TWI646298B - 裝備有具有溫度管理之燈頭的基板處理系統 - Google Patents

裝備有具有溫度管理之燈頭的基板處理系統 Download PDF

Info

Publication number
TWI646298B
TWI646298B TW102115084A TW102115084A TWI646298B TW I646298 B TWI646298 B TW I646298B TW 102115084 A TW102115084 A TW 102115084A TW 102115084 A TW102115084 A TW 102115084A TW I646298 B TWI646298 B TW I646298B
Authority
TW
Taiwan
Prior art keywords
lamp
mirror
channels
monolithic element
dome
Prior art date
Application number
TW102115084A
Other languages
English (en)
Chinese (zh)
Other versions
TW201350778A (zh
Inventor
拉尼許喬瑟夫M
Joseph M. Ranish
布里哈特保羅
Paul Brillhart
古波若沙堤西
Satheesh Kuppurao
姚東明
Dongming IU
Original Assignee
美商應用材料股份有限公司
Applied Materials, Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 美商應用材料股份有限公司, Applied Materials, Inc. filed Critical 美商應用材料股份有限公司
Publication of TW201350778A publication Critical patent/TW201350778A/zh
Application granted granted Critical
Publication of TWI646298B publication Critical patent/TWI646298B/zh

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
    • H10P95/90—Thermal treatments, e.g. annealing or sintering
    • C—CHEMISTRY; METALLURGY
    • C30—CRYSTAL GROWTH
    • C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
    • C30B25/02—Epitaxial-layer growth
    • C30B25/10—Heating of the reaction chamber or the substrate
    • C30B25/105—Heating of the reaction chamber or the substrate by irradiation or electric discharge
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F21—LIGHTING
    • F21V—FUNCTIONAL FEATURES OR DETAILS OF LIGHTING DEVICES OR SYSTEMS THEREOF; STRUCTURAL COMBINATIONS OF LIGHTING DEVICES WITH OTHER ARTICLES, NOT OTHERWISE PROVIDED FOR
    • F21V7/00—Reflectors for light sources
    • F21V7/0083—Array of reflectors for a cluster of light sources, e.g. arrangement of multiple light sources in one plane
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
    • H10P95/90—Thermal treatments, e.g. annealing or sintering
    • H10P95/902—Thermal treatments, e.g. annealing or sintering for the formation of PN junctions without addition of impurities

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • General Engineering & Computer Science (AREA)
  • Chemical Vapour Deposition (AREA)
TW102115084A 2012-04-26 2013-04-26 裝備有具有溫度管理之燈頭的基板處理系統 TWI646298B (zh)

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
US201261638619P 2012-04-26 2012-04-26
US61/638,619 2012-04-26
US201261707938P 2012-09-29 2012-09-29
US61/707,938 2012-09-29
US13/865,672 US10202707B2 (en) 2012-04-26 2013-04-18 Substrate processing system with lamphead having temperature management
US13/865,672 2013-04-18

Publications (2)

Publication Number Publication Date
TW201350778A TW201350778A (zh) 2013-12-16
TWI646298B true TWI646298B (zh) 2019-01-01

Family

ID=49483801

Family Applications (1)

Application Number Title Priority Date Filing Date
TW102115084A TWI646298B (zh) 2012-04-26 2013-04-26 裝備有具有溫度管理之燈頭的基板處理系統

Country Status (6)

Country Link
US (1) US10202707B2 (enExample)
JP (1) JP6637312B2 (enExample)
KR (1) KR102108408B1 (enExample)
CN (1) CN104246969B (enExample)
TW (1) TWI646298B (enExample)
WO (1) WO2013163080A1 (enExample)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102228941B1 (ko) * 2013-11-22 2021-03-17 어플라이드 머티어리얼스, 인코포레이티드 접근이 용이한 램프헤드
US10053777B2 (en) * 2014-03-19 2018-08-21 Applied Materials, Inc. Thermal processing chamber
CN107620893A (zh) * 2017-08-31 2018-01-23 江苏米优光电科技有限公司 一种透气散热型户外全彩led贴片灯组及其生产工艺
KR102699383B1 (ko) 2019-04-18 2024-08-26 삼성전자주식회사 웨이퍼 클리닝 장치
US11680338B2 (en) * 2019-12-19 2023-06-20 Applied Materials, Inc. Linear lamp array for improved thermal uniformity and profile control
KR20250075736A (ko) * 2021-05-11 2025-05-28 어플라이드 머티어리얼스, 인코포레이티드 에피택시 및 cvd 챔버용 가스 인젝터
US12660554B2 (en) * 2021-05-11 2026-06-16 Applied Materials, Inc. Lamp heating module for an epitaxy process chamber
US12091749B2 (en) 2021-05-11 2024-09-17 Applied Materials, Inc. Method for epitaxially depositing a material on a substrate by flowing a process gas across the substrate from an upper gas inlet to an upper gas outlet and flowing a purge gas from a lower gas inlet to a lower gas outlet
US12018372B2 (en) 2021-05-11 2024-06-25 Applied Materials, Inc. Gas injector for epitaxy and CVD chamber
US12060651B2 (en) 2021-05-11 2024-08-13 Applied Materials, Inc. Chamber architecture for epitaxial deposition and advanced epitaxial film applications
JP7667310B2 (ja) * 2021-06-09 2025-04-22 アプライド マテリアルズ インコーポレイテッド 両口金形ランプを用いた軸対称加熱アセンブリレイアウト
CN115274491A (zh) * 2022-04-22 2022-11-01 江苏天芯微半导体设备有限公司 一种控温组件及衬底处理设备
CN115161764B (zh) * 2022-06-23 2024-02-06 江苏天芯微半导体设备有限公司 一种控温装置及其外延设备
US20250132175A1 (en) * 2023-10-18 2025-04-24 Applied Materials, Inc. Actively controlled window for epitaxial deposition process temperature control

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0845863A (ja) * 1994-07-27 1996-02-16 Touyoko Kagaku Kk 半導体基板の枚葉式熱処理装置
TW200945477A (en) * 2008-02-22 2009-11-01 Applied Materials Inc Silver reflectors for semiconductor processing chambers

Family Cites Families (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4047496A (en) * 1974-05-31 1977-09-13 Applied Materials, Inc. Epitaxial radiation heated reactor
US5156820A (en) * 1989-05-15 1992-10-20 Rapro Technology, Inc. Reaction chamber with controlled radiant energy heating and distributed reactant flow
US5002630A (en) 1989-06-06 1991-03-26 Rapro Technology Method for high temperature thermal processing with reduced convective heat loss
US5108792A (en) 1990-03-09 1992-04-28 Applied Materials, Inc. Double-dome reactor for semiconductor processing
JPH04297581A (ja) 1991-03-15 1992-10-21 Mitsubishi Electric Corp 光気相成長装置
JPH09237763A (ja) 1996-02-28 1997-09-09 Tokyo Electron Ltd 枚葉式の熱処理装置
TW315493B (en) * 1996-02-28 1997-09-11 Tokyo Electron Co Ltd Heating apparatus and heat treatment apparatus
JP3616687B2 (ja) 1996-03-04 2005-02-02 東洋製罐株式会社 耐熱耐圧性に優れた自立性容器
US6007635A (en) * 1997-11-26 1999-12-28 Micro C Technologies, Inc. Platform for supporting a semiconductor substrate and method of supporting a substrate during rapid high temperature processing
JP3438658B2 (ja) * 1999-07-22 2003-08-18 ウシオ電機株式会社 ランプユニット及び光照射式加熱装置
JP5049443B2 (ja) 2000-04-20 2012-10-17 東京エレクトロン株式会社 熱処理システム
JP2005222962A (ja) * 2000-04-20 2005-08-18 Tokyo Electron Ltd 熱処理装置及びその方法
US6476362B1 (en) * 2000-09-12 2002-11-05 Applied Materials, Inc. Lamp array for thermal processing chamber
US7075037B2 (en) 2001-03-02 2006-07-11 Tokyo Electron Limited Heat treatment apparatus using a lamp for rapidly and uniformly heating a wafer
JP2002270532A (ja) 2001-03-14 2002-09-20 Tokyo Electron Ltd 加熱装置及び熱処理装置
JP2002270533A (ja) 2001-03-14 2002-09-20 Tokyo Electron Ltd 熱処理装置及びランプ出力制御方法
JP2003022982A (ja) 2001-07-09 2003-01-24 Tokyo Electron Ltd 熱処理装置
US6818864B2 (en) * 2002-08-09 2004-11-16 Asm America, Inc. LED heat lamp arrays for CVD heating
US7691204B2 (en) * 2005-09-30 2010-04-06 Applied Materials, Inc. Film formation apparatus and methods including temperature and emissivity/pattern compensation
US20080072820A1 (en) 2006-06-30 2008-03-27 Applied Materials, Inc. Modular cvd epi 300mm reactor
US7860379B2 (en) 2007-01-15 2010-12-28 Applied Materials, Inc. Temperature measurement and control of wafer support in thermal processing chamber
JP5169299B2 (ja) 2008-02-22 2013-03-27 株式会社デンソー 半導体製造装置
KR101458001B1 (ko) 2008-06-17 2014-11-04 주성엔지니어링(주) 기판 처리 장치
US8294068B2 (en) * 2008-09-10 2012-10-23 Applied Materials, Inc. Rapid thermal processing lamphead with improved cooling
CN102414800A (zh) * 2009-08-18 2012-04-11 东京毅力科创株式会社 热处理装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0845863A (ja) * 1994-07-27 1996-02-16 Touyoko Kagaku Kk 半導体基板の枚葉式熱処理装置
TW200945477A (en) * 2008-02-22 2009-11-01 Applied Materials Inc Silver reflectors for semiconductor processing chambers

Also Published As

Publication number Publication date
KR102108408B1 (ko) 2020-05-08
TW201350778A (zh) 2013-12-16
US20130298832A1 (en) 2013-11-14
KR20150003841A (ko) 2015-01-09
CN104246969B (zh) 2019-06-11
JP2015522939A (ja) 2015-08-06
CN104246969A (zh) 2014-12-24
US10202707B2 (en) 2019-02-12
WO2013163080A1 (en) 2013-10-31
JP6637312B2 (ja) 2020-01-29

Similar Documents

Publication Publication Date Title
TW201350778A (zh) 裝備有具有溫度管理之燈頭的基板處理系統
CN100338729C (zh) 用于集成电路的快速热处理系统
TWI703636B (zh) 用於低壓熱處理的光導管結構窗
TWI489556B (zh) 冷卻改進的快速熱處理燈頭
JP2018170514A (ja) Epiベースリング
TW201639063A (zh) 批量加熱和冷卻腔室或負載鎖定裝置
US9842753B2 (en) Absorbing lamphead face
WO2014018212A1 (en) Chambers with improved cooling devices
TWI625790B (zh) 熱耦合石英圓頂散熱器
KR102214288B1 (ko) 가요성 스탠드오프들을 갖는 램프헤드 pcb
CN105143505B (zh) 吸收性灯头面
TW201713896A (zh) 用於無燈座燈的燈座配接器設計
TWI713550B (zh) 批次處理腔室
US20260040408A1 (en) Heating assembly and method for a processing chamber
KR20250092198A (ko) 기판 처리 챔버들에 대한 램프 및 윈도우 구성들
CN118800691A (zh) 退火工艺腔室及半导体工艺设备
RU203135U1 (ru) Светильник