TWI681933B - Copper alloy for electrical and electronic parts and semiconductors with high strength and high electrical conductivity and method of preparing the same - Google Patents

Copper alloy for electrical and electronic parts and semiconductors with high strength and high electrical conductivity and method of preparing the same Download PDF

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TWI681933B
TWI681933B TW107131725A TW107131725A TWI681933B TW I681933 B TWI681933 B TW I681933B TW 107131725 A TW107131725 A TW 107131725A TW 107131725 A TW107131725 A TW 107131725A TW I681933 B TWI681933 B TW I681933B
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copper alloy
mass ratio
precipitates
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semiconductors
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TW201922619A (en
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郭源信
鄭敏載
崔俊寧
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韓商豐山股份有限公司
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    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22CALLOYS
    • C22C9/00Alloys based on copper
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B21MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL; PUNCHING METAL
    • B21BROLLING OF METAL
    • B21B3/00Rolling materials of special alloys so far as the composition of the alloy requires or permits special rolling methods or sequences ; Rolling of aluminium, copper, zinc or other non-ferrous metals
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    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22FCHANGING THE PHYSICAL STRUCTURE OF NON-FERROUS METALS AND NON-FERROUS ALLOYS
    • C22F1/00Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working
    • C22F1/08Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working of copper or alloys based thereon
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B21MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL; PUNCHING METAL
    • B21BROLLING OF METAL
    • B21B3/00Rolling materials of special alloys so far as the composition of the alloy requires or permits special rolling methods or sequences ; Rolling of aluminium, copper, zinc or other non-ferrous metals
    • B21B2003/005Copper or its alloys

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Abstract

Disclosed are a copper alloy for electrical and electronic parts and semiconductors having high strength and high electrical conductivity and a method of preparing the same. The copper alloy includes 0.09 to 0.20 % by mass of iron (Fe), 0.05 to 0.09 % by mass of phosphorous (P), 0.05 to 0.20 % by mass of manganese (Mn), the remaining amount of copper (Cu) and 0.05 % by mass or less of inevitable impurities, and has tensile strength of 470 MPa or more, hardness of 145 Hv or more, electrical conductivity of 75%IACS or more and a softening resistant temperature of 400℃ or higher.

Description

用於具高強度與高導電性電氣與電子部件和半導體的銅 合金及其製備方法 Copper for electrical and electronic components and semiconductors with high strength and high conductivity Alloy and its preparation method

本發明是關於一種用於具有高強度與高導電性之電氣與電子部件和半導體的銅合金、及其製備方法;更特定地,是關於一種包括銅(Cu)、鐵(Fe)、磷(P)與錳(Mn)的銅合金以及其製備方法。 The present invention relates to a copper alloy used for electrical and electronic parts and semiconductors with high strength and high conductivity, and a preparation method thereof; more specifically, to a copper alloy including copper (Cu), iron (Fe), and phosphorus ( P) Copper alloy with manganese (Mn) and its preparation method.

由於銅合金係基於各種目的而使用,亦即,作為半導體引線框、電氣與電子部件等之材料而使用,故一般使用的是包含鐵(Fe)和磷(P)的Cu-Fe-P基合金。舉例而言,在銅合金中,包含質量比為0.05至0.15%的Fe與質量比為0.025至0.04%的P之銅合金C19210,或是包含質量比為2.1至2.6%的Fe、質量比為0.015至0.15%的P與質量比為0.05至0.2%的鋅(Zn)的銅合金C19400都具有絕佳的強度和導電性,因此被廣泛使用作為引線框之材料。Fe和P作為主要添加元素的理由是,他們在銅基質中形成了析出相以產生絕佳的強度和導電性。 Since copper alloys are used for various purposes, that is, as materials for semiconductor lead frames, electrical and electronic components, etc., Cu-Fe-P groups containing iron (Fe) and phosphorus (P) are generally used alloy. For example, in a copper alloy, a copper alloy C19210 containing Fe in a mass ratio of 0.05 to 0.15% and P in a mass ratio of 0.025 to 0.04%, or Fe containing a mass ratio of 2.1 to 2.6% in a mass ratio of The copper alloy C19400 of 0.015 to 0.15% P and zinc (Zn) with a mass ratio of 0.05 to 0.2% has excellent strength and conductivity, so it is widely used as a material for lead frames. The reason why Fe and P are the main added elements is that they form a precipitated phase in the copper matrix to produce excellent strength and conductivity.

然而,在銅合金的各種特性中,強度和導電性是彼此衝突的,亦即彼此成反比,而且因此,當強度增加時,導電性即不可避免地會降低,而當導電性增加時,強度即不可避免地降低。因此,具400MPa之抗拉強度與80%IACS之導電性的傳統銅合金C19210具有不佳的強度但具有絕佳的導電性,因而被使用於需要高導電性的產品中;而具500MPa之抗拉強度與60%IACS之導電性的傳統銅合金C19400則具有絕佳的強度,且因而被使用於需要高強度的產品中。 However, among the various characteristics of copper alloys, strength and conductivity are in conflict with each other, that is, inversely proportional to each other, and therefore, when the strength increases, the conductivity will inevitably decrease, and when the conductivity increases, the strength That is inevitably reduced. Therefore, the traditional copper alloy C19210 with a tensile strength of 400 MPa and a conductivity of 80% IACS has poor strength but excellent electrical conductivity, so it is used in products requiring high conductivity; and has a resistance of 500 MPa The traditional copper alloy C19400 with tensile strength and 60% IACS conductivity has excellent strength, and is therefore used in products requiring high strength.

近來,基於電氣與電子部件的薄形與小型化趨勢,材料的特性變得更加重要。由於電子設備、車輛等所使用的半導體裝置係朝向大容量、小型化和高整合度趨勢發展,現在在半導體裝置中使用的引線框係呈小型化和薄形。因此,相較於傳統的銅合金,銅合金同時提供了高強度、高導電性和絕佳的加工能力,而且基於電子產品的厚度減少,需要同時滿足470MPa或更高之抗拉強度與75%IACS或更高之導電性的銅合金。因此,為了滿足業界中的這些要求,需要努力增進彼此衝突的強度和導電性兩者。 Recently, based on the trend of thinning and miniaturization of electrical and electronic components, the characteristics of materials have become more important. Since semiconductor devices used in electronic equipment, vehicles, etc. are trending toward large capacity, miniaturization, and high integration, the lead frames used in semiconductor devices are now miniaturized and thin. Therefore, compared to traditional copper alloys, copper alloys provide high strength, high electrical conductivity, and excellent processing ability. Moreover, based on the reduction in thickness of electronic products, it is necessary to meet the tensile strength of 470MPa or higher and 75% at the same time. IACS or higher conductivity copper alloy. Therefore, in order to meet these requirements in the industry, efforts are needed to improve both the strength and the electrical conductivity that conflict with each other.

為了增加銅合金的強度,要增加Fe和P含量,或是添加第三元素(例如錫(Sn)、鎂(Mg)或鎳(Ni));但是當這些元素的含量增加時,銅合金的強度會增加,但銅合金的導電性會降低。因此,除了添加元素以外,取而代之的是細化晶粒或控制結晶與析出物質的大小和分佈,以增進銅合金的特性。然而,在這個情況中會發生各種問題,例如表面缺陷、可靠度下降、不均勻微結構等。因此,銅合金的強度和導電性兩者的提升是一項困難且重要的研究課題。 In order to increase the strength of the copper alloy, it is necessary to increase the Fe and P content, or add a third element (such as tin (Sn), magnesium (Mg) or nickel (Ni)); but when the content of these elements increases, the copper alloy The strength will increase, but the conductivity of the copper alloy will decrease. Therefore, in addition to adding elements, it is replaced by grain refinement or control of the size and distribution of crystallized and precipitated substances to improve the characteristics of the copper alloy. However, various problems occur in this case, such as surface defects, reduced reliability, uneven microstructure, and the like. Therefore, the improvement of both strength and conductivity of copper alloys is a difficult and important research topic.

此外,在應用銅合金的領域中會進行加熱製程,因此銅合金需要有耐熱特性且此特性係稱為耐軟化性(其係以耐軟化溫度作為評估)。耐軟化溫度表示表示製備的銅合金片材在經1分鐘熱處理之後所測得之硬度值對應到初 始硬度值(在熱處理之前)的80%之溫度。耐軟化溫度被使用作為指示相對應材料是否耐熱的指標,其與最終產品的可靠性有關,如上述說明。在傳統半導體封裝結構或電子部件中,耐軟化溫度約380℃之銅合金在產品的製造上和最終產品的可靠性上不會產生問題。然而,最近應用於半導體封裝體與電子部件等的銅合金則因於產品處理中加入了加熱製程(例如焊接或引線接合)而需要較佳的耐軟化性,因此需要將耐軟化性提升至400℃或更高之耐軟化溫度。 In addition, in the field of applying copper alloys, a heating process is performed. Therefore, the copper alloy needs to have heat resistance and this characteristic is called softening resistance (which is evaluated based on the softening temperature resistance). The softening resistance indicates that the hardness value of the prepared copper alloy sheet after 1 minute heat treatment corresponds to the initial 80% of the initial hardness value (before heat treatment). The softening resistance temperature is used as an indicator to indicate whether the corresponding material is heat-resistant, which is related to the reliability of the final product, as described above. In traditional semiconductor packaging structures or electronic components, copper alloys with a softening resistance of about 380°C will not cause problems in the manufacture of the product and the reliability of the final product. However, recently copper alloys used in semiconductor packages and electronic components require better softening resistance due to the addition of heating processes (such as soldering or wire bonding) to product processing, so the softening resistance needs to be increased to 400 ℃ or higher resistance to softening temperature.

已經申請了許多與獲得引線框之銅合金材料所需要的強度和導電性有關的專利。 Many patents have been applied for obtaining the strength and conductivity required for the copper alloy material of the lead frame.

