TWI690401B - Breaking device, breaking system and breaking unit - Google Patents
Breaking device, breaking system and breaking unit Download PDFInfo
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- TWI690401B TWI690401B TW105109658A TW105109658A TWI690401B TW I690401 B TWI690401 B TW I690401B TW 105109658 A TW105109658 A TW 105109658A TW 105109658 A TW105109658 A TW 105109658A TW I690401 B TWI690401 B TW I690401B
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/04—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by tools other than rotary type, e.g. reciprocating tools
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0005—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by breaking, e.g. dicing
- B28D5/0011—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by breaking, e.g. dicing with preliminary treatment, e.g. weakening by scoring
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Abstract
本發明提供一種能夠以精簡之構成對基板進行裂斷之裂斷裝置、裂斷系統及裂斷單元。 The invention provides a fracturing device, a fracturing system and a fracturing unit capable of fracturing a substrate with a simplified structure.
裂斷裝置12,具備二個裂斷單元12a,二個裂斷單元12a以隔著基板G1彼此對向之方式配置。二個裂斷單元12a,分別具備沿基板G1之刻劃線延伸之裂斷棒107、使裂斷棒107往接近基板G1之方向及從基板G1離開之方向移動之馬達及滾珠螺桿、配置於夾著裂斷棒107之位置之二個承受部106a、以及使二個承受部106a往接近基板G1之方向及從基板G1離開之方向移動之汽缸103。 The breaking device 12 includes two breaking units 12a, and the two breaking units 12a are arranged to face each other across the substrate G1. The two breaking units 12a respectively include a breaking bar 107 extending along the scribe line of the substrate G1, a motor and a ball screw that move the breaking bar 107 toward and away from the substrate G1, and are arranged on The two receiving portions 106a sandwiching the breaking bar 107 and the cylinder 103 that moves the two receiving portions 106a toward and away from the substrate G1.
Description
本發明係關於一種在對基板進行裂斷時使用之裂斷裝置、裂斷系統及裂斷單元。 The invention relates to a breaking device, a breaking system and a breaking unit used when breaking a substrate.
以往,基板之分斷,係藉由在基板兩面形成刻劃線後,沿所形成之刻劃線,對基板之上面與下面施加既定之力以使其裂斷之方式進行。 In the past, the breaking of the substrate was carried out by forming a scribe line on both sides of the substrate, and applying a predetermined force to the upper and lower surfaces of the substrate to break the scribe line along the formed scribe line.
以下之專利文獻1中,記載有一種裂斷裝置,該裂斷裝置具備:將基板從上游往下游進行搬送之搬送單元、沿形成於下面之刻劃線裂斷下側基板之第1裂斷單元、及沿形成於上面之刻劃線裂斷上側基板之第2裂斷單元。第1裂斷單元與第2裂斷單元,均具備於上下方向配置在相對向位置的裂斷棒與承托棒(back-up bar)。 The following Patent Document 1 describes a cleaving device including: a conveying unit that conveys a substrate from upstream to downstream, and a first cleavage that cleaves a lower substrate along a score line formed below The unit and the second split unit that splits the upper substrate along the scribe line formed on the upper side. Both the first splitting unit and the second splitting unit include a splitting bar and a back-up bar arranged at opposite positions in the up-down direction.
專利文獻1:日本特開2014-200940號公報 Patent Literature 1: Japanese Patent Laid-Open No. 2014-200940
上述專利文獻1中記載之裂斷裝置,第1裂斷單元與第2裂斷單元以在搬送方向設有間隔之方式排列配置。因此,產生裝置大型化且構成變複雜之問題。 In the breaking device described in the above-mentioned Patent Document 1, the first breaking unit and the second breaking unit are arranged side by side with a gap in the conveying direction. Therefore, a problem arises in that the device becomes large and the configuration becomes complicated.
有鑑於上述課題,本發明之目的在提供一種能夠以精簡之構成對基板進行裂斷之裂斷裝置、裂斷系統及裂斷單元。 In view of the above-mentioned problems, an object of the present invention is to provide a breaking device, a breaking system, and a breaking unit capable of breaking a substrate with a simplified structure.
本發明之第1態樣,係關於一種沿形成在貼合第1基板及第2基板而成之基板兩面之刻劃線對該基板進行裂斷之裂斷裝置。本態樣之裂斷裝置,具備配置於該第1基板側之第1裂斷單元、與配置於該第2基板側之第2裂斷單元。該第1裂斷單元與該第2裂斷單元,以隔著該基板彼此對向之方式配置。該第1裂斷單元及該第2裂斷單元,分別具備沿該刻劃線延伸之裂斷棒、使該裂斷棒往接近該基板之方向及從該基板離開之方向移動之第1驅動部、配置於夾著該裂斷棒之位置之二個承受部、及使該二個承受部往接近該基板之方向及從該基板離開之方向移動之第2驅動部。 The first aspect of the present invention relates to a breaking device for breaking the substrate along the scribe lines formed on both sides of the substrate formed by bonding the first substrate and the second substrate. The breaking device of this aspect includes a first breaking unit arranged on the side of the first substrate, and a second breaking unit arranged on the side of the second substrate. The first breaking unit and the second breaking unit are arranged to face each other across the substrate. The first splitting unit and the second splitting unit each include a splitting rod extending along the scribe line, and a first drive to move the splitting rod toward and away from the substrate Part, two receiving parts arranged at a position sandwiching the breaking bar, and a second driving part that moves the two receiving parts toward the substrate and away from the substrate.
根據本態樣之裂斷裝置,在對第1基板進行裂斷時,係在配置於第1基板側之第1裂斷單元的二個承受部支承第1基板之狀態下,配置於第2基板側之第2裂斷單元的裂斷棒按壓第2基板。另一方面,在對第2基板進行裂斷時,係在配置於第2基板側之第2裂斷單元的二個承受部支承第2基板之狀態下,配置於第1基板側之第1裂斷單元的裂斷棒按壓第1基板。如上所述,根據本態樣之裂斷裝置,可藉由將第1及第2裂斷單元配置成對向於第1基板側及第2基板側,而在相同位置對第1基板及第2基板進行裂斷。據此,能夠以精簡之構成對基板進行裂斷。 According to the splitting device of this aspect, when splitting the first substrate, the two receiving portions of the first splitting unit disposed on the side of the first substrate support the first substrate, and are disposed on the second substrate The breaking rod of the second breaking unit on the side presses the second substrate. On the other hand, when the second substrate is split, the first substrate disposed on the first substrate side is supported by the two receiving portions of the second cleavage unit disposed on the second substrate side supporting the second substrate The breaking bar of the breaking unit presses the first substrate. As described above, according to the splitting device of this aspect, by arranging the first and second splitting units to face the first substrate side and the second substrate side, the first substrate and the second The substrate is broken. According to this, the substrate can be broken with a simplified structure.
本態樣之裂斷裝置中,該第1驅動部,可具備馬達及滾珠螺桿。藉此,能以良好精度進行裂斷棒之驅動。 In the breaking device of this aspect, the first drive unit may include a motor and a ball screw. By this, the splitting rod can be driven with good accuracy.
本態樣之裂斷裝置中,該第2驅動部,可具備汽缸。 In the breaking device of this aspect, the second driving unit may be provided with a cylinder.
本態樣之裂斷裝置中,該第1裂斷單元及該第2裂斷單元,可分別進一步具備用以導引該裂斷棒於上下方向移動的導引部。藉此,能 夠使裂斷棒以所欲之角度適當且正確地按壓刻劃線。 In the splitting device of this aspect, the first splitting unit and the second splitting unit may each further include a guide portion for guiding the splitting bar to move in the vertical direction. By this, can It is enough to press the scribing line properly and correctly at the desired angle.
本態樣之裂斷裝置中,該第1驅動部,可於多處支承該裂斷棒。藉此,由於來自第1驅動部之力分散地傳至裂斷棒,因此與第1驅動部於一處支承裂斷棒之情形相較,能以均等之力使裂斷棒按壓基板。 In the splitting device of this aspect, the first driving section can support the splitting bar at multiple locations. By this, since the force from the first driving part is dispersedly transmitted to the breaking rod, the breaking rod can be pressed against the substrate with an equal force as compared with the case where the first driving section supports the breaking rod at one place.
本態樣之裂斷裝置中,該裂斷棒之端部,可形成為V字狀。藉此,能夠沿著刻劃線確實地裂斷基板。 In the splitting device of this aspect, the end of the splitting rod may be formed in a V shape. With this, the substrate can be reliably broken along the scribe line.
本態樣之裂斷裝置中,該承受部,可形成為在水平方向橫越該刻劃線之方向之寬度,隨著接近該基板而漸窄。藉此,由於承受部對基板之接觸面積變小,因此在另一方之裂斷棒按壓於基板時,使基板容易以所期望之形狀撓曲。據此,能夠於基板之刻劃線附近適切地產生應力,而能夠順暢地裂斷基板。 In the breaking device of this aspect, the receiving portion may be formed to have a width in the direction transverse to the scribe line in the horizontal direction and gradually narrow as it approaches the substrate. As a result, the contact area of the receiving portion with the substrate is reduced, so that when the other splitting bar is pressed against the substrate, the substrate is easily flexed in a desired shape. According to this, the stress can be appropriately generated near the scribe line of the substrate, and the substrate can be smoothly broken.
本發明之第2態樣之裂斷系統,具備上述第1態樣之裂斷裝置、與將貼合該第1基板及該第2基板而成之該基板移送至該裂斷裝置之移送部。 A second aspect of the present invention is a fracturing system comprising the above-described fracturing device of the first aspect, and a transfer section that transfers the substrate formed by bonding the first substrate and the second substrate to the fracturing device .
根據本態樣之裂斷系統,能夠發揮與上述第1態樣同樣之效果。 According to the breaking system of this aspect, the same effect as the first aspect described above can be exerted.
本發明之第3態樣,係關於一種在沿形成在貼合第1基板及第2基板而成之基板兩面之刻劃線對該基板進行裂斷時使用之裂斷單元。本態樣之裂斷單元,具備沿該刻劃線延伸之裂斷棒、使該裂斷棒往接近該基板之方向及從該基板離開之方向移動之第1驅動部、配置於夾著該裂斷棒之位置之二個承受部、及使該二個承受部往接近該基板之方向及從該基板離開之方向移動之第2驅動部。 The third aspect of the present invention relates to a breaking unit used for breaking the substrate along the scribe lines formed on both sides of the substrate formed by bonding the first substrate and the second substrate. The splitting unit of this aspect includes a splitting rod extending along the scribe line, a first driving portion that moves the splitting rod toward the substrate and away from the substrate, and is disposed to sandwich the split Two receiving portions at the position of the broken rod, and a second driving portion that moves the two receiving portions toward the substrate and away from the substrate.
根據本態樣之裂斷單元,當在第1基板側與第2基板側分別配置裂斷單元,且二個裂斷單元以隔著基板彼此對向之方式配置時,能夠發揮與上述第1態樣同樣之效果。 According to the splitting unit of this aspect, when the splitting units are arranged on the first substrate side and the second substrate side, respectively, and the two splitting units are arranged so as to face each other across the substrate, the first state can be exerted. The same effect.
