TWI430038B - 流體分配裝置校準技術 - Google Patents
流體分配裝置校準技術 Download PDFInfo
- Publication number
- TWI430038B TWI430038B TW098135615A TW98135615A TWI430038B TW I430038 B TWI430038 B TW I430038B TW 098135615 A TW098135615 A TW 098135615A TW 98135615 A TW98135615 A TW 98135615A TW I430038 B TWI430038 B TW I430038B
- Authority
- TW
- Taiwan
- Prior art keywords
- substrate
- droplet
- voltage
- droplets
- small
- Prior art date
Links
- 239000012530 fluid Substances 0.000 title claims description 34
- 239000000758 substrate Substances 0.000 claims description 68
- 238000000034 method Methods 0.000 claims description 39
- 239000000463 material Substances 0.000 claims description 22
- 230000008859 change Effects 0.000 claims description 2
- 238000009826 distribution Methods 0.000 description 10
- 238000001459 lithography Methods 0.000 description 9
- 238000004458 analytical method Methods 0.000 description 6
- 239000007788 liquid Substances 0.000 description 6
- 238000000059 patterning Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 4
- 238000004049 embossing Methods 0.000 description 4
- 230000008569 process Effects 0.000 description 4
- 238000012545 processing Methods 0.000 description 4
- 238000012546 transfer Methods 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 3
- 239000010408 film Substances 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 238000005229 chemical vapour deposition Methods 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 230000003993 interaction Effects 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 238000005240 physical vapour deposition Methods 0.000 description 2
- 230000009467 reduction Effects 0.000 description 2
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 description 1
- 239000005388 borosilicate glass Substances 0.000 description 1
- -1 but not limited to Substances 0.000 description 1
- 230000002596 correlated effect Effects 0.000 description 1
- 230000000875 corresponding effect Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 238000003618 dip coating Methods 0.000 description 1
- KPUWHANPEXNPJT-UHFFFAOYSA-N disiloxane Chemical class [SiH3]O[SiH3] KPUWHANPEXNPJT-UHFFFAOYSA-N 0.000 description 1
- 238000000203 droplet dispensing Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 229920002313 fluoropolymer Polymers 0.000 description 1
- 239000005350 fused silica glass Substances 0.000 description 1
- 238000007373 indentation Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000000178 monomer Substances 0.000 description 1
- 229920000620 organic polymer Polymers 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 238000004886 process control Methods 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 229910052707 ruthenium Inorganic materials 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 238000012216 screening Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
- 238000000427 thin-film deposition Methods 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C33/00—Moulds or cores; Details thereof or accessories therefor
- B29C33/42—Moulds or cores; Details thereof or accessories therefor characterised by the shape of the moulding surface, e.g. ribs or grooves
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0002—Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C33/00—Moulds or cores; Details thereof or accessories therefor
- B29C33/38—Moulds or cores; Details thereof or accessories therefor characterised by the material or the manufacturing process
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
Landscapes
- Engineering & Computer Science (AREA)
- Nanotechnology (AREA)
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Mechanical Engineering (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Shaping Of Tube Ends By Bending Or Straightening (AREA)
- Coating Apparatus (AREA)
- Application Of Or Painting With Fluid Materials (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10736008P | 2008-10-22 | 2008-10-22 | |
| US10783708P | 2008-10-23 | 2008-10-23 | |
| US10960808P | 2008-10-30 | 2008-10-30 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201022851A TW201022851A (en) | 2010-06-16 |
| TWI430038B true TWI430038B (zh) | 2014-03-11 |
Family
ID=42108900
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW098135615A TWI430038B (zh) | 2008-10-22 | 2009-10-21 | 流體分配裝置校準技術 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US8480933B2 (enExample) |
| EP (1) | EP2342600A2 (enExample) |
| JP (1) | JP5638529B2 (enExample) |
| KR (1) | KR101743979B1 (enExample) |
| TW (1) | TWI430038B (enExample) |
| WO (1) | WO2010047790A2 (enExample) |
Families Citing this family (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20100102471A1 (en) * | 2008-10-24 | 2010-04-29 | Molecular Imprints, Inc. | Fluid transport and dispensing |
| US20100101493A1 (en) * | 2008-10-27 | 2010-04-29 | Molecular Imprints, Inc. | Dispense System |
| US20100112220A1 (en) * | 2008-11-03 | 2010-05-06 | Molecular Imprints, Inc. | Dispense system set-up and characterization |
| JP5520612B2 (ja) * | 2010-01-04 | 2014-06-11 | 東芝機械株式会社 | ディスペンサを備えた転写装置、ディスペンサの吐出量検出方法、及びディスペンサの吐出量制御方法 |
| JP5595949B2 (ja) * | 2011-02-15 | 2014-09-24 | 株式会社東芝 | インプリント装置、インプリント方法および凹凸板の製造方法 |
| JP5727905B2 (ja) * | 2011-09-15 | 2015-06-03 | 富士フイルム株式会社 | インクジェットヘッドの吐出量補正方法、吐出量補正装置、及びナノインプリントシステム |
| JP6329425B2 (ja) * | 2014-05-02 | 2018-05-23 | キヤノン株式会社 | インプリント装置、インプリント方法、および物品の製造方法 |
| JP2016004794A (ja) * | 2014-06-13 | 2016-01-12 | キヤノン株式会社 | インプリント方法、インプリント装置、および物品の製造方法 |
| JP6661334B2 (ja) * | 2015-02-03 | 2020-03-11 | キヤノン株式会社 | 装置、および物品の製造方法 |
| CN108349155B (zh) * | 2015-10-20 | 2021-07-09 | 惠普发展公司，有限责任合伙企业 | 用于图案化层沉积的系统、方法及计算机可读介质 |
| JP6655988B2 (ja) * | 2015-12-25 | 2020-03-04 | キヤノン株式会社 | インプリント装置の調整方法、インプリント方法および物品製造方法 |
| US9993962B2 (en) | 2016-05-23 | 2018-06-12 | Canon Kabushiki Kaisha | Method of imprinting to correct for a distortion within an imprint system |
| WO2018075174A1 (en) * | 2016-10-18 | 2018-04-26 | Molecular Imprints, Inc. | Microlithographic fabrication of structures |
| CN110461571A (zh) * | 2017-03-27 | 2019-11-15 | 株式会社大赛璐 | 树脂成型品的制造方法及光学部件的制造方法 |
| JP6938189B2 (ja) * | 2017-03-27 | 2021-09-22 | 株式会社ダイセル | 樹脂成型品の製造方法及び光学部品の製造方法 |
| US20200080880A1 (en) * | 2017-05-05 | 2020-03-12 | Brighton Technologies Llc | Method and device for measuring minute volume of liquid |
| US11194247B2 (en) | 2018-01-31 | 2021-12-07 | Canon Kabushiki Kaisha | Extrusion control by capillary force reduction |
| US11927883B2 (en) | 2018-03-30 | 2024-03-12 | Canon Kabushiki Kaisha | Method and apparatus to reduce variation of physical attribute of droplets using performance characteristic of dispensers |
| US10739675B2 (en) | 2018-05-31 | 2020-08-11 | Canon Kabushiki Kaisha | Systems and methods for detection of and compensation for malfunctioning droplet dispensing nozzles |
| JP7596134B2 (ja) * | 2020-12-09 | 2024-12-09 | キヤノン株式会社 | 形成装置、形成方法及び物品の製造方法 |
| WO2022132164A1 (en) * | 2020-12-18 | 2022-06-23 | Hewlett-Packard Development Company, L.P. | Print agent recirculation within printheads for decap performance |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5653389A (en) * | 1995-09-15 | 1997-08-05 | Henderson; Graeme W. | Independent flow rate and droplet size control system and method for sprayer |
| US6936194B2 (en) * | 2002-09-05 | 2005-08-30 | Molecular Imprints, Inc. | Functional patterning material for imprint lithography processes |
| US8349241B2 (en) * | 2002-10-04 | 2013-01-08 | Molecular Imprints, Inc. | Method to arrange features on a substrate to replicate features having minimal dimensional variability |
| US20040065252A1 (en) * | 2002-10-04 | 2004-04-08 | Sreenivasan Sidlgata V. | Method of forming a layer on a substrate to facilitate fabrication of metrology standards |
| US20050106321A1 (en) * | 2003-11-14 | 2005-05-19 | Molecular Imprints, Inc. | Dispense geometery to achieve high-speed filling and throughput |
| WO2005120834A2 (en) | 2004-06-03 | 2005-12-22 | Molecular Imprints, Inc. | Fluid dispensing and drop-on-demand dispensing for nano-scale manufacturing |
| JP5044092B2 (ja) * | 2004-07-23 | 2012-10-10 | 株式会社東芝 | インクジェット塗布装置および塗布体の製造方法 |
| US7483767B2 (en) * | 2004-10-14 | 2009-01-27 | The George Washington University | Feedback mechanism for smart nozzles and nebulizers |
| US20070076040A1 (en) * | 2005-09-29 | 2007-04-05 | Applied Materials, Inc. | Methods and apparatus for inkjet nozzle calibration |
| US7360851B1 (en) * | 2006-02-15 | 2008-04-22 | Kla-Tencor Technologies Corporation | Automated pattern recognition of imprint technology |
| US8001924B2 (en) * | 2006-03-31 | 2011-08-23 | Asml Netherlands B.V. | Imprint lithography |
| KR100781997B1 (ko) | 2006-08-21 | 2007-12-06 | 삼성전기주식회사 | 잉크젯 헤드의 캘리브레이션 방법 및 그 장치 |
-
2009
- 2009-10-20 US US12/582,041 patent/US8480933B2/en active Active
- 2009-10-21 KR KR1020117010792A patent/KR101743979B1/ko active Active
- 2009-10-21 JP JP2011533172A patent/JP5638529B2/ja active Active
- 2009-10-21 TW TW098135615A patent/TWI430038B/zh active
- 2009-10-21 EP EP09744498A patent/EP2342600A2/en not_active Withdrawn
- 2009-10-21 WO PCT/US2009/005723 patent/WO2010047790A2/en not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| KR101743979B1 (ko) | 2017-06-07 |
| TW201022851A (en) | 2010-06-16 |
| JP2012506635A (ja) | 2012-03-15 |
| KR20110074582A (ko) | 2011-06-30 |
| US20100098848A1 (en) | 2010-04-22 |
| WO2010047790A3 (en) | 2010-08-26 |
| US8480933B2 (en) | 2013-07-09 |
| EP2342600A2 (en) | 2011-07-13 |
| WO2010047790A2 (en) | 2010-04-29 |
| JP5638529B2 (ja) | 2014-12-10 |
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