TWI282050B - A proportional to absolute temperature voltage circuit - Google Patents
A proportional to absolute temperature voltage circuit Download PDFInfo
- Publication number
- TWI282050B TWI282050B TW094117525A TW94117525A TWI282050B TW I282050 B TWI282050 B TW I282050B TW 094117525 A TW094117525 A TW 094117525A TW 94117525 A TW94117525 A TW 94117525A TW I282050 B TWI282050 B TW I282050B
- Authority
- TW
- Taiwan
- Prior art keywords
- transistor
- circuit
- amplifier
- base
- arm
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
- G05F3/02—Regulating voltage or current
- G05F3/08—Regulating voltage or current wherein the variable is DC
- G05F3/10—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics
- G05F3/16—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices
- G05F3/20—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
- G05F3/30—Regulators using the difference between the base-emitter voltages of two bipolar transistors operating at different current densities
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
- G05F3/02—Regulating voltage or current
- G05F3/08—Regulating voltage or current wherein the variable is DC
- G05F3/10—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics
- G05F3/16—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices
- G05F3/20—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
- G05F3/26—Current mirrors
- G05F3/262—Current mirrors using field-effect transistors only
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Radar, Positioning & Navigation (AREA)
- Automation & Control Theory (AREA)
- Power Engineering (AREA)
- Amplifiers (AREA)
- Control Of Electrical Variables (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/881,300 US7173407B2 (en) | 2004-06-30 | 2004-06-30 | Proportional to absolute temperature voltage circuit |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200609704A TW200609704A (en) | 2006-03-16 |
| TWI282050B true TWI282050B (en) | 2007-06-01 |
Family
ID=34970849
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW094117525A TWI282050B (en) | 2004-06-30 | 2005-05-27 | A proportional to absolute temperature voltage circuit |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US7173407B2 (enExample) |
| EP (1) | EP1769301B1 (enExample) |
| JP (1) | JP4809340B2 (enExample) |
| CN (1) | CN100511083C (enExample) |
| AT (1) | ATE534066T1 (enExample) |
| TW (1) | TWI282050B (enExample) |
| WO (1) | WO2006003083A1 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9086330B2 (en) | 2009-04-22 | 2015-07-21 | Taiwan Semiconductor Manufacturing Company, Ltd. | Temperature sensing circuit |
Families Citing this family (61)
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| US7543253B2 (en) * | 2003-10-07 | 2009-06-02 | Analog Devices, Inc. | Method and apparatus for compensating for temperature drift in semiconductor processes and circuitry |
| US7256643B2 (en) * | 2005-08-04 | 2007-08-14 | Micron Technology, Inc. | Device and method for generating a low-voltage reference |
| US7411380B2 (en) * | 2006-07-21 | 2008-08-12 | Faraday Technology Corp. | Non-linearity compensation circuit and bandgap reference circuit using the same |
| US8102201B2 (en) | 2006-09-25 | 2012-01-24 | Analog Devices, Inc. | Reference circuit and method for providing a reference |
| US7576598B2 (en) * | 2006-09-25 | 2009-08-18 | Analog Devices, Inc. | Bandgap voltage reference and method for providing same |
| JP2008123480A (ja) * | 2006-10-16 | 2008-05-29 | Nec Electronics Corp | 基準電圧発生回路 |
| US7486129B2 (en) * | 2007-03-01 | 2009-02-03 | Freescale Semiconductor, Inc. | Low power voltage reference |
| US7714563B2 (en) * | 2007-03-13 | 2010-05-11 | Analog Devices, Inc. | Low noise voltage reference circuit |
| US20080265860A1 (en) * | 2007-04-30 | 2008-10-30 | Analog Devices, Inc. | Low voltage bandgap reference source |
| US7773446B2 (en) * | 2007-06-29 | 2010-08-10 | Sandisk 3D Llc | Methods and apparatus for extending the effective thermal operating range of a memory |
| US7656734B2 (en) * | 2007-06-29 | 2010-02-02 | Sandisk 3D Llc | Methods and apparatus for extending the effective thermal operating range of a memory |
| US20090027030A1 (en) * | 2007-07-23 | 2009-01-29 | Analog Devices, Inc. | Low noise bandgap voltage reference |
| US7605578B2 (en) * | 2007-07-23 | 2009-10-20 | Analog Devices, Inc. | Low noise bandgap voltage reference |
| US7598799B2 (en) * | 2007-12-21 | 2009-10-06 | Analog Devices, Inc. | Bandgap voltage reference circuit |
| US7612606B2 (en) * | 2007-12-21 | 2009-11-03 | Analog Devices, Inc. | Low voltage current and voltage generator |
| CN101226414B (zh) * | 2008-01-30 | 2012-01-11 | 北京中星微电子有限公司 | 一种动态补偿基准电压的方法以及带隙基准电压源 |
| US7750728B2 (en) * | 2008-03-25 | 2010-07-06 | Analog Devices, Inc. | Reference voltage circuit |
| US7880533B2 (en) * | 2008-03-25 | 2011-02-01 | Analog Devices, Inc. | Bandgap voltage reference circuit |
| US7902912B2 (en) * | 2008-03-25 | 2011-03-08 | Analog Devices, Inc. | Bias current generator |
| US8710912B2 (en) * | 2008-11-24 | 2014-04-29 | Analog Device, Inc. | Second order correction circuit and method for bandgap voltage reference |
| US8390363B2 (en) * | 2008-11-25 | 2013-03-05 | Linear Technology Corporation | Circuit, trim and layout for temperature compensation of metal resistors in semi-conductor chips |
| US9004754B2 (en) * | 2009-04-22 | 2015-04-14 | Taiwan Semiconductor Manufacturing Company, Ltd. | Thermal sensors and methods of operating thereof |
| US8207724B2 (en) * | 2009-09-16 | 2012-06-26 | Mediatek Singapore Pte. Ltd. | Bandgap voltage reference with dynamic element matching |
| US8330445B2 (en) * | 2009-10-08 | 2012-12-11 | Intersil Americas Inc. | Circuits and methods to produce a VPTAT and/or a bandgap voltage with low-glitch preconditioning |
| US8536854B2 (en) * | 2010-09-30 | 2013-09-17 | Cirrus Logic, Inc. | Supply invariant bandgap reference system |
| US8378735B2 (en) * | 2010-11-29 | 2013-02-19 | Freescale Semiconductor, Inc. | Die temperature sensor circuit |
| WO2013133733A1 (en) * | 2012-03-05 | 2013-09-12 | Freescale Semiconductor, Inc | Reference voltage source and method for providing a curvature-compensated reference voltage |
| US9448579B2 (en) * | 2013-12-20 | 2016-09-20 | Analog Devices Global | Low drift voltage reference |
| US9658637B2 (en) * | 2014-02-18 | 2017-05-23 | Analog Devices Global | Low power proportional to absolute temperature current and voltage generator |
| WO2016118183A1 (en) | 2015-01-24 | 2016-07-28 | Schober Susan Marya | Passive phased injection locked circuit |
| TWI564692B (zh) * | 2015-03-11 | 2017-01-01 | 晶豪科技股份有限公司 | 能隙參考電路 |
| US10345346B2 (en) * | 2015-07-12 | 2019-07-09 | Skyworks Solutions, Inc. | Radio-frequency voltage detection |
| CA3031736A1 (en) | 2015-07-29 | 2017-02-02 | Circuit Seed, Llc | Complementary current field-effect transistor devices and amplifiers |
