TWI662607B - 半導體裝置之製造方法及半導體裝置之製造系統 - Google Patents
半導體裝置之製造方法及半導體裝置之製造系統 Download PDFInfo
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- TWI662607B TWI662607B TW106108647A TW106108647A TWI662607B TW I662607 B TWI662607 B TW I662607B TW 106108647 A TW106108647 A TW 106108647A TW 106108647 A TW106108647 A TW 106108647A TW I662607 B TWI662607 B TW I662607B
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- Prior art keywords
- layer
- etching
- substrate
- film
- semiconductor device
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 24
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 22
- 238000005530 etching Methods 0.000 claims abstract description 52
- 238000012545 processing Methods 0.000 claims abstract description 50
- 239000000758 substrate Substances 0.000 claims abstract description 37
- 238000000034 method Methods 0.000 claims abstract description 31
- 238000012546 transfer Methods 0.000 claims description 25
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 claims description 8
- 230000007246 mechanism Effects 0.000 claims description 8
- 229910052581 Si3N4 Inorganic materials 0.000 claims description 6
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical group N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 claims description 6
- 229910000147 aluminium phosphate Inorganic materials 0.000 claims description 4
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical group O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 2
- 229910052814 silicon oxide Inorganic materials 0.000 claims description 2
- 239000011800 void material Substances 0.000 claims description 2
- 239000010408 film Substances 0.000 description 142
- 239000007789 gas Substances 0.000 description 75
- 235000012431 wafers Nutrition 0.000 description 62
- 230000015572 biosynthetic process Effects 0.000 description 23
- 229910004298 SiO 2 Inorganic materials 0.000 description 22
- 239000007788 liquid Substances 0.000 description 16
- 230000004888 barrier function Effects 0.000 description 15
- MROCJMGDEKINLD-UHFFFAOYSA-N dichlorosilane Chemical compound Cl[SiH2]Cl MROCJMGDEKINLD-UHFFFAOYSA-N 0.000 description 14
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 8
- 230000008569 process Effects 0.000 description 8
- 238000000926 separation method Methods 0.000 description 8
- 238000000231 atomic layer deposition Methods 0.000 description 6
- 239000002052 molecular layer Substances 0.000 description 6
- 238000005121 nitriding Methods 0.000 description 6
- 239000002994 raw material Substances 0.000 description 6
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 5
- 229910052710 silicon Inorganic materials 0.000 description 5
- 239000010703 silicon Substances 0.000 description 5
- 229910021529 ammonia Inorganic materials 0.000 description 4
- 238000001312 dry etching Methods 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- 238000005229 chemical vapour deposition Methods 0.000 description 2
- 238000011534 incubation Methods 0.000 description 2
- 238000010169 landfilling Methods 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 238000005498 polishing Methods 0.000 description 2
- 239000012495 reaction gas Substances 0.000 description 2
- 238000001039 wet etching Methods 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 239000007795 chemical reaction product Substances 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 229910001873 dinitrogen Inorganic materials 0.000 description 1
- NBVXSUQYWXRMNV-UHFFFAOYSA-N fluoromethane Chemical compound FC NBVXSUQYWXRMNV-UHFFFAOYSA-N 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
Classifications
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- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
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- H01L21/0226—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
- H01L21/02263—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase
- H01L21/02271—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase deposition by decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition
- H01L21/0228—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase deposition by decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition deposition by cyclic CVD, e.g. ALD, ALE, pulsed CVD
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- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
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- H01L21/02211—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition the precursor containing a compound comprising Si the compound being a silane, e.g. disilane, methylsilane or chlorosilane
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- H01L21/02107—Forming insulating materials on a substrate
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- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
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- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68771—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by supporting more than one semiconductor substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76801—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing
- H01L21/7682—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing the dielectric comprising air gaps
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76801—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing
- H01L21/76829—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing characterised by the formation of thin functional dielectric layers, e.g. dielectric etch-stop, barrier, capping or liner layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76801—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing
- H01L21/76837—Filling up the space between adjacent conductive structures; Gap-filling properties of dielectrics
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| JP2016-057341 | 2016-03-22 | ||
| JP2016057341A JP6583081B2 (ja) | 2016-03-22 | 2016-03-22 | 半導体装置の製造方法 |
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| TW201738947A TW201738947A (zh) | 2017-11-01 |
| TWI662607B true TWI662607B (zh) | 2019-06-11 |
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| KR (1) | KR102103625B1 (enExample) |
| TW (1) | TWI662607B (enExample) |
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| US10840205B2 (en) | 2017-09-24 | 2020-11-17 | Invensas Bonding Technologies, Inc. | Chemical mechanical polishing for hybrid bonding |
| US11056348B2 (en) | 2018-04-05 | 2021-07-06 | Invensas Bonding Technologies, Inc. | Bonding surfaces for microelectronics |
| JP7040257B2 (ja) * | 2018-04-25 | 2022-03-23 | 東京エレクトロン株式会社 | 成膜装置、及び成膜方法 |
| JP7004608B2 (ja) * | 2018-05-11 | 2022-01-21 | 東京エレクトロン株式会社 | 半導体膜の形成方法及び成膜装置 |
| US10741442B2 (en) | 2018-05-31 | 2020-08-11 | Taiwan Semiconductor Manufacturing Company, Ltd. | Barrier layer formation for conductive feature |
| US11011494B2 (en) | 2018-08-31 | 2021-05-18 | Invensas Bonding Technologies, Inc. | Layer structures for making direct metal-to-metal bonds at low temperatures in microelectronics |
| US10872788B2 (en) * | 2018-11-26 | 2020-12-22 | Taiwan Semiconductor Manufacturing Co., Ltd. | Wet etch apparatus and method for using the same |
| CN110459464B (zh) * | 2019-08-14 | 2021-09-14 | 中国科学院微电子研究所 | 一种厚膜氮化硅的区域挖槽制备方法 |
| US11264357B1 (en) | 2020-10-20 | 2022-03-01 | Invensas Corporation | Mixed exposure for large die |
| WO2023132268A1 (ja) | 2022-01-06 | 2023-07-13 | 東京エレクトロン株式会社 | 判定方法及び基板処理装置 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI246208B (en) * | 2003-12-22 | 2005-12-21 | Showa Denko Kk | Group III nitride semiconductor device and light-emitting device using the same |
| US20130069033A1 (en) * | 2011-09-15 | 2013-03-21 | Kabushiki Kaisha Toshiba | Semiconductor device, wafer, method for manufacturing semiconductor device, and method for manufacturing wafer |
| US8742476B1 (en) * | 2012-11-27 | 2014-06-03 | Monolithic 3D Inc. | Semiconductor device and structure |
| US9000557B2 (en) * | 2012-03-17 | 2015-04-07 | Zvi Or-Bach | Semiconductor device and structure |
Family Cites Families (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5654049A (en) * | 1979-10-09 | 1981-05-13 | Mitsubishi Electric Corp | Semiconductor device |
| JP2812599B2 (ja) * | 1992-02-06 | 1998-10-22 | シャープ株式会社 | 半導体装置の製造方法 |
| JPH07297182A (ja) * | 1994-04-27 | 1995-11-10 | Sony Corp | SiN系絶縁膜の形成方法 |
| JP3660391B2 (ja) * | 1994-05-27 | 2005-06-15 | 株式会社東芝 | 半導体装置の製造方法 |
| US20010028922A1 (en) * | 1995-06-07 | 2001-10-11 | Sandhu Gurtej S. | High throughput ILD fill process for high aspect ratio gap fill |
| JP3402972B2 (ja) | 1996-11-14 | 2003-05-06 | 東京エレクトロン株式会社 | 半導体装置の製造方法 |
| US7115516B2 (en) * | 2001-10-09 | 2006-10-03 | Applied Materials, Inc. | Method of depositing a material layer |
| JP2003243537A (ja) * | 2002-02-18 | 2003-08-29 | Mitsubishi Electric Corp | 半導体装置およびその製造方法 |
| JP3759525B2 (ja) * | 2003-10-27 | 2006-03-29 | 松下電器産業株式会社 | 半導体装置の製造方法 |
| US7482247B1 (en) * | 2004-12-30 | 2009-01-27 | Novellus Systems, Inc. | Conformal nanolaminate dielectric deposition and etch bag gap fill process |
| KR100711928B1 (ko) * | 2005-12-29 | 2007-04-27 | 동부일렉트로닉스 주식회사 | 반도체 장치의 금속 배선 및 그 형성 방법 |
| JP5550843B2 (ja) * | 2009-03-19 | 2014-07-16 | ラピスセミコンダクタ株式会社 | 半導体装置の製造方法 |
| JP5490753B2 (ja) * | 2010-07-29 | 2014-05-14 | 東京エレクトロン株式会社 | トレンチの埋め込み方法および成膜システム |
| JP5544343B2 (ja) * | 2010-10-29 | 2014-07-09 | 東京エレクトロン株式会社 | 成膜装置 |
| JP5599350B2 (ja) * | 2011-03-29 | 2014-10-01 | 東京エレクトロン株式会社 | 成膜装置及び成膜方法 |
| JP5829926B2 (ja) * | 2011-07-06 | 2015-12-09 | 東京エレクトロン株式会社 | タングステン膜の成膜方法 |
| JP6468955B2 (ja) * | 2015-06-23 | 2019-02-13 | 東京エレクトロン株式会社 | シリコン含有膜の成膜方法及び成膜装置 |
-
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- 2016-03-22 JP JP2016057341A patent/JP6583081B2/ja active Active
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2017
- 2017-03-16 TW TW106108647A patent/TWI662607B/zh active
- 2017-03-16 KR KR1020170033034A patent/KR102103625B1/ko active Active
- 2017-03-21 US US15/465,144 patent/US10297443B2/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI246208B (en) * | 2003-12-22 | 2005-12-21 | Showa Denko Kk | Group III nitride semiconductor device and light-emitting device using the same |
| US20100267221A1 (en) * | 2003-12-22 | 2010-10-21 | Showa Denko K.K. | Group iii nitride semiconductor device and light-emitting device using the same |
| US20130069033A1 (en) * | 2011-09-15 | 2013-03-21 | Kabushiki Kaisha Toshiba | Semiconductor device, wafer, method for manufacturing semiconductor device, and method for manufacturing wafer |
| US8937325B2 (en) * | 2011-09-15 | 2015-01-20 | Kabushiki Kaisha Toshiba | Semiconductor device, wafer, method for manufacturing semiconductor device, and method for manufacturing wafer |
| US9000557B2 (en) * | 2012-03-17 | 2015-04-07 | Zvi Or-Bach | Semiconductor device and structure |
| US8742476B1 (en) * | 2012-11-27 | 2014-06-03 | Monolithic 3D Inc. | Semiconductor device and structure |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20170110020A (ko) | 2017-10-10 |
| US10297443B2 (en) | 2019-05-21 |
| JP2017174902A (ja) | 2017-09-28 |
| JP6583081B2 (ja) | 2019-10-02 |
| KR102103625B1 (ko) | 2020-04-22 |
| US20170278698A1 (en) | 2017-09-28 |
| TW201738947A (zh) | 2017-11-01 |
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