TWI633653B - 背面輻射式影像感測器,成像器件及電子裝置 - Google Patents
背面輻射式影像感測器,成像器件及電子裝置 Download PDFInfo
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- TWI633653B TWI633653B TW103125155A TW103125155A TWI633653B TW I633653 B TWI633653 B TW I633653B TW 103125155 A TW103125155 A TW 103125155A TW 103125155 A TW103125155 A TW 103125155A TW I633653 B TWI633653 B TW I633653B
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- 238000003384 imaging method Methods 0.000 title claims abstract description 157
- 239000000758 substrate Substances 0.000 claims abstract description 37
- 238000005498 polishing Methods 0.000 claims abstract description 34
- 238000004519 manufacturing process Methods 0.000 claims description 10
- 238000000034 method Methods 0.000 claims description 6
- 238000010586 diagram Methods 0.000 description 18
- 230000005855 radiation Effects 0.000 description 18
- 238000012545 processing Methods 0.000 description 14
- 239000003086 colorant Substances 0.000 description 6
- 239000004065 semiconductor Substances 0.000 description 5
- 238000006243 chemical reaction Methods 0.000 description 4
- 230000003287 optical effect Effects 0.000 description 4
- 230000002093 peripheral effect Effects 0.000 description 4
- 238000013461 design Methods 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005401 electroluminescence Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 238000002834 transmittance Methods 0.000 description 2
- 239000000654 additive Substances 0.000 description 1
- 230000000996 additive effect Effects 0.000 description 1
- 230000004075 alteration Effects 0.000 description 1
- 230000003321 amplification Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000003139 buffering effect Effects 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
- H10F39/199—Back-illuminated image sensors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/011—Manufacture or treatment of image sensors covered by group H10F39/12
- H10F39/024—Manufacture or treatment of image sensors covered by group H10F39/12 of coatings or optical elements
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/806—Optical elements or arrangements associated with the image sensors
- H10F39/8067—Reflectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/811—Interconnections
Landscapes
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Color Television Image Signal Generators (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013156903A JP6209890B2 (ja) | 2013-07-29 | 2013-07-29 | 裏面照射型イメージセンサ、撮像装置、および電子機器 |
| JP2013-156903 | 2013-07-29 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201508906A TW201508906A (zh) | 2015-03-01 |
| TWI633653B true TWI633653B (zh) | 2018-08-21 |
Family
ID=51298916
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW103125155A TWI633653B (zh) | 2013-07-29 | 2014-07-22 | 背面輻射式影像感測器,成像器件及電子裝置 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US10050077B2 (enExample) |
| EP (1) | EP3028306B1 (enExample) |
| JP (1) | JP6209890B2 (enExample) |
| KR (1) | KR102276530B1 (enExample) |
| CN (1) | CN105340079B (enExample) |
| TW (1) | TWI633653B (enExample) |
| WO (1) | WO2015015753A1 (enExample) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPWO2018034092A1 (ja) * | 2016-08-18 | 2019-06-13 | ソニーセミコンダクタソリューションズ株式会社 | 固体撮像素子、固体撮像素子の製造方法、及び、電子機器 |
