US7389465B2
(en)
*
|
2004-01-30 |
2008-06-17 |
Micron Technology, Inc. |
Error detection and correction scheme for a memory device
|
JP4695385B2
(ja)
*
|
2004-11-30 |
2011-06-08 |
株式会社東芝 |
メモリカードおよびカードコントローラ
|
GB2428496A
(en)
*
|
2005-07-15 |
2007-01-31 |
Global Silicon Ltd |
Error correction for flash memory
|
US7523381B2
(en)
*
|
2005-09-01 |
2009-04-21 |
Micron Technology, Inc. |
Non-volatile memory with error detection
|
US20080256415A1
(en)
*
|
2005-09-27 |
2008-10-16 |
Nxp B.V. |
Error Detection/Correction Circuit as Well as Corresponding Method
|
US7562283B2
(en)
|
2005-12-27 |
2009-07-14 |
D.S.P. Group Ltd. |
Systems and methods for error correction using binary coded hexidecimal or hamming decoding
|
KR100746225B1
(ko)
|
2006-02-13 |
2007-08-03 |
삼성전자주식회사 |
반도체 메모리 장치 및 이를 구비한 메모리 시스템
|
US7453723B2
(en)
*
|
2006-03-01 |
2008-11-18 |
Micron Technology, Inc. |
Memory with weighted multi-page read
|
FR2900749B1
(fr)
*
|
2006-05-05 |
2008-07-25 |
Thales Sa |
Procede et dispositif de securisation de la memoire d'un calculateur a l'encontre des erreurs dues aux radiations
|
US7911834B2
(en)
*
|
2006-05-15 |
2011-03-22 |
Apple Inc. |
Analog interface for a flash memory die
|
US7551486B2
(en)
*
|
2006-05-15 |
2009-06-23 |
Apple Inc. |
Iterative memory cell charging based on reference cell value
|
US7568135B2
(en)
*
|
2006-05-15 |
2009-07-28 |
Apple Inc. |
Use of alternative value in cell detection
|
US7852690B2
(en)
*
|
2006-05-15 |
2010-12-14 |
Apple Inc. |
Multi-chip package for a flash memory
|
US7639531B2
(en)
*
|
2006-05-15 |
2009-12-29 |
Apple Inc. |
Dynamic cell bit resolution
|
US7511646B2
(en)
*
|
2006-05-15 |
2009-03-31 |
Apple Inc. |
Use of 8-bit or higher A/D for NAND cell value
|
US8000134B2
(en)
|
2006-05-15 |
2011-08-16 |
Apple Inc. |
Off-die charge pump that supplies multiple flash devices
|
US7639542B2
(en)
*
|
2006-05-15 |
2009-12-29 |
Apple Inc. |
Maintenance operations for multi-level data storage cells
|
US7613043B2
(en)
*
|
2006-05-15 |
2009-11-03 |
Apple Inc. |
Shifting reference values to account for voltage sag
|
US7701797B2
(en)
*
|
2006-05-15 |
2010-04-20 |
Apple Inc. |
Two levels of voltage regulation supplied for logic and data programming voltage of a memory device
|
US20070283207A1
(en)
*
|
2006-06-01 |
2007-12-06 |
International Business Machines Corporation |
Systems, methods, and computer program products for providing a two-bit symbol bus error correcting code with bus timing improvements
|
US7721178B2
(en)
*
|
2006-06-01 |
2010-05-18 |
International Business Machines Corporation |
Systems, methods, and computer program products for providing a two-bit symbol bus error correcting code
|
US20070283208A1
(en)
*
|
2006-06-01 |
2007-12-06 |
International Business Machines Corporation |
Systems, methods, and computer program products for providing a two-bit symbol bus error correcting code with bus diagnostic features
|
US20070283223A1
(en)
*
|
2006-06-01 |
2007-12-06 |
International Business Machines Corporation |
Systems, methods, and computer program products for providing a two-bit symbol bus error correcting code with all checkbits transferred last
|
US7369434B2
(en)
*
|
2006-08-14 |
