TWI415078B - 補償一照明裝置之老化過程之方法 - Google Patents

補償一照明裝置之老化過程之方法 Download PDF

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TWI415078B
TWI415078B TW095135616A TW95135616A TWI415078B TW I415078 B TWI415078 B TW I415078B TW 095135616 A TW095135616 A TW 095135616A TW 95135616 A TW95135616 A TW 95135616A TW I415078 B TWI415078 B TW I415078B
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Dirk Hente
Edward Willem Albert Young
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Koninkl Philips Electronics Nv
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    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
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    • G09G3/30—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
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Description

補償一照明裝置之老化過程之方法
本發明係關於一種補償一照明裝置之老化過程之方法，該照明裝置包含至少一有機發光二機體(OLED)，其具有隨時間變化的一光輸出。
具有有機發光二極體之照明裝置作為高級平板系統極為令人感興趣。這些系統利用通過有機材料薄膜之電流來產生光。該有機薄膜材料之組成物決定發光顏色及從電流到光之能量轉換效率。然而，隨著OLED之使用，在照明裝置中的該等有機材料會老化，發光時效率會不斷變低。此點會降低照明裝置之使用壽命。效率降低速率係照明裝置之電流密度及溫度之一函數。同時，照明裝置之溫度變化會影響效率變化。
US 2004/0070558A1說明一種有機發光二極體(OLED)顯示系統，其具有在一基板上的一可定址像素，該像素具有效能屬性、及一控制電路，其用於控制該顯示裝置之該等像素，該顯示裝置包含一或多個OLED像素及位於一基板上並連接至該控制電路的一OLED參考像素。該OLED參考像素包含與該一或多個OLED像素相同的效能屬性，該OLED參考像素具有一電壓感測電路，其包括連接至該OLED參考像素之該等端點之一者的一電晶體，用於感測橫跨該OLED參考像素的電壓以產生一電壓信號，其表示橫跨該OLED參考像素的該電壓。此外，該有機發光二極體包含一測量電路，其用以產生一輸出信號，該輸出信號表示該OLED參考像素之效能屬性、及一分析電路，其係連接至該測量電路以接收該輸出信號，該分析電路比較該等效能屬性與預定效能屬性，並回應其產生一回授信號。該控制電路回應該回授信號以補償該等OLED像素之輸出變化。
較不利的係，使用參考像素之所述OLED顯示系統之複雜性極高。而且，使用一參考像素不適用於一"單像素"照明裝置，因為其暗示著要加倍所安裝照明裝置之數目，其在經濟上及實務上均為一本質缺點。
本發明其目的在於排除該等上述缺點。特定言之，本發明之一目的係提供一種補償一照明裝置之老化過程之方法，該方法簡單且可容易調整成用以產生光，其中以一方式控制該OLED之光輸出，使得在該照明裝置之使用壽命過程中亮度恆定。
如本發明之請求項1所教導，藉由一種補償一照明系統之老化過程之方法來實現此目的。在附屬項內定義本發明方法之有利具體實施例。
因此，提供一種補償一照明系統之老化過程之方法，該照明系統包含至少一有機發光二機體(OLED)，其具有一個別電流電壓特徵及隨時間變化的一光輸出。此外，一驅動器與該OLED相連接。本發明方法包含一校正計算程序，其包含複數個步驟。本發明方法所提供的解決方案係基於該OLED上的電流電壓特徵之依賴性。依據本發明方法，必需決定一第一參數，其包括關於該OLED之實際電流電壓特徵之斜率。在下一步驟中，至少基於測量的該第一參數來產生指示老化的一校正信號，以便補償該OLED之該等光輸出變化。較驚奇的係，頃發現可基於已決定的該第一參數，其包含關於該實際電流電壓特徵之斜率之實際值之資訊，來產生一校正信號。該電流電壓特徵(IV曲線)之斜率會在OLED之使用壽命期間減小。
較佳的係，藉由該第一參數來考量該OLED之該實際對數電流電壓特徵之斜率。其意味著該特徵包括對數電流值及非對數電壓值(對數－線性電流電壓特徵或半對數特徵)。較有利的係，該驅動器包含一測量電路及一控制電路，其中該測量電路偵測該OLED之該實際半對數IV曲線之斜率之實際值而該控制電路向其產生該校正信號。在該校正計算程序期間，該驅動器可改變電流，而該測量電路偵測該OLED之電壓。而且，可藉由改變該OLED之電壓並藉由測量電流來獲得該IV曲線之斜率。在二者具體實施例中，該半對數IV曲線之斜率用作用於包括一OLED之照明裝置之老化補償之一指示器。將該半對數IV曲線之偵測斜率值饋送至該控制電路，其調整驅動電流以獲得該照明裝置之一恆定光輸出。可藉由一數學函數，其基於測量的該第一參數來產生一校正信號，來獲得用以獲得一恆定光輸出之補償之數量。
依據本發明之另一較佳具體實施例，該驅動器可包含一查找表，以便回應該半對數IV曲線之該測量斜率來決定該校正信號。較佳的係，藉由一以微控制器為主的控制電路來進行該校正計算程序。
較有利的係，該驅動器偵測該實際電流電壓特徵之斜率之實際值是否大於該OLED之臨界電壓。該臨界電壓係定義為橫跨引起照明的該OLED之最小電壓。該臨界電壓由於老化會在該OLED使用壽命期間增加。因此，正常操作電壓亦會增加。可將該OLED之臨界電壓儲存於該驅動器之一記憶體內。或者，在偵測該實際半對數IV曲線之斜率之實際值之前，該測量電路測量該OLED之臨界電壓。藉由考量該半對數IV曲線是否大於該OLED之臨界電壓，可實質上改良用以補償光輸出變化的該校正信號之品質。
取決於該計算程序，該實際半對數IV曲線之偵測斜率可以係用於計算該校正信號的唯一參數。依據本發明之一較佳具體實施例，該計算程序含多個參數以產生該校正信號。一額外參數可以係該OLED之開啟次數，其係藉由該測量電路來偵測。該驅動器還可計算該OLED之一平均開啟次數，亦可將其考量在該校正計算程序內。
溫度可以係指示老化的一額外參數。例如，可藉由一溫度感測器來決定該溫度資訊並將其發送至該控制電路。可每隔數分鐘來執行溫度測量並可將結果儲存於該驅動器之一記憶體內。而且，可從一查找表讀取該溫度資訊，其係該驅動器之一固定部分。
依據本發明之另一較佳具體實施例，該未使用OLED之電流電壓特徵可以係用於該校正計算程序的一重要參數。在此情況下，將該實際半對數IV曲線之斜率之實際值與該未使用半對數IV曲線之斜率值進行比較，以便獲得關於該OLED之老化的資訊。較佳的係，將該未使用OLED之電流電壓特徵儲存於該驅動器內。
此外，可在一電腦系統上實施依據本發明之方法。調適以執行本發明之該等步驟之一電腦程式自動產生該校正信號以補償該OLED之該等光輸出變化。使用此類電腦程式，其係調適以操作本發明方法，可自動完成依據本發明之校正計算程序，且總體能量消耗較低。
使用期間，在開啟或關閉時可連續地或定期地執行該校正計算程序之上述步驟。或者，可回應供應至該控制電路的使用者信號來執行該校正計算程序。可在數量上限制任何校正變化，例如至一5%變化。還可根據時間平均化校正變化。或者，僅在進行數次讀取之後執行一實際校正，例如每次開啟該OLED時，執行一校正計算並平均化計算的校正信號之數目，以產生施加至該OLED的該實際校正信號。在該OLED之正常照明過程期間，進行該校正計算程序，肉眼無法看見此點。
本發明係關於一種照明裝置，其包含至少一有機發光二極體(OLED)，其具有隨時間變化的一光輸出、及連接至該OLED的一驅動器，其具有一個別電流電壓特徵，其中該照明裝置包含一測量電路，其用於決定一第一參數，該第一參數包括關於該OLED之該實際電流電壓特徵之斜率之資訊、及一控制電路，其用於基於指示老化的該第一參數來產生一校正信號，以便補償該OLED之該等光輸出變化。用於獲得一恆定光輸出之補償數量係該驅動器之一固定部分或採用一以微控制器為主電路之一控制演算法形式來加以實現。該補償特徵取決於該OLED並可程式化地加以變化。
該照明裝置及上述方法可用於各種系統，例如尤其汽車系統、家庭照明系統、顯示器背光系統、環境照明系統、相機閃光燈(色彩可調整)或商店照明系統。
該等前述組件以及該等申明組件及依據本發明用於所述具體實施例之該等組件針對作為技術概念的尺寸、形狀、材料選擇方面不受任何特殊例外影響，因此可無限制地應用相關領域習知的選擇標準。
在該等附屬項內揭示本發明之目的之額外細節、特徵及優點，該等個別圖示之下列說明，其僅用於說明目的，係說明依據本發明之照明裝置之一較佳具體實施例。
圖1說明具有一有機發光二極體1(OLED)之一照明裝置，其中該照明裝置之光輸出隨時間變化。該照明裝置包含一驅動器2，其係連接OLED 1。驅動器2包括一測量電路3及一控制電路4，測量電路3決定OLED 1之該實際對數電流電壓特徵之斜率之實際值。在本發明之所示具體實施例中，該等電流值係對數化，而該等電壓值係非對數化(半對數電流電壓特徵)。一控制電路4基於該實際半對數電流電壓特徵(IV曲線)之斜率之測量實際值來產生一校正信號，以便補償OLED 1之該等光輸出變化。該IV曲線之該已決定斜率係用於OLED 1之老化的一明顯參數。
頃發現，針對一恆定驅動電流，橫跨OLED 1之電壓隨著操作時間增加而增加，如圖2b所示。參見圖2a，該電壓還隨著溫度不斷增加而增加。因而，該電壓無法用作一OLED裝置1之一老化指示器，因為該老化取決於溫度及操作時間。然而，比較二圖表，可以看出，該等半對數IV曲線之斜率實質上隨著操作時間而變化，同時該斜率幾乎獨立於溫度。溫度變化僅引起該半對數IV特徵之一電壓偏移，如圖2b所示。
依據所示具體實施例，驅動器2偵測該實際半對數IV曲線之斜率之實際值是否大於OLED 1之臨界電壓，如圖2b中參考數字8所示。此外，圖2b中說明該未使用OLED 1之半對數電流電壓特徵7及1/2使用壽命的OLED 1之半對數電流電壓特徵6，圖2b顯示二IV曲線6、7之間的本質差異僅存在於OLED 1之臨界電壓8上面的區域內。
在照明過程期間，驅動器2測量OLED 1之實際半對數電流電壓特徵之斜率。此後，產生基於該半對數IV曲線之斜率之偵測實際值的一校正信號，其調整該驅動電流以獲得一恆定光輸出。額外參數，例如OLED 1之開啟次數或溫度，還可用於該產生校正信號程序。在本發明之一可行具體實施例中，可從驅動器2之一記憶體5讀取該些額外參數。或者，可在該校正計算程序之前或期間測量該些額外參數。在所示具體實施例中，藉由位於(？)控制電路4內的一微控制器之一演算法來進行用於產生該校正信號的該程序。
在本發明之一可行具體實施例中，可將針對包括關於使用壽命及光輸出之資訊的用於該OLED校正信號之計算結果儲存於該記憶體5內。局部將專用於一OLED瓦片1之此額外資訊儲存於一記憶體5上的一優點在於，當將新OLED瓦片1添加至OLED瓦片1裝配件時或當OLED瓦片1係重新配置於OLED瓦片1裝配件內時，還傳輸有價值的色彩校正資料、老化因素、及其他細節。
1．．．OLED
2．．．驅動器
3．．．測量電路
4．．．控制電路
5．．．記憶體裝置
6．．．半對數IV曲線(1/2使用壽命)
7．．．半對數IV曲線(未使用OLED)
8．．．臨界電壓區域
圖1顯示依據本發明之一照明裝置之一完全示意圖；圖2a顯示作為溫度之一函數的依據圖1之照明裝置之一OLED之半對數IV曲線；圖2b顯示作為使用壽命之一函數的依據圖1之一OLED之二半對數IV曲線。
1．．．OLED
2．．．驅動器
3．．．測量電路
4．．．控制電路
5．．．記憶體裝置

Claims (10)

  1. 一種補償一照明裝置之老化過程之方法，該照明裝置包含：至少一有機發光二極體(1)(OLED)，其具有隨時間變化的一光輸出，一驅動器(2)，其係連接至具有一個別電流電壓特徵之該OLED(1)，其並包含一校正計算程序，其包括下列步驟：決定一第一參數，其包括關於該OLED(1)之實際半對數電流電壓特徵之斜率之資訊，並至少基於該第一參數來產生指示老化的一校正信號，以便補償該OLED(1)之該等光輸出變化。
  2. 如請求項1之方法，其中該驅動器(2)包含一測量電路(3)及一控制電路(4)，其中該測量電路(3)偵測該OLED(1)之該實際半對數電流電壓特徵之斜率之實際值，且該控制電路(4)向其產生該校正信號。
  3. 如請求項1或2之方法，其中該驅動器(2)偵測該實際半對數電流電壓特徵之斜率之實際值是否大於該OLED(1)之臨界電壓。
  4. 如請求項1或2之方法，其中該測量電路(3)測量該OLED(1)之開啟次數，其係用於老化的一第二參數。
  5. 如請求項1或2之方法，其中一第三參數包含該未使用OLED(1)之該電流電壓特徵。
  6. 如請求項1或2之方法，其中該驅動器(2)包含一數學函數 及/或一查找表用以基於該等參數來產生該校正信號。
  7. 如請求項1或2之方法，其中該驅動器(2)包含一硬體電路，特別是一被動網路，以回應該測量的該第一參數來決定該校正信號。
  8. 如請求項1或2之方法，其中將用於老化的該等參數及計算的該校正信號儲存於一記憶體裝置(5)內。
  9. 一種照明裝置，其包含至少一有機發光二極體(1)(OLED)，其具有隨時間變化的一光輸出以及一驅動器(2)，其係連接至具有一個別電流電壓特徵之該OLED(1)，其中該照明裝置包含：一測量電路(3)，其用於決定一第一參數，其包括關於該OLED(1)之該實際半對數電流電壓特徵之斜率之資訊、及一控制電路(4)，其用於至少基於該第一參數來產生指示老化的一校正信號，以便補償該OLED(1)之該等光輸出變化。
  10. 如請求項9之照明裝置，其中該裝置係可操作以執行如請求項1至8之方法。
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