TWI662607B - 半導體裝置之製造方法及半導體裝置之製造系統 - Google Patents

半導體裝置之製造方法及半導體裝置之製造系統 Download PDF

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TWI662607B
TWI662607B TW106108647A TW106108647A TWI662607B TW I662607 B TWI662607 B TW I662607B TW 106108647 A TW106108647 A TW 106108647A TW 106108647 A TW106108647 A TW 106108647A TW I662607 B TWI662607 B TW I662607B
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layer
etching
substrate
film
semiconductor device
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TW106108647A
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Chinese (zh)
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TW201738947A (zh
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池川寬晃
小川淳
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日商東京威力科創股份有限公司
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    • H01L21/02271Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase deposition by decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition
    • H01L21/0228Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase deposition by decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition deposition by cyclic CVD, e.g. ALD, ALE, pulsed CVD
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Families Citing this family (10)

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Publication number Priority date Publication date Assignee Title
US10840205B2 (en) 2017-09-24 2020-11-17 Invensas Bonding Technologies, Inc. Chemical mechanical polishing for hybrid bonding
US11056348B2 (en) 2018-04-05 2021-07-06 Invensas Bonding Technologies, Inc. Bonding surfaces for microelectronics
JP7040257B2 (ja) * 2018-04-25 2022-03-23 東京エレクトロン株式会社 成膜装置、及び成膜方法
JP7004608B2 (ja) * 2018-05-11 2022-01-21 東京エレクトロン株式会社 半導体膜の形成方法及び成膜装置
US10741442B2 (en) 2018-05-31 2020-08-11 Taiwan Semiconductor Manufacturing Company, Ltd. Barrier layer formation for conductive feature
US11011494B2 (en) 2018-08-31 2021-05-18 Invensas Bonding Technologies, Inc. Layer structures for making direct metal-to-metal bonds at low temperatures in microelectronics
US10872788B2 (en) * 2018-11-26 2020-12-22 Taiwan Semiconductor Manufacturing Co., Ltd. Wet etch apparatus and method for using the same
CN110459464B (zh) * 2019-08-14 2021-09-14 中国科学院微电子研究所 一种厚膜氮化硅的区域挖槽制备方法
US11264357B1 (en) 2020-10-20 2022-03-01 Invensas Corporation Mixed exposure for large die
WO2023132268A1 (ja) 2022-01-06 2023-07-13 東京エレクトロン株式会社 判定方法及び基板処理装置

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI246208B (en) * 2003-12-22 2005-12-21 Showa Denko Kk Group III nitride semiconductor device and light-emitting device using the same
US20130069033A1 (en) * 2011-09-15 2013-03-21 Kabushiki Kaisha Toshiba Semiconductor device, wafer, method for manufacturing semiconductor device, and method for manufacturing wafer
US8742476B1 (en) * 2012-11-27 2014-06-03 Monolithic 3D Inc. Semiconductor device and structure
US9000557B2 (en) * 2012-03-17 2015-04-07 Zvi Or-Bach Semiconductor device and structure

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5654049A (en) * 1979-10-09 1981-05-13 Mitsubishi Electric Corp Semiconductor device
JP2812599B2 (ja) * 1992-02-06 1998-10-22 シャープ株式会社 半導体装置の製造方法
JPH07297182A (ja) * 1994-04-27 1995-11-10 Sony Corp SiN系絶縁膜の形成方法
JP3660391B2 (ja) * 1994-05-27 2005-06-15 株式会社東芝 半導体装置の製造方法
US20010028922A1 (en) * 1995-06-07 2001-10-11 Sandhu Gurtej S. High throughput ILD fill process for high aspect ratio gap fill
JP3402972B2 (ja) 1996-11-14 2003-05-06 東京エレクトロン株式会社 半導体装置の製造方法
US7115516B2 (en) * 2001-10-09 2006-10-03 Applied Materials, Inc. Method of depositing a material layer
JP2003243537A (ja) * 2002-02-18 2003-08-29 Mitsubishi Electric Corp 半導体装置およびその製造方法
JP3759525B2 (ja) * 2003-10-27 2006-03-29 松下電器産業株式会社 半導体装置の製造方法
US7482247B1 (en) * 2004-12-30 2009-01-27 Novellus Systems, Inc. Conformal nanolaminate dielectric deposition and etch bag gap fill process
KR100711928B1 (ko) * 2005-12-29 2007-04-27 동부일렉트로닉스 주식회사 반도체 장치의 금속 배선 및 그 형성 방법
JP5550843B2 (ja) * 2009-03-19 2014-07-16 ラピスセミコンダクタ株式会社 半導体装置の製造方法
JP5490753B2 (ja) * 2010-07-29 2014-05-14 東京エレクトロン株式会社 トレンチの埋め込み方法および成膜システム
JP5544343B2 (ja) * 2010-10-29 2014-07-09 東京エレクトロン株式会社 成膜装置
JP5599350B2 (ja) * 2011-03-29 2014-10-01 東京エレクトロン株式会社 成膜装置及び成膜方法
JP5829926B2 (ja) * 2011-07-06 2015-12-09 東京エレクトロン株式会社 タングステン膜の成膜方法
JP6468955B2 (ja) * 2015-06-23 2019-02-13 東京エレクトロン株式会社 シリコン含有膜の成膜方法及び成膜装置

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI246208B (en) * 2003-12-22 2005-12-21 Showa Denko Kk Group III nitride semiconductor device and light-emitting device using the same
US20100267221A1 (en) * 2003-12-22 2010-10-21 Showa Denko K.K. Group iii nitride semiconductor device and light-emitting device using the same
US20130069033A1 (en) * 2011-09-15 2013-03-21 Kabushiki Kaisha Toshiba Semiconductor device, wafer, method for manufacturing semiconductor device, and method for manufacturing wafer
US8937325B2 (en) * 2011-09-15 2015-01-20 Kabushiki Kaisha Toshiba Semiconductor device, wafer, method for manufacturing semiconductor device, and method for manufacturing wafer
US9000557B2 (en) * 2012-03-17 2015-04-07 Zvi Or-Bach Semiconductor device and structure
US8742476B1 (en) * 2012-11-27 2014-06-03 Monolithic 3D Inc. Semiconductor device and structure

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