韓國專利公開號第10-2008-0019274號揭露了藉由添加鎂(Mg)來提升Cu-Fe-P基合金的強度。然而,當於合金中添加Mg時,則不可避免地會降低合金的導電性。當於傳統的Cu-Fe-P基合金中添加Mg時,合金會呈現450MPa的抗拉強度與70%IACS的導電性,其低於引線框目前所需要的特性(470MPa或更高之抗拉強度、以及77%IACS或更高之導電性),而其理由是因粗的Mg-P基結晶物質。當於合金中添加Mg時,合金的強度和導電性會因粗的Mg-P基結晶物質而不可避免地降低,不可避免地自鑄造的開始到熱軋結束及缺陷產生。 Korean Patent Publication No. 10-2008-0019274 discloses that the strength of Cu-Fe-P-based alloys is improved by adding magnesium (Mg). However, when Mg is added to the alloy, the conductivity of the alloy is inevitably reduced. When Mg is added to the traditional Cu-Fe-P-based alloy, the alloy will exhibit a tensile strength of 450 MPa and a conductivity of 70% IACS, which is lower than the characteristics currently required for lead frames (tensile strength of 470 MPa or higher) Strength, and conductivity of 77% IACS or higher), and the reason is due to the coarse Mg-P-based crystalline material. When Mg is added to the alloy, the strength and conductivity of the alloy will inevitably decrease due to the coarse Mg-P-based crystalline material, inevitably from the beginning of casting to the end of hot rolling and defects.

此外,韓國專利公開號第10-2005-0076767號揭露了藉由控制合金中析出物的粒子大小來加強Cu-Fe-P基合金的強度。然而,在此專利文件中,為了精細地控制析出物的粒子大小,需執行兩次或更多次的冷軋與退火程序,且因此出現各種變數而難以以工業規模來實際製備這種合金。此外,此專利文件描述了析出物的體積比例為1%或更高,而且析出物的粒子數為300/μm2或更高,但是體積比例是包括粗粒子數的數值。 In addition, Korean Patent Publication No. 10-2005-0076767 discloses that the strength of Cu-Fe-P-based alloys is strengthened by controlling the particle size of precipitates in the alloy. However, in this patent document, in order to finely control the particle size of the precipitates, two or more cold rolling and annealing procedures need to be performed, and therefore various variables occur and it is difficult to actually prepare this alloy on an industrial scale. In addition, this patent document describes that the volume ratio of the precipitate is 1% or more, and the number of particles of the precipitate is 300/μm 2 or more, but the volume ratio is a value including the number of coarse particles.

此外,韓國專利公開號第10-2013-0136183號揭露了藉由對合金添加錳(Mn)來加強Cu-Fe-P基合金的強度,但所製備的合金並不滿足工業廠址實際需要的強度和導電性。此外,此專利文件的請求項4描述了析出物的粒子大小為10-30μm,但實質上,10-30μm的粒子大小是過大的,而且這些粒子是對應於鑄造缺陷或外來物質而非析出物,因此並未提升強度與導電性。在這個方面,若銅合金中存在大小為10-30μm的粒子,則銅合金的特性會變差,而且會因不良的表面品質而難以執行半導體封裝製程。此外,上述專利文件並未說明任何分析結果或確定析出物種類的基礎,且於第三圖所示SEM分析結果中僅觀察到晶界而非析出物,而且並未提供技術基礎。 In addition, Korean Patent Publication No. 10-2013-0136183 discloses that the strength of Cu-Fe-P-based alloys is enhanced by adding manganese (Mn) to the alloy, but the prepared alloy does not meet the actual strength required by industrial sites And conductivity. In addition, claim 4 of this patent document describes that the particle size of precipitates is 10-30 μm, but in essence, the particle size of 10-30 μm is too large, and these particles correspond to casting defects or foreign substances rather than precipitates , So the strength and conductivity are not improved. In this respect, if there are particles of 10-30 μm in the copper alloy, the characteristics of the copper alloy will be deteriorated, and it will be difficult to perform the semiconductor packaging process due to poor surface quality. In addition, the above-mentioned patent documents do not specify any analysis results or the basis for determining the type of precipitates. In the SEM analysis results shown in the third figure, only grain boundaries are observed instead of precipitates, and no technical basis is provided.

本發明的目的之一在於提供一種用於電氣與電子部件及半導體的銅合金,其具有滿足了傳統技術所無法滿足之工業界中目前所需特性的強度和導電性,且具有絕佳的耐軟化性;以及其製備方法。 One of the objects of the present invention is to provide a copper alloy for electrical and electronic components and semiconductors, which has strength and conductivity that satisfy the characteristics currently required in the industry that conventional technology cannot meet, and has excellent resistance Softening; and its preparation method.

為了達到這些目的和其他優點、且根據本發明構想,如本文所具現和廣泛描述者,一種用於電氣和電子部件與半導體的銅合金包括質量比為0.09至0.20%的鐵(Fe)、質量比為0.05至0.09%的磷(P)、質量比為0.05至0.20%的錳(Mn)、剩餘含量的銅(Cu)以及質量比為0.05%或更低的不可避免之雜質,其中該不可避免之雜質包括從由矽(Si)、鋅(Zn)、鈣(Ca)、鋁(Al)、鈦(Ti)、鈹(Be)、鉻(Cr)、鈷(Co)、銀(Ag)與鋯(Zr)所組成之群組中 選出的至少其一;而且銅合金具有470MPa或更高的抗拉強度、145Hv或更高的硬度、75%IACS以上的導電性、以及400℃或更高的耐軟化溫度。所述雜質具有質量比為0.01%或更低之含量。所述用於電氣和電子部件與半導體之銅合金可進一步包括質量比為0.0001至0.03%的鎳(Ni)或錫(Sn)至少其一。 In order to achieve these objectives and other advantages, and according to the idea of the present invention, as embodied and widely described herein, a copper alloy for electrical and electronic components and semiconductors includes iron (Fe), mass of 0.09 to 0.20% by mass, mass Phosphorus (P) with a ratio of 0.05 to 0.09%, manganese (Mn) with a mass ratio of 0.05 to 0.20%, copper (Cu) with a residual content, and inevitable impurities with a mass ratio of 0.05% or less, of which Impurities to avoid include from silicon (Si), zinc (Zn), calcium (Ca), aluminum (Al), titanium (Ti), beryllium (Be), chromium (Cr), cobalt (Co), silver (Ag) In the group formed with zirconium (Zr) At least one selected; and the copper alloy has a tensile strength of 470 MPa or higher, a hardness of 145 Hv or higher, a conductivity of 75% IACS or higher, and a softening resistance temperature of 400° C. or higher. The impurities have a content of 0.01% or less by mass. The copper alloy for electrical and electronic components and semiconductors may further include at least one of nickel (Ni) or tin (Sn) in a mass ratio of 0.0001 to 0.03%.

所述銅合金具有20μm或更小的平均晶粒大小與5μm或更低的標準差,得自於利用場發射掃描式電子顯微鏡(FE-SEM)所測量的晶粒大小。 The copper alloy has an average grain size of 20 μm or less and a standard deviation of 5 μm or less, resulting from the grain size measured using a field emission scanning electron microscope (FE-SEM).

所述銅合金包括(FeMn)2P析出物。所述(FeMn)2P析出物係藉由使用一高解析度穿透式電子顯微鏡(HR-TEM)或一場發射穿透式電子顯微鏡(FE-TEM)以100,000x以上的放大倍率觀察由碳提取複製方法所製備之一樣品來測量,且具有之平均粒子大小為50nm或更小,面積密度為1.0*1010/cm2或更高。 The copper alloy includes (FeMn) 2 P precipitates. The (FeMn) 2 P precipitate is observed by using a high-resolution transmission electron microscope (HR-TEM) or a field emission transmission electron microscope (FE-TEM) at a magnification of 100,000x or more A sample prepared by the extraction and replication method is measured, and has an average particle size of 50 nm or less and an area density of 1.0*10 10 /cm 2 or more.

所述銅合金可被製作為片材或板材。 The copper alloy can be made as a sheet or plate.

在本發明的另一構想中,一種用於電氣與電子部件和半導體之銅合金的製備方法包括:熔化如上述之成分元素以鑄造一鑄錠,在900至1000℃之溫度下均質化熱處理所獲得的鑄錠達1至4小時,然後以85至95%的加工率進行熱軋,以87至98%的加工率對先前步驟中所得的產物進行冷軋,以430至520℃之溫度對先前步驟中所得的產物進行析出熱處理達1至10小時,以及以10至90%的減縮率軋製先前步驟中所得的產物,以產生一最終產物。 In another concept of the present invention, a method for preparing a copper alloy for electrical and electronic components and semiconductors includes: melting the component elements as described above to cast an ingot, homogenizing the heat treatment at a temperature of 900 to 1000°C The obtained ingot is up to 1 to 4 hours, and then hot rolled at a processing rate of 85 to 95%, cold rolled the product obtained in the previous step at a processing rate of 87 to 98%, at a temperature of 430 to 520°C The product obtained in the previous step is subjected to precipitation heat treatment for 1 to 10 hours, and the product obtained in the previous step is rolled at a reduction ratio of 10 to 90% to produce a final product.

根據本發明的銅合金具有絕佳的強度和導電性,而且具有傑出的耐軟化性。此外,當透過根據本發明之製備過程來製備銅合金時,儘管製程成本有降低,但所獲得的銅合金會呈現絕佳的強度和導電性,並且除分離的電晶體與半導體引線框以外,還可應用於各種電氣與電子部件。 The copper alloy according to the present invention has excellent strength and electrical conductivity, and has excellent softening resistance. In addition, when the copper alloy is prepared through the preparation process according to the present invention, although the process cost is reduced, the obtained copper alloy will exhibit excellent strength and conductivity, and apart from the separated transistor and semiconductor lead frame, It can also be applied to various electrical and electronic components.

第一圖是說明根據實例5製備而成的銅合金和傳統銅合金的耐軟化特性圖。 The first figure is a graph illustrating the softening resistance characteristics of the copper alloy prepared according to Example 5 and the conventional copper alloy.

第二A圖是一FE-SEM照片,其顯現了在用於製備具有如實例1所載組成之銅合金的製程中在870℃下進行熱軋之後的微結構。 The second image A is an FE-SEM photograph showing the microstructure after hot rolling at 870°C in the process for preparing the copper alloy having the composition as described in Example 1.

第二B圖是一FE-SEM照片,其顯現了在用於製備具有如實例1所載組成之銅合金的製程中在900℃下進行熱軋之後的微結構。 The second image B is a FE-SEM photograph showing the microstructure after hot rolling at 900°C in the process for preparing the copper alloy having the composition as described in Example 1.

第二C圖是一FE-SEM照片,其顯現了在用於製備具有如實例1所載組成之銅合金的製程中在950℃下進行熱軋之後的微結構。 The second image C is a FE-SEM photograph showing the microstructure after hot rolling at 950°C in the process for preparing the copper alloy having the composition as described in Example 1.

