TWI574782B - 自我調節硏磨墊及其製造方法 - Google Patents

自我調節硏磨墊及其製造方法 Download PDF

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Publication number
TWI574782B
TWI574782B TW102108998A TW102108998A TWI574782B TW I574782 B TWI574782 B TW I574782B TW 102108998 A TW102108998 A TW 102108998A TW 102108998 A TW102108998 A TW 102108998A TW I574782 B TWI574782 B TW I574782B
Authority
TW
Taiwan
Prior art keywords
particles
insoluble
polishing pad
foam
coated
Prior art date
Application number
TW102108998A
Other languages
English (en)
Chinese (zh)
Other versions
TW201347907A (zh
Inventor
史考特B 達斯克偉奇
Original Assignee
傑曲羅德斯公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 傑曲羅德斯公司 filed Critical 傑曲羅德斯公司
Publication of TW201347907A publication Critical patent/TW201347907A/zh
Application granted granted Critical
Publication of TWI574782B publication Critical patent/TWI574782B/zh

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/11Lapping tools
    • B24B37/20Lapping pads for working plane surfaces
    • B24B37/24Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/11Lapping tools
    • B24B37/20Lapping pads for working plane surfaces
    • B24B37/26Lapping pads for working plane surfaces characterised by the shape of the lapping pad surface, e.g. grooved
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08JWORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
    • C08J9/00Working-up of macromolecular substances to porous or cellular articles or materials; After-treatment thereof
    • C08J9/35Composite foams, i.e. continuous macromolecular foams containing discontinuous cellular particles or fragments
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08JWORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
    • C08J2203/00Foams characterized by the expanding agent
    • C08J2203/10Water or water-releasing compounds
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08JWORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
    • C08J2203/00Foams characterized by the expanding agent
    • C08J2203/14Saturated hydrocarbons, e.g. butane; Unspecified hydrocarbons
    • C08J2203/142Halogenated saturated hydrocarbons, e.g. H3C-CF3

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Mechanical Engineering (AREA)
  • Composite Materials (AREA)
  • Materials Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • Organic Chemistry (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
TW102108998A 2012-03-20 2013-03-14 自我調節硏磨墊及其製造方法 TWI574782B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US201261613398P 2012-03-20 2012-03-20

Publications (2)

Publication Number Publication Date
TW201347907A TW201347907A (zh) 2013-12-01
TWI574782B true TWI574782B (zh) 2017-03-21

Family

ID=49212255

Family Applications (1)

Application Number Title Priority Date Filing Date
TW102108998A TWI574782B (zh) 2012-03-20 2013-03-14 自我調節硏磨墊及其製造方法

Country Status (6)

Country Link
US (1) US9050697B2 (enExample)
JP (1) JP6078631B2 (enExample)
KR (1) KR101532896B1 (enExample)
CN (1) CN104302446B (enExample)
TW (1) TWI574782B (enExample)
WO (1) WO2013142134A1 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013142134A1 (en) 2012-03-20 2013-09-26 Jh Rhodes Company, Inc. A self-conditioning polishing pad and a method of making the same
US10813444B2 (en) 2018-05-16 2020-10-27 Jh Rhodes Company, Inc. Porous polymeric polishing bristles and methods for their manufacture
KR101783406B1 (ko) * 2016-12-07 2017-10-10 엠.씨.케이 (주) 연마 패드 및 이의 제조방법
US11551936B2 (en) 2018-07-31 2023-01-10 Taiwan Semiconductor Manufacturing Co., Ltd. Self-healing polishing pad
CN112080209B (zh) * 2020-09-11 2022-04-12 宁波江丰电子材料股份有限公司 一种冷却水盘和冷却管的粘结方法
TWI869702B (zh) * 2021-09-02 2025-01-11 美商Cmc材料有限責任公司 包含聚合物顆粒之紋理化cmp墊

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200404648A (en) * 2002-05-23 2004-04-01 Cabot Microelectronics Corp Microporous polishing pads
TW200414967A (en) * 2002-11-05 2004-08-16 Jsr Corp Polishing pad
TW200528529A (en) * 2000-05-31 2005-09-01 Jsr Corp Composition for polishing pad and polishing pad using the same
US20100221983A1 (en) * 2009-01-05 2010-09-02 Innopad, Inc. Multi-layered chemical-mechanical planarization pad
TW201130656A (en) * 2009-12-22 2011-09-16 3M Innovative Properties Co Polishing pad and method of making the same

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4155790B2 (ja) * 2002-10-18 2008-09-24 株式会社東芝 化学機械研磨方法及び素子微細化分離用研磨パッド
US20040224622A1 (en) * 2003-04-15 2004-11-11 Jsr Corporation Polishing pad and production method thereof
US20050176251A1 (en) * 2004-02-05 2005-08-11 Duong Chau H. Polishing pad with releasable slick particles
US7323415B2 (en) 2004-04-23 2008-01-29 Jsr Corporation Polishing pad for semiconductor wafer, polishing multilayered body for semiconductor wafer having same, and method for polishing semiconductor wafer
JP4897238B2 (ja) * 2005-05-17 2012-03-14 東洋ゴム工業株式会社 研磨パッド
US7169031B1 (en) * 2005-07-28 2007-01-30 3M Innovative Properties Company Self-contained conditioning abrasive article
JP4379462B2 (ja) * 2006-10-31 2009-12-09 Jsr株式会社 研磨パッド用組成物及びこれを用いた研磨パッド
US8491360B2 (en) * 2007-10-26 2013-07-23 Innopad, Inc. Three-dimensional network in CMP pad
KR100955032B1 (ko) * 2008-05-20 2010-04-28 (주)피에스텍 연마용 폴리우레탄 흡착 패드 조성물, 연마용 폴리우레탄흡착 패드 및 그 제조방법
SG176151A1 (en) * 2009-05-27 2011-12-29 Rogers Corp Polishing pad, polyurethane layer therefor, and method of polishing a silicon wafer
WO2012138705A2 (en) 2011-04-05 2012-10-11 Universal Photonics, Inc. A self-conditioning polishing pad and a method of making the same
WO2013142134A1 (en) 2012-03-20 2013-09-26 Jh Rhodes Company, Inc. A self-conditioning polishing pad and a method of making the same

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200528529A (en) * 2000-05-31 2005-09-01 Jsr Corp Composition for polishing pad and polishing pad using the same
TW200404648A (en) * 2002-05-23 2004-04-01 Cabot Microelectronics Corp Microporous polishing pads
TW200414967A (en) * 2002-11-05 2004-08-16 Jsr Corp Polishing pad
US20100221983A1 (en) * 2009-01-05 2010-09-02 Innopad, Inc. Multi-layered chemical-mechanical planarization pad
TW201130656A (en) * 2009-12-22 2011-09-16 3M Innovative Properties Co Polishing pad and method of making the same

Also Published As

Publication number Publication date
KR101532896B1 (ko) 2015-06-30
JP6078631B2 (ja) 2017-02-08
TW201347907A (zh) 2013-12-01
CN104302446A (zh) 2015-01-21
JP2015510847A (ja) 2015-04-13
WO2013142134A1 (en) 2013-09-26
KR20140130240A (ko) 2014-11-07
US9050697B2 (en) 2015-06-09
US20130252519A1 (en) 2013-09-26
CN104302446B (zh) 2017-10-31

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