TWI276397B - EMI-shielding assembly and method for the manufacture of same - Google Patents
EMI-shielding assembly and method for the manufacture of same Download PDFInfo
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- TWI276397B TWI276397B TW092106305A TW92106305A TWI276397B TW I276397 B TWI276397 B TW I276397B TW 092106305 A TW092106305 A TW 092106305A TW 92106305 A TW92106305 A TW 92106305A TW I276397 B TWI276397 B TW I276397B
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K9/00—Screening of apparatus or components against electric or magnetic fields
- H05K9/0073—Shielding materials
- H05K9/0081—Electromagnetic shielding materials, e.g. EMI, RFI shielding
- H05K9/0084—Electromagnetic shielding materials, e.g. EMI, RFI shielding comprising a single continuous metallic layer on an electrically insulating supporting structure, e.g. metal foil, film, plating coating, electro-deposition, vapour-deposition
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/02—Pretreatment of the material to be coated
- C23C14/021—Cleaning or etching treatments
- C23C14/022—Cleaning or etching treatments by means of bombardment with energetic particles or radiation
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/02—Pretreatment of the material to be coated
- C23C14/024—Deposition of sublayers, e.g. to promote adhesion of the coating
- C23C14/025—Metallic sublayers
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/14—Metallic material, boron or silicon
- C23C14/20—Metallic material, boron or silicon on organic substrates
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/24—Vacuum evaporation
- C23C14/28—Vacuum evaporation by wave energy or particle radiation
- C23C14/30—Vacuum evaporation by wave energy or particle radiation by electron bombardment
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C28/00—Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of groups C23C2/00 - C23C26/00 or by combinations of methods provided for in subclasses C23C and C25C or C25D
- C23C28/02—Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of groups C23C2/00 - C23C26/00 or by combinations of methods provided for in subclasses C23C and C25C or C25D only coatings only including layers of metallic material
- C23C28/023—Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of groups C23C2/00 - C23C26/00 or by combinations of methods provided for in subclasses C23C and C25C or C25D only coatings only including layers of metallic material only coatings of metal elements only
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/38—Improvement of the adhesion between the insulating substrate and the metal
- H05K3/388—Improvement of the adhesion between the insulating substrate and the metal by the use of a metallic or inorganic thin film adhesion layer
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- Chemical & Material Sciences (AREA)
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- Physics & Mathematics (AREA)
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- Microelectronics & Electronic Packaging (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
Description
1276397 九、發明說明: 【發明所屬之技術領域】 置之電磁波屏敝組件及其製造方 本發明係有關一種用於攜帶式電子裝 法。 【先前技術】 在許錢帶式電子裝置巾,如行動電話中,為防止某些電子^件產生 ^電磁波對内部臨近電子元件之干擾,通常在需要屏蔽的電子元件周圍藉 由k接金屬外殼或金屬化塑膠外殼來實現屏蔽電磁;皮。焊接金屬外殼^ 增加了行動電關重量及成本,這顏不符合行動電話日益小型化^潮 ^因此解紐元件在其讎基縣面驗—層金屬層或在印數電路板 基體局部魏-層金屬屏蔽層,以屏蔽對電磁波比較敏感的電子元件或植 件。然而,一般的水電鍍使鍍層與基體結合不夠牢靠。而且,對於形狀不 規則或形狀較複雜的塑膠基體經常會出現電鍍不均句的現象,導致電磁波 屏蔽性能降低,影響電子元件的正常運行。 【發明内容】 —本發明之目的在於提供一種電磁波屏蔽組件,該電磁波屏蔽組件之屏 蔽層厚度均勻,而且屏蔽層與電磁波屏蔽組件之基體結合牢靠。 本發明之另一目的在於提供一種電磁波屏蔽組件之製造方法,該方法 可使不,形狀的電磁波屏蔽組件之基體獲得均勻致密的電磁波屏蔽層。 為實現上述發明之目的,本發明電磁波屏蔽組件之製造方法包括以下 步驟:首先對基體進行預處理,對預處理過的基體進行離子鍍膜,鍍上一 層黏附層鎳。對鍍有鎳層的基體再次進行離子鍍膜,在基體鎳層薄膜表面 鍍上一層金屬屏蔽層銅。最後,為增加該處理過的電磁波屏蔽組件之耐磨 防蝕性能,用離子鍍方法使其鍍上一層耐磨防蝕層,如不鏽鋼。為取得更 好的屏蔽性能,可以對該基體鍍上多層交替的黏附層及金屬屏蔽層。 相較習知之電磁波屏蔽組件及製造方法,本發明電磁波屏蔽組件因藉 ,離子鍍方法多次鍍膜,使該電磁波屏蔽組件獲得均勻、致密的電磁波屏 蔽層,而且基體與電磁波屏蔽層結合牢靠。因為離子鍍方法具有繞射性好 之特點,所以適宜製造不同形狀的電磁波屏蔽組件。 【實施方式】 請參閱第一圖所示,離子鍍膜裝置由真空室1、真空機組2及電子搶3 1276397 組成。真空機組2設於真空室1之麻j 設於真”丨之左碰,㈣發射高能_可子職工室1 «空。電子搶3 在直ίί 乍架&在真空室1右側壁開設有進氣孔1〇。 在具工至1之底部,又置有陽極_ 15、16。另 ΐΐϋ41| °基體41由常用的塑膠材料,如聚碳酸醋加卫而成。坩^ 15 及綱16則分別容置不同金屬原材料,如錄17及銅18。成掛尚15 組件^圖及第,下祕仔緒述本發日㈣磁波屏蔽 纽41離子鍍金屬屏蔽層之前,需要對基體41進行預處理。首 =;Γ再入=二,欠r水沖洗、蒸配 錢制x 基體進魏水處理並吹乾。最後將吹乾 後的基體41放入烘烤爐内烘乾,烘烤溫度不高於8〇t。 +將裝人真空室1内’搁置於旋轉工作架12上進行氧氣 电水Μ洗。此柃,真空室内之真空度為1〇-ι〜1〇·2托(丁〇ιτ)。由進氣孔1〇以 200 2000SCCM(Standard Cubic Centimeter per Minute,標準立方厘乎备八户、 的速度通人減,並錄體41爲加丨〜3千伏的貞緒喊生輝H刀電鐘) 乳氣被輝光放電電離成氧離子,並在施加於基體41上的貪高壓電場的加速 下飛向基體41,對基體41表面進行離子轟擊清洗,上述過程持續12〜2〇 分鐘。 、 氧氣電漿清洗完畢後,停止通入氧氣。啟動真空機組2對真空室i内 未反應氣體抽真空,同時並由進氣孔1〇通入適量惰性氣體如氬氣,以使真 空室1内保持惰性氣氛。五分鐘後,停止通入氬氣並關閉進氣孔1〇。繼^ 利用真空機組2對真空室1抽真空,使其達到真空度為ι〇-6〜ισ8托。、 此時’對基體41進行離子鍍膜處理,為增加金屬屏蔽層在基體41上 的黏著力,可在其上鍍一層黏附層如鎳或磷化鎳。施加5〇〜2〇〇伏特的偏壓 於基體41上。由電子搶14之钽管32中通入氬氣,保持通入氬氣流量為 20〜60SCCM和抽氣速率為70〜150SCCM,接通引燃電源,使鈕管32内產 生空心陰極放電,鈕管32被氬離子轟擊而溫度升高並發射大量熱電子。這 時接通主電源,就會形成低電壓、高電流密度的空心陰極等離子電子束。 該電子束之放電電壓維持在30〜60伏,放電電流為2〜300Α。電子束在聚焦 磁場和偏轉磁場的作用下射向陽極坩堝15,並由坩堝聚焦磁場聚焦後打在 1276397 ίϊ,15/0t金屬鎳17表面’使其炫化、蒸發。金屬·17表面之鎳原 ^穿過電子束向基體41遷移的過程中,與電子發生激烈的碰撞而電離 =成大量^能中性粒子,沉積於基體41表面形成鎳層薄膜42,厚度為门$ X〜10x10 #。由於在整個離子錢膜過程中,電離的正離子在基體^ =作用下及高能巾性粒子碰撞下,獨地轟擊基體q和膜層表面,清除 =不牢_原子和韻於表面的殘錢體分子,所以使膜_著力比較 強,艘膜也比較均勻、致密。 單又 然後,對鍍有錄層薄膜42的基體q進行離子鍍 面附著-層金屬屏蔽層銅。藉由同樣的方法,使離子源14 打到置㈣^6中的金屬銅18之表面,最終在基體41之錄層薄膜^ 面形,銅層薄膜43。銅層薄膜43之厚度為3χ1〇-7〜6χ1〇-7米。、、 ’為增加電磁波屏蔽組件表面之耐磨、防止腐姓,可選擇性地再 二錯由離子鍵方法使表面形成銅層_43的基體41附著—層耐磨防健 二如^ ^不鏽躺厚度在2XlG.8〜2議·8狀間。在整個離子鑛膜i 二尸:ΓΓ度要保雜於8GC。藉此方法製成的具有屏蔽電磁功能之電 磁波屏敝組件4結構如第三圖所示。 机^理解,上述電磁波屏肢件製造方法可以祕手機、筆記本電腦、 私蓉- =Ϊ(ΡΕ)Α^裝置之具屏蔽電磁波功能之印刷電路板、電磁波屏蔽外 二實現對安裝於電路板上的電子元件進行屏蔽。為得到更 呈古夕/·井蔽效果,上述方法亦可用於對基體41進行多層離子鏡,使1 膜屬屏蔽層。如在本實施例中,在離子鑛金屬銅結束後,停止錢 二t41冷卻5〜15分鐘,使其溫度低於80°c。然後,對鍍有銅層 賴=的基體4丨離子難,然後再離子_,最碰上耐磨防储44。 上』ilt ’本發明符合發明專利要件,爰依法提出專利申請。惟,以 限,二iff發明之較佳實施例,本發明之範圍並不以上述實施例為 比/、、”本紐藝之人士援依本發明之精神所作之等效修飾或變化, 白應涵盍於以下申請專利範圍内。 【圖式簡單說明】 第圖係本發明製造電磁波屏蔽組件所用裝置之示意 圖。 ^ 第=圖係本發明製造電磁波屏蔽組件流程示意圖。 第三圖係本發明製造電磁波屏蔽組件結構示意圖。 1276397 【主要元件符號說明】 真空室 1 氣體入口 10 旋轉工作架 12 坩堝 15 坩堝 16 金屬鎳 17 金屬銅 18 真空機組 2 電子槍 3 電子槍鈕管 32 電磁波屏蔽組件 4 基體 41 鎳層薄膜 42 銅層薄膜 43 而才磨防#層 44
Claims (1)
127639^-T—Π 年卜月 > 日修(東说頁 . 十、申請專利範圍: 1·一種電磁波屏蔽組件之製造方法,包括以下步驟: (1) 首先對基體進行氧氣電漿處理,以清洗該基體; (2) 對電漿處理過的基體進行離子鍍膜,鍍上一層勘附層; ⑶對鍍有黏附層的基體再次進行離子鍍膜,鍍上—層^屬屏蔽層;及 (4)最後再對該鍍有金屬屏蔽層之基體鑛上一層耐磨防姓声。 2·如申請專利範圍第1項所述電磁波屏蔽組件之製造方法,&中在製造過程 中電磁波屏蔽組件基體之溫度低於80°C。 八 3·如申請專利範圍第1項所述電磁波屏蔽組件之製造方法,其中所述離子鍍 膜係在真空條件下進行,真空度為1〇-6〜10·8托(丁0〇:)。/、 又 4·如申請專利範圍第1項所述電磁波屏蔽組件之製造方法,其中所述步驟 氧氣之流速為200〜2000標準立方厘米每分鐘。 ’、 ^ 5·如申請專利範圍第1項所述電磁波屏蔽組件之製造方法,其中所述步驟 黏附層為鎳或磷化鎳。 μ 6·如申請專利範圍第1項所述電磁波屏蔽組件之製造方法,其中所述步驟 金屬屏蔽層為銅。 7·如申請專利範圍第1項所述電磁波屏蔽組件之製造方法,其中在步驟〇)結 束5〜15分鐘後,可選擇性地在金屬屏蔽層上離子鍍膜,鍍上一層黏附層7 鎳或磷化鎳。 8·如申請專利範圍第7項所述電磁波屏蔽組件之製造方法,其中在鍍有鎳或 磷化鎳的表面,再離子鍍上一層銅層薄膜。 9·一種電磁波屏蔽組件之製造方法,包括以下步驟: (1)清洗基體; (2)對清洗過的基體進行離子鍍膜,鍍上一層黏附層;及 ⑶對鑛有黏附層的基體再次進行離子鍍膜,鍍上_層金屬屏蔽層。 10·如申請專利範圍第9項所述電磁波屏蔽組件之製造方法,其中最後再對該 鑛有金屬屏蔽層之基體鍍上一層耐磨防蝕層。 以 11·=申請專利範圍第9項所述電磁波屏蔽組件之製造方法,其中清洗基 採用氧氣電漿處理。 土 ’、 ’其中步驟(2)離 12·如申請專利範圍第9項所述電磁波屏蔽組件之製造方法 子鍍之黏附層為金屬鎳。 13·如申請專利範圍第9項所述電磁波屏蔽組件之製造方法,其中步驟⑶離 子鍍之金屬屏蔽層為金屬銅。 14.一種電磁波屏蔽組件,包括: 基體,係由塑膠材料制成; 附著於基體表面之黏附層; 附著於黏附層表面之金屬屏蔽層;及 附著於金屬屏蔽層表面之耐磨防蝕層。 15·如申睛專利乾圍第μ項所述電磁波屏蔽組件,其中所述黏附層為鎳層。 16.如申請專利範圍第14項所述電磁波屏蔽組件,其中所述黏附層為磷化鎳。 17·如申請專利範圍第15項或16項所述電磁波屏蔽組件,其中所述黏附層之 厚度為5χ10·9〜l〇xi(T9米。 18·如申請專利範圍第14項所述電磁波屏蔽組件,其中所述金屬屏蔽層為銅。 19·如申請專利範圍第18項所述電磁波屏蔽組件,其中所述鋼之厚声為 3xlCT7 〜6xl〇·7 米。 X 1276397 γ年(月α日修(更)正替換頁乂 _____ 七、指定代表圖: (一) 本案指定代表圖為:第(二)圖。 (二) 本代表圖之元件符號簡單說明:
八、本案若有化學式時,請揭示最能顯示發明特徵的化學式: 無
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US8021193B1 (en) * | 2005-04-25 | 2011-09-20 | Nvidia Corporation | Controlled impedance display adapter |
KR100790420B1 (ko) * | 2005-12-28 | 2008-01-02 | 제일모직주식회사 | 전자파 차폐 케이블 |
US8481867B2 (en) * | 2010-07-20 | 2013-07-09 | Brady Converting Ab | Conductive grounding pad |
US8513541B2 (en) | 2011-01-21 | 2013-08-20 | Remy Technologies, L.L.C. | Method of blocking electro-magnetic interference (EMI) in an electric machine and apparatus |
CN104885578B (zh) * | 2013-02-26 | 2018-05-04 | 大自达电线股份有限公司 | 柔性印制线路板用补强部分、柔性印制线路板及屏蔽印制线路板 |
US9949359B2 (en) | 2014-03-18 | 2018-04-17 | Apple Inc. | Multi-layer thin-film coatings for system-in-package assemblies in portable electronic devices |
US9913412B2 (en) | 2014-03-18 | 2018-03-06 | Apple Inc. | Shielding structures for system-in-package assemblies in portable electronic devices |
US9820373B2 (en) | 2014-06-26 | 2017-11-14 | Apple Inc. | Thermal solutions for system-in-package assemblies in portable electronic devices |
CN118028762B (zh) * | 2024-04-12 | 2024-07-09 | 山东省宝丰镀膜有限公司 | 一种悬浮式卷绕磁控阴极轰击蒸发成膜系统 |
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US4544571A (en) * | 1984-02-13 | 1985-10-01 | Pennwalt Corporation | Method of manufacture of EMI/RFI vapor deposited composite shielding panel |
DE69317035T2 (de) * | 1992-11-09 | 1998-06-10 | Chugai Ings Co | Herstellungsverfahren eines Kunststoffformkörpers mit elektromagnetischer Abschirmung |
US5811050A (en) * | 1994-06-06 | 1998-09-22 | Gabower; John F. | Electromagnetic interference shield for electronic devices |
EP1215705A3 (en) * | 2000-12-12 | 2003-05-21 | Nisshinbo Industries, Inc. | Transparent electromagnetic radiation shielding material |
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