TWI592934B - 用於快閃記憶體裝置之混成充電泵與調節構件及方法 - Google Patents
用於快閃記憶體裝置之混成充電泵與調節構件及方法 Download PDFInfo
- Publication number
- TWI592934B TWI592934B TW105105916A TW105105916A TWI592934B TW I592934 B TWI592934 B TW I592934B TW 105105916 A TW105105916 A TW 105105916A TW 105105916 A TW105105916 A TW 105105916A TW I592934 B TWI592934 B TW I592934B
- Authority
- TW
- Taiwan
- Prior art keywords
- voltage
- switch
- transistors
- charge pump
- coupled
- Prior art date
Links
- 238000000034 method Methods 0.000 title description 2
- 239000003990 capacitor Substances 0.000 claims description 31
- 239000013078 crystal Substances 0.000 claims description 6
- 238000007667 floating Methods 0.000 description 15
- 239000000758 substrate Substances 0.000 description 10
- 239000000463 material Substances 0.000 description 7
- 230000008878 coupling Effects 0.000 description 5
- 238000010168 coupling process Methods 0.000 description 5
- 238000005859 coupling reaction Methods 0.000 description 5
- 101100049197 Rattus norvegicus Vegp1 gene Proteins 0.000 description 4
- 230000001629 suppression Effects 0.000 description 4
- 238000013461 design Methods 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 238000003491 array Methods 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 230000007246 mechanism Effects 0.000 description 2
- 230000005689 Fowler Nordheim tunneling Effects 0.000 description 1
- 230000000712 assembly Effects 0.000 description 1
- 238000000429 assembly Methods 0.000 description 1
- 230000002238 attenuated effect Effects 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000005693 optoelectronics Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 238000005086 pumping Methods 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
- G11C5/145—Applications of charge pumps; Boosted voltage circuits; Clamp circuits therefor
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
- G11C16/0408—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors
- G11C16/0425—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors comprising cells containing a merged floating gate and select transistor
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
- G11C16/12—Programming voltage switching circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
- G11C16/14—Circuits for erasing electrically, e.g. erase voltage switching circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/30—Power supply circuits
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M3/00—Conversion of dc power input into dc power output
- H02M3/02—Conversion of dc power input into dc power output without intermediate conversion into ac
- H02M3/04—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters
- H02M3/06—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using resistors or capacitors, e.g. potential divider
- H02M3/07—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using resistors or capacitors, e.g. potential divider using capacitors charged and discharged alternately by semiconductor devices with control electrode, e.g. charge pumps
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M3/00—Conversion of dc power input into dc power output
- H02M3/02—Conversion of dc power input into dc power output without intermediate conversion into ac
- H02M3/04—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters
- H02M3/06—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using resistors or capacitors, e.g. potential divider
- H02M3/07—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using resistors or capacitors, e.g. potential divider using capacitors charged and discharged alternately by semiconductor devices with control electrode, e.g. charge pumps
- H02M3/073—Charge pumps of the Schenkel-type
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C2216/00—Indexing scheme relating to G11C16/00 and subgroups, for features not directly covered by these groups
- G11C2216/02—Structural aspects of erasable programmable read-only memories
- G11C2216/04—Nonvolatile memory cell provided with a separate control gate for erasing the cells, i.e. erase gate, independent of the normal read control gate
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Read Only Memory (AREA)
- Semiconductor Integrated Circuits (AREA)
- Dc-Dc Converters (AREA)
- Semiconductor Memories (AREA)
- Non-Volatile Memory (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201361792643P | 2013-03-15 | 2013-03-15 | |
US13/958,410 US8867281B2 (en) | 2013-03-15 | 2013-08-02 | Hybrid chargepump and regulation means and method for flash memory device |
PCT/US2014/011553 WO2014149165A2 (en) | 2013-03-15 | 2014-01-14 | Hybrid chargepump and regulation means and method for flash memory device |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201631587A TW201631587A (zh) | 2016-09-01 |
TWI592934B true TWI592934B (zh) | 2017-07-21 |
Family
ID=51526472
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW103102090A TWI529720B (zh) | 2013-03-15 | 2014-01-21 | 用於快閃記憶體裝置之混成充電泵與調節構件及方法 |
TW105105916A TWI592934B (zh) | 2013-03-15 | 2014-01-21 | 用於快閃記憶體裝置之混成充電泵與調節構件及方法 |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW103102090A TWI529720B (zh) | 2013-03-15 | 2014-01-21 | 用於快閃記憶體裝置之混成充電泵與調節構件及方法 |
Country Status (7)
Country | Link |
---|---|
US (1) | US8867281B2 (de) |
EP (3) | EP3428920B1 (de) |
JP (4) | JP6302492B2 (de) |
KR (2) | KR101775256B1 (de) |
CN (2) | CN104937666B (de) |
TW (2) | TWI529720B (de) |
WO (1) | WO2014149165A2 (de) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8619445B1 (en) | 2013-03-15 | 2013-12-31 | Arctic Sand Technologies, Inc. | Protection of switched capacitor power converter |
US9361995B1 (en) | 2015-01-21 | 2016-06-07 | Silicon Storage Technology, Inc. | Flash memory system using complementary voltage supplies |
WO2017007991A1 (en) | 2015-07-08 | 2017-01-12 | Arctic Sand Technologies, Inc. | Switched-capacitor power converters |
US10348191B2 (en) * | 2015-11-25 | 2019-07-09 | Psemi Corporation | Switched-capacitor network packaged with load |
US10847227B2 (en) | 2018-10-16 | 2020-11-24 | Silicon Storage Technology, Inc. | Charge pump for use in non-volatile flash memory devices |
US11374491B2 (en) | 2020-01-09 | 2022-06-28 | Skyworks Solutions, Inc. | Low noise charge pumps |
US11810626B2 (en) * | 2022-02-11 | 2023-11-07 | Sandisk Technologies Llc | Generating boosted voltages with a hybrid charge pump |
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JPH03290895A (ja) * | 1990-04-06 | 1991-12-20 | Sony Corp | 半導体集積回路装置 |
JP3285443B2 (ja) * | 1993-12-22 | 2002-05-27 | 三菱電機株式会社 | チャージポンプ |
JP3561060B2 (ja) * | 1995-12-08 | 2004-09-02 | 三菱電機株式会社 | 負電圧発生回路 |
KR100271840B1 (ko) * | 1997-08-27 | 2000-11-15 | 다니구찌 이찌로오 | 회로 면적의 증대를 억제하면서 복수의 전위를 출력할 수 있는내부 전위 발생 회로 |
JP2000049299A (ja) * | 1998-05-25 | 2000-02-18 | Mitsubishi Electric Corp | チャージポンプ回路およびそれを備える不揮発性半導体記憶装置 |
US6356062B1 (en) * | 2000-09-27 | 2002-03-12 | Intel Corporation | Degenerative load temperature correction for charge pumps |
US6369642B1 (en) * | 2000-12-26 | 2002-04-09 | Intel Corporation | Output switch for charge pump reconfiguration |
JP2002208290A (ja) * | 2001-01-09 | 2002-07-26 | Mitsubishi Electric Corp | チャージポンプ回路およびこれを用いた不揮発性メモリの動作方法 |
US6424570B1 (en) * | 2001-06-26 | 2002-07-23 | Advanced Micro Devices, Inc. | Modulated charge pump with uses an analog to digital converter to compensate for supply voltage variations |
JP3832575B2 (ja) * | 2002-02-12 | 2006-10-11 | シャープ株式会社 | 負電圧出力チャージポンプ回路 |
JP4223270B2 (ja) * | 2002-11-19 | 2009-02-12 | パナソニック株式会社 | 昇圧回路およびそれを内蔵した不揮発性半導体記憶装置 |
JP2004348806A (ja) * | 2003-03-26 | 2004-12-09 | Sharp Corp | 半導体記憶装置およびそれを備えた携帯電子機器 |
US7719343B2 (en) * | 2003-09-08 | 2010-05-18 | Peregrine Semiconductor Corporation | Low noise charge pump method and apparatus |
KR100812086B1 (ko) * | 2006-11-30 | 2008-03-07 | 동부일렉트로닉스 주식회사 | 반도체 소자의 전압조절장치 |
KR20080016520A (ko) * | 2007-03-27 | 2008-02-21 | 코네르지 악티엔게젤샤프트 | 인버터 |
KR100898259B1 (ko) * | 2007-04-27 | 2009-05-19 | 경북대학교 산학협력단 | 전하 펌프 방식의 전력 변환 인버터 |
CN100592153C (zh) * | 2007-06-08 | 2010-02-24 | 群康科技(深圳)有限公司 | 负电压产生电路 |
US20090039410A1 (en) | 2007-08-06 | 2009-02-12 | Xian Liu | Split Gate Non-Volatile Flash Memory Cell Having A Floating Gate, Control Gate, Select Gate And An Erase Gate With An Overhang Over The Floating Gate, Array And Method Of Manufacturing |
KR100887843B1 (ko) | 2007-10-04 | 2009-03-09 | 현대자동차주식회사 | 하이브리드 차량용 인버터의 캐패시터 보호 방법 |
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JP2010017013A (ja) * | 2008-07-04 | 2010-01-21 | Rohm Co Ltd | チャージポンプ回路 |
JP5627197B2 (ja) * | 2009-05-26 | 2014-11-19 | ピーエスフォー ルクスコ エスエイアールエルPS4 Luxco S.a.r.l. | 半導体記憶装置及びこれを備える情報処理システム並びにコントローラ |
US7973592B2 (en) * | 2009-07-21 | 2011-07-05 | Sandisk Corporation | Charge pump with current based regulation |
CN101847432B (zh) * | 2010-05-28 | 2015-04-15 | 上海华虹宏力半导体制造有限公司 | 存储器的供电结构 |
KR101764125B1 (ko) * | 2010-12-15 | 2017-08-02 | 삼성전자주식회사 | 음의 고전압 발생기 및 음의 고전압 발생기를 포함하는 비휘발성 메모리 장치 |
CN102360565B (zh) * | 2011-08-26 | 2012-10-10 | 北京兆易创新科技有限公司 | 电荷泵系统及用其产生读写操作字线电压的方法、存储器 |
US8699247B2 (en) * | 2011-09-09 | 2014-04-15 | Sandisk Technologies Inc. | Charge pump system dynamically reconfigurable for read and program |
KR20130066266A (ko) * | 2011-12-12 | 2013-06-20 | 한국전자통신연구원 | 부하변동 특성 향상을 위한 전압공급 회로 및 출력전압 공급 방법 |
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2013
- 2013-08-02 US US13/958,410 patent/US8867281B2/en active Active
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2014
- 2014-01-14 JP JP2015560181A patent/JP6302492B2/ja active Active
- 2014-01-14 KR KR1020157020580A patent/KR101775256B1/ko active IP Right Grant
- 2014-01-14 EP EP18179259.9A patent/EP3428920B1/de active Active
- 2014-01-14 EP EP22163226.8A patent/EP4040438B1/de active Active
- 2014-01-14 WO PCT/US2014/011553 patent/WO2014149165A2/en active Application Filing
- 2014-01-14 CN CN201480005641.4A patent/CN104937666B/zh active Active
- 2014-01-14 KR KR1020177024244A patent/KR101873180B1/ko active IP Right Grant
- 2014-01-14 CN CN201811323753.0A patent/CN109584914B/zh active Active
- 2014-01-14 EP EP14701667.9A patent/EP2923357B1/de active Active
- 2014-01-21 TW TW103102090A patent/TWI529720B/zh active
- 2014-01-21 TW TW105105916A patent/TWI592934B/zh active
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2018
- 2018-03-02 JP JP2018037122A patent/JP2018117519A/ja active Pending
- 2018-12-25 JP JP2018240673A patent/JP6768776B2/ja active Active
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2020
- 2020-06-24 JP JP2020108559A patent/JP7053723B2/ja active Active
Also Published As
Publication number | Publication date |
---|---|
JP2020195279A (ja) | 2020-12-03 |
TW201631587A (zh) | 2016-09-01 |
JP7053723B2 (ja) | 2022-04-12 |
EP3428920B1 (de) | 2022-04-27 |
CN109584914B (zh) | 2023-05-09 |
EP3428920A2 (de) | 2019-01-16 |
JP6768776B2 (ja) | 2020-10-14 |
EP4040438A1 (de) | 2022-08-10 |
US20140269049A1 (en) | 2014-09-18 |
CN104937666B (zh) | 2018-11-27 |
JP2016514446A (ja) | 2016-05-19 |
JP2018117519A (ja) | 2018-07-26 |
TW201503135A (zh) | 2015-01-16 |
EP2923357A2 (de) | 2015-09-30 |
KR101775256B1 (ko) | 2017-09-05 |
CN104937666A (zh) | 2015-09-23 |
KR101873180B1 (ko) | 2018-06-29 |
JP2019050730A (ja) | 2019-03-28 |
KR20150103183A (ko) | 2015-09-09 |
KR20170103024A (ko) | 2017-09-12 |
JP6302492B2 (ja) | 2018-03-28 |
WO2014149165A8 (en) | 2015-02-26 |
CN109584914A (zh) | 2019-04-05 |
EP2923357B1 (de) | 2018-08-01 |
EP3428920A3 (de) | 2019-05-08 |
EP4040438B1 (de) | 2024-09-18 |
TWI529720B (zh) | 2016-04-11 |
WO2014149165A3 (en) | 2014-11-13 |
WO2014149165A2 (en) | 2014-09-25 |
US8867281B2 (en) | 2014-10-21 |
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