CN101278327B - 一种补偿照明设备老化过程的方法 - Google Patents

一种补偿照明设备老化过程的方法 Download PDF

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CN101278327B
CN101278327B CN2006800360617A CN200680036061A CN101278327B CN 101278327 B CN101278327 B CN 101278327B CN 2006800360617 A CN2006800360617 A CN 2006800360617A CN 200680036061 A CN200680036061 A CN 200680036061A CN 101278327 B CN101278327 B CN 101278327B
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D·亨特
E·W·A·扬
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Abstract

所述发明涉及一种补偿照明设备老化过程的方法，该照明设备包含至少一个其光输出线随时间变化的有机发光二极管(1)(OLED)和与该OLED(1)相连接的驱动器，该OLED具有独特的伏安特性。

Description

一种补偿照明设备老化过程的方法
本发明涉及一种补偿照明设备老化过程的方法，该照明设备包含至少一个其光输出随时间改变的有机发光二极管(OLED)。
使用有机发光二极管的照明设备使高级平板系统等产生了极大的兴趣。这些系统利用流经有机材料薄膜的电流来产生光。所发射光的颜色和光电能量转换效率由有机薄膜材料的成分决定。然而，随着OLED的使用，照明设备中的有机材料会逐渐老化并且发光效率也变低。这缩短了照明设备的使用寿命。效率降低的速度是电流密度和照明设备温度的函数。同时，照明设备温度的变化也会影响效率的变化。
US 2004/0070558A1描述了一种有机发光二极管(OLED)显示系统，该系统具有位于衬底上的可寻址的且具备性能属性的像素和用于控制显示设备像素的控制电路，该显示系统包含位于衬底上的且与控制电路连接的一个或者多个OLED像素和一个OLED参考像素。OLED参考像素包含与一个或者多个OLED像素相同的性能属性，OLED参考像素具有一种电压感测电路，该电路包含一个连接在OLED参考像素的一个端子上的晶体管，用于感测OLED参考像素上的电压以产生一个表示OLED参考像素上电压的电压信号。并且，有机发光二极管包含用来产生表示OLED参考像素性能属性的输出信号的测量电路和连接到该测量电路用来接收输出信号的分析电路，所述分析电路将该性能属性同预先设定的性能属性相比较，并响应于此产生一个反馈信号。所述控制电路对该反馈信号做出响应来补偿OLED像素输出的变化。
不幸的是，所描述的这种使用参考像素的OLED显示系统的复杂性非常高。并且，使用参考像素的做法并不适用于“单像素”的照明设备，因为这样就意味着安装的照明设备的数量要加倍，而这在经济性和实用性上都是一个根本的缺陷。
US 2004/0135749A涉及补偿OLED设备的老化，其中用来产生不变亮度的电流基于一种数学方程计算得到。
US 2003/0071821A1公开了对于发射显示器的亮度补偿方法，其中应用于OLED以获得稳定亮度的电压由一种数学方程计算得到。
EP 1 225 557 A1公开了一种平板显示器亮度校正设备，其中测量场致发射显示器FED的阳极电流并且其中在视频无功周期期间照亮任意像素。
本发明的目标就在于消除上面所提到的缺陷。特别地，本发明的一个目标在于提供一种补偿照明设备老化过程的方法，该方法简单并且容易调整来产生光，其中OLED的光输出以这样一种方式来控制：在该照明设备的整个使用期内亮度是恒定的。
这个目标通过本发明所述的一种补偿照明设备老化过程的方法来实现。
于是，提供一种补偿照明设备老化过程的方法，该照明设备包含至少一个具备独特伏安特性并且其光输出随时间变化的有机发光二极管(OLED)。并且，一驱动器与该OLED连接。本发明的方法包含一个由多个步骤组成的校正计算过程。本发明的方法所提出的解决方案基于OLED上伏安特性的相关性。依照本发明的方法，必须确定第一参数，这个参数包括有关OLED实际伏安特性的斜率的信息。在接下来的步骤中，至少基于所测量的第一参数来产生一个表示老化过程的校正信号，以用于补偿OLED光输出的变化。令人惊讶地，我们已经发现基于已确定的第一参数来可以产生校正信号，该参数包含有关实际伏安特性斜率的实际值的信息。伏安特性的斜率(IV曲线)在OLED的使用期内会降低。
优选地，第一参数考虑了取对数后的OLED实际伏安特性的斜率。那意味着所述特性包括取对数后的电流值和未取对数的电压值(log-lin伏安特性或者半对数特性)。有利地，驱动器包含测量电路和控制电路，其中测量电路检测OLED实际半对数伏安曲线的实际斜率值，控制电路产生用于该OLED的校正信号。在校正计算的过程中，驱动器能够改变电流而测量电路检测OLED的电压。同样，通过改变OLED的电压以及测量电流可以得到伏安曲线的斜率。在这两个实施例中，半对数伏安曲线的斜率被用作包含OLED的照明设备的老化补偿的指标。所检测的半对数伏安曲线的斜率值被反馈给控制电路，该控制电路调整驱动电流从而获得该照明设备恒定的光输出。获得恒定光输出所需的补偿量能够通过数学方程得到，该方程基于所测量的第一参数产生一个校正信号。
依照本发明的另一个优选实施例，驱动器可以包含一个查找表，从而依据测量得到的半对数伏安曲线的斜率来确定所述校正信号。优选地，校正计算过程由基于微处理器的控制电路来执行。
有利地，驱动器检测高于OLED阈值电压的实际伏安特性的实际斜率值。该阈值电压被定义为能够在OLED上引发照明的最小电压值。由于老化的原因，OLED的阈值电压会在使用期内逐渐升高。因而，正常的操作电压也会随之升高。OLED的阈值电压值能够储存在驱动器的存储器中。可替换地，测量电路可以在检测实际半对数伏安曲线的实际斜率值之前测量OLED的阈值电压。通过考虑OLED阈值电压之上的半对数伏安曲线，校正信号补偿光输出变化的效果会得到充分的提高。
根据计算过程，检测得到的实际半对数伏安曲线的斜率可以是计算校正信号的唯一参数。依照本发明的一个优选实施例，计算过程包含多于一个参数来产生校正信号。一个附加参数可以是由测量电路检测得到的OLED的导通时间。驱动器也可以计算OLED的平均导通时间，也可以在校正计算的过程中进行考虑。
温度也可以作为反映老化的一个附加参数。例如，可以用一种温度传感器来确定温度信息并将其传送给控制电路。温度的测量可以每几分钟执行一次并将测量结果储存在驱动器的存储器内。温度信息也可以从作为驱动器固定部分的查找表中读取得到。
依照另一个优选实施例，未使用的OLED的伏安特性也可以作为校正计算过程的一个重要参数。在这种情况下，比较实际半对数伏安曲线的实际斜率值和未使用的半对数伏安曲线的斜率值从而得到有关OLED老化的信息。优选地，未使用的OLED的伏安特性储存在驱动器中。
另外，根据本发明的方法可以在计算机系统上执行。适合于执行本发明各步骤的计算机程序自动产生用于补偿OLED光输出变化的校正信号。借助这样一种适合于操作本发明方法的计算机程序，根据本发明的校正计算过程可以被自动地执行并且具有较低的整体能量消耗。
上面描述的校正计算过程的步骤可以在上电、断电以及使用过程中连续地或者周期性地执行。可替换地，校正计算过程也可以通过响应提供给控制电路的用户信号来执行。校正的任何变化可以在幅值上进行限制，比如限制为5％的变化。校正变化也可以在时间上平均。可替换地，一次实际的校正可以只在若干次读取之后进行，比如每当OLED上电的时候，执行校正计算以及多个所计算的校正信号被平均来产生应用于OLED的实际校正信号。在OLED的正常照明过程中执行校正计算过程，其对人眼是不可见的。
本发明涉及一种照明设备，该照明设备包含至少一个具有随时间变化的光输出的有机发光二极管(OLED)和与该OLED相连接的驱动器，该OLED具有独特的伏安特性，其中该照明设备包括测量电路和控制电路，该测量电路用来确定包含关于OLED实际伏安特性的斜率的信息的第一参数，该控制电路至少基于反映老化的第一参数来生成校正信号从而补偿OLED的光输出的变化。获得恒定光输出的补偿量既可以是驱动器的一个固定部分又可以基于微处理器的电路的控制算法的形式来实现。补偿特性取决于OLED并且能够可编程地改变。
上面所提到的照明设备和方法都能应用于多种系统当中，尤其例如车辆系统、家庭照明系统、用于显示的背光系统、环境照明系统、(具有可调颜色的)照相机闪光灯或者商店照明系统。
前面提到的组件以及要求权利的组件和所述实施例中将根据本发明使用的组件都不受任何关于技术概念上大小、形状、材料选择等特殊异常的约束，这样使得在相关领域已知的所选条件能够无限制地应用。
接下来对各个附图的描述涉及有关本发明的照明设备的优选实施例，该描述只作说明的目的。
图1示出了一个根据本发明的照明设备的非常概要的视图，
图2a示出了根据图1中照明设备的OLED的半对数曲线，该曲线是温度的函数，
图2b示出了根据图1中的OLED的两条半对数伏安曲线，这些曲线是使用寿命的函数。
图1举例说明了包含一个有机发光二极管1(OLED)的照明设备，其中照明设备的光输出会随着时间改变。该照明设备包含连接在OLED1上的驱动器2。驱动器2包含测量电路3和控制电路4，测量电路3确定OLED1的实际对数伏安特性的实际斜率值。在本发明的所示实施例中，电流值被取对数，而电压值不取对数(半对数伏安特性)。控制电路4基于所测得的实际半对数伏安特性的实际斜率值来产生校正信号从而补偿OLED1的光输出的变化。确定的伏安曲线斜率是OLED1老化的一个重要参数。
现在已经发现，对于恒定的驱动电流，OLED1上的电压会随着操作时间而增大，这被图解在图2b中。参考图2a，电压随着温度的升高也会增大。所以，电压并不能被用作OLED设备1的老化指标，因为老化取决于温度和工作时间。但是对比这两张图可以发现，半对数伏安曲线的斜率随工作时间发生非常大的变化，但几乎不依赖于温度。温度的变化仅仅引起半对数伏安特性的电压漂移，这被图解在图2b中。
依照所示的实施例，驱动器2检测高于OLED1的阈值电压的实际半对数伏安曲线的实际斜率值，该阈值电压以附图标记8示出在图2b中。并且，未使用的OLED1的半对数伏安特性7和具有1/2使用寿命的OLED1的半对数伏安特性6都被示在图2b中，该图显示出伏安特性曲线6、7之间的主要差别只存在于高于OLED1的阈值电压8的区域内。
在照明过程中，驱动器2测量OLED1的实际半对数伏安特性的斜率。随后，基于所检测的半对数伏安曲线的实际斜率值生成校正信号，这种校正信号调整驱动电流从而获得恒定的光输出。附加的一些参数例如OLED的导通时间或者温度也可以被用于产生校正信号的过程。在本发明的一个可能的实施例中，这些附加的参数可以从驱动器2的存储器5中读取。可替换地，这些附加参数也可以在校正计算过程之前或者该过程期间测量。在所示的实施例中，产生校正信号的过程由控制电路4中微处理器的算法来实现。
在本发明的一个可能的实施例中，用于OLED校正信号的计算结果可以被储存在所述存储器5中，该校正信号包含有关使用寿命和光输出的信息。将OLED砖片1特定的附加信息储存在本地存储器5的一个好处是，当有新的OLED砖片1被添加进OLED砖片1组件或者当OLED砖片1在OLED砖片1组件中被重新排列时，有价值的色彩校正数据、老化参数和其他一些详细资料也同时被传送。
数字列表：
1OLED
2驱动器
3测量电路
4控制电路
5存储设备
6半对数IV曲线(1/2使用寿命)
7半对数IV曲线(未使用的0LED)
8阈值电压区域