2008-05-06 |
Micron Technology, Inc. |
Flash memory with multi-bit read
|
DE102006040644A1
(de)
*
|
2006-08-30 |
2008-03-13 |
Robert Bosch Gmbh |
Korrekturverfahren für einen neu-programmierbaren Mikroprozessor
|
US9495241B2
(en)
*
|
2006-12-06 |
2016-11-15 |
Longitude Enterprise Flash S.A.R.L. |
Systems and methods for adaptive data storage
|
US20080140724A1
(en)
|
2006-12-06 |
2008-06-12 |
David Flynn |
Apparatus, system, and method for servicing object requests within a storage controller
|
US9116823B2
(en)
|
2006-12-06 |
2015-08-25 |
Intelligent Intellectual Property Holdings 2 Llc |
Systems and methods for adaptive error-correction coding
|
US8015473B2
(en)
*
|
2006-12-19 |
2011-09-06 |
Intel Corporation |
Method, system, and apparatus for ECC protection of small data structures
|
US8055982B2
(en)
*
|
2007-02-21 |
2011-11-08 |
Sigmatel, Inc. |
Error correction system and method
|
US8065583B2
(en)
|
2007-07-06 |
2011-11-22 |
Micron Technology, Inc. |
Data storage with an outer block code and a stream-based inner code
|
US8051358B2
(en)
|
2007-07-06 |
2011-11-01 |
Micron Technology, Inc. |
Error recovery storage along a nand-flash string
|
US7747903B2
(en)
*
|
2007-07-09 |
2010-06-29 |
Micron Technology, Inc. |
Error correction for memory
|
JP4564520B2
(ja)
|
2007-08-31 |
2010-10-20 |
株式会社東芝 |
半導体記憶装置およびその制御方法
|
US8046542B2
(en)
|
2007-11-21 |
2011-10-25 |
Micron Technology, Inc. |
Fault-tolerant non-volatile integrated circuit memory
|
US8327245B2
(en)
*
|
2007-11-21 |
2012-12-04 |
Micron Technology, Inc. |
Memory controller supporting rate-compatible punctured codes
|
US7836226B2
(en)
|
2007-12-06 |
2010-11-16 |
Fusion-Io, Inc. |
Apparatus, system, and method for coordinating storage requests in a multi-processor/multi-thread environment
|
US20090158122A1
(en)
*
|
2007-12-12 |
2009-06-18 |
Intel Corporation |
Forward error correction of an error acknowledgement command protocol
|
US8621138B2
(en)
|
2007-12-27 |
2013-12-31 |
Sandisk Enterprise Ip Llc |
Flash storage controller execute loop
|
TWI364661B
(en)
*
|
2008-09-25 |
2012-05-21 |
Silicon Motion Inc |
Access methods for a flash memory and memory devices
|
KR101687038B1
(ko)
*
|
2008-12-18 |
2016-12-15 |
노바칩스 캐나다 인크. |
에러 검출 방법 및 하나 이상의 메모리 장치를 포함하는 시스템
|
US20100180182A1
(en)
*
|
2009-01-09 |
2010-07-15 |
Seagate Technology Llc |
Data memory device and controller with interface error detection and handling logic
|
KR20100098969A
(ko)
*
|
2009-03-02 |
2010-09-10 |
삼성전자주식회사 |
에러 정정 코드들의 신뢰성을 향상시킬 수 반도체 장치, 이를 포함하는 반도체 시스템, 및 에러 정정 코드 처리 방법
|
CN101615145B
(zh)
*
|
2009-07-24 |
2011-12-07 |
中兴通讯股份有限公司 |
一种提高存储器数据缓存可靠性的方法和装置
|
US8077515B2
(en)
*
|
2009-08-25 |
2011-12-13 |
Micron Technology, Inc. |
Methods, devices, and systems for dealing with threshold voltage change in memory devices
|
US8271697B2
(en)
|
2009-09-29 |
2012-09-18 |
Micron Technology, Inc. |
State change in systems having devices coupled in a chained configuration
|
US9626243B2
(en)
*
|
2009-12-11 |
2017-04-18 |
Advanced Micro Devices, Inc. |
Data error correction device and methods thereof
|
TWI413904B
(zh)
*
|
2010-03-03 |
2013-11-01 |
Pixart Imaging Inc |
Universal Serial Bus (USB) controller and its execution method
|
JP4772909B1
(ja)
*
|
2010-03-30 |
2011-09-14 |
株式会社東芝 |
情報処理装置および情報処理方法
|
US8429391B2
(en)
|
2010-04-16 |
2013-04-23 |
Micron Technology, Inc. |
Boot partitions in memory devices and systems
|
US8451664B2
(en)
|
2010-05-12 |
2013-05-28 |
Micron Technology, Inc. |
Determining and using soft data in memory devices and systems
|
US8386895B2
(en)
|
2010-05-19 |
2013-02-26 |
Micron Technology, Inc. |
Enhanced multilevel memory
|
US8640005B2
(en)
*
|
2010-05-21 |
2014-01-28 |
Intel Corporation |
Method and apparatus for using cache memory in a system that supports a low power state
|
KR101739878B1
(ko)
|
2011-02-22 |
2017-05-26 |
삼성전자주식회사 |
컨트롤러, 이의 동작방법, 및 상기 컨트롤러를 포함한 메모리 시스템
|
US8677205B2
(en)
|
2011-03-10 |
2014-03-18 |
Freescale Semiconductor, Inc. |
Hierarchical error correction for large memories
|
US8909982B2
(en)
|
2011-06-19 |
2014-12-09 |
Sandisk Enterprise Ip Llc |
System and method for detecting copyback programming problems
|
US8910020B2
(en)
|
2011-06-19 |
2014-12-09 |
Sandisk Enterprise Ip Llc |
Intelligent bit recovery for flash memory
|
CN102231136B
(zh)
*
|
2011-07-12 |
2014-06-11 |
晨星软件研发(深圳)有限公司 |
一种闪存存储设备的数据存储方法和装置
|
US9058289B2
(en)
|
2011-11-07 |
2015-06-16 |
Sandisk Enterprise Ip Llc |
Soft information generation for memory systems
|
US8924815B2
(en)
|
2011-11-18 |
2014-12-30 |
Sandisk Enterprise Ip Llc |
Systems, methods and devices for decoding codewords having multiple parity segments
|
US8954822B2
(en)
|
2011-11-18 |
2015-02-10 |
Sandisk Enterprise Ip Llc |
Data encoder and decoder using memory-specific parity-check matrix
|
US9048876B2
(en)
|
2011-11-18 |
2015-06-02 |
Sandisk Enterprise Ip Llc |
Systems, methods and devices for multi-tiered error correction
|
US8914712B2
(en)
|
2012-02-27 |
2014-12-16 |
Freescale Semiconductor, Inc. |
Hierarchical error correction
|
US8806294B2
(en)
|
2012-04-20 |
2014-08-12 |
Freescale Semiconductor, Inc. |
Error detection within a memory
|
US9021333B1
(en)
|
2012-05-22 |
2015-04-28 |
Pmc-Sierra, Inc. |
Systems and methods for recovering data from failed portions of a flash drive
|
US8793556B1
(en)
|
2012-05-22 |
2014-07-29 |
Pmc-Sierra, Inc. |
Systems and methods for reclaiming flash blocks of a flash drive
|
US8996957B1
(en)
|
2012-05-22 |
2015-03-31 |
Pmc-Sierra, Inc. |
Systems and methods for initializing regions of a flash drive having diverse error correction coding (ECC) schemes
|
US9176812B1
(en)
|
2012-05-22 |
2015-11-03 |
Pmc-Sierra, Inc. |
Systems and methods for storing data in page stripes of a flash drive
|
US9021337B1
(en)
|
2012-05-22 |
2015-04-28 |
Pmc-Sierra, Inc. |
Systems and methods for adaptively selecting among different error correction coding schemes in a flash drive
|
US8972824B1
(en)
|
2012-05-22 |
2015-03-03 |
Pmc-Sierra, Inc. |
Systems and methods for transparently varying error correction code strength in a flash drive
|
US9021336B1
(en)
|
2012-05-22 |
2015-04-28 |
Pmc-Sierra, Inc. |
Systems and methods for redundantly storing error correction codes in a flash drive with secondary parity information spread out across each page of a group of pages
|
US8788910B1
(en)
|
2012-05-22 |
2014-07-22 |
Pmc-Sierra, Inc. |
Systems and methods for low latency, high reliability error correction in a flash drive
|
US9183085B1
(en)
|
2012-05-22 |
2015-11-10 |
Pmc-Sierra, Inc. |
Systems and methods for adaptively selecting from among a plurality of error correction coding schemes in a flash drive for robustness and low latency
|
US9047214B1
(en)
|
2012-05-22 |
2015-06-02 |
Pmc-Sierra, Inc. |
System and method for tolerating a failed page in a flash device
|
KR101684045B1
(ko)
*
|
2012-05-31 |
2016-12-07 |
휴렛 팩커드 엔터프라이즈 디벨롭먼트 엘피 |
로컬 에러 검출 및 글로벌 에러 정정
|
TWI475387B
(zh)
*
|
2012-07-19 |
2015-03-01 |
Jmicron Technology Corp |
記憶體控制方法及記憶體控制電路
|
US9699263B1
(en)
|
2012-08-17 |
2017-07-04 |
Sandisk Technologies Llc. |
Automatic read and write acceleration of data accessed by virtual machines
|
US9577673B2
(en)
|
2012-11-08 |
2017-02-21 |
Micron Technology, Inc. |
Error correction methods and apparatuses using first and second decoders
|
US9501398B2
(en)
|
2012-12-26 |
2016-11-22 |
Sandisk Technologies Llc |
Persistent storage device with NVRAM for staging writes
|
US9612948B2
(en)
|
2012-12-27 |
2017-04-04 |
Sandisk Technologies Llc |
Reads and writes between a contiguous data block and noncontiguous sets of logical address blocks in a persistent storage device
|
US9239751B1
(en)
|
2012-12-27 |
2016-01-19 |
Sandisk Enterprise Ip Llc |
Compressing data from multiple reads for error control management in memory systems
|
US9003264B1
(en)
|
2012-12-31 |
2015-04-07 |
Sandisk Enterprise Ip Llc |
Systems, methods, and devices for multi-dimensional flash RAID data protection
|
US9454420B1
(en)
|
2012-12-31 |
2016-09-27 |
Sandisk Technologies Llc |
Method and system of reading threshold voltage equalization
|
US9214965B2
(en)
|
2013-02-20 |
2015-12-15 |
Sandisk Enterprise Ip Llc |
Method and system for improving data integrity in non-volatile storage
|
US9329928B2
(en)
|
2013-02-20 |
2016-05-03 |
Sandisk Enterprise IP LLC. |
Bandwidth optimization in a non-volatile memory system
|
US9870830B1
(en)
|
2013-03-14 |
2018-01-16 |
Sandisk Technologies Llc |
Optimal multilevel sensing for reading data from a storage medium
|
US9092350B1
(en)
|
2013-03-15 |
2015-07-28 |
Sandisk Enterprise Ip Llc |
Detection and handling of unbalanced errors in interleaved codewords
|
US9136877B1
(en)
|
2013-03-15 |
2015-09-15 |
Sandisk Enterprise Ip Llc |
Syndrome layered decoding for LDPC codes
|
US9081701B1
(en)
|
2013-03-15 |
2015-07-14 |
Pmc-Sierra, Inc. |
Systems and methods for decoding data for solid-state memory
|
US9026867B1
(en)
|
2013-03-15 |
2015-05-05 |
Pmc-Sierra, Inc. |
Systems and methods for adapting to changing characteristics of multi-level cells in solid-state memory
|
US9009565B1
(en)
|
2013-03-15 |
2015-04-14 |
Pmc-Sierra, Inc. |
Systems and methods for mapping for solid-state memory
|
US9208018B1
(en)
|
2013-03-15 |
2015-12-08 |
Pmc-Sierra, Inc. |
Systems and methods for reclaiming memory for solid-state memory
|
US9367246B2
(en)
|
2013-03-15 |
2016-06-14 |
Sandisk Technologies Inc. |
Performance optimization of data transfer for soft information generation
|
US9236886B1
(en)
|
2013-03-15 |
2016-01-12 |
Sandisk Enterprise Ip Llc |
Universal and reconfigurable QC-LDPC encoder
|
US9244763B1
(en)
|
2013-03-15 |
2016-01-26 |
Sandisk Enterprise Ip Llc |
System and method for updating a reading threshold voltage based on symbol transition information
|
US9053012B1
(en)
|
2013-03-15 |
2015-06-09 |
Pmc-Sierra, Inc. |
Systems and methods for storing data for solid-state memory
|
US9009576B1
(en)
|
2013-03-15 |
2015-04-14 |
Sandisk Enterprise Ip Llc |
Adaptive LLR based on syndrome weight
|
US10049037B2
(en)
|
2013-04-05 |
2018-08-14 |
Sandisk Enterprise Ip Llc |
Data management in a storage system
|
US9170941B2
(en)
|
2013-04-05 |
2015-10-27 |
Sandisk Enterprises IP LLC |
Data hardening in a storage system
|
US9159437B2
(en)
|
2013-06-11 |
2015-10-13 |
Sandisk Enterprise IP LLC. |
Device and method for resolving an LM flag issue
|
TWI497280B
(zh)
*
|
2013-07-08 |
2015-08-21 |
Phison Electronics Corp |
資料保護方法、記憶體儲存裝置與記憶體控制器
|
US9524235B1
(en)
|
2013-07-25 |
2016-12-20 |
Sandisk Technologies Llc |
Local hash value generation in non-volatile data storage systems
|
US9384126B1
(en)
|
2013-07-25 |
2016-07-05 |
Sandisk Technologies Inc. |
Methods and systems to avoid false negative results in bloom filters implemented in non-volatile data storage systems
|
US9043517B1
(en)
|
2013-07-25 |
2015-05-26 |
Sandisk Enterprise Ip Llc |
Multipass programming in buffers implemented in non-volatile data storage systems
|
US9898365B2
(en)
|
2013-07-31 |
2018-02-20 |
Hewlett Packard Enterprise Development Lp |
Global error correction
|
TWI479359B
(zh)
*
|
2013-08-01 |
2015-04-01 |
Phison Electronics Corp |
指令執行方法、記憶體控制器與記憶體儲存裝置
|
KR102170857B1
(ko)
*
|
2013-08-19 |
2020-10-29 |
삼성전자주식회사 |
저항체를 이용한 비휘발성 메모리 장치의 구동 방법
|
US9361221B1
(en)
|
2013-08-26 |
2016-06-07 |
Sandisk Technologies Inc. |
Write amplification reduction through reliable writes during garbage collection
|
US9639463B1
(en)
|
2013-08-26 |
2017-05-02 |
Sandisk Technologies Llc |
Heuristic aware garbage collection scheme in storage systems
|
US9442670B2
(en)
|
2013-09-03 |
2016-09-13 |
Sandisk Technologies Llc |
Method and system for rebalancing data stored in flash memory devices
|
US9519577B2
(en)
|
2013-09-03 |
2016-12-13 |
Sandisk Technologies Llc |
Method and system for migrating data between flash memory devices
|
WO2015047334A1
(en)
*
|
2013-09-27 |
2015-04-02 |
Intel Corporation |
Error correction in non_volatile memory
|
US9158349B2
(en)
|
2013-10-04 |
2015-10-13 |
Sandisk Enterprise Ip Llc |
System and method for heat dissipation
|
US9323637B2
(en)
|
2013-10-07 |
2016-04-26 |
Sandisk Enterprise Ip Llc |
Power sequencing and data hardening architecture
|
US9298608B2
(en)
|
2013-10-18 |
2016-03-29 |
Sandisk Enterprise Ip Llc |
Biasing for wear leveling in storage systems
|
US9442662B2
(en)
|
2013-10-18 |
2016-09-13 |
Sandisk Technologies Llc |
Device and method for managing die groups
|
US9436831B2
(en)
|
2013-10-30 |
2016-09-06 |
Sandisk Technologies Llc |
Secure erase in a memory device
|
US9263156B2
(en)
|
2013-11-07 |
2016-02-16 |
Sandisk Enterprise Ip Llc |
System and method for adjusting trip points within a storage device
|
US9244785B2
(en)
|
2013-11-13 |
2016-01-26 |
Sandisk Enterprise Ip Llc |
Simulated power failure and data hardening
|
US9152555B2
(en)
|
2013-11-15 |
2015-10-06 |
Sandisk Enterprise IP LLC. |
Data management with modular erase in a data storage system
|
US9703816B2
(en)
|
2013-11-19 |
2017-07-11 |
Sandisk Technologies Llc |
Method and system for forward reference logging in a persistent datastore
|
US9520197B2
(en)
|
2013-11-22 |
2016-12-13 |
Sandisk Technologies Llc |
Adaptive erase of a storage device
|
US9280429B2
(en)
|
2013-11-27 |
2016-03-08 |
Sandisk Enterprise Ip Llc |
Power fail latching based on monitoring multiple power supply voltages in a storage device
|
US9122636B2
(en)
|
2013-11-27 |
2015-09-01 |
Sandisk Enterprise Ip Llc |
Hard power fail architecture
|
US9520162B2
(en)
|
2013-11-27 |
2016-12-13 |
Sandisk Technologies Llc |
DIMM device controller supervisor
|
US9582058B2
(en)
|
2013-11-29 |
2017-02-28 |
Sandisk Technologies Llc |
Power inrush management of storage devices
|
US9250676B2
(en)
|
2013-11-29 |
2016-02-02 |
Sandisk Enterprise Ip Llc |
Power failure architecture and verification
|
US9092370B2
(en)
|
2013-12-03 |
2015-07-28 |
Sandisk Enterprise Ip Llc |
Power failure tolerant cryptographic erase
|
US9235245B2
(en)
|
2013-12-04 |
2016-01-12 |
Sandisk Enterprise Ip Llc |
Startup performance and power isolation
|
US9129665B2
(en)
|
2013-12-17 |
2015-09-08 |
Sandisk Enterprise Ip Llc |
Dynamic brownout adjustment in a storage device
|
US9323602B2
(en)
|
2014-01-20 |
2016-04-26 |
Freescale Semiconductor, Inc. |
Error correction with extended CAM
|
US9549457B2
(en)
|
2014-02-12 |
2017-01-17 |
Sandisk Technologies Llc |
System and method for redirecting airflow across an electronic assembly
|
US9497889B2
(en)
|
2014-02-27 |
2016-11-15 |
Sandisk Technologies Llc |
Heat dissipation for substrate assemblies
|
US9703636B2
(en)
|
2014-03-01 |
2017-07-11 |
Sandisk Technologies Llc |
Firmware reversion trigger and control
|
US9485851B2
(en)
|
2014-03-14 |
2016-11-01 |
Sandisk Technologies Llc |
Thermal tube assembly structures
|
US9519319B2
(en)
|
2014-03-14 |
2016-12-13 |
Sandisk Technologies Llc |
Self-supporting thermal tube structure for electronic assemblies
|
US9348377B2
(en)
|
2014-03-14 |
2016-05-24 |
Sandisk Enterprise Ip Llc |
Thermal isolation techniques
|
US9448876B2
(en)
|
2014-03-19 |
2016-09-20 |
Sandisk Technologies Llc |
Fault detection and prediction in storage devices
|
US9390814B2
(en)
|
2014-03-19 |
2016-07-12 |
Sandisk Technologies Llc |
Fault detection and prediction for data storage elements
|
US9454448B2
(en)
|
2014-03-19 |
2016-09-27 |
Sandisk Technologies Llc |
Fault testing in storage devices
|
US9390021B2
(en)
|
2014-03-31 |
2016-07-12 |
Sandisk Technologies Llc |
Efficient cache utilization in a tiered data structure
|
US9626399B2
(en)
|
2014-03-31 |
2017-04-18 |
Sandisk Technologies Llc |
Conditional updates for reducing frequency of data modification operations
|
US9626400B2
(en)
|
2014-03-31 |
2017-04-18 |
Sandisk Technologies Llc |
Compaction of information in tiered data structure
|
US9697267B2
(en)
|
2014-04-03 |
2017-07-04 |
Sandisk Technologies Llc |
Methods and systems for performing efficient snapshots in tiered data structures
|
US9396064B2
(en)
|
2014-04-30 |
2016-07-19 |
Freescale Semiconductor, Inc. |
Error correction with secondary memory
|
US9645749B2
(en)
|
2014-05-30 |
2017-05-09 |
Sandisk Technologies Llc |
Method and system for recharacterizing the storage density of a memory device or a portion thereof
|
US8891303B1
(en)
|
2014-05-30 |
2014-11-18 |
Sandisk Technologies Inc. |
Method and system for dynamic word line based configuration of a three-dimensional memory device
|
US10656840B2
(en)
|
2014-05-30 |
2020-05-19 |
Sandisk Technologies Llc |
Real-time I/O pattern recognition to enhance performance and endurance of a storage device
|
US10372613B2
(en)
|
2014-05-30 |
2019-08-06 |
Sandisk Technologies Llc |
Using sub-region I/O history to cache repeatedly accessed sub-regions in a non-volatile storage device
|
US10162748B2
(en)
|
2014-05-30 |
2018-12-25 |
Sandisk Technologies Llc |
Prioritizing garbage collection and block allocation based on I/O history for logical address regions
|
US10114557B2
(en)
|
2014-05-30 |
2018-10-30 |
Sandisk Technologies Llc |
Identification of hot regions to enhance performance and endurance of a non-volatile storage device
|
US10656842B2
(en)
|
2014-05-30 |
2020-05-19 |
Sandisk Technologies Llc |
Using history of I/O sizes and I/O sequences to trigger coalesced writes in a non-volatile storage device
|
US9703491B2
(en)
|
2014-05-30 |
2017-07-11 |
Sandisk Technologies Llc |
Using history of unaligned writes to cache data and avoid read-modify-writes in a non-volatile storage device
|
US10146448B2
(en)
|
2014-05-30 |
2018-12-04 |
Sandisk Technologies Llc |
Using history of I/O sequences to trigger cached read ahead in a non-volatile storage device
|
US9070481B1
(en)
|
2014-05-30 |
2015-06-30 |
Sandisk Technologies Inc. |
Internal current measurement for age measurements
|
US9093160B1
(en)
|
2014-05-30 |
2015-07-28 |
Sandisk Technologies Inc. |
Methods and systems for staggered memory operations
|
US9652381B2
(en)
|
2014-06-19 |
2017-05-16 |
Sandisk Technologies Llc |
Sub-block garbage collection
|
JP6332134B2
(ja)
*
|
2014-09-16 |
2018-05-30 |
株式会社デンソー |
メモリ診断回路
|
US9768808B2
(en)
|
2015-04-08 |
2017-09-19 |
Sandisk Technologies Llc |
Method for modifying device-specific variable error correction settings
|
US9606737B2
(en)
|
2015-05-20 |
2017-03-28 |
Sandisk Technologies Llc |
Variable bit encoding per NAND flash cell to extend life of flash-based storage devices and preserve over-provisioning
|
US9639282B2
(en)
|
2015-05-20 |
2017-05-02 |
Sandisk Technologies Llc |
Variable bit encoding per NAND flash cell to improve device endurance and extend life of flash-based storage devices
|
US10013179B2
(en)
|
2015-12-03 |
2018-07-03 |
Sandisk Technologies Llc |
Reading logical groups of data from physical locations in memory using headers
|
US9830084B2
(en)
|
2015-12-03 |
2017-11-28 |
Sandisk Technologies Llc |
Writing logical groups of data to physical locations in memory using headers
|
GB201710839D0
(en)
*
|
2017-07-05 |
2017-08-16 |
Irdeto Bv |
Data protection
|
CN109903806A
(zh)
*
|
2019-04-01 |
2019-06-18 |
江苏华存电子科技有限公司 |
一种双模式检错内存及双模式检错方法
|
JP7306945B2
(ja)
*
|
2019-10-03 |
2023-07-11 |
ファナック株式会社 |
メモリエラー判別装置及びメモリエラー判別用コンピュータプログラム
|