TWI368823B - Coating compositions for use with an overcoated photoresist - Google Patents
Coating compositions for use with an overcoated photoresistInfo
- Publication number
- TWI368823B TWI368823B TW095103709A TW95103709A TWI368823B TW I368823 B TWI368823 B TW I368823B TW 095103709 A TW095103709 A TW 095103709A TW 95103709 A TW95103709 A TW 95103709A TW I368823 B TWI368823 B TW I368823B
- Authority
- TW
- Taiwan
- Prior art keywords
- coating compositions
- overcoated photoresist
- overcoated
- photoresist
- compositions
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
- G03F7/091—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers characterised by antireflection means or light filtering or absorbing means, e.g. anti-halation, contrast enhancement
-
- G—PHYSICS
- G10—MUSICAL INSTRUMENTS; ACOUSTICS
- G10H—ELECTROPHONIC MUSICAL INSTRUMENTS; INSTRUMENTS IN WHICH THE TONES ARE GENERATED BY ELECTROMECHANICAL MEANS OR ELECTRONIC GENERATORS, OR IN WHICH THE TONES ARE SYNTHESISED FROM A DATA STORE
- G10H1/00—Details of electrophonic musical instruments
- G10H1/32—Constructional details
-
- G—PHYSICS
- G10—MUSICAL INSTRUMENTS; ACOUSTICS
- G10F—AUTOMATIC MUSICAL INSTRUMENTS
- G10F1/00—Automatic musical instruments
- G10F1/02—Pianofortes with keyboard
-
- G—PHYSICS
- G10—MUSICAL INSTRUMENTS; ACOUSTICS
- G10F—AUTOMATIC MUSICAL INSTRUMENTS
- G10F5/00—Details or accessories
-
- G—PHYSICS
- G10—MUSICAL INSTRUMENTS; ACOUSTICS
- G10H—ELECTROPHONIC MUSICAL INSTRUMENTS; INSTRUMENTS IN WHICH THE TONES ARE GENERATED BY ELECTROMECHANICAL MEANS OR ELECTRONIC GENERATORS, OR IN WHICH THE TONES ARE SYNTHESISED FROM A DATA STORE
- G10H7/00—Instruments in which the tones are synthesised from a data store, e.g. computer organs
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Acoustics & Sound (AREA)
- Multimedia (AREA)
- Architecture (AREA)
- Structural Engineering (AREA)
- General Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Materials For Photolithography (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US65034005P | 2005-02-05 | 2005-02-05 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200641533A TW200641533A (en) | 2006-12-01 |
TWI368823B true TWI368823B (en) | 2012-07-21 |
Family
ID=36216845
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW095103709A TWI368823B (en) | 2005-02-05 | 2006-02-03 | Coating compositions for use with an overcoated photoresist |
Country Status (6)
Country | Link |
---|---|
US (1) | US20060275696A1 (zh) |
EP (1) | EP1691238A3 (zh) |
JP (1) | JP4954562B2 (zh) |
KR (1) | KR101362836B1 (zh) |
CN (1) | CN1828420B (zh) |
TW (1) | TWI368823B (zh) |
Families Citing this family (29)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20060177772A1 (en) * | 2005-02-10 | 2006-08-10 | Abdallah David J | Process of imaging a photoresist with multiple antireflective coatings |
US7816071B2 (en) * | 2005-02-10 | 2010-10-19 | Az Electronic Materials Usa Corp. | Process of imaging a photoresist with multiple antireflective coatings |
US20070275330A1 (en) * | 2006-05-25 | 2007-11-29 | International Business Machines Corporation | Bottom anti-reflective coating |
US8455178B2 (en) * | 2006-09-26 | 2013-06-04 | Rohm And Haas Electronic Materials Llp | Coating compositions for photolithography |
US20080286689A1 (en) * | 2007-05-14 | 2008-11-20 | Hong Zhuang | Antireflective Coating Compositions |
US8017296B2 (en) * | 2007-05-22 | 2011-09-13 | Az Electronic Materials Usa Corp. | Antireflective coating composition comprising fused aromatic rings |
US20090035704A1 (en) * | 2007-08-03 | 2009-02-05 | Hong Zhuang | Underlayer Coating Composition Based on a Crosslinkable Polymer |
JP4993139B2 (ja) * | 2007-09-28 | 2012-08-08 | 信越化学工業株式会社 | 反射防止膜形成材料、反射防止膜及びこれを用いたパターン形成方法 |
EP2209839A1 (en) * | 2007-11-06 | 2010-07-28 | Braggone OY | Carbosilane polymer compositions for anti-reflective coatings |
US8039201B2 (en) * | 2007-11-21 | 2011-10-18 | Az Electronic Materials Usa Corp. | Antireflective coating composition and process thereof |
US8137874B2 (en) * | 2008-01-23 | 2012-03-20 | International Business Machines Corporation | Organic graded spin on BARC compositions for high NA lithography |
JP4918162B2 (ja) * | 2008-02-22 | 2012-04-18 | ブルーワー サイエンス アイ エヌ シー. | 193nmリソグラフィー用の二重層の感光性で現像液に可溶な底面反射防止塗膜 |
US7989144B2 (en) * | 2008-04-01 | 2011-08-02 | Az Electronic Materials Usa Corp | Antireflective coating composition |
US20090274974A1 (en) * | 2008-04-30 | 2009-11-05 | David Abdallah | Spin-on graded k silicon antireflective coating |
US7932018B2 (en) * | 2008-05-06 | 2011-04-26 | Az Electronic Materials Usa Corp. | Antireflective coating composition |
US8329387B2 (en) * | 2008-07-08 | 2012-12-11 | Az Electronic Materials Usa Corp. | Antireflective coating compositions |
US8221965B2 (en) * | 2008-07-08 | 2012-07-17 | Az Electronic Materials Usa Corp. | Antireflective coating compositions |
US20100092894A1 (en) * | 2008-10-14 | 2010-04-15 | Weihong Liu | Bottom Antireflective Coating Compositions |
US20100119979A1 (en) * | 2008-11-13 | 2010-05-13 | Rahman M Dalil | Antireflective Coating Composition Comprising Fused Aromatic Rings |
US20100119980A1 (en) * | 2008-11-13 | 2010-05-13 | Rahman M Dalil | Antireflective Coating Composition Comprising Fused Aromatic Rings |
US20100151392A1 (en) * | 2008-12-11 | 2010-06-17 | Rahman M Dalil | Antireflective coating compositions |
EP2216684B1 (en) * | 2009-02-08 | 2015-10-07 | Rohm and Haas Electronic Materials LLC | Method of forming a photoresist image comprising an undercoat layer |
NL2004297A (en) * | 2009-03-20 | 2010-09-21 | Asml Holding Nv | Improving alignment target contrast in a lithographic double patterning process. |
US20100316949A1 (en) * | 2009-06-10 | 2010-12-16 | Rahman M Dalil | Spin On Organic Antireflective Coating Composition Comprising Polymer with Fused Aromatic Rings |
US8486609B2 (en) * | 2009-12-23 | 2013-07-16 | Az Electronic Materials Usa Corp. | Antireflective coating composition and process thereof |
US8507192B2 (en) * | 2010-02-18 | 2013-08-13 | Az Electronic Materials Usa Corp. | Antireflective compositions and methods of using same |
JP6014110B2 (ja) | 2013-12-23 | 2016-10-25 | ダウ グローバル テクノロジーズ エルエルシー | ギャップ充填方法 |
US9324604B2 (en) * | 2014-07-04 | 2016-04-26 | Rohm And Haas Electronic Materials Llc | Gap-fill methods |
US20200133126A1 (en) * | 2018-10-31 | 2020-04-30 | Rohm And Haas Electronic Materials Korea Ltd. | Coating composition for forming resist underlayer film for euv lithography process |
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US460310A (en) | 1891-09-29 | Dry-dock | ||
US4370405A (en) | 1981-03-30 | 1983-01-25 | Hewlett-Packard Company | Multilayer photoresist process utilizing an absorbant dye |
US4362809A (en) | 1981-03-30 | 1982-12-07 | Hewlett-Packard Company | Multilayer photoresist process utilizing an absorbant dye |
US4442197A (en) | 1982-01-11 | 1984-04-10 | General Electric Company | Photocurable compositions |
US4491628A (en) | 1982-08-23 | 1985-01-01 | International Business Machines Corporation | Positive- and negative-working resist compositions with acid generating photoinitiator and polymer with acid labile groups pendant from polymer backbone |
US4910122A (en) | 1982-09-30 | 1990-03-20 | Brewer Science, Inc. | Anti-reflective coating |
ATE37242T1 (de) | 1984-02-10 | 1988-09-15 | Ciba Geigy Ag | Verfahren zur herstellung einer schutzschicht oder einer reliefabbildung. |
DK241885A (da) | 1984-06-01 | 1985-12-02 | Rohm & Haas | Fotosensible belaegningssammensaetninger, termisk stabile belaegninger fremstillet deraf og anvendelse af saadanne belaegninger til dannelse af termisk stabile polymerbilleder |
CA1307695C (en) | 1986-01-13 | 1992-09-22 | Wayne Edmund Feely | Photosensitive compounds and thermally stable and aqueous developablenegative images |
US4968581A (en) | 1986-02-24 | 1990-11-06 | Hoechst Celanese Corporation | High resolution photoresist of imide containing polymers |
US4810613A (en) | 1987-05-22 | 1989-03-07 | Hoechst Celanese Corporation | Blocked monomer and polymers therefrom for use as photoresists |
DE3721741A1 (de) | 1987-07-01 | 1989-01-12 | Basf Ag | Strahlungsempfindliches gemisch fuer lichtempfindliche beschichtungsmaterialien |
DE68928548T2 (de) | 1988-09-28 | 1998-04-23 | Brewer Science Inc | Multifunktionelle photolithographische zusammensetzungen |
US5128232A (en) | 1989-05-22 | 1992-07-07 | Shiply Company Inc. | Photoresist composition with copolymer binder having a major proportion of phenolic units and a minor proportion of non-aromatic cyclic alcoholic units |
US6472128B2 (en) | 1996-04-30 | 2002-10-29 | Shipley Company, L.L.C. | Antihalation compositions |
US6528235B2 (en) | 1991-11-15 | 2003-03-04 | Shipley Company, L.L.C. | Antihalation compositions |
US6165697A (en) | 1991-11-15 | 2000-12-26 | Shipley Company, L.L.C. | Antihalation compositions |
NZ242686A (en) | 1992-05-11 | 1994-12-22 | Carter Holt Harvey Plastic Pro | Milking claw divided into four chambers to reduce likelihood of cross contamination of animal's quarters |
EP0605089B1 (en) | 1992-11-03 | 1999-01-07 | International Business Machines Corporation | Photoresist composition |
US5344742A (en) | 1993-04-21 | 1994-09-06 | Shipley Company Inc. | Benzyl-substituted photoactive compounds and photoresist compositions comprising same |
US5879856A (en) | 1995-12-05 | 1999-03-09 | Shipley Company, L.L.C. | Chemically amplified positive photoresists |
US5843624A (en) | 1996-03-08 | 1998-12-01 | Lucent Technologies Inc. | Energy-sensitive resist material and a process for device fabrication using an energy-sensitive resist material |
US5861231A (en) | 1996-06-11 | 1999-01-19 | Shipley Company, L.L.C. | Copolymers and photoresist compositions comprising copolymer resin binder component |
US5886102A (en) | 1996-06-11 | 1999-03-23 | Shipley Company, L.L.C. | Antireflective coating compositions |
US6090526A (en) | 1996-09-13 | 2000-07-18 | Shipley Company, L.L.C. | Polymers and photoresist compositions |
KR100220951B1 (ko) | 1996-12-20 | 1999-09-15 | 김영환 | 비닐 4-테트라히드로피라닐옥시벤잘-비닐 4-히드록시벤잘-비닐 테트라히드로피라닐에테르-비닐 아세테이트 공중합체, 비닐 4-테트라히드로피라닐옥시벤잘-비닐 테트라히드로피라닐에테르-비닐 아세테이트 공중합체 및 그들의 제조방법 |
US5939236A (en) | 1997-02-07 | 1999-08-17 | Shipley Company, L.L.C. | Antireflective coating compositions comprising photoacid generators |
US5935760A (en) * | 1997-10-20 | 1999-08-10 | Brewer Science Inc. | Thermosetting polyester anti-reflective coatings for multilayer photoresist processes |
US6057083A (en) | 1997-11-04 | 2000-05-02 | Shipley Company, L.L.C. | Polymers and photoresist compositions |
US6190839B1 (en) | 1998-01-15 | 2001-02-20 | Shipley Company, L.L.C. | High conformality antireflective coating compositions |
US6165674A (en) | 1998-01-15 | 2000-12-26 | Shipley Company, L.L.C. | Polymers and photoresist compositions for short wavelength imaging |
TW457403B (en) * | 1998-07-03 | 2001-10-01 | Clariant Int Ltd | Composition for forming a radiation absorbing coating containing blocked isocyanate compound and anti-reflective coating formed therefrom |
US6136501A (en) | 1998-08-28 | 2000-10-24 | Shipley Company, L.L.C. | Polymers and photoresist compositions comprising same |
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IL141803A0 (en) | 1998-09-23 | 2002-03-10 | Du Pont | Photoresists, polymers and processes for microlithography |
KR20000047909A (ko) | 1998-12-10 | 2000-07-25 | 마티네즈 길러모 | 이타콘산 무수물 중합체 및 이를 함유하는 포토레지스트조성물 |
US6048662A (en) | 1998-12-15 | 2000-04-11 | Bruhnke; John D. | Antireflective coatings comprising poly(oxyalkylene) colorants |
US6251562B1 (en) * | 1998-12-23 | 2001-06-26 | International Business Machines Corporation | Antireflective polymer and method of use |
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US6048664A (en) | 1999-03-12 | 2000-04-11 | Lucent Technologies, Inc. | Energy-sensitive resist material and a process for device fabrication using an energy-sensitive resist material |
KR100574482B1 (ko) * | 1999-09-07 | 2006-04-27 | 주식회사 하이닉스반도체 | 유기 난반사 방지막용 조성물과 이의 제조방법 |
US6303260B1 (en) * | 2000-03-31 | 2001-10-16 | Microchem Corp. | Dissolution rate modifiers for lift-off resists |
US6306554B1 (en) | 2000-05-09 | 2001-10-23 | Shipley Company, L.L.C. | Polymers containing oxygen and sulfur alicyclic units and photoresist compositions comprising same |
US6415909B1 (en) | 2000-07-07 | 2002-07-09 | The Young Industries, Inc. | Apparatus for transporting bulk materials |
JP4772268B2 (ja) | 2000-09-19 | 2011-09-14 | ローム・アンド・ハース・エレクトロニック・マテリアルズ,エル.エル.シー. | 反射防止組成物 |
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JP3852107B2 (ja) * | 2000-11-14 | 2006-11-29 | Jsr株式会社 | 反射防止膜形成組成物 |
KR100772303B1 (ko) * | 2000-11-14 | 2007-11-02 | 제이에스알 가부시끼가이샤 | 반사방지막 형성 조성물 |
CN1257435C (zh) * | 2001-04-10 | 2006-05-24 | 日产化学工业株式会社 | 形成光刻用防反射膜的组合物 |
TW576859B (en) | 2001-05-11 | 2004-02-21 | Shipley Co Llc | Antireflective coating compositions |
TW591341B (en) | 2001-09-26 | 2004-06-11 | Shipley Co Llc | Coating compositions for use with an overcoated photoresist |
JP3852593B2 (ja) * | 2002-07-17 | 2006-11-29 | 日産化学工業株式会社 | 反射防止膜形成組成物 |
KR100510999B1 (ko) * | 2002-07-22 | 2005-08-31 | 주식회사 하이닉스반도체 | 반도체 소자의 패턴 형성 방법 |
JP4292910B2 (ja) * | 2002-07-31 | 2009-07-08 | Jsr株式会社 | アセナフチレン誘導体、重合体および反射防止膜形成組成物 |
TWI317365B (en) * | 2002-07-31 | 2009-11-21 | Jsr Corp | Acenaphthylene derivative, polymer, and antireflection film-forming composition |
US20040067437A1 (en) * | 2002-10-06 | 2004-04-08 | Shipley Company, L.L.C. | Coating compositions for use with an overcoated photoresist |
DE60330798D1 (de) * | 2002-10-09 | 2010-02-11 | Nissan Chemical Ind Ltd | Zusammensetzung zur bildung einer antireflexschicht für die lithographie |
US7038328B2 (en) * | 2002-10-15 | 2006-05-02 | Brewer Science Inc. | Anti-reflective compositions comprising triazine compounds |
KR100832247B1 (ko) * | 2002-11-27 | 2008-05-28 | 주식회사 동진쎄미켐 | 유기 난반사 방지막 조성물 및 이를 이용한 패턴 형성방법 |
JP4769455B2 (ja) * | 2003-12-30 | 2011-09-07 | ローム・アンド・ハース・エレクトロニック・マテリアルズ,エル.エル.シー. | コーティング組成物 |
-
2006
- 2006-02-02 EP EP06250564A patent/EP1691238A3/en not_active Withdrawn
- 2006-02-03 US US11/347,836 patent/US20060275696A1/en not_active Abandoned
- 2006-02-03 TW TW095103709A patent/TWI368823B/zh active
- 2006-02-05 CN CN200610073949XA patent/CN1828420B/zh active Active
- 2006-02-06 JP JP2006029047A patent/JP4954562B2/ja active Active
- 2006-02-06 KR KR1020060011316A patent/KR101362836B1/ko active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
EP1691238A3 (en) | 2009-01-21 |
EP1691238A2 (en) | 2006-08-16 |
KR101362836B1 (ko) | 2014-02-14 |
JP2006227614A (ja) | 2006-08-31 |
JP4954562B2 (ja) | 2012-06-20 |
TW200641533A (en) | 2006-12-01 |
US20060275696A1 (en) | 2006-12-07 |
KR20060089683A (ko) | 2006-08-09 |
CN1828420A (zh) | 2006-09-06 |
CN1828420B (zh) | 2010-07-21 |
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