TWI354347B - Fast substrate loading on polishing head without m - Google Patents
Fast substrate loading on polishing head without m Download PDFInfo
- Publication number
- TWI354347B TWI354347B TW096119819A TW96119819A TWI354347B TW I354347 B TWI354347 B TW I354347B TW 096119819 A TW096119819 A TW 096119819A TW 96119819 A TW96119819 A TW 96119819A TW I354347 B TWI354347 B TW I354347B
- Authority
- TW
- Taiwan
- Prior art keywords
- substrate
- elastic film
- base member
- chamber
- central chamber
- Prior art date
Links
- 239000000758 substrate Substances 0.000 title claims description 162
- 238000005498 polishing Methods 0.000 title description 4
- 238000000034 method Methods 0.000 claims description 39
- 239000012528 membrane Substances 0.000 claims description 13
- 239000000463 material Substances 0.000 claims description 2
- 235000013405 beer Nutrition 0.000 claims 1
- 238000013022 venting Methods 0.000 claims 1
- 239000012530 fluid Substances 0.000 description 21
- 239000000126 substance Substances 0.000 description 3
- 238000010009 beating Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000005086 pumping Methods 0.000 description 2
- 238000005096 rolling process Methods 0.000 description 2
- 230000004888 barrier function Effects 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 238000005336 cracking Methods 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005242 forging Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000001465 metallisation Methods 0.000 description 1
- 238000010408 sweeping Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6838—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/27—Work carriers
- B24B37/30—Work carriers for single side lapping of plane surfaces
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T279/00—Chucks or sockets
- Y10T279/11—Vacuum
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/53—Means to assemble or disassemble
- Y10T29/5313—Means to assemble electrical device
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US81041506P | 2006-06-02 | 2006-06-02 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200807615A TW200807615A (en) | 2008-02-01 |
| TWI354347B true TWI354347B (en) | 2011-12-11 |
Family
ID=38802256
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW096119819A TWI354347B (en) | 2006-06-02 | 2007-06-01 | Fast substrate loading on polishing head without m |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US7527271B2 (enExample) |
| JP (1) | JP2009539626A (enExample) |
| TW (1) | TWI354347B (enExample) |
| WO (1) | WO2007143566A2 (enExample) |
Families Citing this family (36)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2898657B1 (fr) * | 2006-03-16 | 2008-04-18 | Novatec Sa | Procede de mise en oeuvre d'un support intercalaire universel |
| JP5074125B2 (ja) * | 2007-08-09 | 2012-11-14 | リンテック株式会社 | 固定治具並びにワークの処理方法 |
| WO2009066351A1 (ja) * | 2007-11-20 | 2009-05-28 | Shin-Etsu Handotai Co., Ltd. | 研磨ヘッド及び研磨装置 |
| KR100931197B1 (ko) * | 2008-02-22 | 2009-12-10 | 주식회사 실트론 | 웨이퍼 연마장치용 헤드 어셈블리 |
| DE102008018536B4 (de) * | 2008-04-12 | 2020-08-13 | Erich Thallner | Vorrichtung und Verfahren zum Aufbringen und/oder Ablösen eines Wafers auf einen/von einem Träger |
| JP5390807B2 (ja) * | 2008-08-21 | 2014-01-15 | 株式会社荏原製作所 | 研磨方法および装置 |
| US8454408B2 (en) | 2008-11-26 | 2013-06-04 | Applied Materials, Inc. | Load cup substrate sensing |
| AT516595B1 (de) * | 2009-03-05 | 2020-10-15 | Thallner Erich | Vorrichtung und Verfahren zum Aufbringen und/oder Ablösen eines Wafers auf einen/von einem Träger |
| US8460067B2 (en) | 2009-05-14 | 2013-06-11 | Applied Materials, Inc. | Polishing head zone boundary smoothing |
| JP5648954B2 (ja) * | 2010-08-31 | 2015-01-07 | 不二越機械工業株式会社 | 研磨装置 |
| KR101801264B1 (ko) * | 2011-06-13 | 2017-11-27 | 삼성전자주식회사 | 반도체 제조 장치 및 이를 이용한 반도체 패키지 방법 |
| US10099327B2 (en) * | 2012-08-28 | 2018-10-16 | Nissan Motor Co., Ltd. | Device for press-fitting oil seal |
| US8998678B2 (en) | 2012-10-29 | 2015-04-07 | Wayne O. Duescher | Spider arm driven flexible chamber abrading workholder |
| US8998677B2 (en) | 2012-10-29 | 2015-04-07 | Wayne O. Duescher | Bellows driven floatation-type abrading workholder |
| US9233452B2 (en) | 2012-10-29 | 2016-01-12 | Wayne O. Duescher | Vacuum-grooved membrane abrasive polishing wafer workholder |
| US8845394B2 (en) | 2012-10-29 | 2014-09-30 | Wayne O. Duescher | Bellows driven air floatation abrading workholder |
| US9039488B2 (en) | 2012-10-29 | 2015-05-26 | Wayne O. Duescher | Pin driven flexible chamber abrading workholder |
| US9604339B2 (en) | 2012-10-29 | 2017-03-28 | Wayne O. Duescher | Vacuum-grooved membrane wafer polishing workholder |
| US9011207B2 (en) | 2012-10-29 | 2015-04-21 | Wayne O. Duescher | Flexible diaphragm combination floating and rigid abrading workholder |
| US9199354B2 (en) | 2012-10-29 | 2015-12-01 | Wayne O. Duescher | Flexible diaphragm post-type floating and rigid abrading workholder |
| WO2014145456A1 (en) * | 2013-03-15 | 2014-09-18 | Rudolph Technologies, Inc. | Flexible handling system for semiconductor substrates |
| JP6454326B2 (ja) * | 2014-04-18 | 2019-01-16 | 株式会社荏原製作所 | 基板処理装置、基板処理システム、および基板処理方法 |
| CN107000158B (zh) * | 2014-12-19 | 2020-11-06 | 应用材料公司 | 用于化学机械抛光工具的部件 |
| KR102346786B1 (ko) * | 2015-07-03 | 2022-01-04 | 주식회사 케이씨텍 | 화학 기계적 연마 시스템의 웨이퍼 로딩 장치 |
| KR102461598B1 (ko) * | 2015-12-18 | 2022-11-01 | 주식회사 케이씨텍 | 화학 기계적 연마 시스템의 기판 로딩 장치 |
| US10510563B2 (en) * | 2016-04-15 | 2019-12-17 | Taiwan Semiconductor Manufacturing Company Ltd. | Wafer carrier assembly |
| JP6650345B2 (ja) * | 2016-05-26 | 2020-02-19 | 日本特殊陶業株式会社 | 基板保持装置及びその製造方法 |
| US10618447B2 (en) * | 2016-10-17 | 2020-04-14 | Walmart Apollo, Llc | Delivery vehicle and systems or parts thereof |
| KR102330274B1 (ko) * | 2017-05-31 | 2021-11-24 | 주식회사 케이씨텍 | 기판 거치대 및 이를 구비한 기판 처리 장치 |
| US10926378B2 (en) | 2017-07-08 | 2021-02-23 | Wayne O. Duescher | Abrasive coated disk islands using magnetic font sheet |
| CN110142689B (zh) * | 2019-04-17 | 2021-09-14 | 杭州众硅电子科技有限公司 | 一种晶圆装载支架、晶圆装载系统及晶圆装片方法 |
| US11691241B1 (en) * | 2019-08-05 | 2023-07-04 | Keltech Engineering, Inc. | Abrasive lapping head with floating and rigid workpiece carrier |
| US11945073B2 (en) * | 2019-08-22 | 2024-04-02 | Applied Materials, Inc. | Dual membrane carrier head for chemical mechanical polishing |
| US11484987B2 (en) | 2020-03-09 | 2022-11-01 | Applied Materials, Inc. | Maintenance methods for polishing systems and articles related thereto |
| US20230207326A1 (en) * | 2021-12-29 | 2023-06-29 | Canon Kabushiki Kaisha | Planarization process, apparatus and method of manufacturing an article |
| US20240363371A1 (en) * | 2023-04-28 | 2024-10-31 | Applied Materials, Inc. | Substrate cleaning improvement |
Family Cites Families (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5423716A (en) * | 1994-01-05 | 1995-06-13 | Strasbaugh; Alan | Wafer-handling apparatus having a resilient membrane which holds wafer when a vacuum is applied |
| US5762751A (en) * | 1995-08-17 | 1998-06-09 | Semitool, Inc. | Semiconductor processor with wafer face protection |
| US6183354B1 (en) | 1996-11-08 | 2001-02-06 | Applied Materials, Inc. | Carrier head with a flexible membrane for a chemical mechanical polishing system |
| US6056632A (en) * | 1997-02-13 | 2000-05-02 | Speedfam-Ipec Corp. | Semiconductor wafer polishing apparatus with a variable polishing force wafer carrier head |
| US6398621B1 (en) * | 1997-05-23 | 2002-06-04 | Applied Materials, Inc. | Carrier head with a substrate sensor |
| US5964653A (en) * | 1997-07-11 | 1999-10-12 | Applied Materials, Inc. | Carrier head with a flexible membrane for a chemical mechanical polishing system |
| US6080050A (en) * | 1997-12-31 | 2000-06-27 | Applied Materials, Inc. | Carrier head including a flexible membrane and a compliant backing member for a chemical mechanical polishing apparatus |
| US5993302A (en) | 1997-12-31 | 1999-11-30 | Applied Materials, Inc. | Carrier head with a removable retaining ring for a chemical mechanical polishing apparatus |
| US6152808A (en) * | 1998-08-25 | 2000-11-28 | Micron Technology, Inc. | Microelectronic substrate polishing systems, semiconductor wafer polishing systems, methods of polishing microelectronic substrates, and methods of polishing wafers |
| US6159079A (en) * | 1998-09-08 | 2000-12-12 | Applied Materials, Inc. | Carrier head for chemical mechanical polishing a substrate |
| US6165058A (en) * | 1998-12-09 | 2000-12-26 | Applied Materials, Inc. | Carrier head for chemical mechanical polishing |
| US6162116A (en) | 1999-01-23 | 2000-12-19 | Applied Materials, Inc. | Carrier head for chemical mechanical polishing |
| US6156124A (en) | 1999-06-18 | 2000-12-05 | Applied Materials, Inc. | Wafer transfer station for a chemical mechanical polisher |
| JP3816297B2 (ja) * | 2000-04-25 | 2006-08-30 | 株式会社荏原製作所 | 研磨装置 |
| US6722965B2 (en) * | 2000-07-11 | 2004-04-20 | Applied Materials Inc. | Carrier head with flexible membranes to provide controllable pressure and loading area |
| US6857945B1 (en) * | 2000-07-25 | 2005-02-22 | Applied Materials, Inc. | Multi-chamber carrier head with a flexible membrane |
| DE60138343D1 (de) * | 2000-07-31 | 2009-05-28 | Ebara Corp | Substrathalter und Poliervorrichtung |
| US6848980B2 (en) * | 2001-10-10 | 2005-02-01 | Applied Materials, Inc. | Vibration damping in a carrier head |
| US6652362B2 (en) * | 2000-11-23 | 2003-11-25 | Samsung Electronics Co., Ltd. | Apparatus for polishing a semiconductor wafer and method therefor |
| JP3862065B2 (ja) * | 2001-11-29 | 2006-12-27 | 信越半導体株式会社 | ウェーハ研磨ヘッド |
| US7101253B2 (en) | 2002-08-27 | 2006-09-05 | Applied Materials Inc. | Load cup for chemical mechanical polishing |
| US6905392B2 (en) * | 2003-06-30 | 2005-06-14 | Freescale Semiconductor, Inc. | Polishing system having a carrier head with substrate presence sensing |
| US7044832B2 (en) | 2003-11-17 | 2006-05-16 | Applied Materials | Load cup for chemical mechanical polishing |
| US7255771B2 (en) | 2004-03-26 | 2007-08-14 | Applied Materials, Inc. | Multiple zone carrier head with flexible membrane |
| US7210991B1 (en) * | 2006-04-03 | 2007-05-01 | Applied Materials, Inc. | Detachable retaining ring |
-
2007
- 2007-06-01 WO PCT/US2007/070243 patent/WO2007143566A2/en not_active Ceased
- 2007-06-01 US US11/757,069 patent/US7527271B2/en not_active Expired - Fee Related
- 2007-06-01 TW TW096119819A patent/TWI354347B/zh active
- 2007-06-01 JP JP2009513475A patent/JP2009539626A/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| TW200807615A (en) | 2008-02-01 |
| WO2007143566A3 (en) | 2008-09-18 |
| US20070289124A1 (en) | 2007-12-20 |
| JP2009539626A (ja) | 2009-11-19 |
| WO2007143566A2 (en) | 2007-12-13 |
| US7527271B2 (en) | 2009-05-05 |
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