TWI365161B - - Google Patents

Info

Publication number
TWI365161B
TWI365161B TW094137918A TW94137918A TWI365161B TW I365161 B TWI365161 B TW I365161B TW 094137918 A TW094137918 A TW 094137918A TW 94137918 A TW94137918 A TW 94137918A TW I365161 B TWI365161 B TW I365161B
Authority
TW
Taiwan
Application number
TW094137918A
Other languages
Chinese (zh)
Other versions
TW200624360A (en
Inventor
Seiichi Kaise
Noriyuki Iwabuchi
Shigeaki Kato
Hiroshi Nakamura
Takeshi Yokouchi
Mariko Shibata
Akira Obi
Original Assignee
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Ltd filed Critical Tokyo Electron Ltd
Publication of TW200624360A publication Critical patent/TW200624360A/zh
Application granted granted Critical
Publication of TWI365161B publication Critical patent/TWI365161B/zh

Links

Classifications

    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/30—Computing systems specially adapted for manufacturing
TW094137918A 2004-11-01 2005-10-28 Substrate treatment method, substrate treatment system, and substrate treatment program TW200624360A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004318451A JP5031186B2 (ja) 2004-11-01 2004-11-01 基板処理方法、基板処理システム及び基板処理プログラム

Publications (2)

Publication Number Publication Date
TW200624360A TW200624360A (en) 2006-07-16
TWI365161B true TWI365161B (ja) 2012-06-01

Family

ID=36722907

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094137918A TW200624360A (en) 2004-11-01 2005-10-28 Substrate treatment method, substrate treatment system, and substrate treatment program

Country Status (4)

Country Link
JP (1) JP5031186B2 (ja)
KR (1) KR100735935B1 (ja)
CN (1) CN1779906A (ja)
TW (1) TW200624360A (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI759942B (zh) * 2019-11-27 2022-04-01 日商日立全球先端科技股份有限公司 帶電粒子線裝置

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100790824B1 (ko) * 2006-05-30 2008-01-02 삼성전자주식회사 반도체 디바이스 제조설비에서의 웨이퍼 로딩 및 언로딩방법
US8113757B2 (en) 2006-08-01 2012-02-14 Tokyo Electron Limited Intermediate transfer chamber, substrate processing system, and exhaust method for the intermediate transfer chamber
JP4954728B2 (ja) * 2007-01-26 2012-06-20 東京エレクトロン株式会社 ゲートバルブの洗浄方法及び基板処理システム
KR101480738B1 (ko) 2007-04-27 2015-01-09 어플라이드 머티어리얼스, 인코포레이티드 환형 배플
JP5436763B2 (ja) * 2007-07-27 2014-03-05 東京エレクトロン株式会社 気密モジュール、及び該気密モジュールの排気方法
KR100851242B1 (ko) * 2008-03-27 2008-08-08 비전세미콘 주식회사 반도체용 플라즈마 세정장치
JP2010093125A (ja) * 2008-10-09 2010-04-22 Toray Eng Co Ltd 基板処理システムおよび基板処理方法
JP5295808B2 (ja) * 2009-02-09 2013-09-18 東京エレクトロン株式会社 パーティクル付着防止方法及び被処理基板の搬送方法
JP2011181631A (ja) * 2010-02-26 2011-09-15 Tokyo Electron Ltd 表面活性化方法、プログラム、コンピュータ記憶媒体及び表面活性化装置
CN102269940A (zh) * 2010-06-04 2011-12-07 中芯国际集成电路制造(上海)有限公司 一种光刻胶烘焙装置
CN103137412B (zh) * 2011-11-30 2016-09-28 中国科学院微电子研究所 模块化离子注入机控制系统
CN103996634A (zh) * 2013-02-19 2014-08-20 细美事有限公司 检测方法、包括该方法的基板处理方法及基板处理装置
TWI636518B (zh) 2013-04-23 2018-09-21 荏原製作所股份有限公司 基板處理裝置及處理基板之製造方法
JP6122684B2 (ja) * 2013-04-23 2017-04-26 株式会社荏原製作所 基板処理装置及び処理基板の製造方法
CN106611725B (zh) * 2015-10-26 2019-07-19 北京北方华创微电子装备有限公司 一种刻蚀设备及结束其自动任务的处理方法和处理装置
JP6704008B2 (ja) * 2018-03-26 2020-06-03 株式会社Ｋｏｋｕｓａｉ Ｅｌｅｃｔｒｉｃ 基板処理装置、半導体装置の製造方法および記録媒体
CN109192696B (zh) * 2018-08-10 2021-06-08 北京北方华创微电子装备有限公司 升降针系统、真空反应腔室以及半导体加工设备

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3174691B2 (ja) * 1994-08-25 2001-06-11 大日本スクリーン製造株式会社 基板交換装置
JPH11288996A (ja) * 1998-04-04 1999-10-19 Tokyo Electron Ltd 被処理体の搬送装置
JP2001319885A (ja) * 2000-03-02 2001-11-16 Hitachi Kokusai Electric Inc 基板処理装置及び半導体製造方法
JP2003077782A (ja) * 2001-08-31 2003-03-14 Toshiba Corp 半導体装置の製造方法
JP2003100605A (ja) * 2001-09-25 2003-04-04 Dainippon Screen Mfg Co Ltd 基板熱処理装置
JP2003347283A (ja) * 2002-05-30 2003-12-05 Tokyo Electron Ltd 真空処理装置
JP4454243B2 (ja) * 2003-03-31 2010-04-21 キヤノンアネルバ株式会社 基板温度調整装置および基板温度調整方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI759942B (zh) * 2019-11-27 2022-04-01 日商日立全球先端科技股份有限公司 帶電粒子線裝置

Also Published As

Publication number Publication date
TW200624360A (en) 2006-07-16
KR20060052347A (ko) 2006-05-19
JP5031186B2 (ja) 2012-09-19
JP2006128578A (ja) 2006-05-18
KR100735935B1 (ko) 2007-07-06
CN1779906A (zh) 2006-05-31

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