TWI595571B - 有機半導體膜的形成方法 - Google Patents

有機半導體膜的形成方法 Download PDF

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Publication number
TWI595571B
TWI595571B TW103106369A TW103106369A TWI595571B TW I595571 B TWI595571 B TW I595571B TW 103106369 A TW103106369 A TW 103106369A TW 103106369 A TW103106369 A TW 103106369A TW I595571 B TWI595571 B TW I595571B
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TW
Taiwan
Prior art keywords
organic semiconductor
substrate
semiconductor film
cover member
forming
Prior art date
Application number
TW103106369A
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English (en)
Chinese (zh)
Other versions
TW201440149A (zh
Inventor
宇佐美由久
Original Assignee
富士軟片股份有限公司
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Filing date
Publication date
Application filed by 富士軟片股份有限公司 filed Critical 富士軟片股份有限公司
Publication of TW201440149A publication Critical patent/TW201440149A/zh
Application granted granted Critical
Publication of TWI595571B publication Critical patent/TWI595571B/zh

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Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/10Deposition of organic active material
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/10Deposition of organic active material
    • H10K71/12Deposition of organic active material using liquid deposition, e.g. spin coating
    • H10K71/15Deposition of organic active material using liquid deposition, e.g. spin coating characterised by the solvent used
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/10Deposition of organic active material
    • H10K71/191Deposition of organic active material characterised by provisions for the orientation or alignment of the layer to be deposited
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/20Changing the shape of the active layer in the devices, e.g. patterning
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K10/00Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
    • H10K10/40Organic transistors
    • H10K10/46Field-effect transistors, e.g. organic thin-film transistors [OTFT]
    • H10K10/462Insulated gate field-effect transistors [IGFETs]
    • H10K10/484Insulated gate field-effect transistors [IGFETs] characterised by the channel regions
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/80Manufacture or treatment specially adapted for the organic devices covered by this subclass using temporary substrates
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K99/00Subject matter not provided for in other groups of this subclass

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
  • Thin Film Transistor (AREA)
  • Electroluminescent Light Sources (AREA)
TW103106369A 2013-03-15 2014-02-26 有機半導體膜的形成方法 TWI595571B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013054250A JP6061743B2 (ja) 2013-03-15 2013-03-15 有機半導体膜の形成方法

Publications (2)

Publication Number Publication Date
TW201440149A TW201440149A (zh) 2014-10-16
TWI595571B true TWI595571B (zh) 2017-08-11

Family

ID=51536514

Family Applications (1)

Application Number Title Priority Date Filing Date
TW103106369A TWI595571B (zh) 2013-03-15 2014-02-26 有機半導體膜的形成方法

Country Status (6)

Country Link
US (1) US9472760B2 (enExample)
EP (1) EP2975636B1 (enExample)
JP (1) JP6061743B2 (enExample)
CN (1) CN105144357B (enExample)
TW (1) TWI595571B (enExample)
WO (1) WO2014141838A1 (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2017134991A1 (ja) * 2016-02-03 2017-08-10 富士フイルム株式会社 有機半導体膜の製造装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2012026333A1 (ja) * 2010-08-23 2012-03-01 ソニー株式会社 有機薄膜の形成方法および形成装置、ならびに有機デバイスの製造方法
US20120129296A1 (en) * 2009-05-26 2012-05-24 Imec Method for forming an organic material layer on a substrate
US20120193618A1 (en) * 2009-10-02 2012-08-02 Osaka University Method for manufacturing organic semiconductor film, and organic semiconductor film array

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5092269B2 (ja) * 2006-04-26 2012-12-05 コニカミノルタホールディングス株式会社 有機半導体薄膜および有機半導体デバイスの製造方法
EP2028683B1 (en) * 2006-05-24 2017-12-27 Nissan Chemical Industries, Ltd. Process for producing an organic transistor.
CN101461047B (zh) * 2006-06-07 2011-06-15 松下电器产业株式会社 半导体元件及其制造方法以及电子器件及其制造方法
US9741901B2 (en) * 2006-11-07 2017-08-22 Cbrite Inc. Two-terminal electronic devices and their methods of fabrication
JP5590659B2 (ja) * 2010-03-01 2014-09-17 国立大学法人岩手大学 磁場中有機単結晶薄膜作成法及び作成装置
JP2013040124A (ja) * 2011-08-15 2013-02-28 Osaka Univ 自己組織化単分子膜形成用の化合物及びそれを用いた有機半導体素子

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20120129296A1 (en) * 2009-05-26 2012-05-24 Imec Method for forming an organic material layer on a substrate
US20120193618A1 (en) * 2009-10-02 2012-08-02 Osaka University Method for manufacturing organic semiconductor film, and organic semiconductor film array
WO2012026333A1 (ja) * 2010-08-23 2012-03-01 ソニー株式会社 有機薄膜の形成方法および形成装置、ならびに有機デバイスの製造方法

Also Published As

Publication number Publication date
EP2975636B1 (en) 2020-10-21
US9472760B2 (en) 2016-10-18
WO2014141838A1 (ja) 2014-09-18
JP6061743B2 (ja) 2017-01-18
EP2975636A4 (en) 2016-03-30
US20150372233A1 (en) 2015-12-24
CN105144357B (zh) 2017-07-14
CN105144357A (zh) 2015-12-09
EP2975636A1 (en) 2016-01-20
TW201440149A (zh) 2014-10-16
JP2014179568A (ja) 2014-09-25

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