TWI720488B - Resin molding device and method of producing resin molded product - Google Patents
Resin molding device and method of producing resin molded product Download PDFInfo
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- TWI720488B TWI720488B TW108117399A TW108117399A TWI720488B TW I720488 B TWI720488 B TW I720488B TW 108117399 A TW108117399 A TW 108117399A TW 108117399 A TW108117399 A TW 108117399A TW I720488 B TWI720488 B TW I720488B
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- 229920005989 resin Polymers 0.000 title claims abstract description 357
- 239000011347 resin Substances 0.000 title claims abstract description 357
- 238000000465 moulding Methods 0.000 title claims abstract description 88
- 238000000034 method Methods 0.000 title description 5
- 230000007246 mechanism Effects 0.000 claims abstract description 103
- 239000000428 dust Substances 0.000 claims abstract description 97
- 239000000463 material Substances 0.000 claims abstract description 48
- 239000007789 gas Substances 0.000 claims description 45
- 238000003860 storage Methods 0.000 claims description 18
- 239000000112 cooling gas Substances 0.000 claims description 9
- 238000004519 manufacturing process Methods 0.000 claims description 7
- 230000007723 transport mechanism Effects 0.000 claims description 5
- 230000006866 deterioration Effects 0.000 abstract description 7
- 239000000758 substrate Substances 0.000 description 42
- 238000001514 detection method Methods 0.000 description 16
- 239000000843 powder Substances 0.000 description 9
- 238000007789 sealing Methods 0.000 description 9
- 238000012546 transfer Methods 0.000 description 9
- 238000007791 dehumidification Methods 0.000 description 6
- 238000003825 pressing Methods 0.000 description 6
- 239000012530 fluid Substances 0.000 description 5
- 238000004140 cleaning Methods 0.000 description 4
- 230000000737 periodic effect Effects 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- 239000000470 constituent Substances 0.000 description 3
- 238000011109 contamination Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000007726 management method Methods 0.000 description 3
- 238000004378 air conditioning Methods 0.000 description 2
- 230000000712 assembly Effects 0.000 description 2
- 238000000429 assembly Methods 0.000 description 2
- 230000000052 comparative effect Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 239000004593 Epoxy Substances 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 238000007664 blowing Methods 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000004090 dissolution Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 229920005992 thermoplastic resin Polymers 0.000 description 1
- 229920001187 thermosetting polymer Polymers 0.000 description 1
- 238000001721 transfer moulding Methods 0.000 description 1
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67126—Apparatus for sealing, encapsulating, glassing, decapsulating or the like
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C45/00—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor
- B29C45/02—Transfer moulding, i.e. transferring the required volume of moulding material by a plunger from a "shot" cavity into a mould cavity
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C45/00—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor
- B29C45/17—Component parts, details or accessories; Auxiliary operations
- B29C45/1753—Cleaning or purging, e.g. of the injection unit
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C45/00—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor
- B29C45/17—Component parts, details or accessories; Auxiliary operations
- B29C45/18—Feeding the material into the injection moulding apparatus, i.e. feeding the non-plastified material into the injection unit
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
- H01L21/565—Moulds
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
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- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Mechanical Engineering (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
- Casting Or Compression Moulding Of Plastics Or The Like (AREA)
- Injection Moulding Of Plastics Or The Like (AREA)
- Processing And Handling Of Plastics And Other Materials For Molding In General (AREA)
Abstract
Description
本發明關於一種樹脂成形裝置及樹脂成形品的製造方法。The present invention relates to a resin molding device and a method of manufacturing a resin molded product.
以前,如專利文獻1所示,在樹脂密封半導體製造裝置中,有以在保管包含熱硬化性樹脂的樹脂材料的保管部中設置自動空氣調節裝置,而將保管部保持成規定的溫濕度的方式構成者。具體而言,僅在保管部的溫濕度已從規定的設定範圍上下波動的情況下,自動地進行除濕、送風。In the past, as shown in Patent Document 1, in resin-sealed semiconductor manufacturing equipment, an automatic air-conditioning device is installed in a storage section that stores a resin material containing a thermosetting resin, and the storage section is maintained at a predetermined temperature and humidity. Former. Specifically, only when the temperature and humidity of the storage unit have fluctuated up and down from a predetermined setting range, dehumidification and air blowing are automatically performed.
但是,樹脂密封半導體製造裝置等樹脂成形裝置難以將裝置內的空間密閉。另外,現有的樹脂成形裝置由於樹脂材料的粉末等塵埃飛散而對裝置內進行污染,因此設為將裝置內的塵埃與空氣一同抽吸的結構。However, it is difficult for a resin molding apparatus such as a resin-sealed semiconductor manufacturing apparatus to seal the space in the apparatus. In addition, the conventional resin molding apparatus contaminates the inside of the apparatus because dust such as powder of the resin material is scattered, and therefore has a structure that sucks the dust in the apparatus together with air.
於是,即便如所述那樣設置了自動空氣調節裝置,由於外部空氣流入保管部的空間內,因此難以控制保管部的溫濕度。其結果,例如因由吸濕所產生的空隙或由溫度上升所引起的溶解等,而導致樹脂材料的品質劣化。 [現有技術文獻] [專利文獻]Therefore, even if an automatic air-conditioning device is installed as described above, it is difficult to control the temperature and humidity of the storage unit because outside air flows into the space of the storage unit. As a result, the quality of the resin material deteriorates due to voids caused by moisture absorption or dissolution caused by temperature rise, for example. [Prior Art Literature] [Patent Literature]
[專利文獻1]日本專利特開平5-267367號公報[Patent Document 1] Japanese Patent Laid-Open No. 5-267367
[發明所欲解決之課題] 因此,本發明是為了解決所述問題點而成者,其將抑制樹脂材料的品質的劣化作為其主要的問題。 [解決問題的技術手段][The problem to be solved by the invention] Therefore, the present invention was made to solve the above-mentioned problems, and its main problem is to suppress the deterioration of the quality of the resin material. [Technical means to solve the problem]
即,本發明的樹脂成形裝置樹脂的特徵在於包括:樹脂成形組件,進行樹脂成形;搬送機構,將樹脂材料搬送至所述樹脂成形組件中;樹脂供給組件,收容所述樹脂材料,並且將所述樹脂材料供給至所述搬送機構中;抽吸機構,抽吸所述樹脂供給組件內的塵埃;以及控制部,至少控制所述抽吸機構;且所述控制部使利用所述抽吸機構的抽吸斷續地進行。 [發明的效果]That is, the resin molding apparatus of the present invention is characterized in that it includes: a resin molding assembly to perform resin molding; a transport mechanism to transport the resin material to the resin molding assembly; a resin supply assembly to accommodate the resin material and transfer the resin material. The resin material is supplied to the conveying mechanism; a suction mechanism that sucks dust in the resin supply assembly; and a control section that controls at least the suction mechanism; and the control section makes use of the suction mechanism The suction is performed intermittently. [Effects of the invention]
根據如此構成的本發明,可抑制樹脂材料的品質的劣化。According to the present invention thus constituted, it is possible to suppress the deterioration of the quality of the resin material.
繼而,舉例對本發明進行更詳細的說明。但是,本發明並不由以下的說明限定。Next, the present invention will be explained in more detail with examples. However, the present invention is not limited by the following description.
如上所述,本發明的樹脂成形裝置的特徵在於包括:樹脂成形組件,進行樹脂成形;搬送機構,將樹脂材料搬送至所述樹脂成形組件中;樹脂供給組件,收容所述樹脂材料,並且將所述樹脂材料供給至所述搬送機構中;抽吸機構,抽吸所述樹脂供給組件內的塵埃;以及控制部,至少控制所述抽吸機構;且所述控制部使利用所述抽吸機構的抽吸斷續地進行。 若為所述樹脂成形裝置,則使利用抽吸樹脂供給組件內的塵埃的抽吸機構的抽吸斷續地進行,因此可抑制外部空氣朝樹脂供給組件中的流入,而可抑制由因外部空氣所引起的濕度或溫度的變動所導致的樹脂材料的品質的劣化。另外,由於利用抽吸機構抽吸樹脂供給組件內的塵埃,因此可減少樹脂材料的粉末等塵埃飛散所產生的裝置內的污染。As described above, the resin molding apparatus of the present invention is characterized by including: a resin molding assembly to perform resin molding; a conveying mechanism to transport the resin material to the resin molding assembly; a resin supply assembly to accommodate the resin material and The resin material is supplied to the conveying mechanism; a suction mechanism that sucks dust in the resin supply assembly; and a control section that controls at least the suction mechanism; and the control section makes use of the suction The suction of the mechanism is performed intermittently. In the case of the resin molding apparatus, the suction by the suction mechanism that sucks the dust in the resin supply assembly is performed intermittently. Therefore, the inflow of external air into the resin supply assembly can be suppressed, and the external cause can be suppressed. The deterioration of the quality of the resin material caused by the humidity or temperature fluctuation caused by the air. In addition, since the dust in the resin supply assembly is sucked by the suction mechanism, it is possible to reduce contamination in the device caused by scattering of dust such as powder of the resin material.
為了高效地進行樹脂供給組件內的濕度管理,理想的是進而包括將經除濕的氣體供給至所述樹脂供給組件內的除濕氣體供給機構。In order to efficiently perform humidity management in the resin supply module, it is desirable to further include a dehumidified gas supply mechanism that supplies dehumidified gas into the resin supply module.
為了高效地進行樹脂供給組件內的溫度管理,理想的是所述除濕氣體供給機構具有對所述氣體進行冷卻的冷卻器。In order to efficiently perform temperature management in the resin supply module, it is desirable that the dehumidified gas supply mechanism has a cooler that cools the gas.
另外,為了高效地進行樹脂供給組件內的溫度管理,理想的是進而包括將經冷卻的氣體供給至所述樹脂供給組件內的冷卻氣體供給機構。In addition, in order to efficiently perform temperature management in the resin supply module, it is desirable to further include a cooling gas supply mechanism that supplies the cooled gas into the resin supply module.
所述樹脂供給組件可考慮包括在內部收容所述樹脂材料並且送出所述樹脂材料的樹脂送出部、及將已從所述樹脂送出部中送出的樹脂材料供給至所述搬送機構中的樹脂供給部者。 在所述結構中,樹脂送出部收容樹脂材料,因此容易從樹脂送出部產生樹脂材料的粉末等塵埃,另外,外部空氣流入樹脂送出部中的影響變得比其他部分大。 因此,理想的是所述抽吸機構是至少抽吸所述樹脂送出部內的塵埃的機構。The resin supply unit may include a resin delivery unit that accommodates the resin material inside and delivers the resin material, and a resin supply unit that supplies the resin material that has been delivered from the resin delivery unit to the transport mechanism. Ministry. In the above structure, the resin sending part accommodates the resin material, so dusts such as powder of the resin material are likely to be generated from the resin sending part, and the influence of external air flowing into the resin sending part becomes greater than other parts. Therefore, it is desirable that the suction mechanism is a mechanism that sucks at least the dust in the resin sending portion.
另外,理想的是所述樹脂送出部及至少所述樹脂供給部的一部分由蓋體覆蓋,且所述除濕氣體供給機構是將經除濕的氣體至少供給至所述蓋體內部的機構。或者,理想的是所述樹脂送出部及至少所述樹脂供給部的一部分由蓋體覆蓋,且所述冷卻氣體供給機構是將經冷卻的氣體至少供給至所述蓋體內部的機構。 若為所述結構,則可高效地將經除濕的氣體或/及經冷卻的氣體留在蓋體內部。In addition, it is desirable that the resin delivery part and at least a part of the resin supply part are covered by a cover body, and the dehumidified gas supply mechanism is a mechanism that supplies dehumidified gas at least into the cover body. Alternatively, it is desirable that the resin sending portion and at least a part of the resin supplying portion are covered by a lid, and the cooling gas supply mechanism is a mechanism that supplies cooled gas to at least the inside of the lid. With this structure, the dehumidified gas or/and the cooled gas can be efficiently left inside the cover.
為了使抽吸機構的控制變得簡單,可考慮所述控制部使利用所述抽吸機構的抽吸週期性地進行。存在僅藉由使利用所述抽吸機構的抽吸週期性地進行,無法高效地抽吸塵埃的情況。尤其,當從所述樹脂送出部朝所述樹脂供給部中送出所述樹脂材料時,容易產生樹脂材料的粉末等塵埃。因此,理想的是除所述週期性的抽吸以外,控制部至少在從所述樹脂送出部朝所述樹脂供給部中送出所述樹脂材料的動作中使利用所述抽吸機構的抽吸進行。In order to simplify the control of the suction mechanism, it is conceivable that the control unit periodically performs suction by the suction mechanism. There are cases in which dust cannot be sucked efficiently by simply performing suction by the suction mechanism periodically. In particular, when the resin material is sent from the resin sending part to the resin supply part, dust such as powder of the resin material is likely to be generated. Therefore, it is desirable that, in addition to the periodic suction, the control unit causes the suction by the suction mechanism at least during the operation of sending the resin material from the resin delivery unit to the resin supply unit. get on.
為了高效地抽吸樹脂材料的粉末等塵埃,理想的是所述樹脂送出部及至少所述樹脂供給部的一部分由蓋體覆蓋,且所述抽吸機構是抽吸所述蓋體的內部的塵埃的機構。In order to efficiently suck dust such as powders of resin materials, it is desirable that the resin delivery part and at least a part of the resin supply part are covered by a cover, and the suction mechanism sucks the inside of the cover The institution of dust.
另外,本發明的樹脂成形品的製造方法是利用搬送機構將樹脂材料從樹脂供給組件朝樹脂成形組件中搬送,並利用所述樹脂成形組件進行樹脂成形來製造樹脂成形品的樹脂成形品的製造方法,其特徵在於:在從所述樹脂材料的供給至樹脂成形為止的期間的至少一部分中,斷續地抽吸所述樹脂供給組件內的塵埃。 若為所述樹脂成形品的製造方法,則在從樹脂材料的供給至樹脂成形為止的期間的至少一部分中,斷續地抽吸樹脂供給組件內的塵埃,因此可抑制外部空氣朝樹脂供給組件中的流入,而可抑制由因外部空氣所引起的濕度或溫度的變動所導致的樹脂材料的品質的劣化。另外,由於抽吸樹脂供給組件內的塵埃,因此可減少樹脂材料的粉末等塵埃飛散所產生的裝置內的污染。In addition, the method of manufacturing a resin molded product of the present invention uses a conveying mechanism to transport a resin material from a resin supply assembly to a resin molded assembly, and uses the resin molded assembly to perform resin molding to produce a resin molded product. The method is characterized in that the dust in the resin supply assembly is intermittently sucked in at least a part of the period from the supply of the resin material to the resin molding. According to the method of manufacturing the resin molded product, the dust in the resin supply assembly is intermittently sucked in at least a part of the period from the supply of the resin material to the resin molding, so that it is possible to prevent external air from reaching the resin supply assembly. It is possible to suppress the deterioration of the quality of the resin material due to the humidity or temperature fluctuation caused by the outside air. In addition, since the dust in the resin supply assembly is sucked, it is possible to reduce the contamination in the device caused by the scattering of dust such as powder of the resin material.
<本發明的實施方式> 以下,參照圖式對本發明的樹脂成形裝置的一實施方式進行說明。<Embodiments of the present invention> Hereinafter, an embodiment of the resin molding apparatus of the present invention will be described with reference to the drawings.
本實施方式的樹脂成形裝置1是使用傳遞模塑(transfer molding)法的樹脂成形裝置。所述樹脂成形裝置例如為對安裝有半導體芯片的基板進行樹脂成形者,且為將形成圓柱狀的片狀的熱塑性樹脂(以下,稱為“樹脂片(resin tablet)”)用作樹脂材料者。另外,作為“基板”,可列舉:玻璃環氧基板、陶瓷基板、樹脂基板、金屬基板等一般的基板及引線框架等。The resin molding apparatus 1 of this embodiment is a resin molding apparatus using a transfer molding method. The resin molding apparatus is, for example, a person who performs resin molding of a substrate on which a semiconductor chip is mounted, and a person who uses a cylindrical sheet-like thermoplastic resin (hereinafter referred to as a "resin tablet") as a resin material . In addition, as the "substrate", general substrates such as glass epoxy substrates, ceramic substrates, resin substrates, and metal substrates, lead frames, and the like can be cited.
具體而言,如圖1所示,樹脂成形裝置1分別包括供給樹脂密封前的基板W(以下,稱為“密封前基板W”)及樹脂片T的供給組件2,進行樹脂成形的例如兩個樹脂成形組件3A、樹脂成形組件3B,以及用於搬出樹脂成形品的搬出組件4作為構成元件。另外,作為構成元件的供給組件2,樹脂成形組件3A、樹脂成形組件3B,及搬出組件4分別相對於其他構成元件可相互裝卸、且可更換。Specifically, as shown in FIG. 1, the resin molding apparatus 1 includes a
另外,樹脂成形裝置1包括:將由供給組件2所供給的密封前基板W及樹脂片T搬送至樹脂成形組件3A、樹脂成形組件3B中的搬送機構5(以下,稱為“裝載機(loader)5”),以及將由樹脂成形組件3A、樹脂成形組件3B進行了樹脂成形的樹脂成形品搬送至搬出組件4中的搬送機構6(以下,稱為“卸載機(unloader)6”)。In addition, the resin molding apparatus 1 includes: a transport mechanism 5 (hereinafter, referred to as a "loader) for transporting the pre-seal substrate W and the resin sheet T supplied from the
本實施方式的供給組件2是將基板供給組件7及樹脂供給組件8一體化而成者。The
基板供給組件7具有基板送出部71與基板供給部72。基板送出部71是將料盒(magazine)內的密封前基板W送出至基板排隊部中者。基板供給部72是從基板送出部71接收密封前基板W,使已接收的密封前基板W朝規定的方向排隊,然後交接至裝載機5中者。The
樹脂供給組件8具有樹脂送出部81與樹脂供給部82。樹脂送出部81是從後述的儲料器(stocker)83接收樹脂片T,並將樹脂片T送出至樹脂供給部82中者。樹脂供給部82是從樹脂送出部81接收樹脂片T,使已接收的樹脂片T朝規定的方向排隊,然後交接至裝載機5中者。The
樹脂成形組件3A、樹脂成形組件3B分別具有按壓部31。如圖2所示,各按壓部31具有可升降的下模311、相向地固定在下模311的上方的上模(參照圖2的上模312)、及用於對下模311及上模312進行合模的合模機構313。下模311固定在可動盤314的上表面上,上模312固定在上部固定盤315的下表面上。合模機構313是使可動盤314上下移動,由此對上模312及下模311進行合模或開模者。The
在下模311中,形成有安裝已由裝載機5搬送的密封前基板W的安裝部311a。在下模311中,形成有安裝已由裝載機5搬送的樹脂片T的多個罐311b。另外,在下模311中,在罐311b內設置有用於將樹脂片T注入例如形成在上模312中的樹脂通道312a及模腔312b中的柱塞316。In the
此外,在上模312與下模311中分別埋入有加熱器等加熱部(參照圖2的加熱器317)。通常,利用所述加熱部將上模312及下模311加熱至180℃左右。In addition, heating parts such as heaters are embedded in the
<樹脂成形裝置1的樹脂成形動作> 以下,對本實施方式的樹脂成形裝置1的樹脂成形的基本動作進行說明。<Resin molding operation of resin molding apparatus 1> Hereinafter, the basic operation of the resin molding of the resin molding apparatus 1 of the present embodiment will be described.
基板送出部71將料盒內的密封前基板W送出至基板供給部72中。基板供給部72使已接收的密封前基板W朝規定的方向排隊,然後交接至裝載機5中。與此同時,樹脂送出部81將已從儲料器83接收的樹脂片T送出至樹脂供給部82中。樹脂供給部82將已接收的樹脂片T中的需要的個數(圖1中為四個)交接至裝載機5中。The
繼而,裝載機5將已接收的兩塊密封前基板W與四個樹脂片T同時朝按壓部31中搬送。裝載機5將密封前基板W供給至下模311的安裝部311a中,將樹脂片T供給至形成在下模311中的罐311b的內部。Then, the
其後,使用合模機構313對上模312與下模311進行合模。而且,對各罐311b內的樹脂片T進行加熱來使其熔融而生成流動性樹脂,並藉由柱塞316來按壓流動性樹脂。由此,流動性樹脂穿過樹脂通道312a而被注入形成在上模312中的模腔312b的內部。繼而,僅以硬化所需要的所需時間對流動性樹脂進行加熱,由此使流動性樹脂硬化而形成硬化樹脂。由此,模腔312b內的半導體芯片與其周邊的基板被密封在對應於模腔312b的形狀而成形的硬化樹脂(密封樹脂)內。After that, the
繼而,在經過硬化所需要的所需時間後,對上模312與下模311進行開模,而使已密封的基板(未圖示)脫模。其後,使用卸載機6,將由按壓部31進行了樹脂密封的已密封的基板(樹脂成形品)收容在搬出組件4的基板收容部41中。Then, after the required time required for curing has elapsed, the
包含所述一連串的動作的樹脂成形裝置1整體的動作由控制部9來控制。在圖1中,所述控制部9設置在供給組件2中,但也可以設置在其他組件中。另外,控制部9例如包含具有中央處理器(Central Processing Unit,CPU)、內部存儲器、模擬/數字(Analog/Digital,A/D)轉換器、輸入輸出接口等的專用或通用的計算機。The entire operation of the resin molding apparatus 1 including the series of operations is controlled by the
<集塵機構(抽吸機構)及樹脂供給組件8的結構>
而且,本實施方式的樹脂成形裝置1進而包括將樹脂成形組件3A、樹脂成形組件3B及樹脂供給組件8中產生的塵埃與空氣一同抽吸來進行集塵的集塵機構10。<Structure of dust collecting mechanism (suction mechanism) and
具體而言,如圖3所示,集塵機構10包括:集塵器101,將所述集塵器101與各組件3A、組件3B、組件8連接來將塵埃與空氣一同抽吸的連接管102,以及開關閥V1~開關閥V3。本實施方式的集塵器101設置在搬出組件4中,但並不限定於此。Specifically, as shown in FIG. 3, the
連接管102與各樹脂成形組件3A、樹脂成形組件3B及樹脂供給組件8連接。為了容易對上模312或下模311的清潔時所產生的塵埃進行集塵,樹脂成形組件3A、樹脂成形組件3B中的連接管102的開口設置在上模312或下模311的附近。另外,樹脂供給組件8中的連接管102的結構將後述。The connecting
另外,在連接管102的所需部位上設置有用於切換抽吸塵埃的組件的開關閥V1~開關閥V3。此處,開關閥V1或開關閥V2是用於切換從樹脂成形組件3A、樹脂成形組件3B中的集塵及其停止的開關閥。另外,開關閥V3是用於切換從樹脂供給組件8中的集塵及其停止的開關閥。這些開關閥V1~開關閥V3是電動閥,藉由控制部9來控制其開關。In addition, the on-off valve V1 to the on-off valve V3 for switching the dust suction unit are provided at the required part of the connecting
具體而言,控制部9在樹脂成形後的上模312或下模311的清潔時,為了對從上模312或下模311中排出的塵埃進行集塵,將樹脂成形組件3A、樹脂成形組件3B與集塵器101經由連接管102而連接。具體而言,控制部9將開關閥V1或開關閥V2打開。此時,為了使來自樹脂成形組件3A、樹脂成形組件3B中的集塵優先,將樹脂供給組件8側的開關閥V3設為關閉的狀態。Specifically, when cleaning the
另一方面,控制部9在樹脂成形後的上模312或下模311的清潔前,即從樹脂片T的供給至樹脂成形為止的期間內,將樹脂供給組件8與集塵器101經由連接管102而連接。具體而言,控制部9將開關閥V3打開。此時,由於不進行上模312或下模311的清潔,因此將樹脂成形組件3A、樹脂成形組件3B側的開關閥V1、開關閥V2設為關閉的狀態。藉由這些控制,集塵器101變成始終運轉的狀態。On the other hand, the
其次,對樹脂供給組件8中的集塵機構10的結構進行說明。Next, the structure of the
如圖4及圖5所示,本實施方式的樹脂供給組件8具有收容許多樹脂片T並且送出所述樹脂片T的樹脂送出部81、及將已由所述樹脂送出部81送出的樹脂片T供給至搬送機構中的樹脂供給部82。As shown in FIGS. 4 and 5, the
樹脂送出部81包括收容容器811與料斗812。料斗812例如變成可在圖4的橫方向上振動的結構,收容容器811變成包括朝接收部側傾斜的傾斜面的結構。已從儲料器83投入的樹脂片T朝收容容器811的傾斜面落下,並藉由料斗812的振動而被送出至接收部821中。The
收容容器811是形成上壁及一側的側壁開口的例如箱形狀者,以所述一側的側壁變成下方的方式傾斜地設置。另外,在收容容器811的上部設置有收容有許多樹脂片T的儲料器83,樹脂片T從所述儲料器83經由上壁的開口而被投入收容容器811內。The
樹脂供給部82是使用所謂的送料器(parts feeder)者,包括:接收部821,接住已從收容容器811的一側的側壁的開口送出的樹脂片T;振動部822,使所述接收部821振動來使樹脂片T移動;排列部823,使藉由振動而進行移動的樹脂片T排列成一列狀;以及樹脂排隊部824,用於使多個由所述排列部823進行了排列的樹脂材料逐個進行排隊來交接至裝載機5中。在本實施方式中,排列部823是使樹脂片T以橫躺狀態進行排列者,樹脂排隊部824是使橫躺狀態的樹脂片T旋轉成立起狀態來進行排隊者。The
此處,如圖5所示,在接收部821中設置有檢測所述接收部821內的樹脂片T已變少的例如接觸式的第一檢測傳感器S1。控制部9在根據所述第一檢測傳感器S1的檢測信號,必須朝接收部821中補充樹脂片T的情況下,使樹脂送出部81的料斗812振動,而從收容容器811朝接收部821中供給樹脂片T。Here, as shown in FIG. 5, the receiving
另外,如圖5所示,在排列部823中設置有檢測在所述排列部823中是否排列有規定數的樹脂片T的例如透光型的第二檢測傳感器S2。控制部9在根據所述第二檢測傳感器S2的檢測信號,在排列部823中未排列有規定數的樹脂片T的情況下,使振動部822啟動來將規定數的樹脂片T排列在排列部823中。In addition, as shown in FIG. 5, the
在所述結構中,如圖3及圖4所示,與樹脂供給組件8連接的集塵機構10的連接管102具有與收容容器811連接的第一連接管102a、與接收部821連接的第二連接管102b、與排列部823連接的第三連接管102c、以及與樹脂排隊部824連接的第四連接管102d。In the above structure, as shown in FIGS. 3 and 4, the connecting
在本實施方式中,第一連接管102a在收容容器811的底部開口。第二連接管102b在接收部821的底部開口。第三連接管102c在排列部823的底部開口。第四連接管102d在樹脂排隊部824的附近開口。另外,各連接管102a~連接管102d的開口位置並不限定於所述位置,只要是可對各部中的塵埃進行集塵的位置即可。In this embodiment, the first connecting
本實施方式的第一連接管102a~第四連接管102d是在中途進行分支來構成,在所述分支點上設置有用於統一切換第一連接管102a~第四連接管102d的開關的樹脂供給組件8側的開關閥V3(參照圖3)。The first connecting
藉由將所述開關閥V3打開,而進行利用第一連接管102a~第四連接管102d的集塵,藉由將開關閥V3關閉,而停止利用第一連接管102a~第四連接管102d的集塵。By opening the on-off valve V3, dust collection by the first connecting
而且,控制所述開關閥V3的控制部9在樹脂成形完成之前的期間(從樹脂片T的供給至樹脂成形為止的動作中)內,斷續地控制開關閥V3的開關,由此使利用集塵機構10的集塵斷續地進行。Furthermore, the
具體而言,控制部9使利用集塵機構10的集塵週期性地進行。例如,將開關閥V3設為60秒的關閉狀態(不進行集塵的狀態),然後設為15秒的打開狀態(進行集塵的狀態)。另外,將開關閥V3設為關閉狀態的期間及設為打開狀態的期間可對應於供給氣體的溫度、濕度、風量等而變更。此處,在將開關閥V3設為關閉狀態的期間內,將其他開關閥V1或開關閥V2設為打開狀態。由此,可防止始終運轉的集塵器101的損壞。Specifically, the
另外,除所述週期性的開關控制以外,控制部9在從樹脂送出部81朝樹脂供給部82中送出樹脂片T的動作中,將樹脂供給組件8側的開關閥V3打開,使利用集塵機構10的第一連接管102a~第四連接管102d的集塵進行。其原因在於:在從樹脂送出部81送出樹脂片T的動作中,收容容器811藉由料斗812而振動並容易產生塵埃。In addition, in addition to the periodic switch control, the
具體而言,控制部9在根據所述第一檢測傳感器S1的檢測信號而使樹脂送出部81的料斗812振動的情況下,將開關閥V3打開。而且,控制部9在根據第一檢測傳感器S1的檢測信號而停止樹脂送出部81的料斗812的振動的情況下,將開關閥V3關閉。Specifically, the
