TWI408378B - 電流偵測裝置 - Google Patents

電流偵測裝置 Download PDF

Info

Publication number
TWI408378B
TWI408378B TW095108670A TW95108670A TWI408378B TW I408378 B TWI408378 B TW I408378B TW 095108670 A TW095108670 A TW 095108670A TW 95108670 A TW95108670 A TW 95108670A TW I408378 B TWI408378 B TW I408378B
Authority
TW
Taiwan
Prior art keywords
coupled
amplifier
phase
input
reference potential
Prior art date
Application number
TW095108670A
Other languages
English (en)
Chinese (zh)
Other versions
TW200643427A (en
Inventor
Youssef H Atris
Brandt Braswell
Douglas A Garrity
Original Assignee
Freescale Semiconductor Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Freescale Semiconductor Inc filed Critical Freescale Semiconductor Inc
Publication of TW200643427A publication Critical patent/TW200643427A/zh
Application granted granted Critical
Publication of TWI408378B publication Critical patent/TWI408378B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0023—Measuring currents or voltages from sources with high internal resistance by means of measuring circuits with high input impedance, e.g. OP-amplifiers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
    • G01R1/203—Resistors used for electric measuring, e.g. decade resistors standards, resistors for comparators, series resistors, shunts

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Amplifiers (AREA)
  • Measurement Of Current Or Voltage (AREA)
TW095108670A 2005-04-01 2006-03-15 電流偵測裝置 TWI408378B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/097,593 US7102365B1 (en) 2005-04-01 2005-04-01 Apparatus for current sensing

Publications (2)

Publication Number Publication Date
TW200643427A TW200643427A (en) 2006-12-16
TWI408378B true TWI408378B (zh) 2013-09-11

Family

ID=36939453

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095108670A TWI408378B (zh) 2005-04-01 2006-03-15 電流偵測裝置

Country Status (5)

Country Link
US (2) US7102365B1 (https=)
JP (1) JP5030940B2 (https=)
CN (1) CN100580463C (https=)
TW (1) TWI408378B (https=)
WO (1) WO2006107572A2 (https=)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7714762B2 (en) * 2005-04-12 2010-05-11 Massachusetts Institute Of Technology Method and apparatus for current-mode ADC
JP5025171B2 (ja) * 2005-09-29 2012-09-12 エスケーハイニックス株式会社 差動増幅装置
US7964993B2 (en) * 2006-12-11 2011-06-21 Akros Silicon Inc. Network devices with solid state transformer and class AB output stage for active EMI suppression and termination of open-drain transmit drivers of a physical device
US7535391B1 (en) 2008-01-07 2009-05-19 Freescale Semiconductor, Inc. Analog-to-digital converter having random capacitor assignment and method thereof
US7589658B2 (en) * 2008-02-05 2009-09-15 Freescale Semiconductor, Inc. Analog-to-digital converter with variable gain and method thereof
US7969167B2 (en) * 2009-01-28 2011-06-28 Freescale Semiconductor, Inc. Capacitance-to-voltage interface circuit with shared capacitor bank for offsetting and analog-to-digital conversion
US8125231B2 (en) 2009-01-28 2012-02-28 Freescale Semiconductor, Inc. Capacitance-to-voltage interface circuit, and related operating methods
US7796079B2 (en) * 2009-01-28 2010-09-14 Freescale Semiconductor, Inc. Charge redistribution successive approximation analog-to-digital converter and related operating method
US8096179B2 (en) * 2009-04-09 2012-01-17 Freescale Semiconductor, Inc. Sensor device with reduced parasitic-induced error
US9709603B2 (en) * 2014-03-31 2017-07-18 Microsemi Corporation Current sensing system and method
CN105891591B (zh) * 2016-04-08 2018-08-31 北京精密机电控制设备研究所 一种大功率储能逆变器电流检测控制系统
WO2019109363A1 (en) * 2017-12-09 2019-06-13 Dongguan Bang Bang Tang Electronic Technologies Co., Ltd. Current sensor for biomedical measurements
GB2569641B (en) * 2017-12-22 2020-09-09 Shenzhen Dansha Tech Co Ltd Current sensor for biomedical measurements
GB2583584B (en) * 2017-12-22 2021-04-28 Shenzhen Dansha Tech Co Ltd Current sensor for biomedical measurements
WO2020125878A1 (en) * 2018-12-20 2020-06-25 Apator Miitors Aps Ultrasonic flow meter with switchable transducers
US12438509B2 (en) * 2023-06-16 2025-10-07 Trustees Of Boston University Extended energy range particle detectors and uses thereof

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5574457A (en) * 1995-06-12 1996-11-12 Motorola, Inc. Switched capacitor gain stage
US5867054A (en) * 1997-07-31 1999-02-02 National Semiconductor Corporation Current sensing circuit
TW386161B (en) * 1997-05-01 2000-04-01 Central Research Lab Ltd Electrochemical sensing circuits

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5517140A (en) * 1994-04-14 1996-05-14 Matsushita Electric Industrial Co., Ltd. Sample and hold circuit
JP2001006384A (ja) * 1999-06-16 2001-01-12 Sharp Corp サンプル／ホールド回路とこれを用いた基準電圧発生回路
JP4330791B2 (ja) * 2000-12-27 2009-09-16 セイコーインスツル株式会社 半導体集積回路装置および半導体集積回路装置の制御方法
JP3628636B2 (ja) * 2001-07-30 2005-03-16 シャープ株式会社 スイッチトキャパシタ回路
US6617838B1 (en) * 2001-09-11 2003-09-09 Analog Devices, Inc. Current measurement circuit
JP4094436B2 (ja) * 2003-01-16 2008-06-04 セイコーインスツル株式会社 スイッチトキャパシタ増幅回路および電子機器

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5574457A (en) * 1995-06-12 1996-11-12 Motorola, Inc. Switched capacitor gain stage
TW386161B (en) * 1997-05-01 2000-04-01 Central Research Lab Ltd Electrochemical sensing circuits
US5867054A (en) * 1997-07-31 1999-02-02 National Semiconductor Corporation Current sensing circuit

Also Published As

Publication number Publication date
US7102365B1 (en) 2006-09-05
JP2008534962A (ja) 2008-08-28
US7282929B2 (en) 2007-10-16
TW200643427A (en) 2006-12-16
US20060279293A1 (en) 2006-12-14
WO2006107572A2 (en) 2006-10-12
CN101142489A (zh) 2008-03-12
WO2006107572A3 (en) 2007-01-04
JP5030940B2 (ja) 2012-09-19
CN100580463C (zh) 2010-01-13

Similar Documents

Publication Publication Date Title
TWI408378B (zh) 電流偵測裝置
JPH04351969A (ja) 電流測定回路
TWI470254B (zh) Magnetic sensor circuit
US6982559B2 (en) Accurate and efficient sensing circuit and method for bi-directional signals
TW200925629A (en) Magnetic sensor circuit
KR20120121779A (ko) 자기 검출 회로의 오프셋 보상 장치 및 그 방법
JP4977741B2 (ja) 電流検出装置
JP4642413B2 (ja) 電流検出装置
CN101359001A (zh) 放大信号的方法和装置以及使用该方法和装置的测试设备
JP2972552B2 (ja) 容量型センサ用検出回路および検出方法
JP2003066074A (ja) 抵抗測定方法および抵抗測定装置
CN112697343B (zh) 电阻桥式压力传感器的检测电路、方法、电子设备及芯片
CN205509991U (zh) 放大电路及传感信号处理装置
JP2003282158A (ja) 電池電圧測定回路
JP3584803B2 (ja) 圧力センサ回路
Nagarajan et al. A direct-digital converter for resistive sensor elements in bridge configuration
EP4250560A1 (en) Amplifier circuit and sensor circuit
CN110095197B (zh) 温度测量装置
JP2001027655A (ja) 容量型センサの信号処理回路
WO2010098090A1 (ja) 電圧極性判別回路及び電荷量計測回路
JP2008198063A (ja) 座標位置検出装置
CN105680810B (zh) 放大电路、信号放大方法及传感信号处理装置
JP3584205B2 (ja) 半導体装置
JP4581629B2 (ja) 赤外線検知装置
CN103762949A (zh) 一种针对小信号变化检测的电平转换电路