TWI709521B - Attaching mechanism of conveying device and testing equipment for its application - Google Patents
Attaching mechanism of conveying device and testing equipment for its application Download PDFInfo
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Abstract
一種輸送裝置之貼接機構,包含貼接單元及溫控單元,其貼接單元係以至少一貼接件供承靠具有電子元件之載帶,該溫控單元係配置於貼接件,並設有溫控件及導溫部件,導溫部件係傳導溫控件之溫度至電子元件;藉以載帶載送電子元件貼接於貼接件上相對應之導溫部件時,溫控單元利用導溫部件將溫控件之溫度傳導至電子元件,使載帶上之電子元件於模擬預設作業溫度環境執行測試作業,達到提高測試效能之實用效益。 A sticking mechanism of a conveying device includes a sticking unit and a temperature control unit. The sticking unit uses at least one sticking piece to support a carrier tape with electronic components. The temperature control unit is arranged on the sticking piece, and Equipped with temperature control and temperature guide parts, the temperature guide part conducts the temperature of the temperature control to the electronic components; when the electronic components are attached to the corresponding temperature guide parts on the bonding parts by the carrier tape, the temperature control unit is used The temperature guide component conducts the temperature of the temperature control to the electronic components, so that the electronic components on the carrier tape perform test operations in an environment that simulates the preset operating temperature, so as to achieve the practical benefit of improving the test performance.
Description
本發明係提供一種可使載帶上之電子元件於模擬預設作業溫度環境執行測試作業,進而提高測試效能的貼接機構。The present invention provides a bonding mechanism that enables electronic components on a carrier tape to perform test operations in a simulated preset operating temperature environment, thereby improving test performance.
在現今,電子元件日趨精密微型化,並裝配於一撓性材質製作之載帶(如薄膜載帶),業者為確保電子元件之出廠品質,係以測試設備對載帶上之電子元件執行測試作業,而淘汰出不良品;請參閱第1圖,測試設備係設置一具探針卡111之測試裝置11,並於測試裝置11之後方配置輸送裝置12,輸送裝置12係設有一作X方向位移之移動架121,移動架121上裝配二輸送載帶13之上鏈輪122及下鏈輪123,載帶13上配置複數個待測之電子元件14,電子元件14並以導線電性連接載帶13之接點,載帶13之兩側開設複數個卡孔,以嵌合於上鏈輪122之上鏈齒及下鏈輪123之下鏈齒,另於移動架121上固設一供載帶13貼靠之貼接件124;於測試時,輸送裝置12之移動架121帶動具電子元件14之載帶13朝向測試裝置11之探針卡111作X方向位移,使電子元件14側方之接點電性連接探針卡111之探針而執行測試作業;惟,電子元件14於日後實際使用時
,可能處於低溫環境或高溫環境,此一測試設備雖可對電子元件14進行電性測試,但無法使載帶13上之電子元件14於模擬日後實際使用之低溫環境或高溫環境進行測試,易言之,即無法確保電子元件14於日後實際使用於低溫環境或高溫環境之品質,以致無法提升測試準確性及測試品質。
Nowadays, electronic components are becoming more and more precise and miniaturized, and they are assembled on a carrier tape made of flexible material (such as a film carrier tape). To ensure the quality of the electronic components, the industry uses test equipment to test the electronic components on the carrier tape. Please refer to Figure 1. The test equipment is equipped with a
本發明之目的一,係提供一種輸送裝置之貼接機構,包含貼接單元及溫控單元,其貼接單元係以至少一貼接件供承靠具有電子元件之載帶,該溫控單元係配置於貼接件,並設有溫控件及導溫部件,導溫部件係傳導溫控件之溫度至電子元件;藉以載帶載送電子元件貼接於貼接件上相對應之導溫部件時,溫控單元利用導溫部件將溫控件之溫度傳導至電子元件,使載帶上之電子元件於模擬預設作業溫度環境執行測試作業,達到提高測試效能之實用效益 。 The first object of the present invention is to provide a pasting mechanism of a conveying device, including a pasting unit and a temperature control unit. The pasting unit uses at least one pasting member to support a carrier tape with electronic components. The temperature control unit It is arranged on the bonding part, and is provided with a temperature control and a temperature guide component. The temperature guide part conducts the temperature of the temperature control to the electronic component; the carrier tape is used to carry the electronic component to the corresponding guide When temperature components, the temperature control unit uses the temperature guide components to transfer the temperature of the temperature control to the electronic components, so that the electronic components on the carrier tape can perform test operations in a simulated preset operating temperature environment to achieve practical benefits of improving test performance .
本發明之目的二,係提供一種輸送裝置之貼接機構,其中,該溫控單元係於導溫部件之周側設有隔溫件,以避免溫控件之溫度傳導至載帶,進而確保載帶之平整度,使載帶之電子元件及接點精準位於預設測試位置,達到提高測試品質之實用效益。The second objective of the present invention is to provide a bonding mechanism for a conveying device, wherein the temperature control unit is provided with a temperature insulation member on the peripheral side of the temperature guide component to prevent the temperature of the temperature control from being transferred to the carrier tape, thereby ensuring The flatness of the carrier tape enables the electronic components and contacts of the carrier tape to be accurately located at the preset test positions, achieving the practical benefit of improving the test quality.
本發明之目的三,係提供一種應用輸送裝置之電子元件測試設備,包含機台、測試裝置、輸送裝置及中央控制裝置,該測試裝置係配置於機台上,並設有至少一測試器,以供對電子元件執行測試作業,該輸送裝置係配置於機台上,並設有承載機構、輸送機構及本發明之貼接機構,以輸送具電子元件之載帶,並以貼接機構溫控電子元件,該中央控制裝置係用以控制及整合各裝置作動,以執行自動化作業,達到提升測試效能之實用效益。The third objective of the present invention is to provide an electronic component testing equipment using a conveying device, including a machine, a testing device, a conveying device, and a central control device. The test device is arranged on the machine and is provided with at least one tester. In order to perform test operations on electronic components, the conveying device is arranged on the machine table, and is equipped with a carrying mechanism, a conveying mechanism, and the bonding mechanism of the present invention to convey the carrier tape of the electronic components, and the bonding mechanism is used for warming Control electronic components. The central control device is used to control and integrate the actions of various devices to perform automated operations and achieve practical benefits of improving test performance.
為使 貴審查委員對本發明作更進一步之瞭解,茲舉一較佳實施例並配合圖式,詳述如後:In order to enable your reviewer to have a better understanding of the present invention, a preferred embodiment is given in conjunction with the drawings. The details are as follows:
請參閱第2、3、4圖,本發明輸送裝置20包含承載機構、輸送機構及本發明之貼接機構;該承載機構係設有至少一由承載驅動器驅動作第一方向(如X方向)位移之移動架,更進一步,承載驅動器可為壓缸、線性馬達或包含馬達及傳動組,承載驅動器可固設於機架或由搬運驅動器驅動作第一、二
、三方向(如X-Z-Y方向)位移;於本實施例中,承載驅動器係包含馬達211及傳動組,馬達211係驅動一呈X方向配置且為螺桿螺座組212之傳動組,螺桿螺座組212之螺座連結傳動一移動架213作X方向位移。
Please refer to Figures 2, 3, and 4, the
該輸送機構係裝配於承載機構之移動架213,並於移動架213設置第一輸送輪221及第二輸送輪222,以輸送具電子元件之載帶;於本實施例中
,第一輸送輪221及第二輸送輪222均為具有傳動齒之齒輪,並呈上、下方配置
,第一輸送輪221係供嚙合輸入具電子元件之載帶,並載送該載帶作Z方向位移
,第二輸送輪222則輸出具電子元件之載帶。
The conveying mechanism is assembled on the moving
本發明貼接機構係配置於承載機構,並包含貼接單元及溫控單元,該貼接單元係設有至少一貼接件,以供承靠具電子元件之載帶;更進一步
,貼接件可固定式配置或由貼接驅動器驅動作至少一方向位移,貼接驅動器可為壓缸、線性馬達或包含馬達及傳動組,例如貼接單元可於移動架213上固設貼接件,例如貼接單元可設置二個貼接件,其一貼接件固設於移動架213,另一貼接件由貼接驅動器驅動作X方向位移,使二貼接件供承靠及夾持載帶定位
;本發明貼接單元之第一實施例包含第一貼接件231及第二貼接件232,第一貼接件231係固設於移動架213,第二貼接件232係位於第一貼接件231之前方,並設有至少一開口部2321,以供顯露載帶之電子元件;更進一步,第二貼接件232可設有二呈Z方向配置之面板,並令二面板保持適當間距而形成開口部2321
,亦或第二貼接件232係於一呈Z方向配置之面板上開設通孔作為開口部2321,前述二種型態均可供載帶之電子元件顯露於外;於本實施例中,第二貼接件232係設有二呈Z方向配置之面板2322,並令二面板2322保持適當間距而形成開口部2321,第二貼接件232並由貼接驅動器驅動作X方向位移,貼接驅動器係為壓缸233,並裝配於移動架213,以驅動第二貼接件232相對第一貼接件231作X方向位移。
The attaching mechanism of the present invention is arranged on the carrying mechanism and includes an attaching unit and a temperature control unit. The attaching unit is provided with at least one attaching piece for supporting a carrier tape with electronic components;
, The sticking part can be fixedly configured or driven by a sticking driver to move in at least one direction. The sticking driver can be a pressure cylinder, a linear motor or a motor and a transmission group. For example, the sticking unit can be fixed on the
該溫控單元係配置於貼接件,並設有溫控件及導溫部件,導溫部件係傳導溫控件之溫度至電子元件,以供電子元件於模擬高溫或低溫測試環境進行測試,該溫控件可為致冷晶片、加熱件或具流體之載具,該導溫部件可為獨立元件或為溫控件之一部位,亦或為貼接件之一部位,例如可於貼接件裝配具導溫部件之治具,以治具之導溫部件傳導溫控件之溫度至電子元件;例如以溫控件(如致冷晶片或加熱件)之一面作為導溫部件,以接觸傳導溫度至電子元件;例如於貼接件成型導溫部件,以傳導溫控件之溫度至電子元件;又導溫部件之面積係等於或小於電子元件之面積,以避免溫度傳導至電子元件周側之載帶部位;於本實施例中,溫控單元係於第一貼接件231設置一為加熱件之第一溫控件241,以供電子元件於模擬高溫測試環境進行測試,溫控單元係於第一貼接件231設有第一導溫部件2311,第一導溫部件2311係為凸塊,以供將第一貼接件231內之第一溫控件241的溫度導溫至載帶之電子元件;再者,溫控單元係於導溫部件之周側設有至少一隔溫件242,以避免第一溫控件241之溫度傳導至載帶,進而確保載帶之平整度,使載帶之電子元件及接點精準位於預設測試位置,更進一步,隔溫件242可裝配於貼接件,或裝配於具導溫部件之治具,亦或以隔熱材製作之貼接件作為隔溫件,前述方式均可避免導溫部件以外之部位傳導溫度至載帶;於本實施例中,溫控單元係於第一貼接件231上且位於第一導溫部件2311的周側設有隔溫件242,以避免第一溫控件241之溫度直接或間接影響載帶的平整度。The temperature control unit is arranged on the bonding part and is provided with a temperature control and a temperature guide component. The temperature guide component conducts the temperature of the temperature control to the electronic component for testing the electronic component in a simulated high temperature or low temperature test environment. The temperature control can be a refrigerating chip, a heating element or a carrier with a fluid. The temperature guide component can be an independent element or a part of the temperature control, or a part of a bonding part, for example, it can be attached to The connecting piece is assembled with a jig with a temperature-conducting part, and the temperature-conducting part of the jig transfers the temperature of the temperature control to the electronic component; for example, one side of the temperature control (such as a cooling chip or a heating element) is used as the temperature-conducting part. Contact conducts temperature to electronic components; for