TWI403094B - 使用斜面傳輸閘極時脈的類比/數位轉換器 - Google Patents
使用斜面傳輸閘極時脈的類比/數位轉換器 Download PDFInfo
- Publication number
- TWI403094B TWI403094B TW096105396A TW96105396A TWI403094B TW I403094 B TWI403094 B TW I403094B TW 096105396 A TW096105396 A TW 096105396A TW 96105396 A TW96105396 A TW 96105396A TW I403094 B TWI403094 B TW I403094B
- Authority
- TW
- Taiwan
- Prior art keywords
- charge
- voltage
- photosensitive region
- comparator
- floating diffusion
- Prior art date
Links
- 230000005540 biological transmission Effects 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/50—Control of the SSIS exposure
- H04N25/57—Control of the dynamic range
- H04N25/571—Control of the dynamic range involving a non-linear response
- H04N25/575—Control of the dynamic range involving a non-linear response with a response composed of multiple slopes
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
- H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
- H04N25/772—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising A/D, V/T, V/F, I/T or I/F converters
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/78—Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Solid State Image Pick-Up Elements (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/354,444 US7652706B2 (en) | 2006-02-15 | 2006-02-15 | Pixel analog-to-digital converter using a ramped transfer gate clock |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200740127A TW200740127A (en) | 2007-10-16 |
| TWI403094B true TWI403094B (zh) | 2013-07-21 |
Family
ID=38158076
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW096105396A TWI403094B (zh) | 2006-02-15 | 2007-02-14 | 使用斜面傳輸閘極時脈的類比/數位轉換器 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US7652706B2 (enExample) |
| EP (1) | EP2005731B1 (enExample) |
| JP (1) | JP4916517B2 (enExample) |
| CN (1) | CN101385329B (enExample) |
| TW (1) | TWI403094B (enExample) |
| WO (1) | WO2007097918A1 (enExample) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8018514B1 (en) * | 2006-05-04 | 2011-09-13 | Thermo Fisher Scientific Inc | Charge injection device camera system for radiation-hardened applications |
| JP2009081705A (ja) * | 2007-09-26 | 2009-04-16 | Panasonic Corp | 固体撮像装置、受光強度測定装置、および受光強度測定方法 |
| JP2009124514A (ja) | 2007-11-15 | 2009-06-04 | Sony Corp | 固体撮像素子、およびカメラシステム |
| US20090206889A1 (en) * | 2008-02-15 | 2009-08-20 | Mathstar, Inc. | Method and Apparatus for Controlling Power Surge in an Integrated Circuit |
| JP2010258827A (ja) * | 2009-04-24 | 2010-11-11 | Sony Corp | 黒レベル補正回路および固体撮像装置 |
| JP5893550B2 (ja) * | 2012-04-12 | 2016-03-23 | キヤノン株式会社 | 撮像装置及び撮像システム |
| KR102127587B1 (ko) | 2016-01-15 | 2020-06-26 | 인비사지 테크놀로지스, 인크. | 글로벌 전자 셔터를 포함하는 전자 디바이스 |
| CN109155322B (zh) * | 2016-06-08 | 2023-02-21 | 因维萨热技术公司 | 具有电子快门的图像传感器 |
| KR101774779B1 (ko) * | 2016-09-05 | 2017-09-06 | 한국표준과학연구원 | 거리 측정 장치 및 거리 측정 장치의 동작 방법 |
| CN109067396A (zh) * | 2018-07-06 | 2018-12-21 | 北京空间机电研究所 | 一种红外焦平面像元级电压分段计数型模数转换器 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20050083421A1 (en) * | 2003-10-16 | 2005-04-21 | Vladimir Berezin | Dynamic range enlargement in CMOS image sensors |
| WO2005120046A2 (en) * | 2004-06-02 | 2005-12-15 | Council For The Central Laboratory Of The Research Councils | Imaging device |
| TW200605651A (en) * | 2004-04-30 | 2006-02-01 | Eastman Kodak Co | Low noise sample and hold circuit |
Family Cites Families (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2500436B2 (ja) * | 1993-05-10 | 1996-05-29 | 日本電気株式会社 | 信号処理装置 |
| GB9619088D0 (en) * | 1996-09-12 | 1996-10-23 | Vlsi Vision Ltd | Ofset cancellation in array image sensors |
| JP2879670B2 (ja) * | 1997-03-28 | 1999-04-05 | 広島大学長 | 2次元情報処理装置 |
| US6344877B1 (en) * | 1997-06-12 | 2002-02-05 | International Business Machines Corporation | Image sensor with dummy pixel or dummy pixel array |
| US6667768B1 (en) * | 1998-02-17 | 2003-12-23 | Micron Technology, Inc. | Photodiode-type pixel for global electronic shutter and reduced lag |
| US6697114B1 (en) * | 1999-08-13 | 2004-02-24 | Foveon, Inc. | Triple slope pixel sensor and arry |
| US6529240B2 (en) * | 1999-11-18 | 2003-03-04 | Agilent Technologies, Inc. | Random access memory integrated with CMOS sensors |
| DE19959539A1 (de) * | 1999-12-09 | 2001-06-13 | Thomson Brandt Gmbh | Bildaufnehmer |
| JP3710361B2 (ja) * | 2000-06-20 | 2005-10-26 | キヤノン株式会社 | 撮像装置 |
| KR100399954B1 (ko) * | 2000-12-14 | 2003-09-29 | 주식회사 하이닉스반도체 | 아날로그 상호 연관된 이중 샘플링 기능을 수행하는씨모스 이미지 센서용 비교 장치 |
| KR100381026B1 (ko) * | 2001-05-22 | 2003-04-23 | 주식회사 하이닉스반도체 | 펀치전압과 포토다이오드의 집전양을 증가시킬 수 있는씨모스 이미지 센서 및 그 제조 방법 |
| US6927796B2 (en) * | 2001-09-24 | 2005-08-09 | The Board Of Trustees Of The Leland Stanford Junior University | CMOS image sensor system with self-reset digital pixel architecture for improving SNR and dynamic range |
| US7095439B2 (en) | 2002-04-04 | 2006-08-22 | Motorola, Inc. | Image sensor circuit and method |
| US6821808B2 (en) * | 2002-08-23 | 2004-11-23 | Micron Technology, Inc. | CMOS APS with stacked avalanche multiplication layer which provides linear and logarithmic photo-conversion characteristics |
| FR2846147B1 (fr) * | 2002-10-16 | 2005-09-16 | St Microelectronics Sa | Commande d'une cellule photosensible |
| US7215369B2 (en) * | 2003-04-02 | 2007-05-08 | Micron Technology, Inc. | Compact pixel reset circuits using reversed current readout |
| JP4053007B2 (ja) * | 2004-01-09 | 2008-02-27 | シャープ株式会社 | 固体撮像素子およびその信号読み出し方法 |
| JP2005217302A (ja) * | 2004-01-30 | 2005-08-11 | Sony Corp | 固体撮像装置 |
| JP4347819B2 (ja) * | 2005-02-15 | 2009-10-21 | シャープ株式会社 | 固体撮像素子およびその駆動方法 |
| US7382008B2 (en) * | 2006-05-02 | 2008-06-03 | Eastman Kodak Company | Ultra-small CMOS image sensor pixel using a photodiode potential technique |
| JP2009081705A (ja) * | 2007-09-26 | 2009-04-16 | Panasonic Corp | 固体撮像装置、受光強度測定装置、および受光強度測定方法 |
-
2006
- 2006-02-15 US US11/354,444 patent/US7652706B2/en active Active
-
2007
- 2007-02-07 EP EP07717224.5A patent/EP2005731B1/en active Active
- 2007-02-07 CN CN200780005721XA patent/CN101385329B/zh active Active
- 2007-02-07 JP JP2008555278A patent/JP4916517B2/ja active Active
- 2007-02-07 WO PCT/US2007/003332 patent/WO2007097918A1/en not_active Ceased
- 2007-02-14 TW TW096105396A patent/TWI403094B/zh active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20050083421A1 (en) * | 2003-10-16 | 2005-04-21 | Vladimir Berezin | Dynamic range enlargement in CMOS image sensors |
| TW200605651A (en) * | 2004-04-30 | 2006-02-01 | Eastman Kodak Co | Low noise sample and hold circuit |
| WO2005120046A2 (en) * | 2004-06-02 | 2005-12-15 | Council For The Central Laboratory Of The Research Councils | Imaging device |
Non-Patent Citations (1)
| Title |
|---|
| Nitta, Y.; Muramatsu, Y.; Amano, K.; Toyama, T.; Yamamoto, J.; Mishina, K.; Suzuki, A.; Taura, T.; Kato, A.; Kikuchi, M.; Yasui, Y.; Nomura, H.; Fukushima, N.; , "High-Speed Digital Double Sampling with Analog CDS on Column Parallel ADC Architecture for Low-Noise Active Pixel Sensor," Solid-State Circuits Conference, 2006. ISSCC 2006. Digest of Technical Papers. IEEE International , vol., no., pp. * |
Also Published As
| Publication number | Publication date |
|---|---|
| EP2005731B1 (en) | 2014-04-09 |
| JP4916517B2 (ja) | 2012-04-11 |
| CN101385329A (zh) | 2009-03-11 |
| US7652706B2 (en) | 2010-01-26 |
| TW200740127A (en) | 2007-10-16 |
| WO2007097918A1 (en) | 2007-08-30 |
| JP2009527192A (ja) | 2009-07-23 |
| EP2005731A1 (en) | 2008-12-24 |
| CN101385329B (zh) | 2011-11-30 |
| US20070188640A1 (en) | 2007-08-16 |
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