TWI709521B - Attaching mechanism of conveying device and testing equipment for its application - Google Patents

Attaching mechanism of conveying device and testing equipment for its application Download PDF

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TWI709521B
TWI709521B TW108145533A TW108145533A TWI709521B TW I709521 B TWI709521 B TW I709521B TW 108145533 A TW108145533 A TW 108145533A TW 108145533 A TW108145533 A TW 108145533A TW I709521 B TWI709521 B TW I709521B
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temperature
temperature control
attaching
conveying device
carrier tape
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TW108145533A
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Chinese (zh)
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TW202122327A (en
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吳永宏
李佳賢
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鴻勁精密股份有限公司
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Abstract

一種輸送裝置之貼接機構,包含貼接單元及溫控單元,其貼接單元係以至少一貼接件供承靠具有電子元件之載帶,該溫控單元係配置於貼接件,並設有溫控件及導溫部件,導溫部件係傳導溫控件之溫度至電子元件;藉以載帶載送電子元件貼接於貼接件上相對應之導溫部件時,溫控單元利用導溫部件將溫控件之溫度傳導至電子元件,使載帶上之電子元件於模擬預設作業溫度環境執行測試作業,達到提高測試效能之實用效益。 A sticking mechanism of a conveying device includes a sticking unit and a temperature control unit. The sticking unit uses at least one sticking piece to support a carrier tape with electronic components. The temperature control unit is arranged on the sticking piece, and Equipped with temperature control and temperature guide parts, the temperature guide part conducts the temperature of the temperature control to the electronic components; when the electronic components are attached to the corresponding temperature guide parts on the bonding parts by the carrier tape, the temperature control unit is used The temperature guide component conducts the temperature of the temperature control to the electronic components, so that the electronic components on the carrier tape perform test operations in an environment that simulates the preset operating temperature, so as to achieve the practical benefit of improving the test performance.

Description

輸送裝置之貼接機構及其應用之測試設備Attaching mechanism of conveying device and testing equipment for its application

本發明係提供一種可使載帶上之電子元件於模擬預設作業溫度環境執行測試作業,進而提高測試效能的貼接機構。The present invention provides a bonding mechanism that enables electronic components on a carrier tape to perform test operations in a simulated preset operating temperature environment, thereby improving test performance.

在現今,電子元件日趨精密微型化,並裝配於一撓性材質製作之載帶(如薄膜載帶),業者為確保電子元件之出廠品質,係以測試設備對載帶上之電子元件執行測試作業,而淘汰出不良品;請參閱第1圖,測試設備係設置一具探針卡111之測試裝置11,並於測試裝置11之後方配置輸送裝置12,輸送裝置12係設有一作X方向位移之移動架121,移動架121上裝配二輸送載帶13之上鏈輪122及下鏈輪123,載帶13上配置複數個待測之電子元件14,電子元件14並以導線電性連接載帶13之接點,載帶13之兩側開設複數個卡孔,以嵌合於上鏈輪122之上鏈齒及下鏈輪123之下鏈齒,另於移動架121上固設一供載帶13貼靠之貼接件124;於測試時,輸送裝置12之移動架121帶動具電子元件14之載帶13朝向測試裝置11之探針卡111作X方向位移,使電子元件14側方之接點電性連接探針卡111之探針而執行測試作業;惟,電子元件14於日後實際使用時 ,可能處於低溫環境或高溫環境,此一測試設備雖可對電子元件14進行電性測試,但無法使載帶13上之電子元件14於模擬日後實際使用之低溫環境或高溫環境進行測試,易言之,即無法確保電子元件14於日後實際使用於低溫環境或高溫環境之品質,以致無法提升測試準確性及測試品質。 Nowadays, electronic components are becoming more and more precise and miniaturized, and they are assembled on a carrier tape made of flexible material (such as a film carrier tape). To ensure the quality of the electronic components, the industry uses test equipment to test the electronic components on the carrier tape. Please refer to Figure 1. The test equipment is equipped with a test device 11 with a probe card 111, and a conveying device 12 is arranged behind the test device 11. The conveying device 12 is equipped with an X direction A movable frame 121 for displacement. The movable frame 121 is equipped with two upper chain wheels 122 and a lower chain wheel 123 on the conveyor belt 13, and a plurality of electronic components 14 to be tested are arranged on the carrier belt 13, and the electronic components 14 are electrically connected by wires The contact points of the carrier tape 13 are provided with multiple holes on both sides of the carrier tape 13 to fit the upper sprocket of the upper sprocket 122 and the lower sprocket of the lower sprocket 123, and a fixed one on the moving frame 121 The attaching member 124 for the carrier tape 13 to abut against; during testing, the moving frame 121 of the conveying device 12 drives the carrier tape 13 with the electronic component 14 to move in the X direction toward the probe card 111 of the testing device 11, so that the electronic component 14 The side contact is electrically connected to the probe of the probe card 111 to perform the test operation; however, when the electronic component 14 is actually used in the future , May be in a low temperature environment or a high temperature environment. Although this test equipment can perform electrical tests on the electronic components 14, it cannot test the electronic components 14 on the carrier tape 13 in simulating the actual low or high temperature environment in the future. In other words, it is impossible to ensure the quality of the electronic component 14 in actual use in a low temperature environment or a high temperature environment in the future, so that the test accuracy and test quality cannot be improved.

本發明之目的一,係提供一種輸送裝置之貼接機構,包含貼接單元及溫控單元,其貼接單元係以至少一貼接件供承靠具有電子元件之載帶,該溫控單元係配置於貼接件,並設有溫控件及導溫部件,導溫部件係傳導溫控件之溫度至電子元件;藉以載帶載送電子元件貼接於貼接件上相對應之導溫部件時,溫控單元利用導溫部件將溫控件之溫度傳導至電子元件,使載帶上之電子元件於模擬預設作業溫度環境執行測試作業,達到提高測試效能之實用效益 。 The first object of the present invention is to provide a pasting mechanism of a conveying device, including a pasting unit and a temperature control unit. The pasting unit uses at least one pasting member to support a carrier tape with electronic components. The temperature control unit It is arranged on the bonding part, and is provided with a temperature control and a temperature guide component. The temperature guide part conducts the temperature of the temperature control to the electronic component; the carrier tape is used to carry the electronic component to the corresponding guide When temperature components, the temperature control unit uses the temperature guide components to transfer the temperature of the temperature control to the electronic components, so that the electronic components on the carrier tape can perform test operations in a simulated preset operating temperature environment to achieve practical benefits of improving test performance .

本發明之目的二,係提供一種輸送裝置之貼接機構,其中,該溫控單元係於導溫部件之周側設有隔溫件,以避免溫控件之溫度傳導至載帶,進而確保載帶之平整度,使載帶之電子元件及接點精準位於預設測試位置,達到提高測試品質之實用效益。The second objective of the present invention is to provide a bonding mechanism for a conveying device, wherein the temperature control unit is provided with a temperature insulation member on the peripheral side of the temperature guide component to prevent the temperature of the temperature control from being transferred to the carrier tape, thereby ensuring The flatness of the carrier tape enables the electronic components and contacts of the carrier tape to be accurately located at the preset test positions, achieving the practical benefit of improving the test quality.

本發明之目的三,係提供一種應用輸送裝置之電子元件測試設備,包含機台、測試裝置、輸送裝置及中央控制裝置,該測試裝置係配置於機台上,並設有至少一測試器,以供對電子元件執行測試作業,該輸送裝置係配置於機台上,並設有承載機構、輸送機構及本發明之貼接機構,以輸送具電子元件之載帶,並以貼接機構溫控電子元件,該中央控制裝置係用以控制及整合各裝置作動,以執行自動化作業,達到提升測試效能之實用效益。The third objective of the present invention is to provide an electronic component testing equipment using a conveying device, including a machine, a testing device, a conveying device, and a central control device. The test device is arranged on the machine and is provided with at least one tester. In order to perform test operations on electronic components, the conveying device is arranged on the machine table, and is equipped with a carrying mechanism, a conveying mechanism, and the bonding mechanism of the present invention to convey the carrier tape of the electronic components, and the bonding mechanism is used for warming Control electronic components. The central control device is used to control and integrate the actions of various devices to perform automated operations and achieve practical benefits of improving test performance.

為使 貴審查委員對本發明作更進一步之瞭解,茲舉一較佳實施例並配合圖式,詳述如後:In order to enable your reviewer to have a better understanding of the present invention, a preferred embodiment is given in conjunction with the drawings. The details are as follows:

請參閱第2、3、4圖,本發明輸送裝置20包含承載機構、輸送機構及本發明之貼接機構;該承載機構係設有至少一由承載驅動器驅動作第一方向(如X方向)位移之移動架,更進一步,承載驅動器可為壓缸、線性馬達或包含馬達及傳動組,承載驅動器可固設於機架或由搬運驅動器驅動作第一、二 、三方向(如X-Z-Y方向)位移;於本實施例中,承載驅動器係包含馬達211及傳動組,馬達211係驅動一呈X方向配置且為螺桿螺座組212之傳動組,螺桿螺座組212之螺座連結傳動一移動架213作X方向位移。 Please refer to Figures 2, 3, and 4, the conveying device 20 of the present invention includes a bearing mechanism, a conveying mechanism, and the attaching mechanism of the present invention; the bearing mechanism is provided with at least one bearing drive driven in a first direction (such as the X direction) The movable frame of displacement, furthermore, the carrying drive can be a cylinder, a linear motor or a motor and a transmission group. The carrying drive can be fixed on the frame or driven by the transport drive as the first and second Displacement in three directions (such as X-Z-Y directions); in this embodiment, the load-bearing driver includes a motor 211 and a transmission group. The motor 211 drives a transmission group that is arranged in the X direction and is the screw and screw seat group 212. The screw base of the screw base group 212 is connected to drive a moving frame 213 for displacement in the X direction.

該輸送機構係裝配於承載機構之移動架213,並於移動架213設置第一輸送輪221及第二輸送輪222,以輸送具電子元件之載帶;於本實施例中 ,第一輸送輪221及第二輸送輪222均為具有傳動齒之齒輪,並呈上、下方配置 ,第一輸送輪221係供嚙合輸入具電子元件之載帶,並載送該載帶作Z方向位移 ,第二輸送輪222則輸出具電子元件之載帶。 The conveying mechanism is assembled on the moving frame 213 of the carrying mechanism, and the moving frame 213 is provided with a first conveying wheel 221 and a second conveying wheel 222 to convey a carrier tape with electronic components; in this embodiment , The first conveying wheel 221 and the second conveying wheel 222 are gears with transmission teeth, and are arranged up and down , The first conveyor wheel 221 is used to engage a carrier tape with electronic components, and carry the carrier tape for displacement in the Z direction , The second conveying wheel 222 outputs a carrier tape with electronic components.

本發明貼接機構係配置於承載機構,並包含貼接單元及溫控單元,該貼接單元係設有至少一貼接件,以供承靠具電子元件之載帶;更進一步 ,貼接件可固定式配置或由貼接驅動器驅動作至少一方向位移,貼接驅動器可為壓缸、線性馬達或包含馬達及傳動組,例如貼接單元可於移動架213上固設貼接件,例如貼接單元可設置二個貼接件,其一貼接件固設於移動架213,另一貼接件由貼接驅動器驅動作X方向位移,使二貼接件供承靠及夾持載帶定位 ;本發明貼接單元之第一實施例包含第一貼接件231及第二貼接件232,第一貼接件231係固設於移動架213,第二貼接件232係位於第一貼接件231之前方,並設有至少一開口部2321,以供顯露載帶之電子元件;更進一步,第二貼接件232可設有二呈Z方向配置之面板,並令二面板保持適當間距而形成開口部2321 ,亦或第二貼接件232係於一呈Z方向配置之面板上開設通孔作為開口部2321,前述二種型態均可供載帶之電子元件顯露於外;於本實施例中,第二貼接件232係設有二呈Z方向配置之面板2322,並令二面板2322保持適當間距而形成開口部2321,第二貼接件232並由貼接驅動器驅動作X方向位移,貼接驅動器係為壓缸233,並裝配於移動架213,以驅動第二貼接件232相對第一貼接件231作X方向位移。 The attaching mechanism of the present invention is arranged on the carrying mechanism and includes an attaching unit and a temperature control unit. The attaching unit is provided with at least one attaching piece for supporting a carrier tape with electronic components; , The sticking part can be fixedly configured or driven by a sticking driver to move in at least one direction. The sticking driver can be a pressure cylinder, a linear motor or a motor and a transmission group. For example, the sticking unit can be fixed on the movable frame 213. For example, the attaching unit can be provided with two attaching pieces. One attaching piece is fixed to the moving frame 213, and the other attaching piece is driven by the attaching driver to move in the X direction, so that the two attaching pieces can be supported. And clamping carrier tape positioning The first embodiment of the attaching unit of the present invention includes a first attaching piece 231 and a second attaching piece 232, the first attaching piece 231 is fixed to the movable frame 213, and the second attaching piece 232 is located at the first At least one opening 2321 is provided on the front of the attaching member 231 for exposing the electronic components of the carrier tape; further, the second attaching member 232 can be provided with two panels arranged in the Z direction, and the two panels can be held An opening 2321 is formed at an appropriate pitch , Or the second attaching member 232 is provided with a through hole as an opening 2321 on a panel arranged in the Z direction, and both of the foregoing two types can be used to expose the electronic components of the carrier tape; in this embodiment, The second bonding member 232 is provided with two panels 2322 arranged in the Z direction, and the two panels 2322 are kept at an appropriate distance to form an opening 2321. The second bonding member 232 is driven by the bonding driver to move in the X direction. The connecting driver is a pressing cylinder 233 and is assembled on the moving frame 213 to drive the second connecting member 232 to move in the X direction relative to the first connecting member 231.

該溫控單元係配置於貼接件,並設有溫控件及導溫部件,導溫部件係傳導溫控件之溫度至電子元件,以供電子元件於模擬高溫或低溫測試環境進行測試,該溫控件可為致冷晶片、加熱件或具流體之載具,該導溫部件可為獨立元件或為溫控件之一部位,亦或為貼接件之一部位,例如可於貼接件裝配具導溫部件之治具,以治具之導溫部件傳導溫控件之溫度至電子元件;例如以溫控件(如致冷晶片或加熱件)之一面作為導溫部件,以接觸傳導溫度至電子元件;例如於貼接件成型導溫部件,以傳導溫控件之溫度至電子元件;又導溫部件之面積係等於或小於電子元件之面積,以避免溫度傳導至電子元件周側之載帶部位;於本實施例中,溫控單元係於第一貼接件231設置一為加熱件之第一溫控件241,以供電子元件於模擬高溫測試環境進行測試,溫控單元係於第一貼接件231設有第一導溫部件2311,第一導溫部件2311係為凸塊,以供將第一貼接件231內之第一溫控件241的溫度導溫至載帶之電子元件;再者,溫控單元係於導溫部件之周側設有至少一隔溫件242,以避免第一溫控件241之溫度傳導至載帶,進而確保載帶之平整度,使載帶之電子元件及接點精準位於預設測試位置,更進一步,隔溫件242可裝配於貼接件,或裝配於具導溫部件之治具,亦或以隔熱材製作之貼接件作為隔溫件,前述方式均可避免導溫部件以外之部位傳導溫度至載帶;於本實施例中,溫控單元係於第一貼接件231上且位於第一導溫部件2311的周側設有隔溫件242,以避免第一溫控件241之溫度直接或間接影響載帶的平整度。The temperature control unit is arranged on the bonding part and is provided with a temperature control and a temperature guide component. The temperature guide component conducts the temperature of the temperature control to the electronic component for testing the electronic component in a simulated high temperature or low temperature test environment. The temperature control can be a refrigerating chip, a heating element or a carrier with a fluid. The temperature guide component can be an independent element or a part of the temperature control, or a part of a bonding part, for example, it can be attached to The connecting piece is assembled with a jig with a temperature-conducting part, and the temperature-conducting part of the jig transfers the temperature of the temperature control to the electronic component; for example, one side of the temperature control (such as a cooling chip or a heating element) is used as the temperature-conducting part. Contact conducts temperature to electronic components; for example, forming a temperature-conducting component on the bonding part to transfer the temperature of the temperature control to the electronic component; and the area of the thermal-conducting component is equal to or smaller than the area of the electronic component to avoid temperature conduction to the electronic component The carrier tape portion on the peripheral side; in this embodiment, the temperature control unit is provided with a first temperature control 241 as a heating element on the first attaching member 231 for testing electronic components in a simulated high temperature test environment. The control unit is provided with a first temperature guide member 2311 on the first bonding member 231, and the first temperature guide member 2311 is a bump for guiding the temperature of the first temperature control 241 in the first bonding member 231 Electronic components that are warm to the carrier tape; in addition, the temperature control unit is provided with at least one temperature insulating member 242 on the peripheral side of the temperature guide component to prevent the temperature of the first temperature control 241 from being transferred to the carrier tape, thereby ensuring the carrier tape The flatness enables the electronic components and contacts of the carrier tape to be accurately located at the preset test positions. Furthermore, the temperature-insulating member 242 can be assembled to the bonding part, or to a fixture with temperature-conducting parts, or to heat insulation The bonding parts made of materials are used as temperature insulating parts. The aforementioned methods can prevent the temperature from conducting the temperature to the carrier tape at parts other than the temperature guide parts; in this embodiment, the temperature control unit is attached to the first bonding part 231 and is located at the first A temperature insulating member 242 is provided on the peripheral side of the temperature guide member 2311 to prevent the temperature of the first temperature control 241 from directly or indirectly affecting the flatness of the carrier tape.

請參閱第5、7圖,輸送裝置20應用於電子元件測試設備之示意圖,測試設備之測試裝置30係於承板31裝配一為探針卡32之測試器,探針卡32具有測試電子元件之探針321;該輸送裝置20係配置於測試裝置30之後方,並令第二貼接件232之開口部2321相對於探針卡32,輸送機構係以第一輸送輪221及第二輸送輪222輸送具複數個待測電子元件41之載帶42作Z方向位移至第一貼接件231及第二貼接件232之間,並令載帶42上之電子元件41相對於第一貼接件231之第一導溫部件2311。Please refer to Figures 5 and 7, a schematic diagram of the conveying device 20 applied to electronic component testing equipment. The testing device 30 of the testing equipment is assembled on the carrier plate 31 with a tester which is a probe card 32, and the probe card 32 has test electronic components. The probe 321; the conveying device 20 is disposed behind the testing device 30, and the opening 2321 of the second attachment 232 is opposite to the probe card 32, and the conveying mechanism is the first conveying wheel 221 and the second conveying The carrier tape 42 of the wheel 222 conveying a plurality of electronic components 41 to be tested is displaced in the Z direction to between the first attaching piece 231 and the second attaching piece 232, and makes the electronic component 41 on the carrier tape 42 relative to the first The first temperature guiding component 2311 of the attaching piece 231.

請參閱第6、7圖,貼接單元係以壓缸233驅動第二貼接件232相對第一貼接件231作X方向位移,令第二貼接件232之面板2322壓抵載帶42,使載帶42貼接於第一貼接件231上之隔溫件242,並使載帶42上之電子元件41貼接於第一貼接件231之第一導溫部件2311,溫控單元即可利用第一導溫部件2311將第一溫控件241之預設溫度傳導至電子元件41,由於載帶42為撓性可彎曲之薄膜帶體,為提升載帶42之平整度,第一導溫部件2311的面積係小於電子元件41之面積,以避免第一導溫部件2311接觸電子元件41周側之部份載帶42,換言之,即令隔溫件242阻隔第一溫控件241之溫度傳導至電子元件41周側之載帶42 ,使載帶42保持平整度,進而提升電子元件41及接點421之測試定位精度;接著承載機構係以馬達211經螺桿螺座組212之螺座帶動移動架213作X方向向前位移,移動架213即帶動輸送機構、貼接單元、溫控單元及具電子元件41之載帶42同步位移,於載帶42保持平整之狀態下,可使電子元件41及載帶42上之接點421精確位於預設測試位置,測試裝置30之探針卡32的探針321即穿過第二貼接件232之開口部2321而精準接觸載帶42上之接點421,以電性連接電子元件41,再搭配溫控單元利用第一溫控件241及第一導溫部件2311導溫電子元件41,使得電子元件41於模擬預設作業溫度環境執行測試作業,達到有效提升測試品質之實用效益。 Please refer to Figures 6 and 7, the bonding unit uses a pressing cylinder 233 to drive the second bonding member 232 to move in the X direction relative to the first bonding member 231, so that the panel 2322 of the second bonding member 232 presses against the carrier tape 42 , The carrier tape 42 is attached to the temperature insulating member 242 on the first attachment member 231, and the electronic component 41 on the carrier tape 42 is attached to the first temperature guide member 2311 of the first attachment member 231, and the temperature is controlled The unit can use the first temperature guiding component 2311 to conduct the preset temperature of the first temperature control 241 to the electronic component 41. Since the carrier tape 42 is a flexible and bendable film tape, in order to improve the flatness of the carrier tape 42, The area of the first temperature guide member 2311 is smaller than the area of the electronic component 41 to prevent the first temperature guide member 2311 from contacting the part of the carrier tape 42 on the peripheral side of the electronic component 41. In other words, the temperature insulating member 242 blocks the first temperature control The temperature of 241 is conducted to the carrier tape 42 around the electronic component 41 , To maintain the flatness of the carrier tape 42, thereby improving the test positioning accuracy of the electronic components 41 and the contacts 421; then the carrier mechanism is driven by the motor 211 through the screw seat of the screw seat group 212 to drive the moving frame 213 to move forward in the X direction. The moving rack 213 drives the conveying mechanism, the attaching unit, the temperature control unit and the carrier tape 42 with the electronic component 41 to move synchronously, so that the electronic component 41 and the contact point on the carrier tape 42 can be maintained while the carrier tape 42 is kept flat. 421 is accurately located at the preset test position, and the probe 321 of the probe card 32 of the test device 30 passes through the opening 2321 of the second attachment member 232 to precisely contact the contact 421 on the carrier tape 42 to electrically connect the electronics The component 41 is combined with the temperature control unit to use the first temperature control 241 and the first temperature guide component 2311 to conduct the temperature electronic component 41, so that the electronic component 41 performs the test operation in a simulated preset operating temperature environment, so as to effectively improve the test quality. benefit.

請參閱第8、9圖,係本發明溫控單元之第二實施例,其與第一實施例之差異在於溫控單元係於第二貼接件232設有第二導溫部件2323,第二導溫部件2323搭配第二溫控件243,而可傳導預設溫度至電子元件,更進一步 ,第二溫控件243可裝配於第二導溫部件2323之後面或內部,第二導溫部件2323之接觸面的高度位置係低於第二貼接件232之接觸面的高度位置,以使第二貼接件232之接觸面可壓接載帶42及防止壓損電子元件;於本實施例中,溫控單元係以隔溫材(如工程塑膠)製作第二貼接件232,使第二貼接件232成為一隔溫件,溫控單元於第二貼接件232設有第二導溫部件2323,並於第二導溫部件2323之內部配置一為加熱件之第二溫控件243。 Please refer to Figures 8 and 9, which are the second embodiment of the temperature control unit of the present invention. The difference from the first embodiment is that the temperature control unit is provided with a second temperature guide member 2323 on the second attachment member 232. The second temperature guide part 2323 is matched with the second temperature control 243, which can conduct the preset temperature to the electronic components, and further , The second temperature control 243 can be assembled on the back surface or inside of the second temperature guide member 2323, and the height position of the contact surface of the second temperature guide member 2323 is lower than the height position of the contact surface of the second bonding member 232, so that The contact surface of the second bonding member 232 can be crimped to the carrier tape 42 and to prevent pressure loss of electronic components; in this embodiment, the temperature control unit is made of a temperature insulating material (such as engineering plastic) to make the second bonding member 232. Make the second bonding member 232 a temperature insulating member, the temperature control unit is provided with a second temperature guiding member 2323 on the second bonding member 232, and a second heating member is arranged inside the second temperature guiding member 2323 Temperature control 243.

請參閱第10、11圖,貼接單元係以壓缸233驅動第二貼接件232相對第一貼接件231作X方向位移,令第二貼接件232壓抵載帶42,並使第二導溫部件2323貼接載帶42上之電子元件41,貼接單元之第二溫控件243即利用第二導溫部件2323將預設溫度傳導至電子元件41;接著承載機構係以馬達211經螺桿螺座組212之螺座帶動移動架213作X方向向前位移,移動架213即帶動輸送機構、貼接單元、溫控單元及具電子元件41之載帶42同步位移,測試裝置30之探針卡32的探針321即穿過第二貼接件232之開口部2321而精準接觸載帶42上之接點421,以電性連接電子元件41,溫控單元利用第二溫控件243及第二導溫部件2323使電子元件41位於模擬預設作業溫度環境執行測試作業,進而有效提升測試品質。Please refer to Figures 10 and 11, the attaching unit drives the second attaching member 232 to move in the X direction with respect to the first attaching member 231 by the pressing cylinder 233, so that the second attaching member 232 is pressed against the carrier tape 42, and The second temperature guide member 2323 is attached to the electronic component 41 on the carrier tape 42, and the second temperature control 243 of the bonding unit uses the second temperature guide member 2323 to conduct the preset temperature to the electronic component 41; then the carrying mechanism is The motor 211 drives the moving frame 213 to move forward in the X direction through the screw seat of the screw and screw seat group 212. The moving frame 213 drives the conveying mechanism, attaching unit, temperature control unit and carrier tape 42 with electronic components 41 to move synchronously, and test The probe 321 of the probe card 32 of the device 30 passes through the opening 2321 of the second attachment member 232 and precisely contacts the contact 421 on the carrier tape 42 to electrically connect the electronic component 41. The temperature control unit uses the second The temperature control 243 and the second temperature guiding component 2323 enable the electronic component 41 to perform a test operation in a simulated preset operating temperature environment, thereby effectively improving the test quality.

請參閱第2、3、4、12圖,係輸送裝置20應用於電子元件測試設備,包含機台50、測試裝置30、輸送裝置20及中央控制裝置(圖未示出),該測試裝置30係裝配於機台50,並設有至少一對電子元件執行測試作業之測試器,於本實施例中,測試器係設有測試電子元件之探針卡32,該輸送裝置20係配置於機台50上,並設有承載機構、輸送機構及本發明之貼接機構,輸送機構之第一輸送輪221及第二輸送輪222係裝配於承載機構之移動架213,以輸送具電子元件之載帶,本發明貼接機構包含貼接單元及溫控單元,該貼接單元係裝配於承載機構,並設有第一貼接件231及第二貼接件232,以定位載帶,該溫控單元係裝配於貼接單元,並設有第一溫控件241及第一導溫部件2311,以溫控電子元件,承載機構載送該輸送機構、貼接機構及具電子元件之載帶位移,使載帶上之接點精準接觸探針卡32之探針,探針卡32即電性連接電子元件而執行測試作業,該中央控制裝置係用以控制及整合各裝置作動,以執行自動化作業,達到提升作業效能之實用效益。Please refer to Figures 2, 3, 4, and 12, the conveying device 20 is applied to electronic component testing equipment, including a machine 50, a testing device 30, a conveying device 20 and a central control device (not shown). The testing device 30 It is assembled on the machine 50 and is provided with at least a pair of testers for testing electronic components. In this embodiment, the tester is provided with a probe card 32 for testing electronic components. The conveying device 20 is arranged on the machine. The table 50 is provided with a supporting mechanism, a conveying mechanism, and the attaching mechanism of the present invention. The first conveying wheel 221 and the second conveying wheel 222 of the conveying mechanism are assembled on the moving frame 213 of the supporting mechanism to convey electronic components. Carrier tape. The attaching mechanism of the present invention includes an attaching unit and a temperature control unit. The attaching unit is assembled on the carrier mechanism and is provided with a first attaching member 231 and a second attaching member 232 to position the carrier tape. The temperature control unit is assembled in the attaching unit, and is provided with a first temperature control 241 and a first temperature guide component 2311, with temperature-controlled electronic components, the carrier mechanism carries the conveying mechanism, the attaching mechanism and the carrier with electronic components With displacement, the contact points on the carrier tape accurately contact the probes of the probe card 32. The probe card 32 is electrically connected to electronic components to perform test operations. The central control device is used to control and integrate the actions of various devices. Perform automated operations to achieve practical benefits of enhancing operational efficiency.

[習知][Learning]

11:測試裝置11: Test device

111:探針卡111: Probe Card

12:輸送裝置12: Conveying device

121:移動架121: mobile rack

122:上鏈輪122: upper sprocket

123:下鏈輪123: Lower sprocket

124:貼接件124: Sticker

13:載帶13: carrier tape

14:電子元件14: Electronic components

[本發明][this invention]

20:輸送裝置20: Conveying device

211:馬達211: Motor

212:螺桿螺座組212: Screw seat group

213:移動架213: mobile rack

221:第一輸送輪221: The first conveyor wheel

222:第二輸送輪222: Second conveyor wheel

231:第一貼接件231: The first attachment

2311:第一導溫部件2311: The first temperature guide component

232:第二貼接件232: The second attachment

2321:開口部2321: opening

2322:面板2322: Panel

2323:第二導溫部件2323: The second temperature guide component

233:壓缸233: pressure cylinder

241:第一溫控件241: First temperature control

242:隔溫件242: temperature insulation

243:第二溫控件243: Second temperature control

30:測試裝置30: Test device

31:承板31: bearing plate

32:探針卡32: Probe card

321:探針321: Probe

41:電子元件41: Electronic components

42:載帶42: carrier tape

421:接點421: Contact

50:機台50: machine

第1圖:習知測試裝置及輸送裝置之使用示意圖。 第2圖:本發明輸送裝置第一實施例之側視圖。 第3圖:係第2圖之A部放大示意圖。 第4圖:本發明輸送裝置第一實施例之前視圖。 第5圖:本發明輸送裝置第一實施例之使用示意圖(一)。 第6圖:本發明輸送裝置第一實施例之使用示意圖(二)。 第7圖:係第6圖之B部放大示意圖。 第8圖:本發明輸送裝置第二實施例之示意圖。 第9圖:係第8圖之C部放大示意圖。 第10圖:本發明輸送裝置第二實施例之使用示意圖。 第11圖:係第10圖之D部放大示意圖。 第12圖:本發明輸送裝置應用於測試設備之示意圖。 Figure 1: Schematic diagram of the use of the conventional testing device and conveying device. Figure 2: A side view of the first embodiment of the conveying device of the present invention. Figure 3: An enlarged schematic diagram of part A of Figure 2. Figure 4: A front view of the first embodiment of the conveying device of the present invention. Figure 5: A schematic diagram of the use of the first embodiment of the delivery device of the present invention (1). Figure 6: A schematic diagram of the use of the first embodiment of the delivery device of the present invention (2). Figure 7: is an enlarged schematic diagram of part B of Figure 6. Figure 8: A schematic diagram of the second embodiment of the conveying device of the present invention. Figure 9: is an enlarged schematic view of part C of Figure 8. Figure 10: A schematic diagram of the second embodiment of the conveying device of the present invention. Figure 11: An enlarged schematic diagram of part D in Figure 10. Figure 12: A schematic diagram of the conveying device of the present invention applied to test equipment.

231:第一貼接件 231: The first attachment

2311:第一導溫部件 2311: The first temperature guide component

232:第二貼接件 232: The second attachment

2321:開口部 2321: opening

241:第一溫控件 241: First temperature control

242:隔溫件 242: temperature insulation

32:探針卡 32: Probe card

321:探針 321: Probe

41:電子元件 41: Electronic components

42:載帶 42: carrier tape

421:接點 421: Contact

Claims (9)

一種輸送裝置之貼接機構,包含:貼接單元:係設有至少一貼接件,以供承靠具電子元件之載帶;溫控單元:係裝配於該貼接單元,並設有至少一溫控件及至少一導溫部件,該溫控件係配置於至少一該貼接件,該導溫部件係供該溫控件與該載帶之該電子元件作熱交換,並於該導溫部件之周側設有至少一隔溫件,該隔溫件相對於該載帶,而避免該溫控件與該載帶作熱交換,以確保該載帶之平整度。 A sticking mechanism of a conveying device, comprising: sticking unit: at least one sticking piece is provided for supporting a carrier tape with electronic components; temperature control unit: mounted on the sticking unit and provided with at least A temperature control and at least one temperature guide component, the temperature control is arranged on at least one of the attachment parts, the temperature guide component is for the temperature control and the electronic component of the carrier for heat exchange, and in the At least one temperature insulating member is arranged on the peripheral side of the temperature guide component, and the temperature insulating member is opposite to the carrier tape to avoid heat exchange between the temperature control and the carrier tape to ensure the flatness of the carrier tape. 依申請專利範圍第1項所述之輸送裝置之貼接機構,其中,該溫控件係為致冷晶片、加熱件或具流體之載具。 According to the attachment mechanism of the conveying device described in item 1 of the scope of patent application, the temperature control is a cooling chip, a heating element or a carrier with fluid. 依申請專利範圍第1項所述之輸送裝置之貼接機構,其中,該導溫部件係為該溫控件之一部位或為該貼接件之一部位,或於該貼接件設置具該導溫部件之治具。 According to the attachment mechanism of the conveying device described in item 1 of the scope of patent application, wherein the temperature guide component is a part of the temperature control or a part of the attachment part, or is provided with a device on the attachment part The fixture for the temperature guide component. 依申請專利範圍第1項所述之輸送裝置之貼接機構,其中,該貼接單元包含第一貼接件及第二貼接件,該溫控單元係於該第一貼接件設有至少一為第一溫控件之該溫控件及至少一為第一導溫部件之該導溫部件。 According to the attaching mechanism of the conveying device described in item 1 of the scope of patent application, the attaching unit includes a first attaching piece and a second attaching piece, and the temperature control unit is provided with the first attaching piece At least one is the first temperature control and at least one is the first temperature guide. 依申請專利範圍第1項所述之輸送裝置之貼接機構,其中,該貼接單元包含第一貼接件及第二貼接件,該溫控單元係於該第二貼接件設有至少一為第二溫控件之該溫控件及至少一為第二導溫部件之該導溫部件。 According to the attaching mechanism of the conveying device described in item 1 of the scope of patent application, the attaching unit includes a first attaching piece and a second attaching piece, and the temperature control unit is provided with the second attaching piece At least one is the second temperature control and at least one is the second temperature guide. 依申請專利範圍第1項所述之輸送裝置之貼接機構,其中,該溫控單元之該導溫部件的面積係等於或小於該電子元件之面積。 According to the attachment mechanism of the conveying device described in item 1 of the scope of patent application, the area of the temperature guide component of the temperature control unit is equal to or smaller than the area of the electronic component. 依申請專利範圍第1項所述之輸送裝置之貼接機構,其中,該隔溫件係裝配於該貼接件或以隔熱材製作之該貼接件作為該隔溫件,或於該貼接件設置具該導溫部件及該隔溫件之治具。 According to the attachment mechanism of the conveying device described in item 1 of the scope of patent application, wherein the temperature insulation member is assembled to the attachment member or the attachment member made of heat insulation material is used as the temperature insulation member, or The attaching part is provided with a jig with the temperature guide part and the temperature insulation part. 依申請專利範圍第1項所述之輸送裝置之貼接機構,該輸送裝置更包含承載機構及輸送機構,該承載機構係設有至少一由承載驅動器驅動作第一方向位移之移動架,該輸送機構係裝配於該承載機構之該移動架,並於該移動架設有第一輸送輪及第二輸送輪,以輸送該載帶至該貼接單元,該貼接單元係裝配於該移動架。 According to the attachment mechanism of the conveying device described in item 1 of the scope of patent application, the conveying device further includes a bearing mechanism and a conveying mechanism. The bearing mechanism is provided with at least one moving frame driven by a bearing driver to move in a first direction. The conveying mechanism is assembled on the moving rack of the carrying mechanism, and the moving rack is provided with a first conveying wheel and a second conveying wheel to convey the carrier tape to the attaching unit, and the attaching unit is assembled on the moving rack . 一種應用輸送裝置之電子元件測試設備,包含:機台;輸送裝置:係配置於該機台上,包含承載機構、輸送機構及至少一依申請專利範圍第1項所述之輸送裝置之貼接機構,以輸送具電子元件之載帶,並以該貼接機構溫控該電子元件;測試裝置:係配置於該機台上,並設有至少一測試器,以供測試該電子元件;中央控制裝置:係以控制及整合各裝置作動,以執行自動化作業。 An electronic component testing equipment using a conveying device, including: a machine; a conveying device: arranged on the machine, including a carrying mechanism, a conveying mechanism, and at least one attachment of the conveying device described in item 1 of the scope of patent application The mechanism is a carrier tape for conveying electronic components, and the bonding mechanism is used to temperature-control the electronic components; the testing device is arranged on the machine platform and is provided with at least one tester for testing the electronic components; center Control device: It controls and integrates the actions of various devices to perform automated operations.
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US4839587A (en) * 1988-03-29 1989-06-13 Digital Equipment Corporation Test fixture for tab circuits and devices
JP2008175767A (en) * 2007-01-22 2008-07-31 Sharp Corp Testing device for semiconductor chip
TWI534435B (en) * 2015-02-06 2016-05-21 Hon Tech Inc Electronic component testing equipment and its application of test classification equipment
JP6180066B2 (en) 2011-10-18 2017-08-16 アボミナブル ラブス、エルエルシー Lens interchangeable goggles designed to prevent fogging
TWI658978B (en) * 2018-11-01 2019-05-11 鴻勁精密股份有限公司 Positioning mechanism of conveying device and operation equipment applied thereto

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6180066A (en) * 1984-09-27 1986-04-23 Fujitsu Ltd Apparatus for feeding and heating comb tooth substrate
US4839587A (en) * 1988-03-29 1989-06-13 Digital Equipment Corporation Test fixture for tab circuits and devices
JP2008175767A (en) * 2007-01-22 2008-07-31 Sharp Corp Testing device for semiconductor chip
JP6180066B2 (en) 2011-10-18 2017-08-16 アボミナブル ラブス、エルエルシー Lens interchangeable goggles designed to prevent fogging
TWI534435B (en) * 2015-02-06 2016-05-21 Hon Tech Inc Electronic component testing equipment and its application of test classification equipment
TWI658978B (en) * 2018-11-01 2019-05-11 鴻勁精密股份有限公司 Positioning mechanism of conveying device and operation equipment applied thereto

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