TWI660460B - Flexible thin film transistor and preparation method thereof - Google Patents
Flexible thin film transistor and preparation method thereof Download PDFInfo
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- TWI660460B TWI660460B TW107119123A TW107119123A TWI660460B TW I660460 B TWI660460 B TW I660460B TW 107119123 A TW107119123 A TW 107119123A TW 107119123 A TW107119123 A TW 107119123A TW I660460 B TWI660460 B TW I660460B
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- 239000010409 thin film Substances 0.000 title claims abstract description 53
- 238000002360 preparation method Methods 0.000 title abstract description 4
- 239000000758 substrate Substances 0.000 claims abstract description 34
- 239000003990 capacitor Substances 0.000 claims description 30
- 239000000463 material Substances 0.000 claims description 22
- 238000000034 method Methods 0.000 claims description 17
- 239000004642 Polyimide Substances 0.000 claims description 15
- 229920001721 polyimide Polymers 0.000 claims description 15
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- 229910010272 inorganic material Inorganic materials 0.000 claims description 9
- 239000011147 inorganic material Substances 0.000 claims description 9
- 239000010410 layer Substances 0.000 abstract description 254
- 239000011229 interlayer Substances 0.000 abstract description 34
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 13
- 229910052751 metal Inorganic materials 0.000 description 13
- 239000002184 metal Substances 0.000 description 13
- 229910052814 silicon oxide Inorganic materials 0.000 description 13
- 229910052581 Si3N4 Inorganic materials 0.000 description 12
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 12
- 238000009413 insulation Methods 0.000 description 10
- 238000004519 manufacturing process Methods 0.000 description 8
- 238000010586 diagram Methods 0.000 description 7
- 238000005229 chemical vapour deposition Methods 0.000 description 6
- 239000010408 film Substances 0.000 description 6
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- 229910052782 aluminium Inorganic materials 0.000 description 3
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- H01L29/66409—Unipolar field-effect transistors
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Abstract
本發明公開了一種柔性薄膜電晶體及其製備方法。該柔性薄膜電晶體包括:基板;有源層,形成在基板上方;柵極,形成在有源層上方;以及有機絕緣層,形成在柵極上方。本發明減小了層間介電層的應力,降低了層間介電層的整體厚度,進而提升柔性顯示幕的可彎折程度。
Description
本發明屬於顯示技術領域,尤其是關於一種柔性薄膜電晶體(Thin Film Transistor,TFT)及其製備方法。
隨著柔性顯示技術的發展,顯示幕已經可以製作成可彎曲、可折疊、可捲起的形式。可變型、可彎折的柔性顯示幕能夠給用戶帶來顛覆性的使用體驗。但目前的柔性顯示技術還不夠成熟,可彎折仍是技術難點。這是因為柔性顯示幕的圖元區的無機絕緣層較多,且無機絕緣層的厚度較厚,使得在柔性顯示幕發生形變時會產生較大應力,直接影響了柔性顯示幕的可彎折程度,進而造成顯示不良。
圖1是現有技術的薄膜電晶體的結構示意圖。如圖1所示,該薄膜電晶體包括:基板100、形成在基板100上的緩衝層101、形成在緩衝層101上的有源層102、形成在緩衝層101上且與有源層102電連接的源極108和漏極109、形成在有源層102上的柵極絕緣層103、形成在柵極絕緣層103上的柵極104、形成在柵極104上的電容絕緣層105、以及依次形成在電容絕緣層105上的第一層間介電層106和第二層間介電層107。柵極絕緣層103和電容絕緣層105的厚度分別為120nm,第一層間介電層106和第二層間介電層107的整體厚度約為500nm。
由於現有技術中第一層間介電層106和第二層間介電層107主要用於層間絕緣,且二者的整體厚度比其他絕緣層的厚度更厚,因此,在一定程度上影響了薄膜電晶體的可彎折程度。另外,柵極絕緣層103、電容絕緣層105、第一層間介電層106和第二層間介電層107均為無機絕緣層,其材料為彈性和柔韌性相對差的無機材料,因此,在一定程度上也影響了薄膜電晶體的可彎折程度。
有鑑於此,本發明實施例提供了一種柔性薄膜電晶體及其製備方法,用於提升柔性顯示幕的可彎折程度。
本發明的一個方面提供一種柔性薄膜電晶體,包括:基板;有源層,形成在基板上方;柵極,形成在有源層上方;以及有機絕緣層,形成在柵極上方。
在本發明的一個實施例中,該柔性薄膜電晶體還包括:無機絕緣層,形成在有機絕緣層上。
在本發明的一個實施例中,有機絕緣層的材料為有機膠或聚醯亞胺。
在本發明的一個實施例中,有機絕緣層還摻雜有無機材料。
在本發明的一個實施例中,無機絕緣層的厚度在45nm至55nm範圍內。
在本發明的一個實施例中,無機絕緣層的厚度為50nm。
在本發明的一個實施例中,有機絕緣層的厚度在300nm至
450nm範圍內。
在本發明的一個實施例中,有機絕緣層的厚度為350nm。
在本發明的一個實施例中,該柔性薄膜電晶體還包括:緩衝層,形成在基板與有源層之間;柵極絕緣層,形成在有源層與柵極之間;以及電容絕緣層,形成在柵極與有機絕緣層之間。
本發明的另一個方面提供一種柔性薄膜電晶體的製備方法,包括:在基板上方形成有源層;在有源層上方形成柵極;以及在柵極上方形成有機絕緣層。
在本發明的一個實施例中,該柔性薄膜電晶體的製備方法還包括:在有機絕緣層上形成無機絕緣層。
在本發明的一個實施例中,前述在該有機絕緣層上形成無機絕緣層,包括:通過化學氣相沉積或成膜,在有機絕緣層上沉積一層薄薄的無機絕緣層,並對無機絕緣層進行曝光、顯影、刻蝕,再通過物理氣相沉積,將金屬沉積到有機絕緣層上。
在本發明的一個實施例中,在基板上方形成有源層,包括:在基板上方形成至少一層緩衝層,並在至少一層緩衝層上設置該有源層。
在本發明的一個實施例中,前述在該柵極上方形成有機絕緣層,包括:在柵極上形成電容絕緣層;在電容絕緣層上形成電容金屬;以及在電容金屬上形成有機絕緣層。
根據本發明實施例提供的技術方案,通過採用有機絕緣層替代現有技術的層間介電層,減小了層間介電層的應力,降低了層間介電層的整體厚度,進而提升了柔性顯示幕的可彎折程度。
應當理解的是,以上的一般描述和後文的細節描述僅是示例性和解釋性的,並不能限制本發明。
410~430‧‧‧步驟
510~580‧‧‧步驟
100‧‧‧基板
101‧‧‧緩衝層
102‧‧‧有源層
103‧‧‧柵極絕緣層
104‧‧‧柵極
105‧‧‧電容絕緣層
106‧‧‧第一層間介電層
107‧‧‧第二層間介電層
108‧‧‧源極
109‧‧‧漏極
200‧‧‧基板
201‧‧‧緩衝層
202‧‧‧有源層
203‧‧‧柵極絕緣層
204‧‧‧柵極
205‧‧‧電容絕緣層
206‧‧‧有機絕緣層
207‧‧‧源極
208‧‧‧漏極
300‧‧‧基板
301‧‧‧第一緩衝層
302‧‧‧第二緩衝層
303‧‧‧有源層
304‧‧‧柵極絕緣層
305‧‧‧柵極
306‧‧‧電容絕緣層
307‧‧‧有機絕緣層
308‧‧‧無機絕緣層
309‧‧‧源極
310‧‧‧漏極
此處的附圖被併入說明書中並構成本說明書的一部分,示出了符合本發明的實施例,並與說明書一起用於解釋本發明的原理。
圖1是現有技術的薄膜電晶體的結構示意圖;圖2是根據本發明一示例性實施例示出的一種柔性薄膜電晶體的結構示意圖;圖3是根據本發明另一個示例性實施例示出的一種柔性薄膜電晶體的結構示意圖;圖4是根據本發明一示例性實施例示出的一種柔性薄膜電晶體的製備方法的流程示意圖;圖5是根據本發明另一個示例性實施例示出的一種柔性薄膜電晶體的製備方法的流程示意圖。
下面將結合本發明實施例中的附圖,對本發明實施例中的技術方案進行清楚、完整地描述,顯然,所描述的實施例僅是本發明一部分實施例,而不是全部的實施例。基於本發明中的實施例,本領域普通技術人員在沒有做出進步性勞動前提下所獲得的所有其他實施例,都屬於本發
明保護的範圍。
圖2是根據本發明一示例性實施例示出的一種柔性薄膜電晶體的結構示意圖。如圖2所示,該柔性薄膜電晶體包括:基板200;有源層202,形成在基板200上方;柵極204,形成在有源層202上方;以及有機絕緣層206,形成在柵極204上方。
在本發明實施例中,基板200通常為透明的玻璃基板,也可以是其他透明基板,例如透明的塑膠基板,本發明對此不作限制。
有源層202的材料可以是多晶矽(p-Si),也可以是非晶矽(a-Si)。本實施例優先選用多晶矽,因為多晶矽的電子遷移速率較快、穩定性較高,可以減小薄膜電路的面積、提升顯示幕的解析度。有源層202的厚度通常在20nm至50nm範圍內,優選為45nm。
柵極204的材料可以是鉬(Mo)、鈦(Ti)、鋁(Al)、銅(Cu)、金(Au)、銀(Ag)中的一種或多種的組合。柵極204的厚度通常在200nm至300nm範圍內,優選為250nm。
有機絕緣層206的厚度可以在300nm至450nm範圍內,優選為350nm。
根據本發明實施例提供的技術方案,通過採用有機絕緣層替代現有技術的層間介電層,減小了層間介電層的應力,降低了層間介電層的整體厚度,進而提升了柔性顯示幕的可彎折程度。
在本發明的另一個實施例中,該柔性薄膜電晶體還包括:無機絕緣層(未示出),形成在有機絕緣層206上。
具體地,無機絕緣層的材料可以是氧化矽(SiOx)、氮化矽
(SiNx)中的一種或其組合。另外,無機絕緣層很薄,其厚度在45nm至55nm範圍內,優選為50nm。在本發明實施例中,考慮到有機絕緣層的絕緣性遠不及無機絕緣層的絕緣性,因此,通過在有機絕緣層206上佈置一層薄薄的無機絕緣層,能夠更有效地提高薄膜電晶體的絕緣性;此外,由於無機絕緣層的厚度僅為50nm,非常薄,因此,不會對薄膜電晶體的整體厚度造成太大影響。進一步地,本發明實施例的有機絕緣層206和無機絕緣層的整體厚度在345nm至505nm範圍內,優選為400nm,明顯薄於現有技術的第一層間介電層106和第二層間介電層107(如圖1所示)的整體厚度500nm,因此,節約了薄膜電晶體的製作成本。
在本發明的另一個實施例中,有機絕緣層206的材料為有機膠或聚醯亞胺。
具體地,有機絕緣層206的材料可以是具有高電阻率、高強度、高韌性、高絕緣性、耐磨耗、耐高溫、防腐蝕的有機膠或聚醯亞胺(Polyimide,PI)。由於有機膠或聚醯亞胺具有高電阻率、高韌性和高絕緣性,因此,減小了層間介電層的應力,進而提升了柔性顯示幕的可彎折程度。
在本發明的另一個實施例中,有機絕緣層206還摻雜有無機材料。
具體地,無機材料(例如氧化矽、氮化矽等)顆粒/小球可以摻雜在有機絕緣層206的有機膠或聚醯亞胺中,或者也可以佈置在有機膠或聚醯亞胺上,本發明對此不作限制。本發明實施例中,通過在有機絕緣層206中摻雜無機材料,能夠進一步提高有機絕緣層206的絕緣性,並因
