TWI526150B - An electromagnetic wave shielding film, a flexible substrate using the same, and a method for manufacturing the flexible substrate - Google Patents

An electromagnetic wave shielding film, a flexible substrate using the same, and a method for manufacturing the flexible substrate Download PDF

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TWI526150B
TWI526150B TW100107719A TW100107719A TWI526150B TW I526150 B TWI526150 B TW I526150B TW 100107719 A TW100107719 A TW 100107719A TW 100107719 A TW100107719 A TW 100107719A TW I526150 B TWI526150 B TW I526150B
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electromagnetic wave
wave shielding
flexible substrate
metal powder
shielding film
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TW201206334A (en
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Kiyoshi Iwai
Yoshiharu Yanagi
Masayuki Totouge
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Tatsuta Densen Kk
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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K9/00Screening of apparatus or components against electric or magnetic fields
    • H05K9/0073Shielding materials
    • H05K9/0081Electromagnetic shielding materials, e.g. EMI, RFI shielding
    • H05K9/0083Electromagnetic shielding materials, e.g. EMI, RFI shielding comprising electro-conductive non-fibrous particles embedded in an electrically insulating supporting structure, e.g. powder, flakes, whiskers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01BCABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
    • H01B1/00Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
    • H01B1/20Conductive material dispersed in non-conductive organic material
    • H01B1/22Conductive material dispersed in non-conductive organic material the conductive material comprising metals or alloys
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01BCABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
    • H01B3/00Insulators or insulating bodies characterised by the insulating materials; Selection of materials for their insulating or dielectric properties
    • H01B3/002Inhomogeneous material in general
    • H01B3/004Inhomogeneous material in general with conductive additives or conductive layers
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0213Electrical arrangements not otherwise provided for
    • H05K1/0216Reduction of cross-talk, noise or electromagnetic interference
    • H05K1/0218Reduction of cross-talk, noise or electromagnetic interference by printed shielding conductors, ground planes or power plane
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K9/00Screening of apparatus or components against electric or magnetic fields
    • H05K9/0007Casings
    • H05K9/0009Casings with provisions to reduce EMI leakage through the joining parts

Description

電磁波遮蔽薄膜、使用其之撓性基板及該撓性基板之製造方法Electromagnetic wave shielding film, flexible substrate using the same, and manufacturing method of the same

本發明係關於一種電磁波遮蔽薄膜、使用其之撓性基板及該撓性基板之製造方法,詳而言之,係關於一種經長期滑動後亦能維持電磁波遮蔽效果之電磁波遮蔽薄膜、使用其形成電磁波遮層之撓性基板,及該撓性基板之製造方法。The present invention relates to an electromagnetic wave shielding film, a flexible substrate using the same, and a method of manufacturing the same, and more particularly to an electromagnetic wave shielding film which can maintain an electromagnetic wave shielding effect after long-term sliding, and is formed using the same. A flexible substrate with electromagnetic wave shielding, and a method of manufacturing the flexible substrate.

迄今所施行的技術係為在配置於行動電話鉸鏈部等之撓性基板(FPC)上積層電磁波遮蔽薄膜來遮蔽電磁波。作為電磁波遮蔽薄膜,至少含有導電層及保護層,而其導電層係使用由將金屬粉末分散於黏結劑樹脂之導電性黏結劑(導電糊)所形成者。The technology that has been hitherto has been to form an electromagnetic wave shielding film on a flexible substrate (FPC) disposed on a mobile phone hinge portion or the like to shield electromagnetic waves. The electromagnetic wave shielding film contains at least a conductive layer and a protective layer, and the conductive layer is formed by using a conductive adhesive (conductive paste) in which a metal powder is dispersed in a binder resin.

如此之電磁波遮蔽薄膜,伴隨著行動電話的薄型化,雖被要求比以往更薄膜化,但只要其他條件相同,伴隨著薄膜化遮蔽性就會隨之降低,因此抑制遮蔽性降低便成了課題。又,成為電磁波遮蔽對象之撓性基板,於行動電話等之使用時因其是用於彎折、滑動頻繁之部份,故隨著使用期間的增長也會產生出電磁波遮蔽效果降低的問題,故其之解決也為人所期盼。Such an electromagnetic wave shielding film is required to be thinner than ever with the thinning of a mobile phone. However, as long as other conditions are the same, the filming property is reduced as the filming property is lowered. . In addition, since it is a flexible substrate to be shielded by electromagnetic waves, it is used for a mobile phone or the like because it is used for bending and sliding. Therefore, as the use period increases, the electromagnetic wave shielding effect is lowered. Therefore, its solution is also expected.

