TW503661B - Optical observation device and method for observing articles at elevated temperatures - Google Patents

Optical observation device and method for observing articles at elevated temperatures Download PDF

Info

Publication number
TW503661B
TW503661B TW090101461A TW90101461A TW503661B TW 503661 B TW503661 B TW 503661B TW 090101461 A TW090101461 A TW 090101461A TW 90101461 A TW90101461 A TW 90101461A TW 503661 B TW503661 B TW 503661B
Authority
TW
Taiwan
Prior art keywords
emr
spontaneous
wavelength
component
reflected
Prior art date
Application number
TW090101461A
Other languages
English (en)
Inventor
Tzyy-Shuh Chang
Original Assignee
Og Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Og Technologies Inc filed Critical Og Technologies Inc
Application granted granted Critical
Publication of TW503661B publication Critical patent/TW503661B/zh

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Optics & Photonics (AREA)
  • Radiation Pyrometers (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Closed-Circuit Television Systems (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Description

503661 屬 % .、_案號 9Q1Q1461_年月日_魅__ 五、發明說明（16) 本設計中，435 nm之光線係最有用的波長，因為其與一高 熱物體之自發性射線差距最大。該高熱物體必須處在1 8 0 0 °C或更高之溫度，以使其自發性射線可以覆蓋4 3 5 n m，假 設該高熱物體係接近一黑體。 2. 外部光源係照射在高熱物體上，並且與高熱物體之表 面相接觸。由金屬鹵素燈泡（具有三種不同波長）所反射之 射線、由高熱物體發出之自發性射線、以及任何存在之其 他射線，皆係混合在一起。 3. 混合之射線接著便可以通過一干涉濾波器，其係具有 一工作波長4 3 5 n m。亦即，僅有波長係4 3 5 n m之射線才可 以通過該干涉濾波器。所有其他射線都將被阻擋在外。此 一干涉濾波器係可以放置在透鏡前面，或者係放置在映像 感應器前面。 4 .僅有具有預定波長之射線（在此例中係4 3 5 n m )才會到 達影像感應器。 5 .高熱物體將顯示在影像感應器，例如一 C C D晶片，該 影像係如同高熱物體係處在室溫一樣。 6 .解調變之4 3 5 n m訊號接著便轉換成一電子訊號。 7.電子訊號便可以由一 C P U來加以處理，儲存在媒體 中，顯示在一監視器以供人員觀測，或者係進行其他型式 的處理。
