TWI553661B - Silver powder and its use of conductive paste, conductive paint, conductive film - Google Patents

Silver powder and its use of conductive paste, conductive paint, conductive film Download PDF

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TWI553661B
TWI553661B TW104109957A TW104109957A TWI553661B TW I553661 B TWI553661 B TW I553661B TW 104109957 A TW104109957 A TW 104109957A TW 104109957 A TW104109957 A TW 104109957A TW I553661 B TWI553661 B TW I553661B
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silver
copper powder
dendritic
coated
coated copper
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TW201635308A (en
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Hiroshi Okada
Hideyuki Yamashita
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Sumitomo Metal Mining Co
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覆銀銅粉及使用其之導電性糊、導電性塗料、導電性片 Silver-coated copper powder and conductive paste, conductive paint, and conductive sheet using the same

本發明係關於一種於表面被覆有銀之銅粉(覆銀銅粉),更詳細而言,係關於一種藉由用作導電性糊等材料而可改善導電性之新穎之樹枝狀覆銀銅粉及使用其之銅糊、導電性塗料、導電性片。 The present invention relates to a copper powder (silver-coated copper powder) coated with silver on the surface, and more particularly to a novel dendritic silver-coated copper which can improve conductivity by using a material such as a conductive paste. Powder and copper paste, conductive paint, and conductive sheet using the same.

於電子機器之配線層或電極等之形成中,多使用樹脂型糊或燒成型糊、電磁波屏蔽塗料之類的使用銀粉或覆銀銅粉等金屬填料之糊或塗料。銀粉或覆銀銅之金屬填料糊係塗佈或印刷於各種基材上,接受加熱硬化或加熱燒成之處理,形成成為配線層或電極等之導電膜。 In the formation of a wiring layer or an electrode of an electronic device, a paste or a coating of a metal filler such as a silver paste or a silver-coated copper powder such as a resin paste or a fired paste or an electromagnetic wave shield paint is often used. The metal filler paste of silver powder or silver-coated copper is applied or printed on various substrates, and subjected to heat curing or heat baking to form a conductive film which is a wiring layer or an electrode.

例如,樹脂型導電性糊係由金屬填料、與樹脂、硬化劑、溶劑等構成,印刷於導電體電路圖案或端子上,以100℃~200℃加熱硬化而以導電膜之形式形成配線或電極。關於樹脂型導電性糊,由於熱硬化型樹脂因熱而硬化收縮,故而金屬填料被壓接而接觸,藉此重疊金屬填料,形成電性連接之電流路徑。該樹脂型導電性糊於硬化溫度為200℃以下進行處理,因此可用於印刷配線板等使用不耐熱之材料之基板。 For example, the resin-based conductive paste is composed of a metal filler, a resin, a curing agent, a solvent, or the like, and is printed on a conductor circuit pattern or a terminal, and is heat-hardened at 100 ° C to 200 ° C to form a wiring or an electrode in the form of a conductive film. . In the resin-based conductive paste, since the thermosetting resin is hardened and shrunk by heat, the metal filler is pressed and brought into contact, thereby overlapping the metal filler to form a current path for electrical connection. Since the resin-type conductive paste is treated at a curing temperature of 200 ° C or lower, it can be used for a substrate using a heat-resistant material such as a printed wiring board.

另一方面,燒成型導電性糊係由金屬填料及玻璃、溶劑等構成,印刷於導電體電路圖案或端子上,加熱燒成至600℃~800℃而製成導 電膜,形成配線或電極。燒成型導電性糊係藉由利用較高之溫度進行處理而將金屬填料彼此燒結,確保導通性者。該燒成型導電性糊如上所述般於較高之燒成溫度下進行處理,故而存在無法用於使用樹脂材料之印刷配線基板的狀況,但由於藉由高溫處理而燒結金屬填料,因此可實現低電阻。因此,燒成型導電性糊係用於積層陶瓷電容器之外部電極等。 On the other hand, the fire-molded conductive paste is composed of a metal filler, glass, a solvent, etc., and is printed on a conductor circuit pattern or a terminal, and is heated and baked to 600 ° C to 800 ° C to be guided. Electrical film to form wiring or electrodes. The fire-molded conductive paste is obtained by sintering the metal fillers by treatment with a relatively high temperature to ensure conductivity. Since the baked conductive paste is treated at a high firing temperature as described above, there is a case where the printed wiring board cannot be used for a resin material. However, since the metal filler is sintered by high-temperature treatment, Achieve low resistance. Therefore, the fired conductive paste is used for an external electrode or the like of a laminated ceramic capacitor.

另一方面,電磁波屏蔽係為了防止來自電子機器之電磁雜訊之產生而使用者,特別是近年來個人電腦或行動電話之殼體變為樹脂製,因此為了對殼體確保導電性,提出如下之方法:利用蒸鍍法或濺鍍法形成較薄之金屬皮膜之方法或塗佈導電性之塗料之方法、將導電性片貼附至所需之部位而屏蔽電磁波之方法等。其中,使金屬填料分散於樹脂中進行塗佈之方法、或使金屬填料分散於樹脂中並加工成片狀而將其貼附至殼體之方法於加工步驟中無需特殊之設備而自由度優異,從而被頻繁地使用。 On the other hand, in order to prevent the generation of electromagnetic noise from an electronic device, the electromagnetic wave shielding is made of a resin, and in particular, in recent years, the casing of a personal computer or a mobile phone is made of resin. Therefore, in order to ensure electrical conductivity to the casing, the following is proposed. Method: a method of forming a thin metal film by a vapor deposition method or a sputtering method, a method of applying a conductive coating material, a method of attaching a conductive sheet to a desired portion, and shielding an electromagnetic wave. Among them, a method in which a metal filler is dispersed in a resin for coating, or a method in which a metal filler is dispersed in a resin and processed into a sheet shape and attached to a casing is excellent in degree of freedom in a processing step without special equipment. , thus being used frequently.

然而,於此種使金屬填料分散於樹脂中並塗佈之情形、或加工成片狀之情形時,金屬填料於樹脂中之分散狀態並不一致,故而需要為了獲得電磁波屏蔽之效率而提高金屬填料之填充率等方法。然而,於該情形時,因大量之金屬填料之添加而產生片重量變重,並且損害樹脂片之可撓性等問題。因此,例如於專利文獻1中,為了解決該等問題,提出有使用平板狀之金屬填料之方法,藉此可形成電磁波屏蔽效果優異,可撓性亦良好之較薄之片。 However, in the case where the metal filler is dispersed in the resin and coated, or processed into a sheet shape, the dispersion state of the metal filler in the resin is not uniform, so it is necessary to increase the metal filler in order to obtain the efficiency of electromagnetic wave shielding. Method such as filling rate. However, in this case, the weight of the sheet is increased due to the addition of a large amount of the metal filler, and the problem of flexibility of the resin sheet is impaired. For example, in Patent Document 1, in order to solve such problems, a method of using a flat metal filler has been proposed, whereby a thin sheet having excellent electromagnetic wave shielding effect and good flexibility can be formed.

此處,為了製作平板狀銅粉,例如於專利文獻2中,揭示有獲得適於導電性糊之填料之鱗片狀(flake shape)銅粉之方法。具體而言,以平均粒徑為0.5μm~10μm之球狀銅粉為原料,使用球磨機或振磨機, 藉由裝填於研磨機內之介質之機械能量而機械性地加工成平板狀。 Here, in order to produce a flat copper powder, for example, Patent Document 2 discloses a method of obtaining a flake shape copper powder suitable for a filler of a conductive paste. Specifically, a spherical copper powder having an average particle diameter of 0.5 μm to 10 μm is used as a raw material, and a ball mill or a vibrating machine is used. It is mechanically processed into a flat shape by the mechanical energy of the medium loaded in the grinder.

又,例如於專利文獻3中,揭示有關於導電性糊用銅粉末、詳細而言可獲得作為通孔用及外部電極用銅糊之高性能之圓盤狀銅粉末及其製造方法之技術。具體而言,將粒狀霧化銅粉末投入至介質攪拌研磨機,使用1/8英吋~1/4英吋直徑之鋼球作為粉碎介質,對銅粉末添加以重量計0.5%~1%之脂肪酸,於空氣中或非活性氣體環境中進行粉碎,藉此加工成平板狀。 Further, for example, Patent Document 3 discloses a copper powder for conductive paste, and a disk-shaped copper powder which is high-performance as a copper paste for a via hole and an external electrode, and a method for producing the same. Specifically, the granular atomized copper powder is put into a medium agitating mill, and a steel ball having a diameter of 1/8 inch to 1/4 inch is used as a grinding medium, and 0.5% to 1% by weight is added to the copper powder. The fatty acid is pulverized in the air or in an inert gas atmosphere, thereby being processed into a flat shape.

另一方面,作為該等導電性糊或電磁波屏蔽用中所使用之金屬填料,多使用銀粉,但因低成本化之趨勢而有使用藉由在較銀粉廉價之銅粉之表面塗覆銀而減少銀之使用量的覆銀銅粉之傾向。 On the other hand, as the metal filler used for the conductive paste or electromagnetic wave shielding, silver powder is often used, but the tendency to reduce the cost is to use silver coated on the surface of the copper powder which is cheaper than silver powder. The tendency to reduce the amount of silver used in silver-coated copper powder.

作為於銅粉之表面被覆銀之方法,有藉由置換反應而於銅表面被覆銀之方法、及於包含還原劑之無電解鍍敷溶液中被覆銀之方法。 As a method of coating silver on the surface of the copper powder, there is a method of coating silver on the copper surface by a substitution reaction, and a method of coating silver in an electroless plating solution containing a reducing agent.

藉由置換反應被覆銀之方法係藉由利用於溶液中溶出銅時所產生之電子還原銀離子,而於銅表面形成銀之被膜。例如,於專利文獻4中,揭示有如下之製造方法:藉由向存在銀離子之溶液中投入銅粉,而利用銅與銀離子之置換反應於銅表面形成銀之被膜。然而,於利用該置換反應之方法中,若於銅表面形成銀之被膜,則不會進行該程度以上之銅之溶解,故而存在無法控制銀之被覆量之問題。 The method of coating silver by the substitution reaction forms a silver film on the copper surface by reducing silver ions by electrons generated when copper is eluted in the solution. For example, Patent Document 4 discloses a production method in which a copper film is formed by applying a copper powder to a solution in which silver ions are present, and a silver film is formed by a substitution reaction between copper and silver ions. However, in the method using the displacement reaction, if a silver film is formed on the surface of copper, the dissolution of copper to the above extent is not performed, and there is a problem that the amount of silver coating cannot be controlled.

為了解決此種問題,有利用包含還原劑之無電解鍍敷液被覆銀之方法。例如,於專利文獻5中,提出有如下方法:於溶存有還原劑之溶液中,藉由銅粉與硝酸銀之反應而製造被覆有銀之銅粉。 In order to solve such a problem, there is a method of coating silver with an electroless plating solution containing a reducing agent. For example, Patent Document 5 proposes a method of producing a copper powder coated with silver by a reaction between copper powder and silver nitrate in a solution in which a reducing agent is dissolved.

且說,作為銅粉,已知有析出成稱為枝晶(dendrite)狀之 樹枝狀之電解銅粉,由於形狀呈樹枝狀,因此特徵在於表面積大。藉由如上所述般為枝晶狀之形狀,而於將其用於導電膜等之情形時,該枝晶之枝重疊而容易導通,又,粒子彼此之接點數量多於球狀粒子,因此有可減少導電性糊等中之導電性填料之量之優點。例如,於專利文獻6及7中,提出有於呈枝晶狀之銅粉表面被覆銀之覆銀銅粉。 In addition, as a copper powder, it is known that it is precipitated into a dendrite. Dendritic electrolytic copper powder is characterized by a large surface area due to its dendritic shape. By using a dendritic shape as described above, when it is used for a conductive film or the like, the branches of the dendrites overlap and are easily turned on, and the number of contacts between the particles is more than that of the spherical particles. Therefore, there is an advantage that the amount of the conductive filler in the conductive paste or the like can be reduced. For example, in Patent Documents 6 and 7, a silver-coated copper powder coated with silver on the surface of a dendritic copper powder is proposed.

具體而言,於專利文獻6及7中,作為進一步成長為枝晶狀者,揭示有以自主軸分支之長枝為特徵之枝晶,該覆銀銅粉因粒子彼此之接點多於習知之枝晶而提高導通性,若用於導電性糊等,則即便減少導電性粉末之量,亦可提高導電性。 Specifically, in Patent Documents 6 and 7, as a dendritic shape, a dendrite characterized by a long branch of an autonomous axis is disclosed, and the silver-coated copper powder has a more contact with each other due to particles. It is known that the dendrites are used to improve the conductivity, and when used for a conductive paste or the like, the conductivity can be improved even if the amount of the conductive powder is reduced.

另一方面,於專利文獻8中指出:若使電解銅粉之樹枝發展,則於用於導電性糊等之情形時,電解銅粉彼此以所需以上之程度相互纏繞,故而變得容易發生凝集,又,流動性下降而變得非常難以操作,從而使生產性下降。再者,專利文獻8中,為了提高電解銅粉本身之強度,藉由於用以使電解銅粉析出之電解液之硫酸銅水溶液中添加鎢酸鹽,而提高電解銅粉本身之強度,使樹枝變得難以折斷,可成形為較高之強度。 On the other hand, it is pointed out in Patent Document 8 that when the branch of the electrolytic copper powder is developed, when used for a conductive paste or the like, the electrolytic copper powder is entangled with each other to a desired degree or more, and thus it becomes easy to occur. Aggregation, in turn, decreases in fluidity and becomes very difficult to operate, thereby reducing productivity. Further, in Patent Document 8, in order to increase the strength of the electrolytic copper powder itself, the strength of the electrolytic copper powder itself is increased by adding tungstate to the copper sulfate aqueous solution for causing the electrolytic copper powder to be deposited. It becomes difficult to break and can be formed into a higher strength.

又,例如亦於專利文獻9中指出:於將樹枝狀之銅粉用作導電性糊或電磁波屏蔽用樹脂等之金屬填料之情形時,若該金屬填料呈已發展成樹枝狀之形狀,則會產生樹枝狀之銅粉彼此相互纏繞而發生凝集,不會均勻地分散於樹脂中之問題,或因凝集而糊之黏度上升,從而於藉由印刷形成配線中產生問題。 Further, for example, in the case where the dendritic copper powder is used as a metal filler such as a conductive paste or a resin for electromagnetic wave shielding, if the metal filler has a shape which has developed into a dendritic shape, There is a problem that the dendritic copper powder is entangled with each other to cause aggregation, and is not uniformly dispersed in the resin, or the viscosity of the paste rises due to aggregation, thereby causing a problem in forming wiring by printing.

如上所述,將樹枝狀之銅粉用作導電性糊等之金屬填料並不容易,也一直為難以推進糊之導電性之改善的原因。 As described above, it is not easy to use the dendritic copper powder as a metal filler such as a conductive paste, and it has been difficult to advance the improvement of the conductivity of the paste.

為了確保導電性,具有三維形狀之樹枝狀形狀者較粒狀者更容易確保接點,可期待確保作為導電性糊或電磁波屏蔽之較高之導電性。然而,習知之呈枝晶狀之形狀之覆銀銅粉係以自主軸分支之長枝為特徵之枝晶,由於呈細長之枝狀之形狀,因此若自確保接點之方面考慮,則構造較為簡單且作為使用更少之覆銀銅粉而有效地確保接點之形狀而言,習知呈枝晶狀之形狀的覆銀銅粉並非為理想之形狀。 In order to ensure conductivity, a dendritic shape having a three-dimensional shape is more likely to secure a contact than a granular one, and it is expected to ensure high conductivity as a conductive paste or electromagnetic wave shield. However, the conventional silver-coated copper powder having a dendritic shape is a dendrite characterized by a long branch of an autonomous axis branch, and has a slender dendritic shape, so that the structure is ensured from the viewpoint of securing the joint. The silver-coated copper powder, which is known to have a dendritic shape, is not a desirable shape because it is relatively simple and is used to effectively ensure the shape of the joint by using less silver-coated copper powder.

[專利文獻1]日本特開2003-258490號公報 [Patent Document 1] Japanese Patent Laid-Open Publication No. 2003-258490

[專利文獻2]日本特開2005-200734號公報 [Patent Document 2] Japanese Patent Laid-Open Publication No. 2005-200734

[專利文獻3]日本特開2002-15622號公報 [Patent Document 3] Japanese Patent Laid-Open Publication No. 2002-15622

[專利文獻4]日本特開2000-248303號公報 [Patent Document 4] Japanese Patent Laid-Open Publication No. 2000-248303

[專利文獻5]日本特開2006-161081號公報 [Patent Document 5] Japanese Patent Laid-Open Publication No. 2006-161081

[專利文獻6]日本特開2013-89576號公報 [Patent Document 6] Japanese Patent Laid-Open Publication No. 2013-89576

[專利文獻7]日本特開2013-100592號公報 [Patent Document 7] Japanese Laid-Open Patent Publication No. 2013-100592

[專利文獻8]日本專利第4697643號公報 [Patent Document 8] Japanese Patent No. 4976643

[專利文獻9]日本特開2011-58027號公報 [Patent Document 9] Japanese Patent Laid-Open Publication No. 2011-58027

本發明係鑒於此種實情而提出者,其目的在於提供一種使被覆有銀之樹枝狀銅粉彼此接觸時之接點增多而確保優異之導電性,並且防止凝集,可較佳地用於導電性糊或電磁波屏蔽等用途的樹枝狀覆銀銅粉。 The present invention has been made in view of such circumstances, and an object of the present invention is to provide an increase in the contact point when the dendritic copper powder coated with silver is brought into contact with each other, thereby ensuring excellent conductivity and preventing aggregation, and is preferably used for conducting electricity. Dendritic silver-coated copper powder for use in adhesive or electromagnetic wave shielding.

本發明人等反覆進行用以解決上述課題之銳意研究。結果發 現一種覆銀銅粉,其係平板狀銅粒子集合並於該銅粒子之表面被覆有銀而構成者,該平板狀銅粒子成長為樹枝狀之具有主幹、及自該主幹分支之多個枝之樹枝狀形狀且剖面平均厚度為特定之範圍,藉由使該銅粉之平均粒徑(D50)為特定之範圍,可確保優異之導電性,並可與例如樹脂均勻地混合,可較佳地用於導電性糊等用途,從而完成本發明。即,本發明提供以下者。 The present inventors have repeatedly conducted intensive studies to solve the above problems. Result There is a silver-coated copper powder which is composed of flat copper particles and is coated with silver on the surface of the copper particles. The flat copper particles grow into a dendritic shape having a trunk and a plurality of branches from the trunk branch. The dendritic shape and the average thickness of the cross section are in a specific range. By setting the average particle diameter (D50) of the copper powder to a specific range, excellent electrical conductivity can be ensured, and it can be preferably uniformly mixed with, for example, a resin. The present invention is used for applications such as conductive pastes, thereby completing the present invention. That is, the present invention provides the following.

(1)本發明之第1發明係一種覆銀銅粉,其係由樹枝狀形狀之銅粒子集合而成且於表面被覆有銀者,該樹枝狀形狀之銅粒子具有直線性地成長之主幹、及自該主幹分支之多個枝之樹枝狀形狀;該覆銀銅粉其特徵在於:上述銅粒子其主幹及枝之剖面平均厚度超過1.0μm且在5.0μm以下,且為平板狀,該覆銀銅粉為由1層或重疊多層而成之積層構造構成之平板狀,且平均粒徑(D50)為1.0μm~100μm。 (1) The silver-coated copper powder of the present invention is a silver-coated copper powder obtained by collecting dendritic copper particles and coating the surface with silver, and the dendritic copper particles have a linear growth trunk. And a dendritic shape of a plurality of branches from the main branch; the silver-coated copper powder characterized in that the copper particles have a trunk and a branch having an average thickness of more than 1.0 μm and a thickness of 5.0 μm or less and a flat shape. The silver-coated copper powder is a flat plate composed of a laminated structure in which one layer or a plurality of layers are stacked, and the average particle diameter (D50) is from 1.0 μm to 100 μm.

(2)本發明之第2發明係如第1發明之覆銀銅粉,其中,將上述被覆有銀之銅粒子之剖面平均厚度除以該覆銀銅粉之平均粒徑(D50)所得之比為超過0.01且在5.0以下之範圍。 (2) The silver-coated copper powder according to the first aspect of the invention, wherein the average thickness of the cross-section of the copper-coated copper particles is divided by the average particle diameter (D50) of the silver-coated copper powder. The ratio is in the range of more than 0.01 and in the range of 5.0 or less.

(3)本發明之第3發明係如第1發明之覆銀銅粉,其中,銀被覆量相對於經銀被覆之該覆銀銅粉整體之質量100%為1質量%~50質量%。 (3) The silver-coated copper powder according to the first aspect of the invention, wherein the silver coating amount is from 1% by mass to 50% by mass based on 100% by mass of the silver-coated copper-coated copper powder.

(4)本發明之第4發明係如第1發明之覆銀銅粉,其體密度為0.5g/cm3~5.0g/cm3之範圍。 (4) The silver-coated copper powder according to the first aspect of the invention is characterized in that the bulk density is in the range of 0.5 g/cm 3 to 5.0 g/cm 3 .

(5)本發明之第5發明係如第1發明之覆銀銅粉,其BET比表面積值為0.2m2/g~3.0m2/g。 (5) A fifth invention of the present invention based silver coated copper powder as a first invention, BET specific surface area is 0.2m 2 /g~3.0m 2 / g.

(6)本發明之第6發明係一種金屬填料,其特徵在於:以整體之20質量%以上之比率含有第1至第5發明中任一發明之覆銀銅粉。 (6) A metal filler according to the present invention is characterized in that the silver-coated copper powder according to any one of the first to fifth inventions is contained in a ratio of 20% by mass or more of the whole.

(7)本發明之第7發明係一種導電性糊,其特徵在於:係將第6發明之金屬填料混合於樹脂而成。 (7) A conductive paste according to a seventh aspect of the invention is characterized in that the metal filler of the sixth invention is mixed with a resin.

(8)本發明之第8發明係一種電磁波屏蔽用導電性塗料,其特徵在於:係使用第6發明之金屬填料而成。 (8) The conductive paint for electromagnetic wave shielding according to the invention of the present invention is characterized in that the metal filler of the sixth invention is used.

(9)本發明之第9發明係一種電磁波屏蔽用導電性片,其特徵在於:其係使用如第6發明之金屬填料而成。 (9) A conductive sheet for electromagnetic wave shielding according to the invention of the present invention is characterized in that the metal filler according to the sixth aspect of the invention is used.

根據本發明之覆銀銅粉,可確保優異之導電性,並充分地確保銅粉彼此接觸時之接點,又,可防止凝集而與樹脂等均勻地混合,可較佳地用於導電性糊或電磁波屏蔽等用途。 According to the silver-coated copper powder of the present invention, excellent electrical conductivity can be ensured, and the contact points when the copper powders are in contact with each other can be sufficiently ensured, and aggregation can be prevented to be uniformly mixed with a resin or the like, and can be preferably used for conductivity. Use for paste or electromagnetic wave shielding.

1‧‧‧銅粒子 1‧‧‧ copper particles

2‧‧‧(銅粒子之)主幹 2‧‧‧ (copper particles) trunk

3、3a、3b‧‧‧(銅粒子之)枝 3, 3a, 3b‧‧‧ (copper particles) branches

圖1係示意性地表示構成樹枝狀覆銀銅粉之被覆有銀之銅粒子之具體形狀的圖。 Fig. 1 is a view schematically showing a specific shape of silver-coated copper particles constituting a dendritic silver-coated copper powder.

圖2係表示藉由掃描式電子顯微鏡以倍率1,000倍觀察被覆銀前之樹枝狀銅粉時之觀察圖像的照片圖。 Fig. 2 is a photographic view showing an observation image when a dendritic copper powder before silver coating is observed at a magnification of 1,000 times by a scanning electron microscope.

圖3係表示藉由掃描式電子顯微鏡以倍率10,000倍觀察被覆銀前之樹枝狀銅粉時之觀察圖像的照片圖。 Fig. 3 is a photographic view showing an observation image when a dendritic copper powder before silver coating is observed at a magnification of 10,000 times by a scanning electron microscope.

圖4係表示藉由掃描式電子顯微鏡以倍率10,000倍觀察被覆銀前之樹枝狀銅粉時之觀察圖像的照片圖。 Fig. 4 is a photographic view showing an observation image when a dendritic copper powder before silver coating is observed at a magnification of 10,000 times by a scanning electron microscope.

圖5係表示藉由掃描式電子顯微鏡以倍率1,000倍觀察樹枝狀覆銀銅粉 時之觀察圖像的照片圖。 Figure 5 is a view showing the dendritic silver-coated copper powder at a magnification of 1,000 times by a scanning electron microscope. A photo of the observed image.

圖6係表示藉由掃描式電子顯微鏡以倍率10,000倍觀察樹枝狀覆銀銅粉時之觀察圖像的照片圖。 Fig. 6 is a photographic view showing an observation image when a dendritic silver-coated copper powder is observed at a magnification of 10,000 times by a scanning electron microscope.

圖7係表示藉由掃描式電子顯微鏡以倍率5,000倍觀察比較例1中所獲得之銅粉時之觀察圖像的照片圖。 Fig. 7 is a photographic view showing an observation image when the copper powder obtained in Comparative Example 1 was observed at a magnification of 5,000 times by a scanning electron microscope.

圖8係表示藉由掃描式電子顯微鏡以倍率5,000倍觀察比較例2中所獲得之銅粉時之觀察圖像的照片圖。 Fig. 8 is a photographic view showing an observation image when the copper powder obtained in Comparative Example 2 was observed at a magnification of 5,000 times by a scanning electron microscope.

以下,一面參照圖式,一面詳細地對本發明之銅粉之具體之實施形態(以下,稱為「本實施形態」)進行說明,但本發明並不限定於以下之實施形態,可於不變更本發明之主旨之範圍內實現各種變更。再者,於本說明書中,「X~Y」(X、Y為任意之數值)之表述意指「X以上且Y以下」。 In the following, a specific embodiment of the copper powder of the present invention (hereinafter referred to as "this embodiment") will be described in detail with reference to the drawings, but the present invention is not limited to the following embodiments and may not be changed. Various modifications are possible within the scope of the gist of the invention. In addition, in the present specification, the expression "X~Y" (where X and Y are arbitrary values) means "X or more and Y or less".

《1.樹枝狀覆銀銅粉》 "1. Dendritic silver-coated copper powder"

本實施形態之覆銀銅粉係由銅粒子集合而成且於該銅粒子之表面被覆有銀者,該銅粒子成長為樹枝狀之具有主幹及自該主幹分支之多個枝之形狀。 The silver-coated copper powder of the present embodiment is formed by collecting copper particles and coating the surface of the copper particles with silver, and the copper particles are formed into a dendritic shape having a trunk and a plurality of branches from the trunk branch.

圖1係表示構成本實施形態之覆銀銅粉之被覆有銀之銅粒子之具體形狀的示意圖。如圖1之示意圖所示,被覆有銀之銅粒子1(以下,簡稱為「銅粒子1」)具有呈二維或三維形態之樹枝狀之形狀。更具體而言,銅粒子1具有成長為樹枝狀之具有主幹2及自該主幹2分支之多個枝3之形 狀,又,銅粒子1其剖面平均厚度超過1.0μm且在5.0μm以下,且為平板狀。再者,銅粒子1之枝3係指自主幹2分支之枝3a、及自該枝3a進一步分支之枝3b之兩者。 Fig. 1 is a schematic view showing a specific shape of silver-coated copper particles constituting the silver-coated copper powder of the present embodiment. As shown in the schematic view of Fig. 1, the silver-coated copper particles 1 (hereinafter, simply referred to as "copper particles 1") have a dendritic shape in a two-dimensional or three-dimensional form. More specifically, the copper particles 1 have a shape of a trunk 2 and a plurality of branches 3 having branches from the trunk 2 Further, the copper particles 1 have a cross-sectional average thickness of more than 1.0 μm and a thickness of 5.0 μm or less and are flat. Further, the branch 3 of the copper particles 1 means both the branch 3a of the autonomous dry branch and the branch 3b which is further branched from the branch 3a.

本實施形態之覆銀銅粉係由此種平板狀銅粒子1集合而構成,且於具有主幹及多個枝之樹枝狀形狀之銅粉(樹枝狀銅粉)之表面被覆有銀者(以下,亦稱為「樹枝狀覆銀銅粉」),且呈由1層或重疊多層而成之積層構造構成之平板狀(參照圖3或圖4之銅粉之SEM圖像)。而且,由該平板狀銅粒子1構成之樹枝狀覆銀銅粉之平均粒徑(D50)為1.0μm~100μm。 The silver-coated copper powder of the present embodiment is composed of such flat copper particles 1 and is coated with silver on the surface of a copper powder (dendritic copper powder) having a trunk shape and a plurality of branches. Also known as "dendritic silver-coated copper powder", it is in the form of a flat layer composed of a laminated structure in which one layer or a plurality of layers are stacked (see the SEM image of the copper powder of FIG. 3 or FIG. 4). Further, the average particle diameter (D50) of the dendritic silver-coated copper powder composed of the tabular copper particles 1 is 1.0 μm to 100 μm.

再者,如下所示,本實施形態之樹枝狀覆銀銅粉之銀被覆量相對於經銀被覆之該覆銀銅粉整體之質量100%,為1質量%~50質量%,但為銀之厚度(被覆厚度)為0.15μm以下程度之極薄之被膜。因此,該樹枝狀覆銀銅粉成為依舊保持被覆銀前之樹枝狀銅粉之形狀的形狀。因此,被覆銀前之樹枝狀銅粉之形狀與於銅粉被覆銀後之樹枝狀覆銀銅粉之形狀兩者均具有呈二維或三維之形態之樹枝狀之形狀,又,呈由1層或重疊多層而成之積層構造構成之平板狀。 Further, as shown below, the silver coating amount of the dendritic silver-coated copper powder of the present embodiment is 100% by mass based on the total mass of the silver-coated copper powder coated with silver, and is 1% by mass to 50% by mass, but is silver. The thickness (coating thickness) is an extremely thin film of about 0.15 μm or less. Therefore, the dendritic silver-coated copper powder has a shape that remains in the shape of the dendritic copper powder before the silver coating. Therefore, both the shape of the dendritic copper powder coated with silver and the shape of the dendritic silver-coated copper powder after the copper powder is coated with silver have a dendritic shape in a two-dimensional or three-dimensional form, and The layer or the multi-layered multilayer structure is formed into a flat plate shape.

再者,之後敍述詳細內容,本實施形態之樹枝狀覆銀銅粉例如可藉由在樹枝狀銅粉之表面藉由還原型無電解鍍敷法或置換型無電解鍍敷法被覆銀而獲得,該樹枝狀銅粉係藉由於含銅離子之硫酸酸性之電解液中浸漬陽極與陰極並通入直流電流進行電解而析出於陰極上所獲得。 Further, as will be described in detail later, the dendritic silver-coated copper powder of the present embodiment can be obtained, for example, by coating silver on the surface of the dendritic copper powder by reduction electroless plating or displacement electroless plating. The dendritic copper powder is obtained by impregnating an anode and a cathode with an electrolyte of a copper ion-containing acidic acid and electrolyzing it with a direct current to precipitate it on the cathode.

圖2~圖4係表示藉由掃描式電子顯微鏡(SEM)對被覆銀前之樹枝狀銅粉進行觀察時之觀察圖像之一例的照片圖。再者,圖2係以 倍率5,000倍觀察樹枝狀銅粉所得者,圖3及圖4係以倍率10,000倍觀察樹枝狀銅粉所得者。又,圖5係表示藉由SEM對在圖2之樹枝狀銅粉被覆銀而成之樹枝狀覆銀銅粉進行觀察時之觀察圖像之一例的照片圖。又,圖6係表示以相同之方式藉由SEM對在樹枝狀銅粉被覆銀而成之樹枝狀覆銀銅粉之另一處進行觀察時之觀察圖像之一例的照片圖。再者,圖5係以倍率1,000倍觀察樹枝狀覆銀銅粉所得者,圖6係以倍率10,000倍觀察樹枝狀覆銀銅粉所得者。 2 to 4 are photographs showing an example of an observation image when a dendritic copper powder before silver coating is observed by a scanning electron microscope (SEM). Furthermore, Figure 2 is based on The 3,000-fold magnification was observed for the dendritic copper powder. Figures 3 and 4 show that the dendritic copper powder was observed at a magnification of 10,000 times. Moreover, FIG. 5 is a photographic view showing an example of an observation image when the dendritic silver-coated copper powder in which the dendritic copper powder of FIG. 2 is coated with silver is observed by SEM. Moreover, FIG. 6 is a photographic view showing an example of an observation image when the other side of the dendritic silver-coated copper powder in which the dendritic copper powder is coated with silver is observed by SEM in the same manner. Further, Fig. 5 shows that the dendritic silver-coated copper powder was observed at a magnification of 1,000 times, and Fig. 6 was obtained by observing the dendritic silver-coated copper powder at a magnification of 10,000 times.

如圖2~圖4之觀察圖像所示,構成本實施形態之覆銀銅粉之樹枝狀銅粉呈具有主幹及自該主幹分支之枝之二維或三維樹枝狀之析出狀態。又,該主幹及枝呈平板狀且具有樹枝狀之形狀之銅粒子1(參照圖1之示意圖)會集合地構成,進而,該銅粒子1於表面具有微細之凸部。 As shown in the observation images of FIG. 2 to FIG. 4, the dendritic copper powder constituting the silver-coated copper powder of the present embodiment has a state of being precipitated in a two-dimensional or three-dimensional dendritic shape having a trunk and a branch from the trunk branch. Further, the main particles and the copper particles 1 having a dendritic shape and a dendritic shape (see the schematic view of Fig. 1) are collectively formed, and further, the copper particles 1 have fine convex portions on the surface.

此處,構成樹枝狀銅粉且具有主幹2及枝3之平板狀銅粒子1之剖面平均厚度超過1.0μm且在5.0μm以下。平板狀銅粒子1之剖面平均厚度更薄者可發揮作為平板之效果。即,藉由以剖面平均厚度為5.0μm以下之平板狀銅粒子1構成樹枝狀銅粉之主幹及枝,可將銅粒子1彼此以及由該銅粒子1構成之樹枝狀覆銀銅粉彼此接觸之面積確保為大。而且,藉由使該接觸面積變大,可實現低電阻、即高導電率。藉此,導電性更優異,又,可良好地維持該導電性,可較佳地用於導電性塗料或導電性糊之用途。又,藉由以平板狀銅粒子1構成樹枝狀銅粉,亦可有助於配線材等之薄型化。 Here, the average thickness of the cross-sectional copper particles 1 constituting the dendritic copper powder and having the stem 2 and the stem 3 is more than 1.0 μm and not more than 5.0 μm. The thinner average thickness of the flat copper particles 1 can be exerted as a flat plate. In other words, by forming the stem and the branches of the dendritic copper powder with the tabular copper particles 1 having an average thickness of 5.0 μm or less, the copper particles 1 and the dendritic silver-coated copper powder composed of the copper particles 1 can be brought into contact with each other. The area is guaranteed to be large. Moreover, by making the contact area large, low electrical resistance, that is, high electrical conductivity can be achieved. Thereby, the conductivity is more excellent, and the conductivity can be favorably maintained, and it can be preferably used for the use of a conductive paint or a conductive paste. Moreover, by forming the dendritic copper powder with the flat copper particles 1, it is also possible to contribute to the reduction in thickness of the wiring material or the like.

再者,作為平板狀銅粒子1之剖面平均厚度之下限,並無特別限定,於下文之「藉由自含銅離子之硫酸酸性之電解液電解而析出於陰 極上」的方法中,可獲得具有超過1.0μm之剖面平均厚度之平板狀銅粒子1。 In addition, the lower limit of the average thickness of the cross-section of the flat copper particles 1 is not particularly limited, and is hereinafter referred to as "by electrolysis of an electrolyte having a sulfuric acid containing copper ions. In the method of "upper", the tabular copper particles 1 having a cross-sectional average thickness of more than 1.0 μm can be obtained.

又,本實施形態之樹枝狀覆銀銅粉之平均粒徑(D50)為1.0μm~100μm。再者,平均粒徑(D50)例如可藉由雷射繞射散射式粒度分佈測定法而測定。 Further, the average particle diameter (D50) of the dendritic silver-coated copper powder of the present embodiment is from 1.0 μm to 100 μm. Further, the average particle diameter (D50) can be measured, for example, by a laser diffraction scattering type particle size distribution measurement method.

例如,亦如專利文獻1中所指出,成為樹枝狀覆銀銅粉之問題點,可列舉:於用作導電性糊或電磁波屏蔽用樹脂等之金屬填料之情形時,由於為樹脂中之金屬填料已發展成樹枝狀之形狀,故而樹枝狀之銅粉彼此相互纏繞而發生凝集,不會均勻地分散於樹脂中。又,因該凝集而使糊之黏度上升,會在藉由印刷形成配線產生問題。該情形係由於樹枝狀覆銀銅粉之形狀(粒徑)較大而產生者,為了有效地利用樹枝狀之形狀,並解決該問題,需要縮小樹枝狀覆銀銅粉之形狀。然而,若使樹枝狀覆銀銅粉之粒徑變得過小,則無法確保其樹枝狀形狀。因此,藉由呈樹枝狀形狀之效果、即藉由呈三維形狀,表面積較大且成形性或燒結性優異,又,為了確保經由枝狀之部位牢固連結而能夠以較高之強度成形之效果,需要使樹枝狀覆銀銅粉為特定以上之大小。 For example, as described in Patent Document 1, the problem of the dendritic silver-coated copper powder is as a metal filler in a resin such as a conductive paste or an electromagnetic wave shielding resin. The filler has developed into a dendritic shape, so that the dendritic copper powders are entangled with each other to agglomerate and are not uniformly dispersed in the resin. Moreover, the viscosity of the paste rises due to the aggregation, which causes a problem in that wiring is formed by printing. In this case, since the shape (particle diameter) of the dendritic silver-coated copper powder is large, in order to effectively utilize the shape of the dendritic shape and solve the problem, it is necessary to reduce the shape of the dendritic silver-coated copper powder. However, if the particle diameter of the dendritic silver-coated copper powder is too small, the dendritic shape cannot be ensured. Therefore, by the effect of a dendritic shape, that is, by having a three-dimensional shape, the surface area is large, and the formability and the sinterability are excellent, and the effect of forming at a high strength can be ensured in order to secure the connection through the branch-like portion. It is necessary to make the dendritic silver-coated copper powder to a specific size or more.

就該方面而言,本實施形態之樹枝狀覆銀銅粉中,藉由使其平均粒徑為1.0μm~100μm,表面積變大,可確保良好之成形性或燒結性。而且,該樹枝狀覆銀銅粉除呈樹枝狀之形狀以外,係由「呈具有主幹2及枝3之樹枝狀且具有平板形狀」之銅粒子1集合而構成,故而可藉由呈樹枝狀之三維效果、與構成該樹枝形狀之銅粒子1呈平板狀之效果,而更多地確保銅粉彼此之接點。 In this regard, in the dendritic silver-coated copper powder of the present embodiment, the average particle diameter is 1.0 μm to 100 μm, and the surface area is increased to ensure good formability or sinterability. Further, the dendritic silver-coated copper powder is composed of a collection of copper particles 1 having a dendritic shape having a trunk 2 and a branch 3 and having a flat plate shape, and thus may be dendritic. The three-dimensional effect and the effect of the copper particles 1 constituting the shape of the branches are flat, and the contact of the copper powders with each other is more ensured.

此處,如專利文獻2或專利文獻3所記載,於藉由機械性之方法而將例如球狀銅粉製成平板狀之情形時,於機械加工時需要防止銅之氧化,故而藉由添加脂肪酸並於空氣中或非活性氣體環境中進行粉碎而加工成平板狀。然而,存在無法完全防止氧化之情況,或於加工時添加之脂肪酸糊化時存在對分散性造成影響之情形,故而需要於加工結束後去除,但存在該脂肪酸因機械加工時之圧力而牢固地固著於銅表面之情況,產生無法完全去除之問題。 Here, as described in Patent Document 2 or Patent Document 3, when a spherical copper powder is formed into a flat shape by a mechanical method, it is necessary to prevent oxidation of copper during machining, and therefore, by adding The fatty acid is pulverized in the air or in an inert gas atmosphere to be processed into a flat shape. However, there is a case where oxidation cannot be completely prevented, or there is a case where dispersibility is affected when the fatty acid added during processing is gelatinized, and therefore it is necessary to remove it after the completion of the processing, but the fatty acid is firmly fixed by the force during machining. When it is fixed on the copper surface, there is a problem that it cannot be completely removed.

相對於此,構成本實施形態之樹枝狀覆銀銅粉之平板狀銅粒子1係不進行機械加工,直接成長為樹枝狀銅粉之形狀而製作,故而無需防止於機械加工中成為問題之氧化之產生或去除脂肪酸,可使電氣導電性之特性成為極其良好之狀態。 On the other hand, the tabular copper particles 1 constituting the dendritic silver-coated copper powder of the present embodiment are produced by directly growing into the shape of dendritic copper powder without mechanical processing, so that it is not necessary to prevent oxidation which is a problem in machining. The generation or removal of fatty acids makes the electrical conductivity characteristics extremely excellent.

又,本實施形態之樹枝狀覆銀銅粉並無特別限定,較佳為將上述平板狀銅粒子1之剖面平均厚度除以該覆銀銅粉之平均粒徑(D50)所得之比(剖面平均厚度/平均粒徑)為超過0.01且在5.0以下之範圍。 Further, the dendritic silver-coated copper powder of the present embodiment is not particularly limited, and is preferably a ratio obtained by dividing the average thickness of the flat copper particles 1 by the average particle diameter (D50) of the silver-coated copper powder (profile). The average thickness/average particle diameter is in the range of more than 0.01 and not more than 5.0.

以「剖面平均厚度/平均粒徑」表示之比(縱橫比)例如成為加工為導電性銅糊時之凝集程度或分散性、或是銅糊之塗佈時之外觀形狀之保持性等之指標。若該縱橫比超過5.0,則變得近似於由球狀之銅粒子構成之銅粉,由面接點所產生之效果消失。另一方面,若縱橫比為0.01以下,則存在如下情形:於糊化時黏性變高,該銅糊之塗佈時外觀形狀之保持性或表面平滑性劣化。 The ratio (aspect ratio) expressed by the "average cross-sectional average thickness / average particle diameter" is, for example, an index of the degree of aggregation or dispersibility when processed into a conductive copper paste, or the retention of the appearance shape at the time of application of a copper paste. . When the aspect ratio exceeds 5.0, the copper powder composed of spherical copper particles is obtained, and the effect by the surface contact disappears. On the other hand, when the aspect ratio is 0.01 or less, there is a case where the viscosity is high at the time of gelatinization, and the shape retainability or surface smoothness at the time of application of the copper paste is deteriorated.

又,作為本實施形態之樹枝狀覆銀銅粉之體密度,並無特別限定,較佳為0.5g/cm3~5.0g/cm3之範圍。若體密度未達0.5g/cm3,則 存在無法充分確保覆銀銅粉彼此之接點之可能性。另一方面,若體密度超過5.0g/cm3,則存在如下情形:覆銀銅粉之平均粒徑亦變大,於是表面積變小而成形性或燒結性劣化。 Further, the bulk density of the dendritic silver-coated copper powder of the present embodiment is not particularly limited, but is preferably in the range of 0.5 g/cm 3 to 5.0 g/cm 3 . If the bulk density is less than 0.5 g/cm 3 , there is a possibility that the contact between the silver-coated copper powders cannot be sufficiently ensured. On the other hand, when the bulk density is more than 5.0 g/cm 3 , the average particle diameter of the silver-coated copper powder is also increased, so that the surface area is small and the formability or sinterability is deteriorated.

再者,於利用電子顯微鏡進行觀察時,若如上所述之形狀之樹枝狀覆銀銅粉以特定之比率佔據於所獲得之覆銀銅粉中,則即便混入有該樹枝狀覆銀銅粉以外之形狀之銅粉,亦可獲得與僅由該樹枝狀覆銀銅粉構成之覆銀銅粉相同之效果。具體而言,於利用電子顯微鏡(例如500倍~20,000倍)進行觀察時,只要上述形狀之樹枝狀覆銀銅粉佔據總覆銀銅粉個數中之80%以上、較佳為90%以上之比率,則亦可包含其他形狀之覆銀銅粉。 Further, when observed by an electron microscope, if the dendritic silver-coated copper powder having the shape as described above is occupied by the obtained silver-coated copper powder at a specific ratio, even if the dendritic silver-coated copper powder is mixed therein Copper powder of a shape other than the same can also obtain the same effect as the silver-coated copper powder composed only of the dendritic silver-coated copper powder. Specifically, when observed by an electron microscope (for example, 500 times to 20,000 times), the dendritic silver-coated copper powder having the above shape accounts for 80% or more, preferably 90% or more of the total silver-coated copper powder. The ratio may also include silver-coated copper powder of other shapes.

《2.銀被覆量》 "2. Silver Coverage"

如上所述,本實施形態之樹枝狀覆銀銅粉係由剖面平均厚度超過1.0μm且在5.0μm以下之平板狀、且於表面被覆有銀的銅粒子1構成為樹枝狀者。以下,對於對覆銀銅粉之表面之銀被覆進行說明。 As described above, the dendritic silver-coated copper powder of the present embodiment is formed of a dendritic shape in which the copper particles 1 having a plate-like average thickness of more than 1.0 μm and a thickness of 5.0 μm or less and having silver coated on the surface thereof are formed into a dendritic shape. Hereinafter, the silver coating on the surface of the silver-coated copper powder will be described.

本實施形態之樹枝狀覆銀銅粉,係較佳為以相對於經銀被覆之該覆銀銅粉整體之質量100%為1質量%~50質量%之比率,對被覆銀前之樹枝狀銅粉被覆銀者,且就銀之厚度(被覆厚度)而言為0.15μm以下之極薄之被膜。根據該情形,樹枝狀覆銀銅粉成為依舊保持被覆銀前之樹枝狀銅粉之形狀的形狀。 The dendritic silver-coated copper powder of the present embodiment is preferably a dendritic layer coated with silver at a ratio of 100% by mass to 50% by mass based on 100% by mass of the total silver-coated copper powder coated with silver. The copper powder is coated with silver, and the thickness of the silver (coating thickness) is an extremely thin film of 0.15 μm or less. According to this case, the dendritic silver-coated copper powder has a shape that remains in the shape of the dendritic copper powder before the silver coating.

如上所述,樹枝狀覆銀銅粉中之銀之被覆量較佳為相對於經銀被覆之該覆銀銅粉整體之質量100%為1質量%~50質量%之範圍。銀之被覆量就成本之觀點而言,較佳為儘可能地少,但若過少則無法於銅粉表 面確保均勻之銀之被膜,從而成為導電性之下降之原因。因此,作為銀之被覆量,較佳為相對於經銀被覆之該覆銀銅粉整體之質量100%為1質量%以上,更佳為5質量%以上,進而較佳為10質量%以上。 As described above, the coating amount of silver in the dendritic silver-coated copper powder is preferably in the range of 1% by mass to 50% by mass based on 100% by mass of the entire silver-coated copper powder coated with silver. The amount of silver covered is preferably as small as possible from the viewpoint of cost, but if it is too small, it cannot be used in copper powder. The surface ensures a uniform silver film, which causes a decrease in conductivity. Therefore, the amount of silver coating is preferably 1% by mass or more, more preferably 5% by mass or more, and still more preferably 10% by mass or more based on 100% by mass of the silver-coated copper powder coated with silver.

另一方面,若銀之被覆量變多,則就成本之觀點而言欠佳,作為銀之被覆量,較佳為相對於經銀被覆之該覆銀銅粉整體之質量100%為50質量%以下,更佳為30質量%以下,進而較佳為20質量%以下。 On the other hand, if the amount of coating of silver is increased, it is not preferable from the viewpoint of cost, and the amount of silver coated is preferably 50% by mass based on 100% by mass of the silver-coated copper powder coated with silver. Hereinafter, it is more preferably 30% by mass or less, further preferably 20% by mass or less.

又,於本實施形態之樹枝狀覆銀銅粉中,作為被覆於樹枝狀銅粉之表面之銀的平均厚度,為0.0003μm~0.15μm左右,較佳為0.005μm~0.05μm。若銀之被覆厚度平均未達0.0003μm,則無法於銅粉之表面確保均勻之銀之被覆,又,成為導電性之下降之原因。另一方面,若銀之被覆厚度平均超過0.15μm,則就成本之觀點而言欠佳。 Further, in the dendritic silver-coated copper powder of the present embodiment, the average thickness of the silver coated on the surface of the dendritic copper powder is about 0.0003 μm to 0.15 μm, preferably 0.005 μm to 0.05 μm. If the coating thickness of silver is less than 0.0003 μm on average, it is impossible to ensure uniform silver coating on the surface of the copper powder, and this causes a decrease in conductivity. On the other hand, if the coating thickness of silver exceeds 0.15 μm on average, it is not preferable from the viewpoint of cost.

如上所述般被覆於樹枝狀銅粉之表面之銀之平均厚度為0.0003μm~0.15μm左右,小於構成樹枝狀銅粉之平板狀銅粒子1之剖面平均厚度(0.5μm~5.0μm)。因此,於以銀被覆樹枝狀銅粉之表面前後,平板狀銅粒子之剖面平均厚度實質上不會發生變化。 The average thickness of silver coated on the surface of the dendritic copper powder as described above is about 0.0003 μm to 0.15 μm, which is smaller than the average cross-sectional thickness (0.5 μm to 5.0 μm) of the tabular copper particles 1 constituting the dendritic copper powder. Therefore, the average thickness of the cross-section of the tabular copper particles does not substantially change until the surface of the dendritic copper powder is coated with silver.

又,關於本實施形態之樹枝狀覆銀銅粉,其BET比表面積之值較佳為0.2m2/g~3.0m2/g,但並無特別限定。若BET比表面積值未達0.2m2/g,則存在被覆有銀之銅粒子1無法成為如上所述之所期望之形狀的情形,存在無法獲得高導電性之情形。另一方面,若BET比表面積值超過3.0m2/g,則存在樹枝狀覆銀銅粉之表面之銀被覆變得不均勻而無法獲得較高之導電性之可能性。又,存在構成覆銀銅粉之銅粒子1變得過細,覆銀銅粉成為較細之鬚狀之狀態而導電性下降的情形。再者,BET比表面 積可依據JIS Z8830:2013而測定。 Moreover, silver coated copper on the dendritic shape of the present embodiment, the BET specific surface area value is preferably 0.2m 2 /g~3.0m 2 / g, but is not particularly limited. When the BET specific surface area value is less than 0.2 m 2 /g, the copper particles 1 coated with silver may not have the desired shape as described above, and high conductivity may not be obtained. On the other hand, when the BET specific surface area value exceeds 3.0 m 2 /g, the silver coating on the surface of the dendritic silver-coated copper powder may become uneven, and high conductivity may not be obtained. In addition, the copper particles 1 constituting the silver-coated copper powder are too fine, and the silver-coated copper powder is in a state of being finer, and the conductivity is lowered. Further, the BET specific surface area can be measured in accordance with JIS Z8830:2013.

《3.覆銀銅粉之製造方法》 "3. Method for manufacturing silver-coated copper powder"

其次,對本實施形態之樹枝狀覆銀銅粉之製造方法進行說明。以下,首先對構成樹枝狀覆銀銅粉之樹枝狀銅粉之製造方法進行說明,繼而,對於對該樹枝狀銅粉被覆銀而獲得樹枝狀覆銀銅粉之方法進行說明。 Next, a method of producing the dendritic silver-coated copper powder of the present embodiment will be described. Hereinafter, a method for producing a dendritic copper powder constituting a dendritic silver-coated copper powder will be described. Next, a method of obtaining dendritic silver-coated copper powder by coating silver with the dendritic copper powder will be described.

<3-1.樹枝狀銅粉之製造方法> <3-1. Method for producing dendritic copper powder>

被覆銀前之樹枝狀銅粉例如可將含有銅離子之硫酸酸性溶液用作電解液,藉由特定之電解法而製造。 The dendritic copper powder before the coating of silver can be produced, for example, by using an acidic solution of sulfuric acid containing copper ions as an electrolytic solution by a specific electrolytic method.

於進行電解時,例如,於將金屬銅設置為陽極(anode)且將不鏽鋼板或鈦板等設置為陰極(cathode)之電解槽中收容含有銅離子之硫酸酸性之電解液,以特定之電流密度向該電解液通入直流電流,藉此實施電解處理。藉此,伴隨通電,可使樹枝狀銅粉析出(電沈積)至陰極上。特別是於本實施形態中,可不使用球等介質機械性地對藉由電解而獲得之粒狀等之銅粉進行變形加工等,而僅藉由該電解使平板狀銅粒子1集合而形成樹枝狀之樹枝狀銅粉析出至陰極表面。 In the electrolysis, for example, an electrolytic solution containing copper ions and containing a copper ion is placed in an electrolytic cell in which a metal copper is an anode and a stainless steel plate or a titanium plate is provided as a cathode, to a specific current. The density is passed through a direct current to the electrolyte, whereby electrolytic treatment is performed. Thereby, dendritic copper powder can be deposited (electrodeposited) onto the cathode with energization. In particular, in the present embodiment, the copper powder such as the granular material obtained by electrolysis can be mechanically deformed without using a medium such as a ball, and the flat copper particles 1 can be collectively formed by the electrolysis to form a branch. The dendritic copper powder precipitates to the surface of the cathode.

更具體而言,作為電解液,例如可使用含有水溶性銅鹽、硫酸、胺化合物等添加劑、及氯化物離子者。 More specifically, as the electrolytic solution, for example, an additive such as a water-soluble copper salt, sulfuric acid or an amine compound, or a chloride ion can be used.

水溶性銅鹽為供給銅離子之銅離子源,例如可列舉硫酸銅五水合物等硫酸銅、氯化銅、硝酸銅等,但並無特別限定。又,作為電解液中之銅離子濃度,可設為1g/L~20g/L左右,較佳為可設為2g/L~10g/L左右。 The water-soluble copper salt is a copper ion source to which copper ions are supplied, and examples thereof include copper sulfate such as copper sulfate pentahydrate, copper chloride, copper nitrate, and the like, but are not particularly limited. Further, the concentration of copper ions in the electrolytic solution may be about 1 g/L to 20 g/L, and preferably about 2 g/L to 10 g/L.

硫酸係用以製成硫酸酸性之電解液者。關於電解液中之硫酸 之濃度,作為游離硫酸濃度,可設為20g/L~300g/L左右,較佳為可設為50g/L~200g/L左右。該硫酸濃度對電解液之導電度產生影響,故而對在陰極上獲得之銅粉之均勻性產生影響。 Sulfuric acid is used to make an acid electrolyte of sulfuric acid. About sulfuric acid in the electrolyte The concentration can be set to about 20 g/L to 300 g/L as the free sulfuric acid concentration, and preferably about 50 g/L to 200 g/L. The concentration of sulfuric acid has an influence on the conductivity of the electrolyte, and thus affects the uniformity of the copper powder obtained on the cathode.

作為添加劑,例如可使用胺化合物。該胺化合物與下述之氯化物離子皆有助於析出之銅粉之形狀控制,可將析出至陰極表面之銅粉製成「由具有樹枝狀形狀且呈特定之剖面平均厚度之平板狀之銅粒子構成」之具有主幹及多個枝的樹枝狀銅粉。 As the additive, for example, an amine compound can be used. The amine compound and the chloride ions described below all contribute to the shape control of the precipitated copper powder, and the copper powder deposited on the surface of the cathode can be made into a flat plate having a dendritic shape and having a specific average thickness of the section. The copper particles constitute a dendritic copper powder having a trunk and a plurality of branches.

作為胺化合物,例如可使用番紅O(3,7-二胺基-2,8-二甲基-5-苯基-5-氯化啡鎓、C20H19N4Cl、CAS編號:477-73-64)等。再者,作為胺化合物,可單獨添加1種,亦可併用2種以上而添加。又,作為胺化合物類之添加量,較佳設為電解液中之濃度成為超過50mg/L且在500mg/L以下之範圍之量,更佳設為成為100mg/L~400mg/L之範圍之量。 As the amine compound, for example, Safranin O (3,7-diamino-2,8-dimethyl-5-phenyl-5-chloromorph) can be used. 鎓, C 20 H 19 N 4 Cl, CAS number: 477-73-64), and the like. In addition, as the amine compound, one type may be added alone or two or more types may be used in combination. In addition, the amount of the amine compound to be added is preferably such that the concentration in the electrolytic solution exceeds 50 mg/L and is in the range of 500 mg/L or less, and more preferably ranges from 100 mg/L to 400 mg/L. the amount.

作為氯化物離子,可藉由在電解液中添加鹽酸、氯化鈉等供給氯化物離子之化合物(氯化物離子源)而含有。氯化物離子與上述胺化合物等添加劑皆有助於析出之銅粉之形狀控制。作為電解液中之氯化物離子濃度,並無特別限定,可設為1mg/L~1000mg/L左右,較佳為可設為10mg/L~500mg/L左右。 The chloride ion can be contained by adding a compound (chloride ion source) to which chloride ions are supplied, such as hydrochloric acid or sodium chloride, to the electrolytic solution. Additives such as chloride ions and the above amine compounds contribute to the shape control of the precipitated copper powder. The concentration of the chloride ion in the electrolytic solution is not particularly limited, and may be about 1 mg/L to 1000 mg/L, and preferably about 10 mg/L to 500 mg/L.

於該樹枝狀銅粉之製造方法中,例如係藉由使用如上所述之組成之電解液進行電解,而使銅粉析出產生於陰極上而製造。作為電解方法,可使用公知之方法。例如,作為電流密度,於使用硫酸酸性之電解液進行電解時,較佳設為5A/dm2~30A/dm2之範圍,一面攪拌電解液一面 通電。又,作為電解液之液溫(浴溫),例如可設為20℃~60℃左右。 In the method for producing the dendritic copper powder, for example, electrolysis is carried out using an electrolytic solution having a composition as described above, and copper powder is precipitated and produced on the cathode. As the electrolysis method, a known method can be used. For example, when the electrolysis is performed using an electrolyte having a sulfuric acid acidity as the current density, it is preferably in the range of 5 A/dm 2 to 30 A/dm 2 and is energized while stirring the electrolytic solution. Further, the liquid temperature (bath temperature) of the electrolytic solution can be, for example, about 20 ° C to 60 ° C.

<3-2.銀之被覆方法(覆銀銅粉之製造)> <3-2. Silver coating method (manufacturing of silver-coated copper powder)>

本實施形態之樹枝狀覆銀銅粉可藉由如下方式製造:例如使用還原型無電解鍍敷法或置換型無電解鍍敷法,於上述藉由電解法而製作之樹枝狀銅粉之表面被覆銀。 The dendritic silver-coated copper powder of the present embodiment can be produced by, for example, using a reduced electroless plating method or a replacement electroless plating method on the surface of the dendritic copper powder produced by the above electrolysis method. Covered with silver.

為了於樹枝狀銅粉之表面以均勻之厚度被覆銀,較佳為於鍍銀前進行洗淨,可使樹枝狀銅粉分散於洗淨液中並一面進行攪拌一面進行洗淨。作為該洗淨處理,較佳為於酸性溶液中進行,更佳為使用下述之“亦可被用於還原劑”之多元羧酸。於洗淨後,適當地重複樹枝狀銅粉之過濾、分離、及水洗而製成於水中分散有樹枝狀銅粉之水漿料。再者,過濾、分離、及水洗只要使用公知之方法即可。 In order to coat the surface of the dendritic copper powder with a uniform thickness, it is preferable to wash it before silver plating, and to disperse the dendritic copper powder in the cleaning liquid and wash it while stirring. The washing treatment is preferably carried out in an acidic solution, and more preferably a polycarboxylic acid which can be used as a reducing agent as described below. After washing, the dendritic copper powder was appropriately filtered, separated, and washed with water to prepare a water slurry in which dendritic copper powder was dispersed in water. Further, filtration, separation, and water washing may be carried out by using a known method.

具體而言,於藉由還原型無電解鍍敷法而進行覆銀之情形時,可藉由向於洗淨樹枝狀銅粉後獲得之水漿料添加還原劑及銀離子溶液,而於樹枝狀銅粉之表面被覆銀。此處,藉由於預先將還原劑添加於水漿料並分散後,連續地向該含還原劑及樹枝狀銅粉之水漿料添加銀離子溶液,可於樹枝狀銅粉之表面更均勻地被覆銀。 Specifically, when silver plating is performed by a reduced electroless plating method, a reducing agent and a silver ion solution may be added to the water slurry obtained by washing the dendritic copper powder, and the branches are applied to the branches. The surface of the copper powder is covered with silver. Here, by adding a reducing agent to the water slurry and dispersing it in advance, a silver ion solution is continuously added to the water slurry containing the reducing agent and the dendritic copper powder, so that the surface of the dendritic copper powder can be more uniformly Covered with silver.

作為還原劑,可使用各種還原劑,較佳為無法使銅之錯離子還原之還原力較弱之還原劑。作為該還原力較弱之還原劑,可使用還原性有機化合物,例如可使用碳水化合物類、多元羧酸及其鹽、醛類等。更具體而言,可列舉葡萄糖(glucose)、乳酸、草酸、酒石酸、蘋果酸、丙二酸、乙醇酸、酒石酸鉀鈉、福馬林等。 As the reducing agent, various reducing agents can be used, and a reducing agent which is incapable of reducing the dislocation ion of copper and having a weak reducing power is preferable. As the reducing agent having a weak reducing power, a reducing organic compound can be used, and for example, a carbohydrate, a polyvalent carboxylic acid, a salt thereof, an aldehyde or the like can be used. More specifically, glucose, lactic acid, oxalic acid, tartaric acid, malic acid, malonic acid, glycolic acid, sodium potassium tartrate, and fumarin can be mentioned.

較佳為於向含樹枝狀銅粉之水漿料添加還原劑後,為了充分 地使還原劑分散而進行攪拌等。又,為了將水漿料調整為所期望之pH值,可適當地添加酸或鹼。進而,亦可藉由添加醇等水溶性有機溶劑而促進作為還原劑之還原性有機化合物之分散。 Preferably, after adding a reducing agent to the water slurry containing the dendritic copper powder, in order to fully The reducing agent is dispersed and stirred or the like. Further, in order to adjust the water slurry to a desired pH value, an acid or a base may be appropriately added. Further, dispersion of the reducing organic compound as a reducing agent can be promoted by adding a water-soluble organic solvent such as an alcohol.

作為連續地添加之銀離子溶液,可使用公知者作為鍍銀液,但其中較佳為使用硝酸銀溶液。又,硝酸銀溶液就容易錯合而言,更佳為以氨性硝酸銀溶液之形式添加。再者,用於氨性硝酸銀溶液之氨只要使用如下方法中之任一方法即可,該等方法包含:添加至硝酸銀溶液;預先連同還原劑一併添加至水漿料並分散;作為與硝酸銀溶液分開之氨溶液同時添加至水漿料;或該等之組合。 As the silver ion solution to be continuously added, a known one can be used as the silver plating solution, but among them, a silver nitrate solution is preferably used. Further, in the case where the silver nitrate solution is easily misaligned, it is more preferably added in the form of an ammoniacal silver nitrate solution. Further, the ammonia used in the ammoniacal silver nitrate solution may be any one of the following methods, including: adding to the silver nitrate solution; adding to the aqueous slurry together with the reducing agent and dispersing; as the silver nitrate The ammonia solution in which the solution is separated is simultaneously added to the water slurry; or a combination of the above.

銀離子溶液例如於添加入含樹枝狀銅粉及還原劑之水漿料時,較佳為以相對較緩慢之速度緩緩添加,藉此可於樹枝狀銅粉之表面形成均勻之厚度之銀被膜。又,為了提高被膜之厚度之均勻性,更佳為將添加之速度設為固定。進而,亦可利用其他溶液調整預先添加於水漿料之還原劑等,並連同銀離子溶液一併以追加之形式緩緩添加。 The silver ion solution is preferably added at a relatively slow rate, for example, when added to a water slurry containing dendritic copper powder and a reducing agent, thereby forming a uniform thickness of silver on the surface of the dendritic copper powder. Membrane. Further, in order to increase the uniformity of the thickness of the film, it is more preferable to set the speed of the addition to be constant. Further, the reducing agent or the like previously added to the aqueous slurry may be adjusted by using another solution, and may be added in an additional form together with the silver ion solution.

如此,可藉由將添加有銀離子溶液等之水漿料過濾、分離並進行水洗,此後使其乾燥而獲得樹枝狀覆銀銅粉。作為該等過濾以後之處理手段,並無特別限定,只要使用公知之方法即可。 In this manner, the aqueous slurry to which the silver ion solution or the like is added is filtered, separated, and washed with water, and then dried to obtain dendritic silver-coated copper powder. The processing means after the filtration is not particularly limited, and any known method can be used.

另一方面,藉由置換型無電解鍍敷法而進行覆銀之方法,係利用銅與銀之離子化傾向之差異者,且藉由在溶液中溶解銅時產生之電子,使溶液中之銀離子還原而析出至銅表面。因此,置換型無電解鍍銀液只要以作為銀離子源之銀鹽、錯合劑、及傳導鹽為主要成分構成,則可實現覆銀,但為了更均勻地進行覆銀,可視需要添加界面活性劑、光澤劑、 結晶調整劑、pH值調整劑、沈澱防止劑、穩定劑等。於本實施形態之覆銀銅粉之製造中,作為該鍍敷液,亦無特別限定。 On the other hand, a method of performing silver coating by a substitution type electroless plating method utilizes a difference in ionization tendency between copper and silver, and causes electrons generated by dissolving copper in a solution to cause a solution in the solution. Silver ions are reduced and precipitated onto the copper surface. Therefore, the replacement electroless silver plating solution can be silver-plated as long as it is composed of a silver salt, a coupling agent, and a conductive salt as a silver ion source. However, in order to more uniformly perform silver coating, it is necessary to add an interface activity as needed. Agent, brightener, A crystal modifier, a pH adjuster, a precipitation inhibitor, a stabilizer, and the like. In the production of the silver-coated copper powder of the present embodiment, the plating solution is not particularly limited.

更具體而言,作為銀鹽,可使用硝酸銀、碘化銀、硫酸銀、甲酸銀、乙酸銀、乳酸銀等,可與分散於水漿料中之樹枝狀銅粉反應。作為鍍敷液中之銀離子濃度,可設為1g/L~10g/L左右。 More specifically, as the silver salt, silver nitrate, silver iodide, silver sulfate, silver formate, silver acetate, silver lactate or the like can be used, and it can be reacted with dendritic copper powder dispersed in a water slurry. The silver ion concentration in the plating solution can be set to about 1 g/L to 10 g/L.

又,錯合劑係與銀離子形成錯合物者,作為代表性者,可使用檸檬酸、酒石酸、乙二胺四乙酸、氮基三乙酸等、或乙二胺、甘胺酸、乙內醯脲、吡咯啶酮、丁二醯亞胺等含N之化合物、羥基亞乙基二膦酸、胺基三亞甲基膦酸、巰基丙酸、硫甘醇、硫胺脲等。作為鍍敷液中之錯合劑之濃度,可設為10g/L~100g/L左右。 Further, the complexing agent is a complex compound with silver ions, and as a representative, citric acid, tartaric acid, ethylenediaminetetraacetic acid, nitrogen triacetic acid, or the like, or ethylenediamine, glycine, and acetylene can be used. An N-containing compound such as urea, pyrrolidone or butylimine, hydroxyethylidene diphosphonic acid, aminotrimethylenephosphonic acid, mercaptopropionic acid, thioglycol, thiamine or the like. The concentration of the complexing agent in the plating solution can be set to about 10 g/L to 100 g/L.

又,作為傳導鹽,可使用硝酸、硼酸、磷酸等無機酸、檸檬酸、順丁烯二酸、酒石酸、鄰苯二甲酸等有機酸、或其等之鈉、鉀、銨鹽等。作為鍍敷液中之傳導鹽之濃度,可設為5g/L~50g/L左右。 Further, as the conductive salt, an inorganic acid such as nitric acid, boric acid or phosphoric acid, an organic acid such as citric acid, maleic acid, tartaric acid or phthalic acid, or a sodium, potassium or ammonium salt thereof may be used. The concentration of the conductive salt in the plating solution can be set to about 5 g/L to 50 g/L.

於樹枝狀銅粉之表面被覆銀時被覆量之控制例如可藉由改變置換型無電解鍍敷液之銀之投入量而控制。又,為了提高被膜之厚度之均勻性,較佳為將添加之速度設為固定。 The control of the amount of coating when the surface of the dendritic copper powder is coated with silver can be controlled, for example, by changing the amount of silver input to the replacement electroless plating solution. Moreover, in order to improve the uniformity of the thickness of the film, it is preferable to set the speed of addition to be fixed.

如此,可藉由將反應結束後之漿料過濾、分離並進行水洗,此後使其乾燥而獲得樹枝狀覆銀銅粉。作為該等過濾以後之處理手段,並無特別限定,只要使用公知之方法即可。 Thus, the slurry after completion of the reaction can be filtered, separated, and washed with water, and then dried to obtain dendritic silver-coated copper powder. The processing means after the filtration is not particularly limited, and any known method can be used.

《4.導電性糊、電磁波屏蔽用導電性塗料、導電性片之用途》 "4. Conductive paste, conductive paint for electromagnetic wave shielding, and use of conductive sheet"

如上所述,本實施形態之樹枝狀覆銀銅粉係具有主幹及自該主幹分支之多個枝之樹枝狀覆銀銅粉,如圖1之示意圖所示般為如下之經銀被覆之 平板狀銅粒子集合而構成,該經銀被覆之平板狀銅粒子成長為樹枝狀之具有主幹2及自該主幹2分支之多個枝3之形狀,且剖面平均厚度超過1.0μm且在5.0μm以下。而且,該樹枝狀覆銀銅粉之平均粒徑(D50)為1.0μm~100μm。此種樹枝狀覆銀銅粉因呈樹枝狀之形狀而表面積變大,成為成形性或燒結性優異者,又,因特定之剖面平均厚度之平板狀銅粒子集合而構成為樹枝狀,可較多地確保接點之數量,發揮優異之導電性。 As described above, the dendritic silver-coated copper powder of the present embodiment has a trunk and a plurality of dendritic silver-coated copper powders from the main branches, and is silver-coated as shown in the schematic view of Fig. 1 The flat copper particles are aggregated, and the silver-coated flat copper particles grow into a dendritic shape having a trunk 2 and a plurality of branches 3 from the trunk 2, and the average thickness of the cross section exceeds 1.0 μm and is 5.0 μm. the following. Further, the dendritic silver-coated copper powder has an average particle diameter (D50) of 1.0 μm to 100 μm. The dendritic silver-coated copper powder has a large surface area due to a dendritic shape, and is excellent in formability and sinterability, and is formed into a dendritic shape by a combination of flat copper particles having a specific average cross-sectional thickness. Multi-site ensures the number of joints and exerts excellent electrical conductivity.

又,根據此種具有特定之構造之樹枝狀覆銀銅粉,即便於製成銅糊等之情形時,亦可抑制凝集,從而可均勻地分散於樹脂中,又,可抑制因糊之黏度上升等引起之印刷性不良等之發生。因此,根據該樹枝狀覆銀銅粉,可較佳地用於導電性糊或導電塗料等用途。 Further, according to such a dendritic silver-coated copper powder having a specific structure, even when a copper paste or the like is formed, aggregation can be suppressed, and the resin can be uniformly dispersed in the resin, and the viscosity of the paste can be suppressed. The occurrence of poor printability caused by the rise or the like. Therefore, the dendritic silver-coated copper powder can be preferably used for applications such as conductive pastes and conductive coatings.

例如,導電性糊(銅糊),並不限定於在特別限定之條件下之使用,可藉由將本實施形態之樹枝狀覆銀銅粉作為金屬填料,與黏合劑樹脂、溶劑混練,進而,視需要與硬化劑或抗氧化劑、偶合劑、抗腐蝕劑等添加劑混練而製作。 For example, the conductive paste (copper paste) is not limited to use under particularly limited conditions, and the dendritic silver-coated copper powder of the present embodiment can be used as a metal filler, and kneaded with a binder resin or a solvent. It is prepared by mixing with hardeners or additives such as antioxidants, coupling agents, and anti-corrosion agents.

具體而言,作為黏合劑樹脂,並無特別限定,可使用先前使用者。例如,可使用環氧樹脂或酚樹脂、不飽和聚酯樹脂等。 Specifically, the binder resin is not particularly limited, and a prior user can be used. For example, an epoxy resin or a phenol resin, an unsaturated polyester resin, or the like can be used.

又,對於溶劑,亦可使用先前使用之乙二醇、二乙二醇、三乙二醇、甘油、松油醇、乙基卡必醇、卡必醇乙酸酯、丁基溶纖素等有機溶劑。又,作為該有機溶劑之添加量,並無特別限定,可以成為適於網版印刷或分注器等導電膜形成方法的黏度之方式,考慮樹枝狀覆銀銅粉之粒度而進行調整。 Further, as the solvent, an organic solvent such as ethylene glycol, diethylene glycol, triethylene glycol, glycerin, terpineol, ethyl carbitol, carbitol acetate, or butyl cellosolve may be used. . In addition, the amount of the organic solvent to be added is not particularly limited, and may be adjusted to the viscosity of the conductive film forming method such as screen printing or a dispenser, and the particle size of the dendritic silver-coated copper powder may be adjusted.

進而,為了調整黏度,亦可添加其他樹脂成分。例如,可列 舉以乙基纖維素為代表之纖維素系樹脂等,可以溶解於松油醇等有機溶劑之有機媒劑之形式添加。再者,作為該樹脂成分之添加量,需要抑制成不會阻礙燒結性之程度,較佳設為整體之5重量%以下。 Further, in order to adjust the viscosity, other resin components may be added. For example, can be listed A cellulose-based resin typified by ethyl cellulose or the like can be added as an organic vehicle dissolved in an organic solvent such as terpineol. In addition, the amount of the resin component to be added needs to be suppressed so as not to inhibit the sinterability, and is preferably 5% by weight or less of the whole.

又,作為添加劑,例如為了改善燒成後之導電性,可添加抗氧化劑等。作為抗氧化劑,並無特別限定,例如可列舉羥基羧酸等。更具體而言,較佳為檸檬酸、蘋果酸、酒石酸、乳酸等羥基羧酸,特佳為對銅之吸附力較高之檸檬酸或蘋果酸。作為抗氧化劑之添加量,可考慮抗氧化效果或糊之黏度等而設為例如1重量%~15重量%左右。 Moreover, as an additive, for example, in order to improve the electroconductivity after baking, an antioxidant etc. can be added. The antioxidant is not particularly limited, and examples thereof include a hydroxycarboxylic acid and the like. More specifically, a hydroxycarboxylic acid such as citric acid, malic acid, tartaric acid or lactic acid is preferred, and citric acid or malic acid having a high adsorption power to copper is particularly preferred. The amount of the antioxidant to be added is, for example, about 1% by weight to 15% by weight in consideration of the antioxidant effect, the viscosity of the paste, and the like.

又,關於硬化劑,亦可使用先前使用之2-乙基-4-甲基咪唑等。進而,關於腐蝕抑制劑,亦可使用先前使用之苯并噻唑、苯并咪唑等。 Further, as the curing agent, 2-ethyl-4-methylimidazole or the like which has been used in the past can also be used. Further, as the corrosion inhibitor, benzothiazole, benzimidazole or the like which has been previously used may also be used.

又,於將本實施形態之樹枝狀覆銀銅粉用作導電性糊用金屬填料之情形時,可混合其他形狀之銅粉或覆銀銅粉、進而混合鎳或錫等具有導電性之金屬填料而使用。此時,作為用作導電性糊之金屬填料總量中之樹枝狀覆銀銅粉之比率,較佳為20質量%以上,更佳為30質量%以上,進而較佳為40質量%以上。如上所述,於用作金屬填料之情形時,藉由連同本實施形態之樹枝狀覆銀銅粉一併混合其他形狀之銅粉等金屬填料,而於該樹枝狀覆銀銅粉之間隙填充其他形狀之銅粉,藉此,可更多地確保用以確保導電性之接點。又,其結果,亦可減少樹枝狀覆銀銅粉與其他形狀之銅粉之合計投入量。 Further, when the dendritic silver-coated copper powder of the present embodiment is used as a metal filler for a conductive paste, it is possible to mix copper powder or silver-coated copper powder of another shape, and further mix a conductive metal such as nickel or tin. Used as a filler. In this case, the ratio of the dendritic silver-coated copper powder in the total amount of the metal filler used as the conductive paste is preferably 20% by mass or more, more preferably 30% by mass or more, and still more preferably 40% by mass or more. As described above, when used as a metal filler, a metal filler such as copper powder of another shape is mixed together with the dendritic silver-coated copper powder of the present embodiment, and the gap between the dendritic silver-coated copper powder is filled. Copper powder of other shapes, whereby the joint for ensuring electrical conductivity can be more ensured. Further, as a result, the total amount of the input of the dendritic silver-coated copper powder and the copper powder of other shapes can be reduced.

若用作金屬填料之銅粉總量中之樹枝狀覆銀銅粉未達20質量%,則該樹枝狀覆銀銅粉彼此之接點減少,即便借助藉由與其他形狀之銅 粉混合實現之接點之增加,作為金屬填料而言導電性亦下降。 If the dendritic silver-coated copper powder in the total amount of the copper powder used as the metal filler is less than 20% by mass, the dendritic silver-coated copper powder is reduced in contact with each other even by means of copper with other shapes. The increase in the contact point achieved by the powder mixing also reduces the electrical conductivity as a metal filler.

可使用利用上述金屬填料製作之導電性糊形成各種電路。於該情形時,亦不限定於在特別限定之條件下之使用,可利用先前進行之電路圖案形成法等。例如,藉由將利用該金屬填料製作之導電性糊塗佈或印刷至燒成基板或未燒成基板,進行加熱後視需要進行加壓而硬化並燒接,可形成印刷配線板、或各種電子零件之電路或外部電極等。 Various circuits can be formed using the conductive paste made of the above metal filler. In this case, it is not limited to use under particularly limited conditions, and a circuit pattern forming method or the like which has been previously performed can be used. For example, a conductive paste prepared by using the metal filler is applied or printed on a fired substrate or an unfired substrate, and after heating, it is pressed, cured, and baked as necessary to form a printed wiring board or various electrons. The circuit of the part or the external electrode.

又,於利用上述金屬填料作為電磁波屏蔽用材料之情形時,亦不限定於在特別限定之條件下之使用,可使用通常之方法、例如將該金屬填料與樹脂混合而使用。 When the metal filler is used as the material for electromagnetic wave shielding, it is not limited to use under particularly limited conditions, and it can be used by, for example, mixing the metal filler with a resin by a usual method.

例如,於利用上述金屬填料作為電磁波屏蔽用導電性塗料之情形時,可藉由通常之方法、例如將該金屬填料與樹脂及溶劑混合,進而視需要與抗氧化劑、增黏劑、沈澱防止劑等混合並混練而用作導電性塗料。 For example, when the above-mentioned metal filler is used as the conductive coating material for electromagnetic wave shielding, it can be mixed with a resin and a solvent by a usual method, for example, and an antioxidant, a tackifier, and a precipitation inhibitor as needed. It is mixed and kneaded to be used as a conductive paint.

作為此時使用之黏合劑樹脂及溶劑,並無特別限定,可使用先前使用者。例如,作為黏合劑樹脂,可使用氯乙烯樹脂、乙酸乙烯酯樹脂、丙烯酸樹脂、聚酯樹脂、氟樹脂、矽樹脂、或酚樹脂等。又,關於溶劑,亦可使用先前使用之異丙醇等醇類、甲苯等芳香族烴類、乙酸甲酯等酯類、甲基乙基酮等酮類等。又,關於抗氧化劑,亦可使用先前使用之脂肪醯胺、高級脂肪酸胺、苯二胺衍生物、鈦酸酯系偶合劑等。 The binder resin and the solvent used at this time are not particularly limited, and the prior user can be used. For example, as the binder resin, a vinyl chloride resin, a vinyl acetate resin, an acrylic resin, a polyester resin, a fluororesin, an anthracene resin, or a phenol resin can be used. Further, as the solvent, an alcohol such as isopropyl alcohol or an aromatic hydrocarbon such as toluene, an ester such as methyl acetate or a ketone such as methyl ethyl ketone may be used. Further, as the antioxidant, a fatty amide, a higher fatty acid amine, a phenylenediamine derivative, a titanate coupling agent or the like which has been used in the past may be used.

又,於利用上述金屬填料作為電磁波屏蔽用導電性片之情形時,作為用於形成電磁波屏蔽用導電性片之電磁波屏蔽層之樹脂,並無特別限定,可使用先前使用者。例如,可適當地使用由氯乙烯樹脂、乙酸乙烯酯樹脂、偏二氯乙烯樹脂、丙烯酸樹脂、聚胺酯(polyurethane)樹脂、 聚酯樹脂、烯烴樹脂、氯化烯烴樹脂、聚乙烯醇系樹脂、醇酸樹脂、酚樹脂等各種聚合物及共聚物所構成之熱塑性樹脂、熱硬化性樹脂、放射線硬化型樹脂等。 In the case of using the above-mentioned metal filler as the conductive sheet for electromagnetic wave shielding, the resin for forming the electromagnetic wave shielding layer for the conductive sheet for electromagnetic wave shielding is not particularly limited, and the prior art can be used. For example, a vinyl chloride resin, a vinyl acetate resin, a vinylidene chloride resin, an acrylic resin, a polyurethane resin, or the like may be suitably used. A thermoplastic resin, a thermosetting resin, a radiation curable resin, or the like which is composed of various polymers and copolymers such as a polyester resin, an olefin resin, a chlorinated olefin resin, a polyvinyl alcohol resin, an alkyd resin, and a phenol resin.

作為電磁波屏蔽材之製造方法,並無特別限定,例如可藉由如下方式製造:藉由於基材上塗佈或印刷將金屬填料與樹脂分散或溶解於溶劑所得之塗料而形成電磁波屏蔽層,並使其乾燥至表面固化之程度。又,於導電性片之導電性接著劑層中,亦可利用含有本實施形態之樹枝狀覆銀銅粉之金屬填料。 The method for producing the electromagnetic wave shielding material is not particularly limited, and can be produced, for example, by forming an electromagnetic wave shielding layer by coating or printing a coating material obtained by dispersing or dissolving a metal filler and a resin in a solvent on a substrate. Allow it to dry to the extent that the surface cures. Further, a metal filler containing the dendritic silver-coated copper powder of the present embodiment may be used in the conductive adhesive layer of the conductive sheet.

[實施例] [Examples]

以下,將本發明之實施例與比較例一併表示而進一步具體地進行說明,但本發明不受以下之實施例之任何限定。 Hereinafter, the examples of the present invention will be specifically described together with the comparative examples, but the present invention is not limited to the following examples.

《評價方法》 Evaluation Method

對於在下述實施例、比較例中獲得之覆銀銅粉,藉由以下之方法而進行形狀之觀察、平均粒徑之測定等。 With respect to the silver-coated copper powder obtained in the following examples and comparative examples, the shape observation, the measurement of the average particle diameter, and the like were carried out by the following methods.

(形狀之觀察) (observation of shape)

藉由掃描式電子顯微鏡(日本電子股份有限公司製造,JSM-7100F型),以特定之倍率之視域任意地觀察20個視域,觀察該視域內所含之銅粉之外觀。 By scanning electron microscopy (manufactured by JEOL Ltd., model JSM-7100F), 20 fields of view were arbitrarily observed at a specific magnification, and the appearance of the copper powder contained in the field of view was observed.

(平均粒徑之測定) (Measurement of average particle size)

平均粒徑(D50)係使用雷射繞射-散射法粒度分佈測定器(日機裝股份有限公司製造,HRA9320 X-100)測定。 The average particle diameter (D50) was measured using a laser diffraction-scattering particle size distribution analyzer (manufactured by Nikkiso Co., Ltd., HRA9320 X-100).

(縱橫比之測定) (measurement of aspect ratio)

將所獲得之覆銀銅粉埋入至環氧樹脂而製作測定試樣,對該試樣進行切斷、研磨,並利用掃描式電子顯微鏡進行觀察,藉此觀察覆銀銅粉之剖面。更具體而言,觀察20個銅粉,求出該銅粉之平均厚度(剖面平均厚度),根據該剖面平均厚度之值與利用雷射繞射-散射法粒度分佈測定器求出之平均粒徑(D50)之比,求出縱橫比(剖面平均厚度/D50)。 The obtained silver-coated copper powder was embedded in an epoxy resin to prepare a measurement sample, and the sample was cut, polished, and observed by a scanning electron microscope to observe the cross section of the silver-coated copper powder. More specifically, 20 copper powders were observed, and the average thickness (sectional average thickness) of the copper powder was determined, and the average thickness of the cross-section and the average particle obtained by the laser diffraction-scattering particle size analyzer were determined. The aspect ratio (d50) is obtained by the ratio of the diameter (D50).

(BET比表面積) (BET specific surface area)

BET比表面積係使用比表面積-細孔分佈測定裝置(Quantachrome公司製造,QUADRASORB SI)測定。 The BET specific surface area was measured using a specific surface area-pore distribution measuring apparatus (manufactured by Quantachrome, QUADRASORB SI).

(比電阻值測定) (measured by specific resistance value)

被膜之比電阻值係藉由如下方式求出:使用低電阻率計(三菱化學股份有限公司製造,Loresta-GP MCP-T600),藉由四端子法測定薄片電阻值,利用表面粗糙度形狀測定器(東京精密股份有限公司製造,SURFCO M130A)測定被膜之膜厚,並將薄片電阻值除以膜厚。 The specific resistance value of the film was determined by measuring the sheet resistance value by a four-terminal method using a low-resistivity meter (Loresta-GP MCP-T600, manufactured by Mitsubishi Chemical Corporation), and measuring the surface roughness. The film thickness (manufactured by Tokyo Precision Co., Ltd., SURFCO M130A) was measured, and the sheet resistance was divided by the film thickness.

(電磁波屏蔽特性) (Electromagnetic wave shielding characteristics)

電磁波屏蔽特性之評價係對於在各實施例及比較例中獲得之試樣使用頻率為1GHz之電磁波測定其衰減率而評價。具體而言,將未使用樹枝狀覆銀銅粉之比較例4之情形時之等級評價為『△』,將差於該比較例4之等級之情形評價為『×』,將較該比較例4之等級良好之情形評價為『○』,將進而優異之情形評價為『◎』。 The evaluation of the electromagnetic wave shielding characteristics was evaluated by measuring the attenuation rate of the electromagnetic wave having a frequency of 1 GHz using the sample obtained in each of the examples and the comparative examples. Specifically, the grade in the case of Comparative Example 4 in which the dendritic silver-coated copper powder was not used was evaluated as "△", and the case where the grade was inferior to the level of Comparative Example 4 was evaluated as "X", which would be compared with the comparative example. The case where the level of 4 is good is evaluated as "○", and the case of being excellent is evaluated as "◎".

又,為了亦對電磁波屏蔽之可撓性進行評價,將所製作之電磁波屏蔽彎折而確認電磁波屏蔽特性是否發生變化。 Moreover, in order to evaluate the flexibility of the electromagnetic wave shield, the electromagnetic wave shield thus produced was bent to confirm whether or not the electromagnetic wave shielding characteristics were changed.

《實施例、比較例》 "Examples, Comparative Examples"

[實施例1] [Example 1]

<樹枝狀銅粉之製造> <Manufacture of dendritic copper powder>

於容量為100L之電解槽,將電極面積為200mm×200mm之鈦製之電極板用作陰極,將電極面積為200mm×200mm之銅製之電極板用作陽極,將電解液裝入至該電解槽中,於其中通入直流電流而使銅粉(樹枝狀銅粉)析出至陰極板上。 In an electrolytic cell having a capacity of 100 L, an electrode plate made of titanium having an electrode area of 200 mm × 200 mm was used as a cathode, and an electrode plate made of copper having an electrode area of 200 mm × 200 mm was used as an anode, and an electrolytic solution was charged into the electrolytic cell. A copper current (dendritic copper powder) is deposited on the cathode plate by applying a direct current thereto.

此時,作為電解液,使用銅離子濃度為5g/L、硫酸濃度為150g/L之組成者。又,於該電解液以按電解液中之濃度計成為100mg/L之方式添加作為添加劑之番紅O(關東化學股份有限公司製造),進而以按電解液中之氯化物離子(氯離子)濃度計成為10mg/L之方式添加鹽酸溶液(和光純藥工業股份有限公司製造)。接著,於下述之條件以陰極之電流密度成為25A/dm2之方式通電而使銅粉析出至陰極板上,該條件為使用泵使如上所述般調整了濃度之電解液以15L/min之流量循環,並且將溫度維持在25℃。使用刮板機械性地將析出於陰極板上之電解銅粉刮落至電解槽之槽底而回收,於利用純水洗淨所回收之銅粉後,放入至減壓乾燥器而進行乾燥。 At this time, as the electrolytic solution, a composition having a copper ion concentration of 5 g/L and a sulfuric acid concentration of 150 g/L was used. In addition, as the additive, Safranin O (manufactured by Kanto Chemical Co., Ltd.) is added as an additive in a concentration of 100 mg/L in the electrolytic solution, and further, chloride ions (chloride ions) in the electrolyte solution are added. A hydrochloric acid solution (manufactured by Wako Pure Chemical Industries, Ltd.) was added in such a manner that the concentration meter became 10 mg/L. Then, the copper powder was discharged to the cathode plate under the following conditions such that the current density of the cathode was 25 A/dm 2 , which was a condition that the concentration of the electrolyte was adjusted to 15 L/min using a pump as described above. The flow was cycled and the temperature was maintained at 25 °C. The electrolytic copper powder deposited on the cathode plate is mechanically scraped off to the bottom of the electrolytic cell by a scraper, and the recovered copper powder is washed with pure water, and then placed in a vacuum dryer for drying. .

藉由上述利用掃描式電子顯微鏡(SEM)之方法觀察以此方式獲得之銅粉之形狀,結果於所析出之銅粉中,至少90個數%以上之銅粉為如下之銅粒子集合而成之呈二維或三維樹枝狀形狀之樹枝狀銅粉,該銅粒子具有直線性地成長之主幹、自該主幹直線性地分支之多個枝、及進而自該枝進一步分支之枝之形狀。又,銅粉呈由1層或重疊多層而成之積層構造構成之平板狀。 The shape of the copper powder obtained in this manner is observed by the scanning electron microscope (SEM) method described above, and as a result, at least 90% or more of the copper powder in the precipitated copper powder is a collection of copper particles as follows. The dendritic copper powder having a two-dimensional or three-dimensional dendritic shape, the copper particles having a trunk that grows linearly, a plurality of branches that are linearly branched from the stem, and a branch that branches further from the branch. Further, the copper powder is in the form of a flat plate composed of a laminated structure in which one layer or a plurality of layers are stacked.

<利用還原法之樹枝狀覆銀銅粉之製造> <Manufacture of dendritic silver-coated copper powder by reduction method>

其次,使用藉由上述方法而製作之樹枝狀銅粉製作覆銀銅粉。 Next, silver-coated copper powder was produced using the dendritic copper powder produced by the above method.

即,於將所獲得之樹枝狀銅粉100g於3%酒石酸水溶液中攪拌約1小時後,進行過濾、水洗並使其分散於2升之離子交換水中。於其中添加酒石酸5g、葡萄糖5g、乙醇50ml,進而添加28%氨水50ml而進行攪拌,此後花費60分鐘分別緩緩添加將硝酸銀60g溶解於離子交換水4升所得之水溶液、將葡萄糖25g、酒石酸25g、乙醇250ml溶解於離子交換水750ml所得之水溶液、及28%氨水250ml。再者,此時之浴溫為25℃。 Namely, 100 g of the obtained dendritic copper powder was stirred in a 3% aqueous solution of tartaric acid for about 1 hour, and then filtered, washed with water, and dispersed in 2 liters of ion-exchanged water. 5 g of tartaric acid, 5 g of glucose, 50 ml of ethanol, and 50 ml of 28% aqueous ammonia were added thereto, and the mixture was stirred. Thereafter, 60 g of silver nitrate was dissolved in an aqueous solution obtained by dissolving 60 g of silver nitrate in 4 liters of ion-exchanged water, and 25 g of glucose and 25 g of tartaric acid were added. 250 ml of ethanol was dissolved in 750 ml of ion-exchanged water and 250 ml of 28% ammonia water. Furthermore, the bath temperature at this time was 25 °C.

於各水溶液之添加結束後,對粉末進行過濾、水洗,通入乙醇並使其乾燥,結果獲得於樹枝狀銅粉之表面被覆有銀之樹枝狀覆銀銅粉。又,該樹枝狀覆銀銅粉呈由1層或重疊多層而成之積層構造構成之平板狀。回收該樹枝狀覆銀銅粉,測定銀被覆量,結果相對於經銀被覆之覆銀銅粉整體之質量100%為26.2質量%。又,藉由SEM以倍率5,000倍之視域觀察所獲得之樹枝狀覆銀銅粉,結果為如下之樹枝狀覆銀銅粉:於被覆銀前之樹枝狀銅粉之表面均勻地被覆有銀,呈二維或三維樹枝狀之形狀,且呈成長為樹枝狀之具有主幹、自該主幹分支之多個枝、及進而自該枝進一步分支之枝之樹枝狀形狀。再者,所獲得之覆銀銅粉中之至少90個數%以上為上述形狀之樹枝狀覆銀銅粉。 After the completion of the addition of each aqueous solution, the powder was filtered, washed with water, and ethanol was passed through and dried. As a result, the surface of the dendritic copper powder was coated with silver-like dendritic silver-coated copper powder. Further, the dendritic silver-coated copper powder has a flat shape composed of a laminated structure in which one layer or a plurality of layers are stacked. The dendritic silver-coated copper powder was collected, and the amount of the silver coating was measured. As a result, the mass of the silver-coated copper-coated copper powder was 100% by mass of 26.2% by mass. Further, the dendritic silver-coated copper powder obtained by observation of the SEM at a magnification of 5,000 times was found to be a dendritic silver-coated copper powder which was uniformly coated with silver on the surface of the dendritic copper powder before the coating of silver. , in the shape of a two-dimensional or three-dimensional dendritic shape, and having a dendritic shape having a trunk, a plurality of branches from the trunk branch, and further branches from the branch. Further, at least 90% or more of the obtained silver-coated copper powder is a dendritic silver-coated copper powder having the above shape.

又,構成該樹枝狀覆銀銅粉之主幹及枝之銅粒子呈剖面厚度平均為3.4μm之平板狀,該樹枝狀覆銀銅粉之平均粒徑(D50)為58.9μm。而且,根據構成樹枝狀覆銀銅粉之銅粒子之剖面平均厚度與樹枝狀覆銀銅粉之平均粒徑算出的縱橫比(剖面平均厚度/平均粒徑)為0.006。又,所 獲得之銅粉之體密度為3.0g/cm3。又,BET比表面積為1.1m2/g。 Further, the main particles and the copper particles constituting the dendritic silver-coated copper powder have a flat plate shape having an average thickness of 3.4 μm, and the average particle diameter (D50) of the dendritic silver-coated copper powder is 58.9 μm. Further, the aspect ratio (sectional average thickness/average particle diameter) calculated from the average thickness of the cross section of the copper particles constituting the dendritic silver-coated copper powder and the average particle diameter of the dendritic silver-coated copper powder was 0.006. Further, the obtained copper powder had a bulk density of 3.0 g/cm 3 . Further, the BET specific surface area was 1.1 m 2 /g.

<導電性糊化> <Conductive gelatinization>

其次,將藉由上述方法製作之樹枝狀覆銀銅粉糊化而製作導電性糊。 Next, the dendritic silver-coated copper powder produced by the above method was pasted to prepare a conductive paste.

即,相對於所製作之樹枝狀覆銀銅粉40g混合酚樹脂(群榮化學股份有限公司製造,PL-2211)20g、及丁基溶纖素(關東化學股份有限公司製造,鹿特級)10g,使用小型捏合機(日本精機製作所股份有限公司製造,非起泡捏合機NBK-1),反覆進行4次1500rpm、3分鐘之混練,藉此進行糊化。於進行糊化時,銅粉不凝集而均勻地分散於樹脂中。利用金屬刮漿板將所獲得之導電性糊印刷至玻璃上,並於大氣環境中,在150℃、200℃下分別花費30分鐘硬化。 In other words, 20 g of a phenol resin (PL-2211, manufactured by Kyoei Chemical Co., Ltd.) and 10 g of butyl cellulose (manufactured by Kanto Chemical Co., Ltd., Rotters grade) were mixed with 40 g of the obtained dendritic silver-coated copper powder. A small kneading machine (manufactured by Nippon Seiki Co., Ltd., non-foaming kneader NBK-1) was repeatedly kneaded by repeating four times of 1500 rpm and three minutes of kneading. When gelatinizing, the copper powder does not aggregate and is uniformly dispersed in the resin. The obtained conductive paste was printed on glass using a metal squeegee and hardened in an atmospheric environment at 150 ° C and 200 ° C for 30 minutes.

測定藉由硬化而獲得之被膜之比電阻值,結果分別為16×10-6Ω.cm(硬化溫度為150℃)、2.3×10-6Ω.cm(硬化溫度為200℃),可知顯示出優異之導電性。 The specific resistance values of the film obtained by hardening were measured, and the results were 16 × 10 -6 Ω, respectively. Cm (hardening temperature is 150 ° C), 2.3 × 10 -6 Ω. Cm (hardening temperature is 200 ° C), and it is understood that excellent electrical conductivity is exhibited.

[實施例2] [Embodiment 2]

<樹枝狀銅粉之製造> <Manufacture of dendritic copper powder>

作為電解液,使用銅離子濃度為7g/L,硫酸濃度為150g/L之組成者,於該電解液以按電解液中之濃度計成為150mg/L之方式添加作為添加劑之番紅O,進而以按電解液中之氯離子濃度計成為25mg/L之方式添加鹽酸溶液。接著,於下述之條件以陰極之電流密度成為20A/dm2之方式通電而使銅粉析出至陰極板上,該條件為使用泵使如上所述般調整了濃度之電解液以15L/min之流量循環,並且將溫度維持為25℃。使用刮板機械性地將析出於陰極板上之電解銅粉刮落至電解槽之槽底而回收,於利用 純水洗淨所回收之銅粉後,放入至減壓乾燥器而進行乾燥。 As the electrolyte solution, a composition having a copper ion concentration of 7 g/L and a sulfuric acid concentration of 150 g/L is used, and the electrolyte is added as an additive of Safranin O in such a manner that the concentration in the electrolytic solution is 150 mg/L. The hydrochloric acid solution was added so as to be 25 mg/L in terms of the chloride ion concentration in the electrolytic solution. Then, the copper powder was deposited on the cathode plate under the following conditions such that the current density of the cathode was 20 A/dm 2 , which was a condition that the concentration of the electrolyte was adjusted to 15 L/min using a pump as described above. The flow was cycled and the temperature was maintained at 25 °C. The electrolytic copper powder deposited on the cathode plate is mechanically scraped off to the bottom of the electrolytic cell by a scraper, and the recovered copper powder is washed with pure water, and then placed in a vacuum dryer for drying. .

<利用置換法之樹枝狀覆銀銅粉之製作> <Production of dendritic silver-coated copper powder by replacement method>

使用所獲得之樹枝狀銅粉100g,藉由置換型無電解鍍敷液而於該銅粉表面進行銀被覆。 100 g of the obtained dendritic copper powder was subjected to silver coating on the surface of the copper powder by a substitution type electroless plating solution.

作為置換型無電解鍍敷液,採用將硝酸銀20g、檸檬酸20g、乙二胺10g溶解於離子交換水1升之組成之溶液,於該溶液中投入樹枝狀銅粉100g,攪拌60分鐘而使其反應。此時之浴溫為25℃。 As a replacement type electroless plating solution, a solution in which 20 g of silver nitrate, 20 g of citric acid, and 10 g of ethylenediamine were dissolved in 1 liter of ion-exchanged water was used, and 100 g of dendritic copper powder was placed in the solution, and the mixture was stirred for 60 minutes. Its reaction. The bath temperature at this time was 25 °C.

於反應結束後,對粉末進行過濾、水洗,通入乙醇並使其乾燥,結果獲得於樹枝狀銅粉之表面被覆有銀之樹枝狀覆銀銅粉。又,該樹枝狀覆銀銅粉呈由1層或重疊多層而成之積層構造構成之平板狀。回收該樹枝狀覆銀銅粉,測定銀被覆量,結果相對於經銀被覆之覆銀銅粉整體之質量100%為10.6質量%。又,藉由SEM以倍率5,000倍之視域觀察所獲得之樹枝狀覆銀銅粉,結果可實現於被覆銀前之樹枝狀銅粉之表面均勻地被覆有銀之狀態之樹枝狀覆銀銅粉,且覆銀銅粉呈成長為樹枝狀之具有主幹、自該主幹分支之多個枝、及進而自該枝進一步分支之枝之二維或三維樹枝狀形狀。再者,所獲得之覆銀銅粉中之至少90個數%以上為上述形狀之樹枝狀覆銀銅粉。 After the completion of the reaction, the powder was filtered, washed with water, and ethanol was passed through and dried. As a result, the surface of the dendritic copper powder was coated with silver-like dendritic silver-coated copper powder. Further, the dendritic silver-coated copper powder has a flat shape composed of a laminated structure in which one layer or a plurality of layers are stacked. The dendritic silver-coated copper powder was collected, and the amount of silver coating was measured. As a result, the mass of the silver-coated copper-coated copper powder covered with silver was 100% by weight of 10.6% by mass. Moreover, the dendritic silver-coated copper powder obtained by observing the SEM at a magnification of 5,000 times can be realized as a dendritic silver-coated copper in which the surface of the dendritic copper powder before the silver coating is uniformly coated with silver. The powder, and the silver-coated copper powder is a two-dimensional or three-dimensional dendritic shape having a trunk, a plurality of branches from the trunk branch, and further branches from the branch. Further, at least 90% or more of the obtained silver-coated copper powder is a dendritic silver-coated copper powder having the above shape.

又,構成該樹枝狀覆銀銅粉之主幹及枝之銅粒子呈其剖面厚度平均為1.2μm之平板狀,於其表面具有微細之凸部。又,該樹枝狀覆銀銅粉之平均粒徑(D50)為44.6μm。而且,根據該銅粒子之剖面平均厚度與樹枝狀銅粉之平均粒徑算出之縱橫比(剖面平均厚度/平均粒予徑)為0.03。又,所獲得之銅粉之體密度為1.6g/cm3。又,BET比表面積為1.7m2 /g。 Further, the main particles and the branched copper particles constituting the dendritic silver-coated copper powder have a flat plate shape having an average thickness of 1.2 μm, and have fine convex portions on the surface thereof. Further, the dendritic silver-coated copper powder had an average particle diameter (D50) of 44.6 μm. Further, the aspect ratio (sectional average thickness / average particle diameter) calculated from the average thickness of the cross section of the copper particles and the average particle diameter of the dendritic copper powder was 0.03. Further, the obtained copper powder had a bulk density of 1.6 g/cm 3 . Further, the BET specific surface area was 1.7 m 2 /g.

<導電糊化> <Electrically conductive gelatinization>

其次,將藉由上述方法製作之樹枝狀覆銀銅粉糊化而製作導電性糊。 Next, the dendritic silver-coated copper powder produced by the above method was pasted to prepare a conductive paste.

即,相對於所製作之樹枝狀覆銀銅粉40g混合酚樹脂(群榮化學股份有限公司製造,PL-2211)20g、及丁基溶纖素(關東化學股份有限公司製造,鹿特級)10g,使用小型捏合機(日本精機製作所股份有限公司製造,非起泡捏合機NBK-1)反覆進行4次1500rpm、3分鐘之混練,藉此進行糊化。於進行糊化時,銅粉不凝集而均勻地分散於樹脂中。利用金屬刮漿板將所獲得之導電性糊印刷至玻璃上,並於大氣環境中,在150℃、200℃下分別花費30分鐘硬化。 In other words, 20 g of a phenol resin (PL-2211, manufactured by Kyoei Chemical Co., Ltd.) and 10 g of butyl cellulose (manufactured by Kanto Chemical Co., Ltd., Rotters grade) were mixed with 40 g of the obtained dendritic silver-coated copper powder. A small kneading machine (manufactured by Nippon Seiki Co., Ltd., non-foaming kneader NBK-1) was repeatedly kneaded by performing 1500 rpm and 3 minutes of kneading four times. When gelatinizing, the copper powder does not aggregate and is uniformly dispersed in the resin. The obtained conductive paste was printed on glass using a metal squeegee and hardened in an atmospheric environment at 150 ° C and 200 ° C for 30 minutes.

測定藉由硬化而獲得之被膜之比電阻值,結果分別為28×10-6Ω.cm(硬化溫度為150℃)、3.9×10-6Ω.cm(硬化溫度為200℃),可知顯示出優異之導電性。 The specific resistance of the film obtained by hardening was measured, and the results were 28×10 -6 Ω, respectively. Cm (hardening temperature is 150 ° C), 3.9 × 10 -6 Ω. Cm (hardening temperature is 200 ° C), and it is understood that excellent electrical conductivity is exhibited.

[實施例3] [Example 3]

將於實施例1中所製作之樹枝狀覆銀銅粉分散至樹脂而製成電磁波屏蔽材。再者,用以製作樹枝狀覆銀銅粉之樹枝狀銅粉之製作、及至在該樹枝狀銅粉被覆銀而製作樹枝狀覆銀銅粉為止之條件設為與實施例1相同,使用銀被覆量相對於經銀被覆之覆銀銅粉整體之質量100%為26.2質量%之樹枝狀覆銀銅粉。 The dendritic silver-coated copper powder prepared in Example 1 was dispersed in a resin to prepare an electromagnetic wave shielding material. Further, the conditions for producing the dendritic copper powder of the dendritic silver-coated copper powder and the conditions for producing the dendritic silver-coated copper powder by coating the dendritic copper powder with silver are the same as in the first embodiment, and silver is used. The dendritic silver-coated copper powder having a coating amount of 26.2% by mass based on 100% by mass of the silver-coated silver-coated copper powder as a whole.

相對於該樹枝狀覆銀銅粉40g分別混合氯乙烯樹脂100g、及甲基乙基酮200g,使用小型捏合機,反覆進行4次1500rpm、3分鐘之混練,藉此進行糊化。於進行糊化時,銅粉不凝集而均勻地分散於樹脂中。 使用麥耶棒(Meyer bar)將其塗佈至100μm厚度之由透明聚對苯二甲酸乙二酯片構成之基材上並進行乾燥,從而形成厚度為25μm之電磁波屏蔽層。 100 g of a vinyl chloride resin and 200 g of methyl ethyl ketone were mixed with 40 g of the dendritic silver-coated copper powder, and the gelatinization was carried out by kneading four times at 1500 rpm for three minutes using a small kneader. When gelatinizing, the copper powder does not aggregate and is uniformly dispersed in the resin. This was applied to a substrate made of a transparent polyethylene terephthalate sheet having a thickness of 100 μm using a Meyer bar and dried to form an electromagnetic wave shielding layer having a thickness of 25 μm.

對於電磁波屏蔽之特性係藉由使用頻率為1GHz之電磁波,測定其衰減率而進行評價。將結果示於表1。 The characteristics of electromagnetic wave shielding were evaluated by measuring the attenuation rate using an electromagnetic wave having a frequency of 1 GHz. The results are shown in Table 1.

[比較例1] [Comparative Example 1]

除設為不於電解液中添加作為添加劑之番紅O、及氯離子之條件以外,與實施例1同樣地使銅粉析出至陰極板上。此後,對於所獲得之銅粉,與實施例1同樣地於該銅粉表面被覆銀而獲得覆銀銅粉。該覆銀銅粉之銀被覆量相對於經銀被覆之覆銀銅粉整體之質量100%為26.1質量%。 Copper powder was deposited on the cathode plate in the same manner as in Example 1 except that the conditions of adding Safranin O and the chloride ion as additives were not added to the electrolytic solution. Thereafter, silver powder was obtained by coating silver on the surface of the copper powder in the same manner as in Example 1 to obtain a copper-coated copper powder. The silver coating amount of the silver-coated copper powder was 26.1% by mass based on 100% of the mass of the silver-coated silver-coated copper powder.

於圖7中,表示藉由SEM以倍率5,000倍之視域觀察所獲得之覆銀銅粉之形狀的結果。如圖7之照片圖所示,所獲得之覆銀銅粉之形狀為由粒子狀之銅集合而成之樹枝狀之形狀,且呈於該銅粉之表面被覆有銀之狀態,該覆銀銅粉之平均粒徑(D50)為45.3μm。又,未於樹枝狀部形成微小之凸部。 In Fig. 7, the results of the shape of the silver-coated copper powder obtained by observation of the SEM at a magnification of 5,000 times are shown. As shown in the photograph of Fig. 7, the shape of the silver-coated copper powder obtained is a dendritic shape in which the particles of copper are collected, and the surface of the copper powder is covered with silver. The average particle diameter (D50) of the copper powder was 45.3 μm. Further, no minute convex portions are formed in the dendrites.

相對於藉由上述方法而製作之覆銀銅粉40g混合酚樹脂(群榮化學股份有限公司製造,PL-2211)20g、及丁基溶纖素(關東化學股份有限公司製造,鹿特級)10g,使用小型捏合機(日本精機製作所股份有限公司製造,非起泡捏合機NBK-1),反覆進行4次1500rpm、3分鐘之混練,藉此進行糊化。於進行糊化時,每當反覆混練時均發生黏度之上升。認為該情形之原因在於銅粉之一部分凝集,從而難以均勻分散。利用金屬刮漿板將所獲得之導電性糊印刷至玻璃上,並於大氣環境中,在150℃、200℃下分別花費30分鐘硬化。 40 g of a silver-coated copper powder prepared by the above method, 20 g of a phenol resin (PL-2211, manufactured by Kyoei Chemical Co., Ltd.), and 10 g of butyl cellulose (manufactured by Kanto Chemical Co., Ltd., Rote grade) were used. A small kneading machine (manufactured by Nippon Seiki Co., Ltd., non-foaming kneader NBK-1) was repeatedly kneaded by repeating four times of 1500 rpm and three minutes of kneading. When gelatinizing, the viscosity rises every time it is re-mixed. The reason for this is considered to be that a part of the copper powder is agglomerated, so that it is difficult to uniformly disperse. The obtained conductive paste was printed on glass using a metal squeegee and hardened in an atmospheric environment at 150 ° C and 200 ° C for 30 minutes.

