TWI595571B - 有機半導體膜的形成方法 - Google Patents
有機半導體膜的形成方法 Download PDFInfo
- Publication number
- TWI595571B TWI595571B TW103106369A TW103106369A TWI595571B TW I595571 B TWI595571 B TW I595571B TW 103106369 A TW103106369 A TW 103106369A TW 103106369 A TW103106369 A TW 103106369A TW I595571 B TWI595571 B TW I595571B
- Authority
- TW
- Taiwan
- Prior art keywords
- organic semiconductor
- substrate
- semiconductor film
- cover member
- forming
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title claims description 139
- 238000000034 method Methods 0.000 title claims description 58
- 239000000758 substrate Substances 0.000 claims description 116
- 239000000463 material Substances 0.000 claims description 32
- 238000001035 drying Methods 0.000 claims description 19
- 239000007788 liquid Substances 0.000 description 110
- 238000000576 coating method Methods 0.000 description 97
- 239000011248 coating agent Substances 0.000 description 96
- 239000010408 film Substances 0.000 description 82
- 239000002904 solvent Substances 0.000 description 19
- 230000001105 regulatory effect Effects 0.000 description 17
- 230000000052 comparative effect Effects 0.000 description 16
- 239000004809 Teflon Substances 0.000 description 11
- 229920006362 Teflon® Polymers 0.000 description 11
- 230000015572 biosynthetic process Effects 0.000 description 7
- 238000004519 manufacturing process Methods 0.000 description 7
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 6
- 238000001704 evaporation Methods 0.000 description 6
- 230000008020 evaporation Effects 0.000 description 6
- 238000000926 separation method Methods 0.000 description 6
- 239000010409 thin film Substances 0.000 description 5
- FMZQNTNMBORAJM-UHFFFAOYSA-N tri(propan-2-yl)-[2-[13-[2-tri(propan-2-yl)silylethynyl]pentacen-6-yl]ethynyl]silane Chemical compound C1=CC=C2C=C3C(C#C[Si](C(C)C)(C(C)C)C(C)C)=C(C=C4C(C=CC=C4)=C4)C4=C(C#C[Si](C(C)C)(C(C)C)C(C)C)C3=CC2=C1 FMZQNTNMBORAJM-UHFFFAOYSA-N 0.000 description 5
- 238000011282 treatment Methods 0.000 description 4
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 3
- 239000013078 crystal Substances 0.000 description 3
- 230000005669 field effect Effects 0.000 description 3
- -1 polytetrafluoroethylene Polymers 0.000 description 3
- 239000011347 resin Substances 0.000 description 3
- 229920005989 resin Polymers 0.000 description 3
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 description 2
- RDOXTESZEPMUJZ-UHFFFAOYSA-N anisole Chemical compound COC1=CC=CC=C1 RDOXTESZEPMUJZ-UHFFFAOYSA-N 0.000 description 2
- OCKPCBLVNKHBMX-UHFFFAOYSA-N butylbenzene Chemical compound CCCCC1=CC=CC=C1 OCKPCBLVNKHBMX-UHFFFAOYSA-N 0.000 description 2
- 229920001577 copolymer Polymers 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000005401 electroluminescence Methods 0.000 description 2
- 239000004744 fabric Substances 0.000 description 2
- 150000002220 fluorenes Chemical class 0.000 description 2
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 239000010931 gold Substances 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 229910052707 ruthenium Inorganic materials 0.000 description 2
- PCCVSPMFGIFTHU-UHFFFAOYSA-N tetracyanoquinodimethane Chemical compound N#CC(C#N)=C1C=CC(=C(C#N)C#N)C=C1 PCCVSPMFGIFTHU-UHFFFAOYSA-N 0.000 description 2
- XMWRBQBLMFGWIX-UHFFFAOYSA-N C60 fullerene Chemical class C12=C3C(C4=C56)=C7C8=C5C5=C9C%10=C6C6=C4C1=C1C4=C6C6=C%10C%10=C9C9=C%11C5=C8C5=C8C7=C3C3=C7C2=C1C1=C2C4=C6C4=C%10C6=C9C9=C%11C5=C5C8=C3C3=C7C1=C1C2=C4C6=C2C9=C5C3=C12 XMWRBQBLMFGWIX-UHFFFAOYSA-N 0.000 description 1
- 229920001780 ECTFE Polymers 0.000 description 1
- CBENFWSGALASAD-UHFFFAOYSA-N Ozone Chemical compound [O-][O+]=O CBENFWSGALASAD-UHFFFAOYSA-N 0.000 description 1
- 239000002033 PVDF binder Substances 0.000 description 1
- 229920001774 Perfluoroether Polymers 0.000 description 1
- RJGDLRCDCYRQOQ-UHFFFAOYSA-N anthrone Chemical compound C1=CC=C2C(=O)C3=CC=CC=C3CC2=C1 RJGDLRCDCYRQOQ-UHFFFAOYSA-N 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 238000002425 crystallisation Methods 0.000 description 1
- 230000008025 crystallization Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 229920000840 ethylene tetrafluoroethylene copolymer Polymers 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 229910003472 fullerene Inorganic materials 0.000 description 1
- 229910052732 germanium Inorganic materials 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- UZKWTJUDCOPSNM-UHFFFAOYSA-N methoxybenzene Substances CCCCOC=C UZKWTJUDCOPSNM-UHFFFAOYSA-N 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000005192 partition Methods 0.000 description 1
- 125000004817 pentamethylene group Chemical class [H]C([H])([*:2])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[*:1] 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 229920003023 plastic Polymers 0.000 description 1
- 229920002493 poly(chlorotrifluoroethylene) Polymers 0.000 description 1
- 239000005023 polychlorotrifluoroethylene (PCTFE) polymer Substances 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 229920001343 polytetrafluoroethylene Polymers 0.000 description 1
- 239000004810 polytetrafluoroethylene Substances 0.000 description 1
- 229920002620 polyvinyl fluoride Polymers 0.000 description 1
- 229920002981 polyvinylidene fluoride Polymers 0.000 description 1
- 230000002940 repellent Effects 0.000 description 1
- 239000005871 repellent Substances 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 230000001568 sexual effect Effects 0.000 description 1
- 239000004094 surface-active agent Substances 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
- ANRHNWWPFJCPAZ-UHFFFAOYSA-M thionine Chemical compound [Cl-].C1=CC(N)=CC2=[S+]C3=CC(N)=CC=C3N=C21 ANRHNWWPFJCPAZ-UHFFFAOYSA-M 0.000 description 1
- 238000007738 vacuum evaporation Methods 0.000 description 1
- 239000013585 weight reducing agent Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/10—Deposition of organic active material
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/10—Deposition of organic active material
- H10K71/12—Deposition of organic active material using liquid deposition, e.g. spin coating
- H10K71/15—Deposition of organic active material using liquid deposition, e.g. spin coating characterised by the solvent used
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/10—Deposition of organic active material
- H10K71/191—Deposition of organic active material characterised by provisions for the orientation or alignment of the layer to be deposited
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/20—Changing the shape of the active layer in the devices, e.g. patterning
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K10/00—Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
- H10K10/40—Organic transistors
- H10K10/46—Field-effect transistors, e.g. organic thin-film transistors [OTFT]
- H10K10/462—Insulated gate field-effect transistors [IGFETs]
- H10K10/484—Insulated gate field-effect transistors [IGFETs] characterised by the channel regions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/80—Manufacture or treatment specially adapted for the organic devices covered by this subclass using temporary substrates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K99/00—Subject matter not provided for in other groups of this subclass
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
- Thin Film Transistor (AREA)
- Electroluminescent Light Sources (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013054250A JP6061743B2 (ja) | 2013-03-15 | 2013-03-15 | 有機半導体膜の形成方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201440149A TW201440149A (zh) | 2014-10-16 |
| TWI595571B true TWI595571B (zh) | 2017-08-11 |
Family
ID=51536514
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW103106369A TWI595571B (zh) | 2013-03-15 | 2014-02-26 | 有機半導體膜的形成方法 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US9472760B2 (enExample) |
| EP (1) | EP2975636B1 (enExample) |
| JP (1) | JP6061743B2 (enExample) |
| CN (1) | CN105144357B (enExample) |
| TW (1) | TWI595571B (enExample) |
| WO (1) | WO2014141838A1 (enExample) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2017134991A1 (ja) * | 2016-02-03 | 2017-08-10 | 富士フイルム株式会社 | 有機半導体膜の製造装置 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2012026333A1 (ja) * | 2010-08-23 | 2012-03-01 | ソニー株式会社 | 有機薄膜の形成方法および形成装置、ならびに有機デバイスの製造方法 |
| US20120129296A1 (en) * | 2009-05-26 | 2012-05-24 | Imec | Method for forming an organic material layer on a substrate |
| US20120193618A1 (en) * | 2009-10-02 | 2012-08-02 | Osaka University | Method for manufacturing organic semiconductor film, and organic semiconductor film array |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5092269B2 (ja) * | 2006-04-26 | 2012-12-05 | コニカミノルタホールディングス株式会社 | 有機半導体薄膜および有機半導体デバイスの製造方法 |
| EP2028683B1 (en) * | 2006-05-24 | 2017-12-27 | Nissan Chemical Industries, Ltd. | Process for producing an organic transistor. |
| CN101461047B (zh) * | 2006-06-07 | 2011-06-15 | 松下电器产业株式会社 | 半导体元件及其制造方法以及电子器件及其制造方法 |
| US9741901B2 (en) * | 2006-11-07 | 2017-08-22 | Cbrite Inc. | Two-terminal electronic devices and their methods of fabrication |
| JP5590659B2 (ja) * | 2010-03-01 | 2014-09-17 | 国立大学法人岩手大学 | 磁場中有機単結晶薄膜作成法及び作成装置 |
| JP2013040124A (ja) * | 2011-08-15 | 2013-02-28 | Osaka Univ | 自己組織化単分子膜形成用の化合物及びそれを用いた有機半導体素子 |
-
2013
- 2013-03-15 JP JP2013054250A patent/JP6061743B2/ja not_active Expired - Fee Related
-
2014
- 2014-02-19 CN CN201480011019.4A patent/CN105144357B/zh not_active Expired - Fee Related
- 2014-02-19 EP EP14764302.7A patent/EP2975636B1/en not_active Not-in-force
- 2014-02-19 WO PCT/JP2014/053930 patent/WO2014141838A1/ja not_active Ceased
- 2014-02-26 TW TW103106369A patent/TWI595571B/zh not_active IP Right Cessation
-
2015
- 2015-09-01 US US14/842,445 patent/US9472760B2/en not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20120129296A1 (en) * | 2009-05-26 | 2012-05-24 | Imec | Method for forming an organic material layer on a substrate |
| US20120193618A1 (en) * | 2009-10-02 | 2012-08-02 | Osaka University | Method for manufacturing organic semiconductor film, and organic semiconductor film array |
| WO2012026333A1 (ja) * | 2010-08-23 | 2012-03-01 | ソニー株式会社 | 有機薄膜の形成方法および形成装置、ならびに有機デバイスの製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP2975636B1 (en) | 2020-10-21 |
| US9472760B2 (en) | 2016-10-18 |
| WO2014141838A1 (ja) | 2014-09-18 |
| JP6061743B2 (ja) | 2017-01-18 |
| EP2975636A4 (en) | 2016-03-30 |
| US20150372233A1 (en) | 2015-12-24 |
| CN105144357B (zh) | 2017-07-14 |
| CN105144357A (zh) | 2015-12-09 |
| EP2975636A1 (en) | 2016-01-20 |
| TW201440149A (zh) | 2014-10-16 |
| JP2014179568A (ja) | 2014-09-25 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |