TWI550977B - Contact sheet and socket structure - Google Patents

Description

Contact piece and pin holder

The present invention relates to a contact sheet, and more particularly to a contact sheet that is disposed to be in contact with a test target device including an electrode pattern, the electrode pattern having electrical connection for electrical connection with the test target device a predetermined configuration, the contact piece is provided as a sheet having a predetermined area and a thickness, the contact sheet comprising: a sheet body as a main portion of the contact sheet, the sheet body having a predetermined area and formed of an insulating material, The sheet body forms a main portion of the contact sheet; and a plurality of contact pattern elements disposed in the sheet body and configured to be electrically connected to the electrode pattern of the test target device, wherein the contact sheet is at an outer portion thereof and a central portion There are different thicknesses.

The pin is an intermediate portion for connecting the electrical device. That is, the pins are used together with the electrical device to facilitate the connection of the electrical device. Also because the pins are used with conventional electrical components, the pins are used in a variety of applications, for example, when testing various electrical components.

When the pin is connected to the device to be tested, it is extremely important to establish a reliable contact between the pad of the pin and the terminal of the device.

However, a device having a large size and a large number of terminals is susceptible to warping, and thus the flatness of the device may vary from its outer portion to the intermediate portion. So this The terminals of the devices may have different heights, and thus contact errors may occur.

By way of example, Figure 1 illustrates a device D1 having an outer portion that is curved downward. In this case, a connection error can occur between pin D2 and the terminal of device D1. In particular, the possibility of a connection error can be high at the center terminal of device D1. The opposite is also possible. In the opposite case, a connection error may occur particularly at the external terminals of device D1.

Therefore, there is a need for a component that ensures a reliable connection between the pin and the device.

The present invention has been made to solve the above problems, and an object of the present invention is to provide a contact piece which is disposed to be in contact with a test target device including an electrode pattern having a function for electrically reacting with a test target device a predetermined configuration of the connection, the contact piece being provided as a sheet having a predetermined area and a thickness, the contact sheet comprising: a sheet body having a predetermined area and formed of an insulating material, the sheet body forming a main portion of the contact sheet; and a plurality of contact pattern elements An electrode pattern disposed in the sheet body and disposed to be electrically connected to the test target device, wherein the contact piece has a different thickness at the outer portion and the central portion.

According to an embodiment of the invention, a contact strip is arranged to be in contact with a test target device comprising an electrode pattern having a predetermined configuration for electrical connection with the test target device, the contact patch Provided as a sheet having a predetermined area and a thickness, the contact sheet comprising: a sheet body as a main portion of the contact sheet, having a predetermined area and formed of an insulating material; and a plurality of a contact pattern element disposed in the sheet body and configured to be electrically connected to the electrode pattern of the test target device, wherein the contact piece has a different thickness at an outer portion and a central portion of the contact piece .

Preferably, the contact piece has an increased thickness from the outer portion of the contact piece to the central portion.

Preferably, the contact piece has a reduced thickness from the outer portion of the contact piece to the central portion.

Preferably, at least one of the contact piece selected from the upper surface and the lower surface is a circle having a predetermined radius of curvature.

Preferably, the contact piece comprises: a flat lower surface; and an upper surface having a convex shape rising in a direction from the outer portion of the contact piece to the central portion, or from the contact a concave shape in which the outer portion of the sheet descends in the direction of the central portion.

Preferably, the contact pattern element comprises an elastic insulating material and a conductive powder contained in the elastic insulating material.

Preferably, the contact piece further comprises an upper film covering the upper surface of the contact piece.

According to an embodiment of the present invention, a pin holder is disposed to be in contact with a test target device including an electrode pattern having a predetermined configuration for electrically connecting to the test target device, the pin holder The method includes a pin body including a predetermined pin pattern, and a contact piece disposed on the pin body, wherein the contact piece is disposed as a sheet having a predetermined area and a thickness, and includes: as the contact a sheet body of a main portion of the sheet having a predetermined area and comprising an insulating material; and a plurality of contact pattern elements disposed in the sheet body and The electrode pattern disposed to be electrically connected to the test target device and the pin pattern of the pin body, wherein the contact piece has a different thickness at an outer portion and a central portion of the contact piece.

Preferably, the pin base further comprises a contact film between the contact piece and the pin body, wherein the contact film comprises: a film body having a predetermined area and comprising an insulating material, the film body forming body a main portion of the contact film; and a plurality of thin film pattern elements disposed in the film body and contacting the contact pattern element of the contact piece and the pin pattern of the pin body for use in Electrical connections are made therebetween, wherein the thin film pattern elements form a conductive elastic region.

Preferably, the contact pattern element comprises an elastic insulating material and a conductive powder contained in the elastic insulating material.

Preferably, the film body includes a through hole region, and the contact pattern member is disposed in the through hole region.

According to the present invention, since the contact piece has a different thickness at its outer portion and the central portion, when the contact piece is brought into contact with the device to be tested, the contact piece can be surely electrically connected to the device for ensuring test reliability.

100‧‧‧Contact film

110‧‧‧Sheet body

120‧‧‧Contact pattern elements

122‧‧‧Electrical powder

124‧‧‧elastic insulation

140‧‧‧Upper film

200‧‧‧ pin body

210‧‧‧ pin pattern

300‧‧‧Test target device

310‧‧‧electrode pattern

400‧‧‧Contact film

D1‧‧‧ device

D2‧‧‧ feet

H‧‧‧ gap

M‧‧‧ thickness

m‧‧‧Mold

N‧‧‧ thickness

P‧‧‧ recessed area

Q‧‧‧Mold pins

S‧‧矽矽

BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a view for explaining how a pin base of the related art is connected to a device.

2 is a diagram illustrating a contact piece in accordance with an embodiment of the present invention.

FIG. 3 is a view illustrating a contact piece according to another embodiment of the present invention.

4 is an enlarged view illustrating a contact piece in accordance with an embodiment of the present invention.

FIG. 5 is an enlarged view illustrating a contact piece according to another embodiment of the present invention.

6 is a diagram illustrating a pin holder including a contact piece in accordance with an embodiment of the present invention.

FIG. 7 is a view illustrating a pin holder including a contact piece according to another embodiment of the present invention.

FIG. 8 is a view illustrating a pin holder including a contact piece according to another embodiment of the present invention.

9 is a diagram illustrating a pin base including a contact piece in accordance with another embodiment of the present invention.

FIG. 10 is a view illustrating a pin base including a contact piece according to another embodiment of the present invention.

Figure 11 is a diagram illustrating how a device is coupled to a pin header including a contact strip in accordance with an embodiment of the present invention.

Figure 12 is a diagram illustrating how a device is coupled to a pin holder including a contact strip in accordance with another embodiment of the present invention.

13 through 15 are diagrams illustrating a method of manufacturing a contact piece in accordance with an embodiment of the present invention.

Hereinafter, preferred embodiments of the present invention will be described with reference to the accompanying drawings.

2 and 3 are diagrams illustrating a contact sheet 100 in accordance with an embodiment of the present invention, and FIGS. 4 and 5 are enlarged views illustrating a contact sheet 100 in accordance with an embodiment of the present invention. 6 through 10 illustrate the inclusion of contact pads in accordance with an embodiment of the present invention. A diagram of a pin header of 100, and Figures 11 and 12 are diagrams illustrating how the device is coupled to a pin header including a contact strip 100 in accordance with an embodiment of the present invention. 13 through 15 are diagrams illustrating a method of manufacturing a contact piece 100 in accordance with an embodiment of the present invention.

According to an embodiment of the invention, the contact strip 100 is arranged to be in contact with a test target device having an electrode pattern for electrical connection with the test target device. The contact piece 100 is formed of a sheet having a predetermined area and thickness. The contact sheet 100 includes: a sheet body 110 as a main body formed of an insulating material and having a predetermined area; and a plurality of contact pattern elements 120 disposed in the sheet body 110 and configured to be electrically connected to the test target device Electrode pattern. The contact piece 100 has a different thickness at its outer portion and the central portion.

As a whole, the contact piece 100 is a sheet having a predetermined area and thickness.

The contact piece 100 includes a sheet body 110 as a main body, which is formed of an insulating material and has a predetermined area. The sheet body 110 is a sheet-shaped member having a predetermined thickness and area and forming a body of the contact sheet 100. The sheet body 110 is formed of an insulating flexible material. For example, the sheet body 110 may be formed of: a rubber; a synthetic resin such as a polyimide resin, a liquid crystalline polymer, a polyester, or a fluorine resin (fluorine) -containing resin); or silicone. However, the sheet body 110 is not limited thereto.

The number of contact pattern elements 120 is two or more, and the contact pattern elements 120 are disposed in the sheet body 110 in a shape corresponding to the electrode pattern of the test target device to be brought into contact with the contact pattern elements 120. The configuration and number of contact pattern elements 120 are not limited as long as the contact pattern elements 120 correspond to the electrode patterns of the device to be tested using the contact strips 100 and can be connected to the electrode patterns of the device. The contact pattern element 120 can be a shim having a predetermined area and thickness and disposed in the sheet body 110 while occupying some areas of the sheet body 110. The contact pattern element 120 is formed by distributing a conductive powder in the elastic insulating material in a thickness direction of an elastic insulating material such as an anthrone rubber.

The contact pattern element 120 is configured in such a manner that at least a portion of the contact pattern element 120 can overlap the electrode pattern of the device. That is, the configuration of the contact pattern element 120 corresponds to the electrode pattern of the device to be tested such that at least a portion of the contact pattern element 120 can overlap the electrode pattern of the device. Herein, the term "overlap" may be interpreted as a word expressing a state in which the contact pattern element 120 of the contact piece 100 at least partially covers the electrode pattern of the device to be tested when the contact piece 100 is placed on the device and viewed from above.

According to the invention, the contact strip 100 has a different thickness at its outer portion and the central portion. For example, as illustrated in FIG. 2 , the thickness M of the outer portion of the contact strip 100 may be less than the thickness N of the central portion of the contact strip 100 . Therefore, the contact piece 100 may have an inclined surface, and the central portion of the contact piece 100 may have a substantially elevated shape. In Figure 2, the outermost portion of the contact strip 100 is sharp. However, the contact piece 100 is not limited thereto. In another example, the outermost portion of the contact strip 100 can have a portion of a constant thickness.

In another example, as depicted in FIG. 3, the thickness M of the outer portion of the contact strip 100 can be greater than the thickness N of the central portion of the contact strip 100. Accordingly, the contact piece 100 may have an inclined surface, and the outer portion of the contact piece 100 may have a substantially elevated shape. The contact piece 100 is not limited to having a varying thickness over its entire area. For example, the contact strip 100 can have a constant thickness region.

According to an embodiment, the thickness of the contact strip 100 can be from its outer portion to The direction of the central portion increases or decreases, and the contact piece 100 may have a circular cross-sectional shape with a predetermined radius of curvature. That is, according to an embodiment, the contact piece 100 may have an inclined cross-sectional shape that is not straight but rounded.

According to an embodiment, the contact strip 100 has a flat lower surface and a convex or concave upper surface that gradually rises or falls from the outer portion to the central portion. That is, according to an embodiment, the contact piece 100 may have a relatively thick inner region, a flat lower surface, and a convex upper surface that rises in a direction from the outer portion to the central portion. In another example, the contact strip 100 can have a relatively thin outer portion, a relatively thick central portion, a flat lower surface, and a concave upper surface that rises in a direction from the central portion to the outer portion.

As described above, the contact sheet 100 of the present invention has different thicknesses at its central portion and outer portion. Therefore, when the contact piece 100 is brought into contact with the device to be tested, a reliable electrical connection can be made.

For example, in the related art, since the pins having a uniform height as shown in FIG. 1 are used, it is possible to reliably prevent the electrodes of the device to be tested from coming into contact with the pins. That is, when the test target device D1 is electrically connected to the pin base D2, if the device D1 is large and has an electrode pattern formed of a large number of terminals, the device D1 can be warped. In this case, if the outer portion of the electrode pattern of the upper device D1 is lowered as illustrated in FIG. 1, the gap H formed under the electrode pattern may become uneven, and thus compared with the outer portion of the electrode pattern. The inner portion of the electrode pattern may not be reliably brought into contact with the pin holder D2. Therefore, contact errors may occur. On the contrary, if the outer portion of the electrode pattern is relatively high and the inner portion of the electrode pattern is relatively low, a contact error may occur at the outer portion of the electrode pattern.

However, according to the present invention, the contact sheet 100 having a partially varying thickness It serves as an intermediate contact portion between the device to be tested and the pin holder, thereby preventing the above-mentioned contact error and ensuring reliable contact between the device and the pin holder. Further, the contact sheet 100 of the present invention has different thicknesses at its outer portion and the central portion, thereby preventing such contact errors caused by gaps varying from the outer portion to the inner portion of the electrode pattern.

Preferably, the sheet body 110 comprises an anthrone rubber, and the contact pattern element 120 is formed of a mixture of an anthrone and a conductive powder 122.

In accordance with an embodiment of the present invention, preferably, the contact pattern element 120 is formed of an elastic insulating material 124 and a conductive powder 122 contained in the elastic insulating material 124. The elastic insulating material 124 may be a material such as an anthrone rubber having high elasticity and insulating properties. However, the elastic insulating material 124 is not limited thereto. For example, the elastic insulating material 124 can be an elastic material such as a urethane resin, an epoxy resin, or an acrylic resin. However, the elastic insulating material 124 is not limited thereto.

The conductive powder 122 may contain a large amount of conductive particles having a predetermined size. As described above, the electrically conductive powder 122 having electrical conductivity may be dispersed in the elastic insulating material 124.

Preferably, the conductive powder 122 may be formed of a magnetic material such that the conductive powder 122 may be easily distributed in the thickness direction of the contact pattern element 120. Examples of the conductive powder 122 include particles of a magnetic metal such as iron, cobalt or nickel; particles of an alloy thereof; particles containing such a magnetic metal; and highly conductive metals coated with gold, silver, palladium or rhodium Particles; particles of an inorganic material such as a non-magnetic metal or glass or particles coated with a polymer of a conductive magnetic material such as nickel or cobalt; and particles coated with a conductive magnetic material and a highly conductive metal.

Preferably, the conductive powder 122 may be a metal coated with, for example, the following Nickel particles: gold, silver, rhodium, palladium, rhodium, tungsten, molybdenum, platinum or rhodium. Further, the conductive powder 122 may preferably be a particle coated with a plurality of metals, for example, nickel particles coated with silver and gold. In this case, the method of coating the particles (core particles) with a conductive metal is not limited. For example, electroless plating or electroplating can be used.

If the conductive powder 122 is obtained by coating the core particles with a conductive metal, the coating ratio of the conductive metal on the surface of the core particles (ratio of the area coated with the conductive metal to the total surface area of the core particles) may be compared Preferably, it is 40% or more, more preferably 45% or more, and even more preferably 47% to 95%. The amount of the conductive metal formed on the core particles may preferably be from 0.5% by weight to 50% by weight of the core particles, more preferably from 2% by weight to 30% by weight of the core particles, still more preferably from 3% by weight to 25% by weight of the core particles, And even more preferably from 4 wt% to 20 wt% of the core particles. If the conductive metal is gold, the amount of gold is preferably from 0.5% by weight to 30% by weight of the core particles, more preferably from 2% by weight to 20% by weight of the core particles, still more preferably from 3% by weight to 15% by weight of the core particles, and even More preferably, the core particles are from 4% by weight to 10% by weight. If the conductive metal is silver, the amount of silver is preferably from 4 wt% to 50 wt% of the core particles, more preferably from 5 wt% to 40 wt% of the core particles, and still more preferably from 10 wt% to 30 wt% of the core particles.

Further, the particle diameter of the conductive powder 122 is preferably from 1 μm to 1000 μm, more preferably from 2 μm to 500 μm, still more preferably from 5 μm to 300 μm, and even more preferably from 10 μm to 200 μm. Further, the particle size distribution (Dw/Dn) of the conductive powder 122 is preferably from 1 to 10, more preferably from 1.01 to 7, still more preferably from 1.05 to 5, and even more preferably from 1.1 to 4. If the conductive powder 122 satisfies the above conditions, the contact pattern element 120 which is easily deformable by pressure can be obtained, and the particles of the conductive powder 122 can be sufficiently brought into electrical contact with each other. Further, the shape of the particles of the conductive powder 122 is not limited thereby. However, when considering the dispersion in the polymer forming material, the particles of the conductive powder 122 may preferably have a spherical shape, a star shape, or a cluster shape formed by secondary particles in which the particles are clustered together.

The contact pattern element 120 can be disposed in the sheet body 110, as depicted in FIG. That is, the sheet body 110 may have a penetrating aperture region, and the contact pattern elements 120 may be disposed in the penetrating aperture regions, respectively. If the configurations are relatively explained, it will be understood that the pattern electrodes constituting the contact pattern elements 120 are separately disposed, and the sheet body 110 is disposed in a gap between the pattern electrodes to support the contact pattern elements 120.

As described above, the contact pattern element 120 includes an elastic insulating material 124, and a conductive powder 122 distributed in the elastic insulating material 124. Therefore, if the contact pattern element 120 is pushed by the terminal of the test target device, the particles of the conductive powder 122 are brought into contact with each other, and thus enter a conductive state.

Due to this structure, the contact pattern element 120 can form a conductive elastic region and can enter a conductive state according to the contact pressure applied thereto. As described above, the contact pattern element 120 is formed as a conductive elastic region, thereby preventing scratching and damage caused by pressure applied to the conductive elastic region when the terminal of the device is brought into contact with the contact pattern member 120. That is, according to the present invention, the contact pattern element 120 of the contact strip 100 is disposed on the electrode of the device, and since the contact pattern element 120 has both conductivity and elasticity, the contact pattern element 120 can act as a scratch that does not cause scratching and impact damage. Intermediate contact element.

Preferably, as shown in FIG. 5 , the contact piece 100 may further include an upper film 140 covering the upper surface of the contact piece 100 . Although not clearly illustrated, similar to the contact sheet 100, the upper film 140 may preferably include a non-conductive region and a conductive region to allow current flow. The upper film 140 can be used as a cover film The film is disposed on the contact pattern element 120 and the upper surface of the sheet body 110. In this case, the conductive region of the upper film 140 may be disposed on the upper surface of the contact pattern member 120. Therefore, the upper surface of the contact piece 100 can be protected from impact or foreign matter. Figure 5 illustrates an embodiment in which the upper film 140 is disposed on the contact sheet 100, the contact sheet being relatively thicker at its central portion than its outer portion. However, the upper film 140 can be used for a relatively thick condition of the contact sheet 100 at its outer portion.

6 to 10 are views illustrating a pin base according to an embodiment of the present invention, and Figs. 11 and 12 are views illustrating a connection between a pin base and a device.

According to an embodiment of the invention, the pin holder is arranged to be in contact with the test target device 300, the test target device comprising an electrode pattern 310 having a predetermined configuration. The pin holder includes: a pin body 200 including a predetermined pin pattern 210; and a contact piece 100 disposed on the pin body 200. The contact piece 100 has a predetermined area and a thickness. The contact sheet 100 includes: a sheet body 110 as a main portion of the contact sheet 100 having a predetermined area and formed of an insulating material; and a plurality of contact pattern elements 120 disposed in the sheet body 110 and configured to be electrically connected to the test The electrode pattern 310 of the target device 300 and the pin pattern 210 of the pin body 200. The contact piece 100 has a different thickness at its outer portion and the central portion.

In accordance with the present invention, the contact strip 100 can be included in a pin holder for testing the test target device 300. That is, according to the present invention, the pin base may include the contact piece 100. In other words, the pin base of the present invention may include: a pin body 200; a pin pattern 210 included in the pin body 200 and including an electrode; and a contact piece 100. In this case, the pin pattern 210 is in contact with the contact pattern element 120 of the contact strip 100 for electrical connection with the contact pattern element 120, and the contact strip 100 is in its outer portion The portions at the center portion have different thicknesses.

Therefore, the height of the upper surface of the pin base changes from the central portion thereof to the outer portion, thereby preventing contact errors caused by the gap which varies from the outer portion and the inner portion of the electrode pattern 310. BRIEF DESCRIPTION OF THE DRAWINGS The contact sheet 100 has a condition of an outer portion thicker than its central portion, and the contact sheet 100 has a thinner outer portion than its central portion. In addition, FIG. 10 illustrates an embodiment in which the contact sheet 100 includes the upper film 140.

Preferably, the pin base may further include a contact film 400 disposed between the contact piece 100 and the pin body 200. The contact film 400 may include: a film body having a predetermined area and formed of an insulating material, the film body forming a main portion of the contact film 400; and a plurality of thin film pattern elements disposed in the film body and contacting the contact pattern of the contact piece 100 The element 120 and the pin pattern 210 of the pin body 200 are used to make electrical connections therebetween. The thin film pattern element can form a conductive elastic region.

The contact film 400 may be a sheet-shaped member having a predetermined area and thickness. The contact film 400 may include a film body formed of an insulating material; and a film pattern member disposed in the film body. The thin film pattern element may be disposed between the pin pattern 210 of the pin body 200 and the contact pattern element 120 of the contact piece 100 for electrical connection therebetween. Preferably, the film body may comprise an anthrone rubber, and the film pattern element may be formed from a mixture of an anthrone and a conductive powder. Therefore, the thin film pattern element can enter a conductive state in accordance with the contact pressure applied thereto. That is, the thin film pattern element can form a conductive elastic region. Therefore, the scratch and damage caused by the pressure can be prevented when the terminal of the device is brought into contact with the pin holder.

Further, the film body may include a through hole region, and the thin film pattern member may be disposed in the through hole region. In other words, the film body can include a penetrating hole region and is used for the shape The material of the thin film pattern element may be filled in the through hole region to form a thin film pattern element as a conductive elastic region.

According to the embodiment of the present invention, since the pin holder has the above structure, the pin holder can be easily connected to the test target device.

13 to 15 are views for sequentially explaining a method of manufacturing the contact piece 100 according to an embodiment of the present invention.

First, a mold m is prepared. The mold m has a recess corresponding to the shape of the contact piece 100 to be formed according to the present invention. For example, the mold m may have a recess corresponding to the shape of the contact piece 100, the contact piece having a different thickness at its outer portion and the central portion. For example, if it is intended to form a contact piece 100 having a relatively thin outer portion, the mold m may have a relatively deep recessed area P at its inner region, as illustrated in Figures 13-15. In a relative condition (not shown), the mold m may have a recessed area P which is relatively shallow at the inner portion and relatively deep at the outer portion.

Next, a material such as an anthrone S is filled in the recessed area P to form the contact piece 100 according to the present invention. At this time, the fluorenone S may contain a synthetic resin as described above, and when the fluorenone S is filled in the concave region P, the fluorenone S may be hardened by a process such as a heating process to form a contact piece according to the present invention. 100.

In this case, the die pin Q can be placed in the recessed area P of the mold m. For example, a current may be applied to the mold pin Q to form an electric field, and the number of mold pins Q may be at least two.

For example, the liquid fluorenone S to be filled in the recessed area P may contain the above-described conductive powder 122. The distribution of the conductive powder 122 contained in the liquid fluorenone S can be controlled by an electric field formed as described above.

Before the liquid fluorenone S containing the conductive powder 122 is hardened in the recessed region P, an electric field may be formed around the die pin Q to densely distribute the conductive powder 122 around the die pin Q. Next, the contact pattern element 120 may be formed in a region where the conductive powder 122 is densely distributed. In this way, the contact sheet 100 of the present invention can be fabricated.

Although the preferred embodiments of the present invention have been described with reference to the drawings, the invention is not limited to the embodiments. It will be appreciated by those skilled in the art that various modifications and changes can be made in the present invention without departing from the spirit and scope of the invention.

100‧‧‧Contact film

110‧‧‧Sheet body

120‧‧‧Contact pattern elements

M‧‧‧ thickness

N‧‧‧ thickness

Claims (11)

a contact sheet disposed to be in contact with a test target device including an electrode pattern having a predetermined configuration for electrically connecting to the test target device, the contact sheet being configured to have a predetermined area and a sheet having a thickness, the contact sheet comprising: a sheet body as a main portion of the contact sheet having a predetermined area and formed of an insulating material; and a plurality of contact pattern elements disposed in the sheet body and configured The electrode pattern is electrically connected to the test target device, wherein the contact piece has a different thickness at an outer portion and a central portion of the contact piece. The contact sheet of claim 1, wherein the contact piece has an increased thickness from the outer portion of the contact piece to the central portion. The contact sheet of claim 1, wherein the contact piece has a reduced thickness from the outer portion of the contact piece to the central portion. The contact sheet of claim 1, wherein at least one of the contact piece selected from the upper surface and the lower surface is a circular shape having a predetermined radius of curvature. The contact sheet of claim 1, wherein the contact piece comprises: a flat lower surface; and an upper surface having a rise in a direction from the outer portion of the contact piece to the central portion a convex shape, or a concave shape that descends in a direction from the outer portion of the contact piece to the central portion. The contact sheet of claim 1, wherein the contact pattern element comprises an elastic insulating material and a conductive powder contained in the elastic insulating material. The contact sheet of claim 1, further comprising an upper film covering an upper surface of the contact piece. A pin holder configured to be in contact with a test target device including an electrode pattern having a predetermined configuration for electrically connecting to the test target device, the pin holder comprising: a pin body And including a predetermined pin pattern; and a contact piece disposed on the pin body, wherein the contact piece is provided as a sheet having a predetermined area and a thickness, and includes: as a main portion of the contact piece a sheet body having a predetermined area and including an insulating material; and a plurality of contact pattern elements disposed in the sheet body and configured to be electrically connected to the electrode pattern of the test target device and the pin body The pin pattern, wherein the contact piece has a different thickness at an outer portion and a central portion of the contact piece. The pin base of claim 8, further comprising a contact film between the contact piece and the pin body, wherein the contact film comprises: a film body having a predetermined area and including insulation a material, the film body forming a main portion of the contact film; and a plurality of thin film pattern elements disposed in the film body and contacting the contact pattern element of the contact piece and the body of the pin body The pin pattern is used for electrical connection therebetween, wherein the thin film pattern element forms a conductive elastic region. The pin base of claim 9, wherein the thin film pattern element comprises an elastic insulating material and a conductive powder contained in the elastic insulating material. The pin base of claim 9, wherein the film body comprises a penetration hole region, and the contact pattern element is disposed in the penetration hole region.