TWI656332B - 評價透明基體之光學特性之方法及透明基體 - Google Patents

評價透明基體之光學特性之方法及透明基體 Download PDF

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Publication number
TWI656332B
TWI656332B TW104109405A TW104109405A TWI656332B TW I656332 B TWI656332 B TW I656332B TW 104109405 A TW104109405 A TW 104109405A TW 104109405 A TW104109405 A TW 104109405A TW I656332 B TWI656332 B TW I656332B
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Taiwan
Prior art keywords
transparent substrate
glare
index value
brightness
display device
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TW104109405A
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English (en)
Chinese (zh)
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TW201543019A (zh
Inventor
玉田稔
小林裕介
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日商Ａｇｃ股份有限公司
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Publication of TW201543019A publication Critical patent/TW201543019A/zh
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/02—Diffusing elements; Afocal elements

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Optical Elements Other Than Lenses (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
TW104109405A 2014-05-14 2015-03-24 評價透明基體之光學特性之方法及透明基體 TWI656332B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2014100343 2014-05-14
JP2014-100343 2014-05-14

Publications (2)

Publication Number Publication Date
TW201543019A TW201543019A (zh) 2015-11-16
TWI656332B true TWI656332B (zh) 2019-04-11

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Family Applications (2)

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TW107143265A TWI744576B (zh) 2014-05-14 2015-03-24 評價透明基體之光學特性之方法
TW104109405A TWI656332B (zh) 2014-05-14 2015-03-24 評價透明基體之光學特性之方法及透明基體

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TW107143265A TWI744576B (zh) 2014-05-14 2015-03-24 評價透明基體之光學特性之方法

Country Status (5)

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JP (2) JP6341210B2 (ja)
KR (1) KR102321551B1 (ja)
CN (2) CN106461502B (ja)
TW (2) TWI744576B (ja)
WO (1) WO2015174132A1 (ja)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107533161B (zh) * 2015-11-20 2020-08-04 Ａｇｃ株式会社 带膜的弯曲基材及其制造方法以及图像显示装置
JP6969156B2 (ja) * 2016-05-30 2021-11-24 Ａｇｃ株式会社 印刷層付き板およびその製造方法、および表示装置
JP6973250B2 (ja) * 2018-04-04 2021-11-24 日本電気硝子株式会社 透明物品の評価方法、及び透明物品の製造方法

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002082206A (ja) * 2000-09-06 2002-03-22 Toppan Printing Co Ltd 防眩性反射防止フィルム
JP2009085665A (ja) * 2007-09-28 2009-04-23 Toyo Ink Mfg Co Ltd 防眩性評価装置及び防眩性評価方法
JP2010060923A (ja) * 2008-09-04 2010-03-18 Dainippon Printing Co Ltd 光学シート
CN102967442A (zh) * 2011-08-31 2013-03-13 株式会社东芝 用于评价不舒适眩光的方法以及不舒适眩光的评价程序
TWM471589U (zh) * 2013-08-06 2014-02-01 Kupo Co Ltd 電子裝置之螢幕光學保護貼結構
TWM473299U (zh) * 2013-11-19 2014-03-01 Yao-Chang Wang 螢幕保護貼

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4484177B2 (ja) * 1999-02-19 2010-06-16 大日本印刷株式会社 面ぎらの定量的評価方法及び防眩性フィルムの製造方法
JP4377578B2 (ja) * 2001-12-17 2009-12-02 ダイセル化学工業株式会社 防眩性フィルム、それを用いた光学部材及び液晶表示装置
KR100949870B1 (ko) * 2001-12-17 2010-03-25 다이셀 가가꾸 고교 가부시끼가이샤 방현성 필름, 및 이를 이용한 광학 부재 및 액정디스플레이 장치
JP3766342B2 (ja) * 2002-03-26 2006-04-12 富士写真フイルム株式会社 防眩フィルムのギラツキ評価装置
KR100622243B1 (ko) * 2004-02-17 2006-09-14 오므론 가부시키가이샤 광학식 측정 장치 및 광학식 측정 방법
KR101408637B1 (ko) * 2005-03-30 2014-06-17 다이니폰 인사츠 가부시키가이샤 방현성 광학 적층체
JP2007147343A (ja) 2005-11-25 2007-06-14 Sharp Corp 防眩度の評価方法、及び防眩度評価装置
JP4844254B2 (ja) * 2006-06-20 2011-12-28 住友化学株式会社 防眩フィルム及び画像表示装置
US8049860B2 (en) * 2006-06-30 2011-11-01 Nippon Sheet Glass Company, Ltd. Glass substrate for reflective mirror, reflective mirror including the glass substrate, glass substrate for liquid crystal panel, and liquid crystal panel including the glass substrate
CN101501535B (zh) * 2006-08-09 2010-12-22 木本股份有限公司 防眩性构件及使用其的显示装置、以及屏幕
JP2008058081A (ja) * 2006-08-30 2008-03-13 Fujifilm Corp 防眩性評価装置、防眩性評価基準設定方法および防眩性評価方法
JP2008170344A (ja) * 2007-01-12 2008-07-24 Fujifilm Corp 防眩性の評価方法及び測定装置
JP4924344B2 (ja) 2007-10-01 2012-04-25 コニカミノルタオプト株式会社 防眩フィルム、その製造装置、防眩性反射防止フィルム、偏光板、及び表示装置
CN101630118B (zh) * 2008-07-17 2012-05-23 鸿富锦精密工业（深圳）有限公司 镜头模组眩光检测设备及其检测方法
JP4966395B2 (ja) * 2010-04-14 2012-07-04 大日本印刷株式会社 動画像と静止画像との混用に適した液晶表示装置の黒彩感及び画像の切れの改善方法
KR101788357B1 (ko) * 2010-10-04 2017-10-19 다이니폰 인사츠 가부시키가이샤 방현성 필름, 방현성 필름의 제조 방법, 편광판 및 화상 표시 장치

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002082206A (ja) * 2000-09-06 2002-03-22 Toppan Printing Co Ltd 防眩性反射防止フィルム
JP2009085665A (ja) * 2007-09-28 2009-04-23 Toyo Ink Mfg Co Ltd 防眩性評価装置及び防眩性評価方法
JP2010060923A (ja) * 2008-09-04 2010-03-18 Dainippon Printing Co Ltd 光学シート
CN102967442A (zh) * 2011-08-31 2013-03-13 株式会社东芝 用于评价不舒适眩光的方法以及不舒适眩光的评价程序
TWM471589U (zh) * 2013-08-06 2014-02-01 Kupo Co Ltd 電子裝置之螢幕光學保護貼結構
TWM473299U (zh) * 2013-11-19 2014-03-01 Yao-Chang Wang 螢幕保護貼

Also Published As

Publication number Publication date
CN106461502B (zh) 2020-01-24
JP2018163160A (ja) 2018-10-18
TW201543019A (zh) 2015-11-16
KR20170008224A (ko) 2017-01-23
JP6341210B2 (ja) 2018-06-13
TW201913060A (zh) 2019-04-01
JPWO2015174132A1 (ja) 2017-04-20
CN110057547A (zh) 2019-07-26
KR102321551B1 (ko) 2021-11-03
WO2015174132A1 (ja) 2015-11-19
JP6583479B2 (ja) 2019-10-02
CN106461502A (zh) 2017-02-22
TWI744576B (zh) 2021-11-01

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