TWI372439B - Semiconductor wafer positioning method, and apparatus using the same - Google Patents

Semiconductor wafer positioning method, and apparatus using the same

Info

Publication number
TWI372439B
TWI372439B TW094144175A TW94144175A TWI372439B TW I372439 B TWI372439 B TW I372439B TW 094144175 A TW094144175 A TW 094144175A TW 94144175 A TW94144175 A TW 94144175A TW I372439 B TWI372439 B TW I372439B
Authority
TW
Taiwan
Prior art keywords
same
semiconductor wafer
positioning method
wafer positioning
semiconductor
Prior art date
Application number
TW094144175A
Other languages
English (en)
Other versions
TW200631121A (en
Inventor
Satoshi Ikeda
Masayuki Yamamoto
Original Assignee
Nitto Denko Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nitto Denko Corp filed Critical Nitto Denko Corp
Publication of TW200631121A publication Critical patent/TW200631121A/zh
Application granted granted Critical
Publication of TWI372439B publication Critical patent/TWI372439B/zh

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
    • H01L21/681—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment using optical controlling means
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S414/00—Material or article handling
    • Y10S414/135—Associated with semiconductor wafer handling
    • Y10S414/136—Associated with semiconductor wafer handling including wafer orienting means

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
TW094144175A 2005-02-28 2005-12-14 Semiconductor wafer positioning method, and apparatus using the same TWI372439B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005053541A JP4803703B2 (ja) 2005-02-28 2005-02-28 半導体ウエハの位置決定方法およびこれを用いた装置

Publications (2)

Publication Number Publication Date
TW200631121A TW200631121A (en) 2006-09-01
TWI372439B true TWI372439B (en) 2012-09-11

Family

ID=36932449

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094144175A TWI372439B (en) 2005-02-28 2005-12-14 Semiconductor wafer positioning method, and apparatus using the same

Country Status (5)

Country Link
US (1) US7346415B2 (zh)
JP (1) JP4803703B2 (zh)
KR (1) KR101281936B1 (zh)
CN (1) CN100505205C (zh)
TW (1) TWI372439B (zh)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7612185B2 (en) * 2003-03-07 2009-11-03 The Board Of Trustees Of The University Of Illinois Nucleic acid biosensors
US7892734B2 (en) * 2005-08-11 2011-02-22 The Board Of Trustees Of The University Of Illinois Aptamer based colorimetric sensor systems
US8415461B2 (en) * 2007-01-19 2013-04-09 The Board Of Trustees Of The University Of Illinois Amphiphilic substances and functionalized lipid vesicles including the same
JP5022793B2 (ja) * 2007-07-02 2012-09-12 日東電工株式会社 半導体ウエハの欠陥位置検出方法
US8409800B2 (en) * 2007-07-16 2013-04-02 The Board Of Trustees Of The University Of Illinois Nucleic acid based fluorescent sensor for copper detection
US8568690B2 (en) * 2007-07-31 2013-10-29 The Board Of Trustees Of The University Of Illinois MRI contrast agents and high-throughput screening by MRI
US20100105039A1 (en) * 2008-06-03 2010-04-29 Yi Lu Label-free colorimetric detection
JP5384220B2 (ja) * 2009-06-22 2014-01-08 東京応化工業株式会社 アライメント装置およびアライメント方法
JP5949741B2 (ja) * 2013-12-19 2016-07-13 株式会社安川電機 ロボットシステム及び検出方法
CN104748676A (zh) * 2013-12-31 2015-07-01 北京北方微电子基地设备工艺研究中心有限责任公司 位置检测装置和传输系统
CN105097601A (zh) * 2014-04-17 2015-11-25 北京北方微电子基地设备工艺研究中心有限责任公司 晶片校准装置以及半导体加工设备
KR101609695B1 (ko) * 2014-11-14 2016-04-20 (주)로봇앤드디자인 영상촬상소자를 이용한 투명 웨이퍼 정렬 장치 및 방법
KR101616464B1 (ko) * 2014-11-18 2016-04-29 주식회사 엘지실트론 웨이퍼 연마장비의 웨이퍼 로딩장치 및 웨이퍼 로딩위치 조정 방법
CN105762101B (zh) * 2014-12-19 2019-02-19 北京北方华创微电子装备有限公司 晶片定位装置及方法
WO2020180470A1 (en) 2019-03-01 2020-09-10 Applied Materials, Inc. Transparent wafer center finder

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2642216B2 (ja) * 1989-05-23 1997-08-20 サイベック システムズ 半導体物品の予備位置決め方法及び装置
JP3820278B2 (ja) * 1995-04-07 2006-09-13 日東電工株式会社 円板状体の中心決定装置
US5822213A (en) * 1996-03-29 1998-10-13 Lam Research Corporation Method and apparatus for determining the center and orientation of a wafer-like object
US5644400A (en) * 1996-03-29 1997-07-01 Lam Research Corporation Method and apparatus for determining the center and orientation of a wafer-like object
JPH11317439A (ja) * 1998-05-01 1999-11-16 Nec Corp 位置決め装置
JP2002093692A (ja) * 2000-09-20 2002-03-29 Komatsu Ltd 半導体ウェハのノッチ面取部平面部分の光学的処理装置とその処理方法。
JP2003258062A (ja) * 2002-03-04 2003-09-12 Nitto Denko Corp 円板状体の位置合わせ装置およびその方法
JP2006073603A (ja) * 2004-08-31 2006-03-16 Takatori Corp ウエハのアライメント方法

Also Published As

Publication number Publication date
KR20060095443A (ko) 2006-08-31
TW200631121A (en) 2006-09-01
JP4803703B2 (ja) 2011-10-26
US20060194406A1 (en) 2006-08-31
CN100505205C (zh) 2009-06-24
JP2006237501A (ja) 2006-09-07
KR101281936B1 (ko) 2013-07-05
US7346415B2 (en) 2008-03-18
CN1828860A (zh) 2006-09-06

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees