TWI364087B - Machining apparatus and semiconductor strip machining system using the same - Google Patents

Machining apparatus and semiconductor strip machining system using the same Download PDF

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Publication number
TWI364087B
TWI364087B TW096137734A TW96137734A TWI364087B TW I364087 B TWI364087 B TW I364087B TW 096137734 A TW096137734 A TW 096137734A TW 96137734 A TW96137734 A TW 96137734A TW I364087 B TWI364087 B TW I364087B
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TW
Taiwan
Prior art keywords
semiconductor
cutting
unit
unloading
feed
Prior art date
Application number
TW096137734A
Other languages
Chinese (zh)
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TW200822265A (en
Inventor
Ik Kyun Na
Hyun Gyun Jung
Woong Hwan Youn
Original Assignee
Hanmi Semiconductor Co Ltd
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Publication date
Priority claimed from KR1020060098091A external-priority patent/KR20080032413A/en
Priority claimed from KR1020060128282A external-priority patent/KR100814890B1/en
Application filed by Hanmi Semiconductor Co Ltd filed Critical Hanmi Semiconductor Co Ltd
Publication of TW200822265A publication Critical patent/TW200822265A/en
Application granted granted Critical
Publication of TWI364087B publication Critical patent/TWI364087B/en

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Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B28WORKING CEMENT, CLAY, OR STONE
    • B28DWORKING STONE OR STONE-LIKE MATERIALS
    • B28D1/00Working stone or stone-like materials, e.g. brick, concrete or glass, not provided for elsewhere; Machines, devices, tools therefor
    • B28D1/30Working stone or stone-like materials, e.g. brick, concrete or glass, not provided for elsewhere; Machines, devices, tools therefor to form contours, i.e. curved surfaces, irrespective of the method of working used
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/08Devices involving relative movement between laser beam and workpiece
    • B23K26/083Devices involving movement of the workpiece in at least one axial direction
    • B23K26/0853Devices involving movement of the workpiece in at least in two axial directions, e.g. in a plane
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/08Devices involving relative movement between laser beam and workpiece
    • B23K26/0869Devices involving movement of the laser head in at least one axial direction
    • B23K26/0876Devices involving movement of the laser head in at least one axial direction in at least two axial directions
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B28WORKING CEMENT, CLAY, OR STONE
    • B28DWORKING STONE OR STONE-LIKE MATERIALS
    • B28D1/00Working stone or stone-like materials, e.g. brick, concrete or glass, not provided for elsewhere; Machines, devices, tools therefor
    • B28D1/22Working stone or stone-like materials, e.g. brick, concrete or glass, not provided for elsewhere; Machines, devices, tools therefor by cutting, e.g. incising
    • B28D1/221Working stone or stone-like materials, e.g. brick, concrete or glass, not provided for elsewhere; Machines, devices, tools therefor by cutting, e.g. incising by thermic methods
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B28WORKING CEMENT, CLAY, OR STONE
    • B28DWORKING STONE OR STONE-LIKE MATERIALS
    • B28D5/00Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
    • B28D5/0058Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material
    • B28D5/0082Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material for supporting, holding, feeding, conveying or discharging work

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Mechanical Engineering (AREA)
  • Plasma & Fusion (AREA)
  • Mining & Mineral Resources (AREA)
  • Dicing (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Supply And Installment Of Electrical Components (AREA)

Description

1364087 九、發明說明: 【發明所屬之技術領域】 本發明係關於一種半導體加工設備,尤其係關於一種在半導 體切割處理中切割半導體帶使之成為獨立的半導體封裝之加工設 • 備以及使用該加工設備之半導體帶加工系統。 . 【先前技術】 通常情況下,半導體加工處理係包含加工(議)處理以及 裝配處理。在加工處理巾,胁—_晶之上料—積體電路, 錯以形成-半導體晶片。在裝配處理中,係在半導體晶片上附加 -引線_。在裝喊对,係财地執行轉纽或錫焊處理 以及造模處理’藉以形成-半導辭,其中,執行轉處理或錫 焊,理用以形成焊球,藉以將半導體晶片與引線框架電性連接, 造模處理係使用樹脂材料,例如環氧樹脂。 .該半導體帶透麵紐缝台上的—狀拾取妓往切判裝 而後被-旋轉刀片切割.成獨立之半導體封裝。為了執行上述 處理·,係配備有一半導體加工設備。 .然而習叫__做法仍贿有料雜,制是_ 列問題。#卜 , -. S- 在習知的半導體帶加工系統之中,切割裝置僅僅包含一刀 片。馨於這種原因,除了沿直線切割半導體帶以外,哈L曲後 對+導體觸赠。目此,f 1364087 不同的作業狀況。 而且’在習知技術中’當半導體帶沒有被置於夾盤台上理想 位置而被切割裝置切割時,會由於沒有可以自動校正帶偏移之^ 置而產生殘品。 • 【發明内容】 " #於以上所述之_,本發明之—目的在於提供-種加工設 嫌備以及?觀職加工設備之半導鮮加H該加工設備具 有可以、;行切割處理的切割裝詈。 ^--- -—----------- 本發明之另一目的在於提供一種加工設備以及一種使用該加 工议備之半導體帶加工祕,該加工設備係可對趋台上半導體 τ之位置進行檢測’紐據所檢酬之位置對切鄕置之位置進 行校正。 . . . 在本發明之一方面中,一加工設備係包含:一夹盤台單元, 鲁該夾盤台單元係包含一對夾盤台,此對夾盤台可在γ轴方向上單 ‘.:獨進行移動並同時可在X軸方向上移動;以及一切割單元,係用 以對固定於¥盤台上的工募分別進行加工。 在本發明面中,—加工設備係包含:―夾盤台單 兀’該錢*單元係包含四倾盤台,係可在γ财向上單獨進 行移動並同啊在X軸方向上移勢;以及兩個切割單元係用以 •對固定於第-及第三爽盤台或第二及第四夾盤台上之工件進行加: 1364087 該加工設備可進—步包含:—傳感單元該傳感單元係用以 ,取各工件之位置,並傳送該資訊至相關聯之切割單it,該傳感 早兀係包含-視頻獲取器(visicm),係用以獲取表示各工件位置 之資訊’以及-視頻獲取器軌道,係用以使上述視麵取器沿該 執道進行移動。 上述夹盤台單S可包含:夾盤台’係用以支樓半導體帶,一 第-饋送構件,祕在X軸方向上饋送趋台,以及—第二饋送 構件,用於在γ軸方向上饋送夾盤台 其中,各夾盤台均可旋轉360度。 上述炎盤台單元也可包含:夾盤台,係用以支標半導體帶, :垂直驅動器’係用以使該夾盤台垂直移動,以及—水平驅動器, 係用以使該夾盤台水平地移動。 在本發明之另一方面中,一半導體帶加工系統係包含:一裝 载。P ’係用以魏複數辨導體帶;—蝴部係包含上述加工設 備’-卸載部’侧以在對半導體帶加工完成之後接收所生成的 半導體封I.;.錢—饋送部,侧以拾取半導體帶或半導擊封裝, 並饋送至裝載部、切割部或卸載部。 在本發明之另一方面中,一半導體帶加工系統係包含:一第 —裝載部,躲接收複數個半導體帶;-包含社述力。工設備之 第-切割部;-第—卸載部,用於接收在第,切割部中加工完成 後之半導體帶;-饋送部,用於拾取半導體帶並饋送其至第一裝 载部、第一切割部、或望一 第一卸載部卸载之半導體册一第二裝載部,用於接收從 有半導體帶之旋轉台Γ二謂部’係包含一其上放置 成為半導體Μ . —蝴早_於加:L#導體帶使其 成為+導體封裝,一檢測 成之半導體封裝是否存在缺陷二==切Γ工完 , 弟一卸载部,用於接收經過檢 測晶測叙轉傳送 第二卸載部之晴4物。 卿帛卸键 ===_嫩爲繼。第二切割 丄阿進—步包含—傳感單元,用於獲取_半導體 _盤°上的位置之資訊。該第—蝴部可接收來自該傳 感早元之資訊,並鄕-切割部之切割私對半導體帶之加工位 置進行校準。 第二切割部係可包含:旋轉台,在該旋轉台上放置有半導體 帶,並且該旋轉台可在旋轉時在γ轴方向上進行移動;以及—刀 片’係可圍繞旋轉台在丫^方向上移動。 在本發明之又-方面中,—半導體帶加卫系統係包含:一裝 载部’係用以接收複數個半導體帶;上述之加工設備;一清洗♦ 燥和係用以清洗並紐半導體帶加卫域後所生紅半導體封 裝;一檢測部,用於檢測經過清洙與乾嫖後之半導體封裝是否存 在缺陷;-卸載部’用於接收完.成檢測之半導體封裝以及一讀. =部’用於拾取半導體帶或半導體封裝,並饋送所拾取之半導體 帶或半導體職至裝載部、加工設備、清洗/錢部、檢測部或卸 裁部。 該褒載部係可包含:-裝載盒,用於堆疊半導體帶;—傳送 裝置用於傳送裝載盒;—第一轉向執道,用於轉動透過傳送裝 置所饋送之半導體帶;以及—推進器,用於饋送裝載盒中所堆^ 之半_帶至第-轉向執道。該卸载部係可包含:—第二轉向二 用於魏並轉動經過切割且透過饋送部所饋送之半導體帶. =載盒·’祕堆疊經過切狀半導體帶;—傳送妓,用二傳 迗p載盒;以及一夾持器,用於傳送第_ 、 過切割的半導趙帶至卸載盒。轉向軌道上所堆4之經 【實施方式】 以下,將結合圖示部份對本發明之—種加 體帶加工系統的較佳實施例作詳細說明。X +導 圖該半導體帶加工系統之第一實施例之卿^ 以接收即㈣加工紅件,並裝_於⑻,係用 部—裝載後料二:工件於二載…-切割 台之外部;-崎m加工κ咖加工系統平 切割部以及卸裁部400、。M饋达裝栽後的工件至裝載部_、 1364087 上述裝載部100係包含複數個裝載盒102。各裝载盒1〇2中, 依照卡帶盒之形式紐需要進行加工之複數個轉體帶%。當 然,各裝載盒102中只能擺放一個半導體帶SS。 上述裝载部100同時包含一第一傳送裝置104’係用以逐一饋 达裝載盒102,該第一傳送裝置1〇4可以應用各種驅動系統,較佳 之狀況中,該第一傳送裝置辦可以應用帶式驅動系統。1364087 IX. INSTRUCTIONS OF THE INVENTION: TECHNICAL FIELD The present invention relates to a semiconductor processing apparatus, and more particularly to a processing apparatus for cutting a semiconductor strip into a semiconductor package in a semiconductor dicing process and using the same. Semiconductor strip processing system for equipment. [Prior Art] In general, semiconductor processing includes processing (assembly) processing and assembly processing. In the processing of the towel, the threat---the crystal is superimposed on the integrated circuit, and the semiconductor wafer is formed by mistake. In the assembly process, a - lead _ is attached to the semiconductor wafer. In the case of shouting, the implementation of the transfer or soldering process and the modeling process 'by forming a semi-introduction, in which the transfer process or soldering is performed to form a solder ball, thereby using the semiconductor wafer and the lead frame For electrical connection, the molding process uses a resin material such as an epoxy resin. The semiconductor strip-through surface is picked up and then cut by a rotating blade into a separate semiconductor package. In order to perform the above processing, a semiconductor processing apparatus is provided. However, the practice of __ is still a bribe, and the system is a problem. #卜 , -. S- In the conventional semiconductor tape processing system, the cutting device contains only one blade. For this reason, in addition to cutting the semiconductor strip along a straight line, the ha L is followed by a + conductor. For this reason, f 1364087 different operating conditions. Further, in the prior art, when the semiconductor tape is not cut at the desired position on the chuck table and is cut by the cutting device, the residue may be generated because there is no automatic correction of the tape offset. • [Description of the Invention] "# 于的_, the present invention - the purpose of providing - a processing design and? The semi-conducting fresh-processing H of the processing equipment has the cutting device that can be cut and processed. ^---------------- Another object of the present invention is to provide a processing apparatus and a semiconductor tape processing secret using the processing, the processing equipment can be on the stage The position of the semiconductor τ is detected. The position of the check is adjusted to correct the position of the cut. In one aspect of the invention, a processing apparatus includes: a chuck table unit, the chuck table unit includes a pair of chuck tables, and the pair of chuck tables can be single in the γ-axis direction .: Move alone and move in the X-axis direction at the same time; and a cutting unit for processing the repairs fixed on the ¥ platform. In the aspect of the invention, the processing equipment comprises: a "clip table unit", the money unit comprises a four-dip table, which can be moved separately in the gamma direction and moved in the X-axis direction; And two cutting units are used to: add to the workpieces fixed on the first and third tray tables or the second and fourth chuck tables: 1364087 The processing equipment can further include: - sensing unit The sensing unit is configured to take the position of each workpiece and transmit the information to the associated cutting list it. The sensing system includes a video capture device (visicm) for obtaining information indicating the position of each workpiece. The 'and-video acquirer track is used to move the viewfinder along the way. The above chuck table S may include: a chuck table 'for a branch semiconductor strip, a first-feed member, a feed platform in the X-axis direction, and a second feed member for the γ-axis direction In the upper feeding chuck table, each chuck table can be rotated 360 degrees. The above-mentioned flaming table unit may also include: a chuck table for supporting the semiconductor strip, a vertical drive 'for vertically moving the chuck table, and a horizontal driver for leveling the chuck table Move on the ground. In another aspect of the invention, a semiconductor tape processing system includes: a load. P ' is used to identify the conductor strips by Wei complex number; the butterfly system includes the above-mentioned processing equipment 'unloading section' side to receive the generated semiconductor package after processing the semiconductor strip is completed; The semiconductor tape or semi-conductive package is picked up and fed to the loading portion, the cutting portion or the unloading portion. In another aspect of the invention, a semiconductor tape processing system includes: a first loading portion that receives a plurality of semiconductor strips; - a social force. a first cutting portion of the equipment; a first unloading portion for receiving the semiconductor tape after the processing in the cutting portion is completed; a feeding portion for picking up the semiconductor tape and feeding it to the first loading portion, a cutting portion, or a second loading portion of the semiconductor unloading portion unloading the first unloading portion for receiving the rotating portion from the semiconductor strip, the second portion is included in the semiconductor device, and is placed thereon as a semiconductor wafer. Yu Jia: L# conductor strip makes it a +-conductor package, whether a semiconductor package is detected as defective or not. == Cut-to-cut, the unloading part is used to receive the second unloading part after the detection and measurement. Clear 4 things. Qing 帛 unloading key ===_ tender for succession. The second cut 丄阿进-step includes a sensing unit for obtaining information on the position on the _semiconductor_disk. The first butterfly portion receives information from the sensor early, and the cutting portion of the 鄕-cutting portion calibrates the processing position of the semiconductor ribbon. The second cutting portion may include: a rotating table on which the semiconductor strip is placed, and the rotating table is movable in the γ-axis direction while rotating; and the - blade' is rotatable around the rotating table Move on. In still another aspect of the present invention, a semiconductor tape fastening system includes: a loading portion for receiving a plurality of semiconductor tapes; the above processing device; a cleaning and drying system for cleaning the New Semiconductor tape A semiconductor package produced after the addition of the domain; a detection unit for detecting the presence or absence of defects in the semiconductor package after cleaning and drying; - the unloading portion is used for receiving the semiconductor package for inspection and reading. ' is used to pick up a semiconductor tape or semiconductor package and feed the picked semiconductor tape or semiconductor to the loading unit, processing equipment, cleaning/money, inspection or unloading. The load carrying portion may include: - a loading cassette for stacking the semiconductor strips; - a transfer device for transporting the loading cassette; - a first steering lane for rotating the semiconductor strip fed through the transport device; and - a pusher Used to feed the half of the stack in the load box to the first-to-steer way. The unloading portion may include: - a second steering two for Wei and rotating the semiconductor strip that is cut and fed through the feeding portion. = Carrier - 'Secret stacking through the cut semiconductor strip; - Transfer 妓, using two pass 迗a p-cartridge; and a holder for conveying the _, over-cut semi-guided belt to the unloading box. BACKGROUND OF THE INVENTION Hereinafter, preferred embodiments of the additive belt processing system of the present invention will be described in detail with reference to the drawings. X + map The first embodiment of the semiconductor tape processing system is to receive (4) processed red parts, and is loaded with _ (8), the system part - loading the second material: the workpiece is on the second load ... - outside the cutting table ;-Saki m processing κ coffee processing system flat cutting part and unloading part 400. M Feeds the loaded workpiece to the loading unit _, 1364087 The loading unit 100 includes a plurality of loading cassettes 102. In each of the loading boxes 1 to 2, a plurality of swivel belts which are processed in accordance with the form of the cassettes are required. Of course, only one semiconductor strip SS can be placed in each of the loading cassettes 102. The loading unit 100 includes a first conveying device 104 ′ for feeding the loading box 102 one by one. The first conveying device 1-4 can apply various driving systems. In a preferred situation, the first conveying device can Apply a belt drive system.

在第一傳送震置104之一端設置一裝載器1〇5。該裝載器包含 -推進器鄕。該推進器廳係用以透過在一端推進半導體帶. 從而逐-地移動經由第―傳送裝置1G4送來的裝載盒⑽中所擺 放之半導體帶SS,並使得半導體帶ss逐—地安置於第一轉向軌 道112上,下文將對第一轉向軌道112加以詳述。 裝載器105還包含一第一失持_ no。該第-失持器110設置 於裝載盒102之-端,以使其正對上述推進器1〇6。因此,當推進 器106朝向第一轉向軌道112推進半導體帶ss之一邊時第一 爽獲得並学引,ss之另一邊’從而能夠綠地饋 达半導體帶SS。 裝載器105還包含一第一轉向執道112。該第一轉向執道⑴ 設置於上述推進器1G6與第-失持器11G間之移動路徑中。該第 一轉向軌道m包含-對可進行·度轉向。該第—轉向軌道⑴ 之上可放置料_ ss並似轉向,躺改變铸鱗%之移 動方向。 1364087 設置饋送部200,使其與震載部1〇〇之間呈正交。饋送部2〇〇 係用以饋送半導體帶SS自裝載部1〇〇至卸载部棚。該饋送部· 係包含-饋送軌道2〇2。在饋送軌道2〇2上配置第一拾取器洲 以及第二拾取器206,使得二者可沿饋送執道2〇2進行移動。 * 為了改變第—轉*執道η2上處於m定狀ϋ之半導體 '帶SS之移動方向,第一拾取器204以及第二拾取!| 206是可轉動 的。 較佳地’於饋送軌道202上,鄰近於裝載部1〇〇之處配置該 第一拾取H 204。在此種狀況中,第一拾取器2〇4可輕易地拾取一 半導體帶ss並饋送該半導體帶ss至鐘台3()4,後文將對夹盤 台304進行描述。 較佳地,於饋送軌道202上,鄰近於卸載部400之處配置該 第二拾取H 206。在此種狀況中,第二拾輔2〇6可輕易地拾取一 _ 半導體帶SS並饋送該半導體帶ss至卸載部4〇〇。 用於加工半導體y SS之切割部3〇〇被設置於饋送軌道2 心部分之下方。\ 、卞刀割部·3〇0係包含夾盤台單元3〇2,該爽盤台單元如可在X 、Υ方向上做水平移動。將要進行加工之一個或多個半導體帶 被Q定於夾盤.σ單疋302之上奉面上。該切割部釋還包含一 .〜】單疋320.其用於在半導體帶SS上之-點對一條半導體帶進 或u半^tSS上之—直線或曲顧-條半導體帶 ♦ - · ' · . 12 J〇4〇87 進灯加工。該切割單元320能夠對其自身之x轴、Y轴以及Θ角 之位置進行校正。該切_ 進—步包含—賴單元33〇,係用 以獲取將被加工之半導體帶ss錢之資減發送侧所得之位 置資訊至切割單元320 ’以使切割單元32G之加工位置得以校正。 *依照上述結構,該切割部構成了-半導體封裝加工裝置。 - 誠然’該半導體封震加讀置可作為-工件加裝置而非用 %於半導體帶SS之加工裝置。例如’該半導體封裝加工裝置可用於 在工件上形成某種標記。 如「第1圖」所示出,炎盤台單元302係包含夹盤台3〇4,各 爽盤台304跡在-半導體冑ss之下對其進行支稽,以及,一夹 盤台饋送器310用以對夾盤台3〇4進行饋送。 ,在透過切割單元32〇進行加工作業時,各夹盤台3〇4用於在 一半導體帶SS之下對其進行支撐。下文將對切割單丨32〇進行之 • 加工作業加以詳述。本領域之技術人員應當意識到該夹盤台3〇4 可具有任意結構。A loader 1〇5 is disposed at one end of the first transfer shock 104. The loader contains - a propeller. The pusher chamber is configured to move the semiconductor strips placed in the loading cassette (10) sent through the first conveying device 1G4 one by one by pushing the semiconductor strips at one end, and to place the semiconductor strips ss one by one. On the first steering track 112, the first steering track 112 will be described in detail below. The loader 105 also includes a first drop _ no. The first-disarming device 110 is disposed at the end of the loading case 102 so as to be opposed to the above-described pusher 1〇6. Therefore, when the propeller 106 advances one side of the semiconductor strip ss toward the first steering track 112, the first side is obtained and learned, and the other side of the ss is capable of greenly feeding the semiconductor strip SS. The loader 105 also includes a first steering lane 112. The first steering lane (1) is disposed in a moving path between the thruster 1G6 and the first-disarming device 11G. The first steering track m includes a pair of steerable degrees. On the first steering track (1), the material _ ss can be placed and turned like a turn, and the moving direction of the casting scale % is changed. 1364087 The feeding portion 200 is disposed so as to be orthogonal to the seismic loading portion 1A. The feeding portion 2 is used to feed the semiconductor tape SS from the loading portion 1 to the unloading portion shed. The feed portion includes a feed track 2〇2. The first picker continent and the second picker 206 are disposed on the feed track 2〇2 such that they can be moved along the feed lane 2〇2. * In order to change the direction of the semiconductor in the m-shaped state on the first-turn* ruling η2, the first picker 204 and the second pick-up! | 206 is rotatable. Preferably, the first pick H 204 is disposed on the feed track 202 adjacent to the loading portion 1〇〇. In this case, the first pickup 2〇4 can easily pick up a semiconductor tape ss and feed the semiconductor tape ss to the clock stage 3() 4, which will be described later. Preferably, the second pick H 206 is disposed on the feed track 202 adjacent to the unloading portion 400. In this case, the second pick-up 2 〇 6 can easily pick up a _ semiconductor strip SS and feed the semiconductor strip ss to the unloading portion 4 〇〇. A cutting portion 3 for processing the semiconductor y SS is disposed below the core portion of the feed track 2. \ , 卞 割 · 〇 〇 〇 〇 〇 〇 〇 〇 系 〇 系 系 系 系 系 夹 夹 夹 夹 夹 夹 夹 夹 夹 夹 夹 夹 夹 夹 夹 夹 夹 夹 夹 夹One or more semiconductor strips to be processed are placed on the face of the chuck. The cutting portion is further provided with a single 疋 320. It is used for a semiconductor on the semiconductor strip SS to a semiconductor or u half ^ tSS - a straight line or a track-strip semiconductor strip ♦ - · ' · . 12 J〇4〇87 Into the lamp processing. The cutting unit 320 is capable of correcting the position of its own x-axis, Y-axis, and corner. The cutting-in step-by-step unit 33 is used to obtain the position information obtained by subtracting the amount of the semiconductor tape ss to be processed from the transmitting side to the cutting unit 320' to correct the processing position of the cutting unit 32G. * According to the above configuration, the cutting portion constitutes a semiconductor package processing apparatus. - It is true that the semiconductor sealing and reading can be used as a workpiece-adding device instead of a processing device of the semiconductor strip SS. For example, the semiconductor package processing apparatus can be used to form a certain mark on a workpiece. As shown in "Fig. 1", the stencil table unit 302 includes a chuck table 3〇4, and each of the slab stations 304 is sagged under the semiconductor sss, and a chuck table feed The device 310 is used to feed the chuck table 3〇4. When performing the machining operation through the cutting unit 32, each of the chuck stages 3〇4 is used to support it under a semiconductor tape SS. The machining operations performed on the cutting unit 32丨 are detailed below. Those skilled in the art will appreciate that the chuck table 3〇4 can have any configuration.

-. 夾盤台饋送器31(M系包含:一第一饋送構件312,係用以在X 軸方向饋送夾盤台3似;以及一第二饋送構件314,係用以在¥軸 方向饋送夾盤台304。 配置第二饋送構件314與饋送執道·2〇2呈正交。該第二饋送 構件314用於在γ軸方向上饋送央盤台3〇4,且只要該構件可移 動夹盤台304 ’則其可具有任意構造。該第二饋送構件314可包含 - . · · 1364087 呈平仃配置之若干饋送構件。在本實施例中,第二饋送構件糾 包含四個饋送構件,即,〜鮮二饋送構件仙,二號第二饋 送構件314b ’二號第二饋送構件314e以及_四號第二饋送構件 在此it況下’第二饋送構件314可配置包含於其内部的— 螺絲以及-螺栓,以便構成第二饋送構件314之全部饋送構件可 配置第一饋送構件312與第二饋送構件314呈正交。該第一 饋送構件犯用於在X轴方向饋送第二饋議構件叫。透過第一 饋达構件312 ’構成第二饋送構件3M之各饋送構件可同時活動。 切割單元320配置於第二饋送構件314之一側,並位於第二 饋送構件3M之上。該切割單元32〇用於對位於 上的半導體帶ss進行加工。 σ υ4之 就該切割單元320.而言,可應用各種切割裝置。在「第】圖 所示出之實施例中,該切割單元32q包含—娜膚置。同樣 如「第施例,該切割單元細可包含一刀^ c .上述雷射切割裝置包含-安裝於雷射切割器尖端之頭部(附 圖中未示出)。該頭部魏置成可於透過包含於該雷射切割裝置 之控制器對該頭部之χΙγ軸以及Μ位置進行控制之條件下 進行移動。該細_置_以對「第9圖」.中鮮之半 帶SS進行加工,該加工可如「第糊」至「第12'圖」中所示沿 者辟線及直線進仃。當然,該雷射切魏置可對半導體㈣進行 1364087 切割以使之成為獨立的半導體封裝sp。 各種切割裝置皆可用於上述操作。故而,「第丨圖」中示出之 切割單元320包含兩個切割單元,即,一第一切割單元迦,以 及一第二切割單元320b。 設置第-_單元迦與_第二蝴單元现 構件3U之上。如「第!圖」中所示出,第一切割單元伽與一 弟二切割單元320b分舰置於二號第二麟構件咖盘四號第 ,饋送構件遍之上,誠然,第__單元现與第二切割單 几320b也可以分別設置於—號第二饋送構件咖與三號第二饋 送構件314c之上。 在第二饋送構件314上之—側設置一傳感單元33〇。 該傳感單元330包含一視頻獲取器332,該視頻獲取器332 用以對安裝於夾盤台綱上之半導體帶SS之位置進行檢測,其 中該夹盤口 3〇4與第一饋送構件相連接。該視頻獲取器说 並魏騎_植置資訊至雷 射切割裝置之控制器(附圖中未示出),進而在光束發射方向上對. 雷射切割裝置之頭部進行調節。 於切割部下方切割單元320之所在位置設置一廢料盒 350。透過廢料之重力,該廢料盒35〇被作為加工作業期間所^ 廢料之排放通道。 於第,饋送構件314之上設置一視頻獲取器軌道334,該視頻. 15 15/ 獲取器轨道334正交於第二饋送構件3H.且平行於第—饋送構件 312。並且’視頻獲取器332可沿視頻觀器轨道334進行移動。 於饋送部2〇〇上與裝载部1〇〇之相對端設置卸載部伽。該却 載糊〇包含複數個#载盒402。於各却載盒4〇2中擺放經加工 後之半導體f SS。當然各卸載盒4〇2中只可擺放一個半導體帶%。 卸載部400進一步包含一第二傳送裝置4〇4,用以逐個饋送各 7盒他,該第二傳送裝置撕可應用各種驅動系統,較佳地, 第-傳运裝置4G4可應用—帶式驅動系統。 於第二傳送裝置姻之一端設置一卸載器。該卸载器包含一 太-轉向軌道412,該軌道設置於第二拾取器移動軌道之下 第一轉向執it 412包含-對可做36〇度旋轉之軌道。第二轉 '執道412上可放置半導體帶%,並且概道制賤轉半導體 帶SS以改變其運動方向。 對位卸載器410進—步包含以第二夾持器414。該第二夾持器4] 4丨·導體帶ss 一端進行拾取,並饋送1 至卸載器41〇之卸載盒4〇2之一姻。, 八配置卸胁彻之目的在於:當切敢成’即半導體帶%系 、為獨立半導體封裝時,該卸載器彻拾取上述獨立半導體封岁 並饋送該獨轉導體封裝鱗載部·。 、 • 、下依據上述本發a月第一較佳實施例之半導體帶加工 統,對其環行方式加以詳述。 ’、 ^〇4U87 如「第2圖」中所示出,當於卸載盒4()2中安裝- a chuck table feeder 31 (M system includes: a first feeding member 312 for feeding the chuck table 3 in the X-axis direction; and a second feeding member 314 for feeding in the ¥ axis direction The chuck table 304. The second feeding member 314 is disposed to be orthogonal to the feeding lane 2〇2. The second feeding member 314 is for feeding the center disk table 3〇4 in the γ-axis direction, and as long as the member is movable The chuck table 304' may have any configuration. The second feed member 314 may comprise a number of feed members in a flat configuration. In the present embodiment, the second feed member is adapted to include four feed members. , that is, the fresh feed member, the second feed member 314b, the second feed member 314e, and the second feed member, the second feed member 314, in which the second feed member 314 is configurable The screws and the bolts so that all of the feed members constituting the second feed member 314 are configurable. The first feed member 312 is orthogonal to the second feed member 314. The first feed member is operative to feed the second in the X-axis direction The feedback component is called. Through the first feed member 312 ' Each of the feeding members of the second feeding member 3M can be simultaneously moved. The cutting unit 320 is disposed on one side of the second feeding member 314 and located above the second feeding member 3M. The cutting unit 32 is used for the semiconductor located above The processing is performed with ss. σ υ4 In terms of the cutting unit 320., various cutting devices can be applied. In the embodiment shown in the "Fig.", the cutting unit 32q includes -Na skin setting. For example, the cutting unit may comprise a knife. The laser cutting device comprises: a head mounted on the tip of the laser cutter (not shown in the drawing). The head is disposed to be transparently included The controller of the laser cutting device moves under the condition that the χΙ γ axis and the Μ position of the head are controlled. The _ _ is processed by the semi-band SS in the "9th picture". It can be cut along the line and straight line as shown in the "No." to "Twelfth" figure. Of course, the laser cut can be used to cut the semiconductor (4) into 1364087 to make it a separate semiconductor package sp. Various cutting devices can be used for the above operations. Moreover, the cutting unit 320 shown in the "figure map" includes two cutting units, that is, a first cutting unit, and a second cutting unit 320b. Setting the first--unit and the second unit Above the member 3U. As shown in the "Graphic!" diagram, the first cutting unit gamma and the second brother cutting unit 320b are placed on the second ninth member coffee tray No. 4, and the feeding member is over. It is true that the first __ unit and the second dicing table 320b may also be respectively disposed on the second feeding member coffee and the third feeding member 314c. The first feeding member 314 is disposed on the side of the second feeding member 314. The sensing unit 330 includes a video acquirer 332 for detecting the position of the semiconductor strip SS mounted on the chuck table, wherein the chuck port 3〇4 The first feed members are connected. The video acquirer states and controls the information to the controller of the laser cutting device (not shown in the drawing) to adjust the head of the laser cutting device in the direction of beam emission. A waste box 350 is disposed at a position where the cutting unit 320 is below the cutting portion. Through the gravity of the waste, the waste box 35 is used as a discharge passage for the waste during the processing operation. In the first, a video capturer track 334 is disposed above the feed member 314. The video 15 15/acquisition track 334 is orthogonal to the second feed member 3H. and parallel to the first feed member 312. And ' video acquirer 332 can move along video viewer track 334. An unloading portion gamma is provided on the opposite end of the feeding portion 2A from the loading portion 1A. The load contains a plurality of #载箱402. The processed semiconductor f SS is placed in each of the cassettes 4〇2. Of course, only one semiconductor ribbon % can be placed in each of the unloading boxes 4〇2. The unloading portion 400 further includes a second conveying device 4〇4 for feeding each of the seven boxes one by one, the second conveying device tearing can apply various driving systems, preferably, the first conveying device 4G4 is applicable-belt type Drive System. An unloader is disposed at one end of the second transmitting device. The unloader includes a to-steer track 412 disposed below the second picker moving track. The first steering handle 412 includes a pair of tracks that can be rotated 36 degrees. The second turn 'the semiconductor tape % can be placed on the trajectory 412, and the semiconductor tape SS is rotated to change its moving direction. The registration unloader 410 further includes a second holder 414. The second holder 4] 4 丨 · one end of the conductor strip ss is picked up, and fed 1 to one of the unloading boxes 4 〇 2 of the unloader 41 。. The purpose of the eight-way configuration is to remove the independent semiconductor package and feed the single-conductor package scale carrier when the semiconductor tape is used as an independent semiconductor package. The method of semiconductor ring processing according to the first preferred embodiment of the present invention is described in detail below. ', ^〇4U87 as shown in "Figure 2", when installed in the unloading box 4 () 2

SS時,第一楷、.,壯取冰 卞守菔T 傳运裝置傳送卸載盒402至推進器1〇6。 當該卸載盒402與該推進器1〇6之運動方向一致時該推進 器挪開始運行。隨著推進器1〇6運行半導體帶沾被送^ * 轉向軌道112。 田該半^體帶SS移向第一轉向執道112時,第一失持器n〇 鲁拾取半導體帶SS上與推進器106相對之一端,並向第一轉向執道 112推進上述半導體帶SS。由此,透過推進器1G6與第—夾持器 110之合作,半導體帶SS被安裝於第-轉向軌道112之上。 半導體帶ss被安裝於第一轉向執道112之上以後,第一轉向 軌道112轉動丰導體帶ss以使之與夾盤纟3〇4裝置對準,如「第 3圖」中所示出。如此便使得半導體帶ss被安裝於一個夾盤台 之上。 . 當上述第一轉向軌道112轉動時,第一拾取器2〇4沿饋送執 ' 安放於一個夾盤台304上之半導體帶ss。. 隨後’:第一拾取器204將ΐ導體帶SS安裝於夾盤台3〇4之上,其 中’爽盤台304位於一號第二饋送構件3i4b或四號第二饋送構件 3l4d之上。而後’第一拾取器204以相同方式將另一半導韻帶ss 安裝於夾盤台304之上。當然,第一拾取器2〇4將半導體帶双安 裝在位於一號第二饋送構件;314a或三^第二饋送構件314c上的 夾盤台304之上。當第一拾取器2〇4將半導體帶ss安裝於分別與 17 1364087 一號第二饋送構件314b和四號第二饋送構件314d相耦合夾盤台 304之上時’夾盤台304沿第二饋送構件314之相關饋送饋送構件 沿Y軸運動。 虽夾盤台304沿第二饋送構件314沿γ軸方向運動時,二者 .經過傳感單元330。此時’傳感單元330之視頻獲取器332獲取關 ’於半導體τρ* SS位於運動巾每―缝台上位置之資訊,並將該資訊 送往切割單元320之控制器。 該位置資訊係透過傳感單元33〇之視頻獲取器332對半導體 π S上某位置上特定標記之位置進行檢測而獲取。基於上述位置 資訊’可以敕轉體帶SS之位置。 在接收到上述資訊後,控制器基於該資訊對切割單元320頭 Ρ之位置進行校準^在此種狀況中,如「第4圖」中所示出,由 於構成切割單几之第一切割單元η加與第二切割單元幻此分別 鲁 ;號罕一饋送構件3丨处與四號第二饋送構件3丨如之上,傳 .,感單巧33么$卜號第二饋送構件314b以及四號第二饋送構件 、. 裝半導體帶%之位置進行檢測。 同時,「想 .第5圖」中所示出,在對位於二號第二饋送構件 314b與四號第二饋送才冓件31如上之半導體帶SS進行加工時,在 號第一饋送構件314a與三號第二饋送構件3Mc之上安裝半導 .體帶SS。 " 之後,如「第6圖」中所示出,一號第二饋送構件314a與三 據第饋送構件314c上的央盤台向傳感單元33〇之視頻獲取器執 痘334下方之區域運動。由此’視頻獲取器说檢測到一號第二 孩送構件3Ua與三號第二饋送構件黯上夹盤台3〇4上所震載 半導體f SS之位f ’從而對切割單元之位f進行校準。 當對於二號第二饋送構件314b與四號第二饋送構件314d上 央盤口 3〇4上所輯半導體帶ss之加工完成後,透過第一饋送構 件3i2,構成第二饋送構件314之所有饋送構件向χ轴方向運動。 這使得-鮮二觀娜314a與三絲二饋麟件咖上之夹 盤台304分別被置於構成切割單元32()的第一切割單元邀與第 二切割單元320b之下。 、 由此’可以完成對於夹盤台3〇4上半導體帶ss之切割。在完 成對半導體▼ SS之切割後’透過夾盤台饋送器,夾盤台如* 被送回其初始位置。 田王部夾盤纟304被送回其初始位置後。第二拾取器2〇6運 隨後’該第二拾取器206逐-拾取半 導體帶SS並在第—轉向執道上安裝所拾取之半導體帶%。 此^·如第8圖」中所示出,為了透過第二拾取器對 半導體帶ss進行拾取,第二轉向軌道412纽_狀態從而與央 盤台304平行。 當半導體帶SS被安裝於第二轉向軌道412上時,.第二夾持器 414對半導體帶:SS進行拾取,並移動所拾取之半導體帶凫之卸 1364087 载部働之卸載盒402的一邊。當半導體帶%被安裝於卸載各 402上時.第二傳送裝置·使傳送器傳送半導體㈣至下―; 段。至此,加工過程完畢。 誠然,當在切割部中完成加工之半導體帶ss之形式 導體封裝形錢,卸⑽、統可以設料在社半物職证 中執行半導體帶SS之卸載。 下面’對本半導體帶加工系統之第二實施例進行描述。如「第 u圖」相示出’辭導鮮_包含:第—裝載部麵,係用 以接收複數辦導體帶ss,以及—第—蝴部扇。該第一切巧 部3000包含一夾盤台單元3002,該夾盤台單元3002包含夾盤台 3〇04,在該錢台綱上,半導體帶%被逐個地安裝。夹盤台 3004可向X軸與γ麵個方向運動。第一切割部綱還包含^ -第-切割裝置’係用以對夾盤台·4上之半導體帶ss進行曲 線和直線部分之加工。所述半導體帶加工系統還包含:一第一卸 鱗_;S中完成加工之半導體.帶 SS以及第饋送部2000,係用以逐一才合取半導體帶ss'並逐 -饋送所拾取之半導體帶SS至第—切割部.3_或第一卸载部 4000。該半導體帶加工系統進一步包含:一第二裝載部_,係 用以從第1卿_。紐職㈣之铸歸ss。―第二切 割部32〇0 ’該第一切割部32〇〇包含一旋轉台幻26,半導體帶ss 將被逐-地安裝於上述旋轉台3226之上,所述旋轉台3226可在 20 X轴方向上縣’·―第:切繼’物m細為可在x軸 方向上運動以逐—地加卫半導體帶使其成為獨立的半導體封裝 SP; 一檢測n ,制以制第二切_遍中加工好的半 導體封la#她自;—帛二__部5_,_讀收在檢查 檢測器麵巾經過檢測的半導體封裳sp;以及,—傳送器遍, 係用以在第4_與第二裝載部聰之賴送半導體帶 SS。 該第一裝餅1_於··魏㈣__盒臓。在每個第 -裝載盒中’可以放置複數個半導體帶ss。當然,一個半導體帶 SS只能放置於一個第一裴載盒1〇〇2中。 第-裝载部麵還包含:一第一傳送裝置腦,係用以逐一 地饋送第-裝餘膽。該第—傳送裝置麵可以使用各種驅動 系統。較佳地,第-傳送裝置_使用—帶式驅動系統。In the case of SS, the first 楷, ., 壮 冰 卞 卞 菔 T transport device transmits the unloading box 402 to the propeller 1 〇 6. When the unloading box 402 coincides with the direction of movement of the pusher 1〇6, the propeller moves to start operation. As the pusher 1〇6 runs, the semiconductor strip is fed to the steering track 112. When the semiconductor device SS moves to the first steering lane 112, the first missing device n〇u picks up one end of the semiconductor strip SS opposite to the pusher 106, and advances the semiconductor strip to the first steering lane 112. SS. Thereby, the semiconductor tape SS is mounted on the first-steering track 112 by the cooperation of the pusher 1G6 and the first gripper 110. After the semiconductor strip ss is mounted on the first steering lane 112, the first steering track 112 rotates the conductor strip ss to align it with the chuck 纟3〇4 device, as shown in "Fig. 3" . This causes the semiconductor strip ss to be mounted on a chuck table. When the first steering track 112 is rotated, the first picker 2〇4 is placed along the feed to the semiconductor strip ss on a chuck table 304. Subsequently: the first picker 204 mounts the tantalum ribbon SS over the chuck table 3〇4, wherein the 'spindle stage 304 is located above the first feed member 3i4b or the fourth feed member 3414d. Then, the first picker 204 mounts the other semi-conducting band ss on the chuck table 304 in the same manner. Of course, the first picker 2 〇 4 mounts the semiconductor tape on the chuck table 304 on the first feed member 314a or the second feed member 314c. When the first picker 2〇4 mounts the semiconductor strip ss on the chuck table 304 coupled with the 17 1364087 first feed member 314b and the fourth feed member 314d, respectively, the chuck chamber 304 is along the second The associated feed feed member of the feed member 314 moves along the Y axis. While the chuck table 304 is moved along the second feed member 314 in the γ-axis direction, both pass through the sensing unit 330. At this time, the video acquirer 332 of the sensing unit 330 acquires information on the position where the semiconductor τρ* SS is located on each of the sewing sheets, and sends the information to the controller of the cutting unit 320. The position information is acquired by the video acquirer 332 of the sensing unit 33 detecting the position of a specific mark at a position on the semiconductor π S . Based on the above position information ', the position of the body with the SS can be swiveled. After receiving the above information, the controller calibrates the position of the head of the cutting unit 320 based on the information. In this case, as shown in "Fig. 4", the first cutting unit constituting the cutting table The η plus and the second cutting unit are respectively singularly identical; the first feeding member 3 丨 and the fourth feeding member 3 are, for example, transmitted, and the second feeding member 314b is The position of the second feeding member No. 4 and the semiconductor tape is detected. Meanwhile, as shown in "Thinking FIG. 5", when the semiconductor tape SS located above the second feeding member 314b and the second feeding member 31 is processed, the first feeding member 314a is numbered. A semiconductive body band SS is mounted over the third feed member 3Mc. " Thereafter, as shown in the "figure 6", the area under the first and second feeding members 314a and 314c of the third feeding member 314c is opposite to the video receiver of the sensing unit 33. motion. Thus, the 'video acquirer' detects that the second child carrying member 3Ua and the third feeding member No. 3 are placed on the chuck table 3〇4 and the position f′ of the semiconductor f SS is shocked so that the bit of the cutting unit is f Perform calibration. When the processing of the semiconductor strip ss on the upper second port member 314b and the fourth number second feed member 314d on the upper plate opening 3〇4 is completed, all of the second feeding members 314 are formed through the first feeding member 3i2. The feeding member moves in the direction of the x-axis. This causes the chuck table 304 of the squirrel 314a and the three-wire two-feeder to be placed under the first cutting unit and the second cutting unit 320b constituting the cutting unit 32(), respectively. Thus, the cutting of the semiconductor strip ss on the chuck table 3〇4 can be completed. After the cutting of the semiconductor ▼ SS is completed, the chuck table is returned to its original position by the chuck table feeder. After the Tianwang Department chuck 纟 304 was returned to its original position. The second picker 2 〇 then the second picker 206 picks up the semiconductor strip SS and mounts the picked semiconductor strip % on the first steering lane. As shown in Fig. 8, in order to pick up the semiconductor strip ss through the second pickup, the second steering track 412 is in a state of being parallel with the central table 304. When the semiconductor strip SS is mounted on the second steering track 412, the second gripper 414 picks up the semiconductor strip: SS and moves one side of the unloading box 402 of the unloaded 1364084 of the picked-up semiconductor strip . When the semiconductor strip % is mounted on the unloading unit 402, the second transfer device causes the transmitter to transfer the semiconductor (four) to the lower portion; At this point, the processing is complete. It is true that when the semiconductor strip ss is processed in the cutting section, the conductor package is shaped, and the unloading (10) can be performed in the semi-material certificate of the semiconductor. The second embodiment of the present semiconductor tape processing system will be described below. For example, the "figure u" shows that the word "word" is used to: receive the plurality of conductor strips ss, and - the first butterfly. The first incision portion 3000 includes a chuck table unit 3002 including a chuck table 3〇04 on which the semiconductor strips % are mounted one by one. The chuck table 3004 is movable in the X-axis and γ-face directions. The first cutting portion further includes a ^-the first cutting device for processing the curved line and the straight portion of the semiconductor strip ss on the chuck table 4. The semiconductor tape processing system further includes: a first unloading scale; a semiconductor processed in the S. The SS and the first feeding portion 2000 are used to take the semiconductor strip ss' one by one and feed the picked semiconductor one by one The belt is SS to the first cutting portion .3_ or the first unloading portion 4000. The semiconductor tape processing system further includes a second loading portion _ for use from the first _. The new job (four) is cast to ss. ―Second cutting portion 32 〇 0 ' The first cutting portion 32 〇〇 includes a rotating table 26, and the semiconductor strip ss will be mounted on the rotating table 3226 one by one, the rotating table 3226 being at 20 X In the direction of the axis, the county '··: the second step is 'small' can move in the x-axis direction to align the semiconductor strips one by one to make them into independent semiconductor packages SP; one test n, make a second cut _ 加工 加工 加工 加工 加工 加工 加工 加工 加工 加工 加工 加工 加工 加工 加工 加工 加工 加工 加工 加工 加工 加工 加工 加工 加工 加工 加工 加工 加工 加工 加工 加工 加工 加工 加工 加工 加工 加工 加工 加工 加工 加工 加工 加工 加工 加工 加工 加工 加工4_ and the second loading part of the Congzhi to send the semiconductor strip SS. The first cake 1_于··魏(四)__盒臓. A plurality of semiconductor strips ss can be placed in each of the first-loading cartridges. Of course, a semiconductor strip SS can only be placed in a first load box 1〇〇2. The first loading surface further includes: a first conveyor brain for feeding the first mounting bladder one by one. A variety of drive systems can be used for the first conveyor face. Preferably, the first conveyor - uses a belt drive system.

第-裝載器1005安置於第一傳送裝置之一端。第一裝載器包 j : 推進器讓用於透過推進每個半 導體帶SS之一側,逐一‘移動第-傳送裝置1004移向第一推進 器1006之第一裝載盒1002中所擺放的半導體帶ss,藉以使半導 體帶SS逐一地被安裝於第一轉向軌道1008之上。 • ·. · • · . -. ♦ . . ' 第一裝載器1005還包含一第一夾持器1〇1〇。該第一夾持器 1010·被設置於第一推進器1006對面。因此,當第一推進器1〇〇6 向第一轉向執道1008推進一半導體帶§8之一邊時,該第—夾持 、 21 以使得該半導體帶 器1010拾取並牽引該半導體帶ss之另一邊 SS容易被饋送。 7為第-推進請6的—條移動雜該第—轉向軌道圆 包s: 一對可旋轉度之鮮。鄉—轉向執道麵上可放置 +導體帶SS ’並可使料導歸ss _,錢在其他方向上移 動該半導體帶SS。 第一饋送部2000與第-裝载部1000正交設置。該第一饋送 部2000用於從第一裝載部誦逐一地饋送半導體帶ss至第一切 割部3000或第一卸載部4000。 第一饋送部2000包含:一第一饋送軌道2〇〇2,一第一拾取器 2〇〇4 ’該拾取器設置於第一饋送軌道遞之—端,如此該拾取器 便可沿第一饋送軌道2002移動。 具體而言,第一拾取器2004可以設置於第一饋送軌道2〇〇2 上方與第一裴载部1〇〇〇相鄰之處。第一拾取器2004逐一對半導 體帶SS進行拾取,並餚送其至夾盤台3〇〇4,後面靖對該夾盤台 3004做具體描述。 ° 第二拾取器2006可以設置於第一饋送執道2002上方6該第 二拾取器2006逐一地拾取初步切割之半導體帶SS,並饋所拾取 之半導體帶SS至第一卻載部4000。 第一切割部3000設置與第一饋送軌道2002中央部分之下 22 1364087 方。該第一切割部3〇〇〇包 一 斑 切割裝置。且該第一切割部3000 二一較佳實施例中所述切割部3⑻具有相同之構造。因此,第 一切割部_之構成元件可參照「第i圖」中切_細 文不再贅述。The first loader 1005 is disposed at one end of the first conveyor. The first loader package j: the pusher is used to move the semiconductor placed in the first loading box 1002 of the first pusher 1006 one by one by moving one side of each semiconductor strip SS one by one The strip ss is used to mount the semiconductor strips SS one by one on the first turning track 1008. • The first loader 1005 also includes a first gripper 1〇1〇. The first gripper 1010· is disposed opposite the first pusher 1006. Therefore, when the first pusher 1〇〇6 advances one side of the semiconductor strip §8 toward the first steering lane 1008, the first clamping 21 causes the semiconductor ribbon 1010 to pick up and pull the semiconductor strip ss. The other side of the SS is easy to feed. 7 is the first - advancement please - the movement of the strip - the steering track round package s: a pair of rotatable fresh. The township-steering surface can be placed with + conductor strip SS ’ and the material can be guided to ss _, and the money moves the semiconductor strip SS in other directions. The first feeding portion 2000 is disposed orthogonal to the first loading portion 1000. The first feeding portion 2000 is for feeding the semiconductor tape ss one by one from the first loading portion to the first cutting portion 3000 or the first unloading portion 4000. The first feeding portion 2000 includes: a first feeding track 2〇〇2, a first picker 2〇〇4' the picker is disposed at the end of the first feeding track, so that the picker can be along the first The feed track 2002 moves. Specifically, the first picker 2004 may be disposed above the first feed rail 2〇〇2 adjacent to the first load carrying portion 1〇〇〇. The first picker 2004 picks up a pair of semiconductor strips SS and feeds them to the chuck table 3〇〇4, which is described in detail later. The second picker 2006 may be disposed above the first feed lane 2002. The second picker 2006 picks up the pre-cut semiconductor strip SS one by one and feeds the picked semiconductor strip SS to the first load-bearing portion 4000. The first cutting portion 3000 is disposed opposite the central portion of the first feed track 2002 by 22 1364087. The first cutting portion 3 encloses a spot cutting device. And the cutting portion 3 (8) of the first cutting portion 3000 has the same configuration. Therefore, the constituent elements of the first cutting portion _ can be referred to the "i-th image" and will not be described again.

…但是’該第-切割部3_用於沿直線與曲線對半導體帶% 進行切割。即’該第-切割部3_應舰形刀片沿直線與曲線對 母一半導體帶ss難以加工之部分進行切割,而並非如「第圖」 中所示出之完全地對半導體帶沾進行切割。 」 第-卸載部4_配置於第-饋送執道綱2上與第—裝載部 麵相對之—側。該第一卸_4_ 複數悔卩载盒搬。 在每一卸載盒4002中,擺放有複數個經過預切割之半導^帶ss。 虽然,一個半導體帶SS只能擺放於一個卸載盒4〇〇2之中。- 第-域部4_還包含:-第二傳送裝置4〇〇4,係用以逐個 地饋送卸載盒麵。該第二傳送裝置可顧各種驅料統。較佳 地、,該第二傳送裝置可應用帶式驅動系統。 -第一卸裁器401Θ配置於第一卸载部4〇〇〇之,端。#结a . ,琢第一却 載器4010,包含:一第二轉向執道4〇12,該軌道設置於第二拾取 器2006移動路徑之下方。第二轉向軌道4〇12,包含一辦可旋轉 360度之執道《:該第二轉向執道4012上可放置半導體帶%,並可 使該半導體帶SS.旋轉 '以便改變該半導體帶ss之移動方向 第一卸載器4010包含:一第二夾持器4014。該第二失持器 23 1364087 4014拾取位於第二轉向轨道4〇12上的半導體帶ss,並把所拾取 到的半導體帶SS裝於卸載盒4002中。 取 傳送器32〇2設置於第-卸載部4_與第二裂載部3辦之 間。該傳送器32〇2 從第-切割部3_開始傳送經過預切= . 之半導體帶SS至第二切割部3200。 第二裝载部3綱設置於傳送器迦之一端。 3204包含:複數個第二裝載盒遍。在每一第二裳載盒屬中。, 擺放有複數個經過預切割之半導體帶ss。當然,—個半導體帶% 只能擺放於一個第二裝載盒3206之中。 帛二賴部遍還包含:-第三傳送裝置32G8,侧以逐一 地饋送第二裝載盒3施。該第三傳送裝置3施可應用各種驅動系 統。較佳地,該第三傳送裝置3208可應用帶式驅動系統。 f二裝載部32G4包含:-冑二裝載器3綱。該第二裝載器包 籲含:第二推進器遍。該第二推進器321〇用於透過推縣個半導 :體帶SS之-侧逐一地移動第三傳送裝置3施移向第二推進器 .βίο之第二裝載盒32〇6中所擺放的.半導體帶%,藉以使半導體 帶SS逐—地被安裝於一引入軌道3218之上。 .上述引入軌道321:8包含-對執道。該引入轨道用於暫時在第 三拾取器迎之運動軌道上存放一半導體帶ss,以使第三拾取 器3216方便地拾取該半導體帶ss。 3320。該夹持器332〇 第二裝載器32〇9還包含一第三爽持器 24 丄/ έ又置為與第二推進器321〇相 .01〇 封。因此,當第二推進器3210向引 入軌道3218推進該半導體帶 錢㈣盅道μ 心之一邊時,第三夾持器3320拾取 並推進該半導體帶SS之另一邊。 第二饋送部3212與第二萝τ 裝载部3204平行設置。第二饋送部 3212包3 —第二饋送轨道3 … 214。第三拾取器3216配置於第二饋 ^ 上方以便可以沿第二饋送軌道3214移動。第三拾取 器遍逐個拾取半導體帶SS,並饋送該半導體帶SS至下文要進 行描述之旋轉台3226。 第二切割部3200配置於第二讀送部迎之中心部分。且該 第-饋送4 3212配置於第二切割部32〇〇之下方。第二切割部侧 除了包含,轉台遍之外,還包含一刀片單元迎。 刀片單元32Μ在其-面配備有—刀片,制以切割每一半導 體帶SS。該列單元3224可包含—對刀片子單元。 鲁 透過對半導體帶.ss進行切割使之成為具有理想尺寸之零 、件’刀片單元3224把每一半導體帶SS加工成半導體封裝SP。 .旋轉台娜設置於第二切割部3200之一側。該旋轉台3226 透過一電動機可做度旋轉。—夾盤台删可設置於該旋轉台 之上。 .夾盤台3230係用以在刀片單元3224對半導體帶ss進行切割 .操作時在半導禮帶SS下面對其進行夹持與支稼。正如本領域之技 術人員所體會,該夾盤台323〇可具有任意結構。.. 25 1364087 廢料箱(附圖中未示出)可配置於第二切割部遞之 以便去除料導« SS進行泣使之成料導體雖sp過程中 所產生之廢料。可以應用—空氣噴頭(附圖中未示出)替代 =,該空氣噴頭可配置於第二切割部纖之—側,以使购 向某一方向。 ’ 第四拾取器迎配置於第二饋送部3212之—側,該於 可沿第二舰驗3214進行鶴。对瞻抑迎用饋送位 於旋轉台上㈣切狀铸鱗至第二域部觸。 清洗裔/乾燥器3234配置於第四拾取器迎之運動路獲上。 該清絲/乾騎皿係収在找加工健 割部3200之半導體封裝進行清洗並供干。 弟-切 撤麻L卸载4麵包含—乾燥區(dlylngbl°ek)缝,係用以 f底地乾燥_第四拾取器伽饋送之半導體封裝sp。在檢測 器· 5020執行檢測握相^ 乂 、 ϋ 乾燥區可在清洗117乾燥器 八订清洗操作後完全去除殘留於該半導體封裝sp之上的水 分0 上 第-卸載4 5000包含:一第三饋送軌道鑛。一第五〆取器 ^置卿三峨W上並侧編行移動。該 ^ 15 5〇06甩於對送在乾燥區.5002中完全乾燥之半導體封 裝填區5〇08。在檢測之前,該裝填區5_暫時保存該 千等體封裝SP。 , 26 1364087 裝填區5008配置於第五拾取器5〇〇6移動路徑下方並處於該 路徑之一端。裝填區5008配置於與第三饋送轨道5〇〇4正交的穿 填區饋送執道5010之上,並可沿裝填區饋送執道5〇1〇進行移動。 第六拾取5012配置於第三饋送轨道之一端,該第六拾取器 5012用於饋送經檢測器5〇2〇檢測後之半導體封裝卯至接收器 5022,下文將對該接收器5〇22進行描述。 第二卸載部5000還包含:一半導體封裝饋送部5〇14,該半導 體封裝饋送部5〇14與第三饋送執道5〇〇4平行且正交於裝填區饋 送軌道5010。該半導體封裝饋送部5〇14包含:一半導體封裝饋送 執道5016,以及一半導體封裝拾取器5〇18,該半導體封裝拾取器 5018可沿半導體封裝饋送軌道5〇16移動。 半導體封裝拾取器5018拾取半導體封裝,該半導體封裝放置 於沿裝填區饋送軌道5010移動之裝填區5〇〇8内,進而,半導體 封裝拾取器5018放置所拾取的半導體封裝於檢測器5〇2〇上方所 限定之區域内。 依照用戶之要求,可以提供若干半導體封裝饋送部5〇14。在 本實施例中,提供了兩.個半導體封裝饋送部·。檢測器5〇2〇 配置於半導體封裝拾取器測之—端下於,該檢測器·用於 對由半導㈣裝拾取H爾所拾取之半導黯歧聽在缺陷 構成第二卸載部5000之接收器5〇22包括:一接收盤架 5〇24 ’舞用以接收饋送檢測器5〇20、之半導體封裝;以及,一接收 27 1364087 盤架饋送倾鄕,_喊麵触遍可沿魏道進行移 動。 該接收盤架饋送軌道5〇26分別正交於第三饋送執道篇以 及+導體辭顧輯5G16。可賴縣干健收H 5022。較佳 地,可以提供兩個或更多接收器5〇22。 兩個或更多接收器5〇22之一可以作為一接收半導體封裝卯 之工間’其所接故之半導體封裝SP係由檢測器5020確定為次品。 另外,其餘接㈣聰作為接收正品半導體封裝別之空間。 下面,依據本發明對半導體加工系統之第二實施例之運行進 行描述。 在第二實施例中’半導體帶加工系統之第一裝載部麵,第 一饋送部及第-_侧之運行_結第一實施 例中之運行方式嫌並且,第—切割部_之運行方式鱼第一 實施例中切割部300之運行方式相同。. 、 但是’如「第㈣」中卿第—_部_切割半導體帶 之方式不同於第-實施射觸部·之切割方式。半導體帶Μ 經第一切割部觸切割後’被饋送至第一卸裁部侧,並透過傳 达器纖,破從第一卸载部4_饋送至第二裝载部遍。 具體而言,傳送沿傳送器32〇2饋送之主 置通,而後該半導體帶被放置於一個第,盒帶 半導體帶被裝填於第二裝载盒3206中時, 〃 吖第二傳送裝置傳送第二 • . · - · * · 28 1364087 裝載盒3206至第一推進器3210。 當第二裝載盒到達第二推進器遍時第二推進器把第二裝 載盒32〇6之半導體帶推向第三拾取器遍。接下來,第三失持哭 3220拾取半導體帶ss之—側,並饋送該半導體帶SS至引入執i . 3218。 • 當半導體帶%達到引入執道迎時,第三拾取器3216拾取 放置於引入執道3218中之半導體帶ss,並沿第二饋送部迎之 第二饋送軌道3214向迦機。而後,第三拾取器娜 放置該半導體帶ss於旋轉台3226之夾盤台323〇上。 接下來,每-刀片單元3224進行工作。每一刀片單元迎 可在與第二舰顧3214平行之方向上移動。依據每—刀片單元 3224之運行方式,刀片單幻224在對半導體帶%進行切割之同 時在與第二饋雜道3214平行之方向上轉。. 經過清洗與乾驗’半導體封裝sp被放·第二卸载部麵 之乾無區5002卜而後,半導體封裝处在乾燥區5〇〇2中完全地 被乾燥。 第五拾取ϋ遍雜綠辦之半導騎裝sp進行拾取, 而後饋送所拾取到之半導體封震sp至裝填區麵。隨後,放置 於裝填區纖之半導體封裝SP沿裳填區饋送軌道涵進行饋 送。 半導體封裝拾取器5018對沿裝填區饋送執道5〇1〇進行饋送 之半導體封裝sp it行拾取’錢饋賴半導體封裝sp至檢測器 5020 P通後,由檢測器5020檢測後的半導體封裝sp沿半導體封 裝饋送軌道鳩被舰。同時,接㈣架遍沿接收盤架饋送 軌道5026被饋送。 \ . 經檢測器獅檢測為正品之轉體封驗放置於用於接收正 品之接收盤架5024中,同時,經檢測器5〇2〇檢測為次品之半導 體封裝被放置於用於接收次品之接收盤架5024中。 經過上述工序,依據第二實施例之半導體帶加工系統之工作 完畢。 , , ' ' κ 下面,依據本發明對半導體加工系統之第三實施例之運行進 行描述。 • ' . ' * -. .. 如「第14圖」中所示,半導體帶加工系統包含:一裝载部 500,係用以接收複數個半導體帶,以及一切割部7〇〇。該切割部 30 1364087 700包含:-包含夾盤纟7〇4之夹盤台單元7〇2,在該夹盤台聊 之上將逐-放置半導體帶SS。該該夾盤台704可沿χ轴與γ轴方 向移動。物辦進-步包含:—切聽置,該切割裝置可 在移動過程中對放置於夾盤台7〇4上之半導體帶ss進行加二以 使其成為獨立半導體封裝SP。該半導體帶加工系統還包含:—清 洗/乾燥部8GG,_以對經加X後之半導體封裝sp進行清洗與^ 燥;一檢測部900,係用以檢測清洗與乾燥之半導體封裝卯是否 存在缺陷;一卸載部950 ’係用以接收'經檢測後之半導體封裝sp ; 以及,一饋送部600,係用以拾取半導體帶ss,並饋送其至裝载 部500或切割部700,拾取半導體封裝兕並饋送其至清洗/乾燥部 800 ’檢測部900或卸載部950。 裝載部500包含複數個裝載盒5〇2。在每個裝載盒5〇2,可放 置複數個將被切割之半導體帶%。當然,每一裝載盒5〇2中只能 放置一個半導體帶SS。 裝載部500還包含一傳送裝置5〇4,係用以逐一饋送裝载盒 502。該傳送裝置5〇4可以可應用各種驅動系統。較佳地,該傳送 笨置可應用帶式驅動系統。 裝载部5〇〇包含一裝載器505。該裝載器505包含一推進器 • ' · 506。該推進器5〇6係用以透過推動每一半導體帶ss之一側,把 透過傳送裝置504向其移動之半導體帶SS放置於裝載盒502 .之 中,並使得該半導體帶SS被逐一放置於引入轨道510之上。 31 1364087 褒裁器505還包含-夹持請。該夹持器·設置於推進哭 5〇6 =。因此’當推進器506向引入軌㈣推進半導體帶SS 之一側時,夾持器5GS拾取並拉動轉體帶%之另一側。 裝載部姻還進-步包含有引入執道si〇。具體而言該引入 執道510被設置於-條移動路徑中,其中推進器5()6與夹持器观 可沿該移動路#進行移動,或者,被設置於第一拾取器咖下方 該路徑之-側,其t包含於饋送部_之第—拾取請4可沿上 述路徑進行移動。第-拾取器6〇4將在下文進行詳述。在傳輸該 半導體帶SS至切割部之前,該引人軌道別用於暫時存放半 導體帶SS。...but the first-cut portion 3_ is used to cut the semiconductor strip % along a straight line and a curve. That is, the first cutting portion 3_ should cut the portion of the mother-semiconductor strip ss that is difficult to process along a straight line and a curve, instead of completely cutting the semiconductor strip as shown in the "figure" . The first unloading portion 4_ is disposed on the side opposite to the first loading portion on the first-feeding guide. The first unloading _4_ plural repents carrying boxes. In each of the unloading boxes 4002, a plurality of pre-cut semi-conducting tapes ss are placed. Although, a semiconductor strip SS can only be placed in one unloading box 4〇〇2. - The first field portion 4_ further comprises: - a second conveyor 4" for feeding the unloading cassettes one by one. The second conveyor can take care of various drive systems. Preferably, the second conveyor can apply a belt drive system. The first unloader 401 is disposed at the end of the first unloading unit 4〇〇〇. The first carrier 4010 includes a second steering lane 4〇12, and the track is disposed below the moving path of the second picker 2006. The second steering track 4〇12 includes a 360 degree rotation: “The semiconductor track can be placed on the second steering track 4012, and the semiconductor tape SS. can be rotated” to change the semiconductor tape ss. The moving direction first unloader 4010 includes a second holder 4014. The second detentor 23 1364087 4014 picks up the semiconductor strip ss on the second steering track 4〇12 and mounts the picked semiconductor strip SS in the unloading box 4002. The take-up conveyor 32〇2 is disposed between the first unloading unit 4_ and the second splitting unit 3. The conveyor 32〇2 conveys the pre-cut =. semiconductor strip SS to the second cutting portion 3200 from the first cutting portion 3_. The second loading portion 3 is disposed at one end of the conveyor. 3204 includes: a plurality of second load boxes. In each second box. , a plurality of pre-cut semiconductor strips ss are placed. Of course, a semiconductor strip % can only be placed in a second loading box 3206. The second portion further includes: - a third conveyor 32G8, the side feeding the second loading cassette 3 one by one. The third conveyor 3 can be applied to various drive systems. Preferably, the third conveyor 3208 can apply a belt drive system. The f-loader 32G4 includes: - a second loader 3 class. The second loader includes: a second pusher pass. The second pusher 321 is configured to move the third transfer device 3 to the second pusher box 32〇6 of the second pusher. βίο by the pusher semi-conductor: the body belt SS. The semiconductor strip is placed so that the semiconductor strip SS is mounted one by one on a lead-in track 3218. The above-mentioned introduction track 321:8 contains a pair of tracks. The lead-in rail is for temporarily storing a semiconductor strip ss on the moving track of the third pick-up so that the third pick-up 3216 conveniently picks up the semiconductor strip ss. 3320. The holder 332 〇 the second loader 32 〇 9 further includes a third holder 24 丄 / έ and is placed in contact with the second pusher 321 . Therefore, when the second pusher 3210 advances one side of the semiconductor charge (four) ramp to the lead-in rail 3218, the third holder 3320 picks up and advances the other side of the semiconductor strip SS. The second feeding portion 3212 is provided in parallel with the second shovel loading portion 3204. The second feeding portion 3212 includes a second feeding track 3 ... 214. The third picker 3216 is disposed above the second feed ^ so as to be movable along the second feed track 3214. The third pickup picks up the semiconductor tape SS one by one and feeds the semiconductor tape SS to the rotary table 3226 which will be described later. The second cutting portion 3200 is disposed at a central portion of the second reading portion. And the first feed 4 3212 is disposed below the second cutting portion 32A. The second cutting portion side includes, in addition to the turntable, a blade unit. The blade unit 32 is equipped with a blade on its face to cut each of the semiconductor strips SS. The column unit 3224 can include a pair of blade subunits. The semiconductor strip SS is processed into a semiconductor package SP by cutting the semiconductor strip .ss into a zero size piece. The rotating table is disposed on one side of the second cutting portion 3200. The rotary table 3226 is rotatable through a motor. - The chuck table can be set above the rotary table. The chuck table 3230 is for cutting the semiconductor strip ss at the blade unit 3224. During operation, it is clamped and burded under the semi-guide strip SS. As will be appreciated by those skilled in the art, the chuck table 323 can have any configuration. . . . 25 1364087 A waste bin (not shown in the drawings) may be disposed at the second cutting portion to remove the waste material generated during the process of sputtering the feed conductor. Instead of the air nozzle (not shown in the drawings), the air nozzle can be disposed on the side of the second cutting portion so as to be purchased in a certain direction. The fourth picker is disposed on the side of the second feeding portion 3212, so that the crane can be carried along the second ship inspection 3214. For the purpose of welcoming the feed position on the rotating table (four) cut the cast scale to the second domain touch. The cleaning/drying device 3234 is disposed on the fourth picker to welcome the sports road. The clear/dry basket is cleaned and dried for storage in the semiconductor package of the processing and cutting section 3200. Brother-cutting, unloading, and unloading the four sides of the containing-drying zone (dylngbl°ek) seam, which is used to dry the bottom layer of the semiconductor package sp. Performing the detection of the gripper in the detector · 5020 ^ 乂, 干燥 The drying zone can completely remove the moisture remaining on the semiconductor package sp after cleaning the 117 dryer eight-order cleaning operation - the unloading 4 5000 contains: a third Feed the orbital mine. A fifth picker ^Jingqing Sancha W and side line movement. The ^ 15 5〇06甩 is placed on the semiconductor package filling zone 5〇08 which is completely dried in the drying zone .5002. The filling area 5_ temporarily holds the thousand-package SP before the detection. , 26 1364087 The loading area 5008 is disposed below the moving path of the fifth picker 5〇〇6 and at one end of the path. The loading area 5008 is disposed above the filling area feeding lane 5010 orthogonal to the third feeding track 5〇〇4, and is movable along the loading area feeding lane 5〇1〇. The sixth pick 5012 is disposed at one end of the third feed track, and the sixth picker 5012 is configured to feed the semiconductor package package detected by the detector 5〇2〇 to the receiver 5022, which will be performed on the receiver 5〇22 description. The second unloading portion 5000 further includes a semiconductor package feeding portion 5〇14 that is parallel to the third feeding lane 5〇〇4 and orthogonal to the loading region feeding rail 5010. The semiconductor package feed portion 5A 14 includes a semiconductor package feed path 5016, and a semiconductor package pickup 5's, which can be moved along the semiconductor package feed track 5?16. The semiconductor package picker 5018 picks up a semiconductor package that is placed in a loading area 5〇〇8 that moves along the loading area feed track 5010. Further, the semiconductor package pickup 5018 places the picked semiconductor package on the detector 5〇2〇 Within the area defined above. A plurality of semiconductor package feeding portions 5〇14 may be provided in accordance with the requirements of the user. In the present embodiment, two semiconductor package feed portions are provided. The detector 5〇2〇 is disposed at the end of the semiconductor package pick-up, and the detector is configured to detect the semi-conducting yoke picked up by the semi-conductor (four) package and form a second unloading unit 5000. The receiver 5〇22 includes: a receiving tray 5〇24's for receiving the semiconductor package of the feeding detector 5〇20; and a receiving 27 1364087 shelf feeding tilting, _ shouting Wei Dao moved. The receiving tray feed tracks 5 〇 26 are orthogonal to the third feed trajectory and the + conductor trajectory 5G16, respectively. Can Lai County dry health collection H 5022. Preferably, two or more receivers 5〇22 can be provided. One of the two or more receivers 5 〇 22 can be used as a semiconductor package package for receiving the semiconductor package ’. The semiconductor package SP is determined to be defective by the detector 5020. In addition, the rest of the (four) Cong as a space to receive genuine semiconductor packaging. Next, the operation of the second embodiment of the semiconductor processing system will be described in accordance with the present invention. In the second embodiment, the first loading portion of the semiconductor tape processing system, the operation of the first feeding portion and the first-side portion, and the operation mode in the first embodiment, and the operation mode of the first cutting portion The cutting portion 300 operates in the same manner in the first embodiment of the fish. However, the method of cutting the semiconductor strip is different from that of the first-implementing contact portion. The semiconductor tape 触 is fed to the first unloading portion side after being cut by the first cutting portion, and is transmitted through the first unloading portion 4_ to the second loading portion. Specifically, when the main feed is fed along the conveyor 32〇2, and then the semiconductor tape is placed in a first portion, and the cassette semiconductor tape is loaded in the second loading cassette 3206, the second transfer device transmits the first 2 • . . . - 28 1364087 Load box 3206 to first thruster 3210. The second pusher pushes the semiconductor strip of the second loading cassette 32〇6 toward the third picker when the second loading cassette reaches the second pusher pass. Next, the third lost grip 3220 picks up the side of the semiconductor strip ss and feeds the semiconductor strip SS to the introduction exe. 3218. • When the semiconductor strip % reaches the incoming pass, the third picker 3216 picks up the semiconductor strip ss placed in the lead way 3218 and greets the second feed track 3214 toward the chuck along the second feed. Then, the third picker Na places the semiconductor strip ss on the chuck table 323 of the rotary table 3226. Next, each blade unit 3224 operates. Each blade unit is movably moved in a direction parallel to the second ship 3214. Depending on the mode of operation of each blade unit 3224, the blade phantom 224 is rotated in a direction parallel to the second feed channel 3214 while cutting the semiconductor tape %. After cleaning and dry inspection, the semiconductor package sp is placed on the dry no-region 5002 of the second unloading portion, and then the semiconductor package is completely dried in the drying zone 5〇〇2. The fifth pick-up picks up the semi-guided rider sp of the green office to pick up, and then feeds the semiconductor seal sp to the loading area. Subsequently, the semiconductor package SP placed in the loading area is fed along the skirting area feed track culvert. The semiconductor package picker 5018 picks up the semiconductor package sp s which is fed along the loading area feeding channel 5 〇 1 拾 ' ' ' 半导体 半导体 半导体 半导体 半导体 半导体 至 至 至 至 至 至 至 至 至 至 至 , , , 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体The track is loaded along the semiconductor package. At the same time, the pick-up (four) racks are fed along the receiving tray feed track 5026. The tester lion is tested as a genuine swivel seal and placed in the receiving tray 5024 for receiving genuine products. At the same time, the semiconductor package detected as defective by the detector 5〇2〇 is placed for receiving times. The product is received in the tray 5024. Through the above process, the operation of the semiconductor tape processing system according to the second embodiment is completed. , ' ' κ Next, the operation of the third embodiment of the semiconductor processing system will be described in accordance with the present invention. • ' . ' * -. . . As shown in Fig. 14, the semiconductor tape processing system includes a loading unit 500 for receiving a plurality of semiconductor strips and a cutting portion 7〇〇. The cutting portion 30 1364087 700 comprises: - a chuck table unit 7 包含 2 comprising a chuck 纟 7 〇 4 on which the semiconductor strip SS will be placed one by one. The chuck table 704 is movable in the y-axis and y-axis directions. The material advancement step includes: - cutting, the cutting device can add two to the semiconductor strip ss placed on the chuck table 7〇4 during the movement to make it a separate semiconductor package SP. The semiconductor tape processing system further comprises: a cleaning/drying portion 8GG, for cleaning and drying the semiconductor package sp after the addition of X; a detecting portion 900 for detecting the presence or absence of the semiconductor package package for cleaning and drying a defect; an unloading portion 950' is for receiving the 'detected semiconductor package sp; and a feeding portion 600 for picking up the semiconductor strip ss and feeding it to the loading portion 500 or the cutting portion 700 to pick up the semiconductor The crucible is packaged and fed to the cleaning/drying portion 800' detecting portion 900 or the unloading portion 950. The loading unit 500 includes a plurality of loading cassettes 5〇2. At each of the loading cassettes 5〇2, a plurality of semiconductor strips to be cut can be placed. Of course, only one semiconductor strip SS can be placed in each of the loading cassettes 5〇2. The loading unit 500 also includes a transport unit 5〇4 for feeding the load cassette 502 one by one. The transport device 5〇4 can be applied to various drive systems. Preferably, the transfer is cumbersome to apply a belt drive system. The loading unit 5A includes a loader 505. The loader 505 includes a pusher • '· 506. The pusher 5〇6 is used to place the semiconductor strip SS moving through the transport device 504 into the loading box 502 by pushing one side of each of the semiconductor strips ss, and the semiconductor strips SS are placed one by one. Above the introduction track 510. 31 1364087 The tamper 505 also contains - gripping please. The gripper is set to push the cry 5〇6 =. Therefore, when the pusher 506 pushes one side of the semiconductor strip SS toward the lead-in rail (four), the gripper 5GS picks up and pulls the other side of the swivel belt %. The loading department has also entered the step-by-step. Specifically, the introduction lane 510 is disposed in the strip moving path, wherein the pusher 5() 6 and the gripper view are movable along the moving path #, or is disposed under the first picker. The side of the path, t is included in the first part of the feed section - the pick 4 can be moved along the above path. The first picker 6〇4 will be described in detail below. The attracting track is used to temporarily store the semiconductor strip SS before transferring the semiconductor strip SS to the cutting portion.

J 饋送部600配置於裝载部500之一側。該饋送部600包含-饋送執道602。第-拾取器6〇4配置於饋戦道6〇2上並可沿該執 道進行移動。該第-拾取器6〇4對放置於引入軌道51()上之半導 體帶進疗拾取’並放置該半導體帶於饋送執道抛上使得該半 導體帶可被槪至錄台單元7G8,下文將對夾盤台料進行 詳述。 • *' 同時’在饋送軌道602上提供一第二拾取器606。該第二拾取 器606用於從切割部700饋送半導體封裝sp至清洗/乾燥部8〇〇。 下文將對切割部7〇〇以及清洗/乾燥部800進行詳述。 在饋送執道602上還提供了 一第三拾取器6〇8。該第三拾取器 -· . · * 608用於從清洗/乾燥部麵饋送半導體封裝sp至檢測部9〇〇。對 32 "導體帶SS進行加工之切割部7〇〇被配置於饋送部_中心之下 方。 匕3於切部700之中的夾盤台單元7〇2設置為可沿X轴與 轴尺平移動。於失盤台單元7〇2之上表面放置複數個將被加工 半導體fSS。包含於切割部之中的炎盤台單可在半 導體V SS上之-點對其進行加工,或者沿半導體帶 SS上之一直 線或曲線對其進行加工。切割單元720可在X轴,Y轴以及θ角 、置對自純4亍校準。該切割部700還包含一傳感單元730,係用 以獲取f訊’該資訊為即將被加1之半導體帶ss之位置,並將所 檢測到的賴送至_單元72〇,使得蝴單元,之加工位置可 以得到枚準。依據上躲構,該蝴部·絲了—半導體封裝 加工裝置》 如「第14圖」中所示出’包含於夾盤台單元7〇2中之夾盤台 704之中的每-個驗在半導體帶ss下方支撐該半導體帶ss。失 盤台單元702還包含一失盤台饋送器71〇,榣用以饋^_夾盤台7〇4。 母一夾盤台704用於在透過切割單元720對半導體帶ss進行 .加工時,在半導體帶ss下方夾持並支撐一半導體帶ss。下文將 對切割單元720之加工作業進行描述。任何熟習相像技藝者可以 理解該夾盤台704可具有任意結構。 夾盤台饋送器710包含:一第一饋送構件712,係用以在X 軸方向饋送夾盤台704 ;及一第二饋送構件714,係用以在γ軸夺 33 1364087 向饋送夹盤台704。 第二饋送構件714被配置為正交於饋送轨道6〇2。該第二饋送 構件714用於在γ軸方向饋送夾盤台7〇4。第一饋送構件712被 配置為正父於第二饋送構件714。該第一饋送構件712,係用以在 * X軸方向饋送第二饋送構件714。 . 第二饋送構件714可包含若干相互平行之饋送構件。在本實 鲁 施例中,第二饋送構件714包含四個饋送構件,即,一號第二饋 送構件714a,二號第二饋送構件714b,三號第二饋送構件7洳 以及四號第二饋送構件714d。 古刀割單元720設置於第二饋送構件714之上並位於第二饋送 構件714 -端,切割單元72〇麟對放置於每一夹盤台綱上 之半導體帶SS進行加工。 就切割單it 720而言,可應用各種切割裝置、如「第J圖」 ❿巾所示,該切割單元72〇可包含一雷射切割裝置。同樣,如 15圖」中所示,該切割單元72〇可包含一刀片。 ,雷射切割裝置係包含-安裝於雷射切割裝置尖端之頭部(附 圖t未示幻。_部係配可在透過包含於該雷㈣割裝置中 •之控制器對該頭部之X軸、丫軸以及θ角位置進行控制之條件下 進行移動。該雷射切割裝置甩於對4 9圖」情示之半導體册 ss進行加工’該加工可如「第1G圖」至「第12圖」中所示^ 曲線及直線進行。當然,該雷射切割裝置可對料體帶%進行切 - · . . · 34 1364087 。』以使之成為獨立的半導體封裝sp。 知可以應用若干個雷射切割器。所以如「第1圖」中所示,H 割料720可包含__單元,單元廳以 及一第二切割單元720b。 弟切割早疋720a以及第二切割單元薦配置於第二饋送 714之上。如「第14圖」中所示出第一切割單元微以 =-切辟元挪可分耻胁,二舰構件71如與三 ==饋送構件714e之上,或者分別配置於二號第二饋送構件 14b與四旒第二饋送構件71牝之上。 傳感單元B0設置於第二饋送構件W之上並位於第二饋送 ==一端,感單元73〇包含一視頻獲取請,該視頻獲 ,安裝於夾盤台Μ上之半導體帶SS之位置進行檢 取μ/該夾盤台Μ與第二饋送構件714相連接。該視頻獲 =對半導體帶SS之位置進行撿測,並發送所檢測到之位置 、=Γ割裝置之控制器(附圖中:未示出),進而在光束發射 方向上對雷射_裝置之·進行_。' 贿器拙、皆貝送構件714之上设置一視頻獲取器軌道734,該視頻 7^2 # ^ 734正交於第二饋送構件714且平行於第一讀送構伴 且,視頻獲取器732可沿視頻獲取器軌道734進行移動。 對物i單“而言’可彻各種切割裝置。在本實施 例中’切割單元72〇,僅僅包含一雷射切割裝置。 35 丄364〇87 雷射切割裝置包含-安裝於雷射切職置尖端之頭部。該頭 二:配置成可透過包含於騎射_裝置中之控㈣對該頭部之 、Y細及Θ肖位置進彳了細而得錢雜置校正。該雷射 切割震置用於對「_」中所示之半導體帶沾進行加工該加 工T如「第10圖」至「第12圖」中所示沿著曲線及直線進行。 廢料盒750可配置於切割單元72〇之底部,該廢料盒则The J feeding unit 600 is disposed on one side of the loading unit 500. The feed portion 600 includes a -feed way 602. The first picker 6〇4 is disposed on the feed lane 6〇2 and is movable along the lane. The first picker 6〇4 picks up the semiconductor tape placed on the lead-in track 51() and places the semiconductor tape on the feed so that the semiconductor tape can be picked up to the recording unit 7G8, which will be The chuck material is detailed. • * 'At the same time, a second picker 606 is provided on the feed track 602. The second picker 606 is for feeding the semiconductor package sp from the cutting portion 700 to the cleaning/drying portion 8A. The cutting portion 7A and the washing/drying portion 800 will be described in detail below. A third picker 6 〇 8 is also provided on the feed lane 602. The third picker - . . . * 608 is for feeding the semiconductor package sp from the cleaning/drying surface to the detecting portion 9A. The cutting portion 7A for processing the 32 " conductor strip SS is disposed below the center of the feed portion_. The chuck table unit 7〇2 among the cut portions 700 is disposed to be movable flush with the shaft scale along the X axis. A plurality of semiconductor fSS to be processed are placed on the upper surface of the loss table unit 7〇2. The stencil table included in the cutting portion can be processed at a point on the semiconductor V SS or processed along a line or curve on the semiconductor strip SS. The cutting unit 720 can be calibrated on the X-axis, the Y-axis, and the θ angle, paired from a pure 4 。. The cutting unit 700 further includes a sensing unit 730 for acquiring a position of the semiconductor strip ss to be added, and sending the detected ray to the unit 72, so that the unit is , the processing position can be obtained. According to the above-mentioned hiding, the butterfly-silver-semiconductor package processing apparatus is shown in the "Fig. 14" as each of the chucks 704 included in the chuck table unit 7A2. The semiconductor strip ss is supported under the semiconductor strip ss. The lost table unit 702 also includes a lost table feeder 71 for feeding the chuck table 7〇4. The mother-and-pin stage 704 is for holding and supporting a semiconductor strip ss under the semiconductor strip ss when the semiconductor strip ss is processed by the dicing unit 720. The processing of the cutting unit 720 will be described below. Any familiar artisan will understand that the chuck table 704 can have any configuration. The chuck table feeder 710 includes: a first feeding member 712 for feeding the chuck table 704 in the X-axis direction; and a second feeding member 714 for feeding the chuck table at the γ axis 33 1364087 704. The second feed member 714 is configured to be orthogonal to the feed track 6〇2. This second feeding member 714 is for feeding the chuck table 7〇4 in the γ-axis direction. The first feeding member 712 is configured to be the father of the second feeding member 714. The first feeding member 712 is for feeding the second feeding member 714 in the *X-axis direction. The second feed member 714 can include a plurality of feed members that are parallel to each other. In the present embodiment, the second feeding member 714 includes four feeding members, that is, the first feeding member 714a, the second feeding member 714b, the second feeding member 7b, and the second and fourth Feed member 714d. The ancient knife cutting unit 720 is disposed above the second feeding member 714 and at the end of the second feeding member 714, and the cutting unit 72 unicorn processes the semiconductor tape SS placed on each chuck table. In the case of a cutting single it 720, various cutting devices can be applied, as shown in the "J-th drawing" wipe, which can include a laser cutting device. Also, as shown in Fig. 15, the cutting unit 72A may include a blade. The laser cutting device comprises - mounted on the head of the tip of the laser cutting device (Fig. t is unillustrated. The part is configurable to the head through the controller included in the thunder device) The X-axis, the 丫-axis, and the θ-angle position are moved under control. The laser cutting device is processed by the semiconductor book ss of the singular image. The processing can be as follows: "1G" to " The curve and the line shown in Fig. 12 are carried out. Of course, the laser cutting device can cut the material band %--- 34 1364087. to make it a separate semiconductor package sp. A laser cutter. Therefore, as shown in "1", the H cut 720 may include a __ unit, a unit hall, and a second cutting unit 720b. The young cutting 720a and the second cutting unit are preferably configured. Above the second feed 714. As shown in the "figure 14", the first cutting unit is slightly swayed by the slash, and the second member 71 is over the three == feeding member 714e, or They are respectively disposed on the second feed member 14b and the second feed member 71A. The sensing unit B0 is disposed above the second feeding member W and located at the second feeding== end, and the sensing unit 73〇 includes a video acquisition request, and the video is obtained and mounted on the position of the semiconductor strip SS on the chuck table for inspection. The μ/the chuck table is connected to the second feeding member 714. The video is obtained by detecting the position of the semiconductor strip SS and transmitting the detected position, the controller of the cutting device (in the drawing) : not shown), and then in the direction of beam emission, the laser_device is provided with a video capturer track 734. The video 7^2 # ^ 734 Orthogonal to the second feed member 714 and parallel to the first read companion and the video acquirer 732 can be moved along the video acquirer track 734. The object i can be "completely" a variety of cutting devices. In this implementation In the example, the cutting unit 72〇 includes only one laser cutting device. 35 丄 364〇87 The laser cutting device comprises - mounted on the head of the laser cutting tip. The second head: is configured to be permeable to the shooting. _The control in the device (4) The position of the head, the Y and the Θ The miscellaneous correction is used to process the semiconductor strip shown in "_". The processing T is performed along the curve and the line as shown in "Fig. 10" to "12". The waste box 750 can be disposed at the bottom of the cutting unit 72, and the waste box is

'透過廢料之重力,去除在切割部7〇〇對半導體帶%進行加工 使之成為轉黯裝sp之過財所產生之麟。 清洗/乾燥部動配置於饋送部㈣之與裝載部5〇〇相對的一 側。該清洗/乾燥部_包含一第一清洗器/乾燥請以及一第二 清洗器/乾燥器811。 第 >青洗器/乾燥器801限定一清洗/乾燥區域8〇2。在該區域 中,經過切割後的半導體封裝sp被清洗並被乾燥。 乾_ 800還包含一清洗台綱。該清洗台8〇4係裝配 成可石-清洗讀减道.進行移動,該清洗台艇執道德 係在清洗/乾燥部_之縱向延伸。清洗台,係用以在半導體封 =SP位幹清洗台8〇4上之情況下沿著清洗平台進行移動。在清洗 之孝多動路控上配置有一空氣噴頭806。該空氣噴頭鄕係用 二向位於凊洗台804上之半導體封裝SP上喷射空氣,從而去除附 著於Γ導體封裝sp上表面之雜質。當然,該空氣喷頭_也可吹 达熱空氣,私乾騎洗後之半導體封裝SP。 36 1364087 在清洗台804之移動路徑中還配置了一水嘴頭_。該水噴頭 808係用以向位於清洗台8G4上_體封裝即喷射水從而去除 附著於半導體封裝SP上表面之雜質。 此外,在清洗台804之移動路徑中還配置了一第一刷狀物 :。該第-刷狀物⑽係用以為清洗台叫之半導體封裝sp 去除附著於其上表面之雜質。 在第一清洗器/乾燥器之一侧設置一第二清洗器/乾燥器 川,即,饋送部㈣之第三拾取器_移動路徑之一側並位於第 二拾取以08移動路徑下方。該第二清洗器/乾燥器8ιι係用以去 除附著於半導體封裝SP下表面之雜質。 該第二清洗器/乾燥器811包含一第二刷狀物812。該第二刷 狀物812係用以為清洗台804上由第三拾取器饋送之半導體封裝 SP去除附著於其下表面之雜質。· , 該第-清洗器/乾燥器811還包含一空氣噴嘴813盘一水嗔嘴 814,並藉以去_著於半導體封裝沾下表面之师。.、 於清洗/乾燥部_ -側設置有一乾燥區(附圖中未示出),. 即’該乾燥區位於饋送部·之第三拾取器_的移動執道之一 侧。該乾燥區係用以徹底清除殘留於輕體封裝sp上且絲清洗 /乾燥部800清除之雜質。 設置一檢測部_於饋送部_的第三拾取器_之移動路 控之-側。該檢測部·包含:—第—檢測謂,伽以檢測切 37 l364〇87 割後半導體封裝SP之上表面,以及第二檢測器9〇6,係用以檢測 切割後半導體封裝SP之下表面。 檢測部900還包含一檢測台饋送軌道9〇8,該轨道配置於饋送 執道602下方且在與其正交之方向上延伸。該檢測部_進一步 -包含一檢測台910,該檢測台910可沿檢測台饋送轨道9〇8進行移 -動。該檢測部900可放置半導體封裝SP,並沿檢測台饋送軌道· ^ 饋送該半導體封裝SP。 於檢測台饋送轨道_之上設置-監測n第—檢測器饋送執 道912,該執道在與檢測台饋送軌道9〇8正交之方向上延伸。配置 第一檢測器914,使其可在監測器第一檢測器饋送軌道912上移 動該第檢測益914係用以檢測位於檢測台’91〇上之半導體封 裝SP是否存在缺陷。下文將對第二檢測器906進行詳細描述。 於檢測部900之一側設置一卸載部950。該卸載部950包含一 φ 卸載斋饋送執道952,該軌道沿與第一檢測器饋送軌道912平行之 方向延伸。該卸載部950遠包含一半導體封裝拾取器954以及一 卸載屯取器956,二者皆可沿該卸載器饋送軌道952進行移動。 • ▼ . ' - 、 半導體封裝拾取g 954對在檢測台910完成檢測之半導體封 裝SP進行拾取,並放置所拾取之半導體封裝sp於輔助台958上, 下文將對辅助台958進行詳細描述。卸載拾取器956對由第二檢 科器9〇6檢測完畢之半導體封裝sp進行拾取,並放置所拾取之半 V體封裝SP於知载部95〇冬接收器96〇上。 38 丄北4U87 辅助台958配置於半導體封裝拾㈣954與卸載拾取器956 夕動路匕上。該辅助台958係用以暫時存放經第一檢測器914 檢測後的铸體封裝SP。 °° 第-檢測器906配置於輔助台958之一側。該第二檢測器9〇6 係用Μ對藥由第—檢測器914檢測後之半導體封裝之下表面是否 存在缺陷進行檢測。'The gravity of the scrap is removed, and the semiconductor strip % is processed at the cutting portion 7 to make it a stalk produced by the transvestite sp. The cleaning/drying portion is disposed on a side of the feeding portion (four) opposite to the loading portion 5''. The cleaning/drying section _ includes a first washer/drying and a second washer/dryer 811. The > scrubber/dryer 801 defines a cleaning/drying zone 8〇2. In this region, the diced semiconductor package sp is cleaned and dried. Dry _ 800 also contains a cleaning station. The cleaning station 8〇4 is assembled into a rock-washing read-reduction lane. The movement is carried out in a longitudinal extension of the cleaning/drying section. The cleaning station is used to move along the cleaning platform with the semiconductor seal = SP dry cleaning station 8〇4. An air shower head 806 is disposed on the filial hyperactive roadway for cleaning. The air jet nozzle ejects air onto the semiconductor package SP on the washstand 804, thereby removing impurities attached to the upper surface of the tantalum conductor package sp. Of course, the air jet _ can also blow hot air, privately riding the washed semiconductor package SP. 36 1364087 A nozzle head _ is also disposed in the moving path of the washing station 804. The water jet 808 is used to spray water onto the cleaning table 8G4 to remove impurities adhering to the upper surface of the semiconductor package SP. Further, a first brush is disposed in the moving path of the washing table 804. The first brush (10) is used to remove impurities attached to the upper surface of the semiconductor package sp called the cleaning station. A second washer/dryer is disposed on one side of the first washer/dryer, i.e., one side of the third picker_moving path of the feeder (4) and located below the second pick-to-08 moving path. The second washer/dryer 8 ιι is used to remove impurities attached to the lower surface of the semiconductor package SP. The second washer/dryer 811 includes a second brush 812. The second brush 812 is for removing impurities attached to the lower surface of the semiconductor package SP fed by the third pickup on the cleaning stage 804. The first washer/dryer 811 further includes an air nozzle 813, a water nozzle 814, and is placed on the surface of the semiconductor package. A drying zone (not shown in the drawing) is provided on the side of the cleaning/drying section, i.e., the drying zone is located on one side of the moving lane of the third picker_ of the feeding section. The drying zone is for thoroughly removing impurities remaining on the light body package sp and removed by the wire cleaning/drying section 800. A detection portion is provided on the side of the movement control of the third pickup_ of the feed portion_. The detecting part includes: a first detecting means, a gamma detecting cut 37 l364 〇 87 a surface of the semiconductor package SP after cutting, and a second detector 9 〇 6 for detecting a lower surface of the semiconductor package SP after cutting . The detecting portion 900 further includes a detecting stage feeding track 9A8 which is disposed below the feeding path 602 and extends in a direction orthogonal thereto. The detecting portion_further includes a detecting station 910 which is movable along the detecting table feeding track 9〇8. The detecting portion 900 can place the semiconductor package SP and feed the semiconductor package SP along the detecting stage feed track. The n-th detector feed path 912 is disposed on the test-bed feed track_, which extends in a direction orthogonal to the test-station feed track 9〇8. The first detector 914 is configured to move the first detector 914 on the monitor first detector feed track 912 for detecting the presence of a defect in the semiconductor package SP located on the test station '91'. The second detector 906 will be described in detail below. An unloading portion 950 is disposed on one side of the detecting portion 900. The unloading portion 950 includes a φ unloading feed path 952 that extends in a direction parallel to the first detector feed track 912. The unloading portion 950 is remotely comprised of a semiconductor package picker 954 and an unloader picker 956, both of which are movable along the unloader feed track 952. • ▼ . ' - , semiconductor package pick g 954 picks up the semiconductor package SP that has completed the inspection at the inspection station 910, and places the picked semiconductor package sp on the auxiliary stage 958. The auxiliary station 958 will be described in detail below. The unloading picker 956 picks up the semiconductor package sp detected by the second accommodator 9〇6, and places the picked-up half V-body package SP on the receiving unit 95. 38 The north 4U87 auxiliary station 958 is disposed on the semiconductor package pick-up (four) 954 and the unloading picker 956. The auxiliary table 958 is for temporarily storing the cast package SP that has been detected by the first detector 914. The °-detector 906 is disposed on one side of the auxiliary stage 958. The second detector 9 is used to detect whether or not a defect is present on the surface of the semiconductor package after the detection by the first detector 914.

接收器960配置於卸載拾取器956路徑下方且平行於輔助台 接收w 960中所限疋之一空間係用以接收經檢測部9〇〇所檢 測之半導體封裝SP。 可以供應若干個接收器690。較佳地,供應兩個接收器69〇。 即,卸載部950可包含:一接收器_,係用以接收檢測部9〇〇 確認為次品之半導體封裝sp,以及另—接收器_,係用以接收 檢測部900確認為正品之半導體封裝Si>。 同時,卸載拾取器軌道962用於饋送沿卸載饋送軌道移動之 卸載拾取器956。具體來說,該卸載拾取器執道%2被配置 於卸載器每送軌道952 ’這Ϊ·,該卸載拾取器執道%2便可以沿卸 戴器饋送軌道952移動。該卸載拾取器956可沿卸載拾取器軌道 962移動。 這就是說’該卸载拾取器956既可以沿卸載器饋送轨道952 在X軸方向上運動,又可以沿卸載拾取器軌道962在Y軸方向上 移動。 39 又像本發明對加 當-半導體帶被 等體帀之第二實施例進行 傳送裝置504可使裝载盒 裝载成5〇2中時,第一 與推進H 5G6之移動方^ °進a 5G6移動。當裝载盒502 進請之請崎行。伴隨推 器軌道605。 ㈣她第—拾取⑽之第_拾取 當半導體帶SS向苐—拾取 508拾取半導I#帶π u & 杪鄆吋,弟一夾持态 …取牛導‘ SS上與推進請相對之—側 器執道推進該半導體帶ss。 ° 穿.,.〇〇 P +導體帶SS透過推進器506與 一夾持器508之合作被放置與第一拾取器執道奶上。、 。。虽半導體帶ss被放置與第一拾取器執道6〇5上時,第一拾取 ~ 604 /σ饋达部_之第—饋送軌道⑽移動之切割部7⑻。當該 第一拾取器6〇4抵達切割部時,切割部700之夾盤台·被 放置於第一拾取器604之下。 » . - 、.· · 。之後,第-拾取器6〇4放置其所拾取之半導體帶.s§於夾盤台 單兀702之^益台7〇|上’另一半導體帶沾被置於夾盤台單元 . · · · - _ · 702之另一夾盤台7〇4上。當半導體帶沾以上述方式被置於夾盤 〇單元702上時,相關置爽盤台7〇4沿第二饋送構件714於丫軸 上移動。 , ' . . 當失盤台7〇4洛第二饋送構件714於γ軸上移動時,該夾盤 台704經過傳感單元730。此時,傳感單元730之視頻獲取器732 l^〇4U87 獲取半導體帶位於每一夾盤台7()4上位置之資訊并發送該資訊 至切割單元720之控制器。 在接收到上述資訊後’控制器對切割單元72〇頭部之位置進 订校準。在此情況中,傳感單元?3〇對夹盤台上半導體帶沾 之位置進行檢測,如「第14圖」中所示出由於構成切割單元第 與第一切割單凡分別位於二號第二饋送構件71仙與四號第二饋 送構件714d上方,所以夾盤台7〇4與二號第二饋送齡鳩以 及四號第二饋送構件714d相輕合。 田對位於一號第一饋送構件714b與四號第二饋送構件 之爽盤。上方的半導體帶ss所進行之切割工序完成時,夹盤台 ,沿第一饋送構件712在χ轴方向上移動。而後,一號第二饋 送構件714a #二號第二饋送構件714。之爽盤台被置於切割單元 720之下方。 至此,在所有夹盤台704上對半導體帶SS的切割進行完畢。 在對半導體帶ss之切割工序完成後,央盤台7〇4透過夾盤台饋送. 器回到其初^位置广〜… • · ^ · , . '· ^所有夾盤台704回到其初始位置時,第二拾取器606向夾 盤口 〇4上方之區域移動’以便向第一清洗器,乾燥器sol饋送半 導體▼ ss 後’該第二拾取器拾取經切割後之半導體封裝, 並放置該半導體封裝於清洗台804上。 當半導體封紐放胁清洗台_時,财洗自·向清洗/ ^燥區_2移動。首先,該清洗台綱經過空氣嘴頭806,藉以 除附著於半導_裝sp上之雜f。之後,該清洗台·經過水 嘴頭808,藉以透過水對半導體封| sp進行清洗。 同時,當第一刷狀物81〇 沿半導體封裝之上表面移動時 導體封裝SP上之雜質。 沿清洗台804之上表面移動,即, ’該第一刷狀物810清除附著於半 當清洗台m ·經過第一刷狀物_時,該清洗台8〇4再次經 過水噴頭識’細透過謂半導體聽進行清洗。啸該清洗台 8〇4再次經過空氣喷頭_,藉以對該半導體封裝進行清洗與乾燥。 在清洗台8〇4、經過第一清洗器/乾燥器8〇1後,清洗台_回 到其初始位置。此時,第三拾取器_移動至清洗台8G4之上的 區域。此時,第三拾取器608運動至清洗台804上方。隨後,該 第三拾取器608拾取半導體封裝並向第二清洗器/乾燥器811移 動其中,該第二拾取器608沿饋送軌道602進行移動。在此過 程中,第二拾取器608順序經過第二刷狀物812,空氣,嘴813 以及水喷嘴814。…於… ’ ' . * · · 同時,透過第二清洗器/乾燥器811,半導體封裝31>上之水分 被完全去除。 接下來’第三拾取器608放置該半導體封裝於檢測台910上。 當該半導體封裝被放置於檢測台91〇上時’該檢測台910.沿 檢測台饋送執道908移動至第一檢測器914下方之區域。同時, 42 .. 1364087 該第一檢測器914確定放置於檢測台910上的半導體封裝之上表 面是否存在缺陷,並同時沿第一檢測器饋送執道912移動。 在經過第一檢測器914之後,該清洗台8〇4回到其初始位置。 接下來,放置半導體封裝拾取器954拾取清洗台8〇4上之半導體 封裝,並在沿卸載器饋送執道呢移動同時饋送該半導體封裝至 輔助台958。 、 • ^半導體輔助被放置於輔助台958時,卸載拾取器辦拾耳 放置於輔助台958上之半導體封裝並沿卸载II饋送執道952禾 動之後該卸載拾取益956沿卸載拾取器軌道962移動至 檢測器906。 - 該第二檢測器9〇6對經由卸载拾取器祝所拾取至半導體妾 裝之下表面進彳了檢測,藉以確定是該半導體封裝之下表面否存名 缺陷。然後,該卸载拾取器956沿卸載器饋送執道952移動並韻 • 送該半導體封裝之接收器960。 •被放第二檢測器9〇6確定具有良好質量之半導體封裝 • 接收器960中:此外經由第二檢測器肖 、好質!之半導體封裝被放置於用於次品之接收器⑽ 圖“」令所不:出對加工半導體帶之第四實施例。「第15 」不之半_帶加工系統包含:-裝載部侧,係用以 43The receiver 960 is disposed below the path of the unloading picker 956 and parallel to one of the limits of the auxiliary station receiving w 960 for receiving the semiconductor package SP detected by the detecting portion 9A. A number of receivers 690 can be supplied. Preferably, two receivers 69 are supplied. That is, the unloading unit 950 may include a receiver _ for receiving the semiconductor package sp that the detecting unit 9 confirms as a defective product, and a receiver _ for receiving the semiconductor that the detecting unit 900 confirms as authentic. Package Si>. At the same time, the unloading picker track 962 is used to feed the unloading picker 956 that moves along the unloading feed track. Specifically, the unloading picker track %2 is configured for each of the unloader tracks 952', and the unloading picker track %2 can be moved along the unloader feed track 952. The unloading picker 956 can be moved along the unloading picker track 962. That is to say, the unloading picker 956 can move both in the X-axis direction along the unloader feed track 952 and in the Y-axis direction along the unloading picker track 962. 39. In the second embodiment of the present invention, when the transfer device 504 is used to load the loading cassette into the 5 〇 2, the first and the moving H 5G6 are moved. a 5G6 moves. When the loading box 502 enters please ask for it. Accompanied by the pusher track 605. (4) The first pick-up of her first pick-up (10) When the semiconductor strip SS goes to the pick-up 508 picks up the semi-guided I# with π u & 杪郓吋, the younger one grips the state...takes the cow guide' SS on the propulsion and the opposite - The side device is advancing to advance the semiconductor strip ss. ° 穿.,. 〇〇 P + conductor strip SS through the pusher 506 in cooperation with a holder 508 is placed on the first picker to administer the milk. , . . When the semiconductor strip ss is placed on the first picker path 6〇5, the first pick-up 604/σ feed-side-feed track (10) moves the cut portion 7(8). When the first picker 6〇4 reaches the cutting portion, the chuck table of the cutting portion 700 is placed under the first picker 604. » . - ,.· · . Thereafter, the first picker 6〇4 places the semiconductor strip that it has picked up. § § on the chuck table 兀 702 ^ 台 〇 上 上 上 上 上 上 上 上 上 上 上 上 上 上 上 上 上 上 上 上 上 上 上 上 上 上 上 上 上 上 上· - _ · 702 on the other chuck 7 〇 4. When the semiconductor tape is placed on the chuck unit 702 in the above manner, the associated setting tray 7 is moved along the second feeding member 714 on the x-axis. The disc table 704 passes through the sensing unit 730 when the disc stop 7 is moved over the gamma axis. At this time, the video acquirer 732 l 〇 4U87 of the sensing unit 730 acquires the information of the position of the semiconductor tape on each of the chuck stages 7 () 4 and transmits the information to the controller of the cutting unit 720. After receiving the above information, the controller performs a calibration on the position of the head of the cutting unit 72. In this case, the sensing unit? 3〇 Detecting the position of the semiconductor strip on the chuck table, as shown in “Fig. 14”, because the first cutting unit is located on the second feeding member 71 and the fourth Above the two feed members 714d, the chuck table 7〇4 is in direct contact with the second feed age number two and the second feed member 714d. The field is placed on the first feed member 714b of the first and the second feed member of the fourth. When the cutting process by the upper semiconductor tape ss is completed, the chuck table moves in the z-axis direction along the first feeding member 712. Then, the second feed member 714a #2 is the second feed member 714. The refreshing table is placed below the cutting unit 720. So far, the cutting of the semiconductor tape SS is completed on all the chuck tables 704. After the cutting process of the semiconductor strip ss is completed, the central disk tray 7〇4 is fed through the chuck table. The device returns to its initial position and is wide~... • · ^ · , . '· ^ All chuck tables 704 return to it In the initial position, the second picker 606 moves 'to the area above the chuck port 4' to feed the first washer, the dryer sol with the semiconductor ▼ ss, and the second picker picks up the cut semiconductor package, and The semiconductor package is placed on the cleaning station 804. When the semiconductor package is placed against the cleaning station, the cleaning is moved to the cleaning/drying area_2. First, the cleaning stage passes through the air nozzle 806 to remove the miscellaneous f attached to the semiconductor package sp. Thereafter, the cleaning station passes through the nozzle head 808 to clean the semiconductor package |sp through the water. At the same time, the impurities on the conductor package SP when the first brush 81 is moved along the upper surface of the semiconductor package. Moving along the upper surface of the cleaning table 804, that is, 'the first brush 810 is removed and attached to the half of the cleaning table m. · When the first brush _ passes, the cleaning table 8〇4 passes through the water nozzle again It is cleaned by listening to semiconductors. The cleaning station 8〇4 passes through the air nozzle _ again to clean and dry the semiconductor package. After the cleaning station 8〇4 passes through the first washer/dryer 8〇1, the washing station_ returns to its original position. At this time, the third pickup_ moves to the area above the cleaning table 8G4. At this time, the third pickup 608 is moved above the washing table 804. Subsequently, the third picker 608 picks up the semiconductor package and moves it to the second washer/dryer 811, which moves along the feed track 602. In this process, the second picker 608 sequentially passes through the second brush 812, the air, the mouth 813, and the water nozzle 814. ... at the same time, the moisture on the semiconductor package 31 > is completely removed through the second washer/dryer 811. Next, the third picker 608 places the semiconductor package on the inspection station 910. When the semiconductor package is placed on the inspection station 91, the inspection station 910 moves along the inspection station feed lane 908 to a region below the first detector 914. At the same time, 42.. 1364087 The first detector 914 determines whether there is a defect on the surface of the semiconductor package placed on the inspection station 910 and simultaneously moves along the first detector feed lane 912. After passing through the first detector 914, the cleaning station 8〇4 returns to its original position. Next, the semiconductor package picker 954 is placed to pick up the semiconductor package on the cleaning stage 8〇4, and is moved along the unloader feed while feeding the semiconductor package to the auxiliary stage 958. When the semiconductor auxiliary is placed on the auxiliary station 958, the unloading picker picks up the semiconductor package placed on the auxiliary stage 958 and moves along the unloading II feed 952. The unloading pick 956 along the unloading picker track 962 Move to detector 906. - The second detector 9〇6 detects the pickup onto the underlying surface of the semiconductor package via the unloading picker to determine if the surface under the semiconductor package is defective. The unloading picker 956 then moves along the unloader feed track 952 and sends the receiver 960 of the semiconductor package. • The second detector 9〇6 is placed to determine the semiconductor package with good quality. • In the receiver 960: in addition, it is good by the second detector! The semiconductor package is placed in the receiver for the defective product (10). The fourth embodiment of the semiconductor tape is processed. "15th" half of the _ belt processing system includes: - loading side, for 43

Ub4U87 接收將被加卫之工件’聽輯階段裝_讀;—_部, 係用以對所裝狀卫件進行加I ;以及…清洗戦部⑽〇,係 用以清洗並烘干加經工後之工件。 上述裝载部6100包含複數個裳载盒61〇2。在每一裝载盒觀 中依·、’、卡▼益之形式擺放需|進行加王之複數個半導體帶ss。 當然,各裝載盒6102中只能擺放一個半導體帶ss。 上述裝载部6100還包含一傳送裝置61〇4,係用以逐一地饋送 第一裝載盒61()2。該傳送裝置⑽4可以各種驅動系統。較佳 地’傳送裝置_使用—帶式驅動系統。 一裝載器61〇5設置於傳送裝置_4之一端。該裝載器包61〇5 3推進益6106。該推進器6106係用以透過在一端推進半導體帶 ss,從而逐一地移動經由傳送裝置61〇4送來的裝載盒61〇2中所 擺放之半導體帶ss ’並使得半導體帶ss逐-地安置於引入執道 6112上。下文將對該引入軌道6112做詳細描述。 裝载器6105還包含一夾持器611〇。夹持器611〇被設置於裝 載盒6102且與推進器6106相對之一端。因此,當推進器向引入 軌道6112推進半導體帶SS之一端時.,該夾持器611〇拾取並拉動 . · · 該半導體帶SS之另-端’以使得該半導碰帶別可被輕鬆第饋送。 - · . 該裝載器6105還包含一引入執道6112。該引入軌道6112被 设置為推進器6106與夾持器6110之移動路徑。該引入軌道6112 包含一對執道。該引人軌道6112之上可放置一半導體帶ss。Ub4U87 receives the workpiece to be reinforced, 'listening stage _ reading; - _ part, used to add I to the installed guard; and... cleaning the 戦 (10) 〇 for cleaning and drying Workpiece after work. The loading unit 6100 includes a plurality of shoe boxes 61〇2. In each of the loading boxes, the ss is placed in the form of y, y, and yy. Of course, only one semiconductor strip ss can be placed in each of the loading cassettes 6102. The loading unit 6100 further includes a conveying unit 61〇4 for feeding the first loading cassette 61() 2 one by one. The conveyor (10) 4 can be used in a variety of drive systems. Preferably, the 'transport device _ uses a belt drive system. A loader 61〇5 is disposed at one end of the conveyor_4. The loader pack 61〇5 3 advances benefit 6106. The pusher 6106 is configured to move the semiconductor strip ss placed in the loading cassette 61〇2 sent via the transport device 61〇4 one by one by pushing the semiconductor strip ss at one end and causing the semiconductor strip ss to be ground-by-ground Placed on the introduction road 6112. The introduction rail 6112 will be described in detail below. The loader 6105 also includes a gripper 611〇. A holder 611 is disposed at one end of the loading case 6102 and opposite the pusher 6106. Therefore, when the pusher advances one end of the semiconductor strip SS toward the lead-in rail 6112, the gripper 611 picks up and pulls. · The other end of the semiconductor strip SS is made such that the semi-conducting strap can be easily The first feed. - The loader 6105 also includes an introduction lane 6112. The introduction rail 6112 is provided as a moving path of the pusher 6106 and the holder 6110. The introduction track 6112 includes a pair of tracks. A semiconductor strip ss can be placed over the lead-in track 6112.

1364087 饋送部6200設置為正交與裝載部6100。該饋送部62〇〇係用 以從該裝载部6100饋送半導體帶SS至清洗/乾燥部64〇〇。饋送部 6200包含一饋送執道62〇2。第一拾取器62〇4以及第二拾取器62〇6 設置與該饋送軌道6202上方,以便二者可沿該執道進行移動。 . 較佳地,第一拾取器6204配置與饋送執道62〇2上方與裝載 "卩6100相鄰處。在該種情況下,第一拾取器6204可輕鬆地對半 導體帶SS進行拾取,並饋送該半導體帶ss至下文將加以詳述之 夾盤台6304。 車父佳地,第二拾取器62〇6配置與饋送執道62〇2上方與清洗, 乾燥部6400相鄰處。在該種情況下,第二拾取器62〇6可輕鬆地 對半導體帶SS進行拾取,並饋送該半導體帶%至清洗/乾燥部 6400 〇 對各半導體帶SS進行加工之切割部6300被設置於饋送軌道 6202中央部分之下方。 切割部6300包含夾盤台單元6302,該夾盤台單元63〇2係可 ^動^ Y財向上做水平鶴。將要進行加主之—條或多條 體帶SS _定於繼旱元礙之上表面。該切割部議 還匕含一切群元咖,_以沿著半導體帶SS上之一直線對 帶SS進行加工,切割單元632啊 該切割部63GG進—步包含-傳4單it 633G,伽以誇取將 被加工之半導體f SS位置之資訊並發送侧所得之位置^訊至 45 1364087 夹f台單元6302及切割單元632〇,以使切割單元632〇之加工位 置知以校正。紐上述結構,該切卿構成了—半導體封裳加工 裝置。 誠然,該半導體封裝加卫裝置可作為-工件加工裝置而並非 用於半導體帶SS <加工。例如,該加工裝置可用於在—工件上形 成某種標記。 如「第15圖」示出,夾盤台單元63〇2包含夾盤台鑛各 夹盤台6304制以在—半導體帶%之谓其進行支#,以及一 炎盤台饋送器63G6用以職盤台_4進行饋送。 在透過切割單元6320進行加工作業時,各夾盤台6304係用 以在-半導體帶ss之下進行支撐。下文賴_單元632〇 進行之加工作業加以詳述。本領域之技術人員應當意識到該失盤 台6304可具有任意結構。 夾盤.台饋送器63H)包含:—第—饋送構件6312,係用以在χ 軸方向饋达缝台⑽4 ;—第二饋送構件63ΐ4,係用以在Υ抽方 向饋送夾盤細4 ;以痛個轉動構件6315,_以轉動該夹盤. 台 6304。 該第,饋送構件6314配置為正交於饋雜道62()2。第二饋送 構件6314係肋在γ軸方向上饋送該失盤纟㈣4,第—饋送構 件6312配置為正父於該第二饋送構件⑶*。第一饋送構件&祀 用於在Χ軸額上饋送第二饋送構件6314。 46 1364087 第二饋送構件6314可包含若干個平行設置之饋送構件。在本 實施例中,第二饋送構件6314包含四個饋送構件,即,一號第二 饋送構件6314a ’二號第二饋送構件63i4b,三號第二饋送構件 6314c以及四號第二饋送構件6314d。 - 為每一夾盤台6304設置轉動構件6315,該轉動構件6315用 - 於轉動該夾盤台6304。由於切割單元6320是固定的,所以在切割 >單元6320運行過程.中,每-轉動構件6315使與之相關的爽盤台 6304相對與切割單元6320進行轉動。透過該方式,可使半導體帶 被加工成各種形狀。 切割單元6320被設置於第二饋送構件6314上方。該切割單 元6320用於對位於|一夾盤台63〇4上之半導體帶%進行加工。 對於該切割單元6320而言,可以應用各種切割裝置。在「第 15圖」中所示出之本實施例中,該切割單元632〇可包含一刀片。 該刀片用於沿直線對半導體帶SS進行加工,如「第u圖」 以及「第12圖」中所示出。誠然,該半導體帶%可被加工成半 . 導體封裝SP。 . … :^ 在「第15圖」所示出之實施例中,可應甩若干刀片,其中, 兩對刀片为別應用於第一切割單元632〇a與第二切割單元632〇b。 第切割早元6320a以及苐二切割單元6320b設置於第上饋 送構件6314之上方。如「第15圖」所示出,第一切割單元纪2〇a 以及第二切割單元6320b可分別設置於-號第二饋送構件6314a1364087 The feeding portion 6200 is disposed to be orthogonal to the loading portion 6100. The feeding portion 62 is for feeding the semiconductor tape SS from the loading portion 6100 to the cleaning/drying portion 64A. The feeder 6200 includes a feed lane 62〇2. The first picker 62〇4 and the second picker 62〇6 are disposed above the feed track 6202 so that both can move along the way. Preferably, the first picker 6204 is disposed adjacent to the loading lane 62〇2 and adjacent to the loading "卩6100. In this case, the first picker 6204 can easily pick up the semiconductor strip SS and feed the semiconductor strip ss to the chuck table 6304 which will be described later in detail. The car owner, the second picker 62〇6 is disposed above the feeding lane 62〇2 and adjacent to the washing and drying section 6400. In this case, the second picker 62〇6 can easily pick up the semiconductor tape SS and feed the semiconductor tape% to the cleaning/drying section 6400. The cutting section 6300 for processing each semiconductor tape SS is set in Below the central portion of the feed track 6202. The cutting portion 6300 includes a chuck table unit 6302, which is capable of making a horizontal crane. The strip or strips SS to be added to the main body are set on the surface above the drought. The cutting part also contains all the group of coffee, _ to process the belt SS along a straight line on the semiconductor strip SS, the cutting unit 632, the cutting part 63GG into the step contains - pass 4 single it 633G, The information of the semiconductor f SS position to be processed is taken and the position obtained by the transmitting side is sent to the 45 1364087 clip unit 6302 and the cutting unit 632 〇 so that the processing position of the cutting unit 632 is corrected. In the above structure, the Qi Qing constitutes a semiconductor sealing device. It is true that the semiconductor package-assisting device can be used as a workpiece processing device and not as a semiconductor tape SS < For example, the processing device can be used to form a mark on the workpiece. As shown in Fig. 15, the chuck table unit 63〇2 includes the chuck table and the respective chuck table 6304, and the semiconductor tape carrier is used for the branch #, and the disk table feeder 63G6 is used for The platter _4 is fed. When the machining operation is performed by the cutting unit 6320, each chuck table 6304 is used to support under the semiconductor strip ss. The processing operations performed by the unit 632 下文 are detailed below. Those skilled in the art will appreciate that the lost station 6304 can have any configuration. The chuck table feed 63H) comprises: a first feeding member 6312 for feeding the sewing table (10) 4 in the yaw direction; and a second feeding member 63 ΐ 4 for feeding the chuck thin 4 in the squeezing direction; The member 6315 is rotated by a pain to rotate the chuck. Table 6304. The first, feed member 6314 is configured to be orthogonal to the feed chute 62()2. The second feeding member 6314 feeds the lost disk (4) 4 in the γ-axis direction, and the first feeding member 6312 is configured to be the parent to the second feeding member (3)*. The first feeding member & 祀 is for feeding the second feeding member 6314 on the yoke amount. 46 1364087 The second feed member 6314 can comprise a plurality of feed members disposed in parallel. In the present embodiment, the second feeding member 6314 includes four feeding members, that is, the first feeding member No. 6314a 'the second feeding member 63i4b, the second feeding member 6314c, and the second feeding member 6314d . - A rotating member 6315 is provided for each chuck table 6304, and the rotating member 6315 is used to rotate the chuck table 6304. Since the cutting unit 6320 is fixed, in the operation of the cutting > unit 6320, the per-rotation member 6315 rotates the refresher table 6304 associated therewith with the cutting unit 6320. In this way, the semiconductor tape can be processed into various shapes. The cutting unit 6320 is disposed above the second feeding member 6314. The cutting unit 6320 is used to process the semiconductor tape % located on the | chuck stage 63〇4. For the cutting unit 6320, various cutting devices can be applied. In the embodiment shown in "Fig. 15", the cutting unit 632 can include a blade. The blade is used to process the semiconductor strip SS in a straight line as shown in "Fig. u" and "Fig. 12". It is true that the semiconductor strip % can be processed into a half. Conductor package SP. In the embodiment shown in Fig. 15, a plurality of blades may be applied, wherein the two pairs of blades are applied to the first cutting unit 632a and the second cutting unit 632b. The first cutting element 6320a and the second cutting unit 6320b are disposed above the upper feeding member 6314. As shown in FIG. 15, the first cutting unit 2a and the second cutting unit 6320b may be respectively disposed at the -number second feeding member 6314a.

• I * . · • . · . - · 47 · 1364087 以及三號第二饋送構件6314c上方,或分別設置於二號第二饋送 構件6314b以及四號第二饋送構件6314d上方。 傳感單元6330没置於第二饋送構件6314上方並位於該第二 饋送構件6314之一端。 該傳感單元6330包含一視頻獲取器6332,該視頻獲取器6332 用以對安裝於夾盤台6304上之半導體帶ss之位置進行檢測,其 中,該夾盤台6304與第二饋送構件6314相連接。該視頻獲取器 6332對半導體帶SS之位置進行檢測,並發送所檢測到之位置資 訊至田射切割裝置之控制S (附财未示幻,從而對相關失盤台 6304之Y軸以及θ角位置進行調節,並對相關刀片之χ軸位置進 行調節。 一視頻獲取器軌道6334設置於第二饋送構件6314之上,言 視頻獲取H贿63;Μ正交於第二饋雖件6314且平行於第一看 送構件6312。並且’視頻獲取器6332可沿視頻獲取器執道幻3, 進行移動。 , , - · · 清洗/乾燥部6400設置於第二拾取器62〇6之移動路捏上。自 清洗/乾轉嶋麟綺半導料加王完錢,從半導體封潘 SP上移除雜質。—乾燥區6500設置於清洗/乾燥部6400之—側、 用於在清洗/乾燥部6400之操作完畢後,移除位於半導體封貝 水分等之雜質。. : 題上知 下面’依據本聲明之第四實施例對具有上述配置之半導體帶 48 加工系統進行描述。 如「第15圖」所示出者一丰 驻共a 田牛導體帶SS位於裝載部6100> 裝載盒6102上時,傳縣罢⑽μ ㈣。丨6100之 61〇6。 钱置續饋送魏载盒6Η)2至推進器 61〇6=術_於_祕至移動方向對準後,該推進! 開始運行。伴隨推 $丨入執道私,彻㈣被咖 首田半導體tSS向引入執道6112移動時,夹持器石⑽拾取半 V體帶SS上於推進器祕相對之一侧,並向引入軌道6112推進 5半導體f SS。即,伴隨推進器61〇6以及夹持器611〇之合作, 半導體帶SS被安置糾入執道 6112 内。 當該丰導體帶ss被安置於引入執道6m㈣,第一拾取器 6204沿饋送軌道6202移動並拾取安置於引入軌道6112内之半導 體f SS。該第一拾取器62〇4放置所拾取之半導體帶ss於夾盤台 6304之上’該失搫台6304設置於二號第二饋送構件6314b或四號 第一饋送構件6314d上。而後.,該第一拾取器6204以相同.方式放 置另一半導體帶SS於另一失盤台6304之上,玆另一夾盤台6304 - . * · 也設置於二號第二饋送構件6314b或四號第二饋送構件6314d 上。誠然,第一拾取器6204.也可放置所拾取之半導體帶SS於設 .置於一號第二饋送構件0314a或三號第二饋送構件6314c之夾盤 台6304上。 49 1364087 當半導體帶ss被分別安置於與二號第二饋送構件63 i 4b以及 四號第二饋送構件6314d相耦合之夾盤台63〇4之上時,兩個夾盤 台分別沿相應的饋送構件在γ轴上移動。 當夹盤台63G4沿Y軸方向進行移動時,^做盤台經過傳感 單7L 6330。此時,傳感單元633〇之視頻獲取器6332獲取關於半 導體帶SS位於運動中每—夹盤台上位置之資訊,並將該資訊送往 切割單元6320之控制器。 該位置貧訊係透過傳感單元633〇之視頻獲取器6332對半導 體帶SS上某位置上特定標記之位置進行檢測而獲取。基於上述位 置資訊’可以確定半導體帶%之位置。 當接收的上述資訊之後,根據所接收到之資訊該控制器對於 切割單元6320夾盤台之位置以及刀片之位置進行校正。在此種狀 况中如第丨5圖」所示出,由於切割單元6320設置於二號第 二饋送構件6314b與四絲二饋送構件6314d之上,所以該傳感 早το 6330對安裝於二號苐二饋送構件6314b與四號第.二饋送構件 6314d上之夾盤台63〇4之位置進行檢測。 同時’當對位於二號第二饋送構件6314b與四號第二饋送構 件6314d上之半導體帶ss進行加工時,其他半導體帶%被放置 於一號第二饋送構件6314a與三號第二饋送構件 6314c.上.。. > 田對位於二號第二饋送構件6314b與四號.第二饋送構件 6314(1上之半導體帶ss之加工完畢時,構成第二饋送構件6314 50 1364087 之各饋送構件同時透過第一饋送構件6312沿χ轴進行移動。由 此’ 一號第二饋送構件6314a與三號第二饋送構件6314c之央盤 台6304被置於切割單元6320下方。 同樣地,如「第15圖」所示出,透過相關轉動構件( 轉動’夾盤台6304上之半導體帶ss被切割成理想之形狀• I * . . . • • • • - 47 · 1364087 and the second feed member 6314c on the third, or respectively disposed above the second feed member 6314b and the second feed member 6314d. The sensing unit 6330 is not placed above the second feeding member 6314 and is located at one end of the second feeding member 6314. The sensing unit 6330 includes a video acquirer 6332 for detecting the position of the semiconductor strip ss mounted on the chuck table 6304, wherein the chuck table 6304 is associated with the second feeding member 6314. connection. The video acquirer 6332 detects the position of the semiconductor strip SS and transmits the detected position information to the control S of the field cutting device (the wealth is not displayed, so as to the Y-axis and the θ angle of the associated lost table 6304). The position is adjusted and the position of the axis of the associated blade is adjusted. A video acquirer track 6334 is disposed on the second feeding member 6314, and the video captures the bribe 63; Μ is orthogonal to the second feed 6314 and is parallel At the first viewing member 6312. And the 'video acquirer 6332 can perform the movement along the video acquirer 3, and the cleaning/drying portion 6400 is disposed on the moving path of the second picker 62〇6. On the self-cleaning/drying unicorn 绮 semi-conductive material plus Wang Wanqian, remove impurities from the semiconductor seal Pan SP. - Drying area 6500 is set on the side of the cleaning/drying section 6400, used in the cleaning/drying section After the operation of the 6400 is completed, the impurities located in the moisture of the semiconductor package are removed. . : The following is a description of the semiconductor tape 48 processing system having the above configuration according to the fourth embodiment of the present specification. The one shown A total of a field cattle conductor belt SS is located in the loading part 6100> when loading the box 6102, Chuan County strikes (10) μ (four). 丨6100 of 61〇6. Money continues to feed Wei box 6Η) 2 to propeller 61〇6=术_ _ Secret to the direction of the movement, the advancement! Start running. With the push of $ 丨 执 , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , 6112 advances 5 semiconductor f SS. That is, with the cooperation of the pusher 61〇6 and the holder 611〇, the semiconductor tape SS is placed in the correction path 6112. When the rich conductor strip ss is placed in the lead-in lane 6m (four), the first picker 6204 moves along the feed track 6202 and picks up the semiconductor f SS disposed in the lead-in rail 6112. The first picker 62 〇 4 places the picked semiconductor strip ss on the chuck table 6304. The trip unit 6304 is disposed on the second feed member 6314b or the fourth feed member 6314d. Then, the first pickup 6204 places another semiconductor tape SS on the other loss table 6304 in the same manner, and the other chuck table 6304-.* is also disposed on the second feed member 6314b. Or on the fourth feed member 6314d. It is true that the first pick-up 6204. may also place the picked semiconductor strip SS on the chuck table 6304 of the first feed member 0314a or the second feed member 6314c. 49 1364087 When the semiconductor strips ss are respectively disposed on the chuck table 63〇4 coupled to the second feed member 63 i 4b and the second feed member 6314d, the two chucks are respectively along the corresponding The feed member moves on the gamma axis. When the chuck table 63G4 moves in the Y-axis direction, the disk table passes through the sensing unit 7L 6330. At this time, the video acquirer 6332 of the sensing unit 633 obtains information on the position of the semiconductor strip SS on each of the chucks in motion, and sends the information to the controller of the cutting unit 6320. The positional interference is obtained by detecting the position of a specific mark at a certain position on the semiconductor strip SS through the video acquirer 6332 of the sensing unit 633. Based on the above position information ', the position of the semiconductor strip % can be determined. After receiving the above information, the controller corrects the position of the chucking table 6320 and the position of the blade based on the received information. In this case, as shown in FIG. 5, since the cutting unit 6320 is disposed on the second feeding member 6314b and the four-wire feeding member 6314d, the sensing is installed on the second το 6330 pair. The position of the second feeding member 6314b and the chuck table 63〇4 on the fourth feeding member 6314d is detected. Meanwhile, when the semiconductor tape ss located on the second feed member 6314b of the second and the second feed member 6314d of the fourth number are processed, the other semiconductor tape % is placed on the second feed member 6314a and the second feed member No. 3. 6314c.上. >> When the processing of the semiconductor tape ss on the second feeding member 6314b and the fourth feeding member 6314 is completed, the respective feeding members constituting the second feeding member 6314 50 1364087 are simultaneously transmitted through the first The feeding member 6312 is moved along the z-axis. Thus, the first-stage second feeding member 6314a and the third-stage feeding member 6314c are placed under the cutting unit 6320. Similarly, as shown in Fig. 15 It is shown that the semiconductor strip ss on the chucking stage 6304 is cut into a desired shape through the associated rotating member

在上述方式中’全部央盤台鑛之上的半導體帶%被加工 成半導體城。在對料導體帶%峨行之_完紅後,央盤 台6304透過夾盤台饋送器631〇被送回初始位置。 當全部夾盤台6304被送回初始位置之後,第二拾取器62〇6 沿饋送執道㈣被送至越台㈣4上方至區域,,該第二 拾取器6施拾取該半導體封裝犯,並饋送其至清洗/乾燥部6400。 、在清洗戦部6_巾,辭導體封裝处被清洗並乾燥。透 過設置於清洗/乾燥部6400 一侧至乾燥區6500,殘留於該半導體 封裝上之水分被徹底清除。 乂下豸依據本發明對第五實施例之半導體帶加工系統之結 果進行詳細描述。 第圖」所不出’該半導體帶加工系統主要包含:一裝 載4 7100,係用以裝載半導髀 ,^ 體帶切_導_ . 測,係_半導 择·、. 職,卸載部7_,係用以卸載該半導體封 饋送丰U送。p 72GG ’係用以向裝戴部屬以及切割部7300 知彻爾向域物G崎編裝。 1^04087 裝载部7100包含複數個裝載盒7102。各裝載盒7102中,依 知、卡帶盒之形式擺放需要進行加工之複數個半導體帶ss.e當然, 各裝载盒7102中只能擺放一個半導體帶s§。 裝載部7100還包含一第一傳送裝置71〇4。係用以逐一饋送裝 载盒7102,該第一傳送裝置71〇4可以應用各種驅動系統較佳 地’該第-傳送裝置71〇4可以應用帶式驅動系統。 於第一傳送裝置7104之一侧設置一推進器7106。該推進器 7106用於透過在一端推進半導體帶SS,從而逐一地移動經由第一 傳迗裝置7104送來的裝載盒71〇2中所擺放之半導體帶%,並使 得半導體帶ss逐一地安置於第一拾取器執道7206上,下文將對 第一拾取器軌道7206加以詳述。 於裝載部7100之一端設置一饋送部72〇〇。該饋送部72〇〇包 含一饋送軌道7202以及一第一拾取器7204,該第一拾取器72〇4 -被設置為可沿饋送軌道72〇2進行移動。該第一拾取器72〇4逐一 地拾取裝载於裝載部7100中之乎導體帶ss,並饋送上述半導體 帶SS至炎盤台7316,下文將對該夾盤台7316進行詳述。 該第一拾取器7204包含一笫一拾取器軌道7206。該第—拾取 器軌道7206包含一對執道◊當第一拾取器72〇4進行移動時第 一拾取器軌道7206用於放置半導體帶。 第一拾取器72〇4還包含一第一夾持|| 72〇8。該第一来持哭 7208被設置於推進器7106對面。因此,當推進器7106向第一拾 52 1364087 取器轨道7206推進一半導體帶%之一侧時,該第一夾持器㈨ 拾取並牽引該半導體帶SS之另一側。 該第一拾取器7204還包含一傳感單元721〇。該傳感單元721〇 用於獲取夾盤台7316上半導體帶SS位置之資訊並傳送偵測所得 位置貧訊至切割部7300 〇下文將對夾盤台7316進行詳細描述。 切割部7300設置於饋送軌道72〇2中央部分之下方。該切割 部7300包含一夾盤台饋送執道.73〇2,該軌道設置為正交於饋送軌 道 7202 。 一夾盤台單元7304被安裝於夾盤台饋送軌道7302之上,這 樣該夾盤台單元7304便可沿該軌道進行移動。該夾盤台單元73〇4 包含至少一個夹盤台7316。該夾盤台7316透過夾盤台單元7304 被饋送。該失盤台單元7304還包含一驅動體系(body) 7306。該 驅動體系7306包含一水平驅動器7308以及一垂直驅動器7310。 該水平驅動器7308包含一驅動器(如:馬達),用於沿夹盤台饋 送軌道7302水平地移動夾盤台7316。誠然,該水平驅動器7308 可設置為能沿夾盤台饋送軌道7302在X軸與Y軸兩個方向上移 動夾盤台7'316〇 : - ' * ^ - . 該垂直驅勢器7310包含一垂直滑執7312。該垂直滑執7312 . - : 用於使夾盤台7316在其上垂直移動。相似地,水平驅動器7308 • . - · · ·、 也包含一垂直驅動器力1〇。該垂直驅動器7310用於使夹盤台7316 • . - · 在其上垂直移動。 53 1364087 至少一個支撐台7314配置於垂直滑執7312之一端,以便其 正交於該垂直滑軌7312。該支撐台7314可是夹盤台7316放置於 其上。該支撐台7314可接收垂直驅動器7310,並沿垂直滑軌7312 垂直地進行移動。 - 在透過切割單元7318進行加工作業時,各夾盤台7316用於 • 在一半導體帶SS之下對其進行支撐。下文將對切割單元7318進 行之加工作業加以詳述。本領域之技術人員應當意識到該夾盤台 7316可具有任意結構。 可透過一個支撐台7314對若干個来盤台7316進行支撐。在 本發明所示出之實施例中,兩個夹盤台7316平行第放置於支撐台 7314之上,這樣便可於切割單元7318之數量相匹配,下文將對該 切割單元7318進行詳細描述。 如「第17圖」所示出,可以設置一對夾盤台饋送執道73〇2。 在這種情況下,可以設置一對夾盤台單元73〇4,使其可分別沿上 述兩條夾盤台饋送軌道7302進行移動。如上所述,可以防止夾盤 台單元7304在夾盤台之垂直移動中發生相互干擾。為了方便描 述’下文只給出一個切割單元7318。: 切割單元7318配置於夾盤台單元綱之上方的—條移動路 徑中,在該路徑延伸方向上,夾盤台單元73〇4沿夾盤台饋送軌道 73〇2移動。該切割單元7318币於切割位於夾盤台7316之上的半 導體帶,以使之成為半導體封裝。 • ' : 54 1364087 ^ 73 B;T^ ^,〇 了^姆^置。_,_解元加還 議繼L頂嫩—雷射切割^ 刀》j早兀測細贿。对肋職置包含錢於: 7:部。透過包含於該雷射切割裝置中之控制器對該頭; 〇之X轴、Y軸以及Θ角位置進行控制。如「第1〇圖」所干 出,該雷射切割裝置用於沿直線以及曲線對半導體帶ss進行加 工。 可以應用多個雷射切割裝置,在本實施例中,由於兩個夹盤 台7316平行設置,較佳地應用了兩個雷射切割裝置。 於饋送執道7202上與裝载部71〇〇之相對端設置卸載部 7_。該卸綱7_峰紐個域盒期。於物載盒顺 中,擺放經加工後之半導體帶ss。t然各域盒·2中只可擺 放一個半導體帶SS。 卸載部7400還包含-第二傳送裝置74〇4,甩以逐個饋送各卸 载益7402,該第二傳送裝置7404可應用各種驅動系統,較佳地-, 該第二傳送裝置7404可應用一帶式驅動系統。 於饋送部7200之饋送執道7202上方設置—第二拾取器。藉 以拾取並饋送加工後之半導體封裝。該第二拾取器軌道7214包含 一第二拾取器轨道7214。第二拾取器軌道7214包含一對軌道。該 第二拾取器軌道7214用於在第二拾取器7212移動過程中,在丰 . · · 55 叫U87In the above manner, the % of the semiconductor tape on the entire central disk mine is processed into a semiconductor city. After the red balance of the material conductor belt is completed, the center disk 6304 is returned to the initial position through the chuck table feeder 631. After all the chuck tables 6304 are returned to the initial position, the second picker 62〇6 is sent to the area above the crossover (four) 4 along the feeding lane (4), and the second picker 6 picks up the semiconductor package, and It is fed to the washing/drying section 6400. In the cleaning of the crotch portion 6_ towel, the conductor package is cleaned and dried. The moisture remaining on the semiconductor package is completely removed by being disposed on the side of the cleaning/drying portion 6400 to the drying zone 6500. The results of the semiconductor tape processing system of the fifth embodiment will be described in detail in accordance with the present invention. The figure "cannot be produced" The semiconductor tape processing system mainly includes: a loading of 4,7100, which is used to load a semi-conducting crucible, and a body strip cutting _ _ _ _ _ _ semi-guided ·, . 7_ is used to unload the semiconductor package and send it. p 72GG ' is used to assemble the genus and the cutting unit 7300 to the domain object G. 1^04087 The loading unit 7100 includes a plurality of loading boxes 7102. In each of the loading cassettes 7102, a plurality of semiconductor strips ss.e which need to be processed are placed in the form of a cassette, and of course, only one semiconductor strip s § can be placed in each of the loading cassettes 7102. The loading unit 7100 further includes a first conveying device 71〇4. It is used to feed the loading cassette 7102 one by one, and the first conveying device 71〇4 can apply various driving systems. Preferably, the first conveying unit 71〇4 can apply the belt driving system. A pusher 7106 is disposed on one side of the first conveyor 7104. The pusher 7106 is configured to move the semiconductor strips SS placed in the loading cassette 71〇2 sent through the first transfer device 7104 one by one by pushing the semiconductor strips SS at one end, and to place the semiconductor strips ss one by one. On the first picker path 7206, the first picker track 7206 will be described in detail below. A feeding portion 72 is provided at one end of the loading portion 7100. The feeding portion 72 includes a feeding track 7202 and a first pickup 7204 which is arranged to be movable along the feeding track 72〇2. The first pick-up 72 〇 4 picks up the conductor strips ss loaded in the loading portion 7100 one by one, and feeds the above-described semiconductor strips SS to the stencil table 7316, which will be described in detail below. The first picker 7204 includes a pick-up picker track 7206. The first picker track 7206 includes a pair of tracks. The first picker track 7206 is used to place the semiconductor tape when the first picker 72 is moved. The first picker 72〇4 further includes a first clamp || 72〇8. The first crying 7208 is placed opposite the pusher 7106. Therefore, when the pusher 7106 advances one side of the semiconductor strip % to the first pick-up 52 1364087 picker rail 7206, the first gripper (9) picks up and pulls the other side of the semiconductor strip SS. The first picker 7204 further includes a sensing unit 721A. The sensing unit 721 is used to acquire the information of the position of the semiconductor strip SS on the chuck table 7316 and transmit the detected position to the cutting portion 7300. The chuck table 7316 will be described in detail below. The cutting portion 7300 is disposed below the central portion of the feed rail 72〇2. The cutting portion 7300 includes a chuck table feed path .73〇2 that is disposed orthogonal to the feed track 7202. A chuck table unit 7304 is mounted on the chuck table feed track 7302 so that the chuck table unit 7304 can be moved along the track. The chuck table unit 73〇4 includes at least one chuck table 7316. The chuck table 7316 is fed through the chuck table unit 7304. The lost table unit 7304 also includes a drive body 7306. The drive system 7306 includes a horizontal driver 7308 and a vertical driver 7310. The horizontal drive 7308 includes a driver (e.g., a motor) for horizontally moving the chuck table 7316 along the chuck table feed track 7302. It is true that the horizontal drive 7308 can be configured to move the chuck table 7' 316 in both the X-axis and the Y-axis along the chuck table feed track 7302: - ' * ^ - . The vertical actuator 7310 includes a Vertical slip 7312. The vertical slip 7312 . - : is used to vertically move the chuck table 7316 thereon. Similarly, the horizontal drive 7308 • - - · · · also includes a vertical drive force of 1 〇. The vertical drive 7310 is used to move the chuck table 7316. 53 1364087 At least one support table 7314 is disposed at one end of the vertical slide 7312 so as to be orthogonal to the vertical slide 7312. The support table 7314 can be on which the chuck table 7316 is placed. The support table 7314 can receive the vertical drive 7310 and move vertically along the vertical slide 7312. - When performing a machining operation through the cutting unit 7318, each chuck table 7316 is used to • support it under a semiconductor strip SS. The processing of the cutting unit 7318 will be described in detail below. Those skilled in the art will appreciate that the chuck table 7316 can have any configuration. A plurality of trays 7316 can be supported by a support table 7314. In the illustrated embodiment of the invention, the two chuck stages 7316 are placed in parallel on the support table 7314 so that the number of cutting units 7318 can be matched, as will be described in more detail below. As shown in "Fig. 17", a pair of chuck table feeding lanes 73〇2 can be provided. In this case, a pair of chuck table units 73A can be provided so as to be movable along the two chuck table feed rails 7302, respectively. As described above, it is possible to prevent the chuck table unit 7304 from interfering with each other in the vertical movement of the chuck table. For convenience of description, only one cutting unit 7318 is given below. The cutting unit 7318 is disposed in the strip moving path above the chuck table unit, and in the path extending direction, the chuck table unit 73〇4 moves along the chuck table feeding track 73〇2. The cutting unit 7318 cuts the semiconductor strip over the chuck table 7316 to make it a semiconductor package. • ' : 54 1364087 ^ 73 B;T^ ^,〇^^^^. _, _ Jie Yuan plus also negotiated L Ding - laser cutting ^ knife" j early test of bribes. For the rib job, the money is included in: 7: Department. The X-axis, the Y-axis, and the corner position of the head are controlled by a controller included in the laser cutting device. The laser cutting device is used to process the semiconductor strip ss along a straight line and a curve as in "Fig. 1". A plurality of laser cutting devices can be applied. In the present embodiment, since the two chuck tables 7316 are disposed in parallel, two laser cutting devices are preferably applied. An unloading portion 7_ is provided on the opposite end of the feeding path 7202 from the loading portion 71. The unloading 7_ peak area is a box period. The processed semiconductor strip ss is placed in the object carrier. However, only one semiconductor strip SS can be placed in each domain box·2. The unloading portion 7400 further includes a second conveying device 74〇4 for feeding each unloading benefit 7402 one by one, the second transmitting device 7404 being applicable to various driving systems, preferably, the second transmitting device 7404 can be applied with a belt type Drive System. A second pickup is disposed above the feeding lane 7202 of the feeding portion 7200. The processed semiconductor package is picked up and fed. The second picker track 7214 includes a second picker track 7214. The second picker track 7214 includes a pair of tracks. The second picker track 7214 is used during the movement of the second picker 7212, and is called U87.

導體帶下謂麵行H -第二夹持器7216設置於第二拾取器軌道72i4上方 ===置峰㈣㈣4上之半導體帶 下面,依據本發明對第五實施例中 加以描述。 牛導體π加工糸統之運行 备—半導體帶SS被安裝於裝载部之裝載盒71〇2 _ 3置:=轉,借以使得該裝載盒7102運動至第一推進器 1=。爾載姆-細鳩鮮時,第—推進器鳩 轉’借以使得該裝載盒71G2運動至第—拾取錄道·。 时當該半導體帶SS向第-拾取器軌道72〇6運動時第一夹持 态72〇8拾取半導體帶ss上與第一推進器雇相對之—端並向 第一拾取H執it 72G6絲該半導體帶ss。即,透 71〇6以及第-失持器麗之協作,半導體帶沾被安置於第一= 取器軌道7206上。 口 1 · · _ 田半導體tSS.被安置於第一拾取器軌道72〇6上時,第一衿 取器7204沿饋送部72〇〇之饋送執道72〇2運動至切割部测。當 第-拾取H 7204接近該_部7時,該_部73⑻之夹盤台 單元7304被置於第一拾取器72〇4之下方^ 隨後,第-拾取器7204放置該半導體帶於爽盤台單元綱 中。當該半導體帶被放置於夹盤台單元MM中時,第一拾取器 56 1364087 7204之傳感單元7210被置於夾盤台單元7304之下方。 傳感單元7210獲取半導體帶SS與夾盤台7316間位置關係之 資訊’並傳送其所獲之資訊至切割部73〇〇。 在接收到上述資訊後,切割部73〇〇根據該資訊對切割單元 7318之頭部7320之位置進行校準。之後,該夾盤台單元73〇4沿 夹盤台饋送軌道7301運動至切割單元7318下方之一區域。 當夾盤台單元7304位於切割單元7318下方之一區域時,該 切割單元7318於夾盤台單元7304之上切割該半導體帶^在半導 體帶切割完畢後,該夾盤台單元73〇4沿夾盤台饋送執道73〇2回 到其初始位置。 當該夾盤台單元7304回到其初始位置時,第二拾取器7212 運動至失盤台7316上方一區域。隨後,該第二拾取器DU拾取 加工像至之半導體帶SS,並放置該半導體帶ss於第二拾取器執 if 7214 ° 口 當半導體帶SS被放置第二拾取器執道7214時,第二夾持哭 7414推動該半導體帶SS使其進入“卸栽盒7402。當該半導體& 被置於-卸載盒74〇2中時,第二傳送裝置MO4傳送該半導體 .帶SS至下一階段。由此,依據本發明之半導體帶加工系之 作業完畢。'… * • * · 雖然本發明以前述之較佳實施例揭露如上,然其並田' 疋本發明,任何熟習相像技藝者,林脫離本發明之精神和範圍 57 内 本=些許由之更動與潤飾’因此本發明之專利保護範圍須視 兄明書所附之申請專利範圍所界定者為準。 上述本胸之半導體帶加工純係具有町功效: 之切由麟半導體帶加工⑽包含有—具有鐳射切割裝置 早70故其可料導體帶蹄加卫The conductor strips are described below. The second holder 7216 is disposed above the second pickup track 72i4. ===The semiconductor strip on the peak (4) (4) 4 is described below in accordance with the present invention. Operation of the cattle conductor π processing system The semiconductor tape SS is mounted on the loading box of the loading section 71 〇 2 _ 3 set: = turn, whereby the loading box 7102 is moved to the first thruster 1 =. When the carrier is fine, the first pusher is rotated to cause the load box 71G2 to move to the first pick-up track. When the semiconductor strip SS moves toward the first picker track 72〇6, the first clamping state 72〇8 picks up the opposite end of the semiconductor strip ss from the first pusher and proceeds to the first pick H. The semiconductor strip ss. That is, the semiconductor strip is placed on the first = picker track 7206 in cooperation with the 〇6〇6 and the first-disarmer. When the port 1 · · _ field semiconductor tSS. is placed on the first picker track 72〇6, the first picker 7204 moves along the feed channel 72〇2 of the feed portion 72〇〇 to the cutting portion. When the first pick H 7204 is close to the _ portion 7, the chuck table unit 7304 of the _ portion 73 (8) is placed under the first picker 72 〇 4 ^ Subsequently, the first pick-up 7204 places the semiconductor strip on the sizzling In the unit unit. When the semiconductor strip is placed in the chuck stage unit MM, the sensing unit 7210 of the first picker 56 1364087 7204 is placed below the chuck stage unit 7304. The sensing unit 7210 acquires the information 'the positional relationship between the semiconductor strip SS and the chuck table 7316' and transmits the information obtained thereto to the cutting portion 73A. Upon receiving the above information, the cutting portion 73 aligns the position of the head 7320 of the cutting unit 7318 based on the information. Thereafter, the chuck table unit 73〇4 moves along the chuck table feeding track 7301 to an area below the cutting unit 7318. When the chuck table unit 7304 is located in a region below the cutting unit 7318, the cutting unit 7318 cuts the semiconductor tape over the chuck table unit 7304. After the semiconductor tape is cut, the chuck table unit 73〇4 is clipped The table feed channel 73〇2 returns to its initial position. When the chuck table unit 7304 returns to its initial position, the second picker 7212 moves to an area above the lost table 7316. Subsequently, the second picker DU picks up the processed image to the semiconductor strip SS, and places the semiconductor strip ss on the second picker if 7214 ° when the semiconductor strip SS is placed on the second picker way 7214, second The clamping cry 4741 pushes the semiconductor strip SS into the "unloading box 7402. When the semiconductor & is placed in the unloading box 74A2, the second transfer device MO4 transfers the semiconductor. The SS is brought to the next stage. Thus, the operation of the semiconductor tape processing system according to the present invention is completed. '... * • * · Although the present invention has been disclosed above in the preferred embodiment of the foregoing, it is also known to the skilled artisan, The scope of the patent protection of the present invention is subject to the definition of the scope of the patent application attached to the brother's book. The semiconductor tape processing of the above chest is subject to the spirit and scope of the present invention. The pure system has the effect of the town: The cut is processed by the Lin semiconductor strip (10). It has a laser cutting device.

之半導體封«以滿足不_戶之需I M 上:帶㈣統另外包含有用於檢測逢 之資訊校依據透過該傳感單元獲取 進而提^=叫心細叫概如的產生, 【圖式簡單說明】 實施例之結構示 意圖; 第1圖為本發明之半導體帶加工系統之第一 意圖第2圖至第8圖為第⑶所示之系統進行連續作業之結構示 的平為依照本發簡被加卫之—轉體帶於加工前之狀態 平面=圖騎嘴示之糊帶_結構之第一實施例的 平面圖鱗9 _示之半賴料網結構之第二實施例的 58 1364087 第12圖 平面視圖; 第13圖 意圖; 第14圖 意圖; 為第9圖所示之半導體帶的切割結構之第三實施例的 為本發明之料«加^敗第二實補之結構示 為本發明之半導體帶加4統之第三實施例之結構示The semiconductor seal «to meet the needs of the households on the IM: the belt (four) system also contains the information used to detect the information according to the school through the sensor unit and then raise the number of calls to the details of the call, the outline of the simple description BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a first view of the semiconductor tape processing system of the present invention. FIG. 2 to FIG. 8 are diagrams showing the structure of the system shown in (3) for continuous operation. Guarding - the state of the swivel belt before processing = the slanting tape of the singer _ the first plan of the structure of the first embodiment of the scale 9 _ shows the second embodiment of the second embodiment of the structure 58 1364087 12 Fig. 13 is a view; Fig. 14 is intended; Fig. 14 is intended to be a third embodiment of the cutting structure of the semiconductor tape shown in Fig. 9, which is the structure of the invention The structure of the third embodiment of the semiconductor strip device of the invention is shown

第15圖 意圖; 為本發明之半導體帶加L之如實施例之結構示 第㈣為本發明之半導體帶加1系統之第五實_之結鮮 I、圖;以及 第Π圖為本發明之半導體帶加1系統之結構的正視圖。 【主要元件符號說明】FIG. 15 is a view showing the structure of the semiconductor strip of the present invention as shown in the fourth embodiment of the present invention. FIG. 4 is a fifth embodiment of the semiconductor strip plus 1 system of the present invention; FIG. A front view of the structure of the semiconductor strip plus 1 system. [Main component symbol description]

1〇〇 、 6100 、 7100 :裝载部 102、502、6102、7102 裝載盒 104、1004、7104 . · r 第一傳送裝置 105'6105 裝载器' 106 、 6106 、 7106 推進器 110 、 1010、 7208 第一夾持器 112 ' 1008 第—轉向軌道 200、600、6200、7200 饋送部 202、602、6202、7202 饋送軌道 59 1364087 204、604、6204、7204 206、606、6206、7212 300、700、6300、7300 302、3002、702、6302、7304 304、704、3230、7316、3004 310、710、6310 312、712、63121〇〇, 6100, 7100: loading units 102, 502, 6102, 7102 loading boxes 104, 1004, 7104. · r first conveyor 105'6105 loaders '106, 6106, 7106 propellers 110, 1010, 7208 first gripper 112' 1008 first-turn rails 200, 600, 6200, 7200 feeds 202, 602, 6202, 7202 feed rails 59 1364087 204, 604, 6204, 7204 206, 606, 6206, 7212 300, 700 , 6300, 7300 302, 3002, 702, 6302, 7304 304, 704, 3230, 7316, 3004 310, 710, 6310 312, 712, 6312

314、714、6314 314a、714a、6314a 314b、714b、6314b 314c 、 714c 、 6314c 314d、714d、6314d 320、720、6320、7318 320a、720a、6320a 320b、720b、6320b 330、730、6330、7210 332、732、6332 334 350 ' 750 400、950、7400 410 第一拾取器 第二拾取器 切割部 夾盤台單元 夹盤台 夾盤台饋送器 第一饋送構件 第二饋送構件 一號第二饋送構件 二號第二饋送構件 三號第二饋送構件 .四號第二饋送構件 切割單元 第一切割單元 第二切割單元 傳感單元 視頻獲取器 視頻獲取器執道. 廢料盒 卸載部' 卸載器 60 1364087 402 、 4002 、 7402 404、4004、7404 412、4012 414 、 4014 、 7216 500 504、6104 505 506 508 、 6110 510 SS SP 1000 1002 1005 1006 2000 2002 2004 2006 3000 . 卸載盒 第二傳送裝置 第二轉向執道 第二夾持器 裝載部 傳送裝置 裝載器 推進器 夾持器 引入軌道 半導體帶 半導體封裝 第一裝載部 第一裝載盒 第一裝載器 第一推進器 第一饋送部 第一饋送軌道 苐一拾取器… 第二拾取器 第一切割部 61 1364087 3200 第二切割部 3202 傳送器 3204 第二裝載部 3206 第二裝載盒 3208 第三傳送裝置 3209 第二裝載器 3210 第二推進器 3212 第二饋送部 3214 第二饋送執道 3216、608 第三拾取器 3218 ' 6112 引入執道 3220 第三夾持器 3224 刀片單元 3226 旋轉台 3232 第四拾取器 3234 清洗器/乾燥器 4000 第一卸載部 4002 卸載盒 4010 第一卸載器 5000 第二卸載部 5002 乾燥區 62 1364087 5004 第三饋送軌道 5006 第五拾取器 5008 裝填區 5010 裝填區饋送軌道 5012 第六拾取器 5014 半導體封裝饋送部 5016 半導體封裝饋送軌道 5018 半導體封裝拾取器 5020 檢測器 5022、690、960 接收器 5024 接收盤架 5026 接收盤架饋送軌道 605 、 7206 第一拾取器軌道 734、6334 視頻獲取器執道 800 ' 6400 清洗/乾燥部 801 第一清洗器/乾燥器 802 清洗/乾燥區域 804 清洗台 805 清洗台饋送軌道 806 空氣喷頭' 808 水喷頭 63 1364087314, 714, 6314 314a, 714a, 6314a 314b, 714b, 6314b 314c, 714c, 6314c 314d, 714d, 6314d 320, 720, 6320, 7318 320a, 720a, 6320a 320b, 720b, 6320b 330, 730, 6330, 7210 332 , 732, 6332 334 350 '750 400, 950, 7400 410 first pickup second pickup cutting portion chuck table unit chuck table chuck table feeder first feeding member second feeding member first number second feeding member Second No. 2 second feeding member No. 3 second feeding member. No. 4 second feeding member Cutting unit First cutting unit Second cutting unit Sensing unit Video acquirer Video acquirer Exercising. Waste box unloading section 'Unloader 60 1364087 402, 4002, 7402 404, 4004, 7404 412, 4012 414, 4014, 7216 500 504, 6104 505 506 508, 6110 510 SS SP 1000 1002 1005 1006 2000 2002 2004 2006 3000 . Unloading box second conveyor second steering Track second gripper loading section conveyor loader thruster gripper introduction track semiconductor strip semiconductor package first loading part first loading box first loader first thruster First feeding portion first feeding track 拾 a pickup... second pickup first cutting portion 61 1364087 3200 second cutting portion 3202 conveyor 3204 second loading portion 3206 second loading box 3208 third conveying device 3209 second loading 3212 second pusher 3212 second feed portion 3214 second feed way 3216, 608 third picker 3218' 6112 lead way 3220 third holder 3224 blade unit 3226 turntable 3232 fourth picker 3234 washer / dryer 4000 first unloading portion 4002 unloading box 4010 first unloader 5000 second unloading portion 5002 drying zone 62 1364087 5004 third feeding track 5006 fifth picker 5008 loading area 5010 loading area feeding track 5012 sixth picking 5014 Semiconductor package feed 5016 semiconductor package feed track 5018 semiconductor package picker 5020 detector 5022, 690, 960 receiver 5024 receive tray 5026 receive tray feed track 605, 7206 first picker track 734, 6334 video acquirer 800 ' 6400 cleaning/drying section 801 first washer/dryer 802 Cleaning/drying area 804 Washing station 805 Washing station feeding track 806 Air head '808 Water jet 63 1364087

810 第一刷狀物 811 第二清洗器/乾燥器 812 第二刷狀物 813 空氣噴嘴 814 水喷嘴 900 檢測部 906 第二檢測器 908 檢測台饋送執道 910 檢測台 912 第一檢測器饋送執道 914 第一檢測器 952 卸載器饋送軌道 954 半導體封裝拾取器 956 卸載拾取器 958 輔助台 962 卸載拾取器執道 6315 轉動構件 6500 乾燥區 7214 第二拾取器執道 7302 夾盤台饋送執道 7306 '驅動體系 •64 1364087 7308 水平驅動器 7310 垂直驅動器 7312 垂直滑執 7320 頭部810 first brush 811 second washer/dryer 812 second brush 813 air nozzle 814 water nozzle 900 detecting portion 906 second detector 908 detecting station feeding channel 910 detecting station 912 first detector feeding Lane 914 First Detector 952 Unloader Feed Track 954 Semiconductor Package Picker 956 Unload Picker 958 Auxiliary Stage 962 Unload Picker Road 6315 Rotating Member 6500 Drying Area 7214 Second Picking Path 7302 Chuck Table Feeding Road 7306 'Drive System•64 1364087 7308 Horizontal Drive 7310 Vertical Drive 7312 Vertical Slip 7320 Head

6565

Claims (1)

十、申請專利範圍: 1. 一種加工設備,係包含: 一失盤台單元’係包含兩個可單獨地沿γ軸移動並可同時 /;0 X轴移動之夾盤台;以及 一切割單元,係肋分麟固定於夹盤台上之工件進行加 工〇 2. —種加工設備,係包含: 一爽盤台單元,係包含四個可單獨地沿γ軸移動並可同時 /t»X轴移動之夾盤台;以及 兩個切割單元,係用以對固定於第一及第三夹盤台上之工 件進行加工或對固定於第二及第四夾盤台上之工件進行加工。 3. 如申睛專利範圍第i項或第2項所述之加工設備,係進一步包 含: 檢測單兀,係用以獲取各工件位置之資訊,並發送該資 5相關的切割單元’該檢測單元係包含:一視頻獲取器,係 用乂華取各工件之位置資訊以及一視頻獲取器執道係用以 使該視賴㈣沿魏視賴取錄道獅。 4. 辦請專利範圍第1項或第2項所述之加工設備,其中該失盤 台早元係包含: . 所述各錄纟,細处#辭導鮮; 一第—饋賴件’ _以在X财向上饋送所述各失盤 台;以及 66 . 1364087 第二饋送構件’侧以在Y財向上饋騎述各夾盤 台 5. 如申請專利範圍第1項或第2項所述之加工設備,其中各夾盤 台係可旋轉360度。 6. 如申請專利範圍第1項或第2項所述之加工設備,其中該夹盤 台單元係包含: 所述各夾盤台,係用以支撐該半導體帶; -垂直驅動H,係用以使所述各夾盤“直移動;以及 -水平驅以使所述各缝台水平移動。 7· —種半導體帶加工系統,係包含: -裝載部’侧以接收複數彳畔導體帶; —切卿,係包含如申請專利細第1項或第2項所述之 加工設備; :之半2=.咖接收所述各半導體帶加工完畢後所生成 饋运部.,係用以拾取所述各半_帶或該體 並饋送所絲之轉辭辭導體縣至㈣^; 或該卸裁部。 衣戰邛、該切割部 .一種半導趙帶加工系統,.係包含: V I 第裝载部,係用以接收複數値半導體帶; 一第―_部,係包含树請專】項购項 67 所述之加工設備; -第-卸载部’侧以接收在該第—蝴 之所述各半導體帶; 凡畢後 半導2紗’係肋絲料各铸辭,並觀所拾取之 +導如至該第-裝載部、該第一切割部或該第一卸载部. 各半載部’係用以接收從該第—卸載部所卸載之所述 ’#'衫:^㈣,係在雜轉台上放置 斤这各+導體m第二_單元,__所述各半導 體帶進行加I使之成騎㈣封裝; 一檢測部’係用以檢測在該第二切割部中加工生成之半導 體封裝是否存在缺陷; 1二卸載部’係取接收經過該檢測部檢測後之丰導體 封裝,以及’ / 傳如,係肋在該第—卸载部無第二卸載部之 送所述各半導體帶。 9.如申請專利範圍第8項所述之半導體帶加工系統,其中該第一 切割部之切割單祕包含—鐳射切織置並且該第二切割單 元係包含一刀片。 · . 10:如申請__第8項所述之半導體帶加工祕,其中: s第刀。進-步包含一傳感單元’係用以獲取該半導 68 1364087 體帶位於各夾盤台上的位置之資訊;以及 _該第—㈣部_贿絲自該傳感單元之魏,並且對 η ΓΓ切卿之域單靖辭細帶之加讀置進行校準。 二圍第8項所述之半導體帶加工系統,其中該第二 該旋轉台,在該旋轉台上放置有所述各 旋轉台可在旋轉時在γ轴方向上進行移動;以及 一刀片,係可ϋ繞該旋轉台在γ财向上移動。 12. —半導體帶加工系統,係包含: 一裝载部,係用以接收複數個半導體帶; 如申請專利麵第1項或第2項所述之加卫設備. 一清洗_部,_以清歧辆所述各轉體帶經加工 後所生成之半導體封裝; 半導體封裝是否 一檢測部,係用以檢測經清洗與乾燥後之 存在缺陷;. 一卸载部,:係用以¥收經過檢測之半導體封裝;以及 :,饋达部’係用以拾取所述各半導體帶或半導體封裝’ ^所拾取之料體帶或料_裝麵錢部、該加工 備、該清洗/乾燥部、該檢測部或該卸載部。 13 利範圍第7項所述之料體帶加工系统,其中該累 69 ^04087 裝载盒,係用以堆疊所述各半 做. 一傳送裝置,係用以傳送該裝载盒;τ’ 傳送裝置所饋送之所 一第一轉向執道,係用以轉動透過該 述各半導體帶;以及 所堆疊之所述各半導體 一推進器,係用以饋送該裝載盒中 帶至該第一轉向執道; 其申’該卸载部係包含: ,-第二轉域道,伽以接收並猶經勒割且透過該饋 送部所饋送之所述各半導體帶; 卸载盒,係用以堆疊經過切割之所述各半導體帶; 一傳达裝置’細以傳送該卸載盒;以及. 一夾持器’_以傳送該第二轉向軌道上所堆疊之經過切 割的所述各半導體帶至該卸載盒。X. The scope of application for patents: 1. A processing equipment comprising: a losing table unit comprising two chucking tables which can be moved separately along the γ axis and can be simultaneously moved to the 0 axis; and a cutting unit The ribbed ribs are fixed on the chuck table for processing. 〇2. A processing equipment, comprising: a sizzling table unit, the system comprising four can be moved separately along the γ axis and simultaneously /t»X a chuck table for moving the shaft; and two cutting units for processing the workpieces fixed to the first and third chuck tables or for processing the workpieces fixed to the second and fourth chuck tables. 3. The processing equipment according to item i or item 2 of the scope of the patent application further comprises: a detection unit for obtaining information on the position of each workpiece, and transmitting the relevant cutting unit of the asset 5 The unit system includes: a video acquirer, which is used to obtain the position information of each workpiece and a video acquirer to use the video to make the video (W) take the lion along the Wei Shi. 4. The processing equipment referred to in item 1 or 2 of the patent scope is required to be processed, wherein the loss of the platform is contained in: The above-mentioned records, the details of the word #鲜鲜; _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ The processing apparatus described above, wherein each chuck stage can be rotated 360 degrees. 6. The processing apparatus of claim 1 or 2, wherein the chuck unit comprises: each of the chuck stages for supporting the semiconductor strip; - vertically driving H, for So that the chucks are "straight moving; and - horizontally driven to move the respective sewing stations horizontally. 7. A semiconductor tape processing system comprising: - a loading portion side to receive a plurality of turns of the conductor strip; - 切切, which contains the processing equipment as described in the first or second item of the patent application; : half of the == coffee receives the processing part of the semiconductor strip after processing, is used to pick up Each of the semi-bands or the body and feeds the thread to the conductor to the county to (four) ^; or the unloading section. Clothing trench, the cutting department. A semi-guided Zhao belt processing system, the system contains: VI The first loading portion is for receiving a plurality of semiconductor strips; the first portion is a processing device as described in item 67 of the tree; the first - unloading portion is for receiving the first butterfly Each of the semiconductor strips described; after the second half of the 2 yarns, the rib yarns are each cast, and they are picked up. + such as to the first loading portion, the first cutting portion or the first unloading portion. Each half carrier portion ' is for receiving the '#' shirt unloaded from the first unloading portion: ^ (4), The second semiconductor unit is placed on the miscellaneous turntable, and each of the semiconductor strips is added to make it into a riding (four) package; a detecting portion is used to detect processing in the second cutting portion. Whether the generated semiconductor package has a defect; 1) the unloading portion 'receives and receives the abundance conductor package after being detected by the detecting portion, and ' / transmits the rib at the first unloading portion without the second unloading portion 9. The semiconductor tape processing system of claim 8, wherein the cutting edge of the first cutting portion comprises - laser cutting and weaving and the second cutting unit comprises a blade. 10: The semiconductor tape processing secret described in the application __8, wherein: s knives. The step-by-step includes a sensing unit for acquiring the semi-conductor 68 1364087 body belts on each chuck table Location information; and _ the first - (four) _ bribes from the sensing unit Wei, and calibrating the reading of the η ΓΓ 卿 之 域 单 单 单 。 。 。 。 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体The rotating table can be moved in the γ-axis direction when rotating; and a blade can be moved around the rotating table in the γ-axis. 12. The semiconductor tape processing system includes: a loading portion, For receiving a plurality of semiconductor strips; as claimed in the first or second aspect of the patent application, a cleaning device, a cleaning unit, a semiconductor formed by processing the respective rotating belts Packaging; whether the semiconductor package is a detecting part for detecting defects after cleaning and drying; an unloading part for: collecting the tested semiconductor package; and: the feeding part is for picking up Each of the semiconductor strips or semiconductor packages '^ picked up a material strip or material_loading portion, the processing unit, the cleaning/drying portion, the detecting portion or the unloading portion. The material belt processing system of claim 7, wherein the 69 ^ 04087 loading box is used to stack the half bodies. A conveying device is used to convey the loading box; a first steering lane fed by the transmitting device for rotating through the semiconductor strips; and the stacked semiconductor-embedders for feeding the straps in the loading cassette to the first steering The unloading section includes: - a second transfer lane, the semiconductor strips received by the singular and cut through the feed section; the unloading box is used for stacking Cutting each of the semiconductor strips; a communicating device 'slim to transport the unloading cassette; and a holder'_ to transport the cut semiconductor strips stacked on the second steering track to the unloading box.
TW096137734A 2006-10-09 2007-10-08 Machining apparatus and semiconductor strip machining system using the same TWI364087B (en)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5457660B2 (en) * 2008-11-07 2014-04-02 アピックヤマダ株式会社 Cutting method and cutting apparatus
JP5420226B2 (en) * 2008-11-07 2014-02-19 アピックヤマダ株式会社 Cutting device
JP5298157B2 (en) * 2011-04-21 2013-09-25 西進商事株式会社 Laser processing apparatus, laser processing method and laser processed product
KR101635113B1 (en) * 2014-11-20 2016-06-30 서우테크놀로지 주식회사 Semiconductor strip grinder
JP6388547B2 (en) * 2015-01-26 2018-09-12 株式会社ディスコ Cutting equipment
KR101757150B1 (en) * 2016-07-07 2017-07-12 주식회사 영진하이텍 SSD router cutting path correction system
KR101945039B1 (en) * 2017-07-11 2019-02-01 주식회사 영진하이텍 SSD router cutting path correction system with dust removing function and correction method thereof
JP7300846B2 (en) * 2019-02-19 2023-06-30 株式会社ディスコ Cutting equipment and semiconductor package manufacturing method
KR102027238B1 (en) * 2019-03-14 2019-11-04 인세미텍 주식회사 Aparatus of grinding for manufacturing division printed circuit board

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0384949A (en) * 1989-08-29 1991-04-10 Nitto Denko Corp Pasting of adhesive tape on wafer
JP3930087B2 (en) * 1996-01-12 2007-06-13 株式会社東芝 Lid mounting apparatus and solid-state imaging device manufacturing method
JP3388697B2 (en) * 1996-10-31 2003-03-24 株式会社日平トヤマ Laser processing equipment
JP2001340986A (en) * 2000-05-31 2001-12-11 Nippei Toyama Corp Laser processing system and laser processing method
JP3530483B2 (en) * 2000-11-22 2004-05-24 Necマシナリー株式会社 Substrate cutting device
JP3898624B2 (en) * 2002-11-08 2007-03-28 株式会社日平トヤマ Laser processing machine work transfer device
KR100479417B1 (en) * 2003-03-31 2005-03-25 한미반도체 주식회사 A sawing apparatus and a control method for manufacturing processes of semiconductor package
KR100497506B1 (en) * 2003-04-08 2005-07-01 한미반도체 주식회사 Apparatus for Sawing Semiconductor Strip and Apparatus for Singulation of Semiconductor Package Having the Same
JP4315788B2 (en) * 2003-11-26 2009-08-19 アピックヤマダ株式会社 Semiconductor device manufacturing method and manufacturing apparatus
WO2006025622A1 (en) * 2004-08-31 2006-03-09 Hanmi Semiconductor Co., Ltd. A sawing apparatus and a control method for manufacturing processes of semiconductor package
JP4527559B2 (en) * 2005-01-31 2010-08-18 株式会社ディスコ Exposure equipment
JP4676288B2 (en) * 2005-09-14 2011-04-27 株式会社ディスコ Cutting equipment

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