TWI479958B - Copper foil for printed wiring board and manufacturing method thereof - Google Patents

Copper foil for printed wiring board and manufacturing method thereof Download PDF

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TWI479958B
TWI479958B TW099108438A TW99108438A TWI479958B TW I479958 B TWI479958 B TW I479958B TW 099108438 A TW099108438 A TW 099108438A TW 99108438 A TW99108438 A TW 99108438A TW I479958 B TWI479958 B TW I479958B
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copper foil
printed wiring
wiring board
layer
copper
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TW099108438A
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TW201039702A (en
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Fumiaki Akase
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Jx Nippon Mining & Metals Corp
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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/38Improvement of the adhesion between the insulating substrate and the metal
    • H05K3/382Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal
    • H05K3/384Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal by plating
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/09Use of materials for the conductive, e.g. metallic pattern
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B15/00Layered products comprising a layer of metal
    • B32B15/16Layered products comprising a layer of metal next to a particulate layer
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D3/00Electroplating: Baths therefor
    • C25D3/02Electroplating: Baths therefor from solutions
    • C25D3/38Electroplating: Baths therefor from solutions of copper
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/60Electroplating characterised by the structure or texture of the layers
    • C25D5/605Surface topography of the layers, e.g. rough, dendritic or nodular layers
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/60Electroplating characterised by the structure or texture of the layers
    • C25D5/615Microstructure of the layers, e.g. mixed structure
    • C25D5/617Crystalline layers
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D7/00Electroplating characterised by the article coated
    • C25D7/12Semiconductors
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/03Conductive materials
    • H05K2201/0332Structure of the conductor
    • H05K2201/0335Layered conductors or foils
    • H05K2201/0355Metal foils
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/03Metal processing
    • H05K2203/0307Providing micro- or nanometer scale roughness on a metal surface, e.g. by plating of nodules or dendrites
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/07Treatments involving liquids, e.g. plating, rinsing
    • H05K2203/0703Plating
    • H05K2203/0723Electroplating, e.g. finish plating

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Organic Chemistry (AREA)
  • Electrochemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Electroplating Methods And Accessories (AREA)
  • Manufacturing Of Printed Wiring (AREA)
  • Laminated Bodies (AREA)
  • Parts Printed On Printed Circuit Boards (AREA)
  • Other Surface Treatments For Metallic Materials (AREA)

Description

印刷配線板用銅箔及其製造方法Copper foil for printed wiring board and method of manufacturing same

本發明係關於一種耐化學性及黏著性優異之印刷配線板用銅箔及其製造方法。尤其對以BT(雙馬來醯亞胺三嗪)樹脂含浸基材為代表之封裝用基板,提供一種可對精細圖案形成時之化學品處理獲得較強之剝離強度,且可進行精細蝕刻之銅箔及其製造方法。又,於全面蝕刻銅箔後以無電電鍍形成銅圖案之方法中,提供一種可使剝離強度大幅提高之印刷配線板用銅箔及其製造方法。The present invention relates to a copper foil for a printed wiring board which is excellent in chemical resistance and adhesion, and a method for producing the same. In particular, a substrate for packaging represented by a BT (double-maleimide triazine) resin impregnated substrate provides a strong peel strength for chemical treatment during fine pattern formation, and can be finely etched. Copper foil and its manufacturing method. Further, in the method of forming a copper pattern by electroless plating after the copper foil is completely etched, a copper foil for a printed wiring board which can greatly improve the peel strength and a method for producing the same are provided.

半導體封裝基板用銅箔一般亦稱為印刷配線板用銅箔,通常藉由如下步驟而製作。首先,於高溫高壓下在合成樹脂等之基材上積層黏著銅箔。其次,為於基板上形成作為目標之導電性電路,而利用耐蝕刻性樹脂等材料於銅箔上印刷與電路同等之電路。The copper foil for a semiconductor package substrate is also generally referred to as a copper foil for a printed wiring board, and is usually produced by the following procedure. First, a copper foil is laminated on a substrate such as a synthetic resin under high temperature and high pressure. Next, in order to form a target conductive circuit on a substrate, a circuit equivalent to a circuit is printed on a copper foil using a material such as an etching resistant resin.

然後,將露出之銅箔之不要部分藉由蝕刻處理而去除。蝕刻後,將由樹脂等材料所構成之印刷部分去除,於基板上形成導電性電路。於所形成之導電性電路上,最後焊接既定元件,形成電子裝置用之各種印刷電路板。最終,與抗蝕劑或增層(build up)樹脂基板接合。一般而言,對印刷配線板用銅箔之品質要求在與樹脂基材黏著之黏著面(所謂粗化面)、及非黏著面(所謂光澤面)上不同,必須同時滿足兩者。Then, the unnecessary portion of the exposed copper foil is removed by etching. After the etching, the printed portion made of a material such as a resin is removed, and a conductive circuit is formed on the substrate. On the formed conductive circuit, the predetermined components are finally soldered to form various printed circuit boards for electronic devices. Finally, it is bonded to a resist or a build up resin substrate. In general, the quality of the copper foil for a printed wiring board is different between the adhesion surface to the resin substrate (so-called rough surface) and the non-adhesive surface (so-called glossy surface), and both must be satisfied.

作為對光澤面之要求,係要求:(1)外觀良好以及保存時無氧化變色、(2)焊料潤濕性良好、(3)高溫加熱時無氧化變色、(4)與抗蝕劑之密著性良好等。As a requirement for a glossy surface, it is required to have: (1) good appearance and no oxidative discoloration during storage, (2) good solder wettability, (3) no oxidative discoloration when heated at high temperature, and (4) dense with resist Good sex and so on.

另一方面,對於粗化面,主要可列舉:(1)保存時無氧化變色、(2)與基材之剝離強度於高溫加熱、濕式處理、焊接、化學品處理等之後亦充分、(3)並無在與基材之積層、蝕刻後產生的所謂積層污點等。On the other hand, the roughened surface mainly includes (1) no oxidative discoloration during storage, (2) peel strength with the substrate, and high temperature heating, wet processing, welding, chemical treatment, etc., 3) There is no so-called build-up stain or the like which is formed after lamination and etching with the substrate.

又,近年來隨著圖案之精細化,要求銅箔之低輪廓化。故,必須增加銅箔粗化面之剝離強度。Further, in recent years, as the pattern is refined, a low profile of the copper foil is required. Therefore, it is necessary to increase the peel strength of the roughened surface of the copper foil.

進而,電腦或行動通訊等之電子機器中,隨著通訊之高速化、大容量化,電氣訊號之高頻化正進展,要求可與其對應之印刷配線板及銅箔。若電氣訊號之頻率達1 GHz以上,則電流僅於導體之表面流動之集膚效應的影響變得顯著,無法忽視因表面之凹凸而造成電流傳輸路徑變化、阻抗增大之影響。就此方面而言,亦期望銅箔之表面粗糙度小。In addition, in the electronic devices such as computers and mobile communications, as the speed of communication increases and the capacity increases, the high frequency of electrical signals is progressing, and printed wiring boards and copper foils corresponding thereto are required. When the frequency of the electric signal is more than 1 GHz, the influence of the skin effect of the current flowing only on the surface of the conductor becomes remarkable, and the influence of the current transmission path change and the impedance increase due to the unevenness of the surface cannot be ignored. In this regard, it is also desirable that the surface roughness of the copper foil is small.

為應對上述要求,而對印刷配線板用銅箔提倡較多處理方法。In order to cope with the above requirements, a large number of treatment methods are advocated for copper foil for printed wiring boards.

一般而言,印刷配線板用銅箔之處理方法係使用壓延銅箔或電解銅箔,首先為提高銅箔與樹脂之黏著力(剝離強度),通常進行對銅箔表面賦予由銅及氧化銅所構成之微粒子的粗化處理。繼而,為使其具有耐熱防銹之特性,而形成黃銅或鋅等之耐熱處理層(障壁層)。然後,進而為防止搬運中或保管中之表面氧化等,實施浸漬或者電解鉻酸鹽處理或電解鉻鋅處理等防銹處理而製成製品。In general, a copper foil for printed wiring board is treated by using a rolled copper foil or an electrolytic copper foil. First, in order to improve the adhesion between the copper foil and the resin (peeling strength), copper and copper oxide are usually applied to the surface of the copper foil. The roughening treatment of the formed fine particles. Then, in order to have heat-resistant and rust-proof properties, a heat-resistant treatment layer (barrier layer) such as brass or zinc is formed. Then, in order to prevent oxidation of the surface during transportation or storage, a rust-preventing treatment such as immersion or electrolytic chromate treatment or electrolytic chromium-zinc treatment is performed to obtain a product.

其中,尤其粗化處理層擔負提高銅箔與樹脂之黏著力(剝離強度)之較大作用。習知,該粗化處理以呈圓形之(球狀)突起物為佳。該呈圓形之突起物係藉由抑制樹枝狀結晶之發展而達成者。但是,該呈圓形之突起物於蝕刻時會剝離而產生「落粉」之現象。該現象可謂理所當然。其原因在於,球狀突起物與銅箔之接觸面積與呈圓形之(球狀)突起物之直徑相比非常小。Among them, in particular, the roughening treatment layer plays a large role in improving the adhesion (peeling strength) between the copper foil and the resin. Conventionally, the roughening treatment is preferably a round (spherical) projection. The rounded protrusions are achieved by inhibiting the development of dendrites. However, the rounded projections are peeled off during etching to cause "falling powder". This phenomenon can be taken for granted. The reason for this is that the contact area between the spherical projections and the copper foil is very small compared to the diameter of the circular (spherical) projections.

為避免該「落粉」現象,而於上述粗化處理後,在突起物上形成較薄之鍍銅層,以防止突起物之剝離(參照專利文獻1)。其具有防止「落粉」之效果,但存在步驟增加、依該較薄之鍍銅層而「落粉」防止效果有所不同之問題。In order to avoid this "falling powder" phenomenon, a thin copper plating layer is formed on the projections after the roughening treatment to prevent peeling of the projections (see Patent Document 1). This has the effect of preventing "falling powder", but there is a problem in that the step is increased, and the effect of preventing the "falling powder" from being different depending on the thin copper plating layer.

又,已知於銅箔上形成由銅與鎳之合金所構成之針狀之結核狀被覆層的技術(專利文獻2)。該結核狀被覆層由於成為針狀,故認為與上述專利文獻1揭示之呈圓形之(球狀)突起物相比,與樹脂之黏著強度增加,但與成為基底之銅箔為成分不同之銅-鎳合金,故於形成銅之電路的蝕刻時,具有不同之蝕刻速度。因此,存在不適合於穩定之電路設計的問題。Further, a technique of forming a needle-shaped tuberculous coating layer composed of an alloy of copper and nickel on a copper foil is known (Patent Document 2). Since the tuberculous coating layer has a needle shape, it is considered that the adhesion strength to the resin is increased as compared with the circular (spherical) protrusion disclosed in Patent Document 1, but the composition is different from the copper foil serving as the base. Copper-nickel alloys have different etching velocities when etching copper circuits. Therefore, there is a problem that is not suitable for stable circuit design.

形成印刷配線板用銅箔時,通常形成耐熱防銹處理層。作為形成耐熱處理層之金屬或合金之例,形成有Zn、Cu-Ni、Cu-Co及Cu-Zn等之被覆層的多數銅箔已實用化(例如參照專利文獻3)。When a copper foil for a printed wiring board is formed, a heat-resistant rust-preventing treatment layer is usually formed. As an example of a metal or an alloy forming a heat-resistant layer, a plurality of copper foils having a coating layer of Zn, Cu-Ni, Cu-Co, and Cu-Zn have been put into practical use (for example, see Patent Document 3).

該等之中,形成有由Cu-Zn(黃銅)所構成之耐熱處理層的銅箔,於積層於由環氧樹脂等所構成之印刷電路板上之情況並無樹脂層之斑點,並且具有高溫加熱後之剝離強度之劣化少等優異特性,因此在工業上廣泛使用。Among these, a copper foil having a heat-resistant treatment layer made of Cu-Zn (brass) is formed, and when it is laminated on a printed circuit board made of an epoxy resin or the like, there is no spot of the resin layer, and It has excellent characteristics such as low deterioration of peel strength after high-temperature heating, and therefore is widely used industrially.

關於形成該由黃銅所構成之耐熱處理層的方法,專利文獻4及專利文獻5中有詳細說明。A method of forming the heat-resistant treatment layer made of brass is described in detail in Patent Document 4 and Patent Document 5.

形成有此種由黃銅所構成之耐熱處理層的銅箔,繼而為形成印刷電路而進行蝕刻處理。最近,印刷電路之形成時使用大量鹽酸系蝕刻液。A copper foil having such a heat-resistant treatment layer made of brass is formed, and then an etching process is performed to form a printed circuit. Recently, a large amount of hydrochloric acid-based etching liquid has been used in the formation of a printed circuit.

但,若對使用形成有由黃銅所構成之耐熱處理層的銅箔之印刷電路板,以鹽酸系蝕刻液(例如CuCl2 、FeCl3 等)進行蝕刻處理,將除印刷電路部分以外之銅箔之不要部分去除而形成導電性電路,則於電路圖案之兩側產生所謂電路端部(邊緣部)之侵蝕(電路侵蝕)現象,從而產生與樹脂基材之剝離強度劣化之問題。However, if a printed circuit board using a copper foil formed with a heat-resistant treatment layer made of brass is etched with a hydrochloric acid-based etching liquid (for example, CuCl 2 or FeCl 3 ), copper other than the printed circuit portion is used. When the foil is not partially removed to form a conductive circuit, the phenomenon of erosion (circuit erosion) at the end of the circuit (edge portion) occurs on both sides of the circuit pattern, thereby causing a problem that the peel strength with the resin substrate is deteriorated.

所謂該電路侵蝕現象,係指如下現象:自藉由上述蝕刻處理而形成之電路之銅箔與樹脂基材之黏著邊界層、即由黃銅所構成之耐熱防銹處理層露出之蝕刻側面,經上述蝕刻液侵蝕,且其後之水洗不足,因此通常呈黃色(由於係由黃銅所構成)之兩側經侵蝕而呈紅色,該部分之剝離強度明顯劣化。又,若該現象產生於電路圖案整面,則電路圖案自基材上剝離而成為問題。The phenomenon of the circuit erosion refers to a phenomenon in which an adhesion boundary layer of a copper foil and a resin substrate adhered to the circuit formed by the etching treatment, that is, a heat-resistant rust-preventing treatment layer made of brass, is exposed. After being etched by the above etching liquid, and subsequent water washing is insufficient, the sides which are usually yellow (since formed of brass) are red by etching, and the peeling strength of the portion is remarkably deteriorated. Moreover, if this phenomenon occurs on the entire surface of the circuit pattern, the circuit pattern is peeled off from the substrate and becomes a problem.

根據上述情況而提出,對銅箔之表面進行粗化處理、鋅或鋅合金之防銹處理及鉻酸鹽處理後,使含有少量鉻離子之矽烷偶合劑吸附於鉻酸鹽處理後之表面而提高耐鹽酸性(參照專利文獻7)。According to the above situation, after roughening the surface of the copper foil, rust-preventing treatment of zinc or zinc alloy, and chromate treatment, the decane coupling agent containing a small amount of chromium ions is adsorbed on the surface after the chromate treatment. The hydrochloric acid resistance is improved (refer to Patent Document 7).

專利文獻Patent literature

專利文獻1:日本特開平8-236930號公報Patent Document 1: Japanese Laid-Open Patent Publication No. Hei 8-236930

專利文獻2:日本專利第3459964號公報Patent Document 2: Japanese Patent No. 3459964

專利文獻3:日本特公昭51-35711號公報Patent Document 3: Japanese Patent Publication No. 51-35711

專利文獻4:日本特公昭54-6701號公報Patent Document 4: Japanese Patent Publication No. 54-6701

專利文獻5:日本專利第3306404號公報Patent Document 5: Japanese Patent No. 3306404

專利文獻6:日本特願2002-170827號公報Patent Document 6: Japanese Patent Application No. 2002-170827

專利文獻7:日本特開平3-122298號公報Patent Document 7: Japanese Patent Laid-Open No. Hei 3-122298

本發明之課題在於開發出不會使銅箔之其他諸特性劣化而避免上述電路侵蝕現象的半導體封裝基板用銅箔。本發明之課題尤其在於提供可改善銅箔之粗化處理層、可提高銅箔與樹脂之黏著強度的印刷配線板用銅箔及其製造方法。An object of the present invention is to develop a copper foil for a semiconductor package substrate which does not deteriorate other characteristics of the copper foil and avoids the above-described circuit erosion phenomenon. In particular, it is an object of the present invention to provide a copper foil for a printed wiring board which can improve the roughening treatment layer of the copper foil and which can improve the adhesion strength between the copper foil and the resin, and a method for producing the same.

為解決上述問題,本發明者進行銳意研究,結果提供以下之印刷配線板用銅箔及其製造方法。In order to solve the above problems, the inventors of the present invention conducted intensive studies, and as a result, provided the following copper foil for printed wiring boards and a method for producing the same.

1)一種印刷配線板用銅箔,其特徵在於:於銅箔之至少一面,具有直徑為0.1~2.0μm、縱與橫之比為1.5以上之針狀微細之銅粗化粒子所構成的粗化處理層。1) A copper foil for a printed wiring board, characterized in that it has a thickness of 0.1 to 2.0 μm on at least one side of the copper foil and has a needle-like fine copper roughening particle having a longitudinal to transverse ratio of 1.5 or more. Processing layer.

2)一種印刷配線板用銅箔,其特徵在於:於銅箔之至少一面,具有直徑為0.1~2.0μm、縱與橫之比為3.0以上之針狀微細之銅粗化粒子所構成的粗化處理層。2) A copper foil for a printed wiring board, which is characterized in that it has a thickness of 0.1 to 2.0 μm on at least one side of the copper foil and has a needle-like fine copper roughened particle having a longitudinal to transverse ratio of 3.0 or more. Processing layer.

3)如上述1)或2)之印刷配線板用銅箔,其中,針狀粗化粒子之數於電路寬度10μm中存在5個以上。(3) The copper foil for a printed wiring board according to the above 1) or 2), wherein the number of the needle-like roughened particles is five or more in a circuit width of 10 μm.

4)如上述1)或2)之印刷配線板用銅箔,其中,針狀粗化粒子之數於電路寬度10μm中存在10個以上。(4) The copper foil for a printed wiring board according to the above 1) or 2), wherein the number of the needle-like roughened particles is 10 or more in a circuit width of 10 μm.

5)如1)至4)中任一項之印刷配線板用銅箔,其中,於上述粗化處理層上具備含有選自鋅、鎳、銅、磷中至少一種以上元素的耐熱防銹層,於該耐熱防銹層上具備鉻酸鹽皮膜層,並且於該鉻酸鹽皮膜層上具備矽烷偶合劑層。(5) The copper foil for a printed wiring board according to any one of the present invention, wherein the roughened layer has a heat-resistant rust-proof layer containing at least one element selected from the group consisting of zinc, nickel, copper, and phosphorus. A chromate coating layer is provided on the heat-resistant rust-preventing layer, and a decane coupling agent layer is provided on the chromate coating layer.

6)一種印刷配線板用銅箔之製造方法,其特徵在於:使用由含有選自硫酸烷基酯鹽、鎢離子、砷離子中之物質之至少一種以上的硫酸/硫酸銅所構成之電解浴,於銅箔之至少一面形成直徑為0.1~2.0μm、縱與橫之比為1.5以上之針狀微細之銅粗化粒子所構成的粗化處理層。6) A method for producing a copper foil for a printed wiring board, comprising: using an electrolytic bath comprising at least one of sulfuric acid/copper sulfate containing at least one selected from the group consisting of an alkyl sulfate salt, a tungsten ion, and an arsenic ion; A roughened layer composed of needle-shaped fine copper roughened particles having a diameter of 0.1 to 2.0 μm and a longitudinal and lateral ratio of 1.5 or more is formed on at least one surface of the copper foil.

7)如6)之印刷配線板用銅箔之製造方法,於上述粗化處理層上形成含有選自鋅、鎳、銅、磷中至少一種以上元素的耐熱防銹層,繼而於該耐熱防銹層上形成鉻酸鹽皮膜層,進而於該鉻酸鹽皮膜層上形成矽烷偶合劑層。(7) The method for producing a copper foil for a printed wiring board according to 6), wherein a heat-resistant rust-preventing layer containing at least one element selected from the group consisting of zinc, nickel, copper, and phosphorus is formed on the roughened layer, and then the heat-resistant layer is formed A chromate coating layer is formed on the rust layer, and a decane coupling agent layer is formed on the chromate coating layer.

[發明之效果][Effects of the Invention]

如上所示,本發明之印刷配線板用銅箔並非習知認為良好之粗化處理的呈圓形之(球狀)突起物,而係於銅箔之至少一面具有針狀微細之粗化粒子者。藉此具有如下優異效果:可提高銅箔本身與樹脂之黏著強度,可對於封裝用基板提供對精細圖案形成時之化學品處理亦可增大剝離強度,且可進行精細蝕刻之銅箔及其製造方法。As described above, the copper foil for a printed wiring board of the present invention is not a rounded (spherical) protrusion which is conventionally considered to be a good roughening treatment, and has a needle-like fine roughened particle on at least one side of the copper foil. By. Thereby, the following effects are obtained: the adhesion strength of the copper foil itself to the resin can be improved, and the substrate for packaging can be provided with a chemical treatment for fine pattern formation, which can also increase the peel strength, and the copper foil which can be finely etched and Production method.

近年來,於印刷電路之精細圖案化以及高頻化進行之過程中,作為印刷電路用銅箔(半導體封裝基板用銅箔)以及將半導體封裝基板用銅箔與半導體封裝用樹脂貼合而製作之半導體封裝用基板極為有效。In recent years, in the process of fine patterning and high-frequency printing of printed circuits, copper foil for printed circuit (copper foil for semiconductor package substrate) and copper foil for semiconductor package substrate are bonded to resin for semiconductor packaging. The substrate for semiconductor packaging is extremely effective.

其次,為便於理解本發明,而對本發明進行具體且詳細之說明。本發明中使用之銅箔可為電解銅箔或壓延銅箔之任一者。Next, the present invention will be specifically and specifically described in order to facilitate the understanding of the present invention. The copper foil used in the present invention may be either an electrolytic copper foil or a rolled copper foil.

