TWI357969B - Method for inspecting polarizer bonding precision - Google Patents

Method for inspecting polarizer bonding precision Download PDF

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Publication number
TWI357969B
TWI357969B TW100108791A TW100108791A TWI357969B TW I357969 B TWI357969 B TW I357969B TW 100108791 A TW100108791 A TW 100108791A TW 100108791 A TW100108791 A TW 100108791A TW I357969 B TWI357969 B TW I357969B
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Taiwan
Prior art keywords
polarizing plate
liquid crystal
bonding
corners
crystal panel
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TW100108791A
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Chinese (zh)
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TW201139973A (en
Inventor
Keita Imura
Tatsuya Tsuchioka
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Sumitomo Chemical Co
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    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00Optical elements other than lenses
    • G02B5/30Polarising elements
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333Constructional arrangements; Manufacturing methods
    • G02F1/1335Structural association of cells with optical devices, e.g. polarisers or reflectors
    • G02F1/133528Polarisers
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306Details
    • G02F1/1309Repairing; Testing

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  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Liquid Crystal (AREA)
  • Mathematical Physics (AREA)
  • Polarising Elements (AREA)

Description

1357969 六、發明說明: 【發明所屬之技術領域】 本發明係關於一種偏光板之貼合精度檢查方法及貼合精 度檢查裝置。 【先前技術】 在將偏光板貼合於液晶面板上而形成之液晶顯示裝置之 製造步驟中,將偏光板貼合於液晶面板上之後,為確認其 貼合精度,通常會進行檢查偏光板與液晶面板之貼合偏移 的「偏移檢查」。例如,利用游標卡尺等,測量貼合有偏 光板之液晶面板上之偏光板之貼合偏移量,藉此檢查偏光 板與液晶面板之貼合偏移。然而,於如此直接測量貼合偏 移董之方法中’欲對所有數量的貼合有偏光板之液晶面板 進行「偏移檢查」’需要非常大之勞力。因此,亦會藉由 相機進行自動檢查。 例如,在專利文獻1中,揭示有一種檢查貼附於液晶面 板兩面上之兩片偏光板之貼附位置偏移(貼合偏移)的方 法。專利文獻1所揭示之方法係藉由CCD(charge c〇upled —電荷耗合器件)相機自與液晶面板側面成垂直之方 向,拍攝液晶面板之四個角中之任一者或複數個邊缘部附 近,並藉由圖像處理測宏ό ώί· j疋自所拍攝之圖像中液晶面板端部 至偏光板端部之距離。 [先前技術文獻] [專利文獻] [專利文獻1 ]日本公開專剎八扭「 寻矛J么報「特開2004-233184號公 154747.doc 丄357969 報(2004年8月19日公開)」 【發明内容】 [發明所欲解決之問題] 如上所述,藉由專利文獻丨所揭示之方法,可檢查偏光 板之貼合偏移,故而可減少由偏光板之貼合偏移所引起之 液晶顯示裝置之不良率。但是,存在如下情況:僅僅檢查 偏光板之貼合偏移,並不能說已完成對偏光板之貼合精度 之充分檢查。 例如,於將預先配合液晶面板之形狀自長條形之偏光板 原料片材切斷而成之晶片(chip)狀偏光板貼合於液晶面板 上之晶月貼合方式之情形時,晶片狀偏光板之尺寸及垂直 度(squareness)已藉由其出貨檢查而得以確保。因此,將晶 片狀偏光板貼合於液晶面板上之後,作為偏光板之貼合精 度之檢查,只要檢查偏光板之貼合偏移即足矣。 另一方面,於藉由RTP(R0U t0 Panel,片材輥至面板)貼 合方式(例如,參照專利4307510號說明書及專.利4346971 號說明書)將偏光板貼合於液晶面板上之情形時,係於其 貼合步驟中,一面配合液晶面板之形狀將長條形之偏光板 原料片材切斷成晶片狀,一面在連續之步驟中將所獲得之 b曰片狀偏光板貼合於液晶面板上,因此存在貼合後之偏光 板之尺寸及垂直度之精度未得到確保之情況。因此,僅檢 查偏光板之貼合偏移的專利文獻1之方法具有如下問題· 作為藉由RTP貼合方式而貼合之偏光板之貼合精度之檢查 方法並不充分。 i54747.doc 偏光板通常係以覆蓋液晶面板之顯示區域整個面(成為 顯示畫面之部位整個面)之方式,貼合於該液晶面板之兩 面上,然而例如當偏光板之尺寸小於所規定之範圍時,則 會產生在偏光板之端部發生漏光之問題。又,當偏光板之 垂直度在所規定之範圍以外時’會產生液晶顯示裝置之對 比度因偏光板之轴偏移而下降之問題。因此,於RTp貼合 方式之情形時,亦期望與晶片貼合方式之情形時同樣,: 光板之尺寸及垂直度之精度亦得到確保。 本發明係#於上述問題而完成者,其只要目的在於提供 一種偏光板之貼合精度檢查方法及偏光板之貼合精度檢查 裝置’其月&夠對-面切斷長條形之偏光板原料片材一面貼 ^於液时面板上之偏光板,於檢查偏光板之貼合偏移量之 同時,檢查偏光板之尺寸及垂直度。 [解決問題之技術手段] 為解決上述問題,本發明之偏光板之貼合精度檢查方法 之特徵在於.其係一面切斷長條形之偏光板原料片材,一 面檢查貼合於液晶面板上之偏光板之貼合精度者,且包 括·觀察步驟,觀察貼合於上述液晶面板上之上述偏光板 ^所有四個角;以及運算步驟,使用上述觀察步驟中所獲 得之觀察資料,計算出上述偏光板之貼合偏移量、尺寸及 垂直度。 根據上述構成,使用觀察偏光板之所有四個角所獲得之 觀察資料計算偏光板之貼合偏移量、尺寸及垂直度,因此 ;檢_偏光板之貼合偏移量之同時,檢查偏光板之尺寸 154747.doc !357969 及垂直度。因此,可削減檢查步驟數β 再者’如上所述’於專利文獻1所揭示之方法中,僅檢 查貼合後之偏光板之貼合偏移,故而未必需要檢查偏光板 之所有四個角,只要檢查一個角或兩個角即可。 本發明之偏光板之貼合精度檢查裝置包含使用觀察偏光 板之所有四個角所獲得之觀察資料而計算偏光板之貼合偏 移量、尺寸及垂直度之運算機構,因此能夠於檢查偏光板 之貼合偏移量之同時,檢查偏光板之尺寸及垂直度。因 此,可削減檢查步驟數。又,只要使用本發明之偏光板之 貼合精度檢查裝置,即可進行自動檢查。因此,可削減偏 光板之貼合精度檢查之相關勞力及費用。此外,可對所有 數量進行檢查,因此可於所有最終製品中確保偏光板之貼 合精度》 [發明之效果] 本發明之偏光板之貼合精度檢查方法之構成包括:觀察 步驟,觀察貼合於上述液晶面板上之上述偏光板之所有四 個角;以及運算步驟,使用上述觀察步驟中所獲得之觀察 貝料,計算出上述偏光板之貼合偏移量、尺寸及垂直度。 根據本發明之偏光板之貼合精度檢查方法,使用觀察偏 光板之所有四個角所獲得之觀察資料而計算偏光板之貼合 偏移量、尺寸及垂直度,故而能夠於檢查偏光板之貼合偏 移量之同時,檢查偏光板之尺寸及垂直度。由此,可削減 檢查步驟數。因此,根據本發明之偏光板之貼合精度檢查 方法,將獲得能夠削減偏光板之貼合精度檢查之相關勞力 154747.doc 1357969 及費用的效果。又,由於可保證偏光板之貼合精度,故而 將獲得能夠增加最終製品之生產率、良率之效果。 又’本發明之偏光板之貼合精度檢查裝置之構成包括: 觀察機構,其係用以觀察貼合於上述液晶面板上之上述偏 光板之所有四個角者;以及運算機構,其使用上述觀察機 構所獲得之觀察資料’計算上述偏光板之貼合偏移量、尺 寸及垂直度。1357969 VI. Description of the Invention: [Technical Field] The present invention relates to a method for inspecting the adhesion accuracy of a polarizing plate and a fitting precision inspection device. [Prior Art] In the manufacturing process of a liquid crystal display device in which a polarizing plate is bonded to a liquid crystal panel, after the polarizing plate is bonded to the liquid crystal panel, in order to confirm the bonding accuracy, the polarizing plate is usually inspected. "Offset check" of the offset of the LCD panel. For example, the offset of the polarizing plate on the liquid crystal panel to which the polarizing plate is attached is measured by a vernier caliper or the like, thereby checking the offset of the bonding between the polarizing plate and the liquid crystal panel. However, in the method of directly measuring the offset offset Dong, it is very laborious to perform "offset check" on all the number of liquid crystal panels to which the polarizing plate is attached. Therefore, it will also be automatically checked by the camera. For example, Patent Document 1 discloses a method of inspecting a positional shift (bonding offset) of two polarizing plates attached to both surfaces of a liquid crystal panel. The method disclosed in Patent Document 1 captures any one of the four corners of the liquid crystal panel or a plurality of edge portions by a CCD (charge c〇upled) device that is perpendicular to the side surface of the liquid crystal panel. Nearby, and by image processing, the distance between the end of the liquid crystal panel and the end of the polarizing plate in the image taken is measured. [Prior Art Document] [Patent Document] [Patent Document 1] Japan Opens a Special Twisted Eighth Twisted "Looking for a Spear J" Report "Specially Opened 2004-233184 No. 154747.doc 丄357969 (Opened on August 19, 2004)" [Problem to be Solved by the Invention] As described above, by the method disclosed in the patent document, the offset of the polarizing plate can be inspected, so that the offset of the polarizing plate can be reduced. The defect rate of the liquid crystal display device. However, there is a case where only the offset of the polarizing plate is checked, and it cannot be said that the sufficient inspection of the bonding accuracy of the polarizing plate has been completed. For example, when a chip-shaped polarizing plate in which a shape of a liquid crystal panel is cut from a long-length polarizing plate raw material sheet is bonded to a liquid crystal panel, the wafer shape is used. The size and squareness of the polarizer have been ensured by its shipping inspection. Therefore, after the wafer-shaped polarizing plate is bonded to the liquid crystal panel, it is sufficient to check the bonding accuracy of the polarizing plate as the inspection accuracy of the polarizing plate. On the other hand, when the polarizing plate is attached to the liquid crystal panel by the RTP (R0U t0 Panel) bonding method (for example, referring to the specification of Patent No. 4,307,510 and the specification of No. 4,347,971) In the bonding step, the elongated polarizing plate raw material sheet is cut into a wafer shape in accordance with the shape of the liquid crystal panel, and the obtained b-shaped sheet-shaped polarizing plate is bonded to the obtained step in a continuous step. On the liquid crystal panel, there is a case where the accuracy of the size and the perpendicularity of the polarizing plate after bonding is not ensured. Therefore, the method of Patent Document 1 in which only the offset of the polarizing plate is inspected has the following problems: The method of inspecting the bonding accuracy of the polarizing plate bonded by the RTP bonding method is not sufficient. The polarizing plate is usually attached to both sides of the liquid crystal panel so as to cover the entire surface of the display area of the liquid crystal panel (the entire surface of the display screen), but for example, when the size of the polarizing plate is smaller than the specified range At this time, there is a problem that light leakage occurs at the end portion of the polarizing plate. Further, when the perpendicularity of the polarizing plate is outside the predetermined range, there is a problem that the contrast of the liquid crystal display device is lowered due to the axial shift of the polarizing plate. Therefore, in the case of the RTp bonding method, it is also desirable to ensure the accuracy of the size and the perpendicularity of the light plate as in the case of the wafer bonding method. The present invention has been completed in view of the above problems, and an object of the present invention is to provide a method for inspecting the adhesion accuracy of a polarizing plate and a bonding precision inspection device for a polarizing plate, which is capable of cutting a long strip of polarized light on the opposite side. The plate raw material sheet is attached to the polarizing plate on the liquid panel side, and the size and verticality of the polarizing plate are checked while checking the offset of the polarizing plate. [Means for Solving the Problems] In order to solve the above problems, the method for inspecting the adhesion accuracy of the polarizing plate of the present invention is characterized in that the sheet of the polarizing plate of the long strip is cut while being attached to the liquid crystal panel. The bonding precision of the polarizing plate, including the observation step, observing all four corners of the polarizing plate attached to the liquid crystal panel; and calculating the calculation data using the observation data obtained in the above observation step The offset, size and perpendicularity of the polarizing plate described above. According to the above configuration, the observation offset obtained by observing all four corners of the polarizing plate is used to calculate the offset, size, and perpendicularity of the polarizing plate, and therefore, the polarization of the polarizing plate is checked, and the polarizing is checked. The dimensions of the board are 154747.doc !357969 and the verticality. Therefore, the number of inspection steps can be reduced. Further, in the method disclosed in Patent Document 1, only the bonding offset of the polarizing plate after bonding is checked, so that it is not necessary to inspect all four corners of the polarizing plate. Just check one corner or two corners. The bonding precision inspection apparatus for a polarizing plate of the present invention includes a calculation mechanism for calculating a bonding offset, a size, and a perpendicularity of a polarizing plate by using observation data obtained by observing all four corners of the polarizing plate, thereby enabling inspection of polarized light Check the size and verticality of the polarizing plate while the offset of the board is offset. Therefore, the number of inspection steps can be reduced. Further, an automatic inspection can be performed by using the bonding accuracy inspection device of the polarizing plate of the present invention. Therefore, it is possible to reduce the labor and cost associated with the inspection of the bonding accuracy of the polarizing plate. Further, since all the quantities can be inspected, the bonding precision of the polarizing plate can be ensured in all the final products. [Effects of the Invention] The composition of the bonding precision inspection method of the polarizing plate of the present invention includes: an observation step, and observation lamination And all the four corners of the polarizing plate on the liquid crystal panel; and an operation step of calculating the offset, the size and the perpendicularity of the polarizing plate by using the observed bead material obtained in the above observation step. According to the method for inspecting the adhesion accuracy of the polarizing plate of the present invention, the observation offset obtained by observing all four corners of the polarizing plate is used to calculate the offset, size, and perpendicularity of the polarizing plate, so that the polarizing plate can be inspected. Check the size and perpendicularity of the polarizer while fitting the offset. This reduces the number of inspection steps. Therefore, according to the method for inspecting the bonding accuracy of the polarizing plate of the present invention, the effect of the labor force 154747.doc 1357969 and the cost which can reduce the inspection accuracy of the polarizing plate can be obtained. Further, since the bonding precision of the polarizing plate can be ensured, the effect of increasing the productivity and yield of the final product can be obtained. Further, the configuration of the bonding precision inspection apparatus of the polarizing plate of the present invention includes: an observation mechanism for observing all four corners of the polarizing plate attached to the liquid crystal panel; and an arithmetic unit using the above The observation data obtained by the observation mechanism 'calculates the offset, size and perpendicularity of the polarizing plate.

根據上述構成,包含使用觀察偏光板之所有四個角所獲 得之觀察資料計算偏光板之貼合偏移量、尺寸及垂直度之 運算機構,因此能夠於檢查偏光板之貼合偏移量之同時, 檢查偏光板之尺寸及垂直度。因此’能夠削減檢查步驟 數❶又,能夠進行自動檢查。此外,由於能夠對所有數量 進行檢查,故而可於所有最終製品中確保偏光板之貼合精 度。因此,藉由本發明之偏光板之貼合精度檢查裝置,將 獲得可削減偏光板之貼合精度檢查之相關勞力及費用的效According to the above configuration, the calculation mechanism for calculating the offset, the size, and the perpendicularity of the polarizing plate using the observation data obtained by observing all four corners of the polarizing plate is included, so that the offset of the polarizing plate can be checked. Also, check the size and verticality of the polarizer. Therefore, it is possible to reduce the number of inspection steps and perform automatic inspection. In addition, since all the quantities can be inspected, the bonding accuracy of the polarizing plate can be ensured in all the final products. Therefore, with the bonding precision inspection device of the polarizing plate of the present invention, it is possible to obtain the effect of reducing the labor and cost associated with the inspection of the bonding accuracy of the polarizing plate.

果。又’將獲得能夠增加最终製品之生產率、良率之效 果。 本發明之其他目的、特徵及優點將藉由以下所揭示之記 載而充分瞭解。又’本發明之好處將藉由參照隨附圖式之 以下說明而變得清楚明白。 【實施方式】 。然而,本發 内加以各種變 所有學術文獻 以下,詳細說明本發明之實施形態之一例 明並不限定於此,而能夠以於所描述之範圍 形之態樣來實施。又,本說明書中所記載之 154747.doc 及專利文獻於本說明書中均作為參考而引用。再者只要 本說明書巾未作㈣描述,則表示數值範圍之「Α〜Β」係 指「A以上' B以下」。 [1.偏光板之貼合精度檢查方法] 本發明之偏光板之貼合精度檢查方法(以下,稱為「本 發明之檢查方法」)係檢查—面切斷長條形之偏光板原料 片材一面貼合於液晶面板上之偏光板之貼合精度者;其構 成包括:觀察步冑’觀察貼合於上述液晶面板上之上述偏 光板之所有四個角;以及運算步驟,使用上述觀察步驟中 所獲得之觀察資料,計算出上述偏光板之貼合偏移量、尺 寸及垂直度。 本5兒明書中,所謂上述「檢查偏光板之貼合精度」,係 指檢查偏光板之貼合偏移量、尺寸及垂直度/ 又,作為本發明之檢查方法之檢查對象的偏光板,係一 面抽取長條升)之偏光板原料片材,一面以在偏光板之抽取 方向(搬送方向)上成為特定長度(尺寸)之方式將偏光板原 料片材切斷成晶片狀,一面將連續之步驟中所獲得之晶片 狀偏光板貼合於液晶面板上者,即,藉由RTp貼合方式貼 合而成者。 關於自該長條形之偏光板原料片材切斷而成之偏光板之 寬度方向,已在偏光板原料片材中以成為特定長度(尺寸) 之方式保證精度。另一方面,關於長條形之偏光板原料片 材之搬送方向’係以成為特定長度之方式每次配合液晶面 板之形狀進行切斷,因此必需對切斷而成之每個偏光板檢 154747.doc 1357969 查自長條形之偏光板原料片材切斷而成之偏光板之搬送方 向的長度(尺寸)是否為所設定之長度。 ' 因此,在本發明中,上述「偏光板之尺寸」,係特扑 「偏光板之搬送方向之長度」。但是,當然,根據本發= 之檢查方法,不僅可檢查「偏光板之搬送方向之長度」, 而且可檢查「偏光板之寬度方向之長度」。 另外,關於自長條形之偏光板原料片材切斷而成之偏光 板,必需對切斷而成之每個偏光板檢查其形狀是否為矩 形。因此,本發明中,上述「偏光板之垂直度」,係表示 在偏光板之角部上的直角之程度,即偏光板之角部之角度 較90°存在何種程度之誤差。 又,本發明中,上述「偏光板之貼合偏移量」,係表示 偏光板之貼合偏移程度,即偏光板係自液晶面板上之特定 貼合位置偏移何種程度而貼合。 再者,於本說明書中,上述「偏光板原料片材」,意指 切斷成晶片狀之前的偏光板。作為上述偏光板之構成並無 特別限定’意圖包括藉由RTP貼合方式而貼合之先前公知 之偏光板。例如’可列舉:於偏光膜之至少一個面上經由 接著劑層貼合保護膜而成之偏光板;在偏光膜之未貼合保 護膜之側之面上經由黏著層進而貼合可剝離之剝離膜而成 之偏光板等。 (1-1.觀察步称) 觀察步驟係觀察貼合於液晶面板上之偏光板之所有四個 角的步驟。再者,上述「偏光板之四個角」意指「偏光板 154747.doc 1357969 之4個角部」。於觀察步驟中,關於觀察偏光板之所有四個 角之方法,只要可觀察到偏光板之所有4個角部,能夠獲 得所有角部之相關信息,即無特別限定。因此,既可藉由 4個階段一個個地觀察偏光板之4個角部,亦可藉由丨個階 段同時觀察偏光板之4個角部。又,關於觀察偏光板之伟 角部之順序,亦無特別限定。藉由同時觀察偏光板上之4 個角部中之2個以上的角部,可高效率地觀察偏光板之四 個角》 (第1實施形態) 一面參照圖卜一面說明本發明之檢查方法之第1實施形 態。圖1係說明本發明之檢查方法之第丨實施形態者且係 表示觀察機構之概略構成之圖。 如圖1所示,於本發明之檢查方法之第丨實施形態中,在 觀察步驟中,使用用以分別觀察偏光板3之4個角部之4台 相機丨…,作為用以觀察貼合於液晶面板2上之偏光板3之 所有四個角的機構(觀察機構)。4台相機1…係相對於液晶 面板2與#光板3之貼合面自》直方向配置於可拍攝偏光板 3之各個角部之位置。使用此種觀察機構,則在觀察步驟 中,可同時觀察(拍攝)偏光板3之4個角部,因此可高效率 地觀察偏光板3之所有四個角。 作為上述「相機」,可對應於目的而使用例如線掃描相 機面掃拖相機等。線掃描相機雖然有可能因拍攝精度受 到偏光板搬送速度之影^,而使所獲得之圖$資料(觀察 資料)邊得不鮮B月’但是即使偏光板處於移動狀態下,亦 154747.doc 1357969 可拍攝偏光板之四個角。另一方面,面掃描相機雖然必需 使偏光板停止以便拍攝偏光板之四個角,但是由於拍攝精 度較高,故而可獲得更鮮明之圖像資料(觀察資料)。因 此,若考慮到拍攝精度,更佳為使用面掃描相機作為上述 「相機」。再者’於使用線掃描相機觀察偏光板之四個角 之情形時,可固定偏光板,而一面使線掃描相機相對於偏 光板移動、一面觀察偏光板之四個角,亦可固定線掃描相 機,而一面使偏光板相對於線掃描相機移動、一面觀察偏 光板之四個角,或亦可一面使線掃描相機相對於偏光板之 移動方向在180。之方向上移動,一面觀察偏光板之四個 角。 (第2實施形態) 斜對本發明之檢查方法之第2實施形態進行說明。本發 明之檢查方法之第2實施形態中,係在觀察步驟中,使用2 台相機作為觀察機構,以2個階段觀察貼合於液晶面板上 之偏光板之所有四個角,除此以外與上述第丨實施形態相 同。 本發明之檢查方法之第2實施形態中,2台相機係相對於 液曰曰面板與偏光板之貼合面自垂直方向配置於可分別拍攝 偏光板上之4個角部中之2個角部之位置。本發明之檢查方 法之第2實施形態中,首先,在觀察步驟之第丨階段,使用 2台相機分別觀察偏光板之4個角部_之2個角部。繼而, 在第2階段,為能夠分別拍攝到在上述第”皆段未觀察之其 餘2個角部,使2台相機之位置及/或偏光板之位置移動, 154747.doc 1357969 2察其餘2個角部。如此,以2個階段觀察偏光板之4個 卩藉此不使用4台作為觀察機構之相機便可觀察偏光 所有四個角。再者,於觀察步帮中,只要能夠最終觀 -偏光板之所有四個角即可,因此對於在第旧段觀察 偏光板上之4個角部中之哪個角部並無特別限定。然而, 在觀察步驟之第2階段中’若考慮到使2台相機之位置及/ 或偏光板之位置移動’以便能夠分別拍攝到在第i階段未 觀察之其餘兩個角部時,例如於固定相機而__面使偏光板 相對於相機移動、一面觀察偏光板之四個角之情形時,或 者於一面使線掃描相機相對於偏光板之移動方向在18〇。之 方向上移動、一面觀察偏光板之四個角之情形時,可藉由 在第1階段觀察偏光板上之4個角部中朝向偏光板之移動方 向為前方之2個角部,在第2階段觀察朝向偏光板之移動方 向為後方之2個角部’藉此可高效率地觀察偏光板之所有 四個角。 (1-2.運算步驟) 運算步驟係使用在觀察步驟中所獲得之觀察資料,計算 偏光板之貼合偏移量、尺寸及垂直度的步驟。此處,關於 使用在觀察步驟中所獲得之觀察資料而計算偏光板之「貼 合偏移量」、「尺寸」及「垂直度」之方法,參照圖2〜4具 體說明如下。 圖2係說明偏光板之「貼合偏移量」之計算方法之一例 的圖。例如假設於液晶面板2上,基準點(圖2所示之基準 點A、B、C及D)存在於應貼合偏光板3之4個角部(圖2所示 154747.doc •12· 1357969 之角部A’、B,、C,及D,)之位置,偏光板之「貼合偏移量」 可根據連接該基準點間之基準線(例如,圖2所示之基準線 AB及AD)與偏光板3之邊(例如,圖2所示之邊A,B,及A,D,) 之距離而算出。 例如,當計算相對於液晶面板2之基準點八的偏光板3之 角部A’之「貼合偏移量」時,可計算出液晶面板2之基準 線AD與偏光板3之邊A,D,之距離作為偏光板3之短邊方向之 貼合偏移量同樣地,可計算出液晶面板2之基準線ab 與偏光板3之邊Α,Β·之距離,作為偏光板3之長邊方向之貼 合偏移量b。 圖3係說明偏光板之「尺寸」之計算方法之一例的圖。 關於偏光板之「尺寸」,例如假設於液晶面板2上,基準點 (圖3所示之基準點A、B、C&D)存在於應貼合偏光板3之4 個角部(圖3所示之角部a,、B,、c.及D·)之位置,可根據液 晶面板2上已知之基準點間距離(例如,圖3所示之基準點 間距離L)與相對於液晶面板2之基準點的偏光板3之角部之 「貼合偏移量」計算偏光板3之尺寸。 例如,當什算偵光板3之短邊方向之「尺寸」(圖3所示 之角部A,及角部B,間之“)時,計算出液晶面板2之基準 線AD與偏光板3之邊A,D,之距離作為貼合偏移量3。同樣 也片算出液晶面板2之基準線BC與偏光板3之邊b,c,之距 離作為貼合偏移量c。繼而’藉由自基準點間距離L減去貼 合偏移量a及貼合偏移量c,可算出偏光板之「尺寸」。 即,圖3所示之偏光板3之短邊方向之「尺寸」可利用以下 154747.doc •13· 1357969 之式(1)而算出。 [數1] 偏光板之尺寸=基準點間距離L-(貼合偏移量a+貼合偏移量e) (u 圖4係說明偏光板之「垂直度」之計算方法之一例的 圖。關於偏光板之「垂直度」,例如假設於液晶面板2上, 基準點(圖4所示之基準點a、B、C&D)存在於應貼合偏光 板3之4個角部(圖4所示之角部A,、Bi、c,及D,)之位置,可 根據連接該基準點間之基準線與偏光板3之邊之平行度來 計算垂直度。 例如’當計算偏光板3之角部A,之「垂直度」時,首 先,計算出液晶面板2之基準線AB與偏光板3之邊A,B,之平 行度ab。平行度ab可利用以下之式(2)而算出。 [數2] 平行廑a b= + a 貼合偏移量b 2—貼合偏移量b 〔 基準距離J .·· 再者,式(2)中,「貼合偏移量“」係作為自基準線AB上 之任意點(例如,圖4所示之點B1)至偏光板3之邊αέ,為止 之距離而計算者。同樣地,「貼合偏移量μ」係作為自基 準線AB上之另一任意點(例如,圖4所示之點Al)至偏光板3 之邊α,β·為止之距離而計算者〆基準距離u」係基準線 AB上之任意兩點(例如,圖4所示之點扪及點a】)間之距 離。 同樣地,计算出液晶面板2之基準線八〇與偏光板3之邊 AD之平行度ade平行度以可利用以下之式p)而算出。 154747.doc 1357969 ' [數 3] ’ 平粁麿a H=:t 〔貼合偏移量曰2—貼合偏移量a ! 、 基準距離L2 J… (3) 再者,於式(3)中’「貼合偏移量a2」係作為自基準線AD 上之任意點(例如,圖4所示之點D2)至偏光板3之邊A,D,為 . 止之距離而計算者。同樣地’「貼合偏移量al」係作為自 基準線AD上之另一任意之點(例如,圖4所示之點A2)至偏 φ 光板3之邊AD為止之距離而計算者。「基準距離L2」係基 準線AD上之任意兩點(例如,圖4所示之點〇2及點A2)間之 距離。 根據平行度ab及平行度以,計算偏光板3之角部A,之垂 直度D。垂直度〇可利用以下之式(4)而算出。 [數4] 垂直度D=90〇+平行度ab+平行度ad…(4) 作為本發明之-實施形態,例如只要使用包含能夠根據 籲 上述計算方法計冑出偏光板之「貼合偏移量」、「尺寸」及 「垂直度」之運算軟體的運算機構,即可高效率地算出偏 • 光板之「貼合偏移量」、「尺寸」及「垂直度」。再者,作 為上述「運算機構」,只要具有能夠根據上述計算方法 • 算出偏光板之「貼合偏移量」、「尺寸」及「垂直度」之功 能’即不限定於上述構成。 (1-3.其他步驟) 本發明之檢查方法除上述觀察步驟及上述運算步驟以 外’亦可進而包含利用該運算步驟中所獲得之結果,外定 154747.doc -15- 1357969 偏光板之貼合精度合格與否的判定步驟。 於判定步驟中’使用上述運算步驟中所算出之結果,若 偏光板之貼合偏移量、尺寸及垂直度為特定範圍内,則判 定為偏光板之貼合精度處於規定範圍内之合格品。例如, 將上述「貼合偏移量」為±300 μηι,上述「尺寸」為特定 之尺寸±300 μπι以内’且上述「垂直度」為9〇〇±〇.〇5。以内 之情況’判定為偏光板之貼合精度處於規定範圍内之合格 品。另一方面’若偏光板之貼合偏移量、尺寸及垂直度中 之任一者為上述特定範圍外,則判定為偏光板之貼合精度 處於規定範圍外之不合格品。 作為本發明之一實施形態,例如只要使用包含利用上述 運算步驟中所算出之結果,判定偏光板之貼合偏移量、尺 寸及垂直度為上述特定範圍内之判定軟體的判定機構,即 可咼效率地判定偏光板之貼合精度合格與否。再者,作為 ^述「判定機構」,只要具有判定合格品與不合格品之功 能’即不限定於上述構成。 又,本發明之檢查方法亦可進而包含使用上述判定步驟 中所判定之合格與否結果,區分合格品與不合格 步驟。 刀 =為本發明之—實施形態,例如只要使用具備利用上述 ^疋步驟中所判定之合格與否結果區分合格品與不合梅 2功能的區分機構,即可高效率地區分合格品與不合轄 鱼不ΓΙ’作為上述「區分機構」,只要具有區分合格品 〃 0格品之功能,即無特別限定。 154747.doc 16 1357969 本發明之檢查方法亦可與液晶顯示裝置之製造方法組合 .起來。具體而言,於液晶顯示裝置之製造方法中,在一面 抽取長條形之偏光板原料片材,一面以成為特定長度之方 式切斷偏光板原料片材,—面將偏光板貼合於液晶面板上 . 之貼合步驟之後,組合本發明之檢查方法。藉由將本發明 . 之檢查方法組合於液晶顯示裝置之製造方法,而一面檢杳 偏光板之貼合精度,一面製造液晶顯示裝置,因此可減少 φ 由偏光板之貼合不良所引起之液晶顯示裝置之不良率。其 結果為,可增加最終製品之生產率、良率。 [2.偏光板之貼合精度檢查裝置] 本發明之偏光板之貼合精度檢查裝置(以下,稱為「本 發明之檢查裝置」)係一面切斷長條形之偏光板原料片 材、一面檢查貼合於液晶面板上之偏光板之貼合精度的檢 查裝置,係用以使上述本發明之檢查方法具體化的檢查裝 置。具體而言,其構成包括:觀察機構,其用以觀察貼合 | 於上述液晶面板上之上述偏光板之所有四個角;以及運算 機構,其使用上述觀察機構所獲得之觀察資料,計算出上 述偏光板之貼合偏移量、尺寸及垂直度。 本心明之檢查裝置除上述觀察機構及上述運算機構以 外,亦可進而包含使用由上述運算機構所獲得之結果,判 定上述偏光板之貼合精度合格與否之判定機構。作為該判 定機構,例如只要使用包含利用上述運算機構所算出之結 果而判定偏光板之貼合偏移量、尺寸及垂直度為上述特: 範圍内之判定軟體的判定機構,即可高效率地判定偏光板 154747.doc •17· 之貼合精度合格與否。 又’本發明之檢查裝置亦可進而包括使用由上述判定機 構所判疋之合格與否結果,區分合格品與*合格品之區分 機構作為該區分機構,例如只要使用具備制上述判定 機構所判疋之。格與否結果而區分合格品與不合格品之功 能的區分機構’即可高效率地區分合格品與不合格品。 「再者’關於上述「觀察機構」、上述「運算機構」、上述 「判定機構」及上述「區分機構」,皆如上述M.偏光板 之貼合精度檢查方法」之項中所說明。 再者,本發明之檢查裝置亦可組裳至液晶顯示裝置之製 造裝置中。具體而言,亦可於液晶顯示裝置之製造裝置中 組裝本發明之檢查裝置,以便能夠_面將長條形之偏光板 原料片材切斷成料長度,並在將偏絲料於液晶面板 上之後檢查偏光板之貼合精度。藉由將本發明之檢查裝置 組裂至液晶顯示裝置之製造裝置中’彳一面檢查偏光板之 貼口精度一面製造液晶顯示裝置。於此情形時,只要使用 線掃描相機作為上述觀察機構,即可於液晶顯示裝置之製 造裝置中,一面搬送貼合有偏光板之液晶面板,一面觀察 (拍攝)偏光板之四個角。 本發明之偏光板之貼合精度檢查方法中,在上述觀察步 帮中,較佳為同時觀察貼合於上述液晶面板上之上述偏光 板之四個角中之兩個以上。 根據上述構成,由於同時觀察偏光板之四個角中之兩個 以上,故而可高效率地檢查偏光板之貼合精度。 154747.doc 丄357969 人本發明之偏光板之貼合精度檢查方法中,較佳為進而包 3使用上述運算步驟中所獲得之結果,判定 貼合精度合格與否之判定步驟。 先板之 上述判定步驟中,由於使用上述運算步驟中所獲得之結 果而判定上述偏光板之貼合精度合格與否故而可僅選擇 已確保偏光板之貼合精度的合格品並送至下一步驟。