測定藉由硬化而獲得之被膜之比電阻值,結果分別為670×10-6Ω.cm(硬化溫度為150℃)、310×10-6Ω.cm(硬化溫度為200℃),與實施例中所獲得之導電性糊相比,比電阻值較高,導電性較差。 The specific resistance values of the film obtained by hardening were measured, and the results were 670 × 10 -6 Ω, respectively. Cm (hardening temperature is 150 ° C), 310 × 10 -6 Ω. Cm (hardening temperature: 200 ° C), compared with the conductive paste obtained in the examples, the specific resistance value was high and the conductivity was poor.

[比較例2] [Comparative Example 2]

<樹枝狀銅粉之製造> <Manufacture of dendritic copper powder>

作為電解液,使用銅離子濃度為10g/L、硫酸濃度為150g/L之組成者。又,於該電解液以按電解液中之濃度計成為50mg/L之方式添加作為添加劑之番紅O(關東化學工業股份有限公司製造),進而以按電解液中之氯化物離子(氯離子)濃度計成為10mg/L之方式添加鹽酸溶液(和光純藥工業股份有限公司製造)。接著,使用定量泵使調整成如上所述之濃度之電解液以15L/min之流量循環,並且將溫度維持為45℃,以陰極之電流密度成為20A/dm2之方式通電而使銅粉析出至陰極板上。 As the electrolytic solution, a composition having a copper ion concentration of 10 g/L and a sulfuric acid concentration of 150 g/L was used. In addition, as the additive, Safranin O (manufactured by Kanto Chemical Industry Co., Ltd.) is added as the additive so as to be 50 mg/L in terms of the concentration in the electrolytic solution, and further, chloride ions (chloride ions) in the electrolyte solution are added. A hydrochloric acid solution (manufactured by Wako Pure Chemical Industries, Ltd.) was added in such a manner that the concentration meter became 10 mg/L. Next, the electrolytic solution adjusted to the concentration as described above was circulated at a flow rate of 15 L/min using a metering pump, and the temperature was maintained at 45 ° C, and the current density of the cathode was 20 A/dm 2 to conduct the copper powder. To the cathode plate.

於圖8中,表示藉由SEM以倍率5,000倍之視域觀察所獲得之覆銀銅粉之形狀的結果。如圖8之照片圖所示,所獲得之電解銅粉之形狀係由粒狀之銅粒子集合而成之樹枝狀銅粉。然而,其樹枝狀之主幹及枝帶弧度,並非如於實施例中所獲得之銅粉般呈由1層或重疊多層而成之積層構造構成之平板狀。 In Fig. 8, the results of the shape of the silver-coated copper powder obtained by observation of the SEM at a magnification of 5,000 times are shown. As shown in the photograph of Fig. 8, the shape of the obtained electrolytic copper powder is a dendritic copper powder obtained by collecting granular copper particles. However, the dendritic trunk and the branching arc are not in the form of a flat layer composed of a laminated structure in which one layer or a plurality of layers are stacked as in the copper powder obtained in the examples.

<利用還原法之樹枝狀覆銀銅粉之製造> <Manufacture of dendritic silver-coated copper powder by reduction method>

其次,使用所獲得之樹枝狀銅粉,與實施例1同樣地製作覆銀銅粉。 Next, silver-coated copper powder was produced in the same manner as in Example 1 using the obtained dendritic copper powder.

回收所獲得之樹枝狀覆銀銅粉而測定銀被覆量,結果相對於經銀被覆之覆銀銅粉整體之質量100%為26.5質量%。又,利用SEM以倍率為5,000倍之視域觀察所獲得之樹枝狀覆銀銅粉,結果為於被覆銀前之樹枝 狀銅粉之表面均勻地被覆有銀之二維或三維樹枝狀之形狀,並非如於實施例中所獲得之覆銀銅粉般呈由1層或重疊多層而成之積層構造構成之平板狀。 The amount of silver coating was measured by recovering the obtained dendritic silver-coated copper powder, and as a result, the mass of the silver-coated copper-coated copper powder covered with silver was 100% by mass of 26.5% by mass. Further, the dendritic silver-coated copper powder obtained by observation of the field of view at a magnification of 5,000 times by SEM was used as the branch before the silver coating. The surface of the copper powder is uniformly coated with a two-dimensional or three-dimensional dendritic shape of silver, and is not a flat plate composed of a laminated structure of one layer or a plurality of layers as a silver-coated copper powder obtained in the embodiment. .

<導電糊化> <Electrically conductive gelatinization>

其次,將藉由上述方法製作之樹枝狀覆銀銅粉糊化而製作導電性糊。 Next, the dendritic silver-coated copper powder produced by the above method was pasted to prepare a conductive paste.

即,相對於所製作之樹枝狀覆銀銅粉40g混合酚樹脂(群榮化學股份有限公司製造,PL-2211)20g、及丁基溶纖素(關東化學股份有限公司製造,鹿特級)10g,使用小型捏合機(日本精機製作所股份有限公司製造,非起泡捏合機NBK-1),反覆進行4次1500rpm、3分鐘之混練,藉此進行糊化。於進行糊化時,銅粉不凝集而均勻地分散於樹脂中。利用金屬刮漿板將所獲得之導電性糊印刷至玻璃上,並於大氣環境中,在150℃、200℃下分別花費30分鐘硬化。 In other words, 20 g of a phenol resin (PL-2211, manufactured by Kyoei Chemical Co., Ltd.) and 10 g of butyl cellulose (manufactured by Kanto Chemical Co., Ltd., Rotters grade) were mixed with 40 g of the obtained dendritic silver-coated copper powder. A small kneading machine (manufactured by Nippon Seiki Co., Ltd., non-foaming kneader NBK-1) was repeatedly kneaded by repeating four times of 1500 rpm and three minutes of kneading. When gelatinizing, the copper powder does not aggregate and is uniformly dispersed in the resin. The obtained conductive paste was printed on glass using a metal squeegee and hardened in an atmospheric environment at 150 ° C and 200 ° C for 30 minutes.

測定藉由硬化而獲得之被膜之比電阻值結果分別為530×10-6Ω.cm(硬化溫度為150℃)、360×10-6Ω.cm(硬化溫度為200℃)。 The specific resistance values of the film obtained by hardening were 530×10 -6 Ω, respectively. Cm (hardening temperature is 150 ° C), 360 × 10 -6 Ω. Cm (hardening temperature is 200 ° C).

[比較例3] [Comparative Example 3]

評價由在習知之平板狀銅粉被覆銀而成之覆銀銅粉形成之導電性糊的特性,並與使用實施例之樹枝狀覆銀銅粉製作之導電性糊進行比較。 The characteristics of the conductive paste formed of silver-coated copper powder obtained by coating silver with a known flat copper powder were evaluated and compared with the conductive paste produced by using the dendritic silver-coated copper powder of the example.

平板狀銅粉係機械性地將粒狀之電解銅粉扁平化而製作。具體而言,向平均粒徑為7.9μm之粒狀霧化銅粉(Makin Metal Powders公司製造)500g添加硬脂酸5g,利用球磨機進行扁平化處理。向球磨機投入3mm之氧化鋯珠5kg,以500rpm之轉速旋轉60分鐘,藉此進行扁平化處理。 The flat copper powder is produced by mechanically flattening the granular electrolytic copper powder. Specifically, 5 g of stearic acid was added to 500 g of granular atomized copper powder (manufactured by Makin Metal Powders Co., Ltd.) having an average particle diameter of 7.9 μm, and flattened by a ball mill. 5 kg of 3 mm zirconia beads were placed in a ball mill, and rotated at a rotation speed of 500 rpm for 60 minutes to carry out a flattening treatment.

藉由與實施例1相同之方法,對所獲得之平板狀銅粉被覆 銀。所製作之平板狀覆銀銅粉之銀被覆量相對於經銀被覆之覆銀銅粉整體之質量100%為26.4質量%。利用雷射繞射-散射法粒度分佈測定器測定以此方式製作之平板狀之覆銀銅粉,結果平均粒徑(D50)為24.1μm,利用SEM進行觀察,結果厚度為0.6μm,表面平滑且未形成微小之凸部。而且,根據其剖面平均厚度與平均粒徑算出之縱橫比(剖面平均厚度/平均粒徑)為0.02。 The obtained flat copper powder was coated by the same method as in Example 1. silver. The silver coating amount of the flat silver-coated copper powder produced was 26.4% by mass based on 100% of the mass of the silver-coated silver-coated copper powder. The plate-shaped silver-coated copper powder prepared in this manner was measured by a laser diffraction-scattering particle size analyzer, and as a result, the average particle diameter (D50) was 24.1 μm, and observed by SEM, the thickness was 0.6 μm, and the surface was smooth. And no tiny convex portions were formed. Further, the aspect ratio (sectional average thickness/average particle diameter) calculated from the average thickness of the cross section and the average particle diameter was 0.02.

其次,相對於所獲得之平板狀之覆銀銅粉40g混合酚樹脂(群榮化學股份有限公司製造,PL-2211)20g、及丁基溶纖素(關東化學股份有限公司製造,鹿特級)10g,使用小型捏合機(日本精機製作所股份有限公司製造,非起泡捏合機NBK-1),反覆進行4次1500rpm、3分鐘之混練,藉此進行糊化。於進行糊化時,銅粉不凝集而均勻地分散於樹脂中。利用金屬刮漿板將所獲得之導電性糊印刷至玻璃上,並於大氣環境中,在150℃、200℃下分別花費30分鐘硬化。 Next, 20 g of a phenol resin (PL-2211, manufactured by Kyoei Chemical Co., Ltd.) and 10 g of butyl cellulite (manufactured by Kanto Chemical Co., Ltd., Route grade) were mixed with 40 g of the plate-shaped silver-coated copper powder obtained. Using a small kneading machine (manufactured by Nippon Seiki Co., Ltd., non-foaming kneader NBK-1), the mixing was carried out four times at 1500 rpm for three minutes to carry out gelatinization. When gelatinizing, the copper powder does not aggregate and is uniformly dispersed in the resin. The obtained conductive paste was printed on glass using a metal squeegee and hardened in an atmospheric environment at 150 ° C and 200 ° C for 30 minutes.

測定藉由硬化而獲得之被膜之比電阻值,結果分別為59×10-6Ω.cm(硬化溫度為150℃)、10×10-6Ω.cm(硬化溫度為200℃),與實施例1、2中獲得之銅糊相比,比電阻值較高,導電性較差。 The specific resistance values of the film obtained by hardening were measured, and the results were respectively 59 × 10 -6 Ω. Cm (hardening temperature is 150 ° C), 10 × 10 -6 Ω. The cm (hardening temperature was 200 ° C) was higher than the copper paste obtained in Examples 1 and 2, and the electrical conductivity was inferior.

[比較例4] [Comparative Example 4]

製作於與比較例3中所使用者同樣地機械性地將粒狀之電解銅粉扁平化而製作之平板狀銅粉被覆銀而成之覆銀銅粉,評價由該覆銀銅粉形成之電磁波屏蔽之特性,並與使用實施例之樹枝狀覆銀銅粉製作之電磁波屏蔽進行比較而研究樹枝狀形狀之效果。再者,所使用之平板狀之覆銀銅粉係藉由與實施例1相同之方法而被覆銀。所製作之平板狀覆銀銅粉之銀被覆 量相對於經銀被覆之覆銀銅粉整體之質量100%為26.1質量%。 The silver-coated copper powder obtained by flattening the granular copper powder prepared by flattening the granular electrolytic copper powder in the same manner as the user of the comparative example 3 was prepared, and the silver-coated copper powder was evaluated. The characteristics of the electromagnetic wave shield were compared with the electromagnetic wave shield produced by using the dendritic silver-coated copper powder of the example to study the effect of the dendritic shape. Further, the flat silver-coated copper powder used was coated with silver by the same method as in the first embodiment. Silver coating of flat silver-coated copper powder produced The amount of the silver-coated copper powder coated with silver was 100% by mass of 26.1% by mass.

相對於該平板狀之覆銀銅粉40g分別混合氯乙烯樹脂100g、及甲基乙基酮200g,使用小型捏合機,反覆進行4次1500rpm、3分鐘之混練,藉此進行糊化。於進行糊化時,銅粉不凝集而均勻地分散於樹脂中。使用麥耶棒將其塗佈至100μm之厚度之由透明聚對苯二甲酸乙二酯片所構成之基材上並進行乾燥,從而形成厚度為25μm之電磁波屏蔽層。 100 g of a vinyl chloride resin and 200 g of methyl ethyl ketone were mixed with 40 g of the flat silver-coated copper powder, and the gelatinization was carried out by kneading four times at 1500 rpm for three minutes using a small kneader. When gelatinizing, the copper powder does not aggregate and is uniformly dispersed in the resin. This was applied to a substrate made of a transparent polyethylene terephthalate sheet having a thickness of 100 μm using a Meyer rod and dried to form an electromagnetic wave shielding layer having a thickness of 25 μm.

對於電磁波屏蔽之特性係藉由使用頻率為1GHz之電磁波,測定其衰減率而進行評價。將結果示於表1。 The characteristics of electromagnetic wave shielding were evaluated by measuring the attenuation rate using an electromagnetic wave having a frequency of 1 GHz. The results are shown in Table 1.

1‧‧‧銅粒子 1‧‧‧ copper particles

2‧‧‧(銅粒子之)主幹 2‧‧‧ (copper particles) trunk

3、3a、3b‧‧‧(銅粒子之)枝 3, 3a, 3b‧‧‧ (copper particles) branches

Claims (6)

一種覆銀銅粉,其係由樹枝狀形狀之銅粒子集合而構成且於表面被覆有銀者,該樹枝狀形狀之銅粒子具有直線性地成長之主幹、及自該主幹分支之多個枝;該覆銀銅粉之特徵在於:上述銅粒子其剖面平均厚度超過1.0μm且在5.0μm以下,且為平板狀;該覆銀銅粉為由1層或重疊多層而成之積層構造構成之平板狀,且平均粒徑(D50)為1.0μm~100μm;體密度為0.5g/cm3~5.0g/cm3之範圍;BET比表面積值為0.2m2/g~3.0m2/g;銀被覆量相對於經銀被覆之該覆銀銅粉整體之質量100%為1質量%~50質量%。 A silver-coated copper powder comprising a collection of dendritic copper particles and having a surface coated with silver, the dendritic copper particles having a linear growth trunk and a plurality of branches from the trunk branch The silver-coated copper powder is characterized in that the copper particles have a cross-sectional average thickness of more than 1.0 μm and a thickness of 5.0 μm or less, and are in the form of a flat plate; and the silver-coated copper powder is a laminated structure composed of one layer or a plurality of layers. a flat plate shape and an average particle diameter (D50) of 1.0μm ~ 100μm; bulk density 0.5g / cm 3 ~ 5.0g / cm 3 of the range; a BET specific surface area is 0.2m 2 /g~3.0m 2 / g; The amount of the silver coating is 100% by mass to 50% by mass based on 100% of the mass of the silver-coated copper powder coated with silver. 如申請專利範圍第1項之覆銀銅粉,其中,將上述被覆有銀之銅粒子之剖面平均厚度除以該覆銀銅粉之平均粒徑(D50)所得之比為超過0.01且在5.0以下之範圍。 The silver-coated copper powder according to claim 1, wherein the ratio of the average thickness of the copper-coated copper particles divided by the average particle diameter (D50) of the silver-coated copper powder is more than 0.01 and is 5.0. The following range. 一種金屬填料,其以整體之20質量%以上之比率含有申請專利範圍第1或2項之覆銀銅粉。 A metal filler comprising the silver-coated copper powder of claim 1 or 2 in a ratio of 20% by mass or more of the whole. 一種導電性糊,係將申請專利範圍第3項之金屬填料混合於樹脂而成。 A conductive paste obtained by mixing a metal filler of the third application of the patent application with a resin. 一種電磁波屏蔽用導電性塗料,其係使用申請專利範圍第3項之金屬填料而成。 A conductive coating for electromagnetic wave shielding, which is obtained by using a metal filler of the third item of the patent application. 一種電磁波屏蔽用導電性片,其係使用申請專利範圍第3項之金屬填料而成。 A conductive sheet for electromagnetic wave shielding, which is obtained by using a metal filler of the third item of the patent application.
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