TWI388863B - 測試裝置、傳送電路、測試裝置的控制方法以及傳送電路的控制方法 - Google Patents

測試裝置、傳送電路、測試裝置的控制方法以及傳送電路的控制方法 Download PDF

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Publication number
TWI388863B
TWI388863B TW98118033A TW98118033A TWI388863B TW I388863 B TWI388863 B TW I388863B TW 98118033 A TW98118033 A TW 98118033A TW 98118033 A TW98118033 A TW 98118033A TW I388863 B TWI388863 B TW I388863B
Authority
TW
Taiwan
Prior art keywords
data
timing
unit
test
reference clock
Prior art date
Application number
TW98118033A
Other languages
English (en)
Chinese (zh)
Other versions
TW201000928A (en
Inventor
Junichi Matsumoto
Yoshinori Kawaume
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW201000928A publication Critical patent/TW201000928A/zh
Application granted granted Critical
Publication of TWI388863B publication Critical patent/TWI388863B/zh

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
    • G01R31/31726—Synchronization, e.g. of test, clock or strobe signals; Signals in different clock domains; Generation of Vernier signals; Comparison and adjustment of the signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31703—Comparison aspects, e.g. signature analysis, comparators

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
TW98118033A 2008-06-02 2009-06-01 測試裝置、傳送電路、測試裝置的控制方法以及傳送電路的控制方法 TWI388863B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008144581 2008-06-02

Publications (2)

Publication Number Publication Date
TW201000928A TW201000928A (en) 2010-01-01
TWI388863B true TWI388863B (zh) 2013-03-11

Family

ID=41397883

Family Applications (1)

Application Number Title Priority Date Filing Date
TW98118033A TWI388863B (zh) 2008-06-02 2009-06-01 測試裝置、傳送電路、測試裝置的控制方法以及傳送電路的控制方法

Country Status (4)

Country Link
JP (1) JP5202628B2 (ja)
KR (1) KR101239121B1 (ja)
TW (1) TWI388863B (ja)
WO (1) WO2009147797A1 (ja)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014185853A (ja) 2013-03-21 2014-10-02 Advantest Corp 電流補償回路、半導体デバイス、タイミング発生器、試験装置
CN113466675B (zh) * 2021-05-26 2022-06-21 中国电子科技集团公司第五十四研究所 一种测试向量生成方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3773617B2 (ja) 1997-02-28 2006-05-10 沖電気工業株式会社 クロック信号供給装置
JP4293840B2 (ja) 2003-06-06 2009-07-08 株式会社アドバンテスト 試験装置
JP2005038187A (ja) 2003-07-15 2005-02-10 Matsushita Electric Ind Co Ltd 半導体装置
JP2006038831A (ja) * 2004-06-23 2006-02-09 Fujitsu Ltd スキャン試験回路を備えた半導体集積回路
JP4477450B2 (ja) 2004-08-12 2010-06-09 株式会社アドバンテスト タイミング発生器、試験装置、及びスキュー調整方法
JP2007183860A (ja) * 2006-01-10 2007-07-19 Nec Electronics Corp クロック制御回路

Also Published As

Publication number Publication date
JPWO2009147797A1 (ja) 2011-10-20
KR20110005264A (ko) 2011-01-17
WO2009147797A1 (ja) 2009-12-10
JP5202628B2 (ja) 2013-06-05
KR101239121B1 (ko) 2013-03-11
TW201000928A (en) 2010-01-01

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MM4A Annulment or lapse of patent due to non-payment of fees