為了提高電磁波遮蔽薄膜之諸性能,於金屬粒子的形狀、粒徑等上也下了許多功夫。例如,於專利文獻1中,為了提高導電性、密著性以及電磁波之遮蔽性,揭示了平均粒徑0.5μm~20μm的銀粒子和一次粒子之平均粒徑在50nm以下之粒狀銀粒子要在一定的比例之下使用。又於專利文獻2中,為了獲得能滿足撓性基板所要求之彎折特性之導電糊組成物,則揭示了要使用平均粒徑2.0~5.0μm之鱗片狀銀粉末和平均粒徑10~19μm之樹枝狀鍍銀銅粉末之混合粉末。In order to improve the performance of the electromagnetic wave shielding film, much work has been done on the shape and particle diameter of the metal particles. For example, in Patent Document 1, in order to improve conductivity, adhesion, and shielding of electromagnetic waves, it is disclosed that silver particles having an average particle diameter of 0.5 μm to 20 μm and granular silver particles having an average particle diameter of primary particles of 50 nm or less are required. Use under a certain ratio. Further, in Patent Document 2, in order to obtain a conductive paste composition which satisfies the bending characteristics required for a flexible substrate, it is disclosed that scaly silver powder having an average particle diameter of 2.0 to 5.0 μm and an average particle diameter of 10 to 19 μm are used. A mixed powder of dendritic silver-plated copper powder.

然而,目前的現況是:仍未能獲得經數十萬次程度的彎折、滑動之後仍能持續著足夠電磁波遮蔽性之電磁波遮蔽薄膜。However, the current state of the art is that it has not been able to obtain an electromagnetic wave shielding film that has been bent for hundreds of thousands of times and still has sufficient electromagnetic shielding properties after sliding.

先前技術文獻Prior technical literature

專利文獻Patent literature

專利文獻1:日本特開2005-294254號公報Patent Document 1: Japanese Laid-Open Patent Publication No. 2005-294254

專利文獻2:日本特開2009-230952號公報Patent Document 2: Japanese Laid-Open Patent Publication No. 2009-230952

有鑑於上述內容,本發明之目的為:提供一種即便薄膜化也有著優越電磁波遮蔽性之電磁波遮蔽薄膜,且其即使用於如行動電話等之鉸鏈部般彎折、滑動頻繁之部份,其初期之電磁波遮蔽性也能長時間持續。此外並提供使用該薄膜形成電磁波遮蔽層之撓性基板及該撓性基板之製造方法。In view of the above, an object of the present invention is to provide an electromagnetic wave shielding film which has excellent electromagnetic wave shielding properties even when it is thinned, and which is used for bending and sliding frequently, such as a hinge portion of a mobile phone. The initial electromagnetic wave shielding can also last for a long time. Further, a flexible substrate in which an electromagnetic wave shielding layer is formed using the film and a method of manufacturing the flexible substrate are provided.

即本發明之電磁波遮蔽薄膜係於由(A)金屬粉末和(B)黏結劑樹脂所構成之導電層上積層保護層而成之電磁波遮蔽薄膜,為了解決前述之課題,前述導電層由含有(a)與(b)作為前述金屬粉末之導電糊所形成者,該(a)係平均厚度50~300nm、平均粒徑3~10μm之薄片狀金屬粉末,而(b)係平均粒徑3~10μm之針狀或樹枝狀金屬粉末。That is, the electromagnetic wave shielding film of the present invention is an electromagnetic wave shielding film formed by laminating a protective layer on a conductive layer composed of (A) metal powder and (B) a binder resin, and in order to solve the above problems, the conductive layer is contained ( a) and (b) formed as a conductive paste of the metal powder, wherein (a) is a flaky metal powder having an average thickness of 50 to 300 nm and an average particle diameter of 3 to 10 μm, and (b) an average particle diameter of 3 to 3 Needle or dendritic metal powder of 10 μm.

於前述電磁波遮蔽薄膜中,(A)金屬粉末和(B)黏結劑樹脂的比例以重量比計係在A:B=50:50~80:20之範圍內(但,以固體形態換算)且前述(a)薄片狀金屬粉末與(b)針狀或樹枝狀金屬粉末的比例以重量比計係在a:b=20:80~80:20之範圍內為宜。In the electromagnetic wave shielding film, the ratio of the (A) metal powder to the (B) binder resin is in the range of A:B=50:50 to 80:20 by weight ratio (however, in terms of solid form) The ratio of the above (a) flaky metal powder to (b) acicular or dendritic metal powder is preferably in the range of a:b = 20:80 to 80:20 by weight.

本發明之撓性基板之製造方法係為:在撓性基板上載置前述本發明之電磁波遮蔽薄膜,接著將撓性基板與該電磁波遮蔽薄膜一起加熱同時一邊朝厚度方向加壓,藉此於撓性基板上形成電磁波遮蔽層之方法。In the manufacturing method of the flexible substrate of the present invention, the electromagnetic wave shielding film of the present invention is placed on the flexible substrate, and then the flexible substrate is heated together with the electromagnetic shielding film while being pressed in the thickness direction. A method of forming an electromagnetic wave shielding layer on a substrate.

又,本發明之撓性基板係為一種含有由前述本發明之電磁波遮蔽薄膜構成電磁波遮蔽層者。Further, the flexible substrate of the present invention is one which comprises an electromagnetic wave shielding layer composed of the electromagnetic wave shielding film of the present invention.

本發明之電磁波遮蔽薄膜具有優越的電磁波遮蔽效果,使用其於撓性基板上裝設電磁波遮蔽層時,可得到即使經數十萬次程度的彎折或滑動後仍能維持高水準之電磁波遮蔽之效果。The electromagnetic wave shielding film of the present invention has an excellent electromagnetic wave shielding effect, and when the electromagnetic wave shielding layer is mounted on the flexible substrate, electromagnetic wave shielding capable of maintaining a high level even after bending or sliding for several hundred thousand times can be obtained. The effect.

又,如依據本發明之備有電磁波遮蔽層之基板之製造方法,則可容易地獲得前述具備長時間持續優越電磁波遮蔽効果之電磁波遮蔽層之撓性基板。Moreover, according to the method of manufacturing a substrate provided with an electromagnetic wave shielding layer according to the present invention, the flexible substrate having the electromagnetic wave shielding layer having a long-lasting superior electromagnetic wave shielding effect can be easily obtained.

圖式簡單說明Simple illustration

第1圖顯示薄片電阻之測定方法之模式端面圖。Fig. 1 is a schematic end view showing a method of measuring sheet resistance.

第2圖顯示連接電阻之測定方法之模式端面圖,(b)為(a)之部份擴大圖。Fig. 2 is a schematic end view showing the method of measuring the connection resistance, and (b) is a partial enlarged view of (a).

第3圖顯示滑動試驗之方法之模式端面圖。Figure 3 shows a schematic end view of the method of the sliding test.

用以實施發明之形態Form for implementing the invention

以下將詳細說明關於本發明之電磁波遮蔽薄膜以及使用該薄膜之撓性基板之製造方法。Hereinafter, the electromagnetic wave shielding film of the present invention and a method of manufacturing the flexible substrate using the same will be described in detail.

本發明之電磁波遮蔽薄膜,如前述,係為至少含有由金屬粉末與黏結劑樹脂所構成之導電層與保護層者,作為金屬粉末係以併用薄片狀金屬粉末與針狀或樹枝狀金屬粉末為其特徵。As described above, the electromagnetic wave shielding film of the present invention contains at least a conductive layer and a protective layer composed of a metal powder and a binder resin, and is used as a metal powder in combination with a flaky metal powder and a needle-like or dendritic metal powder. Its characteristics.

本發明中所謂「薄片狀金屬粉末」,通常是指被稱之為鱗片狀或是片狀等之物者,只要是平板形狀即可,其平面的形狀並無特別限制。將種種形狀的粒子或壓碎或敲碎所形成之鱗片狀金屬粉末,因在成本或生產性上有利而較適於使用。In the present invention, the term "sheet-like metal powder" is generally referred to as a scaly shape or a sheet shape, and the shape of the flat surface is not particularly limited as long as it is a flat plate shape. The scaly metal powder formed by various shapes of particles or crushed or crushed is suitable for use because it is advantageous in terms of cost or productivity.

薄片狀金屬粉末之金屬的種類,有金、銀、鍍銀銅、銅、鎳等,其中又以銀、鍍銀銅為佳。又,此薄片狀金屬粉末的大小以平均厚度50~300nm、且平均粒徑在3~10μm的範圍者為宜。平均厚度大於300nm的話則薄片狀金屬粉末熔點降低不易;而若平均厚度小於50nm的話則生產成本會大幅上升。此外,平均粒徑若大於10μm的話則會降低分散性;而若平均粒徑小於3μm的話低填充時則有導電性降低的傾向。The type of metal of the flaky metal powder includes gold, silver, silver plated copper, copper, nickel, etc., of which silver or silver plated copper is preferred. Further, the flaky metal powder preferably has an average thickness of 50 to 300 nm and an average particle diameter of 3 to 10 μm. When the average thickness is more than 300 nm, the melting point of the flaky metal powder is not easily lowered; and if the average thickness is less than 50 nm, the production cost is greatly increased. Further, when the average particle diameter is more than 10 μm, the dispersibility is lowered. When the average particle diameter is less than 3 μm, the conductivity tends to decrease when the filler is low.

另一方面,所謂「針狀或樹枝狀金屬粉末」,針狀、樹枝狀(樹突)、或是該兩者的混合物皆可。在此所謂的樹枝狀,不限定其為有可明確認定為枝狀部分之物者,而包含有如金平糖般突起之物者、或是有著大大小小種種形狀之突起部分者。此針狀或樹枝狀金屬粉末的種類也和前述相同,有金、銀、鍍銀銅、銅、鎳等,其中又以鍍銀銅為佳。大小以平均粒徑在3~10μm的範圍者為宜。平均粒徑若大於10μm的話則遮蔽薄膜的薄膜化會變得困難;而若平均粒徑小於3μm的話則金屬粉末之突起形狀的形成會變得困難。On the other hand, the "needle-like or dendritic metal powder" may be needle-shaped, dendritic (dendritic), or a mixture of the two. The term "dendritic shape" as used herein is not limited to those having a branch portion which can be clearly identified as a dendritic portion, and includes those having a protrusion like a gold-sweet sugar or a protrusion having a shape of various sizes. The type of the acicular or dendritic metal powder is also the same as described above, and there are gold, silver, silver plated copper, copper, nickel, etc., of which silver-plated copper is preferred. The size is preferably in the range of 3 to 10 μm in the average particle diameter. When the average particle diameter is more than 10 μm, the film formation of the masking film becomes difficult. When the average particle diameter is less than 3 μm, the formation of the protrusion shape of the metal powder becomes difficult.

前述金屬粉末之平均粒徑或平均厚度可依據雷射繞射散射法來測定。The average particle diameter or average thickness of the aforementioned metal powder can be measured by a laser diffraction scattering method.

經由如前述般併用薄片狀金屬粉末與針狀或樹枝狀金屬粉末,與單獨使用這些金屬粉末中的任一種、或是與其他形狀者作組合使用時(例如,薄片狀金屬粉末與球狀金屬粉末併用),其對於反覆彎折、滑動之電磁波遮蔽效果的持續性,比較起來可認定有顯著地提升。於習知技術中遮蔽效果隨時間的增長降低,被認為是因為薄膜的變形反覆進行而使導電層之金屬粒子們的接觸狀態惡化所致。由此可推測,如上述薄片狀金屬粉末與針狀或樹枝狀金屬粉末併用時,針狀或樹枝狀金屬粉末於薄片狀金屬粉末部份產生了突刺等等之物理性的結合。更進一步,藉由後述之於加熱時同時加壓的步驟,金屬粉末應會產生金屬鍵結或是準於其之堅固結合。還有,藉由後述回焊的步驟,其結合強度應會變得更強。By using a flaky metal powder together with a needle-like or dendritic metal powder as described above, when using any of these metal powders alone or in combination with other shapes (for example, flaky metal powder and spherical metal) The powder is used in combination, and the durability of the electromagnetic wave shielding effect of the repeated bending and sliding can be considered to be significantly improved. In the conventional technique, the increase in the shielding effect with time is considered to be caused by the deterioration of the film and the deterioration of the contact state of the metal particles of the conductive layer. From this, it is presumed that when the flaky metal powder is used in combination with the acicular or dendritic metal powder, the acicular or dendritic metal powder forms a physical bond of spurs or the like in the flaky metal powder portion. Further, by the step of simultaneously pressing at the time of heating, the metal powder should produce a metal bond or a strong bond with it. Further, the bonding strength should be made stronger by the step of reflowing described later.

前述薄片狀金屬粉末(a)與針狀或樹枝狀金屬粉末(b),以使用重量比計係在a:b=20:80~80:20之範圍內之比例者為宜。相對於薄片狀金屬粉末之針狀或樹枝狀金屬粉末的比例若不符上述範圍的話,經由彎折、滑動所造成之導電性降低會變大。即遮蔽效果大幅降低。The flaky metal powder (a) and the acicular or dendritic metal powder (b) are preferably used in a ratio of a:b=20:80 to 80:20 by weight ratio. When the ratio of the acicular or dendritic metal powder to the flaky metal powder does not exceed the above range, the decrease in conductivity due to bending or sliding becomes large. That is, the shadowing effect is greatly reduced.

接著,作為黏結劑樹脂,環氧樹脂、聚胺酯樹脂、丙烯酸樹脂、聚醯亞胺樹脂、酚樹脂、三聚氰胺樹脂等之熱固性樹脂皆可使用並無特別的限制。其中又以聚胺酯樹脂因其可撓性優越而被從優使用。Next, as the binder resin, a thermosetting resin such as an epoxy resin, a polyurethane resin, an acrylic resin, a polyimide resin, a phenol resin, or a melamine resin can be used without particular limitation. Among them, polyurethane resins are favorably used because of their superior flexibility.

上述(A)金屬粉末和(B)黏結劑樹脂之添加比例以重量比計係在A:B=50:50~80:20之範圍內(但,以固體形態換算)為宜,重量比計係在A:B=55:45~70:30之範圍更佳。金屬粉末重量比少於50%的話導電性之顯現變得困難;而重量比若多於80%的話則可撓性或密著性會降低。The addition ratio of the above (A) metal powder and (B) binder resin is preferably in the range of A:B=50:50 to 80:20 by weight ratio (however, it is converted in a solid form), and the weight ratio is preferably It is preferably in the range of A:B=55:45 to 70:30. When the weight ratio of the metal powder is less than 50%, the display of conductivity becomes difficult; and if the weight ratio is more than 80%, the flexibility or the adhesion is lowered.

前述由金屬粉末與黏結劑樹脂來製造電磁波遮蔽薄膜的方法雖無特別地限制,舉例而言,調製上述由金屬粉末與黏結劑樹脂所製成的糊,塗佈在剝離紙等上形成導電層之薄膜。此薄膜的厚度以8~28μm為宜,後述沖壓步驟後則以5~25μm為宜。沖壓步驟後的厚度若不滿5μm的話則難以獲得足夠之電磁波遮蔽性,而厚度若超過25μm的話則對薄膜化的要求來說不宜。The method for producing an electromagnetic wave shielding film from the metal powder and the binder resin is not particularly limited. For example, the paste made of the metal powder and the binder resin is prepared, and coated on a release paper or the like to form a conductive layer. The film. The thickness of the film is preferably 8 to 28 μm, and preferably 5 to 25 μm after the press step described later. If the thickness after the press step is less than 5 μm, it is difficult to obtain sufficient electromagnetic shielding, and if the thickness exceeds 25 μm, it is not suitable for the film formation.

視需要可於前述導電層中添加不離本發明目的範圍內之公知的添加劑。作為添加劑的例子可舉:阻燃劑、整平劑、黏度調整劑等。作為阻燃劑,可適當地使用磷系等之無機系或有機系之阻燃劑。A well-known additive which does not depart from the object of the present invention may be added to the aforementioned conductive layer as needed. Examples of the additive include a flame retardant, a leveling agent, a viscosity adjuster, and the like. As the flame retardant, an inorganic or organic flame retardant such as a phosphorus system can be suitably used.

藉由在構成前述導電層之薄膜上積層構成保護層之薄膜,可獲得本發明之電磁波遮蔽薄膜。或是,也可先形成構成保護層之薄膜再於此薄膜上積層構成導電層之薄膜。The electromagnetic wave shielding film of the present invention can be obtained by laminating a film constituting a protective layer on a film constituting the above-mentioned conductive layer. Alternatively, a film constituting the protective layer may be formed first, and a film constituting the conductive layer may be laminated on the film.

構成保護層之薄膜可由環氧樹脂、聚胺酯樹脂等來形成。又,保護層之表面硬度以鉛筆硬度在H~4H者為宜,因此,視需要可於上述由環氧樹脂、聚胺酯樹脂構成之層上積層壓克力系等之表面硬化處理層。保護層之表面硬度小於鉛筆硬度H的話則容易受損,另一方面,若大於4H的話則可撓性變小,有滑動特性降低之疑慮。The film constituting the protective layer may be formed of an epoxy resin, a polyurethane resin or the like. In addition, it is preferable that the surface hardness of the protective layer is from H to 4H, and a surface-hardened layer such as a ketone system may be laminated on the layer composed of the epoxy resin or the polyurethane resin as needed. When the surface hardness of the protective layer is less than the pencil hardness H, the film is easily damaged. On the other hand, if it is larger than 4H, the flexibility is small and the sliding property is lowered.

又,構成此保護層之薄膜厚度宜為3~15μm,而在後述沖壓步驟後宜為2~12μm。沖壓步驟後之厚度若未滿2μ的話則作為保護層之強度不足,若超過12μm的話則對薄膜化的要求來說不宜。Further, the thickness of the film constituting the protective layer is preferably from 3 to 15 μm, and is preferably from 2 to 12 μm after the press step described later. If the thickness after the press step is less than 2 μ, the strength of the protective layer is insufficient, and if it exceeds 12 μm, it is not preferable for the film formation.

再者,就電磁波遮蔽薄膜全體而言,後述沖壓步驟前之厚度宜為11~30μm,在沖壓步驟後宜為7~28μm。In addition, as for the entire electromagnetic wave shielding film, the thickness before the pressing step described later is preferably 11 to 30 μm, and preferably 7 to 28 μm after the pressing step.

接下來,作為本發明之撓性基板之製造方法,可於撓性基板上載置前述本發明之電磁波遮蔽薄膜,藉由於加熱時同時以1~5MPa之壓力加壓之沖壓步驟,於撓性基板上形成電磁波遮蔽層。沖壓步驟中之加熱溫度以140~200℃為宜。Next, as a method of producing a flexible substrate of the present invention, the electromagnetic wave shielding film of the present invention can be placed on a flexible substrate, and a press step of pressurizing at a pressure of 1 to 5 MPa at the same time as heating can be applied to the flexible substrate. An electromagnetic wave shielding layer is formed thereon. The heating temperature in the pressing step is preferably 140 to 200 °C.

又,藉由對前述以沖壓步驟形成電磁波遮蔽層之撓性基板施以回焊步驟,可使滑動特性有更顯著的提升。回焊之實施條件,以在焊焬熔化的條件下即可,雖無特別的限制,但通常約為260℃4秒的程度。因金屬透過薄膜化熔點會降低,故本發明中所用之薄片狀金屬粉末,例如即使是如熔點為962℃之銀般之高熔點金屬,也會經由在本溫度範圍內之回焊步驟熔化,而使產生前述之金屬鍵結或是準於其之堅固之結合。Further, by applying the reflow step to the flexible substrate in which the electromagnetic wave shielding layer is formed by the press step, the sliding property can be more significantly improved. The conditions for the reflow can be carried out under the condition that the weld bead is melted, and although it is not particularly limited, it is usually about 260 ° C for 4 seconds. Since the melting point of the metal through the thin film is lowered, the flaky metal powder used in the present invention, for example, a high melting point metal such as silver having a melting point of 962 ° C, is melted by a reflow step in this temperature range. This results in the aforementioned metal bond or a strong bond to which it is.

另外,本發明之電磁波遮蔽薄膜為確保與其之被覆對象之撓性基板之密著性,相對於聚醯亞胺宜有180°剝離強度在2N以上之接著力。Further, the electromagnetic wave shielding film of the present invention is excellent in adhesion to the flexible substrate to be coated, and preferably has a bonding strength of 2° or more with respect to the polyimide.

實施例Example

以下將揭示本發明之實施例,但本發明非受限於以下之實施例。Embodiments of the invention are disclosed below, but the invention is not limited to the following examples.

[實施例、比較例][Examples, Comparative Examples]

藉由於離型薄膜上塗覆6μm厚之環氧系樹脂,乾燥後再於其上塗佈壓克力系表面硬化處理液,使其乾燥後,即形成由環氧系軟層與壓克力系表面硬化處理層之2層構造所構成之保護層(後述第1圖、第2圖中之符號1)。藉由於此保護層上塗覆以表1、2所示之比例調製之導電糊,乾燥後形成導電層(同第1圖、第2圖中之符號2)而獲得電磁波遮蔽薄膜。用以此獲得之電磁波遮蔽薄膜來進行以下之評價。所使用之黏結劑樹脂及金屬粉末之明細如下。By coating a 6 μm thick epoxy resin on the release film, after drying, the acrylic surface hardening treatment liquid is applied thereon, and after drying, the epoxy soft layer and the acrylic system are formed. A protective layer composed of a two-layer structure of the surface-hardened layer (symbol 1 in the first and second figures to be described later). The conductive paste prepared by applying the ratios shown in Tables 1 and 2 was applied to the protective layer, and after drying, a conductive layer was formed (the same as in the first drawing and the second reference numeral 2) to obtain an electromagnetic wave shielding film. The following evaluation was carried out using the electromagnetic wave shielding film obtained thereby. The details of the binder resin and metal powder used are as follows.

黏結劑樹脂:大日精化工業(股)製、聚胺酯樹脂UD1375Adhesive resin: Da Ri Jing Chemical Industry Co., Ltd., polyurethane resin UD1375

金屬粉末:(a)鱗片狀銀粉末:平均厚度100nm、平均粒徑5μm、熔點約250℃Metal powder: (a) scaly silver powder: average thickness 100 nm, average particle diameter 5 μm, melting point about 250 ° C

(b)樹枝狀鍍銀銅粉末:平均粒徑5μm(b) Dendritic silver-plated copper powder: average particle size 5 μm

但,於比較例3中使用了球狀鍍銀銅粉末(平均粒徑6~7μm)來取代(b)樹枝狀鍍銀銅粉末。However, in Comparative Example 3, spherical silver-plated copper powder (average particle diameter: 6 to 7 μm) was used instead of (b) dendritic silver-plated copper powder.

(1)薄片電阻(1) sheet resistance

於導電層2上載置第1圖所示之立方體形之電極A、B(電極面積:1 cm2(L1=L2=L3=1cm)、電極間隔d=1cm、電極表面:鍍金處理)於各電極上以箭頭所示之方向加4.9N之重量,A-B電極間之電阻以4端子法來測定,並以測定開始1分鐘後的值作為電阻。測定大氣溫度設為18~28℃,並使用249mm×50mm之裁切試樣做測定。表1顯示實驗數為n=5之平均值。The cube-shaped electrodes A and B shown in Fig. 1 were placed on the conductive layer 2 (electrode area: 1 cm 2 (L1 = L2 = L3 = 1 cm), electrode spacing d = 1 cm, electrode surface: gold plating treatment) The electrode was added with a weight of 4.9 N in the direction indicated by the arrow, and the resistance between the AB electrodes was measured by a 4-terminal method, and the value after 1 minute from the start of the measurement was used as the electric resistance. The atmospheric temperature was measured to be 18 to 28 ° C, and a cut sample of 249 mm × 50 mm was used for measurement. Table 1 shows the average number of experiments with n=5.

(2)180°剝離強度(2) 180° peel strength

將前述電磁波遮蔽薄膜之導電層側隔著聚醯亞胺膜(東麗、杜邦(股)製,凱通100H(商品名))貼於實驗板上,保護層側也隔著接著劑層貼上聚醯亞胺膜(同凱通100H),以50mm/分從聚醯亞胺膜剝離下來。表1顯示實驗數為n=5之平均值。The conductive layer of the electromagnetic wave shielding film was attached to the test plate via a polyimide film (Toray, DuPont, Kaitong 100H (trade name)), and the protective layer side was also pasted with the adhesive layer. The upper polyimine film (with Kaitong 100H) was peeled off from the polyimide film at 50 mm/min. Table 1 shows the average number of experiments with n=5.

(3)連接電阻(3) Connection resistance

將上述之電磁波遮蔽薄膜載置於可撓性印刷基板(厚度53.5μm)上,以170℃加熱30分鐘同時以3MPa之壓力加壓製成一種撓性基板(FPC)之評價用試樣,其係具備有第2圖(a)及(b)所示斷面形狀之電磁波遮蔽薄膜,然後進行5次回焊。在第2圖(a)及(b)中,符號1表示電磁波遮蔽薄膜之保護層,符號2表示其導電層。又,符號3表示FPC之聚醯亞胺層(厚度12.5μm),符號4表示銅層(Cu:18μm),符號5表示無電解鎳-金鍍層(Ni:3~5μm,Au:0.05~0.1μm),符號6表示接著劑層(厚度35μm),符號7表示聚醯亞胺層(厚度25μm)。a為底部直徑。(b)為(a)中之底部之擴大圖。底部直徑(a)於0.5mmψ、0.8mmψ、1.0mmψ各測定其中之電阻值R(連接電阻)。表1、表2顯示實驗數為n=5之平均值。The above-mentioned electromagnetic wave shielding film was placed on a flexible printed circuit board (thickness: 53.5 μm), heated at 170 ° C for 30 minutes, and pressed at a pressure of 3 MPa to prepare a sample for evaluation of a flexible substrate (FPC). The electromagnetic wave shielding film having the cross-sectional shape shown in Figs. 2(a) and (b) is provided, and then reflowing is performed five times. In Figs. 2(a) and 2(b), reference numeral 1 denotes a protective layer of an electromagnetic wave shielding film, and reference numeral 2 denotes a conductive layer. Further, reference numeral 3 denotes a polyacrylonitrile layer of FPC (thickness: 12.5 μm), reference numeral 4 denotes a copper layer (Cu: 18 μm), and reference numeral 5 denotes an electroless nickel-gold plating layer (Ni: 3 to 5 μm, Au: 0.05 to 0.1) Μm), symbol 6 denotes an adhesive layer (thickness 35 μm), and symbol 7 denotes a polyimide layer (thickness 25 μm). a is the bottom diameter. (b) is an enlarged view of the bottom of (a). The bottom diameter (a) was measured at 0.5 mm ψ, 0.8 mm ψ, and 1.0 mm, and the resistance value R (connection resistance) thereof was measured. Tables 1 and 2 show the average number of experiments as n=5.

(4)滑動特性(4) Sliding characteristics

依聚醯亞胺層(12.5μm)、接著劑層(15μm)、銅箔層(12μm)、以及聚醯亞胺層(12.5μm)之順序從上積層製成之4層構造之FPC13,於其之上下兩面積層電磁波遮蔽薄膜14、15(長100mm、寬12mm)製成評價用試樣。FPC13之上面側使其成為內側般將此試樣往長度方向彎折,如第3圖所示般將此試樣以固定板11和滑動板12夾住(彎曲半徑b:1.0mm),而於電磁波遮蔽薄膜14、15之導電層之長度方向兩端的部份藉由銅箔來接續端子(未圖示)以測定薄膜14、15之各個電阻值,作為遮蔽層初期電阻。接著,以黑點作為基點朝箭頭方向作往復衝程(滑動幅度50mm(c=c’=25mm),60往復/分),調查遮蔽層電阻達到100 Ω時之衝程次數(往復作為一次)作為「滑動特性」。又,將上述評價用試樣施以3次回焊步驟後之試樣也施以同樣的實驗。結果顯示於表1、2中。於表中,「內彎」表示彎折時成為FPC13之內側之電磁波遮蔽薄膜15之電阻值,「外彎」表示成為FPC13之外側之電磁波遮蔽薄膜15之電阻值。a four-layer structure of FPC13 made of the upper laminate layer in the order of the polyimide layer (12.5 μm), the adhesive layer (15 μm), the copper foil layer (12 μm), and the polyimide layer (12.5 μm), The lower two-layer electromagnetic wave shielding films 14, 15 (length 100 mm, width 12 mm) were used to prepare samples for evaluation. The upper side of the FPC 13 is bent in the longitudinal direction so that the sample is bent in the longitudinal direction. As shown in Fig. 3, the sample is sandwiched by the fixing plate 11 and the sliding plate 12 (bending radius b: 1.0 mm). The terminals at both ends in the longitudinal direction of the conductive layers of the electromagnetic shielding films 14 and 15 are connected to each other by a copper foil (not shown) to measure the respective resistance values of the films 14 and 15 as the initial resistance of the shielding layer. Then, the black point is used as the base point to make a reciprocating stroke in the direction of the arrow (sliding width 50 mm (c=c'=25 mm), 60 reciprocation/minute), and the number of strokes when the shielding layer resistance reaches 100 Ω (reciprocating as one time) is investigated as " Sliding characteristics." Further, the same test was also carried out on the sample after the above-mentioned evaluation sample was subjected to the three-time reflow step. The results are shown in Tables 1 and 2. In the table, "inner bend" indicates the resistance value of the electromagnetic wave shielding film 15 which becomes the inside of the FPC 13 at the time of bending, and "outer bend" indicates the resistance value of the electromagnetic wave shielding film 15 which becomes the outer side of the FPC 13.

產業上之可利用性Industrial availability

本發明之電磁波遮蔽薄膜除了行動電話之外,也可普遍適用於裝設在有彎折部份或是滑動部份之數位相機等機器中之撓性基板。In addition to a mobile phone, the electromagnetic wave shielding film of the present invention is also generally applicable to a flexible substrate mounted in a machine such as a digital camera having a bent portion or a sliding portion.

1...保護層1. . . The protective layer

2...導電層2. . . Conductive layer

3...聚醯亞胺層3. . . Polyimine layer

4...銅層4. . . Copper layer

5...鎳-金鍍層5. . . Nickel-gold plating

6...接著劑層6. . . Subsequent layer

7...聚醯亞胺層7. . . Polyimine layer

c=c'...滑動幅度c=c'. . . Sliding amplitude

11...固定板11. . . Fixed plate

12...滑動板12. . . Sliding plate

13...FPC13. . . FPC

14...電磁波遮蔽薄膜14. . . Electromagnetic wave shielding film

15...電磁波遮蔽薄膜15. . . Electromagnetic wave shielding film

A...電極A. . . electrode

B...電極B. . . electrode

a...底部直徑a. . . Bottom diameter

b...彎折半徑b. . . Bending radius

d...電極間隔d. . . Electrode spacing

R...電阻值R. . . resistance

第1圖顯示薄片電阻之測定方法之模式端面圖。Fig. 1 is a schematic end view showing a method of measuring sheet resistance.

第2圖顯示連接電阻之測定方法之模式端面圖,(b)為(a)之部分擴大圖。Fig. 2 is a schematic end view showing a method of measuring the connection resistance, and (b) is a partial enlarged view of (a).

第3圖顯示滑動試驗之方法之模式端面圖。Figure 3 shows a schematic end view of the method of the sliding test.

Claims (3)

一種電磁波遮蔽薄膜,係於由(A)金屬粉末和(B)黏結劑樹脂所構成之導電層上積層保護層而成者,其特徵在於:前述導電層係由導電糊形成,且該導電糊含有下述(a)與(b)作為前述金屬粉末:(a)平均厚度50~300nm且平均粒徑3~10μm之薄片狀金屬粉末;及,(b)平均粒徑3~10μm之針狀或樹枝狀金屬粉末;前述導電層中(A)金屬粉末與(B)黏結劑樹脂之比例以重量比計係在A:B=50:50~80:20之範圍內(但,以固體成分換算);前述(a)薄片狀金屬粉末與(b)針狀或樹枝狀金屬粉末之比例以重量比計係在a:b=20:80~80:20之範圍內;並且,該電磁波遮蔽薄膜於沖壓步驟前之厚度為11~30μm,沖壓步驟後之厚度則為7~28μm且較沖壓步驟前之厚度更薄。 An electromagnetic wave shielding film which is formed by laminating a protective layer on a conductive layer composed of (A) a metal powder and (B) a binder resin, wherein the conductive layer is formed of a conductive paste, and the conductive paste The following metal powders (a) and (b) are contained: (a) a flaky metal powder having an average thickness of 50 to 300 nm and an average particle diameter of 3 to 10 μm; and (b) an acicular shape having an average particle diameter of 3 to 10 μm. Or a dendritic metal powder; the ratio of the (A) metal powder to the (B) binder resin in the conductive layer is in the range of A:B=50:50-80:20 by weight ratio (however, as a solid component) The ratio of the above-mentioned (a) flaky metal powder to (b) acicular or dendritic metal powder is in the range of a:b=20:80 to 80:20 by weight ratio; and, the electromagnetic wave shielding The thickness of the film before the stamping step is 11 to 30 μm, and the thickness after the stamping step is 7 to 28 μm and is thinner than the thickness before the stamping step. 一種撓性基板之製造方法,其特徵在於:在撓性基板上載置如申請專利範圍第1項之電磁波遮蔽薄膜,接著將撓性基板與該電磁波遮蔽薄膜一起加熱同時一邊朝厚度方向加壓,藉此於前述撓性基板上形成電磁波遮蔽層。 A method of manufacturing a flexible substrate, wherein an electromagnetic wave shielding film according to claim 1 of the patent application is placed on a flexible substrate, and then the flexible substrate is heated together with the electromagnetic shielding film while being pressed in a thickness direction. Thereby, an electromagnetic wave shielding layer is formed on the flexible substrate. 一種撓性基板,具有一由如申請專利範圍第1項之電磁波遮蔽薄膜所構成之電磁波遮蔽層。A flexible substrate having an electromagnetic wave shielding layer composed of an electromagnetic wave shielding film according to claim 1 of the patent application.
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WO2011111324A1 (en) 2011-09-15
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CN102792790A (en) 2012-11-21
TW201206334A (en) 2012-02-01

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