Claims (10)

1.一种用于补偿照明设备老化过程的方法，该照明设备包括：
至少一个有机发光二极管OLED(1)，其具有随时间变化的光输出，
与该OLED(1)相连接的驱动器(2)，该OLED具有特定的伏安特性，
该方法包括含有以下步骤的校正计算过程：
确定包含有关OLED(1)实际半对数伏安特性的斜率的信息的第一参数，至少基于表示老化的该第一参数产生校正信号以用于补偿OLED(1)的光输出中的变化。
2.依照权利要求1的方法，其特征在于所述校正信号被用于调整该OLED(1)的驱动电流以获得恒定的光输出。
3.依照权利要求1或2的方法，其特征在于驱动器(2)包括测量电路(3)和控制电路(4)，其中测量电路(3)检测OLED(1)的实际半对数伏安特性的实际斜率值，控制电路(4)产生用于该OLED的校正信号。
4.依照权利要求1或2的方法，其特征在于驱动器(2)检测高于OLED(1)阈值电压的实际半对数伏安特性的实际斜率值。
5.依照权利要求3的方法，其特征在于测量电路(3)测量OLED(1)的导通时间作为表示老化的第二参数，并且所述校正信号也基于该第二参数产生。
6.依照权利要求1或2的方法，其特征在于第三参数包含未使用的OLED(1)的伏安特性，并且所述校正信号也基于该第三参数产生。
7.依照权利要求1或2的方法，其特征在于驱动器(2)包含硬件电路，用来响应于所测量的第一参数确定校正信号。
8.依照权利要求1的方法，其特征在于表示老化的参数和计算得到的校正信号都被储存在存储器(5)中。
9.一种照明设备，包括
至少一个有机发光二极管OLED(1)，其具有随时间变化的光输出，以及
与该OLED相连的驱动器(2)，该OLED具有特定的伏安特性，
其中该照明设备包含：
测量电路(3)和控制电路(4)，该测量电路用于确定包含有关OLED(1)实际半对数伏安特性的斜率的信息的第一参数，该控制电路至少基于表示老化的该第一参数生成校正信号以用于补偿OLED(1)的光输出中的变化。
10.依照权利要求9的照明设备，使用了依照权利要求1至8中任意一项的方法。
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