此外,控制部9也可以在使接收部821振動的期間內,使利用集塵機構10的集塵停止。其原因在於:若在使接收部821振動的期間內進行抽吸,則樹脂片T吸附在接收部821的底面上所形成的抽吸口(集塵口)中,樹脂片T變得無法移動。In addition, the
具體而言,控制部9在根據第二檢測傳感器S2的檢測信號而使振動部822停止的情況下,將開關閥V3打開。另一方面,控制部9在根據第二檢測傳感器S2的檢測信號而使振動部822啟動的情況下,將開關閥V3關閉。Specifically, the
另外,在所述中,藉由一個開關閥V3來切換利用第一連接管102a~第四連接管102d的集塵/停止,但也能夠以如下方式構成:在第一連接管102a~第四連接管102d中分別設置開關閥,由此針對每個連接管102a~連接管102d切換集塵/停止。In addition, in the above, one switch valve V3 is used to switch the dust collection/stop using the first connecting
而且,在本實施方式中,如圖4所示,樹脂送出部81及至少樹脂供給部82的一部分由蓋體11包圍並覆蓋。蓋體11是與樹脂供給組件8的框體(未圖示)分開設置,覆蓋樹脂送出部81及至少樹脂供給部82的一部分者。具體而言,樹脂送出部81與樹脂供給部82的至少接收部821由蓋體11包圍並覆蓋。由此,可減小由與樹脂送出部81連接的第一連接管102a及與樹脂供給部82連接的第二連接管102b、第三連接管102c進行抽吸的空間的容積,而提升塵埃的集塵效率。Furthermore, in this embodiment, as shown in FIG. 4, the
另外,如圖4所示,本實施方式的樹脂成形裝置1包括將經除濕的氣體(例如空氣)供給至樹脂供給組件8內的氣體供給機構12。In addition, as shown in FIG. 4, the resin molding apparatus 1 of the present embodiment includes a
具體而言,氣體供給機構12具有對氣體進行冷卻的冷卻器121,藉由所述冷卻器121來對氣體進行冷卻,由此對氣體進行除濕。在此情況下,氣體供給機構12既作為除濕氣體供給機構發揮作用,也作為冷卻氣體供給機構發揮作用。所述經除濕的氣體是濕度比外部空氣低的氣體。另外,氣體供給機構12具有將由冷卻器121進行了冷卻及除濕的氣體供給至樹脂供給組件8內的供給管122。例如可考慮所述供給管122朝樹脂送出部81導出氣體,但只要是將氣體導入樹脂供給組件8內者,則並無特別限定。另外,供給管122的導出口可以是一個,也可以是多個。除濕氣體供給機構也可以供給使用除濕過濾器進行了除濕的壓縮空氣。作為氣體供給機構,也可以設置除濕氣體供給機構及冷卻氣體供給機構兩者。Specifically, the
在本實施方式中,樹脂送出部81及樹脂供給部82由蓋體11覆蓋,因此供給管122被敷設在蓋體11的內部。由此,可高效地將經除濕的氣體或/及經冷卻的氣體留在蓋體11的內部,而可高效地使收容樹脂材料的環境的溫度及濕度下降。In this embodiment, the
<實驗結果>
將藉由以上方式構成的樹脂供給組件8的樹脂送出部81的濕度控制結果示於圖6中。另外,在圖6中,也表示在相同的裝置結構中連續地進行了集塵時的濕度控制結果作為比較例。另外,在圖6中,橫軸任意設定。<Experimental results>
The result of the humidity control of the
如根據圖6而可知那樣,在本實施方式中,濕度的增減對照利用集塵機構10的集塵及其停止的時機而重複。在利用集塵機構10的集塵過程中,濕度上升,在其停止過程中,濕度下降。在本實施方式中,由於斷續地進行集塵,因此難以受到外部空氣的影響,濕度的最小值為36.2%,最大值被抑制成39.8%。另一方面,在比較例中,由於連續地進行集塵動作,因此外部空氣的影響大,雖然濕度的最小值為36.9%,但最大值上升至42.7%為止。
在本實施方式中有五個峰值,從左側起第四個以外的峰值是由週期性的抽吸所產生的結果,從左側起第四個峰值是由除週期性的抽吸以外,在從樹脂送出部81朝樹脂供給部82中送出樹脂材料的動作中進行的抽吸所產生的結果。As can be understood from FIG. 6, in the present embodiment, the increase and decrease of humidity are repeated in comparison with the timing of dust collection by the
<本實施方式的效果>
根據本實施方式的樹脂成形裝置1,在從樹脂片T的供給至樹脂成形為止的動作中,使利用集塵機構10的集塵斷續地進行,因此可抑制外部空氣朝樹脂供給組件8中的流入,而可抑制由因外部空氣所引起的濕度或溫度的變動所導致的樹脂片T的品質的劣化。另外,由於利用集塵機構10對樹脂供給組件8內的塵埃進行集塵,因此可減少樹脂片T的粉末等塵埃飛散所產生的裝置內的污染。<Effects of this embodiment>
According to the resin molding apparatus 1 of the present embodiment, in the operation from the supply of the resin sheet T to the resin molding, the dust collection by the
尤其在本實施方式中,由於利用集塵機構10抽吸樹脂送出部81內的塵埃,因此可從容易產生樹脂片T的粉末等塵埃的部位集中地抽吸塵埃,而可高效地減少由塵埃所產生的污染。此時,由於斷續地進行針對樹脂送出部81的集塵,因此可進行集塵,且減少流入樹脂送出部81中的外部空氣來抑制樹脂片T的品質的劣化。Particularly in this embodiment, since the
<其他實施方式>
例如,如圖7所示,也可以在樹脂供給組件8的上部設置清潔空氣供給機構13。所述清潔空氣供給機構13是朝樹脂供給組件8供給經清潔的空氣者。藉由設置所述清潔空氣供給機構13,可減少塵埃的飛散。另外,也可以對所述清潔空氣進行除濕後朝樹脂供給組件8供給。<Other embodiments>
For example, as shown in FIG. 7, a clean
所述實施方式的樹脂材料是形成片狀者,但除此以外,也可以是片狀、粒狀、顆粒狀、或粉狀等固體狀的樹脂材料。The resin material of the above-mentioned embodiment is formed into a sheet shape, but in addition to this, it may be a solid resin material such as a sheet shape, a granular shape, a granular shape, or a powder shape.
