TWI385255B - Method and apparatus for recovering indium from discarded liquid crystal displays - Google Patents
Method and apparatus for recovering indium from discarded liquid crystal displays Download PDFInfo
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- TWI385255B TWI385255B TW95128432A TW95128432A TWI385255B TW I385255 B TWI385255 B TW I385255B TW 95128432 A TW95128432 A TW 95128432A TW 95128432 A TW95128432 A TW 95128432A TW I385255 B TWI385255 B TW I385255B
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- indium
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- 229910052738 indium Inorganic materials 0.000 title claims description 166
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 title claims description 166
- 238000000034 method Methods 0.000 title claims description 73
- 239000004973 liquid crystal related substance Substances 0.000 title claims description 49
- 239000002923 metal particle Substances 0.000 claims description 117
- 229910052751 metal Inorganic materials 0.000 claims description 106
- 239000002184 metal Substances 0.000 claims description 106
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 claims description 103
- 239000002699 waste material Substances 0.000 claims description 101
- 239000012535 impurity Substances 0.000 claims description 79
- 150000002472 indium compounds Chemical class 0.000 claims description 61
- 239000002245 particle Substances 0.000 claims description 60
- 229910052742 iron Inorganic materials 0.000 claims description 50
- 238000011084 recovery Methods 0.000 claims description 47
- 238000001556 precipitation Methods 0.000 claims description 33
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims description 32
- 239000011701 zinc Substances 0.000 claims description 29
- 229910052725 zinc Inorganic materials 0.000 claims description 23
- 229910052782 aluminium Inorganic materials 0.000 claims description 22
- 238000004090 dissolution Methods 0.000 claims description 22
- 229910000846 In alloy Inorganic materials 0.000 claims description 21
- 239000007788 liquid Substances 0.000 claims description 21
- 238000006243 chemical reaction Methods 0.000 claims description 20
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 claims description 15
- XLYOFNOQVPJJNP-UHFFFAOYSA-M hydroxide Chemical compound [OH-] XLYOFNOQVPJJNP-UHFFFAOYSA-M 0.000 claims description 12
- 239000002253 acid Substances 0.000 claims description 10
- 238000010298 pulverizing process Methods 0.000 claims description 8
- 239000002244 precipitate Substances 0.000 claims description 7
- 238000004064 recycling Methods 0.000 claims description 7
- 239000007787 solid Substances 0.000 claims description 7
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 claims description 5
- 238000003756 stirring Methods 0.000 claims description 5
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 4
- 238000000926 separation method Methods 0.000 claims description 3
- 150000001875 compounds Chemical class 0.000 claims description 2
- 238000000151 deposition Methods 0.000 claims description 2
- 239000000243 solution Substances 0.000 description 65
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 44
- 238000011282 treatment Methods 0.000 description 31
- 239000000126 substance Substances 0.000 description 22
- IGUXCTSQIGAGSV-UHFFFAOYSA-K indium(iii) hydroxide Chemical compound [OH-].[OH-].[OH-].[In+3] IGUXCTSQIGAGSV-UHFFFAOYSA-K 0.000 description 15
- 238000006467 substitution reaction Methods 0.000 description 12
- 238000004140 cleaning Methods 0.000 description 10
- 238000010828 elution Methods 0.000 description 10
- 238000001035 drying Methods 0.000 description 9
- 238000006386 neutralization reaction Methods 0.000 description 9
- 238000006073 displacement reaction Methods 0.000 description 8
- 230000000694 effects Effects 0.000 description 8
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 6
- 239000011347 resin Substances 0.000 description 6
- 229920005989 resin Polymers 0.000 description 6
- 230000003247 decreasing effect Effects 0.000 description 5
- 235000014413 iron hydroxide Nutrition 0.000 description 5
- NCNCGGDMXMBVIA-UHFFFAOYSA-L iron(ii) hydroxide Chemical compound [OH-].[OH-].[Fe+2] NCNCGGDMXMBVIA-UHFFFAOYSA-L 0.000 description 5
- 229910021645 metal ion Inorganic materials 0.000 description 4
- 239000003513 alkali Substances 0.000 description 3
- 239000012670 alkaline solution Substances 0.000 description 3
- 239000002585 base Substances 0.000 description 3
- 238000007599 discharging Methods 0.000 description 3
- 238000000605 extraction Methods 0.000 description 3
- -1 iron are eluted Chemical class 0.000 description 3
- 238000006722 reduction reaction Methods 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 2
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 description 2
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 2
- 229910045601 alloy Inorganic materials 0.000 description 2
- 239000000956 alloy Substances 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 239000004744 fabric Substances 0.000 description 2
- 239000012530 fluid Substances 0.000 description 2
- 230000003472 neutralizing effect Effects 0.000 description 2
- 229910017604 nitric acid Inorganic materials 0.000 description 2
- 229920000742 Cotton Polymers 0.000 description 1
- 229910001111 Fine metal Inorganic materials 0.000 description 1
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 description 1
- 238000007605 air drying Methods 0.000 description 1
- 229910021529 ammonia Inorganic materials 0.000 description 1
- 230000033228 biological regulation Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000011449 brick Substances 0.000 description 1
- 239000003054 catalyst Substances 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 238000009459 flexible packaging Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000000227 grinding Methods 0.000 description 1
- RHZWSUVWRRXEJF-UHFFFAOYSA-N indium tin Chemical compound [In].[Sn] RHZWSUVWRRXEJF-UHFFFAOYSA-N 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 238000004900 laundering Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 239000000178 monomer Substances 0.000 description 1
- 239000011236 particulate material Substances 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 230000001376 precipitating effect Effects 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
- 239000000047 product Substances 0.000 description 1
- 238000007670 refining Methods 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 229910052707 ruthenium Inorganic materials 0.000 description 1
- 238000004062 sedimentation Methods 0.000 description 1
- 238000007873 sieving Methods 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
Classifications
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- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22B—PRODUCTION AND REFINING OF METALS; PRETREATMENT OF RAW MATERIALS
- C22B7/00—Working up raw materials other than ores, e.g. scrap, to produce non-ferrous metals and compounds thereof; Methods of a general interest or applied to the winning of more than two metals
- C22B7/006—Wet processes
- C22B7/007—Wet processes by acid leaching
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B09—DISPOSAL OF SOLID WASTE; RECLAMATION OF CONTAMINATED SOIL
- B09B—DISPOSAL OF SOLID WASTE NOT OTHERWISE PROVIDED FOR
- B09B3/00—Destroying solid waste or transforming solid waste into something useful or harmless
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22B—PRODUCTION AND REFINING OF METALS; PRETREATMENT OF RAW MATERIALS
- C22B25/00—Obtaining tin
- C22B25/06—Obtaining tin from scrap, especially tin scrap
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22B—PRODUCTION AND REFINING OF METALS; PRETREATMENT OF RAW MATERIALS
- C22B3/00—Extraction of metal compounds from ores or concentrates by wet processes
- C22B3/04—Extraction of metal compounds from ores or concentrates by wet processes by leaching
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22B—PRODUCTION AND REFINING OF METALS; PRETREATMENT OF RAW MATERIALS
- C22B3/00—Extraction of metal compounds from ores or concentrates by wet processes
- C22B3/20—Treatment or purification of solutions, e.g. obtained by leaching
- C22B3/44—Treatment or purification of solutions, e.g. obtained by leaching by chemical processes
- C22B3/46—Treatment or purification of solutions, e.g. obtained by leaching by chemical processes by substitution, e.g. by cementation
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22B—PRODUCTION AND REFINING OF METALS; PRETREATMENT OF RAW MATERIALS
- C22B58/00—Obtaining gallium or indium
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22B—PRODUCTION AND REFINING OF METALS; PRETREATMENT OF RAW MATERIALS
- C22B7/00—Working up raw materials other than ores, e.g. scrap, to produce non-ferrous metals and compounds thereof; Methods of a general interest or applied to the winning of more than two metals
- C22B7/005—Separation by a physical processing technique only, e.g. by mechanical breaking
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P10/00—Technologies related to metal processing
- Y02P10/20—Recycling
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Organic Chemistry (AREA)
- Metallurgy (AREA)
- Mechanical Engineering (AREA)
- Materials Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Environmental & Geological Engineering (AREA)
- Geology (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Life Sciences & Earth Sciences (AREA)
- Geochemistry & Mineralogy (AREA)
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Optics & Photonics (AREA)
- General Physics & Mathematics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Manufacture And Refinement Of Metals (AREA)
- Processing Of Solid Wastes (AREA)
- Removal Of Specific Substances (AREA)
Description
本發明係關於一種由廢棄液晶顯示器中回收銦之方法及其裝置,更詳細地,係關於一種由廢棄之液晶電視、行動電話、便攜式遊戲機等中,或者自生產過程中作為不良品排出之液晶顯示器(以下亦稱廢LCD)中回收有價物之銦(In)作為合金或金屬單體之方法及其裝置。The present invention relates to a method and apparatus for recovering indium from a waste liquid crystal display, and more particularly to a liquid crystal television, a mobile phone, a portable game machine, etc., which are discarded, or which are discharged as defective products in a production process. A method and apparatus for recovering valuable indium (In) as an alloy or a metal monomer in a liquid crystal display (hereinafter also referred to as a waste LCD).
於液晶顯示器(以下亦稱LCD)中使用氧化銦錫(ITO)膜作為透明電極。ITO膜主要係藉由濺鍍法而形成膜,但在其目標區域中使用銦。銦係於鋅精製過程中所獲得之稀有金屬,近年來人們擔憂其之枯竭。於廢LCD中含有300 mg/L左右之銦,因而伴隨銦之枯竭,業者期望在回收過程中將銦加以回收。An indium tin oxide (ITO) film is used as a transparent electrode in a liquid crystal display (hereinafter also referred to as LCD). The ITO film is mainly formed by sputtering, but indium is used in the target region. Indium is a rare metal obtained in the zinc refining process, and in recent years there has been concern about its depletion. In the waste LCD, which contains about 300 mg/L of indium, the indium is depleted, and the indium is recovered in the recycling process.
為適應如此要求,業者已嘗試回收廢LCD中之銦,如此技術,例如有於下述非專利文獻1中記載之發明。該發明係關於流動床LCD處理系統,其流動床LCD處理系統係由流動層處理部、旋風器、冷卻器、高溫袋過濾器、觸媒流動層、以及水清洗塔所構成,使於流動層處理部中藉由流動媒體之矽沙而進行機械性剝離之銦蓄積於流動媒體中。但,於使用該處理系統之方法中,廢LCD中之約60%蓄積於流動媒體中,其餘被收集於袋過濾器中,因而銦回收率約為全體之60%,其回收率為60%左右,係較低者。In order to meet such a demand, the inventors have attempted to recover the indium in the waste LCD. Such a technique is, for example, the invention described in Non-Patent Document 1 below. The invention relates to a fluidized bed LCD processing system, wherein the fluidized bed LCD processing system is composed of a fluidized bed processing unit, a cyclone, a cooler, a high temperature bag filter, a catalyst flow layer, and a water cleaning tower to make the fluid layer Indium in the processing unit that is mechanically peeled off by the laundering of the flowing medium is accumulated in the flow medium. However, in the method using the processing system, about 60% of the waste LCD is accumulated in the flowing medium, and the rest is collected in the bag filter, so the indium recovery rate is about 60% of the total, and the recovery rate is 60%. Left and right, the lower one.
非專利文獻1:顯示器月刊2002年4月號第36~46頁Non-Patent Document 1: Display Monthly, April 2002, pp. 36-46
為提高如上述之乾式處理之低回收率,業者目前亦正在開發濕式處理之方法。例如下述專利文獻1中揭示有以下方法:將ITO溶解於硝酸或鹽酸等酸中,再將錫等雜質沈澱除去,之後添加氨進行中和,作為氫氧化銦而加以回收。In order to improve the low recovery rate of the dry treatment as described above, the industry is currently developing a wet treatment method. For example, Patent Document 1 discloses a method in which ITO is dissolved in an acid such as nitric acid or hydrochloric acid, and impurities such as tin are precipitated and removed, and then ammonia is added for neutralization, and is recovered as indium hydroxide.
專利文獻1:日本專利特開2000-128531號公報Patent Document 1: Japanese Patent Laid-Open Publication No. 2000-128531
但,若使用如上述之濕式處理方法,則存在以下問題:經處理獲得之氫氧化銦之過濾性較差因而在操作中需用較長時間,又,經中和等獲得之氫氧化銦之性質產生變化。However, if the wet processing method as described above is used, there is a problem in that the indium hydroxide obtained by the treatment is inferior in filterability, so that it takes a long time in the operation, and the indium hydroxide obtained by neutralization or the like is used. The nature changes.
本發明係為解決如此問題而成者,因而其課題係提供如下之銦回收方法及裝置:無須如先前之以氫氧化銦之狀態進行回收,即可回收銦作為有價金屬,因而在回收時亦無如氫氧化銦情形時之操作缺陷,可用過濾器等容易地加以回收,而且銦之回收率明顯變佳。The present invention has been made to solve such problems, and the object of the present invention is to provide an indium recovery method and apparatus which can recover indium as a valuable metal without being recovered as in the prior state of indium hydroxide. The operation defects in the case of no indium hydroxide can be easily recovered by a filter or the like, and the recovery rate of indium is remarkably improved.
本發明係為解決如此問題而成者,與自廢LCD中回收銦的方法有關之請求項1之發明,其特徵在於:將含有氧化銦錫之廢棄液晶顯示器粉碎,使用酸自粉碎之廢棄液晶顯示器中溶解出氧化銦錫而獲得含有銦化合物之溶液,將其流入回收用反應器內,且於該回收用反應器內添加包含離子化傾向大於銦之金屬之金屬粒子,且使該金屬粒子流動,使上述含有銦化合物之溶液中所含有之銦或者銦合金於上述金屬粒子表面析出,其後藉由剝離方法將上述析出之銦或銦合金自上述金屬粒子上剝離,將已剝離之固體狀銦或 銦合金自液體成分中分離且加以回收。The present invention is directed to the invention of claim 1 relating to a method for recovering indium from a waste LCD, characterized in that a waste liquid crystal display containing indium tin oxide is pulverized, and waste liquid crystal which is self-pulverized using acid is used. A solution containing an indium compound is dissolved in the display to obtain a solution containing an indium compound, and is introduced into the recovery reactor, and metal particles containing a metal having a higher ionization tendency than indium are added to the recovery reactor, and the metal particles are added. Flowing, the indium or indium alloy contained in the solution containing the indium compound is deposited on the surface of the metal particles, and then the precipitated indium or indium alloy is peeled off from the metal particles by a lift-off method to remove the solid. Indium or The indium alloy is separated from the liquid component and recovered.
又,請求項2之發明,其特徵在於:於請求項1之自廢棄液晶顯示器中回收銦之方法中,包含離子化傾向大於銦之金屬之金屬粒子係鋅粒子或鋁粒子。進而,請求項3之發明,其特徵在於:於請求項1或2之由廢棄液晶顯示器中回收銦之方法中,將析出於金屬粒子上之銦或銦合金自上述金屬粒子上剝離之方法,係藉由超音波使金屬粒子振動之方法,或者藉由電磁石攪拌金屬粒子使其相互碰撞之方法。Further, the invention of claim 2 is characterized in that, in the method for recovering indium from the waste liquid crystal display of claim 1, the metal particles are zinc particles or aluminum particles having a higher ionization tendency than the metal of indium. Further, the invention of claim 3 is characterized in that, in the method of recovering indium from a waste liquid crystal display of claim 1 or 2, a method of separating indium or an indium alloy deposited on the metal particles from the metal particles is performed, A method of vibrating metal particles by ultrasonic waves or a method of agitating metal particles by electromagnetic waves to collide with each other.
進而,請求項4之發明,其特徵在於:於請求項1至3中任一項之由廢棄液晶顯示器中回收銦之方法中,在將自廢棄液晶顯示器中溶解出氧化銦錫的含有銦化合物之溶液流入回收用反應器之前,將該含有銦化合物之溶液流入除去雜質用反應器內,再於上述除雜質用反應器內添加包含離子化傾向大於該含有銦化合物之溶液中除銦以外的雜質金屬之金屬之金屬粒子,之後使該金屬粒子流動,使上述雜質金屬於上述金屬粒子表面析出,其後藉由剝離方法將上述析出之雜質金屬自上述金屬粒子中剝離後除去。Further, the invention of claim 4 is characterized in that in the method for recovering indium from a waste liquid crystal display according to any one of claims 1 to 3, the indium compound containing indium tin oxide is dissolved in the self-depleting liquid crystal display. Before flowing the solution into the recovery reactor, the solution containing the indium compound is flowed into the reactor for removing impurities, and the solution for removing impurities is added to the solution containing the indium compound in addition to indium other than the indium compound. The metal particles of the metal of the impurity metal are then caused to flow, and the impurity metal is deposited on the surface of the metal particle, and then the precipitated impurity metal is removed from the metal particle by a lift-off method and then removed.
進而,請求項5之發明,其特徵在於:係於請求項4之由廢棄液晶顯示器中回收銦之方法中,自上述金屬粒子中將析出於金屬粒子上之雜質金屬剝離之方法,係藉由超音波使金屬粒子振動之方法,或者藉由電磁石攪拌金屬粒子使其相互碰撞之方法。進而,請求項6之發明,其特徵在於:於請求項4或5之由廢棄液晶顯示器中回收銦之方法中,雜質金屬為錫。進而,請求項7之發明,其特徵在於:於請求 項4至6之由廢棄液晶顯示器中回收銦之方法中,包含離子化傾向亦大於雜質金屬之金屬之金屬粒子為鐵粒子。進而,請求項8之發明,其特徵在於:於請求項7之由廢棄液晶顯示器中回收銦之方法中,於除去雜質金屬後的含有銦化合物之溶液中添加鹼,將鐵以其氫氧化物而沈澱除去。Further, the invention of claim 5 is characterized in that, in the method of recovering indium from the waste liquid crystal display of claim 4, the method of separating the impurity metal deposited on the metal particles from the metal particles is performed by A method in which ultrasonic waves vibrate metal particles, or a method in which metal particles are stirred by electromagnetic waves to collide with each other. Further, the invention of claim 6 is characterized in that in the method of claim 4 or 5, in which the indium is recovered from the waste liquid crystal display, the impurity metal is tin. Further, the invention of claim 7 is characterized in that: In the method of recovering indium from the waste liquid crystal display of Items 4 to 6, the metal particles containing a metal having a higher ionization tendency than the impurity metal are iron particles. Further, the invention of claim 8 is characterized in that in the method of recovering indium from the waste liquid crystal display of claim 7, the alkali is added to the solution containing the indium compound after removing the impurity metal, and the iron is used as the hydroxide thereof. The precipitate was removed.
進而,請求項9之發明,其特徵在於:於將廢棄液晶顯示器容置於袋中之狀態下,使用酸自該廢棄液晶顯示器中溶解出氧化銦錫,獲得含有銦化合物之溶液,另一方面,將上述容置於袋中之廢棄液晶顯示器進行清洗中和處理,其後進行乾燥處理。Further, the invention of claim 9 is characterized in that, in a state in which the discarded liquid crystal display is housed in a bag, indium tin oxide is dissolved from the discarded liquid crystal display to obtain a solution containing an indium compound, and The waste liquid crystal display placed in the bag is subjected to washing neutralization treatment, and then dried.
進而,與由廢棄液晶顯示器中回收銦之裝置有關的請求項10之發明,其特徵在於具備:粉碎含有氧化銦錫之廢棄液晶顯示器之粉碎機;及使用酸在自粉碎之廢棄液晶顯示器中溶解出氧化銦錫而獲得含有銦化合物之溶液之銦溶解裝置;用以流入於該銦溶解裝置中獲得之含有銦化合物之溶液同時添加包含上述含有離子化傾向大於銦之金屬之金屬粒子,進行使銦或銦合金於上述金屬粒子表面析出的金屬析出反應之回收用反應器;及用以可回收上述析出之銦或銦合金,而將其自上述金屬粒子剝離之剝離機構;及將剝離之固體狀銦或銦合金自液體成分中分離之分離機構。Further, the invention of claim 10 relating to the apparatus for recovering indium from a waste liquid crystal display is characterized by comprising: a pulverizer for pulverizing a waste liquid crystal display containing indium tin oxide; and dissolving in a self-grinding waste liquid crystal display using an acid An indium dissolution device that obtains a solution containing an indium compound, and a solution containing an indium compound obtained by flowing into the indium dissolution device, and simultaneously adding a metal particle containing the metal having a higher ionization tendency than indium a reactor for recovering a metal precipitation reaction in which an indium or an indium alloy is deposited on the surface of the metal particles; and a peeling mechanism for recovering the precipitated indium or indium alloy from the metal particles; and a solid to be peeled off A separation mechanism in which indium or indium alloys are separated from liquid components.
進而,請求項11之發明,其特徵在於:於如請求項10之由廢棄液晶顯示器回收銦之回收裝置中,包含離子化傾向大於銦之金屬之金屬粒子為鋅粒子或鋁粒子。進而如請求項12之發明,其特徵在於:於如請求項10或11之由廢棄液 晶顯示器回收銦之裝置中,將析出於金屬粒子上之銦或銦合金自上述金屬粒子剝離之裝置,為使用超音波使金屬粒子振動之裝置,或者使用電磁石攪拌金屬粒子並使其相互碰撞之裝置。Further, the invention of claim 11 is characterized in that, in the apparatus for recovering indium recovered from a waste liquid crystal display according to claim 10, the metal particles containing a metal having a higher ionization tendency than indium are zinc particles or aluminum particles. Further, the invention of claim 12 is characterized in that the waste liquid is as claimed in claim 10 or In a device for recovering indium from a crystal display, a device for separating indium or an indium alloy deposited on a metal particle from the metal particle is a device for vibrating metal particles using ultrasonic waves, or a metal particle is stirred and collided with each other using an electromagnet. Device.
