TWI561824B - Contact inspection device - Google Patents

Contact inspection device

Info

Publication number
TWI561824B
TWI561824B TW103145004A TW103145004A TWI561824B TW I561824 B TWI561824 B TW I561824B TW 103145004 A TW103145004 A TW 103145004A TW 103145004 A TW103145004 A TW 103145004A TW I561824 B TWI561824 B TW I561824B
Authority
TW
Taiwan
Prior art keywords
inspection device
contact inspection
contact
inspection
Prior art date
Application number
TW103145004A
Other languages
English (en)
Chinese (zh)
Other versions
TW201538984A (zh
Inventor
Tsuyoshi Muramoto
Original Assignee
Nihon Micronics Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Micronics Kk filed Critical Nihon Micronics Kk
Publication of TW201538984A publication Critical patent/TW201538984A/zh
Application granted granted Critical
Publication of TWI561824B publication Critical patent/TWI561824B/zh

Links

TW103145004A 2014-02-07 2014-12-23 Contact inspection device TWI561824B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014022683A JP6546719B2 (ja) 2014-02-07 2014-02-07 接触検査装置

Publications (2)

Publication Number Publication Date
TW201538984A TW201538984A (zh) 2015-10-16
TWI561824B true TWI561824B (en) 2016-12-11

Family

ID=53892010

Family Applications (1)

Application Number Title Priority Date Filing Date
TW103145004A TWI561824B (en) 2014-02-07 2014-12-23 Contact inspection device

Country Status (2)

Country Link
JP (1) JP6546719B2 (cg-RX-API-DMAC7.html)
TW (1) TWI561824B (cg-RX-API-DMAC7.html)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6890921B2 (ja) 2015-10-21 2021-06-18 株式会社日本マイクロニクス プローブカード及び接触検査装置
JP6704733B2 (ja) * 2016-01-08 2020-06-03 株式会社日本マイクロニクス プローブ、プローブカード及び接触検査装置
WO2018101232A1 (ja) * 2016-11-30 2018-06-07 日本電産リード株式会社 接触端子、検査治具、及び検査装置
JP6969930B2 (ja) * 2017-08-24 2021-11-24 株式会社日本マイクロニクス プローブ
CN108490242B (zh) * 2018-04-02 2020-03-27 国网江苏省电力有限公司徐州供电分公司 一种新型验电装置
DE102022119935A1 (de) * 2022-08-08 2024-02-08 Ingun Prüfmittelbau Gmbh Prüfstiftvorrichtung

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2030089U (zh) * 1988-05-24 1989-01-04 李牧 螺旋刃活检针
TWM249021U (en) * 2002-10-15 2004-11-01 Autmwell Entpr Co Ltd Contact terminal structure of seat for IC testing
US7231725B2 (en) * 2005-05-11 2007-06-19 Dr. Johannes Heidenhain Gmbh Probing pin and probe system equipped therewith
TWM328566U (en) * 2006-07-04 2008-03-11 Yu-Shen Chen Conductive complex tips spring probe contact unit
WO2012176289A1 (ja) * 2011-06-22 2012-12-27 株式会社メイコー スパイラルプローブ及びその製造方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0817500A (ja) * 1994-06-30 1996-01-19 Advantest Corp Ｂｇａｉｃ用ソケット及びこれに用いるスプリングピン
JP3851464B2 (ja) * 1999-03-04 2006-11-29 株式会社日立製作所 マニピュレータおよびそれを用いたプローブ装置、試料作製装置
US7601009B2 (en) * 2006-05-18 2009-10-13 Centipede Systems, Inc. Socket for an electronic device
US7491069B1 (en) * 2008-01-07 2009-02-17 Centipede Systems, Inc. Self-cleaning socket for microelectronic devices
JP5208619B2 (ja) * 2008-08-25 2013-06-12 日置電機株式会社 プローブおよびプローブユニット
JP5255459B2 (ja) * 2009-01-06 2013-08-07 日本電子材料株式会社 コンタクトプローブ
JP2010281583A (ja) * 2009-06-02 2010-12-16 Nidec-Read Corp 検査用治具
JP5821432B2 (ja) * 2011-09-05 2015-11-24 日本電産リード株式会社 接続端子及び接続治具

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2030089U (zh) * 1988-05-24 1989-01-04 李牧 螺旋刃活检针
TWM249021U (en) * 2002-10-15 2004-11-01 Autmwell Entpr Co Ltd Contact terminal structure of seat for IC testing
US7231725B2 (en) * 2005-05-11 2007-06-19 Dr. Johannes Heidenhain Gmbh Probing pin and probe system equipped therewith
TWM328566U (en) * 2006-07-04 2008-03-11 Yu-Shen Chen Conductive complex tips spring probe contact unit
WO2012176289A1 (ja) * 2011-06-22 2012-12-27 株式会社メイコー スパイラルプローブ及びその製造方法

Also Published As

Publication number Publication date
JP6546719B2 (ja) 2019-07-17
JP2015148561A (ja) 2015-08-20
TW201538984A (zh) 2015-10-16

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