example, forming a temperature-conducting component on the bonding part to transfer the temperature of the temperature control to the electronic component; and the area of the thermal-conducting component is equal to or smaller than the area of the electronic component to avoid temperature conduction to the electronic component The carrier tape portion on the peripheral side; in this embodiment, the temperature control unit is provided with a
請參閱第5、7圖,輸送裝置20應用於電子元件測試設備之示意圖,測試設備之測試裝置30係於承板31裝配一為探針卡32之測試器,探針卡32具有測試電子元件之探針321;該輸送裝置20係配置於測試裝置30之後方,並令第二貼接件232之開口部2321相對於探針卡32,輸送機構係以第一輸送輪221及第二輸送輪222輸送具複數個待測電子元件41之載帶42作Z方向位移至第一貼接件231及第二貼接件232之間,並令載帶42上之電子元件41相對於第一貼接件231之第一導溫部件2311。Please refer to Figures 5 and 7, a schematic diagram of the
請參閱第6、7圖,貼接單元係以壓缸233驅動第二貼接件232相對第一貼接件231作X方向位移,令第二貼接件232之面板2322壓抵載帶42,使載帶42貼接於第一貼接件231上之隔溫件242,並使載帶42上之電子元件41貼接於第一貼接件231之第一導溫部件2311,溫控單元即可利用第一導溫部件2311將第一溫控件241之預設溫度傳導至電子元件41,由於載帶42為撓性可彎曲之薄膜帶體,為提升載帶42之平整度,第一導溫部件2311的面積係小於電子元件41之面積,以避免第一導溫部件2311接觸電子元件41周側之部份載帶42,換言之,即令隔溫件242阻隔第一溫控件241之溫度傳導至電子元件41周側之載帶42
,使載帶42保持平整度,進而提升電子元件41及接點421之測試定位精度;接著承載機構係以馬達211經螺桿螺座組212之螺座帶動移動架213作X方向向前位移,移動架213即帶動輸送機構、貼接單元、溫控單元及具電子元件41之載帶42同步位移,於載帶42保持平整之狀態下,可使電子元件41及載帶42上之接點421精確位於預設測試位置,測試裝置30之探針卡32的探針321即穿過第二貼接件232之開口部2321而精準接觸載帶42上之接點421,以電性連接電子元件41,再搭配溫控單元利用第一溫控件241及第一導溫部件2311導溫電子元件41,使得電子元件41於模擬預設作業溫度環境執行測試作業,達到有效提升測試品質之實用效益。
Please refer to Figures 6 and 7, the bonding unit uses a
請參閱第8、9圖,係本發明溫控單元之第二實施例,其與第一實施例之差異在於溫控單元係於第二貼接件232設有第二導溫部件2323,第二導溫部件2323搭配第二溫控件243,而可傳導預設溫度至電子元件,更進一步
,第二溫控件243可裝配於第二導溫部件2323之後面或內部,第二導溫部件2323之接觸面的高度位置係低於第二貼接件232之接觸面的高度位置,以使第二貼接件232之接觸面可壓接載帶42及防止壓損電子元件;於本實施例中,溫控單元係以隔溫材(如工程塑膠)製作第二貼接件232,使第二貼接件232成為一隔溫件,溫控單元於第二貼接件232設有第二導溫部件2323,並於第二導溫部件2323之內部配置一為加熱件之第二溫控件243。
Please refer to Figures 8 and 9, which are the second embodiment of the temperature control unit of the present invention. The difference from the first embodiment is that the temperature control unit is provided with a second
請參閱第10、11圖,貼接單元係以壓缸233驅動第二貼接件232相對第一貼接件231作X方向位移,令第二貼接件232壓抵載帶42,並使第二導溫部件2323貼接載帶42上之電子元件41,貼接單元之第二溫控件243即利用第二導溫部件2323將預設溫度傳導至電子元件41;接著承載機構係以馬達211經螺桿螺座組212之螺座帶動移動架213作X方向向前位移,移動架213即帶動輸送機構、貼接單元、溫控單元及具電子元件41之載帶42同步位移,測試裝置30之探針卡32的探針321即穿過第二貼接件232之開口部2321而精準接觸載帶42上之接點421,以電性連接電子元件41,溫控單元利用第二溫控件243及第二導溫部件2323使電子元件41位於模擬預設作業溫度環境執行測試作業,進而有效提升測試品質。Please refer to Figures 10 and 11, the attaching unit drives the second attaching
請參閱第2、3、4、12圖,係輸送裝置20應用於電子元件測試設備,包含機台50、測試裝置30、輸送裝置20及中央控制裝置(圖未示出),該測試裝置30係裝配於機台50,並設有至少一對電子元件執行測試作業之測試器,於本實施例中,測試器係設有測試電子元件之探針卡32,該輸送裝置20係配置於機台50上,並設有承載機構、輸送機構及本發明之貼接機構,輸送機構之第一輸送輪221及第二輸送輪222係裝配於承載機構之移動架213,以輸送具電子元件之載帶,本發明貼接機構包含貼接單元及溫控單元,該貼接單元係裝配於承載機構,並設有第一貼接件231及第二貼接件232,以定位載帶,該溫控單元係裝配於貼接單元,並設有第一溫控件241及第一導溫部件2311,以溫控電子元件,承載機構載送該輸送機構、貼接機構及具電子元件之載帶位移,使載帶上之接點精準接觸探針卡32之探針,探針卡32即電性連接電子元件而執行測試作業,該中央控制裝置係用以控制及整合各裝置作動,以執行自動化作業,達到提升作業效能之實用效益。Please refer to Figures 2, 3, 4, and 12, the
[習知][Learning]
11:測試裝置11: Test device
111:探針卡111: Probe Card
12:輸送裝置12: Conveying device
121:移動架121: mobile rack
122:上鏈輪122: upper sprocket
123:下鏈輪123: Lower sprocket
124:貼接件124: Sticker
13:載帶13: carrier tape
14:電子元件14: Electronic components
[本發明][this invention]
20:輸送裝置20: Conveying device
211:馬達211: Motor
212:螺桿螺座組212: Screw seat group
213:移動架213: mobile rack
221:第一輸送輪221: The first conveyor wheel
222:第二輸送輪222: Second conveyor wheel
231:第一貼接件231: The first attachment
2311:第一導溫部件2311: The first temperature guide component
232:第二貼接件232: The second attachment
2321:開口部2321: opening
2322:面板2322: Panel
2323:第二導溫部件2323: The second temperature guide component
233:壓缸233: pressure cylinder
241:第一溫控件241: First temperature control
242:隔溫件242: temperature insulation
243:第二溫控件243: Second temperature control
30:測試裝置30: Test device
31:承板31: bearing plate
32:探針卡32: Probe card
321:探針321: Probe
41:電子元件41: Electronic components
42:載帶42: carrier tape
421:接點421: Contact
50:機台50: machine
第1圖:習知測試裝置及輸送裝置之使用示意圖。 第2圖:本發明輸送裝置第一實施例之側視圖。 第3圖:係第2圖之A部放大示意圖。 第4圖:本發明輸送裝置第一實施例之前視圖。 第5圖:本發明輸送裝置第一實施例之使用示意圖(一)。 第6圖:本發明輸送裝置第一實施例之使用示意圖(二)。 第7圖:係第6圖之B部放大示意圖。 第8圖:本發明輸送裝置第二實施例之示意圖。 第9圖:係第8圖之C部放大示意圖。 第10圖:本發明輸送裝置第二實施例之使用示意圖。 第11圖:係第10圖之D部放大示意圖。 第12圖:本發明輸送裝置應用於測試設備之示意圖。 Figure 1: Schematic diagram of the use of the conventional testing device and conveying device. Figure 2: A side view of the first embodiment of the conveying device of the present invention. Figure 3: An enlarged schematic diagram of part A of Figure 2. Figure 4: A front view of the first embodiment of the conveying device of the present invention. Figure 5: A schematic diagram of the use of the first embodiment of the delivery device of the present invention (1). Figure 6: A schematic diagram of the use of the first embodiment of the delivery device of the present invention (2). Figure 7: is an enlarged schematic diagram of part B of Figure 6. Figure 8: A schematic diagram of the second embodiment of the conveying device of the present invention. Figure 9: is an enlarged schematic view of part C of Figure 8. Figure 10: A schematic diagram of the second embodiment of the conveying device of the present invention. Figure 11: An enlarged schematic diagram of part D in Figure 10. Figure 12: A schematic diagram of the conveying device of the present invention applied to test equipment.
231:第一貼接件 231: The first attachment
2311:第一導溫部件 2311: The first temperature guide component
232:第二貼接件 232: The second attachment
2321:開口部 2321: opening
241:第一溫控件 241: First temperature control
242:隔溫件 242: temperature insulation
32:探針卡 32: Probe card
321:探針 321: Probe
41:電子元件 41: Electronic components
42:載帶 42: carrier tape
421:接點 421: Contact
Claims (9)
Priority Applications (1)
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TW108145533A TWI709521B (en) | 2019-12-12 | 2019-12-12 | Attaching mechanism of conveying device and testing equipment for its application |
Applications Claiming Priority (1)
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TW108145533A TWI709521B (en) | 2019-12-12 | 2019-12-12 | Attaching mechanism of conveying device and testing equipment for its application |
Publications (2)
Publication Number | Publication Date |
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TWI709521B true TWI709521B (en) | 2020-11-11 |
TW202122327A TW202122327A (en) | 2021-06-16 |
Family
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Family Applications (1)
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TW108145533A TWI709521B (en) | 2019-12-12 | 2019-12-12 | Attaching mechanism of conveying device and testing equipment for its application |
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Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6180066A (en) * | 1984-09-27 | 1986-04-23 | Fujitsu Ltd | Apparatus for feeding and heating comb tooth substrate |
US4839587A (en) * | 1988-03-29 | 1989-06-13 | Digital Equipment Corporation | Test fixture for tab circuits and devices |
JP2008175767A (en) * | 2007-01-22 | 2008-07-31 | Sharp Corp | Testing device for semiconductor chip |
TWI534435B (en) * | 2015-02-06 | 2016-05-21 | Hon Tech Inc | Electronic component testing equipment and its application of test classification equipment |
JP6180066B2 (en) | 2011-10-18 | 2017-08-16 | アボミナブル ラブス、エルエルシー | Lens interchangeable goggles designed to prevent fogging |
TWI658978B (en) * | 2018-11-01 | 2019-05-11 | 鴻勁精密股份有限公司 | Positioning mechanism of conveying device and operation equipment applied thereto |
-
2019
- 2019-12-12 TW TW108145533A patent/TWI709521B/en active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6180066A (en) * | 1984-09-27 | 1986-04-23 | Fujitsu Ltd | Apparatus for feeding and heating comb tooth substrate |
US4839587A (en) * | 1988-03-29 | 1989-06-13 | Digital Equipment Corporation | Test fixture for tab circuits and devices |
JP2008175767A (en) * | 2007-01-22 | 2008-07-31 | Sharp Corp | Testing device for semiconductor chip |
JP6180066B2 (en) | 2011-10-18 | 2017-08-16 | アボミナブル ラブス、エルエルシー | Lens interchangeable goggles designed to prevent fogging |
TWI534435B (en) * | 2015-02-06 | 2016-05-21 | Hon Tech Inc | Electronic component testing equipment and its application of test classification equipment |
TWI658978B (en) * | 2018-11-01 | 2019-05-11 | 鴻勁精密股份有限公司 | Positioning mechanism of conveying device and operation equipment applied thereto |
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TW202122327A (en) | 2021-06-16 |
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