WO2014021037A1 - Electroconductive film - Google Patents

Electroconductive film Download PDF

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Publication number
WO2014021037A1
WO2014021037A1 PCT/JP2013/067862 JP2013067862W WO2014021037A1 WO 2014021037 A1 WO2014021037 A1 WO 2014021037A1 JP 2013067862 W JP2013067862 W JP 2013067862W WO 2014021037 A1 WO2014021037 A1 WO 2014021037A1
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WO
WIPO (PCT)
Prior art keywords
silver
copper powder
coated copper
conductive film
powder particles
Prior art date
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PCT/JP2013/067862
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French (fr)
Japanese (ja)
Inventor
卓 藤本
昌宏 三輪
康成 脇森
林 富雄
晃祐 織田
隆 障子口
宏幸 森中
Original Assignee
三井金属鉱業株式会社
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Priority to JP2013541105A priority Critical patent/JP5503813B1/en
Publication of WO2014021037A1 publication Critical patent/WO2014021037A1/en

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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K9/00Screening of apparatus or components against electric or magnetic fields
    • H05K9/0073Shielding materials
    • H05K9/0081Electromagnetic shielding materials, e.g. EMI, RFI shielding
    • H05K9/0083Electromagnetic shielding materials, e.g. EMI, RFI shielding comprising electro-conductive non-fibrous particles embedded in an electrically insulating supporting structure, e.g. powder, flakes, whiskers
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B22CASTING; POWDER METALLURGY
    • B22FWORKING METALLIC POWDER; MANUFACTURE OF ARTICLES FROM METALLIC POWDER; MAKING METALLIC POWDER; APPARATUS OR DEVICES SPECIALLY ADAPTED FOR METALLIC POWDER
    • B22F1/00Metallic powder; Treatment of metallic powder, e.g. to facilitate working or to improve properties
    • B22F1/06Metallic powder characterised by the shape of the particles
    • B22F1/068Flake-like particles
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B22CASTING; POWDER METALLURGY
    • B22FWORKING METALLIC POWDER; MANUFACTURE OF ARTICLES FROM METALLIC POWDER; MAKING METALLIC POWDER; APPARATUS OR DEVICES SPECIALLY ADAPTED FOR METALLIC POWDER
    • B22F1/00Metallic powder; Treatment of metallic powder, e.g. to facilitate working or to improve properties
    • B22F1/17Metallic particles coated with metal
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C18/00Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
    • C23C18/16Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
    • C23C18/1601Process or apparatus
    • C23C18/1633Process of electroless plating
    • C23C18/1635Composition of the substrate
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C18/00Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
    • C23C18/54Contact plating, i.e. electroless electrochemical plating
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/09Use of materials for the conductive, e.g. metallic pattern
    • H05K1/092Dispersed materials, e.g. conductive pastes or inks
    • H05K1/095Dispersed materials, e.g. conductive pastes or inks for polymer thick films, i.e. having a permanent organic polymeric binder
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0213Electrical arrangements not otherwise provided for
    • H05K1/0216Reduction of cross-talk, noise or electromagnetic interference
    • H05K1/0218Reduction of cross-talk, noise or electromagnetic interference by printed shielding conductors, ground planes or power plane
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/02Fillers; Particles; Fibers; Reinforcement materials
    • H05K2201/0203Fillers and particles
    • H05K2201/0206Materials
    • H05K2201/0218Composite particles, i.e. first metal coated with second metal
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/02Fillers; Particles; Fibers; Reinforcement materials
    • H05K2201/0203Fillers and particles
    • H05K2201/0242Shape of an individual particle
    • H05K2201/0245Flakes, flat particles or lamellar particles
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/02Fillers; Particles; Fibers; Reinforcement materials
    • H05K2201/0203Fillers and particles
    • H05K2201/0242Shape of an individual particle
    • H05K2201/0248Needles or elongated particles; Elongated cluster of chemically bonded particles

Definitions

  • the present invention relates to a conductive film provided with a conductive film.
  • the electromagnetic shielding material is classified into an electromagnetic shielding material made of a transparent conductive film and an electromagnetic shielding material made of a conductive metal mesh.
  • the electromagnetic wave shielding material made of a conductive film is said to be inferior in electromagnetic wave shielding performance due to its high surface resistivity while being excellent in transparency compared to the electromagnetic wave shielding material made of metal mesh. Therefore, regarding the electromagnetic wave shielding material using a conductive film, increasing the conductivity of the conductive film has been one of the important issues.
  • silver powder has been conventionally used as a metal powder as a conductive material.
  • silver powder is expensive, so silver-coated copper powder obtained by plating silver on the surface of copper powder particles by electroless plating or the like. (Also referred to as “silver coated copper powder”) is beginning to be used.
  • Patent Document 1 discloses that a scaly silver powder having an average particle size of 2.0 to 5.0 ⁇ m and a dendritic tree having an average particle size of 10 to 19 ⁇ m are used in order to obtain a conductive paste composition that satisfies the bending characteristics required by a flexible substrate. It is disclosed to use a mixed powder with a silver-plated copper powder.
  • Patent Document 2 discloses that in an electromagnetic wave shielding film in which a protective layer is laminated on a conductive layer made of (A) metal powder and (B) a binder resin, the conductive layer (a) has an average thickness of 50 to 300 nm. And a conductive paste containing flaky metal powder having an average particle diameter of 3 to 10 ⁇ m and (b) acicular or dendritic metal powder (particularly silver-coated copper powder) having an average particle diameter of 3 to 10 ⁇ m. are disclosed.
  • the present invention relates to a conductive film provided with a conductive film using silver-coated copper powder as a conductive material, and provides a new conductive film that can obtain desired conductive characteristics without blending silver powder. To do.
  • the present invention is a conductive film comprising a conductive film containing dendritic silver-coated copper powder particles on a base film, wherein the dendritic silver-coated copper powder particles are at least part of the surface of the copper powder particles Is a silver-coated copper powder particle coated with silver, and when the silver-coated copper powder particle is observed using a scanning electron microscope (SEM), it has one main axis and is orthogonal to the main axis.
  • SEM scanning electron microscope
  • a plurality of branches branch in a direction or oblique direction to form a dendritic shape that grows two-dimensionally or three-dimensionally, and the thickness a of the main axis is 0.3 ⁇ m to 6.0 ⁇ m, and from the main axis
  • a conductive film characterized by dendritic silver-coated copper powder particles having a longest branch length b of 0.3 ⁇ m to 10.0 ⁇ m among the extended branches is proposed.
  • the silver-coated copper powder used in the present invention is a silver-coated copper powder particle having a dendritic shape in which the branches branched from the main axis are significantly grown as compared with the conventional silver-coated copper powder.
  • the particles are further overlapped with each other, the number of contacts between the particles is further increased, and a further excellent electrical conductivity can be obtained. Therefore, sufficient conductive properties can be obtained without adding silver powder, and sufficient conductive properties can be obtained even if the amount of silver-coated copper powder particles is small. Therefore, not only an inexpensive and excellent conductive film can be obtained, but also the transparency of the film can be further increased, and therefore, for example, positioning when the films are bonded can be performed more easily.
  • the conductive film (referred to as “the present conductive film”) according to the present embodiment may be a film provided with a conductive film containing dendritic silver-coated copper powder particles on a base film.
  • a transparent support film is preferably used.
  • a plastic film, a plastic plate, a glass plate, or the like can be used.
  • the raw material for the plastic film and plastic plate include polyesters such as polyethylene terephthalate (PET) and polyethylene naphthalate; polyolefins such as polyethylene (PE), polypropylene (PP), polystyrene, EVA; polyvinyl chloride, Vinyl resins such as polyvinylidene chloride; polyether ether ketone (PEEK), polysulfone (PSF), polyether sulfone (PES), polycarbonate (PC), polyamide, polyimide, acrylic resin, triacetyl cellulose (TAC) Etc. can be used.
  • PET polyethylene terephthalate
  • PP polypropylene
  • EVA polystyrene
  • polyvinyl chloride Vinyl resins such as polyvinylidene chloride
  • PEEK polyether ether ketone
  • PSF poly
  • the conductive film only needs to be a layer containing dendritic silver-coated copper powder particles and a binder resin, and is a single layer consisting of only the layer containing dendritic silver-coated copper powder particles (so-called “isotropic conductive film”). Or a multilayer (so-called “anisotropic conductive film”) in which another layer is stacked on the layer.
  • the dendrite-like silver-coated copper powder particles are silver-coated copper powder particles obtained by coating at least part of the surface of the copper powder particles as a core material with silver and exhibit a dendrite-like shape (“the present silver-coated copper Called "powder particles").
  • the present silver-coated copper powder particles it is sufficient that at least a part of the surface of the copper powder particles as the core material is coated with silver, and the entire surface of the copper powder particles may be coated with silver. In addition, a part of the surface of the copper powder particles may be exposed.
  • dendritic means having a single main axis when observed with an optical microscope or an electron microscope (500 to 20,000 times), and a plurality of branches in an orthogonal direction or an oblique direction from the main axis.
  • the present silver-coated copper powder particles contain, among the dendritic copper powder particles, particles exhibiting a dendritic shape having the following characteristics when observed with an optical microscope or an electron microscope (500 to 20,000 times). Is preferred (see FIG. 1). -It is important that the thickness a of the main shaft is 0.3 ⁇ m to 6.0 ⁇ m, especially 0.4 ⁇ m or more and 4.5 ⁇ m or less, especially 0.5 ⁇ m or more or 4.0 ⁇ m or less. preferable. When the thickness a of the main shaft of the dendrites is less than 0.3 ⁇ m, the main shaft is not firm, so it easily breaks during paste kneading. .
  • the major axis L of the main shaft is preferably 0.1 ⁇ m to 100.0 ⁇ m, more preferably 0.5 ⁇ m or more and 50 ⁇ m or less, and particularly preferably 1 ⁇ m or more or 30 ⁇ m or less.
  • the longest branch length b (referred to as “branch length b”) among the branches extending from the main axis indicates the degree of dendrite growth, and is important to be 0.3 ⁇ m to 10.0 ⁇ m. In particular, 0.5 ⁇ m or more or 9.0 ⁇ m or less, and more preferably 0.7 ⁇ m or more or 8.0 ⁇ m or less. If the branch length b is less than 0.3 ⁇ m, it cannot be said that the dendrite has grown to an extent sufficient to obtain excellent conduction. On the other hand, when the branch length b exceeds 10.0 ⁇ m, the fluidity of the copper powder is lowered and the handling becomes difficult.
  • the number of branches with respect to the major axis L of the main axis indicates the number of dendrite branches and is preferably 0.1 / ⁇ m to 5.0 / ⁇ m, especially 0 .3 / ⁇ m or more or 4.5 / ⁇ m or less, of which 0.5 / ⁇ m or more or 4.0 / ⁇ m or less, of which 0.8 / ⁇ m or more or 3.5 / ⁇ m In the following, it is more preferable that the number is 1.0 / ⁇ m or more or 3.0 / ⁇ m or less.
  • the number of branches / major axis L is 0.1 / ⁇ m or more, the number of branches in the film is sufficiently large and sufficient contact can be secured, while the number of branches / major axis L is 5.0 / ⁇ m or less. If it exists, it can prevent that the fluidity
  • the silver-coated copper powder particles contained in the conductive film are dendrite-like particles as described above when observed with an optical microscope or an electron microscope (500 to 20,000 times). Even if mixed, the same effect as that of the silver-coated copper powder particles composed only of the dendritic particles as described above can be obtained. Therefore, from this point of view, when the conductive film is observed with an optical microscope or an electron microscope (500 to 20,000 times), the above silver-coated copper powder particles are 60% by number or more of the total silver-coated copper powder particles.
  • the non-dendritic silver-coated copper powder particles that are not recognized as dendritic may be included as long as they account for 80% by number or more, more preferably 90% by number or more.
  • the dendritic copper powder as a core material is dispersed in water, a chelating agent is added, and then a water-soluble silver salt is added to cause a substitution reaction to obtain copper powder particles. After the surface layer is replaced with silver, the obtained silver-coated copper powder is taken out of the solution, washed with a chelating agent, and dried.
  • a chelating agent is added to cause a substitution reaction to obtain copper powder particles.
  • the displacement plating coating method can not only uniformly coat the surface of the core material (copper powder particles) with silver, but also can suppress the aggregation of particles after coating. Therefore, it is preferable to employ the displacement plating coating method because it has a feature that it can be manufactured at a lower cost.
  • chelating agent examples include ethylenediaminetetraacetic acid salt (hereinafter referred to as “EDTA”), aminocarboxylic acid-based chelating agents such as diethylenetriaminepentaacetic acid and iminodiacetic acid, hydroxyethylethylenediaminetriacetic acid, dihydroxyethylethylenediaminediacetic acid), 1 , 3-propanediaminetetraacetic acid, one or two or more selected from propanediaminetetraacetic acid can be mentioned, and among these, EDTA is preferably used.
  • EDTA ethylenediaminetetraacetic acid salt
  • aminocarboxylic acid-based chelating agents such as diethylenetriaminepentaacetic acid and iminodiacetic acid, hydroxyethylethylenediaminetriacetic acid, dihydroxyethylethylenediaminediacetic acid), 1 , 3-propanediaminetetraacetic acid, one or two or more selected from propanediaminetetraace
  • the pH of the solution that is, the pH of the solution during the substitution reaction is preferably adjusted to 3-7.
  • Silver salts soluble in water that is, Ag ion sources include silver nitrate, silver perchlorate, silver acetate, silver oxalate, silver chlorate, silver hexafluorophosphate, and boron tetrafluoride.
  • One or more selected from acid silver, silver hexafluoroarsenate, and silver sulfate can be mentioned.
  • the amount of silver salt added is preferably equal to or greater than the theoretical equivalent, for example, when copper is used as the core material, the amount of silver is 2 mol or more, particularly 2.1 mol or more with respect to 1 mol of copper. When the amount is less than 2 mol, the substitution is insufficient and a large amount of copper remains in the silver powder particles. However, it is not economical to add 2.5 mol or more.
  • the silver content in the silver powder particles can be adjusted by the amount of silver salt added, the reaction time, the reaction rate, the amount of chelating agent added, and the like. After completion of the substitution reaction, the silver powder particles are preferably thoroughly washed and dried.
  • the copper powder used as the core material it is preferable to use a copper powder exhibiting a dendrite shape with sufficiently developed branches. If silver is coated by the above method, the shape of the copper powder particles used as the core material can be converted into the particle shape of the present silver-coated copper powder almost as it is.
  • the above-described copper powder having a dendritic shape with sufficiently developed branches can be produced by the following electrolytic method.
  • an anode and a cathode are immersed in a sulfuric acid electrolytic solution containing copper ions, a direct current is passed through the electrolyte, and copper is deposited on the cathode surface in a powder form.
  • a method of producing copper powder through a sieving step or the like, if necessary, by scraping and collecting by mechanical or electrical methods, washing, drying.
  • the copper ions in the electrolyte solution are consumed as copper is deposited, so the copper ion concentration in the electrolyte solution near the electrode plate is reduced, and the electrolytic efficiency decreases as it is. End up. Therefore, normally, in order to increase the electrolysis efficiency, the electrolyte solution in the electrolytic cell is circulated so that the copper ion concentration of the electrolyte solution between the electrodes does not become thin.
  • the copper ion concentration in the electrolyte solution near the electrode is low.
  • the size of the electrolytic cell, the number of electrodes, the distance between the electrodes, and the circulation amount of the electrolytic solution are adjusted, and the copper ion concentration of the electrolytic solution in the vicinity of the electrodes is adjusted to be low. It is preferable to adjust so that the copper ion concentration of the electrolyte solution between electrodes is always thinner than the copper ion concentration of the electrolyte solution at the bottom.
  • the electrolytic cell size is 2 m 3 to 10 m 3
  • the number of electrodes is 10 to 40
  • the distance between the electrodes is 5 cm to 50 cm
  • the copper ion concentration is 1 g /
  • conditions may be set as appropriate based on common general technical knowledge within the range of the above conditions. For example, if it is intended to obtain dendritic copper powder particles having a large particle size, the copper concentration is preferably set to a relatively high concentration within the above preferred range, and the current density is relatively low within the above preferred range. The density is preferably set, and the electrolysis time is preferably set to a relatively long time within the above preferable range. If it is intended to obtain dendritic copper powder particles having a small particle size, it is preferable to set the respective conditions based on the opposite concept. As an example, the copper concentration may be 1 g / L to 20 g / L, the current density may be 50 A / m 2 to 1000 A / m 2 , and the electrolysis time may be 5 minutes to 12 hours.
  • the core material is preferably subjected to a treatment for removing the surface oxide (oxide film) before the substitution reaction, if necessary.
  • a treatment for removing the surface oxide (oxide film) before the substitution reaction if necessary.
  • a reducing agent such as hydrazine is added and stirred and mixed to react. At this time, it is preferable that the added reducing agent is sufficiently washed and removed from the core material.
  • Binder resin for example, epoxy resin, phenol resin, unsaturated polyester resin, polyurethane resin, acrylic resin, melamine resin, polyimide resin, polyamideimide resin, and the like can be used. However, it is not limited to these.
  • the content of the silver-coated copper powder particles in the conductive film may be 2 to 85% by mass of the entire conductive film.
  • the present silver-coated copper powder particles have a feature that electrical conductivity can be obtained even with a small amount.
  • the content of the silver-coated copper powder particles is about 30 to 50% by mass.
  • electromagnetic wave shielding characteristics can be obtained.
  • more preferable conductivity can be obtained if the content of the silver-coated copper powder particles is higher.
  • anisotropic conductive film composed of two layers of a layer containing the present silver-coated copper powder particles and another conductive layer, for example, a conductive layer containing silver
  • the number is remarkably small. For example, it may be about 2 to 5% by mass.
  • the conductive film may contain components other than the binder resin and the present silver-coated copper powder particles.
  • silver particles may be included.
  • the shape of the silver particles is not particularly limited, and examples thereof include a spherical shape and a scale shape. However, since this conductive film can obtain electrical continuity even if it does not contain silver particles, the conductive material contained in the conductive film (in this case, the total of dendritic silver-coated copper powder particles and silver particles)
  • the present silver-coated copper powder particles preferably occupy 80% by number or more, particularly 90% by number or more.
  • the thickness of the conductive film is not particularly limited, and greatly varies depending on whether the conductive film is an anisotropic conductive film or an isotropic conductive film. In any case, the thickness is preferably in the range of 5 ⁇ m to 60 ⁇ m. If the thickness is 5 ⁇ m or more, desirable conductivity can be obtained, and if the thickness is 50 ⁇ m or less, the flexibility of the conductive film can be maintained, bending characteristics can be maintained, and cost can be reduced. .
  • the conductive film can be formed by applying a conductive paste to a base film.
  • the present silver-coated copper powder is mixed with a binder and a solvent, and further, if necessary, a curing agent, a coupling agent, a corrosion inhibitor, etc., without breaking the shape of the present silver-coated copper powder.
  • an electrically conductive paste by kneading so as to be dispersed in the paste. Specifically, avoid the use of a stirrer that gives mechanical impact to the powder, for example, kneading without giving mechanical impact, such as using Awatori Netaro (trade name) or planetary mixer. It is preferable to prepare a conductive paste.
  • binder examples include, but are not limited to, liquid epoxy resins, phenol resins, unsaturated polyester resins, and the like.
  • solvent examples include terpineol, ethyl carbitol, carbitol acetate, butyl cellosolve and the like.
  • curing agent examples include 2-ethyl 4-methylimidazole.
  • corrosion inhibitor examples include benzothiazole and benzimidazole. Additives such as thickeners and leveling agents can also be added. Furthermore, it is also possible to add inorganic fillers, such as carbon and a silica, as needed.
  • Examples of the method for applying the conductive paste include screen printing, intaglio printing, lithographic printing, and dispenser. Screen printing is most preferably used from the viewpoint of the fineness, film thickness, and productivity of the formed wiring.
  • the film which comprises a protective layer can be formed, for example with an epoxy resin, a urethane resin, etc.
  • the surface hardness of the protective layer is preferably H to 4H in terms of pencil hardness.
  • an acrylic hard coat layer can be laminated on the layer made of the epoxy resin or urethane resin as necessary. If the surface hardness of the protective layer is less than H as the pencil hardness, the protective layer is likely to be damaged, whereas if it is greater than 4H, the flexibility is reduced and the sliding characteristics may be deteriorated.
  • the conductive film can obtain conductivity without using silver powder as a conductive material, and can obtain conductivity even when the content of dendritic silver-coated copper powder particles is small. Can do. Therefore, the transparency of the film can be increased. Moreover, it has excellent electromagnetic shielding characteristics. Since this electroconductive film is provided with such a characteristic, it can be utilized as electroconductive films, such as an electromagnetic wave shield film, a bonding film which connects a circuit board and a circuit board, and an antistatic film, for example. Especially, it can utilize especially preferably as an electromagnetic wave shielding film.
  • the electromagnetic wave shielding film even if it is an isotropic conductive film that forms a conductive film only from the layer containing the present silver-coated copper powder particles, the layer containing the present silver-coated copper powder particles and other conductive film layers, for example, any anisotropic conductive film that forms a conductive film from two layers such as a silver film layer can be formed.
  • the electromagnetic wave shielding film for example, a flexible substrate in which a conductive film is formed on a flexible substrate by placing the conductive film on a flexible substrate and performing a pressing process of heating while pressing at a pressure of 1 to 5 MPa. Can be formed. Also in this case, it is preferable to press the silver-coated copper powder without breaking the shape.
  • ⁇ Bending resistivity change value> The films produced in Examples and Comparative Examples were folded 100 times, and the specific resistance before and after folding ( ⁇ / ⁇ ) was measured. Table 1 shows the relative value when the value of the specific resistance ( ⁇ / ⁇ ) after bending is set to 1.00 and the specific resistance ( ⁇ / ⁇ ) before bending is 1.00. Indicated by value.
  • Example 1 28.0 parts by mass of silver-coated copper powder, 34.3 parts by mass of an epoxy-based thermosetting resin as a binder, and 37.7 parts by mass of a MEK / PGM mixed solvent (mixing ratio 3/2) as a solvent,
  • a conductive paste was prepared by kneading using a stirrer (“Awori Nertaro” manufactured by Shinky Co., Ltd., planetary mixer manufactured by Asada Tekko Co., Ltd.) so as to maintain the shape of the silver-coated copper powder particles.
  • This conductive paste is applied to the surface of a 25 ⁇ m-thick fluororesin film (“Aflex” manufactured by Asahi Glass) with an applicator so as to have a thickness of 30 ⁇ m, and a conductive film (electromagnetic wave shield) is formed. Film). At this time, the content rate of the silver covering copper powder in a electrically conductive film was 45 wt%.
  • the electrolytic solution to be circulated was adjusted to a Cu concentration of 10 g / L, a sulfuric acid (H 2 SO 4 ) concentration of 100 g / L, and a current density of 80 A / m 2 for electrolysis for 1 hour.
  • the copper ion concentration of the electrolyte solution between the electrodes was always kept lower than the copper ion concentration of the electrolyte solution at the bottom of the electrolytic cell. Then, the copper deposited on the cathode surface was mechanically scraped and collected, and then washed to obtain a hydrated copper powder cake equivalent to 1 kg of copper powder.
  • This cake was dispersed in 3 L of water, 1 L of an industrial gelatin (made by Nitta Gelatin Co., Ltd.) 10 g / L aqueous solution was added, stirred for 10 minutes, filtered through a Buchner funnel, washed, and then under reduced pressure (1 ⁇ 10 ⁇ 3 Pa) at 80 ° C. for 6 hours to obtain electrolytic copper powder. 25 kg of the obtained electrolytic copper powder was put into 50 L of pure water kept at 50 ° C. and stirred well. Separately, 4.5 kg of silver nitrate was put into 5 L of pure water to prepare a silver nitrate solution. The silver nitrate solution was added all at once to the solution in which the copper powder was dissolved.
  • an industrial gelatin made by Nitta Gelatin Co., Ltd.
  • the silver-coated copper powder slurry is filtered by vacuum filtration. After the filtration is completed, the slurry is washed with a solution obtained by dissolving 600 g of EDTA (ethylenediaminetetraacetic acid) in 6 L of pure water, followed by 3 L of pure water. Residual EDTA was washed with water. Then, it was made to dry at 120 degreeC for 3 hours, and dendritic silver covering copper powder (sample) was obtained. The silver coating amount was 10.8% by mass of the total silver-coated copper powder.
  • EDTA ethylenediaminetetraacetic acid
  • the obtained dendrite-like silver-coated copper powder (sample) was observed using an optical microscope, at least 90% or more of the copper powder particles had one main axis, and a plurality of branches were oblique from the main axis. It has a dendritic shape that branches into a three-dimensional growth and has a main axis thickness a: 4.2 ⁇ m, a main shaft length L: 20.3 ⁇ m, a branch length b: 7.4 ⁇ m, and the number of branches / major axis L: The number was 1.6 / ⁇ m. As shown in Table 1, the sheet resistance of this conductive film showed a good value.
  • Example 2 A conductive film (electromagnetic wave shielding film) was produced in the same manner as in Example 1 except that 18.7 parts by mass of the silver-coated copper powder and 43.6 parts by mass of the epoxy thermosetting resin as the binder were used. At this time, the content rate of the silver covering copper powder in a electrically conductive film was 30 wt%.
  • An electrolytic copper powder was obtained in the same manner as in Example 1 except that the Cu concentration of the electrolytic solution was 5 g / L, the electrolysis time was 40 minutes, and the amount of circulating liquid was 20 L / min. Then, silver was coated in the same manner as in Example 1 to obtain a dendrite-like silver-coated copper powder (sample). The silver coating amount was 10.9% by mass of the total silver-coated copper powder.
  • the obtained dendrite-like silver-coated copper powder (sample) was observed using an optical microscope, at least 90% or more of the copper powder particles had one main axis, and a plurality of branches were oblique from the main axis.
  • It has a dendrite-like shape that branches into a three-dimensional growth and has a main axis thickness a: 1.8 ⁇ m, a main shaft length L: 14.9 ⁇ m, a branch length b: 3.9 ⁇ m, and the number of branches / major axis L: The number was 1.5 / ⁇ m.
  • Example 3 A conductive film (electromagnetic wave shielding film) was produced in the same manner as in Example 1 except that 28.0 parts by mass of the silver-coated copper powder and 34.3 parts by mass of the epoxy thermosetting resin as the binder were used. At this time, the content rate of the silver covering copper powder in a electrically conductive film was 45 wt%.
  • An electrolytic copper powder was obtained in the same manner as in Example 1 except that the Cu concentration of the electrolytic solution was 6 g / L, the circulating liquid amount was 20 L / min, the electrolysis time was 40 minutes, and the current density was 150 A / m 2 . Then, silver was coated in the same manner as in Example 1 to obtain a dendrite-like silver-coated copper powder (sample). The silver coating amount was 10.8% by mass of the total silver-coated copper powder. When the obtained dendrite-like silver-coated copper powder (sample) was observed using an optical microscope, at least 90% or more of the copper powder particles had one main axis, and a plurality of branches were oblique from the main axis.
  • Main shaft thickness a 2.1 ⁇ m
  • main shaft length L 14.6 ⁇ m
  • branch length b 4.2 ⁇ m
  • number of branches / major axis L It was 3.1 / ⁇ m.
  • Table 1 the sheet resistance of this conductive film showed a good value.
  • Example 4 A conductive film (electromagnetic wave shielding film) was produced in the same manner as in Example 1 except that 40.5 parts by mass of the silver-coated copper powder and 21.8 parts by mass of the epoxy thermosetting resin as a binder were used. At this time, the content rate of the silver covering copper powder in a electrically conductive film was 65 wt%.
  • An electrolytic copper powder was obtained in the same manner as in Example 1 except that the Cu concentration of the electrolytic solution was 1 g / L, the circulating liquid amount was 10 L / min, and the electrolysis time was 40 minutes. Then, silver was coated in the same manner as in Example 1 to obtain a dendrite-like silver-coated copper powder (sample). The silver coating amount was 10.7% by mass of the entire silver-coated copper powder.
  • the obtained dendrite-like silver-coated copper powder (sample) was observed using an optical microscope, at least 90% or more of the copper powder particles had one main axis, and a plurality of branches were oblique from the main axis.
  • Example 5 A conductive film (electromagnetic wave shielding film) was produced in the same manner as in Example 1 except that 31.2 parts by mass of the silver-coated copper powder and 31.2 parts by mass of the epoxy thermosetting resin as the binder. At this time, the content rate of the silver covering copper powder in a electrically conductive film was 50 wt%.
  • An electrolytic copper powder was obtained in the same manner as in Example 1 except that the Cu concentration of the electrolytic solution was 4 g / L, the circulating liquid amount was 10 L / min, the electrolysis time was 10 minutes, and the current density was 150 A / m 2 . Then, silver was coated in the same manner as in Example 1 to obtain a dendrite-like silver-coated copper powder (sample). The silver coating amount was 10.8% by mass of the total silver-coated copper powder. When the obtained dendrite-like silver-coated copper powder (sample) was observed using an optical microscope, at least 90% or more of the copper powder particles had one main axis, and a plurality of branches were oblique from the main axis.
  • Main axis thickness a 1.4 ⁇ m
  • main axis length L 6.0 ⁇ m
  • branch length b 5.2 ⁇ m
  • number of branches / major axis L The number was 2.5 / ⁇ m.
  • Table 1 the sheet resistance of this conductive film showed a good value.
  • Example 6 A conductive film (electromagnetic wave shielding film) was produced in the same manner as in Example 1 except that 28.0 parts by mass of the silver-coated copper powder and 34.3 parts by mass of the epoxy thermosetting resin as the binder were used. At this time, the content rate of the silver covering copper powder in a electrically conductive film was 45 wt%.
  • Electrolysis was performed in the same manner as in Example 1 except that the Cu concentration of the electrolytic solution was 1 g / L, the circulating fluid amount was 40 L / min, the electrolysis time was 5 minutes, the current density was 150 A / m 2 , and the circulating fluid amount was 10 L / min. Copper powder was obtained. Then, silver was coated in the same manner as in Example 1 to obtain a dendrite-like silver-coated copper powder (sample). The silver coating amount was 10.5% by mass of the entire silver-coated copper powder.
  • the obtained dendrite-like silver-coated copper powder (sample) was observed using a scanning electron microscope (SEM), at least 90% or more of the copper powder particles had one main axis, and from the main axis It has a dendritic shape in which a plurality of branches obliquely branch and grow three-dimensionally.
  • the main axis thickness a is 0.5 ⁇ m
  • the main axis length L is 3.1 ⁇ m
  • the branch length b is 2.9 ⁇ m
  • the branches Number / major axis L 3.0 / ⁇ m.
  • Table 1 the sheet resistance of this conductive film showed a good value.
  • Example 1 A conductive film (electromagnetic wave shielding film) was produced in the same manner as in Example 1 except that 40.5 parts by mass of the silver-coated copper powder and 21.8 parts by mass of the epoxy thermosetting resin as a binder were used. At this time, the content rate of the silver covering copper powder in a electrically conductive film was 65 wt%.
  • Electrodes In an electrolytic cell having a size of 2.5 m ⁇ 1.1 m ⁇ 1.5 m (about 4 m 3 ), nine copper cathode plates and a copper anode plate (electrodes) each having a size (1.0 m ⁇ 1.0 m) are electrodes. Suspend so that the distance is 5 cm, circulate a copper sulfate solution as an electrolytic solution at 2 L / min, immerse the anode and the cathode in this electrolytic solution, conduct a direct current through this to perform electrolysis, Powdered copper was deposited on the cathode surface.
  • the electrolytic solution to be circulated was adjusted to a Cu concentration of 100 g / L, a sulfuric acid (H 2 SO 4 ) concentration of 100 g / L, a circulating liquid amount of 2 L / min, and a current density of 80 A / m 2 for electrolysis for 60 minutes. Carried out.
  • the copper ion concentration in the electrolyte solution between the electrodes was always higher than the copper ion concentration in the electrolyte solution at the bottom of the electrolytic cell.
  • the copper deposited on the cathode surface was mechanically scraped and collected, and then washed to obtain a hydrous copper powder cake equivalent to 1 kg of copper powder.
  • This cake was dispersed in 3 L of water, 1 L of an industrial gelatin (made by Nitta Gelatin) 10 g / L aqueous solution 1 L was added, stirred for 10 minutes, filtered through a Buchner funnel, washed, and then washed at 80 ° C. in an air atmosphere. It was dried for 6 hours to obtain electrolytic copper powder. Then, silver was coated in the same manner as in Example 1 to obtain a silver-coated copper powder (sample). The silver coating amount was 10.7% by mass of the entire silver-coated copper powder.
  • the particle shape of the obtained electrolytic copper powder was pine cone-shaped, and the measurement of the spindle thickness, branch length, number of branches / long diameter L was I could not do it. As shown in Table 1, the sheet resistance of this conductive film could not be measured due to overrange.
  • a conductive film (electromagnetic wave shielding film) was produced in the same manner as in Example 1 except that. At this time, the content rate of the silver covering copper powder in a electrically conductive film was 65 wt%. As shown in Table 1, the sheet resistance of this conductive film could not be measured due to overrange.
  • ⁇ Comparative Example 3> As a binder, 40.5 parts by mass of silver-coated copper powder obtained by coating 10% by mass of silver on a copper powder particle (average particle thickness: 1 ⁇ m, maximum particle diameter average: 5 ⁇ m) having a coin shape as a particle shape A conductive film (electromagnetic wave shielding film) was produced in the same manner as in Example 1 except that 21.8 parts by mass of the epoxy-based thermosetting resin was used. At this time, the content rate of the silver covering copper powder in a electrically conductive film was 65 wt%. As shown in Table 1, the sheet resistance of this conductive film could not be measured due to overrange.
  • a conductive film (electromagnetic wave shield film) was produced in the same manner as Example 1 except for the above. At this time, the content rate of the silver covering copper powder in a electrically conductive film was 65 wt%. As shown in Table 1, the sheet resistance of this conductive film showed a slightly high value.
  • the conductive film provided with the conductive film using silver-coated copper powder as the conductive material was remarkably grown as a dendrite as in Example 1-6. If the conductive material containing the silver-coated copper powder particles is used, the required conductivity can be obtained without blending the silver powder as compared with the conventional silver-coated copper powder, and the amount of the silver-coated copper powder can be reduced. It has been found that the necessary conductivity can be obtained even with a small amount.

Abstract

The present invention pertains to an electroconductive film in which silver-coated copper powder is used, and provides a novel electroconductive film in which the desired electroconductive properties can be obtained even without adding silver powder. An electroconductive film in which an electroconductive film containing dendritic silver-coated copper powder particles is provided on a substrate film, wherein silver-coated copper powder particles in which at least a part of the surface of copper powder particles is covered by silver are used as the dendritic silver-coated copper powder particles. When the silver-coated copper powder particles are observed using a scanning electron microscope (SEM), the particles have a dendritic shape provided with a single main axis and a plurality of branches branching off from the main axis in perpendicular or diagonal directions, and resulting from two- or three-dimensional growth. The thickness (a) along the main axis is 0.3 to 6.0 μm. The length (b) of the longest of the branches extending from the main axis is 0.3 to 10.0 μm.

Description

導電性フィルムConductive film
 本発明は、導電膜を備えた導電性フィルムに関する。 The present invention relates to a conductive film provided with a conductive film.
 ディスプレイから発生する電磁波が外部に漏洩して人体への悪影響を防ぐという要求に対して、種々の電磁波シールド材が開発されている。
 電磁波シールド材は、透明導電膜による電磁波シールド材と、導電性の金属メッシュによる電磁波シールド材とに区分される。このうち、導電膜による電磁波シールド材は、金属メッシュによる電磁波シールド材に比べて透明性に優れる反面、表面抵抗率が大きく、電磁波シールド性能に劣ると言われている。そのため、導電膜による電磁波シールド材に関しては、導電膜の導電性を高めることが重要な課題の一つであった。
Various electromagnetic shielding materials have been developed in response to the requirement that electromagnetic waves generated from a display leak outside and prevent adverse effects on the human body.
The electromagnetic shielding material is classified into an electromagnetic shielding material made of a transparent conductive film and an electromagnetic shielding material made of a conductive metal mesh. Among these, the electromagnetic wave shielding material made of a conductive film is said to be inferior in electromagnetic wave shielding performance due to its high surface resistivity while being excellent in transparency compared to the electromagnetic wave shielding material made of metal mesh. Therefore, regarding the electromagnetic wave shielding material using a conductive film, increasing the conductivity of the conductive film has been one of the important issues.
 導電膜による電磁波シールド材としては、例えば導電材料としての金属粉を、バインダ樹脂中に分散させた導電性ペーストを、基材フィルムに塗布して導電層を形成し、さらにその上に保護層を形成してなるものが知られている。
 この際、導電材料としての金属粉として、従来から銀粉が使われてきたが、銀粉は高価であるため、無電解メッキなどによって銅粉粒子の表面に、銀をメッキしてなる銀被覆銅粉(「銀被覆銅粉」とも称される)が使用され始めている。
As an electromagnetic shielding material using a conductive film, for example, a conductive paste in which metal powder as a conductive material is dispersed in a binder resin is applied to a base film to form a conductive layer, and a protective layer is further formed thereon. What is formed is known.
At this time, silver powder has been conventionally used as a metal powder as a conductive material. However, silver powder is expensive, so silver-coated copper powder obtained by plating silver on the surface of copper powder particles by electroless plating or the like. (Also referred to as “silver coated copper powder”) is beginning to be used.
 例えば特許文献1には、フレキシブル基板が要求する折り曲げ特性を満足できる導電性ペースト組成物を得るために、平均粒径2.0~5.0μmの鱗片状銀粉と平均粒径10~19μmの樹枝状銀メッキ銅粉との混合粉末を使用することが開示されている。 For example, Patent Document 1 discloses that a scaly silver powder having an average particle size of 2.0 to 5.0 μm and a dendritic tree having an average particle size of 10 to 19 μm are used in order to obtain a conductive paste composition that satisfies the bending characteristics required by a flexible substrate. It is disclosed to use a mixed powder with a silver-plated copper powder.
 また、特許文献2には、(A)金属粉と(B)バインダ樹脂とからなる導電層に、保護層が積層されてなる電磁波シールドフィルムにおいて、導電層が(a)平均厚さ50~300nm、平均粒径3~10μmの薄片状金属粉と、(b)平均粒径3~10μmの針状又は樹枝状金属粉(特に銀被覆銅粉)とを含有する導電性ペーストから形成されてなるものが開示されている。 Patent Document 2 discloses that in an electromagnetic wave shielding film in which a protective layer is laminated on a conductive layer made of (A) metal powder and (B) a binder resin, the conductive layer (a) has an average thickness of 50 to 300 nm. And a conductive paste containing flaky metal powder having an average particle diameter of 3 to 10 μm and (b) acicular or dendritic metal powder (particularly silver-coated copper powder) having an average particle diameter of 3 to 10 μm. Are disclosed.
特開2009-230952号公報JP 2009-230952 A 特開2011-187895号公報JP 2011-187895 A
 従来、電磁波シールドフィルムなどの導電性フィルムにおいて、導電材料として銀被覆銅粉を用いると言っても、前記特許文献1及び2のように、所定量以上の銀粉を混合しなければ所望の導電特性が得られなかったため、銀粉を混合する分だけコスト高となっていた。 Conventionally, in a conductive film such as an electromagnetic wave shielding film, even if silver-coated copper powder is used as a conductive material, as described in Patent Documents 1 and 2, if a predetermined amount or more of silver powder is not mixed, desired conductive characteristics are obtained. Therefore, the cost was increased by the amount of silver powder mixed.
 そこで本発明は、導電材料として銀被覆銅粉を使用した導電膜を備えた導電性フィルムに関し、銀粉を配合しなくても所望の導電特性を得ることができる新たな導電性フィルムを提供せんとするものである。 Therefore, the present invention relates to a conductive film provided with a conductive film using silver-coated copper powder as a conductive material, and provides a new conductive film that can obtain desired conductive characteristics without blending silver powder. To do.
 本発明は、基材フィルム上に、デンドライト状銀被覆銅粉粒子を含有する導電膜を備えた導電性フィルムであって、前記デンドライト状銀被覆銅粉粒子は、銅粉粒子表面の少なくとも一部が銀で被覆されてなる銀被覆銅粉粒子であり、且つ、走査型電子顕微鏡(SEM)を用いて銀被覆銅粉粒子を観察した際、一本の主軸を備えており、該主軸から直交方向又は斜め方向に複数の枝が分岐して、二次元的或いは三次元的に成長したデンドライト状を呈し、且つ、主軸の太さaが0.3μm~6.0μmであり、且つ、主軸から伸びた枝の中で最も長い枝の長さbが0.3μm~10.0μmであるデンドライト状銀被覆銅粉粒子である、ことを特徴とする導電性フィルムを提案する。 The present invention is a conductive film comprising a conductive film containing dendritic silver-coated copper powder particles on a base film, wherein the dendritic silver-coated copper powder particles are at least part of the surface of the copper powder particles Is a silver-coated copper powder particle coated with silver, and when the silver-coated copper powder particle is observed using a scanning electron microscope (SEM), it has one main axis and is orthogonal to the main axis. A plurality of branches branch in a direction or oblique direction to form a dendritic shape that grows two-dimensionally or three-dimensionally, and the thickness a of the main axis is 0.3 μm to 6.0 μm, and from the main axis A conductive film characterized by dendritic silver-coated copper powder particles having a longest branch length b of 0.3 μm to 10.0 μm among the extended branches is proposed.
 本発明で使用する銀被覆銅粉は、従来の銀被覆銅粉に比べて、主軸から分岐した樹枝が顕著に成長したデンドライト状を呈する銀被覆銅粉粒子であるため、従来の銀被覆銅粉に比べて、粒子同士がより一層重なるようになり、粒子間の接点の数がより一層多くなり、より一層優れた導通性を得ることができる。そのため、銀粉を配合しなくても十分な導電特性を得ることができ、しかも、銀被覆銅粉粒子の量が少なくても十分な導電特性を得ることができる。よって、安価で且つ優れた導電性フィルムを得ることができるばかりか、フィルムの透明性をさらに高めることができるため、例えばフィルムを貼り合せる際の位置決めなどをより一層容易に行うことができる。 The silver-coated copper powder used in the present invention is a silver-coated copper powder particle having a dendritic shape in which the branches branched from the main axis are significantly grown as compared with the conventional silver-coated copper powder. As compared with the above, the particles are further overlapped with each other, the number of contacts between the particles is further increased, and a further excellent electrical conductivity can be obtained. Therefore, sufficient conductive properties can be obtained without adding silver powder, and sufficient conductive properties can be obtained even if the amount of silver-coated copper powder particles is small. Therefore, not only an inexpensive and excellent conductive film can be obtained, but also the transparency of the film can be further increased, and therefore, for example, positioning when the films are bonded can be performed more easily.
デンドライト状を呈する銀被覆銅粉粒子のモデル図である。It is a model figure of the silver covering copper powder particle which exhibits a dendrite shape. 本発明の一例に係る導電性フィルムを、光学顕微鏡を用いて2,000倍の倍率で観察した際の写真である。It is a photograph at the time of observing the electroconductive film which concerns on an example of this invention by the magnification of 2,000 times using the optical microscope. 本発明の一例に係る導電性フィルムを、光学顕微鏡を用いて3,000倍の倍率で観察した際の写真である。It is a photograph at the time of observing the electroconductive film which concerns on an example of this invention by the magnification of 3,000 times using the optical microscope.
 以下、本発明の実施形態について詳述する。但し、本発明の範囲が以下の実施形態に限定されるものではない。 Hereinafter, embodiments of the present invention will be described in detail. However, the scope of the present invention is not limited to the following embodiments.
<本導電性フィルム>
 本実施形態に係る導電性フィルム(「本導電性フィルム」と称する)は、基材フィルム上に、デンドライト状銀被覆銅粉粒子を含有する導電膜を備えたフィルムであればよい。
<This conductive film>
The conductive film (referred to as “the present conductive film”) according to the present embodiment may be a film provided with a conductive film containing dendritic silver-coated copper powder particles on a base film.
<基材フィルム>
 基材フィルムとしては、透明支持フィルムを用いることが好ましい。例えばプラスチックフィルム、プラスチック板、およびガラス板などを用いることができる。
 上記プラスチックフィルムおよびプラスチック板の原料としては、例えば、ポリエチレンテレフタレート(PET)、およびポリエチレンナフタレートなどのポリエステル類;ポリエチレン(PE)、ポリプロピレン(PP)、ポリスチレン、EVAなどのポリオレフィン類;ポリ塩化ビニル、ポリ塩化ビニリデンなどのビニル系樹脂;その他、ポリエーテルエーテルケトン(PEEK)、ポリサルホン(PSF)、ポリエーテルサルホン(PES)、ポリカーボネート(PC)、ポリアミド、ポリイミド、アクリル樹脂、トリアセチルセルロース(TAC)などを用いることができる。
<Base film>
As the substrate film, a transparent support film is preferably used. For example, a plastic film, a plastic plate, a glass plate, or the like can be used.
Examples of the raw material for the plastic film and plastic plate include polyesters such as polyethylene terephthalate (PET) and polyethylene naphthalate; polyolefins such as polyethylene (PE), polypropylene (PP), polystyrene, EVA; polyvinyl chloride, Vinyl resins such as polyvinylidene chloride; polyether ether ketone (PEEK), polysulfone (PSF), polyether sulfone (PES), polycarbonate (PC), polyamide, polyimide, acrylic resin, triacetyl cellulose (TAC) Etc. can be used.
<導電膜>
 導電膜は、デンドライト状銀被覆銅粉粒子とバインダ樹脂とを含有する層であればよく、デンドライト状銀被覆銅粉粒子を含有する当該層のみからなる単層(所謂“等方性導電膜”)であってもよいし、当該層に他の層が積層してなる多層(所謂“異方性導電膜”)であってもよい。
<Conductive film>
The conductive film only needs to be a layer containing dendritic silver-coated copper powder particles and a binder resin, and is a single layer consisting of only the layer containing dendritic silver-coated copper powder particles (so-called “isotropic conductive film”). Or a multilayer (so-called “anisotropic conductive film”) in which another layer is stacked on the layer.
(デンドライト状銀被覆銅粉粒子)
 デンドライト状銀被覆銅粉粒子は、芯材としての銅粉粒子の表面の少なくとも一部を、銀で被覆してなる銀被覆銅粉粒子であって、デンドライト状を呈するもの(「本銀被覆銅粉粒子」と称する)である。
 本銀被覆銅粉粒子は、芯材としての銅粉粒子の表面の少なくとも一部が銀で被覆されていればよく、銅粉粒子の表面の全面が銀で被覆されていてもよいし、また、一部銅粉粒子の表面が露出した状態になっていてもよい。
(Dendrite-like silver-coated copper powder particles)
The dendrite-like silver-coated copper powder particles are silver-coated copper powder particles obtained by coating at least part of the surface of the copper powder particles as a core material with silver and exhibit a dendrite-like shape (“the present silver-coated copper Called "powder particles").
In the present silver-coated copper powder particles, it is sufficient that at least a part of the surface of the copper powder particles as the core material is coated with silver, and the entire surface of the copper powder particles may be coated with silver. In addition, a part of the surface of the copper powder particles may be exposed.
 ここで、「デンドライト状」とは、光学顕微鏡若しくは電子顕微鏡(500~20、000倍)で観察した際に、一本の主軸を備えており、該主軸から直交方向又は斜め方向に複数の枝が分岐して、二次元的或いは三次元的に成長した形状を呈する粒子を意味する。幅広の葉が集まって松ぼっくり状を呈するものや、主軸を有さず多数の針状部が放射状に伸長してなる形状のものは含まない。 Here, “dendritic” means having a single main axis when observed with an optical microscope or an electron microscope (500 to 20,000 times), and a plurality of branches in an orthogonal direction or an oblique direction from the main axis. Means a particle which branches and exhibits a shape grown two-dimensionally or three-dimensionally. It does not include those in which wide leaves gather to form a pinecone shape or a shape in which a large number of needle-like portions do not have a main shaft and extend radially.
 本銀被覆銅粉粒子は、デンドライト状銅粉粒子の中でも、光学顕微鏡若しくは電子顕微鏡(500~20,000倍)で観察した際、次のような特徴を有するデンドライト状を呈する粒子を含有するのが好ましい(図1参照)。
 ・主軸の太さaは、0.3μm~6.0μmであることが重要であり、中でも0.4μm以上或いは4.5μm以下、中でも特に0.5μm以上或いは4.0μm以下であるのがさらに好ましい。デンドライトにおける主軸の太さaが0.3μm未満では、主軸がしっかりとしていないためにペースト混練時に折れやすく、6.0μmよりも太くなると、粒子が凝集し易くなり、松ぼっくり状になりやすくなってしまう。
 ・主軸の長径Lは、0.1μm~100.0μmであるのが好ましく、中でも0.5μm以上或いは50μm以下、その中でも1μm以上或いは30μm以下であるのがさらに好ましい。
The present silver-coated copper powder particles contain, among the dendritic copper powder particles, particles exhibiting a dendritic shape having the following characteristics when observed with an optical microscope or an electron microscope (500 to 20,000 times). Is preferred (see FIG. 1).
-It is important that the thickness a of the main shaft is 0.3 μm to 6.0 μm, especially 0.4 μm or more and 4.5 μm or less, especially 0.5 μm or more or 4.0 μm or less. preferable. When the thickness a of the main shaft of the dendrites is less than 0.3 μm, the main shaft is not firm, so it easily breaks during paste kneading. .
The major axis L of the main shaft is preferably 0.1 μm to 100.0 μm, more preferably 0.5 μm or more and 50 μm or less, and particularly preferably 1 μm or more or 30 μm or less.
 ・主軸から伸びた枝の中で最も長い枝の長さb(「枝長b」と称する)は、デンドライトの成長度合いを示しており、0.3μm~10.0μmであることが重要である。中でも0.5μm以上或いは9.0μm以下、その中でも0.7μm以上或いは8.0μm以下であるのがさらに好ましい。枝長bが0.3μm未満では、優れた導通を得るのに十分な程度にデンドライトが成長しているとは言えない。一方、枝長bが10.0μmを超えると、該銅粉の流動性が低下して取り扱いが難しくなるようになる。
 ・主軸の長径Lに対する枝の本数(枝本数/長径L)は、デンドライトの枝の多さを示しており、0.1本/μm~5.0本/μmであるのが好ましく、中でも0.3本/μm以上或いは4.5本/μm以下、その中でも0.5本/μm以上或いは4.0本/μm以下、その中でも特に0.8本/μm以上或いは3.5本/μm以下、さらには1.0本/μm以上或いは3.0本/μm以下であるのがさらに好ましい。枝本数/長径Lが0.1本/μm以上であれば、フィルム中では枝の数は十分に多く、接点を十分に確保できる一方、枝本数/長径Lが5.0本/μm以下であれば、枝の数が多過ぎて該銅粉の流動性が劣るようになることを防ぐことができる。
The longest branch length b (referred to as “branch length b”) among the branches extending from the main axis indicates the degree of dendrite growth, and is important to be 0.3 μm to 10.0 μm. In particular, 0.5 μm or more or 9.0 μm or less, and more preferably 0.7 μm or more or 8.0 μm or less. If the branch length b is less than 0.3 μm, it cannot be said that the dendrite has grown to an extent sufficient to obtain excellent conduction. On the other hand, when the branch length b exceeds 10.0 μm, the fluidity of the copper powder is lowered and the handling becomes difficult.
The number of branches with respect to the major axis L of the main axis (number of branches / major axis L) indicates the number of dendrite branches and is preferably 0.1 / μm to 5.0 / μm, especially 0 .3 / μm or more or 4.5 / μm or less, of which 0.5 / μm or more or 4.0 / μm or less, of which 0.8 / μm or more or 3.5 / μm In the following, it is more preferable that the number is 1.0 / μm or more or 3.0 / μm or less. If the number of branches / major axis L is 0.1 / μm or more, the number of branches in the film is sufficiently large and sufficient contact can be secured, while the number of branches / major axis L is 5.0 / μm or less. If it exists, it can prevent that the fluidity | liquidity of this copper powder becomes inferior because there are too many branches.
 但し、光学顕微鏡若しくは電子顕微鏡(500~20,000倍)で観察した際、導電膜に含まれる銀被覆銅粉粒子の多くが上記の如きデンドライト状粒子であれば、それ以外の形状の粒子が混じっていても、上記の如きデンドライト状粒子のみからなる銀被覆銅粉粒子と同様の効果を得ることができる。よって、かかる観点から、光学顕微鏡若しくは電子顕微鏡(500~20,000倍)で導電膜を観察した際、上記の如き本銀被覆銅粉粒子が全銀被覆銅粉粒子のうちの60個数%以上、好ましくは80個数%以上、より好ましくは90個数%以上を占めていれば、上記の如きデンドライト状とは認められない非デンドライト状の銀被覆銅粉粒子が含まれていてもよい。 However, when most of the silver-coated copper powder particles contained in the conductive film are dendrite-like particles as described above when observed with an optical microscope or an electron microscope (500 to 20,000 times), particles of other shapes are used. Even if mixed, the same effect as that of the silver-coated copper powder particles composed only of the dendritic particles as described above can be obtained. Therefore, from this point of view, when the conductive film is observed with an optical microscope or an electron microscope (500 to 20,000 times), the above silver-coated copper powder particles are 60% by number or more of the total silver-coated copper powder particles. The non-dendritic silver-coated copper powder particles that are not recognized as dendritic may be included as long as they account for 80% by number or more, more preferably 90% by number or more.
 本銀被覆銅粉粒子の製造方法としては、芯材としてのデンドライト状銅粉を水に分散させ、キレート剤を添加した後、水に可溶な銀塩を加えて置換反応させて銅粉粒子の表面層を銀に置換させた後、得られた銀被覆銅粉を溶液から取り出してキレート剤を用いて洗浄し、乾燥させることで得ることができる。但し、この製造方法に限定されるものではない。 As a method for producing the present silver-coated copper powder particles, the dendritic copper powder as a core material is dispersed in water, a chelating agent is added, and then a water-soluble silver salt is added to cause a substitution reaction to obtain copper powder particles. After the surface layer is replaced with silver, the obtained silver-coated copper powder is taken out of the solution, washed with a chelating agent, and dried. However, it is not limited to this manufacturing method.
 置換メッキ被覆法は、還元メッキ被覆法に比べて、芯材(銅粉粒子)表面に銀をより均一に被覆することができるばかりか、被覆後の粒子の凝集を抑えることができ、さらには、より安価に製造できるという特徴を有しているため、置換メッキ被覆法を採用するのが好ましい。 Compared to the reduction plating coating method, the displacement plating coating method can not only uniformly coat the surface of the core material (copper powder particles) with silver, but also can suppress the aggregation of particles after coating. Therefore, it is preferable to employ the displacement plating coating method because it has a feature that it can be manufactured at a lower cost.
 従来の置換メッキ被覆法においては、反応溶液から銀被覆銅粉を取り出す時に、水などで濾過・洗浄していた。しかし、水で洗浄しただけでは、銅イオンの一部が銀被覆銅粉に吸着されるため、粒子表面に銅イオンが残留することになり、この状態で乾燥させると、銅イオンが酸化銅を形成し、粒子表面に酸化銅の被膜を出来ることになってしまった。
 これに対し、キレート剤を用いて洗浄することで、置換反応後に銅の再吸着を防止することができるため、粒子表面に残留する銅イオンを抑制することができ、その結果、粒子表面に酸化銅の被膜が出来ることを抑制して、導電性を高めることができる。
 キレート剤を用いて洗浄した場合、キレート剤が残留する可能性があるため、純水などを用いて洗浄するのが好ましい。
In the conventional displacement plating coating method, when silver-coated copper powder is taken out from the reaction solution, it is filtered and washed with water or the like. However, just washing with water will cause some of the copper ions to be adsorbed on the silver-coated copper powder, so copper ions will remain on the surface of the particles. As a result, a copper oxide film could be formed on the particle surface.
In contrast, by washing with a chelating agent, copper re-adsorption after the substitution reaction can be prevented, so that copper ions remaining on the particle surface can be suppressed. Conductivity can be improved by suppressing the formation of a copper film.
In the case of washing with a chelating agent, the chelating agent may remain, so that it is preferable to wash with pure water or the like.
 キレート剤としては、例えばエチレンジアミン四酢酸塩(以下「EDTA」という)、ジエチレントリアミン五酢酸、イミノ二酢酸などのアミノカルボン酸系キレート剤のほか、ヒドロキシエチルエチレンジアミン三酢酸、ジヒドロキシエチルエチレンジアミン二酢酸)、1,3-プロパンジアミン四酢酸から選ばれた1種又は2種以上のものを挙げることができるが、中でもEDTAを用いるのが好ましい。 Examples of the chelating agent include ethylenediaminetetraacetic acid salt (hereinafter referred to as “EDTA”), aminocarboxylic acid-based chelating agents such as diethylenetriaminepentaacetic acid and iminodiacetic acid, hydroxyethylethylenediaminetriacetic acid, dihydroxyethylethylenediaminediacetic acid), 1 , 3-propanediaminetetraacetic acid, one or two or more selected from propanediaminetetraacetic acid can be mentioned, and among these, EDTA is preferably used.
 銀塩を加える際、溶液のpH、すなわち置換反応させる際の溶液のpHは3~7に調整するのが好ましい。
 銀塩としては、水に可溶な銀塩、すなわちAgイオン供給源としては、硝酸銀、過塩素酸銀、酢酸銀、シュウ酸銀、塩素酸銀、6フッ化リン酸銀、4フッ化ホウ酸銀、6フッ化ヒ酸銀、硫酸銀から選ばれた1種又は2種以上を挙げることができる。
When adding the silver salt, the pH of the solution, that is, the pH of the solution during the substitution reaction is preferably adjusted to 3-7.
Silver salts soluble in water, that is, Ag ion sources include silver nitrate, silver perchlorate, silver acetate, silver oxalate, silver chlorate, silver hexafluorophosphate, and boron tetrafluoride. One or more selected from acid silver, silver hexafluoroarsenate, and silver sulfate can be mentioned.
 銀塩の添加量は、理論当量以上、例えば銅を芯材として用いる場合、銅1モルに対して銀2モル以上、特に2.1モル以上となるように添加するのが好ましい。2モルより少ないと、置換が不十分となり銀粉粒子中に銅が多く残留することになる。但し、2.5モル以上入れても不経済である。 The amount of silver salt added is preferably equal to or greater than the theoretical equivalent, for example, when copper is used as the core material, the amount of silver is 2 mol or more, particularly 2.1 mol or more with respect to 1 mol of copper. When the amount is less than 2 mol, the substitution is insufficient and a large amount of copper remains in the silver powder particles. However, it is not economical to add 2.5 mol or more.
 銀粉粒子における銀の含有率は、銀塩の添加量、反応時間、反応速度、キレート剤の添加量などによって調整することができる。
 置換反応終了後は、銀粉粒子を十分に洗浄し、乾燥させるのが好ましい。
The silver content in the silver powder particles can be adjusted by the amount of silver salt added, the reaction time, the reaction rate, the amount of chelating agent added, and the like.
After completion of the substitution reaction, the silver powder particles are preferably thoroughly washed and dried.
 芯材として用いる銅粉は、枝が十分に発達したデンドライト状を呈する銅粉を用いるのが好ましい。上記の方法で銀を被覆すれば、芯材として用いる銅粉粒子の形状をほぼそのまま本銀被覆銅粉の粒子形状に転化させることができる。 As the copper powder used as the core material, it is preferable to use a copper powder exhibiting a dendrite shape with sufficiently developed branches. If silver is coated by the above method, the shape of the copper powder particles used as the core material can be converted into the particle shape of the present silver-coated copper powder almost as it is.
 上述したような枝が十分に発達したデンドライト状を呈する銅粉は、次のような電解法によって製造することができる。 The above-described copper powder having a dendritic shape with sufficiently developed branches can be produced by the following electrolytic method.
 このような銅粉の製法としては、例えば、銅イオンを含む硫酸酸性の電解液に陽極と陰極を浸漬し、これに直流電流を流して電気分解を行い、陰極表面に粉末状に銅を析出させ、機械的又は電気的方法により掻き落として回収し、洗浄し、乾燥し、必要に応じて篩別工程などを経て銅粉を製造する方法を例示できる。 As a method for producing such a copper powder, for example, an anode and a cathode are immersed in a sulfuric acid electrolytic solution containing copper ions, a direct current is passed through the electrolyte, and copper is deposited on the cathode surface in a powder form. And a method of producing copper powder through a sieving step or the like, if necessary, by scraping and collecting by mechanical or electrical methods, washing, drying.
 電解法で銅粉を製造する場合、銅の析出に伴って電解液中の銅イオンが消費されるため、電極板付近の電解液の銅イオン濃度は薄くなり、そのままでは電解効率が低下してしまう。そのため、通常は電解効率を高めるために、電解槽内の電解液の循環を行って電極間の電解液の銅イオン濃度が薄くならないようにする。
 しかし、各銅粉粒子のデンドライトを発達させるためには、言い換えれば、主軸から伸びる枝の成長を促すためには、電極付近の電解液の銅イオン濃度が低い方が好ましいことが分かってきた。そこで、電解銅粉の製造においては、電解槽の大きさ、電極枚数、電極間距離及び電解液の循環量を調整し、電極付近の電解液の銅イオン濃度を低く調整する、少なくとも電解槽の底部の電解液の銅イオン濃度よりも、電極間の電解液の銅イオン濃度が常に薄くなるように調整するのが好ましい。
When copper powder is produced by the electrolytic method, the copper ions in the electrolyte solution are consumed as copper is deposited, so the copper ion concentration in the electrolyte solution near the electrode plate is reduced, and the electrolytic efficiency decreases as it is. End up. Therefore, normally, in order to increase the electrolysis efficiency, the electrolyte solution in the electrolytic cell is circulated so that the copper ion concentration of the electrolyte solution between the electrodes does not become thin.
However, it has been found that in order to develop the dendrite of each copper powder particle, in other words, to promote the growth of branches extending from the main axis, it is preferable that the copper ion concentration in the electrolyte solution near the electrode is low. Therefore, in the production of electrolytic copper powder, the size of the electrolytic cell, the number of electrodes, the distance between the electrodes, and the circulation amount of the electrolytic solution are adjusted, and the copper ion concentration of the electrolytic solution in the vicinity of the electrodes is adjusted to be low. It is preferable to adjust so that the copper ion concentration of the electrolyte solution between electrodes is always thinner than the copper ion concentration of the electrolyte solution at the bottom.
 ここで、一つのモデルケースを紹介すると、電解槽の大きさが2m3~10m3で、電極枚数が10~40枚で、電極間距離が5cm~50cmである場合に、銅イオン濃度1g/L~50g/Lの電解液の循環量を10~100L/分に調整することにより、デンドライトを発達させることができ、枝が十分に発達したデンドライト状を呈する電解銅粉を得ることができる。 Here, one model case is introduced. When the electrolytic cell size is 2 m 3 to 10 m 3 , the number of electrodes is 10 to 40, and the distance between the electrodes is 5 cm to 50 cm, the copper ion concentration is 1 g / By adjusting the circulating amount of the electrolytic solution of L to 50 g / L to 10 to 100 L / min, dendrites can be developed, and electrolytic copper powder having a dendritic shape with sufficiently developed branches can be obtained.
 デンドライト状銅粉粒子の粒子径を調整するには、上記条件の範囲内で技術常識に基づいて適宜条件を設定すればよい。例えば、大きな粒径のデンドライト状銅粉粒子を得ようとするならば、銅濃度は上記好ましい範囲内で比較的高い濃度に設定するのが好ましく、電流密度は、上記好ましい範囲内で比較的低い密度に設定するのが好ましく、電解時間は、上記好ましい範囲内で比較的長い時間に設定するのが好ましい。小さな粒径のデンドライト状銅粉粒子を得ようとするならば、前記の逆の考え方で各条件を設定するのが好ましい。一例としては銅濃度を1g/L~20g/Lとし、電流密度を50A/m2~1000A/m2とし、電解時間を5分~12時間とすればよい。 In order to adjust the particle size of the dendritic copper powder particles, conditions may be set as appropriate based on common general technical knowledge within the range of the above conditions. For example, if it is intended to obtain dendritic copper powder particles having a large particle size, the copper concentration is preferably set to a relatively high concentration within the above preferred range, and the current density is relatively low within the above preferred range. The density is preferably set, and the electrolysis time is preferably set to a relatively long time within the above preferable range. If it is intended to obtain dendritic copper powder particles having a small particle size, it is preferable to set the respective conditions based on the opposite concept. As an example, the copper concentration may be 1 g / L to 20 g / L, the current density may be 50 A / m 2 to 1000 A / m 2 , and the electrolysis time may be 5 minutes to 12 hours.
 芯材は、必要に応じて、置換反応前に表面酸化物(酸化皮膜)を除去する処理を行なうのがよい。例えば、芯材を水に投入して攪拌混合した後、ヒドラジン等の還元剤を加えて攪拌混合して反応させればよい。この際、加えた還元剤を十分に洗浄して芯材から除去するのが好ましい。 The core material is preferably subjected to a treatment for removing the surface oxide (oxide film) before the substitution reaction, if necessary. For example, after the core material is put into water and stirred and mixed, a reducing agent such as hydrazine is added and stirred and mixed to react. At this time, it is preferable that the added reducing agent is sufficiently washed and removed from the core material.
(バインダ樹脂)
 バインダ樹脂としては、例えばエポキシ樹脂、フェノール樹脂、不飽和ポリエステル樹脂、ポリウレタン樹脂、アクリル樹脂、メラミン樹脂、ポリイミド樹脂、ポリアミドイミド樹脂等を使用することができる。但し、これらに限定するものではない。
(Binder resin)
As the binder resin, for example, epoxy resin, phenol resin, unsaturated polyester resin, polyurethane resin, acrylic resin, melamine resin, polyimide resin, polyamideimide resin, and the like can be used. However, it is not limited to these.
(配合量)
 導電膜における本銀被覆銅粉粒子の含有量は、導電膜全体の2~85質量%であればよい。本銀被覆銅粉粒子は、少ない量でも導通を得ることができるという特徴を有している。よって、例えば本銀被覆銅粉粒子を含有する層のみからなる導電膜(所謂“等方性導電膜”)の場合、本銀被覆銅粉粒子の含有量が30~50質量%程度であっても、電磁波シールド特性を得ることができる。但し、本銀被覆銅粉粒子の含有量がさらに多ければ、より好ましい導電性を得ることができる。
 また、本銀被覆銅粉粒子を含有する層と他の導電層、例えば銀を含有する導電層の2層からなる導電膜(所謂“異方性導電膜”)の場合には、顕著に少なくてもよいから、例えば2~5質量%程度であってもよい。
(Mixing amount)
The content of the silver-coated copper powder particles in the conductive film may be 2 to 85% by mass of the entire conductive film. The present silver-coated copper powder particles have a feature that electrical conductivity can be obtained even with a small amount. Thus, for example, in the case of a conductive film consisting only of a layer containing the silver-coated copper powder particles (so-called “isotropic conductive film”), the content of the silver-coated copper powder particles is about 30 to 50% by mass. In addition, electromagnetic wave shielding characteristics can be obtained. However, more preferable conductivity can be obtained if the content of the silver-coated copper powder particles is higher.
In addition, in the case of a conductive film (so-called “anisotropic conductive film”) composed of two layers of a layer containing the present silver-coated copper powder particles and another conductive layer, for example, a conductive layer containing silver, the number is remarkably small. For example, it may be about 2 to 5% by mass.
(その他の成分)
 導電膜は、バインダ樹脂及び本銀被覆銅粉粒子以外の成分を含んでいてもよい。
 例えば銀粒子などを含んでいてもよい。銀粒子の形状は、特に限定するものではなく、例えば球状、鱗片状などを挙げることができる。
 但し、本導電性フィルムは、銀粒子を含んでいなくても導通を得ることができるため、導電膜が含有する導電性材料(この場合は、デンドライト状銀被覆銅粉粒子と銀粒子の合計量)の80個数%以上、中でも90個数%以上を本銀被覆銅粉粒子が占めるのが好ましい。
(Other ingredients)
The conductive film may contain components other than the binder resin and the present silver-coated copper powder particles.
For example, silver particles may be included. The shape of the silver particles is not particularly limited, and examples thereof include a spherical shape and a scale shape.
However, since this conductive film can obtain electrical continuity even if it does not contain silver particles, the conductive material contained in the conductive film (in this case, the total of dendritic silver-coated copper powder particles and silver particles) The present silver-coated copper powder particles preferably occupy 80% by number or more, particularly 90% by number or more.
(導電膜の厚み)
 導電膜の厚みは、特に制限されるものではなく、上記のような異方性導電膜であるか等方性導電膜であるかによっても大きく異なる。いずれにしても、5μm~60μmの範囲の厚みとすることが好ましい。厚みが5μm以上であれば望ましい導電性を得ることができ、厚みが50μm以下であれば導電膜の柔軟性を保持することができ、屈曲特性を維持することができ、コストを抑えることもできる。
(Thickness of conductive film)
The thickness of the conductive film is not particularly limited, and greatly varies depending on whether the conductive film is an anisotropic conductive film or an isotropic conductive film. In any case, the thickness is preferably in the range of 5 μm to 60 μm. If the thickness is 5 μm or more, desirable conductivity can be obtained, and if the thickness is 50 μm or less, the flexibility of the conductive film can be maintained, bending characteristics can be maintained, and cost can be reduced. .
(導電膜の形成方法)
 導電膜は、基材フィルムに導電性ペーストを塗布して形成することができる。
(Method for forming conductive film)
The conductive film can be formed by applying a conductive paste to a base film.
 例えば導電性ペーストを作製するには、本銀被覆銅粉をバインダ及び溶剤、さらに必要に応じて硬化剤やカップリング剤、腐食抑制剤などと混合し、本銀被覆銅粉の形状を壊さずに分散させるように混練して導電性ペーストを作製するのが好ましい。具体的には、機械的な衝撃を粉体に与える攪拌機などの使用は避けて、例えばあわとり練太郎(商標名)やプラネタリーミキサなどを使って、機械的な衝撃を与えることなく混練して導電性ペーストを作製するのが好ましい。 For example, in order to produce a conductive paste, the present silver-coated copper powder is mixed with a binder and a solvent, and further, if necessary, a curing agent, a coupling agent, a corrosion inhibitor, etc., without breaking the shape of the present silver-coated copper powder. It is preferable to prepare an electrically conductive paste by kneading so as to be dispersed in the paste. Specifically, avoid the use of a stirrer that gives mechanical impact to the powder, for example, kneading without giving mechanical impact, such as using Awatori Netaro (trade name) or planetary mixer. It is preferable to prepare a conductive paste.
 バインダとしては、液状のエポキシ樹脂、フェノール樹脂、不飽和ポリエステル樹脂等を挙げることができるが、これらに限定するものではない。
 溶剤としては、テルピネオール、エチルカルビトール、カルビトールアセテート、ブチルセロソルブ等が挙げることができる。
 硬化剤としては、2エチル4メチルイミダゾールなどを挙げることができる。
 腐食抑制剤としては、ベンゾチアゾール、ベンゾイミダゾール等を挙げることができる。
 また、増粘剤、レベリング剤等の添加物を加えることもできる。さらに必要に応じてカーボンやシリカ等の無機フィラーを添加することも可能である。
Examples of the binder include, but are not limited to, liquid epoxy resins, phenol resins, unsaturated polyester resins, and the like.
Examples of the solvent include terpineol, ethyl carbitol, carbitol acetate, butyl cellosolve and the like.
Examples of the curing agent include 2-ethyl 4-methylimidazole.
Examples of the corrosion inhibitor include benzothiazole and benzimidazole.
Additives such as thickeners and leveling agents can also be added. Furthermore, it is also possible to add inorganic fillers, such as carbon and a silica, as needed.
 導電性ペーストの塗布方法としては、スクリーン印刷、凹版印刷、平板印刷、ディスペンサー等が例示される。形成される配線の精細性、膜厚、また生産性の点から、スクリーン印刷が最も好適に用いられる。 Examples of the method for applying the conductive paste include screen printing, intaglio printing, lithographic printing, and dispenser. Screen printing is most preferably used from the viewpoint of the fineness, film thickness, and productivity of the formed wiring.
(他の層)
 必要に応じて、基材フィルムと導電膜との間、或いは、導電膜の外側に他の層を設けることは任意である。
 例えば、導電膜の外側に、擦り傷防止や力学特性を改良する効果を発現する保護層を設けることが可能である。この際、保護層を構成するフィルムは、例えばエポキシ樹脂、ウレタン樹脂等により形成することができる。
 かかる保護層の表面硬度は、鉛筆硬度でH~4Hであることが好ましく、そのために必要に応じて上記エポキシ樹脂やウレタン樹脂からなる層にアクリル系等のハードコート層を積層することもできる。
 保護層の表面硬度が鉛筆硬度でHより小さいと傷つき易く、一方4Hより大きいと可撓性が小さくなり、摺動特性が低下するおそれがある。
(Other layers)
If necessary, it is optional to provide another layer between the base film and the conductive film or outside the conductive film.
For example, it is possible to provide a protective layer that exhibits an effect of preventing scratches and improving mechanical properties on the outside of the conductive film. Under the present circumstances, the film which comprises a protective layer can be formed, for example with an epoxy resin, a urethane resin, etc.
The surface hardness of the protective layer is preferably H to 4H in terms of pencil hardness. For this purpose, an acrylic hard coat layer can be laminated on the layer made of the epoxy resin or urethane resin as necessary.
If the surface hardness of the protective layer is less than H as the pencil hardness, the protective layer is likely to be damaged, whereas if it is greater than 4H, the flexibility is reduced and the sliding characteristics may be deteriorated.
<本導電性フィルムの特徴・用途>
 本導電性フィルムは、導電性材料として、銀粉を使用せずとも導電性を得ることができ、しかも、デンドライト状銀被覆銅粉粒子の含有量が少ない場合であっても、導電性を得ることができる。よって、フィルムの透明性を高めることができる。しかも、電磁波シールド特性にも優れている。
 本導電性フィルムは、このような特性を備えているため、例えば電磁波シールドフィルム、回路基板と回路基板とを接続するボンディングフィルム、静電気防止フィルムなどの導電性フィルムとして利用することができる。中でも、電磁波シールドフィルムとして特に好ましく利用することができる。
<Characteristics and use of this conductive film>
The conductive film can obtain conductivity without using silver powder as a conductive material, and can obtain conductivity even when the content of dendritic silver-coated copper powder particles is small. Can do. Therefore, the transparency of the film can be increased. Moreover, it has excellent electromagnetic shielding characteristics.
Since this electroconductive film is provided with such a characteristic, it can be utilized as electroconductive films, such as an electromagnetic wave shield film, a bonding film which connects a circuit board and a circuit board, and an antistatic film, for example. Especially, it can utilize especially preferably as an electromagnetic wave shielding film.
 電磁波シールドフィルムに関しては、本銀被覆銅粉粒子を含有する層のみから導電膜を形成する等方性導電膜であっても、本銀被覆銅粉粒子を含有する層と他の導電膜層、例えば銀膜層などの2層から導電膜を形成する異方性導電膜のいずれも形成することができる。 Regarding the electromagnetic wave shielding film, even if it is an isotropic conductive film that forms a conductive film only from the layer containing the present silver-coated copper powder particles, the layer containing the present silver-coated copper powder particles and other conductive film layers, For example, any anisotropic conductive film that forms a conductive film from two layers such as a silver film layer can be formed.
 電磁波シールドフィルムとしては、例えば、フレキシブル基板上に本導電性フィルムを載せ、圧力1~5MPaで加圧しながら加熱するプレス工程を経ることにより、フレキシブル基板上に導電膜を形成してなるフレキシブル基板を形成することができる。この際も、本銀被覆銅粉の形状を壊さずにプレスするのが好ましい。 As the electromagnetic wave shielding film, for example, a flexible substrate in which a conductive film is formed on a flexible substrate by placing the conductive film on a flexible substrate and performing a pressing process of heating while pressing at a pressure of 1 to 5 MPa. Can be formed. Also in this case, it is preferable to press the silver-coated copper powder without breaking the shape.
<語句の説明>
 本明細書において「X~Y」(X,Yは任意の数字)と表現する場合、特にことわらない限り「X以上Y以下」の意と共に、「好ましくはXより大きい」或いは「好ましくYより小さい」の意も包含する。
 また、「X以上」(Xは任意の数字)と表現する場合、特にことわらない限り「好ましくはXより大きい」の意を包含し、「Y以下」(Yは任意の数字)と表現する場合、特にことわらない限り「好ましくYより小さい」の意を包含する。
<Explanation of words>
In the present specification, when expressed as “X to Y” (X and Y are arbitrary numbers), unless otherwise specified, “X is greater than X” and “preferably greater than X” or “preferably greater than Y”. The meaning of “small” is also included.
In addition, when expressed as “X or more” (X is an arbitrary number), it means “preferably larger than X” unless otherwise specified, and expressed as “Y or less” (Y is an arbitrary number). In the case, unless otherwise specified, the meaning of “preferably smaller than Y” is included.
 以下、本発明の実施例について説明する。但し、本発明が以下の実施例に限定されるものではない。 Hereinafter, examples of the present invention will be described. However, the present invention is not limited to the following examples.
<粒子形状の観察>
 実施例・比較例で得たフィルムを、光学顕微鏡(2,000倍)を使用して、任意の100視野において、それぞれ500個の粒子の形状を観察し、主軸の太さa(「主軸太さa」)、主軸の長さL、主軸から伸びた枝の中で最も長い枝の長さb(「枝長b」)、及び、主軸の長径に対する枝の本数(「枝本数/長径L」)を測定し、その平均値を表1に示した。
<Observation of particle shape>
Using the optical microscope (2,000 times), the films obtained in the examples and comparative examples were observed for the shape of 500 particles in an arbitrary 100 field of view, and the main axis thickness a (“main axis thickness”). A "), the length L of the main axis, the length b of the longest branch among the branches extending from the main axis (" branch length b "), and the number of branches with respect to the major axis of the main axis (" number of branches / major axis L ") ) And the average value is shown in Table 1.
<透過率>
 透光量計(日本電飾製「NDH2000」)を用いて、実施例・比較例で得たフィルムの透過率(TT%)を測定した。
<Transmissivity>
The transmissivity (TT%) of the film obtained by the Example and the comparative example was measured using the translucent meter ("NDH2000" made by Nippon Denshoku).
<シート抵抗>
 四端子法により測定を行った。具体的には、アジレントテクノロジーズ社製の半導体デバイスアナライザー「B1500A」に、同じくアジレントテクノロジーズ社製の電圧計「34420A」を接続した測定装置を使用して、100mAにて、実施例及び比較例で得た電磁波シールドフィルムのシート抵抗を測定した。
<Sheet resistance>
Measurements were made by the four probe method. Specifically, using a measurement device in which a voltmeter “34420A” also manufactured by Agilent Technologies, Inc., is connected to a semiconductor device analyzer “B1500A” manufactured by Agilent Technologies, at 100 mA, it is obtained in Examples and Comparative Examples. The sheet resistance of the electromagnetic shielding film was measured.
<折り曲げ比抵抗変化値>
 実施例・比較例で製造したフィルムの折り曲げを100回行い、折り曲げ前後の比抵抗(Ω/□)を測定した。表1には、「折曲比抵抗変化値」の項目に、折り曲げ後の比抵抗(Ω/□)の値を、折り曲げ前の比抵抗(Ω/□)を1.00とした時の相対値で示した。
<Bending resistivity change value>
The films produced in Examples and Comparative Examples were folded 100 times, and the specific resistance before and after folding (Ω / □) was measured. Table 1 shows the relative value when the value of the specific resistance (Ω / □) after bending is set to 1.00 and the specific resistance (Ω / □) before bending is 1.00. Indicated by value.
<実施例1>
 銀被覆銅粉28.0質量部と、バインダとしてのエポキシ系熱硬化性樹脂34.3質量部と、溶剤としてのMEK/PGM混合溶剤(混合比3/2)37.7質量部とを、銀被覆銅粉粒子の形状を保持するように攪拌機(シンキー社製「あわとり練太郎」、浅田鉄工製プラネタリーミキサー)を使用して混練して導電性ペーストを調製した。
 この導電性ペーストを、厚さ25μmのフッ素樹脂フィルム(旭硝子製「アフレックス」)の表面に、30μmの厚さとなるように、アプリケーターによって塗布して導電膜を形成し、導電性フィルム(電磁波シールドフィルム)を作製した。この時、導電膜中の銀被覆銅粉の含有割合は45wt%であった。
<Example 1>
28.0 parts by mass of silver-coated copper powder, 34.3 parts by mass of an epoxy-based thermosetting resin as a binder, and 37.7 parts by mass of a MEK / PGM mixed solvent (mixing ratio 3/2) as a solvent, A conductive paste was prepared by kneading using a stirrer (“Awori Nertaro” manufactured by Shinky Co., Ltd., planetary mixer manufactured by Asada Tekko Co., Ltd.) so as to maintain the shape of the silver-coated copper powder particles.
This conductive paste is applied to the surface of a 25 μm-thick fluororesin film (“Aflex” manufactured by Asahi Glass) with an applicator so as to have a thickness of 30 μm, and a conductive film (electromagnetic wave shield) is formed. Film). At this time, the content rate of the silver covering copper powder in a electrically conductive film was 45 wt%.
 前記銀被覆銅粉は、次のようにして製造したものを使用した。
 2.5m×1.1m×1.5mの大きさ(約4m3)の電解槽内に、それぞれ大きさ(1.0m×1.0m)9枚の銅陰極板と銅陽極板とを電極間距離5cmとなるように吊設し、電解液としての硫酸銅溶液を30L/分で循環させて、この電解液に陽極と陰極を浸漬し、これに直流電流を流して電気分解を行い、陰極表面に粉末状の銅を析出させた。
 この際、循環させる電解液のCu濃度を10g/L、硫酸(H2SO4)濃度を100g/L、電流密度を80A/mに調整して1時間電解を実施した。
 電解中、電解槽の底部の電解液の銅イオン濃度よりも、電極間の電解液の銅イオン濃度が常に薄く維持されていた。
 そして、陰極表面に析出した銅を、機械的に掻き落として回収し、その後、洗浄し、銅粉1kg相当の含水銅粉ケーキを得た。このケーキを水3Lに分散させ、工業用ゼラチン(:新田ゼラチン社製)10g/Lの水溶液1Lを加えて10分間攪拌した後、ブフナー漏斗で濾過し、洗浄後、減圧状態(1×10-3Pa)で80℃、6時間乾燥させ、電解銅粉を得た。
 こうして得られた電解銅粉25kgを、50℃に保温した純水50L中に投入してよく攪拌させた。これとは別に、純水5Lに硝酸銀4.5kg投入して硝酸銀溶液を作製した。先ほど銅粉を溶解した溶液に硝酸銀溶液を一括添加した。この状態で2時間攪拌を行い、銀被覆銅粉スラリーを得た。
 次に、真空ろ過にて銀被覆銅粉スラリーのろ過を行い、ろ過が終わった後、EDTA(エチレンジアミン四酢酸)600gを純水6Lに溶解させた溶液を用いて洗浄し、続いて3Lの純水で残留EDTAを洗浄した。その後、120℃で3時間乾燥させてデンドライト状銀被覆銅粉(サンプル)を得た。銀の被覆量は、銀被覆銅粉全体の10.8質量%であった。
What was manufactured as follows was used for the said silver covering copper powder.
In an electrolytic cell having a size of 2.5 m × 1.1 m × 1.5 m (about 4 m 3 ), nine copper cathode plates and a copper anode plate (electrodes) each having a size (1.0 m × 1.0 m) are electrodes. Suspended so as to have a distance of 5 cm, and circulated a copper sulfate solution as an electrolytic solution at 30 L / min, immersed an anode and a cathode in this electrolytic solution, and conducted a direct current to conduct electrolysis. Powdered copper was deposited on the cathode surface.
At this time, the electrolytic solution to be circulated was adjusted to a Cu concentration of 10 g / L, a sulfuric acid (H 2 SO 4 ) concentration of 100 g / L, and a current density of 80 A / m 2 for electrolysis for 1 hour.
During electrolysis, the copper ion concentration of the electrolyte solution between the electrodes was always kept lower than the copper ion concentration of the electrolyte solution at the bottom of the electrolytic cell.
Then, the copper deposited on the cathode surface was mechanically scraped and collected, and then washed to obtain a hydrated copper powder cake equivalent to 1 kg of copper powder. This cake was dispersed in 3 L of water, 1 L of an industrial gelatin (made by Nitta Gelatin Co., Ltd.) 10 g / L aqueous solution was added, stirred for 10 minutes, filtered through a Buchner funnel, washed, and then under reduced pressure (1 × 10 −3 Pa) at 80 ° C. for 6 hours to obtain electrolytic copper powder.
25 kg of the obtained electrolytic copper powder was put into 50 L of pure water kept at 50 ° C. and stirred well. Separately, 4.5 kg of silver nitrate was put into 5 L of pure water to prepare a silver nitrate solution. The silver nitrate solution was added all at once to the solution in which the copper powder was dissolved. In this state, stirring was performed for 2 hours to obtain a silver-coated copper powder slurry.
Next, the silver-coated copper powder slurry is filtered by vacuum filtration. After the filtration is completed, the slurry is washed with a solution obtained by dissolving 600 g of EDTA (ethylenediaminetetraacetic acid) in 6 L of pure water, followed by 3 L of pure water. Residual EDTA was washed with water. Then, it was made to dry at 120 degreeC for 3 hours, and dendritic silver covering copper powder (sample) was obtained. The silver coating amount was 10.8% by mass of the total silver-coated copper powder.
 得られたデンドライト状銀被覆銅粉(サンプル)を、光学顕微鏡を用いて観察したところ、少なくとも90%以上の銅粉粒子は、一本の主軸を備えており、該主軸から複数の枝が斜めに分岐して三次元的に成長したデンドライト状を呈しており、主軸の太さa:4.2μm、主軸の長さL:20.3μm、枝長b:7.4μm、枝本数/長径L:1.6本/μmであった。
 表1に示すように、この導電性フィルムのシート抵抗は良好な値を示した。
When the obtained dendrite-like silver-coated copper powder (sample) was observed using an optical microscope, at least 90% or more of the copper powder particles had one main axis, and a plurality of branches were oblique from the main axis. It has a dendritic shape that branches into a three-dimensional growth and has a main axis thickness a: 4.2 μm, a main shaft length L: 20.3 μm, a branch length b: 7.4 μm, and the number of branches / major axis L: The number was 1.6 / μm.
As shown in Table 1, the sheet resistance of this conductive film showed a good value.
<実施例2>
 銀被覆銅粉18.7質量部と、バインダとしてのエポキシ系熱硬化性樹脂43.6質量部と、した以外は実施例1と同様に導電性フィルム(電磁波シールドフィルム)を作製した。この時、導電膜中の銀被覆銅粉の含有割合は30wt%であった。
<Example 2>
A conductive film (electromagnetic wave shielding film) was produced in the same manner as in Example 1 except that 18.7 parts by mass of the silver-coated copper powder and 43.6 parts by mass of the epoxy thermosetting resin as the binder were used. At this time, the content rate of the silver covering copper powder in a electrically conductive film was 30 wt%.
 電解液のCu濃度5g/L、電解時間を40分、循環液量を20L/分とした以外は、実施例1と同様にして電解銅粉を得た。そして、実施例1と同様に銀を被覆させてデンドライト状銀被覆銅粉(サンプル)を得た。銀の被覆量は、銀被覆銅粉全体の10.9質量%であった。
 得られたデンドライト状銀被覆銅粉(サンプル)を、光学顕微鏡を用いて観察したところ、少なくとも90%以上の銅粉粒子は、一本の主軸を備えており、該主軸から複数の枝が斜めに分岐して三次元的に成長したデンドライト状を呈しており、主軸の太さa:1.8μm、主軸の長さL:14.9μm、枝長b:3.9μm、枝本数/長径L:1.5本/μmであった。
An electrolytic copper powder was obtained in the same manner as in Example 1 except that the Cu concentration of the electrolytic solution was 5 g / L, the electrolysis time was 40 minutes, and the amount of circulating liquid was 20 L / min. Then, silver was coated in the same manner as in Example 1 to obtain a dendrite-like silver-coated copper powder (sample). The silver coating amount was 10.9% by mass of the total silver-coated copper powder.
When the obtained dendrite-like silver-coated copper powder (sample) was observed using an optical microscope, at least 90% or more of the copper powder particles had one main axis, and a plurality of branches were oblique from the main axis. It has a dendrite-like shape that branches into a three-dimensional growth and has a main axis thickness a: 1.8 μm, a main shaft length L: 14.9 μm, a branch length b: 3.9 μm, and the number of branches / major axis L: The number was 1.5 / μm.
<実施例3>
 銀被覆銅粉28.0質量部と、バインダとしてのエポキシ系熱硬化性樹脂34.3質量部と、した以外は実施例1と同様に導電性フィルム(電磁波シールドフィルム)を作製した。この時、導電膜中の銀被覆銅粉の含有割合は45wt%であった。
<Example 3>
A conductive film (electromagnetic wave shielding film) was produced in the same manner as in Example 1 except that 28.0 parts by mass of the silver-coated copper powder and 34.3 parts by mass of the epoxy thermosetting resin as the binder were used. At this time, the content rate of the silver covering copper powder in a electrically conductive film was 45 wt%.
 電解液のCu濃度を6g/L、循環液量を20L/分、電解時間を40分、電流密度150A/mとした以外は、実施例1と同様にして電解銅粉を得た。そして、実施例1と同様に銀を被覆させてデンドライト状銀被覆銅粉(サンプル)を得た。銀の被覆量は、銀被覆銅粉全体の10.8質量%であった。
 得られたデンドライト状銀被覆銅粉(サンプル)を、光学顕微鏡を用いて観察したところ、少なくとも90%以上の銅粉粒子は、一本の主軸を備えており、該主軸から複数の枝が斜めに分岐して三次元的に成長したデンドライト状を呈しており、主軸の太さa:2.1μm、主軸の長さL:14.6μm、枝長b:4.2μm、枝本数/長径L:3.1本/μmであった。
 表1に示すように、この導電性フィルムのシート抵抗は良好な値を示した。
An electrolytic copper powder was obtained in the same manner as in Example 1 except that the Cu concentration of the electrolytic solution was 6 g / L, the circulating liquid amount was 20 L / min, the electrolysis time was 40 minutes, and the current density was 150 A / m 2 . Then, silver was coated in the same manner as in Example 1 to obtain a dendrite-like silver-coated copper powder (sample). The silver coating amount was 10.8% by mass of the total silver-coated copper powder.
When the obtained dendrite-like silver-coated copper powder (sample) was observed using an optical microscope, at least 90% or more of the copper powder particles had one main axis, and a plurality of branches were oblique from the main axis. It has a dendritic shape that is branched into three dimensions and grows three-dimensionally. Main shaft thickness a: 2.1 μm, main shaft length L: 14.6 μm, branch length b: 4.2 μm, number of branches / major axis L: It was 3.1 / μm.
As shown in Table 1, the sheet resistance of this conductive film showed a good value.
<実施例4>
 銀被覆銅粉40.5質量部と、バインダとしてのエポキシ系熱硬化性樹脂21.8質量部と、した以外は実施例1と同様に導電性フィルム(電磁波シールドフィルム)を作製した。この時、導電膜中の銀被覆銅粉の含有割合は65wt%であった。
<Example 4>
A conductive film (electromagnetic wave shielding film) was produced in the same manner as in Example 1 except that 40.5 parts by mass of the silver-coated copper powder and 21.8 parts by mass of the epoxy thermosetting resin as a binder were used. At this time, the content rate of the silver covering copper powder in a electrically conductive film was 65 wt%.
 電解液のCu濃度を1g/L、循環液量を10L/分、電解時間40分とした以外は、実施例1と同様にして電解銅粉を得た。そして、実施例1と同様に銀を被覆させてデンドライト状銀被覆銅粉(サンプル)を得た。銀の被覆量は、銀被覆銅粉全体の10.7質量%であった。   
 得られたデンドライト状銀被覆銅粉(サンプル)を、光学顕微鏡を用いて観察したところ、少なくとも90%以上の銅粉粒子は、一本の主軸を備えており、該主軸から複数の枝が斜めに分岐して三次元的に成長したデンドライト状を呈しており、主軸の太さa:0.8μm、主軸の長さL:5.0μm、枝長b:1.8μm、枝本数/長径L:3.4本/μmであった。
 表1に示すように、この導電性フィルムのシート抵抗は良好な値を示した。
An electrolytic copper powder was obtained in the same manner as in Example 1 except that the Cu concentration of the electrolytic solution was 1 g / L, the circulating liquid amount was 10 L / min, and the electrolysis time was 40 minutes. Then, silver was coated in the same manner as in Example 1 to obtain a dendrite-like silver-coated copper powder (sample). The silver coating amount was 10.7% by mass of the entire silver-coated copper powder.
When the obtained dendrite-like silver-coated copper powder (sample) was observed using an optical microscope, at least 90% or more of the copper powder particles had one main axis, and a plurality of branches were oblique from the main axis. It has a dendrite-like shape that is branched into three-dimensionally and has a main shaft thickness a: 0.8 μm, a main shaft length L: 5.0 μm, a branch length b: 1.8 μm, the number of branches / long diameter L: It was 3.4 / μm.
As shown in Table 1, the sheet resistance of this conductive film showed a good value.
<実施例5>
 銀被覆銅粉31.2質量部と、バインダとしてのエポキシ系熱硬化性樹脂31.2質量部と、した以外は実施例1と同様に導電性フィルム(電磁波シールドフィルム)を作製した。この時、導電膜中の銀被覆銅粉の含有割合は50wt%であった。
<Example 5>
A conductive film (electromagnetic wave shielding film) was produced in the same manner as in Example 1 except that 31.2 parts by mass of the silver-coated copper powder and 31.2 parts by mass of the epoxy thermosetting resin as the binder. At this time, the content rate of the silver covering copper powder in a electrically conductive film was 50 wt%.
 電解液のCu濃度を4g/L、循環液量を10L/分、電解時間を10分、電流密度150A/mとした以外は、実施例1と同様にして電解銅粉を得た。
 そして、実施例1と同様に銀を被覆させてデンドライト状銀被覆銅粉(サンプル)を得た。銀の被覆量は、銀被覆銅粉全体の10.8質量%であった。    
 得られたデンドライト状銀被覆銅粉(サンプル)を、光学顕微鏡を用いて観察したところ、少なくとも90%以上の銅粉粒子は、一本の主軸を備えており、該主軸から複数の枝が斜めに分岐して三次元的に成長したデンドライト状を呈しており、主軸の太さa:1.4μm、主軸の長さL:6.0μm、枝長b:5.2μm、枝本数/長径L:2.5本/μmであった。
 表1に示すように、この導電性フィルムのシート抵抗は良好な値を示した。
An electrolytic copper powder was obtained in the same manner as in Example 1 except that the Cu concentration of the electrolytic solution was 4 g / L, the circulating liquid amount was 10 L / min, the electrolysis time was 10 minutes, and the current density was 150 A / m 2 .
Then, silver was coated in the same manner as in Example 1 to obtain a dendrite-like silver-coated copper powder (sample). The silver coating amount was 10.8% by mass of the total silver-coated copper powder.
When the obtained dendrite-like silver-coated copper powder (sample) was observed using an optical microscope, at least 90% or more of the copper powder particles had one main axis, and a plurality of branches were oblique from the main axis. It has a dendrite-like shape branching into three dimensions and growing in a three-dimensional manner. Main axis thickness a: 1.4 μm, main axis length L: 6.0 μm, branch length b: 5.2 μm, number of branches / major axis L: The number was 2.5 / μm.
As shown in Table 1, the sheet resistance of this conductive film showed a good value.
<実施例6>
 銀被覆銅粉28.0質量部と、バインダとしてのエポキシ系熱硬化性樹脂34.3質量部と、した以外は実施例1と同様に導電性フィルム(電磁波シールドフィルム)を作製した。この時、導電膜中の銀被覆銅粉の含有割合は45wt%であった。
<Example 6>
A conductive film (electromagnetic wave shielding film) was produced in the same manner as in Example 1 except that 28.0 parts by mass of the silver-coated copper powder and 34.3 parts by mass of the epoxy thermosetting resin as the binder were used. At this time, the content rate of the silver covering copper powder in a electrically conductive film was 45 wt%.
 電解液のCu濃度1g/L、循環液量を40L/分、電解時間を5分、電流密度150A/m、循環液量を10L/分とした以外は、実施例1と同様にして電解銅粉を得た。
 そして、実施例1と同様に銀を被覆させてデンドライト状銀被覆銅粉(サンプル)を得た。銀の被覆量は、銀被覆銅粉全体の10.5質量%であった。    
 得られたデンドライト状銀被覆銅粉(サンプル)を、走査型電子顕微鏡(SEM)を用いて観察したところ、少なくとも90%以上の銅粉粒子は、一本の主軸を備えており、該主軸から複数の枝が斜めに分岐して三次元的に成長したデンドライト状を呈しており、主軸の太さa:0.5μm、主軸の長さL:3.1μm、枝長b:2.9μm、枝本数/長径L:3.0本/μmであった。
 表1に示すように、この導電性フィルムのシート抵抗は良好な値を示した。
Electrolysis was performed in the same manner as in Example 1 except that the Cu concentration of the electrolytic solution was 1 g / L, the circulating fluid amount was 40 L / min, the electrolysis time was 5 minutes, the current density was 150 A / m 2 , and the circulating fluid amount was 10 L / min. Copper powder was obtained.
Then, silver was coated in the same manner as in Example 1 to obtain a dendrite-like silver-coated copper powder (sample). The silver coating amount was 10.5% by mass of the entire silver-coated copper powder.
When the obtained dendrite-like silver-coated copper powder (sample) was observed using a scanning electron microscope (SEM), at least 90% or more of the copper powder particles had one main axis, and from the main axis It has a dendritic shape in which a plurality of branches obliquely branch and grow three-dimensionally. The main axis thickness a is 0.5 μm, the main axis length L is 3.1 μm, the branch length b is 2.9 μm, and the branches Number / major axis L: 3.0 / μm.
As shown in Table 1, the sheet resistance of this conductive film showed a good value.
<比較例1>
 銀被覆銅粉40.5質量部と、バインダとしてのエポキシ系熱硬化性樹脂21.8質量部と、した以外は実施例1と同様に導電性フィルム(電磁波シールドフィルム)を作製した。この時、導電膜中の銀被覆銅粉の含有割合は65wt%であった。
<Comparative Example 1>
A conductive film (electromagnetic wave shielding film) was produced in the same manner as in Example 1 except that 40.5 parts by mass of the silver-coated copper powder and 21.8 parts by mass of the epoxy thermosetting resin as a binder were used. At this time, the content rate of the silver covering copper powder in a electrically conductive film was 65 wt%.
 2.5m×1.1m×1.5mの大きさ(約4m3)の電解槽内に、それぞれ大きさ(1.0m×1.0m)9枚の銅陰極板と銅陽極板とを電極間距離5cmとなるように吊設し、電解液としての硫酸銅溶液を2L/分で循環させて、この電解液に陽極と陰極を浸漬し、これに直流電流を流して電気分解を行い、陰極表面に粉末状の銅を析出させた。
 この際、循環させる電解液のCu濃度を100g/L、硫酸(H2SO4)濃度を100g/L、循環液量を2L/分、電流密度を80A/mに調整して60分間電解を実施した。
 電解中、電極間の電解液の銅イオン濃度は電解槽の底部の電解液の銅イオン濃度よりも、常に濃い状況であった。
 陰極表面に析出した銅を、機械的に掻き落として回収し、その後、洗浄し、銅粉1kg相当の含水銅粉ケーキを得た。このケーキを水3Lに分散させ、工業用ゼラチン(:新田ゼラチン社製)10g/Lの水溶液1Lを加えて10分間攪拌した後、ブフナー漏斗で濾過し、洗浄後大気雰囲気にて80℃、6時間乾燥させて電解銅粉を得た。
 そして、実施例1と同様に銀を被覆させて銀被覆銅粉(サンプル)を得た。銀の被覆量は、銀被覆銅粉全体の10.7質量%であった。    
In an electrolytic cell having a size of 2.5 m × 1.1 m × 1.5 m (about 4 m 3 ), nine copper cathode plates and a copper anode plate (electrodes) each having a size (1.0 m × 1.0 m) are electrodes. Suspend so that the distance is 5 cm, circulate a copper sulfate solution as an electrolytic solution at 2 L / min, immerse the anode and the cathode in this electrolytic solution, conduct a direct current through this to perform electrolysis, Powdered copper was deposited on the cathode surface.
At this time, the electrolytic solution to be circulated was adjusted to a Cu concentration of 100 g / L, a sulfuric acid (H 2 SO 4 ) concentration of 100 g / L, a circulating liquid amount of 2 L / min, and a current density of 80 A / m 2 for electrolysis for 60 minutes. Carried out.
During electrolysis, the copper ion concentration in the electrolyte solution between the electrodes was always higher than the copper ion concentration in the electrolyte solution at the bottom of the electrolytic cell.
The copper deposited on the cathode surface was mechanically scraped and collected, and then washed to obtain a hydrous copper powder cake equivalent to 1 kg of copper powder. This cake was dispersed in 3 L of water, 1 L of an industrial gelatin (made by Nitta Gelatin) 10 g / L aqueous solution 1 L was added, stirred for 10 minutes, filtered through a Buchner funnel, washed, and then washed at 80 ° C. in an air atmosphere. It was dried for 6 hours to obtain electrolytic copper powder.
Then, silver was coated in the same manner as in Example 1 to obtain a silver-coated copper powder (sample). The silver coating amount was 10.7% by mass of the entire silver-coated copper powder.
 得られた銀被覆銅粉(サンプル)を、光学顕微鏡を用いて観察したところ、得られた電解銅粉の粒子形状は松ぼっくり状であり、主軸太さ、枝長、枝本数/長径Lの測定は出来なかった。
 表1に示すように、この導電性フィルムのシート抵抗はレンジオーバーで測定不能であった。
When the obtained silver-coated copper powder (sample) was observed using an optical microscope, the particle shape of the obtained electrolytic copper powder was pine cone-shaped, and the measurement of the spindle thickness, branch length, number of branches / long diameter L was I could not do it.
As shown in Table 1, the sheet resistance of this conductive film could not be measured due to overrange.
<比較例2>
 粒子形状が球状を呈する銅粉粒子(D50:5μm)に10質量%の銀を被覆してなる銀被覆銅粉40.5質量部と、バインダとしてのエポキシ系熱硬化性樹脂21.8質量部と、した以外は実施例1と同様に導電性フィルム(電磁波シールドフィルム)を作製した。この時、導電膜中の銀被覆銅粉の含有割合は65wt%であった。
 表1に示すように、この導電性フィルムのシート抵抗はレンジオーバーで測定不能であった。
<Comparative Example 2>
40.5 parts by mass of silver-coated copper powder obtained by coating 10% by mass of silver on a copper powder particle (D50: 5 μm) having a spherical particle shape, and 21.8 parts by mass of an epoxy-based thermosetting resin as a binder A conductive film (electromagnetic wave shielding film) was produced in the same manner as in Example 1 except that. At this time, the content rate of the silver covering copper powder in a electrically conductive film was 65 wt%.
As shown in Table 1, the sheet resistance of this conductive film could not be measured due to overrange.
<比較例3>
 粒子形状がコイン状を呈する銅粉粒子(粒子の平均厚み:1μm、粒子の最大直径平均:5μm)に10質量%の銀を被覆してなる銀被覆銅粉40.5質量部と、バインダとしてのエポキシ系熱硬化性樹脂21.8質量部と、した以外は実施例1と同様に導電性フィルム(電磁波シールドフィルム)を作製した。この時、導電膜中の銀被覆銅粉の含有割合は65wt%であった。
 表1に示すように、この導電性フィルムのシート抵抗はレンジオーバーで測定不能であった。
<Comparative Example 3>
As a binder, 40.5 parts by mass of silver-coated copper powder obtained by coating 10% by mass of silver on a copper powder particle (average particle thickness: 1 μm, maximum particle diameter average: 5 μm) having a coin shape as a particle shape A conductive film (electromagnetic wave shielding film) was produced in the same manner as in Example 1 except that 21.8 parts by mass of the epoxy-based thermosetting resin was used. At this time, the content rate of the silver covering copper powder in a electrically conductive film was 65 wt%.
As shown in Table 1, the sheet resistance of this conductive film could not be measured due to overrange.
<比較例4>
 市販されている銀被覆銅粉であって、粒子形状が未発達なデンドライト状を呈する銀被覆銅粉40.5質量部と、バインダとしてのエポキシ系熱硬化性樹脂21.8質量部と、した以外は実施例1と同様に導電性フィルム(電磁波シールドフィルム)を作製した。この時、導電膜中の銀被覆銅粉の含有割合は65wt%であった。
 表1に示すように、この導電性フィルムのシート抵抗はやや高い値を示した。
<Comparative example 4>
40.5 parts by mass of silver-coated copper powder which is a commercially available silver-coated copper powder and has a dendritic shape with an underdeveloped particle shape, and 21.8 parts by mass of an epoxy-based thermosetting resin as a binder A conductive film (electromagnetic wave shield film) was produced in the same manner as Example 1 except for the above. At this time, the content rate of the silver covering copper powder in a electrically conductive film was 65 wt%.
As shown in Table 1, the sheet resistance of this conductive film showed a slightly high value.
Figure JPOXMLDOC01-appb-T000001
Figure JPOXMLDOC01-appb-T000001
(考察)
 上記実施例とこれまで行った試験結果を総合的に考えると、導電材料として銀被覆銅粉を使用した導電膜を備えた導電性フィルムに関し、実施例1-6のようにデンドライトとして顕著に成長した銀被覆銅粉粒子を含む導電材料を使用すると、従来の銀被覆銅粉に比べて、銀粉を配合しなくても必要な導電性を得ることができ、しかも、銀被覆銅粉の量を少なくしても必要な導電性を得ることができることが分かった。これは、樹枝が顕著に成長したデンドライト状を呈する銀被覆銅粉粒子を使用すると、粒子同士の重なり合いがより密になり、粒子同士の接点の数がより一層多くなる結果、少ない量でも、より一層優れた導通性を得ることができるようになったものと考えることができる。
 そして、銀被覆銅粉の量を少なくしても、たとえ30wt%程度であっても(実施例2参照)、必要な導電性を得ることができる結果、フィルムの透明性を高めることができることも分かった。
(Discussion)
Considering the above examples and the results of the tests conducted so far, the conductive film provided with the conductive film using silver-coated copper powder as the conductive material was remarkably grown as a dendrite as in Example 1-6. If the conductive material containing the silver-coated copper powder particles is used, the required conductivity can be obtained without blending the silver powder as compared with the conventional silver-coated copper powder, and the amount of the silver-coated copper powder can be reduced. It has been found that the necessary conductivity can be obtained even with a small amount. This is because when silver-coated copper powder particles having dendritic shapes with significantly grown branches are used, the overlapping of the particles becomes denser and the number of contact points between the particles becomes larger, so even with a small amount, more It can be considered that more excellent electrical conductivity can be obtained.
And even if it reduces the quantity of silver covering copper powder, even if it is about 30 wt% (refer Example 2), as a result of obtaining the required electroconductivity, it can also improve the transparency of a film. I understood.

Claims (2)

  1.  基材フィルム上に、デンドライト状銀被覆銅粉粒子を含有する導電膜を備えた導電性フィルムであって、
     前記デンドライト状銀被覆銅粉粒子は、銅粉粒子表面の少なくとも一部が銀で被覆されてなる銀被覆銅粉粒子であり、且つ、走査型電子顕微鏡(SEM)を用いて銀被覆銅粉粒子を観察した際、一本の主軸を備えており、該主軸から直交方向又は斜め方向に複数の枝が分岐して、二次元的或いは三次元的に成長したデンドライト状を呈し、且つ、主軸の太さaが0.3μm~6.0μmであり、且つ、主軸から伸びた枝の中で最も長い枝の長さbが0.3μm~10.0μmであるデンドライト状銀被覆銅粉粒子である、ことを特徴とする導電性フィルム。
    A conductive film comprising a conductive film containing dendritic silver-coated copper powder particles on a base film,
    The dendrite-like silver-coated copper powder particles are silver-coated copper powder particles in which at least a part of the surface of the copper powder particles is coated with silver, and silver-coated copper powder particles using a scanning electron microscope (SEM). Is observed, it has a single main axis, a plurality of branches branch in an orthogonal direction or oblique direction from the main axis, exhibiting a dendritic shape that grows two-dimensionally or three-dimensionally, and the main axis Dendritic silver-coated copper powder particles having a thickness a of 0.3 μm to 6.0 μm and a longest branch length b of 0.3 μm to 10.0 μm among the branches extending from the main axis A conductive film characterized by that.
  2.  デンドライト状銀被覆銅粉粒子が、主軸の長径Lに対する枝の分岐本数(枝本数/長径L)0.1本/μm~4.0本/μmであることを特徴とする請求項1記載の導電性フィルム。
     
    The dendrite-like silver-coated copper powder particles have a branching number (number of branches / major axis L) of 0.1 / μm to 4.0 / μm with respect to the major axis L of the main axis. Conductive film.
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