在所述實施方式中,搬送機構5是將密封前基板W與樹脂片T同時搬送至下模311為止的結構,但也可以是將密封前基板W與樹脂片T分開搬送至下模311為止的結構。In the above-mentioned embodiment, the conveying
樹脂供給組件8只要是將樹脂材料以進行了排隊的狀態交接至搬送機構5中者,則並不限定於所述實施方式的結構。The
所述實施方式的集塵機構是在樹脂成形組件及樹脂供給組件中共用的集塵機構,但也可以分別在樹脂成形組件及樹脂供給組件中設置個別的集塵機構。The dust collection mechanism of the above-mentioned embodiment is a dust collection mechanism shared by the resin molding assembly and the resin supply assembly, but separate dust collection mechanisms may be provided in the resin molding assembly and the resin supply assembly, respectively.
所述實施方式的樹脂成形裝置1是具有將抽吸機構與集塵器組合的集塵機構10的結構,但也可以是具有利用抽吸泵抽吸樹脂供給組件8內的塵埃的抽吸機構的結構。The resin molding apparatus 1 of the above-mentioned embodiment has a structure having a
在所述實施方式中,將樹脂供給組件8與基板供給組件7作為一個組件來構成,但也可以將樹脂供給組件8與基板供給組件7設為不同的組件。In the above-mentioned embodiment, the
在所述實施方式中是具有兩個樹脂成形組件的結構,但樹脂成形組件也可以是一個,也可以是三個以上。In the above-mentioned embodiment, the structure has two resin molded components, but there may be one resin molded component or three or more resin molded components.
此外,本發明並不限定於所述實施方式,當然可在不脫離其主旨的範圍內進行各種變形。In addition, the present invention is not limited to the above-mentioned embodiments, and of course various modifications can be made without departing from the spirit thereof.
1‧‧‧樹脂成形裝置 2‧‧‧供給組件 3A、3B‧‧‧樹脂成形組件 4‧‧‧搬出組件 5‧‧‧搬送機構(裝載機) 6‧‧‧搬送機構(卸載機) 7‧‧‧基板供給組件 8‧‧‧樹脂供給組件 9‧‧‧控制部 10‧‧‧集塵機構(抽吸機構) 11‧‧‧蓋體 12‧‧‧氣體供給機構(除濕氣體供給機構、冷卻氣體供給機構) 13‧‧‧清潔空氣供給機構 31‧‧‧按壓部 41‧‧‧基板收容部 71‧‧‧基板送出部 72‧‧‧基板供給部 81‧‧‧樹脂送出部 82‧‧‧樹脂供給部 83‧‧‧儲料器 101‧‧‧集塵器 102‧‧‧連接管 102a‧‧‧第一連接管 102b‧‧‧第二連接管 102c‧‧‧第三連接管 102d‧‧‧第四連接管 121‧‧‧冷卻器 122‧‧‧供給管 311‧‧‧下模 311a‧‧‧安裝部 311b‧‧‧罐 312‧‧‧上模 312a‧‧‧樹脂通道 312b‧‧‧模腔 313‧‧‧合模機構 314‧‧‧可動盤 315‧‧‧上部固定盤 316‧‧‧柱塞 317‧‧‧加熱器 811‧‧‧收容容器 812‧‧‧料斗 821‧‧‧接收部 822‧‧‧振動部 823‧‧‧排列部 824‧‧‧樹脂排隊部 S1‧‧‧第一檢測傳感器 S2‧‧‧第二檢測傳感器 T‧‧‧樹脂片 V1~V3‧‧‧開關閥 W‧‧‧密封前基板1‧‧‧Resin molding device 2‧‧‧Supply components 3A、3B‧‧‧Resin molding components 4‧‧‧Move out the components 5‧‧‧Transfer mechanism (loader) 6‧‧‧Transfer mechanism (unloader) 7‧‧‧Substrate supply assembly 8‧‧‧Resin supply assembly 9‧‧‧Control Department 10‧‧‧Dust collection mechanism (suction mechanism) 11‧‧‧Cover body 12‧‧‧Gas supply mechanism (dehumidification gas supply mechanism, cooling gas supply mechanism) 13‧‧‧Clean air supply mechanism 31‧‧‧Pressing part 41‧‧‧Substrate storage section 71‧‧‧Substrate delivery section 72‧‧‧Substrate Supply Department 81‧‧‧Resin Delivery Department 82‧‧‧Resin Supply Department 83‧‧‧Stocker 101‧‧‧Dust Collector 102‧‧‧Connecting pipe 102a‧‧‧First connecting pipe 102b‧‧‧Second connecting pipe 102c‧‧‧The third connecting pipe 102d‧‧‧Fourth connecting pipe 121‧‧‧Cooler 122‧‧‧Supply pipe 311‧‧‧Die 311a‧‧‧Installation Department 311b‧‧‧Can 312‧‧‧Upper die 312a‧‧‧Resin channel 312b‧‧‧Mold cavity 313‧‧‧Clamping mechanism 314‧‧‧movable plate 315‧‧‧Upper fixed plate 316‧‧‧Plunger 317‧‧‧Heater 811‧‧‧Container 812‧‧‧ Hopper 821‧‧‧Receiving Department 822‧‧‧Vibration Department 823‧‧‧Arrangement Department 824‧‧‧Resin Queuing Department S1‧‧‧First detection sensor S2‧‧‧Second detection sensor T‧‧‧Resin sheet V1~V3‧‧‧On-off valve W‧‧‧Sealed front substrate
圖1是示意性地表示本實施方式的樹脂成形裝置的結構的平面圖。 圖2是表示本實施方式的按壓部的主要部分的部分剖面圖。 圖3是表示本實施方式的集塵機構的配管結構的示意圖。 圖4是表示本實施方式的樹脂供給組件的概略圖。 圖5是示意性地表示本實施方式的樹脂供給組件的搬送部的結構的平面圖。 圖6是表示本實施方式的樹脂送出部的濕度測定結果、及現有結構的送出部的濕度測定結果的圖。 圖7是表示變形實施方式的樹脂供給組件的概略圖。FIG. 1 is a plan view schematically showing the structure of the resin molding apparatus of this embodiment. Fig. 2 is a partial cross-sectional view showing the main part of the pressing portion of the present embodiment. Fig. 3 is a schematic diagram showing the piping structure of the dust collecting mechanism of the present embodiment. Fig. 4 is a schematic view showing the resin supply assembly of the present embodiment. Fig. 5 is a plan view schematically showing the structure of the conveying section of the resin supply module of the present embodiment. Fig. 6 is a diagram showing the humidity measurement result of the resin delivery unit of the present embodiment and the humidity measurement result of the delivery unit of the conventional structure. Fig. 7 is a schematic diagram showing a resin supply assembly according to a modified embodiment.