此可以省略佈置在有機絕緣層206上的無機絕緣層,進而節約了薄膜電晶體的製作成本。
在本發明的另一個實施例中,該柔性薄膜電晶體還包括:緩衝層201,形成在基板200與有源層202之間;柵極絕緣層203,形成在有源層202與柵極204之間;以及電容絕緣層205,形成在柵極204與有機絕緣層206之間。
具體地,緩衝層201的材料可以是氧化矽、氮化矽中的一種或其組合。另外,緩衝層201的厚度通常在200nm至300nm範圍內,優選為250nm。需要說明的是,緩衝層201的層數可以根據實際需要設置,例如兩層、三層等,本發明對此不作限制。
柵極絕緣層203的材料可以是氧化矽、氮化矽中的一種或其組合,其厚度可以在100nm至150nm範圍內,優選為120nm。
電容絕緣層205可以形成在柵極204與有機絕緣層206之間,其厚度可以在100nm至150nm範圍內,優選為120nm。
進一步地,源極207和漏極208形成在緩衝層201上且分別與有源層202電連接。源極207和漏極208的材料可以是鉬(Mo)、鈦(Ti)、鋁(Al)、銅(Cu)、金(Au)、銀(Ag)中的一種或多種的組合。另外,柵極204的厚度通常在200nm至300nm範圍內,優選為250nm。
上述所有可選技術方案,可以採用任意結合形成本發明的可選實施例,在此不再一一贅述。
圖3是根據本發明另一個示例性實施例示出的一種柔性薄膜電晶體的結構示意圖。如圖3所示,該柔性薄膜電晶體包括:基板300;
第一緩衝層301,形成在基板300上;第二緩衝層302,形成在第一緩衝層301上;有源層303,形成在第二緩衝層302上;柵極絕緣層304,形成在有源層303上;柵極305,形成在柵極絕緣層304上;電容絕緣層306,形成在柵極305上;有機絕緣層307,形成在電容絕緣層306上;以及無機絕緣層308,形成有機絕緣層307上;進一步地,源極309和漏極310形成在第二緩衝層302上且分別與有源層303電連接。
需要說明的是,圖3所示的柔性薄膜電晶體的結構與圖2所示的柔性薄膜電晶體的結構基本相同,因此,下文將僅針對不同之處進行說明。
在本發明實施例中,基板300上可以依次形成第一緩衝層301和第二緩衝層302,並且第一緩衝層301和第二緩衝層302的材料可以是氧化矽、氮化矽中的一種或其組合。具體地,第一緩衝層301的材料為氮化矽,其厚度通常在45nm至55nm範圍內,優選為50nm。第二緩衝層302的材料為氧化矽,其厚度通常在200nm至300nm範圍內,優選為250nm。需要說明的是,第一緩衝層301和第二緩衝層302的材料也可以是有機膠或聚醯亞胺,或者摻雜有無機材料的有機膠或聚醯亞胺,也就是說,為了提高薄膜電晶體的可彎折程度,也可以將第一緩衝層301和第二緩衝層302中的任一層或二層製備成有機絕緣層。
柵極絕緣層304的材料可以是氧化矽、氮化矽中的一種或其組合。需要說明的是,柵極絕緣層304的材料也可以是有機膠或聚醯亞胺,或者摻雜有無機材料的有機膠或聚醯亞胺,也就是說,為了提高薄膜電晶體的可彎折程度,也可以將柵極絕緣層304製備成有機絕緣層。
電容絕緣層306的材料可以是氧化矽、氮化矽中的一種或其組合。需要說明的是,電容絕緣層306的材料也可以是有機膠或聚醯亞胺,或者摻雜有無機材料的有機膠或聚醯亞胺,也就是說,為了提高薄膜電晶體的可彎折程度,也可以將電容絕緣層306製備成有機絕緣層。
無機絕緣層308的材料可以是氧化矽、氮化矽中的一種或其組合。另外,無機絕緣層308很薄,其厚度在45nm至55nm範圍內,優選為50nm。在本發明實施例中,考慮到有機絕緣層的絕緣性遠不及無機絕緣層的絕緣性,因此,通過在有機絕緣層307上佈置一層薄薄的無機絕緣層308,能夠更有效地提高薄膜電晶體的絕緣性;此外,由於無機絕緣層308的厚度僅為50nm,非常薄,因此,不會對薄膜電晶體的整體厚度造成太大影響。進一步地,本發明實施例的有機絕緣層307和無機絕緣層308的整體厚度在345nm至505nm範圍內,優選為400nm,明顯薄於現有技術的第一層間介電層106和第二層間介電層107(如圖1所示)的整體厚度500nm,因此,節約了薄膜電晶體的製作成本。
根據本發明實施例提供的技術方案,通過採用有機絕緣層加很薄的無機絕緣層替代現有技術的層間介電層,減小了層間介電層的整體應力,並提升了柔性顯示幕的可彎折程度。
圖4是根據本發明一示例性實施例示出的一種柔性薄膜電晶體的製備方法的流程示意圖。如圖4所示,該柔性薄膜電晶體的製備方法包括:410:在基板上方形成有源層;420:在有源層上方形成柵極;
430:在柵極上方形成有機絕緣層。