進而,請求項13之發明,其特徵在於:於回收用反應器之前段側設置有雜質除去用反應器,該反應器具備以下方法:於如請求項10至12中之任一項之自廢棄液晶顯示器中回收銦之裝置中,將於銦溶解裝置中獲得之含有銦化合物之溶液流入後,添加包含離子化傾向亦大於該含有銦化合物之溶液中除銦以外的雜質金屬之金屬之金屬粒子,使該金屬粒子流動,使上述雜質金屬於上述金屬粒子表面析出,將上述析出之雜質金屬自上述金屬粒子上剝離且除去。Further, the invention of claim 13 is characterized in that the reactor for removing impurities is provided on the side of the reactor for recovery, and the reactor has the following method: self-depletion according to any one of claims 10 to 12. In the apparatus for recovering indium in a liquid crystal display, after the solution containing the indium compound obtained in the indium dissolving device flows in, a metal particle containing a metal having an ionization tendency larger than that of the impurity metal other than indium in the solution containing the indium compound is added. The metal particles are caused to flow, and the impurity metal is deposited on the surface of the metal particles, and the precipitated impurity metal is peeled off from the metal particles and removed.
進而,請求項14之發明,其特徵在於:於如請求項13之由廢棄液晶顯示器中回收銦之裝置中,將於金屬粒子上析出之雜質金屬自上述金屬粒子上剝離之方法,係藉由超音波使金屬粒子振動之方法,或者藉由電磁石攪拌金屬粒子使其相互碰撞之方法。進而,請求項15之發明,其特徵在於:於如請求項13或14之由廢棄液晶顯示器中回收銦之裝置中,雜質金屬為錫。Further, the invention of claim 14 is characterized in that, in the apparatus for recovering indium from a waste liquid crystal display according to claim 13, the method of separating the impurity metal deposited on the metal particles from the metal particles is performed by A method in which ultrasonic waves vibrate metal particles, or a method in which metal particles are stirred by electromagnetic waves to collide with each other. Further, the invention of claim 15 is characterized in that, in the apparatus for recovering indium from the waste liquid crystal display of claim 13 or 14, the impurity metal is tin.
進而,請求項16之發明,其特徵在於:於如請求項13至15之自廢棄液晶顯示器中回收銦之裝置中,包含離子化傾向大於雜質金屬之金屬之金屬粒子為鐵粒子。進而,請求項17之發明,其特徵在於:於如請求項16之由廢棄液晶顯示器中回收銦之裝置中,具備於除去雜質金屬後之含銦溶 液中添加鹼,使鐵成為氫氧化物而沈澱除去之沈澱除去裝置。Further, the invention of claim 16 is characterized in that, in the apparatus for recovering indium from the waste liquid crystal display according to claims 13 to 15, the metal particles containing the metal having a higher ionization tendency than the impurity metal are iron particles. Further, the invention of claim 17 is characterized in that, in the apparatus for recovering indium from a waste liquid crystal display according to claim 16, the indium-containing solution after removing the impurity metal A precipitation removing device is prepared by adding a base to the liquid to cause the iron to become a hydroxide and to precipitate and remove it.
本發明,如上所述,係將含有氧化銦錫之廢棄液晶顯示器(廢LCD)粉碎,使用酸自粉碎之廢LCD中溶解出氧化銦錫,獲得含有銦化合物之溶液,再流入回收用反應器內,同時於該回收用反應器內添加由離子化傾向大於銦(In)之金屬所構成之金屬粒子,且使該金屬粒子流動,使上述含有銦化合物溶液中所含有之銦或銦合金於上述金屬粒子表面析出,其後藉由剝離機構將上述析出之銦或銦合金自上述金屬粒子上剝離,將剝離之固體狀銦或銦合金自液體成分中分離後加以回收之方法;因而可容易且高效地將ITO自廢LCD中溶解出,於由溶解有銦之溶液中回收銦之方法中,將利用離子化傾向之化學置換反應與剝離技術組合,即,藉由使用金屬粒子而增加用於金屬析出反應之金屬的總表面積,且提高析出反應速度,而且以剝離機構將一定程度生長之析出金屬剝離,藉此可經常使新的金屬表面露出而維持反應速度,因而即使與先前乾式及濕式方法中之任一方法相比,具有可顯著提昇自廢LCD中回收銦的回收率之效果。順便提及,本發明中,關於自廢液中回收銦之回收率,可獲得80%以上之高回收率。According to the present invention, as described above, a waste liquid crystal display (waste LCD) containing indium tin oxide is pulverized, and indium tin oxide is dissolved in a waste LCD which is acid-pulverized to obtain a solution containing an indium compound, and then flows into a recovery reactor. Further, metal particles composed of a metal having a higher ionization tendency than indium (In) are added to the recovery reactor, and the metal particles are caused to flow, so that the indium or indium alloy contained in the indium compound-containing solution is contained. The surface of the metal particles is deposited, and then the precipitated indium or indium alloy is peeled off from the metal particles by a peeling mechanism, and the peeled solid indium or indium alloy is separated from the liquid component and recovered; And efficiently dissolving ITO from the waste LCD, and in the method of recovering indium from the solution in which indium is dissolved, the chemical displacement reaction using the ionization tendency is combined with the lift-off technique, that is, by using metal particles. In the metal precipitation reaction, the total surface area of the metal is increased, and the precipitation reaction rate is increased, and the precipitation metal which is grown to a certain extent by the peeling mechanism is peeled off. Often make the new metal surface is exposed to maintain the reaction rate, even when compared with a method according to any preceding dry and wet method, the lift having a significant recovery from waste recovered indium LCD of effect. Incidentally, in the present invention, with respect to the recovery rate of indium recovered from the waste liquid, a high recovery rate of 80% or more can be obtained.
又,無須以先前濕式法之方式以氫氧化銦狀態進行回收,即可回收銦作為有價金屬,因而具有以下效果:在回收時亦無如氫氧化銦情形時之操作缺陷,可以過濾器等容 易地進行回收。Further, it is possible to recover indium as a valuable metal without recovering it in the state of indium hydroxide by the previous wet method, and thus has the following effects: in the case of recovery, there is no operational defect in the case of indium hydroxide, and a filter or the like can be used. Capacity Easily recycle.
進而,於在回收用反應器之前段側設置有產生與該回收用反應器相同的金屬析出反應之除雜質用反應器之情形時,添加以下金屬:其離子化傾向亦大於自廢LCD中溶解出氧化銦錫之含有銦化合物之溶液中所含有的除銦以外之金屬,例如如錫(Sn)之雜質金屬,例如鐵(Fe)等金屬粒子,使其流動,使上述廢液中所含有之錫等雜質金屬於上述鐵等金屬粒子表面析出,其後藉由剝離機構將上述析出之雜質金屬自上述金屬粒子上剝離,藉此可適當地除去作為雜質金屬之錫等。Further, when a reactor for removing impurities which generates the same metal precipitation reaction as the recovery reactor is provided on the side of the reactor for recovery, the following metal is added: the ionization tendency is also larger than that in the waste LCD. A metal other than indium contained in a solution containing indium tin oxide containing indium tin, for example, an impurity metal such as tin (Sn), such as metal particles such as iron (Fe), flows to cause the waste liquid to be contained therein An impurity metal such as tin is deposited on the surface of the metal particles such as iron, and then the precipitated impurity metal is peeled off from the metal particles by a peeling mechanism, whereby tin or the like as an impurity metal can be appropriately removed.
因此,可於預先自廢液中除去錫等除銦以外的雜質金屬之狀態下,將其廢液供給於回收用反應器,因而具有以回收用反應器所回收的銦之純度進一步提高之效果。順便提及,可藉由於回收用反應器之前段側設置如此雜質除去用反應器,而回收95%以上之高純度銦。Therefore, in the state in which the impurity metal other than indium is removed from the waste liquid in advance, the waste liquid is supplied to the recovery reactor, and the purity of the indium recovered by the recovery reactor is further improved. . Incidentally, 95% or more of high-purity indium can be recovered by providing such an impurity-removing reactor on the front side of the reactor for recovery.
又,於使用如此雜質除去用反應器除去雜質金屬之情形時,上述鐵等添加金屬的離子溶出,但可藉由於其後段之沈澱除去裝置中添加鹼以使鐵等金屬成為氫氧化物沈澱,而在將廢液供給於回收用反應器之前,預先除去鐵等之氫氧化物。於此情形時,若pH值升高則有生成氫氧化銦沈澱之虞,但因沈澱物生成速度於氫氧化鐵一方係絕對地快,故可藉由沈澱除去裝置中之滯留時間控制,而不生成氫氧化銦,從而幾乎無損失地將銦供給於下一回收用反應器。又,即使銦之一部分作為氫氧化銦存在於溶液中,則藉由在下一回收用反應器中調整pH值,而使氫氧化銦再度溶解,因而並不降低銦之回收率。In the case where the impurity metal is removed by the reactor for removing impurities, the metal-added ions such as iron are eluted, but a metal such as iron may be precipitated as a hydroxide by adding a base to the precipitation removing device in the subsequent stage. On the other hand, before the waste liquid is supplied to the recovery reactor, the hydroxide such as iron is removed in advance. In this case, if the pH is increased, there is a ruthenium which forms an indium hydroxide precipitate, but since the rate of formation of the precipitate is absolutely fast on the iron hydroxide side, it can be controlled by the residence time in the precipitation removal device. Indium hydroxide is not formed, so that indium is supplied to the next recovery reactor with almost no loss. Further, even if a part of indium is present in the solution as indium hydroxide, the indium hydroxide is again dissolved by adjusting the pH value in the next recovery reactor, so that the recovery rate of indium is not lowered.
進而,於將廢LCD容置於袋中之狀態下進行使用酸之銦溶出處理、清洗中和處理、乾燥處理之情形時,具有可將於廢LCD粉碎步驟中被粉碎之微細廢LCD容置於袋內而直接進行連續處理,且可簡化全體處理之效果。又,無須將自廢LCD粉碎步驟中所接收之微細廢LCD片製成粉末進行操作,因而具有亦易於操作之效果。Further, when the waste LCD is placed in a bag and the indium acid elution treatment, the cleaning neutralization treatment, and the drying treatment are performed, the fine waste LCD which can be pulverized in the waste LCD pulverization step is accommodated. The continuous treatment is carried out directly in the bag, and the effect of the entire treatment can be simplified. Further, it is not necessary to process the fine waste LCD sheet received from the waste LCD pulverization step, and thus it is easy to handle.
如上所述,根據本發明,可提供回收率高之銦回收方法,因而將來於依家電循環法之規定必須回收循環使用LCD之情形時,作為在液晶電視的循環工廠中的循環過程中之銦回收方法,具有可應用本發明之實際利益。As described above, according to the present invention, it is possible to provide a method for recovering indium having a high recovery rate, and therefore, in the future, in the case of recycling the LCD in accordance with the regulations of the home appliance circulation method, indium in the circulation process in the recycling plant of the liquid crystal television. The recycling method has the practical benefit of applying the invention.
以下,根據圖式就本發明之實施形態加以說明。Hereinafter, embodiments of the present invention will be described with reference to the drawings.
本實施形態之由廢LCD中回收銦之裝置,如圖1所示具備:使用鹽酸由廢LCD中溶解ITO之銦溶解裝置(以下亦稱為In溶解裝置)1;用以於含有於該銦溶解裝置1中被溶解的銦之含有銦化合物之溶液中添加鐵粒子(Fe粒子),而除去除銦以外的雜質金屬之雜質除去用反應器2;將於該除雜質用反應器2中除去雜質金屬的廢液中之上述鐵粒子作為鐵(Fe)之氫氧化物而沈澱除去之沈澱除去裝置3;用以自於該沈澱除去裝置3中沈澱除去鐵的氫氧化物之自廢液中回收銦之回收用反應器4。再者,未圖示,但於銦溶解裝置1之前段設置有粉碎廢LCD之粉碎機。再者,本發明中,所謂粉碎意指將廢LCD粉碎,且其被粉碎之碎片之尺寸並非問題,例如若指通常細細碾碎成粉塵狀,則亦包含如被認為是粉碎之狀態。In the apparatus for recovering indium from a waste LCD according to the present embodiment, as shown in FIG. 1, an indium dissolution device (hereinafter also referred to as In dissolution device) 1 for dissolving ITO from a waste LCD using hydrochloric acid is provided for use in the indium. In the solution of the indium compound containing indium dissolved in the dissolution apparatus 1, iron particles (Fe particles) are added, and the reactor 2 for impurity removal of the impurity metal other than indium is removed; the reactor 2 for impurity removal is removed. a precipitation removing device 3 for precipitating and removing the iron particles in the waste liquid of the impurity metal as a hydroxide of iron (Fe); and a waste liquid for removing hydroxide from the precipitate in the precipitation removing device 3 The reactor 4 for recovery of indium is recovered. Further, although not shown, a pulverizer for pulverizing the waste LCD is provided in the front stage of the indium dissolution apparatus 1. Further, in the present invention, the pulverization means that the waste LCD is pulverized, and the size of the pulverized shards is not a problem. For example, if it is usually finely pulverized into a dusty state, it is also included in a state of being pulverized.
銦溶解裝置1,係用以藉由鹽酸(鹽酸水溶液)自被粉碎之廢LCD中溶解出銦,而獲得含有銦化合物之溶液者。以銦含量成為100~300 mg/L之方式,製備含有銦化合物之溶液。又,以鹽酸濃度成為20%、鹽酸pH值成為1.5之方式,製備該含有銦化合物之溶液。The indium dissolving device 1 is for obtaining a solution containing an indium compound by dissolving indium from a pulverized waste LCD by hydrochloric acid (aqueous hydrochloric acid). A solution containing an indium compound is prepared in such a manner that the indium content is 100 to 300 mg/L. Further, the solution containing the indium compound was prepared so that the hydrochloric acid concentration was 20% and the hydrochloric acid pH was 1.5.
雜質除去用反應器2,係用以由上述含有銦化合物之溶液中除去作為雜質之錫者,且如圖2所示具備縱長之反應器本體5而構成。該反應器本體5,如同一圖所示,由反應器上部6、反應器中部7、及反應器下部8所構成,分別經由連接部9、10連接。反應器上部6、反應器中部7、及反應器下部8分別形成為相同寬度,但反應器上部6之截面積形成為大於反應器中部7之截面積,反應器中部7之截面積形成為大於反應器下部8之截面積。其結果為,全體反應器本體5之截面積,係以向上不連續性增加之方式而構成。再者,連接部9、10向上形成寬廣之錐狀。The reactor 2 for removing impurities is configured to remove tin as an impurity from the solution containing the indium compound, and to have a reactor body 5 of a length as shown in FIG. 2 . As shown in the same figure, the reactor body 5 is composed of a reactor upper portion 6, a reactor middle portion 7, and a reactor lower portion 8, and is connected via connection portions 9, 10, respectively. The reactor upper portion 6, the reactor middle portion 7, and the reactor lower portion 8 are respectively formed to have the same width, but the cross-sectional area of the upper portion 6 of the reactor is formed to be larger than the cross-sectional area of the central portion 7 of the reactor, and the cross-sectional area of the central portion 7 of the reactor is formed to be larger than The cross-sectional area of the lower portion 8 of the reactor. As a result, the cross-sectional area of the entire reactor main body 5 is configured to increase the upward discontinuity. Further, the connecting portions 9, 10 are formed in a wide tapered shape upward.
於反應器下部8之下側,設置有用以流入作為處理對象之含有銦化合物之溶液之略圓錐形的流入用腔室11,進而於其下部設置有流入管12。於流入管12中設置有止回閥,但未圖示。又,於反應器上部6之上側,設置有上部腔室13,於其側部,設置有用以使作為雜質金屬之錫於金屬粒子(鐵粒子)表面上析出再將其排出之排出管14。上部腔室13,不僅係用以藉由如此排出管14而將錫與鐵粒子同時排出之部分,並且亦係投入鐵粒子之部分,該鐵粒子係基於與作為雜質而除去的錫之離子化傾向不同而用以產生所謂化學置換反應(金屬析出反應)者。實際上,鐵與錫之化學置換反應係於上述反應器本體1之全體中產生。On the lower side of the reactor lower portion 8, a slightly conical inflow chamber 11 for inflowing a solution containing an indium compound as a processing target is provided, and an inflow pipe 12 is further provided at a lower portion thereof. A check valve is provided in the inflow pipe 12, but is not shown. Further, an upper chamber 13 is provided on the upper side of the reactor upper portion 6, and a discharge pipe 14 for depositing tin as an impurity metal on the surface of the metal particles (iron particles) and discharging it is provided on the side portion. The upper chamber 13 is not only used for discharging the tin and the iron particles at the same time by discharging the tube 14, but also is applied to a portion of the iron particles based on ionization of tin removed as an impurity. The tendency is to produce a so-called chemical displacement reaction (metal precipitation reaction). In fact, the chemical displacement reaction of iron and tin is produced in the entirety of the reactor body 1 described above.
繼而,自流入管12流入之含有銦化合物之溶液直至到達排出管14之間,其廢液係以一面沿垂直方向上升一面形成鐵粒子的流體化床之方式而構成。進而,分別將作為將含有銦化合物之溶液中所含有的雜質金屬、即藉由上述化學置換反應而於上述鐵粒子表面析出之錫加以剝離的剝離機構之超音波振盪器15a、15b、15c,設置於反應器上部6、反應器中部7、以及反應器下部8。Then, the solution containing the indium compound flowing from the inflow pipe 12 reaches the discharge pipe 14, and the waste liquid is configured to form a fluidized bed of iron particles while rising in the vertical direction. Further, the ultrasonic oscillators 15a, 15b, and 15c, which are exfoliating means for separating the impurity metal contained in the solution containing the indium compound, that is, the tin deposited on the surface of the iron particle by the chemical substitution reaction, respectively, It is disposed in the upper portion of the reactor 6, the middle portion of the reactor 7, and the lower portion 8 of the reactor.
於本實施形態中,如上所述使用鐵粒子作為投入之金屬粒子。較好的是使用鐵粒子之平均粒徑為0.1~8 mm之金屬粒子,但於本實施形態中使用平均粒徑約為3 mm者。再者,利用影像解析法或者JIS Z 8801篩分試驗法等來測定平均粒徑。In the present embodiment, iron particles are used as the input metal particles as described above. It is preferred to use metal particles having an average particle diameter of iron particles of 0.1 to 8 mm, but in the present embodiment, an average particle diameter of about 3 mm is used. Further, the average particle diameter was measured by a video analysis method or a JIS Z 8801 sieving test method or the like.
沈澱除去裝置3係用以將上述鐵粒子以氫氧化物沈澱除去者。氫氧化物之沈澱除去,係藉由添加氫氧化鈉等鹼(鹼溶液)而進行。將該沈澱除去裝置3內之廢液pH值調整為8~9。The precipitation removing device 3 is for removing the above iron particles by hydroxide precipitation. The precipitation of the hydroxide is carried out by adding an alkali (alkaline solution) such as sodium hydroxide. The pH of the waste liquid in the precipitation removing device 3 was adjusted to 8 to 9.
回收用反應器4,係用以如上所述之方式除去雜質錫,且自將鐵以氫氧化物沈澱除去後的含有銦化合物之溶液中回收銦者,因而具有與上述雜質除去用反應器2相同之構成。即,係如圖2所示,具備經由連接部9、10連接反應器上部6、反應器中部7、反應器下部8所構成之反應器本體5者。於該回收用反應器4內,將pH值調整為1.5以下。The reactor 4 for recovery is used to remove impurity tin as described above, and to recover indium from a solution containing an indium compound after the iron is precipitated by hydroxide precipitation, and thus has the reactor 2 for removing impurities described above. The same composition. That is, as shown in Fig. 2, the reactor main body 5 including the reactor upper portion 6, the reactor middle portion 7, and the reactor lower portion 8 is connected via the connecting portions 9, 10. In the recovery reactor 4, the pH is adjusted to 1.5 or less.
就設置有流入用腔室11、流入管12、上部腔室13、排出管14之方面,以及分別將超音波振盪器15a、15b、15c設置於反應器上部6、反應器中部7、以及反應器下部8之方面而言,亦與雜質除去用反應器2相同。The inflow chamber 11, the inflow tube 12, the upper chamber 13, and the discharge tube 14 are provided, and the ultrasonic oscillators 15a, 15b, 15c are respectively disposed in the upper portion of the reactor 6, the middle portion of the reactor 7, and the reaction. The lower portion 8 of the device is also the same as the reactor 2 for impurity removal.
繼而,若就使用具有如此構成的自廢LCD中回收銦之裝置、以及自廢LCD中回收銦之方法加以說明,則首先於粉碎機(未圖示)中將廢LCD粉碎,且將被粉碎之廢LCD供給於銦溶解裝置1。於該銦溶解裝置1中添加鹽酸(鹽酸水溶液),使用該鹽酸將銦自廢LCD中溶出,於上述銦溶解裝置1內獲得銦含量為100~300 mg/L之含有銦化合物之溶液。Then, if a device for recovering indium from a waste LCD having such a configuration and a method for recovering indium from a waste LCD are used, the waste LCD is first pulverized in a pulverizer (not shown) and will be pulverized. The waste LCD is supplied to the indium dissolution device 1. To the indium dissolution apparatus 1, hydrochloric acid (aqueous hydrochloric acid solution) is added, and indium is eluted from the waste LCD using the hydrochloric acid, and a solution containing an indium compound having an indium content of 100 to 300 mg/L is obtained in the indium dissolution apparatus 1.
其次,將該含有銦化合物之溶液供給於雜質除去用反應器2。供給於雜質除去用反應器2的含有銦化合物之溶液,自雜質除去用反應器2之流入管12經流入用腔室11流入反應器本體5內。另一方面,自上部腔室13投入用以產生化學置換反應之金屬粒子(鐵粒子)。於反應器本體5內,流入之含有銦化合物之溶液沿垂直方向上升,另一方面,該含有銦化合物之溶液與自上部腔室13投入的鐵粒子以形成流體化床之方式成為流動狀態。Next, the solution containing the indium compound is supplied to the reactor 2 for impurity removal. The solution containing the indium compound supplied to the reactor 2 for impurity removal flows into the reactor main body 5 through the inflow chamber 11 from the inflow pipe 12 of the reactor 2 for impurity removal. On the other hand, metal particles (iron particles) for generating a chemical displacement reaction are introduced from the upper chamber 13. In the reactor main body 5, the solution containing the indium compound flowing in is raised in the vertical direction, and on the other hand, the solution containing the indium compound and the iron particles charged from the upper chamber 13 are in a fluid state to form a fluidized bed.
繼而,基於含有銦化合物之溶液中所含有的除銦以外之雜質金屬即錫與所投入的金屬粒子鐵之離子化傾向不同,而發生所謂的化學置換反應。若更詳細地加以說明,則各金屬離子之還原反應係如下式,分別表示各金屬離子之標準電極電位(E°)。Then, the ionization tendency of tin, which is an impurity metal other than indium contained in the solution containing the indium compound, is different from that of the metal particle to be charged, and a so-called chemical replacement reaction occurs. More specifically, the reduction reaction of each metal ion is as follows, and the standard electrode potential (E°) of each metal ion is shown.
鐵2 + +2e → 鐵………(1) -0.44 V 錫2 + +2e → 錫………(2) -0.14 VIron 2 + +2e → Iron.........(1) -0.44 V Tin 2 + +2e → Tin... (2) -0.14 V
亦如上述(1)、(2)所表明,與錫2 + 相比,鐵2 + 之標準電極電位較小。換言之,與錫相比,鐵之離子化傾向較大。因此,於成為如上述流動狀態之狀態下,離子化傾向較大之鐵成為鐵2 + (與上述(1)式相反之反應)而溶入含有銦化合物之溶液中,同時含有銦化合物之溶液中所含有之錫2 + 成為錫而於鐵粒子表面析出。As also shown in the above (1) and (2), the standard electrode potential of iron 2 + is smaller than that of tin 2 + . In other words, iron ionization tends to be larger than tin. Thus, as in the state in which the flow becomes a state, the larger the ionization tendency of iron to become iron + 2 (in contrast to the reaction of (1) above) and the compound was dissolved in a solution containing indium, a solution containing both of indium compound Tin 2 + contained in it is tin and precipitates on the surface of iron particles.
繼而,藉由如此化學置換反應將錫析出於鐵粒子表面,之後啟動超音波振盪器15a、15b、15c。藉由使該超音波振盪器15a、15b、15c運轉,由該超音波振盪器15a、15b、15c發出之超音波,賦予使上述錫析出之鐵粒子以振動力及攪拌力,藉此強制性地將所析出之錫自鐵粒子上剝離。Then, the tin is deposited on the surface of the iron particles by such a chemical displacement reaction, and then the ultrasonic oscillators 15a, 15b, and 15c are activated. By operating the ultrasonic oscillators 15a, 15b, and 15c, the ultrasonic waves emitted from the ultrasonic oscillators 15a, 15b, and 15c impart a vibration force and a stirring force to the iron particles deposited by the tin. The precipitated tin is peeled off from the iron particles.
將以如此方式被剝離之錫,自上部腔室13經排出管14排入反應器本體5之外部,最終自含有銦化合物之溶液中除去。於此情形時,於本實施形態中,使用粒子狀者作為用以除去雜質金屬而投入之金屬(鐵),因而例如與投入鐵塊等情形相比,用以產生化學置換反應之金屬(鐵)的表面積增加,且錫之析出反應速度提高。繼而,在確認有一定程度生長之金屬析出後,可藉由利用如上述超音波的振動之強制性剝離,而經常使新的金屬表面(鐵粒子表面)露出,從而維持反應速度。The tin stripped in this manner is discharged from the upper chamber 13 through the discharge tube 14 to the outside of the reactor body 5, and finally removed from the solution containing the indium compound. In this case, in the present embodiment, a particulate material is used as the metal (iron) to be used for removing the impurity metal. Therefore, for example, a metal for generating a chemical displacement reaction (iron) is used as compared with the case of inputting an iron block or the like. The surface area increases, and the precipitation reaction rate of tin increases. Then, after the precipitation of the metal having a certain degree of growth is confirmed, the new metal surface (the surface of the iron particle) can be often exposed by the forced peeling of the vibration of the ultrasonic wave as described above, thereby maintaining the reaction rate.
又,由鐵構成之金屬粒子在反應器本體5內流動,藉由如上述之化學置換反應使鐵2 + 溶出,因而投入上部腔室13之金屬粒子於投入初期時之粒徑,會隨時間經過必然地減少。其結果為,本來廢液以幾乎相同之向上流動速度在反應器本體5內上升,因而存在愈向上部粒徑愈減少從而變小的金屬粒子自反應器本體5中不慎溢出之虞。Further, the iron metal particles constituting the flow within the reactor body 5, as described above by substitution reaction of chemical dissolution of the iron + 2, and therefore into upper chamber 13 of the particle diameter of metal particles at the time of the initial investment, will over time After a certain reduction. As a result, the original waste liquid rises in the reactor main body 5 at almost the same upward flow velocity, so that the metal particles which are smaller in the upper portion and which become smaller and smaller in size are inadvertently overflowed from the reactor body 5.
然而,於本實施形態中,以愈朝上方愈不連續性地增大之方式形成反應器本體5之截面積,故而於反應器本體5內廢液向上流動速度緩慢減少,因此如上所述,由於化學置換反應等而致粒徑減少之金屬粒子,於截面積不斷增加之反應器本體5上部,並不不慎溢出而保持於反應器本體5內之可能性增加。However, in the present embodiment, the cross-sectional area of the reactor body 5 is formed so as to become more discontinuous toward the upper side, so that the upward flow velocity of the waste liquid in the reactor body 5 is slowly decreased, so as described above, The metal particles having a reduced particle size due to a chemical substitution reaction or the like are likely to remain in the reactor body 5 without being inadvertently overflowed in the upper portion of the reactor body 5 whose cross-sectional area is increasing.
又,含有銦化合物之溶液,在自反應器本體5之下部側流入且通過反應器本體5內之時,藉由化學置換反應而使成為對象之錫等金屬析出於由鐵所構成之金屬粒子上,因此愈向反應器本體5之上部,含有銦化合物之溶液中之雜質金屬濃度愈降低。In addition, when a solution containing an indium compound flows in from the lower side of the reactor main body 5 and passes through the inside of the reactor main body 5, a metal such as tin is precipitated by a chemical substitution reaction to form a metal particle composed of iron. Therefore, the concentration of the impurity metal in the solution containing the indium compound is lowered toward the upper portion of the reactor body 5.
然而,於本實施形態中,確認有愈向反應器本體5之上部愈存在微細金屬粒子,又,因含有銦化合物之溶液的向上流動速度緩慢減少而使得金屬粒子數增加,故愈向反應器本體5之上部金屬粒子之總表面積愈大。其結果為,因化學置換反應之反應速度(雜質金屬析出之效率)提高,故於雜質金屬濃度更為降低之反應器本體5的上部,亦可自廢液中有效除去作為雜質金屬之Ni、錫。However, in the present embodiment, it was confirmed that the finer metal particles were present in the upper portion of the reactor main body 5, and the upward flow velocity of the solution containing the indium compound was gradually decreased, so that the number of metal particles was increased, so that the reactor was more toward the reactor. The larger the total surface area of the metal particles on the upper portion of the body 5 is. As a result, since the reaction rate of the chemical substitution reaction (efficiency of precipitation of the impurity metal) is improved, Ni which is an impurity metal can be effectively removed from the waste liquid in the upper portion of the reactor main body 5 in which the impurity metal concentration is further lowered. tin.
其次,將除去錫之含有銦化合物之溶液供給於沈澱除去裝置3。於該沈澱除去裝置3中,添加氫氧化鈉等鹼(鹼溶液)。藉此產生鐵之氫氧化物以及氫氧化銦之固形物。即,於上述雜質除去用反應器2中,藉由化學置換反應而將錫析出於鐵粒子上後除去,另一方面,鐵離子(鐵2 + )溶入含有銦化合物之溶液中。因此,在將含有銦化合物之溶液供給於後段之回收用反應器4之前,亦必須將該鐵2 + 預先自含有銦化合物之溶液中除去。因此,藉由添加如上述之鹼而生成鐵之氫氧化物以及氫氧化銦固形物,但鐵的氫氧化物之沈澱物生成速度絕對快於氫氧化銦,因而藉由控制如凝集沈澱槽之沈澱除去裝置3中的被處理液之滯留時間等,而容易地於沈澱除去裝置3中除去該鐵之氫氧化物。Next, a solution containing the indium compound containing tin is supplied to the precipitation removing device 3. To the precipitation removing device 3, an alkali (alkaline solution) such as sodium hydroxide is added. Thereby, a solid of iron hydroxide and indium hydroxide is produced. In other words, in the reactor 2 for removing impurities, the tin is deposited on the iron particles by a chemical substitution reaction, and then the iron ions (iron 2 + ) are dissolved in the solution containing the indium compound. Therefore, before the solution containing the indium compound is supplied to the recovery reactor 4 in the subsequent stage, the iron 2 + must be removed from the solution containing the indium compound in advance. Therefore, iron hydroxide and indium hydroxide solid matter are formed by adding a base as described above, but the precipitate of iron hydroxide is formed at a speed substantially faster than that of indium hydroxide, and thus is controlled by, for example, agglomerating sedimentation tank. The residence time of the liquid to be treated in the precipitation removing device 3 and the like are easily removed in the precipitation removing device 3 to remove the iron hydroxide.
其次,將鐵的氫氧化物沈澱除去後之含有銦化合物之溶液的pH值調整至1.5以下將氫氧化銦再次溶解後,供給於回收用反應器4。供給於回收用反應器4之含有銦化合物之溶液,與雜質除去用反應器2之情形相同,自流入管12經流入用腔室11流入反應器本體5內。另一方面,自上部腔室13投入用以產生化學置換反應之金屬粒子(Zn粒子或Al粒子)。與雜質除去用反應器2之情形同樣,於反應器本體5內,流入之含有銦化合物之溶液上升,自上部腔室13投入之金屬粒子成為流動狀態。Next, the pH of the solution containing the indium compound after the precipitation of the hydroxide of iron is adjusted to 1.5 or less, and the indium hydroxide is dissolved again, and then supplied to the recovery reactor 4. The solution containing the indium compound supplied to the recovery reactor 4 flows into the reactor main body 5 from the inflow pipe 12 through the inflow chamber 11 in the same manner as in the case of the impurity removal reactor 2. On the other hand, metal particles (Zn particles or Al particles) for generating a chemical displacement reaction are introduced from the upper chamber 13. Similarly to the case of the reactor 2 for impurity removal, the solution containing the indium compound flowing in the reactor main body 5 rises, and the metal particles introduced from the upper chamber 13 become in a flowing state.
繼而,基於作為回收對象之含有銦化合物之溶液中之銦與作為被投入的金屬粒子之Zn或Al之離子化傾向之不同,而發生所謂化學置換反應。各金屬離子之還原反應如下式,分別表示各金屬離子之標準電極電位(E°)。Then, a so-called chemical replacement reaction occurs depending on the difference in the ionization tendency of indium in the solution containing the indium compound to be recovered and Zn or Al as the metal particles to be charged. The reduction reaction of each metal ion is as follows, and the standard electrode potential (E°) of each metal ion is shown.
銦3 + +3e → 銦………(3) -0.34 V Zn2 + +2e → Zn………(4) -0.76 V Al3 + +3e → Al………(5) -1.66 VIndium 3 + +3e → Indium... (3) -0.34 V Zn 2 + +2e → Zn......(4) -0.76 V Al 3 + +3e → Al.........(5) -1.66 V
如上述(3)~(5)所表明,與銦3 + 相比,Zn2 + 或Al3 + 之標準電極電位較小。換言之,與銦相比,Zn或Al之離子化傾向較大。因此,於成為如上述之流動狀態之狀態下,離子化傾向較大之Zn或Al變為Zn2 + 或Al3 + (與上述(4)、(5)式相反之反應)而溶入含有銦化合物之溶液中,同時含有銦化合物之溶液中所含有之銦3 + 變為銦,析出於Zn或Al粒子表面上。As indicated by the above (3) to (5), the standard electrode potential of Zn 2 + or Al 3 + is smaller than that of indium 3 + . In other words, the ionization tendency of Zn or Al is larger than that of indium. Therefore, in the state of the flow state as described above, Zn or Al having a large ionization tendency becomes Zn 2 + or Al 3 + (reaction opposite to the above formulas (4) and (5)) and is dissolved therein. In the solution of the indium compound, indium 3 + contained in the solution containing the indium compound is changed to indium and precipitated on the surface of the Zn or Al particles.
繼而,藉由如此化學置換反應而將銦析出於Zn或Al粒子表面上,之後啟動超音波振盪器15a、15b、15c。藉由使該超音波振盪器15a、15b、15c運轉,由該上述超音波振盪器15a、15b、15c發出之超音波賦予使上述銦析出之Zn或Al粒子以振動力及攪拌力,藉此強制性地將析出之銦自Zn或Al粒子上剝離。Then, indium is deposited on the surface of the Zn or Al particles by such a chemical displacement reaction, and then the ultrasonic oscillators 15a, 15b, and 15c are activated. By operating the ultrasonic oscillators 15a, 15b, and 15c, the ultrasonic waves emitted from the ultrasonic oscillators 15a, 15b, and 15c are supplied with vibration force and stirring force by the Zn or Al particles in which the indium is precipitated. The precipitated indium is forcibly peeled off from the Zn or Al particles.
將以如此方式剝離之銦,自上部腔室13經排出管14排出至反應器本體5之外部,藉此回收銦作為有價金屬。於此情形時,於本實施形態中,與上述雜質除去用反應器2的鐵之情形同樣,作為所投入之Zn或Al係使用粒子狀者,因此用以發生化學置換反應的金屬之表面積增加,且銦之析出反應速度提高。The indium stripped in this manner is discharged from the upper chamber 13 through the discharge tube 14 to the outside of the reactor body 5, whereby indium is recovered as a valuable metal. In this case, in the present embodiment, as in the case of the iron of the impurity-removing reactor 2, since the Zn or Al-based particles are used, the surface area of the metal for chemical substitution reaction increases. And the precipitation reaction rate of indium is increased.
繼而,在確認有一定程度生長之金屬析出後,可藉由如上述利用超音波振動之強制性剝離,而經常使新的Zn或Al粒子表面露出,從而維持反應速度。Then, after the precipitation of the metal having a certain degree of growth is confirmed, the surface of the new Zn or Al particles is often exposed by forced peeling of the ultrasonic vibration as described above, thereby maintaining the reaction rate.
又,藉由化學置換反應使Zn2 + 或Al3 + 自Zn或Al粒子中溶出,因而投入上部腔室13中的Zn或Al粒子於投入初期時之粒徑,隨時間經過必然會減少。其結果為,若本來含有銦化合物之溶液以幾乎相同的向上流動速度在反應器本體5內上升,因而存在愈向上部粒徑愈減少從而變小之Zn或Al粒子自反應器本體5中不慎溢出之虞。Further, since Zn 2 + or Al 3 + is eluted from the Zn or Al particles by the chemical substitution reaction, the particle diameter of the Zn or Al particles charged into the upper chamber 13 at the initial stage of introduction is inevitably decreased over time. As a result, if the solution containing the indium compound originally rises in the reactor main body 5 at almost the same upward flow velocity, the Zn or Al particles which are smaller in the upper portion and smaller in size from the reactor body 5 do not exist. Cautious overflow.
然而,於本實施形態中,反應器本體5之截面積係以愈向上方愈不連續性增大之方式形成,因而於反應器本體5內之含有銦化合物之溶液的向上流動速度緩慢減少,因此如上所述,藉由化學置換反應等而使粒徑減少之金屬粒子,於截面積不斷增加之反應器本體5上部,並不不慎溢出而保持於反應器本體5內之可能性增加。However, in the present embodiment, the cross-sectional area of the reactor body 5 is formed such that the more discontinuous the uppermost portion is, the upward flow velocity of the solution containing the indium compound in the reactor body 5 is slowly decreased. Therefore, as described above, the metal particles having a reduced particle diameter by a chemical substitution reaction or the like are likely to remain in the reactor main body 5 without being inadvertently overflowed in the upper portion of the reactor main body 5 having a large cross-sectional area.
又,含有銦化合物之溶液,在自反應器本體5下部側流入且通過反應器本體5內之時,藉由化學置換反應而使成為對象之銦析出於Zn或Al粒子上,因此愈向反應器本體5之上部,含有銦化合物之溶液中之銦濃度愈降低。Further, when the solution containing the indium compound flows in from the lower side of the reactor main body 5 and passes through the inside of the reactor main body 5, the indium which is the target is deposited on the Zn or Al particles by the chemical substitution reaction, so that the reaction proceeds more. Above the body 5, the concentration of indium in the solution containing the indium compound decreases.
然而,本實施形態中,確認有愈向反應器本體5之上部愈存在微細之Zn或Al粒子,又,藉由含有銦化合物之溶液的向上流動速度緩慢減少而使得Zn或Al粒子數增加,因此愈朝反應器本體5之上部,Zn或Al粒子之總表面積愈大。其結果為,因化學置換反應之反應速度(銦析出之效率)提高,故於銦濃度成為更低之反應器本體5的上部,亦可自含有銦化合物之溶液中有效回收作為回收對象物之銦。However, in the present embodiment, it has been confirmed that finer Zn or Al particles are present in the upper portion of the reactor main body 5, and the upward flow velocity of the solution containing the indium compound is gradually decreased to increase the number of Zn or Al particles. Thus, the more the upper portion of the reactor body 5, the greater the total surface area of the Zn or Al particles. As a result, since the reaction rate of the chemical substitution reaction (efficiency of indium precipitation) is improved, the upper portion of the reactor main body 5 having a lower indium concentration can be efficiently recovered from the solution containing the indium compound as the object to be recovered. indium.
本實施形態之雜質除去用反應器2以及回收用反應器4之反應器本體5之構造,與上述實施形態1不同。即,於本實施形態中,如圖3所示,反應器本體5之周面全體向上形成錐狀,反應器本體5之截面積係以連續性向上增加之方式而構成。就此而言,與反應器本體5之截面積向上不連續性增加之實施形態1的情形不同。The structure of the reactor 2 for removing impurities and the reactor body 5 of the reactor 4 for recovery of the present embodiment is different from that of the first embodiment. That is, in the present embodiment, as shown in Fig. 3, the entire peripheral surface of the reactor main body 5 is formed in a tapered shape, and the cross-sectional area of the reactor main body 5 is configured to increase in continuity. In this regard, the case of the first embodiment in which the cross-sectional area of the reactor body 5 is increased upward is different.
因截面積係以連續性、而非不連續性向上增加之方式而構成,故於本實施形態中,並非以如實施形態1之區分為反應器上部6、反應器中部7、反應器下部8之方式而構成。Since the cross-sectional area is configured to increase in continuity rather than discontinuity, in the present embodiment, it is not divided into the reactor upper portion 6, the reactor middle portion 7, and the lower reactor portion 8 as in the first embodiment. It is constituted by the way.
但,將超音波振盪器15a、15b、15c設置於自反應器本體5之上部至下部之3個部位,與實施形態1相同。因此,於本實施形態中,亦與實施形態1同樣地,藉由超音波振盪器15a、15b、15c所發出之超音波,而獲得可將析出於金屬粒子表面之應除去的雜質金屬即錫或者回收對象金屬即銦強制性剝離之效果。However, the ultrasonic oscillators 15a, 15b, and 15c are provided in three places from the upper portion to the lower portion of the reactor body 5, and are the same as those in the first embodiment. Therefore, in the present embodiment, as in the first embodiment, the ultrasonic waves emitted from the ultrasonic oscillators 15a, 15b, and 15c are used to obtain an impurity metal which can be removed from the surface of the metal particles. Or the effect of forcibly peeling off the target metal, ie, indium.
又,雖存在不連續性或連續性之差異,但就截面積以向上增加之方式構成而言,與實施形態1相同,因而於本實施形態中,亦產生將粒徑減少之微細金屬粒子保持於反應器本體5之上部、且防止其不慎溢出之效果,以及可於對象金屬之濃度為較低的反應器本體5上部將對象金屬有效除去或回收處理之效果。Further, although there is a difference in discontinuity or continuity, the cross-sectional area is increased in the upward direction, and is the same as in the first embodiment. Therefore, in the present embodiment, fine metal particles having a reduced particle diameter are also retained. The effect of preventing the inadvertent overflow of the upper portion of the reactor body 5 and the effect of effectively removing or recovering the target metal at the upper portion of the reactor body 5 having a lower concentration of the target metal.
於本實施形態中,作為將析出金屬自金屬粒子上剝離之方法,係採用使用電磁石攪拌之方法,而取代上述實施形態1及2之以超音波振盪器發出的超音波使其振動之方法。即,於本實施形態中,將如圖5所示的具備電磁石16之滑板17,如圖4所示,升降自如地安裝於水平截面為長方形且設置於反應器本體5側面之軌道18上。如圖5所示,滑板17於其中央具有空間部19,於其空間部19內插入反應器本體5而以包圍該反應器本體5之方式進行設置。再者,本實施形態中所使用之金屬粒子係作為磁性體之鐵等。In the present embodiment, as a method of peeling the precipitated metal from the metal particles, a method of stirring by ultrasonic waves is used instead of the ultrasonic waves emitted from the ultrasonic oscillator in the first and second embodiments. That is, in the present embodiment, as shown in FIG. 4, the slide plate 17 provided with the electromagnet 16 as shown in FIG. 5 is attached to the rail 18 having a rectangular horizontal section and provided on the side surface of the reactor main body 5. As shown in FIG. 5, the slide plate 17 has a space portion 19 at its center, and the reactor body 5 is inserted into the space portion 19 to surround the reactor body 5. Further, the metal particles used in the present embodiment are iron or the like of a magnetic body.
繼而,如圖4之箭頭20所示,藉由使其上下交互移動而攪拌反應器本體5內之金屬粒子,同時使許多金屬粒子相互碰撞,藉此強制性地將析出金屬自金屬粒子上剝離。雖將析出金屬自金屬粒子上剝離之方法為不同,然於本實施形態中,亦可將析出金屬自金屬粒子上適當地剝離,而適當地進行雜質金屬之除去或作為有價金屬之銦之回收。Then, as shown by an arrow 20 in FIG. 4, the metal particles in the reactor body 5 are stirred by moving them up and down, and a plurality of metal particles collide with each other, thereby forcibly separating the precipitated metal from the metal particles. . Although the method of separating the precipitated metal from the metal particles is different, in the present embodiment, the precipitated metal may be appropriately peeled off from the metal particles, and the removal of the impurity metal or the recovery of the indium as the valuable metal may be appropriately performed. .
本實施形態中,就將廢LCD置入袋中進行使用酸之銦溶出處理、清洗中和處理、乾燥處理之情形加以說明。本實施形態之由廢LCD回收銦之裝置中,如圖6所示,具備:溶出處理裝置25、清洗中和處理裝置26、及乾燥處理裝置27。溶出處理裝置25,如圖7所示,具備FRP製槽等溶出處理容器22。將該溶出處理容器22形成為可容納在如軟包裝袋之樹脂製、布製等袋21內容置廢LCD者之尺寸。又,於上述溶出處理容器22之下部,設置有多孔板23及多孔板支持體24。繼而,上述袋21,係以保持於被該多孔板23上之方式而構成。In the present embodiment, a case where the waste LCD is placed in a bag and the indium acid elution treatment, the cleaning neutralization treatment, and the drying treatment are used will be described. As shown in FIG. 6, the apparatus for recovering indium from the waste LCD of the present embodiment includes a elution processing device 25, a cleaning neutralization processing device 26, and a drying processing device 27. As shown in FIG. 7, the elution processing apparatus 25 is provided with the elution processing container 22, such as an FRP tank. The elution processing container 22 is formed into a size that can be accommodated in a bag 21 such as a resin or a cloth, such as a flexible packaging bag. Further, a porous plate 23 and a porous plate support 24 are provided in the lower portion of the elution treatment container 22. Then, the bag 21 is configured to be held by the perforated plate 23.
繼而,被粉碎機等粉碎之廢LCD,以容置於上述袋21內之狀態將銦溶解萃取用鹽酸溶液進行循環處理、且將鹽酸溶液通過廢LCD層28之時,自廢LCD中溶解萃取出銦。即,使用鹽酸自廢LCD中溶解出氧化銦錫,獲得含有銦化合物之溶液。Then, the waste LCD pulverized by the pulverizer or the like is circulated in the state in which the indium is dissolved and extracted with the hydrochloric acid solution, and the hydrochloric acid solution is passed through the waste LCD layer 28, and is dissolved and extracted from the waste LCD. Indium. That is, indium tin oxide was dissolved from the waste LCD using hydrochloric acid to obtain a solution containing an indium compound.
另一方面,使溶解萃取處理後之廢LCD以直接容置於袋21內之狀態,向下一個清洗中和處理裝置26移動,將其容置於該清洗中和用處理裝置26內,進行清洗中和處理。自上述溶出處理裝置25向清洗中和用處理裝置26之移動,係利用吊車等進行。與銦溶解處理同樣,在清洗處理時使用水、在中和處理時使用鹼性溶液進行循環處理。於此情形時之循環處理的液體流通方向,可向下流動,亦可向上流動。將清洗中和處理結束之廢LCD以直接容置且保持於袋內之狀態,向乾燥處理裝置27移動。該乾燥處理裝置27,例如使用藉由氣流乾燥加進行乾燥處理,但亦可不使用如此乾燥處理裝置27,而利用例如曝曬乾燥等乾燥方法進行乾燥處理。將乾燥處理結束後之廢LCD以直接保持於袋21內之狀態,運送至磚瓦工廠、玻璃工廠等作為循環原料。On the other hand, the waste LCD after the dissolution extraction treatment is directly placed in the bag 21, moved to the next cleaning and neutralizing treatment device 26, and placed in the cleaning and processing device 26 for carrying out Cleaning and neutralization treatment. The movement from the elution processing device 25 to the cleaning and neutralizing processing device 26 is performed by a crane or the like. As in the indium dissolution treatment, water is used in the cleaning treatment, and an alkaline solution is used in the neutralization treatment for the circulation treatment. In this case, the circulating flow direction of the liquid can flow downward or upward. The waste LCD which has been subjected to the cleaning neutralization process is moved to the drying processing device 27 in a state of being directly accommodated and held in the bag. The drying treatment device 27 is dried by, for example, air drying, but may be dried by a drying method such as exposure drying without using the drying treatment device 27. The waste LCD after the completion of the drying process is directly held in the bag 21, and is transported to a brick factory, a glass factory, or the like as a circulating material.
於本實施形態中,可藉由將在廢LCD粉碎步驟中被粉碎之微細廢LCD,以如上述之容置於袋21內之狀態進行連續處理,而使處理簡化。又,無須將自廢LCD粉碎步驟中所接收之微細廢LCD片製成粉末再進行處理,因而易於操作。In the present embodiment, the process can be simplified by continuously processing the fine waste LCD pulverized in the waste LCD pulverization step in the state of being placed in the bag 21 as described above. Further, it is not necessary to process the fine waste LCD sheet received in the waste pulverization step and then process it, which is easy to handle.
再者,袋21可具有使廢LCD不落下程度之網眼(多孔性),如布製者就足夠了。袋全體除可具有鹽酸溶液可通過程度之多孔性以外,亦可僅於袋21底部具有多孔性而形成。於任一情形時,藉由於溶出處理容器22內之多孔板23上設置袋21,而以袋21內的廢LCD的自重使袋與溶出處理容器22之壁面緊密接著,藉此鹽酸溶液通過廢LCD層,自袋21之底部經多孔板23向溶出處理容器22之底部移動,因此可藉由循環處理由廢LCD中對銦進行溶解萃取處理。Further, the bag 21 may have a mesh (porosity) such that the waste LCD does not fall, and a cloth maker is sufficient. In addition to the porosity of the hydrochloric acid solution, the entire bag may be formed only by the porosity at the bottom of the bag 21. In either case, by providing the bag 21 on the perforated plate 23 in the dissolution processing container 22, the bag and the wall surface of the dissolution processing container 22 are closely followed by the own weight of the waste LCD in the bag 21, whereby the hydrochloric acid solution passes through the waste. The LCD layer is moved from the bottom of the bag 21 to the bottom of the elution processing container 22 via the perforated plate 23, so that indium can be subjected to a solution extraction treatment in the waste LCD by a circulation process.
再者,於上述實施形態中,已就將使用鹽酸自廢LCD中溶解出ITO所獲得之含有銦化合物之溶液中所含有之除銦以外的作為雜質金屬之錫除去之情形加以說明,但亦可除去除錫以外之金屬。於此情形時,亦可添加除鐵以外之金屬粒子。Further, in the above-described embodiment, the case where tin as an impurity metal other than indium contained in the solution containing the indium compound obtained by dissolving ITO in the waste LCD is used is described. It can remove metals other than tin. In this case, metal particles other than iron may also be added.
又,於該實施形態中,已就使銦於金屬粒子上析出、再將其析出的銦自金屬粒子上剝離之情形加以說明,但並不侷限於作為金屬單體之銦,於使銦與其他金屬的合金即銦合金於金屬粒子上析出、再將其析出之銦合金自金屬粒子上剝離之情形時,亦可應用本發明。Further, in this embodiment, the case where indium is precipitated on the metal particles and the indium precipitated from the metal particles is peeled off from the metal particles is described. However, the indium is not limited to the metal indium, and the indium is used. The present invention can also be applied to the case where an alloy of another metal, that is, an indium alloy is deposited on the metal particles, and the indium alloy precipitated therefrom is peeled off from the metal particles.
又,於上述實施形態中,使用鹽酸作為自廢LCD中將ITO溶解之酸,但該酸之種類並不侷限於鹽酸,例如亦可使用硫酸、硝酸等,或者亦可使用混酸等。Further, in the above embodiment, hydrochloric acid is used as the acid which dissolves ITO in the waste LCD, but the type of the acid is not limited to hydrochloric acid, and for example, sulfuric acid, nitric acid or the like may be used, or a mixed acid or the like may be used.
進而,於上述實施形態中,藉由設置如上述之雜質除去用反應器2,而獲得如上述之較佳效果,但設置如此雜質除去用反應器2並非本發明之必需條件。進而,上述實施形態中,已就添加Zn或Al粒子以回收銦之情形加以說明,但添加於回收用反應器中之金屬粒子,並不侷限於該實施形態之Zn或Al粒子,關鍵是使用離子化傾向大於銦之金屬。Further, in the above-described embodiment, the above-described impurity removing reactor 2 is provided to obtain the above-described preferable effects. However, it is not essential for the present invention to provide the reactor 2 for removing impurities. Further, in the above-described embodiment, the case where Zn or Al particles are added to recover indium is described. However, the metal particles added to the recovery reactor are not limited to the Zn or Al particles of the embodiment, and the key is to use The ionization tendency is greater than the metal of indium.
又,於該實施形態中,將金屬粒子之粒徑設為約3 mm,但金屬粒子之粒徑並不限定於該實施形態,較好的是0.1~8 mm。其原因在於,若粒徑小於0.1 mm,則存在化學置換反應未必能順利進行、而且難以將自金屬粒子上剝離之析出金屬加以回收之可能性;又,若超過8 mm,則有可保存於反應器本體內之金屬粒子數減少,結果造成金屬粒子的總表面積減少從而析出反應的效率下降之虞,而且有除回收目的之有價金屬或雜質金屬以外的金屬於金屬粒子上析出之虞。Further, in this embodiment, the particle diameter of the metal particles is set to about 3 mm, but the particle diameter of the metal particles is not limited to the embodiment, and is preferably 0.1 to 8 mm. The reason for this is that if the particle diameter is less than 0.1 mm, there is a possibility that the chemical substitution reaction does not proceed smoothly, and it is difficult to recover the precipitated metal which is peeled off from the metal particles; and if it exceeds 8 mm, it may be stored in the case where it is more than 8 mm. The number of metal particles in the reactor body is reduced, and as a result, the total surface area of the metal particles is reduced, and the efficiency of the precipitation reaction is lowered, and a metal other than the valuable metal or the impurity metal for the purpose of recovery is precipitated on the metal particles.
進而,於上述實施形態1、2中,反應器本體5之截面積係以愈向上部愈增大之方式形成,因而獲得如上述之較佳效果,但以如此方式形成反應器本體5,並非本發明之必需條件。進而,將析出金屬自金屬粒子上剝離之方法,亦不侷限於上述實施形態1、2之使用超音波之方法或實施形態3之使用電磁石之方法,可為除該等以外之方法。Further, in the above-described first and second embodiments, the cross-sectional area of the reactor main body 5 is formed so that the larger the upper portion is, the better the effect as described above is obtained, but the reactor body 5 is formed in this manner, not The necessary conditions of the present invention. Further, the method of separating the precipitated metal from the metal particles is not limited to the method of using ultrasonic waves according to the first and second embodiments or the method of using the electromagnet according to the third embodiment, and may be a method other than the above.
使用1%、3%、10%鹽酸溶液,於如圖8之裝置中進行用於銦回收處理之銦溶解萃取處理。於圖8中,28表示亦於圖7中說明之廢LCD層,29表示管泵(tube pump),30表示鹽酸,31表示樹脂容器,32表示網籠。根據分析,廢LCD中含有400 mg/kg之銦。溶出處理為:將24 kg廢LCD保持於棉製袋中,將該袋置入如圖8所示設置於100 L樹脂容器內的網籠32上的底面上空出許多孔之樹脂容器31中,再投入14L鹽酸,使用管泵29於室溫下進行循環處理。於溶出處理時,為不使水分蒸發從而不使鹽酸濃度、量產生變化,而於100 L樹脂容器之蓋上設置墊圈;可將100 L樹脂容器與蓋之間加以密封之蓋的管泵29之插入及取出部,係使用以填隙劑進行密封者。The indium dissolution extraction treatment for indium recovery treatment was carried out in a device as shown in Fig. 8 using a 1%, 3%, and 10% hydrochloric acid solution. In Fig. 8, reference numeral 28 denotes a waste LCD layer also illustrated in Fig. 7, 29 denotes a tube pump, 30 denotes hydrochloric acid, 31 denotes a resin container, and 32 denotes a net cage. According to the analysis, the waste LCD contains 400 mg/kg of indium. The dissolution treatment is: holding a 24 kg waste LCD in a cotton bag, and placing the bag into a resin container 31 having a plurality of holes on the bottom surface of the cage 32 provided in the 100 L resin container as shown in FIG. Further, 14 L of hydrochloric acid was introduced, and the tube pump 29 was used for the circulation treatment at room temperature. At the time of the elution treatment, a gasket is provided on the lid of the 100 L resin container so that the concentration and amount of hydrochloric acid are not changed without evaporating the water; a tube pump which can seal the lid between the 100 L resin container and the lid 29 The insertion and removal portions are sealed with a shimming agent.
試驗結果示於表1。The test results are shown in Table 1.
如表1所表明,於任一處理中,亦藉由24小時的溶出處理而獲得98%以上之充分的銦回收率。再者,回收率,係根據廢LCD重量及銦含有率以及處理後鹽酸中的銦濃度、鹽酸量,而計算出。As shown in Table 1, in any of the treatments, a sufficient indium recovery rate of 98% or more was also obtained by a 24 hour dissolution treatment. Further, the recovery rate was calculated based on the weight of the waste LCD, the indium content, the indium concentration in the hydrochloric acid after the treatment, and the amount of hydrochloric acid.
2...雜質除去用反應器2. . . Impurity removal reactor
3...沈澱除去裝置3. . . Precipitation removal device
4...回收用反應器4. . . Recycling reactor
圖1係自廢LCD中回收銦之裝置之一個實施形態之概略方塊圖。BRIEF DESCRIPTION OF THE DRAWINGS Figure 1 is a schematic block diagram showing an embodiment of an apparatus for recovering indium from a waste LCD.
圖2係相同銦回收裝置中之雜質除去用反應器或者回收用反應器之概略正視圖。Fig. 2 is a schematic front view showing a reactor for removing impurities or a reactor for recovery in the same indium recovery apparatus.
圖3係其他實施形態之雜質除去用反應器或者回收用反應器之概略正視圖。Fig. 3 is a schematic front view showing a reactor for removing impurities or a reactor for recovery according to another embodiment.
圖4係其他實施形態之雜質除去用反應器或者回收用反應器之概略正視圖。Fig. 4 is a schematic front view showing a reactor for removing impurities or a reactor for recovery according to another embodiment.
圖5係具備圖4之實施形態中所使用的電磁石之滑板之概略平面圖。Fig. 5 is a schematic plan view of a skateboard including the electromagnet used in the embodiment of Fig. 4.
圖6係表示其他實施形態之銦回收裝置之概略方塊圖。Fig. 6 is a schematic block diagram showing an indium recovery apparatus according to another embodiment.
圖7係相同裝置中之溶出處理裝置之概略剖面圖。Fig. 7 is a schematic cross-sectional view showing a dissolution processing apparatus in the same apparatus.
圖8係實施例中所使用之裝置之概略說明圖。Fig. 8 is a schematic explanatory view of the apparatus used in the embodiment.
1...銦溶解裝置1. . . Indium dissolution device
2...雜質除去用反應器2. . . Impurity removal reactor
3...沈澱除去裝置3. . . Precipitation removal device
4...回收用反應器4. . . Recycling reactor
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Families Citing this family (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5016895B2 (en) * | 2006-03-06 | 2012-09-05 | 株式会社神鋼環境ソリューション | Indium recovery method and apparatus |
JP5068772B2 (en) * | 2007-01-23 | 2012-11-07 | シャープ株式会社 | Method for recovering indium from an etching waste solution containing indium and ferric chloride |
JP2008208396A (en) * | 2007-02-23 | 2008-09-11 | Kobelco Eco-Solutions Co Ltd | Method for collecting indium, and apparatus therefor |
JP2009155717A (en) * | 2007-12-28 | 2009-07-16 | Dowa Eco-System Co Ltd | Method for recovering indium |
JP5217480B2 (en) * | 2008-02-14 | 2013-06-19 | 住友金属鉱山株式会社 | Recovery method of crude indium |
CN101690936B (en) * | 2009-10-16 | 2011-06-15 | 清华大学 | Resourceful treatment method of waste thin film transistor liquid crystal monitor |
FI122676B (en) * | 2010-10-12 | 2012-05-15 | Outotec Oyj | Method for treating a solution containing zinc sulphate |
KR101308972B1 (en) * | 2011-05-31 | 2013-09-16 | 강릉원주대학교산학협력단 | Adsorbent having selective adsorption and preparing method of the same and recovery method of indium from wasted portabel device using the adsorbent |
KR101289987B1 (en) * | 2011-06-29 | 2013-07-26 | 엘지디스플레이 주식회사 | Method for recovering valuable metal in lcd waste glass |
CN103157646B (en) * | 2011-12-14 | 2015-08-19 | 格林美股份有限公司 | A kind of integrated conduct method of waste liquid crystal display |
SG11201403228RA (en) * | 2011-12-15 | 2014-07-30 | Advanced Tech Materials | Apparatus and method for stripping solder metals during the recycling of waste electrical and electronic equipment |
JP5713946B2 (en) * | 2012-03-27 | 2015-05-07 | 三菱電機株式会社 | Method for recovering metal component in oxide semiconductor |
CN103331295B (en) * | 2012-04-24 | 2015-05-20 | 合肥工业大学 | Industrialized recovery method and apparatus of waste liquid crystal display glass panel |
JP5971521B2 (en) * | 2012-08-23 | 2016-08-17 | 住友電気工業株式会社 | Metal manufacturing method |
CN102925696B (en) * | 2012-10-29 | 2014-04-02 | 四川长虹电器股份有限公司 | Comprehensive recycling method of waste plasma screen |
CN103103356B (en) * | 2012-11-09 | 2014-12-10 | 柳州百韧特先进材料有限公司 | Process for recovering crude indium and tin from ITO (indium tin oxide) waste target |
HK1177382A2 (en) * | 2012-12-21 | 2013-08-23 | Li Tong H K Telecom Company Ltd | A system and method for processing objects having chemical contaminates |
CN103436692B (en) * | 2013-09-02 | 2016-01-20 | 沈阳隆基电磁科技股份有限公司 | A kind of electromagnetic oscillation treatment unit and method |
CN103602815B (en) * | 2013-11-06 | 2015-12-09 | 四川长虹电器股份有限公司 | The method of recovery indium from waste liquid crystal display |
FR3017883A1 (en) | 2014-02-27 | 2015-08-28 | Centre Nat Rech Scient | METHOD FOR TREATING AN ELEMENT COMPRISING AT LEAST ONE FIRST MEDIUM WHOSE FACE IS AT LEAST PARTIALLY COVERED WITH A LAYER OF INDIUM OXIDES AND TIN (ITO) |
FR3025806B1 (en) * | 2014-09-15 | 2019-09-06 | Bigarren Bizi | PROCESS FOR PROCESSING AND EXTRACTING ELECTRONIC WASTE FOR RECOVERING COMPONENTS INCLUDED IN SUCH WASTE |
CN104498721A (en) * | 2015-01-08 | 2015-04-08 | 中国科学院城市环境研究所 | Innocent treatment method and system for liquid crystal panel |
CN106011481A (en) * | 2016-06-30 | 2016-10-12 | 华南理工大学 | Method for recovering indium (In) from waste liquid crystal displays |
DE102020100243B4 (en) | 2020-01-08 | 2023-06-22 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung eingetragener Verein | Process for processing glass-plastic-metal composite materials |
TWI748686B (en) * | 2020-10-14 | 2021-12-01 | 遠東科技大學 | Method and device for separating oxide film from surface of indium-bismuth alloy |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10204673A (en) * | 1997-01-22 | 1998-08-04 | Mitsubishi Materials Corp | Recovering method of indium |
JP2000310955A (en) * | 1998-09-09 | 2000-11-07 | Canon Inc | Image display device, and its disassembling process method and recovering method for component |
JP2002069544A (en) * | 2000-08-28 | 2002-03-08 | Nikko Materials Co Ltd | Method for recovering indium |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4054513A (en) * | 1973-07-10 | 1977-10-18 | English Clays Lovering Pochin & Company Limited | Magnetic separation, method and apparatus |
JPS55141530A (en) * | 1979-04-21 | 1980-11-05 | Fujisash Co | Reducing method of heavy metal ion |
JPS5831049A (en) * | 1981-08-18 | 1983-02-23 | Sumitomo Metal Mining Co Ltd | Collecting method of high purity indium from sulfuric acid acidic solution containing indium |
JPS6056031A (en) * | 1983-09-05 | 1985-04-01 | Dowa Mining Co Ltd | Method for recovering ge, ga and in from substance containing trace of ge, ga and in |
JP2649148B2 (en) * | 1995-01-27 | 1997-09-03 | 小島プレス工業株式会社 | Vehicle outside handle |
JPH09268334A (en) * | 1996-04-04 | 1997-10-14 | Mitsui Mining & Smelting Co Ltd | Method for recovering indium |
WO1998050304A1 (en) * | 1997-05-08 | 1998-11-12 | Mitsubishi Chemical Corporation | Method for treating selenium-containing solution |
JP3602329B2 (en) * | 1998-03-20 | 2004-12-15 | 同和鉱業株式会社 | Method for recovering indium from indium-containing material |
JP4598921B2 (en) * | 2000-06-09 | 2010-12-15 | 出光興産株式会社 | Indium recovery method |
-
2006
- 2006-07-25 US US11/997,884 patent/US20100101367A1/en not_active Abandoned
- 2006-07-25 WO PCT/JP2006/314626 patent/WO2007015392A1/en active Application Filing
- 2006-07-25 CN CNB2006800070686A patent/CN100554454C/en not_active Expired - Fee Related
- 2006-07-25 JP JP2007529217A patent/JPWO2007015392A1/en active Pending
- 2006-07-25 KR KR20077018087A patent/KR20080031661A/en not_active Application Discontinuation
- 2006-08-03 TW TW95128432A patent/TWI385255B/en not_active IP Right Cessation
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10204673A (en) * | 1997-01-22 | 1998-08-04 | Mitsubishi Materials Corp | Recovering method of indium |
JP2000310955A (en) * | 1998-09-09 | 2000-11-07 | Canon Inc | Image display device, and its disassembling process method and recovering method for component |
JP2002069544A (en) * | 2000-08-28 | 2002-03-08 | Nikko Materials Co Ltd | Method for recovering indium |
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