5‧‧‧搬送機構(裝載機) 5‧‧‧Transfer mechanism (loader)
8‧‧‧樹脂供給組件 8‧‧‧Resin supply assembly
11‧‧‧蓋體 11‧‧‧Cover body
12‧‧‧氣體供給機構(除濕氣體供給機構、冷卻氣體供給機構) 12‧‧‧Gas supply mechanism (dehumidification gas supply mechanism, cooling gas supply mechanism)
81‧‧‧樹脂送出部 81‧‧‧Resin Delivery Department
82‧‧‧樹脂供給部 82‧‧‧Resin Supply Department
83‧‧‧儲料器 83‧‧‧Stocker
102a‧‧‧第一連接管 102a‧‧‧First connecting pipe
102b‧‧‧第二連接管 102b‧‧‧Second connecting pipe
102c‧‧‧第三連接管 102c‧‧‧The third connecting pipe
102d‧‧‧第四連接管 102d‧‧‧Fourth connecting pipe
121‧‧‧冷卻器 121‧‧‧Cooler
122‧‧‧供給管 122‧‧‧Supply pipe
811‧‧‧收容容器 811‧‧‧Container
812‧‧‧料斗 812‧‧‧ Hopper
821‧‧‧接收部 821‧‧‧Receiving Department
822‧‧‧振動部 822‧‧‧Vibration Department
823‧‧‧排列部 823‧‧‧Arrangement Department
824‧‧‧樹脂排隊部 824‧‧‧Resin Queuing Department
T‧‧‧樹脂片 T‧‧‧Resin sheet
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Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW340961B (en) * | 1996-05-28 | 1998-09-21 | Tokyo Electron Co Ltd | Method of forming coated film and the device |
CN205263685U (en) * | 2015-12-07 | 2016-05-25 | 贵州省华腾农业科技有限公司 | Cooling room humiture adjusting device |
TW201806725A (en) * | 2016-08-19 | 2018-03-01 | 東和股份有限公司 | Resin molding device and resin molding product manufacturing method capable of reducing adverse effect caused by dust generated from resin material |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05267367A (en) * | 1992-03-23 | 1993-10-15 | Fujitsu Miyagi Electron:Kk | Resin sealed semiconductor manufacturing device |
JP3200211B2 (en) * | 1992-12-01 | 2001-08-20 | アピックヤマダ株式会社 | Semiconductor sealing device |
JP3519521B2 (en) * | 1995-11-10 | 2004-04-19 | 株式会社サイネックス | Semiconductor encapsulation molding equipment |
JPH09246298A (en) * | 1996-03-13 | 1997-09-19 | Toshiba Corp | Semiconductor molding equipment |
CN2378179Y (en) * | 1999-07-05 | 2000-05-17 | 王邦枝 | Improved plastic granule moisture separator |
JP2002313829A (en) | 2001-04-19 | 2002-10-25 | Mitsubishi Electric Corp | Cleaning device for mold for semiconductor resin sealing apparatus |
JP3879638B2 (en) | 2002-09-13 | 2007-02-14 | 松下電器産業株式会社 | Semiconductor resin sealing device |
CN1743159A (en) * | 2004-08-30 | 2006-03-08 | 日本瑞翁株式会社 | Regenerated resin formed body, method for forming same and method for obtaining mould for making regenerated resin cd |
JP2008260280A (en) * | 2007-03-20 | 2008-10-30 | Mitsubishi Chemicals Corp | Transporting method and storing method for pelletized polyester |
JP2010247429A (en) * | 2009-04-15 | 2010-11-04 | Apic Yamada Corp | Resin sealing apparatus and resin sealing method using the same |
TWI623071B (en) * | 2010-11-25 | 2018-05-01 | 山田尖端科技股份有限公司 | Resin molding machine and resin molding method |
KR20140120153A (en) * | 2013-04-02 | 2014-10-13 | 에스티엑스조선해양 주식회사 | natural gas hydrate dissociation device and method using hot water injection pipe line |
CN203580062U (en) * | 2013-09-16 | 2014-05-07 | 吴焕雄 | Adjustable filter |
CN106239832A (en) * | 2016-07-25 | 2016-12-21 | 信易电热机械有限公司 | A kind of removal moisture drying pay-off |
CN206383403U (en) * | 2017-01-11 | 2017-08-08 | 东莞市广为塑料机械有限公司 | A kind of removal moisture drying system conveys closed loop |
-
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2019
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Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW340961B (en) * | 1996-05-28 | 1998-09-21 | Tokyo Electron Co Ltd | Method of forming coated film and the device |
CN205263685U (en) * | 2015-12-07 | 2016-05-25 | 贵州省华腾农业科技有限公司 | Cooling room humiture adjusting device |
TW201806725A (en) * | 2016-08-19 | 2018-03-01 | 東和股份有限公司 | Resin molding device and resin molding product manufacturing method capable of reducing adverse effect caused by dust generated from resin material |
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