GB201408522D0 - Device testing - Google Patents

Device testing

Info

Publication number
GB201408522D0
GB201408522D0 GBGB1408522.9A GB201408522A GB201408522D0 GB 201408522 D0 GB201408522 D0 GB 201408522D0 GB 201408522 A GB201408522 A GB 201408522A GB 201408522 D0 GB201408522 D0 GB 201408522D0
Authority
GB
United Kingdom
Prior art keywords
device testing
testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GBGB1408522.9A
Other versions
GB2526110A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
DIAGNOSYS TEST SYSTEMS Ltd
Original Assignee
DIAGNOSYS TEST SYSTEMS Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by DIAGNOSYS TEST SYSTEMS Ltd filed Critical DIAGNOSYS TEST SYSTEMS Ltd
Priority to GB1408522.9A priority Critical patent/GB2526110A/en
Publication of GB201408522D0 publication Critical patent/GB201408522D0/en
Publication of GB2526110A publication Critical patent/GB2526110A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31905—Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
    • G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Environmental & Geological Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
GB1408522.9A 2014-05-14 2014-05-14 Device testing Withdrawn GB2526110A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB1408522.9A GB2526110A (en) 2014-05-14 2014-05-14 Device testing

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB1408522.9A GB2526110A (en) 2014-05-14 2014-05-14 Device testing

Publications (2)

Publication Number Publication Date
GB201408522D0 true GB201408522D0 (en) 2014-06-25
GB2526110A GB2526110A (en) 2015-11-18

Family

ID=51032730

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1408522.9A Withdrawn GB2526110A (en) 2014-05-14 2014-05-14 Device testing

Country Status (1)

Country Link
GB (1) GB2526110A (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110073227B (en) * 2016-12-20 2022-07-29 夸利陶公司 Universal probe assembly with five degrees of freedom
CN114814440B (en) * 2022-06-27 2022-09-09 长春职业技术学院 Detection mechanism of electric automation equipment

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6481242A (en) * 1987-09-24 1989-03-27 Hitachi Ltd Probe inspection device
US4975637A (en) * 1989-12-29 1990-12-04 International Business Machines Corporation Method and apparatus for integrated circuit device testing
US6825680B1 (en) * 2000-06-20 2004-11-30 Nortel Networks Limited Automated semiconductor probing device
FR2884616B1 (en) * 2005-04-19 2007-08-03 Gestamatic Sarl DEVICE FOR SIMPLIFYING THE TEST INTERFACES FOR AN ELECTRONIC CARD
DE102012014812A1 (en) * 2012-07-26 2014-01-30 Etel S.A. Apparatus for testing wafers

Also Published As

Publication number Publication date
GB2526110A (en) 2015-11-18

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Legal Events

Date Code Title Description
WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)