CN102395919B - Polarizer bonding precision inspection method and bonding precision inspection device - Google Patents
Polarizer bonding precision inspection method and bonding precision inspection device Download PDFInfo
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- CN102395919B CN102395919B CN201180001140.5A CN201180001140A CN102395919B CN 102395919 B CN102395919 B CN 102395919B CN 201180001140 A CN201180001140 A CN 201180001140A CN 102395919 B CN102395919 B CN 102395919B
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- 238000000034 method Methods 0.000 title claims abstract description 78
- 238000007689 inspection Methods 0.000 title claims abstract description 48
- 239000004973 liquid crystal related substance Substances 0.000 claims abstract description 84
- 238000010030 laminating Methods 0.000 claims description 74
- 238000012360 testing method Methods 0.000 claims description 28
- 239000013078 crystal Substances 0.000 claims description 3
- 239000012530 fluid Substances 0.000 claims description 3
- 230000015572 biosynthetic process Effects 0.000 description 10
- 238000004519 manufacturing process Methods 0.000 description 10
- 238000004364 calculation method Methods 0.000 description 8
- 230000000694 effects Effects 0.000 description 5
- 238000009434 installation Methods 0.000 description 4
- 239000011248 coating agent Substances 0.000 description 3
- 238000000576 coating method Methods 0.000 description 3
- 230000002950 deficient Effects 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 239000007858 starting material Substances 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 239000012790 adhesive layer Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
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Classifications
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/30—Polarising elements
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/1335—Structural association of cells with optical devices, e.g. polarisers or reflectors
- G02F1/133528—Polarisers
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
Abstract
After a process in which a long master polarizer is cut into polarizers that are bonded to liquid-crystal panels, the disclosed polarizer bonding precision inspection method and polarizer bonding precision inspection device can inspect each polarizer, simultaneously checking the misalignment amount, size, and rectilinearity thereof. Said polarizer bonding precision inspection method includes: an observation step in which all four corners of a polarizer (3) bonded to a liquid-crystal panel (2) are observed; and a computation step in which observation data obtained in the observation step is used to compute the misalignment amount, size, and rectilinearity of the polarizer (3).
Description
Technical field
The present invention relates to a kind of Anawgy accuracy inspection method and Anawgy accuracy testing fixture of polaroid.
Background technology
The manufacturing process that forms liquid crystal indicator for polaroid being fitted on liquid crystal panel, is fitted in polaroid after liquid crystal panel, and in order to confirm this Anawgy accuracy, the laminating deviation of general inspection polaroid and liquid crystal panel, carries out " deviation check ".For example, by using the measurements such as vernier caliper in the polaroid side-play amount being fitted with on the liquid crystal panel of polaroid, check the laminating deviation of polaroid and liquid crystal panel.But, adopt the method for so direct measurement laminating side-play amount, to being fitted with all liquid crystal panels of polaroid, carrying out " deviation check " and need very large labour.Therefore, also carry out the self-verifying according to video camera.
For example, in patent documentation 1, disclose the method that has the paste position deviation (laminating deviation) that checks 2 polaroids that are attached to liquid crystal panel two sides.In the method that patent documentation 1 discloses, from the direction with respect to liquid crystal panel lateral vertical, utilize ccd video camera to take near any one angle or a plurality of edge part at four angles of liquid crystal panel, utilize image to process the distance from liquid crystal panel end to polaroid end of measuring in the image being taken.
Prior art document
Patent documentation
Patent documentation 1 Japan's publication communique " TOHKEMY 2004-233184 communique (on August 19th, 2004 is open)
Summary of the invention
The problem that invention will solve
As mentioned above, in the method that patent documentation 1 discloses, owing to can checking the laminating deviation of polaroid, so can reduce the fraction defective of the liquid crystal indicator that the laminating deviation of polaroid causes.But, only checking the laminating deviation of polaroid, existence can not check the situation of the Anawgy accuracy of polaroid fully.
For example, the shaped like chips polaroid cutting off in the shape that the polaroid starting material from long size is contrasted in advance to liquid crystal panel is fitted in liquid crystal panel, and in the situation of chip laminating type, the size of shaped like chips polaroid and verticality are guaranteed by its shipment inspection.Therefore, shaped like chips polaroid is fitted in after liquid crystal panel, as the inspection of the Anawgy accuracy of polaroid, only checks that the laminating deviation of polaroid is just passable.
Another aspect, according to RTP (Roll to Panel), laminating type (for example, consult No. 4307510 instructionss of patent and No. 4346971 instructionss of patent) when polaroid is fitted on liquid crystal panel, in this bonding process, the shape of the polaroid starting material contrast liquid crystal panel of long size is cut to shaped like chips on one side, in the operation continuing, the shaped like chips polaroid obtaining is fitted on liquid crystal panel on one side, therefore have the size of polaroid that can not guarantee after laminating and the situation of the precision of verticality.Therefore, have following such problem, that is, having the method for the patent documentation 1 of the laminating deviation only check polaroid is inadequate as the inspection method of the Anawgy accuracy of the polaroid of fitting by RTP laminating type.
Conventionally, polaroid is usingd the state at whole (as the positions of display frame whole) of viewing area of covering liquid crystal panel and is fitted in the two sides of this liquid crystal panel, but, for example, the size of polaroid, than the scope hour of regulation, exists at the end of polaroid generation light and spills such problem.And when the scope of regulation is outer, there is to cause due to the axle deviation of polaroid the such problem of contrast of reduction liquid crystal indicator in the verticality of polaroid.Thus, adopt the situation of RTP laminating type and the situation of employing chip laminating type similarly, also wish to guarantee the size of polaroid and the precision of verticality.
The present invention is point in view of the above problems, its main object is to provide a kind of Anawgy accuracy inspection method of polaroid and the Anawgy accuracy testing fixture of polaroid, for the polaroid blank while cutting off long size, fit to the polaroid on liquid crystal panel, can, when checking the laminating side-play amount of polaroid, check size and the verticality of polaroid.
The means of dealing with problems
In order to solve above-mentioned problem, the inspection method of the Anawgy accuracy of the polaroid the present invention relates to is the method for cutting off the polaroid blank of long size and checking the Anawgy accuracy that is fitted in the polaroid on liquid crystal panel, it is characterized in that, comprise following operation: the observation operation of observing four all angles that are fitted in the polaroid on described liquid crystal panel; And use the observed data obtaining in described observation operation, calculate the operational process of laminating side-play amount, size and the verticality of described polaroid.
According to above-mentioned formation, owing to use observing the observed data at four all angles of polaroid, calculate laminating side-play amount, size and the verticality of polaroid, so check size and the verticality of polaroid when can check the laminating side-play amount of polaroid.Therefore, can reduce inspection process number.
More, as mentioned above, in the method disclosing, owing to only checking the laminating deviation of the polaroid after laminating, do not need to check four all angles of polaroid in patent documentation 1, check that an angle or two angles are just passable.
The Anawgy accuracy testing fixture of the polaroid the present invention relates to is owing to having the observed data of using four all angles of observing polaroid, calculate the arithmetic element of laminating side-play amount, size and the verticality of polaroid, so check size and the verticality of polaroid when can check the laminating side-play amount of polaroid.Therefore, can cut down and check operation quantity.Again, use the Anawgy accuracy testing fixture of the polaroid the present invention relates to, can self-verifying.Therefore, can cut down labour and the spending that the Anawgy accuracy inspection of polaroid relates to.Further, due to can exhaustive test, so can guarantee the Anawgy accuracy about the polaroid of whole end articles.The effect of invention
The Anawgy accuracy inspection method of the polaroid the present invention relates to comprise four all angles of observing the above-mentioned polaroid be fitted in above-mentioned liquid crystal panel observation operation and, the observed data that use obtains in above-mentioned observation operation, calculates the operational process of laminating side-play amount, size and the verticality of above-mentioned polaroid.
According to the Anawgy accuracy inspection method of the polaroid the present invention relates to, owing to using the observed data at four all angles of observing polaroid, calculate laminating side-play amount, size and the verticality of polaroid, so can check size and the verticality of polaroid in the laminating side-play amount that checks polaroid.Therefore, can cut down and check operation quantity.Therefore,, according to the Anawgy accuracy inspection method of the polaroid the present invention relates to, have and can cut down the labour who relates to and such effect of paying wages in the Anawgy accuracy inspection of polaroid.Again, owing to can guaranteeing the Anawgy accuracy of polaroid, so there be throughput rate and the such effect of yield rate that can improve end article.
Again, the Anawgy accuracy testing fixture of the polaroid the present invention relates to have four all angles of observing the above-mentioned polaroid be fitted in above-mentioned liquid crystal panel observation unit and, the observed data that use obtains by above-mentioned observational technique, calculates the arithmetic element of laminating side-play amount, size and the verticality of above-mentioned polaroid.
According to above-mentioned formation, owing to thering is the observed data of using four all angles of observing polaroid, calculate the arithmetic element of laminating side-play amount, size and the verticality of polaroid, so can check size and the verticality of polaroid in the laminating side-play amount that checks polaroid.Therefore, can cut down and check operation quantity.Again, can self-verifying.Further, due to can exhaustive test, so can guarantee the Anawgy accuracy about the polaroid of whole end articles.Therefore,, according to the Anawgy accuracy testing fixture of the polaroid the present invention relates to, have and can cut down the labour who relates to and such effect of paying wages in the Anawgy accuracy inspection of polaroid.Be improved throughput rate and the such effect of yield rate of end article again.
Other objects of the present invention, feature and advantage, can be understood fully by record shown below.Again, by the following explanation with reference to accompanying drawing, advantage of the present invention is apparent.
Accompanying drawing explanation
Fig. 1 describes the example of the inspection method relating in the present invention example, means the figure of formation of the summary of observation unit.
Fig. 2 is the figure of an example of calculation method of " the laminating side-play amount " of explanation polaroid.
Fig. 3 is the figure of an example of calculation method of " size " of explanation polaroid.
Fig. 4 is the figure of an example of calculation method of " verticality " of explanation polaroid.
Working of an invention form
Below, example of the present invention example is described in detail.But the present invention is not limited thereto embodiment, the embodiment that various distortion are implemented within the scope of description is also in protection scope of the present invention.Again, all academic documents and the patent documentation recorded are in this manual quoted in this manual as a reference.Again, there is no in this manual special record, numerical range " A～B " means " more than A, below B ".
The Anawgy accuracy inspection method of polaroid (1)
The Anawgy accuracy inspection method of the polaroid the present invention relates to (hereinafter referred to as " inspection method of the present invention ") is the method for the Anawgy accuracy that is fitted in the polaroid on liquid crystal panel that checks while the polaroid blank that cuts off long size, the method comprise observe the above-mentioned polaroid be fitted in above-mentioned liquid crystal panel all observation operations of four jiaos and, the observed data that use is obtained by above-mentioned observation operation, calculates the operational process of laminating side-play amount, size and the verticality of above-mentioned polaroid.
In this instructions, above-mentioned " checking the Anawgy accuracy of polaroid " is laminating side-play amount, size and the verticality of digital examination polaroid.
Again, polaroid as the inspection object of inspection method of the present invention is following such polaroid: Yi Bian unreel the polaroid blank of long size, make the length (size) that direction (throughput direction) unreels regulation that unreels at polaroid, by polaroid cutting ingot, be shaped like chips on one side, in the operation continuing, the shaped like chips polaroid obtaining is fitted in to the polaroid on liquid crystal panel, that is the polaroid of, fitting by RTP laminating type.
About the Width of the polaroid of the polaroid cutting ingot of the long size from such, polaroid blank has guaranteed will reach the length (size) of regulation in precision.On the other hand, about growing the throughput direction of the polaroid blank of size, due to be the shape of each fluid,matching crystal panel cut off in case obtain regulation length, therefore, need to check whether from the length (size) of the throughput direction of the polaroid of the polaroid cutting ingot of long size be the length being set for each cut polaroid.
Therefore, in the present invention, above-mentioned " size of polaroid " is to represent especially " length of the throughput direction of polaroid ".But, natural, according to inspection method of the present invention, not only can check that " length of the throughput direction of polaroid " also can check " length of the Width of polaroid ".
Further, about the polaroid cutting ingot from long size polaroid, the polaroid that need to cut off for each checks whether its shape is rectangle.Therefore, in the present invention, above-mentioned " verticality of polaroid " refers to the degree at the right angle in the bight of polaroid, that is, how the angle that represents the bight of polaroid is compared with 90 ° the error of degree.
Again, in the present invention, above-mentioned " the laminating side-play amount of polaroid " refers to the degree of the laminating deviation of polaroid,, represents the laminating position from the regulation liquid crystal panel that is, and the polaroid of being fitted has the how skew of degree.
In addition, in this manual, above-mentioned " polaroid blank " refers to and cuts into shaped like chips polaroid before.Formation to above-mentioned polaroid is not particularly limited, and refers to the existing known polaroid of fitting by RTP laminating type.For example, can be for example at least one surface of polarizing coating, across adhesive layer, be fitted with diaphragm and across adhesive coating, also fit the stripping film that can peel off and polaroid of forming etc. on the polaroid that forms, surface in the diaphragm side of not fitting of polarizing coating.
(1-1. observes operation)
Observing operation is the operation of observing four all angles of the polaroid that is fitted in liquid crystal panel.More, above-mentioned " polaroid four jiaos " is the meaning in " 4 bights of polaroid ".In observing operation, observe polaroid four all angles method so long as can observe polaroid 4 whole bights, obtain the method about the information in all bights, restriction especially.Therefore, 4 bights of polaroid can be one by one observed by 4 steps, also 4 bights of polaroid can be observed by 1 step simultaneously.Again, the order in 4 bights of observation polaroid is also not particularly limited.In 4 bights of polaroid, by observe two with upper corner simultaneously, can observe more efficiently four angles of polaroid.
(the 1st example)
Consult Fig. 1, the 1st example of the inspection method the present invention relates to is described.Fig. 1 describes the 1st example of the inspection method relating in the present invention, means the figure of formation of the summary of observation unit.
As shown in Figure 1, the words of the 1st example of the inspection method that employing the present invention relates to, in observing operation, as for observing the unit (observation unit) at four all angles of the polaroid 3 being fitted on liquid crystal panel 2, use for observing respectively 4 video cameras 1 in 4 bights of polaroid 3.4 video cameras 1 are configured in vertical direction with respect to the binding face of liquid crystal panel 2 and polaroid 3, can take respectively the position in the bight of polaroid 3.Use such observational technique, in observing operation, owing to can observe 4 bights of (shooting) polaroid 3 simultaneously, so can observe more efficiently four all angles of polaroid 3.
As above-mentioned " video camera ", according to object, for example, can use line-scan camera, face smear camera etc.Because the precision of taking is subject to the impact of the transporting velocity of polaroid, although the view data obtaining (observed data) has feint possibility, line-scan camera is four angles that the state that moves at polaroid also can be taken polaroid.On the other hand, although face smear camera is for four angles of the polaroid of photographing, need to make polaroid stop, because the precision of taking is high, can obtain distincter view data (observed data).Therefore, consider the precision of shooting, as above-mentioned " video camera ", more preferably use face smear camera.More, while using line-scan camera to observe four angles of polaroid, fixing polaroid, when being moved with respect to polaroid, observes line-scan camera four angles of polaroid, also can static line smear camera, when polaroid is moved with respect to line-scan camera, observe four angles of polaroid, also can make line-scan camera when the side of 180 ° of the moving direction with respect to polaroid moves up, observe four angles of polaroid.
(the 2nd example)
The 2nd example to the inspection method the present invention relates to describes.In the 2nd example of the inspection method the present invention relates to, in observing operation, as observation unit, use 2 video cameras, except be fitted in four all angles of the polaroid on liquid crystal panel with 2 steps observations, identical with the 1st above-mentioned example.
In the 2nd example of the inspection method the present invention relates to, 2 camera arrangement in the vertical direction of the binding face with respect to liquid crystal panel and polaroid, can take respectively the position in 2 bights in 4 bights of polaroid.In the 2nd example of the inspection method the present invention relates to, first, in the 1st step of observing operation, use 2 video cameras to observe respectively 2 bights in 4 bights of polaroid.Then, in the 2nd step, in order to take respectively, remaining 2 bights that do not observe in above-mentioned the 1st step, the position of 2 video cameras and/or the position of polaroid are moved, observe remaining 2 bights.So,, by observe 4 bights of polaroid by 2 steps, without using 4 video cameras as observation unit, also can observe four all angles of polaroid.More, in observing operation, as long as finally can observe four all angles of polaroid, so in 4 bights of polaroid, be not limited to especially the 1st step and observe which bight.But, in the 2nd step, in order to take respectively, in above-mentioned the 1st step, not do not observe, remaining 2 bights, consider the words that the position of 2 video cameras and/or the position of polaroid are moved, for example, at fixed cameras, when being moved with respect to video camera, observes polaroid in the situation at four angles of polaroid, or, in the situation that observe four angles of polaroid when line-scan camera being moved in the direction of 180 ° with respect to the moving direction of polaroid, in 4 bights of polaroid, by 2 bights towards the place ahead of the moving direction of polaroid in the 1st step observation, 2 bights in the 2nd step observation towards the rear of the moving direction of polaroid, can observe efficiently four all angles of polaroid.
(1-2. operational process)
Operational process is to use the observed data obtaining in observing operation, calculates the operation of laminating side-play amount, size and the verticality of polaroid.Here, for using the observed data obtaining in observing operation to calculate " the laminating side-play amount " of polaroid, the method for " size " and " verticality ", consult Fig. 2～4 and describe particularly.
The figure that example describe of Fig. 2 to the calculation method of polaroid " laminating side-play amount ".For example, on liquid crystal panel 2, suppose that the position that should be fitted in 4 bights (top corner part A ', the B ', C ' and the D ' that represent) at polaroid 3 exists reference point (reference point A, the B, C and the D that represent in Fig. 2) in Fig. 2, " the laminating side-play amount " of polaroid can be from the datum line that links such reference point (for example, the datum line AB and the AD that in Fig. 2, represent) for example, calculate with the distance between the limit (the limit A ' B ' and the A ' D ' that, represent in Fig. 2) of polaroid 3.
For example, the bight A ' that calculates polaroid 3 is during with respect to " the laminating side-play amount " of the reference point A of liquid crystal panel 2, can calculate distance between the datum line AD of liquid crystal panel 2 and the limit A ' D ' of polaroid 3 as the laminating side-play amount a of the horizontal direction of polaroid 3.Similarly, can calculate distance between the datum line AB of liquid crystal panel 2 and the limit A ' B ' of polaroid 3 as the laminating side-play amount b of the longitudinal direction of polaroid 3.
Fig. 3 is the figure of an example of calculation method of " size " of explanation polaroid." size " of polaroid for example, in liquid crystal panel 2, suppose that the position that should be fitted in 4 bights (top corner part A ', the B ', C ' and the D ' that represent) at polaroid 3 exists reference point (reference point A, the B, C and the D that represent in Fig. 3) in Fig. 3, distance between known reference point from liquid crystal panel 2 (for example, the reference point that represents in Fig. 3 between distance L) and with respect to " the laminating side-play amount " in the bight of the polaroid 3 of the reference point of liquid crystal panel 2, can calculate the size of polaroid 3.
For example, while calculating " size " (the top corner part A ' representing and size between top corner part B ') of the horizontal direction of polaroid 3 in Fig. 3, calculate distance between the datum line AD of liquid crystal panel 2 and the limit A ' D of polaroid 3 as laminating side-play amount a.Similarly, calculate distance between the datum line BC of liquid crystal panel 2 and the limit B ' C ' of polaroid 3 as side-play amount c.Then, by the distance L between reference point, deduct laminating side-play amount a and laminating side-play amount c, can calculate " size " of polaroid.That is " size " of the horizontal direction of the polaroid 3, representing at Fig. 3 can be used following formula (1) to calculate.
[formula 1]
Distance L between the size=reference point of polaroid-(laminating side-play amount a+ laminating side-play amount c) ... (1)
Fig. 4 is the figure of an example of calculation method of " verticality " of explanation polaroid.For example, in liquid crystal panel 2, suppose that the position that should be fitted in 4 bights (bight A ', the B ', C ' and the D ' that represent in Fig. 4) at polaroid 3 exists reference point (reference point A, the B, C and the D that represent in Fig. 4), " verticality " of polaroid can be calculated verticality from the depth of parallelism linking between the datum line of such reference point and the limit of polaroid 3.
For example, while calculating " verticality " of bight A ' of polaroid 3, first, calculate the depth of parallelism ab between the datum line AB of liquid crystal panel 2 and the limit A ' B ' of polaroid 3.Depth of parallelism ab can be used following formula (2) to calculate.
[formula 2]
More, in formula (2), " laminating side-play amount b2 " is for example, to calculate to the distance of the limit A ' B ' of polaroid 3 as the arbitrfary point (the some B1, representing in Fig. 4) from datum line AB.Similarly, " laminating side-play amount b1 " is for example, to calculate to the distance of the limit A ' B ' of polaroid 3 as other the arbitrfary point (the some A1, representing in Fig. 4) from datum line AB." reference range L1 " is for example, distance between 2 points arbitrarily (the some B1, representing in Fig. 4 and some A1) on datum line AB.
Similarly, calculate the depth of parallelism ad between the datum line AD of liquid crystal panel 2 and the limit A ' D ' of polaroid 3.Depth of parallelism ad can be used following formula (3) to calculate.
[formula 3]
More, in formula (3), " laminating side-play amount a2 " is for example, to calculate to the distance of the limit A ' D ' of polaroid 3 as the arbitrfary point (the some D2, representing in Fig. 4) from datum line AD.Similarly, " laminating side-play amount a1 " is for example, to calculate to the distance of the limit A ' D ' of polaroid 3 as other the arbitrfary point (the some A2, representing in Fig. 4) from datum line AD." reference range L2 " is for example, distance between 2 points arbitrarily (the some D2, representing in Fig. 4 and some A2) on datum line AD.
From depth of parallelism ab and depth of parallelism ad, calculate the verticality D of the bight A ' of polaroid 3.Verticality D can be used following formula (4) to calculate.
[formula 4]
Squareness D=90 °+depth of parallelism ab+ depth of parallelism ad ... (4)
As an example of the present invention, for example, use possesses and can calculate " the laminating side-play amount " of polaroid, the arithmetic element of the software of " size " and " verticality " according to above-mentioned calculation method, can calculate efficiently " laminating side-play amount ", " size " and " verticality " of polaroid.More, as above-mentioned " arithmetic element ", as long as have, can calculate " the laminating side-play amount " of polaroid, the function of " size " and " verticality " according to above-mentioned calculation method, be not limited to above-mentioned formation.
(other operation of 1-3.)
Inspection method of the present invention, except above-mentioned observation operation and above-mentioned operational process, may further include and use the result obtaining in this operational process, judges the whether qualified judgement operation of Anawgy accuracy of polaroid.
In judging operation, use the result of calculating in above-mentioned operational process, laminating side-play amount, size and the verticality of polaroid are in specialized range, and the Anawgy accuracy that is judged to be polaroid is the certified products in regulation.For example, above-mentioned " laminating side-play amount " be ± and 300 μ m, above-mentioned " size " are at the size ± 300 μ m of regulation with interior and above-mentioned " verticality " in 90 ° ± 0.05 ° time, and the Anawgy accuracy of judging polaroid is the certified products in regulation.On the other hand, any one in laminating side-play amount, size and the verticality of polaroid be outside the scope of afore mentioned rules time, the unacceptable product of the Anawgy accuracy that is judged to be polaroid outside regulation.
As an example of the present invention, for example, use possesses the decision method of the judgement software in above-mentioned specialized range of laminating side-play amount, size and verticality that utilizes the result calculate in above-mentioned operational process to judge polaroid, can judge efficiently that whether qualified the Anawgy accuracy of polaroid is.More, as above-mentioned " decision method ", as long as there is the certified products of judgement and the such function of unacceptable product, be not limited to above-mentioned formation.
Again, inspection method of the present invention may further include uses the whether qualified result of judging in above-mentioned judgement operation, by the classification operation of certified products and unacceptable product classification.
As an example of the present invention, for example, use to possess and utilize the whether qualified result judged in above-mentioned judgement operation by the classify taxon of such function of certified products and unacceptable product, can be efficiently by certified products and unacceptable product classification.More, as above-mentioned " taxon ", as long as have certified products and unacceptable product such function of classifying, do not limit especially.
Inspection method of the present invention also can combine with the manufacture method of liquid crystal indicator.Can be specifically, in the manufacture method of liquid crystal indicator, length with regulation when unreeling the polaroid blank of long size is cut off polaroid blank, and polaroid is fitted on liquid crystal panel, after this bonding process, can combine inspection method of the present invention.By combine inspection method of the present invention in the manufacture method of liquid crystal indicator, owing to manufacturing liquid crystal indicator while the Anawgy accuracy that checks polaroid, so can be so that reduced by the fraction defective of the bad liquid crystal indicator causing of laminating of polaroid.Consequently, can improve throughput rate and the yield rate of end article.
(the 2. Anawgy accuracy testing fixture of polaroid)
The Anawgy accuracy testing fixture of the polaroid the present invention relates to (hereinafter referred to as " testing fixture of the present invention ") is that the polaroid blank while cutting off long size is fitted to the testing fixture that the Anawgy accuracy of the polaroid on liquid crystal panel checks, is for by the specific testing fixture of above-mentioned inspection method of the present invention.Specifically, its be configured to possess observe four all angles be fitted in the above-mentioned polaroid on above-mentioned liquid crystal panel observation unit and, use the observed data obtaining by above-mentioned observational technique to calculate the arithmetic element of laminating side-play amount, size and the verticality of above-mentioned polaroid.
Testing fixture of the present invention, except above-mentioned observation unit and above-mentioned arithmetic element, may further include the whether qualified identifying unit of Anawgy accuracy that uses the result obtaining by above-mentioned operational method to judge above-mentioned polaroid.As this identifying unit, for example, use possesses the identifying unit of the judgement software in above-mentioned specialized range of laminating side-play amount, size and verticality that utilizes the result calculate by above-mentioned arithmetic element to judge polaroid, can judge efficiently that whether qualified the Anawgy accuracy of polaroid is.
Again, testing fixture of the present invention may further include and uses the whether qualified result of judging by above-mentioned identifying unit, by the taxon of certified products and unacceptable product classification.As this taxon, for example, use to possess and utilize the whether qualified result judged by above-mentioned identifying unit by the classify taxon of such function of certified products and unacceptable product, can be efficiently by certified products and unacceptable product classification.
More, about above-mentioned " observation unit ", above-mentioned " arithmetic element ", above-mentioned " identifying unit " and above-mentioned " taxon ", in the item of above-mentioned " the 1. Anawgy accuracy inspection method of polaroid ", be illustrated.
More, testing fixture of the present invention also can be combined in the manufacturing installation of liquid crystal indicator.Specifically, in the manufacturing installation of liquid crystal indicator, also can combine testing fixture of the present invention, the length that can be regulation by the polaroid cutting ingot of long size is on one side fitted in polaroid on liquid crystal panel on one side, checks afterwards the Anawgy accuracy of polaroid.By testing fixture is combined in the manufacturing installation of liquid crystal indicator, while can check that the Anawgy accuracy of polaroid manufactures liquid crystal indicator.At this moment, as above-mentioned observation unit, use line-scan camera, in the manufacturing installation of liquid crystal indicator, can, when conveying is fitted with the liquid crystal panel of polaroid, observe four angles of (shooting) polaroid.
According to the Anawgy accuracy inspection method of the polaroid the present invention relates to, in above-mentioned observation operation, be preferably the plural angle in four angles simultaneously observing the above-mentioned polaroid that is fitted in above-mentioned liquid crystal panel.
According to above-mentioned formation, due to the plural angle of observing in four angles of polaroid simultaneously, can check efficiently the Anawgy accuracy of polaroid.
According to the Anawgy accuracy inspection method of the polaroid the present invention relates to, be preferably the result that further comprises that use obtains in above-mentioned operational process, judge the whether qualified judgement operation of Anawgy accuracy of above-mentioned polaroid.
In above-mentioned judgement operation, due to use in above-mentioned operational process result judge and Anawgy accuracy whether qualified of above-mentioned polaroid so can only select the guaranteed certified products of Anawgy accuracy of polaroid, be sent to next operation.
Again, in order to solve above-mentioned problem, the Anawgy accuracy testing fixture of the polaroid the present invention relates to is while the polaroid blank that cuts off long size, to check the testing fixture of the Anawgy accuracy of the polaroid that is fitted in liquid crystal panel, have, for observe the above-mentioned polaroid being fitted on above-mentioned liquid crystal panel four all angles observation unit and, use the observed data obtain by above-mentioned observation unit to calculate the arithmetic element of laminating side-play amount, size and the verticality of above-mentioned polaroid.
According to the Anawgy accuracy testing fixture of the polaroid the present invention relates to, above-mentioned observation unit is preferably for observe the unit at the plural angle at four angles that are fitted in the above-mentioned polaroid on above-mentioned liquid crystal panel simultaneously.
According to above-mentioned formation, due to the plural angle that can observe by observation unit in four angles of polaroid simultaneously, so can check efficiently Anawgy accuracy.
According to the Anawgy accuracy testing fixture of the polaroid the present invention relates to, be preferably and further comprise and using by the result obtaining in above-mentioned arithmetic element, judge the whether qualified identifying unit of Anawgy accuracy of above-mentioned polaroid.
According to above-mentioned formation, can only select to be judged as by identifying unit the guaranteed liquid crystal panel of Anawgy accuracy of the polaroid of certified products, be sent to next operation.
The present invention is not limited in above-mentioned each example, in the scope disclosing in the claims, can there be various distortion, the technological means disclosing respectively be suitably combined to the example obtaining be also included in the technical scope of the present invention in different examples.
Practicality in industry
According to the present invention, owing to can guaranteeing the Anawgy accuracy of polaroid, so can improve throughput rate and the yield rate of end article.Owing to checking the size of polaroid and the verticality of polaroid when checking the laminating side-play amount of polaroid, so can reduce, check operation quantity again.Consequently, can cut down labour and the cost that Anawgy accuracy inspection relates to.Therefore, the present invention can be widely used in polaroid being fitted to the various industries of manufacturing the liquid crystal indicators such as the portable equipments such as laptop, mobile phone or large-scale tv machine on liquid crystal panel.
The explanation of symbol
1 smear camera (observation unit)
2 liquid crystal panels
3 polaroids
Claims (6)
1. an inspection method for the Anawgy accuracy of polaroid, described inspection method is the method for cutting off the polaroid blank of long size and checking the Anawgy accuracy that is fitted in the polaroid on liquid crystal panel, it is characterized in that, comprises following operation:
Observation is fitted in the observation operation in 4 all bights of the polaroid on described liquid crystal panel; And
Use is assumed to be the observed data in 4 bights of the polaroid that is present in 4 reference points of the position that 4 bights of polaroid should be fitted and obtains in described observation operation on described liquid crystal panel, calculate laminating side-play amount as the degree of the laminating skew of the described polaroid on described liquid crystal panel, as the operational process of the verticality in the length of throughput direction of polaroid or the size of length of the Width of polaroid and the bight of polaroid
In described operational process,
Calculate datum line between the reference point of connecting fluid crystal panel with the distance on the limit of polaroid corresponding to described datum line as described laminating side-play amount,
By the reference point spacing from liquid crystal panel, deduct with respect to two bights of the polaroid of described reference point to the laminating side-play amount of the datum line with adjacent, vertical with datum line between described reference point separately and calculate the size of described polaroid,
From the depth of parallelism on the limit of described datum line and polaroid, calculate the verticality in the bight of described polaroid.
2. the Anawgy accuracy inspection method of polaroid as claimed in claim 1, is characterized in that, in described observation operation, observes the plural angle in 4 bights that are fitted in the described polaroid on described liquid crystal panel simultaneously.
3. the Anawgy accuracy inspection method of the polaroid as described in claim 1 or 2, is characterized in that, further comprises and use the result obtaining in described operational process, judges the whether qualified judgement operation of Anawgy accuracy of described polaroid.
4. a testing fixture for the Anawgy accuracy of polaroid, described testing fixture is the testing fixture that cuts off the polaroid blank of long size and check the Anawgy accuracy that is fitted in the polaroid on liquid crystal panel, it is characterized in that having:
For observing the observation unit in 4 all bights of the described polaroid being fitted on described liquid crystal panel; And
Use is assumed to be the observed data in 4 bights of the polaroid that is present in 4 reference points of the position that 4 bights of polaroid should be fitted and obtains by described observation unit on described liquid crystal panel, calculate laminating side-play amount as the degree of the laminating skew of the described polaroid on described liquid crystal panel, as the arithmetic element of the verticality in the length of throughput direction of polaroid or the size of length of the Width of polaroid and the bight of polaroid
In described arithmetic element,
Calculate datum line between the reference point of connecting fluid crystal panel with the distance on the limit of polaroid corresponding to described datum line as described laminating side-play amount,
By the reference point spacing from liquid crystal panel, deduct with respect to two bights of the polaroid of described reference point to the laminating side-play amount of the datum line with adjacent, vertical with datum line between described reference point separately and calculate the size of described polaroid,
From the depth of parallelism on the limit of described datum line and polaroid, calculate the verticality in the bight of described polaroid.
5. the Anawgy accuracy testing fixture of polaroid as claimed in claim 4, is characterized in that, described observation unit is for observe the unit at the plural angle in 4 bights that are fitted in the described polaroid on described liquid crystal panel simultaneously.
6. the Anawgy accuracy testing fixture of the polaroid as described in claim 4 or 5, is characterized in that, further has and uses the result obtaining by described arithmetic element, judges the whether qualified identifying unit of Anawgy accuracy of described polaroid.
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2010062899A JP4774123B1 (en) | 2010-03-18 | 2010-03-18 | Method for inspecting bonding accuracy of polarizing plate and apparatus for inspecting bonding accuracy |
| JP2010-062899 | 2010-03-18 | ||
| PCT/JP2011/055544 WO2011114969A1 (en) | 2010-03-18 | 2011-03-09 | Polarizer bonding precision inspection method and bonding precision inspection device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102395919A CN102395919A (en) | 2012-03-28 |
| CN102395919B true CN102395919B (en) | 2014-04-16 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201180001140.5A Expired - Fee Related CN102395919B (en) | 2010-03-18 | 2011-03-09 | Polarizer bonding precision inspection method and bonding precision inspection device |
Country Status (5)
| Country | Link |
|---|---|
| JP (1) | JP4774123B1 (en) |
| KR (1) | KR101124104B1 (en) |
| CN (1) | CN102395919B (en) |
| TW (1) | TWI357969B (en) |
| WO (1) | WO2011114969A1 (en) |
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| JP2013075340A (en) * | 2011-09-30 | 2013-04-25 | Asahi Glass Co Ltd | Method for observing and system for observing glass plate polishing apparatus |
| WO2013077353A1 (en) * | 2011-11-21 | 2013-05-30 | 住友化学株式会社 | Optical member laminate manufacturing system, manufacturing method, and recording medium |
| JP5592587B2 (en) * | 2012-02-29 | 2014-09-17 | 住友化学株式会社 | Optical display device production system and optical display device production method |
| TWI582491B (en) * | 2012-08-08 | 2017-05-11 | 住友化學股份有限公司 | Manufacturing system of optical display device and manufacturing method of optical display device |
| KR102044588B1 (en) * | 2012-09-07 | 2019-11-13 | 스미또모 가가꾸 가부시키가이샤 | Device for producing optical member pasted body |
| KR102120507B1 (en) * | 2012-10-12 | 2020-06-08 | 스미또모 가가꾸 가부시키가이샤 | Detection apparatus, method for manufacturing optical member-bonded body, and method for manufacturing optical member-bonded body |
| CN104854502B (en) * | 2013-01-10 | 2017-08-15 | 住友化学株式会社 | The manufacture device of optical display means and the production system of optical display means |
| JP2014206714A (en) * | 2013-03-21 | 2014-10-30 | 住友化学株式会社 | Manufacturing system and manufacturing method for optical display device |
| JP5724146B2 (en) * | 2013-05-16 | 2015-05-27 | 住友化学株式会社 | Manufacturing system, manufacturing method and recording medium for optical member bonded body |
| JP6037564B2 (en) * | 2013-06-24 | 2016-12-07 | 住友化学株式会社 | Optical display device production system |
| JP5943354B2 (en) * | 2013-07-23 | 2016-07-05 | 住友化学株式会社 | Optical display device production system |
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| JP6529250B2 (en) * | 2014-12-18 | 2019-06-12 | 日東電工株式会社 | Optical display panel manufacturing method and optical display panel manufacturing system |
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| JP2017151164A (en) * | 2016-02-22 | 2017-08-31 | 住友化学株式会社 | Polarizing plate and image display device |
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| CN109212792B (en) * | 2018-07-26 | 2021-04-06 | 深圳同兴达科技股份有限公司 | Detection method for preventing lamination deviation of full-lamination two-in-one module |
| CN109323654B (en) * | 2018-11-14 | 2023-10-27 | 张家港康得新光电材料有限公司 | Detection device and detection method |
| CN111928792B (en) * | 2020-07-15 | 2022-04-29 | 大族激光科技产业集团股份有限公司 | Method and system for detecting inscribed cutting precision of polaroid on surface of LCD panel |
| JP2022090247A (en) * | 2020-12-07 | 2022-06-17 | 日東電工株式会社 | Detection method for marginal portion of optical film |
| JP2022090281A (en) | 2020-12-07 | 2022-06-17 | 日東電工株式会社 | Detection method for marginal portion of optical film |
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Also Published As
| Publication number | Publication date |
|---|---|
| JP4774123B1 (en) | 2011-09-14 |
| KR20110108391A (en) | 2011-10-05 |
| JP2011197281A (en) | 2011-10-06 |
| KR101124104B1 (en) | 2012-03-21 |
| CN102395919A (en) | 2012-03-28 |
| TWI357969B (en) | 2012-02-11 |
| TW201139973A (en) | 2011-11-16 |
| WO2011114969A1 (en) | 2011-09-22 |
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