O:\68\68742-960717.ptc 第19頁 第090101461號專利申請案 中文申請專利範圍替換本(99年11月） 六、申請專利範園 1. 一種光學系統，其係用以產生一物體表面之影像，該物體係具有一獨 特的、溫度取向的、突顯的、自發性EMR光譜，該系統包含： 一EMR光源，其係朝向該物體而投射電磁射線； 一EMR偵測器，其係選擇性地偵測該投射之EMR之一光譜分量，該分 量係由物體之表面所反射而射向該EMR偵測器； 一干涉濾波器，其係與該EMR偵測器相連結； 其中該投射EMR之反射分量係具有一不同於該自發性、突顯之EMR光 譜之波長’使得該反射分量係可以根據波長而與該自發性]^]^區別出來。 2. —種光學系統，其係用以產生一物體表面之影像，該物體係具有一獨 特的、溫度取向的、突顯的、自發性EMR光譜，該系統包含： 一EMR光源，其係朝向該物體而投射電磁射線； 一EMR偵測器，其係選擇性地偵測該投射之EMR之一光譜分量，該分 量係由物體之表面所反射而射向該EMR偵測器； 一氣流控制器，其係提供空氣至該物體，以消除空氣密度的變化； 其中該投射EMR之反射分量係具有一不同於該自發性、突 顯之EMR光 譜之波長’使得該反射分量係可以根據波長而與該自發性EMR區別出來。 3. —種光學系統，其係用以產生一物體表面之影像，該物體係具有一獨 特的、溫度取向的、突顯的、自發,MMR光譜，該系統包含： -EMR光源，其係朝向該物體而投射電磁射線； 一EMR偵測器，其係選擇性地偵測該投射之EMR之一光譜分量，該分 量係由物體之表面所反射而射向該£]^偵測器； ct2381-2-991122.doc 一與頻率光源相連結，用以調變該投射EMR之頻率之調變器，且進一 步包括一與該EMR偵測器連結之解調器； 其中該投射EMR之反射分量係具有一不同於該自發性、突顯之EMR光 '晉之波長，使知β亥反射分里係可以根據波長而與該自發性區別出來。 4. -種光學系統’其係用以產生—物體表面之影像，該物體係具有一獨 特的、溫度取向的、突顯的、自發性EMR光譜，該系統包含： 一EMR光源’其係朝向該物體而投射電磁射線； 一EMR摘測器，其係選擇性地偵測該投射之EMR之一光譜分量，該分 置係由物體之表面所反射而射向該EMR债測器； 其中^EMR光源係僅由以下之族群中選出：金屬鹵素燈泡、以及氙燈 泡，且邊投射EMR之反射分量係具有一不同於該自發性、突顯之EMR光譜 之波長，使得該反射分量係可以根據波長而與該自發性EMR區別出來。 5. —種光學系統，其係用以產生一物體表面之影像，該物體係具有一獨 特的、溫度取向的、突顯的、自發性£]^光譜，該系統包含· 一EMR光源，其係朝向該物體而投射電磁射線； 一EMR偵測器’其係選擇性地偵測該投射之EMR之一光譜分量，該分 量係由物體之表面所反射而射向該EMR偵測器； 其中該EMR光源係一投射一區域光線之雷射，且該投射出之雷射之反 射分量係具有一不同於該自發性、突顯之EMR光譜之波長，使得該反射分 量係可以根據波長而與該自發性EMR區別出來。 6. 一種光學系統，其係用以產生一物體表面之影像，該物體係具有一獨 特的、溫度取向的、突顯的、自發性EMR光譜，該系統包含： ct2381-2-991122.doc ⑧ -2- 503661 * Λ EMR光源’其係朝向該物體而投射電磁射線； EMR偵勤’錢選擇性地侧該投射处之—光譜分量，該分 量係由物體之表輯反射而射向該EMR伽器； 其中該EMR光源係一投射具有特定樣式的光線之雷射，且該投射出之 雷射之反射分量係具有-不同於該自發性、翅之EMR光譜之波長，使得 s玄反射分量係可以根據波長而與該自發性]5]^區別出來。 7·種光學系統’其係用以產生一高熱物體表面的影像，該物體係具有 一獨特的、突顯的、自發性EMR光譜，該系統包含： 一影像攝影機，可感應l75nm至lOOOnm之波長： 干涉滤波器，其係與該影像攝影機相連結，其可以阻擒幾乎所有的 自發性EMR光譜;以及 一光源，其係連接至該影像攝影機，能夠產生包括該攝影機可威應之 波長。 ct2381-2-991122.doc
TW090101461A 1999-08-31 2001-01-20 Optical observation device and method for observing articles at elevated temperatures TW503661B (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US15156599P 1999-08-31 1999-08-31
US09/630,479 US6859285B1 (en) 1999-08-31 2000-08-02 Optical observation device and method for observing articles at elevated temperatures
PCT/US2000/023139 WO2001017264A1 (en) 1999-08-31 2000-08-23 Optical observation device and method for observing articles at elevated temperatures

Publications (1)

Publication Number Publication Date
TW503661B true TW503661B (en) 2002-09-21

Family

ID=26848765

Family Applications (1)

Application Number Title Priority Date Filing Date
TW090101461A TW503661B (en) 1999-08-31 2001-01-20 Optical observation device and method for observing articles at elevated temperatures

Country Status (10)

Country Link
US (2) US6859285B1 (zh)
EP (1) EP1216575A1 (zh)
JP (1) JP2003508979A (zh)
KR (1) KR20020035581A (zh)
CN (1) CN1200567C (zh)
AU (1) AU7066700A (zh)
BR (1) BR0013640A (zh)
CA (1) CA2391782A1 (zh)
TW (1) TW503661B (zh)
WO (1) WO2001017264A1 (zh)

Families Citing this family (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7381211B2 (en) * 2002-08-21 2008-06-03 Kci Licensing, Inc. Medical closure screen device and method
US8062331B2 (en) * 2002-08-21 2011-11-22 Kci Licensing, Inc. Internal and external medical closure screen systems and methods
US7976519B2 (en) * 2002-12-31 2011-07-12 Kci Licensing, Inc. Externally-applied patient interface system and method
FR2852389B1 (fr) * 2003-03-12 2005-05-13 Commissariat Energie Atomique Procede de mesure d'objets tridimensionnels par ombroscopie optique a une seule vue
JP3828532B2 (ja) * 2003-10-29 2006-10-04 Ｔｄｋ株式会社 検査装置および検査方法
FR2887028B1 (fr) * 2005-06-14 2007-12-21 Vai Sias Soc Par Actions Simpl Procede et dispositif optiques de detection de defauts de surface et de structure d'un produit long en defilememnt
US20070065545A1 (en) * 2005-09-20 2007-03-22 Terry Vovan Multi-topping tray container system
KR100891842B1 (ko) * 2007-08-28 2009-04-07 주식회사 포스코 원형 선재 광학결함 검출장치 및 방법
US8224021B2 (en) 2008-03-14 2012-07-17 Millivision Technologies, Inc. Method and system for automatic detection of a class of objects
US8643539B2 (en) * 2008-11-19 2014-02-04 Nokomis, Inc. Advance manufacturing monitoring and diagnostic tool
US20100165080A1 (en) * 2008-12-26 2010-07-01 Fujifilm Corporation Image capturing apparatus and endoscope
US20100321501A1 (en) * 2009-06-23 2010-12-23 Arndt Donald J Electromagnetic Radiation Detector
DE102010055506A1 (de) * 2009-12-22 2011-07-07 MICRO-EPSILON Optronic GmbH, 01465 Sensor und Verfahren zum optischen Messen eines Abstands, einer Position und/oder eines Profils
ES2378602B1 (es) 2009-12-29 2013-02-22 Fundacion Robotiker Sistema de captura y procesamiento de imagen de perfiles de revolución en caliente.
CN102865940A (zh) * 2012-09-27 2013-01-09 上海交通大学 激光切割切缝内热分布与熔融金属流动的测试装置
WO2014145925A1 (en) * 2013-03-15 2014-09-18 Moontunes, Inc. Systems and methods for controlling cameras at live events
TWI472782B (zh) * 2013-04-10 2015-02-11 Inotera Memories Inc 半導體裝置之檢測方法以及半導體裝置之檢測系統
US10373470B2 (en) 2013-04-29 2019-08-06 Intelliview Technologies, Inc. Object detection
ES2890649T3 (es) 2013-05-23 2022-01-21 Rina Consulting Centro Sviluppo Mat S P A Método para la inspección de superficie de productos largos y aparato adecuado para llevar a cabo dicho método
US10296281B2 (en) 2013-11-05 2019-05-21 LiveStage, Inc. Handheld multi vantage point player
US10664225B2 (en) 2013-11-05 2020-05-26 Livestage Inc. Multi vantage point audio player
CA2847707C (en) 2014-03-28 2021-03-30 Intelliview Technologies Inc. Leak detection
US10943357B2 (en) 2014-08-19 2021-03-09 Intelliview Technologies Inc. Video based indoor leak detection
WO2016193525A1 (en) 2015-06-02 2016-12-08 Sapotech Oy Method and apparatus for determining features of hot surface
US10448864B1 (en) 2017-02-24 2019-10-22 Nokomis, Inc. Apparatus and method to identify and measure gas concentrations
CN107525766A (zh) * 2017-08-03 2017-12-29 天津中环电炉股份有限公司 一种高温下物体热成像的装置及方法
CN108050955B (zh) * 2017-12-14 2019-10-18 合肥工业大学 基于结构光投影与数字图像相关的高温空气扰动滤除方法
US11489847B1 (en) 2018-02-14 2022-11-01 Nokomis, Inc. System and method for physically detecting, identifying, and diagnosing medical electronic devices connectable to a network
CN109164045B (zh) * 2018-08-29 2021-01-12 清华大学 检测材料表面液滴的方法及装置
CN113049589B (zh) * 2021-03-10 2021-12-03 清华大学 高温环境下可调控的图像获取方法
CN113483662A (zh) * 2021-04-29 2021-10-08 大连耐视科技有限公司 一种提升拉晶质量的视觉检测装置

Family Cites Families (40)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3187185A (en) * 1960-12-22 1965-06-01 United States Steel Corp Apparatus for determining surface contour
USRE31166E (en) 1967-08-09 1983-03-01 Rca Corporation Recovery of normally illegible, magnetically recorded information
US3727054A (en) 1971-05-10 1973-04-10 Picker Corp X-ray inspection apparatus logic circuitry
US3748471A (en) 1971-09-24 1973-07-24 Int Imaging Syst False color radiant energy detection method and apparatus
JPS4994386A (zh) 1973-01-10 1974-09-07
US4118732A (en) 1977-02-15 1978-10-03 Nippon Steel Corporation Apparatus for detecting a surface flaw of a material at high temperature
FR2381304A1 (fr) 1977-02-18 1978-09-15 Nippon Steel Corp Appareil et procede pour detecter une crique a la surface d'un materiau porte a haute temperature
JPS5499754A (en) 1978-01-25 1979-08-06 Hitachi Ltd Method and apparatus for automatic control of arc welding
GB2019009B (en) 1978-03-23 1982-11-17 Futec Inc Method of imaging the surface of a continuous cast hot metal strip for detection of scarfs appearing thereon and apparatus for the same
US4183055A (en) 1978-08-24 1980-01-08 The United States Of America As Represented By The United States Department Of Energy Beam/seam alignment control for electron beam welding
US4319270A (en) 1979-01-12 1982-03-09 Kobe Steel, Ltd. Surface inspection system for hot radiant material
EP0054596B1 (fr) 1980-12-18 1985-05-29 International Business Machines Corporation Procédé d'inspection et de tri automatique d'objets présentant des configurations avec des tolérances dimensionnelles et des critères de rejet variables selon l'emplacement, équipement et circuits de mise en oeuvre
US4408903A (en) 1981-03-30 1983-10-11 Southwire Company Method of and apparatus for radiation pyrometric temperature measurement of a continuous cast metal bar
US4410787A (en) 1981-08-31 1983-10-18 Sri International Image acquisition apparatus and process
US4608599A (en) 1983-07-28 1986-08-26 Matsushita Electric Industrial Co., Ltd. Infrared image pickup image
JPS6067929A (ja) 1983-09-24 1985-04-18 Nippon Steel Corp 高温物体表面撮像法および装置
CA1229392A (en) 1984-02-28 1987-11-17 Hirosato Yamane Method and apparatus for detection of surface defects of hot metal body
US4649426A (en) 1984-06-12 1987-03-10 The United States Of America As Represented By The United States Department Of Energy Electronic imaging system and technique
US4578561A (en) 1984-08-16 1986-03-25 General Electric Company Method of enhancing weld pool boundary definition
US4795906A (en) 1985-12-13 1989-01-03 Lockheed Corporation Apparatus and system for thermographic identification of parts
US4737614A (en) 1986-04-22 1988-04-12 The Ohio State University Research Foundation Optical image control for automated arc welding system vision system
US4744407A (en) * 1986-10-20 1988-05-17 Inductotherm Corp. Apparatus and method for controlling the pour of molten metal into molds
FR2615966B1 (fr) 1987-06-01 1992-02-14 Framatome Sa Dispositif de surveillance televisuelle d'une operation de soudage a l'arc
DE3884385T2 (de) 1987-12-22 1994-05-05 Takenaka Eng Co Ltd Infrarotdetektor.
NO166424C (no) 1989-01-10 1991-07-17 Elkem Technology Fremgangsmaate for deteksjon av overflatesprekker i metallemner.
US4918517A (en) 1989-01-26 1990-04-17 Westinghouse Electric Corp. System and process for video monitoring a welding operation
US4996426A (en) 1989-09-11 1991-02-26 National Research Council Of Canada Device for subsurface flaw detection in reflective materials by thermal transfer imaging
US5139412A (en) * 1990-05-08 1992-08-18 Weyerhaeuser Company Method and apparatus for profiling the bed of a furnace
US5294198A (en) 1991-10-01 1994-03-15 Cincinnati Electronics Corporation Infrared inspection system and method employing emissivity indications
US5281826A (en) 1991-12-23 1994-01-25 Electric Power Research Institute, Inc. Video fluorescence monitor for determination of spill outlines
US5255088A (en) 1992-01-29 1993-10-19 Arc Machines, Inc. System and process for video monitoring a welding operation
US5240329A (en) 1992-08-14 1993-08-31 Ford Motor Company Non-destructive method for detecting defects in a workpiece
US5292195A (en) 1992-09-09 1994-03-08 Martin Marietta Corporation Thermographic evaluation technique
US5683181A (en) 1995-05-12 1997-11-04 Thermal Wave Imaging, Inc. Method and apparatus for enhancing thermal wave imaging of reflective low-emissivity solids
JPH09138205A (ja) 1995-11-15 1997-05-27 Agency Of Ind Science & Technol 赤外線サーモグラフィによる材料の欠陥検出方法
US5781302A (en) 1996-07-22 1998-07-14 Geneva Steel Non-contact shape meter for flatness measurements
US5719395A (en) 1996-09-12 1998-02-17 Stress Photonics Inc. Coating tolerant thermography
US5711603A (en) 1996-10-30 1998-01-27 United Technologies Corporation Nondestructive testing: transient depth thermography
US5995008A (en) * 1997-05-07 1999-11-30 Detector Electronics Corporation Fire detection method and apparatus using overlapping spectral bands
FR2777838B1 (fr) 1998-04-22 2000-06-23 Cesa Agencement d'une assise de siege de vehicule automobile sur un support

Also Published As

Publication number Publication date
JP2003508979A (ja) 2003-03-04
KR20020035581A (ko) 2002-05-11
US20020008203A1 (en) 2002-01-24
AU7066700A (en) 2001-03-26
BR0013640A (pt) 2002-07-02
CN1200567C (zh) 2005-05-04
US6859285B1 (en) 2005-02-22
EP1216575A1 (en) 2002-06-26
CA2391782A1 (en) 2001-03-08
WO2001017264A1 (en) 2001-03-08
CN1370375A (zh) 2002-09-18

Similar Documents

Publication Publication Date Title
TW503661B (en) Optical observation device and method for observing articles at elevated temperatures
CN105424558B (zh) 一种采用蓝光背光照明的燃烧颗粒多参数测量装置及方法
US20150227773A1 (en) Latent fingerprint detectors and fingerprint scanners therefrom
ATE302978T1 (de) System zur kontrastreichen und verzerrungsarmen bilderfassung
JP2006167451A (ja) 法医学証拠の広範囲紫外線検出方法及びシステム
ES2240726T3 (es) Dispositivo de medida, en particular para la observacion de la llama durante un proceso de combustion.
JP2021501401A (ja) Ｖｃｓｅｌベースのバイオメトリック認証デバイス
KR20020073955A (ko) 의료 영상 검출장치 및 방법
US4794452A (en) Through flame optical viewing
JP2000134611A (ja) 侵入者監視装置
JP2003270037A (ja) 炎検知装置
Matsuyama et al. Advanced active imaging system for fires based on terahertz electromagnetic waves: Experimental study of effectiveness in smoky and high-temperature environments
EP2341330B1 (en) Image capturing and processing system for hot profiles of revolution
JP3133387B2 (ja) 画像処理を用いた炎の発熱量測定装置
TWM442526U (en) Protection case for camera
JP2005300210A (ja) 高熱対象物形状測定装置および高熱対象物距離測定装置
JP6764455B2 (ja) 粒子検知装置及び粒子検知方法
Tkacik et al. Sizing of airborne particles in an operating room
KR102040410B1 (ko) 카메라 비전을 이용한 촬영 사물 거리 측정 방법 및 그 장치
Gardner et al. Basic Skills for Scene Processing: Light Technology
JPS62255829A (ja) 近赤外照明器および近赤外撮像装置
JPS62168322A (ja) 近赤外照明器および近赤外撮像装置
JP2000293663A (ja) 個人識別装置
JPS6014013A (ja) 燃焼表面の観察方法
RU2110952C1 (ru) Способ фотофиксации следов рук на прозрачных объектах

Legal Events

Date Code Title Description
GD4A Issue of patent certificate for granted invention patent
MM4A Annulment or lapse of patent due to non-payment of fees