TW572979B - Polishing composition - Google Patents
Polishing composition Download PDFInfo
- Publication number
- TW572979B TW572979B TW90102235A TW90102235A TW572979B TW 572979 B TW572979 B TW 572979B TW 90102235 A TW90102235 A TW 90102235A TW 90102235 A TW90102235 A TW 90102235A TW 572979 B TW572979 B TW 572979B
- Authority
- TW
- Taiwan
- Prior art keywords
- grinding
- composition
- soluble
- dielectric layer
- acid
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
- H10P52/40—Chemomechanical polishing [CMP]
- H10P52/403—Chemomechanical polishing [CMP] of conductive or resistive materials
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09G—POLISHING COMPOSITIONS; SKI WAXES
- C09G1/00—Polishing compositions
- C09G1/02—Polishing compositions containing abrasives or grinding agents
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
- C09K3/1454—Abrasive powders, suspensions and pastes for polishing
- C09K3/1463—Aqueous liquid suspensions
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/042—Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor
- B24B37/044—Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor characterised by the composition of the lapping agent
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/24—Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Grinding-Machine Dressing And Accessory Apparatuses (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US17967900P | 2000-02-02 | 2000-02-02 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW572979B true TW572979B (en) | 2004-01-21 |
Family
ID=22657533
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW90102235A TW572979B (en) | 2000-02-02 | 2001-02-02 | Polishing composition |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US7070485B2 (https=) |
| EP (1) | EP1263906A1 (https=) |
| JP (1) | JP2003522424A (https=) |
| KR (1) | KR100756469B1 (https=) |
| TW (1) | TW572979B (https=) |
| WO (1) | WO2001057150A1 (https=) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7524346B2 (en) * | 2002-01-25 | 2009-04-28 | Dupont Air Products Nanomaterials Llc | Compositions of chemical mechanical planarization slurries contacting noble-metal-featured substrates |
| US7037184B2 (en) | 2003-01-22 | 2006-05-02 | Raytech Innovation Solutions, Llc | Polishing pad for use in chemical-mechanical planarization of semiconductor wafers and method of making same |
| US6852020B2 (en) | 2003-01-22 | 2005-02-08 | Raytech Innovative Solutions, Inc. | Polishing pad for use in chemical—mechanical planarization of semiconductor wafers and method of making same |
| WO2004040633A1 (en) * | 2002-10-25 | 2004-05-13 | Intersurface Dynamics, Inc. | Method for using additives in the caustic etching of silicon for obtaining improved surface characteristics |
| US8025808B2 (en) * | 2003-04-25 | 2011-09-27 | Saint-Gobain Ceramics & Plastics, Inc. | Methods for machine ceramics |
| JP4339034B2 (ja) * | 2003-07-01 | 2009-10-07 | 花王株式会社 | 研磨液組成物 |
| US20050045852A1 (en) * | 2003-08-29 | 2005-03-03 | Ameen Joseph G. | Particle-free polishing fluid for nickel-based coating planarization |
| US8759216B2 (en) * | 2006-06-07 | 2014-06-24 | Cabot Microelectronics Corporation | Compositions and methods for polishing silicon nitride materials |
| CN101588894B (zh) * | 2006-12-20 | 2013-03-27 | 圣戈本陶瓷及塑料股份有限公司 | 机械加工无机非金属工件的方法 |
| MY150487A (en) * | 2008-09-19 | 2014-01-30 | Cabot Microelectronics Corp | Barrier slurry for low-k dielectrics. |
Family Cites Families (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4338377A (en) * | 1979-10-10 | 1982-07-06 | Minnesota Mining And Manufacturing Company | Sulfonato-organosilanol compounds and aqueous solutions thereof |
| US4480009A (en) * | 1980-12-15 | 1984-10-30 | M&T Chemicals Inc. | Siloxane-containing polymers |
| US4537914A (en) * | 1983-07-06 | 1985-08-27 | Creative Products Resource Associates, Ltd. | Floor cleaning and waxing composition |
| JPS61136909A (ja) * | 1984-12-04 | 1986-06-24 | Mitsubishi Chem Ind Ltd | 無水ケイ酸の水分散液組成物 |
| DE3735158A1 (de) | 1987-10-16 | 1989-05-03 | Wacker Chemitronic | Verfahren zum schleierfreien polieren von halbleiterscheiben |
| JP2714411B2 (ja) | 1988-12-12 | 1998-02-16 | イー・アイ・デュポン・ドゥ・ヌムール・アンド・カンパニー | ウェハーのファイン研摩用組成物 |
| US5352277A (en) * | 1988-12-12 | 1994-10-04 | E. I. Du Pont De Nemours & Company | Final polishing composition |
| US5391258A (en) | 1993-05-26 | 1995-02-21 | Rodel, Inc. | Compositions and methods for polishing |
| US5614444A (en) | 1995-06-06 | 1997-03-25 | Sematech, Inc. | Method of using additives with silica-based slurries to enhance selectivity in metal CMP |
| US5681055A (en) * | 1995-09-28 | 1997-10-28 | Morton International, Inc. | Side-impact airbag module assembly incorporating combination airbag inflator and module housing |
| US5645736A (en) * | 1995-12-29 | 1997-07-08 | Symbios Logic Inc. | Method for polishing a wafer |
| KR970042941A (ko) * | 1995-12-29 | 1997-07-26 | 베일리 웨인 피 | 기계적 화학적 폴리싱 공정을 위한 폴리싱 합성물 |
| US5958288A (en) * | 1996-11-26 | 1999-09-28 | Cabot Corporation | Composition and slurry useful for metal CMP |
| US6083419A (en) * | 1997-07-28 | 2000-07-04 | Cabot Corporation | Polishing composition including an inhibitor of tungsten etching |
| JPH11345789A (ja) * | 1998-06-01 | 1999-12-14 | Toshiba Corp | 研磨方法 |
| JP4257687B2 (ja) * | 1999-01-11 | 2009-04-22 | 株式会社トクヤマ | 研磨剤および研磨方法 |
| US6582623B1 (en) | 1999-07-07 | 2003-06-24 | Cabot Microelectronics Corporation | CMP composition containing silane modified abrasive particles |
| US6602112B2 (en) * | 2000-01-18 | 2003-08-05 | Rodel Holdings, Inc. | Dissolution of metal particles produced by polishing |
-
2001
- 2001-02-02 EP EP01906896A patent/EP1263906A1/en not_active Withdrawn
- 2001-02-02 JP JP2001557972A patent/JP2003522424A/ja active Pending
- 2001-02-02 TW TW90102235A patent/TW572979B/zh not_active IP Right Cessation
- 2001-02-02 US US09/776,079 patent/US7070485B2/en not_active Expired - Fee Related
- 2001-02-02 KR KR1020027009918A patent/KR100756469B1/ko not_active Expired - Fee Related
- 2001-02-02 WO PCT/US2001/003367 patent/WO2001057150A1/en not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| KR20020075902A (ko) | 2002-10-07 |
| US20010044264A1 (en) | 2001-11-22 |
| EP1263906A1 (en) | 2002-12-11 |
| KR100756469B1 (ko) | 2007-09-07 |
| JP2003522424A (ja) | 2003-07-22 |
| WO2001057150A1 (en) | 2001-08-09 |
| US7070485B2 (en) | 2006-07-04 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GD4A | Issue of patent certificate for granted invention patent | ||
| MM4A | Annulment or lapse of patent due to non-payment of fees |