TWI328112B - - Google Patents

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Publication number
TWI328112B
TWI328112B TW093122272A TW93122272A TWI328112B TW I328112 B TWI328112 B TW I328112B TW 093122272 A TW093122272 A TW 093122272A TW 93122272 A TW93122272 A TW 93122272A TW I328112 B TWI328112 B TW I328112B
Authority
TW
Taiwan
Prior art keywords
sheet
product
position information
defect
strip
Prior art date
Application number
TW093122272A
Other languages
English (en)
Chinese (zh)
Other versions
TW200510710A (en
Inventor
Hiroshi Aizawa
Fumio Oono
Masaki Shikami
Original Assignee
Nitto Denko Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nitto Denko Corp filed Critical Nitto Denko Corp
Publication of TW200510710A publication Critical patent/TW200510710A/zh
Application granted granted Critical
Publication of TWI328112B publication Critical patent/TWI328112B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/59—Transmissivity
    • G01N21/5907—Densitometers
    • G01N2021/5957—Densitometers using an image detector type detector, e.g. CCD
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00722—Communications; Identification
    • G01N35/00732—Identification of carriers, materials or components in automatic analysers
    • G01N2035/00742—Type of codes
    • G01N2035/00752—Type of codes bar codes

Landscapes

  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Polarising Elements (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Liquid Crystal (AREA)
TW093122272A 2003-07-28 2004-07-26 Inspection method for sheet-shaped product and inspection system TW200510710A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003202349 2003-07-28

Publications (2)

Publication Number Publication Date
TW200510710A TW200510710A (en) 2005-03-16
TWI328112B true TWI328112B (ja) 2010-08-01

Family

ID=34587136

Family Applications (1)

Application Number Title Priority Date Filing Date
TW093122272A TW200510710A (en) 2003-07-28 2004-07-26 Inspection method for sheet-shaped product and inspection system

Country Status (3)

Country Link
KR (1) KR20050013491A (ja)
CN (1) CN100476414C (ja)
TW (1) TW200510710A (ja)

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007093411A (ja) * 2005-09-29 2007-04-12 Olympus Corp 基板検査装置
KR100788734B1 (ko) * 2005-12-05 2008-01-02 에버테크노 주식회사 편광필름 검사장치 및 방법
CN102717596B (zh) * 2007-02-21 2015-05-27 武藏工业株式会社 喷墨制膜方法
KR100899558B1 (ko) * 2007-05-03 2009-05-27 에버테크노 주식회사 편광필름 검사장치의 마킹제어방법
CN101413903B (zh) * 2007-10-19 2011-05-18 欣竑科技有限公司 电子组件料带冲孔机的导带异常检测法
EP2291101B1 (en) 2008-06-26 2013-05-15 Kingsdown, Inc. Methods and apparatuses for comfort/support analysis of a sleep support member
CN101368974B (zh) * 2008-09-28 2011-11-30 张德丰 可将缺陷信息打印在工件上的方法
JP2010262265A (ja) * 2009-04-10 2010-11-18 Nitto Denko Corp 光学フィルムロール原反、およびそれを用いた画像表示装置の製造方法
JP4503693B1 (ja) 2009-10-13 2010-07-14 日東電工株式会社 連続ウェブ形態の切込線入り光学フィルム積層体の連続ロール並びにその製造方法及び製造装置
JP5444092B2 (ja) * 2010-04-06 2014-03-19 株式会社日立ハイテクノロジーズ 検査方法およびその装置
EP2565038A4 (en) * 2010-04-30 2013-12-18 Komori Corp DEVICE AND METHOD FOR INSPECTING A PRINTED MATERIAL
CN102364332B (zh) * 2011-06-10 2014-07-30 乐金化学(南京)信息电子材料有限公司 偏光板移动检测装置及方法
CN103175840B (zh) * 2011-12-21 2016-01-20 北京兆维电子(集团)有限责任公司 基于机器视觉的胶印版材表面检测方法及系统
JP6182806B2 (ja) * 2013-06-04 2017-08-23 住友化学株式会社 欠陥検査システム及びフィルムの製造装置
JP6177017B2 (ja) * 2013-06-12 2017-08-09 住友化学株式会社 欠陥検査システム
TWI494560B (zh) * 2013-11-12 2015-08-01 Mpi Corp 晶粒選擇方法及壞晶地圖產生方法
CN103753969B (zh) * 2013-12-31 2016-03-02 苏州普丽盛包装材料有限公司 打标机
JP2017075936A (ja) * 2015-10-15 2017-04-20 住友化学株式会社 光学フィルムの製造装置及び製造方法
CN105424721B (zh) * 2015-12-11 2018-07-13 南京神源生智能科技有限公司 一种金属应变计缺陷自动检测系统
JP2018047655A (ja) * 2016-09-23 2018-03-29 三菱重工機械システム株式会社 シートの不良除去装置及び方法、シートの不良除去制御装置、段ボールシートの製造装置
CN107064175B (zh) * 2017-06-14 2019-11-01 福州东旭光电科技有限公司 离线式玻璃基板传送装置和玻璃基板缺陷检测装置
CN107703152A (zh) * 2017-10-27 2018-02-16 深圳精创视觉科技有限公司 光学膜缺点自动标示装置
CN108398344B (zh) * 2018-02-26 2020-07-31 合肥工业大学 一种可原位观测材料内部疲劳裂纹生长的摩擦磨损试验装置
CN109540902A (zh) * 2018-11-14 2019-03-29 苏州襄行软件有限公司 一种偏光片瑕疵检测系统及其检测方法
CN109540797B (zh) * 2018-12-21 2021-12-10 东华大学 纤维束排列均匀性和断裂形态的反射式测量装置与方法
CN113507847B (zh) * 2019-03-05 2023-01-20 菲利普莫里斯生产公司 检查台和用于检查片材材料的方法
CN110146506B (zh) * 2019-04-09 2022-11-22 恒美光电股份有限公司 一种偏光板自动光学检查机检测规格准确度调整方法
CN110090808A (zh) * 2019-05-17 2019-08-06 智翼博智能科技(苏州)有限公司 偏光片全自动投料外观检测设备及检测方法
TWI828544B (zh) * 2023-02-22 2024-01-01 開必拓數據股份有限公司 應用於協助提升自動視覺檢測系統之檢測準確率的互動式用戶反饋系統

Also Published As

Publication number Publication date
TW200510710A (en) 2005-03-16
CN100476414C (zh) 2009-04-08
CN1576828A (zh) 2005-02-09
KR20050013491A (ko) 2005-02-04

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MM4A Annulment or lapse of patent due to non-payment of fees