第三圖是一FE-FEM照片,其顯現了根據實例5製備而成的銅合金的微結構。 The third figure is a FE-FEM photograph showing the microstructure of the copper alloy prepared according to Example 5.

第四A圖是藉由離子研磨法製備而成的樣品的FE-TEM照片,用以確認具有實例5之組成的銅合金中的析出物。 The fourth image A is an FE-TEM photograph of a sample prepared by the ion milling method to confirm the precipitates in the copper alloy having the composition of Example 5.

第四B圖是藉由碳萃取複製法製備而成的樣品的FE-TEM照片,用以確認具有實例5之組成的銅合金中的析出物。 The fourth image B is an FE-TEM photograph of a sample prepared by the carbon extraction and replication method to confirm the precipitates in the copper alloy having the composition of Example 5.

本發明提供了一種具高強度和導電性以及絕佳耐軟化性、用於電氣與電子部件和半導體的銅合金,以及其製備方法。在下述說明中,「%」是表示成分元素的含量的質量比(% by mass),除非有另行說明者。 The invention provides a copper alloy with high strength and electrical conductivity and excellent softening resistance, used in electrical and electronic parts and semiconductors, and a preparation method thereof. In the following description, "%" refers to the mass ratio (% by mass) indicating the content of the constituent elements, unless otherwise stated.

根據本發明之銅合金Copper alloy according to the invention

根據本發明之銅合金包括質量比為0.09至0.20%的鐵(Fe)、質量比為0.05至0.09%的磷(P)、質量比為0.05至0.20%的錳(Mn)、剩餘含量的銅(Cu)以及質量比為0.05%或更低的不可避免的雜質,所述不可避免的雜質包括從由矽(Si)、鋅(Zn)、鈣(Ca)、鋁(Al)、鈦(Ti)、鈹(Be)、鉻(Cr)、鈷(Co)、銀(Ag)與鋯(Zr)所組成之群組中選出的至少其一;而且所述銅合金是一種用於電氣與電子部件或半導體的銅合金,其具有470MPa或更高的抗拉強度、145Hv或更高的硬度、75%IACS以上的導電性、以及400℃或更高的耐軟化溫度。 The copper alloy according to the present invention includes iron (Fe) in a mass ratio of 0.09 to 0.20%, phosphorus (P) in a mass ratio of 0.05 to 0.09%, manganese (Mn) in a mass ratio of 0.05 to 0.20%, and a residual content of copper (Cu) and inevitable impurities with a mass ratio of 0.05% or less, the inevitable impurities include from silicon (Si), zinc (Zn), calcium (Ca), aluminum (Al), titanium (Ti ), beryllium (Be), chromium (Cr), cobalt (Co), silver (Ag) and zirconium (Zr) selected from the group consisting of at least one; and the copper alloy is a kind of electrical and electronic A copper alloy for parts or semiconductors, which has a tensile strength of 470 MPa or higher, a hardness of 145 Hv or higher, a conductivity of 75% IACS or higher, and a softening resistance temperature of 400° C. or higher.

在下文中,將描述根據本發明之銅合金的成分組成。在下述說明中,如非另有說明,否則表示元素含量的%是指質量比(% by mass)。 Hereinafter, the composition of the copper alloy according to the present invention will be described. In the following description, unless otherwise stated, the% representing the element content refers to the mass ratio (% by mass).

[鐵(Fe)] [Iron (Fe)]

Fe是要形成微細(FeMn)2P析出物以增進強度或導電性所必須的元素,Fe含量是在0.09至0.20%的範圍內。若Fe含量低於0.09%,則形成析出物所需的粒子會不夠,且因析出物所致之晶粒成長的抑制效果會降低。故,平均晶粒大小或平均晶粒的標準偏差會過度增加,因而降低強度。因此,為了要有效呈現效應,Fe含量需要是0.09%或更高。然而,當Fe含量超過0.20%(即過度增加)時,則會導致析出物的粗化,平均晶粒的標準偏差過度增加,因而降低彎曲加工性和導電性。 Fe is an element necessary to form fine (FeMn) 2 P precipitates to improve strength or conductivity, and the Fe content is in the range of 0.09 to 0.20%. If the Fe content is less than 0.09%, the particles required to form precipitates are insufficient, and the effect of suppressing the growth of crystal grains due to the precipitates is reduced. Therefore, the average crystal grain size or the standard deviation of the average crystal grains will increase excessively, thus decreasing the strength. Therefore, in order to effectively exhibit the effect, the Fe content needs to be 0.09% or higher. However, when the Fe content exceeds 0.20% (that is, excessive increase), it causes coarsening of the precipitates, and the standard deviation of the average crystal grains increases excessively, thereby reducing bending workability and electrical conductivity.

[磷(P)] [Phosphorus (P)]

除了脫酸以外,P與Fe和Mn結合,並且因而形成了微細的(FeMn)2P析出物,以增進銅合金的強度或傳導性。P含量為0.05至0.09%。當P含量低於0.05%,微細析出物的形成會不充足,且因析出物所致之晶粒成長的抑制效果會 降低。故,平均晶粒大小或平均晶粒的標準偏差會過度增加,因而降低強度。因此,P含量需要是0.05%或更高。然而,若P含量超過0.09%(亦即過度增加),則粗析出物粒子會增加,平均晶粒的標準偏差會增加,而且彎曲加工性會因此降低。此外,導電性也會降低。 In addition to deacidification, P combines with Fe and Mn, and thus forms fine (FeMn) 2 P precipitates to improve the strength or conductivity of the copper alloy. The P content is 0.05 to 0.09%. When the P content is less than 0.05%, the formation of fine precipitates is insufficient, and the effect of suppressing grain growth due to the precipitates is reduced. Therefore, the average crystal grain size or the standard deviation of the average crystal grains will increase excessively, thus decreasing the strength. Therefore, the P content needs to be 0.05% or higher. However, if the P content exceeds 0.09% (that is, excessive increase), coarse precipitate particles increase, the standard deviation of the average crystal grains increases, and the bending workability decreases accordingly. In addition, the conductivity will also be reduced.

[錳(Mn)] [Manganese (Mn)]

據報導,添加至銅合金中的Mn一般有助於提升銅合金的強度,若僅於銅合金中添加Mn來提升強度,則最終獲得的銅合金產品的導電性會不可避免地降低。在根據本發明的銅合金中形成有(FeMn)2P析出物,因此可同時增進銅合金的強度和導電性兩者。在根據本發明的銅合金中,Mn含量為0.05至0.20%。若Mn含量低於0.05%,析出物的形成會不充足,且因析出物所致之晶粒成長的抑制效果會降低,因此降低強度,如同在Fe中的情形。然而,當Mn含量超過0.20%,則強度和導電性兩者都會因粗結晶物質或鑄造缺陷而降低。 According to reports, the Mn added to the copper alloy generally helps to increase the strength of the copper alloy. If only adding Mn to the copper alloy to increase the strength, the conductivity of the finally obtained copper alloy product will inevitably decrease. (FeMn) 2 P precipitates are formed in the copper alloy according to the present invention, and therefore both the strength and conductivity of the copper alloy can be improved. In the copper alloy according to the present invention, the Mn content is 0.05 to 0.20%. If the Mn content is less than 0.05%, the formation of precipitates will be insufficient, and the effect of suppressing the growth of crystal grains due to precipitates will be reduced, so the strength will be reduced, as in the case of Fe. However, when the Mn content exceeds 0.20%, both strength and conductivity will be reduced due to coarse crystalline substances or casting defects.

[不可避免的雜質] [Unavoidable impurities]

此外,根據本發明之銅合金包含0.05%或更低之由Si、Zn、Ca、Al、Ti、Be、Cr、Co、Ag和Zr所組成群組中選出的至少其一。較佳地,雜質含量為0.01%或更低。這些元素是用以增進銅合金的各種特性的元素,而且可根據應用而選擇地添加。 In addition, the copper alloy according to the present invention contains 0.05% or less of at least one selected from the group consisting of Si, Zn, Ca, Al, Ti, Be, Cr, Co, Ag, and Zr. Preferably, the impurity content is 0.01% or lower. These elements are elements to improve various characteristics of the copper alloy, and can be added selectively according to the application.

在根據本發明的銅合金中,若於銅合金中添加被廣知具有絕佳強化效果的Mg,則最終獲得的銅合金產物的強度會有所提升,但產物的導電性則不可避免地下降,而且Mg與P反應並從鑄造開始到熱軋結束都產生粗大的Mg-P基結晶物質和缺陷。因此,Mg應該要被排除。 In the copper alloy according to the present invention, if Mg, which is widely known to have an excellent strengthening effect, is added to the copper alloy, the strength of the finally obtained copper alloy product will be improved, but the conductivity of the product inevitably decreases And, Mg reacts with P and produces coarse Mg-P-based crystalline substances and defects from the beginning of casting to the end of hot rolling. Therefore, Mg should be excluded.

[鎳(Ni)]和[錫(Sn)] [Nickel (Ni)] and [tin (Sn)]

根據本發明的銅合金可進一步包含0.0001%至0.03%的Ni或Sn中至少其一。Ni溶解於Cu基質中,因此具有提升強度的效果,並且可有效提供耐熱性。若Ni含量低於0.0001%,則無法提升銅合金的強度;而且,若Ni含量超過0.03%,則會降低銅合金的導電性。 The copper alloy according to the present invention may further contain 0.0001% to 0.03% of at least one of Ni or Sn. Ni is dissolved in the Cu matrix, so it has the effect of improving strength, and can effectively provide heat resistance. If the Ni content is less than 0.0001%, the strength of the copper alloy cannot be improved; moreover, if the Ni content exceeds 0.03%, the conductivity of the copper alloy will be reduced.

Sn是一種固體溶液強化合金元素,其溶解於Cu基質中以增進強度。若Sn含量低於0.0001%,則難以預期銅合金的強度提升;而且,若Sn含量超過0.03%,則會降低銅合金的導電性。 Sn is a solid solution strengthening alloy element, which is dissolved in the Cu matrix to increase strength. If the Sn content is less than 0.0001%, it is difficult to predict the strength improvement of the copper alloy; and, if the Sn content exceeds 0.03%, the conductivity of the copper alloy will be reduced.

[根據本發明之銅合金的特性][Characteristics of the copper alloy according to the present invention]

一般而言,在銅合金中,當銅合金的強度增加,銅合金的導電性會減少,因而難以控制兩種特性。 In general, in copper alloys, as the strength of the copper alloy increases, the conductivity of the copper alloy decreases, making it difficult to control both characteristics.

