TWI271505B - Method for examining land pattern and apparatus for examining the same - Google Patents

Method for examining land pattern and apparatus for examining the same Download PDF

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Publication number
TWI271505B
TWI271505B TW094145474A TW94145474A TWI271505B TW I271505 B TWI271505 B TW I271505B TW 094145474 A TW094145474 A TW 094145474A TW 94145474 A TW94145474 A TW 94145474A TW I271505 B TWI271505 B TW I271505B
Authority
TW
Taiwan
Prior art keywords
image
hole
circle
pattern
target
Prior art date
Application number
TW094145474A
Other languages
English (en)
Chinese (zh)
Other versions
TW200636207A (en
Inventor
Yuji Akagi
Jun Onishi
Katsuji Kenno
Original Assignee
Dainippon Screen Mfg
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dainippon Screen Mfg filed Critical Dainippon Screen Mfg
Publication of TW200636207A publication Critical patent/TW200636207A/zh
Application granted granted Critical
Publication of TWI271505B publication Critical patent/TWI271505B/zh

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Classifications

    • EFIXED CONSTRUCTIONS
    • E01CONSTRUCTION OF ROADS, RAILWAYS, OR BRIDGES
    • E01FADDITIONAL WORK, SUCH AS EQUIPPING ROADS OR THE CONSTRUCTION OF PLATFORMS, HELICOPTER LANDING STAGES, SIGNS, SNOW FENCES, OR THE LIKE
    • E01F8/00Arrangements for absorbing or reflecting air-transmitted noise from road or railway traffic
    • E01F8/0005Arrangements for absorbing or reflecting air-transmitted noise from road or railway traffic used in a wall type arrangement
    • E01F8/0023Details, e.g. foundations

Landscapes

  • Life Sciences & Earth Sciences (AREA)
  • Sustainable Development (AREA)
  • Engineering & Computer Science (AREA)
  • Architecture (AREA)
  • Civil Engineering (AREA)
  • Structural Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)
TW094145474A 2005-03-28 2005-12-21 Method for examining land pattern and apparatus for examining the same TWI271505B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005091990A JP4518494B2 (ja) 2005-03-28 2005-03-28 ランドパターン検査方法及び検査装置

Publications (2)

Publication Number Publication Date
TW200636207A TW200636207A (en) 2006-10-16
TWI271505B true TWI271505B (en) 2007-01-21

Family

ID=37030156

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094145474A TWI271505B (en) 2005-03-28 2005-12-21 Method for examining land pattern and apparatus for examining the same

Country Status (4)

Country Link
JP (1) JP4518494B2 (enExample)
KR (1) KR100660400B1 (enExample)
CN (1) CN100507530C (enExample)
TW (1) TWI271505B (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5234639B2 (ja) * 2009-01-31 2013-07-10 株式会社メガトレード スルーホールの検査装置
CN101995223B (zh) * 2009-08-25 2013-05-08 比亚迪股份有限公司 一种芯片外观检测方法及系统
CN102595024B (zh) * 2011-12-16 2014-10-22 飞狐信息技术(天津)有限公司 一种数字视频图像修复方法与装置
CN104020222B (zh) * 2014-06-18 2016-06-22 长春光华微电子设备工程中心有限公司 全自动超声波铝丝压焊机焊接质量检测系统
CN104535587A (zh) * 2014-12-23 2015-04-22 安徽科鸣三维科技有限公司 一种基于机器视觉的pcba焊点检测方法
JP6496159B2 (ja) * 2015-02-23 2019-04-03 株式会社Screenホールディングス パターン検査装置およびパターン検査方法
TWI521476B (zh) * 2015-04-17 2016-02-11 銘傳大學 週期性圖案之自動光學檢測方法
CN106651989B (zh) * 2016-12-21 2020-04-21 北京信息科技大学 用于微小孔对中的嵌套圆拟合方法及装置
CN109950165B (zh) * 2019-02-19 2021-06-04 长江存储科技有限责任公司 测试结构和测试方法
CN118070749B (zh) * 2024-04-17 2024-07-23 淄博芯材集成电路有限责任公司 一种基板收缩方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01269035A (ja) * 1988-04-21 1989-10-26 Ibiden Co Ltd プリント回路基板の検査装置
JP2001267722A (ja) * 2000-03-23 2001-09-28 Ngk Spark Plug Co Ltd プリント配線板の検査方法
JP3589424B1 (ja) * 2003-12-22 2004-11-17 株式会社メガトレード 基板検査装置

Also Published As

Publication number Publication date
KR100660400B1 (ko) 2006-12-22
CN1841049A (zh) 2006-10-04
JP4518494B2 (ja) 2010-08-04
JP2006275612A (ja) 2006-10-12
CN100507530C (zh) 2009-07-01
KR20060103823A (ko) 2006-10-04
TW200636207A (en) 2006-10-16

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