如上所述,本發明之印刷配線板用銅箔並非習知認為良好之粗化處理的呈圓形之(球狀)突起物,而係於銅箔之至少一面形成針狀微細之銅粗化粒子者。其形狀係直徑為0.1~2.0μm、縱(長度)與橫(直徑)之比為1.5以上之粗化處理層。As described above, the copper foil for a printed wiring board of the present invention is not a rounded (spherical) projection which is conventionally considered to be excellent in roughening treatment, and is formed into a needle-like fine copper roughening on at least one side of the copper foil. Particles. The shape is a roughened layer having a diameter of 0.1 to 2.0 μm and a ratio of the longitudinal (length) to the transverse (diameter) of 1.5 or more.

進而,較佳為直徑為0.1~2.0μm、縱與橫之比為3.0以上之針狀微細之銅粗化粒子,即較長之粗化粒子。Further, it is preferably needle-shaped fine copper roughened particles having a diameter of 0.1 to 2.0 μm and a longitudinal to transverse ratio of 3.0 or more, that is, long roughened particles.

該銅粗化粒子之形狀具有約為馬尾(horsetail)之形狀,如後述之顯微鏡相片所示,多為上方具有鼓起者。最小直徑與最大直徑之比為1:1~1:1.2左右。該比成為進一步提高黏著力之要因,若具有上述數值之針狀體,則可充分達成本發明之目的。The shape of the copper roughened particles has a shape of a horsetail, and as shown in a microscope photograph to be described later, it is often a bulge. The ratio of the minimum diameter to the maximum diameter is about 1:1 to 1:1.2. This ratio is a factor for further improving the adhesion, and the needle of the above numerical value can sufficiently achieve the object of the present invention.

又,該針狀微細之銅粗化粒子中,並非無直徑偏離0.1~2.0μm、縱(長度)與橫(直徑)之比偏離1.5以上之數值者,例如長度較短者、異形狀之粒子的情況,但若其量為整體之5%以內,則不會對銅箔本身與樹脂之黏著強度造成影響。Further, in the needle-shaped fine copper roughened particles, the diameter is not deviated by 0.1 to 2.0 μm, and the ratio of the longitudinal (length) to the transverse (diameter) is deviated from 1.5 or more, for example, a shorter length or a differently shaped particle. In the case of the resin, if the amount is within 5% of the whole, the adhesion strength between the copper foil itself and the resin is not affected.

於蝕刻印刷配線板用銅箔而形成電路之情況,較佳為上述銅之針狀粗化粒子之數於電路寬度10μm中存在5個以上。藉此,可使銅箔與樹脂之黏著強度大幅提高。尤佳為銅之針狀粗化粒子之數於電路寬度10μm中存在10個以上。由針狀微細之銅粗化粒子所構成的粗化處理層可使用由含有選自硫酸烷基酯鹽、鎢離子、砷離子中之物質之至少一種以上的硫酸/硫酸銅所構成之電解浴而製造。In the case where the circuit is formed by etching a copper foil for a printed wiring board, it is preferable that the number of the needle-like roughened particles of the copper is five or more in a circuit width of 10 μm. Thereby, the adhesion strength between the copper foil and the resin can be greatly improved. More preferably, the number of needle-like roughened particles of copper is 10 or more in a circuit width of 10 μm. An electrolytic bath composed of at least one of sulfuric acid/copper sulfate containing at least one selected from the group consisting of an alkyl sulfate salt, a tungsten ion, and an arsenic ion can be used as the roughened layer composed of the acicular fine copper roughened particles. And manufacturing.

為防止落粉、提高剝離強度,由針狀微細之銅粗化粒子所構成的粗化處理層較佳為利用由硫酸/硫酸銅所構成之電解浴而進行包層鍍敷。In order to prevent falling powder and to improve peeling strength, the roughened layer composed of acicular fine copper roughened particles is preferably subjected to cladding plating using an electrolytic bath composed of sulfuric acid/copper sulfate.

具體之處理條件如下。The specific processing conditions are as follows.

(液組成1)(liquid composition 1)

CuSO4 ‧5H2 O:39.3~118 g/LCuSO 4 ‧5H 2 O: 39.3 to 118 g/L

Cu:10~30 g/LCu: 10 to 30 g/L

H2 SO4 :10~150 g/LH 2 SO 4 : 10 to 150 g/L

Na2 WO4 ‧2H2 O:0~90 mg/LNa 2 WO 4 ‧2H 2 O: 0 to 90 mg/L

W:0~50 mg/LW: 0 to 50 mg/L

十二烷基硫酸鈉:0~50 mgSodium lauryl sulfate: 0-50 mg

H3 AsO3 (60%水溶液):0~6315 mg/LH 3 AsO 3 (60% aqueous solution): 0 to 6315 mg/L

As:0~2000 mg/LAs: 0 to 2000 mg/L

(電鍍條件1)(plating condition 1)

溫度:30~70℃Temperature: 30 ~ 70 ° C

(電流條件1)(current condition 1)

電流密度:25~110 A/dm2 Current density: 25 ~ 110 A / dm 2

粗化庫侖量:50~500 As/dm2 Coarse coulomb amount: 50 ~ 500 As / dm 2

鍍敷時間:0.5~20秒Plating time: 0.5 to 20 seconds

(液組成2)(liquid composition 2)

CuSO4 ‧5H2 O:78~314 g/LCuSO 4 ‧5H 2 O: 78~314 g/L

Cu:20~80 g/LCu: 20 to 80 g/L

H2 SO4 :50~200 g/LH 2 SO 4 : 50 to 200 g/L

(電鍍條件2)(plating condition 2)

溫度:30~70℃Temperature: 30 ~ 70 ° C

(電流條件2)(current condition 2)

電流密度:5~50 A/dm2 Current density: 5 to 50 A/dm 2

粗化庫侖量:50~300 As/dm2 Coarse coulomb amount: 50 to 300 As/dm 2

鍍敷時間:1~60秒Plating time: 1 to 60 seconds

進而,於上述粗化處理層上進一步形成含有選自鋅、鎳、銅、磷中至少一種以上元素的耐熱防銹層,於該耐熱防銹層上形成鉻酸鹽皮膜層,並且於該鉻酸鹽皮膜層上形成矽烷偶合劑層,從而可製成印刷配線板用銅箔。Further, a heat-resistant rust-preventing layer containing at least one element selected from the group consisting of zinc, nickel, copper, and phosphorus is further formed on the roughened layer, and a chromate film layer is formed on the heat-resistant rust-preventing layer, and the chromium is formed on the rust-resistant layer. A layer of a decane coupling agent is formed on the acid salt film layer to form a copper foil for a printed wiring board.

作為耐熱防銹層,並無特別限制,可使用習知之耐熱防銹層。例如對於半導體封裝基板用銅箔,可使用習知使用之黃銅被覆層。The heat-resistant rust-preventing layer is not particularly limited, and a conventional heat-resistant rust-proof layer can be used. For example, as the copper foil for a semiconductor package substrate, a conventionally used brass coating layer can be used.

進而,於該耐熱防銹層上形成鉻酸鹽皮膜層及矽烷偶合劑層而作為銅箔之至少與樹脂之黏著面。將具有由該等鉻酸鹽皮膜層及矽烷偶合劑層所構成之被覆層的銅箔積層黏著於樹脂上,進而,於該銅箔上形成耐蝕刻性印刷電路後,藉由蝕刻將除印刷電路部分以外之銅箔之不要部分去除,從而形成導電性電路。Further, a chromate coating layer and a decane coupling agent layer are formed on the heat-resistant rust-preventing layer to form at least an adhesion surface of the copper foil to the resin. A copper foil layer having a coating layer composed of the chromate coating layer and the decane coupling agent layer is adhered to the resin, and an etching resistive printed circuit is formed on the copper foil, and then the printing is performed by etching. The copper foil other than the circuit portion is not partially removed, thereby forming a conductive circuit.

作為耐熱防銹層,可使用現存之處理,具體而言例如可使用如下者。As the heat-resistant rust-preventing layer, an existing treatment can be used, and specifically, for example, the following can be used.

(液組成)(liquid composition)

NaOH:40~200 g/LNaOH: 40 ~ 200 g / L

NaCN:70~250 g/LNaCN: 70~250 g/L

CuCN:50~200 g/LCuCN: 50 ~ 200 g / L

Zn(CN)2 :2~100 g/LZn(CN) 2 : 2 to 100 g/L

As2 O3 :0.01~1 g/LAs 2 O 3 : 0.01 to 1 g/L

(液溫)(liquid temperature)

40~90℃40~90°C

(電流條件)(current condition)

電流密度:1~50 A/dm2 Current density: 1 to 50 A/dm 2

鍍敷時間:1~20秒Plating time: 1 to 20 seconds

上述鉻酸鹽皮膜層可使用電解鉻酸鹽皮膜層或浸漬鉻酸鹽皮膜層。該鉻酸鹽皮膜層較佳為Cr量為25~150 μg/dm2The chromate coating layer may be an electrolytic chromate coating layer or an impregnated chromate coating layer. The chromate coating layer preferably has a Cr content of 25 to 150 μg/dm 2 .

若Cr量小於25 μg/dm2 ,則無防銹層效果。又,若Cr量超過150 μg/dm2 ,則效果飽和,故造成浪費。因此,Cr量宜設為25~150 μg/dm2If the amount of Cr is less than 25 μg/dm 2 , there is no rust-proof layer effect. Further, when the amount of Cr exceeds 150 μg/dm 2 , the effect is saturated, which is wasteful. Therefore, the amount of Cr should be set to 25 to 150 μg/dm 2 .

以下記載用以形成上述鉻酸鹽皮膜層之條件之例。但是,如上所述,不必限定於該條件,已公知之鉻酸鹽處理中任一種均可使用。該防銹處理係對耐酸性造成影響之因素之一,藉由鉻酸鹽處理,耐酸性進一步提高。An example of the conditions for forming the chromate coating layer described below is described below. However, as described above, it is not necessarily limited to this condition, and any of the known chromate treatments can be used. The rust-preventing treatment is one of the factors affecting the acid resistance, and the acid resistance is further improved by the chromate treatment.

(a)浸漬鉻酸鹽處理(a) impregnated chromate treatment

K2 Cr2 O7 :1~5 g/L,pH:2.5~4.5,溫度:40~60℃,時間:0.5~8秒K 2 Cr 2 O 7 : 1 to 5 g / L, pH: 2.5 to 4.5, temperature: 40 to 60 ° C, time: 0.5 to 8 seconds

(b)電解鉻酸鹽處理(鉻鋅處理(鹼性浴))(b) electrolytic chromate treatment (chromium zinc treatment (alkaline bath))

K2 Cr2 O7 :0.2~20 g/L,酸:磷酸、硫酸、有機酸,pH:1.0~3.5,溫度:20~40℃,電流密度:0.1~5 A/dm2 ,時間:0.5~8秒K 2 Cr 2 O 7 : 0.2 to 20 g/L, acid: phosphoric acid, sulfuric acid, organic acid, pH: 1.0 to 3.5, temperature: 20 to 40 ° C, current density: 0.1 to 5 A/dm 2 , time: 0.5 ~8 seconds

(c)電解鉻鋅處理(鹼性浴)(c) Electrolytic chromium and zinc treatment (alkaline bath)

K2 Cr2 O7 (Na2 Cr2 O7 或CrO3 ):2~10 g/L,NaOH或KOH:10~50 g/L,ZnOH或ZnSO4 ‧7H2 O:0.05~10 g/L,pH:7~13,浴溫:20~80℃,電流密度:0.05~5 A/dm2 ,時間:5~30秒K 2 Cr 2 O 7 (Na 2 Cr 2 O 7 or CrO 3 ): 2 to 10 g/L, NaOH or KOH: 10 to 50 g/L, ZnOH or ZnSO 4 ‧7H 2 O: 0.05 to 10 g/ L, pH: 7 to 13, bath temperature: 20 to 80 ° C, current density: 0.05 to 5 A / dm 2 , time: 5 to 30 seconds

(d)電解鉻酸鹽處理(鉻鋅處理(酸性浴))(d) electrolytic chromate treatment (chromium zinc treatment (acid bath))

K2 Cr2 O7 :2~10 g/L,Zn:0~0.5 g/L,Na2 SO4 :5~20 g/L,pH:3.5~5.0,浴溫:20~40℃,電流密度:0.1~3.0 A/dm2 ,時間:1~30秒K 2 Cr 2 O 7 : 2 to 10 g / L, Zn: 0 to 0.5 g / L, Na 2 SO 4 : 5 to 20 g / L, pH: 3.5 to 5.0, bath temperature: 20 to 40 ° C, current Density: 0.1 ~ 3.0 A / dm 2 , time: 1 ~ 30 seconds

作為本發明之半導體封裝基板用銅箔中所使用之矽烷偶合劑層,可使用通常用於銅箔之矽烷偶合劑,並無特別限制。例如若表示矽烷處理之具體條件,則如下所示。The decane coupling agent layer used in the copper foil for a semiconductor package substrate of the present invention can be a decane coupling agent which is usually used for a copper foil, and is not particularly limited. For example, if the specific conditions of the decane treatment are shown, the following is shown.

0.2%環氧矽烷/0.4% TEOS,pH50.2% epoxy decane / 0.4% TEOS, pH 5

亦可使用四烷氧基矽烷、含有1種以上具備具有與樹脂之反應性之官能基的烷氧基矽烷者。該矽烷偶合劑層之選擇亦為任意,但可以說較佳為考慮到與樹脂之黏著性的選擇。A tetraalkoxy decane or an alkoxy decane containing one or more functional groups having reactivity with a resin can also be used. The selection of the decane coupling agent layer is also arbitrary, but it can be said that it is preferable to consider the adhesion to the resin.

實施例Example

其次,對實施例及比較例進行說明。再者,本實施例係舉出較佳之例者,本發明並不限定於該等實施例。因此,本發明之技術思想中所包含之變形、其他實施例或態樣皆包含於本發明。Next, examples and comparative examples will be described. Furthermore, the present embodiment is a preferred embodiment, and the present invention is not limited to the embodiments. Therefore, variations, other embodiments, or aspects included in the technical idea of the present invention are included in the present invention.

再者,為與本發明進行對比而揭示比較例。Further, a comparative example is disclosed in comparison with the present invention.

(實施例1)(Example 1)

使用厚度12μm之電解銅箔,對該銅箔之粗面(粗糙面:M面)進行下述所示之粗化鍍敷。以下表示處理條件。The rough surface (rough surface: M surface) of the copper foil was subjected to rough plating as described below using an electrolytic copper foil having a thickness of 12 μm. The processing conditions are shown below.

(液組成1)(liquid composition 1)

CuSO4 ‧5H2 O:58.9 g/LCuSO 4 ‧5H 2 O: 58.9 g/L

Cu:15 g/LCu: 15 g/L

H2 SO4 :100 g/LH 2 SO 4 : 100 g/L

As添加量:1000 ppm:使用H3 AsO3 (60%水溶液)As addition amount: 1000 ppm: using H 3 AsO 3 (60% aqueous solution)

(電鍍溫度1)50℃(plating temperature 1) 50 ° C

(電流條件1)(current condition 1)

電流密度:90 A/dm2 Current density: 90 A/dm 2

粗化庫侖量:200 As/dm2 Coarse coulomb amount: 200 As/dm 2

本粗化處理之後,進行下述所示之正常鍍敷。以下表示處理條件。After the roughening treatment, normal plating as shown below was performed. The processing conditions are shown below.

(液組成2)(liquid composition 2)

CuSO4 ‧5H2 O:156 g/LCuSO 4 ‧5H 2 O: 156 g/L

Cu:40 g/LCu: 40 g/L

H2 SO4 :100 g/LH 2 SO 4 : 100 g/L

(電鍍溫度1)40℃(plating temperature 1) 40 ° C

(電流條件1)(current condition 1)

電流密度:30 A/dm2 Current density: 30 A/dm 2

粗化庫侖量:150 As/dm2 Coarse coulomb amount: 150 As/dm 2

將實施例1之粗化處理層之SEM相片示於圖1。圖1所示之左側之掃描式電子顯微鏡(scanning electron microscope,SEM)相片之倍率為(×3000),右側之SEM相片之倍率為(×30000)。如該圖1所示,可知形成為針狀之粒子形狀。平均之粒子直徑為0.57μm,粒子之長度為1.56μm,縱與橫之比為2.7,滿足本發明之條件。The SEM photograph of the roughened layer of Example 1 is shown in Fig. 1. The magnification of the scanning electron microscope (SEM) photograph on the left side shown in Fig. 1 is (×3000), and the magnification of the SEM photograph on the right side is (×30000). As shown in FIG. 1, it is understood that the shape of the particles is formed into a needle shape. The average particle diameter was 0.57 μm, the length of the particles was 1.56 μm, and the ratio of the longitudinal to the transverse direction was 2.7, which satisfied the conditions of the present invention.

其次,於上述銅之粗化處理面上形成耐熱防銹層。該條件可使用已公知之耐熱防銹層,本實施例中係以如下條件實施。Next, a heat-resistant rust-preventing layer is formed on the copper roughened surface. As the condition, a known heat-resistant rust-preventing layer can be used, and in the present embodiment, it is carried out under the following conditions.

(液組成)(liquid composition)

NaOH:72 g/LNaOH: 72 g / L

NaCN:112 g/LNaCN: 112 g/L

CuCN:91.6 g/L(Cu:65 g/L)CuCN: 91.6 g/L (Cu: 65 g/L)

Zn(CN)2 :8.1 g/L(Zn:4.5 g/L)Zn(CN) 2 : 8.1 g/L (Zn: 4.5 g/L)

As2 O3 :0.125 g/L(As:95 ppm)As 2 O 3 : 0.125 g/L (As: 95 ppm)

(液溫)76.5℃(liquid temperature) 76.5 ° C

(電流條件)(current condition)

電流密度:6.7 A/dm2 Current density: 6.7 A/dm 2

電流:4.0 ACurrent: 4.0 A

鍍敷時間:5秒Plating time: 5 seconds

其次,於耐熱防銹層上進行電解鉻酸鹽處理。Next, electrolytic chromate treatment is performed on the heat-resistant rustproof layer.

電解鉻酸鹽處理(鉻鋅處理(酸性浴))Electrolytic chromate treatment (chromium zinc treatment (acid bath))

Cr2 O3 :0.73 g/LCr 2 O 3 : 0.73 g/L

ZnSO4 ‧7H2 O:2.46 g/LZnSO 4 ‧7H 2 O: 2.46 g/L

Na2 SO4 :18 g/LNa 2 SO 4 : 18 g/L

H3 PO3 :0.53 g/LH 3 PO 3 : 0.53 g/L

pH:4.6,浴溫:37℃pH: 4.6, bath temperature: 37 ° C

電流密度:2.06 A/dm2 Current density: 2.06 A/dm 2

時間:1~30秒Time: 1 to 30 seconds

(pH調整係以硫酸或氫氧化鉀實施)(pH adjustment is carried out with sulfuric acid or potassium hydroxide)

其次,於該鉻酸鹽皮膜層上實施矽烷處理(藉由塗布)。Next, a decane treatment (by coating) is performed on the chromate coating layer.

矽烷處理之條件如下。The conditions for the treatment of decane are as follows.

0.2%環氧矽烷/0.4% TEOS,pH50.2% epoxy decane / 0.4% TEOS, pH 5

將以上述方式製作之銅箔積層黏著於玻璃布基材BT(雙順丁烯二醯亞胺‧三嗪)樹脂板上,對以下項目進行測定或分析。The copper foil layer produced in the above manner was adhered to a glass cloth substrate BT (bis-butylene diamine ‧ triazine) resin plate, and the following items were measured or analyzed.

(1)落粉之觀察(1) Observation of falling powder

未確認到落粉。將該結果示於表1。No powder was confirmed. The results are shown in Table 1.

(2)常態剝離強度(2) Normal peel strength

常態剝離強度為0.79 kg/cm,具有良好之剝離強度。將該結果示於表1。The normal peel strength is 0.79 kg/cm and has good peel strength. The results are shown in Table 1.

(3)耐鹽酸性試驗(3) Hydrochloric acid resistance test

關於耐鹽酸性,係將於0.4 mm電路中,使用12 wt%鹽酸於60℃下浸漬90分鐘後之損耗(Loss)量以%表示者。以下同樣。損耗(Loss)量為5%,與後述之比較例相比損耗(Loss)量少,表現出良好之性質。將該結果示於表1。Regarding hydrochloric acid resistance, the amount of loss (Loss) in a 0.4 mm circuit after immersion for 90 minutes at 60 ° C using 12 wt% hydrochloric acid is expressed in %. The same is true below. The amount of loss (Loss) was 5%, and the amount of loss (Loss) was small as compared with the comparative example described later, and exhibited good properties. The results are shown in Table 1.

(4)耐硫酸過氧化氫性(硫酸10%,過氧化氫2%,室溫:30℃)之試驗結果(4) Test results of sulfuric acid-resistant hydrogen peroxide (sulfuric acid 10%, hydrogen peroxide 2%, room temperature: 30 ° C)

於0.4 mm電路中實施。此時,對蝕刻2μm之情況進行調查。將損耗(Loss)量以%表示。以下同樣。將該結果示於表1。Implemented in a 0.4 mm circuit. At this time, the case of etching 2 μm was investigated. The amount of loss (Loss) is expressed in %. The same is true below. The results are shown in Table 1.

如表1所示,Loss量少至6.6%,耐硫酸過氧化氫性良好。As shown in Table 1, the amount of Loss was as small as 6.6%, and the sulfuric acid-resistant hydrogen peroxide was good.

(實施例2)(Example 2)

使用厚度12μm之電解銅箔,對該銅箔之粗面(粗糙面:M面)進行下述所示之粗化鍍敷及與實施例1相同之正常鍍敷。以下表示粗化鍍敷處理條件。The rough surface (rough surface: M surface) of the copper foil was subjected to rough plating as shown below and normal plating similar to that of Example 1 using an electrolytic copper foil having a thickness of 12 μm. The roughening plating treatment conditions are shown below.

(液組成1)(liquid composition 1)

CuSO4 ‧5H2 O:58.9 g/LCuSO 4 ‧5H 2 O: 58.9 g/L

Cu:15 g/LCu: 15 g/L

H2 SO4 :100 g/LH 2 SO 4 : 100 g/L

Na2 WO4 ‧2H2 O:5.4 mg/LNa 2 WO 4 ‧2H 2 O: 5.4 mg/L

W添加量:3 ppmW addition amount: 3 ppm

(電鍍溫度1)50℃(plating temperature 1) 50 ° C

(電流條件1)(current condition 1)

電流密度:40 A/dm2 Current density: 40 A/dm 2

粗化庫侖量:300 As/dm2 Coarse coulomb amount: 300 As/dm 2

將實施例2之粗化處理層之SEM相片示於圖2。圖2所示之左側之SEM相片之倍率為(×3000),右側之SEM相片之倍率為(×30000)。如該圖2所示,可知形成為針狀之粒子形狀。平均之粒子直徑為0.67μm,粒子之長度為1.78μm,縱與橫之比為2.7,滿足本發明之條件。The SEM photograph of the roughened layer of Example 2 is shown in Fig. 2. The magnification of the SEM photograph on the left side shown in Fig. 2 is (×3000), and the magnification of the SEM photograph on the right side is (×30000). As shown in FIG. 2, it is understood that the shape of the particles is formed into a needle shape. The average particle diameter was 0.67 μm, the length of the particles was 1.78 μm, and the ratio of the longitudinal to the transverse direction was 2.7, which satisfied the conditions of the present invention.

其次,於上述銅之粗化處理面上形成與實施例1相同之耐熱防銹層,於該耐熱防銹層上進行電解鉻酸鹽處理,進而於該鉻酸鹽皮膜層上實施矽烷處理(藉由塗布)。Next, a heat-resistant rust-preventing layer similar to that of the first embodiment is formed on the roughened surface of the copper, an electrolytic chromate treatment is performed on the heat-resistant rust-preventing layer, and decane treatment is performed on the chromate coating layer ( By coating).

將以上述方式製作之銅箔積層黏著於玻璃布基材BT(雙馬來醯亞胺三嗪)樹脂板上,對以下項目進行測定或分析。The copper foil layer produced in the above manner was adhered to a glass cloth substrate BT (Bismaleimide Triazine) resin plate, and the following items were measured or analyzed.

(1)落粉之觀察(1) Observation of falling powder

未確認到落粉。將該結果示於表1。No powder was confirmed. The results are shown in Table 1.

(2)常態剝離強度(2) Normal peel strength

常態剝離強度為0.83 kg/cm,具有良好之剝離強度。將該結果示於表1。The normal peel strength is 0.83 kg/cm and has good peel strength. The results are shown in Table 1.

(3)耐鹽酸性試驗(3) Hydrochloric acid resistance test

關於耐鹽酸性,係將於0.4 mm電路中,使用12 wt%鹽酸於60℃下浸漬90分鐘後之損耗(Loss)量以%表示者。以下同樣。損耗(Loss)量為2.3%,與後述之比較例相比損耗(Loss)量少,表現出良好之性質。將該結果示於表1。Regarding hydrochloric acid resistance, the amount of loss (Loss) in a 0.4 mm circuit after immersion for 90 minutes at 60 ° C using 12 wt% hydrochloric acid is expressed in %. The same is true below. The amount of loss (Loss) was 2.3%, and the amount of loss (Loss) was small as compared with the comparative example described later, and exhibited good properties. The results are shown in Table 1.

(4)耐硫酸過氧化氫性(硫酸10%,過氧化氫2%,室溫:30℃)之試驗結果(4) Test results of sulfuric acid-resistant hydrogen peroxide (sulfuric acid 10%, hydrogen peroxide 2%, room temperature: 30 ° C)

於0.4 mm電路中實施。此時,對蝕刻2μm之情況進行調查。將損耗(Loss)量以%表示。以下同樣。將該結果示於表1。Implemented in a 0.4 mm circuit. At this time, the case of etching 2 μm was investigated. The amount of loss (Loss) is expressed in %. The same is true below. The results are shown in Table 1.

如表1所示,Loss量少至4.4%,耐硫酸過氧化氫性良好。As shown in Table 1, the amount of Loss was as low as 4.4%, and the sulfuric acid resistant to sulfuric acid was good.

(實施例3)(Example 3)

使用厚度12μm之電解銅箔,對該銅箔之粗面(粗糙面:M面)進行下述所示之粗化鍍敷及與實施例1相同之正常鍍敷。以下表示粗化鍍敷處理條件。The rough surface (rough surface: M surface) of the copper foil was subjected to rough plating as shown below and normal plating similar to that of Example 1 using an electrolytic copper foil having a thickness of 12 μm. The roughening plating treatment conditions are shown below.

(液組成1)(liquid composition 1)

CuSO4 ‧5H2 O:58.9 g/LCuSO 4 ‧5H 2 O: 58.9 g/L

Cu:15 g/LCu: 15 g/L

H2 SO4 :100 g/LH 2 SO 4 : 100 g/L

十二烷基硫酸鈉添加量:10 ppmSodium lauryl sulfate addition: 10 ppm

(電鍍溫度1) 50℃(plating temperature 1) 50 ° C

(電流條件1)(current condition 1)

電流密度:100 A/dm2 Current density: 100 A/dm 2

粗化庫侖量:200 As/dm2 Coarse coulomb amount: 200 As/dm 2

將實施例3之粗化處理層之SEM相片示於圖3。圖3所示之左側之SEM相片之倍率為(×3000),右側之SEM相片之倍率為(×30000)。如該圖3所示,可知雖亦有稍接近球狀者,但仍維持針狀之粒子形狀。平均之粒子直徑為0.6μm,粒子之長度為1.5μm,縱與橫之比為2.5,滿足本發明之條件。The SEM photograph of the roughened layer of Example 3 is shown in Fig. 3. The magnification of the SEM photograph on the left side shown in Fig. 3 is (×3000), and the magnification of the SEM photograph on the right side is (×30000). As shown in Fig. 3, it is understood that although the shape is slightly closer to the spherical shape, the shape of the needle-like particles is maintained. The average particle diameter was 0.6 μm, the length of the particles was 1.5 μm, and the ratio of the longitudinal to the transverse was 2.5, which satisfied the conditions of the present invention.

其次,於上述銅之粗化處理面上形成與實施例1相同之耐熱防銹層,於該耐熱防銹層上進行電解鉻酸鹽處理,進而於該鉻酸鹽皮膜層上實施矽烷處理(藉由塗布)。Next, a heat-resistant rust-preventing layer similar to that of the first embodiment is formed on the roughened surface of the copper, an electrolytic chromate treatment is performed on the heat-resistant rust-preventing layer, and decane treatment is performed on the chromate coating layer ( By coating).

將以上述方式製作之銅箔積層黏著於玻璃布基材BT(雙馬來醯亞胺三嗪)樹脂板上,對以下項目進行測定或分析。The copper foil layer produced in the above manner was adhered to a glass cloth substrate BT (Bismaleimide Triazine) resin plate, and the following items were measured or analyzed.

(1)落粉之觀察(1) Observation of falling powder

未確認到落粉。將該結果示於表1。No powder was confirmed. The results are shown in Table 1.

(2)常態剝離強度(2) Normal peel strength

常態剝離強度為0.75 kg/cm,具有良好之剝離強度。將該結果示於表1。The normal peel strength is 0.75 kg/cm and has good peel strength. The results are shown in Table 1.

(3)耐鹽酸性試驗(3) Hydrochloric acid resistance test

關於耐鹽酸性,係將於0.4 mm電路中,使用12 wt%鹽酸於60℃下浸漬90分鐘後之損耗(Loss)量以%表示者。以下同樣。損耗(Loss)量為7.8%,與後述之比較例相比損耗(Loss)量少,表現出良好之性質。將該結果示於表1。Regarding hydrochloric acid resistance, the amount of loss (Loss) in a 0.4 mm circuit after immersion for 90 minutes at 60 ° C using 12 wt% hydrochloric acid is expressed in %. The same is true below. The amount of loss (Loss) was 7.8%, and the amount of loss (Loss) was small as compared with the comparative example described later, and exhibited good properties. The results are shown in Table 1.

(4)耐硫酸過氧化氫性(硫酸10%,過氧化氫2%,室溫:30℃)之試驗結果(4) Test results of sulfuric acid-resistant hydrogen peroxide (sulfuric acid 10%, hydrogen peroxide 2%, room temperature: 30 ° C)

於0.4 mm電路中實施。此時,對蝕刻2μm之情況進行調查。將損耗(Loss)量以%表示。以下同樣。將該結果示於表1。Implemented in a 0.4 mm circuit. At this time, the case of etching 2 μm was investigated. The amount of loss (Loss) is expressed in %. The same is true below. The results are shown in Table 1.

如表1所示,Loss量少至8.7%,耐硫酸過氧化氫性良好。As shown in Table 1, the amount of Loss was as small as 8.7%, and the sulfuric acid-resistant hydrogen peroxide was good.

(實施例4)(Example 4)

使用厚度12μm之電解銅箔,對該銅箔之粗面(粗糙面:M面)進行下述所示之粗化鍍敷及與實施例1相同之正常鍍敷。以下表示粗化鍍敷處理條件。The rough surface (rough surface: M surface) of the copper foil was subjected to rough plating as shown below and normal plating similar to that of Example 1 using an electrolytic copper foil having a thickness of 12 μm. The roughening plating treatment conditions are shown below.

(液組成1)(liquid composition 1)

CuSO4 ‧5H2 O:58.9 g/LCuSO 4 ‧5H 2 O: 58.9 g/L

Cu:15 g/LCu: 15 g/L

H2 SO4 :100 g/LH 2 SO 4 : 100 g/L

Na2 WO4 ‧2H2 O:5.4 mg/LNa 2 WO 4 ‧2H 2 O: 5.4 mg/L

W:3 ppmW: 3 ppm

As:150 ppm(使用H3 AsO3 (60%水溶液))As: 150 ppm (using H 3 AsO 3 (60% in water))

(電鍍溫度1)50℃(plating temperature 1) 50 ° C

(電流條件1)(current condition 1)

電流密度:90 A/dm2 Current density: 90 A/dm 2

粗化庫侖量:200 As/dm2 Coarse coulomb amount: 200 As/dm 2

將實施例4之粗化處理層之SEM相片示於圖4。圖4所示之左側之SEM相片之倍率為(×3000),右側之SEM相片之倍率為(×30000)。如該圖4所示,可知形成為針狀之粒子形狀。平均之粒子直徑為0.59μm,粒子之長度為1.9μm,縱與橫之比為3.2,滿足本發明之條件。The SEM photograph of the roughened layer of Example 4 is shown in Fig. 4. The magnification of the SEM photograph on the left side shown in Fig. 4 is (×3000), and the magnification of the SEM photograph on the right side is (×30000). As shown in FIG. 4, it is understood that the shape of the particles is formed into a needle shape. The average particle diameter was 0.59 μm, the length of the particles was 1.9 μm, and the ratio of the longitudinal to the transverse direction was 3.2, which satisfied the conditions of the present invention.

其次,於上述銅之粗化處理面上形成與實施例1相同之耐熱防銹層,於該耐熱防銹層上進行電解鉻酸鹽處理,進而於該鉻酸鹽皮膜層上實施矽烷處理(藉由塗布)。Next, a heat-resistant rust-preventing layer similar to that of the first embodiment is formed on the roughened surface of the copper, an electrolytic chromate treatment is performed on the heat-resistant rust-preventing layer, and decane treatment is performed on the chromate coating layer ( By coating).

將以上述方式製作之銅箔積層黏著於玻璃布基材BT(雙馬來醯亞胺三嗪)樹脂板上,對以下項目進行測定或分析。The copper foil layer produced in the above manner was adhered to a glass cloth substrate BT (Bismaleimide Triazine) resin plate, and the following items were measured or analyzed.

(1)落粉之觀察(1) Observation of falling powder

未確認到落粉。將該結果示於表1。No powder was confirmed. The results are shown in Table 1.

(2)常態剝離強度(2) Normal peel strength

常態剝離強度為0.82 kg/cm,具有良好之剝離強度。將該結果示於表1。The normal peel strength is 0.82 kg/cm and has good peel strength. The results are shown in Table 1.

(3)耐鹽酸性試驗(3) Hydrochloric acid resistance test

關於耐鹽酸性,係將於0.4 mm電路中,使用12 wt%鹽酸於60℃下浸漬90分鐘後之損耗(Loss)量以%表示者。以下同樣。損耗(Loss)量為4.3%,與後述之比較例相比損耗(Loss)量少,表現出良好之性質。將該結果示於表1。Regarding hydrochloric acid resistance, the amount of loss (Loss) in a 0.4 mm circuit after immersion for 90 minutes at 60 ° C using 12 wt% hydrochloric acid is expressed in %. The same is true below. The amount of loss (Loss) was 4.3%, and the amount of loss (Loss) was small as compared with the comparative example described later, and exhibited good properties. The results are shown in Table 1.

(4)耐硫酸過氧化氫性(硫酸10%,過氧化氫2%,室溫:30℃)之試驗結果(4) Test results of sulfuric acid-resistant hydrogen peroxide (sulfuric acid 10%, hydrogen peroxide 2%, room temperature: 30 ° C)

於0.4 mm電路中實施。此時,對蝕刻2μm之情況進行調查。將損耗(Loss)量以%表示。以下同樣。將該結果示於表1。Implemented in a 0.4 mm circuit. At this time, the case of etching 2 μm was investigated. The amount of loss (Loss) is expressed in %. The same is true below. The results are shown in Table 1.

如表1所示,Loss量少至6.8%,耐硫酸過氧化氫性良好。As shown in Table 1, the amount of Loss was as small as 6.8%, and the sulfuric acid-resistant hydrogen peroxide was good.

(實施例5)(Example 5)

使用厚度12μm之電解銅箔,對該銅箔之粗面(粗糙面:M面)進行下述所示之粗化鍍敷及與實施例1相同之正常鍍敷。以下表示粗化鍍敷處理條件。The rough surface (rough surface: M surface) of the copper foil was subjected to rough plating as shown below and normal plating similar to that of Example 1 using an electrolytic copper foil having a thickness of 12 μm. The roughening plating treatment conditions are shown below.

(液組成)(liquid composition)

CuSO4 ‧5H2 O:58.9 g/LCuSO 4 ‧5H 2 O: 58.9 g/L

Cu:15 g/LCu: 15 g/L

H2 SO4 :100 g/LH 2 SO 4 : 100 g/L

十二烷基硫酸鈉添加量:10 ppmSodium lauryl sulfate addition: 10 ppm

As添加量:1000 ppm:使用H3 AsO4 (60%水溶液)As addition amount: 1000 ppm: using H 3 AsO 4 (60% aqueous solution)

(電鍍溫度)50℃(plating temperature) 50 ° C

(電流條件)(current condition)

電流密度:40 A/dm2 Current density: 40 A/dm 2

粗化庫侖量:240 As/dm2 Coarse coulomb amount: 240 As/dm 2

將實施例5之粗化處理層之SEM相片示於圖5。圖5所示之左側之SEM相片之倍率為(×3000),右側之SEM相片之倍率為(×30000)。如該圖5所示,可知形成為針狀之粒子形狀。平均之粒子直徑為0.72μm,粒子之長度為1.93μm,縱與橫之比為2.7,滿足本發明之條件。The SEM photograph of the roughened layer of Example 5 is shown in Fig. 5. The magnification of the SEM photograph on the left side shown in Fig. 5 is (×3000), and the magnification of the SEM photograph on the right side is (×30000). As shown in FIG. 5, it is understood that the shape of the particles is formed into a needle shape. The average particle diameter was 0.72 μm, the length of the particles was 1.93 μm, and the ratio of the longitudinal to the transverse direction was 2.7, which satisfied the conditions of the present invention.

其次,於上述銅之粗化處理面上形成與實施例1相同之耐熱防銹層,於該耐熱防銹層上進行電解鉻酸鹽處理,進而於該鉻酸鹽皮膜層上實施矽烷處理(藉由塗布)。Next, a heat-resistant rust-preventing layer similar to that of the first embodiment is formed on the roughened surface of the copper, an electrolytic chromate treatment is performed on the heat-resistant rust-preventing layer, and decane treatment is performed on the chromate coating layer ( By coating).

將以上述方式製作之銅箔積層黏著於玻璃布基材BT(雙馬來醯亞胺三嗪)樹脂板上,對以下項目進行測定或分析。The copper foil layer produced in the above manner was adhered to a glass cloth substrate BT (Bismaleimide Triazine) resin plate, and the following items were measured or analyzed.

(1)落粉之觀察(1) Observation of falling powder

未確認到落粉。將該結果示於表1。No powder was confirmed. The results are shown in Table 1.

(2)常態剝離強度(2) Normal peel strength

常態剝離強度為0.83 kg/cm,具有良好之剝離強度。將該結果示於表1。The normal peel strength is 0.83 kg/cm and has good peel strength. The results are shown in Table 1.

(3)耐鹽酸性試驗(3) Hydrochloric acid resistance test

關於耐鹽酸性,係將於0.4 mm電路中,使用12 wt%鹽酸於60℃下浸漬90分鐘後之損耗(Loss)量以%表示者。以下同樣。損耗(Loss)量為4.6%,與後述之比較例相比損耗(Loss)量少,表現出良好之性質。將該結果示於表1。Regarding hydrochloric acid resistance, the amount of loss (Loss) in a 0.4 mm circuit after immersion for 90 minutes at 60 ° C using 12 wt% hydrochloric acid is expressed in %. The same is true below. The amount of loss (Loss) was 4.6%, and the amount of loss (Loss) was small as compared with the comparative example described later, and exhibited good properties. The results are shown in Table 1.

(4)耐硫酸過氧化氫性(硫酸10%,過氧化氫2%,室溫:30℃)之試驗結果(4) Test results of sulfuric acid-resistant hydrogen peroxide (sulfuric acid 10%, hydrogen peroxide 2%, room temperature: 30 ° C)

於0.4 mm電路中實施。此時,對蝕刻2μm之情況進行調查。將損耗(Loss)量以%表示。以下同樣。將該結果示於表1。Implemented in a 0.4 mm circuit. At this time, the case of etching 2 μm was investigated. The amount of loss (Loss) is expressed in %. The same is true below. The results are shown in Table 1.

如表1所示,Loss量少至7.5%,耐硫酸過氧化氫性良好。As shown in Table 1, the amount of Loss was as small as 7.5%, and the sulfuric acid-resistant hydrogen peroxide was good.

(實施例6)(Example 6)

使用厚度12μm之電解銅箔,對該銅箔之粗面(粗糙面:M面)進行下述所示之粗化鍍敷及與實施例1相同之正常鍍敷。以下表示粗化鍍敷處理條件。The rough surface (rough surface: M surface) of the copper foil was subjected to rough plating as shown below and normal plating similar to that of Example 1 using an electrolytic copper foil having a thickness of 12 μm. The roughening plating treatment conditions are shown below.

(液組成1)(liquid composition 1)

CuSO4 ‧5H2 O:58.9 g/LCuSO 4 ‧5H 2 O: 58.9 g/L

Cu:15 g/LCu: 15 g/L

H2 SO4 :100 g/LH 2 SO 4 : 100 g/L

Na2 WO4 ‧2H2 O:5.4 mg/LNa 2 WO 4 ‧2H 2 O: 5.4 mg/L

W:3 ppmW: 3 ppm

十二烷基硫酸鈉添加量:10 ppmSodium lauryl sulfate addition: 10 ppm

(電鍍溫度1)50℃(plating temperature 1) 50 ° C

(電流條件1)(current condition 1)

電流密度:100 A/dm2 Current density: 100 A/dm 2

粗化庫侖量:200 As/dm2 Coarse coulomb amount: 200 As/dm 2

將實施例6之粗化處理層之SEM相片示於圖6。圖6所示之左側之SEM相片之倍率為(×3000),右側之SEM相片之倍率為(×30000)。如該圖6所示,可知形成為針狀之粒子形狀。平均之粒子直徑為0.48μm,粒子之長度為1.6μm,縱與橫之比為3.3,滿足本發明之條件。The SEM photograph of the roughened layer of Example 6 is shown in Fig. 6. The magnification of the SEM photograph on the left side shown in Fig. 6 is (×3000), and the magnification of the SEM photograph on the right side is (×30000). As shown in FIG. 6, it is understood that the shape of the particles is formed into a needle shape. The average particle diameter was 0.48 μm, the length of the particles was 1.6 μm, and the ratio of vertical to horizontal was 3.3, which satisfied the conditions of the present invention.

其次,於上述銅之粗化處理面上形成與實施例1相同之耐熱防銹層,於該耐熱防銹層上進行電解鉻酸鹽處理,進而於該鉻酸鹽皮膜層上實施矽烷處理(藉由塗布)。Next, a heat-resistant rust-preventing layer similar to that of the first embodiment is formed on the roughened surface of the copper, an electrolytic chromate treatment is performed on the heat-resistant rust-preventing layer, and decane treatment is performed on the chromate coating layer ( By coating).

將以上述方式製作之銅箔積層黏著於玻璃布基材BT(雙馬來醯亞胺三嗪)樹脂板上,對以下項目進行測定或分析。The copper foil layer produced in the above manner was adhered to a glass cloth substrate BT (Bismaleimide Triazine) resin plate, and the following items were measured or analyzed.

(1)落粉之觀察(1) Observation of falling powder

未確認到落粉。將該結果示於表1。No powder was confirmed. The results are shown in Table 1.

(2)常態剝離強度(2) Normal peel strength

常態剝離強度為0.83 kg/cm,具有良好之剝離強度。將該結果示於表1。The normal peel strength is 0.83 kg/cm and has good peel strength. The results are shown in Table 1.

(3)耐鹽酸性試驗(3) Hydrochloric acid resistance test

關於耐鹽酸性,係將於0.4 mm電路中,使用12 wt%鹽酸於60℃下浸漬90分鐘後之損耗(Loss)量以%表示者。以下同樣。損耗(Loss)量為3.9%,與後述之比較例相比損耗(Loss)量少,表現出良好之性質。將該結果示於表1。Regarding hydrochloric acid resistance, the amount of loss (Loss) in a 0.4 mm circuit after immersion for 90 minutes at 60 ° C using 12 wt% hydrochloric acid is expressed in %. The same is true below. The amount of loss (Loss) was 3.9%, and the amount of loss (Loss) was small as compared with the comparative example described later, and exhibited good properties. The results are shown in Table 1.

(4)耐硫酸過氧化氫性(硫酸10%,過氧化氫2%,室溫:30℃)之試驗結果(4) Test results of sulfuric acid-resistant hydrogen peroxide (sulfuric acid 10%, hydrogen peroxide 2%, room temperature: 30 ° C)

於0.4 mm電路中實施。此時,對蝕刻2μm之情況進行調查。將損耗(Loss)量以%表示。以下同樣。將該結果示於表1。Implemented in a 0.4 mm circuit. At this time, the case of etching 2 μm was investigated. The amount of loss (Loss) is expressed in %. The same is true below. The results are shown in Table 1.

如表1所示,Loss量為5.2%,耐硫酸過氧化氫性良好。As shown in Table 1, the amount of Loss was 5.2%, and the sulfuric acid-resistant hydrogen peroxide was good.

(實施例7)(Example 7)

使用厚度12μm之電解銅箔,對該銅箔之粗面(粗糙面:M面)進行下述所示之粗化鍍敷及與實施例1相同之正常鍍敷。以下表示粗化鍍敷處理條件。The rough surface (rough surface: M surface) of the copper foil was subjected to rough plating as shown below and normal plating similar to that of Example 1 using an electrolytic copper foil having a thickness of 12 μm. The roughening plating treatment conditions are shown below.

(液組成1)(liquid composition 1)

CuSO4 ‧5H2 O:58.9 g/LCuSO 4 ‧5H 2 O: 58.9 g/L

Cu:15 g/LCu: 15 g/L

H2 SO4 :100 g/LH 2 SO 4 : 100 g/L

Na2 WO4 ‧2H2 O:5.4 mg/LNa 2 WO 4 ‧2H 2 O: 5.4 mg/L

W:3 ppmW: 3 ppm

十二烷基硫酸鈉添加量:10 ppmSodium lauryl sulfate addition: 10 ppm

As添加量:150 ppm:使用H3 AsO3 (60%水溶液)As addition amount: 150 ppm: using H 3 AsO 3 (60% aqueous solution)

(電鍍溫度1)50℃(plating temperature 1) 50 ° C

(電流條件1)(current condition 1)

電流密度:80 A/dm2 Current density: 80 A/dm 2

粗化庫侖量:280 As/dm2 Coarse coulomb amount: 280 As/dm 2

將實施例7之粗化處理層之SEM相片示於圖7。圖7所示之左側之SEM相片之倍率為(×3000),右側之SEM相片之倍率為(×30000)。如該圖7所示,可知形成為針狀之粒子形狀。平均之粒子直徑為0.55μm,粒子之長度為1.7μm,縱與橫之比為3.1,滿足本發明之條件。The SEM photograph of the roughened layer of Example 7 is shown in Fig. 7. The magnification of the SEM photograph on the left side shown in Fig. 7 is (×3000), and the magnification of the SEM photograph on the right side is (×30000). As shown in FIG. 7, it is understood that the shape of the particles is formed into a needle shape. The average particle diameter was 0.55 μm, the length of the particles was 1.7 μm, and the ratio of the longitudinal to the transverse direction was 3.1, which satisfied the conditions of the present invention.

其次,於上述銅之粗化處理面上形成與實施例1相同之耐熱防銹層,於該耐熱防銹層上進行電解鉻酸鹽處理,進而於該鉻酸鹽皮膜層上實施矽烷處理(藉由塗布)。Next, a heat-resistant rust-preventing layer similar to that of the first embodiment is formed on the roughened surface of the copper, an electrolytic chromate treatment is performed on the heat-resistant rust-preventing layer, and decane treatment is performed on the chromate coating layer ( By coating).

將以上述方式製作之銅箔積層黏著於玻璃布基材BT(雙馬來醯亞胺三嗪)樹脂板上,對以下項目進行測定或分析。The copper foil layer produced in the above manner was adhered to a glass cloth substrate BT (Bismaleimide Triazine) resin plate, and the following items were measured or analyzed.

(1)落粉之觀察(1) Observation of falling powder

未確認到落粉。將該結果示於表1。No powder was confirmed. The results are shown in Table 1.

(2)常態剝離強度(2) Normal peel strength

常態剝離強度為0.85 kg/cm,具有良好之剝離強度。將該結果示於表1。The normal peel strength is 0.85 kg/cm and has good peel strength. The results are shown in Table 1.

(3)耐鹽酸性試驗(3) Hydrochloric acid resistance test

關於耐鹽酸性,係將於0.4 mm電路中,使用12 wt%鹽酸於60℃下浸漬90分鐘後之損耗(Loss)量以%表示者。以下同樣。損耗(Loss)量為1.6%,與後述之比較例相比損耗(Loss)量少,表現出良好之性質。將該結果示於表1。Regarding hydrochloric acid resistance, the amount of loss (Loss) in a 0.4 mm circuit after immersion for 90 minutes at 60 ° C using 12 wt% hydrochloric acid is expressed in %. The same is true below. The amount of loss (Loss) was 1.6%, and the amount of loss (Loss) was small as compared with the comparative example described later, and exhibited good properties. The results are shown in Table 1.

(4)耐硫酸過氧化氫性(硫酸10%,過氧化氫2%,室溫:30℃)之試驗結果(4) Test results of sulfuric acid-resistant hydrogen peroxide (sulfuric acid 10%, hydrogen peroxide 2%, room temperature: 30 ° C)

於0.4 mm電路中實施。此時,對蝕刻2μm之情況進行調查。將損耗(Loss)量以%表示。以下同樣。將該結果示於表1。Implemented in a 0.4 mm circuit. At this time, the case of etching 2 μm was investigated. The amount of loss (Loss) is expressed in %. The same is true below. The results are shown in Table 1.

如表1所示,Loss量少至4.5%,耐硫酸過氧化氫性良好。As shown in Table 1, the amount of Loss was as low as 4.5%, and the sulfuric acid-resistant hydrogen peroxide was good.

(比較例1)(Comparative Example 1)

使用厚度12μm之電解銅箔,對該銅箔之粗面(粗糙面:M面)進行下述所示之粗化鍍敷及與實施例1相同之正常鍍敷。以下表示粗化鍍敷處理條件。此時,本發明之添加劑概不使用。The rough surface (rough surface: M surface) of the copper foil was subjected to rough plating as shown below and normal plating similar to that of Example 1 using an electrolytic copper foil having a thickness of 12 μm. The roughening plating treatment conditions are shown below. At this time, the additive of the present invention is not used.

(液組成)(liquid composition)

CuSO4 ‧5H2 O:58.9 g/LCuSO 4 ‧5H 2 O: 58.9 g/L

Cu:15 g/LCu: 15 g/L

H2 SO4 :100 g/LH 2 SO 4 : 100 g/L

(電鍍溫度)50℃(plating temperature) 50 ° C

(電流條件)(current condition)

電流密度:90 A/dm2 Current density: 90 A/dm 2

粗化庫侖量:200 As/dm2 Coarse coulomb amount: 200 As/dm 2

將比較例1之粗化處理層之SEM相片示於圖8。圖8所示之左側之SEM相片之倍率為(×3000),右側之SEM相片之倍率為(×30000)。如該圖8所示,可知形成為樹枝狀結晶狀之粒子形狀。平均之粒子直徑為5μm,粒子之長度為25μm,縱與橫之比為5.0,滿足本發明之條件。The SEM photograph of the roughened layer of Comparative Example 1 is shown in Fig. 8. The magnification of the SEM photograph on the left side shown in Fig. 8 is (×3000), and the magnification of the SEM photograph on the right side is (×30000). As shown in FIG. 8, it is understood that the shape of the particles is formed into a dendritic crystal. The average particle diameter was 5 μm, the length of the particles was 25 μm, and the ratio of the longitudinal to the transverse direction was 5.0, which satisfied the conditions of the present invention.

其次,於上述銅之粗化處理面上形成與實施例1相同之耐熱防銹層,於該耐熱防銹層上進行電解鉻酸鹽處理,進而於該鉻酸鹽皮膜層上實施矽烷處理(藉由塗布)。Next, a heat-resistant rust-preventing layer similar to that of the first embodiment is formed on the roughened surface of the copper, an electrolytic chromate treatment is performed on the heat-resistant rust-preventing layer, and decane treatment is performed on the chromate coating layer ( By coating).

將以上述方式製作之銅箔積層黏著於玻璃布基材BT(雙馬來醯亞胺三嗪)樹脂板上,對以下項目進行測定或分析。The copper foil layer produced in the above manner was adhered to a glass cloth substrate BT (Bismaleimide Triazine) resin plate, and the following items were measured or analyzed.

(1)落粉之觀察(1) Observation of falling powder

本比較例1中,確認到落粉。將該結果示於表1。In Comparative Example 1, it was confirmed that the powder was dropped. The results are shown in Table 1.

(2)常態剝離強度(2) Normal peel strength

常態剝離強度為0.58 kg/cm,剝離強度低。將該結果示於表1。The normal peel strength was 0.58 kg/cm, and the peel strength was low. The results are shown in Table 1.

(3)耐鹽酸性試驗(3) Hydrochloric acid resistance test

關於耐鹽酸性,係將於4 mm電路中,使用12 wt%鹽酸於60℃下浸漬90分鐘後之損耗(Loss)量以%表示者。以下同樣。損耗(Loss)量為32.4%,與後述之比較例相比損耗(Loss)量少,表現出良好之性質。將該結果示於表1。Regarding hydrochloric acid resistance, the amount of loss (Loss) in a 4 mm circuit after immersion for 90 minutes at 60 ° C using 12 wt% hydrochloric acid is expressed in %. The same is true below. The amount of loss (Loss) was 32.4%, and the amount of loss (Loss) was small as compared with the comparative example described later, and exhibited good properties. The results are shown in Table 1.

(4)耐硫酸過氧化氫性(硫酸10%,過氧化氫2%,室溫:30℃)之試驗結果(4) Test results of sulfuric acid-resistant hydrogen peroxide (sulfuric acid 10%, hydrogen peroxide 2%, room temperature: 30 ° C)

於0.4 mm電路中實施。此時,對蝕刻2μm之情況進行調查。將損耗(Loss)量以%表示。將該結果示於表1。Implemented in a 0.4 mm circuit. At this time, the case of etching 2 μm was investigated. The amount of loss (Loss) is expressed in %. The results are shown in Table 1.

如表1所示,Loss量多至31%,耐硫酸過氧化氫性不良。As shown in Table 1, the amount of Loss is as much as 31%, and the resistance to sulfuric acid hydrogen peroxide is poor.

(比較例2)(Comparative Example 2)

使用厚度12μm之電解銅箔,對該銅箔之粗面(粗糙面:M面)進行下述所示之粗化鍍敷及與實施例1相同之正常鍍敷。以下表示粗化鍍敷處理條件。The rough surface (rough surface: M surface) of the copper foil was subjected to rough plating as shown below and normal plating similar to that of Example 1 using an electrolytic copper foil having a thickness of 12 μm. The roughening plating treatment conditions are shown below.

(液組成)(liquid composition)

CuSO4 ‧5H2 O:58.9 g/LCuSO 4 ‧5H 2 O: 58.9 g/L

Cu:15 g/LCu: 15 g/L

H2 SO4 :100 g/LH 2 SO 4 : 100 g/L

As添加量:150 ppm:使用H3 AsO3 (60%水溶液)As addition amount: 150 ppm: using H 3 AsO 3 (60% aqueous solution)

(電鍍溫度)50℃(plating temperature) 50 ° C

(電流條件)(current condition)

電流密度:40 A/dm2 Current density: 40 A/dm 2

粗化庫侖量:240 As/dm2 Coarse coulomb amount: 240 As/dm 2

將比較例2之粗化處理層之SEM相片示於圖8。圖8所示之左側之SEM相片之倍率為(×3000),右側之SEM相片之倍率為(×30000)。如該圖8所示,可知形成為球狀之粒子形狀。平均之粒子直徑為1.3μm,粒子之長度為1.8μm,縱與橫之比為1.4,並不滿足本發明之條件。The SEM photograph of the roughened layer of Comparative Example 2 is shown in Fig. 8. The magnification of the SEM photograph on the left side shown in Fig. 8 is (×3000), and the magnification of the SEM photograph on the right side is (×30000). As shown in FIG. 8, it is understood that the shape of the particles is formed into a spherical shape. The average particle diameter was 1.3 μm, the length of the particles was 1.8 μm, and the ratio of the longitudinal to the transverse direction was 1.4, which did not satisfy the conditions of the present invention.

其次,於上述銅之粗化處理面上形成與實施例1相同之耐熱防銹層,於該耐熱防銹層上進行電解鉻酸鹽處理,進而於該鉻酸鹽皮膜層上實施矽烷處理(藉由塗布)。Next, a heat-resistant rust-preventing layer similar to that of the first embodiment is formed on the roughened surface of the copper, an electrolytic chromate treatment is performed on the heat-resistant rust-preventing layer, and decane treatment is performed on the chromate coating layer ( By coating).

將以上述方式製作之銅箔積層黏著於玻璃布基材BT(雙馬來醯亞胺三嗪)樹脂板上,對以下項目進行測定或分析。The copper foil layer produced in the above manner was adhered to a glass cloth substrate BT (Bismaleimide Triazine) resin plate, and the following items were measured or analyzed.

(1)落粉之觀察(1) Observation of falling powder

未確認到落粉。將該結果示於表1。No powder was confirmed. The results are shown in Table 1.

(2)常態剝離強度(2) Normal peel strength

常態剝離強度為0.82 kg/cm,具有良好之剝離強度。將該結果示於表1。The normal peel strength is 0.82 kg/cm and has good peel strength. The results are shown in Table 1.

(3)耐鹽酸性試驗(3) Hydrochloric acid resistance test

關於耐鹽酸性,係將使用12 wt%鹽酸於60℃下浸漬90分鐘後之損耗(Loss)量以%表示者。以下同樣。損耗(Loss)量為20%,與後述之比較例相比損耗(Loss)量少,表現出良好之性質。將該結果示於表1。Regarding hydrochloric acid resistance, the amount of loss (Loss) after immersion for 90 minutes at 60 ° C using 12 wt% hydrochloric acid is expressed in %. The same is true below. The amount of loss (Loss) was 20%, and the amount of loss (Loss) was small as compared with the comparative example described later, and exhibited good properties. The results are shown in Table 1.

(4)耐硫酸過氧化氫性(硫酸10%,過氧化氫2%,室溫:30℃)之試驗結果(4) Test results of sulfuric acid-resistant hydrogen peroxide (sulfuric acid 10%, hydrogen peroxide 2%, room temperature: 30 ° C)

於0.4 mm電路中實施。此時,對蝕刻2μm之情況進行調查。將損耗(Loss)量以%表示。以下同樣。將該結果示於表1。Implemented in a 0.4 mm circuit. At this time, the case of etching 2 μm was investigated. The amount of loss (Loss) is expressed in %. The same is true below. The results are shown in Table 1.

如表1所示,Loss量多至15%,耐硫酸過氧化氫性不良。As shown in Table 1, the amount of Loss is as much as 15%, and the resistance to sulfuric acid hydrogen peroxide is poor.

由以上可知,本發明之印刷配線板用銅箔由於並非習知認為良好之粗化處理的呈圓形之(球狀)突起物或樹枝狀結晶狀之結晶粒徑,而係於銅箔之至少一面形成針狀微細之粗化粒子,故具有如下之優異效果:可提高銅箔本身與樹脂之黏著強度,對於封裝用基板提供對精細圖案形成時之化學品處理亦可增大剝離強度,且可進行精細蝕刻的銅箔及其製造方法。As described above, the copper foil for a printed wiring board of the present invention is not a rough (spherical) protrusion or a dendritic crystal grain size which is conventionally considered to be excellent in roughening treatment, and is used in copper foil. Since the needle-shaped fine roughened particles are formed on at least one side, the adhesive film has the excellent effect of improving the adhesion strength between the copper foil itself and the resin, and the chemical treatment for forming the fine pattern on the substrate for packaging can also increase the peel strength. And a copper foil which can be finely etched and a method of manufacturing the same.

如以上所示,本發明藉由於銅箔之至少一面形成針狀微細之粗化粒子,而具有如下優異效果:提高銅箔本身與樹脂之黏著強度,對於封裝用基板提供對精細圖案形成時之化學品處理亦可增大剝離強度,且可進行精細蝕刻之銅箔及其製造方法。As described above, the present invention has an excellent effect of forming the needle-like fine roughened particles on at least one side of the copper foil, thereby improving the adhesion strength between the copper foil itself and the resin, and providing the package substrate with a fine pattern formation. The chemical treatment can also increase the peel strength, and can perform fine etching of the copper foil and a method of manufacturing the same.

近年來,於印刷電路之精細圖案化及高頻化之進展過程中,作為印刷電路用銅箔(半導體封裝基板用銅箔)以及將半導體封裝基板用銅箔與半導體封裝用樹脂貼合而製作之半導體封裝用基板極為有效。In recent years, in the process of fine patterning and high-frequency development of printed circuits, copper foil for printed circuit (copper foil for semiconductor package substrate) and copper foil for semiconductor package substrate are bonded to resin for semiconductor packaging. The substrate for semiconductor packaging is extremely effective.

圖1係實施例1之粗化處理層之SEM相片。Figure 1 is a SEM photograph of the roughened layer of Example 1.

圖2係實施例2之粗化處理層之SEM相片。2 is a SEM photograph of the roughened layer of Example 2.

圖3係實施例3之粗化處理層之SEM相片。Figure 3 is a SEM photograph of the roughened layer of Example 3.

圖4係實施例4之SEM相片。Figure 4 is a SEM photograph of Example 4.

圖5係實施例5之粗化處理層之SEM相片。Figure 5 is a SEM photograph of the roughened layer of Example 5.

圖6係實施例6之SEM相片。Figure 6 is a SEM photograph of Example 6.

圖7係實施例7之粗化處理層之SEM相片。Figure 7 is a SEM photograph of the roughened layer of Example 7.

圖8係比較例1之粗化處理層之SEM相片。Fig. 8 is a SEM photograph of the roughened layer of Comparative Example 1.

圖9係比較例2之粗化處理層之SEM相片。Figure 9 is a SEM photograph of the roughened layer of Comparative Example 2.

Claims (13)

一種印刷配線板用銅箔,其特徵在於:於銅箔之至少一面,具有由直徑為0.1~2.0μm、縱與橫之比為1.5以上之針狀微細銅粗化粒子所構成的粗化處理層。 A copper foil for a printed wiring board, characterized in that it has a roughening treatment of at least one surface of a copper foil, which is composed of needle-shaped fine copper roughened particles having a diameter of 0.1 to 2.0 μm and a vertical to horizontal ratio of 1.5 or more. Floor. 一種印刷配線板用銅箔,其特徵在於:於銅箔之至少一面,具有由直徑為0.1~2.0μm、縱與橫之比為3.0以上之針狀微細銅粗化粒子所構成的粗化處理層。 A copper foil for a printed wiring board, characterized in that the copper foil has a roughening treatment composed of needle-shaped fine copper roughened particles having a diameter of 0.1 to 2.0 μm and a vertical to horizontal ratio of 3.0 or more on at least one side of the copper foil. Floor. 如申請專利範圍第1項之印刷配線板用銅箔,其中,針狀粗化粒子之數於電路寬度10μm中存在5個以上。 The copper foil for a printed wiring board according to the first aspect of the invention, wherein the number of the needle-like roughened particles is five or more in a circuit width of 10 μm. 如申請專利範圍第2項之印刷配線板用銅箔,其中,針狀粗化粒子之數於電路寬度10μm中存在5個以上。 The copper foil for a printed wiring board according to the second aspect of the invention, wherein the number of the needle-like roughened particles is five or more in a circuit width of 10 μm. 如申請專利範圍第1項之印刷配線板用銅箔,其中,針狀粗化粒子之數於電路寬度10μm中存在10個以上。 The copper foil for a printed wiring board according to the first aspect of the invention, wherein the number of the needle-like roughened particles is 10 or more in a circuit width of 10 μm. 如申請專利範圍第2項之印刷配線板用銅箔,其中,針狀粗化粒子之數於電路寬度10μm中存在10個以上。 The copper foil for a printed wiring board according to the second aspect of the invention, wherein the number of the needle-like roughened particles is 10 or more in a circuit width of 10 μm. 如申請專利範圍第1至6項中任一項之印刷配線板用銅箔,其中,於該粗化處理層上具備含有選自鋅、鎳、銅、磷中至少一種以上元素的耐熱防銹層,於該耐熱防銹層上具備鉻酸鹽皮膜層,並且於該鉻酸鹽皮膜層上具備矽烷偶合劑層。 The copper foil for a printed wiring board according to any one of claims 1 to 6, wherein the roughened layer has heat-resistant rust containing at least one element selected from the group consisting of zinc, nickel, copper, and phosphorus. The layer has a chromate coating layer on the heat-resistant rust-preventing layer, and a decane coupling agent layer is provided on the chromate coating layer. 一種印刷配線板用銅箔之製造方法,其特徵在於:使用由含有選自硫酸烷基酯鹽、鎢離子、砷離子中之物質之至少一種以上的硫酸/硫酸銅所構成之電解浴,於銅箔之至少一面形成由直徑為0.1~2.0μm、縱與橫之比為1.5以上 之針狀微細銅粗化粒子所構成的粗化處理層。 A method for producing a copper foil for a printed wiring board, comprising: using an electrolytic bath comprising at least one of sulfuric acid/copper sulfate containing at least one selected from the group consisting of alkyl sulfate salts, tungsten ions, and arsenic ions; At least one side of the copper foil is formed to have a diameter of 0.1 to 2.0 μm and a vertical to horizontal ratio of 1.5 or more. A roughened layer composed of acicular fine copper roughened particles. 如申請專利範圍第8項之印刷配線板用銅箔之製造方法,於該粗化處理層上形成含有選自鋅、鎳、銅、磷中至少一種以上元素的耐熱防銹層,繼而於該耐熱防銹層上形成鉻酸鹽皮膜層,進而於該鉻酸鹽皮膜層上形成矽烷偶合劑層。 The method for producing a copper foil for a printed wiring board according to the eighth aspect of the invention, wherein the heat-treated rust-preventing layer containing at least one element selected from the group consisting of zinc, nickel, copper, and phosphorus is formed on the roughened layer, and then A chromate coating layer is formed on the heat-resistant rust-preventing layer, and a decane coupling agent layer is formed on the chromate coating layer. 一種覆銅積層板,係使用申請專利範圍第1至5項中任一項之印刷配線板用銅箔而製成。 A copper clad laminate is produced by using a copper foil for a printed wiring board according to any one of claims 1 to 5. 一種印刷配線板,係使用申請專利範圍第1至5項中任一項之印刷配線板用銅箔而製成。 A printed wiring board produced by using a copper foil for a printed wiring board according to any one of claims 1 to 5. 一種封裝用基板,係使用申請專利範圍第1至5項中任一項之印刷配線板用銅箔而製成。 A substrate for packaging is produced by using a copper foil for a printed wiring board according to any one of claims 1 to 5. 一種電子機器,其使用有申請專利範圍第11項之印刷配線板。 An electronic machine using the printed wiring board of claim 11 of the patent application.
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