TWI225658B - Ion source - Google Patents
Ion source Download PDFInfo
- Publication number
- TWI225658B TWI225658B TW092109457A TW92109457A TWI225658B TW I225658 B TWI225658 B TW I225658B TW 092109457 A TW092109457 A TW 092109457A TW 92109457 A TW92109457 A TW 92109457A TW I225658 B TWI225658 B TW I225658B
- Authority
- TW
- Taiwan
- Prior art keywords
- filament
- ion source
- mentioned
- raw material
- material gas
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
- H01J37/08—Ion sources; Ion guns
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Sources, Ion Sources (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002120072A JP3575472B2 (ja) | 2002-04-23 | 2002-04-23 | イオン源 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200402749A TW200402749A (en) | 2004-02-16 |
TWI225658B true TWI225658B (en) | 2004-12-21 |
Family
ID=29267353
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW092109457A TWI225658B (en) | 2002-04-23 | 2003-04-23 | Ion source |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP3575472B2 (ja) |
KR (1) | KR100548930B1 (ja) |
CN (1) | CN1263080C (ja) |
TW (1) | TWI225658B (ja) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8748845B2 (en) | 2003-10-16 | 2014-06-10 | Carl Zeiss Microscopy, Llc | Ion sources, systems and methods |
TWI463525B (zh) * | 2005-12-02 | 2014-12-01 | Carl Zeiss Microscopy Llc | 用於樣本分析的系統 |
TWI467615B (zh) * | 2009-04-16 | 2015-01-01 | Varian Semiconductor Equipment | 離子源與調整離子束均一性的方法 |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8028653B2 (en) | 2007-12-06 | 2011-10-04 | Hitachi Global Storage Technologies Netherlands, B.V. | System, method and apparatus for filament and support used in plasma-enhanced chemical vapor deposition for reducing carbon voids on media disks in disk drives |
JP7197245B2 (ja) * | 2017-01-12 | 2022-12-27 | キヤノン電子管デバイス株式会社 | X線管及びx線管の製造方法 |
JP7197927B2 (ja) * | 2020-02-20 | 2022-12-28 | 株式会社 プラズマテック | 電子ビーム発生装置及びアタッチメント部材 |
-
2002
- 2002-04-23 JP JP2002120072A patent/JP3575472B2/ja not_active Expired - Lifetime
-
2003
- 2003-04-21 KR KR1020030024993A patent/KR100548930B1/ko active IP Right Grant
- 2003-04-22 CN CNB031232329A patent/CN1263080C/zh not_active Expired - Fee Related
- 2003-04-23 TW TW092109457A patent/TWI225658B/zh not_active IP Right Cessation
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8748845B2 (en) | 2003-10-16 | 2014-06-10 | Carl Zeiss Microscopy, Llc | Ion sources, systems and methods |
TWI463525B (zh) * | 2005-12-02 | 2014-12-01 | Carl Zeiss Microscopy Llc | 用於樣本分析的系統 |
TWI463515B (zh) * | 2005-12-02 | 2014-12-01 | Carl Zeiss Microscopy Llc | 產生離子束的系統 |
TWI463524B (zh) * | 2005-12-02 | 2014-12-01 | Carl Zeiss Microscopy Llc | 離子顯微鏡、離子源系統 |
TWI463514B (zh) * | 2005-12-02 | 2014-12-01 | Carl Zeiss Microscopy Llc | 處理樣本之方法 |
TWI467615B (zh) * | 2009-04-16 | 2015-01-01 | Varian Semiconductor Equipment | 離子源與調整離子束均一性的方法 |
Also Published As
Publication number | Publication date |
---|---|
TW200402749A (en) | 2004-02-16 |
KR20030084630A (ko) | 2003-11-01 |
CN1453818A (zh) | 2003-11-05 |
CN1263080C (zh) | 2006-07-05 |
KR100548930B1 (ko) | 2006-02-02 |
JP3575472B2 (ja) | 2004-10-13 |
JP2003317640A (ja) | 2003-11-07 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |