TWI369418B - Wafer electroplating apparatus for reducing edge defects - Google Patents

Wafer electroplating apparatus for reducing edge defects

Info

Publication number
TWI369418B
TWI369418B TW098142112A TW98142112A TWI369418B TW I369418 B TWI369418 B TW I369418B TW 098142112 A TW098142112 A TW 098142112A TW 98142112 A TW98142112 A TW 98142112A TW I369418 B TWI369418 B TW I369418B
Authority
TW
Taiwan
Prior art keywords
electroplating apparatus
edge defects
reducing edge
wafer electroplating
wafer
Prior art date
Application number
TW098142112A
Other languages
English (en)
Other versions
TW201028503A (en
Inventor
Vinay Prabhakar
Bryan L Buckalew
Kousik Ganesan
Shantinath Ghongadi
Zhian He
Steven T Mayer
Robert Rash
Jonathan D Reid
Yuichi Takada
James R Zibrida
Original Assignee
Novellus Systems Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Novellus Systems Inc filed Critical Novellus Systems Inc
Publication of TW201028503A publication Critical patent/TW201028503A/zh
Application granted granted Critical
Publication of TWI369418B publication Critical patent/TWI369418B/zh

Links

Classifications

    • C—CHEMISTRY; METALLURGY
    • C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
    • C25D17/001—Apparatus specially adapted for electrolytic coating of wafers, e.g. semiconductors or solar cells
    • C—CHEMISTRY; METALLURGY
    • C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
    • C25D17/004—Sealing devices
    • C—CHEMISTRY; METALLURGY
    • C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D7/00—Electroplating characterised by the article coated
    • C25D7/12—Semiconductors
    • C25D7/123—Semiconductors first coated with a seed layer or a conductive layer

Landscapes

  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Sustainable Development (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Electroplating Methods And Accessories (AREA)
  • Electrodes Of Semiconductors (AREA)
TW098142112A 2008-12-10 2009-12-09 Wafer electroplating apparatus for reducing edge defects TWI369418B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US12146008P 2008-12-10 2008-12-10

Publications (2)

Publication Number Publication Date
TW201028503A TW201028503A (en) 2010-08-01
TWI369418B true TWI369418B (en) 2012-08-01

Family

ID=42264466

Family Applications (1)

Application Number Title Priority Date Filing Date
TW098142112A TWI369418B (en) 2008-12-10 2009-12-09 Wafer electroplating apparatus for reducing edge defects

Country Status (6)

Country Link
US (2) US8172992B2 (zh)
JP (2) JP5237924B2 (zh)
KR (1) KR101203223B1 (zh)
CN (1) CN101798698B (zh)
SG (1) SG162686A1 (zh)
TW (1) TWI369418B (zh)

Families Citing this family (35)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7980000B2 (en) * 2006-12-29 2011-07-19 Applied Materials, Inc. Vapor dryer having hydrophilic end effector
US7985325B2 (en) * 2007-10-30 2011-07-26 Novellus Systems, Inc. Closed contact electroplating cup assembly
US7935231B2 (en) * 2007-10-31 2011-05-03 Novellus Systems, Inc. Rapidly cleanable electroplating cup assembly
US9512538B2 (en) 2008-12-10 2016-12-06 Novellus Systems, Inc. Plating cup with contoured cup bottom
JP5237924B2 (ja) 2008-12-10 2013-07-17 ノベルス・システムズ・インコーポレーテッド ベースプレート、及び電気メッキ装置
US9221081B1 (en) 2011-08-01 2015-12-29 Novellus Systems, Inc. Automated cleaning of wafer plating assembly
US9228270B2 (en) * 2011-08-15 2016-01-05 Novellus Systems, Inc. Lipseals and contact elements for semiconductor electroplating apparatuses
US10066311B2 (en) 2011-08-15 2018-09-04 Lam Research Corporation Multi-contact lipseals and associated electroplating methods
US9988734B2 (en) 2011-08-15 2018-06-05 Lam Research Corporation Lipseals and contact elements for semiconductor electroplating apparatuses
US9309603B2 (en) * 2011-09-14 2016-04-12 Applied Materials, Inc Component cleaning in a metal plating apparatus
US8900425B2 (en) 2011-11-29 2014-12-02 Applied Materials, Inc. Contact ring for an electrochemical processor
SG11201406133WA (en) 2012-03-28 2014-10-30 Novellus Systems Inc Methods and apparatuses for cleaning electroplating substrate holders
KR102092416B1 (ko) 2012-03-30 2020-03-24 노벨러스 시스템즈, 인코포레이티드 역전류 디플레이팅을 이용한 전기도금 기판 홀더의 클리닝
US20130306465A1 (en) * 2012-05-17 2013-11-21 Applied Materials, Inc. Seal rings in electrochemical processors
US9746427B2 (en) 2013-02-15 2017-08-29 Novellus Systems, Inc. Detection of plating on wafer holding apparatus
US10416092B2 (en) 2013-02-15 2019-09-17 Lam Research Corporation Remote detection of plating on wafer holding apparatus
US9399827B2 (en) * 2013-04-29 2016-07-26 Applied Materials, Inc. Microelectronic substrate electro processing system
US9368340B2 (en) 2014-06-02 2016-06-14 Lam Research Corporation Metallization of the wafer edge for optimized electroplating performance on resistive substrates
KR101581276B1 (ko) * 2014-09-26 2016-01-04 주식회사 티케이씨 박형화 웨이퍼의 도금시 에지 부분의 손상 방지를 위한 웨이퍼 취급장치
JP6745103B2 (ja) * 2014-11-26 2020-08-26 ノベラス・システムズ・インコーポレーテッドＮｏｖｅｌｌｕｓ Ｓｙｓｔｅｍｓ Ｉｎｃｏｒｐｏｒａｔｅｄ 半導体電気メッキ装置用のリップシールおよび接触要素
US10053793B2 (en) * 2015-07-09 2018-08-21 Lam Research Corporation Integrated elastomeric lipseal and cup bottom for reducing wafer sticking
US20170073832A1 (en) * 2015-09-11 2017-03-16 Lam Research Corporation Durable low cure temperature hydrophobic coating in electroplating cup assembly
WO2017092029A1 (en) * 2015-12-04 2017-06-08 Acm Research (Shanghai) Inc. Apparatus for holding substrate
CN107447242B (zh) * 2016-05-31 2020-09-08 台湾积体电路制造股份有限公司 电镀装置及方法
US20170370017A1 (en) * 2016-06-27 2017-12-28 Tel Nexx, Inc. Wet processing system and method of operating
US20180251907A1 (en) * 2017-03-01 2018-09-06 Lam Research Corporation Wide lipseal for electroplating
JP6963524B2 (ja) * 2018-03-20 2021-11-10 キオクシア株式会社 電解メッキ装置
US11274377B2 (en) * 2018-04-20 2022-03-15 Applied Materials, Inc. Seal apparatus for an electroplating system
JP7256027B2 (ja) * 2019-02-20 2023-04-11 株式会社荏原製作所 基板ホルダおよび当該基板ホルダを備えるめっき装置
US20220220627A1 (en) * 2019-05-17 2022-07-14 Lam Research Corporation Substrate sticking and breakage mitigation
CN115485421A (zh) * 2020-04-30 2022-12-16 朗姆研究公司 用于在薄衬底搬运期间防止碎裂的混合式接触指
EP3998374A4 (en) 2020-09-16 2022-08-03 Changxin Memory Technologies, Inc. DEVICE AND METHOD FOR AIR LEAK DETECTION AND METHOD FOR ELECTROPLATING WAFER
CN114645311A (zh) * 2020-12-18 2022-06-21 盛美半导体设备(上海)股份有限公司 基板保持装置的杯形夹盘及基板保持装置
CN114555870A (zh) * 2021-03-17 2022-05-27 株式会社荏原制作所 镀覆装置以及镀覆装置的接触部件清洗方法
CN115135618B (zh) * 2021-10-18 2024-07-02 株式会社荏原制作所 镀覆方法及镀覆装置

Family Cites Families (63)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4466864A (en) 1983-12-16 1984-08-21 At&T Technologies, Inc. Methods of and apparatus for electroplating preselected surface regions of electrical articles
US5000827A (en) 1990-01-02 1991-03-19 Motorola, Inc. Method and apparatus for adjusting plating solution flow characteristics at substrate cathode periphery to minimize edge effect
US5221449A (en) 1990-10-26 1993-06-22 International Business Machines Corporation Method of making Alpha-Ta thin films
WO1992007968A1 (en) 1990-10-26 1992-05-14 International Business Machines Corporation STRUCTURE AND METHOD OF MAKING ALPHA-Ta IN THIN FILMS
US5482611A (en) 1991-09-30 1996-01-09 Helmer; John C. Physical vapor deposition employing ion extraction from a plasma
US5227041A (en) 1992-06-12 1993-07-13 Digital Equipment Corporation Dry contact electroplating apparatus
JP3490238B2 (ja) 1997-02-17 2004-01-26 三菱電機株式会社 メッキ処理装置およびメッキ処理方法
US6193954B1 (en) * 1997-03-21 2001-02-27 Abbott Laboratories Formulations for pulmonary delivery of dopamine agonists
US5985762A (en) 1997-05-19 1999-11-16 International Business Machines Corporation Method of forming a self-aligned copper diffusion barrier in vias
US6156167A (en) 1997-11-13 2000-12-05 Novellus Systems, Inc. Clamshell apparatus for electrochemically treating semiconductor wafers
US6159354A (en) 1997-11-13 2000-12-12 Novellus Systems, Inc. Electric potential shaping method for electroplating
US6126798A (en) 1997-11-13 2000-10-03 Novellus Systems, Inc. Electroplating anode including membrane partition system and method of preventing passivation of same
US6179983B1 (en) 1997-11-13 2001-01-30 Novellus Systems, Inc. Method and apparatus for treating surface including virtual anode
CA2320278C (en) 1998-02-12 2006-01-03 Acm Research, Inc. Plating apparatus and method
DE69929967T2 (de) 1998-04-21 2007-05-24 Applied Materials, Inc., Santa Clara Elektroplattierungssystem und verfahren zur elektroplattierung auf substraten
US6217716B1 (en) 1998-05-06 2001-04-17 Novellus Systems, Inc. Apparatus and method for improving target erosion in hollow cathode magnetron sputter source
US6071388A (en) * 1998-05-29 2000-06-06 International Business Machines Corporation Electroplating workpiece fixture having liquid gap spacer
US6099702A (en) 1998-06-10 2000-08-08 Novellus Systems, Inc. Electroplating chamber with rotatable wafer holder and pre-wetting and rinsing capability
US6303010B1 (en) 1999-07-12 2001-10-16 Semitool, Inc. Methods and apparatus for processing the surface of a microelectronic workpiece
US6080291A (en) * 1998-07-10 2000-06-27 Semitool, Inc. Apparatus for electrochemically processing a workpiece including an electrical contact assembly having a seal member
JP2003520898A (ja) 1998-07-10 2003-07-08 セミトゥール・インコーポレイテッド 化学メッキ及び電気メッキを使って銅メッキを行うための方法及び装置
US6773560B2 (en) 1998-07-10 2004-08-10 Semitool, Inc. Dry contact assemblies and plating machines with dry contact assemblies for plating microelectronic workpieces
WO2000003074A1 (fr) 1998-07-10 2000-01-20 Ebara Corporation Dispositif de placage
US6074544A (en) 1998-07-22 2000-06-13 Novellus Systems, Inc. Method of electroplating semiconductor wafer using variable currents and mass transfer to obtain uniform plated layer
US6176985B1 (en) 1998-10-23 2001-01-23 International Business Machines Corporation Laminated electroplating rack and connection system for optimized plating
US7070686B2 (en) 2000-03-27 2006-07-04 Novellus Systems, Inc. Dynamically variable field shaping element
US6402923B1 (en) 2000-03-27 2002-06-11 Novellus Systems Inc Method and apparatus for uniform electroplating of integrated circuits using a variable field shaping element
US6613214B2 (en) 1998-11-30 2003-09-02 Applied Materials, Inc. Electric contact element for electrochemical deposition system and method
US6258220B1 (en) * 1998-11-30 2001-07-10 Applied Materials, Inc. Electro-chemical deposition system
US6413388B1 (en) 2000-02-23 2002-07-02 Nutool Inc. Pad designs and structures for a versatile materials processing apparatus
US6124203A (en) 1998-12-07 2000-09-26 Advanced Micro Devices, Inc. Method for forming conformal barrier layers
DE19859467C2 (de) * 1998-12-22 2002-11-28 Steag Micro Tech Gmbh Substrathalter
US6179973B1 (en) 1999-01-05 2001-01-30 Novellus Systems, Inc. Apparatus and method for controlling plasma uniformity across a substrate
US6193854B1 (en) 1999-01-05 2001-02-27 Novellus Systems, Inc. Apparatus and method for controlling erosion profile in hollow cathode magnetron sputter source
US6221757B1 (en) 1999-01-20 2001-04-24 Infineon Technologies Ag Method of making a microelectronic structure
US6368475B1 (en) 2000-03-21 2002-04-09 Semitool, Inc. Apparatus for electrochemically processing a microelectronic workpiece
US6197182B1 (en) 1999-07-07 2001-03-06 Technic Inc. Apparatus and method for plating wafers, substrates and other articles
US7645366B2 (en) * 1999-07-12 2010-01-12 Semitool, Inc. Microelectronic workpiece holders and contact assemblies for use therewith
US6267860B1 (en) 1999-07-27 2001-07-31 International Business Machines Corporation Method and apparatus for electroplating
US6612915B1 (en) * 1999-12-27 2003-09-02 Nutool Inc. Work piece carrier head for plating and polishing
US6270646B1 (en) 1999-12-28 2001-08-07 International Business Machines Corporation Electroplating apparatus and method using a compressible contact
US6251242B1 (en) 2000-01-21 2001-06-26 Applied Materials, Inc. Magnetron and target producing an extended plasma region in a sputter reactor
US6277249B1 (en) 2000-01-21 2001-08-21 Applied Materials Inc. Integrated process for copper via filling using a magnetron and target producing highly energetic ions
JP2002069698A (ja) * 2000-08-31 2002-03-08 Tokyo Electron Ltd 液処理装置及び液処理方法
JP2004536217A (ja) * 2000-10-03 2004-12-02 アプライド　マテリアルズ　インコーポレイテッド 金属蒸着のためのエントリーにあたって半導体基板を傾けるための方法と関連する装置
US6627052B2 (en) 2000-12-12 2003-09-30 International Business Machines Corporation Electroplating apparatus with vertical electrical contact
US6540899B2 (en) 2001-04-05 2003-04-01 All Wet Technologies, Inc. Method of and apparatus for fluid sealing, while electrically contacting, wet-processed workpieces
US6800187B1 (en) 2001-05-31 2004-10-05 Novellus Systems, Inc. Clamshell apparatus for electrochemically treating wafers
US6551487B1 (en) 2001-05-31 2003-04-22 Novellus Systems, Inc. Methods and apparatus for controlled-angle wafer immersion
US6908540B2 (en) 2001-07-13 2005-06-21 Applied Materials, Inc. Method and apparatus for encapsulation of an edge of a substrate during an electro-chemical deposition process
US6579430B2 (en) 2001-11-02 2003-06-17 Innovative Technology Licensing, Llc Semiconductor wafer plating cathode assembly
US6989084B2 (en) 2001-11-02 2006-01-24 Rockwell Scientific Licensing, Llc Semiconductor wafer plating cell assembly
US7033465B1 (en) 2001-11-30 2006-04-25 Novellus Systems, Inc. Clamshell apparatus with crystal shielding and in-situ rinse-dry
US6755946B1 (en) 2001-11-30 2004-06-29 Novellus Systems, Inc. Clamshell apparatus with dynamic uniformity control
US7087144B2 (en) * 2003-01-31 2006-08-08 Applied Materials, Inc. Contact ring with embedded flexible contacts
JP3886919B2 (ja) * 2003-03-12 2007-02-28 富士通株式会社 めっき装置
US7285195B2 (en) * 2004-06-24 2007-10-23 Applied Materials, Inc. Electric field reducing thrust plate
US7301458B2 (en) 2005-05-11 2007-11-27 Alien Technology Corporation Method and apparatus for testing RFID devices
KR20080007931A (ko) * 2006-07-19 2008-01-23 삼성전자주식회사 전기 도금 장치
US7522005B1 (en) * 2006-07-28 2009-04-21 Sequoia Communications KFM frequency tracking system using an analog correlator
US7985325B2 (en) 2007-10-30 2011-07-26 Novellus Systems, Inc. Closed contact electroplating cup assembly
US7935231B2 (en) 2007-10-31 2011-05-03 Novellus Systems, Inc. Rapidly cleanable electroplating cup assembly
JP5237924B2 (ja) 2008-12-10 2013-07-17 ノベルス・システムズ・インコーポレーテッド ベースプレート、及び電気メッキ装置

Also Published As

Publication number Publication date
KR20100067072A (ko) 2010-06-18
CN101798698A (zh) 2010-08-11
KR101203223B1 (ko) 2012-11-20
JP2010150659A (ja) 2010-07-08
US20120181170A1 (en) 2012-07-19
TW201028503A (en) 2010-08-01
CN101798698B (zh) 2014-01-29
JP2013167022A (ja) 2013-08-29
JP5237924B2 (ja) 2013-07-17
US8172992B2 (en) 2012-05-08
US20100155254A1 (en) 2010-06-24
SG162686A1 (en) 2010-07-29

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