TWI731734B - 用於引線接合的接合機上的自動懸伸晶粒優化工具及相關方法 - Google Patents
用於引線接合的接合機上的自動懸伸晶粒優化工具及相關方法 Download PDFInfo
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- TWI731734B TWI731734B TW109122367A TW109122367A TWI731734B TW I731734 B TWI731734 B TW I731734B TW 109122367 A TW109122367 A TW 109122367A TW 109122367 A TW109122367 A TW 109122367A TW I731734 B TWI731734 B TW I731734B
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K20/00—Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating
- B23K20/002—Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating specially adapted for particular articles or work
- B23K20/004—Wire welding
- B23K20/005—Capillary welding
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K37/00—Auxiliary devices or processes, not specially adapted for a procedure covered by only one of the other main groups of this subclass
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/01—Manufacture or treatment
- H10W72/011—Apparatus therefor
- H10W72/0115—Apparatus for manufacturing bond wires
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices
- H10P74/23—Testing or measuring during manufacture or treatment of wafers, substrates or devices characterised by multiple measurements, corrections, marking or sorting processes
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/0711—Apparatus therefor
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/0711—Apparatus therefor
- H10W72/07113—Means for calibration
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/0711—Apparatus therefor
- H10W72/07141—Means for applying energy, e.g. ovens or lasers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/0711—Apparatus therefor
- H10W72/07183—Means for monitoring
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/073—Connecting or disconnecting of die-attach connectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/073—Connecting or disconnecting of die-attach connectors
- H10W72/07351—Connecting or disconnecting of die-attach connectors characterised by changes in properties of the die-attach connectors during connecting
- H10W72/07352—Connecting or disconnecting of die-attach connectors characterised by changes in properties of the die-attach connectors during connecting changes in structures or sizes
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
- H10W72/07521—Aligning
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
- H10W72/07531—Techniques
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/30—Die-attach connectors
- H10W72/321—Structures or relative sizes of die-attach connectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/531—Shapes of wire connectors
- H10W72/536—Shapes of wire connectors the connected ends being ball-shaped
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/531—Shapes of wire connectors
- H10W72/5363—Shapes of wire connectors the connected ends being wedge-shaped
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/531—Shapes of wire connectors
- H10W72/5366—Shapes of wire connectors the bond wires having kinks
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/551—Materials of bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/851—Dispositions of multiple connectors or interconnections
- H10W72/874—On different surfaces
- H10W72/884—Die-attach connectors and bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/951—Materials of bond pads
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/20—Configurations of stacked chips
- H10W90/231—Configurations of stacked chips the stacked chips being on both top and bottom sides of an auxiliary carrier having no electrical connection structure
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/731—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
- H10W90/732—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between stacked chips
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/731—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
- H10W90/734—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between a chip and a stacked insulating package substrate, interposer or RDL
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/751—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
- H10W90/754—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked insulating package substrate, interposer or RDL
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Wire Bonding (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
- Manufacturing & Machinery (AREA)
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201562250745P | 2015-11-04 | 2015-11-04 | |
| US62/250,745 | 2015-11-04 | ||
| US15/234,563 US10121759B2 (en) | 2015-11-04 | 2016-08-11 | On-bonder automatic overhang die optimization tool for wire bonding and related methods |
| US15/234,563 | 2016-08-11 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW202040716A TW202040716A (zh) | 2020-11-01 |
| TWI731734B true TWI731734B (zh) | 2021-06-21 |
Family
ID=58635709
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW109122367A TWI731734B (zh) | 2015-11-04 | 2016-10-12 | 用於引線接合的接合機上的自動懸伸晶粒優化工具及相關方法 |
| TW105132890A TWI712094B (zh) | 2015-11-04 | 2016-10-12 | 用於引線接合的接合機上的自動懸伸晶粒優化工具及相關方法 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW105132890A TWI712094B (zh) | 2015-11-04 | 2016-10-12 | 用於引線接合的接合機上的自動懸伸晶粒優化工具及相關方法 |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US10121759B2 (https=) |
| JP (1) | JP6971012B2 (https=) |
| KR (1) | KR102593242B1 (https=) |
| CN (2) | CN110695575B (https=) |
| SG (2) | SG10201907000QA (https=) |
| TW (2) | TWI731734B (https=) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109560024B (zh) * | 2018-11-06 | 2020-11-06 | 武汉新芯集成电路制造有限公司 | 一种晶圆键合装置及其校正方法 |
| US11581285B2 (en) | 2019-06-04 | 2023-02-14 | Kulicke And Soffa Industries, Inc. | Methods of detecting bonding between a bonding wire and a bonding location on a wire bonding machine |
| KR20220160553A (ko) * | 2020-03-29 | 2022-12-06 | 쿨리케 앤드 소파 인더스트리즈, 인코포레이티드 | 와이어 본딩 머신 상의 지지 구조에 대한 반도체 소자의 클램핑 최적화 방법, 및 관련된 방법 |
| US11515284B2 (en) * | 2020-07-14 | 2022-11-29 | Semiconductor Components Industries, Llc | Multi-segment wire-bond |
| JP7794821B2 (ja) | 2020-11-05 | 2026-01-06 | クリック アンド ソッファ インダストリーズ、インク. | ワイヤボンディング装置におけるボンディング力の精度を監視する方法を含む、ワイヤボンディング装置を動作させる方法、および関連する方法 |
| CN117337485A (zh) * | 2021-05-20 | 2024-01-02 | 库利克和索夫工业公司 | 确定和/或校准楔焊机上的切割器高度的方法以及相关的楔焊机 |
| KR102891276B1 (ko) * | 2021-05-25 | 2025-12-03 | 야마하 로보틱스 가부시키가이샤 | 와이어 본딩 시스템, 검사 장치, 와이어 본딩 방법, 및 기록 매체 |
| CN121464751A (zh) * | 2023-07-11 | 2026-02-03 | 库利克和索夫工业公司 | 检测半导体元件中的裂纹的方法以及相关的焊线系统 |
Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20120074206A1 (en) * | 2010-09-27 | 2012-03-29 | Kulicke And Soffa Industries, Inc. | Methods of forming wire bonds for wire loops and conductive bumps |
| US8302840B2 (en) * | 2007-05-16 | 2012-11-06 | Kulicke And Soffa Industries, Inc. | Closed loop wire bonding methods and bonding force calibration |
| TW201417285A (zh) * | 2012-08-10 | 2014-05-01 | Semiconductor Energy Lab | 半導體裝置及其製造方法 |
| TW201417289A (zh) * | 2012-09-14 | 2014-05-01 | 半導體能源研究所股份有限公司 | 半導體裝置及其製造方法 |
| TW201426924A (zh) * | 2012-12-17 | 2014-07-01 | 巨擘科技股份有限公司 | 封裝結構及封裝方法 |
| TW201511139A (zh) * | 2010-04-23 | 2015-03-16 | 半導體能源研究所股份有限公司 | 半導體裝置及半導體裝置的製造方法 |
| TW201513172A (zh) * | 2013-05-29 | 2015-04-01 | Ev集團E塔那有限公司 | 用以接合基板之裝置及方法 |
| TW201517175A (zh) * | 2013-10-14 | 2015-05-01 | 康寧公司 | 用於半導體與中介層處理之載具接合方法與物件 |
| TW201533817A (zh) * | 2013-12-17 | 2015-09-01 | 庫利克和索夫工業公司 | 用於接合半導體元件的接合機的操作方法及接合機 |
| TW201541527A (zh) * | 2009-10-21 | 2015-11-01 | 半導體能源研究所股份有限公司 | 半導體裝置及其製造方法 |
Family Cites Families (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63293844A (ja) * | 1987-05-27 | 1988-11-30 | Toshiba Corp | ワイヤボンデイングヘツド |
| JP3178567B2 (ja) * | 1993-07-16 | 2001-06-18 | 株式会社カイジョー | ワイヤボンディング装置及びその方法 |
| JPH07183321A (ja) * | 1993-12-24 | 1995-07-21 | Kaijo Corp | ワイヤボンディング装置 |
| JP2001267352A (ja) * | 2000-03-16 | 2001-09-28 | Mitsubishi Electric Corp | ワイヤボンディング装置およびその制御方法 |
| JP4547330B2 (ja) * | 2005-12-28 | 2010-09-22 | 株式会社新川 | ワイヤボンディング装置、ボンディング制御プログラム及びボンディング方法 |
| US7511961B2 (en) * | 2006-10-26 | 2009-03-31 | Infineon Technologies Ag | Base plate for a power semiconductor module |
| JP4786500B2 (ja) * | 2006-10-26 | 2011-10-05 | 株式会社東芝 | ワイヤボンディング装置及びワイヤボンディング方法 |
| JP4425319B1 (ja) * | 2008-09-10 | 2010-03-03 | 株式会社新川 | ボンディング方法、ボンディング装置及び製造方法 |
| US7762449B2 (en) * | 2008-11-21 | 2010-07-27 | Asm Assembly Automation Ltd | Bond head for heavy wire bonder |
| JP4658224B2 (ja) * | 2010-01-26 | 2011-03-23 | 株式会社新川 | ワイヤボンディング装置 |
| US20120007426A1 (en) * | 2010-07-08 | 2012-01-12 | Thompson Steve A | Multiple DC power generation systems common load coupler |
| JP2012186416A (ja) * | 2011-03-08 | 2012-09-27 | Toshiba Corp | 半導体装置の製造方法 |
| JP2014007363A (ja) * | 2012-06-27 | 2014-01-16 | Renesas Electronics Corp | 半導体装置の製造方法および半導体装置 |
| US8899469B2 (en) * | 2013-03-04 | 2014-12-02 | Kulicke And Soffa Industries, Inc. | Automatic rework processes for non-stick conditions in wire bonding operations |
| JP2015153907A (ja) * | 2014-02-14 | 2015-08-24 | 株式会社新川 | 半導体装置の製造方法及びワイヤボンディング装置 |
| JP2016092192A (ja) * | 2014-11-04 | 2016-05-23 | 株式会社デンソー | 電子装置の製造方法 |
-
2016
- 2016-08-11 US US15/234,563 patent/US10121759B2/en active Active
- 2016-10-12 TW TW109122367A patent/TWI731734B/zh active
- 2016-10-12 TW TW105132890A patent/TWI712094B/zh active
- 2016-10-24 SG SG10201907000QA patent/SG10201907000QA/en unknown
- 2016-10-24 SG SG10201608922TA patent/SG10201608922TA/en unknown
- 2016-10-31 KR KR1020160143605A patent/KR102593242B1/ko active Active
- 2016-11-02 JP JP2016214727A patent/JP6971012B2/ja active Active
- 2016-11-03 CN CN201910986731.0A patent/CN110695575B/zh active Active
- 2016-11-03 CN CN201610959217.4A patent/CN107030415B/zh active Active
-
2018
- 2018-09-26 US US16/142,662 patent/US10665564B2/en active Active
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8302840B2 (en) * | 2007-05-16 | 2012-11-06 | Kulicke And Soffa Industries, Inc. | Closed loop wire bonding methods and bonding force calibration |
| TW201541527A (zh) * | 2009-10-21 | 2015-11-01 | 半導體能源研究所股份有限公司 | 半導體裝置及其製造方法 |
| TW201511139A (zh) * | 2010-04-23 | 2015-03-16 | 半導體能源研究所股份有限公司 | 半導體裝置及半導體裝置的製造方法 |
| US20120074206A1 (en) * | 2010-09-27 | 2012-03-29 | Kulicke And Soffa Industries, Inc. | Methods of forming wire bonds for wire loops and conductive bumps |
| TW201417285A (zh) * | 2012-08-10 | 2014-05-01 | Semiconductor Energy Lab | 半導體裝置及其製造方法 |
| TW201417289A (zh) * | 2012-09-14 | 2014-05-01 | 半導體能源研究所股份有限公司 | 半導體裝置及其製造方法 |
| TW201426924A (zh) * | 2012-12-17 | 2014-07-01 | 巨擘科技股份有限公司 | 封裝結構及封裝方法 |
| TW201513172A (zh) * | 2013-05-29 | 2015-04-01 | Ev集團E塔那有限公司 | 用以接合基板之裝置及方法 |
| TW201517175A (zh) * | 2013-10-14 | 2015-05-01 | 康寧公司 | 用於半導體與中介層處理之載具接合方法與物件 |
| TW201533817A (zh) * | 2013-12-17 | 2015-09-01 | 庫利克和索夫工業公司 | 用於接合半導體元件的接合機的操作方法及接合機 |
Also Published As
| Publication number | Publication date |
|---|---|
| TW202040716A (zh) | 2020-11-01 |
| JP6971012B2 (ja) | 2021-11-24 |
| US20170125311A1 (en) | 2017-05-04 |
| US10665564B2 (en) | 2020-05-26 |
| TWI712094B (zh) | 2020-12-01 |
| CN110695575A (zh) | 2020-01-17 |
| TW201727791A (zh) | 2017-08-01 |
| KR20170052484A (ko) | 2017-05-12 |
| CN110695575B (zh) | 2022-06-17 |
| KR102593242B1 (ko) | 2023-10-25 |
| SG10201608922TA (en) | 2017-06-29 |
| US10121759B2 (en) | 2018-11-06 |
| US20190027463A1 (en) | 2019-01-24 |
| CN107030415A (zh) | 2017-08-11 |
| CN107030415B (zh) | 2020-06-05 |
| JP2017092464A (ja) | 2017-05-25 |
| SG10201907000QA (en) | 2019-09-27 |
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