TWI704043B - Resin molding device and manufacturing method of resin molded product - Google Patents

Resin molding device and manufacturing method of resin molded product Download PDF

Info

Publication number
TWI704043B
TWI704043B TW107105777A TW107105777A TWI704043B TW I704043 B TWI704043 B TW I704043B TW 107105777 A TW107105777 A TW 107105777A TW 107105777 A TW107105777 A TW 107105777A TW I704043 B TWI704043 B TW I704043B
Authority
TW
Taiwan
Prior art keywords
light
molding
substrate
resin
mold
Prior art date
Application number
TW107105777A
Other languages
Chinese (zh)
Other versions
TW201838783A (en
Inventor
後藤智行
岩田康弘
花坂周邦
Original Assignee
日商東和股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商東和股份有限公司 filed Critical 日商東和股份有限公司
Publication of TW201838783A publication Critical patent/TW201838783A/en
Application granted granted Critical
Publication of TWI704043B publication Critical patent/TWI704043B/en

Links

Images

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C43/00Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor
    • B29C43/02Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor of articles of definite length, i.e. discrete articles
    • B29C43/18Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor of articles of definite length, i.e. discrete articles incorporating preformed parts or layers, e.g. compression moulding around inserts or for coating articles
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C43/00Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor
    • B29C43/32Component parts, details or accessories; Auxiliary operations
    • B29C43/58Measuring, controlling or regulating
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/50Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
    • H01L21/56Encapsulations, e.g. encapsulation layers, coatings
    • H01L21/565Moulds
    • H01L21/566Release layers for moulds, e.g. release layers, layers against residue during moulding
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C43/00Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor
    • B29C43/02Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor of articles of definite length, i.e. discrete articles
    • B29C43/18Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor of articles of definite length, i.e. discrete articles incorporating preformed parts or layers, e.g. compression moulding around inserts or for coating articles
    • B29C2043/181Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor of articles of definite length, i.e. discrete articles incorporating preformed parts or layers, e.g. compression moulding around inserts or for coating articles encapsulated
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C43/00Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor
    • B29C43/32Component parts, details or accessories; Auxiliary operations
    • B29C43/58Measuring, controlling or regulating
    • B29C2043/585Measuring, controlling or regulating detecting defects, e.g. foreign matter between the moulds, inaccurate position, breakage

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Moulds For Moulding Plastics Or The Like (AREA)
  • Casting Or Compression Moulding Of Plastics Or The Like (AREA)

Abstract

本發明提供樹脂成型裝置及樹脂成型品的製造方法。目的在於抑制由樹脂成型對象的定位引起的成型不良的產生。樹脂成型裝置包括:成型模,具有彼此相對配置的作為第一模的上模(9)及作為第二模的下模(10);供給機構(13),用於向型面供給作為樹脂成型對象的成型前基板(15);定位機構(25,26),用於將成型前基板(15)定位到導向部件(23,24);合模機構,用於對成型模進行合模;發光元件(27,28),用於發出照射光;第一受光元件(31,32),被設置於供給機構(13)且能夠接收照射光;和判斷部,用於對成型前基板(15)的定位進行判斷,在上模(9)上設置有使來自發光元件(27,28)的照射光通過的第一出射用通孔(29,30),判斷部基於第一受光元件(31,32)對通過第一出射用通孔(29,30)的照射光的檢測,判斷成型前基板(15)是否正常定位到導向部件(23,24)。 The present invention provides a resin molding device and a method of manufacturing a resin molded product. The purpose is to suppress the occurrence of molding defects caused by the positioning of the resin molding object. The resin molding device includes: a molding die with an upper die (9) as a first die and a lower die (10) as a second die arranged opposite to each other; a supply mechanism (13) for supplying the molding surface as a resin molding The object's pre-molding substrate (15); positioning mechanism (25, 26) for positioning the pre-molding substrate (15) to the guide member (23, 24); mold clamping mechanism for clamping the molding mold; light emitting The elements (27, 28) are used to emit irradiated light; the first light-receiving element (31, 32) is provided in the supply mechanism (13) and can receive the irradiated light; and the judging part is used to compare the pre-molding substrate (15) The upper mold (9) is provided with a first outgoing through hole (29, 30) through which the irradiated light from the light emitting element (27, 28) passes, and the judgment unit is based on the first light receiving element (31, 32) Detecting the irradiated light passing through the first exit through holes (29, 30) to determine whether the substrate (15) is normally positioned on the guide member (23, 24) before molding.

Description

樹脂成型裝置及樹脂成型品的製造方法 Resin molding device and manufacturing method of resin molded product

本發明涉及一種用於對樹脂成型對象進行樹脂成型的樹脂成型裝置及樹脂成型品的製造方法。 The present invention relates to a resin molding apparatus for resin molding a resin molding object and a method of manufacturing a resin molded product.

作為現有技術,例如在專利文獻1中公開了如下的樹脂模塑裝置,該裝置具備:被成型品5的供給部8;用於支撐被成型品的板夾具10的供給部20;安裝部30,通過檢測設置於被成型品5上的定位用識別部並將被成型品5安裝在板夾具10的規定位置上;壓制裝置40,設置有將安裝有被成型品5的板夾具10定位到樹脂模塑金屬模50、51的定位裝置,並且安裝有通過與板夾具10一同夾緊被成型品5而進行樹脂模塑的樹脂模塑金屬模50、51;通過樹脂模塑金屬模50、51樹脂成型後的成型品62的收納部60;和給排機構70、72,用於將被成型品5、成型品62及板夾具10給排到被成型品5的供給部8、板夾具10的供給部20、安裝部30、壓制裝置40及成型品62的收納部60中。 As a prior art, for example, Patent Document 1 discloses a resin molding apparatus including: a supply part 8 of a molded product 5; a supply part 20 of a plate holder 10 for supporting the molded product; and a mounting part 30 , By detecting the positioning recognition part provided on the molded product 5 and mounting the molded product 5 on the predetermined position of the plate clamp 10; the pressing device 40 is provided with the plate clamp 10 on which the molded product 5 is mounted Positioning devices for the resin molding metal molds 50, 51, and are equipped with resin molding metal molds 50, 51 that perform resin molding by clamping the molded product 5 together with the plate clamp 10; the resin molding metal molds 50, 51 51 The receiving part 60 of the molded product 62 after resin molding; and the feeding and discharging mechanism 70, 72 for feeding and discharging the molded product 5, the molded product 62 and the plate clamp 10 to the supply part 8 and the plate clamp of the molded product 5 10 of the supply section 20, the mounting section 30, the pressing device 40, and the storage section 60 of the molded product 62.

此外,在專利文獻1中,作為定位裝置,例如在專利文獻1的第6圖所示那樣設置在下模44的定位銷45上抵接板夾具10(參照第[0023]段)。 In addition, in Patent Document 1, as the positioning device, for example, as shown in FIG. 6 of Patent Document 1, the positioning pin 45 provided on the lower mold 44 abuts the plate jig 10 (see paragraph [0023]).

專利文獻1:日本專利公開2008-132730號公報 Patent Document 1: Japanese Patent Publication No. 2008-132730

在專利文獻1中未記載如下內容:在使板夾具10與定位銷45抵接的定位中,確認是否適當地進行了定位。於是,通過成型後的成型品判斷起因於定位的成型不良。 Patent Document 1 does not describe the following: in the positioning in which the plate clamp 10 is brought into contact with the positioning pin 45, it is confirmed whether or not the positioning is properly performed. Therefore, it is judged from the molded product after molding that the molding defect due to positioning is performed.

本發明是為了解決上述問題而提出的。其目的在於,提供一種能夠抑制起因於定位的成型不良的產生的樹脂成型裝置及樹脂成型品的製造方法。 The present invention is proposed to solve the above-mentioned problems. An object thereof is to provide a resin molding apparatus and a method of manufacturing a resin molded product that can suppress the occurrence of molding defects caused by positioning.

為了解決上述問題,本發明所涉及的樹脂成型裝置包括:成型模,具有彼此相對配置的第一模及第二模;供給機構,用於向所述第一模及所述第二模中的任一個模的型面供給樹脂成型對象;定位機構,用於在所述型面上將所述樹脂成型對象定位到導向部件;合模機構,用於對所述成型模進行合模;發光元件,用於發出照射光;第一受光元件,被設置於所述供給機構且能夠接收所述照射光;和判斷部,用於對所述樹脂成型對象的定位進行判斷,在所述一個模中設置有使來自所述發光元件的所述照射光通過的第一出射用通孔,所述判斷部基於所述第一受光元件對通過所述第一出射用通孔的所述照射光的檢測,判斷所述樹脂成型對象是否正常定位到所述導向部件。 In order to solve the above-mentioned problems, the resin molding apparatus according to the present invention includes: a molding die having a first die and a second die arranged opposite to each other; and a supply mechanism for feeding the first die and the second die The molding surface of any mold is supplied with a resin molding object; a positioning mechanism for positioning the resin molding object to a guide member on the molding surface; a mold clamping mechanism for clamping the molding mold; a light emitting element , Used to emit irradiated light; the first light-receiving element is provided in the supply mechanism and can receive the irradiated light; and a judging section for judging the positioning of the resin molding object, in the one mold A first emission through hole is provided through which the irradiation light from the light emitting element passes, and the judgment unit is based on the detection of the irradiation light passing through the first emission through hole by the first light receiving element , Judging whether the resin molded object is normally positioned on the guide member.

為了解決上述問題,本發明所涉及的樹脂成型品的製造方法包括:供給製程,通過供給機構向具有彼此相對配置的第一模及第二模的成型模中的任一個模的型面供給樹脂成型對象;定位製程,在所述型面上將所述樹脂成型對象定位到導向部件;照射製程,從發光元件發出照射光,所述照射光通過設置於所述一個模的第一出射用通孔;檢測製程,由設置於所述供給機構的第一受光元件對通過第一出射用通孔的所述照射光進行檢測;判斷製程,基於所述檢測製程中的檢測,判斷所述樹脂成型對象是否正常定位到所述導向部件;和樹脂成型製程,在所述判斷製程中判斷為所述樹脂成型對象正常定位的情況下,對所述成型模進行合模而進行樹脂成型。 In order to solve the above-mentioned problems, the method of manufacturing a resin molded product according to the present invention includes a supply process of supplying resin to the molding surface of any one of the molding molds having a first mold and a second mold disposed opposite to each other through a supply mechanism Molding object; positioning process, positioning the resin molding object to the guide member on the molding surface; irradiating process, emitting irradiated light from the light-emitting element, the irradiated light passes through the first exit pass provided in the one mold Hole; detection process, by the first light-receiving element provided in the supply mechanism to detect the irradiated light passing through the first outgoing through hole; judging process, based on the detection in the detection process, judging the resin molding Whether the object is normally positioned to the guide member; and a resin molding process, when it is determined that the resin molded object is normally positioned in the judgment process, the molding mold is clamped to perform resin molding.

根據本發明,能夠抑制起因於定位的成型不良的產生。 According to the present invention, it is possible to suppress the occurrence of molding defects caused by positioning.

1:樹脂成型單元 1: Resin molding unit

10:下模 10: Lower die

11:成型模 11: Forming mold

12:樹脂成型對象 12: Resin molding objects

13:供給機構 13: Supply organization

14:半導體晶片 14: Semiconductor wafer

15:成型前基板 15: Substrate before molding

16:型腔 16: cavity

17:離型膜 17: Release film

18:分送器 18: Distributor

19:移動機構 19: Mobile agency

2:底座 2: base

20:液狀樹脂 20: Liquid resin

21:硬化樹脂 21: Hardened resin

22:樹脂成型品 22: Resin molded products

23、23X、24:導向部件 23, 23X, 24: guide parts

25、26:定位機構 25, 26: positioning mechanism

27、27a、27b、28、28a、28b、35、36:發光元件 27, 27a, 27b, 28, 28a, 28b, 35, 36: light-emitting element

29、29a、29b、30、30a、30b:第一出射用通孔 29, 29a, 29b, 30, 30a, 30b: through holes for the first exit

3:連接桿 3: connecting rod

31、31a、31b、32、32a、32b:第一受光元件 31, 31a, 31b, 32, 32a, 32b: the first light receiving element

33:照射光 33: Irradiation light

34:間隙 34: gap

37、38:第二出射用通孔 37, 38: Through hole for second ejection

39、40:第二受光元件 39, 40: second light receiving element

4、49:固定台板 4.49: Fixed table

41、42、50、51、55、56、57、60:導光部 41, 42, 50, 51, 55, 56, 57, 60: light guide

43、43a、43b、44、44a、44b:反射鏡 43, 43a, 43b, 44, 44a, 44b: mirror

45:供給機構 45: Supply organization

46、47:入射用通孔 46, 47: Through hole for incident

48、9:上模 48, 9: upper die

5:可動台板 5: movable table

52、53、58、58a、58b、61、61a、61b:光纖 52, 53, 58, 58a, 58b, 61, 61a, 61b: optical fiber

54:光纖用透鏡 54: Optical fiber lens

59、62:分支部件 59, 62: branch parts

6:合模機構 6: Mold clamping mechanism

63:樹脂成型裝置 63: Resin molding device

64:基板供給收納模組 64: substrate supply storage module

65A、65B、65C:成型模組 65A, 65B, 65C: molding module

66:樹脂供給模組 66: Resin supply module

67:成型前基板供給部 67: Substrate supply section before molding

68:樹脂成型品收納部 68: Resin molded product storage section

69:基板載置部 69: Board placement section

7:啟動源 7: Startup source

70:離型膜供給機構 70: Release film supply mechanism

71:判斷部 71: Judgment Department

72:控制部 72: Control Department

8:傳遞部件 8: transfer parts

第1圖係表示在本發明所涉及的樹脂成型裝置中樹脂成型單元的大致結構的主視圖。 Fig. 1 is a front view showing the general structure of the resin molding unit in the resin molding apparatus according to the present invention.

第2圖的(a)~(d)係表示對樹脂成型對象進行樹脂成型的製程的示意性剖視圖。 (A) to (d) of FIG. 2 are schematic cross-sectional views showing the process of resin molding a resin molding object.

第3圖係表示在實施方式1中用於檢驗樹脂成型對象係否正常定位在上模的型面上的機構的示意圖,(a)係上模的仰視圖,(b)係成型模及供給機構的大致剖視圖,(c)係供給機構的俯視圖。 Figure 3 is a schematic diagram showing the mechanism used to check whether the resin molding object is properly positioned on the surface of the upper mold in the first embodiment, (a) is a bottom view of the upper mold, (b) is a molding mold and its supply A schematic cross-sectional view of the mechanism, (c) is a top view of the supply mechanism.

第4圖係在實施方式1中用於檢驗定位在上模的型面上的樹脂成型對象是否正常定位的示意圖,(a)係表示對樹脂成型對象進行定位的狀態的示意性剖視圖,(b)係表示正常定位的狀態的示意性剖視圖,(c)係表示產生定位不良的狀態的示意性剖視圖。 Figure 4 is a schematic diagram used to verify whether the resin molding object positioned on the molding surface of the upper mold is normally positioned in Embodiment 1, (a) is a schematic cross-sectional view showing the state of positioning the resin molding object, (b ) Is a schematic cross-sectional view showing a state of normal positioning, and (c) is a schematic cross-sectional view showing a state of poor positioning.

第5圖係表示在實施方式1中用於檢驗是否產生導向部件的異常或樹脂成型對象的翹曲或彎曲等變形的機構的示意圖,(a)係上模的仰視圖,(b)係成型模及供給機構的示意性剖視圖,(c)係供給機構的俯視圖。 Figure 5 is a schematic diagram showing the mechanism used to check whether the guide member is abnormal or the resin molding object is warped or bent in the first embodiment. (a) is the bottom view of the upper mold, (b) is the molding A schematic cross-sectional view of the mold and the supply mechanism, (c) is a top view of the supply mechanism.

第6圖係在實施方式1中用於檢驗是否產生導向部件的異常或樹脂成型對象的翹曲的示意圖,(a)係表示樹脂成型對象正常定位的狀態的示意性剖視圖,(b)係表示導向部件產生異常的狀態的示意性剖視圖,(c)係表示樹脂成型對象產生翹曲的狀態的示意性剖視圖。 Fig. 6 is a schematic diagram for checking whether an abnormality of the guide member or warpage of the resin molded object occurs in the first embodiment, (a) is a schematic cross-sectional view showing a state in which the resin molded object is normally positioned, and (b) shows A schematic cross-sectional view of a state in which an abnormality occurs in the guide member, and (c) is a schematic cross-sectional view showing a state in which the resin molded object is warped.

第7圖係表示在實施方式2中將樹脂成型對象定位在上模的型面上的狀態的示意圖,(a)係上模的仰視圖,(b)係成型模及供給機構的示意性剖視圖,(c)係供給機構的俯視圖。 Fig. 7 is a schematic diagram showing a state in which the resin molding object is positioned on the molding surface of the upper mold in the second embodiment, (a) is a bottom view of the upper mold, (b) is a schematic cross-sectional view of the molding mold and the supply mechanism , (C) is the top view of the supply mechanism.

第8圖係表示在實施方式3中將樹脂成型對象定位在上模的型面上的狀態的示意圖,(a)係上模的仰視圖,(b)係成型模及供給機構的示意性剖視圖,(c)係供給機構的俯視圖。 Figure 8 is a schematic diagram showing a state in which the resin molding object is positioned on the molding surface of the upper mold in the third embodiment, (a) is a bottom view of the upper mold, (b) is a schematic cross-sectional view of the molding mold and the supply mechanism , (C) is the top view of the supply mechanism.

第9圖係表示在實施方式4中將樹脂成型對象定位在上模的型面上的狀態的示意圖,(a)係上模的仰視圖,(b)係成型模及供給機構的示意性剖視圖,(c)係供給機構的俯視圖。 Figure 9 is a schematic diagram showing a state in which the resin molding object is positioned on the molding surface of the upper mold in the fourth embodiment, (a) is a bottom view of the upper mold, (b) is a schematic cross-sectional view of the molding mold and the supply mechanism , (C) is the top view of the supply mechanism.

第10圖係表示在實施方式5中將樹脂成型對象定位在上模的型面上的狀態的示意圖,(a)係上模的仰視圖,(b)係成型模及供給機構的示意性剖視圖,(c)係供給機構的俯視圖。 Figure 10 is a schematic diagram showing the state of positioning the resin molding object on the molding surface of the upper mold in the fifth embodiment, (a) is a bottom view of the upper mold, (b) is a schematic cross-sectional view of the molding mold and the supply mechanism , (C) is the top view of the supply mechanism.

第11圖係表示在實施方式6中將樹脂成型對象定位在上模的型面上的狀態的示意圖,(a)係上模的仰視圖,(b)係成型模及供給機構的示意性剖視圖,(c)係供給機構的俯視圖。 Figure 11 is a schematic diagram showing a state where the resin molding object is positioned on the molding surface of the upper mold in the sixth embodiment, (a) is a bottom view of the upper mold, (b) is a schematic cross-sectional view of the molding mold and the supply mechanism , (C) is the top view of the supply mechanism.

第12圖係表示在實施方式7中將樹脂成型對象定位在上模的型面上的狀態的示意圖,(a)係上模的仰視圖,(b)係成型模及供給機構的示意性剖視圖,(c)係供給機構的俯視圖。 Figure 12 is a schematic diagram showing the state in which the resin molding object is positioned on the molding surface of the upper mold in the seventh embodiment, (a) is a bottom view of the upper mold, and (b) is a schematic cross-sectional view of the molding mold and the supply mechanism , (C) is the top view of the supply mechanism.

第13圖係表示在實施方式8中將樹脂成型對象定位在上模的型面上的狀態的示意圖,(a)係上模的仰視圖,(b)係成型模及供給機構的示意性剖視圖,(c)係供給機構的俯視圖。 Figure 13 is a schematic diagram showing the state of positioning the resin molding object on the molding surface of the upper mold in the eighth embodiment, (a) is a bottom view of the upper mold, (b) is a schematic cross-sectional view of the molding mold and the supply mechanism , (C) is the top view of the supply mechanism.

第14圖係表示在本發明所涉及的樹脂成型裝置中裝置的大致結構的俯視圖。 Fig. 14 is a plan view showing the general structure of the resin molding apparatus according to the present invention.

下面,參照圖式對本發明的實施方式進行說明。本發明中的任一幅圖均為了易於理解而進行了適當省略或誇張來示意性地繪製。對相同的結構 要素使用了相同的符號,並適當省略了說明。此外,在本發明中,“樹脂成型”係指利用成型模對樹脂進行成型,係包含利用成型模對封裝樹脂部進行成型的“樹脂封裝”的概念表達。另外,“樹脂成型品”係指至少包含樹脂成型後的樹脂部分的產品,係包含後述的安裝在基板上的半導體晶片通過成型模被樹脂成型而樹脂封裝後的形式的封裝後基板的概念表達。 Hereinafter, embodiments of the present invention will be described with reference to the drawings. Any figure in the present invention is schematically drawn for ease of understanding and is appropriately omitted or exaggerated. To the same structure The same symbols are used for the elements, and the description is omitted appropriately. In addition, in the present invention, "resin molding" refers to molding a resin using a molding die, and includes the concept expression of "resin encapsulation" in which a molding die is used to mold a sealing resin portion. In addition, "resin molded product" refers to a product containing at least a resin portion after resin molding, and is a conceptual expression of a packaged substrate including a form in which a semiconductor wafer mounted on a substrate described later is resin molded by a molding die and resin encapsulated. .

[實施方式1] [Embodiment 1]

(樹脂成型單元的結構) (Structure of resin molding unit)

參照第1圖對本發明所涉及的樹脂成型裝置中使用的樹脂成型單元的機構進行說明。第1圖所示的樹脂成型單元1為例如使用壓縮成型法或傳遞成型法的樹脂成型單元。樹脂成型單元1具有底座2。在底座2的四角固定有作為保持部件的四根連接桿3。在朝向上方延伸的四根連接桿3的上部固定有與底座2相對的固定台板4。在底座2與固定台板4之間,與底座2和固定台板4分別相對的可動台板5被套設於四根連接桿3上。在底座2上設置有用於使可動台板5升降的合模機構6。合模機構6通過使可動台板5升降而進行成型模的開模和合模。合模機構6由驅動源7和傳遞部件8的組合而構造。例如,作為合模機構6,可使用伺服電動機與滾珠絲杠的組合或液壓缸與連桿的組合。作為合模機構,也可以使用肘桿機構。 The mechanism of the resin molding unit used in the resin molding apparatus according to the present invention will be described with reference to Fig. 1. The resin molding unit 1 shown in FIG. 1 is a resin molding unit using a compression molding method or a transfer molding method, for example. The resin molding unit 1 has a base 2. Four connecting rods 3 as holding members are fixed to the four corners of the base 2. A fixed table 4 opposite to the base 2 is fixed to the upper part of the four connecting rods 3 extending upward. Between the base 2 and the fixed platform 4, the movable platform 5 opposite to the base 2 and the fixed platform 4 is sleeved on the four connecting rods 3. The base 2 is provided with a mold clamping mechanism 6 for raising and lowering the movable platen 5. The mold clamping mechanism 6 raises and lowers the movable platen 5 to open and close the molding mold. The mold clamping mechanism 6 is constructed by a combination of the drive source 7 and the transmission member 8. For example, as the mold clamping mechanism 6, a combination of a servo motor and a ball screw or a combination of a hydraulic cylinder and a connecting rod can be used. As the clamping mechanism, a toggle mechanism can also be used.

在固定台板4的下表面上固定有上模9。在上模9的正下方,與上模9相對地設置有下模10。下模10被固定在可動台板5的上表面上。上模9和下模10一併構造成型模11。在上模9及下模10中適當設置有作為加熱裝置的加熱器(未圖示)。 An upper mold 9 is fixed on the lower surface of the fixed platen 4. Just below the upper mold 9, a lower mold 10 is provided opposite to the upper mold 9. The lower mold 10 is fixed on the upper surface of the movable platen 5. The upper mold 9 and the lower mold 10 constitute a molding mold 11 together. The upper mold 9 and the lower mold 10 are appropriately provided with heaters (not shown) as heating devices.

在上模9與下模10之間,例如配置有用於向上模9的型面供給樹脂成型對象12的供給機構13。作為樹脂成型對象12,例如安裝有半導體晶片的基板、安裝有半導體晶片的引線框等被供給到上模9的型面上。在該情況下,雖然示出了向上模9的型面供給樹脂成型對象12的情況,但也可以向下模10的型面供給樹脂成型對象12。 Between the upper mold 9 and the lower mold 10, for example, a supply mechanism 13 for supplying the resin molding object 12 to the surface of the upper mold 9 is arranged. As the resin molding object 12, for example, a substrate on which a semiconductor wafer is mounted, a lead frame on which a semiconductor wafer is mounted, and the like are supplied to the molding surface of the upper mold 9. In this case, although the case where the resin molding object 12 is supplied to the molding surface of the upper mold 9 is shown, the resin molding object 12 may be supplied to the molding surface of the lower mold 10.

(樹脂成型品的製造方法) (Method of manufacturing resin molded products)

參照第1圖~第2圖,對以下方法的製程進行說明:該方法通過在設置於樹脂成型裝置(參照第14圖)的樹脂成型單元1中,例如對作為樹脂成型對象安裝在基板上的半導體晶片進行樹脂成型而製造樹脂成型品。 With reference to Figures 1 to 2, the manufacturing process of the following method will be described: This method uses the resin molding unit 1 installed in the resin molding apparatus (refer to Figure 14), for example, the resin molding object mounted on the substrate The semiconductor wafer is resin molded to produce a resin molded product.

如第2圖的(a)所示,首先,在樹脂成型裝置中,對上模9和下模10進行開模。接著,使用供給機構13,將作為安裝有半導體晶片14的基板的成型前基板15運送到上模9與下模10之間。在該情況下,由於將成型前基板15供給到上模9的型面上,因此以安裝有半導體晶片14的面朝下的方式運送成型前基板15。接著,通過使供給機構13上升,將成型前基板15供給到上模9的型面上。 As shown in Fig. 2(a), first, in the resin molding apparatus, the upper mold 9 and the lower mold 10 are opened. Next, the supply mechanism 13 is used to transport the pre-molding substrate 15 as the substrate on which the semiconductor wafer 14 is mounted between the upper mold 9 and the lower mold 10. In this case, since the pre-molding substrate 15 is supplied to the molding surface of the upper mold 9, the pre-molding substrate 15 is transported with the surface on which the semiconductor wafer 14 is mounted faces downward. Next, by raising the supply mechanism 13, the pre-molding substrate 15 is supplied to the molding surface of the upper mold 9.

接著,如後述,在上模9的型面上,通過定位機構將成型前基板15定位到導向部件(參照第3圖的(a))。使用設置於供給機構13的受光元件(參照第3圖的(b)、(c)),來檢驗成型前基板15是否正常定位在上模9的型面上。至於將成型前基板15定位在上模9的型面上的操作以及判斷成型前基板15是否正常定位在上模9的型面上的操作,將在後面描述(參照第3圖至第6圖)。 Next, as described later, on the molding surface of the upper mold 9, the pre-molding substrate 15 is positioned to the guide member by a positioning mechanism (see Fig. 3(a)). The light-receiving element (refer to (b) and (c) of FIG. 3) provided in the supply mechanism 13 is used to check whether the substrate 15 is normally positioned on the surface of the upper mold 9 before molding. As for the operation of positioning the substrate 15 on the molding surface of the upper mold 9 before molding and the operation of determining whether the substrate 15 is normally positioned on the molding surface of the upper mold 9 before molding, they will be described later (refer to FIGS. 3 to 6). ).

接著,在判斷為成型前基板15正常定位在上模9的型面上的情況下,使用離型膜供給機構(參照第14圖),向設置於下模10的型腔16供給離型膜 17。作為離型膜17,可使用從膜供給捲筒連續供給至卷取捲筒的長條狀的離型膜或切斷成長方形狀的離型膜中的任一種。或者,也可以不使用離型膜。 Next, when it is determined that the substrate 15 is normally positioned on the molding surface of the upper mold 9 before molding, a release film supply mechanism (refer to Figure 14) is used to supply the release film to the cavity 16 provided in the lower mold 10 17. As the release film 17, either a long release film continuously supplied from a film supply reel to a take-up reel or a cut rectangular release film can be used. Alternatively, the release film may not be used.

接著,對以下情況進行說明:即,如第2圖的(b)所示,例如將分送器作為樹脂供給機構使用,並且將作為樹脂材料的液狀樹脂供給到型腔16中。第2圖的(b)所示的分送器18為使用預先混合主劑和硬化劑而成的液狀樹脂的單液型分送器。作為主劑,例如可使用具有熱硬化性的矽酮樹脂或環氧樹脂。 在供給液狀樹脂時,也可以使用將混合主劑和硬化劑混合使用的雙液混合型分送器。 Next, a description will be given of a case where, as shown in (b) of FIG. 2, for example, a dispenser is used as a resin supply mechanism and a liquid resin as a resin material is supplied into the cavity 16. The dispenser 18 shown in (b) of FIG. 2 is a single-liquid type dispenser using a liquid resin prepared by mixing a main agent and a curing agent in advance. As the main agent, for example, a thermosetting silicone resin or epoxy resin can be used. When supplying liquid resin, a two-liquid mixing type dispenser that mixes a main mixing agent and a curing agent can also be used.

接著,利用移動機構19使分送器18在上模9與下模10之間移動。 接著,從分送器18的吐出口向型腔16吐出液狀樹脂20。由此,向型腔16供給液狀樹脂20。在該情況下,使用分送器18將液狀樹脂20供給到型腔16中。不限於此,作為樹脂材料可使用粉末狀、顆粒狀、片狀或固體狀的樹脂材料並將其供給到型腔中。 Then, the dispenser 18 is moved between the upper mold 9 and the lower mold 10 by the moving mechanism 19. Next, the liquid resin 20 is discharged from the discharge port of the dispenser 18 to the cavity 16. Thus, the liquid resin 20 is supplied to the cavity 16. In this case, the dispenser 18 is used to supply the liquid resin 20 into the cavity 16. Not limited to this, as the resin material, a powdered, granular, flake, or solid resin material may be used and supplied into the cavity.

接著,如第2圖的(c)所示,使用合模機構6(參照第1圖)提升可動台板5。由此,對上模9和下模10進行合模。通過合模,將安裝在成型前基板15上的半導體晶片14浸漬在供給到型腔16的液狀樹脂20中。此時,可以使用設置於下模10的型腔底面部件(未圖示),來對型腔16內的液狀樹脂20施加規定的樹脂壓力。 Next, as shown in FIG. 2(c), the movable platen 5 is lifted using the mold clamping mechanism 6 (refer to FIG. 1). Thus, the upper mold 9 and the lower mold 10 are clamped. By clamping the mold, the semiconductor wafer 14 mounted on the pre-molding substrate 15 is immersed in the liquid resin 20 supplied to the cavity 16. At this time, a cavity bottom surface member (not shown) provided in the lower mold 10 can be used to apply a predetermined resin pressure to the liquid resin 20 in the cavity 16.

此外,在合模製程中,也可以使用抽真空機構(未圖示)對型腔16內進行抽吸。由此,殘留在型腔16內的空氣和包含在液狀樹脂20中的氣泡等被排出到成型模11的外部。此外,型腔16內被設定為規定的真空度。 In addition, in the mold clamping process, a vacuuming mechanism (not shown) may also be used to suck the inside of the cavity 16. As a result, air remaining in the cavity 16 and air bubbles contained in the liquid resin 20 are discharged to the outside of the molding die 11. In addition, the inside of the cavity 16 is set to a predetermined degree of vacuum.

接著,使用設置於下模10的加熱器(未圖示)對液狀樹脂20進行加熱,加熱時間為液狀樹脂20的硬化所需的時間。通過使液狀樹脂20硬化而成型硬化樹脂21。由此,通過成型為與型腔16的形狀對應的硬化樹脂21,對安裝在成型前基板15上的半導體晶片14進行樹脂成型(樹脂封裝)。 Next, the liquid resin 20 is heated using a heater (not shown) provided in the lower mold 10, and the heating time is the time required for the curing of the liquid resin 20. By curing the liquid resin 20, the cured resin 21 is molded. Thus, the semiconductor wafer 14 mounted on the pre-molding substrate 15 is resin-molded (resin encapsulation) by molding the cured resin 21 corresponding to the shape of the cavity 16.

接著,如第2圖的(d)所示,在成型硬化樹脂21之後,使用合模機構6降低可動台板5。由此,對上模9和下模10進行開模。在上模9的型面上固定有作為經樹脂成型的成型後基板的樹脂成型品22。接著,使樹脂成型品22從上模9脫模。在該步驟中完成樹脂成型(樹脂封裝)。 Next, as shown in (d) of FIG. 2, after the cured resin 21 is molded, the mold clamping mechanism 6 is used to lower the movable platen 5. Thus, the upper mold 9 and the lower mold 10 are opened. A resin molded product 22 as a resin molded substrate after molding is fixed to the molding surface of the upper mold 9. Next, the resin molded product 22 is released from the upper mold 9. In this step, resin molding (resin encapsulation) is completed.

(基板定位檢驗機構) (Substrate positioning inspection agency)

參照第3圖,對用於檢驗供給到成型模11中的成型前基板15的定位的定位檢驗機構進行說明。定位檢驗機構具備發光元件和受光元件,並且根據受光元件是否檢測到發光元件所發出的發射光來檢驗成型前基板15的定位。 在本實施方式中,對在固定台板4上設置有發光元件並在供給機構13上設置有受光元件的情況進行說明。 With reference to FIG. 3, the positioning inspection mechanism for inspecting the positioning of the substrate 15 before molding supplied to the molding die 11 will be described. The positioning inspection mechanism includes a light-emitting element and a light-receiving element, and checks the positioning of the substrate 15 before molding according to whether the light-receiving element detects the emitted light from the light-emitting element. In this embodiment, a case where a light emitting element is provided on the fixed platen 4 and a light receiving element is provided on the supply mechanism 13 will be described.

如第3圖的(a)所示,在上模9的型面(下表面)上設置有導向部件23,該導向部件23例如為用於在X方向上定位成型前基板15的定位部件。作為導向部件23,例如可使用導銷等的具有銷狀形狀的部件。同樣,用於在Y方向上定位成型前基板15的導向部件24被設置在上模9的型面上。較佳例如沿Y方向及X方向分別設置有至少兩個導向部件23、24。在該情況下,將具有銷狀形狀的部件用作導向部件。作為導向部件,也可以使用具有沿X方向及Y方向延伸的長方體形狀的部件。 As shown in FIG. 3(a), a guide member 23 is provided on the molding surface (lower surface) of the upper mold 9. The guide member 23 is, for example, a positioning member for positioning the substrate 15 before molding in the X direction. As the guide member 23, for example, a member having a pin-like shape such as a guide pin can be used. Likewise, a guide member 24 for positioning the pre-molding substrate 15 in the Y direction is provided on the molding surface of the upper mold 9. Preferably, for example, at least two guide members 23 and 24 are respectively provided along the Y direction and the X direction. In this case, a member having a pin-like shape is used as the guide member. As the guide member, a member having a rectangular parallelepiped shape extending in the X direction and the Y direction may be used.

在上模9或固定台板4上例如設置有定位機構25、26,該定位機構25、26通過將成型前基板15的端面按壓到導向部件23、24而進行定位。通過定位機構25,在X方向上對成型前基板15進行定位。同樣,通過定位機構26,在Y方向上對成型前基板15進行定位。通過定位機構25、26,成型前基板被配置在上模9的型面上。在該情況下,設為將定位機構25、26設置在上模9或固定台板4上的結構。不限於此,也可以設為將定位機構設置在供給機構13上的結構。 The upper mold 9 or the fixed platen 4 is provided with, for example, positioning mechanisms 25 and 26 which perform positioning by pressing the end surface of the substrate 15 before molding against the guide members 23 and 24. The positioning mechanism 25 positions the pre-molding substrate 15 in the X direction. Similarly, the positioning mechanism 26 positions the pre-molding substrate 15 in the Y direction. By the positioning mechanisms 25 and 26, the substrate is placed on the molding surface of the upper mold 9 before molding. In this case, it is assumed that the positioning mechanisms 25 and 26 are provided on the upper mold 9 or the fixed platen 4. It is not limited to this, and a structure in which the positioning mechanism is provided on the supply mechanism 13 may be adopted.

在本發明中,如第3圖的(a)所示,表示如下情況:即,成型前基板15的長邊方向沿X方向配置,並且成型前基板15的短邊方向沿Y方向配置。以下,將成型前基板15的沿長邊方向的端面稱作成型前基板15的沿X方向的端面。 同樣,將成型前基板15的沿短邊方向的端面稱作成型前基板15的沿Y方向的端面。 In the present invention, as shown in FIG. 3(a), it is shown that the long side direction of the substrate 15 before molding is arranged in the X direction, and the short side direction of the substrate 15 before molding is arranged in the Y direction. Hereinafter, the end surface of the substrate 15 before molding along the longitudinal direction is referred to as the end surface of the substrate 15 before molding along the X direction. Similarly, the end surface of the substrate 15 before molding in the short-side direction is referred to as the end surface of the substrate 15 before molding in the Y direction.

如第3圖的(a)、(b)所示,例如作為用於檢驗成型前基板15的X方向及Y方向的定位的結構要素,在固定台板4的內部設置有發光元件27、28。作為發光元件27、28,例如可使用發光二極體(LED)或鐳射二極體(LD)等。較佳發光元件27、28具有耐熱性。在上模9上分別設置有使發光元件27、28所發出的照射光通過的第一出射用通孔29、30。此外,“出射用”的含義為從上模9側向外部的受光元件側發射照射光。 As shown in Fig. 3 (a) and (b), for example, as a structural element for checking the positioning of the substrate 15 in the X direction and the Y direction before molding, light emitting elements 27 and 28 are provided inside the fixed platen 4 . As the light emitting elements 27 and 28, for example, a light emitting diode (LED), a laser diode (LD), or the like can be used. Preferably, the light-emitting elements 27 and 28 have heat resistance. The upper mold 9 is provided with first emission through holes 29, 30 through which the irradiated light emitted by the light emitting elements 27, 28 passes, respectively. In addition, the term “for emission” means to emit irradiated light from the upper mold 9 side to the outside light receiving element side.

如第3圖的(a)所示,第一出射用通孔29、30分別被設置於在成型前基板15與導向部件23、24接觸的狀態下成型前基板15配置在上模9的型面的區域上。更詳細而言,第一出射用通孔29以如下方式設置在上模9上:在成型前基板15與導向部件23接觸的狀態下,第一出射用通孔29從成型前基板15的沿Y方向的端面對應於內側區域。同樣,第一出射用通孔30以如下方式設置在上模9上: 在成型前基板15與導向部件24接觸的狀態下,第一出射用通孔30從成型前基板15的沿X方向的端面對應於內側區域。 As shown in Fig. 3(a), the first ejection through holes 29, 30 are respectively provided in a type in which the substrate 15 is placed on the upper mold 9 before the molding substrate 15 is in contact with the guide members 23, 24. On the surface area. In more detail, the first through-hole 29 for ejection is provided on the upper mold 9 in such a manner that the first through-hole 29 for ejection extends from the edge of the substrate 15 before molding in a state where the substrate 15 is in contact with the guide member 23 before molding. The end surface in the Y direction corresponds to the inner region. Similarly, the first through hole 30 for ejection is provided on the upper mold 9 in the following manner: In a state where the pre-molding substrate 15 is in contact with the guide member 24, the first ejection through hole 30 corresponds to the inner region from the end surface of the pre-molding substrate 15 in the X direction.