如以上所述,根據本發明,能提供一種能夠以精簡之構成對基板進行裂斷之裂斷裝置、裂斷系統及裂斷單元。 As described above, according to the present invention, it is possible to provide a breaking device, a breaking system, and a breaking unit capable of breaking a substrate with a simplified structure.
本發明之效果及意義,可透過以下所示實施形態之說明而更加清楚明瞭。但是,以下所示之實施形態,僅為實施本發明時之一個例示,本發明並不受限於以下實施形態中記載之內容。 The effects and significance of the present invention will be more clearly understood from the description of the embodiments shown below. However, the embodiments shown below are only an example when implementing the present invention, and the present invention is not limited to the contents described in the following embodiments.
1‧‧‧裂斷系統 1‧‧‧Fracture system
11、13、17、20‧‧‧輸送裝置(移送部) 11, 13, 17, 20 ‧‧‧ Conveying device (transfer section)
14、15‧‧‧移送部 14, 15‧‧‧ Transfer Department
12、18、21‧‧‧裂斷裝置 12, 18, 21‧‧‧rupture device
12a、18a、21a‧‧‧裂斷單元(第1裂斷單元、第2裂斷單元) 12a, 18a, 21a ‧‧‧ split unit (1st split unit, 2nd split unit)
103‧‧‧汽缸(第2驅動部) 103‧‧‧Cylinder (2nd drive unit)
106a‧‧‧承受部 106a‧‧‧Receiving Department
106d‧‧‧凹部(導引部) 106d‧‧‧recess (guide part)
107‧‧‧裂斷棒 107‧‧‧Broken rod
107a‧‧‧端部 107a‧‧‧End
201‧‧‧馬達(第1驅動部) 201‧‧‧Motor (1st drive section)
202‧‧‧滾珠螺桿(第1驅動部) 202‧‧‧Ball screw (1st drive section)
G1、G2‧‧‧基板 G1, G2‧‧‧ substrate
L1~L5‧‧‧刻劃線 L1~L5‧‧‧Scribe line
圖1,係顯示實施形態之裂斷系統之構成的示意圖。 FIG. 1 is a schematic diagram showing the structure of the cleavage system of the embodiment.
圖2,係顯示實施形態之將基板裂斷之順序的圖。 FIG. 2 is a diagram showing the sequence of breaking the substrate in the embodiment.
圖3(a),係顯示實施形態之裂斷裝置之構成的側視圖;圖3(b)、(c),係分別顯示實施形態之將第1基板及第2基板裂斷時之狀態的側視圖。 Fig. 3(a) is a side view showing the configuration of the cleaving device of the embodiment; Figs. 3(b) and (c) show the state of the embodiment when the first substrate and the second substrate are cleaved Side view.
圖4(a)、(b),係顯示實施形態之裂斷單元之從保持構件至基板側之構成的剖面圖。 4(a) and (b) are cross-sectional views showing the structure of the cleavage unit of the embodiment from the holding member to the substrate side.
圖5,係顯示實施形態之裂斷單元之構成的剖面圖。 Fig. 5 is a cross-sectional view showing the structure of the split unit according to the embodiment.
圖6(a)、(b),係詳細地顯示實施形態之將基板裂斷之動作的圖。 6(a) and (b) are diagrams showing in detail the operation of breaking the substrate in the embodiment.
圖7(a)、(b),係分別顯示實施形態之上游側及下游側之裂斷單元之構成的示意圖。 7(a) and (b) are schematic diagrams showing the structure of the upstream and downstream cleavage units of the embodiment, respectively.
圖8(a)、(b),係顯示變形例之裂斷單元之從保持構件至基板側之構成的剖面圖。 8(a) and (b) are cross-sectional views showing the structure of the breaking unit of the modification from the holding member to the substrate side.
圖9(a)~(c),係顯示變形例之裂斷單元之從保持構件至基板側之構成的剖面圖。 9(a) to (c) are cross-sectional views showing the structure of the breaking unit of the modified example from the holding member to the substrate side.
以下,針對本發明之實施形態,參照圖式進行說明。各圖中,為便於說明,標記有彼此正交之XYZ軸。X-Y平面與水平面平行,而Z軸正方向為鉛直往上方向。 Hereinafter, embodiments of the present invention will be described with reference to the drawings. In each figure, for convenience of explanation, XYZ axes orthogonal to each other are marked. The X-Y plane is parallel to the horizontal plane, and the positive direction of the Z axis is the vertical upward direction.
圖1係顯示裂斷系統1之構成的示意圖。 FIG. 1 is a schematic diagram showing the structure of the fracturing system 1.
在裂斷系統1之上游側(X軸負側),設置用以在基板G1形成刻劃線之刻劃裝置(未圖示)。裂斷系統1,承接從刻劃裝置搬送來的基板G1,藉由對基板G1沿刻劃線進行裂斷而生成基板G2,藉由對基板G2沿刻劃線進行裂斷而生成成為液晶面板之原型的基板G3。 On the upstream side (X-axis negative side) of the rupture system 1, a scoring device (not shown) for forming a scoring line on the substrate G1 is provided. The cleavage system 1 accepts the substrate G1 transferred from the scribing device, generates the substrate G2 by cleaving the substrate G1 along the scribe line, and generates the liquid crystal panel by cleaving the substrate G2 along the scribe line The prototype substrate G3.
基板G1,係供切出基板G3之母基板,由第1基板與第2基板彼此貼合而成之所謂的貼合基板構成。在第1基板,形成有濾色片(color filter),在第2基板,形成有用於驅動液晶之薄膜電晶體(TFT)及用於外部連接之端子。第1基板與第2基板,透過密封材貼合,在藉由第1基板、第2基板與密封材形成之區域注入液晶。刻劃線,沿著密封材形成於第1基板之外側面與第2基板之外側面。基板G1,以第1基板位於下面側(Z軸負側)之方式,從刻劃裝置搬送至裂斷系統1。 The substrate G1 is a mother substrate from which the substrate G3 is cut out, and is composed of a so-called bonded substrate in which the first substrate and the second substrate are bonded to each other. A color filter is formed on the first substrate, and a thin film transistor (TFT) for driving liquid crystal and terminals for external connection are formed on the second substrate. The first substrate and the second substrate are bonded through a sealing material, and liquid crystal is injected into a region formed by the first substrate, the second substrate, and the sealing material. A scribe line is formed along the sealing material on the outer surface of the first substrate and the outer surface of the second substrate. The substrate G1 is transferred from the scribing device to the cleavage system 1 so that the first substrate is located on the lower surface side (Z axis negative side).
裂斷系統1,具備輸送裝置11、13、17、19、20、22、裂斷裝置12、18、21、移送部14、15、導件16、及檢查裝置23。檢查裝置23,具備輸送裝置23a。
The breaking system 1 includes conveying
輸送裝置11,將從上游之刻劃裝置搬送來的基板G1往X
軸正方向搬送。裂斷裝置12,具備分別配置於基板G1之第1基板側及第2基板側的裂斷單元12a。二個裂斷單元12a,從Z軸方向觀察,位於輸送裝置11與輸送裝置13之間。裂斷裝置12,藉由二個裂斷單元12a,進行基板G1之裂斷生成基板G2。輸送裝置13,將生成之基板G2往X軸正方向搬送,使其位於由移送部14、15進行保持之保持位置。
The conveying
移送部14、15,構成為可沿於Y軸方向延伸之導件16於Y軸方向移動。移送部14、15,藉由從上側吸附位於輸送裝置13上之保持位置的基板G2,將之往上方提起。移送部14,使被提起之基板G2往Y軸正方向移動,使其旋轉90度後載置於輸送裝置17上。移送部15,將被提起之基板G2往Y軸負方向移動,使其旋轉90度後載置於輸送裝置20上。由基板G1生成之基板G2,藉由移送部14、15,交互地被搬送至輸送裝置17、20。
The
輸送裝置17,將基板G2往X軸正方向搬送。裂斷裝置18,具備分別配置於基板G2之第1基板側及第2基板側之裂斷單元18a。二個裂斷單元18a,從Z軸方向觀察,位於輸送裝置17與輸送裝置19之間。裂斷裝置18,藉由二個裂斷單元18a,進行基板G2之裂斷生成基板G3。輸送裝置19,將生成之基板G3往X軸正方向搬送。
The conveying
同樣地,輸送裝置20,將基板G2往X軸正方向搬送。裂斷裝置21,具備分別配置於基板G2之第1基板側及第2基板側之裂斷單元21a。二個裂斷單元21a,從Z軸方向觀察,位於輸送裝置20與輸送裝置22之間。裂斷裝置21,藉由二個裂斷單元21a,進行基板G2之裂斷生成基板G3。輸送裝置22,將生成之基板G3往X軸正方向搬送。
Similarly, the
檢查裝置23,藉由將以輸送裝置19、22搬送來的基板G3往上方提起以取得之,檢查裂斷裝置18、21所進行的裂斷是否適當且正確地進行。經檢查判定為適當且正確的基板G3,藉由輸送裝置23a往X軸正方向搬送,搬送至進行後段之研磨及洗淨的裝置(未圖示)。以上述方式,結束裂斷系統1之處理。
The
圖2,係顯示從基板G1生成基板G2、G3之順序的圖。圖2,係從上側觀察被搬送於裂斷系統1內之基板G1~G3的圖。另外,針對基板G2、G3,亦一併顯示對應之側視圖。 FIG. 2 is a diagram showing the sequence of generating substrates G2 and G3 from the substrate G1. FIG. 2 is a diagram of the substrates G1 to G3 transported in the fracturing system 1 as viewed from above. In addition, corresponding side views are also displayed for the substrates G2 and G3.
被往裂斷系統1搬送之基板G1,藉由上游之刻劃裝置形成有刻劃線L1~L5。刻劃線L1,沿Y軸方向形成於基板G1之第1基板之下面。刻劃線L2,沿Y軸方向形成於基板G1之第2基板之上面。從Z軸方向觀察,刻劃線L1、L2之位置相同。刻劃線L3、L5,沿X軸方向形成於基板G1之第1基板之下面。刻劃線L4,沿X軸方向形成於基板G1之第2基板之上面。從Z軸方向觀察,刻劃線L3、L4之位置相同,刻劃線L3、L4之位置與刻劃線L5之位置不同。 The substrate G1 transported to the breaking system 1 is formed with scoring lines L1 to L5 by an upstream scoring device. The scribe line L1 is formed under the first substrate of the substrate G1 in the Y-axis direction. The scribe line L2 is formed on the upper surface of the second substrate of the substrate G1 in the Y-axis direction. Viewed from the Z-axis direction, the positions of the scribe lines L1 and L2 are the same. The scribe lines L3 and L5 are formed under the first substrate of the substrate G1 in the X-axis direction. The scribe line L4 is formed on the upper surface of the second substrate of the substrate G1 in the X-axis direction. Viewed from the Z-axis direction, the positions of the scribe lines L3 and L4 are the same, and the positions of the scribe lines L3 and L4 are different from the positions of the scribe lines L5.
當將基板G1之刻劃線L1、L2搬送至裂斷裝置12之裂斷位置時,藉由裂斷裝置12,使第1基板與第2基板分別沿刻劃線L1、L2裂斷。藉此,生成基板G2。將所生成之基板G2,藉由圖1中所示之移送部14、15,往Y軸正方向及Y軸負方向搬送之後,從Z軸方向觀察順時針旋轉90度,並載置於輸送裝置17、20。
When the scribe lines L1 and L2 of the substrate G1 are transferred to the breaking position of the breaking
接著,當將基板G2之刻劃線L5搬送至裂斷裝置18之裂斷位置時,藉由裂斷裝置18,使第1基板沿刻劃線L5裂斷。此外,當將基板
G2之刻劃線L3、L4搬送至裂斷裝置18之裂斷位置時,藉由裂斷裝置18,使第1基板沿刻劃線L3裂斷,並使第2基板沿刻劃線L4裂斷。藉此,生成基板G3。
Next, when the scribe line L5 of the substrate G2 is transferred to the rupture position of the
此時,第1基板之相當於刻劃線L3、L5之間的部分,因對刻劃線L4、L5之裂斷而被去除。藉此,由於在生成之基板G3形成沿Y軸方向延伸之缺口部G3a,因此使形成於第2基板之端子露出。另外,被去除之第1基板之部分,於裂斷後立即從輸送裝置17、19之間往下掉落而被回收。或者,被去除之第1基板之部分,由輸送裝置19搬送而於輸送裝置19之X軸正側掉落而被回收。
At this time, the portion of the first substrate corresponding to the scribe lines L3 and L5 is removed by breaking the scribe lines L4 and L5. With this, since the notch portion G3a extending in the Y-axis direction is formed on the generated substrate G3, the terminal formed on the second substrate is exposed. In addition, the part of the removed first substrate is dropped from between the conveying
同樣地,當將基板G2之刻劃線L3、L4、L5搬送至裂斷裝置21之裂斷位置時,藉由裂斷裝置21,使第1基板沿刻劃線L3、L5裂斷,使第2基板沿刻劃線L4裂斷。藉此,生成基板G3。
Similarly, when the scribe lines L3, L4, L5 of the substrate G2 are transported to the breaking position of the breaking
檢查裝置23,藉由使用雷射位移感測器,檢查是否於生成之基板G3適當且正確地形成缺口部G3a。將經判定為適當且正確地形成有缺口部G3a之基板G3,往位於裂斷系統1之下游側的裝置搬送。
The
圖3(a)係從Y軸負方向觀察裂斷裝置12時的側視圖。
FIG. 3(a) is a side view when the cleaving
裂斷裝置12,如上所述,具備二個裂斷單元12a。二個裂斷單元12a,以透過被搬送於輸送裝置11上之基板G1彼此對向配置,具有以基板G1為對稱面彼此對稱之構成。以下,參照圖3(a),針對上側之裂斷單元12a之構成進行說明。
As described above, the breaking
裂斷單元12a,具備保持構件101、導件102、汽缸103、滑動構件104、保持構件105、收容部106、及裂斷棒107。
The
保持構件101,固定設置於裂斷系統1內,保持沿Z軸方向延伸之導件102及具有桿件103a之汽缸103。滑動構件104,構成為可沿導件102於Z軸方向滑動。汽缸103之桿件103a之下端,設置於滑動構件104之上面。藉由汽缸103之桿件103a於Z軸方向移動,滑動構件104沿導件102於Z軸方向移動。保持構件105,設置於滑動構件104之下面,收容部106,設置於保持構件105之下面。
The holding
在收容部106內配置有沿基板G1之刻劃線L1、L2延伸於Y軸方向之裂斷棒107。在裂斷棒107之下端,形成有於Y軸方向延伸之端部107a。裂斷棒107,在收容部106之內部,被下述機構支承為可於Z軸方向移動。在收容部106之下端,形成有於Y軸方向延伸之二個承受部106a,二個承受部106a位於夾著裂斷棒107之位置。又,關於收容部106、裂斷棒107、及收容部106內部之機構,將於以下參照圖4(a)~圖5進行說明。
A
圖3(b)係顯示使基板G1下側之第1基板裂斷時之狀態的側視圖,圖3(c)係顯示使基板G1上側之第2基板裂斷時之狀態的側視圖。 3(b) is a side view showing the state when the first substrate on the lower side of the substrate G1 is broken, and FIG. 3(c) is a side view showing the state when the second substrate on the upper side of the substrate G1 is broken.