根據本發明之銅合金的強度可滿足抗拉強度為470MPa或更高、以及硬度為145Hv或更高兩者。這些是反映了業界最近需要的特性、而且是在考慮具有反向關係的銅合金強度和導電性時會被視為是限制的數值。 The strength of the copper alloy according to the present invention can satisfy both the tensile strength of 470 MPa or higher and the hardness of 145 Hv or higher. These are the values that reflect the recent needs of the industry, and are considered to be limiting values when considering the strength and conductivity of copper alloys that have an inverse relationship.

此外,半導體或電氣與電子部件中所使用的銅合金應具有75%IACS或更高之導電性。若銅合金的導電性低於75%IACS,則電氣訊號的傳輸即不是有效的,因而該銅合金無法使用於產品中。根據本發明之銅合金的導電性為75%IACS或更高。 In addition, copper alloys used in semiconductors or electrical and electronic components should have a conductivity of 75% IACS or higher. If the conductivity of the copper alloy is less than 75% IACS, the transmission of electrical signals is not effective, so the copper alloy cannot be used in products. The electrical conductivity of the copper alloy according to the present invention is 75% IACS or higher.

亦即,根據本發明之銅合金具有絕佳的特性,即提升的強度和導電性兩者。 That is, the copper alloy according to the present invention has excellent characteristics, that is, both enhanced strength and electrical conductivity.

根據本發明之銅合金具有400℃或更高之絕佳耐軟化溫度。以下將於根據本發明之銅合金的製備方法中提出耐軟化溫度的詳細說明。 The copper alloy according to the present invention has an excellent softening resistance temperature of 400°C or higher. In the following, a detailed description of the softening temperature resistance will be provided in the preparation method of the copper alloy according to the present invention.

[根據本發明之銅合金的製備方法][The preparation method of the copper alloy according to the present invention]

根據本發明之銅合金可藉由下述方法來製備。首先,將根據上述組成之成分元素熔化以鑄造一鑄錠。所獲得的鑄錠在900至1000℃的溫度下經均質化熱處理達1至4小時,然後立即以85至95%之加工率進行熱軋。在完成熱軋同時,對所得產物進行水淬冷以進行溶質元素的固溶處理,然後以87至98%之加工率進行冷軋。在經由這類冷軋而累積了高應變能量、故而增加了用以產生析出物的驅動力之後,所得產物在430至520℃下進行析出熱處理達1至10小時。接著,對所得產物進行減縮率為10至90%的軋製,因此決定最終產物的最終厚度。 The copper alloy according to the present invention can be prepared by the following method. First, the component elements according to the above composition are melted to cast an ingot. The obtained ingot is subjected to homogenization heat treatment at a temperature of 900 to 1000°C for 1 to 4 hours, and then immediately hot-rolled at a processing rate of 85 to 95%. While hot rolling is completed, the resulting product is water-quenched for solution treatment of solute elements, and then cold-rolled at a processing rate of 87 to 98%. After accumulating high strain energy through such cold rolling and thus increasing the driving force for generating precipitates, the resulting product is subjected to precipitation heat treatment at 430 to 520°C for 1 to 10 hours. Next, the resulting product is rolled with a reduction ratio of 10 to 90%, thus determining the final thickness of the final product.

以下將更詳細說明根據本發明之銅合金的製備方法的個別操作。 The individual operations of the method for preparing a copper alloy according to the present invention will be explained in more detail below.

首先,上述組成元素經熔化以鑄造鑄錠。 First, the above constituent elements are melted to cast an ingot.

然後,在所得產物受溫度為900至1000℃的均質化熱處理達1至4小時之後,立即對其以加工率為85至95%進行熱軋。均質化熱處理是一種熱軋前置基本處理,使得鑄錠在充分加熱的狀態下、而非在冷加工狀態下進行熱軋,以去除鑄造結構並產生新的再結晶結構。在根據本發明之銅合金的製備方法中,熱軋是最重要的操作。熱軋條件是對於產生合金特性的金屬結構有重要影響的因子,根據熱軋條件而在熱軋之後形成不同結構,從而最終產物的特性會有變化。熱軋條件包括熱軋溫度、熱軋中的通過次數、冷卻條件等,而在熱軋後所獲得的結構會根據各別條件而改變。 Then, after the resulting product was subjected to a homogenization heat treatment at a temperature of 900 to 1000° C. for 1 to 4 hours, it was immediately hot-rolled at a processing rate of 85 to 95%. Homogenization heat treatment is a basic pre-treatment for hot rolling, so that the ingot is hot rolled in a fully heated state instead of in a cold working state to remove the cast structure and produce a new recrystallized structure. In the method of preparing a copper alloy according to the present invention, hot rolling is the most important operation. Hot rolling conditions are factors that have an important influence on the metal structure that produces alloy characteristics. Different structures are formed after hot rolling according to the hot rolling conditions, so that the characteristics of the final product will change. The hot rolling conditions include hot rolling temperature, the number of passes during hot rolling, cooling conditions, etc., and the structure obtained after hot rolling will vary according to various conditions.

為實現根據本發明之銅合金的特性,熱軋溫度應在900至1000℃的範圍內。當熱軋溫度落在此範圍內時,可獲得具有非方向性的異向性再結晶結構。正如下述實例中所確認,若熱軋溫度低於900℃,加工結構(軋製結構)仍 被保留。在傳統用於一般引線框的銅合金中,為了避免最終產物的特性劣化,應加入一次或更多次的固溶處理和析出製程,而這會導致成本的增加與產量降低。另一方面,根據本發明之銅合金則在不需任何額外製程下具有其特性,而且因此可降低處理成本且可提生產量。 To achieve the characteristics of the copper alloy according to the present invention, the hot rolling temperature should be in the range of 900 to 1000°C. When the hot rolling temperature falls within this range, an anisotropic recrystallized structure with non-directionality can be obtained. As confirmed in the following example, if the hot rolling temperature is lower than 900°C, the processed structure (rolled structure) is still Is retained. In the traditional copper alloy used for general lead frames, in order to avoid the deterioration of the characteristics of the final product, one or more solution treatment and precipitation processes should be added, which will lead to an increase in cost and a reduction in yield. On the other hand, the copper alloy according to the present invention has its characteristics without any additional process, and therefore can reduce the processing cost and increase the production volume.

當鑄錠被加熱到900至1000℃之溫度達1至4小時以進行均質化熱處理時,即可同時得到異向性再結晶結構,呈現固溶處理之效果。當鑄錠被加熱達小於1小時的時間,則仍會局部保留加工結構,且鑄錠無法完全呈現異向性再結晶結構的特性;而當鑄錠被加熱達超過4小時的時間,鑄錠會部分熔化。固溶處理是一種在超飽和狀態下將超過溶解能力的元素量溶解於Cu基質中的程序,且因此析出效應可達最大化。在一般的析出強化合金中,需要對具薄膜厚度的合金進行獨立的額外固溶處理製程,因此會增加處理成本且產量會下降。然而,在根據本發明之銅合金中,是透過在熱軋製程中的熱處理來得到固溶處理效果,因此高應變能會透過在後續冷軋製程中、加工率為87至98%的強軋製而累積於材料中。材料中的高應變能是作為冷軋之後的析出製程的驅動力,因此在析出製程中微細的析出物能夠均勻分布。 When the ingot is heated to a temperature of 900 to 1000°C for 1 to 4 hours for homogenization heat treatment, an anisotropic recrystallization structure can be obtained at the same time, showing the effect of solution treatment. When the ingot is heated for less than 1 hour, the processing structure is still partially retained, and the ingot cannot fully exhibit the characteristics of anisotropic recrystallization structure; while when the ingot is heated for more than 4 hours, the ingot Will partially melt. Solution treatment is a procedure to dissolve the amount of elements exceeding the dissolution capacity in the Cu matrix under supersaturated state, and therefore the precipitation effect can be maximized. In general precipitation-strengthened alloys, it is necessary to perform an independent additional solution treatment process on the alloy with a thin film thickness, so the treatment cost will increase and the output will decrease. However, in the copper alloy according to the present invention, the solution treatment effect is obtained through the heat treatment in the hot rolling process, so the high strain energy will pass through the strong rolling in the subsequent cold rolling process with a processing rate of 87 to 98% System and accumulate in the material. The high strain energy in the material serves as the driving force for the precipitation process after cold rolling, so fine precipitates can be evenly distributed in the precipitation process.

然後,在熱軋完成同時,從先前步驟中所得產物係經水淬冷以實施溶質元素的固溶處理,接著以87至98%的加工率對其進行冷軋。高應變能會經由此冷軋而累積,因此可增加用以產生析出物的驅動力。 Then, at the same time when the hot rolling is completed, the product obtained from the previous step is quenched with water to perform the solution treatment of the solute element, and then it is cold rolled at a processing rate of 87 to 98%. High strain energy accumulates through this cold rolling, so the driving force for generating precipitates can be increased.

然後,從先前步驟中獲得的產物在430至520℃的溫度下進行析出熱處理達1至10小時。根據本發明之銅合金是一種析出強化型合金,因此析出過程是重要的。此外,根據本發明之銅合金是被設計為額外包含Mn,但僅添加Mn無法獲得銅合金的最佳強度和導電性,這些性質是藉由在析出製程期間均勻地 分佈微細析出物而獲得。在傳統的Cu-Fe-P基合金中,銅合金中主要存在Fe2P析出物,但粗FeP析出物是局部地存在,因此導致銅合金的特性變差。另一方面,在根據本發明的銅合金製備方法中,析出熱處理是在上述條件下進行,而因此,微細的(FeMn)2P析出物係分佈於銅合金中,因此可達到高強度和高導電性兩者。 Then, the product obtained from the previous step is subjected to precipitation heat treatment at a temperature of 430 to 520°C for 1 to 10 hours. The copper alloy according to the present invention is a precipitation strengthening alloy, so the precipitation process is important. In addition, the copper alloy according to the present invention is designed to additionally contain Mn, but the optimum strength and conductivity of the copper alloy cannot be obtained by adding Mn alone. These properties are obtained by uniformly distributing fine precipitates during the precipitation process. In the traditional Cu-Fe-P-based alloy, the Fe 2 P precipitates are mainly present in the copper alloy, but the coarse FeP precipitates are locally present, so that the characteristics of the copper alloy are deteriorated. On the other hand, in the copper alloy preparation method according to the present invention, the precipitation heat treatment is performed under the above conditions, and therefore, the fine (FeMn) 2 P precipitate system is distributed in the copper alloy, and therefore high strength and high Conductivity both.

最後,以10至90%的減縮率軋製先前步驟中所得的產物。在此,產物是以10至90%的加工率進行冷軋軋製,因而獲得目標物理性質。在此,加工率的較佳範圍是30至70%,在此範圍內,根據本發明之銅合金的加工量之強度增加效率可達最大化。 Finally, the product obtained in the previous step is rolled at a reduction rate of 10 to 90%. Here, the product is cold-rolled at a processing rate of 10 to 90%, thereby obtaining the target physical properties. Here, the preferable range of the processing rate is 30 to 70%. Within this range, the strength increase efficiency of the processing amount of the copper alloy according to the present invention can be maximized.

此外,在上述方法中,在析出熱處理之後、且在最終產物的最終軋製之前,可視需要執行加工率為30至90%之冷軋,然後進行中間熱處理。這種以加工率為30至90%進行的冷軋與中間熱處理並非必須,但可執行以解決表面品質的問題,例如因主生產線的析出熱處理設備的處理或製備條件所產生的燒結(burning)(因熱和壓力所致之部分黏結)、因析出熱處理之後的表面酸洗製程所產生的刮傷等。若析出熱處理之後的產物的厚度與最終軋製之後的最終產物的厚度之間有大差異,且最終產物超出目標物理性質(強度與導電性)的範圍,則可實施中間熱處理,否則會難以得到目標特性。在此,由於中間熱處理的主要目的在於降低銅合金的強度,但銅合金的導電性降低必須達最小化,因此中間熱處理是重要的,以使導電性降低0.1至3%IACS的範圍。倘導電性降低的數值低於0.1%IACS,則熱處理不具效果;且若導電性降低的數值超過3%IACS,則熱處理具有良好效果,但存在有銅合金因其導電性和強度降低而偏離目標特性的可能性。 In addition, in the above method, after precipitation heat treatment and before final rolling of the final product, cold rolling with a processing rate of 30 to 90% may be performed as necessary, and then intermediate heat treatment is performed. This kind of cold rolling and intermediate heat treatment at a processing rate of 30 to 90% is not necessary, but can be performed to solve the problem of surface quality, such as sintering (burning) due to the processing or preparation conditions of the precipitation heat treatment equipment of the main production line (Partial adhesion due to heat and pressure), scratches caused by the surface pickling process after precipitation heat treatment, etc. If there is a large difference between the thickness of the product after precipitation heat treatment and the thickness of the final product after final rolling, and the final product exceeds the target physical properties (strength and conductivity), then intermediate heat treatment can be carried out, otherwise it will be difficult to obtain Target characteristics. Here, since the main purpose of the intermediate heat treatment is to reduce the strength of the copper alloy, but the conductivity reduction of the copper alloy must be minimized, the intermediate heat treatment is important to reduce the conductivity in the range of 0.1 to 3% IACS. If the value of the reduced conductivity is less than 0.1% IACS, the heat treatment has no effect; and if the value of the reduced conductivity exceeds 3% IACS, the heat treatment has a good effect, but there is a copper alloy that deviates from the target due to its reduced conductivity and strength Possibility of characteristics.

在根據本發明之銅合金的製備方法中,熱軋和析出熱處理製程對於最終獲得的銅合金的特性有重要影響,而且,為了在根據本發明之銅合金中分佈微細的(FeMn)2P析出物,熱軋製程到析出製程都需要精確地依序加以控制。為了確認銅合金中產生的微細析出物,使用FE-SEM和FE-TEM來觀察是必要的。 In the preparation method of the copper alloy according to the present invention, hot rolling and precipitation heat treatment processes have an important influence on the characteristics of the finally obtained copper alloy, and, in order to distribute fine (FeMn) 2 P precipitation in the copper alloy according to the present invention The hot rolling process to the precipitation process all need to be controlled accurately and sequentially. In order to confirm the fine precipitates generated in the copper alloy, observation using FE-SEM and FE-TEM is necessary.

根據本發明之方法所製備的銅合金包含有微細的(FeMn)2P析出物,而且,當利用FE-TEM之結晶取向分析以100,000x或更高的放大倍率觀察微結構時,(FeMn)2P析出物的平均粒子大小為50nm或更小,(FeMn)2P析出物的面積密度為1.0*1010/cm2或更高。 The copper alloy prepared according to the method of the present invention contains fine (FeMn) 2 P precipitates, and, when the microstructure is observed at a magnification of 100,000x or higher using FE-TEM crystal orientation analysis, (FeMn) The average particle size of 2 P precipitates is 50 nm or less, and the area density of (FeMn) 2 P precipitates is 1.0*10 10 /cm 2 or more.

為了觀察析出物,傳統上是透過一般的離子研磨法來製備TEM樣品。然而,使用這種樣品難以觀察到粒子大小為數奈米或數十奈米的微細析出物。即使嘗試要觀察微細的析出物,仍難以區分出析出物與通過離子研磨法所製備的TEM樣品中的雜質或外來物質,而且無法確認析出物的結晶結構、組成等。另一方面,通過以碳萃取重複法所製備之樣品的TEM分析,可觀察到根據本發明之銅合金中的微細析出物。 In order to observe the precipitates, TEM samples are traditionally prepared by the general ion milling method. However, it is difficult to observe fine precipitates with a particle size of several nanometers or tens of nanometers using this sample. Even if an attempt is made to observe fine precipitates, it is difficult to distinguish the precipitates from impurities or foreign substances in the TEM sample prepared by the ion milling method, and the crystal structure and composition of the precipitates cannot be confirmed. On the other hand, by TEM analysis of the sample prepared by the carbon extraction repeat method, fine precipitates in the copper alloy according to the present invention can be observed.

在根據本發明之銅合金中,微細的(FeMn)2P析出物是均勻地分佈到晶界與晶粒內部,而且(FeMn)2P析出物的平均粒子大小是50nm或更小。若析出物的平均粒子大小超過50nm,則導電性即不可避免地會降低,且會導致在半導體製程中有不良的可靠性。析出物的平均粒子大小可透過場發射穿透式電子顯微鏡(FE-TEM)結晶取向分析、以100000x或更高的放大倍率觀察而測得。在這方面,第四A圖與第四B圖說明在下述實例中的根據本發明之銅合金的FE-TEM分析結果。 In the copper alloy according to the present invention, fine (FeMn) 2 P precipitates are uniformly distributed within the grain boundaries and inside the crystal grains, and the average particle size of the (FeMn) 2 P precipitates is 50 nm or less. If the average particle size of the precipitate exceeds 50 nm, the conductivity will inevitably decrease, and this will lead to poor reliability in the semiconductor manufacturing process. The average particle size of the precipitate can be measured by field emission transmission electron microscopy (FE-TEM) crystal orientation analysis and observation at a magnification of 100,000x or higher. In this regard, the fourth graph A and the fourth graph B illustrate the results of FE-TEM analysis of the copper alloy according to the present invention in the following examples.

此外,可根據第四A圖和第四B圖所示FE-TEM結果測量面積密度。面積密度是指在一指定面積內存在的析出物數量,且是作為估計析出物分佈的指標。傳統上是使用體積比例來估計析出物分佈,但體積比例是表示一指定面積中的析出物百分比,因此,若產生了具有大尺寸的粗粒子,則誤差範圍就變得可觀。另一方面,若使用面積密度的概念,粗粒子的存在並不會影響面積密度,即可更精確地確認析出物的分佈程度。根據本發明之銅合金的面積密度是1.0*1010/cm2或更高。由於根據本發明之銅合金的(FeMn)2P析出物的平均粒子大小是非常微細的,亦即50nm或更小,為了要呈現根據本發明之銅合金的特性,需要有大量的析出物,因而若析出物數量(亦即面積密度)低於1.0*1010/cm2,則銅合金即無法具有充足強度。 In addition, the area density can be measured based on the FE-TEM results shown in the fourth A and fourth B diagrams. Area density refers to the number of precipitates present in a specified area and is used as an index to estimate the distribution of precipitates. Traditionally, the volume ratio is used to estimate the distribution of precipitates, but the volume ratio represents the percentage of precipitates in a specified area. Therefore, if coarse particles with large sizes are generated, the error range becomes considerable. On the other hand, if the concept of area density is used, the presence of coarse particles does not affect the area density, and the degree of distribution of precipitates can be confirmed more accurately. The area density of the copper alloy according to the present invention is 1.0*10 10 /cm 2 or higher. Since the average particle size of (FeMn) 2 P precipitates of the copper alloy according to the present invention is very fine, that is, 50 nm or less, in order to exhibit the characteristics of the copper alloy according to the present invention, a large amount of precipitates is required, Therefore, if the number of precipitates (that is, area density) is less than 1.0*10 10 /cm 2 , the copper alloy cannot have sufficient strength.

根據本發明之銅合金的耐軟化溫度為400℃或更高。為了在電氣與電子部件和半導體中有足夠的耐軟化性,銅合金的耐軟化溫度必須是400℃或更高。在本發明中,是執行析出強化(而非晶粒細化)來作為一種提升銅合金強度的方式,因此銅合金具有絕佳的耐軟化性。若執行劇烈的塑性變形來達到晶粒細化,則會因高內部應力而發生缺陷軟化。缺陷軟化是指材料的硬度在材料處理與半導體裝置的封裝期間因熱而降低,因而產生缺陷產品。 The softening temperature of the copper alloy according to the present invention is 400°C or higher. In order to have sufficient softening resistance in electrical and electronic parts and semiconductors, the softening temperature of copper alloys must be 400°C or higher. In the present invention, precipitation strengthening (rather than grain refinement) is performed as a way to increase the strength of the copper alloy, so the copper alloy has excellent softening resistance. If severe plastic deformation is performed to achieve grain refinement, defects will soften due to high internal stress. Defect softening means that the hardness of the material decreases due to heat during material processing and packaging of the semiconductor device, thus producing defective products.

根據本發明之電氣與電子部件和半導體之銅合金可被製備為片材或板材。這種片材或板材類型的銅合金適合應用於半導體或IC引線框或連接器、以及端子。 Copper alloys for electrical and electronic components and semiconductors according to the present invention can be prepared as sheets or plates. This type of sheet or plate type copper alloy is suitable for use in semiconductor or IC lead frames or connectors, and terminals.