如第3圖的(b)、(c)所示,在供給機構13上分別設置有用於檢測發光元件27、28所發出的照射光的第一受光元件31、32。第一受光元件31、32為用於檢驗成型前基板15的X方向及Y方向的定位的受光元件。作為第一受光元件31、32,例如可使用光電二極體(PD)等。在成型前基板15定位到導向部件23、24的狀態下,第一受光元件31被設置為俯視觀察時與發光元件27及第一出射用通孔29重疊,第一受光元件32被設置為俯視觀察時與發光元件28及第一出射用通孔30重疊。可以與第一受光元件31、32所接收的光強度相應地任意設定第一出射用通孔29、30的直徑。在成型前基板15定位到導向部件23、24的狀態下,根據第一受光元件31、32是否檢測到發光元件27、28所發出的照射光,來檢驗成型前基板15是否正常定位在上模9的型面上。例如,可通過將第一出射用通孔29、30的直徑設為0.01~0.1mm左右的大小,來提高對成型前基板15定位的檢驗精度。 As shown in (b) and (c) of FIG. 3, the supply mechanism 13 is provided with first light-receiving elements 31 and 32 for detecting the irradiation light emitted by the light-emitting elements 27 and 28, respectively. The first light-receiving elements 31 and 32 are light-receiving elements for checking the positioning of the substrate 15 in the X direction and the Y direction before molding. As the first light receiving elements 31 and 32, for example, a photodiode (PD) or the like can be used. In the state where the substrate 15 is positioned on the guide members 23 and 24 before molding, the first light receiving element 31 is arranged so as to overlap the light emitting element 27 and the first emission through hole 29 in a plan view, and the first light receiving element 32 is arranged in a plan view. It overlaps with the light-emitting element 28 and the first emission through hole 30 during observation. The diameters of the first emission through holes 29 and 30 can be arbitrarily set according to the intensity of light received by the first light receiving elements 31 and 32. In the state where the substrate 15 is positioned on the guide members 23, 24 before molding, it is checked whether the substrate 15 is normally positioned on the upper mold before molding according to whether the first light receiving elements 31, 32 detect the light emitted by the light emitting elements 27, 28 The shape of 9. For example, by setting the diameter of the first through holes 29 and 30 for ejection to a size of about 0.01 to 0.1 mm, the accuracy of the inspection of the positioning of the substrate 15 before molding can be improved.

此外,在成型模11開模的狀態下,導向部件23、24從上模9的型面突出。導向部件23、24被構造為,在成型模11合模的狀態下被下模10的型面向上推頂而收納在上模9的內部。該結構例如可通過將導向部件23、24設為通過彈簧等彈性部件來支撐的結構實現。另外,也可以將導向部件23、24設為不可動,並使導向部件23、24退避到設置於下模10的開口孔(未圖示)中。 In addition, in a state where the molding die 11 is opened, the guide members 23 and 24 protrude from the molding surface of the upper die 9. The guide members 23 and 24 are configured to be pushed up by the profile surface of the lower mold 10 in a state where the molding mold 11 is closed, and are accommodated in the upper mold 9. This structure can be realized, for example, by setting the guide members 23 and 24 to be supported by elastic members such as springs. In addition, the guide members 23 and 24 may be made immovable, and the guide members 23 and 24 may be retracted into an opening hole (not shown) provided in the lower mold 10.

(基板定位操作及定位檢驗操作(樹脂成型品的製造方法)) (Board positioning operation and positioning inspection operation (method of manufacturing resin molded products))

參照第3圖~第4圖,對供給到成型模11中的成型前基板15的定位操作及用於檢驗供給到成型模11中的成型前基板15是否正常定位的操作進行說 明。在本實施方式中示出向成型模11的上模9供給成型前基板15並進行定位的情況。此外,此處的說明還兼作樹脂成型品的製造方法的說明。 Referring to Figs. 3 to 4, the positioning operation of the pre-molding substrate 15 supplied to the molding die 11 and the operation for checking whether the pre-molding substrate 15 supplied to the molding die 11 is properly positioned will be described. Bright. In this embodiment, the case where the pre-molding substrate 15 is supplied to the upper mold 9 of the molding die 11 and positioned is shown. In addition, the description here also serves as the description of the manufacturing method of the resin molded article.

(基板定位操作) (Substrate positioning operation)

參照第3圖,對將成型前基板15定位在上模9的型面上的操作進行說明。首先,如第3圖的(b)所示,使保持有成型前基板15的供給機構13在上模9與下模10之間移動。接著,提升供給機構13,並從供給機構13向上模9的型面移交成型前基板15。 3, the operation of positioning the pre-molding substrate 15 on the molding surface of the upper mold 9 will be described. First, as shown in (b) of FIG. 3, the supply mechanism 13 holding the pre-molding substrate 15 is moved between the upper mold 9 and the lower mold 10. Next, the supply mechanism 13 is lifted, and the pre-molding substrate 15 is transferred from the supply mechanism 13 to the molding surface of the upper mold 9.

接著,例如使用設置於上模9或固定台板4的定位機構25、26,將成型前基板15的端面分別推壓到導向部件23、24。首先,如第3圖的(a)所示,使用定位機構25,將成型前基板15的沿Y方向的端面推壓到兩個導向部件23。由此,成型前基板15的沿Y方向的端面被定位在上模9的型面上。接著,使用定位機構26,將成型前基板15的沿X方向的端面推壓到兩個導向部件24。由此,成型前基板15的沿X方向的端面被定位在上模9的型面上。 Next, for example, using positioning mechanisms 25 and 26 provided on the upper mold 9 or the fixed platen 4, the end faces of the substrate 15 before molding are pressed against the guide members 23 and 24, respectively. First, as shown in (a) of FIG. 3, the positioning mechanism 25 is used to press the Y-direction end surface of the substrate 15 before molding to the two guide members 23. Thereby, the end surface of the substrate 15 in the Y direction before molding is positioned on the molding surface of the upper mold 9. Next, the positioning mechanism 26 is used to press the X-direction end surface of the substrate 15 before molding to the two guide members 24. Thereby, the end surface of the substrate 15 in the X direction before molding is positioned on the molding surface of the upper mold 9.

通過使用定位機構25、26將成型前基板15推壓到導向部件23、24,將成型前基板15定位在上模9的型面上。在定位成型前基板15之後,利用抽吸機構(未圖示)對成型前基板15進行抽吸並將其固定在上模9的型面上。在該狀態下,完成成型前基板15在上模9上的定位。 By using positioning mechanisms 25 and 26 to push the pre-molding substrate 15 to the guide members 23 and 24, the pre-molding substrate 15 is positioned on the molding surface of the upper mold 9. After positioning the pre-molding substrate 15, a suction mechanism (not shown) is used to suck the pre-molding substrate 15 and fix it on the molding surface of the upper mold 9. In this state, the positioning of the substrate 15 on the upper mold 9 before molding is completed.

在該情況下,使用設置於上模9或固定台板4的定位機構25、26,分別獨立地進行成型基板15在X方向及Y方向上的定位。不限於此,可以設為使定位機構25、26聯動的結構。由此,能夠同時進行成型前基板15在X方向及Y方向上的定位。 In this case, the positioning mechanisms 25 and 26 provided on the upper mold 9 or the fixed platen 4 are used to independently position the molded substrate 15 in the X direction and the Y direction. It is not limited to this, and it may be set as the structure which interlock|cooperates the positioning mechanisms 25 and 26. Thereby, the positioning of the substrate 15 before molding in the X direction and the Y direction can be performed simultaneously.

(基板定位檢驗操作) (Substrate positioning inspection operation)

參照第3圖~第4圖,對用於檢驗供給到上模9的成型前基板15是否正常定位的操作進行說明。首先,如第4圖的(a)所示,通過供給機構13將成型前基板15供給到上模9的型面上。接著,使用定位機構25、26將成型前基板15定位在上模9的型面上。在該狀態下,發光元件27、第一出射用通孔29及第一受光元件31被配置為俯視觀察時重疊。同樣,發光元件28、第一出射用通孔30及第一受光元件32被配置為俯視觀察時重疊。 Referring to FIGS. 3 to 4, the operation for checking whether the pre-molding substrate 15 supplied to the upper mold 9 is normally positioned will be described. First, as shown in (a) of FIG. 4, the pre-molding substrate 15 is supplied to the molding surface of the upper mold 9 by the supply mechanism 13. Next, positioning mechanisms 25 and 26 are used to position the pre-molding substrate 15 on the molding surface of the upper mold 9. In this state, the light emitting element 27, the first emitting through hole 29, and the first light receiving element 31 are arranged so as to overlap in a plan view. Similarly, the light emitting element 28, the first emitting through hole 30, and the first light receiving element 32 are arranged so as to overlap in a plan view.

接著,如第4圖的(b)所示,從發光元件27、28發出照射光33。從發光元件27、28發出的照射光33通過形成於上模9的第一出射用通孔29、30後到達成型前基板15的基板側的面。 Next, as shown in FIG. 4(b), the irradiated light 33 is emitted from the light emitting elements 27 and 28. The irradiated light 33 emitted from the light-emitting elements 27 and 28 passes through the first exit through holes 29 and 30 formed in the upper mold 9 and reaches the substrate-side surface of the substrate 15 before molding.

在成型前基板15正常定位到設置於上模9的導向部件23、24的情況下,例如如第4圖的(b)所示,在成型前基板15的沿Y方向的端面與導向部件23接觸的情況下,在導向部件23與成型前基板15的沿Y方向的端面之間不會產生間隙。因此,發光元件27所發出的照射光33被成型前基板15遮斷。於是,照射光33不會到達設置於供給機構13的第一受光元件31。因此,第一受光元件31檢測不到照射光33。 When the substrate 15 is normally positioned to the guide members 23 and 24 provided on the upper mold 9 before molding, for example, as shown in FIG. 4(b), the end surface of the substrate 15 in the Y direction and the guide member 23 before molding In the case of contact, no gap is generated between the guide member 23 and the end surface of the substrate 15 before molding in the Y direction. Therefore, the irradiation light 33 emitted by the light-emitting element 27 is blocked by the pre-molding substrate 15. Therefore, the irradiation light 33 does not reach the first light receiving element 31 provided in the supply mechanism 13. Therefore, the first light receiving element 31 cannot detect the irradiation light 33.

同樣,在成型前基板15的沿X方向的端面與導向部件24(參照第3圖的(a))接觸的情況下,在導向部件24與成型前基板15的沿X方向的端面之間不會產生間隙。因此,發光元件28(參照第3圖的(a))所發出的照射光33被成型前基板15遮斷。於是,照射光33不會到達設置於供給機構13的第一受光元件32(參照第3圖的(c))。因此,第一受光元件32檢測不到照射光33。 Similarly, when the X-direction end surface of the substrate 15 before molding is in contact with the guide member 24 (refer to Figure 3(a)), there is no gap between the guide member 24 and the X-direction end surface of the substrate 15 before molding. There will be gaps. Therefore, the irradiated light 33 emitted by the light-emitting element 28 (refer to FIG. 3(a)) is blocked by the pre-molding substrate 15. Therefore, the irradiation light 33 does not reach the first light receiving element 32 provided in the supply mechanism 13 (see (c) of FIG. 3). Therefore, the first light receiving element 32 cannot detect the irradiation light 33.

在第一受光元件31、32這兩個受光元件未檢測到照射光33的情況下,設置於樹脂成型裝置的控制部的判斷部(參照第14圖)判斷為成型前基板15正 常定位在X方向及Y方向上。在第一受光元件31、32這兩個受光元件未檢測到照射光33的情況下,判斷為成型前基板15正常定位到導向部件23、24,並進入下一製程即樹脂成型製程。 When the two light-receiving elements of the first light-receiving elements 31 and 32 do not detect the irradiated light 33, the judgment unit (refer to Figure 14) provided in the control unit of the resin molding apparatus judges that the substrate 15 before molding is normal Often positioned in the X and Y directions. When the two light receiving elements 31, 32, the first light receiving elements 31, 32 do not detect the irradiated light 33, it is determined that the substrate 15 is normally positioned to the guide members 23, 24 before molding, and the next process, namely the resin molding process, is entered.

在成型前基板15未正常定位到導向部件23、24的情況下,例如如第4圖的(c)所示,在成型前基板15的沿Y方向的端面未與導向部件23接觸的情況下,導向部件23與成型前基板15的沿Y方向的端面之間產生間隙34。如果在導向部件23與成型前基板15的沿Y方向的端面之間產生間隙34,則從發光元件27發出的照射光33會通過該間隙34。通過該間隙34的照射光33到達第一受光元件31。 由此,第一受光元件31檢測到照射光33。在第一受光元件31檢測到照射光33的情況下,判斷部(參照第14圖)判斷為成型前基板15未正常定位在X方向上。因此,判斷部停止進入下一製程。並且,重新進行成型前基板15的定位。 In the case where the substrate 15 is not normally positioned to the guide members 23 and 24 before molding, for example, as shown in FIG. 4(c), the end surface of the substrate 15 in the Y direction before molding is not in contact with the guide member 23 , A gap 34 is generated between the guide member 23 and the end surface of the substrate 15 in the Y direction before molding. If a gap 34 is generated between the guide member 23 and the end surface of the substrate 15 before molding in the Y direction, the irradiated light 33 emitted from the light-emitting element 27 passes through the gap 34. The irradiation light 33 passing through the gap 34 reaches the first light receiving element 31. As a result, the first light receiving element 31 detects the irradiation light 33. When the first light receiving element 31 detects the irradiated light 33, the determination unit (refer to FIG. 14) determines that the substrate 15 is not normally positioned in the X direction before molding. Therefore, the judgment unit stops entering the next process. And, the positioning of the substrate 15 before molding is performed again.

同樣,在成型前基板15的沿X方向的端面未與導向部件24接觸的情況下,在導向部件24與成型前基板15的沿X方向的端面之間產生間隙。從發光元件28發出的照射光33通過該間隙後到達第一受光元件32。由此,第一受光元件32檢測到照射光33。在第一受光元件32檢測到照射光33的情況下,判斷部判斷為成型前基板15未正常定位在Y方向上。在該情況下,判斷部也判斷為成型前基板15未正常定位,並停止進入下一製程。並且,重新進行成型前基板15的定位。 Similarly, when the end surface of the substrate 15 before molding in the X direction is not in contact with the guide member 24, a gap is generated between the guide member 24 and the end surface of the substrate 15 before molding in the X direction. The irradiation light 33 emitted from the light emitting element 28 passes through the gap and reaches the first light receiving element 32. As a result, the first light receiving element 32 detects the irradiation light 33. In the case where the first light receiving element 32 detects the irradiated light 33, the determination unit determines that the substrate 15 is not normally positioned in the Y direction before molding. In this case, the judgment unit also judges that the substrate 15 is not normally positioned before molding, and stops entering the next process. And, the positioning of the substrate 15 before molding is performed again.

在成型前基板15被定位在上模9的型面上的狀態下,當第一受光元件31、32中的任一受光元件檢測到照射光33時,判斷部判斷為成型前基板15未正常定位在X方向或Y方向中的任一方向上。在該情況下,停止進入下一製程,並重新進行成型前基板15的定位。在第一受光元件31、32這兩個受光元件 未檢測到照射光33的情況下,判斷部判斷為成型前基板15正常定位,並進入下一製程。因此,可根據第一受光元件31、32是否檢測到照射光33來抑制由成型前基板15的定位引起的成型不良的產生。 In the state where the substrate 15 is positioned on the molding surface of the upper mold 9 before molding, when any one of the first light receiving elements 31, 32 detects the irradiated light 33, the judgment unit determines that the substrate 15 before molding is not normal Position in either the X direction or the Y direction. In this case, stop entering the next process, and re-position the substrate 15 before molding. In the first light-receiving element 31, 32, the two light-receiving elements If the irradiated light 33 is not detected, the judgment unit judges that the substrate 15 is normally positioned before molding and enters the next process. Therefore, it is possible to suppress the occurrence of molding defects caused by the positioning of the substrate 15 before molding based on whether the first light receiving elements 31 and 32 detect the irradiated light 33.

此外,關於成型前基板15的定位,理想的是,當照射光33完全被成型前基板15遮斷時第一受光元件31、32不會檢測到照射光33。然而,有時照射光33的一部分作為衍射光而繞過成型前基板15並到達第一受光元件31、32,或者有時外部的雜訊光到達第一受光元件31、32。因此,在還考慮第一受光元件31、32檢測衍射光或雜訊光的情況而檢測到超過已設定的閾值(例如,某一大小的光強度)的照射光的情況下,判斷部判斷為第一受光元件31、32檢測到照射光33。在檢測到閾值以下的照射光的情況下,判斷部判斷為第一受光元件31、32未檢測到照射光33。如此,判斷部判斷成型前基板15是否正常定位在上模9的型面上。作為一例,在通過測量受光元件的電流值並利用由光照射產生光電流這一現象而進行光檢測的情況下,針對待測量的電流值設定閾值即可。該設定在其他實施方式中也同樣,並且在使用其他受光元件的檢測中也同樣。 In addition, regarding the positioning of the pre-molding substrate 15, it is desirable that the first light receiving elements 31 and 32 do not detect the illuminating light 33 when the irradiating light 33 is completely blocked by the pre-molding substrate 15. However, sometimes a part of the irradiated light 33 bypasses the pre-molding substrate 15 as diffracted light and reaches the first light receiving elements 31 and 32, or sometimes external noise light reaches the first light receiving elements 31 and 32. Therefore, considering the detection of diffracted light or noise light by the first light-receiving elements 31, 32, and the detection of irradiation light exceeding a set threshold (for example, a certain magnitude of light intensity), the determination unit determines that The first light receiving elements 31 and 32 detect the irradiation light 33. When the irradiation light below the threshold value is detected, the determination unit determines that the first light receiving elements 31 and 32 have not detected the irradiation light 33. In this way, the determination unit determines whether the substrate 15 is normally positioned on the molding surface of the upper mold 9 before molding. As an example, in the case of performing light detection by measuring the current value of the light-receiving element and using the phenomenon that photocurrent is generated by light irradiation, a threshold value may be set for the current value to be measured. This setting is the same in other embodiments, and also in detection using other light-receiving elements.

(用於檢驗導向部件的異常或基板變形的機構及操作(包括樹脂成型品的製造方法)) (Mechanism and operation for inspecting abnormality of guide member or substrate deformation (including manufacturing method of resin molded product))

參照第5圖~第6圖,對用於檢驗導向部件23、24是否產生了磨損或缺損等異常以及成型前基板15是否產生了翹曲或彎曲等變形中的至少一種的機構及操作進行說明。關於成型前基板的變形,在此作為一例主要對翹曲進行說明,但除此以外如產生褶皺或折痕那樣基板彎曲的情況下,也能夠使用同樣的機構進行同樣的操作。對於成型前基板的變形而言,作為在至少一部分包含 樹脂的樹脂性基板中易於產生的變形,還包含如因熱影響而導致基板的一部分翹曲的變形。此外,此處的說明還兼作樹脂成型品的製造方法的說明。 With reference to Figures 5 to 6, the mechanism and operation for inspecting at least one of abnormalities such as wear or chipping of the guide members 23 and 24 and whether the substrate 15 has deformed such as warpage or bending before molding will be described. . Regarding the deformation of the substrate before molding, the warpage will be mainly described here as an example. In addition, when the substrate is bent such as wrinkles or creases, the same operation can be performed using the same mechanism. For the deformation of the substrate before molding, as at least a part of The deformation that is likely to occur in the resinous resin substrate of the resin also includes deformation such as warpage of a part of the substrate due to the influence of heat. In addition, the description here also serves as the description of the manufacturing method of the resin molded article.

如第5圖所示,用於檢驗導向部件23、24的異常或成型前基板15變形的機構在成型前基板15的端面與導向部件23、24接觸的狀態下與配置有成型前基板15的區域對應地,在與設置有發光元件27、28、第一出射用通孔29、30及第一受光元件31、32的位置相反一側的位置上分別設置有發光元件35、36、第二出射用通孔37、38及第二受光元件39、40。因此,第二受光元件39、40以如下方式分別設置在供給機構13上:即,在成型前基板15被定位到導向部件23、24的狀態下,俯視觀察時,第二受光元件39與發光元件35及第二出射用通孔37重疊,第二受光元件40與發光元件36及第二出射用通孔38重疊。 As shown in Figure 5, the mechanism for inspecting the abnormality of the guide members 23, 24 or the deformation of the substrate 15 before molding is in contact with the pre-molding substrate 15 in the state where the end surface of the substrate 15 is in contact with the guide members 23 and 24. Corresponding to the region, light emitting elements 35, 36, and second light emitting elements 35, 36, and 32 are respectively provided at positions opposite to the positions where light emitting elements 27, 28, first emission through holes 29, 30, and first light receiving elements 31, 32 are provided. Outgoing through holes 37, 38 and second light receiving elements 39, 40. Therefore, the second light-receiving elements 39 and 40 are respectively installed on the supply mechanism 13 in such a way that the second light-receiving element 39 and the light-emitting element 39 and the light emitting The element 35 and the second emission through hole 37 overlap, and the second light receiving element 40 overlaps with the light emitting element 36 and the second emission through hole 38.

參照第6圖,對用於檢驗導向部件23、24上是否產生了磨損或缺損等異常、或者成型前基板15上是否產生了翹曲或彎曲等變形的操作進行說明。 With reference to Fig. 6, an operation for inspecting whether abnormalities such as wear or chipping have occurred on the guide members 23 and 24, or whether deformation such as warpage or bending has occurred on the substrate 15 before molding will be described.

第6圖的(a)表示在不存在導向部件23、24的磨損或缺損等異常以及成型前基板15的翹曲或彎曲等變形的情況下成型前基板15正常定位在上模9的型面上的狀態。如第6圖的(a)所示,在成型前基板15正常定位在上模9的型面上的情況下,從四個發光元件27、28、35、36發出的照射光33全部被成型前基板15遮斷。因此,四個受光元件(第一受光元件31、32及第二受光元件39、40)均不會檢測到照射光33。 Fig. 6(a) shows that the substrate 15 is normally positioned on the surface of the upper mold 9 before molding without abnormalities such as wear or defect of the guide members 23 and 24, and warpage or bending of the substrate 15 before molding. On the status. As shown in Fig. 6(a), when the substrate 15 is normally positioned on the molding surface of the upper mold 9 before molding, the irradiated light 33 emitted from the four light-emitting elements 27, 28, 35, 36 is all molded The front substrate 15 is blocked. Therefore, none of the four light receiving elements (the first light receiving elements 31, 32 and the second light receiving elements 39, 40) detects the irradiation light 33.

由於第一受光元件31、32未檢測到照射光33,判斷部判斷為成型前基板15與導向部件23、24正常接觸。由於第二受光元件39、40未檢測到照射光33,判斷部判斷為導向部件23、24未產生磨損或缺損等異常且成型前基板15上未產生翹曲或彎曲等變形。如此,在四個受光元件(第一受光元件31、32及第 二受光元件39、40)均未檢測到照射光33的情況下,判斷部判斷為沒有任何異常且成型前基板15正常定位在上模9的型面上,並進入下一製程。 Since the first light receiving elements 31 and 32 do not detect the irradiated light 33, the judgment unit judges that the substrate 15 and the guide members 23 and 24 are in normal contact before the molding. Since the second light receiving elements 39, 40 do not detect the irradiated light 33, the determination unit determines that the guide members 23, 24 have no abnormalities such as wear or chipping, and no warpage or bending deformation has occurred on the substrate 15 before molding. In this way, the four light-receiving elements (the first light-receiving element 31, 32 and the When the two light-receiving elements 39, 40) do not detect the irradiated light 33, the judging part determines that there is no abnormality and the substrate 15 is normally positioned on the surface of the upper mold 9 before forming, and the next process is entered.

在第一受光元件31、32檢測到照射光33的情況下,判斷部判斷為成型前基板15未與導向部件23或24正常接觸,並停止進入下一製程。並且,重新進行成型前基板15的定位。 When the first light-receiving elements 31 and 32 detect the irradiated light 33, the judgment unit judges that the substrate 15 is not in normal contact with the guide member 23 or 24 before molding, and stops entering the next process. And, the positioning of the substrate 15 before molding is performed again.

第6圖的(b)表示導向部件23、24上產生磨損或缺損等異常的狀態。例如表示被配置在Y方向上的導向部件產生磨損或缺損的狀態。 Fig. 6(b) shows a state in which abnormalities such as wear or chipping of the guide members 23 and 24 have occurred. For example, it indicates a state in which a guide member arranged in the Y direction is worn or chipped.

如第6圖的(b)所示,通過定位機構25(參照第3圖的(b))將成型前基板15的端部推壓到產生磨損或缺損的導向部件23X。由於導向部件23X上產生了磨損或缺損而變得比通常的大小小,因此成型前基板15被推出到比正常位置更靠+X方向側。由此,雖然第一出射用通孔29被成型前基板15遮斷,但第二出射用通孔37的一部分未被成型前基板15遮斷。因此,雖然從發光元件27發出的照射光33被成型前基板15遮斷,但從發光元件35發出的照射光33通過成型前基板15後到達第二受光元件39。由此,第二受光元件39檢測到照射光33。在第二受光元件39檢測到照射光33的情況下,判斷部判斷為有可能在導向部件23X上產生了磨損或缺損等異常。於是,判斷部停止進入下一製程,並對導向部件的異常進行調查。 As shown in FIG. 6(b), the end of the pre-molding substrate 15 is pressed by the positioning mechanism 25 (see FIG. 3(b)) to the guide member 23X where wear or defect occurs. Since the guide member 23X is worn or chipped and becomes smaller than the usual size, the substrate 15 before molding is pushed out to the +X direction side than the normal position. Thus, although the first through-hole 29 for ejection is blocked by the pre-molding substrate 15, a part of the second through-hole 37 for ejection is not blocked by the pre-molding substrate 15. Therefore, although the irradiation light 33 emitted from the light-emitting element 27 is blocked by the pre-molding substrate 15, the irradiating light 33 emitted from the light-emitting element 35 passes through the pre-molding substrate 15 and reaches the second light receiving element 39. Thus, the second light receiving element 39 detects the irradiation light 33. When the second light receiving element 39 detects the irradiation light 33, the determination unit determines that there is a possibility that an abnormality such as abrasion or chipping may have occurred on the guide member 23X. Then, the judgment unit stops entering the next process and investigates the abnormality of the guide member.

同樣,在第二受光元件40(參照第5圖的(a))檢測到照射光33的情況下,判斷部判斷為有可能在導向部件24上產生了磨損或缺損等異常。於是,判斷部停止進入下一製程。如此,在第二受光元件39、40中的任一受光元件檢測到照射光33的情況下,判斷為有可能在導向部件23、24上產生了磨損或缺損等 異常並停止進入下一製程。由此,能抑制由導向部件23、24的異常引起的成型不良的產生。 Similarly, when the second light receiving element 40 (see FIG. 5(a)) detects the irradiated light 33, the determination unit determines that there is a possibility that abnormalities such as wear or chipping may have occurred on the guide member 24. Then, the judgment unit stops entering the next process. In this way, when any one of the second light receiving elements 39, 40 detects the irradiated light 33, it is determined that there is a possibility of wear or chipping on the guide members 23, 24. Exception and stop entering the next process. Thus, it is possible to suppress the occurrence of molding defects caused by abnormalities of the guide members 23 and 24.

第6圖的(c)表示成型前基板15上產生作為變形之一的翹曲的狀態。例如,表示成型前基板15向安裝有半導體晶片14的一側翹曲後的狀態。 (C) of FIG. 6 shows a state where warpage, which is one of the deformations, has occurred on the substrate 15 before molding. For example, it shows a state where the substrate 15 before molding is warped to the side where the semiconductor wafer 14 is mounted.

如第6圖的(c)所示,通過定位機構25(參照第3圖的(b))將例如產生了翹曲的成型前基板15的端部推壓到導向部件23。由於成型前基板15上產生了翹曲,因此成型前基板15在成型前基板15的沿Y方向的兩端部從上模9的型面翹起的狀態下被配置在上模9上。由此,雖然第一出射用通孔29被成型前基板15遮斷,但第二出射用通孔37的一部分未被成型前基板15遮斷。因此,雖然從發光元件27發出的照射光33被成型前基板15遮斷,但從發光元件35發出的照射光33通過成型前基板15後到達第二受光元件39。由此,第二受光元件39檢測到照射光33。在第二受光元件39檢測到照射光33的情況下,判斷部判斷為有可能在成型前基板15上產生了翹曲。於是,判斷部停止進入下一製程,並對成型前基板15的狀態進行調查。 As shown in FIG. 6(c), the end of the pre-molding substrate 15 that has warped, for example, is pressed against the guide member 23 by the positioning mechanism 25 (see FIG. 3(b)). Since the pre-molding substrate 15 is warped, the pre-molding substrate 15 is arranged on the upper mold 9 in a state where both ends of the pre-molding substrate 15 in the Y direction are raised from the molding surface of the upper mold 9. Thus, although the first through-hole 29 for ejection is blocked by the pre-molding substrate 15, a part of the second through-hole 37 for ejection is not blocked by the pre-molding substrate 15. Therefore, although the irradiation light 33 emitted from the light-emitting element 27 is blocked by the pre-molding substrate 15, the irradiating light 33 emitted from the light-emitting element 35 passes through the pre-molding substrate 15 and reaches the second light receiving element 39. Thus, the second light receiving element 39 detects the irradiation light 33. When the second light receiving element 39 detects the irradiated light 33, the judgment unit judges that there is a possibility that warpage has occurred on the substrate 15 before molding. Then, the judgment unit stops entering the next process, and investigates the state of the substrate 15 before molding.

同樣,在第二受光元件40(參照第5圖的(a))檢測到照射光33的情況下,判斷部判斷為有可能在成型前基板15上產生了翹曲。於是,判斷部停止進入下一製程。如此,在第二受光元件39、40中的任一受光元件檢測到照射光33的情況下,判斷為有可能在成型前基板15上產生了翹曲並停止進入下一製程。 由此,能抑制由成型前基板15上產生的翹曲引起的成型不良的產生。 Similarly, when the second light receiving element 40 (refer to (a) of FIG. 5) detects the irradiated light 33, the judgment unit judges that there is a possibility that the pre-molding substrate 15 has warped. Then, the judgment unit stops entering the next process. In this way, when any one of the second light receiving elements 39 and 40 detects the irradiated light 33, it is determined that there is a possibility of warping on the substrate 15 before molding and the next process is stopped. Thereby, it is possible to suppress the occurrence of molding defects caused by warpage generated on the substrate 15 before molding.

在第二受光元件39、40中的任一受光元件檢測到照射光33的情況下,有可能在導向部件23、24上產生了磨損或缺損等異常,或者有可能在成型前基板15上產生了翹曲。雖然有必要對這些異常確認原因,但在任何情況下, 判斷部也都判斷為有可能產生了某種異常並停止進入下一製程。由此,能抑制由成型前基板15的定位引起的成型不良的產生。 When any one of the second light receiving elements 39, 40 detects the irradiated light 33, it is possible that abnormalities such as wear or chipping may occur on the guide members 23, 24, or the substrate 15 may be produced before molding. Warped. Although it is necessary to confirm the cause of these abnormalities, in any case, The judgment unit also judged that some kind of abnormality might have occurred and stopped entering the next process. Thus, it is possible to suppress the occurrence of molding defects caused by the positioning of the substrate 15 before molding.

如上述,在設置於供給機構13的四個受光元件(第一受光元件31、32及第二受光元件39、40)中的任一受光元件檢測到照射光33的情況下,可判斷為在成型前基板15的定位上產生了異常。在第一受光元件31、32檢測到照射光33的情況下,判斷為成型前基板15未與導向部件23、24正常接觸。在第二受光元件39、40檢測到照射光33的情況下,判斷為有可能在導向部件23、24上產生了磨損或缺損等異常,或者有可能在成型前基板15上產生了翹曲或彎曲等變形。在此,在第二受光元件39、40檢測到照射光33的情況下,判斷為有可能在導向部件23、24上產生了磨損或缺損等異常,或者判斷為有可能在成型前基板15上產生了翹曲或彎曲等變形,或者判斷為這些導向部件23、24的異常和成型前基板15的變形這兩者有可能同時發生。在這些情況下,停止進入下一製程。 As described above, if any one of the four light receiving elements (first light receiving elements 31, 32 and second light receiving elements 39, 40) provided in the supply mechanism 13 detects the irradiated light 33, it can be determined that An abnormality occurred in the positioning of the substrate 15 before molding. When the first light receiving elements 31 and 32 detect the irradiated light 33, it is determined that the substrate 15 is not in normal contact with the guide members 23 and 24 before molding. When the second light-receiving elements 39, 40 detect the irradiated light 33, it is determined that there may be abnormalities such as wear or chipping on the guide members 23, 24, or there may be warping or warping on the substrate 15 before molding. Deformation such as bending. Here, when the second light-receiving elements 39, 40 detect the irradiated light 33, it is determined that abnormalities such as wear or chipping may occur on the guide members 23, 24, or it is determined that it may be on the substrate 15 before molding. Deformation such as warpage or bending occurs, or it is judged that the abnormality of the guide members 23 and 24 and the deformation of the substrate 15 before molding may occur simultaneously. In these cases, stop entering the next process.

在四個受光元件(第一受光元件31、32及第二受光元件39、40)均未檢測到照射光33的情況下,判斷為在不存在導向部件23、24的磨損或缺損等異常以及成型前基板15的翹曲或彎曲等變形的情況下成型前基板15正常定位在上模9的型面上。在該情況下,進入下一製程。因此,能夠在檢驗成型前基板15正常定位後的狀態下進行樹脂成型,並能抑制起因於定位的成型不良的產生。 In the case where none of the four light receiving elements (the first light receiving elements 31, 32 and the second light receiving elements 39, 40) detects the irradiated light 33, it is determined that there is no abnormality such as wear or damage of the guide members 23, 24, and In the case of deformation such as warpage or bending of the substrate 15 before molding, the substrate 15 before molding is normally positioned on the molding surface of the upper mold 9. In this case, proceed to the next process. Therefore, it is possible to perform resin molding in a state after the normal positioning of the substrate 15 is checked before molding, and it is possible to suppress the occurrence of molding defects due to positioning.

可以根據四個受光元件(第一受光元件31、32及第二受光元件39、40)所接收的光強度,來任意設定設置於上模9的四個出射用通孔(第一出射用通孔29、30及第二出射用通孔37、38)的直徑。在這些出射用通孔的直徑較小的情況下,出射用通孔有時會被樹脂材料或異物等堵塞。因此,較佳定期檢驗四個出射用通孔上是否產生了樹脂堵塞等異常。例如,在未將成型前基板15供給到 上模9的狀態下,從四個發光元件27、28、35、36分別發出照射光33。在四個受光元件(第一受光元件31、32及第二受光元件39、40)中的每一個受光元件檢測到照射光33的情況下,可判斷為四個出射用通孔(第一出射用通孔29、30及第二出射用通孔37、38)上均未產生樹脂堵塞等異常。在四個受光元件(第一受光元件31、32及第二受光元件39、40)中的任一個受光元件未檢測到照射光33的情況下,可判斷為與未檢測到照射光33的受光元件對應的出射用通孔上產生了異常。如此,也能檢驗設置於上模9的四個出射用通孔(第一出射用通孔29、30及第二出射用通孔37、38)的異常。 According to the light intensity received by the four light receiving elements (the first light receiving element 31, 32 and the second light receiving element 39, 40), the four exit through holes (first exit through holes) provided in the upper mold 9 can be arbitrarily set. The diameters of the holes 29, 30 and the second ejection through holes 37, 38). When the diameter of these through-holes for ejection is small, the through-holes for ejection may be blocked by a resin material, foreign matter, or the like. Therefore, it is preferable to periodically check whether there are abnormalities such as resin clogging on the four ejection through holes. For example, before the molding substrate 15 is supplied to In the state of the upper mold 9, the four light-emitting elements 27, 28, 35, and 36 emit irradiation light 33, respectively. When each of the four light-receiving elements (the first light-receiving elements 31, 32 and the second light-receiving elements 39, 40) detects the irradiated light 33, it can be judged as four exit through holes (first exit No abnormalities such as resin clogging occurred in the through holes 29 and 30 and the second ejection through holes 37 and 38). When any one of the four light receiving elements (the first light receiving elements 31, 32 and the second light receiving elements 39, 40) does not detect the irradiated light 33, it can be determined that the light receiving of the irradiated light 33 is not detected. An abnormality occurred in the through hole for ejection corresponding to the component. In this way, it is also possible to check the abnormality of the four ejection through holes (the first ejection through holes 29 and 30 and the second ejection through holes 37 and 38) provided in the upper mold 9.

此外,也可以在其他實施方式中應用用於檢驗導向部件23、24上是否產生了磨損或缺損等異常或者成型前基板15上是否產生了翹曲或彎曲等變形的機構。 In addition, a mechanism for checking whether abnormalities such as wear or chipping have occurred on the guide members 23 and 24 or whether deformation such as warpage or bending has occurred on the substrate 15 before molding may be applied in other embodiments.

(作用效果) (Effect)

在本實施方式中,樹脂成型裝置為如下結構。即,該樹脂成型裝置包括:成型模11,具有彼此相對配置的作為第一模的上模9及作為第二模的下模10;供給機構13,用於向作為上模9及下模10中的任一個模的上模9或下模10的型面供給作為樹脂成型對象的成型前基板15;定位機構25、26,用於在型面上將成型前基板15定位到導向部件23、24;合模機構6,用於對成型模11進行合模;發光元件27、28,用於發出照射光33;第一受光元件31、32,被設置於供給機構13且能接收照射光33;和判斷部,用於對成型前基板15的定位進行判斷。 其中,在上模9中設置有使來自發光元件27、28的照射光33通過的第一出射用通孔29、30,判斷部基於第一受光元件31、32對通過第一出射用通孔29、30的照射光的檢測,判斷成型前基板15是否正常定位到導向部件23、24。 In this embodiment, the resin molding apparatus has the following structure. That is, the resin molding apparatus includes: a molding die 11 having an upper die 9 as a first die and a lower die 10 as a second die arranged opposite to each other; a supply mechanism 13 for supplying the upper die 9 and the lower die 10 The molding surface of the upper mold 9 or the lower mold 10 of any one of the molds supplies the pre-molding substrate 15 as the object of resin molding; positioning mechanisms 25, 26 are used to position the pre-molding substrate 15 on the molding surface to the guide members 23, 24; mold clamping mechanism 6 for clamping the molding mold 11; light emitting elements 27, 28 for emitting illuminating light 33; first light receiving elements 31, 32, which are provided in the supply mechanism 13 and can receive illuminating light 33 ; And a judging part for judging the positioning of the substrate 15 before molding. Among them, the upper mold 9 is provided with first emitting through holes 29, 30 through which the irradiated light 33 from the light emitting elements 27, 28 passes, and the judging unit is based on the first light receiving elements 31, 32 to pass through the first emitting through holes The detection of irradiation light at 29 and 30 determines whether the substrate 15 is normally positioned to the guide members 23 and 24 before molding.

本實施方式的樹脂成型品的製造方法包括:供給製程,向作為成型模11中的任一個模的上模9或下模10的型面供給作為樹脂成型對象的成型前基板15,其中,該成型模11具有彼此相對配置的作為第一模的所述上模9及作為第二模的所述下模10;定位製程,在型面上將成型前基板15定位到導向部件23、24;照射製程,從發光元件27、28發出照射光33,該照射光33通過設置於上模9的第一出射用通孔29、30;檢測製程,由設置於供給機構13的第一受光元件31、32來檢測通過第一出射用通孔29、30的照射光33;判斷製程,基於檢測製程中的檢測,判斷成型前基板15是否正常定位到導向部件23、24;和樹脂成型製程,在判斷製程中判斷為成型前基板15正常定位的情況下,在所述樹脂成型製程中對成型模11進行合模而進行樹脂成型。 The method of manufacturing a resin molded product of the present embodiment includes a supply process of supplying a pre-molding substrate 15 as a resin molding object to the surface of an upper mold 9 or a lower mold 10 that is any one of the molding dies 11, wherein the The forming mold 11 has the upper mold 9 as a first mold and the lower mold 10 as a second mold, which are arranged opposite to each other; a positioning process, positioning the substrate 15 before forming on the mold surface to the guide members 23, 24; During the irradiation process, the irradiated light 33 is emitted from the light-emitting elements 27 and 28, and the irradiated light 33 passes through the first outgoing through holes 29, 30 provided in the upper mold 9. The detection process is performed by the first light receiving element 31 provided in the supply mechanism 13 , 32 to detect the irradiated light 33 passing through the first outgoing through holes 29, 30; to determine the process, based on the detection in the inspection process, to determine whether the substrate 15 is normally positioned to the guide parts 23, 24 before molding; and the resin molding process, in When it is determined in the judgment process that the substrate 15 is normally positioned before molding, the molding die 11 is clamped during the resin molding process to perform resin molding.

根據該結構,能夠在檢驗供給到成型模11中的作為樹脂成型對象的成型前基板15正常定位到導向部件23、24的狀態下進行樹脂成型,並且能抑制起因於定位的成型不良的產生。因此,在判斷為成型前基板15正常定位的情況下進行樹脂成型。在判斷為成型前基板15未正常定位的情況下停止樹脂成型。 According to this structure, it is possible to perform resin molding while checking that the pre-molding substrate 15 supplied to the molding die 11 as a resin molding object is normally positioned on the guide members 23 and 24, and the occurrence of molding defects due to positioning can be suppressed. Therefore, resin molding is performed when it is determined that the substrate 15 is normally positioned before molding. If it is determined that the substrate 15 is not normally positioned before molding, the resin molding is stopped.

更詳細而言,根據本實施方式,為了檢驗作為樹脂成型對象的成型前基板15是否正常定位到設置於成型模的上模9上的導向部件23、24,設置發光元件27、28和第一受光元件31、32。通過使成型前基板15與導向部件23、24接觸,將成型前基板15定位在上模9上。在成型前基板15正常定位到導向部件23、24的情況下,在成型前基板15的端面與導向部件23、24之間不會產生間隙。 由此,成型前基板15遮斷從發光元件27、28發出的照射光33。因此,第一受光元件31、32檢測不到照射光33。在第一受光元件31、32這兩個受光元件未檢測 到照射光33的情況下,判斷部判斷為成型前基板15正常定位到導向部件23、24。 在判斷為成型前基板15正常定位的情況下進行樹脂成型。 In more detail, according to this embodiment, in order to check whether the pre-molding substrate 15 that is the object of resin molding is normally positioned on the guide members 23, 24 provided on the upper mold 9 of the molding die, the light-emitting elements 27, 28 and the first Light receiving elements 31, 32. By bringing the pre-molding substrate 15 into contact with the guide members 23 and 24, the pre-molding substrate 15 is positioned on the upper mold 9. When the pre-molding substrate 15 is normally positioned to the guide members 23 and 24, no gap will be generated between the end surface of the pre-molding substrate 15 and the guide members 23 and 24. Thereby, the substrate 15 before molding blocks the irradiation light 33 emitted from the light emitting elements 27 and 28. Therefore, the first light receiving elements 31 and 32 cannot detect the irradiation light 33. The two light-receiving elements 31 and 32 are not detected When the irradiation light 33 is reached, the determination unit determines that the substrate 15 is normally positioned on the guide members 23 and 24 before molding. When it is determined that the substrate 15 is normally positioned before molding, resin molding is performed.

在成型前基板15未正常定位到導向部件23或24的情況下,在成型前基板15的端面與導向部件23或24之間產生間隙。在產生間隙的情況下,從發光元件27、28發出的照射光33通過該間隙後到達第一受光元件31、32。在第一受光元件31、32中的任一受光元件檢測到照射光33的情況下,判斷部判斷為成型前基板15未正常定位到導向部件23或24。在判斷為成型前基板15未正常定位的情況下停止樹脂成型。因此,能抑制由成型前基板15的定位引起的成型不良的產生。 In the case where the substrate 15 is not normally positioned to the guide member 23 or 24 before molding, a gap is generated between the end surface of the substrate 15 and the guide member 23 or 24 before molding. When a gap occurs, the irradiation light 33 emitted from the light-emitting elements 27 and 28 reaches the first light-receiving elements 31 and 32 after passing through the gap. When any one of the first light receiving elements 31 and 32 detects the irradiated light 33, the determination unit determines that the substrate 15 is not normally positioned on the guide member 23 or 24 before molding. If it is determined that the substrate 15 is not normally positioned before molding, the resin molding is stopped. Therefore, it is possible to suppress the occurrence of molding defects caused by the positioning of the substrate 15 before molding.

此外,根據本實施方式,為了檢驗導向部件23、24的異常或成型前基板15的變形,分別設置發光元件35、36、第二出射用通孔37、38及第二受光元件39、40。在第二受光元件39或40中的任一受光元件檢測到照射光33的情況下,判斷為有可能在導向部件23、24上產生了磨損或缺損等異常,或者有可能在成型前基板15上產生了翹曲或彎曲等變形。在這些情況下,停止進入下一製程,並對導向部件23、24的異常或成型前基板15的變形進行調查。由此,能抑制由導向部件23、24的異常或成型前基板15的變形引起的成型不良的產生。 In addition, according to this embodiment, in order to check the abnormality of the guide members 23 and 24 or the deformation of the substrate 15 before molding, the light emitting elements 35 and 36, the second emission through holes 37 and 38 and the second light receiving elements 39 and 40 are respectively provided. When any one of the second light-receiving elements 39 or 40 detects the irradiated light 33, it is determined that abnormalities such as wear or chipping may have occurred on the guide members 23, 24, or the substrate 15 may be formed before molding. Deformation such as warping or bending occurred on the surface. In these cases, stop entering the next process, and investigate the abnormality of the guide members 23 and 24 or the deformation of the substrate 15 before molding. Thereby, it is possible to suppress the occurrence of molding defects caused by abnormalities of the guide members 23 and 24 or deformation of the substrate 15 before molding.

此外,根據本實施方式,在未將成型前基板15供給到上模9的狀態下,從四個發光元件27、28、35、36分別發出照射光33。在四個受光元件(第一受光元件31、32及第二受光元件39、40)中的每一個受光元件檢測到照射光33的情況下,判斷為四個出射用通孔(第一出射用通孔29、30及第二出射用通孔37、38)上均未產生樹脂堵塞等異常。在受光元件(第一受光元件31、32及第二受光元件39、40)中的任一受光元件未檢測到照射光33的情況下,判斷為與未檢測到照 射光33的受光元件對應的出射用通孔上產生了異常。在該情況下,調查與未檢測到照射光33的受光元件對應的出射用通孔的堵塞等並進行清理。由此,能抑制由出射用通孔(第一出射用通孔29、30及第二出射用通孔37、38)的異常引起的成型不良的產生。 In addition, according to this embodiment, in a state where the pre-molding substrate 15 is not supplied to the upper mold 9, the four light-emitting elements 27, 28, 35, and 36 emit irradiation light 33, respectively. When each of the four light-receiving elements (the first light-receiving elements 31, 32 and the second light-receiving elements 39, 40) detects the irradiated light 33, it is determined as four through-holes for emission (for the first emission). No abnormalities such as resin clogging occurred in the through holes 29, 30 and the second ejection through holes 37, 38). When any one of the light-receiving elements (the first light-receiving elements 31, 32 and the second light-receiving elements 39, 40) does not detect the irradiated light 33, it is judged as different from the undetected light. An abnormality has occurred in the emission through hole corresponding to the light receiving element that emits the light 33. In this case, it is checked and cleaned for clogging of the emission through hole corresponding to the light receiving element that has not detected the irradiation light 33. Thereby, it is possible to suppress the occurrence of molding defects caused by abnormalities in the ejection through holes (the first ejection through holes 29, 30 and the second ejection through holes 37, 38).

如上述,根據本實施方式,在如作為樹脂成型對象的成型前基板15未與導向部件23、24正常接觸的情況、導向部件23、24上產生磨損或缺損等異常的情況、成型前基板15上產生翹曲或彎曲等變形的情況、以及第一出射用通孔29、30、第二出射用通孔37、38上產生樹脂堵塞的情況等的、產生起因於定位的異常的情況下,停止進入下一製程。由此,能抑制起因於定位的成型不良的產生。因此,能夠在檢驗成型前基板15正常定位後的狀態下進行樹脂成型。 As described above, according to the present embodiment, for example, when the pre-molding substrate 15 that is the object of resin molding is not in normal contact with the guide members 23, 24, the guide members 23, 24 are worn or damaged, and the pre-molding substrate 15 When there is deformation such as warpage or bending on the top, and when resin clogging occurs in the first through-holes 29, 30, and the second through-holes 37, 38 for ejection, etc., an abnormality caused by positioning occurs, Stop entering the next process. Thereby, it is possible to suppress the occurrence of molding defects due to positioning. Therefore, it is possible to perform resin molding in a state after checking that the substrate 15 is normally positioned before molding.

在本實施方式中,作為對成型前基板15進行定位的裝置,使用了設置於上模9或固定台板4的定位機構25、26。不限於此,也可以在供給機構13上設置定位機構。在由供給機構13將成型前基板15移交於上模9的型面之後,使用設置於供給機構13的定位機構來將成型前基板15分別推壓到導向部件23、24。由此,能夠將成型前基板15定位在上模9的型面上。通過在供給機構13上設置定位機構,能夠簡化樹脂成型裝置的結構。 In this embodiment, as a device for positioning the substrate 15 before molding, positioning mechanisms 25 and 26 provided on the upper mold 9 or the fixed platen 4 are used. It is not limited to this, and a positioning mechanism may be provided on the supply mechanism 13. After the supply mechanism 13 transfers the pre-molding substrate 15 to the molding surface of the upper mold 9, the positioning mechanism provided in the supply mechanism 13 pushes the pre-molding substrate 15 to the guide members 23 and 24, respectively. Thereby, the pre-molding substrate 15 can be positioned on the molding surface of the upper mold 9. By providing a positioning mechanism on the supply mechanism 13, the structure of the resin molding apparatus can be simplified.

此外,可以將供給機構13自身用作定位機構。在將供給機構13自身用作定位機構的情況下,在將成型前基板15移交於上模9的型面的同時,使用供給機構13使成型前基板15在X方向及Y方向上移動,從而將成型前基板15的端面分別推壓到導向部件23、24。由此,能夠將成型前基板15定位在上模9的型面上。通過將供給機構13自身用作定位機構,能夠進一步簡化樹脂成型裝置的結構。 In addition, the supply mechanism 13 itself can be used as a positioning mechanism. When the supply mechanism 13 itself is used as a positioning mechanism, the substrate 15 before molding is transferred to the molding surface of the upper mold 9, and the substrate 15 before molding is moved in the X direction and the Y direction by the supply mechanism 13 The end faces of the substrate 15 before molding are pressed against the guide members 23 and 24, respectively. Thereby, the pre-molding substrate 15 can be positioned on the molding surface of the upper mold 9. By using the supply mechanism 13 itself as a positioning mechanism, the structure of the resin molding apparatus can be further simplified.

[實施方式2] [Embodiment 2]

參照第7圖,對在實施方式2中用於檢驗供給到上模9的成型前基板15是否正常定位的機構進行說明。實施方式2與實施方式1的不同點在於,發光元件27設置在固定台板4的外部,並且在設置於固定台板4的導光部上設置有用於反射照射光33的光學部件。除此以外的結構及操作與實施方式1相同,因此省略說明。此外,在以下的實施方式中,對導向部件23、24不存在磨損或缺損等異常且成型前基板15未產生翹曲或彎曲等變形的情況進行描述。 With reference to Fig. 7, a mechanism for checking whether the pre-molding substrate 15 supplied to the upper mold 9 is normally positioned in the second embodiment will be described. The second embodiment differs from the first embodiment in that the light emitting element 27 is provided outside the fixed platen 4 and an optical member for reflecting the irradiated light 33 is provided on the light guide portion provided on the fixed platen 4. The structure and operation other than this are the same as those of the first embodiment, so the description is omitted. In addition, in the following embodiments, a description will be given of a case where there is no abnormality such as wear or chipping in the guide members 23 and 24 and the substrate 15 is not deformed such as warpage or bending before molding.

如第7圖的(a)、(b)所示,在固定台板4上分別設置有:導光部41,與第一出射用通孔29相連且沿X方向延伸;以及導光部42,與第一出射用通孔30相連且沿Y方向延伸。在沿X方向延伸的導光部41的延伸方向上配置有發光元件27。同樣,在沿Y方向延伸的導光部42的延伸方向上配置有發光元件28。 As shown in (a) and (b) of Figure 7, the fixed platen 4 is provided with a light guide portion 41 connected to the first exit through hole 29 and extending in the X direction; and a light guide portion 42 , Which is connected to the first emission through hole 30 and extends in the Y direction. The light emitting element 27 is arranged in the extending direction of the light guide 41 extending in the X direction. Similarly, the light emitting element 28 is arranged in the extending direction of the light guide portion 42 extending in the Y direction.

如第7圖的(b)所示,反射鏡43被設置於導光部41,該反射鏡43用於將從發光元件27朝向-X方向發出的照射光33的行進方向變更90度。借助反射鏡43將行進方向變更為-Z方向後的照射光33通過第一出射用通孔29後到達成型前基板15。同樣,反射鏡44被設置於導光部42,該反射鏡44用於將從發光元件朝向-Y方向發出的照射光33的行進方向變更90度。借助反射鏡44將行進方向變更為-Z方向後的照射光33通過第一出射用通孔30後到達成型前基板15。 As shown in FIG. 7(b), a reflecting mirror 43 is provided in the light guide portion 41, and the reflecting mirror 43 changes the traveling direction of the irradiation light 33 emitted from the light emitting element 27 in the −X direction by 90 degrees. The irradiation light 33 whose traveling direction is changed to the −Z direction by the reflecting mirror 43 passes through the first exit through hole 29 and reaches the pre-molding substrate 15. Similarly, a reflecting mirror 44 is provided in the light guide portion 42 for changing the traveling direction of the irradiation light 33 emitted from the light-emitting element toward the -Y direction by 90 degrees. The irradiation light 33 whose traveling direction is changed to the −Z direction by the reflecting mirror 44 passes through the first exit through hole 30 and reaches the pre-molding substrate 15.

如第7圖的(c)所示,設置於供給機構13的第一受光元件31、32的配置與實施方式1相同。用於檢驗成型前基板15的定位的操作與實施方式1同樣。因此,本實施方式也取得與實施方式1同樣的效果。 As shown in FIG. 7(c), the arrangement of the first light receiving elements 31 and 32 provided in the supply mechanism 13 is the same as that of the first embodiment. The operation for checking the positioning of the substrate 15 before molding is the same as in the first embodiment. Therefore, the present embodiment also obtains the same effect as the first embodiment.

[實施方式3] [Embodiment 3]

參照第8圖,對在實施方式3中用於檢驗供給到上模的成型前基板15是否正常定位的機構及操作進行說明。實施方式3與實施方式1的不同點在於,將發光元件27、28設置於供給機構,並且在設置於固定台板的導光部上設置有作為光學部件的兩片反射鏡。伴隨該變更,上模、下模及固定台板的結構與實施方式1~2不同。 With reference to Fig. 8, the mechanism and operation for checking whether the pre-molding substrate 15 supplied to the upper mold is normally positioned in the third embodiment will be described. The third embodiment is different from the first embodiment in that the light-emitting elements 27 and 28 are provided in the supply mechanism, and the light guide portion provided on the fixed platen is provided with two mirrors as optical components. With this change, the structures of the upper mold, the lower mold, and the fixed platen are different from those of the first and second embodiments.

(基板定位檢驗機構) (Substrate positioning inspection agency)

參照第8圖,對用於檢驗供給到上模的成型前基板15是否正常定位的機構進行說明,如第8圖的(b)、(c)所示,在供給機構45上設置有作為用於檢驗成型前基板15在X方向上的定位的結構要素的發光元件27及第一受光元件31。同樣,在供給機構45上設置有作為用於檢驗成型前基板15在Y方向上的定位的結構要素的發光元件28及第一受光元件32。 Referring to Fig. 8, the mechanism for checking whether the pre-molding substrate 15 supplied to the upper mold is normally positioned will be described. As shown in Fig. 8 (b) and (c), the supply mechanism 45 is provided with The light-emitting element 27 and the first light-receiving element 31 of the structural elements positioned in the X direction of the substrate 15 before molding are inspected. Similarly, the supply mechanism 45 is provided with a light-emitting element 28 and a first light-receiving element 32 as structural elements for checking the positioning of the substrate 15 in the Y direction before molding.

如第8圖的(a)、(b)、(c)所示,在上模48上分別設置有用於使從設置於供給機構45的發光元件27、28發出的照射光33通過的入射用通孔46及47。 發光元件27和入射用通孔46被配置為俯視觀察時重疊。同樣,發光元件28和入射用通孔47被配置為俯視觀察時重疊。此外,“入射用”的含義為從外部的發光元件27、28將照射光33射入上模48側的導光部50、51(後述)。 As shown in Fig. 8 (a), (b), (c), the upper mold 48 is provided with an incident light for passing the irradiated light 33 emitted from the light emitting elements 27 and 28 provided in the supply mechanism 45, respectively. Through holes 46 and 47. The light emitting element 27 and the incident through-hole 46 are arranged so as to overlap in a plan view. Similarly, the light-emitting element 28 and the incident through-hole 47 are arranged so as to overlap in a plan view. In addition, "for incident" means that the irradiated light 33 is incident on the light guide portions 50, 51 (described later) on the upper mold 48 side from the external light emitting elements 27, 28.

在固定台板49上沿X方向設置有與第一出射用通孔及入射用通孔46相連的導光部50。同樣,在固定台板49上沿Y方向設置有與第一出射用通孔30及入射用通孔47相連的導光部51。在導光部50中,作為光學部件分別設置有用於將照射光33的行進方向變更90度的反射鏡43a、43b。同樣,在導光部51中,作為光學部件分別設置有用於將照射光33的行進方向變更90度的反射鏡44a、44b。 The fixed platen 49 is provided with a light guide 50 connected to the first through hole for emission and the through hole 46 for incidence along the X direction. Similarly, the fixed platen 49 is provided with a light guide 51 connected to the first through hole 30 for emission and the through hole 47 for incidence along the Y direction. In the light guide 50, mirrors 43a and 43b for changing the traveling direction of the irradiation light 33 by 90 degrees are provided as optical components, respectively. Similarly, in the light guide portion 51, mirrors 44a and 44b for changing the traveling direction of the irradiation light 33 by 90 degrees are provided as optical components, respectively.

(基板定位檢驗操作(樹脂成型品的製造方法)) (Substrate positioning inspection operation (method of manufacturing resin molded products))

參照第8圖,對用於檢驗供給到上模的成型前基板15是否正常定位的操作進行說明。此外,該說明還兼作樹脂成型品的製造方法的說明。 Referring to Fig. 8, the operation for checking whether the pre-molding substrate 15 supplied to the upper mold is normally positioned will be described. In addition, this description also serves as a description of the method of manufacturing a resin molded product.

如第8圖的(b)所示,從發光元件27朝向+Z方向發出的照射光33通過入射用通孔46後射入反射鏡43a。射入反射鏡43a的照射光33通過反射鏡43a將行進方向變更90度後在導光部50內沿-X方向行進而射入反射鏡43b。射入反射鏡43b的照射光33通過反射鏡43b將行進方向變更90度後沿-Z方向行進並通過第一出射用通孔29。通過第一出射用通孔29的照射光33到達成型前基板15。 As shown in (b) of FIG. 8, the irradiation light 33 emitted from the light emitting element 27 in the +Z direction passes through the entrance through hole 46 and then enters the mirror 43a. The irradiation light 33 that has entered the mirror 43a changes its traveling direction by 90 degrees by the mirror 43a, travels in the -X direction in the light guide 50, and enters the mirror 43b. The irradiation light 33 that has entered the mirror 43b changes the traveling direction by 90 degrees by the mirror 43b, travels in the -Z direction, and passes through the first exit through hole 29. The irradiated light 33 passing through the first exit through hole 29 reaches the pre-molding substrate 15.

根據設置於供給機構45的第一受光元件31是否檢測到從發光元件27發出且依次通過入射用通孔46、導光部50及第一出射用通孔29的照射光33,來判斷成型前基板15是否正常定位在X方向上。同樣,根據第二受光元件32是否檢測到從發光元件28發出且依次通過入射用通孔47、導光部51及第一出射用通孔30的照射光33,來判斷成型前基板15是否正常定位在Y方向上。如此,能夠檢驗成型前基板15的定位。在該情況下,由於發光元件27、28及第一受光元件31、32均設置於供給機構45,因此易於將其訊號線佈線於樹脂成型裝置的控制部及判斷部。由於取得與實施方式1同樣的效果,因此省略關於作用效果的說明。 According to whether the first light-receiving element 31 provided in the supply mechanism 45 detects the irradiated light 33 emitted from the light-emitting element 27 and passed through the incident through hole 46, the light guide 50, and the first exit through hole 29 in order to determine the pre-molding Whether the substrate 15 is normally positioned in the X direction. Similarly, according to whether the second light-receiving element 32 detects the irradiated light 33 emitted from the light-emitting element 28 and sequentially passed through the incident through hole 47, the light guide 51, and the first outgoing through hole 30, it is determined whether the substrate 15 before molding is normal Position in the Y direction. In this way, the positioning of the substrate 15 before molding can be checked. In this case, since the light-emitting elements 27 and 28 and the first light-receiving elements 31 and 32 are all provided in the supply mechanism 45, it is easy to wire their signal lines to the control unit and the judgment unit of the resin molding apparatus. Since the same effect as that of the first embodiment is obtained, the description of the effect is omitted.

[實施方式4] [Embodiment 4]

參照第9圖,對在實施方式4中用於檢驗供給到上模48的成型前基板15是否正常定位的機構進行說明。實施方式4與實施方式3的不同點在於,作為光學部件使用光纖而不是反射鏡。除此以外的結構及操作與實施方式3相同,因此省略說明。 With reference to Fig. 9, a mechanism for checking whether the pre-molding substrate 15 supplied to the upper mold 48 is normally positioned in the fourth embodiment will be described. The fourth embodiment is different from the third embodiment in that an optical fiber is used as an optical component instead of a mirror. The structure and operation other than this are the same as those of the third embodiment, so the description is omitted.

如第9圖的(a)、(b)所示,在設置於固定台板49的導光部50、51上分別設置有光纖52、53。較佳光纖52、53為具有耐熱性的光纖。光纖52、53具有中心部的芯線和包圍該芯線周圍的金屬包層這雙重結構。為了保持耐熱性,優先使用如下光纖:即,該光纖的芯線及金屬包層由石英玻璃構成,並且利用耐熱性聚醯亞胺來包覆該光纖。 As shown in (a) and (b) of FIG. 9, optical fibers 52 and 53 are respectively provided on the light guide portions 50 and 51 provided on the fixed platen 49. Preferably the optical fibers 52 and 53 are optical fibers having heat resistance. The optical fibers 52 and 53 have a dual structure of a core wire at the center and a metal cladding surrounding the core wire. In order to maintain heat resistance, it is preferable to use an optical fiber in which the core wire and the metal clad of the optical fiber are made of silica glass, and the optical fiber is covered with heat-resistant polyimide.

與第一出射用通孔29、30及入射用通孔46、47的直徑對應地,可使用光纖為一根的單芯光纖,或者可使用通過捆紮多根單芯光纖並包覆而成的光纖束。此外,可以在光纖的兩端嵌入光纖用透鏡。作為透鏡,可適當使用准直透鏡、聚光透鏡或非球面透鏡等。在第9圖中示出在接收從發光元件27、28發出的照射光33的一側分別設置有光纖用透鏡54的情況。光纖52、53具有傳送損失小且佈線自由度高的特徵。此外,作為光纖,較佳使用耐熱性光纖,例如可使用由聚醯亞胺包覆的石英製光纖。 Corresponding to the diameters of the first exit through holes 29, 30 and the entrance through holes 46, 47, a single-core fiber with a single fiber can be used, or a single-core fiber formed by bundling and coating multiple single-core fibers can be used Fiber optic bundle. In addition, the optical fiber lens can be embedded at both ends of the optical fiber. As the lens, a collimator lens, a condenser lens, an aspheric lens, or the like can be suitably used. FIG. 9 shows a case where the optical fiber lens 54 is provided on the side receiving the irradiation light 33 emitted from the light emitting elements 27 and 28, respectively. The optical fibers 52 and 53 have the characteristics of low transmission loss and high wiring freedom. In addition, as the optical fiber, a heat-resistant optical fiber is preferably used. For example, a silica optical fiber coated with polyimide can be used.

用於檢驗成型前基板15的定位的操作與實施方式1相同,因此不再重複說明。本實施方式也取得與實施方式1同樣的效果。 The operation for checking the positioning of the substrate 15 before molding is the same as that of the first embodiment, so the description will not be repeated. This embodiment also has the same effect as the first embodiment.

[實施方式5] [Embodiment 5]

參照第10圖,對在實施方式5中用於檢驗供給到上模48的成型前基板15是否正常定位的機構進行說明。實施方式5與實施方式4的不同點在於將光纖設置在設置於上模48的導光部,從發光元件27發出的照射光33到達第一受光元件31的行經路線形成在僅由該上模48、該供給機構45以及該上模48和該供給機構45之間的空間所構成的位置範圍的內部。除此以外的結構及操作與實施方式4相同,因此省略說明。 With reference to Fig. 10, a mechanism for checking whether the pre-molding substrate 15 supplied to the upper mold 48 is normally positioned in the fifth embodiment will be described. The difference between the fifth embodiment and the fourth embodiment is that the optical fiber is provided in the light guide portion provided in the upper mold 48, and the path of the irradiation light 33 emitted from the light emitting element 27 to the first light receiving element 31 is formed only by the upper mold. 48. The inside of the position range formed by the supply mechanism 45 and the space between the upper mold 48 and the supply mechanism 45. The structure and operation other than this are the same as those of the fourth embodiment, so the description is omitted.

如第10圖的(a)、(b)所示,在設置於上模48的導光部55、56分別設置有實施方式4所示的光纖52、53。光纖52、53為具有耐熱性的光纖。 As shown in (a) and (b) of FIG. 10, the optical fibers 52 and 53 shown in Embodiment 4 are respectively provided in the light guide portions 55 and 56 provided on the upper mold 48. The optical fibers 52 and 53 are optical fibers having heat resistance.

用於檢驗成型前基板15的定位的操作與實施方式1相同。本實施方式也取得與實施方式1同樣的效果。 The operation for checking the positioning of the substrate 15 before molding is the same as in the first embodiment. This embodiment also has the same effect as the first embodiment.

[實施方式6] [Embodiment 6]

參照第11圖,對在實施方式6中用於同時檢驗被供給到上模9的成型前基板15是否正常定位到導向部件23、24、導向部件23、24上是否產生了磨損或缺損等異常、或者成型前基板15上是否了產生翹曲或彎曲等變形的機構進行說明。實施方式6與在此之前說明的實施方式的不同點在於第一出射用通孔29、30的設置位置不同。 Referring to Fig. 11, the sixth embodiment is used to simultaneously check whether the pre-molding substrate 15 supplied to the upper mold 9 is normally positioned on the guide members 23, 24, and whether the guide members 23, 24 have abnormalities such as wear or chipping. , Or whether there is a deformation mechanism such as warpage or bending on the substrate 15 before molding. The sixth embodiment is different from the previously described embodiments in that the installation positions of the first emission through holes 29 and 30 are different.

如第11圖的(a)所示,在成型前基板15與導向部件23、24接觸的狀態下,例如在上模9的型面的配置成型前基板15的區域中的對角線上的角部(第11圖中的右上和右下)中分別設置有第一出射用通孔29、30。在第一出射用通孔29、30設置於該位置的狀態下,發光元件27及第一受光元件31被設置為俯視觀察時與第一出射用通孔29重疊,發光元件28及第一受光元件32被設置為俯視觀察時與第一出射用通孔30重疊。 As shown in Fig. 11(a), in the state where the substrate 15 is in contact with the guide members 23 and 24 before molding, for example, the upper mold 9 is arranged at the diagonal corners in the area where the substrate 15 before molding is arranged The first exit through holes 29 and 30 are respectively provided in the parts (upper right and lower right in FIG. 11). In the state where the first emitting through holes 29 and 30 are provided at this position, the light emitting element 27 and the first light receiving element 31 are arranged so as to overlap the first emitting through hole 29 in a plan view, and the light emitting element 28 and the first light receiving element The element 32 is provided so as to overlap with the first emission through hole 30 in a plan view.

在第一受光元件31、32這兩個受光元件未檢測到從發光元件27、28發出的照射光33的情況下,可判斷為未產生成型前基板15的定位不良、導向部件23、24的異常及成型前基板15的變形。在第一受光元件31、32中的任一受光元件檢測到照射光33的情況下,可判斷為產生了成型前基板15的定位不良、導向部件23、24的異常及成型前基板15的變形中的任一種而成型前基板15未正常定位。 When the two light-receiving elements of the first light-receiving elements 31, 32 do not detect the irradiated light 33 emitted from the light-emitting elements 27, 28, it can be judged that there is no positioning failure of the substrate 15 before molding, and the failure of the guide members 23, 24. Abnormalities and deformation of the substrate 15 before molding. When any one of the first light receiving elements 31, 32 detects the irradiated light 33, it can be judged that the positioning failure of the substrate 15 before molding, the abnormality of the guide members 23, 24, and the deformation of the substrate 15 before molding have occurred. Either of them, the substrate 15 is not normally positioned before molding.

通過設為這種結構,在不增加發光元件及受光元件的數量的情況下,能夠同時檢驗成型前基板15的定位不良、導向部件23、24的異常及成型前基板15的變形。因此,在樹脂成型裝置中,能抑制定位機構的成本。 With this configuration, it is possible to simultaneously inspect the positioning failure of the substrate 15 before molding, the abnormality of the guide members 23 and 24, and the deformation of the substrate 15 before molding without increasing the number of light emitting elements and light receiving elements. Therefore, in the resin molding apparatus, the cost of the positioning mechanism can be suppressed.

[實施方式7] [Embodiment 7]

參照第12圖,對在實施方式7中用於檢驗供給到上模9的成型前基板15是否正常定位的機構進行說明。實施方式7與實施方式1的不同點在於,在成型前基板15的沿Y方向及X方向的端部分別設置兩個發光元件和兩個受光元件並檢驗成型前基板15的定位。由此,不僅在X方向及Y方向上,還在θ方向上能夠檢驗成型前基板15是否正常定位。除此以外的結構與實施方式1相同,因此省略說明。 With reference to Fig. 12, a mechanism for checking whether the pre-molding substrate 15 supplied to the upper mold 9 is normally positioned in the seventh embodiment will be described. The seventh embodiment is different from the first embodiment in that two light-emitting elements and two light-receiving elements are respectively provided at the ends of the substrate 15 before molding in the Y direction and the X direction, and the positioning of the substrate 15 before molding is checked. Therefore, it is possible to check whether the substrate 15 is normally positioned before molding not only in the X direction and the Y direction, but also in the θ direction. The structure other than this is the same as that of the first embodiment, so the description is omitted.

(基板定位檢驗機構) (Substrate positioning inspection agency)

參照第12圖,對在實施方式7中用於檢驗供給到上模9的成型前基板15的定位的機構進行說明。如第12圖的(a)所示,實施方式7與實施方式1同樣地在上模9的型面上分別設置有:導向部件23,用於將成型前基板15定位在X方向上;以及導向部件24,用於將成型前基板15定位在Y方向上。 With reference to Fig. 12, a mechanism for checking the positioning of the pre-molding substrate 15 supplied to the upper mold 9 in the seventh embodiment will be described. As shown in Fig. 12(a), in the seventh embodiment, similarly to the first embodiment, a guide member 23 is provided on the molding surface of the upper mold 9 to position the substrate 15 before molding in the X direction; and The guide member 24 is used to position the pre-molding substrate 15 in the Y direction.

如第12圖的(a)、(b)所示,為了檢驗成型前基板15在X方向上的定位,在固定台板4的內部設置有兩個發光元件27a、27b。同樣,為了檢驗成型前基板15在Y方向上的定位,在固定台板4的內部設置有兩個發光元件28a、28b。 As shown in (a) and (b) of FIG. 12, in order to verify the positioning of the substrate 15 in the X direction before molding, two light-emitting elements 27a and 27b are provided inside the fixed platen 4. Similarly, in order to verify the positioning of the substrate 15 in the Y direction before molding, two light-emitting elements 28a and 28b are provided inside the fixed platen 4.

在上模9上分別設置有使發光元件27a及27b所發出的照射光通過的第一出射用通孔29a及29b。如第12圖的(a)所示,第一出射用通孔29a、29b分別設置於在成型前基板15與導向部件23接觸的狀態下成型前基板15配置在上模 9的型面的區域上。第一出射用通孔30a、30b分別設置於在成型前基板15與導向部件24接觸的狀態下成型前基板15配置在上模9的型面的區域上。 The upper mold 9 is provided with first emission through holes 29a and 29b through which the irradiated light emitted by the light-emitting elements 27a and 27b passes, respectively. As shown in Figure 12(a), the first ejection through holes 29a, 29b are respectively provided in the state that the pre-molding substrate 15 is in contact with the guide member 23 and the pre-molding substrate 15 is placed on the upper mold. 9 on the surface area. The first ejection through holes 30 a and 30 b are respectively provided in the area where the pre-molding substrate 15 is arranged on the molding surface of the upper mold 9 in a state where the pre-molding substrate 15 is in contact with the guide member 24.

如第12圖的(c)所示,在供給機構13上分別設置有用於檢測發光元件27a、27b所發出的照射光33的第一受光元件31a、31b。第一受光元件31a、31b為用於檢驗成型前基板15在X方向上的定位的受光元件。同樣,在供給機構13上分別設置有用於檢驗發光元件28a、28b所發出的照射光33的第一受光元件32a、32b。第一受光元件32a、32b為用於檢驗成型前基板15在Y方向上的定位的受光元件。 As shown in FIG. 12(c), the supply mechanism 13 is provided with first light receiving elements 31a, 31b for detecting the irradiation light 33 emitted by the light emitting elements 27a, 27b, respectively. The first light-receiving elements 31a and 31b are light-receiving elements for checking the positioning of the substrate 15 in the X direction before molding. Similarly, the supply mechanism 13 is provided with first light-receiving elements 32a, 32b for inspecting the irradiation light 33 emitted by the light-emitting elements 28a, 28b, respectively. The first light-receiving elements 32a and 32b are light-receiving elements for checking the positioning of the substrate 15 in the Y direction before molding.

由於沿Y方向設置有兩個第一受光元件31a、31b,並且沿X方向設置有兩個第一受光元件32a、32b,因此不僅在X方向及Y方向上,還在θ方向上能夠檢驗成型前基板15是否正常定位。由此,能夠進一步高精度地檢驗成型前基板15的定位。 Since there are two first light-receiving elements 31a, 31b along the Y direction, and two first light-receiving elements 32a, 32b along the X direction, the molding can be checked not only in the X and Y directions, but also in the θ direction Whether the front substrate 15 is positioned normally. As a result, the positioning of the substrate 15 before molding can be checked with higher accuracy.

在本實施方式中,沿Y方向設置有兩個第一受光元件31a、31b,沿X方向設置有兩個第一受光元件32a、32b。不限於此,也可以設為沿Y方向設置有兩個第一受光元件且沿X方向設置有一個第一受光元件的結構。或者,也可以設為沿X方向設置有兩個第一受光元件且沿Y方向設置有一個第一受光元件的結構。在這些情況下也不僅在X方向及Y方向上,還在θ方向上能夠檢驗成型前基板15是否正常定位。 In this embodiment, two first light receiving elements 31a and 31b are provided along the Y direction, and two first light receiving elements 32a and 32b are provided along the X direction. It is not limited to this, and a structure in which two first light receiving elements are provided along the Y direction and one first light receiving element is provided along the X direction may be adopted. Alternatively, it may be a structure in which two first light receiving elements are provided along the X direction and one first light receiving element is provided along the Y direction. In these cases, not only in the X direction and the Y direction, but also in the θ direction, it is possible to check whether the substrate 15 is normally positioned before molding.

由於本實施方式中的成型前基板15的定位檢驗操作基本上與實施方式1相同,因此不再重複說明。關於作用效果,也取得與實施方式1同樣的效果。另外,用於檢驗導向部件的異常或成型前基板15的變形的機構也可以與實施方式1同樣的方式進行檢驗。 Since the positioning inspection operation of the substrate 15 before molding in this embodiment is basically the same as that in Embodiment 1, the description will not be repeated. Regarding the effects, the same effects as in the first embodiment are obtained. In addition, the mechanism for inspecting the abnormality of the guide member or the deformation of the substrate 15 before molding can also be inspected in the same manner as in the first embodiment.

[實施方式8] [Embodiment 8]

參照第13圖,對在實施方式8中用於檢驗供給到上模9的成型前基板15的定位的機構進行說明。實施方式8與實施方式7的不同點在於,為了檢驗X方向及Y方向的定位而分別設置一個發光元件和兩個第一受光元件。兩個第一受光元件經由設置於固定台板4內的導光部的光纖而接收發光元件所發出的照射光33。除此以外的結構及操作與實施方式7相同,因此省略說明。 With reference to Fig. 13, a mechanism for checking the positioning of the pre-molding substrate 15 supplied to the upper mold 9 in the eighth embodiment will be described. The eighth embodiment differs from the seventh embodiment in that one light-emitting element and two first light-receiving elements are respectively provided in order to verify the positioning in the X direction and the Y direction. The two first light-receiving elements receive the irradiated light 33 emitted by the light-emitting element through the optical fiber provided in the light guide portion in the fixed platen 4. The structure and operation other than this are the same as those of the seventh embodiment, so the description is omitted.

如第13圖的(a)、(b)所示,為了檢驗成型前基板15在X方向上的定位,在固定台板4的內部設置有具有T字型形狀的導光部57。在T字型的導光部57設置有光纖58、用於分支在光纖58內行進的光的分支部件59和分支後的光纖58a、58b。發光元件27所發出的照射光33經由光纖58和分支部件59依次通過光纖58a、58b及第一出射用通孔29a、29b後,分別被第一受光元件31a、31b檢測。 As shown in (a) and (b) of FIG. 13, in order to verify the positioning of the substrate 15 in the X direction before molding, a T-shaped light guide 57 is provided inside the fixed platen 4. The T-shaped light guide 57 is provided with an optical fiber 58, a branching member 59 for branching light traveling in the optical fiber 58, and branched optical fibers 58a and 58b. The irradiated light 33 emitted by the light emitting element 27 passes through the optical fibers 58a and 58b and the first emission through holes 29a and 29b via the optical fiber 58 and the branch member 59 in this order, and is detected by the first light receiving elements 31a and 31b, respectively.

同樣,為了檢驗成型前基板15在Y方向上的定位,在固定台板4的內部設置有具有T字型形狀的導光部60。在T字型的導光部60設置有光纖61、用於分支在光纖61內行進的光的分支部件62和分支後的光纖61a、61b。發光元件28所發出的照射光33經由光纖61和分支部件62依次通過光纖61a、61b及第一出射用通孔30a、30b後,分別被第一受光元件32a、32b檢測。 Similarly, in order to verify the positioning of the substrate 15 in the Y direction before molding, a light guide 60 having a T-shaped shape is provided inside the fixed platen 4. The T-shaped light guide 60 is provided with an optical fiber 61, a branching member 62 for branching the light traveling in the optical fiber 61, and branched optical fibers 61a and 61b. The irradiated light 33 emitted by the light emitting element 28 passes through the optical fibers 61a and 61b and the first emission through holes 30a and 30b via the optical fiber 61 and the branching member 62 in this order, and is detected by the first light receiving elements 32a and 32b, respectively.

通過設為這種結構,能夠削減發光元件的數量,並且不僅在X方向及Y方向上,還在θ方向上能夠檢驗成型前基板15是否正常定位。因此,能夠進一步高精度地檢驗成型前基板15的定位,並且能抑制定位機構的成本。 With this structure, the number of light-emitting elements can be reduced, and it is possible to check whether the substrate 15 is normally positioned before molding not only in the X direction and the Y direction, but also in the θ direction. Therefore, the positioning of the substrate 15 before molding can be verified with higher accuracy, and the cost of the positioning mechanism can be suppressed.

在此,雖然使從共同的發光元件28發出的照射光33分支到兩個第一出射用通孔30a、30b,但也可以使該照射光33分支到第一出射用通孔和第二出射用通孔。 Here, although the irradiated light 33 emitted from the common light-emitting element 28 is branched to the two first exit through holes 30a, 30b, the irradiated light 33 may be branched to the first exit through hole and the second exit. Use through holes.

在本實施方式中,為了分支發光元件所發出的照射光33,使用了光纖及分支部件。不限於此,只要採用用於分支從發光元件發出的照射光的光學部件則並不特別限定。 In this embodiment, in order to branch the irradiation light 33 emitted by the light emitting element, an optical fiber and a branch member are used. It is not limited to this, and it is not particularly limited as long as an optical member for branching the irradiated light emitted from the light-emitting element is used.

[實施方式9] [Embodiment 9]

(樹脂成型裝置的結構) (Structure of resin molding equipment)

參照第14圖對本發明所涉及的樹脂成型裝置的結構進行說明。第14圖所示的樹脂成型裝置為例如使用壓縮成型法的樹脂成型裝置。如實施方式1所示,示出將成型前基板15作為樹脂成型對象使用並且將液狀樹脂作為樹脂材料使用的例。 The structure of the resin molding apparatus according to the present invention will be described with reference to Fig. 14. The resin molding apparatus shown in FIG. 14 is a resin molding apparatus using a compression molding method, for example. As shown in Embodiment 1, an example is shown in which the pre-molding substrate 15 is used as a resin molding object and a liquid resin is used as the resin material.

樹脂成型裝置63包括分別作為結構要素的基板供給收納模組64、三個成型模組65A、65B、65C和樹脂供給模組66。作為結構要素的基板供給收納模組64、成型模組65A、65B、65C和樹脂供給模組66分別相對於其他結構要素能夠彼此裝卸,並且能夠交換。 The resin molding apparatus 63 includes a substrate supply storage module 64, three molding modules 65A, 65B, 65C, and a resin supply module 66 as constituent elements, respectively. The substrate supply storage module 64, the molding modules 65A, 65B, 65C, and the resin supply module 66 as the structural elements can be attached to and detached from other structural elements, and can be exchanged.

在基板供給收納模組64中設置有:成型前基板供給部67,用於供給成型前基板15;成型後基板收納部68,用於收納作為成型後基板的樹脂成型品22;基板載置部69,用於移交成型前基板15及樹脂成型品22;和供給機構13,用於將成型前基板15供給到成型模11中。在該情況下,例如設置有實施方式1所示的供給機構13(參照第3圖的(b)、(c))。在供給機構13上設置有用於檢驗成型前基板15的定位的第一受光元件31、32。在本實施方式中示出實施方式1中說明的定位檢驗機構,但也可以採用其他實施方式中說明的定位檢驗機構。 The substrate supply and storage module 64 is provided with a pre-molding substrate supply portion 67 for supplying the pre-molding substrate 15; a post-molding substrate storage portion 68 for accommodating the resin molded product 22 as a molded substrate; and a substrate placement portion 69, used to transfer the pre-molding substrate 15 and the resin molded product 22; and a supply mechanism 13 for supplying the pre-molding substrate 15 to the molding die 11. In this case, for example, the supply mechanism 13 shown in Embodiment 1 is provided (see (b) and (c) in FIG. 3). The supply mechanism 13 is provided with first light receiving elements 31 and 32 for checking the positioning of the substrate 15 before molding. In this embodiment, the positioning inspection mechanism described in Embodiment 1 is shown, but the positioning inspection mechanism described in other embodiments may be adopted.

在各成型模組65A、65B、65C中分別設置有第1圖所示的樹脂成型單元1。在樹脂成型單元1中設置有能夠升降的下模10和與下模10相對配置的 上模9(參照第3圖的(a)、(b))。上模9和下模10一併構造成型模11(參照第2圖)。各成型模組65A、65B、65C具有對上模9和下模10進行合模及開模的合模機構6(第14圖中的用雙點劃線表示的部分)。在下模10中設置有型腔16,型腔16為液狀樹脂20(參照第2圖的(b))所被供給且進行硬化的空間。在下模10中設置有用於供給長條狀的離型膜(參照第2圖的(a))的離型膜供給機構70。此外,在此對在下模10上設置有型腔16的結構進行說明,但型腔也可以設置於上模,並且還可以設置於上模和下模這兩個模上。 The resin molding unit 1 shown in FIG. 1 is provided in each molding module 65A, 65B, and 65C. The resin molding unit 1 is provided with a lower mold 10 that can be raised and lowered and a lower mold 10 arranged opposite to Upper mold 9 (refer to (a) and (b) of Figure 3). The upper mold 9 and the lower mold 10 construct a forming mold 11 together (refer to FIG. 2). Each molding module 65A, 65B, 65C has a mold clamping mechanism 6 (a portion indicated by a two-dot chain line in FIG. 14) for clamping and opening the upper mold 9 and the lower mold 10. A cavity 16 is provided in the lower mold 10, and the cavity 16 is a space where the liquid resin 20 (see (b) of FIG. 2) is supplied and cured. The lower mold 10 is provided with a release film supply mechanism 70 for supplying a long release film (see (a) of FIG. 2). In addition, the structure in which the cavity 16 is provided in the lower mold 10 is described here, but the cavity may be provided in the upper mold, and may also be provided in both the upper mold and the lower mold.

在樹脂供給模組66中設置有:分送器18,用於向成型模11供給液狀樹脂20;和移動機構19,用於使分送器18移動。在分送器18的前端部具有用於吐出液狀樹脂的樹脂吐出部。 The resin supply module 66 is provided with a dispenser 18 for supplying the liquid resin 20 to the molding die 11 and a moving mechanism 19 for moving the dispenser 18. The front end of the dispenser 18 has a resin discharge part for discharging liquid resin.

在樹脂供給模組66中設置有具有判斷部71的控制部72。判斷部71基於設置於供給機構13的第一受光元件31、32是否檢測到照射光33,判斷成型前基板15在成型模11中是否正常定位。此外,判斷部71還判斷導向部件上是否產生了異常或成型前基板15上是否了產生變形。控制部72控制成型前基板15及樹脂成型品22的運送、成型前基板15的定位、液狀樹脂20的供給、成型模11的加熱和成型模11的開閉等。換言之,控制部72控制基板供給收納模組64、成型模組65A、65B、65C及樹脂供給模組66中的各種操作。 The resin supply module 66 is provided with a control unit 72 having a judgment unit 71. The determining unit 71 determines whether the pre-molding substrate 15 is normally positioned in the molding die 11 based on whether the first light receiving elements 31 and 32 provided in the supply mechanism 13 have detected the irradiated light 33. In addition, the judgment unit 71 also judges whether an abnormality has occurred in the guide member or whether deformation has occurred in the substrate 15 before molding. The control unit 72 controls the transportation of the pre-molding substrate 15 and the resin molded product 22, the positioning of the pre-molding substrate 15, the supply of the liquid resin 20, the heating of the molding die 11, the opening and closing of the molding die 11, and the like. In other words, the control unit 72 controls various operations in the substrate supply storage module 64, the molding modules 65A, 65B, 65C, and the resin supply module 66.

配置控制部72的位置也可以是任何位置,控制部72也可以配置在基板供給收納模組64、成型模組65A、65B、65C和樹脂供給模組66中的至少一個模組上,還可以配置在各模組的外部。另外,也可以將控制部72構造為根據作為控制對象的操作而分離至少一部分而成的多個控制部。也可以與控制部的結構對應地設置判斷部71。 The position of the control unit 72 can be any position. The control unit 72 can also be arranged on at least one of the substrate supply storage module 64, the molding modules 65A, 65B, 65C, and the resin supply module 66. It is arranged outside each module. In addition, the control unit 72 may be configured as a plurality of control units that are separated at least in part according to an operation as a control target. The determination unit 71 may be provided corresponding to the configuration of the control unit.

由於在第2圖所示的樹脂成型品的製造方法中對樹脂成型裝置63的操作概要進行了說明,因此在此不再重複說明。 Since the outline of the operation of the resin molding apparatus 63 has been described in the method of manufacturing a resin molded article shown in FIG. 2, the description will not be repeated here.

在本實施方式中,在基板供給收納模組64與樹脂供給模組66之間沿X方向排列安裝有三個成型模組65A、65B、65C。也可以將基板供給收納模組64和樹脂供給模組66設為一個模組,並且在該模組上沿X方向排列安裝一個成型模組65A。此外,也可以在該成型模組65A上安裝其他成型模組65B。由此,能夠與生產方式或生產量對應地增減成型模組65A、65B、…。因此,能夠優化樹脂成型裝置63的結構,故能提高生產率。 In the present embodiment, three molding modules 65A, 65B, and 65C are arranged in the X direction between the substrate supply storage module 64 and the resin supply module 66. It is also possible to set the substrate supply storage module 64 and the resin supply module 66 as one module, and install one molding module 65A on the module along the X direction. In addition, other molding modules 65B can also be mounted on the molding module 65A. Thereby, it is possible to increase or decrease the molding modules 65A, 65B, ... in accordance with the production method or production volume. Therefore, the structure of the resin molding apparatus 63 can be optimized, and thus the productivity can be improved.

在各實施方式中,通過向成型模的上模供給成型前基板15,並且由設置於供給機構的受光元件檢測照射光33,從而檢驗供給到上模的成型前基板15是否正常定位。不限於此,在向成型模的下模供給成型前基板15並將其定位在下模的型面上的情況下,也可以應用本發明。在該情況下,也取得與各實施方式同樣的效果。 In each embodiment, by supplying the pre-molding substrate 15 to the upper mold of the molding die, and detecting the irradiation light 33 by the light receiving element provided in the supply mechanism, it is checked whether the pre-molding substrate 15 supplied to the upper mold is normally positioned. Not limited to this, the present invention can also be applied in the case where the pre-molding substrate 15 is supplied to the lower mold of the molding mold and positioned on the molding surface of the lower mold. Also in this case, the same effect as in each embodiment is obtained.

在各實施方式中,示出在使用壓縮成型法的樹脂成型裝置的成型模中檢驗供給到上模的成型前基板15是否正常定位的情況。不限於此,在使用傳遞成型法的樹脂成型裝置的成型模中也可以應用本發明。 In each embodiment, a case is shown in which it is checked whether the pre-molding substrate 15 supplied to the upper mold is normally positioned in the molding mold of the resin molding apparatus using the compression molding method. Not limited to this, the present invention can also be applied to a molding die of a resin molding apparatus using a transfer molding method.

在各實施方式中,示出將安裝有半導體晶片14的成型前基板15作為樹脂成型對象使用的例。作為成型前基板,可使用玻璃環氧基板、陶瓷基板、樹脂基板或金屬基板等的普通基板及引線框等。此外,樹脂成型對象也可以是如專利文獻1所記載的安裝在板夾具上的結構。 In each embodiment, an example in which the pre-molding substrate 15 on which the semiconductor wafer 14 is mounted is used as a resin molding object is shown. As the substrate before molding, ordinary substrates such as glass epoxy substrates, ceramic substrates, resin substrates, or metal substrates, lead frames, and the like can be used. In addition, the resin molding object may be a structure mounted on a plate jig as described in Patent Document 1.

在各實施方式中,對樹脂成型裝置及樹脂成型品的製造方法進行了說明。其中,該樹脂成型裝置在對半導體晶片進行樹脂成型時使用。樹脂成 型的對象可以是IC或電晶體等的半導體晶片,也可以是未使用半導體的非半導體晶片,還可以是半導體晶片和非半導體晶片混合在一起的晶片組。在利用硬化樹脂對安裝在玻璃環氧基板、陶瓷基板或引線框等基板上的一個或多個晶片進行樹脂成型時可應用本發明。 In each embodiment, a resin molding apparatus and a method of manufacturing a resin molded product have been described. Among them, this resin molding apparatus is used when resin molding a semiconductor wafer. Resin The object of the type can be a semiconductor wafer such as an IC or a transistor, a non-semiconductor wafer that does not use a semiconductor, or a wafer group in which a semiconductor wafer and a non-semiconductor wafer are mixed together. The present invention can be applied to resin molding of one or more wafers mounted on a substrate such as a glass epoxy substrate, a ceramic substrate, or a lead frame using a hardened resin.

如上述,上述實施方式的樹脂成型裝置包括:成型模,具有彼此相對配置的第一模及第二模;供給機構,用於向第一模及第二模中的任一個模供給樹脂成型對象;定位機構,用於在型面上將樹脂成型對象定位到導向部件;合模機構,用於對成型模進行合模;發光元件,用於發出照射光;第一受光元件,被設置於供給機構且能夠接收照射光;和判斷部,用於對樹脂成型對象的定位進行判斷,在一個模上設置有使來自發光元件的照射光通過的第一出射用通孔,判斷部基於第一受光元件對通過第一出射用通孔的照射光的檢測,判斷樹脂成型對象是否正常定位到導向部件。 As described above, the resin molding apparatus of the above embodiment includes: a molding die having a first die and a second die arranged opposite to each other; and a supply mechanism for supplying a resin molding object to any one of the first die and the second die Positioning mechanism for positioning the resin molding object to the guide member on the molding surface; Mold clamping mechanism for clamping the molding mold; Light emitting element for emitting light; The first light receiving element is set in the supply Mechanism and capable of receiving irradiated light; and a judging section for judging the positioning of the resin molding object, a mold is provided with a first outgoing through hole that allows the irradiated light from the light-emitting element to pass, and the judging section is based on the first light receiving The element detects the irradiated light passing through the first emission through hole to determine whether the resin molded object is normally positioned on the guide member.

根據該結構,能夠在檢驗樹脂成型對象正常定位到導向部件後的狀態下進行樹脂成型。因此,能抑制起因於定位的成型不良的產生。 According to this structure, it is possible to perform resin molding in a state after checking that the resin molding object is normally positioned on the guide member. Therefore, it is possible to suppress the occurrence of molding defects due to positioning.

此外,在上述實施方式的樹脂成型裝置中,判斷部為如下結構:在第一受光元件未檢測到照射光的情況下判斷為樹脂成型對象正常定位到導向部件;在第一受光元件檢測到照射光的情況下判斷為樹脂成型對象未正常定位到導向部件。 In addition, in the resin molding apparatus of the above-mentioned embodiment, the determining section has a structure: when the first light receiving element does not detect the irradiated light, it is determined that the resin molding object is normally positioned on the guide member; the first light receiving element detects the irradiation In the case of light, it is determined that the resin molded object is not properly positioned on the guide member.

根據該結構,基於第一受光元件是否檢測到照射光,來判斷樹脂成型對象是否正常定位到導向部件。因此,能抑制起因於定位的成型不良的產生。 According to this structure, based on whether the first light receiving element detects the irradiated light, it is determined whether the resin molded object is normally positioned on the guide member. Therefore, it is possible to suppress the occurrence of molding defects due to positioning.

此外,上述實施方式的樹脂成型裝置為如下結構:在樹脂成型對象與導向部件接觸的狀態下導向部件側的樹脂成型對象所配置的區域上設置有第一出射用通孔。 In addition, the resin molding apparatus of the above-mentioned embodiment has a structure in which a first ejection through hole is provided in a region where the resin molding object on the guide member side is arranged in a state where the resin molding object is in contact with the guide member.

根據該結構,基於第一受光元件是否檢測到通過第一出射用通孔的照射光,來判斷樹脂成型對象是否正常定位到導向部件。因此,能抑制起因於定位的成型不良的產生。 According to this structure, based on whether the first light-receiving element detects the irradiated light passing through the first outgoing through hole, it is determined whether the resin molded object is normally positioned on the guide member. Therefore, it is possible to suppress the occurrence of molding defects due to positioning.

此外,上述實施方式的樹脂成型裝置為如下結構:在一個模或安裝有一個模的台板上設置有導光部,該導光部用於將從發光元件發出的照射光引導到第一出射用通孔,在導光部設置有使照射光通過的光學部件。 In addition, the resin molding apparatus of the above embodiment has a structure in which one mold or a platen on which one mold is mounted is provided with a light guide portion for guiding the irradiated light emitted from the light emitting element to the first exit With the through hole, an optical member for passing the irradiated light is provided in the light guide portion.

根據該結構,通過在導光部上設置光學部件,能夠將從發光元件發出的照射光引導到第一出射用通孔。 According to this configuration, by providing the optical member on the light guide portion, it is possible to guide the irradiated light emitted from the light emitting element to the first emission through hole.

此外,上述實施方式的樹脂成型裝置為如下結構:光學部件包含光纖、反射鏡及棱鏡中的任一種。 In addition, the resin molding apparatus of the above-mentioned embodiment has a structure in which the optical component includes any one of an optical fiber, a mirror, and a prism.

根據該結構,通過使用光纖、反射鏡及棱鏡中的任一種,能夠將照射光引導到第一出射用通孔。 According to this structure, by using any one of an optical fiber, a mirror, and a prism, it is possible to guide the irradiated light to the first emission through hole.

此外,上述實施方式的樹脂成型裝置為如下結構:發光元件被設置於供給機構,在一個模上設置有入射用通孔,該入射用通孔用於使從發光元件發出的照射光通過並將其引導到導光部。 In addition, the resin molding apparatus of the above-mentioned embodiment has a structure in which the light-emitting element is provided in the supply mechanism, and one mold is provided with an incident through hole for passing the irradiated light from the light-emitting element and It is guided to the light guide.

根據該結構,能夠將從設置於供給機構的發光元件發出的照射光經由入射用通孔及光學部件引導到第一出射用通孔。 According to this configuration, the irradiated light emitted from the light emitting element provided in the supply mechanism can be guided to the first emission through hole via the incident through hole and the optical member.

此外,上述實施方式的樹脂成型裝置為如下結構:在樹脂成型對象與導向部件接觸的狀態下導向部件的相反側中的樹脂成型對象所配置的區域 上設置有使從發光元件或其他發光元件發出的照射光通過的第二出射用通孔,在供給機構上設置有能夠接收照射光的第二受光元件。 In addition, the resin molding apparatus of the above-mentioned embodiment has a structure in which the resin molding object is arranged in an area on the opposite side of the guide member in a state where the resin molding object is in contact with the guide member A second emission through hole is provided for passing the irradiated light emitted from a light-emitting element or other light-emitting element, and a second light-receiving element capable of receiving the irradiated light is provided on the supply mechanism.

根據該結構,能夠基於第二受光元件是否檢測到通過設置於導向部件的相反側的第二出射用通孔的照射光,來判斷導向部件的異常及樹脂成型對象是否產生變形中的至少一種。因此,能抑制起因於定位的成型不良的產生。 According to this configuration, it is possible to determine at least one of abnormality of the guide member and deformation of the resin molded object based on whether or not the second light receiving element detects the irradiated light passing through the second emission through hole provided on the opposite side of the guide member. Therefore, it is possible to suppress the occurrence of molding defects due to positioning.

上述實施方式的樹脂成型品的製造方法包括:供給製程,通過供給機構向具有彼此相對配置的第一模及第二模的成型模中的任一個模的型面供給樹脂成型對象;定位製程,在型面上將樹脂成型對象定位到導向部件;照射製程,從發光元件發出通過設置於一個模的第一出射用通孔的照射光;檢測製程,設置於供給機構的第一受光元件對通過第一出射用通孔的照射光進行檢測;判斷製程,基於檢測製程中的檢測,判斷樹脂成型對象是否正常定位到導向部件;和樹脂成型製程,在判斷製程中判斷為樹脂成型對象正常定位的情況下,在樹脂成型製程中對成型模進行合模而進行樹脂成型。 The method of manufacturing a resin molded product of the above-mentioned embodiment includes: a supplying process of supplying a resin molding object to the molding surface of any one of the molding dies having a first mold and a second mold arranged opposite to each other through a supplying mechanism; a positioning process, Position the resin molding object to the guide member on the molding surface; the irradiation process, from the light-emitting element, emits the irradiated light through the first outgoing through hole provided in a mold; the detection process, the first light-receiving element provided in the supply mechanism passes through The first exit is detected by the irradiated light of the through hole; the judgment process is based on the detection in the detection process to judge whether the resin molding object is normally positioned to the guide member; and the resin molding process is judged as the resin molding object is normally positioned during the judgment process In this case, the molding die is closed during the resin molding process to perform resin molding.

根據該方法,能夠在檢驗樹脂成型對象正常定位到導向部件後的狀態下進行樹脂成型。因此,能抑制起因於定位的成型不良的產生。 According to this method, it is possible to perform resin molding in a state where it is verified that the resin molding object is normally positioned on the guide member. Therefore, it is possible to suppress the occurrence of molding defects due to positioning.

此外,上述實施方式的樹脂成型品的製造方法在檢測製程中第一受光元件未檢測到照射光的情況下,在判斷製程中判斷為樹脂成型對象正常定位到導向部件;在檢測製程中第一受光元件檢測到照射光的情況下,在判斷製程中判斷為樹脂成型裝置未正常定位到導向部件。 In addition, in the method for manufacturing a resin molded article of the above embodiment, when the first light receiving element does not detect the irradiated light in the inspection process, it is determined in the determination process that the resin molded object is normally positioned on the guide member; in the inspection process, the first When the light-receiving element detects the irradiated light, it is determined in the judging process that the resin molding device is not properly positioned to the guide member.

根據該方法,基於第一受光元件是否檢測到照射光,來判斷樹脂成型對象是否正常定位到導向部件。因此,能抑制起因於定位的成型不良的產生。 According to this method, based on whether the first light receiving element detects the irradiated light, it is determined whether the resin molded object is normally positioned on the guide member. Therefore, it is possible to suppress the occurrence of molding defects due to positioning.

此外,上述實施方式的樹脂成型品的製造方法在檢測製程中對通過第一出射用通孔的照射光進行檢測,其中,所述第一出射用通孔被設置於在樹脂成型對象與導向部件接觸的狀態下導向部件側的樹脂成型對象所配置的區域上。 In addition, in the method of manufacturing a resin molded article of the above-mentioned embodiment, the irradiated light passing through the first through-hole for exit is detected in the inspection process, wherein the first through-hole for exit is provided between the resin molded object and the guide member In the contact state, on the area where the resin molded object on the side of the guide member is arranged.

根據該方法,基於第一受光元件是否檢測到通過第一出射用通孔的照射光,來判斷樹脂成型對象是否正常定位到導向部件。因此,能抑制起因於定位的成型不良的產生。 According to this method, it is determined whether or not the resin molded object is normally positioned on the guide member based on whether the first light receiving element detects the irradiated light passing through the first emission through hole. Therefore, it is possible to suppress the occurrence of molding defects due to positioning.

此外,上述實施方式的樹脂成型品的製造方法在照射製程中朝向導光部發出照射光,其中所述導光部被設置於一個模上或者設置於安裝有一個模的台板上,在檢測製程中對經由導光部而通過第一出射用通孔的照射光進行檢測。 In addition, the method of manufacturing a resin molded article of the above embodiment emits irradiating light toward the light guide portion during the irradiation process, wherein the light guide portion is provided on a mold or a platen on which a mold is mounted, and the inspection During the manufacturing process, the irradiated light passing through the first emission through hole through the light guide portion is detected.

根據該方法,基於第一受光元件是否檢測到經由導光部而通過第一出射用通孔的照射光,來判斷樹脂成型對象是否正常定位到導向部件。因此,能抑制起因於定位的成型不良的產生。 According to this method, it is determined whether or not the resin molded object is normally positioned on the guide member based on whether or not the first light receiving element detects the irradiated light passing through the first emission through hole via the light guide portion. Therefore, it is possible to suppress the occurrence of molding defects due to positioning.

此外,在上述實施方式的樹脂成型品的製造方法中,發光元件被設置於供給機構,照射光從發光元件依次經由設置於一個模的入射用通孔、導光部及第一出射用通孔後被第一受光元件檢測。 In addition, in the method of manufacturing a resin molded article of the above embodiment, the light emitting element is provided in the supply mechanism, and the irradiated light from the light emitting element sequentially passes through the incident through hole, the light guide portion, and the first exit through hole provided in one mold Then it is detected by the first light-receiving element.

根據該方法,基於第一受光元件是否檢測到由設置於供給機構的發光元件發出且依次通過入射用通孔、導光部及第一出射用通孔的照射光,來判斷樹脂成型對象是否正常定位到導向部件。因此,能抑制起因於定位的成型不良的產生。 According to this method, it is judged whether the resin molding object is normal based on whether the first light receiving element detects the irradiated light emitted by the light emitting element provided in the supply mechanism and passing through the incident through hole, the light guide portion, and the first emission through hole in sequence Position to the guide part. Therefore, it is possible to suppress the occurrence of molding defects due to positioning.

此外,在上述實施方式的樹脂成型品的製造方法中,檢測製程包括以下製程:第二受光元件對通過第二出射用通孔的從發光元件或其他發光元件發出的照射光進行檢測,其中,在樹脂成型對象與導向部件接觸的狀態下進一步在導向部件的相反側中的樹脂成型對象所配置的區域上設置有所述第二出射用通孔,在判斷製程中基於檢測製程中的由第二受光元件進行的檢測,判斷導向部件的異常及樹脂成型對象的變形中的至少一種。 In addition, in the method of manufacturing a resin molded article of the above embodiment, the detection process includes the following process: the second light receiving element detects the irradiated light emitted from the light emitting element or other light emitting element through the second emission through hole, wherein, In a state where the resin molding object is in contact with the guide member, the second ejection through hole is further provided on the area where the resin molding object on the opposite side of the guide member is arranged, and the judgment process is based on the detection process. 2. Detection by the light receiving element to determine at least one of the abnormality of the guide member and the deformation of the resin molded object.

根據該方法,能夠基於第二受光元件是否檢測到通過設置於導向部件的相反側的第二出射用通孔的照射光,來判斷導向部件的異常及樹脂成型對象是否產生變形中的至少一種。 According to this method, it is possible to determine at least one of abnormality of the guide member and deformation of the resin molded object based on whether the second light receiving element detects the irradiated light passing through the second emission through hole provided on the opposite side of the guide member.

因此,能抑制起因於定位的成型不良的產生。 Therefore, it is possible to suppress the occurrence of molding defects due to positioning.

本發明並不限定於上述的各實施方式,在不脫離本發明精神的範圍內,可根據需要,任意且適當地組合、變更或選擇性地採用。 The present invention is not limited to the above-mentioned respective embodiments, and can be combined, changed or selectively adopted arbitrarily and appropriately as needed within the scope not departing from the spirit of the present invention.

10:下模 10: Lower die

13:供給機構 13: Supply organization

14:半導體晶片 14: Semiconductor wafer

15:成型前基板 15: Substrate before molding

16:型腔 16: cavity

23、24:導向部件 23, 24: guide parts

25、26:定位機構 25, 26: positioning mechanism

27、28:發光元件 27, 28: Light-emitting components

29、30:第一出射用通孔 29, 30: Through hole for the first shot

31、32:第一受光元件 31, 32: the first light receiving element

4:固定台板 4: fixed platen

9:上模 9: upper die

Claims (4)

一種樹脂成型裝置,包括:成型模,具有彼此相對配置的第一模及第二模;供給機構,用於向該第一模及該第二模中的任一個模的型面供給樹脂成型對象;定位機構,用於在該型面上將該樹脂成型對象定位到導向部件;合模機構,用於對該成型模進行合模;發光元件,用於發出照射光;第一受光元件,被設置於該供給機構且能夠接收該照射光;以及判斷部,用於對該樹脂成型對象的定位進行判斷,在該一個模中設置有使來自該發光元件的該照射光通過的第一出射用通孔,該第一出射用通孔以在該樹脂成型對象與該導向部件接觸的狀態下與該樹脂成型對象端面的內側區域對應的方式設置在該一個模上,該第一受光元件設置為,在該樹脂成型對象定位到該導向部件的狀態下俯視觀察時該第一受光元件與該第一出射用通孔重疊,在該一個模上設置有導光部,該導光部用於將從該發光元件發出的該照射光引導到該第一出射用通孔,在該導光部上設置有使該照射光通過的光學部件, 該發光元件設置在該供給機構上,在該一個模上設置有入射用通孔,該入射用通孔用於使從該發光元件發出的該照射光通過並引導到該導光部,從該發光元件發出的照射光到達該第一受光元件的行經路線形成在僅由該一個模、該供給機構以及該一個模和該供給機構之間的空間所構成的位置範圍的內部,在該第一受光元件未檢測到該照射光的情況下,該判斷部判斷為該樹脂成型對象正常定位到該導向部件;在該第一受光元件檢測到該照射光的情況下,該判斷部判斷為該樹脂成型對象未正常定位到該導向部件。 A resin molding device includes: a molding die having a first die and a second die arranged opposite to each other; a supply mechanism for supplying a resin molding object to the molding surface of any one of the first die and the second die Positioning mechanism for positioning the resin molding object to the guide member on the molding surface; Mold clamping mechanism for clamping the molding mold; Light emitting element for emitting light; First light receiving element Provided in the supply mechanism and capable of receiving the irradiated light; and a judging section for determining the positioning of the resin molded object, and a first emitting device for passing the irradiated light from the light-emitting element is provided in the one mold A through hole is provided in the one mold so as to correspond to the inner region of the end face of the resin molded object in a state where the resin molded object is in contact with the guide member, and the first light receiving element is provided as When the resin molding object is positioned on the guide member in a plan view, the first light receiving element overlaps the first emitting through hole, and a light guide portion is provided on the one mold, and the light guide portion is used to The irradiated light emitted from the light-emitting element is guided to the first emission through hole, and an optical member for passing the irradiated light is provided on the light guide portion, The light-emitting element is provided on the supply mechanism, and the one mold is provided with a through-hole for incidence, and the through-hole for incidence is used to pass and guide the irradiated light emitted from the light-emitting element to the light guide, and from the The path of the irradiated light emitted by the light-emitting element to the first light-receiving element is formed within the position range formed by only the one mold, the supply mechanism, and the space between the one mold and the supply mechanism. If the light receiving element does not detect the irradiated light, the judgment unit judges that the resin molding object is normally positioned on the guide member; if the first light receiving element detects the irradiated light, the judgment unit judges that the resin The molding object is not normally positioned to the guide part. 如申請專利範圍第1項所述之樹脂成型裝置,其中在該一個模中的、在該樹脂成型對象與該導向部件接觸的狀態下該導向部件的相反側上的該樹脂成型對象所配置的區域上設置有第二出射用通孔,其中,該第二出射用通孔用於使從該發光元件或其他發光元件發出的照射光通過,在該供給機構上設置有第二受光元件,該第二受光元件能夠接收通過該第二出射用通孔的該照射光。 The resin molding apparatus described in claim 1, wherein in the one mold, the resin molding object on the opposite side of the guide member is arranged in a state where the resin molding object is in contact with the guide member The area is provided with a second emission through hole, wherein the second emission through hole is used to pass the irradiated light emitted from the light-emitting element or other light-emitting elements, the supply mechanism is provided with a second light-receiving element, the The second light receiving element can receive the irradiated light passing through the second emission through hole. 一種樹脂成型品的製造方法,包括:供給製程,通過供給機構向具有彼此相對配置的第一模及第二模的成型模中的任一個模的型面供給樹脂成型對象;定位製程,在該型面上將該樹脂成型對象定位到導向部件;照射製程,從發光元件發出照射光,該照射光通過設置於該一個模的第一出射用通孔; 檢測製程,由設置於該供給機構的第一受光元件對通過該第一出射用通孔的該照射光進行檢測;判斷製程,基於該檢測製程中的檢測,判斷該樹脂成型對象是否正常定位到該導向部件;以及樹脂成型製程,在該判斷製程中判斷為該樹脂成型對象正常定位的情況下,對該成型模進行合模而進行樹脂成型,將該第一出射用通孔以在該樹脂成型對象與該導向部件接觸的狀態下與該樹脂成型對象端面的內側區域對應的方式設置在該一個模上,將該第一受光元件設置為,在該樹脂成型對象定位到該導向部件的狀態下俯視觀察時該第一受光元件與該第一出射用通孔重疊,在該照射製程中,朝向設置在該一個模上的導光部發出該照射光,在該檢測製程中,針對經由該導光部通過該第一出射用通孔的該照射光進行檢測,該發光元件設置在該供給機構上,該照射光從該發光元件依次經由設置在該一個模上的入射用通孔、該導光部、該第一出射用通孔後被該第一受光元件檢測,從該發光元件發出的照射光到達該第一受光元件的行經路線形成在僅由該一個模、該供給機構以及該一個模和該供給機構之間的空間所構成的位置範圍的內部, 在該檢測製程中該第一受光元件未檢測到該照射光的情況下,在該判斷製程中判斷為該樹脂成型對象正常定位到該導向部件;在該檢測製程中該第一受光元件檢測到該照射光的情況下,在該判斷製程中判斷為該樹脂成型對象未正常定位到該導向部件。 A method of manufacturing a resin molded product includes: a supplying process, supplying a resin molding object to the molding surface of any one of the molding dies having a first mold and a second mold disposed opposite to each other through a supplying mechanism; Position the resin molding object on the guide member on the molding surface; irradiate the manufacturing process to emit irradiated light from the light-emitting element, and the irradiated light passes through the first exit through hole provided in the one mold; The detection process, the first light-receiving element provided in the supply mechanism detects the irradiated light passing through the first exit through hole; the judgment process, based on the detection in the detection process, determines whether the resin molding object is normally positioned The guide member; and the resin molding process, in the case of determining that the resin molding object is normally positioned in the determining process, the molding mold is clamped to perform resin molding, and the first through hole for ejection is used in the resin When the molding object is in contact with the guide member, it is set on the one mold so as to correspond to the inner region of the end surface of the resin molding object, and the first light receiving element is set to be in a state where the resin molding object is positioned on the guide member When viewed from the top down, the first light receiving element overlaps the first emitting through hole. During the irradiation process, the irradiation light is emitted toward the light guide portion provided on the one mold. During the inspection process, the The light guide is detected by the irradiated light from the first outgoing through hole, the light-emitting element is provided on the supply mechanism, and the irradiated light sequentially passes from the light-emitting element through the incident through hole provided on the one mold, the The light guide portion, the first exit hole are detected by the first light receiving element, and the path of the irradiated light emitted from the light emitting element to the first light receiving element is formed by only the one mold, the supply mechanism, and the The interior of the position range formed by the space between a mold and the supply mechanism, In the case that the first light-receiving element does not detect the irradiated light in the detection process, it is determined in the judgment process that the resin molded object is normally positioned on the guide member; in the detection process, the first light-receiving element detects In the case of the irradiated light, it is determined in the determination process that the resin molded object is not normally positioned on the guide member. 如申請專利範圍第3項所述之樹脂成型品的製造方法,其中該檢測製程包括以下製程:第二受光元件對通過第二出射用通孔的從該發光元件或其他發光元件發出的照射光進行檢測,其中,在該樹脂成型對象與該導向部件接觸的狀態下進一步在該導向部件的相反側中的該樹脂成型對象所配置的區域上設置有該第二出射用通孔,在該判斷製程中,基於該檢測製程中的由該第二受光元件進行的檢測,判斷該導向部件的異常及該樹脂成型對象的變形中的至少一種。 According to the method of manufacturing a resin molded article described in the scope of the patent application, the detection process includes the following process: the second light-receiving element responds to the light emitted from the light-emitting element or other light-emitting elements through the second emission through hole Detection is performed, wherein the second ejection through hole is further provided on the region where the resin molded object is arranged on the opposite side of the guide member in a state where the resin molded object is in contact with the guide member, and in the judgment During the manufacturing process, at least one of the abnormality of the guide member and the deformation of the resin molded object is determined based on the detection performed by the second light-receiving element in the detection process.
TW107105777A 2017-04-26 2018-02-21 Resin molding device and manufacturing method of resin molded product TWI704043B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2017-087132 2017-04-26
JP2017087132A JP6894285B2 (en) 2017-04-26 2017-04-26 Resin molding equipment and manufacturing method of resin molded products

Publications (2)

Publication Number Publication Date
TW201838783A TW201838783A (en) 2018-11-01
TWI704043B true TWI704043B (en) 2020-09-11

Family

ID=64094603

Family Applications (1)

Application Number Title Priority Date Filing Date
TW107105777A TWI704043B (en) 2017-04-26 2018-02-21 Resin molding device and manufacturing method of resin molded product

Country Status (4)

Country Link
JP (1) JP6894285B2 (en)
KR (1) KR102153058B1 (en)
CN (1) CN108789988B (en)
TW (1) TWI704043B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7203778B2 (en) * 2020-01-21 2023-01-13 Towa株式会社 RESIN MOLDING APPARATUS AND RESIN MOLDED PRODUCT MANUFACTURING METHOD
JP2022037315A (en) 2020-08-25 2022-03-09 Towa株式会社 Resin molding equipment and method for manufacturing resin molded product

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200712800A (en) * 2005-06-08 2007-04-01 Canon Kk Mold, pattern forming method, and pattern forming apparatus
TW201040009A (en) * 2009-05-08 2010-11-16 Hon Hai Prec Ind Co Ltd Method for making optical element and imprinting mold
JP2015154201A (en) * 2014-02-13 2015-08-24 キヤノン株式会社 Image processing system, control method for the same, and program

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH084267Y2 (en) * 1989-05-31 1996-02-07 三菱マテリアル株式会社 Mold for element package molding
JPH05109797A (en) * 1991-10-14 1993-04-30 Mitsubishi Electric Corp Semiconductor resin sealing device
JPH1086188A (en) * 1996-09-18 1998-04-07 Sony Corp Mold assembly for ic package
JP3398032B2 (en) * 1997-12-10 2003-04-21 河西工業株式会社 Sheet material positioning method and positioning device
JP4362296B2 (en) * 2003-02-25 2009-11-11 アピックヤマダ株式会社 Work carry-in device and resin sealing device
JP2005154201A (en) * 2003-11-26 2005-06-16 Sumitomo Heavy Ind Ltd Mold assembly, press apparatus, handling apparatus and method, and positioning method
CN101604124B (en) * 2005-06-08 2011-07-27 佳能株式会社 Mold, pattern forming method, and pattern forming apparatus
CN101037013A (en) * 2006-03-15 2007-09-19 鸿富锦精密工业(深圳)有限公司 Mould device
JP4965933B2 (en) * 2006-08-11 2012-07-04 アピックヤマダ株式会社 Mold equipment
JP4848255B2 (en) * 2006-11-29 2011-12-28 アピックヤマダ株式会社 Resin molding method and resin molding apparatus
JP6294680B2 (en) * 2014-01-24 2018-03-14 キヤノン株式会社 Imprint apparatus and article manufacturing method
JP6566706B2 (en) * 2015-04-29 2019-08-28 Towa株式会社 Article manufacturing apparatus and method

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200712800A (en) * 2005-06-08 2007-04-01 Canon Kk Mold, pattern forming method, and pattern forming apparatus
TW201040009A (en) * 2009-05-08 2010-11-16 Hon Hai Prec Ind Co Ltd Method for making optical element and imprinting mold
JP2015154201A (en) * 2014-02-13 2015-08-24 キヤノン株式会社 Image processing system, control method for the same, and program

Also Published As

Publication number Publication date
JP2018183931A (en) 2018-11-22
TW201838783A (en) 2018-11-01
KR102153058B1 (en) 2020-09-07
JP6894285B2 (en) 2021-06-30
KR20180120074A (en) 2018-11-05
CN108789988A (en) 2018-11-13
CN108789988B (en) 2021-01-15

Similar Documents

Publication Publication Date Title
TWI704043B (en) Resin molding device and manufacturing method of resin molded product
CN102468120A (en) Laser processing device and laser processing method using the same
CN113702269B (en) Chemical liquid supply device and coating and developing system
KR20190099143A (en) Resin molding machine and resin molding method
KR20190073353A (en) Holding apparatus, inspection apparatus, inspection method, resin sealing apparatus, resin sealing method, and manufacturing method of resin sealed article
KR20210072820A (en) Inspection device and inspection method
KR101265923B1 (en) Automatic inspection system for plc chip
KR101953146B1 (en) Method and apparatus for inspecting a chip prior to bonding
TW202132780A (en) Stage and inspection apparatus
KR101705656B1 (en) Apparatus for arrayed waveguide grating module assembling
TW202015510A (en) Transferring of electronic components from a first to a second carrier
KR102214324B1 (en) Apparatus and method for dispensing package
WO2017023130A1 (en) Probe pin bonding apparatus
KR101324973B1 (en) Semiconductor Package Inspecting Unit, Semiconductor Package Inspecting Device and Semiconductor Package Inspecting method
US20220059377A1 (en) Inspection device, resin molding apparatus, and method of manufacturing resin molded product
US20210005498A1 (en) Collet inspection in a semiconductor pick and place apparatus
KR100417764B1 (en) An apparatus and a method for defect inspection
JP2007327878A (en) Apparatus for measuring optical device, and optical device measurement method
KR101551351B1 (en) Method for Inspecting Lead Frame of LED
KR102056800B1 (en) Lighting apparatus for inspection
TWI808864B (en) Calibration method, and manufacturing method of electronic component
KR102214325B1 (en) Apparatus and method for dispensing package
TWI842312B (en) Wafer bumps inspection device and semiconductor electroplating apparatus having the same
KR101324969B1 (en) Semiconductor Package Inspecting Device
JP3198175B2 (en) Position shift detector