fruit. In addition, the effect of increasing the productivity and yield of the final product will be obtained. Other objects, features, and advantages of the present invention will be made apparent from the appended claims. The advantages of the present invention will become apparent from the following description of the accompanying drawings. [Embodiment] However, the present invention is not limited to the details of the embodiments of the present invention, and can be implemented in the form of the described scope. Further, the 154747.doc and the patent documents described in the present specification are hereby incorporated by reference. In addition, as long as the description of the specification is not described in (4), the numerical range "Α~Β" means "A or more" below B. [1. Method for inspecting the bonding accuracy of the polarizing plate] The method for inspecting the bonding accuracy of the polarizing plate of the present invention (hereinafter referred to as "the inspection method of the present invention") is a method of inspecting the surface to cut a long strip of polarizing plate material. The bonding precision of the polarizing plate attached to the liquid crystal panel on one side; the composition includes: observing step 胄 'observing all four corners of the polarizing plate attached to the liquid crystal panel; and calculating steps using the above observation In the observation data obtained in the step, the offset, size and perpendicularity of the polarizing plate are calculated. In the above-mentioned book, the "adhesion accuracy of the inspection polarizing plate" refers to a polarizing plate which inspects the offset amount, the size, and the perpendicularity of the polarizing plate as the inspection object of the inspection method of the present invention. The polarizing plate raw material sheet is cut into a wafer shape so as to have a specific length (size) in the extraction direction (transport direction) of the polarizing plate while the polarizing plate raw material sheet is taken out from the polarizing plate. The wafer-shaped polarizing plate obtained in the successive steps is bonded to the liquid crystal panel, that is, by lamination by means of RTp bonding. With respect to the width direction of the polarizing plate cut from the long-length polarizing plate raw material sheet, the precision is ensured in a specific length (size) in the polarizing plate raw material sheet. On the other hand, the transfer direction of the long-length polarizing plate raw material sheet is cut so as to match the shape of the liquid crystal panel so as to have a specific length. Therefore, it is necessary to inspect each of the polarized plates cut off by 154747. .doc 1357969 Check whether the length (size) of the polarizing plate cut from the long-length polarizing plate raw material sheet is the set length. Therefore, in the present invention, the "size of the polarizing plate" is the "length of the direction in which the polarizing plate is conveyed". However, of course, according to the inspection method of the present invention, it is possible to check not only the "length of the polarizing plate in the conveying direction" but also the "length of the polarizing plate in the width direction". Further, regarding the polarizing plate obtained by cutting the raw material sheet of the long polarizing plate, it is necessary to check whether the shape of each of the polarizing plates is a rectangular shape. Therefore, in the present invention, the "perpendicularity of the polarizing plate" indicates the degree of the right angle at the corner portion of the polarizing plate, that is, the degree of the angle of the corner portion of the polarizing plate to 90 degrees. Further, in the present invention, the "adhesion offset amount of the polarizing plate" indicates the degree of the offset of the polarizing plate, that is, how much the polarizing plate is offset from the specific bonding position on the liquid crystal panel. . In the present specification, the "polarizing sheet raw material sheet" means a polarizing plate before being cut into a wafer shape. The configuration of the polarizing plate is not particularly limited. It is intended to include a conventionally known polarizing plate which is bonded by an RTP bonding method. For example, a polarizing plate in which a protective film is bonded to at least one surface of a polarizing film via an adhesive layer is provided, and a surface of the polarizing film on the side where the protective film is not bonded is bonded to the surface via an adhesive layer. A polarizing plate or the like obtained by peeling off a film. (1-1. Observation step) The observation step is a step of observing all four corners of the polarizing plate attached to the liquid crystal panel. Furthermore, the above "four corners of the polarizing plate" means "four corners of the polarizing plate 154747.doc 1357969". In the observation step, as for the method of observing all four corners of the polarizing plate, as long as all four corner portions of the polarizing plate can be observed, information on all the corner portions can be obtained, that is, it is not particularly limited. Therefore, the four corners of the polarizing plate can be observed one by one by four stages, and the four corners of the polarizing plate can be simultaneously observed by one stage. Further, the order of observing the corner portions of the polarizing plate is not particularly limited. By simultaneously observing two or more corners of the four corners on the polarizing plate, the four corners of the polarizing plate can be efficiently observed. (First Embodiment) The inspection method of the present invention will be described with reference to the drawings. The first embodiment. Fig. 1 is a view showing a schematic configuration of an observation mechanism according to a third embodiment of the inspection method of the present invention. As shown in Fig. 1, in the embodiment of the inspection method of the present invention, in the observation step, four cameras 用以 for observing the four corners of the polarizing plate 3 are used as the observation for fitting. A mechanism (observation mechanism) of all four corners of the polarizing plate 3 on the liquid crystal panel 2. The four cameras 1 are placed at respective corners of the image-capturing plate 3 from the straight direction with respect to the bonding surface of the liquid crystal panel 2 and the light plate 3. With such an observation mechanism, in the observation step, the four corners of the polarizing plate 3 can be simultaneously observed (photographed), so that all four corners of the polarizing plate 3 can be observed efficiently. As the "camera" described above, for example, a line scan camera surface sweeping camera or the like can be used depending on the purpose. Although the line scan camera may be affected by the transfer speed of the polarizing plate, the obtained image $data (observation data) is not too good for B month, but even if the polarizing plate is in motion, 154747.doc 1357969 The four corners of the polarizer can be taken. On the other hand, although the face-scanning camera must stop the polarizing plate to take the four corners of the polarizing plate, it is possible to obtain more vivid image data (observation data) because of the high shooting accuracy. Therefore, in consideration of the shooting accuracy, it is more preferable to use a surface scanning camera as the above "camera". Furthermore, when using a line scan camera to observe the four corners of the polarizing plate, the polarizing plate can be fixed while moving the line scanning camera relative to the polarizing plate while observing the four corners of the polarizing plate, and can also perform fixed line scanning. The camera moves the polarizing plate relative to the line scanning camera while observing the four corners of the polarizing plate, or the moving direction of the line scanning camera relative to the polarizing plate is 180. Move in the direction and observe the four corners of the polarizer. (Second Embodiment) A second embodiment of the inspection method of the present invention will be described obliquely. In the second embodiment of the inspection method of the present invention, in the observation step, two cameras are used as the observation mechanism, and all four corners of the polarizing plate bonded to the liquid crystal panel are observed in two stages, and The above-described third embodiment is the same. In the second embodiment of the inspection method of the present invention, the two cameras are disposed at two corners of the four corner portions of the polarizing plate that can be respectively photographed from the vertical direction with respect to the bonding surface of the liquid helium panel and the polarizing plate. The location of the department. In the second embodiment of the inspection method of the present invention, first, at the second stage of the observation step, two corners of the four corner portions of the polarizing plate are observed using two cameras. Then, in the second stage, in order to be able to separately capture the positions of the two cameras and/or the position of the polarizing plate in the remaining two corners which are not observed in the above-mentioned first section, 154747.doc 1357969 2 In this way, the four eccentrics of the polarizing plate are observed in two stages, so that all four corners of the polarized light can be observed without using four cameras as observation mechanisms. Moreover, in the observation step, as long as the final view can be observed - all four corners of the polarizing plate are sufficient, and therefore, it is not particularly limited to which of the four corners of the polarizing plate is observed in the old stage. However, in the second stage of the observation step, Moving the position of the two cameras and/or the position of the polarizing plate so that the remaining two corners not observed in the i-th phase can be separately captured, for example, by fixing the camera and moving the polarizing plate relative to the camera, By observing the four corners of the polarizing plate, or by moving the direction of the line scanning camera relative to the polarizing plate in the direction of 18 〇, while observing the four corners of the polarizing plate, Observed in stage 1 Among the four corners on the optical plate, the moving direction toward the polarizing plate is two corners in the front, and in the second stage, the two corners which are rearward in the moving direction of the polarizing plate are observed', whereby the polarizing plate can be observed efficiently All of the four corners. (1-2. Operation step) The calculation step is a step of calculating the offset, size, and perpendicularity of the polarizing plate using the observation data obtained in the observation step. Here, regarding the use The method of calculating the "fit offset", "size" and "perpendicularity" of the polarizing plate in the observation data obtained in the observation step will be specifically described below with reference to FIGS. 2 to 4. Fig. 2 is a view showing an example of a method of calculating the "bonding offset amount" of the polarizing plate. For example, on the liquid crystal panel 2, the reference points (reference points A, B, C, and D shown in FIG. 2) exist at the four corners of the polarizing plate 3 (Fig. 2 154747.doc • 12· The position of the corners A', B, C, and D, of 1357969, the "fit offset" of the polarizer can be based on the reference line connecting the reference points (for example, the reference line AB shown in Figure 2) And AD) is calculated from the distance between the sides of the polarizing plate 3 (for example, the sides A, B, and A, D shown in Fig. 2). For example, when the "fit offset amount" of the corner portion A' of the polarizing plate 3 with respect to the reference point 8 of the liquid crystal panel 2 is calculated, the reference line AD of the liquid crystal panel 2 and the side A of the polarizing plate 3 can be calculated. In the same manner, the distance between the reference line ab of the liquid crystal panel 2 and the side of the polarizing plate 3, and the distance between the polarizing plate 3 and the polarizing plate 3 can be calculated as the distance of the polarizing plate 3. The offset b in the side direction. Fig. 3 is a view showing an example of a method of calculating the "size" of the polarizing plate. Regarding the "size" of the polarizing plate, for example, on the liquid crystal panel 2, the reference points (reference points A, B, C & D shown in FIG. 3) exist at the four corners of the polarizing plate 3 to be bonded (Fig. 3). The positions of the corner portions a, B, c., and D·) shown may be based on the distance between the reference points known on the liquid crystal panel 2 (for example, the distance L between the reference points shown in FIG. 3) and relative to the liquid crystal. The "bonding offset amount" of the corner portion of the polarizing plate 3 at the reference point of the panel 2 is calculated as the size of the polarizing plate 3. For example, when the "size" of the short side direction of the light shielding plate 3 (the corner portion A and the corner portion B shown in FIG. 3) is calculated, the reference line AD of the liquid crystal panel 2 and the polarizing plate 3 are calculated. The distances A and D are used as the bonding offset 3. Similarly, the reference line BC of the liquid crystal panel 2 and the sides b and c of the polarizing plate 3 are calculated as the bonding offset c. The "size" of the polarizing plate can be calculated by subtracting the bonding offset a and the bonding offset c from the distance L between the reference points. That is, the "size" in the short-side direction of the polarizing plate 3 shown in Fig. 3 can be calculated by the following formula (1) of 154747.doc • 13· 1357969. [Number 1] Dimensions of the polarizing plate = distance between reference points L - (bonding offset a + bonding offset e) (u FIG. 4 is a view showing an example of a method of calculating the "perpendicularity" of the polarizing plate. Regarding the "perpendicularity" of the polarizing plate, for example, on the liquid crystal panel 2, the reference points (reference points a, B, C & D shown in FIG. 4) exist in the four corners of the polarizing plate 3 to be bonded (Fig. The position of the corners A, Bi, c, and D,) shown in Fig. 4 can be calculated based on the parallelism between the reference line connecting the reference points and the side of the polarizing plate 3. For example, when calculating the polarizing plate In the case of the "perpendicularity" of the corner portion A, first, the parallelism ab of the reference line AB of the liquid crystal panel 2 and the sides A and B of the polarizing plate 3 is calculated. The parallelism ab can be expressed by the following equation (2) Calculated. [Number 2] Parallel 廑ab= + a Fit offset b 2 - Fit offset b [Base distance J .·· In addition, in equation (2), "fit offset" The calculation is based on the distance from any point on the reference line AB (for example, point B1 shown in Fig. 4) to the side αέ of the polarizing plate 3. Similarly, the "fit offset μ" is used as From baseline AB The other point (for example, the point A1 shown in FIG. 4) is the distance from the sides α, β· of the polarizing plate 3, and the calculator 〆 the reference distance u′′ is any two points on the reference line AB (for example, The distance between the point 扪 and the point a]) is similarly calculated. Similarly, the parallelism degree parallelism of the reference line gossip of the liquid crystal panel 2 and the side AD of the polarizing plate 3 is calculated by using the following formula p) Calculated. 154747.doc 1357969 '[Number 3] ' 平粁麿 a H=:t 〔Adhesion offset 曰2—fitting offset a ! , reference distance L2 J... (3) Again, in equation (3) In the middle of the 'adhesion offset a2' is taken from any point on the reference line AD (for example, the point D2 shown in FIG. 4) to the side A, D of the polarizing plate 3, and is calculated as the distance . Similarly, the "fit offset amount a" is calculated as the distance from another arbitrary point on the reference line AD (for example, the point A2 shown in Fig. 4) to the side AD of the φ plate 3. The "reference distance L2" is the distance between any two points on the reference line AD (for example, point 〇 2 and point A2 shown in Fig. 4). The vertical angle D of the corner portion A of the polarizing plate 3 is calculated based on the parallelism ab and the parallelism. The perpendicularity 〇 can be calculated by the following formula (4). [Equation 4] Verticality D = 90 〇 + parallelism ab + parallelism ad (4) As an embodiment of the present invention, for example, a "fit offset" capable of extracting a polarizing plate according to the above calculation method is used. The calculation mechanism of the calculation software of the "quantity", "size" and "perpendicularity" can efficiently calculate the "fit offset", "size" and "perpendicularity" of the polarizer. Further, the "computation means" is not limited to the above configuration as long as it has the function of calculating the "fit offset amount", "size" and "perpendicularity" of the polarizing plate according to the above calculation method. (1-3. Other Steps) The inspection method of the present invention may further comprise, in addition to the above observation steps and the above-mentioned calculation steps, the result obtained by using the calculation step, the external 154747.doc -15-1357969 polarizing plate sticker The determination step of whether the accuracy is acceptable or not. In the determination step, 'if the result of the calculation in the above-mentioned calculation step is used, if the offset amount, the size, and the perpendicularity of the polarizing plate are within a specific range, it is determined that the bonding precision of the polarizing plate is within the predetermined range. . For example, the above-mentioned "bonding offset" is ±300 μηι, the above "size" is within a specific size of ±300 μπι" and the above "verticality" is 9〇〇±〇.〇5. In the case of the inside, it is judged that the bonding precision of the polarizing plate is within the predetermined range. On the other hand, if any one of the offset amount, the size, and the perpendicularity of the polarizing plate is outside the above-described specific range, it is determined that the bonding accuracy of the polarizing plate is out of the predetermined range. According to an embodiment of the present invention, for example, a determination means for determining a matching software in which the bonding offset amount, the size, and the perpendicularity of the polarizing plate are within the specific range can be determined by using the result calculated by the calculation step.咼 Efficiently determine whether the bonding accuracy of the polarizing plate is acceptable or not. In addition, the "determination means" as described above is not limited to the above configuration as long as it has the function of determining a good product or a defective product. Further, the inspection method of the present invention may further include the use of the result of the pass or fail determined in the above-described determination step to distinguish between the qualified product and the unqualified step. Knife = the embodiment of the present invention, for example, by using a division mechanism having the function of distinguishing the quality of the product from the product of the Bumi 2 by the result of the pass or fail determined in the above-mentioned steps, the qualified product and the non-rule can be distinguished efficiently. As the above-mentioned "division mechanism", there is no particular limitation as long as it has a function of distinguishing the quality of the product. 154747.doc 16 1357969 The inspection method of the present invention can also be combined with the manufacturing method of the liquid crystal display device. Specifically, in the method of manufacturing a liquid crystal display device, the polarizing plate raw material sheet is cut to a specific length while the long polarizing plate raw material sheet is taken out, and the polarizing plate is bonded to the liquid crystal. After the bonding step on the panel, the inspection method of the present invention is combined. By combining the inspection method of the present invention with the manufacturing method of the liquid crystal display device, the liquid crystal display device is manufactured while checking the bonding accuracy of the polarizing plate, so that the liquid crystal caused by the poor bonding of the polarizing plate can be reduced. The defect rate of the display device. As a result, the productivity and yield of the final product can be increased. [2. Fixing accuracy inspection device for polarizing plate] The bonding precision inspection device for polarizing plate of the present invention (hereinafter referred to as "inspection device of the present invention") cuts a long-length polarizing plate raw material sheet, An inspection apparatus for inspecting the bonding accuracy of a polarizing plate attached to a liquid crystal panel is an inspection apparatus for embodying the above-described inspection method of the present invention. Specifically, the configuration includes: an observation mechanism for observing all four corners of the polarizing plate attached to the liquid crystal panel; and an arithmetic mechanism that calculates the observation data obtained by the observation mechanism The offset, size and perpendicularity of the polarizing plate described above. In addition to the observation mechanism and the arithmetic unit described above, the inspection apparatus of the present invention may further include a determination means for determining whether or not the bonding accuracy of the polarizing plate is acceptable by using the result obtained by the calculation means. As the determination means, for example, by using a determination means for determining the offset amount, the size, and the perpendicularity of the polarizing plate to be the determination software within the above-described range by using the result calculated by the above-described calculation means, the determination means can be efficiently used. It is judged whether the bonding precision of the polarizing plate 154747.doc •17· is acceptable or not. Further, the inspection apparatus according to the present invention may further include, as the classification means, a classification mechanism for distinguishing the qualified product from the *qualified product by using the result of the pass or fail determined by the determination means, for example, by using the determination means Oh. The difference between the function of the qualified product and the non-conforming product by the result of the grid or not can be used to distinguish between the qualified product and the non-conforming product. The above-mentioned "observation mechanism", the above-mentioned "computing mechanism", the above-mentioned "judging mechanism" and the above-mentioned "differentiation mechanism" are as described in the item "Method for inspecting the bonding precision of the above-mentioned M. polarizing plate". Furthermore, the inspection apparatus of the present invention can also be incorporated into a manufacturing apparatus of a liquid crystal display device. Specifically, the inspection apparatus of the present invention can be assembled in a manufacturing apparatus of a liquid crystal display device so that the long-length polarizing plate raw material sheet can be cut into a material length, and the partial filament is fed to the liquid crystal panel. Check the bonding accuracy of the polarizing plate after the upper one. A liquid crystal display device is manufactured by arranging the inspection apparatus of the present invention into a manufacturing apparatus of a liquid crystal display device while checking the adhesion accuracy of the polarizing plate. In this case, by using a line scan camera as the above-described observation mechanism, the liquid crystal panel to which the polarizing plate is bonded can be conveyed while the four corners of the polarizing plate are observed (photographed). In the method for inspecting the bonding accuracy of the polarizing plate of the present invention, in the above observation step, it is preferable to simultaneously observe two or more of the four corners of the polarizing plate bonded to the liquid crystal panel. According to the above configuration, since two or more of the four corners of the polarizing plate are simultaneously observed, the bonding precision of the polarizing plate can be efficiently inspected. In the method of inspecting the bonding accuracy of the polarizing plate of the present invention, it is preferable that the package 3 uses the result obtained in the above-described calculation step to determine whether or not the bonding accuracy is acceptable or not. In the above-described determination step of the first plate, it is determined whether or not the bonding precision of the polarizing plate is acceptable by using the result obtained in the above-described calculation step, and only the qualified product that has ensured the bonding accuracy of the polarizing plate can be selected and sent to the next step. step.

又,為解決上述課題,本發明之偏光板之貼合精度檢查 裝置的特徵在於:其係—面切斷長條形之偏光板原料片 材,一面檢查貼合於液晶面板上之偏光板之貼合精度者, 且包括:觀察機構,其係用以觀察貼合於上述液晶面板上 之上述偏光板之所有四個角者;以及運算機構,其使用上 述觀察機構所獲得之觀察資料,計算出上述偏光板之貼合 偏移量、尺寸及垂直度。 本發明之偏光板之貼合精度檢查裝置中,上述觀察機構 較佳為用α同時觀察貼合於上述液晶面板上之上述偏光板 之四個角中之兩個以上之機構。 若為上述構成,可藉由觀察機構同時觀察偏光板之四個 角中之兩個以上,因此可高效率地檢查貼合精度》 本發明之偏光板之貼合精度檢查裝置中,較佳為進而包 含使用上述運算機構所獲得之結果,判定上述偏光板之貼 合精度合格與否之判定機構。 根據上述構成,可僅選擇已由判定機構判定為合格品的 已確保偏光板之貼合精度的液晶面板送至下一步驟。 本發明並不限定於上述各實施形態,而可於申請專利範 154747.doc •19- 1357969 圍各項所揭示之範圍内進行各種變更,關於將不同實施形 態中所分別揭示之技術手段加以適當組合而獲得之實施形 態’亦屬於本發明之技術範圍。 [產業上之可利用性] 根據本發明,可保證偏光板之貼合精度,因此可增加最 終製品之生產率、良率。又,可於檢查偏光板之貼合偏移 量之同時’檢查偏光板之尺寸及偏光板之垂直度,因此可 削減檢查步驟數。其結果為,可削減貼合精度檢查之相關 勞力及成本。因此,本發明可廣泛應用於將偏光板貼合於 液晶面板上而製造筆記型個人電腦或行動電話等之行動設 備、以及大型電視機等之液晶顯示裝置的各種產業中。又 【圖式簡單說明】 施形態之一例的圖, 」之計算方法之一例 圖1係說明本發明之檢查方法之實 係表示觀察機構之概略構成之圖。 圖2係說明偏光板之「貼合偏移量 的圖〇 圖 圖3係說明偏光板之「 圖4係說明偏光板之 尺寸」之計算方法之一例的圖。 「垂直度」之計算方法之一例的 【主要元件符號說明】 2 3a 、 al 、 a2 、 b 、 bl 、 b2 、 面掃描相機(觀察機構) 液晶面板 偏光板 貝占合偏移量 154747.doc -20- 1357969 A、B、C、D A'、B'、C'、D'Moreover, in order to solve the above-mentioned problem, the bonding precision inspection apparatus of the polarizing plate of the present invention is characterized in that the polarizing plate raw material sheet is cut and attached to the polarizing plate attached to the liquid crystal panel. The accuracy of the fitting includes: an observation mechanism for observing all four corners of the polarizing plate attached to the liquid crystal panel; and an arithmetic mechanism for calculating the observation data obtained by the observation mechanism The offset, size and perpendicularity of the above polarizing plate are obtained. In the bonding precision inspection apparatus for a polarizing plate of the present invention, it is preferable that the observation means simultaneously observes two or more of the four corners of the polarizing plate attached to the liquid crystal panel by α. According to the above configuration, the observation mechanism can simultaneously observe two or more of the four corners of the polarizing plate, so that the bonding precision can be efficiently inspected. In the bonding precision inspection device of the polarizing plate of the present invention, it is preferable that Further, the determination means for determining whether or not the bonding accuracy of the polarizing plate is acceptable is determined by using the result obtained by the arithmetic means. According to the above configuration, only the liquid crystal panel having the bonding precision of the polarizing plate that has been determined to be a good product by the determining means can be selected and sent to the next step. The present invention is not limited to the above-described embodiments, and various modifications can be made within the scope of the disclosure of the patent application 154747.doc. 19-1357969, and the technical means disclosed in the different embodiments are appropriately adapted. The embodiment obtained by combination is also within the technical scope of the present invention. [Industrial Applicability] According to the present invention, the bonding precision of the polarizing plate can be ensured, so that the productivity and yield of the final product can be increased. Further, the size of the polarizing plate and the perpendicularity of the polarizing plate can be checked while checking the offset of the polarizing plate, so that the number of inspection steps can be reduced. As a result, the labor and cost associated with the inspection of the bonding accuracy can be reduced. Therefore, the present invention can be widely applied to various industries in which a polarizing plate is bonded to a liquid crystal panel to manufacture a mobile device such as a notebook computer or a mobile phone, and a liquid crystal display device such as a large-sized television. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a view showing a schematic configuration of an observation mechanism in accordance with an embodiment of the inspection method of the present invention. Fig. 2 is a view showing "the offset amount of the polarizing plate". Fig. 3 is a view showing an example of a method of calculating the "size of the polarizing plate" of the polarizing plate. [Main component symbol description] of one example of calculation method of "perpendicularity" 2 3a, al, a2, b, bl, b2, surface scanning camera (observation mechanism) LCD panel polarizing plate occupant offset 154747.doc - 20- 1357969 A, B, C, D A', B', C', D'

A1、A2、B1、D2 AB、AD、BC A,B'、A,D'、B'C' L LI、L2 基準點 角部 點 基準線 偏光板之邊 基準點間距離 基準距離A1, A2, B1, D2 AB, AD, BC A, B', A, D', B'C' L LI, L2 Reference point Corner point Reference line Edge of polarizer Distance between reference points Reference distance

154747.doc -21 -154747.doc -21 -

Claims (1)

1357969 • 七、申請專利範圍: . 1. 一種偏光板之貼合精度檢查方法,其係一面切斷長條形 之偏光板原料片材,一面檢查貼合於液晶面板上之偏光 板之貼合精度者,且包括: . 觀察步驟,觀察貼合於上述液晶面板上之上述偏光板 . 之所有四個角;以及 運算步驟,使用上述觀察步驟中所獲得之觀察資料, Φ 計算出上述偏光板之貼合偏移量、尺寸及垂直度。 2. 如請求項1之偏光板之貼合精度檢查方法,其中於上述 觀察步驟中,同時觀察貼合於上述液晶面板上之上述偏 光板之四個角中之兩個以上。 3. 如請求項1或2之偏光板之貼合精度檢查方法,其中進而 包括判定步驟,其使用上述運算步驟中所獲得之結果, 判定上述偏光板之貼合精度合格與否。 4. 一種偏光板之貼合精度檢查裝置,其係一面切斷長條形 φ 之偏光板原料片材,一面檢查貼合於液晶面板上之偏光 板之貼合精度者,且包括: 觀察機構,其係用以觀察貼合於上述液晶面板上之上 述偏光板之所有四個角者;以及 • 運算機構,其使用上述觀察機構所獲得之觀察資料, 計算出上述偏光板之貼合偏移量、尺寸及垂直度。 5.如請求項4之偏光板之貼合精度檢查裝置,其中上述觀 察機構係用以同時觀察貼合於上述液晶面板上之上述偏 光板之四個角中之兩個以上之機構。 154747.doc 1357969 6.如請求項4或5之偏光板之貼合精度檢查裝置,其中進而 包括判定機構,其使用上述運算機構所獲得之結果,判 定上述偏光板之貼合精度合格與否。 154747.doc1357969 • VII. Patent application scope: 1. A method for checking the adhesion accuracy of a polarizing plate, which is to cut a long-shaped polarizing plate raw material sheet while checking the bonding of a polarizing plate attached to a liquid crystal panel. Accuracy, and includes: . observing step, observing all four corners of the polarizing plate attached to the liquid crystal panel; and calculating steps, using the observation data obtained in the above observation step, Φ to calculate the polarizing plate Fit the offset, size and verticality. 2. The method of checking the adhesion accuracy of the polarizing plate of claim 1, wherein in the above observation step, two or more of the four corners of the polarizing plate attached to the liquid crystal panel are simultaneously observed. 3. The method of checking the adhesion accuracy of the polarizing plate of claim 1 or 2, further comprising a determining step of determining whether the bonding accuracy of the polarizing plate is acceptable or not using the result obtained in the calculating step. 4. A bonding precision inspection device for a polarizing plate which cuts a long-length φ polarizing plate raw material sheet and inspects a bonding precision of a polarizing plate attached to a liquid crystal panel, and includes: an observation mechanism For observing all four corners of the polarizing plate attached to the liquid crystal panel; and an arithmetic mechanism for calculating the offset of the polarizing plate using the observation data obtained by the observation mechanism Volume, size and verticality. 5. The bonding precision inspection apparatus of the polarizing plate of claim 4, wherein the observation mechanism is a mechanism for simultaneously observing two or more of the four corners of the polarizing plate attached to the liquid crystal panel. A bonding precision inspection apparatus for a polarizing plate according to claim 4 or 5, further comprising a determining means for determining whether the bonding precision of the polarizing plate is acceptable or not using the result obtained by the arithmetic means. 154747.doc
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Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013075340A (en) * 2011-09-30 2013-04-25 Asahi Glass Co Ltd Method for observing and system for observing glass plate polishing apparatus
KR101477453B1 (en) * 2011-11-21 2014-12-29 수미토모 케미칼 컴퍼니 리미티드 Optical member laminate manufacturing system, manufacturing method, and recording medium
KR101973832B1 (en) * 2012-02-29 2019-04-29 수미토모 케미칼 컴퍼니 리미티드 Optical display device production system, and optical display device production method
KR102031401B1 (en) * 2012-08-08 2019-10-11 스미또모 가가꾸 가부시키가이샤 Method for producing and system for producing optical display device
WO2014038433A1 (en) * 2012-09-07 2014-03-13 住友化学株式会社 Device for producing optical member pasted body
KR102120507B1 (en) * 2012-10-12 2020-06-08 스미또모 가가꾸 가부시키가이샤 Detection apparatus, method for manufacturing optical member-bonded body, and method for manufacturing optical member-bonded body
JP5828972B2 (en) * 2013-01-10 2015-12-09 住友化学株式会社 Optical display device manufacturing apparatus and optical display device production system
JP2014206714A (en) * 2013-03-21 2014-10-30 住友化学株式会社 Manufacturing system and manufacturing method for optical display device
JP5724146B2 (en) * 2013-05-16 2015-05-27 住友化学株式会社 Manufacturing system, manufacturing method and recording medium for optical member bonded body
JP6037564B2 (en) * 2013-06-24 2016-12-07 住友化学株式会社 Optical display device production system
JP5943354B2 (en) * 2013-07-23 2016-07-05 住友化学株式会社 Optical display device production system
CN204128496U (en) 2014-08-07 2015-01-28 日东电工株式会社 Blooming bonding position determinator and optical display production line
JP6529250B2 (en) * 2014-12-18 2019-06-12 日東電工株式会社 Optical display panel manufacturing method and optical display panel manufacturing system
CN105784723A (en) 2014-12-24 2016-07-20 日东电工株式会社 Transmission-type defect detection device and transmission-type defect detection method
CN105157580A (en) * 2015-08-06 2015-12-16 武汉华星光电技术有限公司 Method and device for detecting sizes of polaroid
JP2017151164A (en) * 2016-02-22 2017-08-31 住友化学株式会社 Polarizing plate and image display device
CN105629535B (en) * 2016-03-22 2019-01-15 深圳市华星光电技术有限公司 patch detection system
CN106200042B (en) * 2016-07-22 2020-01-03 武汉华星光电技术有限公司 Polaroid attaching method and polaroid attaching machine
CN109212792B (en) * 2018-07-26 2021-04-06 深圳同兴达科技股份有限公司 Detection method for preventing lamination deviation of full-lamination two-in-one module
CN109323654B (en) * 2018-11-14 2023-10-27 张家港康得新光电材料有限公司 Detection device and detection method
CN111928792B (en) * 2020-07-15 2022-04-29 大族激光科技产业集团股份有限公司 Method and system for detecting inscribed cutting precision of polaroid on surface of LCD panel
JP2022090247A (en) 2020-12-07 2022-06-17 日東電工株式会社 Detection method for marginal portion of optical film
JP2022090281A (en) 2020-12-07 2022-06-17 日東電工株式会社 Detection method for marginal portion of optical film
CN112596286B (en) * 2020-12-15 2022-11-04 滁州惠科光电科技有限公司 Polaroid detection method and device and polaroid attaching machine
CN113340909B (en) * 2021-08-05 2021-11-16 常州铭赛机器人科技股份有限公司 Glue line defect detection method based on machine vision
CN114355640A (en) * 2021-12-31 2022-04-15 深圳市深科达智能装备股份有限公司 Polaroid laminating detection equipment, system and method
CN115979120B (en) * 2022-09-28 2023-12-15 南京颖图电子技术有限公司 Method for verifying precision of liquid crystal polarizer laminating system
CN116177298B (en) * 2023-04-28 2023-07-28 山东瑞邦智能装备股份有限公司 Board film pasting defect detection and film cutting adjustment system and method based on machine vision

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3117010B2 (en) * 1998-11-05 2000-12-11 日本電気株式会社 LCD panel
JP2001125092A (en) * 1999-10-26 2001-05-11 Matsushita Electric Ind Co Ltd Liquid crystal display device and method of producing the same
JP2003344302A (en) * 2002-05-31 2003-12-03 Sumitomo Chem Co Ltd Method and equipment for inspecting polarization film
JP3948522B2 (en) * 2003-01-30 2007-07-25 株式会社タカトリ LCD panel polarizing plate adhesion accuracy inspection method
JP4742628B2 (en) * 2005-03-16 2011-08-10 コニカミノルタオプト株式会社 Optical film and method for producing the same
CN101629871B (en) * 2009-08-07 2011-09-07 明基材料有限公司 Device and method for detecting polaroid

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