相較於傳統產品,根據本發明之銅合金具有絕佳的強度和導電性,而且藉由混合銅合金之成分與精確控制製備過程而具有絕佳的耐軟化特性,如上文所述,因此不僅特別適合電氣與電子部件(例如傳統使用之半導體引線 框、端子、連接器、切換器、繼電器等),也適用於近來需求增加之分離電晶體(亦即車用電源控制半導體)。 Compared with traditional products, the copper alloy according to the present invention has excellent strength and conductivity, and has excellent resistance to softening by mixing the composition of the copper alloy and precisely controlling the preparation process, as described above, so not only Particularly suitable for electrical and electronic components (e.g. traditionally used semiconductor leads Frames, terminals, connectors, switches, relays, etc.) are also suitable for discrete transistors (that is, automotive power control semiconductors) that have recently increased in demand.

實例Examples

實例1至實例16Example 1 to Example 16

實例1至16的樣品是根據下表1所揭露的組成而製備。在下文中將說明製備樣品的方法。 The samples of Examples 1 to 16 were prepared according to the compositions disclosed in Table 1 below. In the following, a method of preparing a sample will be explained.

包含銅之合金元素係根據表1所揭露的各個組成依每1公斤加以混合,在高頻熔化加熱爐中熔化所得的混合物,然後製得厚度為20mm、寬度為50mm、長度為160至180mm的鑄錠。為了移除不良部分,例如快速冷卻的部分和收縮穴部,所製得之鑄錠的底部與頂部會被切掉20mm的長度,然後在箱式加熱爐中900℃的溫度下進行鑄錠的均質化熱處理達2小時。在均質化熱處理之後,立即執行加工率為90%的熱軋,在熱軋完成的同時藉由水淬冷進行固溶處理,以抑制溶質元素的析出。在析出製程之前,以90%的加工率進行冷軋,使得高應變能經由此冷軋而累積,因而增加用以產生析出物的驅動力。之後,在450℃的溫度下進行析出熱處理達3小時,然後以50%的加工率進行冷軋。最後,銅合金之最終產物被製備為樣品,樣品大小為0.3t*30w*200l,且樣品被使用於後續進行的測試中。表2表示實例1至實例16的製備銅合金樣品的特性分析結果,揭露於測試實例(Test Example)中。 The alloy elements containing copper are mixed according to each composition disclosed in Table 1 per 1 kg, and the resulting mixture is melted in a high-frequency melting heating furnace, and then made into a thickness of 20 mm, a width of 50 mm, and a length of 160 to 180 mm. Ingot. In order to remove bad parts, such as fast cooling parts and shrinkage cavities, the bottom and top of the prepared ingots will be cut off by a length of 20 mm, and then the ingots will be processed in a box-type heating furnace at 900°C Homogenization heat treatment for 2 hours. Immediately after the homogenization heat treatment, hot rolling with a processing rate of 90% is performed. After the hot rolling is completed, the solution treatment is performed by water quenching to suppress the precipitation of solute elements. Before the precipitation process, cold rolling is performed at a processing rate of 90%, so that high strain energy is accumulated through this cold rolling, thus increasing the driving force for generating precipitates. Thereafter, precipitation heat treatment was performed at a temperature of 450° C. for 3 hours, and then cold rolling was performed at a processing rate of 50%. Finally, the final product of the copper alloy was prepared as a sample, the sample size was 0.3t*30w*200l, and the sample was used in subsequent tests. Table 2 shows the characteristic analysis results of the copper alloy samples prepared in Examples 1 to 16, which are disclosed in the Test Example.

比較例1至比較例16Comparative Example 1 to Comparative Example 16

比較例1至16的樣品是根據表1所揭露的組成、在與實例1至16相同條件下以製備方法而製備。表2也呈現比較例1至比較例16的製備銅合金樣品的特性分析結果。 The samples of Comparative Examples 1 to 16 were prepared according to the composition disclosed in Table 1 under the same conditions as in Examples 1 to 16 by the preparation method. Table 2 also presents the characteristics analysis results of the copper alloy samples prepared in Comparative Examples 1 to 16.

Figure 107131725-A0305-02-0018-1
Figure 107131725-A0305-02-0018-1
Figure 107131725-A0305-02-0019-2
Figure 107131725-A0305-02-0019-2

實例1至14是評估表1中所示的Cu、Fe、Mn和P的組成範圍的臨界意義的實例。實例14至16是確認添加元素(例如Ni和Sn)的效果的實例。比較例1與廣泛用於引線框的合金C19210的組成相同。此外,比較例8至13的組成除了合金C19210的組成以外還包括Mn。 Examples 1 to 14 are examples of evaluating the critical significance of the composition range of Cu, Fe, Mn, and P shown in Table 1. Examples 14 to 16 are examples confirming the effect of adding elements such as Ni and Sn. Comparative Example 1 has the same composition as alloy C19210, which is widely used in lead frames. In addition, the compositions of Comparative Examples 8 to 13 include Mn in addition to the composition of alloy C19210.

[測試實例] [Test example]

在下文中,將說明根據實例與比較例而製備的銅合金樣品的特性分析方法。 In the following, a characteristic analysis method of copper alloy samples prepared according to Examples and Comparative Examples will be explained.

抗拉強度是利用ZWICK ROELL有限公司的通用測試機器Z100加以測量;硬度是利用INSTRON有限公司的Vickers硬度測試機TUKON 2500施加1公斤負載加以測量:導電性是利用FOERSTER有限公司的SIGMATEST加以測量。 Tensile strength is measured using ZWICK ROELL Co., Ltd.'s universal testing machine Z100; hardness is measured using INSTRON Co., Ltd.'s Vickers hardness tester TUKON 2500 with a load of 1 kg: conductivity is measured using SIGMATEST from FOERSTER Co., Ltd.

在耐軟化溫度分析中,是利用THERMO SCIENTIFIC有限公司的Thermolyne 5.8L D1 Benchtop Muffle Furnace加熱爐來進行熱處理。更詳細而言,在分別以300、350、400、450、500、550、600、650與700℃之溫度進行樣品熱處理達1分鐘之後,測量樣品的硬度值,繪製虛線圖形(其中Y軸代表硬度、X軸代表溫度),與相對應於初始硬度的80%的點交會的溫度值即被計算作為耐軟化溫度。結果係示於第一圖,其中實例5的銅合金係示例地與傳統銅合金C19400和C19210相比較。 In the analysis of softening temperature resistance, Thermolyne 5.8L D1 Benchtop Muffle Furnace heating furnace of THERMO SCIENTIFIC Co., Ltd. was used for heat treatment. In more detail, after performing sample heat treatment at 300, 350, 400, 450, 500, 550, 600, 650, and 700°C for 1 minute, measure the hardness value of the sample and draw a dotted line graph (where the Y axis represents (Hardness, X axis represents temperature), and the temperature value that intersects the point corresponding to 80% of the initial hardness is calculated as the softening resistance temperature. The results are shown in the first graph, in which the copper alloy system of Example 5 is exemplarily compared with the conventional copper alloys C19400 and C19210.

利用FEI有限公司的Quanta650FEG(FE-SEM)來測量樣品的微結構的平均結晶粒大小。為了測量平均結晶粒大小,在對樣品的表面進行電解質拋 光之後,樣品被插入到FE-SEM爐體內,腔室內部的壓力保持為1*10-5托耳或更低,然後以離子束輻照透過結晶取向分析來觀察樣品。第三圖說明實例5的銅合金的微結構的觀察結果。 The average crystal grain size of the microstructure of the sample was measured using Quanta650FEG (FE-SEM) of FEI Co., Ltd. In order to measure the average crystal grain size, after performing electrolyte polishing on the surface of the sample, the sample is inserted into the FE-SEM furnace body, the pressure inside the chamber is maintained at 1*10 -5 Torr or lower, and then irradiated with an ion beam Observe the sample through crystal orientation analysis. The third graph illustrates the observation results of the microstructure of the copper alloy of Example 5.

使用JEOL有限公司的JEM-2100F(FE-TEM)來測量析出物的平均粒子大小和面積密度。為了使用FE-TEM觀察樣品,分析係藉由兩種方法來實施,而第四A圖表示利用一般樣品製備方法(即離子研磨法)的FE-TEM結果。如第四A圖所例示,係難以確認與分析微細的析出物。因此,為了要分析無法利用離子研磨法確認的微細析出物,第四B圖表示以碳萃取重複法製備之樣品的FE-TEM分析的結果。 The average particle size and area density of the precipitates were measured using JEM-2100F (FE-TEM) of JEOL Co., Ltd. In order to observe the sample using FE-TEM, the analysis was carried out by two methods, and the fourth graph A shows the FE-TEM result using the general sample preparation method (ie, ion milling method). As illustrated in the fourth graph A, it is difficult to confirm and analyze fine precipitates. Therefore, in order to analyze fine precipitates that cannot be confirmed by the ion milling method, Figure 4B shows the results of FE-TEM analysis of samples prepared by the carbon extraction repeat method.

下表2表示根據上述特性分析方法之測量結果。 Table 2 below shows the measurement results according to the above characteristic analysis method.

Figure 107131725-A0305-02-0020-3
Figure 107131725-A0305-02-0020-3
Figure 107131725-A0305-02-0021-4
Figure 107131725-A0305-02-0021-4

在上表2中,透過實例4和實例8的比較,可確認實例4的銅合金(其除了實例8的銅合金組成以外還具有P增量)提供了足量的P來形成微細的(FeMn)2P析出物,因此具有提升的強度和導電性兩者。此外,從實例5的結果確認了實例5之銅合金兼具絕佳的強度和導電性。 In Table 2 above, through comparison between Example 4 and Example 8, it can be confirmed that the copper alloy of Example 4 (which has a P increment in addition to the copper alloy composition of Example 8) provides a sufficient amount of P to form fine (FeMn ) 2 P precipitates and therefore has both enhanced strength and conductivity. In addition, from the results of Example 5, it was confirmed that the copper alloy of Example 5 has both excellent strength and electrical conductivity.

另一方面,比較例1至16之銅合金並不滿足與業界中所需特性中其一相對應之強度,即使透過製備製程最佳化來實施析出物的控制。其原因在於,銅合金偏離了根據本發明之銅合金的最佳成分組成,且因此難以形成微細的(FeMn)2P析出物。 On the other hand, the copper alloys of Comparative Examples 1 to 16 do not satisfy the strength corresponding to one of the characteristics required in the industry, even if the precipitation control is implemented by optimizing the preparation process. The reason for this is that the copper alloy deviates from the optimal composition of the copper alloy according to the present invention, and therefore it is difficult to form fine (FeMn) 2 P precipitates.

在上述比較例中,比較例8至13是用來確認僅僅將Mn添加至傳統合金C19210是否為有效的比較例。從比較例8至13的結果可確認,僅藉由Mn之簡單添加,任何組成都無法滿足所需特性。其原因在於,Mn之簡單添加無法形成(FeMn)2P析出物,而且Mn是溶解在Cu基質中,因而降低了導電性;而此問題是 因欠缺形成(FeMn)2P析出物所需之P含量所致。特別地,可確認添加物元素的簡單固溶強化某程度提升了強度,但大幅降低了導電性。 Among the above-mentioned comparative examples, comparative examples 8 to 13 are comparative examples for confirming whether merely adding Mn to the conventional alloy C19210 is effective. From the results of Comparative Examples 8 to 13, it can be confirmed that with simple addition of Mn, any composition cannot satisfy the required characteristics. The reason is that (FeMn) 2 P precipitates cannot be formed by simple addition of Mn, and Mn is dissolved in the Cu matrix, thus reducing the conductivity; and this problem is due to the lack of formation of (FeMn) 2 P precipitates Due to P content. In particular, it can be confirmed that the simple solid solution strengthening of the additive element increases the strength to some extent, but the electrical conductivity is greatly reduced.

總結上述特性分析結果,可確認即使結合與具有根據本發明之銅合金特性的實例1至16相同的製備方法和分析方法,傳統銅合金C19210的組成仍無法呈現提升的合金特性。 Summarizing the above characteristic analysis results, it can be confirmed that the composition of the conventional copper alloy C19210 still cannot exhibit improved alloy characteristics even when combined with the same preparation methods and analysis methods as Examples 1 to 16 having the characteristics of the copper alloy according to the present invention.

為了根據熱軋溫度條件來評估銅合金的特性,分別在不同的熱軋溫度條件下製備具有實例1所示組成之銅合金樣品,然後評價銅合金樣品的物理性質。 In order to evaluate the characteristics of the copper alloy according to the hot rolling temperature conditions, copper alloy samples having the composition shown in Example 1 were prepared under different hot rolling temperature conditions, and then the physical properties of the copper alloy samples were evaluated.

Figure 107131725-A0305-02-0022-5
Figure 107131725-A0305-02-0022-5

從表3可確認,當熱軋溫度低於900℃,則無法呈現根據本發明之銅合金的特性。第二A圖至第二C圖表示表3的結果。第二A圖顯示藉由在870℃的溫度下熱軋而製備的銅合金,其相對應於引線框之銅合金的一般熱軋條件;在熱軋之後觀察該銅合金發現仍保留有加工結構(軋製結構),其影響後續製程並且導致最終產物的特性下降。在第二B圖與第二C圖的銅合金中,熱軋溫度是900 ℃或更高,因此在熱軋之後形成了異向性再結晶結構,並且可呈現出根據本發明之銅合金的特性。 It can be confirmed from Table 3 that when the hot rolling temperature is lower than 900°C, the characteristics of the copper alloy according to the present invention cannot be exhibited. The second graphs A to C show the results of Table 3. The second figure A shows a copper alloy prepared by hot rolling at a temperature of 870°C, which corresponds to the general hot rolling conditions of the copper alloy of the lead frame; observation of the copper alloy after hot rolling reveals that the processing structure remains (Rolled structure), which affects the subsequent process and causes the characteristics of the final product to decrease. In the copper alloys in the second B and second C diagrams, the hot rolling temperature is 900 C or higher, so that an anisotropic recrystallized structure is formed after hot rolling, and can exhibit the characteristics of the copper alloy according to the present invention.

為了確認根據本發明之銅合金的平均結晶粒大小和微結構,第三圖示出根據實例5之組成所製備的銅合金樣品的FE-SEM照片。如第三圖之例示,實例5的樣品的平均結晶粒大小為20μm或更小,且其標準偏差為5μm或更小。從這些結果可確認,根據本發明之銅合金具有良好的微結構,並且因此可用於電氣與電子部件及半導體中,其並無任何問題(例如表面缺陷)。 In order to confirm the average crystal grain size and microstructure of the copper alloy according to the present invention, the third figure shows the FE-SEM photograph of the copper alloy sample prepared according to the composition of Example 5. As exemplified in the third graph, the average crystal grain size of the sample of Example 5 was 20 μm or less, and its standard deviation was 5 μm or less. From these results, it can be confirmed that the copper alloy according to the present invention has a good microstructure, and thus can be used in electrical and electronic components and semiconductors without any problems (such as surface defects).

利用FE-TEM之實例5的銅合金樣品分析結果係如第四A圖和第四B圖所示。 The analysis results of the copper alloy sample of Example 5 using FE-TEM are shown in the fourth graph A and the fourth graph B.

第四A圖藉由一般所使用之離子研磨法加以製備的樣品的FE-TEM照片,用以確認具有實例5之組成的銅合金中的析出物,而且在此EE-TEM照片中,難以確認銅合金中析出物的存在、以及析出物是否分佈於銅合金中,因此要精確分析是有困難的。為了解決這些問題,必須採用一種新的分析方法。 Fig. 4A is an FE-TEM photograph of a sample prepared by generally used ion milling method to confirm the precipitates in the copper alloy having the composition of Example 5, and in this EE-TEM photograph, it is difficult to confirm The presence of precipitates in the copper alloy and whether the precipitates are distributed in the copper alloy makes it difficult to analyze accurately. In order to solve these problems, a new analysis method must be adopted.

為了要克服傳統離子研磨法的限制,第四B圖為藉由碳萃取重複法所製備的樣品的FE-TEM照片,用以確認具有實例5之組成的銅合金中的析出物。若觀察藉由碳萃取重複法所製備的樣品,即可精確進行包括微細析出物的形狀、大小、組成、面積密度等之分析。從第四A圖僅可確認存在析出物,但從第四B圖則可確認(FeMn)2P(在傳統Cu-Fe-P基中觀察不到)是均勻地形成,而且其平均粒子大小為50nm或更小、面積密度為1.0*1010/cm2或更高。 In order to overcome the limitations of the traditional ion milling method, Figure 4B is a FE-TEM photograph of the sample prepared by the carbon extraction repeat method to confirm the precipitates in the copper alloy having the composition of Example 5. If you observe the sample prepared by the carbon extraction repeat method, you can accurately analyze the shape, size, composition, area density, etc. of fine precipitates. Only the presence of precipitates can be confirmed from the fourth picture A, but from the fourth picture B it can be confirmed that (FeMn) 2 P (not observed in the traditional Cu-Fe-P group) is uniformly formed and its average particle size It is 50 nm or less, and the area density is 1.0*10 10 /cm 2 or more.

Claims (8)

一種用於電氣與電子部件和半導體的銅合金,包括:質量比為0.09至0.20%的鐵(Fe)、質量比為0.05至0.09%的磷(P)、質量比為0.05至0.20%的錳(Mn)、剩餘含量的銅(Cu)以及質量比為0.05%或更低的不可避免之雜質,該不可避免之雜質包括從由矽(Si)、鋅(Zn)、鈣(Ca)、鋁(Al)、鈦(Ti)、鈹(Be)、鉻(Cr)、鈷(Co)、銀(Ag)與鋯(Zr)所組成之群組中選出的至少其一;以及(FeMn)2P析出物,其中:所述(FeMn)2P析出物係藉由使用一高解析度穿透式電子顯微鏡(HR-TEM)或一場發射穿透式電子顯微鏡(FE-TEM)以100,000x以上的放大倍率觀察由碳提取複製方法所製備之一樣品來測量,且具有之平均粒子大小係介於27nm至50nm,面積密度為1.0*1010/cm2或更高;以及銅合金具有470MPa或更高的抗拉強度、145Hv或更高的硬度、75%IACS以上的導電性、以及400℃或更高的耐軟化溫度。 A copper alloy for electrical and electronic components and semiconductors, including: iron (Fe) in a mass ratio of 0.09 to 0.20%, phosphorus (P) in a mass ratio of 0.05 to 0.09%, and manganese in a mass ratio of 0.05 to 0.20% (Mn), the remaining content of copper (Cu) and the inevitable impurities with a mass ratio of 0.05% or less, the inevitable impurities include from silicon (Si), zinc (Zn), calcium (Ca), aluminum At least one selected from the group consisting of (Al), titanium (Ti), beryllium (Be), chromium (Cr), cobalt (Co), silver (Ag) and zirconium (Zr); and (FeMn) 2 P precipitates, wherein: the (FeMn) 2 P precipitates are obtained by using a high-resolution transmission electron microscope (HR-TEM) or a field emission transmission electron microscope (FE-TEM) at 100,000x or more The magnification observation is measured by a sample prepared by the carbon extraction and replication method, and has an average particle size ranging from 27 nm to 50 nm, and an area density of 1.0*10 10 /cm 2 or higher; and the copper alloy has 470 MPa or Higher tensile strength, hardness of 145Hv or higher, conductivity above 75% IACS, and softening temperature resistance of 400°C or higher. 如申請專利範圍第1項所述之用於電氣與電子部件和半導體的銅合金,其中所述雜質具有質量比為0.01%或更低之含量。 The copper alloy for electrical and electronic components and semiconductors as described in item 1 of the scope of the patent application, wherein the impurities have a content of 0.01% or less by mass. 如申請專利範圍第1項所述之用於電氣與電子部件和半導體的銅合金,進一步包括質量比為0.0001至0.03%的鎳(Ni)或錫(Sn)至少其一。 The copper alloy for electrical and electronic components and semiconductors as described in item 1 of the scope of the patent application further includes at least one of nickel (Ni) or tin (Sn) with a mass ratio of 0.0001 to 0.03%. 如申請專利範圍第1項所述之用於電氣與電子部件和半導體的銅合金,其中所述銅合金具有20μm或更小的平均晶粒大小、以及5μm或更小的晶粒大小標準偏差,其係藉由使用一場發射掃描式電子顯微鏡(FE-SEM)之結晶取向分析所測得。 A copper alloy for electrical and electronic components and semiconductors as described in item 1 of the patent application scope, wherein the copper alloy has an average grain size of 20 μm or less and a standard deviation of grain size of 5 μm or less, It was measured by crystal orientation analysis using a field emission scanning electron microscope (FE-SEM). 如申請專利範圍第1項所述之用於電氣與電子部件和半導體的銅合金,其中所述銅合金是製備為一片材或一板材。 The copper alloy for electrical and electronic components and semiconductors as described in item 1 of the patent application scope, wherein the copper alloy is prepared as a sheet or a plate. 一種用於製備用於電氣與電子部件和半導體的銅合金之方法,包括;熔化如下所述之成分元素,以鑄造一鑄錠:質量比為0.09至0.20%的鐵(Fe)、質量比為0.05至0.09%的磷(P)、質量比為0.05至0.20%的錳(Mn)、剩餘含量的銅(Cu)以及質量比為0.05%或更低的不可避免之雜質,該不可避免之雜質包括從由矽(Si)、鋅(Zn)、鈣(Ca)、鋁(Al)、鈦(Ti)、鈹(Be)、鉻(Cr)、鈷(Co)、銀(Ag)與鋯(Zr)所組成之群組中選出的至少且一;在900至1000℃之溫度下均質化熱處理所獲得的鑄錠達1至4小時,然後以85至95%的加工率進行熱軋;以87至98%的加工率對先前步驟中所得的產物進行冷軋;以430至520℃之溫度對先前步驟中所得的產物進行析出熱處理達1至10小時;以及以10至90%的減縮率軋製先前步驟中所得的產物,以產生一最終產物,所製備而得的銅合金包括(FeMn)2P析出物,所述(FeMn)2P析出物係藉由使用一高解析度穿透式電子顯微鏡(HR-TEM)或一場發射穿透式電子顯微鏡(FE-TEM)以100,000x以上的放大倍率觀察由碳提取複製方法所製備之一樣品來測量,且具有之平均粒子大小係介於27nm至50nm,面積密度為1.0*1010/cm2或更高;以及 銅合金具有470MPa或更高的抗拉強度、145Hv或更高的硬度、75%IACS以上的導電性、以及400℃或更高的耐軟化溫度。 A method for preparing a copper alloy for electrical and electronic components and semiconductors, comprising: melting the constituent elements described below to cast an ingot: iron (Fe) with a mass ratio of 0.09 to 0.20% and a mass ratio of 0.05 to 0.09% phosphorus (P), 0.05 to 0.20% mass ratio of manganese (Mn), residual content of copper (Cu), and 0.05% or lower mass ratio of inevitable impurities, the inevitable impurities Including from silicon (Si), zinc (Zn), calcium (Ca), aluminum (Al), titanium (Ti), beryllium (Be), chromium (Cr), cobalt (Co), silver (Ag) and zirconium ( Zr) at least one selected from the group consisting of: ingots obtained by homogenizing heat treatment at a temperature of 900 to 1000°C for 1 to 4 hours, and then hot rolled at a processing rate of 85 to 95%; 87 to 98% processing rate cold rolling the product obtained in the previous step; precipitation heat treatment of the product obtained in the previous step at a temperature of 430 to 520°C for 1 to 10 hours; and a reduction rate of 10 to 90% rolling the product obtained in the previous step, to produce a final product, obtained by preparing a copper alloy that comprises (FeMn) 2 P precipitates, the (FeMn) 2 P-based precipitates penetration by use of a high-resolution Electron microscope (HR-TEM) or field emission transmission electron microscope (FE-TEM) at a magnification of 100,000x or more to observe a sample prepared by the carbon extraction and replication method to measure, and the average particle size is At 27nm to 50nm, the area density is 1.0*10 10 /cm 2 or higher; and the copper alloy has a tensile strength of 470MPa or higher, hardness of 145Hv or higher, conductivity of 75% IACS or higher, and 400℃ Or higher softening resistance temperature. 一種用於製備用於電氣與電子部件和半導體的銅合金之方法,包括:熔化如下所述之成分元素,以鑄造一鑄錠質量比為0.09至0.20%的鐵(Fe)、質量比為0.05至0.09%的磷(P)、質量比為0.05至0.20%的錳(Mn)、剩餘含量的銅(Cu)以及質量比為0.01%或更低的不可避免之雜質,該不可避免之雜質包括從由矽(Si)、鋅(Zn)、鈣(Ca)、鋁(Al)、鈦(Ti)、鈹(Be)、鉻(Cr)、鈷(Co)、銀(Ag)與鋯(Zr)所組成之群組中選出的至少且一:在900至1000℃之溫度下均質化熱處理所獲得的鑄錠達1至4小時,然後以85至95%的加工率進行熱軋;以87至98%的加工率對先前步驟中所得的產物進行冷軋;以430至520℃之溫度對先前步驟中所得的產物進行析出熱處理達1至10小時;以及以10至90%的減縮率軋製先前步驟中所得的產物,以產生一最終產物,所製備而得的銅合金包括(FeMn)2P析出物,所述(FeMn)2P析出物係藉由使用一高解析度穿透式電子顯微鏡(HR-TEM)或一場發射穿透式電子顯微鏡(FE-TEM)以100,000x以上的放大倍率觀察由碳提取複製方法所製備之一樣品來測量,且具有之平均粒子大小係介於27nm至50nm,面積密度為1.0*1010/cm2或更高;以及 銅合金具有470MPa或更高的抗拉強度、145Hv或更高的硬度、75%IACS以上的導電性、以及400℃或更高的耐軟化溫度。 A method for preparing a copper alloy for electrical and electronic components and semiconductors, comprising: melting the constituent elements described below, casting an ingot with a mass ratio of 0.09 to 0.20% iron (Fe), and a mass ratio of 0.05 Phosphorus (P) to 0.09%, manganese (Mn) with a mass ratio of 0.05 to 0.20%, copper (Cu) with a residual content, and inevitable impurities with a mass ratio of 0.01% or less. The inevitable impurities include From silicon (Si), zinc (Zn), calcium (Ca), aluminum (Al), titanium (Ti), beryllium (Be), chromium (Cr), cobalt (Co), silver (Ag) and zirconium (Zr) ) At least one selected from the group consisting of: homogenizing the ingot obtained by heat treatment at a temperature of 900 to 1000°C for 1 to 4 hours, and then hot rolling at a processing rate of 85 to 95%; 87 Cold rolling of the product obtained in the previous step to a processing rate of up to 98%; precipitation heat treatment of the product obtained in the previous step at a temperature of 430 to 520°C for 1 to 10 hours; and rolling at a reduction rate of 10 to 90% manufactured product obtained in the previous step, to produce a final product, obtained by preparing a copper alloy that comprises (FeMn) 2 P precipitates, the (FeMn) 2 P-based precipitates by using a high-resolution transmissive Electron microscopy (HR-TEM) or field emission transmission electron microscopy (FE-TEM) was observed at a magnification of 100,000x or more to observe a sample prepared by the carbon extraction and replication method, and the average particle size is between 27nm to 50nm, area density is 1.0*10 10 /cm 2 or higher; and the copper alloy has a tensile strength of 470MPa or higher, hardness of 145Hv or higher, conductivity above 75% IACS, and 400℃ or Higher resistance to softening temperature. 一種用於製備用於電氣與電子部件和半導體的銅合金之方法,包括:熔化如下所述之成分元素,以鑄造一鑄錠質量比為0.09至0.20%的鐵(Fe)、質量比為0.05至0.09%的磷(P)、質量比為0.05至0.20%的錳(Mn)、質量比為0.0001至0.03%的鎳(Ni)或錫(Sn)至少其一、剩餘含量的銅(Cu)以及質量比為0.05%或更低的不可避免之雜質,該不可避免之雜質包括從由矽(Si)、鋅(Zn)、鈣(Ca)、鋁(Al)、鈦(Ti)、鈹(Be)、鉻(Cr)、鈷(Co)、銀(Ag)與鋯(Zr)所組成之群組中選出的至少其一;在900至1000℃之溫度下均質化熱處理所獲得的鑄錠達1至4小時,然後以85至95%的加工率進行熱軋;以87至98%的加工率對先前步驟中所得的產物進行冷軋;以430至520℃之溫度對先前步驟中所得的產物進行析出熱處理達1至10小時;以及以10至90%的減縮率軋製先前步驟中所得的產物,以產生一最終產物,所製備而得的銅合金包括(FeMn)2P析出物,所述(FeMn)2P析出物係藉由使用一高解析度穿透式電子顯微鏡(HR-TEM)或一場發射穿透式電子顯微鏡(FE-TEM)以100,000x以上的放大倍率觀察由碳提取複製方法所製備之一樣品來測量,且具有之平均粒子大小係介於27nm至50nm,面積密度為1.0*1010/cm2或更高;以及 銅合金具有470MPa或更高的抗拉強度、145Hv或更高的硬度、75%IACS以上的導電性、以及400℃或更高的耐軟化溫度。 A method for preparing a copper alloy for electrical and electronic components and semiconductors, comprising: melting the constituent elements described below, casting an ingot with a mass ratio of 0.09 to 0.20% iron (Fe), and a mass ratio of 0.05 At least one of phosphorus (P) to 0.09%, manganese (Mn) at a mass ratio of 0.05 to 0.20%, nickel (Ni) or tin (Sn) at a mass ratio of 0.0001 to 0.03%, and the remaining content of copper (Cu) And inevitable impurities with a mass ratio of 0.05% or less, the inevitable impurities include from silicon (Si), zinc (Zn), calcium (Ca), aluminum (Al), titanium (Ti), beryllium ( At least one selected from the group consisting of Be), chromium (Cr), cobalt (Co), silver (Ag), and zirconium (Zr); ingots obtained by homogenizing heat treatment at a temperature of 900 to 1000°C Up to 1 to 4 hours, then hot rolling at a processing rate of 85 to 95%; cold rolling the product obtained at the previous step at a processing rate of 87 to 98%; at a temperature of 430 to 520°C Products are subjected to precipitation heat treatment for 1 to 10 hours; and rolling the products obtained in the previous step at a reduction rate of 10 to 90% to produce a final product, the prepared copper alloy includes (FeMn) 2 P precipitates The (FeMn) 2 P precipitate is observed by using a high-resolution transmission electron microscope (HR-TEM) or a field emission transmission electron microscope (FE-TEM) at a magnification of 100,000x or more It is measured by a sample prepared by the carbon extraction and replication method, and has an average particle size ranging from 27 nm to 50 nm, and an area density of 1.0*10 10 /cm 2 or higher; and the copper alloy has a tensile strength of 470 MPa or higher Strength, hardness of 145Hv or higher, conductivity above 75% IACS, and softening resistance temperature of 400°C or higher.
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