TWI358337B - Method and device of continuously wire-bonding bet - Google Patents

Method and device of continuously wire-bonding bet Download PDF

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Publication number
TWI358337B
TWI358337B TW098108999A TW98108999A TWI358337B TW I358337 B TWI358337 B TW I358337B TW 098108999 A TW098108999 A TW 098108999A TW 98108999 A TW98108999 A TW 98108999A TW I358337 B TWI358337 B TW I358337B
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TW
Taiwan
Prior art keywords
wire
bonding
solder
solder joint
joint
Prior art date
Application number
TW098108999A
Other languages
English (en)
Other versions
TW201034780A (en
Inventor
Yen Sheng Chou
Original Assignee
Powertech Technology Inc
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Publication date
Application filed by Powertech Technology Inc filed Critical Powertech Technology Inc
Priority to TW098108999A priority Critical patent/TWI358337B/zh
Publication of TW201034780A publication Critical patent/TW201034780A/zh
Application granted granted Critical
Publication of TWI358337B publication Critical patent/TWI358337B/zh

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    • H01L2225/06562Geometry of the stack, e.g. form of the devices, geometry to facilitate stacking at least one device in the stack being rotated or offset

Description

1358337 六、發明說明: 【發明所屬之技術領域】 本發明係有關於半導體裝置之製造技術,特別係有關 於一種多焊點之間不截斷之連續打線方法與結構。 【先前技術】 近年來為了敗•達到電子產品輕薄短小的要求,半導 體的後段製程都在進行三度空間(Three Dimensi〇n ; 3d) 的封裝,以期利用最少的面積來達到較高的密度或是記 憶體的容量等。現階段已發展出使用晶片堆疊 stacked)的方式來達成三度空間的封裝。 在一種習知的多晶片封裝技術中,可將複數個晶片相 互堆疊並設置於一晶片載體上,晶片上的焊墊不可被覆 蛊或阻礙,然後使用打線的製程(wire bonding process) 來使複數個晶片中相同訊號的焊墊電性連接至晶片載體 之同一接指,即具備多焊點之間串連之型態。打線形成 之焊線的電性連接品質與結構強度是非常重要的,這決 定了電子封裝產品之可靠度與運作效能。而目前的串連 方式是以多段式形成之焊線在同一焊墊上鍵合。在焊線 與焊線之間相接的鍵合界面若產生剝離(peeling)便會有 電性斷路問題,若避免剝離一昧地增加同一焊墊上打線 壓焊的次數與強度,越容易在焊墊表面造成損傷。 如第1圖所示,為習知一種多晶片打線結構之截面示 意圖。該多晶片打線結構1 〇〇係包含一第一晶片i 〇、複 數個第二晶片20、一第一焊線12〇、複數個第二焊線 1358337 以及一晶片載體30。該晶片載體30係可為一印刷電路 板之類基板或一導線架(或稱引線框架該第一晶片ι〇 與該些第二晶片20係為半導體材質並可以堆疊方式設 置於該晶片載體30上。該第一銲線ι2〇與該些第二焊線 1 3 0係以打線方式形成,用以分別電性連接該第一晶片 10至該些第二晶片20以及該些第二晶片2〇之間或至該 該晶片載體3 0。 φ 該第一晶片1 〇之主動面上係具有至少一焊墊,以做 為一第一焊點111,該些第二晶片20主動面上係各具有 至少一焊墊21,在每一焊墊21上預先以打線工具(或可 稱瓷嘴,capillary)以放電燒球(electrical spark)形成一結 線凸塊(stud bump)做為一第二焊點112,即第一次壓焊 在對應焊墊21上。之後,以打線方式形成該第一焊線 • 120,其一端壓焊在該第一焊點m(即該第一晶片之 - 焊墊)並拉線由該第一焊線12〇延伸至該第二焊點112, 鲁 並使該第一焊線120之另一端壓焊在該焊墊21上之第二 焊點11 2,再切斷焊線。此時,該第一焊線」2〇之一球 — 接合端12 1係接合在該第一焊點i丨丨,該第一焊線i 2〇 之一線尾端1 22係接合在該第二焊點i丨2,即第二次壓 焊在對應焊墊21上。 接著’再打線形成至少一第二焊線130,在兩個第二 曰曰片20之間各形成有一球接合端131與一線尾端132, 第二焊線130之球接合端131係鍵合至該第一焊線12〇 之該線尾端122 ’並往更下方第二晶片2〇之該第二焊點 1358337 112 拉線(looping),再第_ 乐一:tf線130之線尾端132鍵合 至下方第二晶片20之該第 矛一知點112。依晶片堆疊數目 重覆以上打線方式,直到县1以够 直到最後的第二焊線13〇之一線尾 端132連接到該晶片載體 風體3〇之接指(即第三焊點113), 而使該第一晶片10、該此楚— 二第一日日片20與該晶片載體3〇 達成多段焊線之電性串連。 干迓。如第2圖之放大圖所示,於 上述的習知打線方式中,^ 八1P,位於其中一焊墊21之部位,要 先使例如結線凸塊之第-悝 〜乐一焊點112接合在該焊墊21,此 為第-次料。該第—焊線12G之該線尾# 122接合在 第二焊點112’此為第二次壓焊。該第二焊線13〇之一 球接合端⑶係壓焊在該第一焊線12〇之該線尾端122 與第二焊‘點112’此為第三次壓焊。因此,該焊墊。係 經過三:欠的打線壓焊次數,丨其是在第三次壓焊仍需要 有足夠的壓焊力’否則一旦在上方的該第二焊線13〇之 球接合端131產生剝離,便會造成整個串連的電性斷 路,但這卻會造成該焊墊21之表面容易產生損傷 (damage),導致產品良率降低,影響電子封裝產品 丘· ifr 」 罪又。此外,在以多段焊線串連的多焊點之間,其連接 之電性路徑會經過焊線尾頭壓焊形成之鍵合界面,當串 連的烊點數量越多,電流需要通過的鍵合界面也越多, 容易有訊號衰竭或延遲的現象。 【發明内容】 為了解決上述之問題’本發明之主要目的係在於提供 一種多焊點之間不截斷之連續打線方法與結構,可有效 5 Ϊ358337 ^同時地解決㈣知多段焊線串連所受到的打線衝擊而 t焊塾表面羞生損傷與在習知分段焊_鍵合界面產生 剥離而引起電性斷路之問題。 本發明之次一目的係在於提供_ ^ ^ _ 捉供種多焊點之間不截 斷之連續打線方法與結構,可婵 s加連接在多烊點之間焊 線之黏著力與穩定度。 斷 電 或 本發/之再目的係在於提供一種多焊點之間不截 之連續打線方法與結構,即使串連的焊點數量越多, 流需要通過的鍵合界面卻不會辦& 丨个f增加,能減少訊號衰竭 延遲的現象。 本發明之再-目的係在於提供一種多焊點之間不截 斷之連續打線方法與結構,能達到在中間串連之焊點防 止斷線之緩衝功效。
I 以下技術方 本發明的目的及解決其技術問題是採用
案來實現的。本發明揭示—種多焊點之間不截斷之連續 打線方法,主要包含以下步驟:首先,提供一第一焊點、 至少-第二焊點以及一第三焊點。接著,打線形成一焊 線,該焊線係依序具有一球接合端、—第一線段、至少 一返折線部、一第二線段以及一線尾端,該球接合端係 接合至該第一焊點,該線尾端係接合至該第三焊點/該 第一線段係形成於該第一焊點與該第二焊點之間,以一 體連接該球接合端與該返折線部,該返折線部係具有一 第一線壓焊點與一第二線壓焊點,該第一線壓焊點係接 合至該第二焊點,該第二線壓焊點係接合至第一線壓焊 6 1358337 ,該 點 間, 第二線段係形成於該第二焊點與該第三焊點之 …以一體連接該返折線部與該線尾端。本發明還揭示 由前述方法形成之多焊點之間不截斷之連續打線結構= 本發明的目的及解決其技術問題還可採用以;術 措施進一步實現。 在前述的連續打線方法中,該第二焊點係可為一凸 塊。 在前述的連續打線方法中’該凸塊係可為一結 並接合於中間堆疊晶片之焊墊上。 在前述的連續打、線方法中,該第一焊 上之焊塾,而該第三焊點係可為-晶片載體上之接:片 在前述的連續打線方法中’該第一焊點係可為―: 载體上之接指,而該第三焊點係可為一晶: 塊。 π玄上之凸 述的連續打線方法中,該返折線部心具有1 _=前述的連續打線方法中,該緩衝線弧㈣心㈣ (2。前述的連續打線方法中,該焊線之材f係可包含金 在前述的連續打線方法中,該返折線部係另 -線壓焊點’其係接合至在第—線壓焊 结之間的線段。 由以上技術方案可以看出,本發明之多 線壓 焊點之間不 戴 1358337 斷之連續打線方法與結構,具有 — 旁M下優點與功效- 、利用多焊點之間不截斷之連 —姑你主讲打線技術作為其中之 技術手段,可有效提高打線 衣径之工作敎遙,4f 郎省焊線燒結成球接合端之曰 ,, 用置。此外,由於煜 線為不戴斷的連續串連多個炫 、 π A 坪點’在中間焊點上的 返折線部的第二線壓焊點即 α 使斷裂也不會影響電性 '-質,故能有效且同時地解決 一 野成因習知多段焊線串連 所受到的打線衝擊而在焊墊 外势表面產生損傷與在習知 为段焊線間鍵合界面產生剝
到離而引起電性斷路之問 題。 J 二、利用焊線之線段彎折形 為其中之一技術手段, 黏著力與穩定度。 成在中間焊點上返折線部作 可增加焊線在中間焊點上之 利用-焊線串連多個焊點並以線段f折方式在中間
焊點上形成返折線部作為其中之一技術手段即使 串連的焊點數量越多’電流f要通過的焊線與焊線 間鍵合界面卻不會增加,故能減少訊號衰竭或延遲 的現象。 四、利用一焊線串連多個焊點並以線段彎折方式在中間 焊點上形成返折線部作為其中之一技術手段,返折 線部之第二線壓焊點可作為預斷緩衝作用,即使斷 開也不會影響電性連接品質,能達到在中間串連之 焊點防止斷線之緩衝功效。 【實施方式】 8 Γ358337
以下將配合所附圖示詳細說明本發明之實施例,秋應 注意的是’該些圖示均為簡化之示意圖,僅以示意方法 來說明本發明之基本架構或實施方法,故僅顯示盘本案 有關之元件與组合關係,圖中所顯示之元件並非以實際 實施之數目、形狀、尺寸做等比例繪製,某些尺寸比例 與其他相關尺寸比例或已誇張或是簡化處理,以提供更 清楚的描述。實際實施之數目、形狀及尺寸比例為一種 選置性之設計’詳細之元件佈局可能更為複雜。 依據本發明之第-具體實施例,一種多焊點之間不截 斷之連續打線方法舉例說明於第3八至31圖之製程中元 件之截面示意圖。其中’冑用前述方法形成的多焊點之 間不截斷之連續打線結構可見於第31圖。本發明之多焊 點之間不截斷之連續打線方法包含以下步驟:首先,如 第3A至3F圖所示,提供一第一焊點211、至少一第二 知點2 12以及-第二焊點2】3。在本實施例中,該第一 焊點211係可為一最上層晶片(即第一晶片4〇)之焊墊(如 第3A圖所示),該焊墊之材質可包含鋁或銅等金屬。而 該第三焊點2 13係可為一晶片載體6〇上之接指,以提供 正打打線連接之實施例說明。如第至3E圖所示,該 第二焊點212係可為凸塊,例如由打線形成之球接合端 並經旋即截斷之結線凸塊(stud bump),凸塊的硬度可小 於焊整並成與焊線中非球接合端之部位(如中間線段之 線壓焊點或線尾端)建立出非平面接合的鍵合界面,故能 以增加焊線之接合強度與面積。在本實施例中,例如結 1358337 線凸塊之該第二焊點2 1 2係可接合於中間堆疊晶片(第 二晶片50)之焊墊51上。 如第3A圖所示,該第一晶片40與該些第二晶片50 係堆疊在該晶片載體6〇之上,其中該第一晶片40位於 最上層’該些第二晶片5〇係疊設於該第一晶片40與該 晶片載體60之間’該第二晶片50之數量係可增加並往 上堆疊,以達到較高之容量或達到較多之功能應用。更 φ 具體地’該第一晶片40與該些第二晶片50之主動面係 朝上並以階梯狀交錯排列,以使該第二晶片5 0之焊塾 51露出,故可完全黏晶堆疊作業之後在一次進行多焊點 之間不截斷之連續打線作業。該晶片載體60係可為一印 刷電路板、一導線架(L/F)、一電路薄膜或各種晶片載 體。此外,可利用已知黏晶材料,例如雙面黏性膠帶、 B階黏膠(B-stage adhesive)或是晶片貼附物質(Die Attach Material,DAM),以黏貼該些晶片40、50之、間與 • 黏貼最下方之該第二晶片50至該晶片載體60之上表 面。本實施例中,如第3E圖所示,該第一焊點211與該 些第二焊點2 1 2係排列在同一側向而有利於與該晶片載 體6 0之該接指(即第三焊點2 1 3)以打線方式達到電性連 接。 再如第3A圖所示,該第二焊點212係利用一打線工 具(Capillary)70通過放電燒球方式使焊線之露出端燒結 成一結線凸塊並焊接於該第二晶片5〇之焊墊5 1上。在 形成其中一第二晶片50之該第二焊點212之後,如第 10 Γ358337 3B與3C圖所示,相鄰第二晶片50之焊墊51上以打線 方式形成在-結線凸塊。如第扣與冗圖所示,.依序在 後續每一第二晶片5〇之焊墊 坪蟄51上以打線方式各形成一 結線凸塊。故每一第-曰y < λ 第一曰曰片50之焊墊51上皆設有一第 二焊點2 1 2。 接著,如第3F$ it同保·- 31圖所不,打線形成一連續串連多 焊點之焊線220,該焊線22〇係 π兩一種可彎折之金屬細
線,通常其材質係可為今,+ ()或可為銅(Cu)或銘(A1)。 該焊線220可不分段地串連多顆 甲迷夕顆日日片40、50至該晶片載 體6 0的訊號傳遞盥接妯/雷爲牧 呀< 〇按地/¾源路徑。該焊線22〇係依序 具有一球接合端22卜一第一線段222、至少一返折線部 223、一第二線段224以及一線尾端225(如第3h圖所 示)。在本實施例中,該焊線220係可為正向打線(f〇rward bonding)形成,此乃為由晶片至基板的打線操作。即在 打線接合時’該球接合端22 1係接合於晶片上焊墊,該 線尾端225(或稱尾鍵合端或訂备式接合端,stitch bond) 係接合於該晶片載體上接指。 如第3G圖所示,該球接合端221係接合至該第一焊 點211,該第一線段222係形成於該第一焊點211與該 第二焊點212之間,以一體連接該球接合端221與該返 折線部223。接著,以打線工具70牽引該焊線220不截 斷地往下接合相鄰該些第二晶片50上之結線凸塊(即其 中一第二焊點212)。並在該第二焊點212(即結線凸塊) 上係形成出一返折線部223,其係依照打線工具特定的 1358337
點212上形成—返折線部223以及在該些第二 丨以及在該些第二晶片5〇 並再最後操作的第二焊點 再使該線尾端225接合到 之間可拉出一中間線段229。 212上’拉出該第二線段224, 鲁該第三焊點213,以完成本發明之多焊點之間不截斷之 連續打線結構200(如第31圖所示),而使該第一晶片4〇 與該些第二晶片50可電性連接至該晶片載體6〇。 如第4A圖所示,該返折線部223係具有一第—線壓 焊點226與一第二線壓焊點227,該第—線壓焊點 係接合至该第二焊點212,該第二線壓焊點227係接合 至第一線壓烊點226 ^該返折線部223可為s形曲折並 封閉之。較佳地,另可具有一第三線壓焊點227A,接合 •至在第一線壓焊點226與第二線壓焊點227之間的線 段,以使該返折線部223為扁平狀。此外,一中間線段 229係一體連接該返折線部223並由該第二線壓焊點227 往其它第二焊點2 1 2延伸。該返折線部223可增加該焊 線220之黏著力與穩定度,並提供作為防止線拉斷之緩 衝線段。具體而言,該返折線部223係可具有一緩衝線 孤228,該緩衝線弧228係位在該返折線部223之最高 點。如第31與4A圖所示,該緩衝線弧228係可朝向該 第一焊點211,以使後續的線段(如中間線段229或該第 12 1358337 一線段224)方便往相鄰第一焊點212或該第三焊點213 拉伸。該第二線段224係形成於該第二焊點212斑該第 二焊點213之間’以一體連接該返折線部223與該線尾 端 225。
在其他變化例中’如第4B圖所示,該返折線部223 係可為往該第一線段222做單一次往復彎折之後再壓焊 形成該第一線壓焊點227’故該返折線部223之形成係 朝向該第一線段222,可藉以壓低該第一線段222之弧 高。之後,適當回復伸直後再往其它相鄰該第二焊點2 i 2 延伸,故該返折線部223可為往上突起的u形曲折並為 封閉狀或者,如第4C圖所示,該返折線部223係可 為往該第二線段224做單一次隹復彎折之後,再壓焊形 成該第二線壓焊點227在該第一線壓焊點226上。之後 適當回復伸直後再往相鄰的第二焊點212或該第三焊點 213延伸。以上實施例,皆是利用該打線工具70在第二 焊點2 1 2上做出特定形狀線弧的返折線部⑵,以增加 該焊線220之黏著力與穩定性。 因此,可有效提高打線製程之工作效率,並節省習知 焊線相接需要燒結成球接合端之使用量。此外,由 於該焊線22G係為不截斷的連續串連多個焊點211、212 與213’在中間的第二 知點212上的返折線部223的第
一線壓焊點2 2 7即伸齡 gg L p使斷裂也不會影響電性品質。該 220係一體串連多個焊點 夕徊坏點,在中間的第二焊點212上 以省略一次球接合娘蔽 I焊次數。故能有效且同時地解 13 1358337 決因%知^&焊、線串連所受到的打線衝擊而*焊塾之表 面產生損傷u及在習知分段焊線間鍵合界面產生剝離而 引起電性斷路之問題。 依據本發明之第二具體實施例,另-種多焊點之間不 截斷之連續打線結構說明於第5圖之截面示意圖。該多 焊點之間不戴斷之連續打線結構300包含一第一焊點 211、至少一第二焊點212、一第三焊點213以及打線形 成串連該些焊點211、212肖213之焊線220。其中與第 一實施例相同的主要元件將以相同符號標示,並具有上 述之相同作用,在此不再予以贅述。該焊線22〇之形成 方法亦如同第一實施例所述技術相同。 在此實施例中,該焊線22〇係可為逆向打線(revere bonding)形成。該第一焊點211係可為—晶片載體“上 之接指,而該第三焊點213係可為設置在第一晶片4〇 之焊墊上的凸塊。而該第二焊點212係為凸塊,其係設 置在中間堆疊第二晶片50之焊墊51上。該焊線22〇之 該球接合^& 221係以球接合方式焊接在第一焊點Μ〗(該 晶片載體60之接指)’該返折線部223係設置於該第二 焊點212上,該焊線220之線尾端225係以壓印接合方 式焊接在該第二:tp點213(該第一晶片40之焊塾上之凸 塊)。使用反向打線的模式,可有效降低該焊線22〇之線 弧高度’因此可符合低厚度封裝構造之要求。 以上所述’僅是本發明的較佳實施例而已,並非對本 發明作任何形式上的限制,雖然本發明已以較佳實施例 1358337 ’任何熟悉本項技 ’所作的任何簡單 揭露如上,然而並非用以限定本發明 術者,在不脫離本發明之技術範圍内 修改、等效性變化與修飾,均仍屬於本發明的技術範圍 内。 【圖式簡單說明】
第 1圖: 為 習知一種多晶片打線結構之截面示 意 圖 〇 第 2圖: 為 第1圖中一上方焊線之球接合端壓 焊 一 下 方 焊 線已接合於焊點之線尾端之局部 放 大 立 體 圖 0 第 3A至 31 圖:為依據本發明之第—具體實施 例 的 在 多 焊 點之間不截斷之連續打線方法中的 元 件 截 面 示 意圖。 第 4A至 4C 圖:為依據本發明之第—具體實施 例 的 多 焊 點 之間不截斷之連續打線方法中用以 繪 示 不 同 返折線部形狀變化之局部截面示意圖 〇 第 5圖: 為 依據本發明之第二具體實施例的另 一— 種 多 焊 點, 之間不截斷之連續打線方法所形成 之 結 構 之 截 面示意圖。 [ 主要元件符號說明】 10 第- .晶 片 20 第二晶片 21 焊 墊 30 晶片 載 體 40 第- •晶 片 50 第二晶片 51 焊 塾 60 晶片 載 體 1358337 100 多 晶 片 打 線 結 構 111 第 一 焊 點 112 第二 二焊 點 113 第三 :焊 點 120 第 一 焊 線 121 球接合 端 122 線尾端 130 第 二 焊 線 131 球接合 端 132 線尾端 200 連 續 打 線 結 構 211 第 一 焊 點 212 第二 二焊 點 213 第J 二焊 點 220 焊 線 221 球接合 端 222 第- -線 段 223 返 折 線部 224 第二線段 225 線尾端 226 \ 第 一 線 壓 焊 點 227 第 二 線 壓 焊 點 227A : 第- Ξ*線壓焊點 228 緩 衝 線 229 中 間 線 段 300 連 續 打 線 結 構 16

Claims (1)

  1. Γ358337 七、申請專利範圍: 1、一種多焊點之間不截斷之連續打線方法,包含以下 步驟: 提供一第一焊點、至少—第二焊點以及一第三焊 點;以及 2 打線形成一焊線’該焊線係依序具有一球接合端、 一第一線段、至少一返折線部、一第二線段以及一 線尾端’該球接合端係接合至該第一焊點,該線尾 端係接合至該第三焊點’該第一線段係形成於該第 一焊點與該第二焊點之間,以一體連接該球接合端 與該返折線部,該返折線部係具有一第一線壓焊點 與-第二線壓焊點’該第—線壓焊點係接合至該第 二焊點’該第二線壓焊點係接合至第'線壓焊點, 該第二綠段係形成於該第二焊點與該第三焊點之 間’以一體連接該返折線部與該線尾端。 , 根據申請專利範圍第1項之多焊 ° 繪+ ώ &之間不截斷之連 續打線方法,其中該第二谭點係為 戴斷之連 根據申請專利範圍第2項之多焊點 。 續打線方法,其中該凸塊係為一結=不截斷之連 中間堆疊晶片之焊墊上。 、塊並接合於 根據申請專利範圍第Μ之多焊 續打線方法,其中該第一焊點係為間不截斷之連 塾’而該第三焊點係為—晶片載體上丄片t上之焊 根據申請專利範圍第1項之多焊點1=㈣ 17 4 1358337 6 7
    9 10 續打線方法,其中該第一烊點 圩點係為一晶片載體上之 根二而該第三焊點係為—晶片烊塾上之凸塊。 續專利範圍第1項之多焊點之間不截斷之連 方法’其中該返折線部係具有一緩衝線弧。 :據申…範圍第6項之多焊點之間不截斷之連 :::方法,其中該緩衝線弧係朝向該第-焊點。 ^據申請專利範圍第1項之多焊點之間不截斷之連 續打線方法,其中該焊線之#質係包含金(Au)。 :據申請專利範圍第i項之多焊點之間不截斷之連 :曰打線方法’其中該返折線部係另具有一第三線壓 焊點纟係接合至在第一線壓焊點與第二線壓焊點 之間的線段。 、一種多焊點之間不截斷之連續打線結構,包含:一第—烊點、至少一第二焊點以及一第三焊點;以 及
    打線形成之焊線,該焊線係依序具有一球接合 端、—第一線段、至少一返折線部、一第二線段以 及—線尾端,該球接合端係接合至該第一焊點,該 線尾端係接合至該第三焊點’該第—線段係形成於 該第—烊點與該第二焊點之間’以一體連接該球接 合端與該返折線部,該返折線部係具有一第一線壓 焊點與一第二線壓焊點,該第一線壓焊點係接合至 該第二焊點,該第二線壓焊點係接合至第一線壓谭 點’該第二線段係形成於該第二焊點與該第三焊點 18 1358337 之間,以一體連接該返折線部與該線尾端。 11、根據申請專利範圍第10項之多焊點之間不截斷之 連續打線結構,其中該第二焊點係為一凸塊。 1 2、根據申請專利範圍第11項之多焊點之間不截斷之 連續打線結構,其中該凸塊係為一結線凸塊並接合 於中間堆疊晶片之焊墊上。 1 3、根據申請專利範圍第1 0項之多焊點之間不截斷之 連續打線結構,其中該第一焊點係為一晶片上之焊 墊,而該第三焊點係為一晶片載體上之接指。 1 4、根據申請專利範圍第1 0項之多焊點之間不截斷之 連續打線結構,其中該第一焊點係為一晶片載體上 之接指,而該第三焊點係為一晶片焊墊上之凸塊。 1 5、根據申請專利範圍第1 0項之多焊點之間不截斷之 連續打線結構,其中該返折線部係具有一緩衝線弧。 1 6、根據申請專利範圍第1 5項之多焊點之間不截斷之 連續打線結構,其中該缓衝線弧係朝向該第一焊點。 1 7、根據申請專利範圍第1 0項之多焊點之間不截斷之 連續打線結構,其中該焊線之材質係包含金(Au)。 1 8、根據申請專利範圍第1 0項之多焊點之間不截斷之 連續打線結構,其中該返折線部另具有一第三線壓 焊點,其係接合至在第一線壓焊點與該第二線壓焊 點之間的線段。 19
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