TWI527132B - 晶片封裝,電子計算裝置及用以傳遞信號之方法 - Google Patents
晶片封裝,電子計算裝置及用以傳遞信號之方法 Download PDFInfo
- Publication number
- TWI527132B TWI527132B TW100128699A TW100128699A TWI527132B TW I527132 B TWI527132 B TW I527132B TW 100128699 A TW100128699 A TW 100128699A TW 100128699 A TW100128699 A TW 100128699A TW I527132 B TWI527132 B TW I527132B
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- Prior art keywords
- semiconductor dies
- semiconductor
- ramp
- ramp assembly
- semiconductor die
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- H—ELECTRICITY
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/24—Coupling light guides
- G02B6/42—Coupling light guides with opto-electronic elements
- G02B6/43—Arrangements comprising a plurality of opto-electronic elements and associated optical interconnections
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/117—Shapes of semiconductor bodies
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- H—ELECTRICITY
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W46/00—Marks applied to devices, e.g. for alignment or identification
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- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
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- H—ELECTRICITY
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W46/00—Marks applied to devices, e.g. for alignment or identification
- H10W46/301—Marks applied to devices, e.g. for alignment or identification for alignment
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- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
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- H—ELECTRICITY
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- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/072—Connecting or disconnecting of bump connectors
- H10W72/07202—Connecting or disconnecting of bump connectors using auxiliary members
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- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/072—Connecting or disconnecting of bump connectors
- H10W72/07221—Aligning
- H10W72/07227—Aligning involving guiding structures, e.g. spacers or supporting members
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- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/072—Connecting or disconnecting of bump connectors
- H10W72/07231—Techniques
- H10W72/07236—Soldering or alloying
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- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/072—Connecting or disconnecting of bump connectors
- H10W72/07231—Techniques
- H10W72/07237—Techniques using a polymer adhesive, e.g. an adhesive based on silicone or epoxy
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- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/072—Connecting or disconnecting of bump connectors
- H10W72/07251—Connecting or disconnecting of bump connectors characterised by changes in properties of the bump connectors during connecting
- H10W72/07252—Connecting or disconnecting of bump connectors characterised by changes in properties of the bump connectors during connecting changes in structures or sizes
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- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/072—Connecting or disconnecting of bump connectors
- H10W72/07251—Connecting or disconnecting of bump connectors characterised by changes in properties of the bump connectors during connecting
- H10W72/07254—Connecting or disconnecting of bump connectors characterised by changes in properties of the bump connectors during connecting changes in dispositions
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- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/073—Connecting or disconnecting of die-attach connectors
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- H—ELECTRICITY
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- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/073—Connecting or disconnecting of die-attach connectors
- H10W72/07321—Aligning
- H10W72/07323—Active alignment, e.g. using optical alignment using marks or sensors
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- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/073—Connecting or disconnecting of die-attach connectors
- H10W72/07331—Connecting techniques
- H10W72/07337—Connecting techniques using a polymer adhesive, e.g. an adhesive based on silicone or epoxy
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- H—ELECTRICITY
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/221—Structures or relative sizes
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/221—Structures or relative sizes
- H10W72/225—Bumps having a filler embedded in a matrix
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- H—ELECTRICITY
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/221—Structures or relative sizes
- H10W72/227—Multiple bumps having different sizes
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/241—Dispositions, e.g. layouts
- H10W72/244—Dispositions, e.g. layouts relative to underlying supporting features, e.g. bond pads, RDLs or vias
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/251—Materials
- H10W72/252—Materials comprising solid metals or solid metalloids, e.g. PbSn, Ag or Cu
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/251—Materials
- H10W72/253—Materials not comprising solid metals or solid metalloids, e.g. polymers or ceramics
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/261—Functions other than electrical connecting
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- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/281—Auxiliary members
- H10W72/285—Alignment aids, e.g. alignment marks
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/29—Bond pads specially adapted therefor
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/30—Die-attach connectors
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/834—Interconnections on sidewalls of chips
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/851—Dispositions of multiple connectors or interconnections
- H10W72/853—On the same surface
- H10W72/856—Bump connectors and die-attach connectors
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- H—ELECTRICITY
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/851—Dispositions of multiple connectors or interconnections
- H10W72/874—On different surfaces
- H10W72/877—Bump connectors and die-attach connectors
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- H—ELECTRICITY
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/931—Shapes of bond pads
- H10W72/932—Plan-view shape, i.e. in top view
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/20—Configurations of stacked chips
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/20—Configurations of stacked chips
- H10W90/24—Configurations of stacked chips at least one of the stacked chips being laterally offset from a neighbouring stacked chip, e.g. chip stacks having a staircase shape
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/20—Configurations of stacked chips
- H10W90/293—Configurations of stacked chips characterised by non-galvanic coupling between the chips, e.g. capacitive coupling
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- H—ELECTRICITY
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/721—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/731—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
- H10W90/732—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between stacked chips
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Optical Couplings Of Light Guides (AREA)
- Wire Bonding (AREA)
- Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US12/874,446 US8283766B2 (en) | 2010-09-02 | 2010-09-02 | Ramp-stack chip package with static bends |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201234501A TW201234501A (en) | 2012-08-16 |
| TWI527132B true TWI527132B (zh) | 2016-03-21 |
Family
ID=44630458
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW100128699A TWI527132B (zh) | 2010-09-02 | 2011-08-11 | 晶片封裝,電子計算裝置及用以傳遞信號之方法 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US8283766B2 (https=) |
| EP (1) | EP2612356B1 (https=) |
| JP (1) | JP6000952B2 (https=) |
| KR (1) | KR101853754B1 (https=) |
| CN (1) | CN103403865B (https=) |
| TW (1) | TWI527132B (https=) |
| WO (1) | WO2012030470A2 (https=) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI698809B (zh) * | 2017-08-24 | 2020-07-11 | 美商谷歌有限責任公司 | 用於三維堆疊式神經網路加速器之良率改善 |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| US8390109B2 (en) * | 2011-02-17 | 2013-03-05 | Oracle America, Inc. | Chip package with plank stack of semiconductor dies |
| US8786080B2 (en) * | 2011-03-11 | 2014-07-22 | Altera Corporation | Systems including an I/O stack and methods for fabricating such systems |
| US9082632B2 (en) * | 2012-05-10 | 2015-07-14 | Oracle International Corporation | Ramp-stack chip package with variable chip spacing |
| WO2014003533A1 (en) * | 2012-06-25 | 2014-01-03 | Intel Corporation | Multi-die semiconductor structure with intermediate vertical side chip and semiconductor package for same |
| KR101880173B1 (ko) * | 2012-07-11 | 2018-07-19 | 에스케이하이닉스 주식회사 | 멀티 칩 패키지 |
| KR101994930B1 (ko) | 2012-11-05 | 2019-07-01 | 삼성전자주식회사 | 일체형 단위 반도체 칩들을 갖는 반도체 패키지 |
| JP6129605B2 (ja) * | 2013-03-25 | 2017-05-17 | 本田技研工業株式会社 | 電力変換装置の製造方法及びそれに用いられる治具 |
| JP6133093B2 (ja) * | 2013-03-25 | 2017-05-24 | 本田技研工業株式会社 | 電力変換装置 |
| KR20150018099A (ko) * | 2013-08-09 | 2015-02-23 | 에스케이하이닉스 주식회사 | 적층 반도체 장치 |
| US9209165B2 (en) * | 2013-10-21 | 2015-12-08 | Oracle International Corporation | Technique for controlling positions of stacked dies |
| US9825002B2 (en) * | 2015-07-17 | 2017-11-21 | Invensas Corporation | Flipped die stack |
| US9871019B2 (en) | 2015-07-17 | 2018-01-16 | Invensas Corporation | Flipped die stack assemblies with leadframe interconnects |
| US9837394B2 (en) | 2015-12-02 | 2017-12-05 | International Business Machines Corporation | Self-aligned three dimensional chip stack and method for making the same |
| US9508691B1 (en) | 2015-12-16 | 2016-11-29 | Invensas Corporation | Flipped die stacks with multiple rows of leadframe interconnects |
| US10566310B2 (en) | 2016-04-11 | 2020-02-18 | Invensas Corporation | Microelectronic packages having stacked die and wire bond interconnects |
| US9929290B2 (en) | 2016-06-20 | 2018-03-27 | Globalfoundries Inc. | Electrical and optical via connections on a same chip |
| US9728524B1 (en) | 2016-06-30 | 2017-08-08 | Invensas Corporation | Enhanced density assembly having microelectronic packages mounted at substantial angle to board |
| CN107993997B (zh) | 2016-10-26 | 2020-06-16 | 晟碟信息科技(上海)有限公司 | 半导体器件 |
| CN108933109B (zh) | 2017-05-27 | 2020-07-07 | 晟碟信息科技(上海)有限公司 | 成角度的裸芯的半导体器件 |
| KR20190052957A (ko) * | 2017-11-09 | 2019-05-17 | 에스케이하이닉스 주식회사 | 다이 오버시프트 지시 패턴을 포함하는 반도체 패키지 |
| US20190279962A1 (en) * | 2018-03-09 | 2019-09-12 | Oracle International Corporation | Method and apparatus for stacking warped chips to assemble three-dimensional integrated circuits |
| US11222865B2 (en) * | 2020-05-12 | 2022-01-11 | Western Digital Technologies, Inc. | Semiconductor device including vertical bond pads |
| US20230247795A1 (en) | 2022-01-28 | 2023-08-03 | The Research Foundation For The State University Of New York | Regenerative preheater for phase change cooling applications |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| US5239447A (en) * | 1991-09-13 | 1993-08-24 | International Business Machines Corporation | Stepped electronic device package |
| DK174111B1 (da) | 1998-01-26 | 2002-06-24 | Giga As | Elektrisk forbindelseselement samt fremgangsmåde til fremstilling af et sådant |
| TW460927B (en) | 1999-01-18 | 2001-10-21 | Toshiba Corp | Semiconductor device, mounting method for semiconductor device and manufacturing method for semiconductor device |
| JP2001036309A (ja) | 1999-07-15 | 2001-02-09 | Nec Eng Ltd | マルチチップモジュール接続構造 |
| US6376904B1 (en) | 1999-12-23 | 2002-04-23 | Rambus Inc. | Redistributed bond pads in stacked integrated circuit die package |
| CN1207785C (zh) * | 2000-03-21 | 2005-06-22 | 三菱电机株式会社 | 半导体器件、电子装置的制造方法、电子装置和携带式信息终端 |
| JP2001313314A (ja) * | 2000-04-28 | 2001-11-09 | Sony Corp | バンプを用いた半導体装置、その製造方法、および、バンプの形成方法 |
| JP2002009221A (ja) * | 2000-06-26 | 2002-01-11 | Rohm Co Ltd | 半導体装置及びその製造方法 |
| US6921867B2 (en) * | 2002-11-29 | 2005-07-26 | Nokia Corporation | Stress release feature for PWBs |
| KR100498488B1 (ko) * | 2003-02-20 | 2005-07-01 | 삼성전자주식회사 | 적층형 반도체 패키지 및 그 제조방법 |
| JP4215689B2 (ja) * | 2004-06-17 | 2009-01-28 | 株式会社新川 | ワイヤボンディング方法及びバンプ形成方法 |
| DE102005051332B4 (de) * | 2005-10-25 | 2007-08-30 | Infineon Technologies Ag | Halbleitersubstrat, Halbleiterchip, Halbleiterbauteil und Verfahren zur Herstellung eines Halbleiterbauteils |
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-
2010
- 2010-09-02 US US12/874,446 patent/US8283766B2/en active Active
-
2011
- 2011-08-04 WO PCT/US2011/046519 patent/WO2012030470A2/en not_active Ceased
- 2011-08-04 EP EP20110745649 patent/EP2612356B1/en active Active
- 2011-08-04 JP JP2013527083A patent/JP6000952B2/ja active Active
- 2011-08-04 CN CN201180042191.2A patent/CN103403865B/zh active Active
- 2011-08-04 KR KR1020137005325A patent/KR101853754B1/ko active Active
- 2011-08-11 TW TW100128699A patent/TWI527132B/zh active
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI698809B (zh) * | 2017-08-24 | 2020-07-11 | 美商谷歌有限責任公司 | 用於三維堆疊式神經網路加速器之良率改善 |
| US10963780B2 (en) | 2017-08-24 | 2021-03-30 | Google Llc | Yield improvements for three-dimensionally stacked neural network accelerators |
| US11836598B2 (en) | 2017-08-24 | 2023-12-05 | Google Llc | Yield improvements for three-dimensionally stacked neural network accelerators |
| US12292473B2 (en) | 2017-08-24 | 2025-05-06 | Google Llc | Yield improvements for three-dimensionally stacked neural network accelerators |
Also Published As
| Publication number | Publication date |
|---|---|
| EP2612356B1 (en) | 2015-04-22 |
| US8283766B2 (en) | 2012-10-09 |
| WO2012030470A2 (en) | 2012-03-08 |
| JP2013536999A (ja) | 2013-09-26 |
| US20120056327A1 (en) | 2012-03-08 |
| JP6000952B2 (ja) | 2016-10-05 |
| WO2012030470A3 (en) | 2012-05-03 |
| CN103403865A (zh) | 2013-11-20 |
| EP2612356A2 (en) | 2013-07-10 |
| TW201234501A (en) | 2012-08-16 |
| CN103403865B (zh) | 2016-08-03 |
| KR101853754B1 (ko) | 2018-06-20 |
| KR20130136446A (ko) | 2013-12-12 |
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