根據本發明實施例提供的技術方案,通過採用有機絕緣層替代現有技術的層間介電層,減小了層間介電層的應力,降低了層間介電層的整體厚度,進而提升了柔性顯示幕的可彎折程度。
在本發明的另一個實施例中,該柔性薄膜電晶體的製備方法還包括:在有機絕緣層上形成無機絕緣層。
在本發明的另一個實施例中,該柔性薄膜電晶體的製備方法還包括:在基板與有源層之間形成緩衝層;在有源層與柵極之間形成柵極絕緣層;以及在柵極與有機絕緣層之間形成電容絕緣層。
圖5是根據本發明另一個示例性實施例示出的一種柔性薄膜電晶體的製備方法的流程示意圖。如圖5所示,該柔性薄膜電晶體的製備方法包括:
510:在基板上形成第一緩衝層和第二緩衝層。
在本發明實施例中,通過化學氣相沉積(Chemical Vapor Deposition,CVD)方法,在清洗潔淨的玻璃基板或塑膠基板上依次形成第一緩衝層和第二緩衝層。第一緩衝層和第二緩衝層可以是氧化矽層、氮化矽層、或者氧化矽層與氮化矽層的複合層。在該實施例中,第一緩衝層為氮化矽層,第二緩衝層為氧化矽層。
520:在第二緩衝層上形成有源層。
在本發明實施例中,通過化學氣相沉積方法,在第二緩衝層上形成有源層,該有源層的材料為非晶矽。接續,通過准分子鐳射退火(Excimer Laser Anneal,ELA)工藝將非晶矽轉化為多晶矽。
530:在有源層上形成柵極絕緣層。
在本發明實施例中,通過等離子體增強化學氣相沉積(Plasma Enhanced Chemical Vapor Deposition,PECVD)方法,在有源層上形成柵極絕緣層,該柵極絕緣層覆蓋第二緩衝層。
540:在柵極絕緣層上形成柵極。
在本發明實施例中,通過物理氣相沉積(Physical Vapor Deposition,PVD)方法,在柵極絕緣層上形成正對有源層上方的柵極,即第一金屬M1。進一步地,對有源層的兩端進行硼離子注入形成源極和漏極。
550:在柵極上形成電容絕緣層。
在本發明實施例中,通過化學氣相沉積或成膜,在柵極上形成電容絕緣層,該電容絕緣層覆蓋柵極絕緣層。
560:在電容絕緣層上形成電容金屬。
在本發明實施例中,通過物理氣相沉積或成膜,在電容絕緣層上形成電容金屬,即第二金屬M2。
570:在電容金屬上形成有機絕緣層。
在本發明實施例中,通過塗布有機膠或聚醯亞胺,在電容金屬上形成有機絕緣層,並對該有機絕緣層進行曝光、顯影。
580:在有機絕緣層上形成無機絕緣層。
在本發明實施例中,通過化學氣相沉積或成膜,在有機絕緣層上沉積一層薄薄的無機絕緣層,並對無機絕緣層進行曝光、顯影、刻蝕。進一步地,通過物理氣相沉積,將第三金屬M3沉積到有機絕緣層上。
最後,對玻璃基板或塑膠基板和薄膜電晶體進行分離。
需要說明的是,第一金屬M1、第二金屬M2和第三金屬M3的材料可以是鉬、鈦、鋁、銅、金、銀中的一種或多種的組合。
根據本發明實施例提供的技術方案,通過採用有機絕緣層加很薄的無機絕緣層替代現有技術的層間介電層,減小了層間介電層的整體應力,並提升了柔性顯示幕的可彎折程度。
以上所述僅為本發明的較佳實施例而已,並不用以限制本發明,凡在本發明的精神和原則之內,所作的任何修改、等同替換等,均應包含在本發明的保護範圍之內。
產業利用性
本發明的柔性薄膜電晶體及其製備方法,通過採用有機絕緣層替代現有技術的層間介電層,減小了層間介電層的應力,降低了層間介電層的整體厚度,進而提升了柔性顯示幕的可彎折程度。
Claims (8)
- 一種柔性薄膜電晶體,包括:基板;有源層,形成在該基板上方;柵極,形成在該有源層上方;有機絕緣層,形成在該柵極上方;以及無機絕緣層,形成在該有機絕緣層上,其中,該無機絕緣層的厚度小於該有機絕緣層的厚度。
- 如請求項1所述的柔性薄膜電晶體,其中,該有機絕緣層的材料為有機膠或聚醯亞胺,該有機絕緣層還摻雜有無機材料。
- 如請求項1所述的柔性薄膜電晶體,其中,該無機絕緣層的厚度在45nm至55nm範圍內。
- 如請求項3所述的柔性薄膜電晶體,其中,該無機絕緣層的厚度為50nm。
- 如請求項1所述的柔性薄膜電晶體,其中,該有機絕緣層的厚度在300nm至450nm範圍內。
- 如請求項5所述的柔性薄膜電晶體,其中,該有機絕緣層的厚度為350nm。
- 如請求項1所述的柔性薄膜電晶體,其中,還包括:緩衝層,形成在該基板與該有源層之間;柵極絕緣層,形成在該有源層與該柵極之間;以及電容絕緣層,形成在該柵極與該有機絕緣層之間。
- 一種柔性薄膜電晶體的製備方法,包括:在基板上方形成有源層;在該有源層上方形成柵極;在該柵極上方形成有機絕緣層;以及在該有機絕緣層上形成無機絕緣層,其中,該無機絕緣層的厚度小於該有機絕緣層的厚度。
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