TW200834785A - System for manufacturing semiconductor packages and method for manufacturing semiconductor packages - Google Patents

System for manufacturing semiconductor packages and method for manufacturing semiconductor packages Download PDF

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Publication number
TW200834785A
TW200834785A TW97104488A TW97104488A TW200834785A TW 200834785 A TW200834785 A TW 200834785A TW 97104488 A TW97104488 A TW 97104488A TW 97104488 A TW97104488 A TW 97104488A TW 200834785 A TW200834785 A TW 200834785A
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Taiwan
Prior art keywords
unit
semiconductor package
cleaning
package
tray
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TW97104488A
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Chinese (zh)
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TWI411056B (en
Inventor
Hyun-Gyun Jung
Jai-Young Lim
Nam-Heon Kim
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Hanmi Semiconductor Co Ltd
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Publication of TW200834785A publication Critical patent/TW200834785A/en
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Publication of TWI411056B publication Critical patent/TWI411056B/en

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  • Engineering & Computer Science (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Multi-Process Working Machines And Systems (AREA)
  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)

Abstract

A system for manufacturing semiconductor packages and a method for manufacturing semiconductor packages are disclosed. The semiconductor package manufacturing system includes a loading and unloading unit for loading semiconductor packages, a package fixing unit for fixing the semiconductor packages, loaded by the loading and unloading unit, to a jig so as to cut the semiconductor packages, a cutting unit for cutting the semiconductor packages, fixed to the jig, a first washing unit for washing one-side surfaces, i.e., the tops or bottoms, of the semiconductor packages, cut by the cutting unit, and a second washing unit for washing the other-side surfaces of the semiconductor packages. According to the present invention, the whole process is automatically carried out, and therefore, the total size of the semiconductor package manufacturing system is reduced. Consequently, the present invention has the effect of greatly reducing the manufacturing costs and time.

Description

200834785 九、發明說明: 【發明所屬之技術領域】 本發明係關於-_於製造半導體封裝之系統,特別传關於 種此夠自動製造目標物體,例如半導體封裝之半 系統及其製造方法。 对衣衣化 【先前技術】 近年來’半導體封裝以各種方式被使用。例如,諸如^入 乂而要料體封衣麵照需要以合適形狀進行製造。為此, 成有複數個轉體封裝之細條(如ρ)必須對應各個半導_= 切成複數健,纽魄必彡扣贼雜製造各個轉體封Γ 依照習知技術,半導體封裝係由使用者直接插人—失^封二 =雜封賴放从具中_時,由任意洲機進;;宝ΖBACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a system for manufacturing a semiconductor package, and more particularly to a semi-system capable of automatically manufacturing a target object, such as a semiconductor package, and a method of fabricating the same. [Coating] In recent years, semiconductor packages have been used in various ways. For example, if the material is to be sealed, it is necessary to manufacture it in a suitable shape. To this end, the strips (such as ρ) that have a plurality of swivel packages must correspond to the respective semi-conductors _= cut into complex numbers, and the 转 魄 贼 贼 制造 制造 制造 制造 制造 制造 制造 制造 制造 依照 依照 依照 依照 依照 依照 依照 依照 依照The user directly inserts the person--------------------------------------------------------------------------------------------------------

此方式’鋪望形狀進行铸體封裝製造。 〇J 然而,上述習知技術存在以下問題。 習知半導體封裝製程係手工執行,由此導致 長,並且製造成本增加。 衣叫間較 【發明内容】 繁於以上的_,本發_ _ 裝之夢料㈣H *的在槐供·'種半導體封 衣U獻雜造找,藉岐麵Μ於⑽技術之局限This method 'casts the shape for casting package manufacturing. 〇J However, the above conventional techniques have the following problems. Conventional semiconductor packaging processes are performed manually, resulting in long lengths and increased manufacturing costs.衣 间 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 繁 繁 繁 繁 繁 繁 繁 繁 繁 繁 繁 繁 繁 繁 繁 繁 繁 繁 繁 繁 繁 繁 繁 繁 繁 繁 繁 繁 繁 繁 繁 繁 繁 繁 繁 繁 繁

及缺點所導致之一或多個問題。 σ A 有關本發明的其他特徵及優點,將在下文的說明中得到閣 8 200834785 明,亚且倾具抒職狀技藝者根據朗⑽賴瞭解本發 明的部分特徵,或者透過本發明之實踐”之。本發明之目的^ 其他優點將透過特別是說明書射請專利範圍以及圖式指出之妹 構而實現及獲得。 因此’為達上述目的’本發日騎揭露之半導體封裝之製造系 統’包含有-裝載與載單元、一封裝固定單元、一切割單元、 第/月洗單元以及一第二清洗單兀;於此,裝载與卸載單元係 用於裝载半導體封裝;封裝固定單元__定域載與卸载單 凡裝載之半導體縣至m致於蝴此半導體域;切巧 ^元係用於切咖定至夾具之半導體封裝;第—清洗單元係祕 清洗^_單元切割之半導體封裝之—側面,例如頂部或底部;、 以及第二清洗單元胁清洗轉賴裝之另—侧面。 較佳地,轉體封裝之製造紐更包含—傳輸單元,係用於 傳輸由裝載與卸載單元裝載之半導體封裝至封裝固定單元。 。較佳地,轉騎裝之製造祕更包含—乾鱗元,係用於 乾燥由第一清洗單元及第二清洗單元清洗之半導體封叢。 、 較佳地,蝴單元包含—位置變換裝置,以轉轉換失 顛倒方向。 '' 較佳地,半導體封裝之製造祕更包含-檢查單元,係用於 檢查已切割半導體封裝是否有缺陷。 ' ; 較佳地,封裝包含—主體單元、_第—推進組件、 9 200834785 —第二推件以及—鏈動單元。其中,主體單元係具有用於容 納夹具之—夾具保持器’並包含-水平元件及-垂直祕,水平 兀件係構成主體單元底部,垂直元件係垂直水平元件。第一推進 組件係用於欽半導體封裝於夾具中,第—推進組件可沿乂轴方 ,向及γ軸方向於水平元件上水平移動。第二推進組件係對應第一 、推進組件設置’以用於從夾具上移除半導體封裝。鏈動單元係用 於㈣夹具保肺,進而半導體封裝㈣容胃地嵌人並固定於夹 W 具Φ。 車乂^土地’弟一推進組件包含一主體部、一支座塊以及一第一 推進單元。射主體部係戦第―推進組件之域。支座塊係配 置於主體部頂端,進醉導體封裝位於支座塊頂端。第一推進單 _以相同於支座塊上之轉體封裝的高度水平移動,以引 導體封裝至夾具之狹縫中。And one or more problems caused by the shortcomings. σ A pertaining to other features and advantages of the present invention will be apparent from the following description, which will be apparent to those skilled in the art of the present invention. OBJECTS OF THE INVENTION The other advantages will be realized and obtained through the specific scope of the patent application and the designation of the drawings. Therefore, the manufacturing system for the semiconductor package disclosed by the present invention is included. a load-and-load unit, a package fixing unit, a cutting unit, a month/wash unit, and a second cleaning unit; wherein the loading and unloading unit is for loading a semiconductor package; the package fixing unit __ The semiconductor loading and unloading of the semiconductor county to m to the semiconductor domain; the ingenuity is used to cut the coffee to the fixture of the semiconductor package; the first - cleaning unit is the secret cleaning ^_ unit cutting semiconductor package - the side, such as the top or bottom; and the second cleaning unit, the cleaning is transferred to the other side. Preferably, the manufacturing of the swivel package includes a transmission unit, For transporting the semiconductor package loaded by the loading and unloading unit to the package fixing unit. Preferably, the manufacturing secret of the riding device further comprises a dry scale element, which is used for drying and cleaning by the first cleaning unit and the second cleaning unit. The semiconductor package. Preferably, the butterfly unit includes a position changing device for converting the reverse direction. '' Preferably, the manufacturing of the semiconductor package further includes an inspection unit for inspecting the cut semiconductor package. Whether there is a defect. '; Preferably, the package comprises a main body unit, a _th-propulsion component, a 9200834785 - a second pusher and a chain-moving unit, wherein the main body unit has a clamp holder for accommodating the clamp 'And contains - horizontal components and - vertical secrets, the horizontal components constitute the bottom of the main unit, the vertical components are vertical horizontal components. The first propulsion component is used for the Qin semiconductor package in the fixture, the first - the propulsion component can be along the axis Moving horizontally on the horizontal element in the direction of the γ-axis. The second propulsion component corresponds to the first, propulsion component setting 'for removing the semi-guide from the fixture The package is provided for the (4) clamp to protect the lungs, and then the semiconductor package (4) is embedded in the stomach and fixed to the clamp W. The rut ^ land 'di' propulsion assembly includes a main body portion, a seat block and a The first propulsion unit is a domain of the first propulsion unit. The support block is disposed at the top end of the main body, and the drunk conductor package is located at the top of the support block. The first propulsion unit is the same as the support block. The height of the swivel package is moved horizontally to encapsulate the body into the slit of the fixture.

較佳地,第二推進組件包含一主體部以及一第二推進單元。 八中主體縣形成第二推進組件之主體,第二推進單元可沿著兰 體部水平移動,進而從夹具之狹縫上移除半導體封裝。 、另外,本發明供了—種轉體封裝之製造方法,係包令 =步驟·賴半導體縣至―製造錢;固定此已輯半導體 =至夹具,切割固定至夾具之半導體封裝;以 上卸載半導體封裝。 衣、糸、、充 半導體雜之製造絲更包含親及絲已切割半 200834785 導體封装之步驟。 車父佳地’其中清洗及乾燥已切割半導體封裝之步驟包含:清 洗半導體封装頂部;清洗半導體封裝底部;以及乾燥半導體封裝。 車父佳地’半導體封裝之製造方法更包含檢測已切割半導體封 ^ 裝疋否有缺陷之步驟。 , 較佳地’半導體封裝之製造方法更包含偵測及修正已切割半 春導體封裝之偏離程度之步驟。 應當暸解上文概括說明及下文之詳細說明僅為本發明之示例 及解釋,目的在於為發明申請專利範圍提供進一步之解釋。 【實施方式】 有關本發明的特徵與實作,茲配合圖式作最佳實施例詳細說 下在整個圖式中,將使用相同的參考編號用於表示相同或 相似之元件。 鲁 「第1圖」為本發明之半導體封裝製造系統之結構示意圖。 下文中’將麥考「第1圖」對本發明之半導體封裝製造系統 .之總體結構作出綱。本發明之半導體縣製造系統包含一裝载 載單元應、一傳輪單元⑽、-封裝固定單元3〇〇、一切割 早5GG、-清洗與乾燥單元_以及—檢查單元彻。#載盘卸 $單元議係用於裝载還未製造之半導體封裝sp至半導體封裝製 ’亚且用於從製造系統上卸載已製造之半導體封裝SP。傳 勒早το·用於將裝载與卸載單元1〇〇載入之半導體封裝兕傳輸 11 200834785 至-預粒置’其巾在此預定位置即將製造半導體_ sp。封裝 固定單元個於將傳輸單元傳輸之轉體封裝SP固定^ -夾具31〇,以致於進行半導體封裝sp切割。切割單元鄉用於 切割固定至夾具3U)之半導體封裝sp,清洗與乾燥單元6〇〇用於 .清洗由切割單元5〇〇切割之轉體封裝SP。檢查單元·係用於 , 檢查被切割之半導體封裝SP,以判斷被切割半導體封裝SP是否 存在缺陷。下文巾,將詳域日胖導體製造祕之各個單元。 首先將參考第1圖」對裳載與卸載單元1〇〇作出說明。 裝載與卸載單元1〇〇係配備有複數個托盤盒1〇6,其中每個托盤盒 106上放置有一托盤102。此外,裝載與卸載單元1〇〇還配備有活 動口 103,活動台103係在放置托盤1〇2於各個活動台上的同 日守私動。各個活動台1〇3係構造沿著一活動台傳輸、線1〇4移動。 托盤盒106之數量可以為數個。例如,如「第i圖」顯示, 春托盤I 106的數置為四個。這種情況下,四個托盤盒1〇6分別確 定位置如下,即其上放置有仍補造之半導體雜sp之未切割托 盤’其上放置有已製造且麟為優良品錢品之半導體封裝sp之 ▲ I好托盤,其上未㈣諸雜sp放置之雜盤,以及其上放置 有被酬為有缺陷產品之半導體職sp之再加工托盤。當然,本 領域之熟悉技藝者也可以根據本發明推得其他組合。 活動台103之數量可以是多個,以增加半導體封裝製造系統 之處理速度。例如,活動台之婁文量為三個。其中一個活動台 12 200834785 可以構造為在仍未製造之半導體封裝 同時,其沿著對應的活動讀輪線㈣動。、此上的 斷為台⑽可以構造為:在已製造且由檢查單元7。。判 销崎SP恤此__上的同 守八,口者對應之活動台傳輪線104移動。 710及第Μ 在已製造且由第—檢查單元 於此^ 元⑽峨麵陷版轉崎sp放置 /。〇3上的同時’其沿著對應的活動台傳輸線104移動。 =活動台傳輸線顺,以使得活動台能夠從各個托盤盒1〇6 。傳輸早7C 200之傳輸單元撿拾器2G4之移動路線下方的位置移 動0 另一方面’托盤撿拾器傳輪線〗丨〇係設置於活動台傳輸線1〇4 之上方,進而托盤撿拾器傳輸線11〇垂直於活動台傳輸線辦。托 盤撿拾器傳輸線110係配備有一托盤撿拾器112。托盤檢拾器Μ] 用於撿拾托盤102’並在托盤盒106之間與活動台1〇3之間傳輸托 Μ 102。當然,可以配備複數個托盤撿拾器112,以增加半導體封 裝製造系統之處理速度。 只要乾盤撿拾器112能夠撿拾托盤1〇2,其結構不特別限定。 較佳地’耗盤撿拾器112包含一夾持元件,以緊抓托盤1〇2,以及 包含一搬運元件,以沿著托盤撿拾器傳輸線11〇搬運托盤1〇2。 托盤撿拾器112可以設計為夾取一個托盤102,或者可以設計 13 200834785 為抓取兩l蚊k減搬。#構造滅撿拾器112為抓取兩個 或更夕托盤搬時’托盤撿拾器m之傳輸容量係極大增加。 如「第2A圖」顯示,托盤撿拾器]12可以設計為抓取兩個托 盤 102。 外如「第2A圖」顯示,托盤撿拾器' 112包含一主體部ιΐ4、兩 對第一夾持單元116以及兩對第二夾持單元118。主體部114係形 成托疏&拾$ 112之結構,第—爽持單元ιΐ6做置於主體部114 的一側’進而第-夾持單元116係互相相對,以用於抓取一個托 盤102。兩對之第二夾持單元118係設置於主體部m -側,進而 昂二夹持單元m係互相姆,用於抓取另一托盤ι〇2。 —主體部114之大小係對應於托盤1〇2的大小。這是因為,當 主體部m具有與托盤1G2大小對應的大小時,托盤檢拾器^ j被減」㈣、’亚且兩對第—夾持單元μ與兩對第二夹 知早70 118容易接觸托盤1〇2之側部。 、,如:2β圖」顯示’兩對第一夾持單元116係互相相對設置, -一:對Γγ夹*早70118也互相相對設置。這是因為,當兩對 持116互相相對時,托盤102能夠在其相對側被牢穩 “也可以提供—對第一夹持單元116與-對第二夾 麵替提供兩對之第一夾持單元II6及兩對第二夹持 早几118。 每個 弟夹*早70 116包含—夾持ϋ 116a、-轉軸120以及 14 200834785 一驅動元件116b,其中夾持器116a係彎曲為‘n,狀,轉軸i2〇係 形成於夾持器116a之彎曲部,進而夾持器116&能夠旋轉。驅動元 件116b用於驅動夾持器116a。同樣地,每個第二失持單元Mg包 含彎曲為v狀之-夾持ϋ ma、形成於夾持器118a f曲部之一 轉軸U0,進而能夠旋轉夾持器胸,以及用於驅動失持器論 之驅動元件118b。 如「第2B圖」顯示,每個夾持器腕係配備有一定位槽116c, 進而其中-錄n 116a之定位槽116e係相對於另—夹持器恤 之定位槽116c。同樣地,每個夾持器、腿係配備有一定位槽·, 進而其中一夾持器ma之定位槽收係與另一夹持器之定 位槽me相對。當托盤1〇2由夹持器_及_檢起時,定位 槽脱及me係用於引導托盤1〇2之侧邊,進而把盤搬能夠被 穩固地撿拾起。 母個夹持H 116a之各個定靖116e邊緣,錄地其前邊緣奋 配置有-喷合(catching)突起腕。進而在夹持器版之柄 突起腕互相相向對突出的同時,其中一夹持器腕之嗔合突 起^係與另一夾持器腕之齡突起⑽相對。同樣地,每 =器服之各個梅_邊緣,較佳地其前邊緣係配備有 g)突起進而在_服㈣合突起_ ^ =大_時,其中一夹持器隱之嗜合突起·係鱼 另-夹持nma之鐵起_相對。當托盤⑽位於定位槽 200834785 8C中^ ’嗜合大起_及118d係用於在托盤102底端 對,、進仃支撐’進而能夠更加穩固地撿起托盤搬。 每個夾持器116a上與形成有對狀位槽版的—端相對之另 :端係配備有—彈性元件122。同樣地,每個夹持器ma上與形 、有對應定位槽118c的—端相對之另一端係配備有一彈性元件 h、彈性元件122係設置於主體部114與夹持器_及職之 間以彈性支標夾持器版及施,進而夹持器版及服能 夠沿預定方向旋轉。較佳地,彈性糾122提供有_彈性力,= :其中一個祕請a之定位槽以及其中—夾制_之 疋,槽U8C能夠朝向分別與其組成夾持器對之另-夹持器116a 之疋位槽116e及另-鱗|| 118a之定位槽U8e移動。 驅動元件1勘及118b可以分別配置於各個第_夾持單元加 及第二夾持單元118上’進而驅動元件祕及職能夠分別驅 動夾持器116a及馳。或者’僅配置—個驅動元件,並且更配置 -鏈動元件(「f 2B目」t未_ ),關_械騎行之夹持 器 116a 及 118a。 驅動元件116b及係配置於主體部114 —側,以用於推 動夾持器116a及118a上形成有定位槽116c及mc之部分。特別 地,驅動元件116b及腸係用於提供-鶴力,進而彈性元件 122提供-彈性力,並因此夾持器n6aA118a能夠沿著與夹持器 U6a及118a之旋轉方向相反之方向旋轉。 16 200834785 同時,夾持單元包含第一夾持單元116與第二夾持單元118。 如「第2A®」顯示,第一夾持單元116係用於檢起第一托盤购, 進而第-托盤102a鄰近主體部114,並且第二崎單元118用於 撿拾位於第一托盤l〇2a下方之一第二托盤1〇2b。 • 每個第一夹持單元U6之夾持器116a以及每個第二夾持單元 .U8之夾持器118a可以朝著主體部114下方延伸,以使得每個第 ^ 二夾持單元118之夹持器118a之延伸長度係相比每個第一夾持單 疋116之夾持器116a之延伸長度多了一個托盤搬的厚度。然而, 可以構造夾持器118a之定位槽i18c同時接收位於夾持器n6a之 疋位槽116C内的第一托盤腿以及位於夾持器、118a内之第二托 盤 102b 〇 並且’複數個導向桿124係配置於主體部114側部,如「第 2C圖」顯不,導向桿124用於引導及固定托盤ι〇2,進而托盤 φ %夠由第—夾持單元116及第二夾持單it 118容易地撿拾至主體 部114下方。 • 亚且,如「第1圖」顯示,可以配置三個托盤撿拾器112以 • 、、且成托盤撿拾态組件。這是因為,活動台1〇3之數量為三個, 亚因此在托盤撿拾器112之裝載與卸載期間增加處理速度。換言 之’置於二個活動台1〇3上之全部托盤1〇2能夠由托盤4金拾器ιΐ2 人才双起,由此增加處理速度。例如,其中一托盤撿拾器112可 乂處於運行模式,以及其他兩個托盤撿拾器可以處於備用模 17 200834785 式。 ,这對應於托盤撿拾器112能夠撿拾僅一個托盤逝之情況。 當三個活的103 _向滅撿拾器' m下方移鱗,假設托盤 撿拾器112之數量僅為兩個,則需要满放置在活動台1G3上之 -托盤1〇2是否將被撿起。另一方面’依照本發明,配置托盤撿拾 , 器112,以使得托盤撿拾H 112的數量對應於活動台1〇3之數量。 鲁目此,不需要判斷放置於活動台1〇3上的托盤1〇2是否將被撿起。 因此,一定程度地增加了處理速度。 晴’當依辭導體封裝製造彡統之整個處理触進行製造 之轉體封裝SP由傳鮮元送㈣,魏與域單元1〇1還 用於卸載已製造之半導體封裝SP。 接著,在被置於活動台1〇3上的同時由裝載與卸載單元1〇〇 移動的未製造半導體封裝SP則由傳輸單元2〇〇移動至封裝固定單 • 兀300。當然,上述未製造半導體封裝SP也可以從裝載與卸載單 儿1GG被直接傳輸至封裝目定單元3⑽,而不透過傳輸單元搬。 • 傳輸單元200具有傳輸單元撿拾器傳輸線202,傳輸單元撿拾 . 器傳輸線202係相對設置於活動台傳輸線104上方,進而傳輸單 元撿拾器傳輸線202係垂直於活動台傳輪線1〇4。即,傳輸單元撿 拾裔傳輸線202係平行托盤撿拾器傳輪線11〇排列。 在傳輸單元撿拾器傳輸線202上係配置有傳輸單元撿拾器 204,傳輸單元撿拾器2〇4係設置沿著傳輸單元撿拾器傳輸線2〇2Preferably, the second propulsion assembly comprises a main body portion and a second propulsion unit. The main body of the eighth middle body forms the main body of the second propulsion unit, and the second propulsion unit is horizontally movable along the blue body to remove the semiconductor package from the slit of the jig. In addition, the present invention provides a method for manufacturing a swivel package, which is a package order = step Lai Semiconductor County to "manufacturing money; fixing the semiconductor to the jig, cutting and fixing the semiconductor package to the jig; Package. The fabrics of enamel, enamel, and semiconductor are also included in the process of packaging the conductor. The step of cleaning and drying the cut semiconductor package includes: cleaning the top of the semiconductor package; cleaning the bottom of the semiconductor package; and drying the semiconductor package. The method of manufacturing the semiconductor package of the vehicle father's semiconductor package further includes the step of detecting whether the semiconductor package has been defective. Preferably, the method of fabricating the semiconductor package further includes the step of detecting and correcting the degree of deviation of the cut semiconductor package. It is to be understood that the following general description and the following detailed description are merely illustrative and illustrative of the invention DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS In the following, the same reference numerals will be used to refer to the same or similar elements throughout the drawings. Lu "Fig. 1" is a schematic structural view of a semiconductor package manufacturing system of the present invention. Hereinafter, the overall structure of the semiconductor package manufacturing system of the present invention will be outlined in the "Figure 1" of Mai Kao. The semiconductor county manufacturing system of the present invention comprises a loading unit, a transfer unit (10), a package fixing unit 3, a cutting early 5GG, a cleaning and drying unit, and an inspection unit. The #unit unloading unit is used to load an unmanufactured semiconductor package sp to a semiconductor package and to unload the fabricated semiconductor package SP from the manufacturing system. The semiconductor package 用于 used to load the loading and unloading unit 1 11 11 200834785 to - pre-granulation ‘the towel is to manufacture the semiconductor _ sp at this predetermined position. The package fixing unit is fixed to the swivel package SP that transports the transfer unit, so that the semiconductor package sp is cut. The cutting unit is used for cutting the semiconductor package sp fixed to the jig 3U), and the cleaning and drying unit 6 is used for cleaning the swivel package SP cut by the cutting unit 5〇〇. The inspection unit is used to inspect the cut semiconductor package SP to determine whether the semiconductor package SP to be cut is defective. In the following section, the details of the domain will be made by the conductors of the fat conductor. First, the description of the load carrying and unloading unit 1 will be described with reference to Fig. 1. The loading and unloading unit 1 is equipped with a plurality of tray boxes 1 〇 6 in which a tray 102 is placed on each tray box 106. Further, the loading and unloading unit 1A is also provided with a movable port 103 which is attached to the same day on the respective movable tables. Each movable platform 1〇3 structure is transported along a movable station and line 1〇4. The number of tray cassettes 106 can be several. For example, as shown in "i-fi", the number of spring trays I 106 is set to four. In this case, the four tray boxes 1〇6 are respectively determined to have the following positions, that is, the uncut tray on which the still-prepared semiconductor spp is placed, on which the semiconductor package which has been manufactured and which is a good product is placed. Sp ▲ I good tray, which is not (4) miscellaneous sp placed on the miscellaneous disc, and the reprocessing tray on which the semiconductor job sp is paid for defective products. Of course, those skilled in the art can also derive other combinations in accordance with the present invention. The number of movable stations 103 can be plural to increase the processing speed of the semiconductor package manufacturing system. For example, the number of texts on the event desk is three. One of the active stations 12 200834785 can be configured to move along the corresponding active read wheel line (4) while still being unmanufactured. The break (10) on this can be configured as: already manufactured and by the inspection unit 7. . Judging the pin-up SP-shirt on this __ on the defensive occupant, the corresponding mobile station transmission line 104 moves. 710 and Μ Μ 已 Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ At the same time as 〇3, it moves along the corresponding movable stage transmission line 104. = The movable table is transported smoothly so that the movable table can be accessed from each tray box 1〇6. The positional movement below the moving route of the transmission unit pickup 2G4 of the early 7C 200 is transmitted. On the other hand, the 'tray pickup passing line〗 is set above the movable transmission line 1〇4, and the tray pickup transmission line 11〇 Vertically to the active station transmission line. The tray picker transfer line 110 is equipped with a tray picker 112. The tray picker Μ] is used to pick up the tray 102' and transfer the tray 102 between the tray cassette 106 and the movable table 1〇3. Of course, a plurality of tray pickers 112 can be provided to increase the processing speed of the semiconductor package manufacturing system. As long as the dry tray picker 112 can pick up the tray 1〇2, the structure thereof is not particularly limited. Preferably, the consuming tray picker 112 includes a gripping member for gripping the tray 1 〇 2 and a carrying member for transporting the tray 1 〇 2 along the tray picker transfer line 11 . The tray picker 112 can be designed to pick up a tray 102, or can be designed to capture two of the mosquitoes. The #configuration 捡 picker 112 is used to capture two or more eve trays. The transmission capacity of the tray picker m is greatly increased. As shown in Figure 2A, the tray picker 12 can be designed to grab two trays 102. As shown in Fig. 2A, the tray picker '112 includes a main body portion ι4, two pairs of first holding units 116, and two pairs of second holding units 118. The main body portion 114 is formed into a structure of the top and bottom of the main body portion 114, and the first holding unit 116 is opposed to each other for gripping a tray 102. . Two pairs of second clamping units 118 are disposed on the main body portion m - side, and then the two clamping units m are mutually coupled for grasping another tray ι 2 . The size of the main body portion 114 corresponds to the size of the tray 1〇2. This is because when the main body portion m has a size corresponding to the size of the tray 1G2, the tray pickup is reduced by "four", "sub and two pairs of the first clamping unit μ and two pairs of the second clamping. Easy to touch the side of the tray 1〇2. For example, the 2β map shows that the two pairs of first clamping units 116 are disposed opposite each other, and the first pair of Γγ clips *70118 are also disposed opposite to each other. This is because, when the two pairs 116 are opposed to each other, the tray 102 can be secured on its opposite side "may also provide - providing the first clamp for the first clamping unit 116 and the second clamping surface for the second clamp Holding unit II6 and two pairs of second clamping early 118. Each of the brothers**70 116 includes a clamping jaw 116a, a rotating shaft 120 and a 143434785 driving element 116b, wherein the holder 116a is bent to 'n The shaft, the shaft i2 is formed on the curved portion of the holder 116a, and the holder 116& is rotatable. The driving member 116b is for driving the holder 116a. Similarly, each of the second holding units Mg includes a bending The v-shaped clamping ϋ ma is formed on the rotating shaft U0 of the curved portion of the holder 118a, and is further capable of rotating the holder chest and the driving element 118b for driving the missing device. For example, "2B" It is shown that each of the gripper wrists is provided with a positioning groove 116c, and the positioning groove 116e of the n 116a is opposite to the positioning groove 116c of the other holder. Similarly, each of the holders and legs is provided with a positioning groove·, and the positioning groove of one of the holders ma is opposed to the positioning groove me of the other holder. When the tray 1〇2 is picked up by the holders _ and _, the positioning groove is removed and the side is used to guide the side of the tray 1〇2, so that the tray can be firmly picked up. The mother clamps the edge of each of the 116° of the H 116a, and the front edge of the ground is equipped with a catching protrusion. Further, while the shank protrusions of the holder plate protrude toward each other, the kneading protrusion of one of the grippers is opposite to the aging protrusion (10) of the other holder. Similarly, each plum-edge of each device is preferably equipped with g) protrusions, and then, in the case of a (four) joint protrusion _ ^ = large _, one of the holders is invisible. The fish is another - the iron that holds the nma _ relative. When the tray (10) is located in the positioning groove 200834785 8C, the 'hobby fit' and the 118d are used for the bottom end of the tray 102, and the support is pushed in, and the tray can be lifted more stably. Each of the holders 116a is provided with an elastic member 122 opposite to the end on which the opposite slot plate is formed. Similarly, each of the holders Ma is provided with an elastic member h at the other end opposite to the end of the shape having the corresponding positioning groove 118c. The elastic member 122 is disposed between the main body portion 114 and the holder _ With the elastic support holder plate and the application, the holder plate and the uniform can be rotated in a predetermined direction. Preferably, the elastic correcting 122 is provided with an elastic force, =: one of the positioning grooves of the secret a and the middle of the clamping, the groove U8C can be oriented toward the other pair of grippers 116a respectively forming the pair of grippers The positioning groove U8e of the clamp groove 116e and the other scale||118a moves. The drive element 1 survey 118b can be disposed on each of the first gripping unit and the second gripping unit 118, respectively. Further, the drive component secret member can drive the gripper 116a and the drive separately. Alternatively, 'only one drive element is configured, and the other is a chain-moving element ("f 2B mesh" t not _), which is used to hold the grippers 116a and 118a. The driving element 116b and the system are disposed on the side of the main body portion 114 for pushing the portions of the holders 116a and 118a on which the positioning grooves 116c and mc are formed. In particular, the drive member 116b and the intestine are used to provide - the force of the arm, and the elastic member 122 provides the -elastic force, and thus the holder n6aA118a is rotatable in a direction opposite to the direction of rotation of the holders U6a and 118a. 16 200834785 At the same time, the clamping unit comprises a first clamping unit 116 and a second clamping unit 118. As shown in "2A®", the first clamping unit 116 is used to check the first tray purchase, and the first tray 102a is adjacent to the main body portion 114, and the second sacrificial unit 118 is used to pick up the first tray 10a2a. One of the second trays 1〇2b below. • The holder 116a of each first clamping unit U6 and the holder 118a of each second clamping unit .U8 may extend below the body portion 114 such that each of the second clamping units 118 The extension length of the holder 118a is one more than the extension of the length of the holder 116a of each first holding unit 116. However, the positioning groove i18c of the holder 118a can be configured to simultaneously receive the first tray leg located in the clamping groove 116C of the holder n6a and the second tray 102b in the holder, 118a and 'plurality of guide rods The 124 series is disposed on the side of the main body portion 114, as shown in "2C", the guide bar 124 is used to guide and fix the tray ι 2, and the tray φ % is sufficient by the first clamping unit 116 and the second clamping sheet It 118 is easily picked up below the main body portion 114. • Yahe, as shown in Figure 1, three tray pickers 112 can be configured to • and to be palletized. This is because the number of the movable tables 1〇3 is three, so the processing speed is increased during the loading and unloading of the tray picker 112. In other words, all the trays 1〇2 placed on the two movable tables 1〇3 can be doubled by the tray 4 gold picker 2, thereby increasing the processing speed. For example, one of the tray pickers 112 can be in the run mode and the other two tray pickers can be in the standby mode 17 200834785. This corresponds to the situation in which the tray picker 112 is able to pick up only one tray. When the three live 103 _ 捡 捡 下方 m m , , , , , , , , , , , , , , , , , , 假设 假设 假设 假设 假设 假设 假设 假设 假设 假设 假设 假设 假设 假设 假设 假设 假设 假设 假设 假设 假设 假设 假设 假设 假设 假设On the other hand, in accordance with the present invention, the tray picker 112 is configured such that the number of tray pickups H 112 corresponds to the number of the movable tables 1〇3. Therefore, it is not necessary to judge whether or not the tray 1〇2 placed on the movable table 1〇3 will be picked up. Therefore, the processing speed is increased to some extent. The rotating package SP manufactured by the entire processing of the conductor package manufacturing system is sent by the fresh element (4), and the Wei and domain unit 1〇1 is also used to unload the manufactured semiconductor package SP. Next, the unmanufactured semiconductor package SP moved by the loading and unloading unit 1 while being placed on the movable stage 1〇3 is moved by the transfer unit 2〇〇 to the package fixing unit 兀300. Of course, the above-described unmanufactured semiconductor package SP can also be directly transferred from the loading and unloading unit 1GG to the package ordering unit 3 (10) without being carried through the transport unit. • The transmission unit 200 has a transmission unit pickup transmission line 202, and the transmission unit pickup line 202 is relatively disposed above the movable stage transmission line 104, and the transmission unit pickup transmission line 202 is perpendicular to the movable stage transmission line 1〇4. That is, the transmission unit 捡 pick-up transmission line 202 is arranged in parallel pallet picker transfer line 11 。. A transmission unit pickup 204 is disposed on the transmission unit pickup transmission line 202, and the transmission unit pickup 2〇4 is disposed along the transmission unit pickup transmission line 2〇2

200834785 移動。傳輸單元撿拾器204用於撿拾托盤102上之半導體封裝sp, 並傳輸撿起的半導體封裝SP至封裝固定單元3〇〇。按照與托盤撿 拾态112相同的方式,每個傳輸單元撿拾器2〇4可以包含一吸取 元件以及一搬運元件。 但是,與托盤撿拾器112不同,傳輪單元撿拾器朋係用於 撿拾各個轉肋裝sp。,f要設収取元件祕撿拾單個 半導體封裝SP。 —在本發明之實施例中’如「第3A圖」與「第3B圖」顯示, 每個傳輸單元撿拾器綱包含—撿拾器組件挪。撿拾器組件施 包含-吸取元件208、-垂直移動元件21G以及—旋轉元件22〇。 吸取元件施驗撿好導體封裝sp,垂直移動元件21〇係用於 垂直移動吸取元件208,旋轉元件22〇則用於旋轉吸取元件测。 吸取元件208係用於利用真空吸取半導體封襄sp。吸取元件 之頂端係配備有-嘴嘴2G9。按照需要也可以配置有複數個吸 ^件2G8。綱日㈣崎,「㈣目」齡,吸取元 件208之數署盏八個。 〇置私動元件210係安裝至吸取元件識上,並包含一第一 驅動元件212以及一第一鏈動元侔隹 牛4。弟一驅動元件212用於當 提供有電源時產生一驅動力。第_絲 鏈動讀214用於傳輸第-驅 動兀件212產生之驅動力至吸取元件 移動。 件208進而吸取元件208能夠 19 200834785 只要當提供電源至第-驅動元件212時,其能難生驅動力, 則屬於本發明領域之熟悉技藝者可以制任意麵之第一驅動元 件。例如,第一驅動元件212可以是馬達。 第-鏈動元件214係用於傳輪第_驅動元件212產生之驅動 力至吸取元件通。只要第一鏈動元件214能夠傳輸第一驅動元件 212產生之驅動經吸取元件駕,進而吸取元件施能夠垂直移 動’則其結構不作特別限定。200834785 Mobile. The transfer unit pickup 204 is used to pick up the semiconductor package sp on the tray 102 and transfer the picked up semiconductor package SP to the package fixing unit 3A. In the same manner as the tray pick-up 112, each transport unit picker 2〇4 can include a pick-up element and a handling element. However, unlike the tray picker 112, the transfer unit pick-up unit is used to pick up the respective ribs sp. , f must set up a component to pick up a single semiconductor package SP. - In the embodiment of the present invention, as shown in "Fig. 3A" and "Fig. 3B", each of the transmission unit pickup assemblies includes a pickup assembly. The pickup assembly includes a suction member 208, a vertical movement member 21G, and a rotation member 22A. The suction element is tested for the conductor package sp, the vertical movement element 21 is used to vertically move the suction element 208, and the rotary element 22 is used for the rotary suction element measurement. The suction element 208 is used to draw the semiconductor package sp by vacuum. The top end of the suction element is equipped with a mouthpiece 2G9. A plurality of suction members 2G8 can also be configured as needed. On the fourth day of the "fourth", the number of 208 elements was collected. The set of telecontrol elements 210 is mounted to the pick-up element and includes a first drive element 212 and a first chain element. A drive element 212 is used to generate a driving force when a power source is supplied. The first wire chain motion read 214 is used to transmit the driving force generated by the first driving member 212 to the movement of the suction member. The member 208, in turn, the pick-up element 208 can be used. As long as the power supply to the first drive member 212 is provided, it is difficult for the drive force to be generated, and those skilled in the art can make the first drive element of any face. For example, the first drive element 212 can be a motor. The first-linking element 214 is used to transmit the driving force generated by the first driving element 212 to the suction element. The structure of the first chain moving element 214 is not particularly limited as long as it can transmit the drive generated by the first driving element 212 through the suction element and the suction element can be moved vertically.

例如,如「第3A圖」顯示,第一鏈動元件214包含一小齒輪 、及卞218 ’其中小齒輪216係安裝至馬達之旋轉軸上, 進而小齒輪216能夠隨同馬達一起旋轉。齒條218係絲於吸取 兀件208上’進而齒條218與小齒輪216齡,以轉換小齒輪加 之旋轉力為直線往復運動。 檢拾器組件施更包含旋轉元件220,以用於旋轉吸取元件 2〇8。疑轉兀件22〇可以包含—第二驅動元件似以及一第二鍵動 το件224 ’其中第二鷄元件222係用於當被提供電源時產生驅動 力。第二鏈動元件224用於傳輸第二驅動元件222產生之驅動力 至吸取元件208,進而吸取元件能夠旋轉。 鮮-驅動元件212相同,只要當提供電源至第二驅動元件 222時’其能夠產生驅動力,則屬於本發明領域之熟悉技藝者可以 採用任^型之第二驅動元件。依照本發明,第二驅動元件從 可以是馬達。 20 200834785 只要第二鏈動元件224能夠傳輸第二驅動元件222產生之驅 動力至吸取元件進而吸取元件观能夠旋轉,則第二鍵動元 件224之結構不作特別限定。 每仏傳輸單元撿拾器204可以包含複數個撿拾器組件2〇6。此 種情況下,在半導體封I sp傳輸之過程中處理速度增加,因此減 少了總處理時間。 依,¾本發明,如「第圖」顯示,每個傳輸單元撿拾器撕 包含八個檢拾器組件施。當然’組成各個傳輸單元撿拾器204 之撿拾器組件206之數量可以根據需要進行改變。 當各個撿拾器組件206触入夾具31〇 t時,依據切割單元 5〇〇 (下文中將作詳細說明)之切割刃5〇2方向,傳輸單元檢拾器 2〇4之各個撿拾器組件206係具有不同的嵌入方向。這時,如「第 1圖」顯示,需要由傳輸單元撿拾器2〇4撿拾之半導體封裝卯排 列於中間台302上。 為了如「第1圖」顯示排列半導體封裝SP於中間台3〇2上, 沾益組件206可以設計具有如下結構:其中數個撿拾器組件施 吸取元件208係有規律地一起旋轉。當然,可以配置用於旋轉 撿拾器組件206之吸取树施之旋轉元件22〇,以旋轉撿拾器組 件206之各個吸取元件208。 另方面’可以配置「第3B圖」顯示之結構用於減少構成旋 轉以牛220之部件數量。特別地,在撿拾胃組件2〇6之吸取元件 200834785 施卜必須成對旋轉的各個吸取元件包含一第二驅動 ==Γ224,其中第二鏈動元件224係用於傳輪第二驅 取元件观。之絲力至對應的吸取元件施,進而能夠移動吸 -例如’如「第3Β圖」顯示,由檢拾器組件2〇6之— =哪位及—口第三舰元件施撿拾之半_裝sp必須沿相 π方向疋位。因此,可以提供—第—驅航件m 一吸取元件鳥及第三吸取元件施e,並且可 躺第-驅動元件222a之旋轉力能夠經由傳送帶细而傳:第 ^取兀件2〇8a以及第三吸取元件職。當然,可以在第一吸取 傳及/三吸取元件施處提供滑輪228,進而旋轉力能夠 被疋地倾至帛—錄树施衫三舰树細c。 同樣地’由撿拾器組件206之一第二吸取元件獅及一第四 吸取兀件施撿拾之轉體職SP必須沿_方向定位。因此, 可=構造第二錄元件施b鄉四吸取树2(跡以使其能夠一 起旋轉。雜,可㈣造第五錄元件識與第七吸取元件戰, 進而使其錢—起_,並且可輯造第六吸取元件肅與第八 吸取元件2_,以使其㈣_起補。 同時’透過構造配置於第—驅動元件2仏以_小齒輪(「第 3B圖」中未顯示)’以及配置於第一吸取元件細&及第三吸取元 件208c之旋轉軸以一齒條(「第3B圖」中未顯示)之結構,進而 22 200834785 歯條同時與第-吸取元件施以及第三吸取元件脈之旋轉轴 鳴合’則可以實現撿拾器組件篇之第一吸取元件麻與第二吸 取元件施之旋轉。因此,第一吸取元件聽與第三吸取元件 ▲08c係同時地成對旋轉。 • 並且,可以設計撿拾器組件206之第一吸取元件騰、第三 •吸取元件施、第五吸取元件208e以及第七吸取元件·之: 構’贿得它們-起共職轉。透過上述結構,以設置半導體封 裝SP由第-吸取元件施、第三吸取元件施、第五吸取元件 2〇8e以及第七吸取元件2(%撿拾,並且沿相同方向位於中間台 302上。當然’也可以設計第二吸取元件2_、第四吸取元件 208d、第六吸取元件208f以及第八吸取元件2隱能夠共同旋轉。 此外,可以構造傳輸單元撿拾器2〇4,以使得其不僅能夠沿著 傳輸單元撿拾轉輸線202移動,並且能夠垂直傳輸單元撿拾器 • 傳輸線2〇2移動。換言之’可以構造傳輸單元撿拾器' 2〇4能夠沿 半導體封裝製造系統之γ軸方向移動。, 傳輸單兀撿拾器204移動沿著的傳輸單元撿拾器傳輸線2〇2 數量可以是數條,以改善半導體封裝製造系統之處理效率。依照 本發明,提供有兩條傳輸單元撿拾器傳輸線2〇2。兩條傳輸單元撿 拾器傳輸線202包含一第一傳輸單元撿拾器傳輸線2〇2a以及一第 二傳輸單元撿拾器傳輸線202b。 第一傳輸單元撿拾器傳輸線202a與第二傳輸單元撿拾器傳輸 23 200834785 線„屢係分別提供於一第—傳輪單元撿拾器、204a以及一第二傳 輸單元撿拾器纖。每個傳輪單元撿拾器綱係用於夾取放置於 動口 3之托盤1〇2上之半導體封裝,其中活動台1〇3沿著 對應的活動台傳輸線104移動,並且沿對應傳輸單元撿拾器傳輸 線2〇2傳輸已夾取之半導體封^至預定區域,例如封裝固定單 TO300之中間台3〇2。 ,當然,傳輸單元撿拾器204可以從中間台3〇2上再次撿拾已 衣化的半封裝SP ’並沿對應的傳輸單域拾器傳輸線搬傳 輸已撿^之料體封裝sp至活動台ι〇3之托盤搬上。 封衣固^單% 3GG係提供祕將雜單元·傳輸之半導體 封衣SP嵌入一夾具310中’其中夾具训用於在半導體封裝兕 之切割過程中對其進行固定。 封裝固定單元3〇〇係包含一夹具31Q以及一封裝固定裝置 5〇其中夹具310為用來固定即將製造之半導體封裝之框架, ί衣口定衣置现用於將半導體封裝sp喪入並固定於夾具31〇 中。此外’封裝固定單元300可以更包含一固定單元撿拾器奶, 以作為傳輸it件驗傳輸封裝蚊單元中的半導體封裝证。 、…錢,將詳細說明夾具細如下。失具31〇係形成為矩形的 平仃、面體。在夾具31〇内部係形成有複數個狹缝則,其中複數 個狹缝314以預定間隔排列。配置狹缝314以使得即將製造之半 導體封裝SP被固定地嵌入狹缝314中。 24 200834785 狹缝314係透過夾具310形成,因此,能夠製造嵌入狹缝内 之半導體封裝SP之相對側。特別地,在半導體封裝SP嵌入央具 310之狹缝314之同時,仍未製造之半導體封裝sp係由切割單元 500切割。下文將對切割單元500作出說明。 另外,如「第1圖」顯示,封裳固定單元3〇〇係配備有中間 台302 ’其中半導體封裝SP首先透過傳輸單元2〇〇被傳送至中間For example, as shown in Fig. 3A, the first chain moving element 214 includes a pinion gear and a pinion 218' in which the pinion gear 216 is mounted to a rotating shaft of the motor, so that the pinion gear 216 can rotate with the motor. The rack 218 is threaded onto the suction member 208. Further, the rack 218 and the pinion gear are 216 years old, and the shifting pin and the rotational force are linearly reciprocated. The pickup assembly further includes a rotating member 220 for rotating the suction member 2〇8. The suspected member 22 can include a second drive member and a second key member 224' wherein the second chicken member 222 is used to generate a driving force when the power is supplied. The second chain moving element 224 is used to transmit the driving force generated by the second driving element 222 to the suction element 208, so that the suction element can be rotated. The fresh-driving element 212 is identical, as long as it is capable of generating a driving force when a power source is provided to the second driving element 222, a person skilled in the art of the invention may employ any type of second driving element. According to the invention, the second drive element can be a motor. 20 200834785 The structure of the second keying element 224 is not particularly limited as long as the second chain moving element 224 can transmit the driving force generated by the second driving element 222 to the suction element and the suction element can be rotated. Each transport unit picker 204 can include a plurality of picker assemblies 2〇6. In this case, the processing speed is increased during the transfer of the semiconductor package I, thus reducing the total processing time. According to the invention, as shown in the "figure", each transport unit picker tears contains eight pickup assemblies. Of course, the number of picker assemblies 206 that make up each of the transport unit pickers 204 can be varied as desired. When each of the pickup assemblies 206 is brought into the jig 31〇t, the respective pickup assemblies 206 of the transfer unit pickups 2〇4 are oriented in accordance with the cutting edge 5〇2 direction of the cutting unit 5〇〇 (described in detail below). The system has different embedding directions. At this time, as shown in Fig. 1, the semiconductor package package which needs to be picked up by the transfer unit pickup 2〇4 is arranged on the intermediate stage 302. In order to display the semiconductor package SP on the intermediate stage 3〇2 as shown in Fig. 1, the smear assembly 206 can be designed to have a structure in which a plurality of pickup unit applying suction members 208 are regularly rotated together. Of course, the sucking element 22 for rotating the picker assembly 206 can be configured to rotate the respective picking elements 208 of the picker assembly 206. On the other hand, the structure shown in Fig. 3B can be configured to reduce the number of components constituting the rotation of the cow 220. In particular, the pick-up elements 200834785 in the pick-up stomach assembly 2〇6 must include a second drive==Γ224 in each of the pick-up elements that must be rotated in pairs, wherein the second chain-moving element 224 is used to transport the second drive-off element View. The wire force is applied to the corresponding suction element, and then the suction can be moved - for example, as shown in the "3rd drawing", by the pickup assembly 2〇6 -= which and the third port component is picked up by half_ The sp must be clamped in the direction of the phase π. Therefore, it is possible to provide the first driving member m, the suction member bird and the third suction member e, and the rotational force of the reclining first driving member 222a can be transmitted through the conveyor belt: the second picking member 2〇8a and The third is to take the component. Of course, the pulley 228 can be provided at the first suction and/or three suction elements, and the rotational force can be tilted to the bottom of the tree. Similarly, the swivel job SP, which is picked up by the second pick-up element lion and the fourth pick-up element of the pick-up assembly 206, must be positioned in the _ direction. Therefore, it is possible to construct a second recording element to apply a bucking tree 2 (to make it possible to rotate together. Miscellaneous, (4) make a fifth recording component and a seventh suction component to fight, thereby making it money-up, Moreover, the sixth pick-up element can be fabricated and the eighth pick-up element 2_ can be made to make it (4)_complement. At the same time, the transmission structure is disposed on the first drive element 2, and the pinion gear is not shown in the figure (not shown in FIG. 3B). 'and the rotation axis of the first suction element thin & and the third suction element 208c is a rack (not shown in "Fig. 3B"), and further the 22 200834785 purlin is simultaneously with the first and the suction element The rotation axis of the third pick-up element is turned on, so that the first pick-up element and the second pick-up element of the pick-up assembly can be rotated. Therefore, the first pick-up element listens to the third pick-up element ▲08c simultaneously Rotating in pairs. • Also, the first suction element, the third, the suction element, the fifth suction element 208e, and the seventh suction element of the pickup assembly 206 can be designed: Through the above structure, set half The body package SP is applied by the first-absorbent element, the third suction element, the fifth suction element 2〇8e, and the seventh suction element 2 (% picked up and located on the intermediate stage 302 in the same direction. Of course, the second can also be designed second The suction element 2_, the fourth suction element 208d, the sixth suction element 208f, and the eighth suction element 2 can be co-rotated together. Further, the transmission unit pickup 2〇4 can be constructed so that it can not only pick up and transfer along the transmission unit The line 202 moves and is capable of vertical transmission unit pickups • transmission line 2〇2 movement. In other words, the 'transportable unit pickup' 2〇4 can be moved in the γ-axis direction of the semiconductor package manufacturing system. The transmission single pickup 204 moves The number of transmission unit pickup transmission lines 2〇2 along the number may be several to improve the processing efficiency of the semiconductor package manufacturing system. According to the present invention, two transmission unit pickup transmission lines 2〇2 are provided. Two transmission unit pickups The transmission line 202 includes a first transmission unit pickup transmission line 2〇2a and a second transmission unit pickup transmission line 202b. The first transmission The unit pickup transmission line 202a and the second transmission unit pickup transmission 23 200834785 lines are respectively provided in a first-transport unit pickup, 204a and a second transmission unit pickup. Each of the transmission unit pickups It is used for clamping a semiconductor package placed on the tray 1〇2 of the movable port 3, wherein the movable stage 1〇3 moves along the corresponding movable stage transmission line 104, and is transported along the corresponding transmission unit pickup transmission line 2〇2 The semiconductor package is sealed to a predetermined area, for example, the intermediate stage 3〇2 of the fixed single TO300. Of course, the transfer unit pickup 204 can pick up the printed semi-package SP' from the intermediate stage 3〇2 and correspondingly The transfer single-domain pickup transfer line has been transported to the tray of the movable table ι〇3. The sealing unit is provided with a semiconductor unit. The sealing SP is embedded in a jig 310. The jig is used to fix the semiconductor package 切割 during the cutting process. The package fixing unit 3 includes a clamp 31Q and a package fixing device 5, wherein the clamp 310 is used to fix the frame of the semiconductor package to be manufactured, and the LY garment is used to smother and fix the semiconductor package sp In the clamp 31〇. In addition, the package fixing unit 300 may further comprise a fixed unit pickup milk for transmitting the semiconductor package certificate in the package unit. , ... money, will detail the fixture as follows. The missing 31 is formed into a rectangular flat or flat body. A plurality of slits are formed inside the jig 31, wherein the plurality of slits 314 are arranged at predetermined intervals. The slit 314 is disposed such that the semiconductor package SP to be manufactured is fixedly embedded in the slit 314. 24 200834785 The slit 314 is formed by the jig 310, and therefore, the opposite side of the semiconductor package SP embedded in the slit can be manufactured. In particular, while the semiconductor package SP is embedded in the slit 314 of the implement 310, the semiconductor package sp that has not yet been fabricated is cut by the cutting unit 500. The cutting unit 500 will be described below. Further, as shown in Fig. 1, the cover fixing unit 3 is equipped with an intermediate stage 302' in which the semiconductor package SP is first transferred to the middle through the transfer unit 2

台302。設置中間台302以使得其能夠沿著中間台傳輸線3〇4移 動’其中中間台傳輸線3〇4係垂直於傳輸單元檢拾器傳輸線2〇2。 傳輸單it撿拾$ 204之各個吸取元件進行旋轉,進而如「第1 圖」顯示之排列半導體封裝SP係位於中間台3〇2之頂部。即,半 導體封裝SP如「第1圖」顯示配置於中間台观上。 當半導體封裝SP如上文所述進行配置時,由於_單元· 之切告’j刃502係设计為不同之結構(關於切割刀地下文將作出 說明)’則能夠製造位於兩個狹縫線其中一個中之半導體封褒Sp 頂部’亚且此夠製造位於另一狹缝線内之半導體封裝Sp底部,其 中狭缝314係沿著狹縫線排歹卜因此,假如切割單元_之切割 刃被設計為_結構’耻般計可岐不必要的。 ° 中間台302與中間台傳輸線綱之數量可以為數個。依照本 4月係配置有兩個中間台搬及兩個中間台傳輪線綱。當中 台3〇2與中間台傳輪線綱為兩個或更多時,則處理效率得以改 呈。 25 200834785 至於搬運元件,一固定單元撿拾器傳輸線32〇及一固定單元 撿拾器322係配置於各個中間台傳輸線3〇4 _端上方。固定單元 撿拾器、傳輸線320係垂直於中間台傳輪線3〇4,並且固定單 器322可沿著固定單元撿拾器傳輸線32〇移動。 • 固疋單元撿拾态322係用於夾取尚未製造且置於中間台3犯 .上之半導體封裝SP,以放置夾取之半導體封裝sp於封裝固定裝 置350之支座塊392上,並傳輸已製造且置於支座塊列2上之半 導體封裝SP至一清洗台616。 如「弟4八圖」與「第4BII」顯示,固定單元撿拾器322係 配備有-撿起裝置324,撿起裝置324包含吸取元件326、驅動元 件328以及-醜單元330 ’其中吸取元件326驗撿起半導體封 裝SP ’驅動件328用於產生移動吸取元件326所需之驅動力。 鏈動單S 330用於傳輸驅動元件328產生之驅動力至吸取元件 326。Station 302. The intermediate stage 302 is disposed such that it can move along the intermediate stage transmission line 3〇4 where the intermediate stage transmission line 3〇4 is perpendicular to the transmission unit pickup transmission line 2〇2. Each of the pick-up elements of the transfer unit is rotated 200, and the semiconductor package SP is placed on top of the intermediate stage 3〇2 as shown in the “Fig. 1”. That is, the semiconductor package SP is arranged on the intermediate stage as shown in "Fig. 1". When the semiconductor package SP is configured as described above, since the 'unit' indicates that the 'j edge 502 is designed to have a different structure (to be explained below with respect to the cutting blade)', it is possible to manufacture the two slit lines. One of the semiconductors is sealed with the top of the top portion of the semiconductor package Sp, and the slits 314 are arranged along the slit lines. Therefore, if the cutting unit is cut, the cutting edge is Designed as a _structure 'shame can be unnecessary. ° The number of intermediate station 302 and intermediate station transmission lines can be several. According to this April, there are two intermediate stations and two intermediate transmission lines. When the intermediate platform 3〇2 and the intermediate platform transmission line are two or more, the processing efficiency is changed. 25 200834785 As for the handling component, a fixed unit pickup transmission line 32A and a fixed unit pickup 322 are disposed above the respective intermediate transmission lines 3〇4 _ end. The fixed unit pickup, transmission line 320 is perpendicular to the intermediate stage transfer line 3〇4, and the fixed unit 322 is movable along the fixed unit pickup transfer line 32〇. • The solid state unit 322 is used to clamp the semiconductor package SP that has not been fabricated and placed on the intermediate stage 3 to place the clamped semiconductor package sp on the holder block 392 of the package fixture 350 and transmit The semiconductor package SP, which has been fabricated and placed on the column block 2, is attached to a cleaning station 616. As shown in "Big 4" and "4BII", the fixed unit pickup 322 is equipped with a pick-up device 324 that includes a suction member 326, a drive member 328, and a ugly unit 330. The pick-up member 326 The semiconductor package SP' driver 328 is used to generate the driving force required to move the pick-up element 326. The chain drive S 330 is used to transmit the driving force generated by the drive element 328 to the suction element 326.

I 吸取兀件326係用於利用真空吸取半導體封裝sp。每個吸取 兀件326之頂端係配備有一吸取噴嘴327。可以配置複數個吸取喷 嘴327 ’進而吸取喷嘴327按照需要按數行排列。較佳地,排列吸 取贺嘴327 ’以使其與支座塊392的形狀對應。依照本發明,如「第 4B圖」顯不’較佳為沿一行排列有兩個吸取喷嘴327,且配置兩 行之吸取噴嘴327。 驅動元件328係提供用於驅動各個吸取喷嘴327,驅動單元 26 200834785 似可以採用自各種電源。依照本發明,各個驅動元件娜為一馬 達。 _鏈動單元33G係用於傳輸產生自驅動元件328之驅動力至吸 取〜牛3‘6。依照树明,由於驅動元件328為馬達,因此較佳為 .構造鏈動單元挪,以使得驅動元件328產生之旋轉運動能夠被轉 化為吸取元件326之直線運動。 • I鍵動單元33〇包含支撐桿332、導引桿334、齒條336以及小 u輪338支撐桿332係用於支撐吸取元件326,導引桿辦係連 接至支禮桿332 -端之侧部’以引導吸取元件326之運動。齒條 336形成於各個導引桿334上’小齒輪现則絲於驅動元細 之_軸上,進而小齒輪338與對應之齒條说嗜合。 關於鏈動單元330及吸取元件汹之結構將更詳細地說明如 Z 縣她27係穿鱗_支細32,進㈣取喷嘴 •鶴1ΓΓ上下之Γ於Γ導引桿334上之齒條336係舆各個 、應小㈤輪338上嗜合,由此驅動元件328之 ==轉換為垂直往復運動。當然,除咖%與小錄观 採用^之外’任何可轉換旋轉運動為垂直往復運動之機構均可以 與彈:了:配置一修正單元340 ·單元340包含修正桿342 " 修正桿342係固定於支撐桿332 -端之例部,進 而修正桿342孚尸狄、营, 侧口P,進 丁 引桿334排列。彈性元件344用於彈性支 27 200834785 :彡 在〗、回輪與對應齒條336嗜合的同時,當小齒 —,疋^日寸,修正單元340用於防止由於各個齒條之間限定之 間隙2如定位錯誤的出現(齒隙)而造成的運動傳輪偏差。 —同時,半導體封裝固定裝置35〇係提供用於固定經由固定單 兀撿拾器322傳輪之半導體封裝sp於夾具則上。 下麵’炫結合「第5A圖」,詳細說明半導體封裝固定裝置350。 半導體封裝ϋ定裝置35G包含—主體單元、—第—推進組件 390、-第二推進組件4〇〇以及一鍵動單元別。主體單元具 有:夾具保持器376,以容納夾具310。第一推進組件390用於將 半&體封衣SP肷入夾具310中,第二推進組件4〇〇用於將半導體 封衣sp攸夾具310中移除。鏈動單元37〇用於移動夾具保持器 進而半$體封裝Sp能夠被容易地喪入夾具31〇中, 中移除。 半導體封裝固定裝置35〇之主體單元係包含—水平元件 362 ’以構成主體單元之底部,還包含與水平元件遍垂直之 垂直元件364。鏈動單元370係設置於水平元件362與垂直元件 364之間。 鏈動單元370包含-水平鏈動元件372以及一垂直鏈動元件 374,其中水平鏈動元件372可沿著水平元件紐滑動,垂直鏈動 元件374可沿著垂直元件364滑動。夾具保持器376係設置於水 平鏈動元件372與垂直鏈動元件374之間,並且夾具保持器376 28 200834785 係用於容納夹具310。 夹具保持器376 -端係鉸鏈連接至垂直鏈動元件374之上 端,因此,夹具保持器376能夠關於垂直鏈動元件374上端鉸接 々疋付穴具保持益376沿其每側係配備有一導引槽3 78。 水平鏈動το件372之相對側係配置有侧壁373,以支樓夹具保 U76在相對侧壁373之上端係形成有旋轉軸38〇,其中旋轉 軸勘向内延伸,進而旋轉軸遍互相相對。如「第5A圖」、「第 5B圖」第5C圖」及「第5D圖」顯示,水平鏈動元件奶之旋 轉軸380係沿著夾具保持器376之對應導引槽挪移動。並且, 每個旋轉軸380可以配備有一滾輪,以有助於旋轉轴彻沿對應 導引槽378移動。 只要為啊動結構,任何結構均可以應用於水平元件尬與 水平鏈動元件372之間以及垂直元件364與垂直鏈動元件374 ^I suction element 326 is used to vacuum the semiconductor package sp. The top end of each suction member 326 is provided with a suction nozzle 327. A plurality of suction nozzles 327' may be disposed, and the suction nozzles 327 may be arranged in a plurality of rows as needed. Preferably, the mouthpiece 327' is aligned to correspond to the shape of the holder block 392. According to the present invention, as shown in Fig. 4B, it is preferable that two suction nozzles 327 are arranged in one row, and two rows of suction nozzles 327 are disposed. Drive element 328 is provided for driving each of the suction nozzles 327, and drive unit 26 200834785 may be adapted from a variety of power sources. According to the invention, each of the drive elements is a motor. The chain unit 33G is for transmitting the driving force generated from the driving member 328 to the suction of the cow 3'6. According to the tree, since the driving member 328 is a motor, it is preferable to construct the chain moving unit so that the rotational motion generated by the driving member 328 can be converted into a linear motion of the suction member 326. • The I-key unit 33 includes a support rod 332, a guide rod 334, a rack 336, and a small u-wheel 338. The support rod 332 is for supporting the suction member 326, and the guide rod system is connected to the end of the support rod 332. The side portion 'to guide the movement of the suction element 326. A rack 336 is formed on each of the guide rods 334. The pinion gear is now on the shaft of the drive element, and the pinion 338 is said to be in line with the corresponding rack. The structure of the chain-moving unit 330 and the suction element 将 will be described in more detail. For example, Z County, her 27-series scaly _ branch 32, the inlet (four) take the nozzle, the crane 1 ΓΓ, the 336 on the Γ guiding rod 334 The system is accommodating to each of the small (five) wheels 338, whereby the == of the drive element 328 is converted into a vertical reciprocating motion. Of course, except for the coffee% and the small recording view, any mechanism that converts the rotary motion into a vertical reciprocating motion can be used together: a correction unit 340 is configured: the unit 340 includes a correction rod 342 " It is fixed to the example of the end of the support rod 332, and then the rod 342 is fixed, the battalion, the side port P, and the ferrule 334 are arranged. The elastic member 344 is used for the elastic branch 27 200834785: while the return wheel and the corresponding rack 336 are in harmony, when the small tooth is 小, the correction unit 340 is used to prevent the limitation between the respective racks. The gap of motion 2 caused by the occurrence of a misalignment (backlash). At the same time, the semiconductor package fixing device 35 is provided with a semiconductor package sp for fixing the transfer wheel via the fixed single pickup 322 to the jig. The semiconductor package fixing device 350 will be described in detail below with the combination of "Hyun" and "5A". The semiconductor package determining device 35G includes a main body unit, a first pusher assembly 390, a second pusher assembly 4A, and a keying unit. The main body unit has a jig holder 376 to accommodate the jig 310. The first advancement assembly 390 is used to plunge the semi-ample body seal SP into the jig 310, and the second advancement assembly 4 is used to remove the semiconductor seal sp攸 jig 310. The chain moving unit 37 is used to move the jig holder, and the half body package Sp can be easily lost in the jig 31, and removed. The body unit of the semiconductor package fixture 35 includes a horizontal element 362' to form the bottom of the body unit and a vertical element 364 that is perpendicular to the horizontal element. The chain drive unit 370 is disposed between the horizontal member 362 and the vertical member 364. The chaining unit 370 includes a horizontal chaining element 372 and a vertical chain element 374, wherein the horizontal chain element 372 is slidable along the horizontal element and the vertical chain element 374 is slidable along the vertical element 364. A clamp holder 376 is disposed between the horizontal chain link member 372 and the vertical chain link member 374, and the clamp holders 376 28 200834785 are used to receive the clamp 310. The clamp holder 376 - the end hinge is connected to the upper end of the vertical chain element 374, so that the clamp holder 376 can be hinged about the upper end of the vertical chain element 374 to maintain a hole 376 with a guide along each side thereof Slot 3 78. The opposite side of the horizontal chain traversing member 372 is provided with a side wall 373, and the branching fixture U76 is formed with a rotating shaft 38〇 at the upper end of the opposite side wall 373, wherein the rotating shaft is extended inwardly, and the rotating shaft is mutually extended relatively. As shown in Fig. 5A, Fig. 5B, Fig. 5C and Fig. 5D, the horizontal chain element milk rotation shaft 380 is moved along the corresponding guide groove of the jig holder 376. Also, each of the rotating shafts 380 may be provided with a roller to facilitate the movement of the rotating shaft along the corresponding guiding groove 378. Any structure can be applied between the horizontal member 尬 and the horizontal slewing member 372 as well as the vertical member 364 and the vertical slewing member 374 as long as the structure is ah.

間。例如,一導引槽可以形成於一側,並且一導引突起可以形成 於另一側。當m達及—第二馬達可以分觀置於水平 鏈動兀件372縣直鏈就件374上,以可滑躺轉水平鍵動 元件372及垂直鏈動元件374。 此外’如「第5C圖」顯示,當夾具保持器376直立時,可以 配置-夾具保持器固定單元384關定夾具保持器挪,進而夹具 保持器376不會晃動。 /、 夾具保持器固定單元384係配置於垂直鍵動元件讲之相對 29 200834785 較低側,並具有一主體385自垂直鏈動元件374垂直突出。主體 385配備有—凹槽386,其中凹槽撕向下凹陷。在凹槽地中係 設置有-彈性元件387,例如彈簧。在例如彈簧之彈性元件撕 =端係絲有-突起娜,突起388能夠沿著凹槽撕滑動,進而 突起m之頂端暴露於外側。特別地,突起瑚自彈性元件撕 彈性支撐,因此突起388之頂端向外暴露。 同%,失具保持器376之下端係配備有一嗜合槽谢,如「第 =圖」顯示,當夾具保持器376直立時,嗜合槽谢與失具保持 =定單元384對應。較佳地,粒嗜合槽389與夾具保持^ 定早το 384之突起388頂端嗜合。因此,突起撕穩定地喷合於 唾合槽389中,由此可以防止夾具保持器376晃動。 °、 如「第7A圖」顯示,一夾具定位孔382係形成於夹具保持哭 376中。形成夾具定位孔3δ2,進而其對應於夾具31〇之外形。才: 造夾具定位孔382之結構為:夹具31〇係由真空吸取,並且夹具 3Κ)係固定於夾具定位孔382中。本領域之熟悉技藝者可以不同地 设想出上述夾具310固定於夾具定位孔382中之結構。 如上文所述,半導體封裝固定裝置35〇包含第一推進组件 390。第-滅組件390係安裝至水平元件362上,進而第一推進 組件390能夠獨立於水平鏈動元件372滑動。第一推進組件· 可以被構造使得第-推進組件390能夠沿著一底座391移動,其 中底座39!係沿著X軸方向及γ軸方向平行於水平元件啦設置二 30 200834785 第一推進組件390包含一主體部393, 一支座塊392以及—第 一推進單元395。主體部393形成第一推進組件390之主體,支座 塊392係配置於主體部393之頂端,進而半導體封裝sp位於支座 塊392頂部。第一推進單元395以相同於支座塊392之高度可水 平移動。 如「第8圖」顯示,支座塊392係用於將半導體封裝sp定位 於其上,並且用於引導半導體封裝SP,進而半導體封裝sp可由 苐一推進部397容易地嵌入炎具310之狹缝314中。 支座塊392用於引導半導體封裝sp,進而半導體封裝sp能 夠穩定地嵌入夾具310之狹缝314中。然而,假如半導體封裝sp 能夠被穩定地引導至夾具310之狹缝314中,則支座塊392可以 被取下。 支座塊392之頂部係配備有凹陷之定位部394,半導體封裝 SP係放置於定位部394上部。定位部394用於引導半導體封裝 sp,進而半導體封裝SP能夠正確地嵌入狹缝314中。 並且’如「第8圖」顯示,支座塊392係設計為台階狀結構。 特別地,支座塊392頂部係構造為兩層結構。較佳地,第一定位 口P 394a及第一疋位部394b係形成於支座塊392的較低頂部及較 高頂部,進而兩個半導體封裝SP能夠同時地欲入夾具310之狹缝 314中。當然,依照需要,支座塊392可以構造為一層結構,或者 多層結構。 200834785 在每個第一定位部394a中,係形成有—氣孔396。同樣地, 氣孔396形成於各個第二定位部鳩中。第—定位部綱&及第 二定位部394b上方之空氣透過氣孔396被抽空至—真空源,因此 +導體封裝SP能夠正確且穩定地放置於定位部别&及第二 定位部394b上。 v 第-推進單元395係配置於支座塊392的—側,例如位於和 夾具保持器376絲位肋對之位置處。第—推進單元係構 造為沿著主體部393頂部水平滑動。 —第-推進單A 395係、配備有可滑動之第一推進部撕,進而在 第-推進部397平行於支座塊392的同時,其能夠朝向或雜支 座塊392移動。如「第6A圖」顯示,第一推進部397之頂端係設 計為兩層結構。第-推進部397之兩層頂端允許放置於兩層結構 構造之支座塊392之第-定位部394a及第二定位部罵上的半 導體封裝sp能夠被同時嵌入夾具31〇之狹缝314中。 第-推進單το 395更包含-驅動單元,以驅動第一推進部 397 ’進而第-推進部397能夠沿著主體部观頂部滑動。如「第 6A圖」顯示,驅動單元包含一馬達(「第6A圖」未顯示)、一第 一第-滑輪398a、-第二滑輪398b,以及一傳送帶3·。馬達用 於當被賦以能量時產生一驅動力,第一滑輪3術係連接至馬達之 旋轉軸,進而第一滑輪398a能夠由馬達旋轉。第二滑輪3_與 第-滑輪398a係間隔一預定距離,傳送帶施則圍繞第一滑輪 32 200834785 398a及第二滑輪398b運轉。 在傳送帶398c與第-推進部397之間可以配置一固定導引裝 置398d,藉由固定導引裝置398d,傳送帶邓%與第一推進部397 可A/、夕動“备然,上遂第一推進部397沿主體部3刃頂部滑 動之結構可由本技術領域之熟悉技藝者變化獲得。 另一方面,如「第6A圖」顯示,第一推進單元395可以包含 對第-推進單元,例如μΐ推進單元395a與U推進單元難。 這樹月况下’上述滑動結構可以應用於μι推進單元奶&與u 推進單元395b中,進而丨·1推進單元395a與W推進單元働 能夠獨立運行。 卜另外,如「第7A圖」、「第7B圖」、「第7C圖」、「第7〇圖」 及「第7E圖」顯示,一感測單元399係安裝至w推進單元洲 及1_2推進單元㈣上’當半導體封裝sp歲入夾具之狹缝 3H中或者從中分離時’感測單元399用以防止由於狹㈣*邊緣 與半導體封裝SP之間的干涉而導致第—推進單元·出現故障。 如「第6A圖」詳細顯示,第一推進部397包含一推進刃施、 -推進刀導桿鳩卩及―支撐導桿撕。推進们祝係配置於 其頂端,進而推進刃397a與半導體封裝sp得到接觸。推進刀導 桿3=設置於推進刃施下方,用於可移動地支撐推進刃贏。 支掉導捍撕係設置於推進刀孤後部,用於支樓推進刀397a。 感測單元399可以配置於推進刃孤與支撐導桿撕之間, 33 200834785 亚可以包含i性元件399a以支進们π㈣及包含安 ,推進刀397a或支撐導桿Wc 一侧之感測器鳩。當然,更 可以提供一導引桿3"C,以防止彈性元件399a從推進刃397a與 支撐導桿397c之間分離。 、 例如,彈性元件399a例如可以是彈簧。感測器通可以為 一接觸感·。因此,#推制397a糊料具·邊緣沖突時, 因此推進刀397a沒有嵌入夹具31G之狹缝314中,則推進刀撕 之後知與導引桿399c產生接觸,結果是感測器39%運行以傳輪 推進刀397a之故障訊號至一控制單元(「第6A圖」中未顯示 同時,第二推進組件4〇〇係設置於第一推進組件39〇之相對 侧,進而第二推進組件4〇〇對應於第一推進組件39〇。如「第6b 圖」顯示,第二推進組件400係構造為與第一推進組件39〇相同 之結構。 例如’第二推進組件4〇〇可以包含一 2-1推進單元4〇1&與_ 推進單元4〇lb。每個推進單元4〇la及4〇lb可以包含一推進部 402、一驅動單元403以及一感測單元404。此外,推進部402可 以包含一推進刃402a、一推進刃導桿402b以及一支撐導桿4〇2c。 驅動單元403可以包含一第一滑輪4〇3a、一第二滑輪403b、一傳 送帶403c以及一固定導桿403d。感測單元404可以包含一彈性元 件404a及一感測器404b。 但是,第二推進組件400係從圖示的右側向左侧移動,以傳 34 200834785 輸夹具310之狭縫314中接收之半導體封裝sp至支座塊观之定 位部394。 因此,如「第6B圖」顯示,與第一推進部397之推進刀施 頂端不同,第二推進部4G2之推進刃搬a頂端係具有不同之長 度。這是因為支额392之第一定位部购與第二定位部拠 之間之距離偏差能夠由第二推進部搬之推進刀搬&頂端之間的 長度補償。換言之’推進刀397a與她之間的差別係由第一定 位部394a之尺寸補償。 此外,請參考「第5D圖」,在半導_裝sp由第一推進部 397篏入夾具310之狹縫314之後,第一推進部397從狹缝糾 上分離,並且垂直移動夾具保持器376之垂直鍵動元件374執行 向上或向下運動,進而空閑狹缝3H係位於第一推進部397之移 動路線上。當然,即使當半導體封裝sp由第二推進部搬從狹縫 314上移除時,則按相反次序執行上述操作。 隨後’將參考「第1圖」詳細說明切割單元5〇〇如下,其中 切割單元,係用於切割由封裝固定單元勤嵌入並固定於失具 310内之半導體封裝SP。 /、 切割單元500包含切割刃502、一可旋轉卡盤台5〇4、一卡盤 台傳輸線5〇6以及-位置變換裝置S2〇。切割刀5〇2係用於切割: 導體雖SP,可旋轉卡盤台谢上設置有夾具谓,卡盤台傳輪 線鄉用於傳輸卡盤台5〇4至切割刃观,位置變換裝置52〇貝^ 35 200834785 則,進㈣具31q關觀為顛倒方向。 j單元5GG更包含—切割單元撿拾器观以及—切割單元 壯才口 J專^線5〇9。切割單元撿拾器观用於撿起放置有半導體封 之f ’亚沿著切割單元撿拾器傳輸線奶移動,以傳 • 1夹具310至卡盤台504。卡盤台5〇4係配置於切害,J單元撿拾器 ,=之移動路線下方,設置卡盤台5〇4以使其能夠圍繞其垂直軸旋 鲁^ 1化者平仃切割單元撿拾器傳輸線$⑽之卡盤台傳輸線鄕 移動至切割刃502。 立内和疋有半導體封裝sp之夾具31〇係位於卡盤台谢之頂 〜在夾,、310 j則,例如夾具31〇頂部被切割之後,則需要切 割夾具細之底部。這時,在固定夾具3K)的同日寺,位置變換裝 圍%水平細疋轉夾具31〇,進而颠倒失具训頂部及底部。 i考第9A圖」與「第9B圖」,本發明之位置變換裝置 • 2〇係包3爽具固定單元530以及一旋轉單元M0。夾具固定單 元530用於固定内部嵌有半導體封裝SP之失具310,旋轉單元· 祕疑轉夾具固定單元530。在嵌入夾具綱之半導體封裝处之 ‘ 體封裝sp之相對端必須被蝴。因此,位置變 換裝置520用於旋轉夾具310。 夾具固定單元53〇係配備有一框架S32,框架532内部限定有 -預定空間’例如一夾具定位空間SS1,以用來固定内部财半導 體封裝sp之夾具310。較佳地,夾具定位空間531係形成與夹具 36 200834785 3i〇形狀_、之矩形框形狀。框架532之形狀也形成為矩形。 立如弟10圖」顯示’ _臨時固定元件533係配置於框架淡 内士以用來在夾具31()定位過程中臨時地固定夾具定位空間別 H)。臨時固定元件533可以包含—嗔合突起$说以及 彈/、533b喷合突起533a可以在框架532内部限定之預定空間 内'月動’彈黃533b係用於彈性支撐嗜合突起533a。在夾具310外 何场成嗜合槽3〇la,其中喷合槽3灿中鉤住有臨時固定元 件f3之嗜合突起现。在上述說明中,雖然:本技術領域之熟悉 技蟄者可以設想出其他可能之結構,但央具训係臨時地固定於 框架532之夾具定位空間531中。 532之相對端係配置有固定單元534,以固定夹具wo, 進而當夾具31〇位於夾具定位空間531中時,其不會自夾具定位 空間531中分離。 母個映單元534係包含一_元件537以及—移動元件 538固定耕537係設置於框架532 一端,進而固定元件537能 狗沿者框架532之縱向移動。固定元件537内部形成有固定狹縫 536,以固定夾具31〇 一端。移動元件538係用於沿著框架切之 縱向移動固定元件537。 只要夾具310由單獨固定元件537固定而不能從失具定位空 7幻1中分離,則可以使用一單獨固定元件537。然而,較佳的是 提供-對固定元件537。可以構造固定元件537,以使其能夠互相 37 200834785 相向或者互相遠離移動。並且,固定狹缝536係形成與夾具3i〇 各角對應之形狀’進而夾具310各個角能夠喪入固定狹缝说内。 同時,每個移動元件538可以安裝至對應的固定元件撕上。 、対夕動元4^38摘以直線往復運動形式移動固定元件切,則 不對其作特別限定。依照本發明,移動元件538可以為一汽缸 (cylinder ) ° 此外私動元件538係安裝至成對的固定元件537上,這樣 每個移動元件538能夠連接至對應固定元件537之内部。佈置上 述安排,以穩定地移動固定元件537至夾具定位空間531。 位置變換裝置520之旋轉單元54G包含一驅動元件542以及 鏈動單几544。驅動元件542係安裝於夾具固定單元53〇 一侧, 進而驅動元件542能齡線軸。鏈解元说驗轉換驅動元 件M2之直線運動為旋轉運動,進而夾具固定單元別能夠被旋 轉。 請參考「第9A圖」,驅動元件542係安裝於位置變換裝置52〇 -侧。驅動元件542可以是-氣筒(air cylinder),其能夠執行執 行往復運動。鏈動單元544係用於轉換驅動元件542之直線運動 為夾具固定單元530之旋轉運動。 鏈動單元544包含一齒條546,齒條546係連接至驅動元件 542,進而當驅動元件542以氣筒形式移動時,_ 546能夠隨同 驅動元件542 —起直線運動。鏈動單元544還包含一小齒輪548, 38 200834785 小齒輪548係連接至夾具固定單元53〇之旋轉軸,小齒輪548與 齒條546嚙合,進而小齒輪548能夠旋轉。 因此,透過齒條546與小齒輪548之共同操作,驅動元件542 之直線運動被轉換為夾具固定單元53〇之旋轉運動。 雖然旋轉單元540包含驅動元件542以及鏈動單元544,其中 鏈動單元544係用於轉換驅動元件⑽之直線運動為旋轉運動。 如上文所述’透過_之_元件’只要能_換錢運動為旋 車τ元件本領域之热悉技藝者能夠採用任何類型之旋轉元件。 或者,可峨置馬達、絲齒輪以及從動錄之組件。這種情況 下,則不S要轉換直線運動為旋轉運動。 —位置變換裝置52〇可以更包含一移動單元55g,以移動夹具固 定单το 530脫離位置變換裝置52〇。正如「第i圖」顯示,位置變 換装置520係平行於卡盤台傳輸線5〇6設置。因此,移動單元55〇 透,遠離卡盤台504 -定距離而移動位置變換裝置52〇之失具固 、,=動單元550係包含_驅動馬達(「第μ圖」中未顯示),— 姐以及-傳送帶固定元件5Μ。驅動馬達麟當被職以其 ^置時產生—驅動力’傳送帶议用於傳輪驅動馬達之驅動力 失具固定單元530,傳误黑涵——α 、k▼固疋兀件554則固定至傳送帶552,以 允許傳送帶552之驅動力偉仏 司刀得輸至夾具固定單元53〇。 如厂第9A圖 - 」絲、不,驅動馬達係包含於位置變換裝置520 39 200834785 二=生驅動傳送帶552所需之旋轉力。傳送帶552係設計為 月^圍⑼配置於位置變換裝置52〇相對側之滑輪说運轉。並且, 可以提供-對傳运帶552,進而傳送帶M2沿位置變換穿置別 之縱向,例如夹具固定單元53〇之運動方向互相平行。、、 傳送帶固定元件554係固定於傳送帶552 -側,並連接至夾 具固定I元530以及狀於傳送帶议上。因此,傳送帶固定元 件554鱗傳送帶垃之驅動力被直接傳送至夾具固定單元別。 同% ’可以可拆卸方式構造夾具固定單元別盘旋轉單元 2。、例如,連接至夹具蚊單元別之旋轉軸之小齒輪548可以 汉计為垂直於旋轉單元54〇之齒條546之運動方向移動。 特別地’傳送帶固定元件554可以包含於夹具固定單元別 中,並且僅包含小齒輪548之夾具固定單元53〇可以從旋轉單元 540上刀離’進而透過傳送帶552的運動,夹具固定單元別能夠 被移動脫離於位置變換裝置520。 扭回參考「第丨圖」,切割刃观係設置於卡盤台傳輸線鄕 上刀d刃502係用於切副放置於夾具31〇上之半導體封裝卯為 使用者期望之形狀。 構造切割刀502為兩個互相平行排列之切割力5〇2,設計切割 刃502互相平行排列之原因是因為,半導體封襄sp係以兩行置於 失具训上。並且,切割刃观具有不同之形狀。這是因為,即 將切割之半導體封裝sp之__具有不_靴。當然,如果 200834785 需要’切割刃502也可以具有相同的形狀。或者,其他不同結構 也可以應用於切割刃502。 例如,切割刃502可以垂直設置,進而切割刃5〇2互相相對。 這種情況下,切割刃502係設置於夾具310之運動線路上方及下 方,以同時切割嵌入夾具310之狹縫314内之半導體封裝sp之頂 部及底部。這時,上述位置變換裝置520則是不必要的。 請返回參考「第1圖」’下麵將說明半導體_製造系統之處 • 理過程。在位於夾具310内之半導體封裝SP由包含位置變換裝置 520之切割單元500切割之後,已切割之轉體封裝仰被傳送至 封裝固定單元300。P遺後’從夾具31〇上分離已切割半導體封裝 SP ’然後移動至支座塊392。接著,透過固定單元撿拾器、奶,傳 輸已切割半導體封裝SP至清洗與乾燥單元600。 在完成切割處理之後,清洗與乾燥單元係執行隨後的處 修理。依照本發明’清洗與乾燥單元_較佳係設置於傳輸單元撿 拾器傳輸線2G2上,進而清洗與乾燥單元_垂直於傳輸單元撿 拾器傳輸線202。 如第11A圖」、「第iiB圖」、「第llc圖」及「第圖」 顯示’清洗與錢單元_係包含—第―清洗單元_以及一第 -清洗早το 65G。第-清洗單元_用於清洗半導體封裝处之頂 部,以及第二清洗單元65〇係用於清洗半導體封裝sp之底部。當 d第/月洗單元610與第二清洗單元65〇可以結合為一單獨部 41 200834785 分0 如「第11A圖」顯示,示例之第一清洗單元61〇係包含一清 洗容器612,一清洗台616以及一清洗台搬運單元618。清洗容器 612中限定有一清洗空間614,清洗台616設置於清洗容器612中, 以允許已製造半導體封裝sp位於其上。清洗台搬運單元618用於 通過清洗空間614搬運清洗台616。 清洗容器612 —侧敞開,進而固定單元撿拾器322之吸取噴 嘴327可以透過此開口引入清洗空間614。清洗容器612之另一側 也是敞開的,進而一單元撿拾器660 (下文將作出說明)能夠通過 此開口被引入清洗空間614中。 清洗台616之頂部為平坦的,進而半導體封裝sp能夠定位於 清洗台616頂部。 只要清洗台搬運單元618能夠穿過清洗空間614搬運清洗台 616 ’則本領域之熟悉技藝者可以採用任何類型之清洗台搬運單 元。例如,清洗台搬運單元618可以設計為「第UA圖」顯示之 結構。 、 清洗台搬運單元618包含一馬達62〇、一第一滑輪必、一第 二滑輪624以及-傳送帶626’射馬達_綴當解能量時產 生一驅動力,第一滑輪622可由馬達旋轉,第二滑輪624^ 第-滑輪622分隔-預定距離,傳送帶伽則圍繞第—滑輪奶 及第二滑輪624運轉。當,然,清洗台_可以固定於傳送帶· 42 200834785 -側,進而清洗台6i6能夠隨同傳送帶_ 一起移動。 在繼讀中,可以設置各_於清洗彻 裝置。-種用於清洗半導體封裝SP之結構例如「第_」_的 一第一噴嘴_沿著清洗台616之運動路線設置於清洗^ _上方。第-喷嘴628用於噴灑液體至半導體封裝sp上,^ 噴灑液體巾包含麟清洗料體塊sp之絲雜劑,進而能夠 以化學方法清洗半導體封裝SP。當然,透·—喷嘴必喷麗之 液體可以更包含-除油劑。此外,根據需要液體中也可以增加复 他不同製劑。a f接著第-喷嘴628之後的為—刷子㈣,較佳地,設置刷子 630,當清洗台616位於刷子㈣下方時,則吏得刷子㈣頂端能 夠接觸到位於清洗台⑽上之半導體封裝sp。刷子㈣用於物理 清洗半導體封裝SP頂部。 • 席仔030後面乐接著一第二嘴嘴632,第二噴嘴632係設計用 於观液體,例如水至清洗台616。第二喷嘴632用於喷灑水,進 • 而半導體封裝SP能夠由噴灑之水清洗。 . 第二噴嘴632後面是一第三噴嘴634,第三噴嘴634也設計用 於向清洗台616喷灑空氣。第三噴嘴634用於噴出空氣,進而能 夠透過噴出氣體來清潔半導體封裝SP。 第二清洗單元650係配置於第一清洗單元61〇 一端。只要第 一π洗單元650設置於第一清洗單元後部,進而能夠傳輸已穿過 43 200834785 第-清洗單S 610之半導體封裝sp至第二清洗單元㈣/則第二 清洗單元650之結财作特雜定。 ^依照本發明’如「第1圖」顯示,第二清洗單元650係垂直 於弟一清洗單元61G設置。第二清洗單以50用於清洗已由第一 清洗單元610清洗之半導體封裝sp之底部。 如同第-清洗單元61〇,第二清洗單元65〇包含數個喷嘴652 、及刷子654。贺嘴652可以包含用於噴灑含有清洗劑之液體、 用於0驗體例如水之噴嘴,以及用於賴空氣之嘴嘴。 清洗與乾燥單元600更包含各種用於清洗半導體封裝SP之不 同裝置。例如,清洗與乾燥料_可以配備有超聲清洗功能。 w _同才/月洗與乾燥單元600更包含一單元撿拾器060以及一 早το撿拾輯輸線662。單元撿拾$ 於從第—清洗單元 610傳輪半導體封裝sp至第二清洗單元㈣,並且沿著檢 器讀線662,單元撿拾器_被傳輸。單元撿拾器_係用料 =起位於α洗台616上之半導體封裝sp,並且將單獨檢起之半 :月封I SP置於-乾燥⑽上。關於乾燥台_下文中將作出 说明。 2元撿拾n _可以包含概势錄树,峨起單個半導 γ I本領域之熟悉技藝者可簡如各種類型之吸取元 岸於=如’吸取元件可岐真”取树。吸取元狀數量係對 應於+導體封裝SP之數量。 44 200834785 單元撿拾器660係撿起位於清洗台616上之半導體封穿 並經過用於清洗半導體封裝sp底部之第二清洗單元65〇。 乾燥台670係設置於單元撿拾器66〇之移動路線一側下方, 並具有一加熱器(「第1圖」未顯示)安裝於其中,當半導體梦壯 • SP位於乾煉台67〇上時,加熱器可用以徹底除去穿過第—清洗單 •元610及第二清洗單元㈣之半導體封裝SP上之濕氣,進而充: ^ 乾燥半導體封裝SP。 71 _ 偷台670係構造為能沿著一乾燥台傳輪線672移動。依照 本發明,乾燥台傳輸線672係垂直於傳輸單元撿拾器傳輸線2犯。 表好疋,乾燥台傳輸線672鄰近中間台傳輸線304設置,進而# 煉台傳輸線672平行於中間台傳輸線3〇4。上述設置可防止半導體 封裝製造糸統之大小增加。 由清洗與乾燥單元600清洗並乾燥之半導體封裝8]?被傳送至 ⑩檢查單元700,然後由傳輸單元200傳送至裝載與卸載單元1〇〇。 如「第1圖」顯示,檢查單元700包含一對檢查單元即第_ • 檢查單元71G及第二檢查單元720,以分別檢查位於半導體封裝 SP頂部及底部之半導體封裝SP。也可以提供複數個檢查單元彻 及 720 〇 在本發明之實施例中,第一檢查單元71〇及第二檢查單元72〇 之結構如「第1圖」顯示。請參考「第j圖」,第一檢查單元· 係設置沿著單元撿拾器傳輸線662移動。第一檢查單元71〇係用 45 200834785 於判斷位於乾燥台67G上之已製造半導體封裝sp之頂部是否 缺陷。 子 當然,第-檢查單元71〇可以檢測位於乾燥台㈣上之 體封裝SP之位置資訊,並傳輸半導體封裝sp之檢測位置資訊至 控制單元’其中當傳輸單元撿拾器綱檢起半導體封裝犯時^ 制單元依據半導體封裝sp之位置資訊執行修正,進而半導體封: SP可以被放置於其正確的位置。對於半導騎裝sp中之球 列(ballgrida卿,BGA)型半導體封裝,修正處理更為轉。 士並且,當第-檢查單元71〇沿著單元撿拾器傳輸線^多動 乐一檢查單元710可以判斷位於托盤1〇2上之半導體封裝卯 是否偏離於其正確位置或者已經轉變方向類倒。其中托般= 設置於沿活動台傳輸線谢移動之活動台⑽上。由^檢查= 凡710制之位置資訊被輸入至半導體封裳製造系統之控制 =當然,甚至在上述情況下,修正處理仍執行,触 4拾器綱將料體封裝sp傳輸至中間台3 SP能夠置於其正確位置。 了传體封裝 同% ’苐二檢查單元720係設置於值一 動㈣下*甘士由 宁0又置於傳輪早兀撿拾器204之移 ^路線下方,㈣m 線202移動。第二檢查單元72 糾™傅輸 ^ ;欢—由傳輪單元撿拾器204 MM SP H,此半導體封裝证是 46 200834785 ⑽如同第h查單凡爪’第工檢查單元no也用於判斷由傳輸 單元撿拾器綱撿起之半導體封裝sp多大程度地偏離其正確位 置。 抑透過安裝至傳輪單元撿拾器、2〇4噴嘴頂端之触η2,第二檢 • 單元20係债/則由傳輸單元撿拾器' 2〇4撿起之半導體封裝Sp之 ‘位置資訊。當半導體封裝SP由吸取元件208之喷嘴撿起時,接墊 ❿722用作判斷半導體封裝SP正確位置所需之參考點。 4寸另J地母個接塾722可以开)成為矩开)狀。各固接墊开) 成矩形的是因為接著對應之半導體封裝係形成多邊形,因此 依據其頂點能夠容易地檢測X軸、γ軸以及㊀角。 也就是說’當第二檢查單元72〇在半導體封裝sp下方查看每 個半導體封裝SP時,看到之每個半導體職SP如「第12圖」顯 示,因此能夠精確地檢測半導體封裝81>之位置。 馨 纟第二檢查單元720偵測之半導體封裝sp之位i資訊係存儲 於半‘體封裝製造系統之控制單元巾。因此,甚至當傳輸單元撿 拾益204之接墊722被磨損或者替換時,結果是偵測半導體封裝 位置所必需之麥考點被改變,依據存儲於控制單元中的位置資 汛相反地嫁定接墊722之偏離程度。因此,能夠重新建立半導 體封裝SP之參考點。 同時,由第一檢查單元710以及第二檢查單元72〇偵測之半 ‘體封裝SP之位置資訊係輸入至半導體封裝製造系統之控制單 47 200834785 疋中,其中在控制單元中x軸、γ軸以及θ角被修 體域sp之傳鮮擔拾㈣鮮元檢ί 在傳知早讀拾器2〇4撿起半導體封裝 過繼例於丫財崎乾燥_ = 執:半導體封裝sp之一由此,沿Y二:;: 封衣SP之偏離程度。此外,活動請在Y轴方向沿著活動1 輸線刚移動,以沿γ轴方向修正半導體封装sp之偏離程度口。, 透過旋轉用於撿起半導體封裝sp之傳輸單元撿拾器取,可 以執订+導體封裳SP之e方向修正,由此沿θ方向修正半導體封 裝SP之偏離程度。 雖然檢查單元700之結構如「第1圖」顯示,但是能夠提供 設置於不職置之增加數量之檢查單元,如「第13圖」、「第Μ 圖」、「第15圖」及「第16圖」顯示。 首先一,依照「第13圖」顯示之結構,更提供-第三檢查單元 730。弟二檢查單元73〇係設計沿著托盤撿拾器傳輸線則移動。 第球查單元730用於檢查半導_裝sp是否正確地定位於活動 台103上之托盤搬上’例如,檢查铸體封裝sp是否已經轉為 顛倒方向。 然後’依照「第14圖」顯示之結構,更提供有「第13圖」 之第三檢查單it 730。然而這種情況下,第三檢查單元73〇係設計 48 200834785 沿著單元撿拾器傳輸線662運動。即,第三檢查單元沿著用 於第-檢查單s 之單元撿拾器傳輸線662移動。 田第二才欢查單το 730、沿單元撿拾器傳輸線662移動時,第三 檢查單元73G係用於檢查位於把盤搬上之半導體封裝sp是否正 確定位,其中托盤1〇2設置於沿著活動台傳輸線刚鑛之活動 口 1〇3上’活動台傳輸線104則設置於單元撿拾器傳輸線船下 方。 依照「第15圖」顯示之結構’除「第14圖」之第三檢查單 兀730之外,更提供一第四檢查單元74〇。第四檢查單元7仞係構 造為沿著單元撿拾器傳輸線662移動。然而這種情況下,第三檢 查單70 730係設計用來檢查僅位於三個活動台1〇3之左活動台搬 之托盤102上的半導體封裝是否正確定位。 除第三檢查單元730檢查之活動台103之外,第四檢查單元 740係5又计用於檢查位於餘下兩個活動台1的之托盤川2上之半導 體封裝sp是否正確定位。即,第三檢查單元73〇或第四檢查單元 可以檢域人半導酸裝製造祕之半導體職sp是否正確 定位,並且第四檢查單元740或第三檢查單元73〇可以檢查在半 ¥體封裝製造系統中製造並從此系統中卸載之半導體封裝是 否正確位於活動台103之托盤102上。 如「第16圖」顯示,另一實施例之檢查單元7⑽之結構為: 第三檢查單元730位於固定單元撿拾器322之運動路線下方。這 49 200834785 種f月況下’第二檢查單兀bo係、檢查由固定單元撿拾器Μ2撿起 同時傳輸之半導體封裝SP是否正確定位。 裝載與卸鮮元100、傳輸單元·、封裝蚊單元·、切 Dj單元5υυ β 乂與乾》喿單元600以及檢查單元7⑻均互相電性連 接,並由控制单元(圖中未顯示)控制。 下文中,將詳細說明具有上述結構之本發明半導體封裝製造 系統之操作。 首先,如「第1圖」顯示,透過托盤撿拾器112移動任意一 個放置於托盤盒106上之托盤102至對應的活動臺上。其中托盤 1〇2上具有已完成模組處理(moduleprocess)之半導體封裝sp。 托盤撿拾器112透過以下步驟自對應托盤盒1〇6中撿起托盤 102。「第2B圖」顯示了一正規狀態,其中托盤1〇2沒有被托盤撿 拾裔112檢起。 當半導體封裝製造系統之控制單元發送用於撿起位於對應托 盤益106上之托盤1〇2之訊號時,托盤撿拾器η]則下降至托盤 盒106頂部。藉由托盤撿拾器112之連續下降,托盤撿拾器112 之導向桿124内表面則包圍托盤盒106上之托盤1〇2之外表面。 雖然托盤102之外表面由導向桿124包圍,但托盤檢拾器η〕 之驅動元件116b及118b係運行以移動成對設計之夾持器116&及 118a,進而夾持器n6a及118a互相遠離移動。 當托盤撿拾器112之主體部114底部接觸托盤1〇2時,第一 50 200834785 娜元U6之驅航件ll6b運行,進而第—夾持單幻 弟一托盤102a之相對側。 當弟-夾持單元m失取第一托盤職之相對侧時,第一托 盤_之相對邊則喪入第一夹持器服之定位槽版,並且同 時,第=持器maM合突起116d支撐第_托盤雇&之底部。 同8守,托盤撿拾器112能夠撿起另一托盤,例如第二把盤between. For example, a guide groove may be formed on one side, and a guide protrusion may be formed on the other side. When m is reached, the second motor can be placed on the horizontal chain link member 372 of the horizontal chain link member 374 to slide the horizontal keying member 372 and the vertical chain link member 374. Further, as shown in Fig. 5C, when the jig holder 376 is erected, the jig holder fixing unit 384 can be configured to lock the jig holder, so that the jig holder 376 does not shake. /, the clamp holder fixing unit 384 is disposed on the lower side of the vertical key moving element, and has a main body 385 vertically protruding from the vertical chain moving element 374. The body 385 is provided with a recess 386 in which the recess is recessed downwardly. An elastic member 387, such as a spring, is provided in the recessed ground. In the elastic element such as the spring, the end wire has a protrusion, and the protrusion 388 can be slid along the groove, and the tip of the protrusion m is exposed to the outside. In particular, the projections are elastically supported by the elastic members, so that the tips of the projections 388 are exposed outward. In the same %, the lower end of the disarm retainer 376 is equipped with a fitting groove. As shown in the "figure map", when the jig holder 376 is erected, the indwelling groove corresponds to the missing piece holding unit 384. Preferably, the particle-compatible groove 389 is in contact with the tip of the protrusion 388 which is held by the clamp το 384. Therefore, the projection tear is stably sprayed in the salivation groove 389, whereby the jig holder 376 can be prevented from rattling. °, as shown in "Fig. 7A", a clamp positioning hole 382 is formed in the clamp to keep crying 376. The jig positioning hole 3δ2 is formed, which in turn corresponds to the shape of the jig 31〇. Only: The fixture positioning hole 382 is configured such that the clamp 31 is vacuum-absorbed, and the clamp is fixed in the clamp positioning hole 382. Those skilled in the art can differently contemplate the structure in which the above-described jig 310 is fixed in the jig positioning hole 382. As described above, the semiconductor package fixture 35A includes a first advancement assembly 390. The first-extinguishing assembly 390 is mounted to the horizontal member 362 such that the first advancement assembly 390 can slide independently of the horizontal linkage member 372. The first propulsion assembly can be configured such that the first propulsion assembly 390 can be moved along a base 391, wherein the base 39! is disposed parallel to the horizontal element along the X-axis direction and the γ-axis direction. A main body portion 393, a block 392 and a first propulsion unit 395 are included. The main body portion 393 forms a main body of the first propulsion assembly 390, and the support block 392 is disposed at the top end of the main body portion 393, and the semiconductor package sp is located at the top of the support block 392. The first propulsion unit 395 is horizontally movable at the same height as the abutment block 392. As shown in FIG. 8, the holder block 392 is used to position the semiconductor package sp thereon, and is used to guide the semiconductor package SP, so that the semiconductor package sp can be easily embedded in the narrowness of the device 310 by the first push portion 397. Sew 314. The holder block 392 is used to guide the semiconductor package sp, and thus the semiconductor package sp can be stably inserted into the slit 314 of the jig 310. However, if the semiconductor package sp can be stably guided into the slit 314 of the jig 310, the holder block 392 can be removed. The top of the holder block 392 is provided with a recessed positioning portion 394, and the semiconductor package SP is placed on the upper portion of the positioning portion 394. The positioning portion 394 is for guiding the semiconductor package sp, and thus the semiconductor package SP can be correctly embedded in the slit 314. And, as shown in Fig. 8, the support block 392 is designed as a stepped structure. In particular, the top of the support block 392 is constructed in a two-layer structure. Preferably, the first positioning port P 394a and the first clamping portion 394b are formed on the lower top and the upper top of the holder block 392, so that the two semiconductor packages SP can simultaneously enter the slit 314 of the jig 310. in. Of course, the support block 392 can be constructed as a one-layer structure or a multi-layer structure as needed. 200834785 In each of the first positioning portions 394a, a gas hole 396 is formed. Similarly, air holes 396 are formed in each of the second positioning portions 鸠. The air passing through the air holes 396 is evacuated to the vacuum source, and the +-conductor package SP can be correctly and stably placed on the positioning portion & and the second positioning portion 394b. . v The first propulsion unit 395 is disposed on the side of the abutment block 392, for example, at a position opposite the wire rib pair of the clamp holder 376. The first propulsion unit is configured to slide horizontally along the top of the main body portion 393. - The first propulsion single A 395 system, equipped with a slidable first propulsion portion tear, is moved parallel to the abutment block 392 while the first propulsion portion 397 is parallel to the abutment block 392. As shown in Fig. 6A, the top end of the first advancing portion 397 is designed to have a two-layer structure. The two ends of the first-pushing portion 397 allow the semiconductor package sp placed on the first positioning portion 394a and the second positioning portion 392 of the two-layer structure of the holder block 392 to be simultaneously inserted into the slit 314 of the jig 31 . The first propulsion unit το 395 further includes a drive unit for driving the first propulsion portion 397 ' and thus the first propulsion portion 397 is slidable along the top of the main body portion. As shown in Fig. 6A, the drive unit includes a motor (not shown in Fig. 6A), a first first pulley 398a, a second pulley 398b, and a conveyor belt 3. The motor is used to generate a driving force when energized, and the first pulley 3 is coupled to the rotating shaft of the motor, and the first pulley 398a can be rotated by the motor. The second pulley 3_ is spaced apart from the first pulley 398a by a predetermined distance, and the conveyor belt is operated around the first pulley 32 200834785 398a and the second pulley 398b. A fixed guiding device 398d may be disposed between the conveyor belt 398c and the first pushing portion 397. By fixing the guiding device 398d, the conveyor belt Deng% and the first pushing portion 397 can be A/, and the movement is "prepared," The structure in which a push portion 397 slides along the top of the blade portion of the main body portion 3 can be obtained by a person skilled in the art. On the other hand, as shown in "Fig. 6A", the first propulsion unit 395 can include a pair of propulsion units, for example The μΐ propulsion unit 395a and the U propulsion unit are difficult. In the case of this tree, the above sliding structure can be applied to the μι propulsion unit milk & and u propulsion unit 395b, and the 丨·1 propulsion unit 395a and the W propulsion unit 能够 can operate independently. In addition, as shown in Figure 7A, Figure 7B, Figure 7C, Figure 7 and Figure 7E, a sensing unit 399 is attached to the w-propelled unit and 1_2 The pushing unit (4) is used to prevent the first propulsion unit from malfunctioning due to interference between the narrow (four)* edge and the semiconductor package SP when the semiconductor package sp is inserted into or separated from the slit 3H of the jig. . As shown in detail in Fig. 6A, the first advancing portion 397 includes a pusher blade, a pusher guide bar, and a support guide bar. The pusher wishes to be placed at the top end, and the advancement blade 397a is brought into contact with the semiconductor package sp. The pusher guide bar 3 = is placed below the pusher blade for movably supporting the pusher blade to win. The support guide tearing system is disposed at the rear of the propeller and is used for the propulsion knife 397a. The sensing unit 399 can be disposed between the pusher blade and the support guide, and the sensor can include the i-component 399a to support the π(4) and the sensor including the amp, the pusher 397a or the support guide Wc. Hey. Of course, a guide rod 3"C can be provided to prevent the elastic member 399a from being separated from the support guide 397a and the support guide 397c. For example, the resilient element 399a can be, for example, a spring. The sensor pass can be a contact feeling. Therefore, when the 397a paste has an edge collision, the advancement blade 397a is not inserted into the slit 314 of the jig 31G, and then the blade is torn and then contacted with the guide bar 399c, and the sensor is 39% operated. The fault signal of the propeller 397a is pushed to a control unit (not shown in FIG. 6A), and the second propulsion unit 4 is disposed on the opposite side of the first propulsion unit 39, and then the second propulsion unit 4 〇〇 corresponds to the first propulsion assembly 39. As shown in Figure 6b, the second propulsion assembly 400 is constructed in the same structure as the first propulsion assembly 39. For example, the second propulsion assembly 4 can include a 2-1 propulsion unit 4〇1& and _ propulsion unit 4〇1b. Each of the propulsion units 4〇1a and 4〇1b may include a propulsion unit 402, a driving unit 403, and a sensing unit 404. In addition, the propulsion unit The 402 may include a propulsion blade 402a, a propulsion blade guide 402b, and a support guide rod 4〇2c. The drive unit 403 may include a first pulley 4〇3a, a second pulley 403b, a conveyor belt 403c, and a fixed guide rod. 403d. The sensing unit 404 can include a Element 404a and a sensor 404b. However, the second propulsion assembly 400 is moved from the right side to the left side of the figure to transmit the semiconductor package sp received in the slit 314 of the 200834785 transmission jig 310 to the support block view. Therefore, as shown in the "Fig. 6B", unlike the propelling blade tip of the first advancing portion 397, the advancing blade a of the second advancing portion 4G2 has a different length. This is because the amount is The distance deviation between the first positioning portion and the second positioning portion 392 of 392 can be compensated by the length between the advancement knife and the top end of the second advancement portion. In other words, the difference between the advancement knife 397a and her is It is compensated by the size of the first positioning portion 394a. In addition, referring to "5D", after the semiconductor guide 397 is inserted into the slit 314 of the jig 310 by the first pushing portion 397, the first pushing portion 397 is slit from the slit. Correcting the separation, and vertically moving the vertical key member 374 of the clamp holder 376 to perform an upward or downward movement, whereby the idle slit 3H is located on the movement path of the first advancement portion 397. Of course, even when the semiconductor package sp is Two propulsion parts are moved from the slit When the 314 is removed, the above operation is performed in the reverse order. Subsequently, the cutting unit 5 will be described in detail with reference to "Fig. 1", wherein the cutting unit is used for cutting and being fixed by the package fixing unit. The semiconductor package SP in the 310. The cutting unit 500 includes a cutting edge 502, a rotatable chuck table 5〇4, a chuck table transmission line 5〇6, and a position changing device S2〇. The cutting blade 5〇2 For cutting: Although the conductor SP, the rotatable chuck table is set with a fixture, the chuck table transmission line is used for the transmission chuck table 5〇4 to the cutting edge view, the position changing device 52 mussels ^ 35 200834785 Then, enter (four) with 31q Guanuan as the reverse direction. j unit 5GG further includes - cutting unit picker view and - cutting unit Zhuangcai mouth J line ^ line 5〇9. The cutting unit pick-up device is used to pick up the semiconductor unit to be placed along the cutting unit pickup line to move the milk to transfer the clamp 310 to the chuck table 504. The chuck table 5〇4 is arranged in the cutting device, the J unit picker, below the moving route, and the chuck table 5〇4 is set so that it can be rotated around its vertical axis. The deck transfer line of the transmission line $(10) moves to the cutting edge 502. The fixtures of the semiconductor package sp and the semiconductor package sp are located at the top of the chuck table. In the clamp, 310 j, for example, after the top of the clamp 31 is cut, it is necessary to cut the bottom of the clamp. At this time, in the same day temple of the fixed jig 3K), the position change is mounted to the level of the fine-twisting jig 31 〇, thereby reversing the top and bottom of the lost training. i. Fig. 9A and Fig. 9B, the position changing device of the present invention • 2 〇 3 package 3 is a cooling unit 530 and a rotating unit M0. The jig fixing unit 530 is for fixing the dislocation 310 in which the semiconductor package SP is embedded, and the rotating unit·secret transfer fixture fixing unit 530. The opposite end of the 'body package sp' must be spliced at the semiconductor package of the embedded fixture. Therefore, the position changing device 520 is used to rotate the jig 310. The jig fixing unit 53 is provided with a frame S32 which internally defines a predetermined space, such as a jig positioning space SS1, for fixing the jig 310 of the internal semiconductor package sp. Preferably, the jig positioning space 531 is formed in a rectangular frame shape with the shape of the jig 36 200834785. The shape of the frame 532 is also formed into a rectangular shape.立如弟10图"Display" _ Temporary fixing element 533 is arranged in the frame light vestibule for temporarily fixing the fixture positioning space H during the positioning of the clamp 31 (). The temporary fixing member 533 may include - a projection protrusion $ and a spring/, 533b spray projection 533a may be used in the predetermined space defined inside the frame 532 to "elastic" the yellow 533b for elastically supporting the associative projection 533a. The field outside the jig 310 is a fitting groove 3〇la, in which the fitting groove 3 is hooked with the indwelling protrusion of the temporary fixing member f3. In the above description, although the skilled artisan can conceive other possible configurations, the central training system is temporarily fixed in the jig positioning space 531 of the frame 532. The opposite end of the 532 is provided with a fixing unit 534 for fixing the jig wo, and thus, when the jig 31 is placed in the jig positioning space 531, it is not separated from the jig positioning space 531. The parent map unit 534 includes a _ element 537 and a moving member 538 is attached to one end of the frame 532, so that the fixed member 537 can move longitudinally of the dog finder frame 532. A fixing slit 536 is formed inside the fixing member 537 to fix one end of the jig 31. The moving element 538 is used to move the stationary element 537 longitudinally along the frame. A separate securing element 537 can be used as long as the clamp 310 is secured by a separate securing element 537 and cannot be separated from the dislocation positioning space. However, it is preferred to provide a pair of fixing members 537. The fixing element 537 can be constructed such that it can move toward or away from each other 37 200834785. Further, the fixing slits 536 form a shape corresponding to each corner of the jig 3i, and the corners of the jig 310 can be immersed in the fixed slit. At the same time, each moving element 538 can be mounted to the corresponding fixed element tear. When the moving element is cut in the form of a linear reciprocating motion, the 対 动 moving element 4^38 is not particularly limited. In accordance with the present invention, the moving element 538 can be a cylinder. Moreover, the telekinetic element 538 is mounted to the pair of stationary elements 537 such that each moving element 538 can be coupled to the interior of the corresponding fixed element 537. The above arrangement is arranged to stably move the fixing member 537 to the jig positioning space 531. The rotary unit 54G of the position changing device 520 includes a drive member 542 and a chain unit 544. The driving member 542 is attached to the side of the jig fixing unit 53, and the driving member 542 can be used as a spool. The chain solution means that the linear motion of the conversion drive element M2 is a rotary motion, and the fixture fixing unit can be rotated. Referring to "FIG. 9A", the drive element 542 is attached to the position change device 52A side. The drive element 542 can be an air cylinder that is capable of performing a reciprocating motion. The chain moving unit 544 is used to convert the linear motion of the driving member 542 into a rotational motion of the clamp fixing unit 530. The chain drive unit 544 includes a rack 546 that is coupled to the drive member 542 such that when the drive member 542 is moved in the form of a gas cylinder, the _ 546 can move linearly with the drive member 542. The chain drive unit 544 further includes a pinion 548, 38 200834785 pinion 548 is coupled to the rotating shaft of the clamp fixing unit 53A, and the pinion 548 is meshed with the rack 546, so that the pinion 548 can rotate. Therefore, by the operation of the rack 546 and the pinion 548, the linear motion of the driving member 542 is converted into the rotational motion of the clamp fixing unit 53. Although the rotating unit 540 includes a driving element 542 and a chaining unit 544, wherein the chaining unit 544 is used to convert the linear motion of the driving element (10) into a rotational motion. As described above, the 'transmission element' can be any type of rotating element as long as it can be changed into a spinning tau element. Alternatively, the motor, the wire gear, and the driven components can be placed. In this case, then S does not convert the linear motion into a rotational motion. The position changing means 52A may further comprise a moving unit 55g for moving the jig fixing unit τ 530 out of the position changing means 52. As shown in the "figure i", the position changing device 520 is disposed parallel to the chuck table transmission line 5〇6. Therefore, the moving unit 55 is smashed away from the chuck table 504 by a fixed distance, and the position changing device 52 is disabled. The moving unit 550 includes a _ drive motor (not shown in the "μ"), Sister and - conveyor belt fixing element 5 Μ. The drive motor Lin was employed when it was set up - the driving force' conveyor belt was used for the driving force of the transmission drive motor to fix the fixed unit 530, and the black culvert was transmitted - α, k▼ fixed 554 was fixed To the conveyor belt 552, to allow the driving force of the conveyor belt 552 to be transferred to the clamp fixing unit 53A. As shown in Figure 9A - "Wire, no, the drive motor is included in the position change device 520 39 200834785 two = the rotational force required to drive the conveyor belt 552. The conveyor belt 552 is designed to be operated by a pulley disposed on the opposite side of the position changing device 52. Further, the pair of transport belts 552 may be provided, and the conveyor belt M2 may be longitudinally inserted in the longitudinal direction, for example, the movement direction of the clamp fixing unit 53 is parallel to each other. The belt fixing member 554 is fixed to the side of the conveyor belt 552 - and is connected to the holder fixing member 530 and to the conveyor belt. Therefore, the driving force of the belt fixing member 554 scale conveyor belt is directly transmitted to the fixture fixing unit. The jig fixing unit disc rotating unit 2 can be constructed in a detachable manner. For example, the pinion 548 connected to the other rotating shaft of the gripper unit can be moved in the direction of movement of the rack 546 perpendicular to the rotating unit 54. In particular, the 'belt fixing member 554 may be included in the jig fixing unit, and the jig fixing unit 53 including only the pinion 548 may be detached from the rotating unit 540 and further transmitted through the belt 552, and the jig fixing unit can be The movement is separated from the position changing device 520. Turning back to the "secondary view", the cutting edge is disposed on the chuck table transmission line. The upper blade d-blade 502 is used to cut the sub-mount of the semiconductor package placed on the jig 31 to the shape desired by the user. The construction cutting blade 502 has two cutting forces 5 〇 2 arranged in parallel with each other, and the reason why the design cutting edges 502 are arranged in parallel with each other is because the semiconductor sealing sp is placed in two rows on the missing training. Also, the cutting edge view has a different shape. This is because the __ of the semiconductor package sp to be cut has no boots. Of course, if 200834785 requires the 'cutting edge 502', it can have the same shape. Alternatively, other different configurations may be applied to the cutting edge 502. For example, the cutting edges 502 may be disposed vertically, and thus the cutting edges 5〇2 are opposed to each other. In this case, the cutting edge 502 is disposed above and below the motion line of the jig 310 to simultaneously cut the top and bottom of the semiconductor package sp embedded in the slit 314 of the jig 310. At this time, the position converting means 520 described above is unnecessary. Please refer back to "Figure 1". The semiconductor_manufacturing system will be explained below. After the semiconductor package SP located in the jig 310 is cut by the cutting unit 500 including the position changing device 520, the cut swivel package is conveyed to the package fixing unit 300. After the past, the cut semiconductor package SP' is separated from the jig 31 and then moved to the holder block 392. Next, the cut semiconductor package SP is transferred to the cleaning and drying unit 600 through the fixed unit pickup and the milk. After the cutting process is completed, the cleaning and drying unit performs subsequent repairs. In accordance with the present invention, the cleaning and drying unit is preferably disposed on the transport unit pickup transport line 2G2, and the cleaning and drying unit_perpendicular to the transport unit pickup transport line 202. As shown in Figure 11A, Figure iiB, "llc" and "Graph", the "Cleaning and Money Unit" contains - the "cleaning unit" and a - cleaning early το 65G. The first cleaning unit _ is used to clean the top of the semiconductor package, and the second cleaning unit 65 is used to clean the bottom of the semiconductor package sp. When the d/th wash unit 610 and the second cleaning unit 65 are combined into a single unit 41 200834785, 0, as shown in FIG. 11A, the first cleaning unit 61 includes a cleaning container 612, a cleaning The stage 616 and a cleaning station handling unit 618. A cleaning space 614 is defined in the cleaning container 612, and the cleaning station 616 is disposed in the cleaning container 612 to allow the fabricated semiconductor package sp to be positioned thereon. The cleaning table transport unit 618 is for transporting the cleaning table 616 through the cleaning space 614. The cleaning container 612 is open to the side so that the suction nozzle 327 of the fixed unit pickup 322 can be introduced into the cleaning space 614 through the opening. The other side of the cleaning container 612 is also open so that a unit pickup 660 (described below) can be introduced into the cleaning space 614 through this opening. The top of the cleaning station 616 is flat so that the semiconductor package sp can be positioned on top of the cleaning station 616. As long as the cleaning station handling unit 618 is capable of transporting the cleaning station 616' through the cleaning space 614, those skilled in the art can employ any type of cleaning station handling unit. For example, the cleaning table transport unit 618 can be designed as a "UA map" display structure. The cleaning table handling unit 618 includes a motor 62〇, a first pulley, a second pulley 624, and a conveyor belt 626. The motor _ is activated to generate a driving force when the energy is released, and the first pulley 622 can be rotated by the motor. The two pulleys 624^-the pulleys 622 are separated by a predetermined distance, and the conveyor belts are operated around the first pulley milk and the second pulley 624. When it is, the washing station _ can be fixed to the side of the conveyor belt 42 200834785, and the washing table 6i6 can be moved along with the conveyor belt _. In the subsequent reading, each of the cleaning devices can be set. A structure for cleaning the semiconductor package SP, for example, a "first nozzle" of "the _"_ is disposed above the cleaning _ along the movement path of the cleaning table 616. The first nozzle 628 is used to spray the liquid onto the semiconductor package sp, and the spray liquid towel contains the silk dopant of the lining material block sp, thereby chemically cleaning the semiconductor package SP. Of course, the liquid that can be sprayed through the nozzle can contain more degreaser. In addition, different formulations can be added to the liquid as needed. Following a-nozzle 628 is a brush (four), preferably a brush 630 is provided, and when the cleaning station 616 is positioned below the brush (four), the top end of the brush (four) is accessible to the semiconductor package sp on the cleaning station (10). The brush (4) is used to physically clean the top of the semiconductor package SP. • After the seat 030 is followed by a second mouth 632, the second nozzle 632 is designed to view a liquid, such as water, to the wash station 616. The second nozzle 632 is used to spray water, and the semiconductor package SP can be washed by the sprayed water. .  Behind the second nozzle 632 is a third nozzle 634 which is also designed to spray air to the washing station 616. The third nozzle 634 is for ejecting air, and is capable of cleaning the semiconductor package SP by ejecting gas. The second cleaning unit 650 is disposed at one end of the first cleaning unit 61. As long as the first π-wash unit 650 is disposed at the rear of the first cleaning unit, the semiconductor package sp that has passed through the 43 200834785 first cleaning sheet S 610 to the second cleaning unit (four)/the second cleaning unit 650 can be transported. Specially fixed. According to the present invention, as shown in Fig. 1, the second cleaning unit 650 is disposed perpendicular to the first cleaning unit 61G. The second cleaning sheet 50 is used to clean the bottom of the semiconductor package sp that has been cleaned by the first cleaning unit 610. Like the first cleaning unit 61, the second cleaning unit 65 includes a plurality of nozzles 652 and a brush 654. The mouthpiece 652 may include a nozzle for spraying a cleaning agent, a nozzle for a sample such as water, and a mouth for air. The cleaning and drying unit 600 further includes various devices for cleaning the semiconductor package SP. For example, cleaning and drying materials can be equipped with ultrasonic cleaning. The w _ gen/month wash and dry unit 600 further includes a unit picker 060 and an early το捡 pick line 662. The unit picks up from the first cleaning unit 610 to the second cleaning unit (4), and along the detector read line 662, the unit pickup_ is transmitted. Unit Picker_System Material = The semiconductor package sp located on the alpha washstand 616, and the separately picked up half: the monthly seal I SP is placed on the -dry (10). About the drying station _ will be explained below. 2 yuan pick n _ can contain the general record tree, pick up a single semi-conducting γ I. The familiar art in this field can be as simple as various types of sucking Yuan shore = such as 'sucking components can be true" to take the tree. The number corresponds to the number of +-conductor packages SP. 44 200834785 The unit pick-up 660 picks up the semiconductor encapsulation on the cleaning station 616 and passes through a second cleaning unit 65 for cleaning the bottom of the semiconductor package sp. It is disposed below the side of the moving path of the unit pickup 66, and has a heater (not shown in FIG. 1) installed therein. When the semiconductor dream SP is located on the dry table 67, the heater is available. To completely remove the moisture on the semiconductor package SP passing through the first cleaning unit 610 and the second cleaning unit (4), and then to: dry the semiconductor package SP. 71 _ The stealing platform 670 is configured to be movable along a drying station transmission line 672. In accordance with the present invention, the drying station transmission line 672 is made perpendicular to the transmission unit pickup transmission line 2. Preferably, the drying station transmission line 672 is disposed adjacent to the intermediate stage transmission line 304, and the #化台 transmission line 672 is parallel to the intermediate stage transmission line 3〇4. The above arrangement prevents the size of the semiconductor package manufacturing system from increasing. The semiconductor package 8] cleaned and dried by the cleaning and drying unit 600 is transferred to the inspection unit 700, and then transferred by the transfer unit 200 to the loading and unloading unit 1A. As shown in Fig. 1, the inspection unit 700 includes a pair of inspection units, i.e., an inspection unit 71G and a second inspection unit 720, for respectively inspecting the semiconductor packages SP located at the top and bottom of the semiconductor package SP. A plurality of inspection units can also be provided. 720 〇 In the embodiment of the present invention, the structures of the first inspection unit 71 and the second inspection unit 72 are displayed as "1". Please refer to "Jth diagram", the first inspection unit is set to move along the unit pickup transmission line 662. The first inspection unit 71 uses 45 200834785 to determine whether the top of the manufactured semiconductor package sp located on the drying table 67G is defective. Of course, the first-inspection unit 71 can detect the position information of the body package SP located on the drying station (4), and transmit the detection position information of the semiconductor package sp to the control unit, wherein when the transmission unit picks up the semiconductor package ^ The unit performs correction according to the position information of the semiconductor package sp, and the semiconductor package: the SP can be placed in its correct position. For the ball-striker (BGA) type semiconductor package in the semi-guided riding sp, the correction process is further changed. Also, when the first-inspection unit 71 is along the unit pickup transmission line, the multi-motion-inspection unit 710 can judge whether or not the semiconductor package 位于 located on the tray 1〇2 deviates from its correct position or has been shifted. Among them, it is set on the movable table (10) which moves along the transmission line of the mobile station. By ^Check = Where the position information of the 710 system is input to the control of the semiconductor seal manufacturing system = Of course, even in the above case, the correction processing is still performed, and the touch device is transferred to the intermediate stage 3 SP Can be placed in its correct position. The transmissive package is the same as the % 苐 检查 2 inspection unit 720 is set at the value of one (four) * * 甘 宁 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 The second inspection unit 72 corrects the weight of the fuse; the joy-by-passer unit pickup 204 MM SP H, the semiconductor package certificate is 46 200834785 (10) as the h-th check, the claws 'the inspection unit no is also used to judge The semiconductor package sp from which the transfer unit is picked up deviates from its correct position. The second inspection unit 20 is the ‘positional information of the semiconductor package Sp picked up by the transmission unit pickup unit 2〇4 through the touch η2 attached to the top of the transfer unit pickup and the 2〇4 nozzle. When the semiconductor package SP is picked up by the nozzle of the pick-up element 208, the pad 722 serves as a reference point for determining the correct position of the semiconductor package SP. 4 inches of another J-mother joint 722 can be opened) to become a moment open. Each of the fixing pads is formed in a rectangular shape because the corresponding semiconductor package is formed into a polygon, so that the X-axis, the γ-axis, and the corner can be easily detected based on the apex thereof. That is to say, when the second inspection unit 72 looks at each semiconductor package SP under the semiconductor package sp, each semiconductor job SP is seen as shown in FIG. 12, so that the semiconductor package 81 can be accurately detected. position. The information of the semiconductor package sp detected by the second inspection unit 720 is stored in the control unit of the semi-body package manufacturing system. Therefore, even when the pad 722 of the transfer unit 204 is worn or replaced, the result is that the test point necessary for detecting the position of the semiconductor package is changed, and the pad is oppositely bonded according to the position stored in the control unit. The degree of deviation from 722. Therefore, the reference point of the semiconductor package SP can be newly established. At the same time, the position information of the semi-body package SP detected by the first inspection unit 710 and the second inspection unit 72 is input to the control package 47 200834785 of the semiconductor package manufacturing system, wherein the control unit has x-axis and γ. The axis and the θ angle are picked up by the repairing domain sp (4) Fresh element inspection ί In the early detection of the pickup 2 〇 4 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 : : 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体 半导体Thus, along Y 2:;: The degree of deviation of the seal SP. In addition, the movement should be moved along the movable 1 transmission line in the Y-axis direction to correct the degree of deviation of the semiconductor package sp along the γ-axis direction. By rotating the transfer unit pickup for picking up the semiconductor package sp, the e-direction correction of the + conductor seal SP can be performed, thereby correcting the degree of deviation of the semiconductor package SP in the θ direction. Although the structure of the inspection unit 700 is as shown in the "Picture 1", it is possible to provide an inspection unit that is installed in an increased number of non-operating positions, such as "Graph 13", "Grade", "15th" and " Figure 16 shows. First, in accordance with the structure shown in Fig. 13, a third check unit 730 is further provided. The second inspection unit 73 is designed to move along the tray picker transmission line. The first ball inspecting unit 730 is for checking whether or not the semiconductor package sp is properly positioned on the tray on the movable table 103. For example, it is checked whether the casting package sp has been turned to the reverse direction. Then, according to the structure shown in "Fig. 14", a third checklist IT 730 of "Fig. 13" is further provided. In this case, however, the third inspection unit 73 is designed to move along the unit pickup transport line 662. That is, the third inspection unit moves along the unit pickup transmission line 662 for the first checklist s. When the second second check box το 730 moves along the unit pickup transmission line 662, the third inspection unit 73G is used to check whether the semiconductor package sp located on the tray is correctly positioned, wherein the tray 1〇2 is disposed along The active station transmission line is located on the movable port of the mine. The mobile station transmission line 104 is placed under the unit pickup transmission line ship. In addition to the third checklist 兀 730 of "Fig. 14", a fourth inspection unit 74A is provided in accordance with the structure shown in Fig. 15. The fourth inspection unit 7 is configured to move along the unit pickup transfer line 662. In this case, however, the third checklist 70 730 is designed to check whether the semiconductor package located on the tray 102 of the left movable stage of the three movable stages 1〇3 is correctly positioned. In addition to the movable table 103 inspected by the third inspection unit 730, the fourth inspection unit 740 is further counted for checking whether the semiconductor package sp on the tray 2 of the remaining two movable tables 1 is correctly positioned. That is, the third inspection unit 73 or the fourth inspection unit can detect whether the semiconductor device sp is correctly positioned, and the fourth inspection unit 740 or the third inspection unit 73 can check the half-body. Whether the semiconductor package fabricated in the package manufacturing system and unloaded from the system is properly located on the tray 102 of the movable table 103. As shown in FIG. 16, the inspection unit 7 (10) of another embodiment has the following structure: The third inspection unit 730 is located below the movement path of the fixed unit pickup 322. In the case of the 2008 2008, the second inspection unit, the second inspection unit, checks whether the semiconductor package SP that is simultaneously transported by the fixed unit pickup unit 2 is correctly positioned. The loading and unloading unit 100, the transport unit, the packaged mosquito unit, the cut Dj unit 5υυβ乂 and the dry unit 600, and the inspection unit 7(8) are electrically connected to each other and controlled by a control unit (not shown). Hereinafter, the operation of the semiconductor package manufacturing system of the present invention having the above structure will be described in detail. First, as shown in "Fig. 1", any one of the trays 102 placed on the tray case 106 is moved to the corresponding movable table by the tray picker 112. The tray 1〇2 has a semiconductor package sp on which the module process has been completed. The tray picker 112 picks up the tray 102 from the corresponding tray cassette 1〇6 by the following steps. "Fig. 2B" shows a normal state in which the tray 1〇2 is not picked up by the tray picking 112. When the control unit of the semiconductor package manufacturing system transmits a signal for picking up the tray 1〇2 located on the corresponding tray benefit 106, the tray picker η] is lowered to the top of the tray cassette 106. By the continuous lowering of the tray picker 112, the inner surface of the guide bar 124 of the tray picker 112 surrounds the outer surface of the tray 1〇2 on the tray case 106. Although the outer surface of the tray 102 is surrounded by the guide bar 124, the drive members 116b and 118b of the tray pickup η are operated to move the pair of designed holders 116 & and 118a, whereby the holders n6a and 118a are away from each other. mobile. When the bottom of the main body portion 114 of the tray picker 112 contacts the tray 1〇2, the first 50 200834785 Nayuan U6 driving member ll6b is operated, and the first side of the tray 102a is gripped. When the younger-clamping unit m loses the opposite side of the first tray, the opposite side of the first tray _ is lost into the positioning slot of the first holder, and at the same time, the third holder maM is raised 116d Support the bottom of the _ tray hire & With the 8th guard, the tray picker 112 can pick up another tray, such as the second tray.

特別地托盤撿拾裔112向對應托盤盒觸移動,In particular, the tray picks up the 112 to move to the corresponding tray.

降以撿拾第二托盤102b。 …、T 當托盤撿拾器The second tray 102b is picked up. ..., T when the tray picker

112卩牛低,並且托盤檢拾器η]之主體部HA 底部接觸第二托盤腿時,第二夾持單元 118之驅動元件118b 運行,因此第二夾持器_夾取第二托盤獅之相對側。 虽第一夾持器118a夹取第二姉職之相對侧時,第二托 盤102b之相對邊係後入第二失持器ma之定位槽服,同時, 第二夾持器118a之嗜合突起118d支擇第二托盤應b底部。 口此,托盤撿拾裔112使用第一夹持單元116及第二夾持單 兀118同時分別撿起並傳輸第一托# 1〇2a及第二托盤獅。即, 能夠同時撿起並傳輸兩個托盤職及撤b,由此增加整體處理速 度。 此外弟托盤102a可以構造為空閑把盤,相反第二托盤i〇2b 可以構造為其上放置有半導體封裝sp之托盤。這時,第一托盤 l〇2a.係設置於放置苐二托盤1〇2b上方之半導體封裝sp之間,並 51 200834785 且托盤撿拾态112係作為防止靜電及粘結出現之絕緣體。 換言之,第一托盤1〇2&可以設計為一有色托盤。例如,第一 托盤102a可以為紅色、黃色或者藍色,進而區別置於各個托盤盒 106上之托盤。 按照上述步驟相反之次序,由托盤撿拾器112撿起之托盤 被置於對應活動台103或者對應托盤盒1〇6上。 當托盤102被置於對應活動台103上時,活動台1〇3沿著活 動台傳輸線1〇4移動至傳輸單元撿拾器傳輸線搬下方。在活動 台1〇3沿活動台傳輸線綱移動之後,傳輸單元檢拾器辦夹取 預定數量之半導體封裝SP置於托盤遍上,沿著傳輸單元檢拾器 傳輸線2〇2移動,並且放置已夾取半導體封裝sp於對財間台 302 上。 " 依照本發明,傳鮮元撿拾^綱係絲並傳輸/M醉導體 封裝SP。當然,按照需要各種條件可以增加至控制單元中,進而 傳輸單元撿拾器204能夠執行夾取操作。 放置半導體封裝SP於中間台3〇2上所沿之方向是重要的,此 方向係依據切割單元之切割刃搬形狀改變。 |、田刀刀502具有相同形狀時,嵌入夹具310之狹缝 之半導體封農SP可以沿相同方向定位。另—方面,當切割 夢”有不同^狀’例如其中—切割刀係構造用於切割半導體 、衣頂部’相反另—切f_編於切割半導體封裝SP底 52 200834785 部’這需要嵌入半導體封裝sp於夾具狹縫似中所沿的 改變為如「第1圖」顯示。 〇 一這時’截入夾具31〇之狹缝314中之轉體封裝sp必須沿相 反二向知yg。U此’傳輪單驗拾器綱之吸取元件細旋轉, 以符合狹縫314之方向。當第一驅動元件222_「第3b圖」^頁 :旋轉時取树施及第三鄕元件施職轉。當 弟二驅動請222e旋轉時,第五吸取元件施及第 2〇8g則旋轉。 仵 …當第-吸取元件2〇8a、第三吸取元件職、第五吸取元件裏 以及第七吸取元件·g旋轉時,由傳輸單元撿拾器綱撿起 输:裳SP則如「第!圖」顯示排列。傳輸單元撿拾器物係放 置半導體封裝SP於中間台3G2頂部。 在放置半導體封裝SP於中間台3〇2上之後,半導體封裝卯112 when the yak is low, and the bottom portion of the main body portion HA of the tray pickup η] contacts the second tray leg, the driving member 118b of the second clamping unit 118 operates, so the second holder _ grips the second tray lion Opposite side. When the first holder 118a grips the opposite side of the second job, the opposite side of the second tray 102b is inserted into the positioning groove of the second holder, and at the same time, the second holder 118a is compatible. The projection 118d supports the bottom of the second tray. Thus, the tray picking 112 uses the first gripping unit 116 and the second gripping unit 118 to simultaneously pick up and transport the first tray #1〇2a and the second tray lion. That is, it is possible to pick up and transfer two tray jobs and withdraw b at the same time, thereby increasing the overall processing speed. Further, the tray 102a may be configured as a free tray, and the second tray i2b may be configured as a tray on which the semiconductor package sp is placed. At this time, the first tray 110a is disposed between the semiconductor packages sp placed above the second trays 1 and 2b, and 51 200834785 and the tray pick-up 112 serves as an insulator for preventing static electricity and adhesion. In other words, the first tray 1〇2& can be designed as a colored tray. For example, the first tray 102a may be red, yellow or blue to distinguish the trays placed on the respective tray boxes 106. In the reverse order of the above steps, the tray picked up by the tray picker 112 is placed on the corresponding movable table 103 or the corresponding tray case 1〇6. When the tray 102 is placed on the corresponding movable table 103, the movable table 1〇3 moves along the movable table transmission line 1〇4 to the lower side of the transmission unit pickup transmission line. After the movable table 1〇3 moves along the movable table transmission line, the transfer unit picker picks up a predetermined number of semiconductor packages SP placed on the tray, moves along the transfer unit pickup transfer line 2〇2, and is placed The semiconductor package sp is sandwiched on the counter 302. " In accordance with the present invention, the fresh-spotted scorpion wire and the transmission/M drunk conductor package SP. Of course, various conditions can be added to the control unit as needed, and the transmission unit pickup 204 can perform the gripping operation. It is important to place the direction in which the semiconductor package SP is placed on the intermediate stage 3〇2, which is changed in accordance with the shape of the cutting edge of the cutting unit. When the field knife 502 has the same shape, the semiconductor package SP embedded in the slit of the jig 310 can be positioned in the same direction. On the other hand, when the cutting dream "has a different shape", for example, where - the cutting blade system is configured to cut the semiconductor, the top of the garment 'is the opposite - the other is cut-to-cut the semiconductor package SP bottom 52 200834785 'This requires embedded semiconductor package The change in sp along the jig slit is as shown in "1".转 At this point, the swivel package sp in the slit 314 of the intercepting jig 31 must be yg in the opposite direction. U The suction element of the transmission single inspection device is finely rotated to conform to the direction of the slit 314. When the first driving element 222_"3b" is rotated: the tree is applied and the third element is applied. When the second driver drives 222e to rotate, the fifth suction member rotates when the second 〇8g is applied.仵... When the first-suction element 2〇8a, the third suction element position, the fifth suction element, and the seventh suction element·g rotate, the transmission unit picks up the gear: the skirt SP is as “第!图The display is arranged. The transfer unit pickup device places the semiconductor package SP on top of the intermediate stage 3G2. After placing the semiconductor package SP on the intermediate stage 3〇2, the semiconductor package卯

^由:之兩個固定單元撿拾器322所夾取。接著,固定單元檢 沿固定單元撿拾器傳輸線32〇移動,然後轉體封裝兕 被置於形成在支座塊392頂部之定位部394上。 用於调整固定單元撿拾器322各個吸取喷嘴線之驅動元件 328係運行’以移動支禮桿孤以及支撐桿现。支稽桿迪 係用於支撐放置轉體職sp於第—定位部施上之吸取喷嘴 327 ’支撐桿332b則用於支撐放置半導體封裝π於第二定位部 现上之吸取喷嘴327,進而支辦獅係、低於支撐桿取。之 53 200834785 後疋位士半導體封裳sp於形成在支座塊规頂部之定位部别上。 ’定位部394上的空氣透過氣孔396被抽空,由此半導 體封裝SP係正確地放置於定位部观上。當控制單元透過穿過氣 幻9〇之空氣排出判斷半導體封裝sp已經正確置於定位部綱上 時’ ^平鍵動元件372及垂直鏈動元件374則由對應馬達運行。 —h別力水平賴耕奶移向垂直元件364,並且垂直鍵動 凡件374向上移動。因此,如「第5a圖」、「第犯圖」、「第冗 ^及「第5D圖」顯示’用於夾取夹具之夾具保持器別 直立。 更特別地’如「第5C圖」顯示,在水平鏈航件372之旋轉 轴380旋轉,以及與垂直鏈動元物鉸鏈連接之夹具保持器376 =她轉的同時,水平鏈動元件372之旋轉軸姻沿夾具保持器 376之對應導引槽378滑動。 夾具保持n完全豎起之後,控鮮元_馬達轉動第-推進:件390。由此,第一推進組件·滑動,直至第—推細 39〇靠近夹具保持器、m之前部,如「第5〇圖」顯示。^ is sandwiched by two fixed unit pickups 322. Next, the fixed unit inspection moves along the fixed unit pickup transfer line 32, and then the swivel package is placed on the positioning portion 394 formed on the top of the holder block 392. The drive member 328 for adjusting the respective suction nozzle lines of the fixed unit pickup 322 is operated to move the support rod and the support rod. The support rod 332b is used to support the placement of the rotating body sp to the first positioning portion of the suction nozzle 327. The support rod 332b is used to support the placement of the semiconductor package π in the second positioning portion of the suction nozzle 327, and then support The lion system is used, which is lower than the support rod. 53 200834785 After the 疋 半导体 半导体 半导体 半导体 sp sp 于 sp sp sp sp sp sp sp sp sp sp sp sp sp sp sp sp sp sp sp sp sp sp sp sp sp sp sp sp sp sp sp The air passing through the air holes 396 in the positioning portion 394 is evacuated, whereby the semiconductor package SP is correctly placed on the positioning portion. When the control unit judges that the semiconductor package sp has been correctly placed on the positioning portion through the air discharge through the illusion 9, the flat keying element 372 and the vertical chain moving element 374 are operated by the corresponding motor. The h-force level shifts to the vertical element 364 and the vertical key moves 374 upward. Therefore, such as "5a", "figure map", "redundancy ^ and "5D map" display", the clamp holder for the gripping jig is not upright. More specifically, 'as shown in FIG. 5C, the horizontal chain link element 372 is rotated while the rotary shaft 380 of the horizontal link member 372 is rotated and the clamp holder 376 is hingedly coupled to the vertical chain mover. The rotating shaft slides along the corresponding guiding groove 378 of the clamp holder 376. After the clamp keeps n fully erected, the control unit _ motor rotates the first-propulsion: member 390. Thereby, the first propulsion unit is slid until the first-thickness 39〇 approaches the clamp holder and the front portion of the m, as shown in the "5th drawing".

當第-推進組件390靠近夾具保持器376前部時,控制單元 則驅動馬達以驅動第一推進單元395。由此,第_推進單元奶 推動置於支座塊392上之半導體縣sp,直至半導體封裝 全嵌入夾具310之狹縫314中。 凡 在半導體封裝嵌入完成之後 用於驅動第一推進單元395之 54 200834785 相^向旋轉,由此第—推進單幻95徹底地脫離於支 "A 這日$,控制夾具保持器376垂直移動之垂直鏈動元件 —向上或向下移動,進而夾具31〇之空閑狹缝314沿第-推進單 元395之移動方向定位。When the first propulsion assembly 390 is near the front of the clamp holder 376, the control unit drives the motor to drive the first propulsion unit 395. Thus, the first advancement unit milk pushes the semiconductor county sp placed on the holder block 392 until the semiconductor package is fully embedded in the slit 314 of the jig 310. 54 200834785 for driving the first propulsion unit 395 after the completion of the semiconductor package embedding is rotated, whereby the first propulsion single magic 95 is completely separated from the support "A this day, and the control jig holder 376 is vertically moved. The vertical chain moving element moves upward or downward, and the idle slit 314 of the clamp 31 is positioned in the moving direction of the first propulsion unit 395.

在第推進單元395自支座塊392上分離之後,固定單元撿 拾f 322則夾取兩行之兩個中間台302上之半導體封裝SP,然後 放置夾取之半導體封裝犯於支座塊392之定位部394上。 在半導體封裝sp被置於支絲392上之後,銳上述步驟, 因此夹具31〇之空閑狹縫SM上係填滿有半導體封裝sp。 同守如苐6A圖」顯示,第一推進單元 娜料元。感測單元3"係安裝於第一推進單元奶上。當第 推進單το 395將半導體封裝sp嵌入央具細之狹缝⑽中 轉體封裝sp可能與夾㈣之狹縫314邊緣沖突,由此第―推 進單元395出現故障。 例如 ® '推進單元395a之推進刃施推動置於支座塊 392之定位部綱上的半導體封裝犯喪入夾具細狹_中時, 但是由W推進單元395b之推進刀推動且位於支座塊观上之半 導體聰歧具⑽之狹缝則輕卡住,纽轉體封裝 能嵌入對應狹縫314中,雖然w推進單元395a 移動至狹缝3M中,但推進單元 ’又 而能夠 一推進早70 39北確不能順利移動。因此, 1-2推進單元働之推進刀逆著彈性元件施之彈力而朝向支撐 55 200834785 導桿397c推進。 田1 2推進單兀働之推物向支樓導桿孤推進時,因此 推進刃後部接觸支樓導桿397c之感測器通,感測器通係運 彳了以雜w麵單元㈣之轉喊至轉體雌製造系統之 控制單元。 . 當接收到故障訊號時,控制單元則控制第一推進組件按 水平垂直於直立夾具310之方向沿底座移動。在第一推進組件· 移動之後,控制單元驅動馬達以移動第—推進單元395朝向夹且 310狹縫314移動。 /、 因此,由纽310之狹縫3U邊緣鉤住動此沒有嵌入夾且 別狹縫314中之半導體聰sp則由第—推進單元奶推動,因 此半導體封裝SP被穩定地嵌人夾具31G之狹缝314中。 在透過上述方法將半導體封裝证填滿爽具之狹縫314之 籲後’水平鏈動元件372移動至圖示左側,並且垂直鍵動元件讲 向下移動’因此如「第5A圖」所示夾具保持器、376係水平定位。 • 在夾具保持器376水平定位之後,控制單元驅動切割單元檢 ,拾器' 508,以夾取並傳輸卡盤台5〇4上方之夹具。當失具训 位於卡盤台5〇4上方時,卡盤台5〇4旋轉9〇度,並沿著卡盤台傳 輸線506移動。這時,切割刃5〇2旋轉。 因此’在半導體封裝sp沿卡盤台傳輪線506移動的同時,置 於夹具310上之半導體封裝sp ♦其接觸蝴刃皿之表面被切 56 200834785 割。 在完成卡盤台5〇4上之夾具之半導體封裝一側面切割步 驟之後,卡盤台504沿卡盤台傳輪線506返回至其起始位置,^ 且切割單元胁1 ,再:欠撿起失具310。執行上述步驟以旋轉^ . 具310,進而切割固定於夾具310上之半導體封裝sp另一側:。 • t切割單元撿拾器遍撿起夹具310的同時升高時,位置變 •換裝置520之夾具固定單元530被滑動嵌入夾具31〇與卡盤台^ 之間限定之空間内。特別地,如「第8β圖」所示,夹具固定單元 530係由位置變換裝置52〇之移動單元55〇移動。 、更特別地,當移動單元55〇之驅動馬達運行時,被傳輪驅動 馬達之驅動力之傳送帶5S2則圍繞配置於位置變換裝置⑽相對 端之滑輪556運轉,以移動傳送帶固定元件554。 册=运帶固定元件554係固定至夾具固定單元53〇。因此,傳送 鲁▼口疋疋件554連同夾具固定單元MO 一起移動。當夹具固定單 凡530定位於切害·】單元撿拾器'通與卡盤台撕之間時,切割單 元撿拾,篇則位於夾具固定單元別之夾具定位空間別中。 , Α 口疋早7G 534之移動元件538運行R使得夾具更安全地 固^於夾具定位空間531中,因此固定元件奶移向夹具剔。當 口疋讀537移向夹具3ω時,夾具則之各角則嵌入固定元件 537之固定狹缝536中。 當夾具310各角被嵌入固定元件537之固定狹缝536中時, 57 200834785 夹具310係完全固定至位置變換裝置52〇中。在夹具刃〇完全固 定於位置變換裝置520之後,移動單元55〇之躺動馬達係沿相反 方向旋轉。目此,連接至傳送帶固定元件554之夹具固定單元別 係移動至其起始位置。 纽置變換裝置似之夾具固定單元530移動至其起始位置 .之後,旋轉單元_之驅動元件542運行。隨著驅動元件542的 運行,夾具固定單元530由鏈動單元544旋轉。 ❿ j別地’透過連接至驅動元件542之齒條546鱗接至夾具 固定單元530之小齒輪548之間的共同協作,驅動元件542之直 線往復運動被轉換為旋轉運動,由此旋触具固定單元53〇。 田夾具固疋單το 530旋轉時,因此尚未製造之半導體封震 之一!^向上直立,移動單元550之驅動馬達再次運行,由此夾 /、口疋單元530疋位於切剔單元撿拾器、獅與卡盤台綱之間。 φ 這寸夾具固疋單元53〇之移動元件MS運行,以移動固定 j 537通離夾具31〇。當固定元件537遠離夾具⑽移動時,切 . 割單元撿拾器通在撿起夾具31G的同時上升。 • 在夾具310從失具固定單元530上移除之後,移動單元55〇 之驅動馬達再次運行,由此如「第Μ圖」顯示,位置變換裝置 520之夾具固定單元53〇移動至其起始位置。 〜撿起夾具310之切割單元撿拾器篇再次下落,並將失具训 疋位於卡盤台5〇4上。接著,卡盤台撕旋轉⑽度,然後沿著卡 58 200834785 盤台傳輸線506向切割刀5〇2移動。因此,固定至夾具3i〇之半 導體封裝SP另一側面被切割。 在疋成夾具310之半導體封裝sp之切割處理之後,卡盤台 汹沿卡盤台傳輸'線鄕返回其起始位置。然後,沿相反方向旋轉 9〇度。隨著卡盤台504之旋轉,切割單元撿拾器、,夾取夹具則,After the first advancing unit 395 is separated from the support block 392, the fixed unit picks up the f 322 to capture the semiconductor package SP on the two intermediate rows 302 of the two rows, and then places the clamped semiconductor package on the support block 392. Positioning unit 394. After the semiconductor package sp is placed on the branch wire 392, the above steps are sharpened, so that the idle slit SM of the jig 31 is filled with the semiconductor package sp. The same as the 苐 苐 苐 6A picture shows, the first propulsion unit Na yuan yuan. The sensing unit 3" is mounted on the first propulsion unit milk. When the first push sheet το 395 embeds the semiconductor package sp into the slit of the centerpiece (10), the swivel package sp may collide with the edge of the slit 314 of the clip (4), whereby the first push unit 395 malfunctions. For example, when the pusher blade of the pusher unit 395a pushes the semiconductor package placed on the positioning portion of the holder block 392 into the jig, it is pushed by the pusher of the W push unit 395b and is located in the stand block. The slit of the semiconductor singularity (10) is lightly stuck, and the button package can be embedded in the corresponding slit 314. Although the w-propulsion unit 395a moves into the slit 3M, the propulsion unit can be advanced early. 70 39 North does not move smoothly. Therefore, the propulsion knife of the 1-2 propulsion unit is pushed against the support 55 200834785 guide 397c against the elastic force exerted by the elastic member. Tian 1 2 pushes the push of the single squat to the propeller of the branch building, so the sensor is connected to the rear of the blade guide 397c, and the sensor passes through the miscellaneous w surface unit (4). Shout to the control unit of the swivel female manufacturing system. When the fault signal is received, the control unit controls the first propulsion assembly to move along the base in a direction perpendicular to the upright fixture 310. After the first propulsion assembly has moved, the control unit drives the motor to move the first propulsion unit 395 toward the clamp and 310 the slit 314 to move. /, Therefore, the slit 3U edge of the button 310 is hooked by the semiconductor clip without the embedded clip and the slit 314 is pushed by the first push unit milk, so the semiconductor package SP is stably embedded in the jig 31G. In the slit 314. After the semiconductor package is filled with the slit 314 of the refresher by the above method, the 'horizontal chain moving element 372 is moved to the left side of the figure, and the vertical keying element is moved downward'. Therefore, as shown in FIG. 5A The clamp holder and the 376 are horizontally positioned. • After the clamp holder 376 is horizontally positioned, the control unit drives the cutting unit to check the picker '508 to grip and transport the clamp above the chuck table 5〇4. When the misalignment is located above the chuck table 5〇4, the chuck table 5〇4 is rotated by 9 degrees and moved along the chuck table transmission line 506. At this time, the cutting edge 5〇2 rotates. Therefore, while the semiconductor package sp is moving along the chuck table transfer line 506, the surface of the semiconductor package sp ♦ which is placed on the jig 310 is cut by the surface of the wafer. After completing the side cutting step of the semiconductor package of the jig on the chuck table 5〇4, the chuck table 504 returns to the initial position along the chuck table transfer line 506, and the cutting unit threatens 1, and then: Get upset 310. The above steps are performed to rotate the tool 310, and then cut the other side of the semiconductor package sp fixed on the jig 310: • When the t-cut unit pickup is raised while lifting the jig 310, the jig fixing unit 530 of the position changing device 520 is slidably embedded in the space defined between the jig 31 and the chuck table. Specifically, as shown in the "8th figure", the jig fixing unit 530 is moved by the moving unit 55 of the position changing device 52. More specifically, when the driving motor of the moving unit 55 is operated, the belt 5S2 driven by the driving force of the driving motor is operated around the pulley 556 disposed at the opposite end of the position changing device (10) to move the belt fixing member 554. Book = the belt fixing member 554 is fixed to the jig fixing unit 53A. Therefore, the transfer Lu 疋疋 疋疋 554 moves together with the jig fixing unit MO. When the fixture is fixed, the 530 is positioned between the cutting unit and the chucking unit, and the cutting unit is picked up. The part is located in the fixture positioning space of the fixture fixing unit. The movement element 538 of the 7G 534 is operated so that the clamp is safely fixed in the fixture positioning space 531, so the fixed component milk moves toward the clamp. When the port reading 537 is moved toward the jig 3ω, the corners of the jig are inserted into the fixing slits 536 of the fixing member 537. When the corners of the clamp 310 are embedded in the fixed slit 536 of the fixing member 537, the 57 200834785 clamp 310 is completely fixed to the position changing device 52A. After the gripper blade is completely fixed to the position changing device 520, the reclining motor of the moving unit 55 is rotated in the opposite direction. Thus, the jig fixing unit connected to the belt fixing member 554 is moved to its starting position. The button changing device 530 is moved to its starting position. After that, the driving unit 542 of the rotating unit operates. As the drive member 542 operates, the clamp fixing unit 530 is rotated by the chain drive unit 544.别 别 别 ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' The fixing unit 53 is closed. When the field fixture is rotated by a single το 530, one of the semiconductor seals that has not yet been manufactured is erected upward, and the drive motor of the mobile unit 550 is operated again, whereby the clamp/port unit 530 is located at the pick-up unit pickup, Between the lion and the chuck. φ The moving element MS of the clamp fixture unit 53 is operated to move the fixed j 537 away from the clamp 31〇. When the fixing member 537 moves away from the jig (10), the cutting unit pickup rises while lifting the jig 31G. • After the jig 310 is removed from the lost fixing unit 530, the driving motor of the moving unit 55 is operated again, whereby the jig fixing unit 53 of the position changing device 520 is moved to its start as shown in the "figure diagram". position. ~ The cutting unit pick-up piece of the pick-up jig 310 is again dropped, and the missing tool is placed on the chuck table 5〇4. Next, the chuck table is torn (10) degrees and then moved along the card 58 200834785 disk transfer line 506 toward the cutting blade 5〇2. Therefore, the other side of the semiconductor package SP fixed to the jig 3i is cut. After the cutting process of the semiconductor package sp of the forming jig 310, the chuck table 传输 transmits the 'wire 汹 along the chuck table to its starting position. Then, rotate 9 degrees in the opposite direction. As the chuck table 504 rotates, the cutting unit picks up the gripper, and the gripping jig,

沿著切割單元撿拾器傳輸線獅移動,並將夾具训定位於夹具 保持器376之夾具定位孔382中。 在夾具310凡全定位且固定於夾具保持器中之後,水平 鏈動το件372肖右移動,並且垂直鏈動元件374向上移動,因此 2具保持器376如「第5B圖」顯示直立。如「第5c圖」顯示, 虽夹具保持器376在直立的同時運行時,用於驅動第一推進組件 之焉達私。因此’第—推進組件滑動,直至其靠近夹且 保持器376前部,如「第5D圖」顯示。 八 、立並且’用於驅動第二推進部402之馬達運行。因此,第二推 、P 4〇2矛夕動攸失具31〇後部嵌入狹缝別並放置於狹缝训中 之半導體封裝SP至支座塊392之定位部规。 古、言、第—推進402之頂端係構造為兩層結構,並且其較 :貝^之長度小於其較低頂端長度。因此,當第二推進部402推 _十衣SP枯’半導體封裝Sp被正確地定位於台階結構之 塊392之第一定位部綱a以及第二定位部394b上。' 在半導體封I SP置蚊位部394上之後,固定單元撿拾器 59 200834785 2則化著固疋單凡撿拾器傳輸線32〇移動,並位於第—定位部 394a與第—定位部於扑上方。在此之後固& — 你俊固疋早兀撿拾器322利 用驅動元件328之向下運動夾取半^^封裝sp。 W ’支撐桿332a及332b由各個,航件迦及32%驅 動’其中支撐桿孤及现係連接至按兩行排歹则定單元檢 拾器322上之吸取喷嘴327。因此,置於支座塊392之第一定位部 3叫以及第二定位部3她上之半導體封農sp係由固定單元檢拾 器322容易夾取。 。。夾取半導體封裝SP之固定單元撿拾器322係沿著固定單元檢 拾器傳輸線320移動’以傳輸已夾取半導體封裝至清洗與乾燥單 元 600。 在固定單元撿拾器322移向清洗與乾燥單元_之後,固定 單元撿拾1 322 半導體封裝sp定位於第一清洗單元61〇之清 洗台616上。當半導體封裝sp位於清洗台训上,控制單元則驅 動馬達620,進而清洗台616能夠沿傳送帶626移動。 ^清洗台6丨6首先位於第一喷嘴628下方,當清洗台616位於 第-喷嘴628·下方時,第一喷嘴628向清洗台616上之半導體封 裝SP嘴灑含有表面活性劑之液體,進而以化學方法清洗半導體封 襞SP 〇 在清洗台616經過第一噴嘴628之後,半導體封裝sp被位於 刷子630下方。半導體封裳sp頂部由刷子63〇物理清洗。在清洗 200834785 台616經過刷子630之後,清洗台616則定位於第二噴嘴6幻下 方0 當清洗台616位於第二喷嘴632下方時,第二喷嘴632向清 洗台616上的半導體封裝SP喷灑例如水的液體。因此,留在半導 體封裝SP上的雜質以及從第一噴嘴628喷灑的清洗劑被第二噴嘴 632喷灑之液體徹底除去。 在清洗台616經過第二噴嘴632之後,清洗台616則位於第 三喷嘴634 T方。第三噴嘴634係用於向清洗台616上之半導體 封衣SP貝灑氣體。因此,留在清洗台616上之半導體封裝上 的濕氣基本上被第三噴嘴634所喷灑之氣體除去。 在清洗台616經過第三喷嘴634之後,清洗台616則位於單 2撿拾器' _下方。單元撿拾器、660朝向清洗台616下降’撿起 清洗^ 616上之半導體封裝sp,並移向第二清洗單元65〇。 單元撿拾11 _係_撿起位於清洗台616上之所有半導體 封衣SP ’亚雜至第二清洗單元㈣上方。以相同於第—清洗單 元_之方式,第二清洗單元650利用各種喷嘴652及刷子654, 進而物理及化學地清洗半賴雜sp底部。 ^通過第二清洗單元㈣之半導體職sp上仍留有濕氣,因 ’ -了徹底乾燥半導體封裝sp,單元撿拾器、_將半導體封裝 SP定位於乾燥台670上。 、 一加熱器係安裝於乾燥台 670中。因此,透過加熱器產生的 61 200834785 熱里徹底乾她於乾燥台67G上之半導體封裝sp。在乾燥台· j半導體封裝SP之乾燥處理故之後,第—檢查單元71〇則沿 者車元心拾器傳輸線662移動。 ㈣地第-檢查單元71〇係位於乾燥台_上方,以檢查 j台67G上之半體封|处頂部是否有缺陷。此外,第一檢查 :兀?10傳輸半導體封裝证頂部是否存在缺陷之檢查結果至控制 單元。The line lion is moved along the cutting unit picker and the fixture is positioned in the fixture positioning hole 382 of the clamp holder 376. After the jig 310 is fully positioned and fixed in the jig holder, the horizontal chain moving member 372 is moved rightward and the vertical chain moving member 374 is moved upward, so that the two holders 376 are displayed upright as shown in Fig. 5B. As shown in Fig. 5c, although the clamp holder 376 is operated while standing upright, it is used to drive the first propulsion assembly. Therefore, the 'first-propulsion assembly slides until it approaches the clamp and the front of the holder 376, as shown in "Fig. 5D". Eight, standing and 'for driving the motor of the second propulsion portion 402. Therefore, the second push, the P 4 〇 2 攸 攸 〇 〇 〇 〇 〇 〇 〇 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 The apex of the ancient, the syllabus, the first-propulsion 402 is constructed as a two-layer structure, and its length is smaller than its lower tip length. Therefore, when the second advancing portion 402 pushes the semiconductor package Sp to be correctly positioned on the first positioning portion a and the second positioning portion 394b of the block 392 of the step structure. After the semiconductor package I SP is placed on the mosquito-receiving portion 394, the fixed unit pickup 59 200834785 2 is moved by the fixed-carrying pickup transmission line 32〇, and is located above the first positioning portion 394a and the first positioning portion. . After that, the solid & _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ The W' support rods 332a and 332b are each driven by a 32% drive member in which the support rods are connected to the suction nozzles 327 on the unit pickup 322 in two rows. Therefore, the first positioning portion 3 placed on the holder block 392 and the semiconductor sealing portion on the second positioning portion 3 are easily gripped by the fixed unit pickup 322. . . The fixed unit pickup 322 that grips the semiconductor package SP moves along the fixed unit pickup transmission line 320 to transfer the captured semiconductor package to the cleaning and drying unit 600. After the fixed unit pickup 322 is moved toward the cleaning and drying unit _, the fixed unit picks up 1 322 and the semiconductor package sp is positioned on the cleaning stage 616 of the first cleaning unit 61. When the semiconductor package sp is on the cleaning station, the control unit drives the motor 620, and the cleaning station 616 can be moved along the conveyor belt 626. ^The cleaning station 6丨6 is first located below the first nozzle 628. When the cleaning station 616 is located below the first nozzle 628·, the first nozzle 628 sprinkles the liquid containing the surfactant onto the semiconductor package SP nozzle on the cleaning table 616, and further The semiconductor package SP is chemically cleaned. After the cleaning stage 616 passes the first nozzle 628, the semiconductor package sp is positioned below the brush 630. The top of the semiconductor seal sp is physically cleaned by a brush 63. After the cleaning of the 200834785 table 616 through the brush 630, the cleaning station 616 is positioned below the second nozzle 6. When the cleaning station 616 is positioned below the second nozzle 632, the second nozzle 632 is sprayed onto the semiconductor package SP on the cleaning station 616. For example, a liquid of water. Therefore, the impurities remaining on the semiconductor package SP and the cleaning agent sprayed from the first nozzle 628 are completely removed by the liquid sprayed by the second nozzle 632. After the cleaning station 616 passes the second nozzle 632, the cleaning station 616 is located at the third nozzle 634T. The third nozzle 634 is for blowing gas to the semiconductor seal SP on the cleaning station 616. Therefore, the moisture remaining on the semiconductor package on the cleaning stage 616 is substantially removed by the gas sprayed by the third nozzle 634. After the cleaning station 616 passes the third nozzle 634, the cleaning station 616 is located below the single picker's. The unit pickup 660 is lowered toward the cleaning station 616 to pick up the semiconductor package sp on the cleaning unit 616 and move to the second cleaning unit 65A. The unit picks up 11 _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ In the same manner as the first cleaning unit _, the second cleaning unit 650 utilizes various nozzles 652 and brushes 654 to physically and chemically clean the bottom of the semi-dissolving sp. ^The semiconductor device sp is still left with moisture through the second cleaning unit (4) because the semiconductor package sp is completely dried, and the semiconductor package SP is positioned on the drying table 670. A heater is mounted in the drying station 670. Therefore, the heat generated by the heater in 2008, 2008, 785, thoroughly dried her semiconductor package sp on the drying station 67G. After the drying process of the drying station j semiconductor package SP, the first inspection unit 71 moves along the vehicle core pickup transmission line 662. (4) The ground-inspection unit 71 is located above the drying station_ to check whether there is a defect at the top of the half-body seal| In addition, the first check: 兀? 10Transfer the inspection result of the defect on the top of the semiconductor package to the control unit.

亚且’弟-檢查單元71〇檢查位於乾燥台㈣上之半導體封 =否置於其正確位置’例如半導體封裝sp何種程度地偏離 八正確位置。第-檢查單元刑傳輸此檢紐果至控制單元。 ㈣tr檢查單元71G完紐查之後,乾私㈣沿乾燥台傳 嫩_私細2心撕㈣。隨後,傳 :早4拾器綱撿起位於乾燥台叫之半導體封裝sp。這時, 執仃弟一修正,以修正半導體封裝§1>之位置。 上之:「: 23圖」顯示,一些半導體封裝SP係位於乾燥台670 ^地置處,但是—些半導崎sp卻不正舰位於乾燥 口 670上。因此,乾燥台67〇上之半導體封裝处之位置m :此位置編、晴,输71。元:係提 供至傳輸單元撿拾器2〇4。因此,如「 糸徒 口口- Μ 圖」顯示,透過傳輪 早讀拾器204舆乾操台670之間的相對運動,喊行第一修! 例如,透過傳輸單元撿拾器2〇4沿 孕由方向在預定範圍内的 62 200834785 移動,以及傳輸單元撿拾器204之半導體封裝SP撿起操作而執一 半導體封裝SP之X軸修正。 订 半導體封裝SP之Y軸修正係透過乾燥台沿γ轴方向在預定 範圍内的移動,以及傳輸單元撿拾器2〇4之轉朗裝处檢^ 作而執行。 呆 透過以預定角度旋轉用於撿起半導體封裝sp之傳輸單元撿 拾器204,進而執行半導體封裝兕之0修正。 取 已完成第-修正之半導體封裝sp係由傳輸單元撿拾器撕撿 起’並且傳輸單元撿拾器綱沿傳輸單元撿拾器傳輪線加移^ 至第二檢查單元720上方。 在傳輸單元撿拾器2〇4移至第二檢查單元72〇上方之後,第 二檢查單元則檢查由傳輪單秘拾ϋ綱撿起並傳輸之半導封 裝SP的底部是否存在缺陷。 在第二檢查單元檢查由傳輸單元撿拾器綱撿起之半導體封 裝SP底部是否存在缺陷之後,第二檢查單元⑽傳輸檢查結果至 控制單元。 此外’弟二檢查單元72〇還檢查由傳輸單元檢拾器、施檢起 之半導體雜SP偏轉正魏好大侧。制地,第二檢查單 疋720檢查半導體封裳sp之位置是否由於結構及其他環境因素, 例如在透過傳輸單元撿拾器綱傳輸首先由第一檢查單元爪修 正之半導體封裝SP之過財祕之_齒隙,耐經造成半導體 63 200834785 封裝sp之位置變化。並且,第二檢查單元72〇傳輸此檢查結果至 控制單元。 同日守’接塾722係設置於傳輸單元撿拾器2〇4之較低端。因 此如第12圖」顯示,考慮到接墊722位置以及半導體封裝SP 之滅位置,例如每個半導體封裝sp之χ轴、γ轴以及㊀角而能 夠偵、測半導體縣sp之麟程度。 此外’由於半導體封裝Sp位置已經由第-檢查單it 710修 正口此由第—檢查單元no檢查之半導體封裝π之偏離程度係 在非系小之錯誤範圍内被修正。 因此,當存儲有第二檢查單元砂之檢查結果之控制單元判 斷半導崎SP與難722之㈣目對位置檢紐果偏離標準錯 她圍時,則執行回饋,其中料體封裝sp與接墊722之間之相 對位置檢查結果係由第二檢查單元720執行。因此 斷讎722係不正確定位,並通知使用者接物為不正確定Γ’ 進而此夠由使用者重新調整接塾722之位置。 ☆在第二檢查單元72〇完成檢查之後,沿著傳輪單元檢於哭偉 =〇2搬運傳輪單_____時t^ X軸轴修正係透過傳輪單元撿拾器204例如按 /口“早讀拾器傳輸線搬移動來執 SP之Υ轴修正係透過活動台1〇 +^體魄 孕由方向沿活動台傳輪線 64 200834785 封裝SP之Θ修正係透過傳輸單元撿拾器 104移動來執行。半導體 204之旋轉執行。 或者,傳輪單元撿拾器204可以構造為如下結構,即傳輸單 兀檢拾器2G4能夠在半输鐵造_沿X齡向、γ軸方 2以及Θ方向移動’進而所有修正均_傳輸單元撿拾器测 執行。 H况下’當傳輸單元撿拾器谢、沿傳輸單元檢拾器傳輸 移動時’傳輸單元檢拾器204可以不管控制單元由於齒隙 斤傳輸^錯誤資訊,而將铸體封裝sp定位於活動台赐上。 一 控制單兀可以利用傳輸單元撿拾器2〇4之各個接墊722 之執行回饋,進而傳輸單元撿拾器2〇4能狗基於其哪值(處 理月b力‘數)運行,由此將故障出現減到最少。 在上述修正完成之後,傳輸單元撿拾器204將半導體封裝SP 置於對應活動台103之托盤102上。 •當存儲於控制單元中之關於半導體封裝SP t缺陷資訊被傳 輸至傳輸單元撿拾器綱時,傳輸單元撿拾器綱則將判斷為有 夬產口π之半導體封裝Sp定位於活動台之再力。工托盤上,以及放 置判斷為優良品質產品之轉體封裝sp於活動台之良好扼盤上。 上面設置有包含半導體封裝sp之托盤102之半導體封裝活動 口 103係沿著活動台傳輸線1〇4移動,然後定位於托盤撿拾器之 私動路線下方。托盤撿拾b 112撿^^托盤皿,並放置已撿起之托 65 200834785 盤102於預定托盤盒106中,進而托盤102能夠被卸載。並且, 托盤撿拾益112係構造為同時撿起兩個托盤1〇2,由此快速執行卸 載處理。 或者,複數個托盤撿拾器112可以互相平行配置,以同時撿 起並放置托盤102於對應活動台1〇3上。The sub-and-different inspection unit 71 checks whether the semiconductor package on the drying station (4) is placed in its correct position, for example, to what extent the semiconductor package sp deviates from the eight correct positions. The first-inspection unit transmits the checksum to the control unit. (4) After the tr check unit 71G finishes the New Check, the dry and private (four) pass along the drying station to pass the tender _ private fine 2 heart tear (four). Subsequently, Chuan: The early 4 picks up the semiconductor package sp located in the drying station. At this time, the sister-in-law corrected it to correct the position of the semiconductor package §1>. Above: ": Figure 23" shows that some semiconductor package SPs are located at 670 ^ on the drying station, but some semi-conductors are not on the dry port 670. Therefore, the position of the semiconductor package on the drying table 67 is m: this position is edited, sunny, and 71. Element: is supplied to the transport unit pickup 2〇4. Therefore, as shown in the "The gangster's mouth - Μ map", the relative movement between the 205 and the dry 670 is carried out through the transmission wheel, and the first repair is made! For example, through the transmission unit pickup 2〇4 The X-axis correction of the semiconductor package SP is performed by the operation of 62 200834785 moving in the predetermined range and the semiconductor package SP of the transfer unit pickup 204. The Y-axis correction of the semiconductor package SP is performed by the movement of the drying stage within a predetermined range in the γ-axis direction and the inspection of the transfer unit pickup 2〇4. The transmission unit pickup 204 for picking up the semiconductor package sp is rotated by a predetermined angle to perform the zero correction of the semiconductor package. The semiconductor package sp that has completed the first correction is torn by the transfer unit pickup and the transfer unit pickup is moved over the transfer unit to the second inspection unit 720. After the transport unit pickup 2〇4 is moved over the second inspection unit 72A, the second inspection unit checks whether or not there is a defect in the bottom of the semiconductor package SP picked up by the transfer single-chip assembly and transmitted. After the second inspection unit checks whether there is a defect in the bottom of the semiconductor package SP picked up by the transfer unit pickup, the second inspection unit (10) transmits the inspection result to the control unit. Further, the "second two inspection unit 72" also inspects the semiconductor miscellaneous SP deflected by the transmission unit pickup and the positive side. The second inspection unit 720 checks whether the position of the semiconductor package sp is due to structural and other environmental factors, for example, the semiconductor package SP which is first modified by the first inspection unit claw through the transmission unit pickup device. _ backlash, resistance to the semiconductor 63 200834785 package sp position change. And, the second checking unit 72 transmits the result of the check to the control unit. On the same day, the 塾 塾 722 system is placed at the lower end of the transmission unit pickup 2〇4. Therefore, as shown in Fig. 12, in consideration of the position of the pad 722 and the off position of the semiconductor package SP, for example, the x-axis, the γ-axis, and the corner of each semiconductor package sp can detect and measure the degree of the semiconductor county sp. Further, since the position of the semiconductor package Sp has been corrected by the first checklist 710, the degree of deviation of the semiconductor package π inspected by the first check unit no is corrected within a non-small error range. Therefore, when the control unit storing the inspection result of the second inspection unit sand determines that the semi-consistency SP and the difficulty 722 (4) are out of the standard deviation, the feedback is performed, wherein the material package sp and the connection The relative position inspection result between the pads 722 is performed by the second inspection unit 720. Therefore, the break 722 is incorrectly positioned, and the user is notified that the pick is not correct Γ' and thus the position of the interface 722 is re-adjusted by the user. ☆ After the second inspection unit 72〇 completes the inspection, it is checked along the transmission unit to the crying relay=〇2 when the delivery wheel is _____. The t^X axis correction system is transmitted through the transmission unit pickup 204, for example, by the mouth/port. "Early read pickup transmission line moves to perform SP's axis correction system through the movable table 1 〇 + ^ body pregnancy from the direction along the movable table transmission line 64 200834785 The package SP correction is performed by the transmission unit pickup 104 movement The rotation of the semiconductor 204 is performed. Alternatively, the transfer unit pickup 204 may be configured as follows, that is, the transfer single pick-up 2G4 can be moved in the half-steel direction, along the X-direction, the γ-axis 2, and the Θ direction. Furthermore, all the corrections are performed by the transmission unit pickup. In the case of H, when the transmission unit picks up and moves along the transmission unit pickup, the transmission unit pickup 204 can transmit the error of the control unit due to the backlash. Information, and the casting package sp is positioned on the movable table. A control unit can utilize the execution feedback of each of the pads 722 of the transmission unit pickups 2, 4, and then the transmission unit picks 2 〇 4 can be based on which Value (processing month b 'Number' operation, thereby minimizing the occurrence of faults. After the above correction is completed, the transfer unit pickup 204 places the semiconductor package SP on the tray 102 of the corresponding movable table 103. • When stored in the control unit about the semiconductor When the package SP t defect information is transmitted to the transmission unit pickup unit, the transmission unit pickup program judges that the semiconductor package Sp having the production port π is positioned at the movable table. The work tray and the placement are judged to be excellent. The rotating package sp of the quality product is on the good disk of the movable table. The semiconductor package movable port 103 on which the tray 102 including the semiconductor package sp is disposed is moved along the movable table transmission line 1〇4, and then positioned in the tray picker. Below the private route, the tray picks up the b 112捡^^ pallet and places the picked up tray 65 200834785 The tray 102 is in the predetermined tray box 106, so that the tray 102 can be unloaded. Moreover, the tray picking 112 is constructed simultaneously The two trays 1〇2 are picked up, whereby the unloading process is quickly performed. Alternatively, the plurality of tray pickers 112 can be arranged in parallel with each other to pick up at the same time. And placing the tray 102 on the corresponding movable table 1〇3.

下文中’將參考「第19圖」以及「第20A圖」至「第20E 圖」詳細說明本發明第二實施例之採用位置變換裝置之半導體封 裝製造糸統。 與本發明第一實施例中之位置變換裝置520不同,在本發明 第一貫施例之半導體封裝製造系統中,位置變換裝置52〇〇係設置 於1 ^盤台傳輸線5060上方。換言之,與第一實施例之位置變換 衣置52〇不同,第一貫施例之位置變換裝置5200沒有配備有一移 動單元。 關於第二實施例之位置變換裝置52〇〇之結構將說明如下。與 第一實施例之位置變換裝置52〇相同,第二實施例之位置變換裝 置5200係包含一夾具固定單元⑽以及一旋轉單元“⑽,其中 失具固定單元5300係用於固定嵌有半導體封裝sp之夾具31〇〇, 疑孝^單元5400用於旋轉夾具固定單元53〇〇。即,第二實施例之位 置、又換裝置5200之基本結構係類似於第一實施例之位置變換裝置 52〇。然而,第二實施例之位置變換裝置5200區別於第一實施例 之位置變換裝置520之結構方面詳細如下。 66 200834785 夹具固疋早疋测包含—第一固定元件測、—第二固定元 =⑽-軸元件鄭財,第—固定元件测係用於 :疋夹具则-n固技件532_第—固定树遍 叹置以在喊夹具細旋轉中心的同咖於峡夾具細另 移動元件係安裝於第一固定元件·或者第二固定 ^助-側,以用於移動第一固定元件测或 件5320至夾具31〇〇。 义 、,弟-固定7L件5310係旋轉安裝於位置變換裝置$一側。 亚且,第二固定元件5320旋轉安裝於位置變換裝置5200另-側, 進而第二固定元件测係树於第—固定元件跡因此,第一 固定兀件测與第:_件測形成位置觸請〇之旋 轉軸。 弟-固定7L件5310頂端係配備有一第—支撐轴跡並且兩 籲個或更多之凸軸部形成於第一支撐轴灿頂端。如此配置凸轴 部,當第-支撐軸5312旋轉時,透過凸軸部傳送其旋轉力至夹具 31〇〇 ’因此能夠旋轉夾具31〇〇。 —第二固定元件532G之頂端係配備有—第二支撐轴助。與第 -支撐軸5312 _,_或更多之凸麵可_成於第二支樓轴 5士322頂端。然而,當不需要傳輸馬達產生之旋轉力至失具遞 時,僅形成一個凸軸部於第二支撐軸5322頂端。 位置變縣置·包含_元件·,於提供第一支撐 67 200834785 軸5312移向或遠離夹具31〇〇, 必需之驅動力。 例如移向或遠轉二支禮轴5322 因此,弟-支撑軸S312移向或遠離第二支標軸逝,由此夹 具遞係連接至夾織單元侧,或者自夾具岐單元通 。當然,-移動元件533〇可以安裝至第_支撐轴迎或 者弟二支撐軸5322。或者,_軸元件侧可以絲至第一支 撐軸5312與第二支撐軸5322上。 〜位置變雜置湖包含旋鮮元,鶴單元·安裝 於第-固定元件53Η)或者第二固定元件532〇 一側,以用於提供 旋轉夾具鳩必需之鶴力。旋轉單元5彻例如可以為—馬達。 位置變歸置遍更包含—就單元侧,綠單元測 係設置於夾具固定單元53〇〇中。清洗單元测具有嗔嘴,其中 噴嘴係指向固定至夹具岐單元测之夾具3觸。此外,清洗單 元5500之、.、σ構如下.其中當未驅動清洗單元%⑻時,其喷嘴方 向遂離夾具删,當清洗單元测被鶴時,其物旨向爽具 31〇〇 〇 當在撿域具刪之时旋轉位置變換裝置5時,清洗 早7L 5500用於除去在切割夾具31〇〇上固定之半導體封裳卯之過 程中產生的雜質,進而清潔半導體封裝sp。 下面,將詳細說明具有上述結構之本發明第二實施例之採用 位置變換裝置之轉翻絲造純讀作。 68 200834785 首先,一切割單元5000之結構如「第19圖」顯示。當—卡 盤台504CM立於-切割單元撿拾器5_下方時,其中卡盤臺上放 置有夾,、3100 ’夾具31〇〇上具有一側面已經製造之半導體封裝 SP ’因此這時切割單元撿拾器、5_撿起夹具删並上升。 接著,切割單元撿拾器5080沿一切割單元檢拾器傳輸線5的〇 移動’如「第20A圖」顯示,由此切割單元撿拾器5_定位於位 置變換褒置5200上方’並且夹具3卿位於位置變換裝置湖之 夾具固定單元内部定義之夾具定位空助。 田夾具31〇〇位於夹具定位空間中時,透過移動元件测第 一固定元件侧向夾具侧移動。隨著第一固定元件531〇移向 夾具3100 ’夾具3100職向第二固定元件532()鑛。因此,失 具3100之相對端係連接至第一固定元件测與第二固定元件 5320,如「第2〇B圖」顯示。 〜更㈣地’第-固定元件531〇之第一支撐轴5祀以及第二 口疋το件5320之第二支撐車由5322係連接至夾具誦之相對端。 在夹具3觸固定至夹具固定單元上之後,旋轉單元·運 订以旋轉180度之夾具31〇〇。 爲、現著夹具3100由旋轉單元5400旋轉了 180度,夾具3咖轉 又為顛倒方向。鱗,從安裝於夾具固定單元遍—侧之清洗單 疋_噴出錢,以除去夾具3漏上之雜質。 在透過旋鮮元_枝夾具_之_之後,切割單元 69 200834785 撿拾器觸移動至夾具31〇〇上方,並夾取夾具3觸。隨後,透 過私動元件5330,第-固定元件5310與第二固定元件532〇遠離 夹具3100移動,由此第一支稽軸5312及第二支樓轴迎從夹具 3100分離’並且切割單元撿拾器5〇8〇撿起夾具31〇〇。 在切割單元撿拾器5_撿起夾具3100之後,切割單元撿拾 器5080沿切割單元撿拾器傳輸線5〇9〇移動至卡盤台5〇4〇上方, 然後將夾具3100置於卡盤台5040上部。 上方放置有夾具3100之卡盤台测移動至一切割刀觸, 進而透過切割刀5020切割半導體封裝sp之另—侧面。固定有已 完成切割處理之半導體封裝sp之夾具雇將經歷與上述處理相 同之處理。 —雖然本發明以前述之較佳實_揭露如上,然其並非用以限 疋本發明’任何熟習相像技藝者,在不脫離本發明之精神和範圍 内田可作些許之更動與潤飾,因此本發明之專利保護 本說明書_之申請專概圍所界定者鱗。 例如,雖然如上文所述,本發明之半導體封裝製造系统之扯 構為第一推進組件以滑動方式靠近其中夾具直立之垂: 元件364’但是本發敗半導體雌製造系統還可以構造為如下結 構’其中垂直it件364係靠近第—推進組件。 亚且’如「第21A圖」、「第21B圖」、「第21C圖」及「第加 圖」顯示’夾具保持器376可以不是鉸鏈連接至垂直鍵動元件 200834785 374,而是可以透過旋轉及滑動方式連接至垂直鏈動元件374。 並且,如「第21A圖」、「第21B圖」、「第2ic圖」及「第21D 圖」顯示,第一推進部398及第二推進部402可以構造為三層結 構。當然,當第一推進部398及第二推進部402構造為三層結構 時,可以構造支座塊392為三層結構。 霣 此外,如「第22圖」顯示,可以構造上述第一實施例之位置 ’ 變換裝置,以使得-位置變換裝置520,位於一卡盤台傳輸線5〇6, 鲁上方。並且,在上述第一貫施例之位置變換裝置中,可以僅提供 位置變換裝置520,,並且位置變換裝置52〇,可以沿著一導桿G向 上或向下移自。並且,可以配置-旋轉元件用於旋轉一夾具固定 單元530’。此旋轉元件可以是馬達。Hereinafter, the semiconductor package manufacturing system using the position changing device according to the second embodiment of the present invention will be described in detail with reference to "19th" and "20A" to "20E". Unlike the position converting device 520 of the first embodiment of the present invention, in the semiconductor package manufacturing system of the first embodiment of the present invention, the position changing device 52 is disposed above the 1 ^ disk transfer line 5060. In other words, unlike the position changing device 52 of the first embodiment, the position changing device 5200 of the first embodiment is not provided with a moving unit. The structure of the position changing device 52A of the second embodiment will be described below. Like the position changing device 52A of the first embodiment, the position changing device 5200 of the second embodiment includes a clamp fixing unit (10) and a rotating unit "(10), wherein the lost fixing unit 5300 is used for fixing the embedded semiconductor package The j-clamp 31, the suspect unit 5400 is used to rotate the jig fixing unit 53. That is, the position of the second embodiment, the basic structure of the re-changing device 5200 is similar to the position changing device 52 of the first embodiment. However, the positional conversion device 5200 of the second embodiment is different from the structure of the position conversion device 520 of the first embodiment in detail as follows. 66 200834785 The fixture is pre-tested to include - the first fixed component measurement, the second fixed Yuan = (10) - Axis component Zheng Cai, the first - fixed component measurement system is used for: 疋 fixture - n solid technology 532_ the first - fixed tree sighs to set the fine rotation center of the shouting fixture The moving component is mounted on the first fixing component or the second fixing side for moving the first fixing component measuring member 5320 to the clamp 31. The right, the fixed-fixed 7L member 5310 is rotatably mounted on Bit The second fixed component 5320 is rotatably mounted on the other side of the position changing device 5200, and the second fixed component is measured on the first fixed component. Therefore, the first fixed component measures the first: _The measuring position is the position of the rotating shaft. The stern-fixed 7L member 5310 is equipped with a first support shaft and two or more convex shaft portions are formed on the first support shaft. The shaft portion, when the first support shaft 5312 rotates, transmits its rotational force through the convex shaft portion to the jig 31'' so that the jig 31 can be rotated. - The top end of the second fixing member 532G is equipped with a second support shaft The convex surface with the first support shaft 5312 _, _ or more can be formed at the top of the second branch shaft 5 322. However, when it is not necessary to transmit the rotational force generated by the motor to the mishandling, only the formation A convex shaft portion is at the top end of the second support shaft 5322. The position is changed to include the element, and the first support 67 200834785 is provided. The shaft 5312 moves toward or away from the clamp 31, and the necessary driving force. For example, moving toward or far Turn the second ritual axis 5322, therefore, the brother-support axis S 312 moves toward or away from the second axis, whereby the clamp is connected to the side of the weaving unit, or from the fixture unit. Of course, the moving element 533 can be mounted to the first support shaft or the second support The shaft 5322. Alternatively, the _shaft element side may be wired onto the first support shaft 5312 and the second support shaft 5322. The position of the misplaced lake includes a sleek element, the crane unit is mounted on the first fixing member 53 Η or the second The fixing member 532 is on one side for providing the necessary force for rotating the jig. The rotating unit 5 can be, for example, a motor. The position change is further included - on the unit side, the green unit is set in the fixture fixing unit 53 〇〇. The cleaning unit measures the nozzle, wherein the nozzle is directed to the fixture 3 fixed to the fixture unit. In addition, the cleaning unit 5500 has the following structure. The σ structure is as follows. When the cleaning unit % (8) is not driven, the nozzle direction is removed from the clamp, and when the cleaning unit measures the crane, the object is to the cool device 31. When the position changing device 5 is rotated while the field is being deleted, the cleaning 7L 5500 is used to remove impurities generated during the process of fixing the semiconductor package on the cutting jig 31, thereby cleaning the semiconductor package sp. Next, a purely readable turn-over reading using the position changing device of the second embodiment of the present invention having the above configuration will be described in detail. 68 200834785 First, the structure of a cutting unit 5000 is shown as "19th". When the chuck table 504CM stands under the - cutting unit pickup 5_, wherein the chuck is placed on the chuck table, the 3100 'clamp 31 has a semiconductor package SP ' having been fabricated on one side, so the cutting unit picks up at this time , 5_ pick up the fixture and increase it. Next, the cutting unit pickup 5080 is displayed along the 〇 movement of a cutting unit pickup transmission line 5 as shown in FIG. 20A, whereby the cutting unit pickup 5_ is positioned above the position changing device 5200 and the jig is located The position changing device is defined by the fixture positioning unit inside the fixture unit of the lake. When the field fixture 31 is positioned in the fixture positioning space, the first fixing member is moved to the side of the jig by the moving member. As the first fixing member 531 is moved toward the jig 3100', the jig 3100 is moved toward the second fixing member 532(). Therefore, the opposite end of the dislocation 3100 is connected to the first fixed component and the second fixed component 5320, as shown in "Fig. 2B". The second support vehicle of the first support shaft 5'' and the second support member 5320 of the first and second fixed members 531'' are connected to the opposite ends of the clamp by the 5322. After the jig 3 is fixed to the jig fixing unit, the rotating unit is operated to rotate the jig 31 旋转 by 180 degrees. For example, the clamp 3100 is rotated by 180 degrees by the rotating unit 5400, and the clamp 3 is turned to the reverse direction. The scale is ejected from the cleaning sheet mounted on the side of the jig fixing unit to remove the impurities leaking from the jig 3. After passing through the rotary element_clamp__, the cutting unit 69 200834785 picks up the handle to move over the clamp 31〇〇, and grips the clamp 3 to touch. Subsequently, through the telekinetic element 5330, the first fixing element 5310 and the second fixing element 532 are moved away from the clamp 3100, whereby the first bearing shaft 5312 and the second branch shaft are separated from the clamp 3100' and the cutting unit pickup 5〇8〇捡The clamp 31〇〇. After the cutting unit pickup 5_ picks up the jig 3100, the cutting unit pickup 5080 moves along the cutting unit pickup transfer line 5〇9〇 to the upper of the chuck table 5〇4〇, and then places the jig 3100 on the upper portion of the chuck table 5040. . The chuck table on which the jig 3100 is placed is moved to a cutting blade, and the other side of the semiconductor package sp is cut through the cutter 5020. The jig of the semiconductor package sp to which the cutting process has been completed will be subjected to the same processing as the above processing. </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; Patent Protection of the Invention This application is intended to cover the scales defined by the company. For example, although as described above, the semiconductor package manufacturing system of the present invention is configured such that the first pusher assembly slides in close proximity to the erecting of the fixture: element 364' but the present invention can also be constructed as follows 'The vertical member 364 is adjacent to the first advancement assembly. "As shown in Figure 21A", "21B", "21C" and "Plus", the 'fixture holder 376 may not be hinged to the vertical keying element 200834785 374, but may be rotated And slidingly connected to the vertical chain link element 374. Further, as shown in "21A", "21B", "2ic" and "21D", the first advancing portion 398 and the second advancing portion 402 can be constructed in a three-layer structure. Of course, when the first advancing portion 398 and the second advancing portion 402 are constructed in a three-layer structure, the abutting block 392 can be constructed in a three-layer structure. Further, as shown in Fig. 22, the position 'transformation means of the first embodiment described above can be constructed such that the - position changing means 520 is located above a chuck table transmission line 5〇6. Further, in the position changing device of the first embodiment described above, only the position converting means 520 may be provided, and the position changing means 52'' can be moved up or down along a guide bar G. Also, a rotation element can be configured for rotating a fixture fixing unit 530'. This rotating element can be a motor.

特別地,當放置有夾具310’之卡盤台5〇4,沿著卡盤台傳輸線 5〇6移動時,卡盤台504’係位於位置變換裝置52〇,下方。位置變 ⑩換裝置520,撿起夾具310,,並且然後沿著導桿G上升。在位置變 換衣置520之旋轉單兀54〇,旋轉之後M立置變換裝置52〇,係沿著 . 導桿G下降,然後將夾具31〇,置於卡盤台5〇4,上。A ^ 同日守,如「第1圖」顯示,根據切割刃502之方向性,需要 對即將嵌入夾具310之狹缝314中的半導體封裝sp建立方向性。 依肤第1圖」之結構,透過設計傳輸單元撿拾器、2〇4能夠旋轉, 則獲件方向性。然而,在半導體封裳证嵌入狹缝314之前,可以 獲得這樣的方向性。因此,如「第16圖」顯示,固定單元檢拾器 71 200834785 322可以構造為可旋轉’以獲得即將嵌入夾具310之狹缝314中之 半導體封裝SP之方向性。 並且’如「第17圖」顯示,支座塊392之定位部观可以構 ,為能夠旋轉。當支座塊392之定位部394旋轉時,則維持即將 後入^具31〇之狹縫314之料體封裳W之方向性。由此,呈現 與「第1圖」之結構相同的效果。Specifically, when the chuck table 5〇4 on which the jig 310' is placed is moved along the chuck table transfer line 5〇6, the chuck table 504' is located below the position changing device 52A. The position change device 520, picks up the jig 310, and then rises along the guide bar G. At the position of the rotary unit 520 of the garment 520, after the rotation, the M vertical shifting device 52 is lowered along the guide rod G, and then the clamp 31 is placed on the chuck table 5〇4. A ^ Same day, as shown in Fig. 1, according to the directivity of the cutting edge 502, it is necessary to establish directivity to the semiconductor package sp to be embedded in the slit 314 of the jig 310. According to the structure of the first image of the skin, by designing the transfer unit pickup, 2〇4 can be rotated, the orientation is obtained. However, such directionality can be obtained before the semiconductor package is embedded in the slit 314. Therefore, as shown in Fig. 16, the fixed unit pickup 71 200834785 322 can be configured to be rotatable to obtain the directivity of the semiconductor package SP to be embedded in the slit 314 of the jig 310. Further, as shown in Fig. 17, the positioning portion of the holder block 392 can be configured to be rotatable. When the positioning portion 394 of the holder block 392 is rotated, the directivity of the material body W of the slit 314 which is to be inserted into the holder 31 is maintained. Thereby, the same effect as the structure of "Fig. 1" is exhibited.

此外,在「第18A圖」、「第18B圖」及「第18C圖」中,可 =中間台规為可旋轉。如「第18A圖」顯示,在透過傳輪 早‘拾益將定位於中間台3〇2之半導體封裳sp中,第一 位於中間台3〇2上之後,然後中間台, 又’ h體封裝SP如「第圖」顯示排列。如「第耽 ==單:撿拾咖^ 之4半導體封裝SP如「第18c圖顯示 此,維持位於中間㈣2上之轉體封裝sp之方向性。 透過上文贿賴得知,整麵理顧係自減行,因此依 明之半導體封裝製造系統及其製造方法,半導體封裳¥造 以^少。目此,树料有大域少製絲本及時間 【圖式簡單說明】 第 第 1圖為本發明尤半導體 2Α圖、第2Β圖、第 封裝製造系統之結構示意圖; C圖以及苐2D圖為顯示組成第 72 200834785 圖之托盤撿拾n之賴及_之正姻及側視圖; 第3A圖及第3B圖爲上μ, ^ 〜、、、/、、、且成弟1圖之傳輸單元之傳輸單元 檢拾器結構之透視圖及剖视圖; 疋早元之結構及操 第4Α圖與第4Β圖為顯示組成第i圖之固 作之侧視圖及正視圖; 第5A圖、第5B圖、第5C圖以及第5D圖為顯示組成第工 作之侧視圖;In addition, in "18A", "18B" and "18C", the intermediate table can be rotated. For example, "Picture 18A" shows that in the semiconductor seals sp that will be positioned in the middle table 3〇2 through the transfer wheel, the first is located on the intermediate stage 3〇2, then the middle stage, and then the 'h body The package SP is arranged as shown in the "figure". For example, "Dimensional == Single: Pick up the coffee ^ 4 semiconductor package SP as shown in Figure 18c, maintain the directionality of the swivel package sp located in the middle (four) 2. Through the above bribes, the whole face Since the semiconductor package manufacturing system and its manufacturing method, the semiconductor package is made in a small amount. Therefore, the tree material has a large area and a small amount of silk and time [simple description of the figure] The first picture is The schematic diagram of the structure of the second semiconductor, the second diagram, and the package manufacturing system of the present invention; the C diagram and the 苐2D diagram show the arrangement of the trays that constitute the 72 200834785 map and the side view and the side view; And FIG. 3B is a perspective view and a cross-sectional view of the transmission unit pickup structure of the transmission unit of the upper μ, ^ 〜, , , /, , and Chengdi 1 diagrams; And FIG. 4 is a side view and a front view showing the solidification of the composition of the i-th diagram; FIGS. 5A, 5B, 5C, and 5D are side views showing the first work;

第6Α圖與S 6Β圖為顯示組成帛1圖之封裝固定單元之第一 推動組件及第二推動組件之結構正視圖及侧視圖; 第7Α圖、第7:6圖、第7(::圖、第71)圖以及第7]£圖為顯示 組成第1圖之封裝固定單元之結構及操作之正視圖; 第8圖為組成第5圖之支座塊之結構透視圖; 第9Α圖與第9Β圖為顯示組成第Ί圖之位置變換裝置之操作 之正視圖, 第10圖為顯示一臨時固定結構之分解透視圖,其中在臨時固 定結構中一夾具係臨時固定至第9圖之位置變換裝置上; 第11Α圖、第11Β圖、第11C圖、第i1D圖以及第11Ε圖為 顯示組成第1圖之清洗單元之操作之側視圖; 第12圖為顯示自組成第1圖之第二檢查單元觀察傳輸單元撿 拾器之狀態示意圖; 第13圖為本發明另一實施例之半導體封裝製造系統之結構示 73 200834785 意圖; 第14圖為本發明又_實施例之半導體封裝製造系統之結構示 意圖; 第15圖為本發明再一實施例之半導體封裝製造系統之結構示 意圖; 第16圖為本發明另一實施例之半導體封裝製造系統之結構示 意圖; 第17圖為本發明再一實施例之半導體封裝製造系統之結構示 意圖; 弟18A圖、弟18B圖以及第18C圖為本發明另一實施例之半 &amp;體封裝製造系統之封裝固定單元之操作平面圖; 第19圖為另一實施例之組成第丨圖之切割單元之平面圖; 第20A圖、第20B圖、第2〇c圖、第2〇D圖以及第2〇e圖 為顯示組成第19圖之位置變換裝置操作之側視圖; 第21A调、第21B圖、第21C圖以及第21D圖為顯示另一實 施例之組成第1圖之封裝固定單元之操作侧視圖; 第22圖為顯示再一實施例之組成第1圖之切割單元之平面 圖;以及 第23圖及第24圖為顯示組成第1圖之乾燥台及傳輸單元撿 拾器之操作平面圖。 【主要元件符號說明】 74 200834785 100 102 102a 102b 106 * 103 ^ 104 ❿ 110 112 114 116 116a 116b 116c _ 116d 118 ^ 118a ’ 118b 118c 118d 120 裝載與卸載單元 托盤_ 第一托盤 第二托盤 托盤盒 活動台 活動台傳輸線 托盤撿拾器傳輸線 托盤撿拾器 主體部 第一夾持單元 夹持斋 驅動元件 定位槽 嗜合突起 第二夾持單元 失持裔 驅動元件 定位槽 嚙合突起 轉軸 75 200834785Figure 6 and Figure 6 are front and side views showing the structure of the first pusher assembly and the second pusher assembly of the package fixing unit constituting the Figure 1; Figure 7, Figure 7:6, Figure 7 (:: Figure 71, Fig. 7 and Fig. 7 are front views showing the structure and operation of the package fixing unit constituting Fig. 1; Fig. 8 is a perspective view showing the structure of the holder block constituting Fig. 5; FIG. 10 is a front elevational view showing the operation of the position changing device constituting the second drawing, and FIG. 10 is an exploded perspective view showing a temporary fixing structure in which a jig is temporarily fixed to FIG. 9 in the temporary fixing structure. The position conversion device; the 11th, 11th, 11th, 1st, and 11th are side views showing the operation of the cleaning unit constituting the first drawing; and the 12th drawing is the self-composition of the first drawing. The second inspection unit observes the state of the transmission unit pickup; FIG. 13 is a structural diagram of the semiconductor package manufacturing system according to another embodiment of the present invention. 73 200834785 is intended; FIG. 14 is a semiconductor package manufacturing system according to another embodiment of the present invention. Schematic diagram of the structure; 15 is a schematic structural view of a semiconductor package manufacturing system according to still another embodiment of the present invention; FIG. 16 is a schematic structural view of a semiconductor package manufacturing system according to another embodiment of the present invention; and FIG. 17 is a semiconductor according to still another embodiment of the present invention; FIG. 19 is a schematic plan view of a package fixing unit of a half &amp; body package manufacturing system according to another embodiment of the present invention; FIG. 19 is another embodiment of the present invention; a plan view of the cutting unit constituting the figure; 20A, 20B, 2c, 2D, and 2D are side views showing the operation of the position changing device constituting FIG. 19; 21A, 21B, 21C, and 21D are side views showing the operation of the package fixing unit of the first embodiment, and FIG. 22 is a view showing the composition of still another embodiment. A plan view of the cutting unit; and Figs. 23 and 24 are plan views showing the operation of the drying station and the transfer unit pickup constituting Fig. 1. [Description of main component symbols] 74 200834785 100 102 102a 102b 106 * 103 ^ 104 ❿ 110 112 114 116 116a 116b 116c _ 116d 118 ^ 118a ' 118b 118c 118d 120 Loading and unloading unit tray _ First tray Second tray tray box activity Station movable table transmission line tray pickup transmission line tray pickup main body first clamping unit clamping fast driving element positioning groove fitting protrusion second clamping unit lost holding driving element positioning groove meshing projection shaft 75 200834785

122 彈性元件 124 導向桿 200 傳輸單元 202 傳輸單元撿拾器傳輸線 204 傳輸單元撿拾器 206 撿拾器組件 208 吸取元件 210 垂直移動元件 212 第一驅動元件 214 第一鏈動元件 216 小齒輪 218 齒條 209 喷嘴 222 第二驅動元件 220 旋轉元件 224 第二鏈動元件 202a 第一傳輸單元撿拾器傳輸線 202b 第二傳輸單元撿拾器傳輸線 204a 第一傳輸單元撿拾器 204b 第二傳輸單元撿拾器 222a 第一驅動元件 76 200834785 222c 第三驅動元件 228 滑輪 208a 第一吸取元件 208b 第二吸取元件 208c 第三吸取元件 ~ 208d 第四吸取元件 ¥ 208e 第五吸取元件 • 208f 第六吸取元件 2〇8g 第七吸取元件 208h 第八吸取元件 300 封裝固定單元 302 中間台 304 中間台傳輸線 310 夾具 ® 310, 夾具 3100 夾具 ^ 314 狹缝 ’ 336 蠢條 320 固定單元撿拾器傳輸線 322 固定單元撿拾器 382 夾具定位孔 77 200834785 SP 半導體封裝 338 小齒輪 328 驅動7L件 330 鏈動單元 334 導引桿 344 彈性元件 . 340 修正單元 • 342 修正桿 326 吸取元件 332 支撐桿 327 吸取噴嘴 324 撿起裝置 332a 支撐桿 332b 支撐桿 328a 驅動元件 328b 驅動元件 350 封裝固定裝置 360 主體單元 362 水平元件 364 垂直元件 370 鏈動單元 78 200834785122 elastic element 124 guide bar 200 transmission unit 202 transmission unit pickup transmission line 204 transmission unit pickup 206 pickup assembly 208 suction element 210 vertical movement element 212 first drive element 214 first chain element 216 pinion 218 rack 209 nozzle 222 second driving element 220 rotating element 224 second chain moving element 202a first transmission unit pickup transmission line 202b second transmission unit pickup transmission line 204a first transmission unit pickup 204b second transmission unit pickup 222a first driving element 76 200834785 222c third drive element 228 pulley 208a first suction element 208b second suction element 208c third suction element ~ 208d fourth suction element ¥ 208e fifth suction element 208f sixth suction element 2 〇 8g seventh suction element 208h Eight suction element 300 Package fixing unit 302 Intermediate stage 304 Intermediate stage transmission line 310 Fixture® 310, Fixture 3100 Fixture ^ 314 Slit '336 Stupid strip 320 Fixed unit Pickup transfer line 322 Fixed unit Pickup 382 Fixture locating hole 77 200834785 SP semiconductor package 338 pinion 328 drive 7L piece 330 chain unit 334 guide rod 344 elastic element. 340 correction unit • 342 correction rod 326 suction element 332 support rod 327 suction nozzle 324 pick-up device 332a support rod 332b support rod 328a drive Element 328b Drive Element 350 Package Fixing Device 360 Body Unit 362 Horizontal Element 364 Vertical Element 370 Chain Unit 78 200834785

372 水平鏈動元件 373 侧壁 374 垂直鏈動元件 376 夾具保持器 378 導引槽 380 旋轉轴 384 夾具保持器固定單元 385 主體 386 凹槽 387 彈性元件 388 突起 389 嚙合槽 390 第一推進組件 391 底座 395 第一推進單元 397 第一推進部 397a 推進刃 397b 推進刃導桿 397c 支撐導桿 398a 第一滑輪 398b 第二滑輪 79 200834785 398c 傳送帶 398d 固定導引裝置 398 第一推進部 393 主體部 394 定位部 394a 第一定位部 394b 第二定位部 396 氣孔 392 支座塊 399 感測單元 399a 彈性元件 399b 感測器 399c 導引桿 395a 1-1推進單元 395b 1-2推進單元 400 第二推進組件 401a 2-1推進單元 401b 2-2推進單元 402 推進部 402a 推進刃 402b 推進刃導桿 200834785 402c 403 403a 403b 403c ^ 403d ^ 404 • 404a 404b 500 502 502, 5020 504 • 504, 5040 • 506 ^ 506, 5060 508 5080 支撐導桿 驅動單元 第一滑輪 第二滑輪 傳送帶 固定導桿 感測單元 彈性元件 感測器 切割單元 切割刃 切割刃 切割刃 卡盤台 卡盤台 卡盤台 卡盤台傳輸線 卡盤台傳輸線 卡盤台傳輸線 切割單元撿拾器 切割單元撿拾器 81 200834785372 Horizontal chain element 373 Side wall 374 Vertical chain element 376 Clamp holder 378 Guide groove 380 Rotary shaft 384 Clamp holder fixing unit 385 Body 386 Groove 387 Elastic element 388 Protrusion 389 Engagement groove 390 First propulsion assembly 391 Base 395 first propulsion unit 397 first propulsion unit 397a propulsion blade 397b propulsion blade guide rod 397c support guide rod 398a first pulley 398b second pulley 79 200834785 398c conveyor belt 398d fixed guiding device 398 first propulsion portion 393 main body portion 394 positioning portion 394a First positioning portion 394b Second positioning portion 396 Air hole 392 Bearing block 399 Sensing unit 399a Elastic element 399b Sensor 399c Guide rod 395a 1-1 Propulsion unit 395b 1-2 Propulsion unit 400 Second propulsion unit 401a 2 -1 propulsion unit 401b 2-2 propulsion unit 402 propulsion portion 402a propulsion blade 402b propulsion blade guide 200834785 402c 403 403a 403b 403c ^ 403d ^ 404 • 404a 404b 500 502 502, 5020 504 • 504, 5040 • 506 ^ 506, 5060 508 5080 support guide drive unit first pulley second pulley conveyor fixed guide A sensor sensing unit elastic member cutting unit cutting edge of the cutting edge of the cutting edge chuck table chuck table chuck table chuck table chuck table of the transmission line of the transmission line of the transmission line chuck table cutting unit cutting unit pickup pickup 81,200,834,785

509 切割單元撿拾器傳輸線 5090 切割單元撿拾器傳輸線 520 位置變換裝置 520, 位置變換裝置 5200 位置變換裝置 5300 夾具固定單元 530, 夾具固定單元 5310 第一固定元件 5312 第一支撐轴 5320 第二固定元件 5322 第二支撐軸 5330 移動元件 5400 旋轉單元 540, 旋轉單元 55⑽ 清洗單元 530 夾具固定單元 531 夾具定位空間 532 框架 533 臨時固定元件 533a 响合突起 533b 彈簧 82 200834785 534 536 537 538 540 • 542 ’ 544 • 546 548 550 552 554 556 600 _ 610 612 • 614 ^ 616 618 620 固定單元 固定狹缝 固定元件 移動元件 旋轉單元 驅動兀件 鏈動單元 齒條 小齒輪 移動單元 傳送帶 傳送帶固定元件 滑輪 清洗與乾燥單元 第一清洗單元 清洗容器 清洗空間 清洗台 清洗台搬運單元 馬達 第一滑輪 83 622 200834785 624 第二滑輪 626 傳送帶 654 刷子 652 650 670 660 634 632 噴嘴 第二清洗早元 乾燥台 單元撿拾器 第三喷嘴 第二喷嘴 630 刷子509 cutting unit pickup transfer line 5090 cutting unit pickup transfer line 520 position changing device 520, position changing device 5200 position changing device 5300 jig fixing unit 530, jig fixing unit 5310 first fixing member 5312 first support shaft 5320 second fixing member 5322 Second support shaft 5330 moving element 5400 rotation unit 540, rotation unit 55 (10) cleaning unit 530 clamp fixing unit 531 clamp positioning space 532 frame 533 temporary fixing member 533a ringing protrusion 533b spring 82 200834785 534 536 537 538 540 • 542 ' 544 • 546 548 550 552 554 556 600 _ 610 612 • 614 ^ 616 618 620 Fixing unit fixing slit fixing element moving element rotating unit driving element chain moving unit rack pinion moving unit conveyor belt conveyor belt fixing element pulley cleaning and drying unit first cleaning Unit cleaning container cleaning space cleaning station cleaning station handling unit motor first pulley 83 622 200834785 624 second pulley 626 conveyor belt 654 brush 652 650 670 660 634 632 nozzle second cleaning early drying table Unit picker third nozzle second nozzle 630 brush

628 672 662 700 710 720 722 730 740 G 第一喷嘴 乾燥台傳輸線 單元撿拾器傳輸線 檢查單元 第一檢查單元 第二檢查單元 接墊 第三檢查單元 第四檢查單元 導桿 84628 672 662 700 710 720 722 730 740 G First nozzle Drying station transfer line Unit pickup transfer line Inspection unit First inspection unit Second inspection unit Pads Third inspection unit Fourth inspection unit Guide 84

Claims (1)

200834785 十、申請專利範圍·· 1· 一種半導體封裝之製造系統,包含有: 一裝載與卸載單元,係用於裝載半導體封裝; :封裝固定單元,係用於固定_輯與卸载單元 該半導體封歧-夾具’以致於洲辭導體封裝; 一切割單元,翻於切姻定至做具之辭導體封裳; 一弟-清洗單元,伽於清洗由該糊單元蝴之該半導 體封裝之一側面,例如頂部或底部;以及 、 -第二清洗單元,用於清洗該半_封裝之另—側面 2. 如申請專利範圍第i項所述之製造系統,更包含一傳輸單元, =用於傳輸由該裝載與卸載單元裝載之該半導體封二二 裝固定單元。 3. =請專利範圍第i項或第2項所述之製造系統,更包含—乾 餘早7L ’侧於乾燥由鄕—清洗單元及該第二清洗單元 之該半導體封裝。 九 4. 如申請專利範圍第i項所述之製造系統,其中該切割單元包人 一位置變換裝置,以用於轉換該夾具為顛倒方向。 3 5. 如申請專利範圍第1項所述之製造系統,更包含一檢查單元, 係用於檢查該已切割半導體封裝是否有缺陷。 一早70, 6. 如=請專利範圍第!項所述之製造系統,其中該封裝固定單元 包含. 並 主體單元,係具有祕容賊失具之—从保持器, 85 200834785 包含-水平元件及-垂直元件,該水平元件係構成該主體單元 底部,該垂直元件係垂直該水平元件;· -第-推進組件,侧於嵌人該轉體封裝於該夹且中, 該第-推進組件可沿X軸方向及γ輛方向於該水平元件上水 平移動; 一第二推進組件,係對應該第一推進 θ 雅逆、、且件叹置,以用於從 該夾具上移除該半導體封裝;以及 -鏈動單元’係祕移動該纽保魅,_辭導體封 裝能夠容易地嵌入並固定於該夾具中。 ' 如申請專利翻第6項所述之製造系統,射該第—推進 包含: ' Τ 一主體部,係形成該第一推進組件之主體; -支座塊,係配置於該主體部頂端,進而該半導體封農位 於該支座塊頂端;以及 一一第-推進單元,係以相同於該支座塊上之半導體封裝的 兩度水平義’則丨軸轉體職至該轉之狹缝中。 如申請專利範圍第6項所述之製造系統,其中該第二推進組件 包含: -主體部,伽彡成該第二推軌件之主體;以及 -第二推進單元’可沿著該主體部水平移動,進而從該夹 具之狹缝上移除該半導體封裝。 86 200834785 9, -種半導體封裝之製造方法’包含以下步驟: 裝載半導體封裝至一製造系統; 固定該已裝載半導體封裝至一失具· 切割固定至該夾具之該半導體封裝;以及 仗該製造糸統上卸載該半導體封裝。 1〇·如申請專_圍第9項所述之製造方法,更包含清洗 已切割半導體封裝之步驟。 ^200834785 X. Patent Application Scope 1. A manufacturing system for a semiconductor package, comprising: a loading and unloading unit for loading a semiconductor package; and a package fixing unit for fixing and unloading the semiconductor package The disambiguation-clamping is so that the engraving conductor is packaged; a cutting unit is turned over to the inscription and the conductor is sealed; a younger-cleaning unit is glazed to clean one side of the semiconductor package from the paste unit , for example, a top or a bottom; and, a second cleaning unit for cleaning the other side of the half-package. 2. The manufacturing system of claim i, further comprising a transmission unit, = for transmission The semiconductor package is mounted by the loading and unloading unit. 3. The manufacturing system described in item i or item 2 of the patent scope further comprises - drying the remaining 7L side of the semiconductor package for drying the cleaning unit and the second cleaning unit. 9. The manufacturing system of claim i, wherein the cutting unit includes a position changing device for converting the jig to a reverse direction. 3. The manufacturing system of claim 1, further comprising an inspection unit for checking whether the cut semiconductor package is defective. Early 70, 6. If = please patent scope! The manufacturing system of the present invention, wherein the package fixing unit comprises: and the main unit has a secret thief missing - the retainer, 85 200834785 comprises - a horizontal element and a vertical element, the horizontal element constitutes the main unit a bottom member, the vertical member is perpendicular to the horizontal member; a first-pushing assembly, the side of the rotating body is packaged in the clip, and the first-propulsion assembly can be in the X-axis direction and the γ-direction to the horizontal member Moving up horizontally; a second propulsion assembly corresponding to the first advancement θ 雅 inverse, and the sigh of the component for removing the semiconductor package from the fixture; and the chain-linking unit The enchantment, _ _ conductor package can be easily embedded and fixed in the fixture. The manufacturing system described in claim 6 is directed to: - a body portion forming a body of the first propulsion assembly; - a support block disposed at a top end of the body portion Further, the semiconductor enclosure is located at the top of the support block; and the first and second propulsion units are the same as the two-dimensional horizontal sense of the semiconductor package on the support block. in. The manufacturing system of claim 6, wherein the second propulsion assembly comprises: - a body portion, the gem is the body of the second rail member; and - the second propulsion unit is along the body portion Moving horizontally removes the semiconductor package from the slit of the fixture. 86 200834785 9, a method of manufacturing a semiconductor package comprising the steps of: loading a semiconductor package to a manufacturing system; fixing the loaded semiconductor package to a missing device; cutting the semiconductor package fixed to the fixture; and manufacturing the package The semiconductor package is unloaded. 1〇· The application method described in the application of the ninth item further includes the step of cleaning the cut semiconductor package. ^ 11·如申請專利範圍第1〇項所述之製造方法 該已切割半導體封裝之步驟包含: 其中该清洗及乾燥 清洗該半導體封裝頂部; 清洗該半導體封裝底部;以及 乾燥該半導體封裝。11. The manufacturing method of claim 1, wherein the step of cutting the semiconductor package comprises: cleaning and drying the top of the semiconductor package; cleaning the bottom of the semiconductor package; and drying the semiconductor package. 12. 如申請專繼财9項至f u項任意—顿述之製造方法, 更包含檢測該已爛半導體是否有缺陷之步驟。 13. 如申請專纖_ 12項所叙製造麵,更包含侧及修正 該已切割半導體封裝之偏離程度之步驟。 8712. If you apply for the special manufacturing method from item 9 to item f--the manufacturing method, it also includes the steps to detect whether the defective semiconductor is defective. 13. If you apply for the manufactured side of the special fiber _ 12, it also includes the side and the steps to correct the degree of deviation of the cut semiconductor package. 87
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