當將基板G1往X軸正方向搬送,如圖3(a)所示,將刻劃線L1、L2定位於裂斷棒107之端部107a之位置時,如圖3(b)所示,驅動裂斷裝置12。具體而言,藉由將上側之裂斷棒107往下方向驅動,將上側之裂斷棒107之端部107a按壓於第2基板。此外,藉由將下側之桿件103a往上方向驅動,將下側之收容部106之承受部106a按壓於第1基板。
When the substrate G1 is transported in the positive direction of the X axis, as shown in FIG. 3(a), when the scribe lines L1, L2 are positioned at the
如上所述,將端部107a按壓於第2基板之刻劃線L2,將承受部106a按壓於第1基板之從刻劃線L1往X軸正方向及X軸負方向偏移既定寬度之位置。藉此,使第1基板沿刻劃線L1裂斷。關於第1基板之裂
斷,將於以下參照圖6(a)詳細地進行說明。
As described above, the
當使第1基板裂斷時,基板G1之位置不動,接著,如圖3(c)所示,驅動裂斷裝置12。具體而言,將上側之裂斷棒107往上方向驅動,將上側之桿件103a往下方向驅動,藉此,將上側之收容部106之承受部106a按壓於第2基板。此外,將下側之桿件103a往下方向驅動,將下側之裂斷棒107往上方向驅動,藉此,將下側之裂斷棒107之端部107a按壓於第1基板。
When the first substrate is broken, the position of the substrate G1 does not move, and then, as shown in FIG. 3(c), the breaking
如上所述,將端部107a按壓於第1基板之刻劃線L1,將承受部106a按壓於第2基板之從刻劃線L2往X軸正方向及X軸負方向偏移既定寬度之位置。藉此,使第2基板沿刻劃線L2裂斷。關於第2基板之裂斷,將於以下參照圖6(b)詳細地進行說明。
As described above, the
圖4(a)、(b)與圖5係顯示從上側之裂斷單元12a之保持構件105起下方之構成的剖面圖。圖4(a)係圖4(b)所示之A1-A2剖面圖,圖4(b)係圖4(a)所示之B1-B2剖面圖,圖5係圖4(a)、(b)所示之C1-C2剖面圖。A1-A2剖面係與XZ平面平行之剖面,B1-B2剖面係與YZ平面平行之剖面,C1-C2剖面係與XY平面平行之剖面。
4(a), (b) and FIG. 5 are cross-sectional views showing the configuration below from the holding
如圖4(a)、(b)與圖5所示,收容部106,由與YZ平面平行之二個壁部106b及與XZ平面平行之二個壁部106c構成。如圖4(a)、(b)所示,承受部106a形成於二個壁部106b之下端。承受部106a之外側面往收容部106之內側方向傾斜,藉此,承受部106a之X軸方向之寬度(於水平方向橫越刻劃線L1、L2之方向的寬度),隨著接近基板G1而漸窄。二個壁部106c之下端,位於較承受部106a之下端更上方。
As shown in FIGS. 4( a ), (b) and FIG. 5, the
在壁部106b、106c所圍繞之空間內,收容有馬達201、滾珠螺桿202、支承構件203、204、及裂斷棒107。馬達201,設置於保持構件105之下面。滾珠螺桿202,固定於馬達201之旋轉軸。支承構件203,固定於滾珠螺桿202之螺帽。支承構件204之上端,固定於支承構件203之下面。支承構件204之下端一分為二。支承構件204之二個下端,位於在Y軸方向分開之位置,在該下端固定有裂斷棒107。裂斷棒107之端部107a之側面傾斜,藉此,端部107a之X軸方向之寬度,隨著接近基板G1而漸窄。亦即,裂斷棒107之端部107a,形成為V字狀。
In the space surrounded by the
如圖4(a)、(b)與圖5所示,在壁部106c之內側面,形成有凹部106d。在Y軸正側與Y軸負側之壁部106c之凹部106d,分別收容裂斷棒107之Y軸正側與Y軸負側之端部。
As shown in FIGS. 4(a), (b) and FIG. 5, a
如圖5所示,在將基板G1之Y軸方向之寬度設為W1、將Y軸正側之壁部106c之內側面與Y軸負側之壁部106c之內側面的間隔設為W2、將Y軸正側之凹部106d之Y軸正側面與Y軸負側之凹部106d之Y軸負側面的間隔設為W3、將Y軸正側之壁部106c之外側面與Y軸負側之壁部106c之外側面的間隔設為W4時,W1~W4的關係為W1<W2<W3<W4。在將裂斷棒107之X軸方向之寬度設為W5、凹部106d之X軸方向之寬度設為W6時,W5、W6的關係為W5<W6。
As shown in FIG. 5, when the width of the substrate G1 in the Y-axis direction is W1, the distance between the inner surface of the
參照圖4(a)、(b),在使裂斷棒107往下方向移動時,驅動馬達201使滾珠螺桿202之螺帽往下方向移動。藉此,用於支承裂斷棒107的支承構件203、204即往下方向移動,裂斷棒107往下方向移動。另一方面,在使裂斷棒107往上方向移動時,驅動馬達201使滾珠螺桿202之螺帽往上
方向移動。藉此,用於支承裂斷棒107的支承構件203、204即往上方向移動,裂斷棒107往上方向移動。此時,裂斷棒107因被凹部106d導引,而確實地僅往上下方向移動。
4 (a) and (b), when the splitting
圖6(a)、(b),係詳細顯示藉由收容部106之承受部106a及裂斷棒107之端部107a使基板G1裂斷的圖。圖6(a)、(b)係與圖4(a)同樣之A1-A2剖面圖。
6(a) and (b) are diagrams showing in detail that the substrate G1 is broken by the receiving
如圖6(a)所示,在使第1基板裂斷時,將上側之裂斷棒107之端部107a按壓於第2基板,將下側之收容部106之承受部106a按壓於第1基板之下面。此時,因基板G1往下方向撓曲而使第1基板裂斷。如圖6(b)所示,在使第2基板裂斷時,將上側之收容部106之承受部106a按壓於第2基板,將下側之裂斷棒107之端部107a按壓於第1基板。此時,因基板G1往上方向撓曲而使第2基板裂斷。
As shown in FIG. 6(a), when breaking the first substrate, the
以上,參照圖3(a)~圖6(b)針對裂斷裝置12之構成、與裂斷裝置12對基板G1進行裂斷之動作進行了說明,裂斷裝置18之構成、與裂斷裝置18對基板G2進行裂斷之動作亦大致相同,裂斷裝置21之構成、與裂斷裝置21對基板G2進行裂斷之動作亦大致相同。
The structure of the breaking
圖7(a),係顯示裂斷裝置12上側之裂斷單元12a的示意圖,圖7(b),係顯示裂斷裝置18、21上側之裂斷單元18a、21a的示意圖。又,裂斷裝置18、21具有彼此相同之構成。
FIG. 7(a) is a schematic diagram showing the
如圖7(a)、(b)所示,裂斷單元18a、21a與裂斷單元12a相較,其不同點在於保持構件105、收容部106、及裂斷棒107之Y軸方向之長度較短。裂斷單元18a、21a之其他構成,則與裂斷單元12a相同。
As shown in FIGS. 7(a) and (b), the breaking
此外,在裂斷單元18a、21a中,圖5所示之W1~W4之長度的關係被設定為相同。亦即,圖5中,若將W1作為基板G2之Y軸方向之寬度,將W2~W4作為裂斷單元18a、21a之相對應之長度,則W1~W4的關係與裂斷單元12a的情形相同,為W1<W2<W3<W4。
In addition, in the
此外,裂斷裝置18之二個裂斷單元18a,以透過基板G2彼此對向之方式配置,具有以基板G2為對稱面而彼此對稱之構成。同樣地,裂斷裝置21之二個裂斷單元21a,以透過基板G2彼此對向之方式配置,具有以基板G2為對稱面而彼此對稱之構成。因此,裂斷裝置18、21與裂斷裝置12同樣地,能夠對基板G2進行裂斷。
In addition, the two breaking
根據本實施形態,能發揮以下效果。 According to this embodiment, the following effects can be exhibited.
在對基板G1、G2之第1基板進行裂斷時,在配置於第1基板側之裂斷單元12a、18a、21a之二個承受部106a支承第1基板之狀態下,將配置於第2基板側之裂斷單元12a、18a、21a之裂斷棒107按壓於第2基板。另一方面,在對基板G1、G2之第2基板進行裂斷時,在配置於第2基板側之裂斷單元12a、18a、21a之二個承受部106a支承第2基板之狀態下,將配置於第1基板側之裂斷單元12a、18a、21a之裂斷棒107按壓於第1基板。如上所述,根據本實施形態之裂斷裝置12、18、21,藉由將二個裂斷單元以和第1基板側及第2基板側相對向之方式配置,能夠在相同位置對第1基板及第2基板進行裂斷。據此,能夠以精簡之構成對基板G1、G2進行裂斷。
When the first substrates of the substrates G1 and G2 are broken, the two receiving
此外,用於將裂斷棒107驅動於上下方向之驅動部,由馬達201及滾珠螺桿202構成。藉此,例如與僅藉由馬達201將裂斷棒107驅動於上下方向的情形相較,能以良好精度進行裂斷棒107之驅動。
In addition, the driving section for driving the breaking
此外,裂斷單元12a、18a、21a,具備用於導引裂斷棒107之上下方向之移動的凹部106d。藉此,能夠使裂斷棒107以所欲之角度、亦即在與基板垂直之方向適當且正確地按壓於刻劃線。
In addition, the breaking
此外,馬達201與滾珠螺桿202,藉由支承構件204於二處支承裂斷棒107。亦即,支承構件204,於在Y軸方向分開之二處固定於裂斷棒107。藉此,由於來自馬達201與滾珠螺桿202之力分散地傳至裂斷棒107,因此,與將支承構件204於一處固定於裂斷棒107的情形相較,能夠於Y軸方向以均等之力將裂斷棒107按壓於基板G1、G2。
In addition, the
此外,裂斷棒107之端部107a,形成V字狀。藉此,能夠一邊將裂斷棒107按壓於基板G1、G2,一邊沿刻劃線L1~L5確實地使基板G1、G2裂斷。
In addition, the
此外,裂斷裝置12之承受部106a,以於水平方向橫越刻劃線L1、L2之方向的寬度、亦即X軸方向的寬度隨著接近基板G1而漸窄之方式形成。同樣地,裂斷裝置18、21之承受部106a,以於水平方向橫越刻劃線L3~L5之方向的寬度、亦即X軸方向的寬度隨著接近基板G2而漸窄之方式形成。藉此,由於承受部106a對基板G1、G2的接觸面積變小,因此,能夠在將於上下方向相對向之另一裂斷棒107按壓於基板G1、G2時,基板G1、G2容易以所期望之形狀撓曲。據此,能夠在基板G1之刻劃線L1、L2及基板G2之刻劃線L3~L5附近適切地產生應力,而能夠順暢地使基板
G1、G2裂斷。
In addition, the receiving
以上,雖已針對本發明之實施形態進行了說明,但本發明並不受限於上述實施形態,此外,本發明之實施形態除了上述以外亦可做各種改變。 Although the embodiments of the present invention have been described above, the present invention is not limited to the above-mentioned embodiments. In addition, the embodiments of the present invention may be variously modified in addition to the above.
例如,上述實施形態中,基板G1、G2為液晶面板,且係藉由第1基板與第2基板彼此貼合而成,但基板G1、G2並不限於上述實施形態所示。作為裂斷裝置18、21之裂斷對象的基板,只要是可沿刻劃線裂斷之基板即可。
For example, in the above embodiments, the substrates G1 and G2 are liquid crystal panels and are formed by bonding the first substrate and the second substrate to each other, but the substrates G1 and G2 are not limited to those shown in the above embodiments. The substrate to be cleaved by the cleaving
此外,上述實施形態,在裂斷裝置12中,二個裂斷單元12a為彼此相同之構成,在裂斷裝置18中,二個裂斷單元18a為彼此相同之構成,在裂斷裝置21中,二個裂斷單元21a為彼此相同之構成。但並不限於此,二個裂斷單元不一定須為相同之構成。
In addition, in the above embodiment, in the
此外,上述實施形態中,馬達201與滾珠螺桿202,雖藉由支承構件204於二處支承裂斷棒107,但並不限於此,亦可藉由支承構件204於三處以上支承裂斷棒107。此場合,支承構件204係以在Y軸方向分開之三處以上部位固定於裂斷棒107。又,裂斷裝置18、21,由於裂斷棒107之Y軸方向長度短,因此,馬達201及滾珠螺桿202,亦可藉由支承構件204於一處支承裂斷棒107。
In addition, in the above embodiment, the
此外,上述實施形態中,如圖4(a)、(b)所示,壁部106c之基板側之端部較承受部106a之基板側之端部位於離基板較遠之位置。但並不限於此,在Z軸方向,壁部106c之基板側之端部可與承受部106a之基板
側之端部位於相同之位置。
In addition, in the above embodiment, as shown in FIGS. 4( a) and (b ), the end of the
圖8(a)、(b)係顯示上述構成的圖。此變形例中,於Z軸方向,壁部106c之下端位置與承受部106a之下端位置相同。又,此變形例中,C1-C2剖面亦與圖5大致相同。
8(a) and (b) are diagrams showing the above configuration. In this modification, in the Z-axis direction, the lower end position of the
此變形例中,在承受部106a支承基板時,壁部106c之端部亦接觸基板。但是,從Z軸方向觀察,壁部106c接觸基板之區域,與相對向之另一方之裂斷棒107接觸基板之區域並不重疊。因此,例如在上側之承受部106a支承基板G1、G2、下側之裂斷棒107按壓於基板G1、G2時,不會因上側之壁部106c之下端妨礙基板G1、G2之撓曲。藉此,能以與上述實施形態同樣之方式使第1基板與第2基板撓曲,使基板G1、G2裂斷。
In this modification, when the receiving
此外,上述實施形態中,承受部106a雖為圖4(a)所示之形狀,但並不限於此,亦可為其他形狀。例如,如圖9(a)所示,亦可藉由承受部106a之內側面亦往收容部106之外側方向傾斜,使承受部106a形成V字狀。此外,如圖9(b)所示,承受部106a之外側面及內側面,亦可形成圓弧狀。
In addition, in the above-mentioned embodiment, although the receiving
又,承受部106a,如圖9(c)所示,亦可形成為矩形。此場合,由於承受部106a對基板G1、G2之接觸面積變大,因此可假定在相對向之另一方之裂斷棒107按壓於基板G1、G2時,基板G1、G2不以所期望之形狀撓曲。因此,如圖4(a)與圖9(a)、(b)所示,將承受部106a以X軸方向之寬度隨著接近基板G1、G2而漸窄之方式形成較佳。
Furthermore, as shown in FIG. 9(c), the receiving
此外,上述實施形態中,雖於收容部106之基板側之端部連續地形成承受部106a,但並不限於此,亦可局部地形成承受部106a。此外,
承受部106a之形成方向雖與刻劃線平行,但亦可不與刻劃線平行。此外,承受部106a雖形成為直線狀,但亦可以是曲折狀。
In addition, in the above-mentioned embodiment, although the receiving
本發明之實施形態,在申請專利範圍所揭示之技術性思想範圍內,可適當地進行各種變更。 The embodiments of the present invention can be appropriately modified in various ways within the scope of the technical idea disclosed in the patent application.
12‧‧‧裂斷裝置 12‧‧‧Breaking device
12a‧‧‧裂斷單元(第1裂斷單元、第2裂斷單元) 12a‧‧‧Fracture unit (1st fracture unit, 2nd fracture unit)
101‧‧‧保持構件 101‧‧‧ Retaining member
102‧‧‧導件 102‧‧‧Guide
103‧‧‧汽缸(第2驅動部) 103‧‧‧Cylinder (2nd drive unit)
103a‧‧‧桿件 103a‧‧‧rod
104‧‧‧滑動構件 104‧‧‧sliding member
105‧‧‧保持構件 105‧‧‧Retaining member
106‧‧‧收容部 106‧‧‧ Containment Department
106a‧‧‧承受部 106a‧‧‧Receiving Department
107‧‧‧裂斷棒 107‧‧‧Broken rod
107a‧‧‧端部 107a‧‧‧End
G1‧‧‧基板 G1‧‧‧ substrate
Claims (8)
Applications Claiming Priority (2)
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JP2015112051A JP6550932B2 (en) | 2015-06-02 | 2015-06-02 | Breaker, break system and break unit |
JPJP2015-112051 | 2015-06-02 |
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TW201711819A TW201711819A (en) | 2017-04-01 |
TWI690401B true TWI690401B (en) | 2020-04-11 |
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TW105109658A TWI690401B (en) | 2015-06-02 | 2016-03-28 | Breaking device, breaking system and breaking unit |
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JP (1) | JP6550932B2 (en) |
KR (1) | KR20160142224A (en) |
CN (1) | CN106217664B (en) |
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CN110883828A (en) * | 2019-11-21 | 2020-03-17 | 浙江中茂科技有限公司 | PCB clamping mechanism for board separating machine |
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2015
- 2015-06-02 JP JP2015112051A patent/JP6550932B2/en not_active Expired - Fee Related
-
2016
- 2016-03-08 KR KR1020160027919A patent/KR20160142224A/en unknown
- 2016-03-21 CN CN201610162749.5A patent/CN106217664B/en not_active Expired - Fee Related
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JP2016221897A (en) | 2016-12-28 |
JP6550932B2 (en) | 2019-07-31 |
CN106217664A (en) | 2016-12-14 |
KR20160142224A (en) | 2016-12-12 |
TW201711819A (en) | 2017-04-01 |
CN106217664B (en) | 2020-01-17 |
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