| WO2017019981A1 (en) * | 2015-07-30 | 2017-02-02 | Circuit Seed, Llc | Reference generator and current source transistor based on complementary current field-effect transistor devices |
| WO2017019973A1 (en) | 2015-07-30 | 2017-02-02 | Circuit Seed, Llc | Multi-stage and feed forward compensated complementary current field effect transistor amplifiers |
| WO2017019978A1 (en) | 2015-07-30 | 2017-02-02 | Circuit Seed, Llc | Low noise trans-impedance amplifiers based on complementary current field-effect transistor devices |
| CN105204564A (zh) * | 2015-10-30 | 2015-12-30 | 无锡纳讯微电子有限公司 | 一种低温度系数基准源电路 |
| CA3043989A1 (en) | 2015-12-14 | 2017-06-22 | Circuit Seed, Llc | Super-saturation current field effect transistor and trans-impedance mos device |
| US10078016B2 (en) * | 2016-02-10 | 2018-09-18 | Nxp Usa, Inc. | On-die temperature sensor for integrated circuit |
| JP6685168B2 (ja) * | 2016-04-15 | 2020-04-22 | 新日本無線株式会社 | 基準電圧回路 |
| CN105955384B (zh) * | 2016-07-19 | 2018-02-23 | 南方科技大学 | 一种非带隙基准电压源 |
| US10222817B1 (en) | 2017-09-29 | 2019-03-05 | Cavium, Llc | Method and circuit for low voltage current-mode bandgap |
| US9864389B1 (en) * | 2016-11-10 | 2018-01-09 | Analog Devices Global | Temperature compensated reference voltage circuit |
| CN106411127A (zh) * | 2016-11-22 | 2017-02-15 | 郑州搜趣信息技术有限公司 | 一种pwm调制转换电路 |
| CN109002075B (zh) * | 2017-06-07 | 2021-07-23 | 苏州瀚宸科技有限公司 | 双极型晶体管的基极电流镜像电路、rssi电路及芯片 |
| US10557894B2 (en) | 2017-08-07 | 2020-02-11 | Linear Technology Holding Llc | Reference signal correction circuit |
| US10691156B2 (en) * | 2017-08-31 | 2020-06-23 | Texas Instruments Incorporated | Complementary to absolute temperature (CTAT) voltage generator |
| IT201700117023A1 (it) * | 2017-10-17 | 2019-04-17 | St Microelectronics Srl | Circuito di riferimento bandgap, dispositivo e procedimento corrispondenti |
| CN108614611B (zh) * | 2018-06-27 | 2024-06-04 | 上海治精微电子有限公司 | 低噪声带隙基准电压源、电子设备 |
| US10409312B1 (en) * | 2018-07-19 | 2019-09-10 | Analog Devices Global Unlimited Company | Low power duty-cycled reference |
| US10691155B2 (en) * | 2018-09-12 | 2020-06-23 | Infineon Technologies Ag | System and method for a proportional to absolute temperature circuit |
| US10794761B2 (en) * | 2018-11-09 | 2020-10-06 | Linear Technology Holding Llc | Logarithmic scale analog to digital converter for wide dynamic range avalanche photodiode current companding |
| US11068011B2 (en) * | 2019-10-30 | 2021-07-20 | Taiwan Semiconductor Manufacturing Company Ltd. | Signal generating device and method of generating temperature-dependent signal |
| CN112256078B (zh) * | 2020-10-30 | 2021-12-31 | 电子科技大学 | 一种正温系数电流源和一种零温度系数电流源 |
| JP7535911B2 (ja) * | 2020-10-30 | 2024-08-19 | エイブリック株式会社 | 基準電圧回路 |
| JP7599999B2 (ja) * | 2021-03-12 | 2024-12-16 | 株式会社東芝 | バンドギャップ型基準電圧発生回路 |
| US11429125B1 (en) | 2021-03-18 | 2022-08-30 | Texas Instruments Incorporated | Mitigation of voltage shift induced by mechanical stress in bandgap voltage reference circuits |
| US11983026B2 (en) | 2022-03-16 | 2024-05-14 | Apple Inc. | Low output impedance voltage reference circuit |
| US12360547B2 (en) * | 2022-06-03 | 2025-07-15 | Mpics Innovations Pte. Ltd | Highly tunable ultra-low temperature coefficient bandgap precision reference circuit |
| CN115328258B (zh) * | 2022-09-22 | 2024-08-20 | 武汉泽声微电子有限公司 | 带隙基准电路 |
| CN116400770B (zh) * | 2023-04-13 | 2025-04-29 | 中国电子科技集团公司第五十八研究所 | 一种高精度低温漂的基准电压电路 |
Family Cites Families (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4399398A (en) | 1981-06-30 | 1983-08-16 | Rca Corporation | Voltage reference circuit with feedback circuit |
| JP2695515B2 (ja) * | 1990-07-19 | 1997-12-24 | ローム株式会社 | 基準電圧発生回路 |
| US5352973A (en) * | 1993-01-13 | 1994-10-04 | Analog Devices, Inc. | Temperature compensation bandgap voltage reference and method |
| US5646518A (en) * | 1994-11-18 | 1997-07-08 | Lucent Technologies Inc. | PTAT current source |
| JPH09330137A (ja) * | 1996-04-10 | 1997-12-22 | Toshiba Corp | 基準電圧発生回路及び基準電圧発生方法 |
| US5796244A (en) * | 1997-07-11 | 1998-08-18 | Vanguard International Semiconductor Corporation | Bandgap reference circuit |
| US6188556B1 (en) * | 1998-10-22 | 2001-02-13 | Shukri Souri | Two-terminal transistor PTC circuit protection devices |
| US6531857B2 (en) * | 2000-11-09 | 2003-03-11 | Agere Systems, Inc. | Low voltage bandgap reference circuit |
| JP2003273654A (ja) * | 2002-03-15 | 2003-09-26 | Seiko Epson Corp | 温度特性補償装置 |
| TW574782B (en) * | 2002-04-30 | 2004-02-01 | Realtek Semiconductor Corp | Fast start-up low-voltage bandgap voltage reference circuit |
| US6737849B2 (en) | 2002-06-19 | 2004-05-18 | International Business Machines Corporation | Constant current source having a controlled temperature coefficient |
| FR2842317B1 (fr) * | 2002-07-09 | 2004-10-01 | Atmel Nantes Sa | Source de tension de reference, capteur de temperature, detecteur de seuil de temperature, puce et systeme correspondant |
| US6664847B1 (en) | 2002-10-10 | 2003-12-16 | Texas Instruments Incorporated | CTAT generator using parasitic PNP device in deep sub-micron CMOS process |
| US6690228B1 (en) | 2002-12-11 | 2004-02-10 | Texas Instruments Incorporated | Bandgap voltage reference insensitive to voltage offset |
| US6885178B2 (en) * | 2002-12-27 | 2005-04-26 | Analog Devices, Inc. | CMOS voltage bandgap reference with improved headroom |
| US6815941B2 (en) * | 2003-02-05 | 2004-11-09 | United Memories, Inc. | Bandgap reference circuit |
| US7012416B2 (en) * | 2003-12-09 | 2006-03-14 | Analog Devices, Inc. | Bandgap voltage reference |
| US7211993B2 (en) * | 2004-01-13 | 2007-05-01 | Analog Devices, Inc. | Low offset bandgap voltage reference |
-
2004
- 2004-06-30 US US10/881,300 patent/US7173407B2/en not_active Expired - Lifetime
-
2005
- 2005-05-27 TW TW094117525A patent/TWI282050B/zh not_active IP Right Cessation
- 2005-06-14 EP EP05754213A patent/EP1769301B1/en not_active Expired - Lifetime
- 2005-06-14 WO PCT/EP2005/052737 patent/WO2006003083A1/en not_active Ceased
- 2005-06-14 JP JP2007519760A patent/JP4809340B2/ja not_active Expired - Fee Related
- 2005-06-14 AT AT05754213T patent/ATE534066T1/de active
- 2005-06-14 CN CNB2005800218621A patent/CN100511083C/zh not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9086330B2 (en) | 2009-04-22 | 2015-07-21 | Taiwan Semiconductor Manufacturing Company, Ltd. | Temperature sensing circuit |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2008505412A (ja) | 2008-02-21 |
| JP4809340B2 (ja) | 2011-11-09 |
| CN100511083C (zh) | 2009-07-08 |
| TW200609704A (en) | 2006-03-16 |
| CN1977225A (zh) | 2007-06-06 |
| ATE534066T1 (de) | 2011-12-15 |
| EP1769301B1 (en) | 2011-11-16 |
| WO2006003083A1 (en) | 2006-01-12 |
| US20060001413A1 (en) | 2006-01-05 |
| US7173407B2 (en) | 2007-02-06 |
| EP1769301A1 (en) | 2007-04-04 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |