TWI458183B - 連接端子 - Google Patents
連接端子 Download PDFInfo
- Publication number
- TWI458183B TWI458183B TW100141571A TW100141571A TWI458183B TW I458183 B TWI458183 B TW I458183B TW 100141571 A TW100141571 A TW 100141571A TW 100141571 A TW100141571 A TW 100141571A TW I458183 B TWI458183 B TW I458183B
- Authority
- TW
- Taiwan
- Prior art keywords
- end portion
- diameter
- contact member
- base end
- contact
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/22—Contacts for co-operating by abutting
- H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
- H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
- H01R13/2421—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means using coil springs
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
- G01R1/06722—Spring-loaded
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06733—Geometry aspects
- G01R1/06738—Geometry aspects related to tip portion
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Geometry (AREA)
- Measuring Leads Or Probes (AREA)
- Connecting Device With Holders (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2010254840 | 2010-11-15 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201251216A TW201251216A (en) | 2012-12-16 |
TWI458183B true TWI458183B (zh) | 2014-10-21 |
Family
ID=46084004
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW100141571A TWI458183B (zh) | 2010-11-15 | 2011-11-15 | 連接端子 |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP5805102B2 (ja) |
TW (1) | TWI458183B (ja) |
WO (1) | WO2012067077A1 (ja) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104425945A (zh) * | 2013-08-30 | 2015-03-18 | 贝尔威勒电子股份有限公司 | 伸缩端子 |
TWI555987B (zh) * | 2014-01-28 | 2016-11-01 | Spring sleeve type probe and its manufacturing method | |
KR101869211B1 (ko) | 2014-08-08 | 2018-06-19 | 니혼 하츠쵸 가부시키가이샤 | 접속 단자 |
KR101552553B1 (ko) * | 2014-09-23 | 2015-10-01 | 리노공업주식회사 | 검사장치용 컨택트 프로브 |
CN107121570A (zh) * | 2017-05-03 | 2017-09-01 | 林荣敏 | 高压开关柜分电接点的耐压试验装置 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW200532207A (en) * | 2004-02-04 | 2005-10-01 | Nhk Spring Co Ltd | Needle shape member, conductive conductive contactor and conductive conductor unit |
TWM389955U (en) * | 2010-02-08 | 2010-10-01 | Hon Hai Prec Ind Co Ltd | Electrical connector and contact thereof |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005308684A (ja) * | 2004-04-26 | 2005-11-04 | Seiko Epson Corp | プローブおよび検査装置 |
JP4574222B2 (ja) * | 2004-05-06 | 2010-11-04 | 日本電産リード株式会社 | 基板検査用接触子、これを用いた基板検査用治具及び基板検査装置 |
KR101012712B1 (ko) * | 2005-06-10 | 2011-02-09 | 델라웨어 캐피탈 포메이션, 인코포레이티드 | 컴플라이언트 전기적 상호접속체 및 전기적 접촉 프로브 |
JP5067790B2 (ja) * | 2007-04-27 | 2012-11-07 | センサータ テクノロジーズ マサチューセッツ インコーポレーテッド | プローブピンおよびそれを用いたソケット |
US7862391B2 (en) * | 2007-09-18 | 2011-01-04 | Delaware Capital Formation, Inc. | Spring contact assembly |
-
2011
- 2011-11-14 WO PCT/JP2011/076214 patent/WO2012067077A1/ja active Application Filing
- 2011-11-14 JP JP2012544242A patent/JP5805102B2/ja active Active
- 2011-11-15 TW TW100141571A patent/TWI458183B/zh active
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW200532207A (en) * | 2004-02-04 | 2005-10-01 | Nhk Spring Co Ltd | Needle shape member, conductive conductive contactor and conductive conductor unit |
TWM389955U (en) * | 2010-02-08 | 2010-10-01 | Hon Hai Prec Ind Co Ltd | Electrical connector and contact thereof |
Also Published As
Publication number | Publication date |
---|---|
JPWO2012067077A1 (ja) | 2014-05-12 |
JP5805102B2 (ja) | 2015-11-04 |
WO2012067077A1 (ja) | 2012-05-24 |
TW201251216A (en) | 2012-12-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
GD4A | Issue of patent certificate for granted invention patent |