CN100580463C - 用于电流感测的设备 - Google Patents

用于电流感测的设备 Download PDF

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Publication number
CN100580463C
CN100580463C CN200680008837A CN200680008837A CN100580463C CN 100580463 C CN100580463 C CN 100580463C CN 200680008837 A CN200680008837 A CN 200680008837A CN 200680008837 A CN200680008837 A CN 200680008837A CN 100580463 C CN100580463 C CN 100580463C
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CN
China
Prior art keywords
coupling
amplifier
electrode
phase place
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN200680008837A
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English (en)
Chinese (zh)
Other versions
CN101142489A (zh
Inventor
尤瑟夫·H·阿特瑞斯
布兰兹·布瑞斯韦尔
道格拉斯·A.·加里逖
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NXP USA Inc
Original Assignee
Freescale Semiconductor Inc
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Publication date
Application filed by Freescale Semiconductor Inc filed Critical Freescale Semiconductor Inc
Publication of CN101142489A publication Critical patent/CN101142489A/zh
Application granted granted Critical
Publication of CN100580463C publication Critical patent/CN100580463C/zh
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0023—Measuring currents or voltages from sources with high internal resistance by means of measuring circuits with high input impedance, e.g. OP-amplifiers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
    • G01R1/203—Resistors used for electric measuring, e.g. decade resistors standards, resistors for comparators, series resistors, shunts

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Amplifiers (AREA)
  • Measurement Of Current Or Voltage (AREA)
CN200680008837A 2005-04-01 2006-03-17 用于电流感测的设备 Expired - Fee Related CN100580463C (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/097,593 2005-04-01
US11/097,593 US7102365B1 (en) 2005-04-01 2005-04-01 Apparatus for current sensing

Publications (2)

Publication Number Publication Date
CN101142489A CN101142489A (zh) 2008-03-12
CN100580463C true CN100580463C (zh) 2010-01-13

Family

ID=36939453

Family Applications (1)

Application Number Title Priority Date Filing Date
CN200680008837A Expired - Fee Related CN100580463C (zh) 2005-04-01 2006-03-17 用于电流感测的设备

Country Status (5)

Country Link
US (2) US7102365B1 (https=)
JP (1) JP5030940B2 (https=)
CN (1) CN100580463C (https=)
TW (1) TWI408378B (https=)
WO (1) WO2006107572A2 (https=)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7714762B2 (en) * 2005-04-12 2010-05-11 Massachusetts Institute Of Technology Method and apparatus for current-mode ADC
JP5025171B2 (ja) * 2005-09-29 2012-09-12 エスケーハイニックス株式会社 差動増幅装置
US7964993B2 (en) * 2006-12-11 2011-06-21 Akros Silicon Inc. Network devices with solid state transformer and class AB output stage for active EMI suppression and termination of open-drain transmit drivers of a physical device
US7535391B1 (en) 2008-01-07 2009-05-19 Freescale Semiconductor, Inc. Analog-to-digital converter having random capacitor assignment and method thereof
US7589658B2 (en) * 2008-02-05 2009-09-15 Freescale Semiconductor, Inc. Analog-to-digital converter with variable gain and method thereof
US7969167B2 (en) * 2009-01-28 2011-06-28 Freescale Semiconductor, Inc. Capacitance-to-voltage interface circuit with shared capacitor bank for offsetting and analog-to-digital conversion
US8125231B2 (en) 2009-01-28 2012-02-28 Freescale Semiconductor, Inc. Capacitance-to-voltage interface circuit, and related operating methods
US7796079B2 (en) * 2009-01-28 2010-09-14 Freescale Semiconductor, Inc. Charge redistribution successive approximation analog-to-digital converter and related operating method
US8096179B2 (en) * 2009-04-09 2012-01-17 Freescale Semiconductor, Inc. Sensor device with reduced parasitic-induced error
US9709603B2 (en) * 2014-03-31 2017-07-18 Microsemi Corporation Current sensing system and method
CN105891591B (zh) * 2016-04-08 2018-08-31 北京精密机电控制设备研究所 一种大功率储能逆变器电流检测控制系统
WO2019109363A1 (en) * 2017-12-09 2019-06-13 Dongguan Bang Bang Tang Electronic Technologies Co., Ltd. Current sensor for biomedical measurements
GB2569641B (en) * 2017-12-22 2020-09-09 Shenzhen Dansha Tech Co Ltd Current sensor for biomedical measurements
GB2583584B (en) * 2017-12-22 2021-04-28 Shenzhen Dansha Tech Co Ltd Current sensor for biomedical measurements
WO2020125878A1 (en) * 2018-12-20 2020-06-25 Apator Miitors Aps Ultrasonic flow meter with switchable transducers
US12438509B2 (en) * 2023-06-16 2025-10-07 Trustees Of Boston University Extended energy range particle detectors and uses thereof

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5517140A (en) * 1994-04-14 1996-05-14 Matsushita Electric Industrial Co., Ltd. Sample and hold circuit
US5867054A (en) * 1997-07-31 1999-02-02 National Semiconductor Corporation Current sensing circuit
US6617838B1 (en) * 2001-09-11 2003-09-09 Analog Devices, Inc. Current measurement circuit

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5574457A (en) * 1995-06-12 1996-11-12 Motorola, Inc. Switched capacitor gain stage
GB9708786D0 (en) * 1997-05-01 1997-06-25 Central Research Lab Ltd Elecrochemical sensing circuits
JP2001006384A (ja) * 1999-06-16 2001-01-12 Sharp Corp サンプル／ホールド回路とこれを用いた基準電圧発生回路
JP4330791B2 (ja) * 2000-12-27 2009-09-16 セイコーインスツル株式会社 半導体集積回路装置および半導体集積回路装置の制御方法
JP3628636B2 (ja) * 2001-07-30 2005-03-16 シャープ株式会社 スイッチトキャパシタ回路
JP4094436B2 (ja) * 2003-01-16 2008-06-04 セイコーインスツル株式会社 スイッチトキャパシタ増幅回路および電子機器

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5517140A (en) * 1994-04-14 1996-05-14 Matsushita Electric Industrial Co., Ltd. Sample and hold circuit
US5867054A (en) * 1997-07-31 1999-02-02 National Semiconductor Corporation Current sensing circuit
US6617838B1 (en) * 2001-09-11 2003-09-09 Analog Devices, Inc. Current measurement circuit

Also Published As

Publication number Publication date
TWI408378B (zh) 2013-09-11
US7102365B1 (en) 2006-09-05
JP2008534962A (ja) 2008-08-28
US7282929B2 (en) 2007-10-16
TW200643427A (en) 2006-12-16
US20060279293A1 (en) 2006-12-14
WO2006107572A2 (en) 2006-10-12
CN101142489A (zh) 2008-03-12
WO2006107572A3 (en) 2007-01-04
JP5030940B2 (ja) 2012-09-19

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SE01 Entry into force of request for substantive examination
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CP01 Change in the name or title of a patent holder

Address after: Texas in the United States

Patentee after: NXP USA, Inc.

Address before: Texas in the United States

Patentee before: FREESCALE SEMICONDUCTOR, Inc.

CP01 Change in the name or title of a patent holder
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20100113

CF01 Termination of patent right due to non-payment of annual fee