| JP7066316B2 (ja) * | 2016-12-13 | 2022-05-13 | ソニーセミコンダクタソリューションズ株式会社 | 撮像素子及び電子機器 |
| KR20180071802A (ko) | 2016-12-20 | 2018-06-28 | 삼성전자주식회사 | 이미지 센서 |
| WO2021149577A1 (ja) * | 2020-01-24 | 2021-07-29 | ソニーセミコンダクタソリューションズ株式会社 | 固体撮像素子および電子機器 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20110140225A1 (en) * | 2009-12-16 | 2011-06-16 | Masafumi Tsutsui | Semiconductor device |
| TW201133810A (en) * | 2009-09-11 | 2011-10-01 | Toshiba Kk | Solid-state image sensor and method of manufacturing the same |
Family Cites Families (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3137072B2 (ja) * | 1998-04-30 | 2001-02-19 | 日本電気株式会社 | 半導体集積回路の自動配線レイアウト方法 |
| JP3877565B2 (ja) * | 2001-10-04 | 2007-02-07 | 松下電器産業株式会社 | 撮像装置 |
| US6815787B1 (en) * | 2002-01-08 | 2004-11-09 | Taiwan Semiconductor Manufacturing Company | Grid metal design for large density CMOS image sensor |
| WO2003079675A1 (en) * | 2002-03-20 | 2003-09-25 | Sony Corporation | Solid-state image pickup device and its drive method |
| JP4147861B2 (ja) * | 2002-08-06 | 2008-09-10 | ソニー株式会社 | 固体撮像素子の製造方法 |
| JP4826111B2 (ja) | 2005-03-17 | 2011-11-30 | ソニー株式会社 | 固体撮像素子および固体撮像素子の製造方法および画像撮影装置 |
| JP5187934B2 (ja) * | 2007-07-26 | 2013-04-24 | 株式会社サトー知識財産研究所 | 検査支援装置 |
| JP5173493B2 (ja) * | 2008-02-29 | 2013-04-03 | キヤノン株式会社 | 撮像装置及び撮像システム |
| JP5198150B2 (ja) * | 2008-05-29 | 2013-05-15 | 株式会社東芝 | 固体撮像装置 |
| KR101545638B1 (ko) * | 2008-12-17 | 2015-08-19 | 삼성전자 주식회사 | 이미지 센서 및 그 제조 방법, 이미지 센서를 포함하는 장치 및 그 제조 방법 |
| JP5696513B2 (ja) * | 2011-02-08 | 2015-04-08 | ソニー株式会社 | 固体撮像装置とその製造方法、及び電子機器 |
| JP5909051B2 (ja) * | 2011-04-26 | 2016-04-26 | キヤノン株式会社 | 固体撮像素子及び撮像装置 |
| JP5919653B2 (ja) * | 2011-06-09 | 2016-05-18 | ソニー株式会社 | 半導体装置 |
| JP5956866B2 (ja) * | 2011-09-01 | 2016-07-27 | キヤノン株式会社 | 固体撮像装置 |
| JP5893302B2 (ja) * | 2011-09-01 | 2016-03-23 | キヤノン株式会社 | 固体撮像装置 |
| JP6026102B2 (ja) | 2011-12-07 | 2016-11-16 | ソニーセミコンダクタソリューションズ株式会社 | 固体撮像素子および電子機器 |
-
2013
- 2013-07-29 JP JP2013156903A patent/JP6209890B2/ja not_active Expired - Fee Related
-
2014
- 2014-07-22 KR KR1020167000904A patent/KR102276530B1/ko not_active Expired - Fee Related
- 2014-07-22 WO PCT/JP2014/003838 patent/WO2015015753A1/en not_active Ceased
- 2014-07-22 CN CN201480036251.3A patent/CN105340079B/zh not_active Expired - Fee Related
- 2014-07-22 EP EP14748301.0A patent/EP3028306B1/en active Active
- 2014-07-22 US US14/904,795 patent/US10050077B2/en active Active
- 2014-07-22 TW TW103125155A patent/TWI633653B/zh not_active IP Right Cessation
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW201133810A (en) * | 2009-09-11 | 2011-10-01 | Toshiba Kk | Solid-state image sensor and method of manufacturing the same |
| US20110140225A1 (en) * | 2009-12-16 | 2011-06-16 | Masafumi Tsutsui | Semiconductor device |
Also Published As
| Publication number | Publication date |
|---|---|
| TW201508906A (zh) | 2015-03-01 |
| US20160204147A1 (en) | 2016-07-14 |
| EP3028306B1 (en) | 2020-04-29 |
| WO2015015753A1 (en) | 2015-02-05 |
| KR102276530B1 (ko) | 2021-07-13 |
| EP3028306A1 (en) | 2016-06-08 |
| US10050077B2 (en) | 2018-08-14 |
| JP2015026786A (ja) | 2015-02-05 |
| JP6209890B2 (ja) | 2017-10-11 |
| CN105340079B (zh) | 2019-01-29 |
| KR20160037882A (ko) | 2016-04-06 |
| CN105340079A (zh) | 2016-02-17 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |