TWI341448B - Method , apparatus and computer-readable medium for compensating for temperature drift in semiconductor processes and circuitry - Google Patents

Method , apparatus and computer-readable medium for compensating for temperature drift in semiconductor processes and circuitry

Info

Publication number
TWI341448B
TWI341448B TW093129420A TW93129420A TWI341448B TW I341448 B TWI341448 B TW I341448B TW 093129420 A TW093129420 A TW 093129420A TW 93129420 A TW93129420 A TW 93129420A TW I341448 B TWI341448 B TW I341448B
Authority
TW
Taiwan
Prior art keywords
compensating
circuitry
computer
readable medium
temperature drift
Prior art date
Application number
TW093129420A
Other languages
English (en)
Other versions
TW200519558A (en
Inventor
Stefan Marinca
Thomas G O'dwyer
Original Assignee
Analog Devices Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Analog Devices Inc filed Critical Analog Devices Inc
Publication of TW200519558A publication Critical patent/TW200519558A/zh
Application granted granted Critical
Publication of TWI341448B publication Critical patent/TWI341448B/zh

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F1/00—Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements
    • H03F1/30—Modifications of amplifiers to reduce influence of variations of temperature or supply voltage or other physical parameters
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45—Differential amplifiers
    • H03F3/45071—Differential amplifiers with semiconductor devices only
    • H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
    • H03F3/45179—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using MOSFET transistors as the active amplifying circuit
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2200/00—Indexing scheme relating to amplifiers
    • H03F2200/447—Indexing scheme relating to amplifiers the amplifier being protected to temperature influence

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Control Of Electrical Variables (AREA)
  • Semiconductor Integrated Circuits (AREA)
TW093129420A 2003-10-07 2004-09-29 Method , apparatus and computer-readable medium for compensating for temperature drift in semiconductor processes and circuitry TWI341448B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/680,265 US7543253B2 (en) 2003-10-07 2003-10-07 Method and apparatus for compensating for temperature drift in semiconductor processes and circuitry

Publications (2)

Publication Number Publication Date
TW200519558A TW200519558A (en) 2005-06-16
TWI341448B true TWI341448B (en) 2011-05-01

Family

ID=34394316

Family Applications (1)

Application Number Title Priority Date Filing Date
TW093129420A TWI341448B (en) 2003-10-07 2004-09-29 Method , apparatus and computer-readable medium for compensating for temperature drift in semiconductor processes and circuitry

Country Status (5)

Country Link
US (1) US7543253B2 (zh)
JP (1) JP4523942B2 (zh)
CN (1) CN1864116B (zh)
TW (1) TWI341448B (zh)
WO (1) WO2005033820A1 (zh)

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US10734298B2 (en) * 2018-06-22 2020-08-04 Microchip Technology Incorporated Methods of reinforcing integrated circuitry of semiconductor devices and related semiconductor devices and packages
CN109375697B (zh) * 2018-12-24 2023-10-20 中国电子科技集团公司第五十八研究所 一种温漂修调电路
KR20210158223A (ko) * 2020-06-23 2021-12-30 에스케이하이닉스 주식회사 반도체 장치 및 이의 동작 방법
CN111565049B (zh) * 2020-07-20 2020-10-23 微龛(广州)半导体有限公司 二进制加权电流产生电路及数模转换器
CN115574962B (zh) * 2021-06-21 2024-02-23 辉芒微电子(深圳)股份有限公司 一种温度传感器及其校正方法

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Also Published As

Publication number Publication date
WO2005033820A1 (en) 2005-04-14
JP2007514988A (ja) 2007-06-07
JP4523942B2 (ja) 2010-08-11
CN1864116A (zh) 2006-11-15
TW200519558A (en) 2005-06-16
US7543253B2 (en) 2009-06-02
US20050073290A1 (en) 2005-04-07
CN1864116B (zh) 2010-11-03

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